TWM336434U - Probe structure - Google Patents

Probe structure Download PDF

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Publication number
TWM336434U
TWM336434U TW97202078U TW97202078U TWM336434U TW M336434 U TWM336434 U TW M336434U TW 97202078 U TW97202078 U TW 97202078U TW 97202078 U TW97202078 U TW 97202078U TW M336434 U TWM336434 U TW M336434U
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TW
Taiwan
Prior art keywords
groove
probe structure
top surface
extending direction
disposed
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Application number
TW97202078U
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Chinese (zh)
Inventor
Meng-Lin Lai
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Ascend Top Entpr Co Ltd
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Application filed by Ascend Top Entpr Co Ltd filed Critical Ascend Top Entpr Co Ltd
Priority to TW97202078U priority Critical patent/TWM336434U/en
Publication of TWM336434U publication Critical patent/TWM336434U/en

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Description

M336434 八、新型說明: 【新型所屬之技術領域】 本創作係關於一種探針結構,尤指利用於電子裝置 中,用以電性接觸電池之抹針結構。 【先前技術】 將電池安裝於電子裝置中時,例如筆記型電腦、 行動電話等電子裝置,為使電性接觸良好,將電子裝 置中用以電性接觸電池電極之端子做成具彈性的探 針,是一種理想的方法。 此外,尚有一些筆記型電腦是採用機身分離組合 式的設計,一些非必要周邊裝置係設置於下機身,而 必要的處理單元'記憶單元、顯示器、輸出/入單元皆 設置於上機身,使用者於短期間攜帶筆記型電腦時, 會拆離上機身以便於攜帶,於定位使用更多功能時才 會組合上、下機身,其中,上、下機身組合之電性連 接之處(電訊以及電能的傳輸)也可採用探針的接觸方 式。 習知的彈性探針可如中華民國專利第M249022 號所示,係將探針端子穿置於套筒底座内並受彈簧頂 掣,當前這類技術中用以限制探針端子不脫離套筒底 座之盛行方法,請參閱第一圖之彈性探針2a,係於探 針端子4a伸入套筒底座6a中之後,將套筒底座6a上 部開口邊緣向内彎折,使套筒底座6a上部開口較探針 5 M336434 端子4a下緣小,因此限制探針端子4a不會脫離套筒 底座6a,並使探針端子4a受套筒底座6a中之彈簧8a 向上頂掣。 此種方法固然簡單好用,然而,從外部係會看到 套筒底座6a的開口邊緣,並且直接目視到兩個元件一 套筒底座6a、探針端子4a,容易令消費者感到較不美 觀,進一步影響彈性探針2a所在電子裝置的產品價 值,另外上述之彈性探針2a使用久時,其内之該彈簧 8a會產生彈性疲乏,而該彈性探針2a亦以焊接或鉚 接之方式結合於一印刷電路板l〇a上,而難以將該彈 性探針2a整個置換,亦無法將該筒底座6a之開口開 啟,而將該彈簧8a置換,而增加使用者維修之費用。 因此,本創作的主要目的在於提供一種利用於電 子裝置中,用以電性接觸電池之探針結構,以改善上 述問題。 【新型内容】 本創作之目的在提供一種利用於電子裝置中,用 以電性接觸電池之探針結構,且具有較吸引消費者的 外觀,並能更換其内之彈簧,以能增加使用壽命。 本創作係關於一種探針結構,係包含:一端子件, 係自該端子件之一底部沿一延伸方向,而開設一凹槽, 該凹槽係開設至一抵頂面,且在該凹槽鄰近該底部之内 壁係設有一螺紋段;一固定件,係具有一螺合部及一軸 6 M336434 孔’該螺合部係螺合於該螺紋段,該軸孔係沿該延伸方 向貝通ϋ亥固定件;一支撐軸件,係具有一軸部及——^固 部’该轴部係可移動地貫穿於該軸孔,該卡固部係設置 方;忒軸部之一端,並位於該套筒部内;以及一彈性元 件,係沿該延伸方向設置於該套筒部内,且該彈性元件 之一端接觸該凹槽之該抵頂面。 口此’藉由本創作利用於電子裝置中,用以電性 接角1电池之探針結構,於使用狀態時,使用者僅目 到一穿敕^ 正之一鳊子件,而具有較吸引使用者的外觀。 卜利用一固定件螺合該端子件之方式,而可以藉由 呈Λ 2疋件與该端子件,而能使使用者輕易的置钱 其内^彈簧,而能減少維修費用,並增加探針結、 使用·^命。 關於本創作之優點與精神可以藉由以下 述及所附圖式得到進一步的瞭解。 乍啐 【實施方式】 ^閱第—圖,第二圖係本創作才会 子裝置2嶋_謂之示意 ^ =用於電 可利用於電子裝置2财,轉 j纟,針結構100 裝置咖咖謂輸等電子 以將電池細的電力傳輸給電子I置咖使用h性連接, 此外如先前技術所述,—此整 一,在此未·; 7 M336434 上 下機身組合之琶性連接的理想元件。 此時,该探針結構100係可設置於如筆記型電腦下機身 之電子裝置中,當該電子裝置與另一電子裝置(如筆記型電 腦上機身)結合時’該探針結構⑽之端子件之頂面15係與 所述另-電子褒置之電極電性接觸,以傳 於 二組合的電子裝置之間。 〜ω及钱於 人之二,三圖’第三圖係本創作探針結構100結 二子件]7^®。本創作之探針結構、係包含,- 定件2一支料件3、〜彈性元件“ 心而子件1係具有一凹槽η,該固定件2係可抓 =:曹12之開口處,而與該端子件螺合,而該: 牙 係可移動地貫穿該固定件2,而該彈性元件4 係設置於該凹枰19免……H系弹[生兀件4 /凹匕12内,其ϋ糸接觸讀凹槽12之抵 奸Μ另—端係接觸該支撐軸件3部,以提供 二1與該支撐軸件3間,彈性力,並請參閱第 二圖,,創作之探針結構100設置於讀電子裝置200 Z/itt件1之頂面15係用以與該電池細之電極 301電性接觸。 配合第三圖進—步參閱第四圖’第作 針結構_爆炸之__。 本们作仏 ,而子件1係設有一底部11 ’由s亥底部沿一延伸方 向係開叹~~凹槽12,該凹槽I2係開設至-抵頂面13, 該凹槽12鄰近該底部u之内壁係設有、螺 凹槽12係具有—第—凹槽121、一第二四槽123及 M336434 ‘ ;凹槽⑵,該螺紋段14係設置於該第二凹槽】23之側 :自錢部11沿該延伸方向開設該第三凹槽至該第 面•自該第二抵頂面126沿該延伸方向開設 、、=:!!槽至該第—抵頂面124,至該第—抵頂面124 伸方向開設該第-凹槽至該抵頂面13。該第三凹 之内徑係大於該第-凹槽⑵。 凹才曰 • 蟫/亥固疋件2係具有-螺合部2卜-螺帽部22及一 ::孔,該螺合部21與該螺帽部22係可一體成形設置, 〇Λ螺合部21之底端係設置該螺帽~ 22 1 又 外經係大於該螺合部21,节虫=22,_部22之 該螺咬段】4灿,确“卩21之側壁係螺合於 係沿該延伸方向㈣ 其;該螺合部21及該螺帽部仏 邻?/、 糸可位於该第二凹槽⑵内,古亥螺人 邛1之頂面係可接觸該第—抵面:、口 觸該第二抵頂面126。 2之頂面係可接 因此該固定件2螺合於該端 ,合部力之頂面接觸該第—抵頂面124 /可错由該螺 之動作,以防止組裝時產生損壞。守’而停止螺合 另請一併參考第五圖,該苴 係為一多邊形,該螺帽部22之、;22之底部 125之内徑,可以_工且 “小於該第三凹槽 側壁,該固定件2分離 9 M336434 使使用者輕易的置換其内之彈性元件4,而能減少維 修費用,並增加探針結構之使用壽命。 請參考第三圖及第四圖,該支撐軸件3係具有一軸 部31及一卡固部32,該軸部31係可移動地貫穿於該轴 孔23,該卡固部32係設置於該軸部31之一端,並位於 該套筒部内之該第一凹槽121内,其中該支撐軸件3之 另一端係鉚接於一基座5,該基座5之側邊係延伸一接 腳51,該接腳51係可結合於一印刷電路板上(圖未示), 於另一實施例中該基座5係可為一印刷電路板。 該彈性元件4係可為一彈簧,該彈性元件4係沿該 延伸方向設置於該套筒部内,且該彈性元件4之一端接 觸該凹槽12之該抵頂面13,於本實施例中,該支撐轴 件3之該卡固部32之頂面321自該延伸方向設有一溝 槽33,該該彈性元件4之另一端係延伸入該溝槽33以 彈性接觸該固定件2。 並請參閱第二圖,舉例而言,本創作之探針結構100 設置於該電子裝置200時,使用者僅目視到一完整之 一端子件1,而具有較吸引使用者的外觀。而欲裝設該 電池200時,而該電池200之電極301下壓該端子件1 之頂面15,使該彈性元件4壓縮,該端子件1與該固定 件2相對於該支撐軸件3向下移動,而該彈性元件4提 供該端子件1 一彈性力,以使該端子件1與該電極301 具有良好之性接觸。而移除該該電池200時,因該彈性 元件4之彈力,而該端子件1與該固定件2相對於該支 10 M336434 撐軸件3向上移動,以恢復原來之位置。 另請參考第六圖係為本創作之另一實施例示意 圖,與前述之實施例不同的是,該支撐軸件3之該卡固 部32之頂面321係無該溝槽33,該彈性元件4之另一 端係彈性接觸該支撐轴件3之該卡固部32之頂面321。 藉由以上較佳具體實施例之詳述,係希望能更加 清楚描述本創作之特徵與精神,而並非以上述所揭露 的較佳具體實施例來對本創作之範疇加以限制。相反 地,其目的是希望能涵蓋各種改變及具相等性的安排 於本創作所欲申請之專利範圍的範疇内。 【圖式簡單說明】 第一圖係習知技術探針結構結合之剖面示意圖; 第二圖係本創作探針結構利用於電子裝置接觸電 池之示意圖; 第三圖係本創作探針結構結合之侧剖示意圖; 第四圖係本創作探針結構爆炸之侧剖示意圖; 第五圖係本創作之端子件及固定件之上視示意 圖;以及 第六圖係本創作支撐軸件接觸彈性元件之另一實 施例示意圖。 【主要元件符號說明】 [習知技術] π M336434 彈性探針2a 探針端子4a 套筒底座6a 彈簧8a 印刷電路板10 a [本創作] 探針結構100 端子件1 底部11 凹槽12 第一凹槽121 第二凹槽123 第一抵頂面124 第三凹槽125 第二抵頂面126 抵頂面13 螺紋段14 頂面15 固定件2 螺合部21 M336434 螺帽部22 轴孔23 支撐轴件3 轴部31 卡固部32 頂面321 • 溝槽33 彈性元件4 基座5 接腳51 電子裝置200 電池300 電極301M336434 VIII. New description: [New technical field] This creation is about a probe structure, especially a squeegee structure used in an electronic device to electrically contact a battery. [Prior Art] When the battery is mounted in an electronic device, for example, an electronic device such as a notebook computer or a mobile phone, in order to make electrical contact good, the terminal for electrically contacting the battery electrode in the electronic device is made elastic. Needle is an ideal method. In addition, some notebook computers are designed with a split-body combination. Some unnecessary peripheral devices are installed in the lower body, and the necessary processing units 'memory unit, display, and output/input unit are all set on the upper machine. When the user carries the notebook computer for a short period of time, the upper body is detached for carrying, and the upper and lower body are combined when positioning and using more functions, wherein the electrical properties of the upper and lower body combinations are combined. Where the connection (telecom and power transmission) can also be made by the way the probe is touched. The conventional elastic probe can be as shown in the Republic of China Patent No. M249022. The probe terminal is placed in the sleeve base and is spring-loaded. The current technology is used to limit the probe terminal from the sleeve. For the prevailing method of the base, please refer to the elastic probe 2a of the first figure, after the probe terminal 4a protrudes into the sleeve base 6a, the upper opening edge of the sleeve base 6a is bent inward to make the upper part of the sleeve base 6a The opening is smaller than the lower edge of the terminal 5a of the probe 5 M336434, so that the probe terminal 4a is restricted from coming off the sleeve base 6a, and the probe terminal 4a is pushed up by the spring 8a in the sleeve base 6a. Although this method is simple and easy to use, however, the opening edge of the sleeve base 6a is seen from the external system, and the two components, a sleeve base 6a and the probe terminal 4a, are directly visually observed, which is easy for the consumer to feel less beautiful. Further, the product value of the electronic device where the elastic probe 2a is located is further affected. In addition, when the elastic probe 2a is used for a long time, the spring 8a therein is elastically fatigued, and the elastic probe 2a is also welded or riveted. On the printed circuit board 10a, it is difficult to completely replace the elastic probe 2a, and the opening of the cylinder base 6a cannot be opened, and the spring 8a is replaced, thereby increasing the cost of maintenance for the user. Therefore, the main object of the present invention is to provide a probe structure for electrically contacting a battery in an electronic device to improve the above problem. [New content] The purpose of the present invention is to provide a probe structure for electrically contacting a battery in an electronic device, and having an appearance that is more attractive to the consumer, and capable of replacing the spring therein to increase the service life. . The present invention relates to a probe structure, comprising: a terminal member extending from a bottom of one of the terminal members along a direction of extension, and a recess is formed, the recess is formed to an abutting surface, and the recess is The inner wall of the groove is provided with a threaded section; a fixing member has a screwing portion and a shaft 6 M336434 hole. The screwing portion is screwed to the threaded portion, and the shaft hole is bent along the extending direction. The support member has a shaft portion and a solid portion that is movably inserted through the shaft hole, the fastening portion is disposed at one side of the shaft portion The sleeve portion is disposed; and an elastic member is disposed in the sleeve portion along the extending direction, and one end of the elastic member contacts the abutting surface of the groove. This is used in the electronic device by the present invention to electrically connect the probe structure of the battery. In the state of use, the user only has to wear one of the components, and is more attractive to use. The appearance of the person. By means of a fixing member screwing the terminal member, the user can easily deposit the inner spring by using the second member and the terminal member, thereby reducing the maintenance cost and increasing the exploration. Needle knot, use · ^ life. The advantages and spirit of this creation can be further understood by the following description of the drawings.乍啐[Embodiment] ^Reading the first picture, the second picture is the creation of the child device 2 嶋 _ said the meaning ^ = for electricity can be used in electronic devices 2, turn j 纟, needle structure 100 device coffee The coffee is said to lose power and other electrons to transfer the fine power of the battery to the electronic I. The use of the h-connection, in addition to the prior art, - this whole, here is not; 7 M336434 upper and lower fuselage combination of the sturdy connection Ideal component. At this time, the probe structure 100 can be disposed in an electronic device such as a notebook computer, and when the electronic device is combined with another electronic device (such as a body on a notebook computer), the probe structure (10) The top surface 15 of the terminal member is in electrical contact with the electrode of the other electronic device for transmission between the two combined electronic devices. ~ω and money in the second, three pictures 'The third picture is the creation of the probe structure 100 knot two sub-pieces] 7 ^ ®. The probe structure of the present invention includes, - a member 2, a piece of material 3, an elastic element "heart and a member 1 has a groove η, the fixing member 2 is graspable =: the opening of Cao 12 And the terminal member is screwed, and the: the dental system is movably penetrated through the fixing member 2, and the elastic member 4 is disposed on the concave portion 19 to avoid the H-shaped projectile [the raw material member 4 / the concave portion 12 Inside, the contact with the reading groove 12 is contacted with the end portion to contact the supporting shaft member 3 to provide the elastic force between the two 1 and the supporting shaft member 3, and please refer to the second figure, The probe structure 100 is disposed on the top surface 15 of the Z/itt device 1 of the reading electronic device 200 for electrically contacting the thin electrode 301 of the battery. Referring to the third figure, the fourth figure is referred to as the first needle structure. _ __ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The groove 12 is disposed adjacent to the inner wall of the bottom portion u. The screw groove 12 has a first groove 121, a second groove 123 and a M336434'; a groove (2), the thread segment 14 is disposed on the groove Second concave a side of the 23: the third groove is opened from the money portion 11 in the extending direction to the first surface. • The second abutting surface 126 is opened in the extending direction, and the =:!! slot to the first to the top The surface 124 extends to the first recessed surface 124 to open the first recess to the abutting surface 13. The inner diameter of the third recess is larger than the first recess (2). The cymbal 2 has a screwing portion 2 - a nut portion 22 and a hole: the screw portion 21 and the nut portion 22 are integrally formed, and the bottom end of the shank portion 21 is provided The nut ~ 22 1 and the outer warp system is larger than the screwing portion 21, the knotworm = 22, the screw bite section of the _ portion 22] 4 can be, "the side wall of the 卩 21 is screwed in the extension direction (four) Is the screwing portion 21 and the nut portion adjacent? The 糸 can be located in the second recess (2), and the top surface of the Guailuo 邛1 can contact the first-to-face: the mouth touches the second abutting surface 126. The top surface of the second surface is connectable. Therefore, the fixing member 2 is screwed to the end, and the top surface of the engaging force contacts the first top surface 124/the wrong action of the screw to prevent damage during assembly. Keeping the screw and closing the screw, please refer to the fifth figure. The raft is a polygon. The inner diameter of the bottom portion 125 of the nut portion 22 can be smaller than the third groove sidewall. The fixing member 2 separates the 9 M336434 so that the user can easily replace the elastic member 4 therein, thereby reducing the maintenance cost and increasing the service life of the probe structure. Please refer to the third and fourth figures, the supporting shaft member The third system has a shaft portion 31 and a fastening portion 32. The shaft portion 31 is movably inserted through the shaft hole 23. The fastening portion 32 is disposed at one end of the shaft portion 31 and is located in the sleeve portion. In the first recess 121, the other end of the supporting shaft member 3 is riveted to a base 5, and a side of the base 5 extends a pin 51, and the pin 51 can be coupled to a printed circuit. On the board (not shown), in another embodiment, the base 5 can be a printed circuit board. The elastic element 4 can be a spring, and the elastic element 4 is disposed on the sleeve along the extending direction. Inside the portion, and one end of the elastic member 4 contacts the abutting surface 13 of the groove 12, in the embodiment, the support shaft The top surface 321 of the fastening portion 32 of the member 3 is provided with a groove 33 from the extending direction, and the other end of the elastic member 4 extends into the groove 33 to elastically contact the fixing member 2. Please refer to the second For example, when the probe structure 100 of the present invention is disposed on the electronic device 200, the user only visually sees a complete one of the terminal members 1 and has a more attractive appearance to the user. At the same time, the electrode 301 of the battery 200 presses the top surface 15 of the terminal member 1 to compress the elastic member 4, and the terminal member 1 and the fixing member 2 move downward relative to the support shaft member 3, and the elasticity The component 4 provides an elastic force of the terminal member 1 to make the terminal member 1 have good sexual contact with the electrode 301. When the battery 200 is removed, the terminal member 1 is coupled with the elastic force of the elastic member 4. The fixing member 2 is moved upward relative to the support member 10 M336434 to restore the original position. Please refer to the sixth drawing, which is a schematic view of another embodiment of the present invention, which is different from the foregoing embodiment. The top surface 321 of the fixing portion 32 of the supporting shaft member 3 is free of the groove 33. The other end of the elastic member 4 elastically contacts the top surface 321 of the fixing portion 32 of the supporting shaft member 3. With the detailed description of the above preferred embodiments, it is desirable to more clearly describe the features and spirit of the present invention. The scope of the present invention is not limited by the preferred embodiments disclosed above. Instead, it is intended to cover various modifications and equivalent arrangements within the scope of the patent application. BRIEF DESCRIPTION OF THE DRAWINGS The first figure is a schematic cross-sectional view of a conventional probe structure; the second figure is a schematic diagram of the use of the probe structure for the electronic device to contact the battery; The side view is a side cross-sectional view of the explosion of the probe structure of the present invention; the fifth figure is a top view of the terminal member and the fixing member of the present invention; and the sixth figure is the contact elastic member of the creative support shaft member. A schematic of another embodiment. [Main component symbol description] [Prior Art] π M336434 Elastic probe 2a Probe terminal 4a Sleeve base 6a Spring 8a Printed circuit board 10 a [This creation] Probe structure 100 Terminal piece 1 Bottom 11 Groove 12 First Groove 121 second groove 123 first abutting surface 124 third groove 125 second abutting surface 126 abutting surface 13 threaded section 14 top surface 15 fixing member 2 screwing portion 21 M336434 nut portion 22 shaft hole 23 Support shaft member 3 Shaft portion 31 Fixing portion 32 Top surface 321 • Groove 33 Elastic element 4 Base 5 Pin 51 Electronic device 200 Battery 300 Electrode 301

Claims (1)

M336434 九、申請專利範圍: _ 1、一種探針結構,係包含: 一端子件,係自該端子件之一底部沿一延伸方向, 而開設一凹槽,該凹槽係開設至一抵頂面,且在 該凹槽鄰近該底部之内壁係設有一螺紋段; 一固定件,係具有一螺合部及一轴孔,該螺合部係 螺合於該螺紋段,該軸孔係沿該延伸方向貫通該 0 固定件; 一支撐軸件,係具有一軸部及一卡固部,該軸部係 可移動地貫穿於該軸孔,該卡固部係設置於該軸 部之一端,並位於該套筒部内;以及 一彈性元件,係沿該延伸方向設置於該套筒部内, 且該彈性元件之一端接觸該凹槽之該抵頂面。 2、 如申請專利範圍第1項所述之探針結構,其中該端 φ 子件之一頂面係與一電池之電極電性接觸。 3、 如申請專利範圍第1項所述之探針結構,係設置於 _ 一電子裝置中,且當該電子裝置與另一電子裝置結 合時,該端子件之頂面係與所述另一電子裝置之電 極電性接觸。 4、 如申請專利範圍第1項所述之探針結構,其中該支 撐轴件之另一端係鉚接於一基座。 14 M336434 5、 如中請專利_第4項所述之探針結構,其中該基 座係為一印刷電路板。 6、 如ΐ請專利範圍第4項所述之探針結構,其中該基 座之側邊係延伸一接腳。 7、 如申請專·圍第1項所述之探針結構,其中該固 定件係包含設置於該螺合部底部之—螺帽部,_ 帽部係之底部係為一多邊形。 8、 如申請專利範圍第“所述之探針結構,其中該凹 槽係具有—第—凹槽及—第二凹槽,該第二凹槽係 沿該延伸方向開設至—第—抵頂面,自該第一抵頂 面沿該延伸方向開設該第—凹槽至該抵頂面,其中 該相部係位於該第—凹槽内,該螺紋段係設置於 5亥第二凹槽之侧壁。 9、 ^申請專利範圍第8項所述之探針結構,其中該螺 :!係位於該第二凹槽内,該螺合部之頂面係接觸 邊第一抵頂面。 10、 如申請糊·第8韻述之探針結構,其中該該 :槽係更進一步具有—第三凹槽,自該底部沿該延 方向開設該第三凹槽至一第二抵頂面,自該第二 15 M336434 抵頂面 頂面。 沿 口亥延伸方 向開設該第二凹槽至該 第一抵 11 如申請專利範圍證 1中物^ 項所述之探針結構,其中兮 /、中该固定件係包 、中。亥 第三凹槽内L 螺帽部係位於該 面。 ’部之頂面係接觸該第二抵頂 12、如申請專利範 之探針結構,其中該 ^ ^累巾目部之底部係為一多 勹夕达形,该螺帽部之外 13 &係小於該第三凹槽之内徑。 如申清專利範11第1項所述之探針結構,其中該彈 Htg件之另—端係彈性接觸該支撐軸件之該卡固 部頂面。 14 如申請專鄕圍第1項所述之探針結構,其中自該 支撐軸件之該卡固部之頂面自該延伸方向設有一 溝槽,該彈性元件之另一端係延伸入該溝槽以彈性 接觸該固定件。 16M336434 IX. Patent application scope: _ 1. A probe structure comprising: a terminal member extending from a bottom of one of the terminal members along an extending direction, and a groove is formed to open to a top a threaded section is disposed on the inner wall of the groove adjacent to the bottom portion; a fixing member has a screwing portion and a shaft hole, the screwing portion is screwed to the threaded portion, and the shaft hole is tied along the threaded portion The extending direction extends through the 0 fixing member; a supporting shaft member has a shaft portion and a fastening portion, the shaft portion is movably inserted through the shaft hole, and the fastening portion is disposed at one end of the shaft portion And located in the sleeve portion; and an elastic member disposed in the sleeve portion along the extending direction, and one end of the elastic member contacts the abutting surface of the recess. 2. The probe structure of claim 1, wherein a top surface of the terminal φ component is in electrical contact with an electrode of a battery. 3. The probe structure according to claim 1, wherein the probe structure is disposed in an electronic device, and when the electronic device is combined with another electronic device, the top surface of the terminal member is coupled to the other The electrodes of the electronic device are in electrical contact. 4. The probe structure of claim 1, wherein the other end of the support shaft is riveted to a base. The probe structure of the invention of claim 4, wherein the base is a printed circuit board. 6. The probe structure of claim 4, wherein the side of the base extends a pin. 7. The probe structure of claim 1, wherein the fixing member comprises a nut portion disposed at a bottom portion of the screw portion, and a bottom portion of the cap portion is a polygon. 8. The probe structure of claim 1, wherein the groove has a first groove and a second groove, and the second groove extends along the extending direction to the first to the top. a first groove from the first abutting surface to the abutting surface along the extending direction, wherein the phase portion is located in the first groove, and the thread segment is disposed in the second groove of 5 9. The probe structure of claim 8, wherein the screw: is located in the second groove, and the top surface of the screw portion is in contact with the first abutting surface. 10. The probe structure of the application of the paste according to the eighth aspect, wherein the groove system further has a third groove, and the third groove is opened from the bottom portion in the extension direction to a second abutting surface. The second 15 M336434 is applied to the top surface of the top surface. The second groove is opened along the extending direction of the mouth of the mouth to the first abutment 11 as described in claim 1 of the patent application, wherein 兮/ In the third part of the third recess, the L nut portion is located on the surface. The second abutting 12, as in the probe structure of the patent application, wherein the bottom of the eye portion is a multi-turned shape, and the outer portion of the nut portion is smaller than the third groove The probe structure of claim 1, wherein the other end of the elastic Htg member elastically contacts the top surface of the fastening portion of the support shaft member. The probe structure of claim 1, wherein a top surface of the fastening portion of the supporting shaft member is provided with a groove from the extending direction, and the other end of the elastic member extends into the groove to elastically contact the fixing Pieces. 16
TW97202078U 2008-01-31 2008-01-31 Probe structure TWM336434U (en)

Priority Applications (1)

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TW97202078U TWM336434U (en) 2008-01-31 2008-01-31 Probe structure

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Application Number Priority Date Filing Date Title
TW97202078U TWM336434U (en) 2008-01-31 2008-01-31 Probe structure

Publications (1)

Publication Number Publication Date
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI401445B (en) * 2009-12-08 2013-07-11 Zhen Ding Technology Co Ltd Apparatus for testing printed circuit board

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI401445B (en) * 2009-12-08 2013-07-11 Zhen Ding Technology Co Ltd Apparatus for testing printed circuit board

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