M309104 八、新型說明： 【新型所屬之技術領域】 本創作係關於一種探針構造，尤指利用偏心之導電探 針及不同纏繞情形之彈簧形成—探針構造，使導電探針與 導電套筒的接觸面積增加，祕電阻及提升電訊傳輸 者。 I 【先前技術】 第一圖為習知之探針構造剖視圖，如第一圖所示，現 有用於晶片BGA製程線路量測之探針構造，因為導電探針 1採對稱結構設計及彈簧3為等直徑，使得導電探針i與 導電套筒2的接觸機會少，再加上量測時導電探針丨與導 電套筒2間的接觸因為導電探針丨的往復運動，常有短暫 的輕微離脫狀況，造成量測的電子訊號傳輸中斷而形成錯 誤的檢測結果。另外，習知探針構造的彈簧3為等直徑， • 等纏繞密度設計，在使用時，也容易造成彈簧彈性疲勞及 彈簧線圈之間互相糾結，造成探針構造的損壞。 因此，如何創作出一種探針構造，使導電探針與導電 套筒的接觸面積增加，將是本創作所欲積極探討之處。 【新型内容】 有鑑於上述習知之缺憾，創作人有感其未臻於完善， 遂竭其心智悉心研究克服，憑其從事該項產業多年之累積 經驗，進而研發出一種探針構造，其利用偏心之導電探針 M3 09104 及不同纏繞情形之彈簧形成一探針構造，使導電探針芦， 電套筒的接觸面積增加，降低電阻及提升電訊傳输姝率 且使導電探針在晶片BGA製程中量測線路導通與否0矛’ 電子訊號的有效傳輸，進而達到準確量測的目的。 本創作之主要目的在提供一種探針構造，其伏須偏: 之&電探針及不同纏繞情形之彈簧形成一探針構造，橡$ 兒奴針與導電套筒的接觸面積增加，降低電阻及提升電訊 傳輪致率。 >本創作之一樣態係提供一種探針構造，包括：一導電 筒’其一端具有-開π，該開σ具有-擋緣；一導電探 圓掩其部體於該導電套筒内，該導電探斜的—端係為一 二隹或-斜面，該圓錐的頂點非在該導電探針的中心線 ’讀斜面與該導電探針的中心線非正交且 電探針的兩端之間具有一抿制部；_彈炫 0乂、 套衿知 u _丨 彈頁，其設於該導電 的該_的_端頂抵於該導電套筒之内壁，該彈菩M309104 VIII. New description: [New technical field] This is a probe structure, especially the use of eccentric conductive probes and springs in different winding situations. Probe construction, conductive probes and conductive sleeves Increased contact area, secret resistance and improved telecommunications transmitters. I [Prior Art] The first figure is a cross-sectional view of a conventional probe structure. As shown in the first figure, the existing probe configuration for wafer BGA process line measurement, because the conductive probe 1 adopts a symmetrical structure design and the spring 3 is The equal diameter makes the contact between the conductive probe i and the conductive sleeve 2 less, and the contact between the conductive probe 丨 and the conductive sleeve 2 during measurement is often short-lived due to the reciprocating motion of the conductive probe 丨. The off-state condition causes the transmission of the measured electronic signal to be interrupted to form an erroneous detection result. In addition, the spring 3 of the conventional probe structure is of equal diameter, and the winding density design is also easy to cause spring elastic fatigue and entanglement between the spring coils during use, resulting in damage to the probe structure. Therefore, how to create a probe structure to increase the contact area between the conductive probe and the conductive sleeve will be actively explored by the author. [New content] In view of the above-mentioned shortcomings, the creator feels that he has not perfected it, exhausted his mind and researched and overcome it. Based on his accumulated experience in the industry for many years, he developed a probe structure. The eccentric conductive probe M3 09104 and the springs of different winding conditions form a probe structure, which increases the contact area of the conductive probe reed and the electric sleeve, reduces the resistance and improves the telecommunication transmission rate and makes the conductive probe on the wafer BGA. In the process, the measurement line is turned on or off, and the effective transmission of the electronic signal is achieved, thereby achieving the purpose of accurate measurement. The main purpose of this creation is to provide a probe construction in which the whisker bias: the & electric probe and the spring of different winding conditions form a probe configuration, and the contact area between the rubber and the conductive sleeve is increased and decreased. Resistance and boosting the transmission rate of telecommunications. > The same state of the present invention provides a probe structure comprising: a conductive cylinder having one end with an opening π, the opening σ having a blocking edge; and a conductive probe covering the body within the conductive sleeve, The conductive probe is terminated by a 隹 or - slope, the apex of the cone is not at the center line of the conductive probe, and the read slope is non-orthogonal to the center line of the conductive probe and both ends of the electrical probe Between the 抿 炫 乂 ; _ ; ; ; 炫 炫 炫 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , ,
部份圓椎或該斜面且該擔緣播制該抵制部，使 該V電採針與該導電套筒之内壁接觸 針的另-端突出於該開口。 且使心A 本創作之另-樣態係提供—軸針構造 緣筒’其兩端分別具有―開口，該二開U分別且有一擋 電^導電探針，其分別部份設於該導電套筒内4二^ 或:=:端:分別為一圓椎及1椎…斜面及： 線上該圓錐的頂點非在該導電探針的中心 祕面與科電探針財㈣非正h非平行，該 6 M3 09104 二導電探針的兩端之間分別具有一抵制部；一彈簧，其設 於該導電套筒内，該彈簧的兩端分別頂抵該圓椎及該圓 椎、該斜面及該斜面或該圓椎及該斜面，且該二檔緣分別 擋制該二抵制部，使該二導電探針分別部份與該導電套筒 之内壁接觸，且使該二導電探針的另一端分別突出於該二 開口。 本創作之再一樣態係提供一種探針構造，包括：一導 電套筒，其一端具有一開口，該開口具有一擂緣；一導電 探針’其部份設於該導電套筒内’該導電探針的一端具有 一 v形凹陷部，該v形凹陷部開口的另一端非在該導電探 針的中心線上，該導電探針的兩端之間具有一抵制部；一 彈簧，其設於該導電套筒内，該彈簧的一端頂抵於該導電 套筒之内壁，該彈簧的另一端頂抵該V形凹陷部且該擋緣 擋制該抵制部，使部份該導電探針與該導電套筒之内壁接 觸，且使該導電探針的另一端突出於該開口。 P 本創作之又一樣態係提供一種探針構造，包括：一導 電套筒，其兩端分別具有一開口，該二開口分別具有一檔 緣；二導電探針，其分別部份設於該導電套筒内，該二導 電探針的一端係皆具有一 V形凹陷部或分別具有一 V形凹 陷部及一斜面，該V形凹陷部開口的另一端非在該導電探 針的中心線上，該斜面與該導電探針的中心線非正交且非 平行，該二導電探針的兩端之間分別具有一抵制部；一彈 簧，其設於該導電套筒内，該彈簧的兩端分別頂抵該V形 凹陷部或分別頂抵該V形凹陷部及該斜面，且該二擋緣分 7 M3 09104 別檔制該二抵制部，使該二導電探針分別部份與該導電套 筒之内壁接觸，且使該二導電探針的另一端分別突出於該 二開口。 藉此，利用偏心之導電探針及不同纏繞情形之彈簧形 ^ 成一探針構造，使導電探針與導電套筒的接觸面積增加， 降低電阻及提升電訊傳輸效率。 【實施方式】 ® 為使貴審查委員充分暸解本創作之目的、特徵及功 效，茲藉由下述具體之實施例，並配合所附之圖式，對本 創作做一詳細說明，說明如後： 第二圖及第三圖分別為本創作之第一較佳具體實施例 之探針構造分解圖及剖視圖，請同時參考第二圖及第三 圖，此探針構造包括：一導電套筒2,其一端具有一開口 4, 開口 4具有一檔緣5 ; —導電探針1，其部份設於導電套筒 φ 2内，導電探針1的一端係為一圓椎(但亦可為一斜面），圓 錐的頂點非在導電探針1的中心線上，（如是斜面則與導電 探針1的中心線非正交且非平行），導電探針1的兩端之間 具有一抵制部6，其中，導電探針1突出於開口 4的部份 的直徑，小於導電探針1設於導電套筒2内的部份的直徑； 一彈簧3，其設於導電套筒2内，彈簧3的外形為一圓柱， 彈簧3的一端頂抵於導電套筒2之内壁，彈簧3的另一端 頂抵圓椎（或斜面）且檔緣5檔制抵制部6,使部份導電探針 1與導電套筒2之内壁接觸，且使導電探針1的另一端突 8 M309104 出於開口 4。由此，增加導電探針丨與導電套筒2的接觸 面積，達到降低電阻及增加電子訊號傳輸的效果。 、 第四圖及第五圖分別為本創作之第二較佳具體實施例 • 之奴針構造分解圖及剖視圖，而第六圖及第七圖分別為本 創作之第三較佳具體實施例之探針構造分解圖及剖視圖， 叫同時芩考第四圖至第七圖，其與本創作之第一較佳具體 ， 只知例不同處為第二較佳具體實施例之彈簧3中間部分的 纏繞密度大於其他部分，而第三較佳具體實施例之彈簧3 中間部分及兩端的纏繞密度大於其他部分。由此，除前述 第一較佳具體實施例所述之功效外，更可防止彈簧糾結及 彈性疲勞。 第八圖及第九圖分別為本創作之第四較佳具體實施例 之探針構造分解圖及剖視圖，請同時參考第八圖及第九 圖’其與本創作之第一較佳具體實施例不同處為第四較佳 具體實施例之彈簧3的直徑由彈簧3的中間向兩端漸小。 _ 由此，除前述各實施例所述之功效外，更增加導電探針1 與導電套筒2的接觸機會，達到降低電阻及增加電子訊號 傳輪的效果。 第十圖及第十一圖分別為本創作之第五較佳具體實施 例之探針構造分解圖及剖視圖，而第十二圖及第十三圖分 、 別為本創作之第六較佳具體實施例之探針構造分解圖及剖 視圖，請同時參考第十圖至第十三圖，其與本創作之第四 較佳具體實施例不同處為第五較佳具體實施梆之彈簧3中 間部分的纏繞密度大於其他部分，而第六較隹具體實施例 9 M309104 之彈簧3中間部分及兩端的纏繞密度大於其他部分。由 此，除前述第四較佳具體實施例所述之功效外，更可防止 彈簧糾結及彈性疲勞。 第十四圖及第十五圖分別為本創作之第七較佳具體實 〜例之探針構造分解圖及剖視圖，請同時參考第十四圖及 第十五圖，此探針構造包括：一導電套筒12，其兩端分別 具有一開口 14，該二開口 14分別具有一擋緣15 ;二導電a portion of the circular vertex or the bevel and the ribs broadcast the resisting portion such that the V electric picking needle contacts the inner wall of the conductive sleeve and the other end of the needle protrudes from the opening. And the other aspect of the creation of the heart A is provided - the pin structure has a "opening" at both ends thereof, and the two openings U respectively have a blocking electric conductive probe, and the respective portions are respectively disposed on the conductive Inside the sleeve 4 2 ^ or :=: end: respectively a circular vertebra and 1 vertebra... beveled surface and: the apex of the cone is not parallel to the center of the conductive probe and the electric probe (4) non-positive h non-parallel The 6 M3 09104 two conductive probes respectively have a resisting portion between the two ends; a spring is disposed in the conductive sleeve, and the two ends of the spring respectively abut the circular vertebra and the circular vertex, the inclined surface And the inclined surface or the circular vertex and the inclined surface, and the second flanges respectively block the two resisting portions, so that the two conductive probes are respectively partially in contact with the inner wall of the conductive sleeve, and the two conductive probes are The other end protrudes from the two openings, respectively. A further configuration of the present invention provides a probe construction comprising: a conductive sleeve having an opening at one end thereof, the opening having a flange; a conductive probe 'partially disposed within the conductive sleeve' One end of the conductive probe has a v-shaped recess, the other end of the opening of the v-shaped recess is not on the center line of the conductive probe, and a resisting portion is disposed between the two ends of the conductive probe; a spring is provided In the conductive sleeve, one end of the spring abuts against the inner wall of the conductive sleeve, and the other end of the spring abuts against the V-shaped recess and the retaining edge blocks the resisting portion, so that the conductive probe is partially Contacting the inner wall of the conductive sleeve and causing the other end of the conductive probe to protrude from the opening. The same state of the present invention provides a probe structure comprising: a conductive sleeve having an opening at each end thereof, the two openings respectively having a flange; and two conductive probes respectively disposed at the same In the conductive sleeve, one end of the two conductive probes has a V-shaped recess or has a V-shaped recess and a slope, and the other end of the V-shaped recess is not on the center line of the conductive probe. The slope is non-orthogonal and non-parallel to the center line of the conductive probe, and the two conductive probes respectively have a resisting portion between the two ends; a spring is disposed in the conductive sleeve, and the two springs The two ends are respectively abutted against the V-shaped recess or respectively abutted against the V-shaped recess and the inclined surface, and the two retaining edges are respectively 7 M3 09104 to form the two resisting portions, so that the two conductive probes respectively and the conductive portion The inner wall of the sleeve contacts, and the other ends of the two conductive probes respectively protrude from the two openings. Thereby, the eccentric conductive probe and the spring shape of different winding conditions are used to form a probe structure, which increases the contact area between the conductive probe and the conductive sleeve, reduces the resistance and improves the telecommunication transmission efficiency. [Embodiment] ® In order to fully understand the purpose, characteristics and efficacy of this creation, the following specific examples, together with the attached drawings, provide a detailed explanation of the creation, as follows: The second and third figures are respectively an exploded view and a cross-sectional view of the probe structure of the first preferred embodiment of the present invention. Please refer to the second and third figures simultaneously. The probe structure includes: a conductive sleeve 2 One end has an opening 4, and the opening 4 has a flange 5; a conductive probe 1 partially disposed in the conductive sleeve φ 2, and one end of the conductive probe 1 is a circular vertebra (but may also be a The apex of the cone is not on the center line of the conductive probe 1 (if the slope is non-orthogonal and non-parallel to the center line of the conductive probe 1), a resist portion 6 is formed between the two ends of the conductive probe 1 The diameter of the portion of the conductive probe 1 protruding from the opening 4 is smaller than the diameter of the portion of the conductive probe 1 disposed in the conductive sleeve 2; a spring 3 disposed in the conductive sleeve 2, the spring 3 The shape is a cylinder, and one end of the spring 3 abuts against the inner wall of the conductive sleeve 2, The other end of the spring 3 is abutted against the circular vertex (or the inclined surface) and the flange 5 is formed in the resisting portion 6, so that the part of the conductive probe 1 is in contact with the inner wall of the conductive sleeve 2, and the other end of the conductive probe 1 is protruded 8 M309104 is out of the opening 4. Thereby, the contact area between the conductive probe 丨 and the conductive sleeve 2 is increased to reduce the resistance and increase the effect of electronic signal transmission. 4 and 5 are respectively an exploded view and a cross-sectional view of a second preferred embodiment of the present invention, and the sixth and seventh figures are respectively a third preferred embodiment of the present creation. The probe structure exploded view and cross-sectional view, which are referred to at the same time as the fourth to seventh figures, which are different from the first preferred embodiment of the present invention, and only the difference between the examples is the middle portion of the spring 3 of the second preferred embodiment. The winding density is greater than the other portions, and the winding portion of the intermediate portion and the ends of the spring 3 of the third preferred embodiment is larger than the other portions. Thereby, in addition to the effects described in the first preferred embodiment, spring entanglement and elastic fatigue can be prevented. 8 and 9 are respectively an exploded perspective view and a cross-sectional view of a probe according to a fourth preferred embodiment of the present invention. Please refer to FIG. 8 and FIG. 9 simultaneously with the first preferred embodiment of the present invention. The difference in the diameter of the spring 3, which is different from the fourth preferred embodiment, is gradually reduced from the middle to the both ends of the spring 3. Thus, in addition to the functions described in the foregoing embodiments, the contact chance of the conductive probe 1 and the conductive sleeve 2 is increased, thereby reducing the resistance and increasing the effect of the electronic signal transmission wheel. 10 and 11 are respectively an exploded view and a cross-sectional view of the probe structure of the fifth preferred embodiment of the present invention, and the twelfth and thirteenth drawings are the sixth preferred embodiment of the present invention. For a probe structure exploded view and a cross-sectional view of a specific embodiment, please refer to the tenth to thirteenth drawings at the same time, which is different from the fourth preferred embodiment of the present invention as the fifth preferred embodiment of the spring 3 The winding density of the portion is greater than that of the other portions, and the sixth portion of the spring portion 3 of the M309104 has a higher winding density than the other portions. Therefore, in addition to the effects described in the fourth preferred embodiment, spring entanglement and elastic fatigue can be prevented. The fourteenth and fifteenth drawings are respectively an exploded view and a cross-sectional view of the probe structure of the seventh preferred embodiment of the present invention. Please refer to both the fourteenth and fifteenth drawings. The probe configuration includes: a conductive sleeve 12 has an opening 14 at each end thereof, and the two openings 14 respectively have a retaining edge 15;
才采針11 ’其分別部份設於導電套筒12内，二導電探針11 的一端係皆為一圓椎，亦可皆為一斜面或分別為一圓椎及 一斜面，圓錐的頂點非在導電探針11的中心線上(如是斜 面則與導電探針11的中心線非正交且非平行），二導電探 針11的兩端之間分別具有一抵制部16，其中，二導電探 針11突出於二開口 14的部份的直徑，分別小於二導 針11设於導電套筒12内的部份的直徑；一彈箬η，其$ 於導電套筒12内，彈簧的外形為一圓柱，^ i3的: 端分別頂抵-圓椎，亦可分別職—斜面或分別頂抵一圓 椎及-斜面，且二擔緣15分別揚制二抵制部16，使二導 電探針11分別部份與導電套筒12夕允辟杜Λ · 4 U之内壁接觸，且使二導 電探針11的另一端分別突出於- 〜開口丨4。由此，增加導 電探針1與導電套筒2的接觸面并 ^ τ 積’達到降低電阻及增加 電子訊號傳輸的效果。 第十六圖及第十七圖分別為太 ^ 承創作之第八較佳呈體實 施例及第九較佳具體實施例之探社扭、 权狂，、胆只 , 、个構造剖視圖，請同時參 考第十六圖及第十七圖，其與本貪 ^ ^ 則作之第七較佳具體實施 10 M3 09104 例不同處為第人較佳具體實施例之彈簧13巾間部分的_ 繞密度大於其他部分，而第九較佳具體實施例之彈菩η中 • 間部分及兩端的纏繞密度大於其他部分。由此，除前述第 •七較佳具體實施例之功效外，更可防止彈菁糾結m處 勞。 第十八圖為本創作之第十較佳具體實施例之探針構造 剖視圖，請參考第十八圖，其與本創作之第七較佳具體實 _ ，例不同處為第十較佳具體實施例之彈簧13的直ς由弹 黃13的中間向兩端漸小。由此，除前述第七至第九較佳具 體實施例所述之功效外，更增加導電探針η與導電套筒 U的接觸機會，達到降低電阻及增加電子訊號傳輸的效果。 第十九圖及第二十圖分別為本創作之第十一較佳具體 κ施例及第十二較佳具體實施例之探針構造剖視圖，請同 日寸參考第十九圖及第二十圖，纟與本創作之第十較佳具體 實施例不同處為第十一較佳具體實施例之彈簧13中間部 _二的纏繞密度大於其他部分，而第十二較隹具體實施例之 彈κ 13中間部分及兩端的纏繞密度大於其他部分。由此， 除韵述第十軚佳具體實施例之功效外，更玎防止彈簧糾結 及彈性疲勞。 第二十一圖為本創作之第十三較佳具體實施例之探針 構造剖視圖，請參考第二十一圖，其與本創作之第七較佳 具體實施例不同處為二導電探針u的一端係分別為一圓 椎及斜面，圓錐的項點非在導電探針“的中心線上，而 斜面則與導電探針11的中心線非正交且非平行。由此，增 11The needles 11' are respectively disposed in the conductive sleeve 12, and one end of the two conductive probes 11 is a circular vertebra, or both of them are a slope or a circular vertebra and a slope, and the apex of the cone is not The center line of the conductive probe 11 (if the slope is not orthogonal to the center line of the conductive probe 11 and non-parallel), the two conductive probes 11 respectively have a resisting portion 16 between the two ends, wherein the two conductive probes The diameter of the portion protruding from the two openings 14 is smaller than the diameter of the portion of the second guide pin 11 disposed in the conductive sleeve 12; a spring 箬 n is in the conductive sleeve 12, and the shape of the spring is one. Cylindrical, ^ i3: The end is respectively abutted to the vertebral vertebra, and may be respectively separated from the slanting surface or the slanting surface and the slanting surface, and the second stalk 15 respectively raises the two resisting portions 16 so that the two conductive probes 11 respectively The portion is in contact with the inner wall of the conductive sleeve 12, and the other ends of the two conductive probes 11 are respectively protruded from the opening 丨4. Thereby, the contact surface of the conductive probe 1 and the conductive sleeve 2 is increased and the τ product is reduced to reduce the resistance and increase the transmission of the electronic signal. Figure 16 and Figure 17 are respectively a cross-sectional view of the eighth preferred embodiment of the creation and the ninth preferred embodiment of the creation of the Twisted, mad, and biliary, respectively. Referring to the sixteenth and seventeenth drawings at the same time, it is different from the seventh preferred embodiment of the present invention. The M3 09104 example is the _ winding of the portion of the spring 13 of the preferred embodiment of the first person. The density is greater than the other portions, and the winding density of the intermediate portion and the both ends of the ninth preferred embodiment is greater than that of the other portions. Thus, in addition to the effects of the above-described seventh preferred embodiment, it is possible to prevent the elastic entanglement m from being labored. Figure 18 is a cross-sectional view showing the configuration of a probe according to a tenth preferred embodiment of the present invention. Please refer to the eighteenth figure, which is different from the seventh preferred embodiment of the present invention. The straight cymbal of the spring 13 of the embodiment is gradually reduced from the middle to the both ends of the spring 13 . Thus, in addition to the functions described in the seventh to ninth preferred embodiments, the contact chance of the conductive probe η with the conductive sleeve U is increased, thereby reducing the resistance and increasing the effect of electronic signal transmission. Figure 19 is a cross-sectional view showing the configuration of the probe of the eleventh preferred embodiment of the present invention and the twelfth preferred embodiment of the present invention. Please refer to the nineteenth and the twentieth for the same day. The difference between the figure and the tenth preferred embodiment of the present invention is that the winding density of the middle portion _2 of the spring 13 of the eleventh preferred embodiment is greater than that of the other portions, and the twelfth embodiment of the present invention The winding density of the middle portion and both ends of κ 13 is larger than that of other portions. Thus, in addition to the effects of the tenth embodiment of the rhyme, the spring entanglement and elastic fatigue are further prevented. 21 is a cross-sectional view showing the configuration of a probe according to a thirteenth preferred embodiment of the present invention. Referring to FIG. 21, a second conductive probe is different from the seventh preferred embodiment of the present invention. One end of u is a circular vertex and a bevel, the point of the cone is not on the center line of the conductive probe, and the slope is non-orthogonal and non-parallel to the center line of the conductive probe 11. Thus, 11
V M3 09104 加導電探針11與導電套筒12的接觸面積，達到降低電阻 及增加電子訊號傳輸的效果。 ， 第二十二圖及第二十三圖分別為本創作之第十四較佳 . 具體實施例及第十五較佳具體實施例之探針構造剖視圖， 請同時參考第二十二圖及第二十三圖，其與本創作之第十 三較佳具體實施例不同處為第十四較佳具體實施例之彈筈 . 13中間部分的纏繞密度大於其他部分，而第十五較佳具體 實施例之彈簧13中間部分及兩端的纏繞密度大於其:部 分。由此，除前述第十三較佳具體實施例之功效外，更可 防止彈黃糾結及彈性疲勞。 第一十四圖為本創作之第十六較佳具體實施例之探針 構造剖視圖，請參考第二十四圖，其與本創作之第十三較 佳具體實施例不同處為第十六較佳具體實施例之彈簧13 的直徑由彈簧13的中間向雨端漸小。由此，除前述第十三 至第十五較佳具體實施例所述之功效外，更增加導電探針 _ 11與導電套筒12的接觸機會，達到降低電阻及增加電子 訊號傳輸的效果。 第二十五圖及第二十六圖分別為本創作之第十七較佳 具體實施例及第十八較佳具體實施例之探針構造剖視圖， 請同時參考第二十五圖及第二十六圖，其與本創作之第十 ， /、权仏具體實施例不同處為第十七車义佳具體實施例之彈簧 13中間部分的纏繞密度大於其他部分’而第十八較佳具體 貫施例之彈簧13中間部分及雨端的纏繞密度大於其他部 分。由此，除前述第十六較值具體貫施例之功效外，更可 12 M309104 防止彈簧糾結及彈性疲勞。 第二十七圖及第二十八圖分別為本 — 具體實施例之探針構造分解圖及職圖，九較佳 十七圖及第二十八圖，此探針構造 參考第二 其一端具有一開口4,開口4具有1緣5Γ一導電，筒2， 其部份設於導電套筒2内，導電探針丨具，導兔探針1， V形凹陷部開口的另一端非在導電探^有一 V形凹陷部， 電探針1的兩端之間具有一抵制部6，L的中:線上，導 突出於開口 4的部份的直徑，小 中’導電探針1 筒2内的部份的直徑；—彈菩3 , u衣針1設於導電套 彈簧3的直徑由彈簀3的中間向兩蠕漸小，彈笪3二内， 頂抵於導電套筒2之内壁，彈簧3的£ Μ的—端 部且擋緣5擋制抵制部6,使部份導 、- > 凹陷 兒于衣針1與導電奎锊 之内壁接觸，且使導電探針1的另1突出於開口4 = 此，增加導電探針1與導電套筒2的接觸面積，達到降低 電p且及增加電子訊號傳輸的效果。 一 第二十九圖及第三十圖分別為本創作之第二十較佳具 體實施例之探針構造分解圖及剖視圖，而第三十一圖及第 三十-圖分別為本創作之第二十-較佳具體實施例之探針 構造分解圖及剖視圖，請同時參考第二十九圖至第三十二 ， 圖，其與本創作之第十九較佳具體實施例不同處為第二十 較隹具體實施例之彈簧3中間部分的纏繞密度大於其他部 分，而第二十一較佳具體實施例之彈簧3中間部分及兩端 的缠繞密度大於其他部分。由此，除前述第十九較佳具體 13 M309104 實_所叙功效外，更可防止彈簧糾結及彈性疲勞。 弟—十二圖及第三十四圖分別為本創作 .佳二=!之探針構造分解圖及剖視圖，請暢;;V M3 09104 plus the contact area of the conductive probe 11 and the conductive sleeve 12, to reduce the resistance and increase the effect of electronic signal transmission. The twenty-second and twenty-third figures are respectively a fourteenth preferred embodiment of the present invention. A cross-sectional view of the probe configuration of the fifteenth preferred embodiment, please refer to the twenty-second diagram and The twenty-third figure, which differs from the thirteenth preferred embodiment of the present invention, is the magazine of the fourteenth preferred embodiment. The intermediate portion has a higher winding density than the other portions, and the fifteenth preferred The intermediate portion and the ends of the spring 13 of the specific embodiment have a winding density greater than that of the portion. Thereby, in addition to the effects of the thirteenth preferred embodiment described above, it is possible to prevent the entanglement and elastic fatigue of the yellowing. Figure 14 is a cross-sectional view showing the probe construction of the sixteenth preferred embodiment of the present invention. Please refer to the twenty-fourth figure, which is different from the thirteenth preferred embodiment of the present invention. The diameter of the spring 13 of the preferred embodiment is tapered from the middle of the spring 13 toward the rain end. Thus, in addition to the functions described in the thirteenth to fifteenth preferred embodiments, the contact chance of the conductive probe _ 11 and the conductive sleeve 12 is increased to achieve the effect of reducing the resistance and increasing the transmission of the electronic signal. The twenty-fifth and twenty-fifth drawings are respectively a cross-sectional view of the probe configuration of the seventeenth preferred embodiment and the eighteenth preferred embodiment of the present invention. Please refer to the twenty-fifth and second The sixteenth figure, which differs from the tenth embodiment of the present invention, is that the intermediate portion of the spring 13 of the seventeenth car Yijia specific embodiment has a higher winding density than the other portions' and the eighteenth preferred The winding portion of the intermediate portion and the rain end of the spring 13 of the embodiment is larger than the other portions. Therefore, in addition to the above-mentioned sixteenth value specific embodiment, the 12 M309104 can prevent spring entanglement and elastic fatigue. The twenty-seventh and twenty-eighthth drawings are respectively the exploded view and the job diagram of the probe structure of the specific embodiment, and the nineteenth and seventeenth and twenty-eighth drawings, the probe structure is referred to the second end Having an opening 4, the opening 4 has a rim 5, a conductive, the barrel 2, the portion of which is disposed in the conductive sleeve 2, the conductive probe cooker, the rabbit probe 1, the other end of the opening of the V-shaped recess is not The conductive probe has a V-shaped recess, and the two ends of the electric probe 1 have a resisting portion 6, a middle of the line L, a diameter of a portion protruding from the opening 4, and a small medium 'conductive probe 1 barrel 2 The diameter of the inner part; the elastic needle 3, the u needle 1 is set on the diameter of the conductive sleeve spring 3 from the middle of the magazine 3 to the two creeps, the magazine 3, the top is pressed against the conductive sleeve 2 The inner wall, the end of the spring 3, and the retaining edge 5 blocks the resisting portion 6, so that the partial guide, the > recess, contacts the inner wall of the conductive pin and the conductive probe 1 The other one protrudes from the opening 4 = this increases the contact area between the conductive probe 1 and the conductive sleeve 2, thereby reducing the electric power p and increasing the effect of electronic signal transmission. A twenty-ninth and thirteenth drawings are respectively an exploded view and a cross-sectional view of the probe structure of the twentieth preferred embodiment of the present invention, and the thirty-first figure and the thirty-first figure are respectively 20th - preferred embodiment of the probe structure exploded view and cross-sectional view, please also refer to the twenty-ninth to thirty-second, the figure, which is different from the nineteenth preferred embodiment of the present invention The winding density of the intermediate portion of the spring 3 of the twentieth embodiment is greater than that of the other portions, and the winding portion of the intermediate portion and the ends of the spring 3 of the twenty-first preferred embodiment is larger than the other portions. Therefore, in addition to the effects described above, it is possible to prevent spring entanglement and elastic fatigue. The younger brothers—Twelve Diagrams and Thirty-fourth Diagrams are the original creations. Jia 2=! The probe structure exploded view and sectional view, please go;
.十四圖’此探針構造包括:-導電套筒12, 广刀別具有一開口 14，該二開口 M =二導電探針η’其分別部份設於導電套筒12内：= 1探針η的-端係皆具有—ν形凹 利 口的另-端非在導電探針u的中心線上，二^凹W開 ，之間分別具有一抵制部16，其中，：導電 :出於二開口 14的部份的直徑，分別小於二導電探針Μ δ又於導電套筒12内的部份的直徑；—彈菩13，盆 内，彈簧13的直徑由該彈簧的中間向兩端;二 便一導電鉍針η分別部份與導 壁且使二導電探針U的另一端分別突出於二開 達到電探針U與導電套筒12的接觸面積， 牛低電阻及增加電子訊號傳輸的效果。 #且^三十五圖及第三十六圖分別為本創作之第二十三較 = ^ =四較佳具體實施例之探針構造剖視 第一:广考弟二十五圖及第三十六圖，其與本創作之 Sr，實施例不同處為第二十三較佳具體實施 ^耳13中間部分的纏繞密度大於其他部分，而第二十 實蘭之彈簧13中間部分及㈣_繞密度 大於其他部分。由此，除前述第二十二較佳具體實施例戶= 14 M3 09104 述之功效外，更可防止彈簧糾結及彈性疲勞。 第三十七圖為本創作之第二十五較佳具體實施例之探 針構造剖視圖，請參考第三十七圖，其與本創作之第二十 二較佳具體實施例不同處為第二十五較佳具體實施例之二 導電棟針的一 係刀別具有一 v形凹陷部及一斜面，v形 凹陷部開口的另一端非在導電探針n的中心線上，斜面與 導電探針11的中心線非正交且非平行，彈簧13的兩端分 別頂抵V形凹陷部及斜面，由此，增加導電探針丨丨與導電 套筒12的接觸面積，達到降低電阻及增加電子訊號傳輸的 效果。 第三十八圖及第三十九圖分別為本創作之第二十六較 佳具體實_及第二十讀佳具體實施例之探針構造剖視 圖’請同時參考第三十人圖及第三十九圖，其與本創作之 第二十五較佳具體實施例不同處為第二十六較 例之彈簧13中間部分的纏繞密度大於其他部分，^:十 實施例之彈簧13中間部分及兩端的纏繞密度 议:力效;/。纽，除前述第二十五較佳具體實施例所 述 ^ h ’更可防止彈簧糾結及彈性疲勞。 =述所有實施例之導電探針U的量測端外形 外形的導電探❹。貝際使用用不同量測端 本創作係利用利用偏"之導電探針及不同 的接觸面積增加針構以使針與導電套筒 、 条低電阻及提升電訊傳輪效率，且使導 15 .M309104 在晶片BGA製程中量測線路導通與否時，因電子訊 利用性Γ1輸，進而達到準_量測的目的；就產業上的"" 騎市場^求利用本創作所衍生的產品，當可充分滿足Figure 14 'This probe configuration includes: - a conductive sleeve 12, the wide blade has an opening 14, the two openings M = two conductive probes η' are respectively disposed in the conductive sleeve 12: = 1 The end-end of the probe η has a v-shaped concave end, and the other end is not on the center line of the conductive probe u, and the recess W is open, and has a resisting portion 16 therebetween, wherein: conductive: out The diameter of the portion of the two openings 14 is smaller than the diameter of the portion of the second conductive probe Μ δ and the conductive sleeve 12; respectively, the diameter of the spring 13 is from the middle to the opposite ends of the spring. 2, a conductive pin η respectively and the guide wall and the other end of the two conductive probe U respectively protrudes to reach the contact area of the electric probe U and the conductive sleeve 12, the low resistance of the cow and the increase of the electronic signal The effect of the transmission. #且^The thirty-fifth and the thirty-sixth drawings are respectively the twenty-third of the creation. ^^=The preferred configuration of the probe structure is the first section: the broad tester twenty-fifth and the first Thirty-sixth figure, which is different from the Sr of the present invention, the difference of the embodiment is the twenty-third preferred embodiment. The middle portion of the ear 13 has a higher winding density than the other portions, and the middle portion of the twentieth solid spring 13 and (4) The _ winding density is greater than the other parts. Thus, in addition to the effects described in the aforementioned twenty-second preferred embodiment of the household = 14 M3 09104, spring entanglement and elastic fatigue can be prevented. Figure 37 is a cross-sectional view showing the probe construction of the twenty-fifth preferred embodiment of the present invention. Please refer to the thirty-seventh embodiment, which is different from the twenty-second preferred embodiment of the present invention. A preferred embodiment of the second embodiment of the conductive pin has a v-shaped recess and a bevel, and the other end of the v-shaped recess is not on the center line of the conductive probe n, the bevel and the conductive probe The center line of the needle 11 is non-orthogonal and non-parallel, and the two ends of the spring 13 respectively abut against the V-shaped recessed portion and the inclined surface, thereby increasing the contact area between the conductive probe 丨丨 and the conductive sleeve 12, thereby reducing the resistance and increasing The effect of electronic signal transmission. The thirty-eighth and thirty-ninth figures are respectively a sectional view of the probe structure of the twenty-sixth preferred embodiment of the present invention and the twenty-first preferred embodiment. 39. The difference from the twenty-fifth preferred embodiment of the present invention is that the winding portion of the middle portion of the spring 13 of the twenty-sixth comparative example is larger than the other portions, and the middle portion of the spring 13 of the ten embodiment And the winding density at both ends: force effect; /. In addition to the above-mentioned twenty-fifth preferred embodiment, h h ' can prevent spring entanglement and elastic fatigue. = Conductive probe of the shape of the measuring end of the conductive probe U of all the embodiments. The use of different measuring ends in the field uses the conductive probes with different biases and different contact areas to increase the needle structure to make the needle and the conductive sleeve, the strips have low resistance and improve the efficiency of the telecommunication transmission, and the guide 15 .M309104 When the measurement of the line conduction in the wafer BGA process, due to the use of electronic information Γ1, and thus achieve the purpose of quasi-measurement; on the industrial "" riding market ^ seeking the use of this creation Product, when fully satisfied
衡者應i乍在上文中已以車父佳實施例揭露，然熟習本頊技 續為理解的是，該實施例則於描繪本創作，而不應解 致史綠創作之範圍。應注意的是，舉凡與該實施例等 本創作匕舄置換，均應設為涵蓋於本創作之範疇内。因此， 。 之保遵範圍當以下文之申請專利範圍所界定者為率 式簡單說明】 =一圖為g知之探針構造剖視圖。 陶。圖為本創作之第一較佳具體實施例之探針構造分解 第二图、 _。回為本創作之第一較佳具體實施例之探針構造剖祝 回為本創作之第二較佳具體實施例之探針構造分解 Ϊ1 :回為本創作之第二較佳具體實施例之探針構造剖祝 弟六圖兔士 陶。 〜、本創作之第三較佳具體實施例之探針構造分解 第七 、 °為本創作之第三較佳具體實施例之探針構造刹祝 16 M3 09104 圖。 第八圖為本創作之第四較佳具體實施例之探針構造分解 _ 圖。 第九圖為本創作之第四較佳具體實施例之探針構造剖視 圖。 第十圖為本創作之第五較佳具體實施例之探針構造分解 圖。 第十一圖為本創作第五較佳具體實施例之探針構造剖視 ’圖。 第十二圖為本創作之第六較佳具體實施例之探針構造分 解圖。 第十三圖為本創作之第六較佳具體實施例之探針構造剖 視圖。 第十四圖為本創作之第七較佳具體實施例之探針構造分 解圖。 _ 第十五圖為本創作之第七較佳具體實施例之探針構造剖 視圖。 第十六圖為本創作之第八較佳具體實施例之探針構造剖 視圖。 第十七圖為本創作之第九較佳具體實施例之探針構造剖 視圖。 第十八圖為本創作之第十較佳具體實施例之探針構造剖 視圖。 第十九圖為本創作之第十一較佳具體實施例之探針構造 17 M3 09104 剖視圖。 第二十圖為本創作之第十二較佳具體實施例之探針構造 剖視圖。 第二十一圖為本創作之第十三較佳具體實施例之探針構 造剖視圖。 第二十二圖為本創作之第十四較佳具體實施例之探針構 造剖視圖。 第二十三圖為本創作之第十五較佳具體實施例之探針構 ’造剖視圖。 第二十四圖為本創作之第十六較佳具體實施例之探針構 造剖視圖。 第二十五圖為本創作之第十七較佳具體實施例之探針構 造剖視圖。 第二十六圖為本創作之第十八較佳具體實施例之探針構 造剖視圖。 p 第二十七圖為本創作之第十九較佳具體實施例之探針構 造分解圖。 第二十八圖為本創作之第十九較佳具體實施例之探針構 造剖視圖。 第二十九圖為本創作之第二十較佳具體實施例之探針構 造分解圖。 第三十圖為本創作之第二十較佳具體實施例之探針構造 剖視圖。 第三十一圖為本創作之第二十一較佳具體實施例之探針 18 M3 09104 構造分解圖。 第三十二圖為本創作之第二十一較佳具體實施例之探針 構造剖視圖。 第三十三圖為本創作之第二十二較佳具體實施例之探針 構造分解圖。 第三十四圖為本創作之第二十二較佳具體實施例之探針 構造剖視圖。 第三十五圖為本創作之第二十三較佳具體實施例之探針 構造剖視圖。 第三十六圖為本創作之第二十四較佳具體實施例之探針 構造剖視圖。 第三十七圖為本創作之第二十五較佳具體實施例之探針 構造剖視圖。 第三十八圖為本創作之第二十六較佳具體實施例之探針 構造剖視圖。 第三十九圖為本創作之第二十七較佳具體實施例之探針 構造剖視圖。 【主要元件符號說明】 1導電探針 2導電套筒 3彈簧 4開口 19 M309104 5擋緣 6抵制部 . 11導電探針 . 12導電套筒 13彈簧 14開口 15擋緣 16抵制部The balancer should have been exposed in the above example in the car's best example. However, it is understood that this embodiment is intended to depict the creation and should not address the scope of the creation of Shi Green. It should be noted that the replacement of this creation with the embodiment and the like should be made to be included in the scope of the present creation. Therefore, . The scope of the warranty is as defined in the scope of the patent application below, which is a simple description of the rate] = a picture is a cross-sectional view of the probe structure. pottery. The figure is the first preferred embodiment of the probe structure decomposition of the first embodiment, the second figure, _. Returning to the probe configuration of the first preferred embodiment of the present invention, the probe structure of the second preferred embodiment of the present invention is decomposed Ϊ1: back to the second preferred embodiment of the present invention. The probe structure is cut into the six-figure rabbit. The probe structure of the third preferred embodiment of the present invention is decomposed. The seventh embodiment is the probe structure of the third preferred embodiment of the present invention. 16 M3 09104. The eighth figure is a decomposition of the probe structure of the fourth preferred embodiment of the present invention. Figure 9 is a cross-sectional view showing the construction of a probe of a fourth preferred embodiment of the present invention. The tenth drawing is an exploded view of the probe structure of the fifth preferred embodiment of the present invention. Figure 11 is a cross-sectional view of the probe construction of the fifth preferred embodiment of the present invention. Fig. 12 is a view showing the probe configuration of the sixth preferred embodiment of the present invention. Figure 13 is a cross-sectional view showing the configuration of a probe of a sixth preferred embodiment of the present invention. Fig. 14 is a view showing the probe configuration of the seventh preferred embodiment of the present invention. The fifteenth drawing is a cross-sectional view of the probe construction of the seventh preferred embodiment of the present invention. Fig. 16 is a cross-sectional view showing the configuration of a probe of an eighth preferred embodiment of the present invention. Figure 17 is a cross-sectional view showing the configuration of a probe of a ninth preferred embodiment of the present invention. Figure 18 is a cross-sectional view showing the configuration of a probe of a tenth preferred embodiment of the present invention. Fig. 19 is a cross-sectional view showing the probe structure 17 M3 09104 of the eleventh preferred embodiment of the present invention. Figure 20 is a cross-sectional view showing the probe construction of the twelfth preferred embodiment of the present invention. Figure 21 is a cross-sectional view showing the probe construction of the thirteenth preferred embodiment of the present invention. Fig. 22 is a cross-sectional view showing the configuration of the probe of the fourteenth preferred embodiment of the present invention. Figure 23 is a cross-sectional view showing the probe structure of the fifteenth preferred embodiment of the present invention. Figure 24 is a cross-sectional view showing the configuration of a probe of a sixteenth preferred embodiment of the present invention. Figure 25 is a cross-sectional view showing the configuration of a probe of a seventeenth preferred embodiment of the present invention. Figure 26 is a cross-sectional view showing the configuration of the probe of the eighteenth preferred embodiment of the present invention. p. Figure 27 is an exploded view of the probe construction of the nineteenth preferred embodiment of the present invention. Figure 28 is a cross-sectional view showing the probe construction of the nineteenth preferred embodiment of the present invention. A twenty-ninth embodiment is an exploded view of the probe construction of the twentieth preferred embodiment of the present invention. Figure 30 is a cross-sectional view showing the probe construction of the twentieth preferred embodiment of the present invention. Figure 31 is an exploded view of the probe 18 M3 09104 of the twenty-first preferred embodiment of the present invention. Figure 32 is a cross-sectional view showing the configuration of a probe of a twenty-first preferred embodiment of the present invention. A thirty-third drawing is an exploded view of the probe structure of the twenty-second preferred embodiment of the present invention. Figure 34 is a cross-sectional view showing the configuration of a probe of a twenty-second preferred embodiment of the present invention. Figure 35 is a cross-sectional view showing the configuration of a probe of a twenty-third preferred embodiment of the present invention. Figure 36 is a cross-sectional view showing the configuration of a probe of a twenty-fourth preferred embodiment of the present invention. Figure 37 is a cross-sectional view showing the configuration of a probe of a twenty-fifth preferred embodiment of the present invention. Figure 38 is a cross-sectional view showing the configuration of a probe of a twenty-sixth preferred embodiment of the present invention. Figure 39 is a cross-sectional view showing the configuration of a probe of a twenty-seventh preferred embodiment of the present invention. [Main component symbol description] 1 Conductive probe 2 Conductive sleeve 3 Spring 4 opening 19 M309104 5 Retaining edge 6 resisting part 11 Conductive probe . 12 Conductive sleeve 13 spring 14 opening 15 retaining edge 16 resisting part
2020