TWI833116B - Optical interference tomography device and optical interference tomography method - Google Patents

Optical interference tomography device and optical interference tomography method Download PDF

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TWI833116B
TWI833116B TW110135128A TW110135128A TWI833116B TW I833116 B TWI833116 B TW I833116B TW 110135128 A TW110135128 A TW 110135128A TW 110135128 A TW110135128 A TW 110135128A TW I833116 B TWI833116 B TW I833116B
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能美政男
坂倉淳史
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日商大金工業股份有限公司
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Abstract

本發明提供一種即便為可攜式亦不易產生斷層圖像之偏差且能一次性地對廣範圍進行斷層攝影之光干涉斷層攝影裝置、以及使用其之光干涉斷層攝影法。本發明之光干涉斷層攝影裝置具備使來自光源之光聚光於試樣之物鏡,且基於來自上述試樣之反射光即試樣光、及來自上述物鏡與上述試樣之間所設置的參照面之反射光即參照光之干涉,進行上述試樣之斷層攝影,並且上述試樣光及參照光兩者通過上述物鏡,上述物鏡係Fθ透鏡。The present invention provides an optical interference tomography apparatus that is not prone to deviation in tomographic images even if it is portable and can perform tomography of a wide range at once, and an optical interference tomography method using the same. The optical interference tomography apparatus of the present invention includes an objective lens for focusing light from a light source on a sample, and is based on the reflected light from the sample, that is, the sample light, and the reference provided between the objective lens and the sample. The reflected light from the surface is the interference of the reference light, and the tomography of the above-mentioned sample is performed, and both the above-mentioned sample light and the reference light pass through the above-mentioned objective lens, and the above-mentioned objective lens is an Fθ lens.

Description

光干涉斷層攝影裝置及光干涉斷層攝影法Optical interference tomography device and optical interference tomography method

本發明係關於一種光干涉斷層攝影裝置及光干涉斷層攝影法。The invention relates to an optical interference tomography device and an optical interference tomography method.

光干涉斷層攝影法(Optical Coherence Tomography:OCT)係主要於醫療領域中用於眼球等生物器官之斷層攝影。Optical Coherence Tomography (OCT) is mainly used in the medical field for tomography of biological organs such as eyeballs.

作為光干涉斷層攝影裝置,一般係藉由分光鏡等分割來自光源之光,且分別照射至試樣及參照鏡而得到反射光,利用通過各自之光路之該等反射光之干涉進行斷層攝影(例如參照專利文獻1)。 [先前技術文獻] [專利文獻] As an optical interference tomography device, the light from the light source is generally divided by a spectroscope, etc., and is irradiated to the sample and the reference mirror respectively to obtain reflected light, and the interference of the reflected light passing through the respective optical paths is used to perform tomography ( For example, refer to Patent Document 1). [Prior technical literature] [Patent Document]

專利文獻1:日本特開2011-104127號公報Patent Document 1: Japanese Patent Application Publication No. 2011-104127

[發明所欲解決之課題][Problem to be solved by the invention]

本發明之目的在於提供一種即便為可攜式亦不易產生斷層圖像之偏差且能一次性地對廣範圍進行斷層攝影之光干涉斷層攝影裝置、以及使用其之光干涉斷層攝影法。 [解決課題之技術手段] An object of the present invention is to provide an optical interference tomography apparatus that is not prone to deviation in tomographic images even if it is portable and can perform tomography of a wide range at once, and an optical interference tomography method using the same. [Technical means to solve the problem]

本發明係關於一種光干涉斷層攝影裝置,其具備使來自光源之光聚光於試樣之物鏡,且基於來自上述試樣之反射光即試樣光、及來自上述物鏡與上述試樣之間所設置的參照面之反射光即參照光之干涉,進行上述試樣之斷層攝影,並且 上述試樣光及參照光兩者通過上述物鏡, 上述物鏡係Fθ透鏡。 The present invention relates to an optical interference tomography apparatus, which is provided with an objective lens that condenses light from a light source on a sample, and is based on the reflected light from the sample, that is, the sample light, and the space between the objective lens and the sample. The reflected light from the set reference surface is the interference of the reference light, and the tomography of the above sample is performed, and Both the above-mentioned sample light and the reference light pass through the above-mentioned objective lens, The above objective lens is an Fθ lens.

上述光干涉斷層攝影裝置較佳以下述方式構成:可將上述參照面與上述試樣之距離設為0~3 cm地進行上述斷層攝影。The optical interference tomography apparatus is preferably configured so that the tomography can be performed with the distance between the reference surface and the sample being 0 to 3 cm.

上述參照面較佳係參照構件所具有之平面,該參照構件包含選自由MgF 2、CaF 2、石英及藍寶石所組成之群中之至少1種。 The reference surface is preferably a flat surface of a reference member including at least one selected from the group consisting of MgF 2 , CaF 2 , quartz, and sapphire.

上述試樣光及參照光兩者較佳為產生自通過上述物鏡之來自上述光源之光。It is preferable that both the sample light and the reference light are generated from the light from the light source passing through the objective lens.

上述干涉較佳為菲左型干涉。The above-mentioned interference is preferably a Fezuo-type interference.

上述光干涉斷層攝影裝置較佳為進而具備循環器,該循環器係將來自上述光源之光輸出至上述物鏡之側,並將通過上述物鏡之上述試樣光及參照光輸出至檢測該試樣光及參照光之檢測器之側。The optical interference tomography apparatus preferably further includes a circulator that outputs light from the light source to the side of the objective lens, and outputs the sample light and reference light passing through the objective lens to detect the sample. light and reference light on the detector side.

上述光干涉斷層攝影裝置較佳為進而具備耦合器,該耦合器將來自上述光源之光分割成用於產生上述試樣光及參照光之分割光1、及用於去除干涉信號之直流成分之分割光2,且分割光1與分割光2之強度比為90:10~99:1。The optical interference tomography apparatus preferably further includes a coupler that splits the light from the light source into split light 1 for generating the sample light and reference light, and a split light 1 for removing the DC component of the interference signal. Split light 2, and the intensity ratio of split light 1 and split light 2 is 90:10~99:1.

上述光干涉斷層攝影裝置較佳以下述方式構成:使用者可攜帶具備上述物鏡之部分並進行上述斷層攝影。The above-mentioned optical interference tomography apparatus is preferably configured in such a manner that a user can carry the part provided with the above-mentioned objective lens and perform the above-mentioned tomography.

較佳為經由光纖將攜帶之具備上述物鏡之部分與不攜帶之部分連接, 來自上述光源之光,以及上述試樣光及參照光通過上述光纖而傳輸。 Preferably, the portable part equipped with the objective lens and the non-portable part are connected via an optical fiber. The light from the above-mentioned light source, the above-mentioned sample light and the reference light are transmitted through the above-mentioned optical fiber.

較佳為上述光纖之長度為3 m以上,於攜帶之具備上述物鏡之部分的周圍環境與上述不攜帶之部分的周圍環境之溫度差為1℃以上之情形時,得到之光干涉斷層圖像之偏差為100 μm以下。Preferably, the length of the optical fiber is 3 m or more, and the optical interference tomographic image is obtained when the temperature difference between the surrounding environment of the part carrying the objective lens and the part not carrying the objective lens is 1°C or more. The deviation is less than 100 μm.

本發明亦係關於一種使用上述任一光干涉斷層攝影裝置之光干涉斷層攝影法。 [發明之效果] The present invention also relates to an optical interference tomography method using any of the above-mentioned optical interference tomography devices. [Effects of the invention]

根據本發明,可提供一種即便為可攜式亦不易產生斷層圖像之偏差且能一次性地對廣範圍進行斷層攝影之光干涉斷層攝影裝置、以及使用其之光干涉斷層攝影法。According to the present invention, it is possible to provide an optical interference tomography apparatus that is less likely to cause deviation in tomographic images even if it is portable and can perform tomography of a wide range at once, and an optical interference tomography method using the same.

於醫療領域中,一般使用如圖1所示之使用邁克生干涉儀之光干涉斷層攝影(OCT)裝置。於圖1之OCT裝置10中,從光源11輸出之光藉由耦合器12分割,產生通過包含循環器13及參照鏡14之光路之參照光、及通過包含循環器15及試樣16之光路之試樣光。上述參照光及試樣光藉由耦合器17耦合,干涉信號藉由光檢測器18檢測。In the medical field, an optical interference tomography (OCT) device using a Michelson interferometer as shown in Figure 1 is generally used. In the OCT device 10 of FIG. 1 , the light output from the light source 11 is split by the coupler 12 to generate reference light that passes through the optical path including the circulator 13 and the reference mirror 14 , and passes through the optical path including the circulator 15 and the sample 16 The sample light. The reference light and the sample light are coupled by the coupler 17 , and the interference signal is detected by the photodetector 18 .

於醫療領域中,通常,具備試樣光路之探測器及具備參照光路之OCT裝置本體(殼體)靠近地設置,且於同一室內使用。 與此相對,於工業領域等中,有時會要求攜帶探測器並對位於離OCT裝置本體(殼體)很遠之地點如室外之對象進行攝影。於此種情形時,於試樣光及參照光通過各自之光路之圖1之邁克生型OCT裝置中,存在下述問題:放置試樣光路(探測器)及參照光路(本體)之環境(溫度等)容易產生差異,由於光路長度之變化,所得到之斷層圖像之偏差(偏移)會變大。 In the medical field, usually, a detector with a sample optical path and an OCT device body (casing) with a reference optical path are installed close to each other and used in the same room. On the other hand, in the industrial field, etc., it is sometimes required to carry a detector and photograph an object located far away from the OCT device body (casing), such as outdoors. In this case, in the Michelson-type OCT device in Figure 1 where the sample light and the reference light pass through their respective optical paths, there are the following problems: the environment in which the sample light path (detector) and the reference light path (body) are placed ( Temperature, etc.) are prone to differences, and due to changes in optical path length, the deviation (offset) of the obtained tomographic image will become larger.

又,亦存在下述問題:醫療領域中所使用之OCT裝置係將重點放在了以高精度對眼球等極窄之範圍進行斷層攝影上,而難以應用於要求一次性地對廣範圍進行斷層攝影之領域中。In addition, there is also the following problem: OCT devices used in the medical field focus on tomographic imaging of a very narrow range such as the eyeball with high precision, and are difficult to apply to applications that require tomography of a wide range at once. In the field of photography.

本發明人等進行積極研究,結果發現,藉由使試樣光及參照光兩者通過物鏡並採用Fθ(F Theta)透鏡作為該物鏡,可解決上述問題,以致完成本發明之OCT裝置。The present inventors conducted active research and found that by passing both the sample light and the reference light through an objective lens and using an Fθ (F Theta) lens as the objective lens, the above problems can be solved, and the OCT device of the present invention was completed.

以下,對本發明進行具體說明。Hereinafter, the present invention will be described in detail.

本發明係關於一種光干涉斷層攝影(OCT)裝置,其具備使來自光源之光聚光於試樣之物鏡,且基於來自上述試樣之反射光即試樣光、及來自上述物鏡與上述試樣之間所設置的參照面之反射光即參照光之干涉,進行上述試樣之斷層攝影,並且上述試樣光及參照光兩者通過上述物鏡,上述物鏡係Fθ透鏡。The present invention relates to an optical interference tomography (OCT) apparatus, which is provided with an objective lens that condenses light from a light source on a sample, and is based on the reflected light from the sample, that is, the sample light, and the light from the above-mentioned objective lens and the above-mentioned sample. The interference of the reference light, which is the reflected light from the reference surface provided between the samples, is used to perform tomography of the sample, and both the sample light and the reference light pass through the objective lens, which is an Fθ lens.

於本發明之OCT裝置中,來自成為攝影對象之試樣之反射光即試樣光、及來自參照面之反射光即參照光兩者通過物鏡。藉由該構成,即便於使具備上述物鏡之部分(例如探測器)為可攜式之情形時,亦不會產生試樣光路與參照光路之環境差異,故而所得到之斷層圖像之偏差小。 再者,上述試樣光及參照光從上述物鏡之上述試樣側入射,出射至上述光源側。 In the OCT device of the present invention, both the sample light, which is the reflected light from the sample to be photographed, and the reference light, which is the reflected light from the reference surface, pass through the objective lens. With this configuration, even when the part equipped with the objective lens (such as a detector) is made portable, there will be no environmental difference between the sample optical path and the reference optical path, so the deviation of the tomographic image obtained will be small. . Furthermore, the sample light and the reference light are incident from the sample side of the objective lens and emitted to the light source side.

上述試樣光及參照光產生自來自光源之光。來自光源之光通過本發明之OCT裝置所具備之物鏡,聚光於試樣。將來自該試樣之反射光作為試樣光。又,來自上述光源之光之一部分藉由上述物鏡與上述試樣之間所設置之參照面反射,成為參照光。 上述試樣光及參照光較佳為均產生自通過上述物鏡之來自上述光源之光。與如習知之邁克生型OCT裝置般由通過物鏡前所分割之光分別產生試樣光及參照光之情形相比,可縮小試樣光路及參照光路之環境差異,且可進一步減少所得到之斷層圖像之偏差。 The above-mentioned sample light and reference light are generated from light from a light source. The light from the light source passes through the objective lens of the OCT device of the present invention and is focused on the sample. The reflected light from the sample is regarded as the sample light. In addition, part of the light from the light source is reflected by a reference surface provided between the objective lens and the sample, and becomes reference light. It is preferable that the sample light and the reference light are both generated from the light from the light source passing through the objective lens. Compared with the situation where the sample light and the reference light are generated separately from the light split in front of the objective lens like the conventional Michelson type OCT device, the environmental difference between the sample light path and the reference light path can be reduced, and the obtained light can be further reduced. Deviation of tomographic images.

本發明之OCT裝置所具備之物鏡係Fθ透鏡。藉由該構成,能一次性地對廣範圍進行斷層攝影。 上述Fθ透鏡係於將透鏡之焦點距離設為f時,使相對於透鏡之光軸以角度θ入射之光於焦點上自與光軸垂直之面之光軸出射至fθ之位置的透鏡。 The objective lens provided in the OCT device of the present invention is an Fθ lens. With this configuration, tomographic imaging of a wide range can be performed at once. The above-mentioned Fθ lens is a lens in which light incident at an angle θ with respect to the optical axis of the lens is emitted from the optical axis of a plane perpendicular to the optical axis at the focal point to a position fθ when the focal distance of the lens is set to f.

上述Fθ透鏡可為遠心Fθ透鏡,亦可為非遠心Fθ透鏡。 遠心Fθ透鏡係設計為主光線與透鏡之光軸平行之Fθ透鏡,即便透鏡與試樣之距離變動亦可得到高精度之斷層圖像這一方面較佳。 The above-mentioned Fθ lens may be a telecentric Fθ lens or a non-telecentric Fθ lens. The telecentric Fθ lens is an Fθ lens designed with the main ray parallel to the optical axis of the lens. It is better in that it can obtain high-precision tomographic images even if the distance between the lens and the sample changes.

於本發明之OCT裝置中,通過上述物鏡之光線可不必遠心地入射至試樣,但就得到更高精度之斷層圖像這一方面而言,較佳為以於儘量接近遠心之狀態入射之方式配置上述物鏡。In the OCT device of the present invention, the light passing through the objective lens does not need to be telecentrically incident on the sample. However, in order to obtain a more precise tomographic image, it is preferable to be incident as close to the telecentricity as possible. Configure the objective lens as above.

上述參照面較佳為以下述方式設置:於上述物鏡與上述試樣之間,且與上述物鏡之光軸垂直。 上述參照面只要為反射來自上述光源之光之至少一部分之面即可,但就容易以試樣光及參照光通過共通之光路之方式構成這一方面而言,較佳為「穿透來自上述光源之光之一部分並反射一部分」之面。於該態樣中,穿透上述參照面之光聚光於上述試樣,產生試樣光,另一方面,由上述參照面反射之光成為參照光。 The reference plane is preferably provided between the objective lens and the sample and perpendicular to the optical axis of the objective lens. The above-mentioned reference surface only needs to be a surface that reflects at least a part of the light from the above-mentioned light source. However, in order to easily configure the sample light and the reference light through a common optical path, it is preferably a surface that "penetrates" the light from the above-mentioned light source. A surface that reflects part of the light from the light source. In this aspect, the light passing through the reference surface is condensed on the sample to generate sample light, while the light reflected from the reference surface becomes reference light.

上述參照面較佳為參照構件所具有之平面,更佳為該參照構件之上述試樣側之表面。 上述參照構件較佳為穿透來自上述光源之光之一部分並反射一部分。 The reference surface is preferably a plane of the reference member, and more preferably is the surface of the reference member on the sample side. The reference member preferably transmits part of the light from the light source and reflects part of it.

作為構成上述參照構件之材料,可例舉結晶性材料,較佳為可用於光學窗之結晶,具體而言,可例舉MgF 2、石英(SiO 2)、藍寶石(Al 2O 3)、CaF 2、BaF 2、LiF、ZnSe等結晶。其中,就耐化學性優異之方面而言,較佳為選自由MgF 2、CaF 2、石英及藍寶石所組成之群中之至少1種。 適宜之態樣之一係:上述參照面為參照構件所具有之平面,該參照構件包含選自由MgF 2、CaF 2、石英及藍寶石所組成之群中之至少1種。 上述參照構件較佳為不施以塗布(例如用以調整反射之塗布)。 Examples of materials constituting the reference member include crystalline materials, preferably crystals that can be used for optical windows, and specific examples include MgF 2 , quartz (SiO 2 ), sapphire (Al 2 O 3 ), and CaF. 2. Crystals of BaF 2 , LiF, ZnSe, etc. Among them, in terms of excellent chemical resistance, at least one selected from the group consisting of MgF 2 , CaF 2 , quartz, and sapphire is preferred. A suitable aspect is that the reference plane is a plane of a reference member, and the reference member includes at least one selected from the group consisting of MgF 2 , CaF 2 , quartz, and sapphire. The above-mentioned reference member is preferably not coated (for example, coated to adjust reflection).

上述參照構件之形狀只要為具有平面之形狀即可,可為板狀、圓柱狀、角柱狀等,但較佳為圓柱狀。於為圓柱狀之情形時,亦可不必為正圓柱。又,於上述參照構件進而具有參照面以外之平面之情形時,參照面與其他平面亦可不必平行。The shape of the above-mentioned reference member only needs to be a flat shape, and may be a plate shape, a cylindrical shape, a corner prism shape, etc., but a cylindrical shape is preferred. In the case of a cylindrical shape, it does not need to be a right cylinder. Furthermore, when the reference member further has a plane other than the reference plane, the reference plane does not need to be parallel to the other plane.

上述參照構件之厚度(光軸方向之厚度)例如較佳為1~50 mm,更佳為10~30 mm。 再者,於上述參照構件之厚度不固定之情形時,較佳為最薄部及最厚部之厚度均處於上述範圍內。 The thickness of the reference member (thickness in the optical axis direction) is, for example, preferably 1 to 50 mm, more preferably 10 to 30 mm. Furthermore, when the thickness of the reference member is not fixed, it is preferable that the thickness of the thinnest part and the thickest part are both within the above range.

上述參照構件較佳為滿足下述關係式(1)。 nd≧Z max(1) (式中,nd表示上述參照構件之光學厚度,Z max表示可測量之距離。) 光學厚度係上述參照構件之折射率與實際之(幾何學上之)厚度之積。 可測量之距離由下述關係式(2)表示。 Z max=c/(4δf)             (2) (式中,c表示光速,δf表示OCT干涉信號採樣之頻率間隔。) 當使用滿足關係式(1)之參照構件時,基於來自上述參照構件之後方基底面(參照面之相反側之面)之後方反射的信號不出現於斷層圖像內(與深度超過0且未達Z max對應之範圍內),因此可得到更高精度之斷層圖像。 The above-mentioned reference member preferably satisfies the following relational expression (1). nd≧Z max (1) (In the formula, nd represents the optical thickness of the above reference member, and Z max represents the measurable distance.) The optical thickness is the product of the refractive index of the above reference member and the actual (geometric) thickness . The measurable distance is expressed by the following relational expression (2). Z max =c/(4δf) (2) (In the formula, c represents the speed of light, and δf represents the frequency interval of OCT interference signal sampling.) When using a reference component that satisfies the relationship (1), based on the parameters from the above reference component The signal reflected behind the base surface (the surface opposite the reference surface) does not appear in the tomographic image (in the range corresponding to the depth exceeding 0 and not reaching Z max ), so a higher-precision tomographic image can be obtained.

上述參照構件更佳為滿足下述關係式(3)。 n×WD>nd>n×Z max(3) (式中,n表示上述參照構件之折射率。WD表示OCT裝置之作動距離。nd及Z max如上所述。) 作動距離(working distance)係自聚焦時的物鏡之試樣側之最前表面至試樣之距離。 當使用滿足關係式(3)之參照構件時,可降低基於來自上述參照構件之後方基底面(參照面之反對側之面)之後方反射之重像的強度,可得到更高精度之斷層圖像。 就可進一步降低上述基於後方反射之重像的強度之方面而言,上述參照構件之厚度較佳為於滿足關係式(3)之範圍內且偏厚。又,亦較佳為使上述參照構件之後方基底面相對於參照面傾斜。 上述效果於設置下述去頻疊濾波器(低通濾波器)之情形時尤為顯著。 The above reference member preferably satisfies the following relational expression (3). n×WD>nd>n×Z max (3) (In the formula, n represents the refractive index of the above reference member. WD represents the operating distance of the OCT device. nd and Z max are as above.) The working distance (working distance) is The distance from the frontmost surface of the specimen side of the objective lens to the specimen during self-focusing. When using a reference member that satisfies relational expression (3), the intensity of the ghost image based on the rear reflection from the rear base surface of the reference member (the surface opposite to the reference surface) can be reduced, and a higher-precision tomogram can be obtained. picture. In order to further reduce the intensity of the ghost image due to rear reflection, the thickness of the reference member is preferably within a range that satisfies relational expression (3) and is thicker. Furthermore, it is also preferable that the rear base surface of the reference member is inclined relative to the reference surface. The above effect is particularly noticeable when a de-aliasing filter (low-pass filter) described below is set.

上述參照構件特佳為滿足下述關係式(4)。 nd=m×Z max(4) (式中,nd及Z max如上所述。m表示1以上之整數。) m較佳為1以上且20以下之整數,1以上且10以下之整數亦較佳。 當使用滿足關係式(4)之參照構件時,基於來自上述參照構件之後方基底面(參照面之反對側之面)之後方反射的信號與斷層圖像之端部(與深度0或Z max對應之位置)重合,因此對斷層圖像之影響少,可得到更高精度之斷層圖像。 It is particularly preferable that the above-mentioned reference member satisfies the following relational expression (4). nd = m good. When using a reference member that satisfies relational expression (4), the signal reflected from the rear base surface of the reference member (surface opposite to the reference surface) and the end of the tomographic image (corresponding to depth 0 or Z max The corresponding positions) overlap, so there is less impact on the tomographic image, and a higher-precision tomographic image can be obtained.

本發明之OCT裝置可為具備上述參照面(參照構件)者。The OCT device of the present invention may be provided with the above-mentioned reference surface (reference member).

本發明之OCT裝置較佳為以下述方式構成:可將上述參照面與上述試樣之距離設為0~3 cm地進行上述斷層攝影。當可如此使參照面與試樣接近時,作動距離變短,雜訊變小,且解析度變高,又,就聚焦到試樣之深處並可得到更深處的清晰之斷層圖像之方面而言較佳。本發明之OCT裝置係將Fθ透鏡用於物鏡,因此即便於如上所述參照面與試樣之距離接近之情形時,亦可高精度地進行斷層攝影。 當然,亦可使上述參照面與上述試樣之距離以大於上述距離之方式進行斷層攝影。 The OCT device of the present invention is preferably configured so that the tomography can be performed with the distance between the reference surface and the sample being 0 to 3 cm. When the reference surface and the sample can be brought close to each other in this way, the operating distance becomes shorter, the noise becomes smaller, and the resolution becomes higher. In addition, the depth of the sample can be focused and clearer tomographic images of deeper depths can be obtained. Better in terms of aspects. The OCT device of the present invention uses an Fθ lens as the objective lens, so even when the distance between the reference surface and the sample is close to each other as described above, tomography can be performed with high accuracy. Of course, tomography can also be performed by making the distance between the reference surface and the sample larger than the above distance.

上述光源可為低相干光源,較佳為「依時間使頻率(波長)變化地進行掃描」之頻率掃描光源。 作為上述頻率掃描光源,可使用利用波長掃描濾波器(由多面鏡進行之驅動、由電流計鏡進行之驅動等)之波長掃描雷射、FDML雷射、MEMS波長掃描光源(MEMS VCSEL、外部共振器型MEMS法布里培若(Fabry-Perot)雷射等)、SGDBR雷射等。 The above-mentioned light source can be a low-coherence light source, preferably a frequency-sweeping light source that "scans by changing the frequency (wavelength) over time." As the above-mentioned frequency scanning light source, wavelength scanning laser using a wavelength scanning filter (driving by a polygon mirror, driving by a galvanometer mirror, etc.), FDML laser, MEMS wavelength scanning light source (MEMS VCSEL, external resonance, etc.) can be used Device type MEMS Fabry-Perot laser, etc.), SGDBR laser, etc.

作為從上述光源輸出之光線,可例舉可見光線、紅外線,較佳為近紅外線(NIR)。作為上述光線較佳為使用波長800~2000 nm之光線。其中,就光源之穩定性或感測器之可靠性而言,更佳為以940±50 nm、1100±50 nm、1310±50 nm、1550±100 nm或1750±100 nm為中心波長之光線。Examples of the light output from the above-mentioned light source include visible rays and infrared rays, and preferably near-infrared rays (NIR). As the above-mentioned light, it is preferable to use light with a wavelength of 800 to 2000 nm. Among them, in terms of the stability of the light source or the reliability of the sensor, light with a central wavelength of 940±50 nm, 1100±50 nm, 1310±50 nm, 1550±100 nm or 1750±100 nm is better. .

本發明之OCT裝置可為具備上述光源者。The OCT device of the present invention may be equipped with the above-mentioned light source.

本發明之OCT裝置基於上述試樣光及上述參照光之干涉來進行上述試樣之斷層攝影。上述干涉只要為原理上使上述試樣光及參照光兩者可通過上述物鏡者即可,較佳為菲左型干涉或米勞型干涉,更佳為菲左型干涉。The OCT device of the present invention performs tomography of the sample based on the interference of the sample light and the reference light. The above-mentioned interference only needs to allow both the above-mentioned sample light and the reference light to pass through the above-mentioned objective lens in principle, and is preferably a Frisot-type interference or a Milau-type interference, and is more preferably a Frisot-type interference.

作為本發明之OCT裝置所能採用之OCT之種類,可例舉時域OCT(Time Domain OCT:TD-OCT)、傅立葉域OCT(Fourier Domain OCT:FD-OCT)等。作為FD-OCT,可例舉頻譜域OCT(Spectral Domain OCT:SD-OCT)、掃頻OCT(Swept Source OCT:SS-OCT)等。其中,就感度高、可測量之深度深之方面而言,較佳為SS-OCT。Examples of types of OCT that can be used by the OCT device of the present invention include Time Domain OCT (TD-OCT), Fourier Domain OCT (Fourier Domain OCT: FD-OCT), and the like. Examples of FD-OCT include Spectral Domain OCT (SD-OCT) and Sweep Source OCT (SS-OCT). Among them, SS-OCT is preferable in terms of high sensitivity and deep measurable depth.

本發明之OCT裝置較佳為進而具備將來自上述光源之光轉換為平行光之準直器。上述準直器較佳為設置於上述光源與上述物鏡之間之光路上。The OCT device of the present invention preferably further includes a collimator for converting light from the above-mentioned light source into parallel light. The collimator is preferably disposed on the optical path between the light source and the objective lens.

本發明之OCT裝置較佳為進而具備對聚光於上述試樣之來自上述光源之光進行掃描之掃描鏡。上述掃描鏡較佳為設置於上述光源與上述物鏡之間之光路上,更佳為設置於上述準直器與上述物鏡之間之光路上。The OCT device of the present invention preferably further includes a scanning mirror for scanning the light from the light source that is focused on the sample. The scanning mirror is preferably disposed on the optical path between the light source and the objective lens, and more preferably is disposed on the optical path between the collimator and the objective lens.

作為上述掃描鏡,可例舉電流計鏡、多面鏡、MEMS鏡等。其中較佳為電流計鏡,更佳為單軸或雙軸之電流計鏡,進而較佳為雙軸之電流計鏡。Examples of the scanning mirror include galvanometer mirrors, polygon mirrors, MEMS mirrors, and the like. Among them, a galvanometer mirror is preferred, a single-axis or dual-axis galvanometer mirror is more preferred, and a dual-axis galvanometer mirror is even more preferred.

本發明之OCT裝置較佳為進而具備用以驅動上述掃描鏡之驅動裝置。The OCT device of the present invention preferably further includes a driving device for driving the scanning mirror.

本發明之OCT裝置較佳為進而具備循環器,該循環器係將來自上述光源之光輸出至上述物鏡之側,並將通過上述物鏡之上述試樣光及參照光輸出至檢測該試樣光及參照光之檢測器之側。於該態樣中,可將上述試樣光及參照光藉由1個循環器進行傳輸。藉由如此構成,與如圖1所示般分別設置試樣光及參照光所通過之循環器之情形相比,可使裝置小型化,又,亦可降低成本。The OCT device of the present invention preferably further includes a circulator that outputs light from the light source to the side of the objective lens, and outputs the sample light and reference light passing through the objective lens to detect the sample light. and the reference light side of the detector. In this aspect, the sample light and reference light can be transmitted through one circulator. With this structure, compared with the case where separate circulators are provided for passing the sample light and the reference light as shown in FIG. 1 , the device can be miniaturized and the cost can also be reduced.

上述循環器較佳為具有3個以上之埠,更佳為具有3個埠。The above-mentioned circulator preferably has three or more ports, and more preferably has three ports.

上述循環器較佳為設置於上述光源與上述物鏡之間之光路上,更佳為設置於上述光源與上述準直器之間之光路上。 於3埠之循環器之情形時,來自上述光源之光自位於上述光源之側之第1埠輸入,自位於上述物鏡之側之第2埠輸出。通過上述物鏡之上述試樣光及參照光自第2埠輸入,自位於上述檢測器之側之第3埠輸出。 The circulator is preferably disposed on the optical path between the light source and the objective lens, and more preferably is disposed on the optical path between the light source and the collimator. In the case of a 3-port circulator, the light from the above-mentioned light source is input from the first port located on the side of the above-mentioned light source and output from the second port located on the side of the above-mentioned objective lens. The sample light and reference light passing through the objective lens are input from the second port and output from the third port located on the side of the detector.

本發明之OCT裝置較佳為進而具備檢測上述試樣光及參照光之檢測器(亦稱為檢測器(1))。檢測器(1)較佳為檢測由上述試樣光及參照光所產生之干涉信號。The OCT device of the present invention preferably further includes a detector (also referred to as detector (1)) for detecting the sample light and reference light. The detector (1) preferably detects the interference signal generated by the above-mentioned sample light and reference light.

檢測器(1)較佳為差動光檢測器。檢測器(1)亦可具有放大信號之功能。又,亦可另外設置放大器。The detector (1) is preferably a differential light detector. The detector (1) may also have the function of amplifying the signal. In addition, an amplifier may be provided separately.

本發明之OCT裝置較佳為進而具備耦合器(亦稱為耦合器(1)),該耦合器將來自上述光源之光分割成用於產生上述試樣光及參照光之分割光1、及用於去除干涉信號之直流成分之分割光2。耦合器(1)較佳為設置於上述光源與上述物鏡之間之光路上,更佳為設置於上述光源與上述循環器之間之光路上。The OCT device of the present invention preferably further includes a coupler (also referred to as a coupler (1)) that splits the light from the above-mentioned light source into the split light 1 for generating the above-mentioned sample light and reference light, and Split light 2 used to remove the DC component of the interference signal. The coupler (1) is preferably disposed on the optical path between the above-mentioned light source and the above-mentioned objective lens, and more preferably is disposed on the optical path between the above-mentioned light source and the above-mentioned circulator.

於設置耦合器(1)之情形時,上述分割光1與分割光2之強度比較佳為90:10~99:1,更佳為92:8~98:2。藉由分割成此種強度比,可有效地從干涉信號中去除直流成分。When the coupler (1) is provided, the intensity ratio of the split light 1 and the split light 2 is preferably 90:10 to 99:1, more preferably 92:8 to 98:2. By dividing into such intensity ratios, the DC component can be effectively removed from the interference signal.

本發明之OCT裝置較佳為進而具備檢測分割光2之檢測器(亦稱為檢測器(2))。檢測器(2)可為與上述檢測器(1)相同之檢測器,亦可為不同之檢測器。The OCT device of the present invention preferably further includes a detector (also referred to as detector (2)) for detecting the divided light 2. The detector (2) may be the same detector as the above-mentioned detector (1), or may be a different detector.

本發明之OCT裝置較佳為進而具備使分割光2衰減之衰減器。作為上述衰減器,較佳為可變光衰減器(VOA)。上述衰減器較佳為設置於上述耦合器(1)與檢測分割光2之檢測器(2)之間之光路上。The OCT device of the present invention preferably further includes an attenuator for attenuating the split light 2 . As the attenuator, a variable optical attenuator (VOA) is preferred. The above-mentioned attenuator is preferably arranged on the optical path between the above-mentioned coupler (1) and the detector (2) that detects the split light 2.

本發明之OCT裝置較佳為進而具備收集上述試樣光及參照光所產生之干涉信號之資料收集(DAQ)裝置。上述DAQ裝置較佳為含有A/D轉換器。上述DAQ裝置較佳為將所收集之干涉信號轉換為數位資料。The OCT device of the present invention is preferably further equipped with a data acquisition (DAQ) device that collects interference signals generated by the sample light and reference light. The above DAQ device preferably includes an A/D converter. The above DAQ device preferably converts the collected interference signals into digital data.

本發明之OCT裝置較佳為進而具備使超過上述可測量之距離(Z max)之不需要之頻率成分衰減的去頻疊濾波器(亦稱為低通濾波器)。上述去頻疊濾波器較佳為設置於上述檢測器(1)與上述DAQ裝置之間之光路上。 The OCT device of the present invention preferably further includes a de-aliasing filter (also called a low-pass filter) that attenuates unnecessary frequency components exceeding the measurable distance (Z max ). The above-mentioned de-aliasing filter is preferably disposed on the optical path between the above-mentioned detector (1) and the above-mentioned DAQ device.

本發明之OCT裝置較佳為進而具備運算裝置,該運算裝置產生基於上述試樣光及參照光之干涉信號之光干涉斷層圖像。上述運算裝置根據強度等特性使干涉信號圖像化,藉此產生光干涉斷層圖像。The OCT device of the present invention preferably further includes a computing device that generates an optical interference tomographic image based on the interference signal of the sample light and the reference light. The above-mentioned computing device images the interference signal based on characteristics such as intensity, thereby generating an optical interference tomographic image.

本發明之OCT裝置較佳為進而具備顯示所得到之光干涉斷層圖像之顯示裝置。上述顯示裝置可為固定型,亦可為可攜式,但若為可攜式,因可於攝影現場確認圖像故較佳。又,與上述運算裝置之連接可為有線亦可為無線。上述顯示裝置可為1個,亦可為複數個。The OCT device of the present invention is preferably further provided with a display device that displays the obtained optical interference tomographic image. The above-mentioned display device may be a fixed type or a portable type, but a portable type is preferred because the image can be confirmed at the shooting site. In addition, the connection with the above-mentioned computing device may be wired or wireless. There may be one display device or a plurality of display devices.

將本發明之OCT裝置之一例示於圖2,但本發明之OCT裝置並不限於此。 於圖2之OCT裝置100中,頻率掃描光源101輸出OCT所使用之光。頻率掃描光源101於每次開始頻率掃描時輸出觸發信號。又,藉由馬赫-岑得干涉儀檢測光,且輸出用於進行頻率等間隔採樣之K時脈訊號。 從頻率掃描光源101輸出之光於耦合器102中以95:5之強度比分割成用於產生試樣光及參照光之分割光1、及用於去除干涉信號之直流成分所使用之分割光2。分割光1輸入至循環器103之埠1並從埠2輸出,通過數米長度之光纖傳輸至探測器104。 於探測器104中,分割光1藉由準直器105轉換為平行光之後,藉由電流計鏡106反射,入射至Fθ透鏡即物鏡107。電流計鏡106藉由電流計鏡驅動器111驅動,將上述平行光於與光軸垂直之XY方向上進行掃描。入射至物鏡107之平行光通過參照構件108而聚光於攝影對象即試樣110,於試樣面上反射而作為試樣光入射至物鏡107。又,入射至物鏡107之平行光之一部分於參照構件108所具有之參照面109上反射,作為參照光入射至物鏡107。 入射至物鏡107之試樣光及參照光於通過電流計鏡106、準直器105之後,通過光纖輸入至循環器103之埠2並從埠3輸出,繼而,輸入至差動光檢測放大器113。差動光檢測放大器113對基於試樣光及參照光之干涉的干涉信號進行檢測並放大。 於耦合器102中分割出之分割光2於藉由可變光衰減器112衰減之後,輸入至差動光檢測放大器113。差動光檢測放大器113利用分割光2之信號,去除上述干涉信號所含有之直流成分。 藉由差動光檢測放大器113去除直流成分,且經放大之干涉信號由PC 114所具備之DAQ裝置(A/D轉換器)收集,並轉換為數位資料。干涉信號之收集根據頻率掃描光源101所發出之觸發信號而開始,與K時脈訊號同步地進行。 再者,於差動光檢測放大器113與DAQ裝置之間,設置有使超過可測量之距離(Z max)之不需要之頻率成分衰減的去頻疊濾波器(未圖示)。 PC 114所具備之運算裝置基於藉由DAQ裝置轉換之干涉信號,產生試樣110之光干涉斷層圖像,並顯示於行動顯示器115。 An example of the OCT device of the present invention is shown in FIG. 2 , but the OCT device of the present invention is not limited thereto. In the OCT device 100 of FIG. 2 , the frequency scanning light source 101 outputs the light used for OCT. The frequency scanning light source 101 outputs a trigger signal each time frequency scanning is started. In addition, the light is detected by a Mach-Zehnder interferometer, and a K clock signal for sampling at equal frequency intervals is output. The light output from the frequency scanning light source 101 is split in the coupler 102 at an intensity ratio of 95:5 into split light 1 used to generate the sample light and reference light, and split light used to remove the DC component of the interference signal. 2. Split light 1 is input to port 1 of the circulator 103 and output from port 2, and is transmitted to the detector 104 through an optical fiber of several meters in length. In the detector 104, the split light 1 is converted into parallel light by the collimator 105, is reflected by the galvanometer mirror 106, and is incident on the Fθ lens, that is, the objective lens 107. The galvanometer mirror 106 is driven by the galvanometer mirror driver 111 to scan the parallel light in the XY direction perpendicular to the optical axis. The parallel light incident on the objective lens 107 passes through the reference member 108 and is focused on the sample 110 which is the imaging object, and is reflected on the sample surface and enters the objective lens 107 as sample light. In addition, part of the parallel light incident on the objective lens 107 is reflected on the reference surface 109 of the reference member 108 and enters the objective lens 107 as reference light. The sample light and reference light incident on the objective lens 107 pass through the galvanometer mirror 106 and the collimator 105, then are input to port 2 of the circulator 103 through the optical fiber and output from port 3, and then input to the differential light detection amplifier 113 . The differential light detection amplifier 113 detects and amplifies an interference signal based on the interference of the sample light and the reference light. The split light 2 split by the coupler 102 is attenuated by the variable optical attenuator 112 and then input to the differential light detection amplifier 113 . The differential light detection amplifier 113 uses the signal of the split light 2 to remove the DC component contained in the interference signal. The DC component is removed by the differential light detection amplifier 113, and the amplified interference signal is collected by the DAQ device (A/D converter) provided by the PC 114 and converted into digital data. The collection of interference signals starts according to the trigger signal sent by the frequency scanning light source 101, and is performed synchronously with the K clock signal. Furthermore, a de-aliasing filter (not shown) that attenuates unnecessary frequency components exceeding a measurable distance (Z max ) is provided between the differential light detection amplifier 113 and the DAQ device. The computing device provided by the PC 114 generates an optical interference tomographic image of the sample 110 based on the interference signal converted by the DAQ device, and displays it on the mobile display 115 .

本發明之OCT裝置較佳為以下述方式構成:使用者可攜帶具備上述物鏡之部分並進行上述斷層攝影。本發明之OCT裝置即便於如此使具備上述物鏡之部分為可攜式之情形時,亦不會產生試樣光路與參照光路之環境差異,因此所得到之斷層圖像之偏差小。The OCT device of the present invention is preferably configured in such a manner that a user can carry the part equipped with the objective lens and perform the tomography. Even when the part equipped with the objective lens is made portable in this way, the OCT device of the present invention does not cause environmental differences between the sample optical path and the reference optical path, so the deviation of the tomographic image obtained is small.

具備上述物鏡之部分較佳為進而具備上述參照面(或參照構件)、上述準直器及上述掃描鏡。 具備上述物鏡之部分較佳為OCT裝置之探測器。 The part provided with the objective lens preferably further includes the reference surface (or reference member), the collimator, and the scanning mirror. The part equipped with the above-mentioned objective lens is preferably a detector of an OCT device.

本發明之OCT裝置較佳為以下述方式構成:使用者可手持具備上述物鏡之部分來進行上述斷層攝影;更佳為以下述方式構成:使用者可單手持具備上述物鏡之部分來進行上述斷層攝影。The OCT device of the present invention is preferably configured in such a manner that a user can hold the part equipped with the objective lens to perform the tomography; more preferably, it is configured in a manner that the user can hold the part equipped with the objective lens with one hand to perform the tomography. Photography.

本發明之OCT裝置除了具備上述物鏡之部分以外,亦可具備於斷層攝影時使用者所能攜帶之部分。作為該部分,例如可例舉用以驅動上述掃描鏡之驅動裝置或上述顯示裝置。In addition to the above-mentioned objective lens part, the OCT device of the present invention may also have a part that can be carried by the user during tomography. Examples of this part include a driving device for driving the scanning mirror or the display device.

於本發明之OCT裝置中,較佳為經由光纖將所攜帶之具備上述物鏡之部分與不攜帶之部分連接,來自上述光源之光、以及上述試樣光及參照光通過上述光纖而傳輸。於該態樣中,即便於攝影對象位於離上述不攜帶之部分很遠之地點的情形時,亦可藉由調整上述光纖之長度來使具備上述物鏡之部分於攝影對象附近而進行斷層攝影。來自上述光源之光、以及上述試樣光及參照光均通過上述光纖而傳輸,因此即便於使上述光纖變長之情形時,亦不會產生試樣光路與參照光路之環境差異,所得到之斷層圖像之偏差小。又,由於是使用上述光纖之有線型,因此即便對位於離上述不攜帶之部分很遠之地點的攝影對象亦可實施高解析度之OCT測量。In the OCT device of the present invention, it is preferable that the carried part equipped with the objective lens and the non-carried part are connected through optical fibers, and the light from the above-mentioned light source, the above-mentioned sample light and the reference light are transmitted through the above-mentioned optical fibers. In this aspect, even when the imaging subject is located far away from the non-carrying part, tomography can be performed by adjusting the length of the optical fiber so that the part equipped with the objective lens is close to the imaging subject. The light from the above-mentioned light source, as well as the above-mentioned sample light and reference light are all transmitted through the above-mentioned optical fiber. Therefore, even if the above-mentioned optical fiber is lengthened, there will be no environmental difference between the sample optical path and the reference optical path, and the obtained The deviation of the tomographic image is small. In addition, since it is a wired type using the above-mentioned optical fiber, high-resolution OCT measurement can be performed even on the imaging subject located at a location far away from the above-mentioned non-carrying part.

上述光纖之長度並無特別限定,可根據攝影對象所在之地點決定,例如可為1 m以上,較佳為3 m以上,更佳為5 m以上,進而較佳為10 m以上。又,可為100 m以下,亦可為50 m以下。The length of the optical fiber is not particularly limited and can be determined according to the location of the photographic object. For example, it can be 1 m or more, preferably 3 m or more, more preferably 5 m or more, and still more preferably 10 m or more. Moreover, it may be 100 m or less, or it may be 50 m or less.

上述不攜帶之部分較佳為例如具備上述光源、上述循環器、上述檢測器、上述DAQ裝置、上述運算裝置等。 上述不攜帶之部分較佳為OCT裝置本體(殼體)。 The non-portable part preferably includes, for example, the light source, the circulator, the detector, the DAQ device, the arithmetic device, and the like. The above-mentioned non-portable part is preferably the OCT device body (casing).

於除了具備上述物鏡之部分以外還有攜帶之部分的情形時,該部分與具備上述物鏡之部分或上述不攜帶之部分的連接不必限定於藉由光纖之連接,例如亦可為藉由電線之連接。In the case where there is a portable part in addition to the part equipped with the above-mentioned objective lens, the connection between the part and the part equipped with the above-mentioned objective lens or the above-mentioned non-portable part is not necessarily limited to the connection through an optical fiber, and may also be through a wire, for example. connection.

本發明之OCT裝置較佳為上述光纖之長度為3 m以上,於攜帶之具備上述物鏡之部分的周圍環境與上述不攜帶之部分的周圍環境之溫度差為1℃以上之情形時,得到之光干涉斷層圖像之偏差為100 μm以下。 於工業領域等中,存在攝影對象位於離OCT裝置本體(殼體)很遠之地點、室外、高溫或低溫之設施內之情形。於此種情形時,探測器與OCT裝置本體之環境(溫度)會產生大之差異,因此於試樣光路位於探測器側且參照光路位於本體側之OCT裝置中,試樣光路與參照光路之環境差異會導致所得到之斷層圖像產生大之偏差。相對於此,本發明之OCT裝置即便於如上所述之情形時,亦不會產生試樣光路與參照光路之環境差異,因此所得到之斷層圖像之偏差小。 In the OCT device of the present invention, it is preferable that the length of the optical fiber is 3 m or more, and the temperature difference between the surrounding environment of the portable part equipped with the objective lens and the surrounding environment of the non-carried part is 1°C or more. The deviation of the optical interference tomography image is less than 100 μm. In the industrial field, etc., there are cases where the photographic subject is located far away from the OCT device body (casing), outdoors, or in a facility with high or low temperature. In this case, there will be a big difference in the environment (temperature) between the detector and the OCT device body. Therefore, in an OCT device in which the sample optical path is located on the detector side and the reference optical path is located on the body side, the difference between the sample optical path and the reference optical path is Environmental differences will lead to large deviations in the obtained tomographic images. In contrast, the OCT device of the present invention does not cause environmental differences between the sample optical path and the reference optical path even in the above-mentioned situation, so the deviation of the obtained tomographic image is small.

上述態樣中之光纖之長度較佳為3 m以上,更佳為5 m以上,進而較佳為10 m以上。又,可為100 m以下,亦可為50 m以下。The length of the optical fiber in the above aspect is preferably 3 m or more, more preferably 5 m or more, and further preferably 10 m or more. Moreover, it may be 100 m or less, or it may be 50 m or less.

上述態樣中之上述環境之溫度差較佳為1℃以上,更佳為5℃以上,進而較佳為10℃以上。又,上述溫度差較佳為50℃以下。In the above-mentioned aspect, the temperature difference of the above-mentioned environment is preferably 1°C or more, more preferably 5°C or more, and further preferably 10°C or more. Moreover, it is preferable that the said temperature difference is 50 degreeC or less.

上述光干涉斷層圖像之偏差較佳為100 μm以下,更佳為50 μm以下,特佳為30 μm以下。 上述偏差(ΔZ)係由下述式(A)規定: ΔZ(μm)=dn/dT(1/℃)×L(m)×10 6×2×Δt(℃)     (A) (式中,dn/dT表示光纖材質之折射率之溫度係數(1/℃),L表示光纖之長度(m),Δt表示試樣光路與參照光路之溫度差(℃))。 上述ΔZ係光學距離之偏差。 於光纖材質為石英玻璃,光之波長為1.3 μm,溫度為接近室溫之情形時,dn/dT為約1.9×10 -5(1/℃)。 The deviation of the optical interference tomography image is preferably 100 μm or less, more preferably 50 μm or less, and particularly preferably 30 μm or less. The above deviation (ΔZ) is specified by the following formula (A): ΔZ (μm) = dn/dT (1/℃) × L (m) × 10 6 × 2 × Δt (℃) (A) (where, dn/dT represents the temperature coefficient of the refractive index of the optical fiber material (1/°C), L represents the length of the optical fiber (m), and Δt represents the temperature difference between the sample optical path and the reference optical path (°C)). The above ΔZ is the deviation of the optical distance. When the fiber material is quartz glass, the wavelength of light is 1.3 μm, and the temperature is close to room temperature, dn/dT is approximately 1.9×10 -5 (1/℃).

於試樣光路位於探測器側且參照光路位於本體側之OCT裝置中,攜帶之具備上述物鏡之部分的周圍環境與上述不攜帶之部分的周圍環境之溫度差幾乎直接地反映在光路之溫度差Δt,因此所得到之斷層圖像之偏差ΔZ大。相對於此,於本發明之OCT裝置中,即便於攜帶之具備上述物鏡之部分的周圍環境與上述不攜帶之部分的周圍環境之溫度差大之情形時,光路之溫度差Δt極小,因此ΔZ亦極小。In an OCT device in which the sample optical path is located on the detector side and the reference optical path is located on the main body side, the temperature difference between the surrounding environment of the part that carries the objective lens and the part that does not carry it is almost directly reflected in the temperature difference in the optical path. Δt, so the deviation ΔZ of the obtained tomographic image is large. On the other hand, in the OCT device of the present invention, even when there is a large temperature difference between the surrounding environment of the part where the objective lens is carried and the part where it is not carried, the temperature difference Δt in the optical path is extremely small, so ΔZ Also extremely small.

將本發明之OCT裝置之另一例(使具備物鏡之部分為可攜式之例)示於圖3,但本發明之OCT裝置並不限於此。 於圖3中,使用者201單手持OCT裝置之探測器202,將用以驅動探測器202所內置之電流計鏡之電流計鏡驅動器205置於腰。探測器202經由光纖203而與OCT裝置之殼體206連接。電流計鏡驅動器205經由電線204而與探測器202及殼體206連接。 於殼體206,收納有光源、檢測器、DAQ裝置、運算裝置等。 Another example of the OCT device of the present invention (an example in which the part equipped with the objective lens is made portable) is shown in FIG. 3 , but the OCT device of the present invention is not limited to this. In FIG. 3 , a user 201 holds the detector 202 of the OCT device with one hand and places the galvanometer mirror driver 205 used to drive the galvanometer mirror built in the detector 202 on his waist. The detector 202 is connected to the housing 206 of the OCT device via an optical fiber 203 . The galvanometer mirror driver 205 is connected to the detector 202 and the housing 206 via a wire 204 . The housing 206 houses a light source, a detector, a DAQ device, a computing device, and the like.

本發明之OCT裝置較佳為以下述方式構成:於每次使用下述光源之斷層攝影時,使可利用10 μm以上之解析度進行攝影之面方向之區域為長0.1~14 mm、寬0.1~14 mm之範圍。藉此,(即使於使用其他光源之情形時亦)能一次性地對廣範圍進行高精度地斷層攝影。 (光源) AXSUN公司之高速波長掃描光源(中心波長:1310 nm;掃描寬度:100 nm;A-scan速率:50 kHz;輸出:25 mW;相干長度:12 mm) The OCT device of the present invention is preferably configured in such a way that the area in the plane direction that can be photographed with a resolution of 10 μm or more is 0.1 to 14 mm long and 0.1 wide each time a tomography is performed using the following light source. ~14 mm range. This enables high-precision tomography of a wide range at once (even when using other light sources). (light source) AXSUN's high-speed wavelength scanning light source (center wavelength: 1310 nm; scan width: 100 nm; A-scan rate: 50 kHz; output: 25 mW; coherence length: 12 mm)

使用本發明之OCT裝置,可進行試樣之光干涉斷層攝影。本發明亦關於一種使用上述本發明之OCT裝置之光干涉斷層攝影法。 於本發明之光干涉斷層攝影法中,即便於使用者攜帶具備上述物鏡之部分(例如探測器)並進行斷層攝影之情形時,亦不會產生試樣光路與參照光路之環境差異,因此所得到之斷層圖像之偏差小。又,能一次性地對廣範圍進行斷層攝影。 Using the OCT device of the present invention, optical interference tomography of a sample can be performed. The present invention also relates to an optical interference tomography method using the OCT device of the present invention. In the optical interference tomography method of the present invention, even when the user carries a part (such as a detector) equipped with the above-mentioned objective lens and performs tomography, there will be no environmental difference between the sample optical path and the reference optical path. Therefore, The deviation of the obtained tomographic image is small. In addition, tomography can be performed on a wide range at once.

本發明之OCT裝置及光干涉斷層攝影法無關領域,可合適地用於所有光干涉斷層攝影。如上所述,即便於使OCT裝置之一部分為可攜式之情形時,亦不易產生斷層圖像之偏差,又,能一次性地對廣範圍進行斷層攝影,因此尤其可於工業領域中合適地使用。 [實施例] The OCT device of the present invention has nothing to do with the field of optical interference tomography, and can be suitably used in all optical interference tomography. As described above, even when part of the OCT device is made portable, deviations in tomographic images are less likely to occur, and tomography of a wide range can be performed at once. Therefore, it is particularly suitable for use in the industrial field. use. [Example]

接著舉出實施例對本發明進行進一步詳細說明,但本發明並不僅限於該等實施例。Next, the present invention will be described in further detail with reference to Examples, but the present invention is not limited to these Examples.

實施例1 使用具有圖2所示之構成之OCT裝置,從厚7.8 mm、長25 mm、寬25 mm之氟樹脂片材之PFA層側進行OCT攝影,上述氟樹脂片材係依序積層有厚3.1 mm之聚四氟乙烯(PTFE)層、厚0.4 mm之四氟乙烯/六氟丙烯共聚物(FEP)層及厚4.3 mm之四氟乙烯/全氟(烷基乙烯基醚)共聚物(PFA)層者。將所得到之斷層圖像(長8 mm×寬8 mm)示於圖4。 以下表示所使用之OCT裝置及攝影條件之詳細情況。 OCT用掃描雷射光源:中心波長:1310 nm;掃描寬度:100 nm;A-scan速率:50 kHz;輸出:25 mW;相干長度:12 mm 物鏡:Fθ透鏡(商品名:Thorlabs公司製造之LSM04),有效波長範圍(1250~1380 nm),有效焦點距離(54 mm) 參照構件:石英玻璃製,圓柱筒形,直徑20 mm ,長度20 mm 光纖:石英玻璃製,長度10 m 攝影溫度:26℃ 參照面與試樣之距離:0 cm 其他攝影條件:亮度100,對比度30 Example 1 Using an OCT device having the structure shown in Figure 2, OCT imaging was performed from the PFA layer side of a fluororesin sheet with a thickness of 7.8 mm, a length of 25 mm, and a width of 25 mm. The above fluororesin sheets were laminated in sequence. 3.1 mm thick polytetrafluoroethylene (PTFE) layer, 0.4 mm thick tetrafluoroethylene/hexafluoropropylene copolymer (FEP) layer and 4.3 mm thick tetrafluoroethylene/perfluoro (alkyl vinyl ether) copolymer (PFA) layer. The obtained tomographic image (length 8 mm × width 8 mm) is shown in Figure 4. Details of the OCT device used and photography conditions are shown below. Scanning laser light source for OCT: central wavelength: 1310 nm; scan width: 100 nm; A-scan rate: 50 kHz; output: 25 mW; coherence length: 12 mm Objective: Fθ lens (trade name: LSM04 manufactured by Thorlabs) ), effective wavelength range (1250~1380 nm), effective focus distance (54 mm) Reference component: quartz glass, cylindrical shape, diameter 20 mm , length 20 mm Optical fiber: made of quartz glass, length 10 m Photography temperature: 26°C Distance between reference surface and sample: 0 cm Other photography conditions: brightness 100, contrast 30

比較例1 除了將物鏡變更為非Fθ透鏡之消色差透鏡(商品名:Thorlabs公司製造之AC254-050-C;有效波長範圍:1050~1700 nm;有效焦點距離:50 mm)以外,以與實施例1相同之方式進行OCT攝影。將所得到之斷層圖像(長8 mm×寬8 mm)示於圖5。 Comparative example 1 It is the same as Example 1 except that the objective lens is changed to an achromatic lens other than an Fθ lens (trade name: AC254-050-C manufactured by Thorlabs; effective wavelength range: 1050 to 1700 nm; effective focal length: 50 mm). method for OCT photography. The obtained cross-sectional image (length 8 mm × width 8 mm) is shown in Figure 5.

於圖4中,斷層圖像整體清晰且均勻,相對於此,於圖5中,用虛線包圍之部分以外雜訊非常多,可知有效視野較窄(未能完成廣範圍之斷層攝影)。In Figure 4, the overall tomographic image is clear and uniform. In contrast, in Figure 5, there is a lot of noise outside the part enclosed by the dotted line, indicating that the effective field of view is narrow (wide-range tomography cannot be completed).

比較例2 使用具有圖1所示之構成之OCT裝置,且藉由乾燥機僅將樣品臂之光纖加熱至40℃,再進行外徑12 mm、內徑8 mm之氟樹脂管之剖面方向之OCT攝影。將所得到之斷層圖像示於圖6。 以下表示所使用之OCT裝置及攝影條件之詳細情況。 OCT用掃描雷射光源:中心波長:1310 nm;掃描寬度:100 nm;A-scan速率:50 kHz;輸出:25 mW;相干長度:12 mm 物鏡:Fθ透鏡(商品名:Thorlabs公司製造之LSM03),有效波長範圍(1250~1380 nm),有效焦點距離(36 mm) 光纖(樣品臂、參考臂):石英玻璃製,長度4 m 攝影溫度:26℃ 其他攝影條件:亮度100,對比度30 Comparative example 2 An OCT device with the structure shown in Figure 1 was used, and only the optical fiber of the sample arm was heated to 40°C by a dryer, and then OCT photography was performed in the cross-sectional direction of a fluororesin tube with an outer diameter of 12 mm and an inner diameter of 8 mm. The obtained tomographic image is shown in Figure 6 . Details of the OCT device used and photography conditions are shown below. Scanning laser light source for OCT: central wavelength: 1310 nm; scan width: 100 nm; A-scan rate: 50 kHz; output: 25 mW; coherence length: 12 mm Objective lens: Fθ lens (trade name: LSM03 manufactured by Thorlabs), effective wavelength range (1250~1380 nm), effective focus distance (36 mm) Optical fiber (sample arm, reference arm): made of quartz glass, length 4 m Photography temperature: 26℃ Other photography conditions: brightness 100, contrast 30

參考例1 除了不加熱樣品臂之光纖以外,以與比較例2相同之方式,進行OCT攝影。將所得到之斷層圖像示於圖7。 Reference example 1 OCT imaging was performed in the same manner as in Comparative Example 2 except that the optical fiber of the sample arm was not heated. The obtained tomographic image is shown in Figure 7 .

於使臂間產生溫度差之圖6中,與圖7相比管之斷層圖像於深度方向朝上方偏移2 mm以上,且與管表層部對應之部分超出畫面外。又,圖6中亦見到為反射雜訊之假影(圖像上部之逆圓弧之像)。In Figure 6 where a temperature difference is generated between the arms, the tomographic image of the tube is shifted upward by more than 2 mm in the depth direction compared to Figure 7, and the portion corresponding to the surface of the tube is outside the frame. In addition, artifacts caused by reflection noise (the image of an inverse arc in the upper part of the image) are also seen in Figure 6.

10:OCT裝置 11:光源 12,17:耦合器 13,15:循環器 14:參照鏡 16:試樣 18:光檢測器 ①,②,③:埠 100:OCT裝置 101:頻率掃描光源 102:耦合器 103:循環器 104:探測器 105:準直器 106:電流計鏡 107:物鏡 108:參照構件 109:參照面 110:試樣 111:電流計鏡驅動器 112:可變光衰減器 113:差動光檢測放大器 114:PC 115:行動顯示器 201:使用者 202:探測器 203:光纖 204:電線 205:電流計鏡驅動器 206:殼體 10:OCT device 11:Light source 12,17:Coupler 13,15: Circulator 14: Reference mirror 16:Sample 18:Light detector ①,②,③:port 100:OCT device 101: Frequency scanning light source 102:Coupler 103: Circulator 104:Detector 105:Collimator 106: Galvanometer mirror 107:Objective lens 108:Reference component 109:Reference surface 110:Sample 111: Galvanometer mirror driver 112:Variable optical attenuator 113: Differential light detection amplifier 114:PC 115:Mobile monitor 201:User 202:Detector 203:Optical fiber 204:Wire 205: Galvanometer mirror driver 206: Shell

[圖1]係表示習知之光干涉斷層攝影(OCT)裝置之一例之示意圖。 [圖2]係表示本發明之OCT裝置之一例之示意圖。 [圖3]係表示本發明之OCT裝置之另一例之示意圖。 [圖4]係表示實施例1中所得到之OCT圖像之圖。 [圖5]係表示比較例1中所得到之OCT圖像之圖。 [圖6]係表示比較例2中所得到之OCT圖像之圖。 [圖7]係表示參考例1中所得到之OCT圖像之圖。 [Fig. 1] is a schematic diagram showing an example of a conventional optical interference tomography (OCT) apparatus. [Fig. 2] is a schematic diagram showing an example of the OCT device of the present invention. [Fig. 3] is a schematic diagram showing another example of the OCT device of the present invention. [Fig. 4] A diagram showing an OCT image obtained in Example 1. [Fig. 5] A diagram showing an OCT image obtained in Comparative Example 1. [Fig. 6] A diagram showing an OCT image obtained in Comparative Example 2. [Fig. 7] A diagram showing an OCT image obtained in Reference Example 1.

Figure 110135128-A0304-11-0001-8
,
Figure 110135128-A0304-11-0001-9
,
Figure 110135128-A0304-11-0001-10
:埠
Figure 110135128-A0304-11-0001-8
,
Figure 110135128-A0304-11-0001-9
,
Figure 110135128-A0304-11-0001-10
:port

100:OCT裝置 100:OCT device

101:頻率掃描光源 101: Frequency scanning light source

102:耦合器 102:Coupler

103:循環器 103: Circulator

104:探測器 104:Detector

105:準直器 105:Collimator

106:電流計鏡 106: Galvanometer mirror

107:物鏡 107:Objective lens

108:參照構件 108:Reference component

109:參照面 109:Reference surface

110:試樣 110:Sample

111:電流計鏡驅動器 111: Galvanometer mirror driver

112:可變光衰減器 112:Variable optical attenuator

113:差動光檢測放大器 113: Differential light detection amplifier

114:PC 114:PC

115:行動顯示器 115:Mobile monitor

Claims (10)

一種光干涉斷層攝影(OCT)裝置,其具備使來自光源之光聚光於試樣之物鏡、對聚光於上述試樣之來自上述光源之光進行掃描之掃描鏡、及耦合器,且基於來自上述試樣之反射光即試樣光、及來自上述物鏡與上述試樣之間所設置的參照面之反射光即參照光之干涉,進行上述試樣之斷層攝影,並且上述試樣光及參照光兩者通過上述物鏡,上述物鏡係Fθ透鏡,來自上述光源之光為以1100±50nm、1310±50nm或1550±100nm為中心波長之光線,上述參照面為滿足下述關係式(3):n×WD>nd>n×Zmax (3)(式中,n表示參照構件之折射率,WD表示OCT裝置之作動距離,nd表示參照構件之光學厚度,Zmax表示由下述關係式(2):Zmax=c/(4δf) (2)(式中,c表示光速,δf表示OCT干涉信號採樣之頻率間隔)表示之可測量之距離)之參照構件所具有之平面,上述耦合器將來自上述光源之光分割成用於產生上述試樣光及參照光之分割光1、及用於去除干涉信號之直流成分之分割光2,且分割光1與分割光2之強度比為90:10~99:1。 An optical interference tomography (OCT) device is provided with an objective lens that focuses light from a light source on a sample, a scanning mirror that scans the light from the light source that is focused on the sample, and a coupler, and is based on The interference of the reflected light from the above-mentioned sample, that is, the sample light, and the reflected light from the reference surface provided between the above-mentioned objective lens and the above-mentioned sample, that is, the reference light, performs tomography of the above-mentioned sample, and the above-mentioned sample light and Both reference lights pass through the above-mentioned objective lens. The above-mentioned objective lens is an Fθ lens. The light from the above-mentioned light source is light with a central wavelength of 1100±50nm, 1310±50nm or 1550±100nm. The above-mentioned reference plane satisfies the following relational expression (3) : n×WD>nd>n×Z max (3) (where n represents the refractive index of the reference member, WD represents the operating distance of the OCT device, nd represents the optical thickness of the reference member, and Z max represents the following relational expression (2): Z max =c/(4δf) (2) (where c represents the speed of light, δf represents the frequency interval of OCT interference signal sampling) represents the measurable distance) of the reference member, the above-mentioned coupling The device splits the light from the above-mentioned light source into the split light 1 used to generate the above-mentioned sample light and reference light, and the split light 2 used to remove the DC component of the interference signal, and the intensity ratio of the split light 1 and the split light 2 is 90:10~99:1. 如請求項1之光干涉斷層攝影裝置,其以下述方式構成:可將上述參照面與上述試樣之距離設為0~3cm地進行上述斷層攝影。 The optical interference tomography apparatus according to claim 1 is configured in such a manner that the tomography can be performed with the distance between the reference surface and the sample being 0 to 3 cm. 如請求項1或2之光干涉斷層攝影裝置,其中,上述參照面係參照構件所具有之平面,該參照構件包含選自由MgF2、CaF2、石英及藍寶石所組成之群中之至少1種。 The optical interference tomography device of claim 1 or 2, wherein the reference plane is a plane of a reference member, and the reference member includes at least one selected from the group consisting of MgF 2 , CaF 2 , quartz and sapphire. . 如請求項1或2之光干涉斷層攝影裝置,其中,上述試樣光及參照光兩者產生自通過上述物鏡之來自上述光源之光。 The optical interference tomography device of claim 1 or 2, wherein both the sample light and the reference light are generated from the light from the light source passing through the objective lens. 如請求項1或2之光干涉斷層攝影裝置,其中,上述干涉為菲左型干涉。 The optical interference tomography device of claim 1 or 2, wherein the above-mentioned interference is a Festo-type interference. 如請求項1或2之光干涉斷層攝影裝置,其進而具備循環器,該循環器係將來自上述光源之光輸出至上述物鏡之側,並將通過上述物鏡之上述試樣光及參照光輸出至檢測該試樣光及參照光之檢測器之側。 The optical interference tomography device of claim 1 or 2 further includes a circulator that outputs the light from the above-mentioned light source to the side of the above-mentioned objective lens, and outputs the above-mentioned sample light and reference light that pass through the above-mentioned objective lens. to the side of the detector that detects the sample light and reference light. 如請求項1或2之光干涉斷層攝影裝置,其以下述方式構成:使用者可攜帶具備上述物鏡之部分並進行上述斷層攝影。 The optical interference tomography device according to claim 1 or 2 is configured in such a way that a user can carry the part equipped with the objective lens and perform the tomography. 如請求項7之光干涉斷層攝影裝置,其經由光纖將攜帶之具備上述物鏡之部分與不攜帶之部分連接,來自上述光源之光、以及上述試樣光及參照光通過上述光纖而傳輸。 An optical interference tomography device according to Claim 7, which connects a carrying part equipped with the objective lens and a non-carrying part via an optical fiber, and the light from the above-mentioned light source, the above-mentioned sample light and the reference light are transmitted through the above-mentioned optical fiber. 如請求項8之光干涉斷層攝影裝置,其中,上述光纖之長度為3m以上,於攜帶之具備上述物鏡之部分的周圍環境與上述不攜帶之部分的周圍環境之溫度差為1℃以上之情形時,得到之光干涉斷層圖像之偏差為100μm以下。 The optical interference tomography device according to claim 8, wherein the length of the optical fiber is 3 m or more, and the temperature difference between the surrounding environment of the portable part with the objective lens and the surrounding environment of the non-carried part is 1°C or more. When, the deviation of the obtained optical interference tomography image is less than 100 μm. 一種光干涉斷層攝影法,其使用請求項1至9中任一項之光干涉斷層攝影裝置。 An optical interference tomography method using the optical interference tomography device according to any one of claims 1 to 9.
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