TWI830073B - Optical lens device and optical measuring method - Google Patents
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- 238000005259 measurement Methods 0.000 description 33
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0252—Constructional arrangements for compensating for fluctuations caused by, e.g. temperature, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a photometer; Purge systems, cleaning devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0214—Constructional arrangements for removing stray light
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
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- G—PHYSICS
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- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M99/00—Subject matter not provided for in other groups of this subclass
- G01M99/002—Thermal testing
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
- G02B7/022—Mountings, adjusting means, or light-tight connections, for optical elements for lenses lens and mount having complementary engagement means, e.g. screw/thread
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
- G02B7/028—Mountings, adjusting means, or light-tight connections, for optical elements for lenses with means for compensating for changes in temperature or for controlling the temperature; thermal stabilisation
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Abstract
Description
本發明是有關於一種光學測量設備,特別是指一種光學鏡頭裝置及光學量測方法。 The present invention relates to an optical measurement equipment, and in particular to an optical lens device and an optical measurement method.
參閱圖1,一種現有的光學測量設備1,適用於量測一待測元件11所發出之一光束的光學特性,並包含一用於供該待測元件11設置的平台12、一用於供該待測元件11電連接的探針卡13,及一適用於接收該待測元件11之光束的物鏡14。如此,使用者可以透過調整該平台12以提供該待測元件11不同的環境溫度,並透過該探針卡13供該待測元件11電連接而發光,而能透過物鏡14接受該光束供一攝像件(圖未示)拍攝一照片,藉此,使用者可以透過分析該影像而了解該待測元件11的光束特性。
Referring to Figure 1, an existing
惟,在測量時,於某些測試方法(溫度迴圈測試、熱衝擊測試、高低溫儲存測試)下,該平台12會與該物鏡14產生溫差,
此時,由於該物鏡14與該待測元件11間為自由空間(free space),前述溫差會因為熱對流現象而在該自由空間內產生氣流,使待測元件11所發出的光束,會因為氣流之氣體密度而產生的折射率變化,而不斷改變光路,造成該攝像件所拍攝之照片出現畸變或模糊的現象,亦稱為氣動光學現象(aero-optical effect),進而導致量測時,量測重複性低且精準度低之缺點。
However, during measurement, under certain test methods (temperature loop test, thermal shock test, high and low temperature storage test), a temperature difference will occur between the
因此,本發明之其中一目的,即在提供一種提升量測重複性與提高精準度的光學鏡頭裝置。 Therefore, one of the objectives of the present invention is to provide an optical lens device that improves measurement repeatability and accuracy.
於是,本發明光學鏡頭裝置在一些實施態樣中,適用於接收一待測物所發出之待測光束,並包含一鏡頭,及一套筒組。 Therefore, in some embodiments, the optical lens device of the present invention is suitable for receiving the light beam to be measured emitted by an object to be measured, and includes a lens and a sleeve set.
該鏡頭包括一外殼。該外殼具有一適用於接收該待測光束的入光側。 The lens includes a housing. The housing has a light incident side adapted to receive the light beam to be measured.
該套筒組環繞設置於該外殼的入光側並界定出適用於供該待測光束通過的一收光空間,以使該待測光束不受氣流擾動影響。 The sleeve group is arranged around the light incident side of the housing and defines a light collection space suitable for the light beam to be measured to pass through, so that the light beam to be measured is not affected by air flow disturbance.
在一些實施態樣中,該套筒組包括一環繞於該外殼的第一套筒,及一連接於該第一套筒的第二套筒,該第二套筒可相對於該第一套筒移動,藉以調整該套筒組的長度。 In some implementations, the sleeve set includes a first sleeve surrounding the housing, and a second sleeve connected to the first sleeve. The second sleeve can be relative to the first sleeve. The barrel moves to adjust the length of the sleeve group.
在一些實施態樣中,該套筒組的長度介於5mm~50mm。 In some implementations, the length of the sleeve set is between 5 mm and 50 mm.
在一些實施態樣中,該第一套筒具有一形成在鄰近於該第二套筒之一側的外凸緣,該第二套筒具有一形成在鄰近於該第一套筒之一側且用於靠抵於該外凸緣的內凸緣。 In some embodiments, the first sleeve has an outer flange formed on one side adjacent to the second sleeve, and the second sleeve has an outer flange formed on one side adjacent to the first sleeve. and for leaning against the inner flange of the outer flange.
在一些實施態樣中,該套筒組可拆卸地安裝於該鏡頭的外殼。 In some implementations, the sleeve set is detachably mounted on the housing of the lens.
在一些實施態樣中,還包含一固定組,該固定組用於圍繞並迫緊該套筒組,使該套筒組可拆卸地固定於該鏡頭。 In some embodiments, a fixing group is further included, the fixing group is used to surround and press the sleeve group so that the sleeve group can be detachably fixed to the lens.
在一些實施態樣中,該固定組包括二共同圍繞於該第一套筒的緊固件,及二連接該等緊固件的鎖固件,該等鎖固件與該等緊固件相配合使該第一套筒迫緊並固定於該鏡頭。 In some embodiments, the fixing group includes two fasteners surrounding the first sleeve and two locking parts connecting the fasteners. The locking parts cooperate with the fasteners to secure the first sleeve. The sleeve is tightened and secured to the lens.
在一些實施態樣中,該第一套筒還具有一形成在一外表面且該固定組嵌設的環槽。 In some embodiments, the first sleeve further has an annular groove formed on an outer surface and in which the fixing group is embedded.
在一些實施態樣中,該第一套筒還具有至少一缺槽,該固定組圍繞該至少一缺槽,以調整該第一套筒在被該固定組環繞之部分的內徑。 In some embodiments, the first sleeve further has at least one notch, and the fixing group surrounds the at least one notch to adjust the inner diameter of the first sleeve in the portion surrounded by the fixing group.
因此,本發明之另一目的,即在提供一種提升量測重複性與提高精準度的光學量測方法。 Therefore, another object of the present invention is to provide an optical measurement method that improves measurement repeatability and accuracy.
於是,本發明光學鏡頭裝置在一些實施態樣中,適用於 接收一待測物所發出之待測光束,並包含以下步驟。 Therefore, in some embodiments, the optical lens device of the present invention is suitable for Receive a beam to be measured emitted by an object to be measured and include the following steps.
(A)預備一用於發出待測光束的待測物、一鏡頭,及一環繞設置於該鏡頭之外殼的套筒組,該套筒組界定出一收光空間。 (A) Prepare an object to be measured for emitting a light beam to be measured, a lens, and a sleeve set surrounding the housing of the lens. The sleeve set defines a light collection space.
(B)該鏡頭接收自該收光空間通過的待測光束,該收光空間使該待測光束不受氣流擾動影響。 (B) The lens receives the light beam to be measured passing through the light collecting space, and the light collecting space prevents the light beam to be measured from being affected by air flow disturbance.
本發明至少具有以下功效:透過該套筒組使該待測光束不受氣流擾動影響,以防止氣流進入該收光空間,並使該收光空間內的溫度維持一致,藉此使該待測光束不會因氣流產生的擾動而偏折,藉此,達到提升量測精準度及重複性的功效。 The present invention at least has the following effects: through the sleeve group, the light beam to be measured is not affected by air flow disturbance, so as to prevent air flow from entering the light collecting space, and maintain the temperature in the light collecting space consistent, thereby making the light beam to be measured The beam will not be deflected by disturbances caused by airflow, thereby improving measurement accuracy and repeatability.
1:光學測量設備 1: Optical measurement equipment
11:待測元件 11: Component under test
12:平台 12:Platform
13:探針卡 13: Probe card
14:物鏡 14:Objective lens
2:鏡頭 2: Lens
21:外殼 21: Shell
211:入光側 211: light incident side
212:出光側 212: Light side
3:套筒組 3:Socket set
31:第一套筒 31:First sleeve
311:第一筒壁 311:First cylinder wall
312:外表面 312:Outer surface
313:第一端面 313: First end face
314:第二端面 314:Second end face
315:外凸緣 315:Outer flange
316:環槽 316: Ring groove
317:缺槽 317: missing slot
32:第二套筒 32:Second sleeve
321:第二筒壁 321:Second cylinder wall
322:第三端面 322:Third end face
323:第四端面 323:Fourth end face
324:內凸緣 324:Inner flange
30:收光空間 30: Lighting space
4:固定組 4: Fixed group
41:緊固件 41: Fasteners
42:鎖固件 42:Lock firmware
5:測量平台 5:Measurement platform
6:待測物 6:Object to be tested
7:電性探測單元 7: Electrical detection unit
本發明之其他的特徵及功效,將於參照圖式的實施方式中清楚地呈現,其中:圖1是現有的光學測量設備之一剖視示意圖;圖2是本發明光學鏡頭的一實施例的一立體組合圖;圖3是該實施例的一立體分解圖;圖4是沿圖2之線IV-IV所截取的不完整的剖視示意圖,說明該實施例應用於一種光學測量設備;圖5是類似於圖4的不完整的剖視示意圖,且該實施例的該第二套筒抵靠於一測量平台; 圖6是類似於圖5的不完整的剖視示意圖,說明該實施例應用於另一種光學測量設備;及圖7是沿圖5之線VII-VII所截取的剖視圖。 Other features and effects of the present invention will be clearly presented in the embodiments with reference to the drawings, in which: Figure 1 is a schematic cross-sectional view of an existing optical measurement device; Figure 2 is an embodiment of an optical lens of the present invention. A three-dimensional assembled view; Figure 3 is a three-dimensional exploded view of this embodiment; Figure 4 is an incomplete cross-sectional schematic view taken along line IV-IV of Figure 2, illustrating that this embodiment is applied to an optical measurement device; Figure 5 is an incomplete cross-sectional schematic view similar to Figure 4, and the second sleeve of this embodiment is against a measurement platform; FIG. 6 is an incomplete cross-sectional schematic view similar to FIG. 5 , illustrating application of this embodiment to another optical measurement device; and FIG. 7 is a cross-sectional view taken along line VII-VII of FIG. 5 .
參閱圖2、圖3與圖4,本發明光學鏡頭裝置之一實施例適用於接收一設置於一測量平台5之待測物6所發出之待測光束,並包含一鏡頭2、一套筒組3,及一固定組4。
Referring to Figures 2, 3 and 4, one embodiment of the optical lens device of the present invention is suitable for receiving a light beam to be measured emitted by an object to be measured 6 disposed on a
該鏡頭2包括一外殼21。該外殼21具有一適用於接收該待測光束的入光側211,及一相反於該入光側211的出光側212。
The
該套筒組3環繞設置於該外殼21的入光側211並界定出適用於供該待測光束通過的一收光空間30,以使該待測光束不受氣流擾動影響。由於該收光空間30並非自由空間,可以減少因環境溫差(例如:該鏡頭2與該測量平台5的溫度差)所產生的氣流擾動現象,此外,由於該待測光束是通過該收光空間30內進入該入光側211,意即,即使該收光空間30外有氣流擾動,前述的氣流擾動也會因為該套筒組3的阻擋而無法進入該收光空間30。因此,該待測光束可以減少因氣流擾動所產生的光路變化,使每次該鏡頭2接收該待測光束的光路維持一致,藉此達到提升量測精準度及重複性的功效。
The sleeve set 3 is arranged around the light incident side 211 of the
具體來說,該套筒組3包括一可拆卸地固定於該外殼21的第一套筒31,及一連接於該第一套筒31的第二套筒32。
Specifically, the sleeve set 3 includes a
該第一套筒31具有一第一筒壁311、一外表面312、一鄰近於該鏡頭2的第一端面313、一相反於該第一端面313的第二端面314、一自該外表面312靠近該第二端面314處徑向往外凸伸的外凸緣315、一自該外表面312靠近該第一端面313處徑向內凹的環槽316,及四個形成於該第一筒壁311並自該第一端面313朝該第二端面314延伸且連通於該環槽316的缺槽317。
The
該第二套筒32可移動地套設於該第一套筒31外,並具有一第二筒壁321、一第三端面322、一相反於該第三端面322的第四端面323,及一自該第二筒壁321的內表面靠近該第三端面322處徑向凸伸的內凸緣324。該第二筒壁321的內徑大於該第一套筒31的外凸緣315的外徑,且該內凸緣324的內徑小於該外凸緣315的外徑並與該第一筒壁311的外徑相配合。藉由該內凸緣324的內徑小於該外凸緣315的外徑,可使該內凸緣324抵靠於該外凸緣315,以防止該第二套筒32脫離該第一套筒31。藉由該內凸緣324的內徑與該第一筒壁311的外徑相配合,使該內凸緣324可在該外凸緣315與該環槽316之間沿該第一筒壁311移動,以調整該套筒組3的長度。在本實施例中,該套筒組3的長度定義為該第一端面313與該第四端面323之間的距離,且該套筒組3的長度較佳介於5mm~50mm之
間。
The
如圖4所示,當該第二套筒32的內凸緣324靠抵於該第一套筒31的外凸緣315時,該第二套筒32的第四端面323最遠離該第一套筒31的第一端面313,此時,該套筒組3的長度最長。
As shown in FIG. 4 , when the
如圖5所示,該第二套筒32的第四端面323可靠抵於該測量平台5,使該內凸緣324離開該第一套筒31的外凸緣315並往靠近該第一端面313方向移動,而縮短該套筒組3的長度。故該套筒組3的長度能依據使用需求而調整。
As shown in FIG. 5 , the
具體而言,在本實施例所應用的一種光學測量設備中,該測量平台5具備點測、承載該待測物6、使該待測物6導電與加熱(或冷卻)該待測物6的功能。在進行光學量測時,使用者可以控制該鏡頭2上下移動,以找到最佳成像位置(例如:該待測光束的光腰位置(beam waist))。當該鏡頭2需要較靠近該待測物6時,可使該第二套筒32的第四端面323靠抵於該測量平台5,並縮短該套筒組3的長度。當該鏡頭2需要較遠離該待測物6時,往上移動該鏡頭2可以連動該第一套筒31,且該第二套筒32受重力作用可以不移動,直到該外凸緣315抵於該內凸緣324才能帶動該第二套筒32,如此即可增加該套筒組3的長度。換言之,藉由該第二套筒32可相對於該第一套筒31移動,使該套筒組3的長度可以被調整,能提供調整該鏡頭2與該待測物6之距離的彈性,以利於找到最佳成像位置,並確保
該待測光束能保持在該收光空間30內。為使該待測光束能保持在該收光空間30內,以避免氣流擾動的影響,在使用時,該第二套筒32的第四端面323與該測量平台5的距離以不大於30mm較佳。
Specifically, in an optical measurement device used in this embodiment, the
參閱圖6,值得說明的是,本實施例也可以應用於另一種光學測量設備,該光學測量設備除了該測量平台5外,還包含一電性探測單元7,其中,該測量平台5具備點測功能,至於承載該待測物6、使該待測物6導電與加熱(或冷卻)該待測物6的功能則是透過該電性探測單元7(例如:探針卡)提供。同樣地,在進行光學量測時,若要使該鏡頭2較靠近該待測物6時,可以藉由該第二套筒32的第四端面323靠抵於該電性探測單元7,使該第二套筒32往上移動而縮短該套筒組3的長度。
Referring to Figure 6, it is worth noting that this embodiment can also be applied to another optical measurement equipment. In addition to the
參閱圖3、圖4與圖7,該固定組4用於圍繞並迫緊該套筒組3,使該套筒組3可拆卸地固定於該鏡頭2。
Referring to FIG. 3 , FIG. 4 and FIG. 7 , the
該固定組4包括二共同圍繞於該第一套筒31的C形緊固件41,及二將該等緊固件41鎖接的鎖固件42。該等緊固件41嵌合於該第一套筒31的環槽316,且圍繞該等缺槽317。藉由該等缺槽317使該第一筒壁311具有縮小內徑的彈性。該等鎖固件42與該等緊固件41相配合使該第一筒壁311迫緊於該鏡頭2的外殼21,使該第一套筒31固定於該鏡頭2。如此,由於該第一套筒31設有該等缺槽317,使該等緊固件41嵌合於該第一套筒31的環槽316時,該
等緊固件41可以與該等鎖固件42相配合,而能輕易調整該第一套筒31在環槽316處的內徑,使該第一套筒31能穩定地連接於該鏡頭2之外殼21。
The
透過設置該固定組4,使用者可以根據不同的待測物6的待測光束特性或是不同的測試環境,而容易更換不同長度、不同伸縮範圍或不同內徑的該套筒組3。
By arranging the fixed
值得注意的是,在本實施例中,該等缺槽317的數量為四,且等角度地設置在該第一套筒31,在其他變化態樣中,該等缺槽317的數量也可以是非四的整數。
It is worth noting that in this embodiment, the number of the
本發明光學量測方法的一實施例,包含以下步驟101~步驟102。 An embodiment of the optical measurement method of the present invention includes the following steps 101 to 102.
步驟101:預備一用於發出待測光束的待測物6、一鏡頭2,及一環繞設置於該鏡頭2之外殼21的套筒組3。該套筒組3界定出一收光空間30。
Step 101: Prepare an
在本實施例中,是透過前述的固定組4將該套筒組3環繞設置於該鏡頭組2。
In this embodiment, the
步驟102:該鏡頭2接收自該收光空間30通過的該待測物6所發出之待測光束,該收光空間30使該待測光束不受氣流擾動影響。
Step 102: The
更進一步的,該光學量測方法還包含步驟103:加熱或
冷卻該待測物6。
Furthermore, the optical measurement method also includes step 103: heating or
Cool the
具體來說,是透過前述的該測量平台5或該電性探測單元7與該待測物6進行熱交換,以加熱或冷卻該待測物6,藉此對待測物6進行不同的測試,例如:熱迴圈測試、熱衝擊測試、高溫儲存測試、低溫儲存測試等測試方式,使用者可根據不同的測試方式,使該測量平台5或該電性探測單元7對該待測物6加熱或冷卻。
Specifically, the
如此,透過設置該套筒組3使該待測光束不受氣流擾動影響,使得在加熱或冷卻該待測物6的過程中,該待測光束不會因氣流產生的擾動而偏折。
In this way, by arranging the
綜上所述,本發明光學鏡頭裝置與該光學量測方法,由於透過設置該套筒組3使該待測光束不受氣流擾動影響,以防止氣流進入該收光空間30,並使該收光空間30內的溫度維持一致,藉此使該待測光束不會因氣流產生的擾動而偏折,故確實能達成本發明之提升量測精準度及重複性的目的。
To sum up, the optical lens device and the optical measurement method of the present invention prevent the light beam to be measured from being affected by air flow disturbance by arranging the
惟以上所述者,僅為本發明之實施例而已,當不能以此限定本發明實施之範圍,凡是依本發明申請專利範圍及專利說明書內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。 However, the above are only examples of the present invention, and should not be used to limit the scope of the present invention. All simple equivalent changes and modifications made based on the patent scope of the present invention and the content of the patent specification are still within the scope of the present invention. Within the scope covered by the patent of this invention.
2:鏡頭 2: Lens
21:外殼 21: Shell
211:入光側 211: light incident side
212:出光側 212: Light side
3:套筒組 3:Socket set
31:第一套筒 31:First sleeve
311:第一筒壁 311:First cylinder wall
312:外表面 312:Outer surface
313:第一端面 313: First end face
314:第二端面 314:Second end face
315:外凸緣 315:Outer flange
316:環槽 316: Ring groove
32:第二套筒 32:Second sleeve
321:第二筒壁 321:Second cylinder wall
322:第三端面 322:Third end face
323:第四端面 323:Fourth end face
324:內凸緣 324:Inner flange
30:收光空間 30: Lighting space
4:固定組 4: Fixed group
41:緊固件 41: Fasteners
42:鎖固件 42:Lock firmware
5:測量平台 5:Measurement platform
6:待測物 6:Object to be tested
Claims (9)
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US17/959,443 US20230124939A1 (en) | 2021-10-19 | 2022-10-04 | Optical lens assembly and optical measurement method |
JP2022166607A JP2023061385A (en) | 2021-10-19 | 2022-10-18 | Optical lens assembly and optical measurement method |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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US7140744B2 (en) * | 2003-09-30 | 2006-11-28 | The Boeing Company | Lamp assembly for a pressure sensitive paint measuring system |
CN104297169A (en) * | 2014-10-23 | 2015-01-21 | 中国科学院合肥物质科学研究院 | Stable compact type laser-transceiving integrated detection light path structure |
TWM560036U (en) * | 2016-10-09 | 2018-05-11 | Lumos Technology Co Ltd | Light source and image capture assembly with airtight passage and insulated case |
CN113188765A (en) * | 2021-04-23 | 2021-07-30 | 长光卫星技术有限公司 | Test system for MTF and anti-dispersion test of visible light detector |
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US5764409A (en) * | 1996-04-26 | 1998-06-09 | Alpha Innotech Corp | Elimination of vibration by vibration coupling in microscopy applications |
JP3171985U (en) * | 2011-09-15 | 2011-11-24 | 炎 喬 | Microscope camera adapter |
JP6663772B2 (en) * | 2016-03-29 | 2020-03-13 | オリンパス株式会社 | Laser scanning microscope |
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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US7140744B2 (en) * | 2003-09-30 | 2006-11-28 | The Boeing Company | Lamp assembly for a pressure sensitive paint measuring system |
CN104297169A (en) * | 2014-10-23 | 2015-01-21 | 中国科学院合肥物质科学研究院 | Stable compact type laser-transceiving integrated detection light path structure |
TWM560036U (en) * | 2016-10-09 | 2018-05-11 | Lumos Technology Co Ltd | Light source and image capture assembly with airtight passage and insulated case |
CN113188765A (en) * | 2021-04-23 | 2021-07-30 | 长光卫星技术有限公司 | Test system for MTF and anti-dispersion test of visible light detector |
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