TWI827476B - Meter reading device and reading method for meter - Google Patents
Meter reading device and reading method for meter Download PDFInfo
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- 238000000034 method Methods 0.000 title claims abstract description 25
- 238000012360 testing method Methods 0.000 claims abstract description 28
- 108091008695 photoreceptors Proteins 0.000 claims description 210
- 206010034960 Photophobia Diseases 0.000 claims description 51
- 208000013469 light sensitivity Diseases 0.000 claims description 51
- 206010034972 Photosensitivity reaction Diseases 0.000 claims description 38
- 230000036211 photosensitivity Effects 0.000 claims description 38
- 230000003068 static effect Effects 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 10
- 230000035945 sensitivity Effects 0.000 description 8
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Description
本發明是有關於一種儀表的讀取技術,且特別是有關於一種儀表讀取裝置及儀表的讀取方法。 The present invention relates to an instrument reading technology, and in particular, to an instrument reading device and an instrument reading method.
在工廠等環境中,諸多設備具備用來呈現資訊的儀表,從而呈現出儀器的情形。然而,由於諸多國家因少子化、高齡化而形成人口負成長的情形下,許多工廠逐漸面臨人力不足,因此全球製造業正在加速工廠自動化的進程,進而節省人力資源。然而,具備類比式儀表的設備佔大多數,若要全部替換掉這些設備便需付出高昂的建置成本。若可利用相應設備來對儀表中呈現的數值進行讀取與監控的話,或可降低工廠自動化的建置成本。 In environments such as factories, many devices have instruments used to present information, thus presenting the appearance of instruments. However, due to negative population growth in many countries due to declining birthrates and aging, many factories are gradually facing a shortage of manpower. Therefore, the global manufacturing industry is accelerating the process of factory automation to save human resources. However, the majority of equipment has analog instruments, and replacing all of them would require high construction costs. If corresponding equipment can be used to read and monitor the values presented in the instrument, the construction cost of factory automation may be reduced.
本發明提供一種儀表讀取裝置及儀表的讀取方法,其可高速獲知待測儀表上的數值,以立即性地進行儀表數值的回饋,從而達成設備監控。 The present invention provides an instrument reading device and an instrument reading method, which can obtain the values on the instrument to be measured at high speed and provide immediate feedback of the instrument values, thereby achieving equipment monitoring.
本發明實施例的儀表讀取裝置包括多個光線發射器、多個感光器以及處理器。多個光線發射器配置於一感測平面上,所述光線發射器用以向一發射方向發出多個第一光線。多個感光器配置於所述感測平面上。所述感光器感測一第二光線以產生對應的多個當前感光值,所述第二光線是所述第一光線照射至一待測儀表並受到反射的光線。處理器獲得所述當前感光值,依據所述當前感光值判斷所述待測儀表中的一指針位置,並基於所述感光器與所述待測儀表的一相對位置關係而利用所述指針位置獲得一儀表數值。 The meter reading device according to the embodiment of the present invention includes multiple light emitters, multiple photoreceptors and a processor. A plurality of light emitters are arranged on a sensing plane, and the light emitters are used to emit a plurality of first light rays in a emission direction. A plurality of photoreceptors are arranged on the sensing plane. The photoreceptor senses a second light to generate corresponding multiple current photosensitivity values. The second light is the light that the first light irradiates to an instrument to be measured and is reflected. The processor obtains the current photosensitivity value, determines a pointer position in the instrument under test based on the current photosensitivity value, and uses the pointer position based on a relative position relationship between the photoreceptor and the instrument under test. Get a meter value.
本發明實施例所述儀表的讀取方法適用於包括多個光線發射器及多個感光器的一儀表讀取裝置。所述讀取方法包括下列步驟:在將所述儀表讀取裝置與一待測儀表相互配置之後,逐一控制每個所述光線發射器以向一發射方向發出一第一光線,並獲得所述感光器所產生的多個當前感光值,其中所述光線發射器及所述感光器配置於一感測平面上;依據每個所述感光器所產生的所述當前感光值判斷所述待測儀表的一指針位置;以及,基於所述感光器與所述待測儀表的一相對位置關係,依據所述指針位置計算並獲得一儀表數值。 The instrument reading method described in the embodiment of the present invention is suitable for an instrument reading device including multiple light emitters and multiple photoreceptors. The reading method includes the following steps: after configuring the instrument reading device and an instrument to be measured, controlling each of the light emitters one by one to emit a first light in an emission direction, and obtaining the A plurality of current light sensitivity values generated by a photoreceptor, wherein the light emitter and the photoreceptor are arranged on a sensing plane; judging the object to be measured based on the current light sensitivity value generated by each of the photoreceptors. A pointer position of the instrument; and, based on a relative positional relationship between the photoreceptor and the instrument to be measured, calculate and obtain an instrument value based on the pointer position.
基於上述,本發明實施例所述的儀表讀取裝置及儀表的讀取方法可在感測平面上設置多個光線發射器與多個感光器,並利用這些光線發射器與感光器來偵測待測儀表中的指針位置,並基於感光器與待測儀表的相對位置關係獲知每個感光器所處位置 所對應的刻度值,進而利用與前述指針位置最接近的感光器的刻度值來計算並獲得儀表數值。並且,本實施例的儀表讀取裝置可與待測儀表十分接近,從而可將儀表讀取裝置進行輕薄化設計,並且感光器偵測得到的數值易於進行分析與進行後續資料處理,因此本發明各實施例所提出的儀表讀取裝置及相應技術更可降低建置成本。 Based on the above, the instrument reading device and the instrument reading method described in the embodiments of the present invention can provide multiple light emitters and multiple photoreceptors on the sensing plane, and use these light emitters and photoreceptors to detect The position of the pointer in the instrument under test, and the location of each photoreceptor based on the relative position of the photoreceptor and the instrument under test The corresponding scale value is then used to calculate and obtain the meter value by using the scale value of the photoreceptor closest to the aforementioned pointer position. Moreover, the meter reading device of this embodiment can be very close to the meter to be measured, so that the meter reading device can be designed to be thin and light, and the values detected by the photoreceptor are easy to analyze and perform subsequent data processing. Therefore, the present invention The meter reading device and corresponding technology proposed in each embodiment can further reduce the construction cost.
100:儀表讀取裝置 100: Meter reading device
110:儀表讀取裝置的本體 110: The body of the meter reading device
120:簍空區域 120: Empty area
130:印刷電路板 130:Printed circuit board
200:待測儀表 200: Instrument to be tested
210:指針 210:Pointer
220:待測儀表的中心點 220: Center point of the instrument under test
410、410_1~410_10:光線發射器 410, 410_1~410_10: Light emitter
420:光線控制器 420:Light controller
430、430_1~430_10:感光器 430, 430_1~430_10: Photoreceptor
440:處理器 440: Processor
510:印刷電路板的點 510: Printed circuit board points
S610~S690:步驟 S610~S690: steps
圖1是依照本發明一實施例的一種儀表讀取裝置的外觀示意圖。 Figure 1 is a schematic diagram of the appearance of an instrument reading device according to an embodiment of the present invention.
圖2是本實施例中待測儀表的示意圖。 Figure 2 is a schematic diagram of the instrument to be tested in this embodiment.
圖3是圖1儀表讀取裝置與圖2待測儀表相互配置後的外觀示意圖。 Figure 3 is a schematic diagram of the appearance of the instrument reading device in Figure 1 and the instrument under test in Figure 2 after they are configured with each other.
圖4是依照本發明一實施例的一種儀表讀取裝置的方塊圖。 Figure 4 is a block diagram of a meter reading device according to an embodiment of the present invention.
圖5是圖1中印刷電路板及相應配置元件的放大示意圖。 FIG. 5 is an enlarged schematic diagram of the printed circuit board and corresponding configuration components in FIG. 1 .
圖6是依照本發明一實施例的一種儀表的讀取方法的流程圖。 Figure 6 is a flow chart of a method for reading an instrument according to an embodiment of the present invention.
為了說明上的便利和明確,圖式中各元件的厚度或尺寸,係以誇張或省略或概略的方式表示,以供熟悉此技藝之人士之瞭解與閱讀,且每個元件的尺寸並未完全為其實際的尺寸,並非用以 限定本發明可實施之限定條件,故不具技術上之實質意義,任何結構之修飾、比例關係之改變或大小之調整,在不影響本發明所能產生之功效及所能達成之目的下,均仍應落在本發明所揭示之技術內容涵蓋之範圍內。在所有圖式中相同的標號將用於表示相同或相似的元件。 For the convenience and clarity of explanation, the thickness or size of each component in the drawings is exaggerated, omitted or schematically expressed to facilitate the understanding and reading of those familiar with this art, and the size of each component is not complete. their actual size and are not intended to be The conditions that limit the implementation of the present invention have no technical substantive significance. Any structural modifications, changes in proportions, or adjustments in size will not affect the effects that the present invention can produce and the purposes that can be achieved. It should still fall within the scope of the technical content disclosed in the present invention. The same reference numbers will be used throughout the drawings to refer to the same or similar elements.
本發明各實施例可利用光線發射器與感光器以及相應資料處理所構成的儀表讀取裝置來精確地讀取各類型且具備指針的儀表,例如,溫度表、壓力表、電壓表、電流表、水表、瓦斯表...等,因此本發明實施例的儀表讀取裝置可快速獲知待測儀表上的數值,以立即性地進行儀表數值的回饋,達成設備監控。 Various embodiments of the present invention can utilize an instrument reading device composed of a light emitter, a photoreceptor, and corresponding data processing to accurately read various types of instruments with pointers, such as thermometers, pressure gauges, voltmeters, ammeters, Water meter, gas meter, etc. Therefore, the instrument reading device according to the embodiment of the present invention can quickly obtain the value on the instrument to be measured, so as to immediately provide feedback of the instrument value to achieve equipment monitoring.
圖1是依照本發明一實施例的一種儀表讀取裝置100的外觀示意圖。圖1左半部的(A)部分為儀表讀取裝置100的正面,其具備本體110以及用於觀測待測儀表的簍空區域120。圖1右半部的(B)部分為儀表讀取裝置100的背面,其具備簍空區域120以及用以乘載儀表讀取裝置100中多個部件的印刷電路板130。印刷電路板130上配置多個光線發射器及感光器。印刷電路板130上配置的諸多部件將於下述圖5與相應描述中說明。
FIG. 1 is a schematic diagram of the appearance of a
於本實施例中,這些光線發射器以及感光器配置於印刷電路板130的一面上且經排列為圓形,在此將配置有光線發射器以及感光器的該面稱為是感測平面。應用本實施例者可依其需求將這些光線發射器以及感光器以不同排列方式配置在感測平面上,例如,可將光線發射器以及感光器以圓形、橢圓形、矩形、矩陣、
線性排列或前述排列的組合配置在感測平面上。
In this embodiment, these light emitters and photoreceptors are disposed on one side of the printed
本實施例中光線發射器以及感光器的數量皆為10個,但應用本實施例者可依其需求調整光線發射器以及感光器的各自數量,且光線發射器的數量不一定要與感光器的數量相等。例如,應用本實施例者可透過單個光線發射器與多個感光器、多個光線發射器與單個感光器以及任意數量配置的光線發射器與感光器來實現本發明實施例。 In this embodiment, the number of light emitters and photoreceptors is both 10, but users who apply this embodiment can adjust the respective numbers of light emitters and photoreceptors according to their needs, and the number of light emitters does not necessarily have to be the same as the number of photoreceptors. The quantities are equal. For example, those who apply this embodiment can implement the embodiment of the present invention through a single light emitter and multiple photoreceptors, multiple light emitters and a single photoreceptor, or any number of light emitters and photoreceptors configured.
應用本實施例者亦可以透過相應的機械構造來驅動或調整光線發射器與感光器的所在位置,從而實現本發明實施例的精神。例如,可透過環形配置配合馬達來使光線發射器在不同時間發射光線,以使多個感光器透過前述光線判斷指針的位置。 Those who apply this embodiment can also drive or adjust the positions of the light emitter and the photoreceptor through corresponding mechanical structures, thereby realizing the spirit of the embodiment of the present invention. For example, a ring-shaped arrangement and a motor can be used to allow the light emitter to emit light at different times, so that multiple photoreceptors can determine the position of the pointer through the aforementioned light.
圖2是本實施例中待測儀表200的示意圖。本實施例是以具備指針210的類比式溫度表作為待測儀表200的舉例。在實際應用圖1的儀表讀取裝置100時,會將圖1(B)部分的印刷電路板130與待測儀表200相互面對面配置,如圖3所示。圖3是圖1儀表讀取裝置100與圖2待測儀表200相互配置後的外觀示意圖。由圖3可知,儀表讀取裝置100的簍空區域120可看見待測儀表200的部分畫面,且位於儀表讀取裝置100背面上印刷電路板130的感測平面會面向待測儀表200。本實施例中,光線發射器以及感光器配置於感測平面上且經排列為圓形,且前述圓形的圓心(如圖5中的點510)會對應於待測儀表200的中心點(以圖2的點220表示)相互設置。特別說明的是,本發明實施例中的光線
發射器與感光器於電路板130的感測平面上的排列方式不僅限於上述排列類型,應用本實施例者可依其需求將這些光線發射器以及感光器以不同形狀配置在感測平面上,例如,可將光線發射器以及感光器配置在感測平面上且經排列為圓形、橢圓形、矩形、矩陣、線性排列或前述排列的組合。
Figure 2 is a schematic diagram of the
圖4是依照本發明一實施例的一種儀表讀取裝置100的方塊圖。儀表讀取裝置100用以讀取待測儀表200上指針的數值。儀表讀取裝置100包括多個光線發射器410、光線控制器420、多個感光器430以及處理器440。本實施例的光線控制器420電性耦接於光線發射器410、感光器430以及處理器440。感光器430用以感測光線以產生感光值。光線控制器420可將前述感光器430感測到的類比式感光值進行類比數位轉換,且將轉換後的感光值提供給處理器440。並且,光線控制器420可控制光線發射器410發射光線以及控制所發出的光線的亮度。
FIG. 4 is a block diagram of a
本實施例的光線控制器420與處理器440可以各自使用不同的微處理器來實現,也可以將光線控制器420與處理器440整合為同一個微處理器來實現。光線發射器410可以是紅外光發射器,感光器430可以是紅外光感測器,但不以此為限。應用本實施例者可選擇性地調整光線發射器410發射之光線以及感光器430所接收之光線類型,例如前述光線的類型也可以是可見光或紫外光。
The
光線發射器410配置於印刷電路板的感測平面上。本實
施例中,多個光線發射器410利用感測平面所朝向的方向作為光線的發射方向,並且這些光線發射器410以前述發射方向而發出多個第一光線。詳細來說,光線發射器410所發出的光可呈現圓錐狀,圓錐狀的頂點可為光線發射器410中發射光的光源處,而前述所指的『發射方向』則為光線從前述圓錐形的頂點指向底面上圓心的方向。換句話說,光線發射器410所發出的光的發射方向指的可以是發出的光的光強度出現最大值的方向。本實施例的發射方向不平行於感測平面。例如,第一光線的發射方向垂直於感測平面,從而朝向待測儀表200發射。然則,上述發射方向是否平行於感測平面並不限制本發明實施例,應用本實施例者可依其需求調整第一光線的發射方向,使其選擇性地平行或不平行於感測平面。
The
感光器430同樣配置於印刷電路板的感測平面上。多個感光器430用以感測第二光線以產生對應於第二光線的多個當前感光值。此第二光線便是光線發射器410所發射的第一光線照射至待測儀表200並受到反射的光線。
The
光線控制器420用以控制光線發射器410及感光器430,以從感光器430獲得當前感光值。詳細來說,本實施例的光線控制器420逐一控制每個光線發射器410以向發射方向發出第一光線。另一方面,本實施例的感光器430會持續地感測光線以產生感光值,光線控制器420則獲得多個感光器430所產生的多個當前感光值。
The
光線控制器420可透過多種實現方式來獲得多個感光器430所產生的多個當前感光值。於本發明實施例中,當某個光線發射器410發光時,光線控制器420會將與發光的前述光線發射器410相對應的感光器430進行感光值的讀取而獲得前述當前感光值,並且光線控制器420將經讀取的前述當前感光值進行類比數位轉換而產生數位的當前感光值而提供給處理器440。處理器440便可依據數位的當前感光值透過資料處理以進行待測儀表200的指針位置判讀並進而讀取儀表數值。
The
於本發明另一實施例中,在光線控制器420逐一控制每個光線發射器410以向發射方向發出第一光線之後,光線控制器420還會逐一控制經發光的前述光線發射器410所對應的感光器430進行感光,從感光器430獲得類比式當前感光值,並且將經讀取的經當前感光值經由類比數位轉換而產生對應的數位式當前感光值。並且,光線控制器420傳輸每個感光器430所產生的當前感光值到處理器440。應用本實施例者可依其需求採用前述方式或利用他種方式來實現光線控制器420讀取多個感光器430所感測之感光值。
In another embodiment of the present invention, after the
本實施例的處理器440可依據多個感光器430的當前感光值來判斷待測儀表200上指針的所在位置,並利用這些感光器430與待測儀表200之間的相對位置關係知悉相應刻度值,從而獲得待測儀表200上的儀表數值。
The
本實施例的儀表讀取裝置100還可具備記憶體(未繪示)
或相應儲存空間(未繪示),例如,儀表讀取裝置100還可包括快閃記憶體(未繪示)以及靜態隨機存取記憶體(未繪示),以做為資料除或暫存之用。前述靜態隨機存取記憶體可設置於圖4之處理器440當中。
The
圖5是圖1中印刷電路板130及相應配置元件的放大示意圖。圖5中印刷電路板130上具備10個光線發射器410_1~410_10以及10個感光器430_1~430_10。本實施例中,光線發射器410_1~410_10以及感光器430_1~430_10之間具有一對一的對應關係。本實施例將圖5印刷電路板130的點510作為圓心,並將圓形切割為10等分,每36度各配置光線發射器410_1~410_10其中之一及感光器430_1~430_10其中之一在印刷電路板130的感測平面上。也就是說,10個光線發射器410_1~410_10以等角度排列圍繞點510排列,10個感光器430_1~430_10以等角度排列圍繞點510排列。圖4所示之光線控制器420會逐一控制光線發射器410_1~410_10以發出第一光線(如,紅外光),且感光器430_1~430_10會持續感光。當某個光線發射器(例如,光線發射器410_1)受控制而發光時,光線控制器420會對與前述光線發射器(例如,光線發射器410_1)相對應的感光器(例如,感光器430_1)進行感光值的讀取而獲得前述當前感光值,以獲悉紅外光的反射強度。
FIG. 5 is an enlarged schematic diagram of the printed
舉例來說,若將光線發射器410_1發出的光線有照射到待測儀表的指針(亦即,光線發射器410_1的前方有待測儀表的
指針),此時的感光器430_1所接收的當前感光值稱為是第一感光值,並且,將光線發射器410_1發出的光線沒有照射到待測儀表的指針(亦即,光線發射器410_1的前方沒有待測儀表的指針),此時的感光器430_1所接收的當前感光值稱為是第二感光值。那麼,前述第一感光值與前述第二感光值兩者之間具備較大的數值差異。本實施例便可利用前述感光值的數值差異來感測及判斷待測儀表200的指針位置。本實施例的感光器430_1~430_10皆是以電壓值來呈現當前感光值。圖4所示之處理器440利用感光器430_1~430_10所感測出的當前感光值(電壓值)以計算指針位置,並經由計算每個感光器430_1~430_10所接收的當前感光值以及來自待測儀表200上指針的紅外線佔比,即可準確讀出待測儀表200上的儀表數值。
For example, if the light emitted by the light emitter 410_1 irradiates the pointer of the instrument to be measured (that is, there is a pointer of the instrument to be measured in front of the light emitter 410_1
pointer), the current photosensitive value received by the photoreceptor 430_1 at this time is called the first photosensitive value, and the light emitted by the light emitter 410_1 does not illuminate the pointer of the meter to be measured (that is, the pointer of the light emitter 410_1 (there is no pointer of the meter to be measured in front), the current photosensitive value received by the photoreceptor 430_1 at this time is called the second photosensitive value. Then, there is a large numerical difference between the first photosensitive value and the second photosensitive value. In this embodiment, the numerical difference in the aforementioned photosensitive values can be used to sense and determine the pointer position of the
在此詳細說明前述光線發射器410_1~410_10以及感光器430_1~430_10之間具有的一對一的對應關係。雖然本發明實施例利用10個光線發射器410_1~410_10以及10個感光器430_1~430_10來作為舉例說明,例如,以一個光線發射器對應一個感光器的關係(稱為一對一的對應關係)來實現待測儀表200上儀表數值的讀取,使得光線發射器與感光器之間會有對應關係,但應用本實施例者可依其需求調整光線發射器及感光器的數量,且光線發射器及感光器的數量不必然會是相同。應用本實施例者可使用3個光線發射器及9個感光器並以1個光線發射器對應3個感光器的關係(稱為一對三的對應關係)實現本發明實施例,例如,
光線控制器420可控制光線發射器410的其中之一發出光線,並透過感光器430的其中三個(例如,最靠近發出光線的光線發射器)獲得對應的感光值。依此類推,應用本實施例者亦可使用20個光線發射器及10個感光器並以2個光線發射器對應1個感光器的關係(稱為二對一的對應關係)實現本發明實施例。
The one-to-one correspondence between the light emitters 410_1 to 410_10 and the photoreceptors 430_1 to 430_10 is described in detail here. Although the embodiment of the present invention uses 10 light emitters 410_1 to 410_10 and 10 photoreceptors 430_1 to 430_10 as an example, for example, one light emitter corresponds to one photoreceptor (called a one-to-one correspondence). To realize the reading of the instrument value on the instrument to be tested 200, so that there is a corresponding relationship between the light emitter and the photoreceptor, but the user of this embodiment can adjust the number of light emitters and photoreceptors according to their needs, and the light emission The number of sensors and photoreceptors is not necessarily the same. Those who apply this embodiment can use 3 light emitters and 9 photoreceptors and implement the embodiment of the invention with the relationship of 1 light emitter corresponding to 3 photoreceptors (called a one-to-three correspondence relationship), for example,
The
圖6是依照本發明一實施例的一種儀表的讀取方法的流程圖。圖6的讀取方法適用於包括多個光線發射器及多個感光器的儀表讀取裝置,如圖4所示的儀表讀取裝置100。然而,本發明內容所屬技術領域中具有通常知識者均可瞭解,本發明實施例的讀取方法並不侷限應用於圖4的儀表讀取裝置100,也不侷限於圖6之流程圖的各項步驟順序。
Figure 6 is a flow chart of a method for reading an instrument according to an embodiment of the present invention. The reading method of FIG. 6 is applicable to an instrument reading device including multiple light emitters and multiple photoreceptors, such as the
請同時參照圖4與圖6,於步驟S610中,在儀表讀取裝置100出廠前,會對儀表讀取裝置100中的每個感光器430_1~430_10進行校準,以使每個感光器430_1~430_10在接收到標準光線後產生經校準感光數值。每個光線發射器410_1~410_10所發出的光線的強度與感光器430_1~430_10接收光線的感測靈敏度都會有些許偏差,因此在儀表讀取裝置100出廠前,對這些元件進行校準,從而降低每個光線發射器410_1~410_10以及感光器430_1~430_10之間的差異。本發明實施例的校準方式可在感測平面的前方放置一個標準物件,並且利用圖4之處理器440內建的校準程序或透過外部設備(如,另設的校準設備)的控制而逐一調整每個光線發射器所發射的光線的工作週期(duty cycle),並且使
得對應的感光器430_1~430_10在接收經由標準物件所反射的光線(發射至標準物件的光線係由光線發射器410_1~410_10所發射)後,其感測到的感光數值為特定的電壓值(如,1.2V)。
Please refer to Figure 4 and Figure 6 at the same time. In step S610, before the
於步驟S620中,圖4之處理器440可依照圖2之待測儀表200的形式,判斷感光器與待測儀表的相對位置關係以計算或設定每個感光器所對應的每個設定刻度值。本實施例可在儀表讀取裝置的記憶體(如,快閃記憶體)或相應儲存空間(未繪示)中儲存有多種待測儀表200的刻度關係,並且處理器440可利用感光器對於待測儀表200的感測情形來判讀待測儀表200的形式,進而由儲存的多種待測儀表200的刻度關係中選擇其中一個待測儀表200的刻度關係,並透過判斷感光器與待測儀表的相對位置關係以計算或設定每個感光器所對應的每個設定刻度值。
In step S620, the
在將儀表讀取裝置100與待測儀表200相互配置之後,因儀表讀取裝置100所在環境及現況的影響,需要將儀表讀取裝置100進行感光器的初始設定。因此,在步驟S630中,在將儀表讀取裝置100與待測儀表200相互配置之後,在儀表讀取裝置100的初始設定階段,圖4處理器440透過光線控制器420控制每個感光器以獲得每個感光器所產生的感光數值,並將所有的感光器所產生的感光數值當中的最小感光數值作為每個感光器的初始感光值。換句話說,當感光器前面並未存在待測儀表200的指針時,感光器所感測到的感光數值應為最小感光數值,藉以作為初始感光值,從而易於判斷指針是否位在感光器的位置前方。
After the
步驟S640至步驟S670則是在進行前述初始設定(步驟S610至步驟S630)後,儀表讀取裝置100實際進行儀表數值的讀取的相應步驟。詳細來說,於圖1的儀表讀取裝置100與圖2待測儀表200相互配置後(例如圖3所繪示之配置),於步驟S640中,圖4之處理器440透過光線發射器410發射光線,並獲得每個感光器430所產生的當前感光值,例如可透過光線控制器420獲得每個感光器430所產生的當前感光值。於步驟S650中,處理器440將各感光器430的當前感光值減去感光器430各自的初始感光值(例如於步驟S630中獲得的初始感光值)以獲得每個感光器430所對應的一差異感光值。於步驟S660中,處理器440依據每個感光器430所對應的差異感光值來判斷待測儀表200的指針位置。並且,於步驟S670中,處理器440至少依據與所述指針位置相對應的感光器430所對應的設定刻度值來計算儀表數值(指針位置的儀表數值)。
Steps S640 to S670 are corresponding steps in which the
本發明的儀表的讀取方法還可包括步驟S680及步驟S690。於步驟S680中,處理器440判斷是否持續監控待測儀表200。若希望持續監控待測儀表200(步驟S680的判斷結果為是),則從步驟S680進入步驟S640,並重複步驟S640至S670以持續地讀取並計算儀表數值。相對地,若希望不監控待測儀表200(步驟S680的判斷結果為否),則從步驟S680進入步驟S690,以結束此對於待測儀表200的讀取方法。
The meter reading method of the present invention may also include step S680 and step S690. In step S680, the
在此以下表(一)跟表(二)的資訊及圖4、圖5作為舉例來
說明圖6中各步驟。表(一)用以呈現編號為430_1至430_5的感光器的初始值、當前感光值、差異感光值以及設定刻度值;表(二)類似於表(一),其用以呈現編號為430_6至430_10的感光器的相應數值。本實施例中,編號為430_1至430_10的感光器可為圖5中繪示的10個感光器430_1~430_10,這10個感光器430_1~430_10配置於感測平面上且經排列為圓形。在本發明一些實施例中,表(一)及表(二)更可儲存於儀表讀取裝置100的記憶體或相應儲存空間中。於本實施例中,表(一)及表(二)中的感光器編號以及前述設定刻度值可儲存在儀表讀取裝置100的快閃記憶體中,表(一)及表(二)中的當前感光值、初始感光值、差異感光值則暫存在處理器440中的靜態隨機存取記憶體(未繪示)。
Here, the information in Table (1) and Table (2) and Figures 4 and 5 are used as examples.
Explain each step in Figure 6. Table (1) is used to present the initial value, current sensitivity value, differential sensitivity value and set scale value of the photoreceptors numbered 430_1 to 430_5; Table (2) is similar to Table (1), which is used to present the photoreceptors numbered 430_6 to 430_5. The corresponding value of the photoreceptor of 430_10. In this embodiment, the photoreceptors numbered 430_1 to 430_10 may be the ten photoreceptors 430_1 to 430_10 shown in FIG. 5 . The ten photoreceptors 430_1 to 430_10 are arranged on the sensing plane and arranged in a circle. In some embodiments of the present invention, table (1) and table (2) can be further stored in the memory or corresponding storage space of the
在圖6步驟S620中,處理器440依照圖2待測儀表220的形式,對每個感光器設定了對應的設定刻度值。例如,編號為430_1的感光器的設定刻度值為“53”,編號為430_2的感光器的設定刻度值為“64”。
In step S620 of FIG. 6 , the
在圖6步驟S630中,對每個感光器設定了對應的初始感光值。由於本實施例的感光器皆已在步驟S610中受到校準且儀表讀取裝置100並未受到環境影響,將感光器430_1至430_10所產生的感光數值當中的最小感光數值作為每個感光器的初始感光值,因此編號為430_1至430_10的感光器的初始感光值皆為“3480”。
In step S630 of FIG. 6 , a corresponding initial light sensitivity value is set for each photoreceptor. Since the photoreceptors in this embodiment have been calibrated in step S610 and the
表(一)與表(二)呈現了在圖6步驟S640中,圖1的儀表讀取裝置100與圖2待測儀表200相互配置後,10個感光器430_1~430_10中的每個感光器所感測到的當前感光值。表(一)與表(二)呈現了在圖6步驟S650中,10個感光器430_1~430_10中每個感光器在當前感光值減去初始感光值後所對應的差異感光值。
Tables (1) and (2) present each of the 10 photoreceptors 430_1~430_10 after the
在圖6步驟S660中,處理器440透過表(一)與表(二)呈現的差異感光值可知,具備最大差異感光值者為感光器430_9,因此可判斷待測儀表的指針應位於感光器430_9前方附近。換句話說,處理器440比較這些差異感光值,具有最大的差異感光值所對應的感光器前方的待測儀表的位置具有指針。
In step S660 of FIG. 6 , the
在圖6步驟S670中,處理器440至少依據與前述指針位
置(即,位於感光器430_9前方的待測儀表的位置附近)相對應的感光器430_9所對應的設定刻度值來計算儀表數值。具有最大的差異感光值的感光器在本實施例中即為與指針位置相對應的感光器430_9。於本實施例中,處理器440可依據與前述指針位置(即,位於感光器430_9前方的待測儀表的位置附近)相對應的感光器(即,具有最大的差異感光值的感光器430_9)的當前感光值及其對應的設定刻度值、與具有最大的差異感光值所對應的感光器相鄰的N個感光器所產生對應的當前感光值以及相鄰的N個感光器所對應的設定刻度值來計算所述儀表數值,其中N為大於1的正整數。本實施例將具有最大的差異感光值所對應的感光器相鄰的前後各2個感光器的相應數值進行計算,即N為4。
In step S670 of FIG. 6 , the
因此,本實施例將最大差異感光值(即,編號430_9的感光器的差異感光值)表示為DN,最大差異感光值所對應的感光器(即,編號430_9的感光器)對應的設定刻度值表示為SN,最大差異感光值DN對應的感光器(編號430_9的感光器)相鄰的前後各兩個感光器(即,編號430_7、430_8、430_10與編號430_1的感光器)所產生對應的差異感光值依序表示為DN-2、DN-1、DN+1、DN+2。與最大差異感光值DN對應的感光器(編號430_9的感光器)相鄰的前後各兩個感光器(即,編號430_7、430_8、430_10與編號430_1的感光器)對應的設定刻度值依序表示為SN-2、SN-1、SN+1、SN+2。並且,差異感光值DN-2、DN-1、DN、DN+1、DN+2的加總表示為DT。 Therefore, in this embodiment, the maximum difference in light sensitivity value (ie, the difference in light sensitivity value of the photoreceptor numbered 430_9) is expressed as D N , and the setting scale corresponding to the photoreceptor corresponding to the maximum difference in light sensitivity value (ie, the photoreceptor numbered 430_9) is The value is expressed as SN , and the maximum difference light sensitivity value DN is generated by the photoreceptor corresponding to the photoreceptor (the photoreceptor numbered 430_9) and the two adjacent photoreceptors (that is, the photoreceptor numbered 430_7, 430_8, 430_10 and the photoreceptor numbered 430_1). The corresponding differential photosensitivity values are expressed as DN -2 , DN -1 , DN+1 , DN +2 in sequence. The set scale values corresponding to the photoreceptor corresponding to the maximum difference light sensitivity value D N (the photoreceptor numbered 430_9) and the two adjacent photoreceptors (that is, the photoreceptors numbered 430_7, 430_8, 430_10 and 430_1) are in sequence Expressed as SN-2 , SN -1 , SN +1 , SN +2 . Furthermore, the sum of the differential photosensitivity values DN -2 , DN -1 , DN , DN+1 , and DN +2 is expressed as DT .
在步驟S670中,處理器440可按照下述方程式(1)計算而得儀表數值V:
換句話說,本發明實施例是利用具備最大差異感光值所對應的感光器(如,感光器430_9)以及與前述感光器相鄰的感光器(如,感光器430_7、430_8、430_10、430_1)對應的相關數值來計算儀表數值V。例如,方程式(1)就是利用感光器430_7、430_8、430_9、430_10、430_1對應的差異感光值相對於其所對應的差異感光值之總和的比例來推算前述感光器430_7、430_8、430_9、430_10、430_1對應的設定刻度值的佔比後進行加總,從而計算出儀表數值V。 In other words, the embodiment of the present invention uses the photoreceptor corresponding to the maximum difference in photosensitivity value (such as photoreceptor 430_9) and the photoreceptor adjacent to the aforementioned photoreceptor (such as photoreceptors 430_7, 430_8, 430_10, 430_1) Corresponding relevant values are used to calculate the instrument value V. For example, Equation (1) uses the ratio of the differential photosensitive values corresponding to the photoreceptors 430_7, 430_8, 430_9, 430_10, and 430_1 to the sum of the corresponding differential photosensitive values to calculate the aforementioned photoreceptors 430_7, 430_8, 430_9, 430_10, The proportion of the set scale value corresponding to 430_1 is then added up to calculate the instrument value V.
因此,基於方程式(1),從表(一)至表(二)呈現的資訊來說,本實施例的儀表數值V為27.7。在使用前述方程式(1)計算儀表數值V時,圖4之處理器440會將需要使用的設定刻度值從快閃記憶體(未繪示)中取出並暫存在靜態隨機存取記憶體(未繪示)所設定的矩陣當中,以供計算方程式(1)使用。上述之方程式(1)僅係舉例說明,本發明實施例並不侷限於上述所列之方程式的方法。
Therefore, based on equation (1) and the information presented in tables (1) to (2), the instrument value V of this embodiment is 27.7. When using the aforementioned equation (1) to calculate the instrument value V, the
在能夠進行儀表讀取的技術中,也可採用基於攝影機以及影像處理來識別儀表上的指針,進而讀取儀表數值。然則,攝影機所擷取的資料為影像資料,不易進行後續資料處理,需要針對每種類型的類比式儀表與其指針重新撰寫對應的影像辨識程式,或 甚至需要重新對人工智慧程序進行訓練才能使用。並且,受限於攝影機的焦距及拍攝範圍,若要拍攝到整個待測儀表的話,需要大廣角的鏡頭作為攝影機的鏡頭,或加大垂直的安裝空間。另外,指針式儀表的外殼通常為弧形的玻璃,易造成反光,從而大幅增加了影像的擷取與識別的難度,容易導致儀表數值的讀取錯誤。 Among the technologies that can perform meter reading, cameras and image processing can also be used to identify the pointer on the meter and then read the meter value. However, the data captured by the camera is image data, which is difficult to perform subsequent data processing. It is necessary to rewrite the corresponding image recognition program for each type of analog instrument and its pointer, or Even the artificial intelligence program needs to be retrained before it can be used. Moreover, limited by the focal length and shooting range of the camera, if you want to capture the entire instrument under test, you need a wide-angle lens as the camera lens, or you need to increase the vertical installation space. In addition, the casing of pointer instruments is usually made of curved glass, which can easily cause reflection, which greatly increases the difficulty of image capture and identification, and can easily lead to reading errors of instrument values.
本發明實施例係主要利用光線發射器與感光器建置儀表讀取裝置。由於光線發射器與感光器的建置成本較低,且光線感光器偵測得到的數值易於分析與進行後續資料處理,因此本發明各實施例所提出的儀表讀取裝置及相應技術更是具備低建置成本的效果。並且,光線發射器並沒有焦距與拍攝範圍的問題,因此可將儀表讀取裝置設置於跟待測儀表十分接近,從而可將儀表讀取裝置進行輕薄化設計。並且,本發明實施例的儀表讀取裝置可適用於各種類型與形狀的指針式待測儀表中,具備高度相容性。 The embodiment of the present invention mainly uses a light emitter and a photoreceptor to build an instrument reading device. Since the construction cost of light emitters and photoreceptors is low, and the values detected by the light photoreceptors are easy to analyze and perform subsequent data processing, the instrument reading devices and corresponding technologies proposed in each embodiment of the present invention are even more capable The effect of low construction costs. Moreover, the light emitter does not have problems with focal length and shooting range, so the instrument reading device can be set very close to the instrument under test, so that the instrument reading device can be designed to be thin and light. Moreover, the instrument reading device according to the embodiment of the present invention can be applied to various types and shapes of pointer-type instruments to be tested, and has high compatibility.
綜上所述,本發明實施例所述的儀表讀取裝置及儀表的讀取方法可在感測平面上設置多個光線發射器與多個感光器,並利用這些光線發射器與感光器來偵測待測儀表中的指針位置,並基於感光器與待測儀表的相對位置關係獲知每個感光器所處位置所對應的刻度值,進而利用與前述指針位置最接近的感光器的刻度值來計算並獲得儀表數值。並且,本實施例的儀表讀取裝置可與待測儀表十分接近,從而可將儀表讀取裝置進行輕薄化設計,並且感光器偵測得到的數值易於進行分析與進行後續資料處理,因此本發明各實施例所提出的儀表讀取裝置及相應技術更可降低建置 成本。 To sum up, the instrument reading device and the instrument reading method according to the embodiments of the present invention can provide multiple light emitters and multiple photoreceptors on the sensing plane, and use these light emitters and photoreceptors to Detect the position of the pointer in the instrument under test, and obtain the scale value corresponding to the position of each photoreceptor based on the relative position of the photoreceptor and the instrument under test, and then use the scale value of the photoreceptor closest to the aforementioned pointer position. to calculate and obtain meter values. Moreover, the meter reading device of this embodiment can be very close to the meter to be measured, so that the meter reading device can be designed to be thin and light, and the values detected by the photoreceptor are easy to analyze and perform subsequent data processing. Therefore, the present invention The instrument reading device and corresponding technology proposed in each embodiment can further reduce the cost of construction cost.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。 Although the present invention has been disclosed above through embodiments, they are not intended to limit the present invention. Anyone with ordinary knowledge in the technical field may make some modifications and modifications without departing from the spirit and scope of the present invention. Therefore, The protection scope of the present invention shall be determined by the appended patent application scope.
100:儀表讀取裝置 100: Meter reading device
200:待測儀表 200: Instrument to be tested
410:光線發射器 410:Light emitter
420:光線控制器 420:Light controller
430:感光器 430:Photoreceptor
440:處理器 440: Processor
Claims (16)
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US6271523B1 (en) * | 1997-12-05 | 2001-08-07 | John D. Weaver | Optical sensor system and method for monitoring consumables |
CN1860348A (en) * | 2003-06-13 | 2006-11-08 | Arad计量科技有限公司 | Meter register having an encoder for measuring material flow and an algorithm to selectively block signal transmission |
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