TWI817386B - Phase locked loop, voltage controlled oscillator and tuning method - Google Patents
Phase locked loop, voltage controlled oscillator and tuning method Download PDFInfo
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/099—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop
- H03L7/0991—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop the oscillator being a digital oscillator, e.g. composed of a fixed oscillator followed by a variable frequency divider
- H03L7/0992—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop the oscillator being a digital oscillator, e.g. composed of a fixed oscillator followed by a variable frequency divider comprising a counter or a frequency divider
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/16—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop
- H03L7/18—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop
- H03L7/183—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop a time difference being used for locking the loop, the counter counting between fixed numbers or the frequency divider dividing by a fixed number
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/099—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/083—Details of the phase-locked loop the reference signal being additionally directly applied to the generator
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/085—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal
- H03L7/093—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal using special filtering or amplification characteristics in the loop
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/16—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop
- H03L7/18—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/16—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop
- H03L7/18—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop
- H03L7/183—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop a time difference being used for locking the loop, the counter counting between fixed numbers or the frequency divider dividing by a fixed number
- H03L7/187—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop a time difference being used for locking the loop, the counter counting between fixed numbers or the frequency divider dividing by a fixed number using means for coarse tuning the voltage controlled oscillator of the loop
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- H—ELECTRICITY
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- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L2207/00—Indexing scheme relating to automatic control of frequency or phase and to synchronisation
- H03L2207/06—Phase locked loops with a controlled oscillator having at least two frequency control terminals
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Abstract
Description
本揭示文件是關於一種鎖相迴路,特別是關於一種使用了電感/電容壓控振盪器的鎖相迴路。 This disclosure document relates to a phase locked loop, specifically a phase locked loop using an inductor/capacitor voltage controlled oscillator.
鎖相迴路(phase locked loop,PLL)電路為一種產生輸出時脈訊號的電子控制電路,且此輸出時脈訊號具有鎖定至輸入參考訊號相位的相位。舉例而言,鎖相迴路可以用於調整振盪器,使得由振盪器產生的訊號的頻率以及相位可以匹配參考輸入訊號的頻率以及相位。鎖相迴路電路通常使用於通訊裝置、電腦以及其他電子裝置中。針對高級應用,高效能的鎖相迴路可以採用電感/電容(inductance-capacitance,LC)壓控振盪器。舉例而言,在第五代行動系統、雷達及高效能計算應用中,可以採用LC壓控振盪器。 A phase locked loop (PLL) circuit is an electronic control circuit that generates an output clock signal, and the output clock signal has a phase locked to the phase of the input reference signal. For example, a phase locked loop can be used to adjust an oscillator so that the frequency and phase of the signal generated by the oscillator matches the frequency and phase of the reference input signal. Phase locked loop circuits are commonly used in communication devices, computers and other electronic devices. For advanced applications, high-performance phase-locked loops can use inductance-capacitance (LC) voltage-controlled oscillators. For example, LC voltage controlled oscillators can be used in fifth-generation mobile systems, radar and high-performance computing applications.
藉由採用小型壓控電容器(變容二極體),可以改善LC壓控電容器之相位雜訊。然而,小型壓控電容器可能導致非常窄的頻率調諧範圍,此狀況可能導致鎖相迴路在溫 度或電壓變化期間失鎖的高風險。此外,壓控振盪器內的頻率調整可能會引起大幅的轉換抖動(transition jitter)。需要解決方案來降低失鎖的風險以及減少由頻率調整引起的轉換抖動。 By using small voltage-controlled capacitors (varactors), the phase noise of LC voltage-controlled capacitors can be improved. However, small voltage-controlled capacitors can result in a very narrow frequency tuning range, a condition that can cause phase-locked loops to malfunction at temperature. High risk of losing lock during temperature or voltage changes. In addition, frequency adjustments within the voltage controlled oscillator may cause significant transition jitter. Solutions are needed to reduce the risk of losing lock and reduce transition jitter caused by frequency scaling.
本揭示文件提供一種鎖相迴路,鎖相迴路包含壓控振盪器,壓控振盪器包含粗調陣列以及微調陣列,粗調陣列包含複數個粗調裝置,微調陣列包含複數個微調裝置。其中,根據壓控振盪器調諧訊號高於類比電壓範圍的判定,壓控振盪器用以從微調陣列的微調裝置之中選擇一微調裝置,以將壓控振盪器輸出訊號的頻率增加至較高窄頻率範圍中。其中,根據壓控振盪器調諧訊號低於類比電壓範圍的判定,壓控振盪器用以從微調陣列的微調裝置之中選擇一微調裝置,以將壓控振盪器輸出訊號的頻率減小至較低窄頻率範圍中。其中,根據壓控振盪器調諧訊號高於類比電壓範圍且窄頻率範圍位於寬頻率範圍內的高準位的判定,壓控振盪器用以從粗調陣列的粗調裝置之中選擇粗調裝置,以將壓控振盪器輸出訊號的頻率增加至較高寬頻率範圍中。其中,根據壓控振盪器調諧訊號低於類比電壓範圍且窄頻率範圍位於寬頻率範圍內的低準位的判定,壓控振盪器用以從粗調陣列的粗調裝置之中選擇一粗調裝置,以將壓控振盪器輸出訊號的頻率減小至較低寬頻率範圍中。 This disclosure document provides a phase locked loop. The phase locked loop includes a voltage controlled oscillator. The voltage controlled oscillator includes a coarse adjustment array and a fine adjustment array. The coarse adjustment array includes a plurality of coarse adjustment devices, and the fine adjustment array includes a plurality of fine adjustment devices. Among them, according to the determination that the tuning signal of the voltage controlled oscillator is higher than the analog voltage range, the voltage controlled oscillator is used to select a trimming device from the trimming devices of the trimming array to increase the frequency of the voltage controlled oscillator output signal to a higher in a narrow frequency range. Among them, according to the determination that the tuning signal of the voltage controlled oscillator is lower than the analog voltage range, the voltage controlled oscillator is used to select a trimming device from the trimming devices of the trimming array to reduce the frequency of the output signal of the voltage controlled oscillator to a lower value. in the low and narrow frequency range. Among them, based on the determination that the tuning signal of the voltage controlled oscillator is higher than the analog voltage range and the narrow frequency range is at a high level within the wide frequency range, the voltage controlled oscillator is used to select the coarse adjustment device from the coarse adjustment devices of the coarse adjustment array , to increase the frequency of the voltage controlled oscillator output signal to a higher and wider frequency range. Among them, according to the determination that the tuning signal of the voltage controlled oscillator is lower than the analog voltage range and the narrow frequency range is at a low level within the wide frequency range, the voltage controlled oscillator is used to select a coarse adjustment device from the coarse adjustment device of the coarse adjustment array. Device to reduce the frequency of the voltage controlled oscillator output signal to a lower wide frequency range.
本揭示文件提供一種壓控振盪器,壓控振盪器包含 粗調陣列以及微調陣列。粗調陣列包含複數個粗調裝置。微調陣列包含複數個微調裝置。其中,根據壓控振盪器調諧訊號高於類比電壓範圍的判定,壓控振盪器用以從微調陣列的微調裝置之中選擇一微調裝置,以將壓控振盪器輸出訊號的頻率增加至較高窄頻率範圍內。其中,根據壓控振盪器調諧訊號低於類比電壓範圍的判定,壓控振盪器用以從微調陣列的微調裝置之中選擇一微調裝置,以將壓控振盪器輸出訊號的頻率減小至較低窄頻率範圍內。其中,根據壓控振盪器調諧訊號高於類比電壓範圍且窄頻率範圍位於寬頻率範圍內的高準位的判定,壓控振盪器用以從粗調陣列的粗調裝置之中選擇一粗調裝置,以將壓控振盪器輸出訊號的頻率增加至較高寬頻率範圍內。其中,根據壓控振盪器調諧訊號低於類比電壓範圍且窄頻率範圍位於寬頻率範圍內的低準位的判定,壓控振盪器用以從粗調陣列的粗調裝置之中選擇一粗調裝置,以將壓控振盪器輸出訊號的頻率減小至較低寬頻率範圍內。 This disclosure document provides a voltage controlled oscillator. The voltage controlled oscillator includes Coarse array and fine array. The coarse adjustment array contains a plurality of coarse adjustment devices. The fine-tuning array includes a plurality of fine-tuning devices. Among them, according to the determination that the tuning signal of the voltage controlled oscillator is higher than the analog voltage range, the voltage controlled oscillator is used to select a trimming device from the trimming devices of the trimming array to increase the frequency of the voltage controlled oscillator output signal to a higher within a narrow frequency range. Among them, according to the determination that the tuning signal of the voltage controlled oscillator is lower than the analog voltage range, the voltage controlled oscillator is used to select a trimming device from the trimming devices of the trimming array to reduce the frequency of the output signal of the voltage controlled oscillator to a lower value. within a low and narrow frequency range. Among them, according to the determination that the tuning signal of the voltage controlled oscillator is higher than the analog voltage range and the narrow frequency range is at a high level within the wide frequency range, the voltage controlled oscillator is used to select a coarse adjustment device from the coarse adjustment device of the coarse adjustment array. Device to increase the frequency of the voltage controlled oscillator output signal to a higher and wider frequency range. Among them, according to the determination that the tuning signal of the voltage controlled oscillator is lower than the analog voltage range and the narrow frequency range is at a low level within the wide frequency range, the voltage controlled oscillator is used to select a coarse adjustment device from the coarse adjustment device of the coarse adjustment array. Device to reduce the frequency of the voltage controlled oscillator output signal to a lower wide frequency range.
本揭示文件提供一種壓控振盪器的調諧方法,包含以下步驟:接收壓控振盪器調諧訊號。判定壓控振盪器調諧訊號為高於類比電壓範圍、低於類比電壓範圍或位於類比電壓範圍內。當壓控振盪器調諧訊號高於類比電壓範圍時選擇一微調裝置,以產生在較高窄頻率範圍內的壓控振盪器輸出訊號。當壓控振盪器調諧訊號低於類比電壓範圍時選擇一微調裝置,以產生在較低窄頻率範圍內的壓控振盪器輸出訊號。判定窄頻率範圍位於寬頻率範圍的高準位 或低準位。 This disclosure document provides a tuning method for a voltage controlled oscillator, which includes the following steps: receiving a voltage controlled oscillator tuning signal. Determine whether the voltage controlled oscillator tuning signal is higher than the analog voltage range, lower than the analog voltage range, or within the analog voltage range. When the voltage controlled oscillator tuning signal is higher than the analog voltage range, a trimming device is selected to generate a voltage controlled oscillator output signal within a higher narrow frequency range. When the voltage controlled oscillator tuning signal is lower than the analog voltage range, a trimming device is selected to generate a voltage controlled oscillator output signal within a lower narrow frequency range. Determine the narrow frequency range to be at a high level of the wide frequency range or low level.
100:鎖相迴路 100:Phase locked loop
101,VTUNE:壓控振盪器調諧訊號 101,V TUNE : Voltage controlled oscillator tuning signal
102,FREF:參考輸入訊號 102,F REF : Reference input signal
103,band_bin_out[3:0]:粗調二進位碼訊號 103,band_bin_out[3:0]: Coarse binary code signal
104,fine_bin_out[2:0]:微調二進位碼訊號 104, fine_bin_out[2:0]: Fine-tune binary code signal
105,band_th[14:0]:粗調選擇訊號 105,band_th[14:0]: Coarse adjustment selection signal
106,fine_th[6:0]:微調選擇訊號 106, fine_th[6:0]: Fine-tuning selection signal
107:調諧陣列選擇電路 107: Tuning array selection circuit
108:解碼器 108:Decoder
109,LC-VCO:電感/電容壓控振盪器 109, LC-VCO: Inductor/Capacitor Voltage Controlled Oscillator
110:壓控振盪器輸出訊號 110: Voltage controlled oscillator output signal
201:類比上溢與下溢檢測器 201: Analog Overflow and Underflow Detector
202:微調計數器電路 202: Fine-tuning counter circuit
203:粗調計數器電路 203: Coarse adjustment counter circuit
204:邊界檢驗器 204:Bounds checker
205:分頻器 205:Frequency divider
206:粗調陣列 206: Coarse array
207:微調陣列 207: Fine-tuning array
208,over_ana:上溢訊號 208,over_ana: overflow signal
209,under_ana:下溢訊號 209,under_ana: underflow signal
210,fine_ov:高頻率準位邊界訊號/微調範圍上溢訊號 210, fine_ov: high frequency level boundary signal/fine adjustment range overflow signal
211,fine_ud:低頻率準位邊界訊號/微調範圍下溢訊號 211, fine_ud: low frequency level boundary signal/fine adjustment range underflow signal
213:第一降低頻率訊號 213: First reduced frequency signal
214:第二降低頻率訊號 214: Second lower frequency signal
215,EN:致能訊號 215,EN: Enable signal
216,ov_rt:壓控振盪器上溢調諧訊號 216,ov_rt: Voltage controlled oscillator overflow tuning signal
217,ud_rt:壓控振盪器下溢調諧訊號 217,ud_rt: Voltage controlled oscillator underflow tuning signal
218,band_bin[3:0]:粗調/無符號二進位碼輸入訊號 218,band_bin[3:0]: Coarse/unsigned binary code input signal
401:寬頻率範圍 401: wide frequency range
402:窄頻率範圍 402: Narrow frequency range
501,fine_count[3:0]:微調計數器變數 501, fine_count[3:0]: Fine-tune counter variables
502,coar_count[3:0]:粗調計數器變數 502,coar_count[3:0]: Coarse counter variable
503:第一節點 503: first node
504:第二節點 504: Second node
505:第三數位比較器 505: Third digital comparator
506:第四數位比較器 506: Fourth digital comparator
507:第五數位比較器 507: Fifth digital comparator
508:第六數位比較器 508: Sixth digital comparator
509:第七資料鎖存器 509: Seventh data latch
510:第四邏輯(及)閘 510: The fourth logic (and) gate
511:第五邏輯(及)閘 511: The fifth logic (and) gate
512:第六邏輯(及)閘 512: The sixth logic (and) gate
513:第七邏輯(或)閘 513: The seventh logic (or) gate
514:第八邏輯(及)閘 514: The eighth logic (and) gate
515:邏輯(或)閘 515: Logic (OR) gate
516:第一多工器 516:First multiplexer
517:第一加法器 517: First adder
518:第一數位比較器 518: First digital comparator
519:第二數位比較器 519: Second digital comparator
520:第三資料鎖存器 520: Third data latch
521:第四資料鎖存器 521: Fourth data latch
522:第五資料鎖存器 522: Fifth data latch
523:第二邏輯(及)閘 523: Second logic (and) gate
524:第一邏輯(或)閘 524: First logical (OR) gate
525:有符號至無符號方塊 525: Signed to unsigned squares
526:第二多工器 526: Second multiplexer
527:第二加法器 527: Second adder
528:第六資料鎖存器 528: Sixth data latch
529:第九資料鎖存器 529: Ninth data latch
530:第三加法器 530: Third adder
531:分壓器 531:Voltage divider
532:第一資料鎖存器 532: First data latch
533:第二資料鎖存器 533: Second data latch
534:微調加法器訊號 534: Fine-tuning the adder signal
535:輸出訊號 535:Output signal
536:邏輯(及)閘 536: Logic (and) gate
537:追蹤訊號 537:Tracking signal
801:等式 801: Equation
802:壓控電容器(變容二極體) 802: Voltage controlled capacitor (varactor diode)
803:節點 803:node
804:微調裝置 804: Fine adjustment device
805:粗調裝置 805: Coarse adjustment device
901:高品質因數電感器 901: High Quality Factor Inductor
902:恆定輔導電路 902:Constant tutoring circuit
903:變容二極體 903:Varactor diode
904:粗調電容器 904: Coarse adjustment capacitor
905:微調電容器 905:Trimmer capacitor
1001~1017:步驟 1001~1017: steps
1201:類比數位轉換器 1201:Analog-to-digital converter
1202:數位比較器 1202:Digital comparator
1400:方法 1400:Method
1401~1405:步驟 1401~1405: Steps
當結合附圖閱讀以下詳細描述時,可以最佳地理解本揭示文件之態樣。 The aspects of this disclosure can best be understood when the following detailed description is read in conjunction with the accompanying drawings.
第1圖為在鎖相迴路中實現的示例性調諧陣列選擇電路、解碼器以及LC壓控振盪器的方塊圖;第2圖為示例性調諧陣列選擇電路、解碼器以及LC壓控振盪器的詳細方塊圖;第3圖為示例性調諧陣列選擇電路、解碼器及LC壓控振盪器之詳細組件的圖式;第4圖為壓控振盪器調整壓控振盪器輸出訊號的示意圖;第5圖為調諧陣列選擇電路的詳細圖式;第6圖為在壓控振盪器調諧訊號略高於類比電壓範圍的條件期間,調諧陣列選擇電路內的各種訊號的時序圖;第7圖為在壓控振盪器調諧訊號明顯高於類比電壓範圍的條件期間,調諧陣列選擇電路內的各種訊號的時序圖;第8圖為LC壓控振盪器的詳細圖式;第9圖為LC壓控振盪器的佈局平面圖;第10圖為LC壓控振盪器的操作流程圖;第11A~11F圖為本揭示文件中的元件所採用的LC壓 控振盪器的不同實施例的圖式;第12圖為使用數位組件實現的上溢與下溢檢測器的圖式;第13A~13B圖為先前方法所用之壓控振盪器輸出訊號以及本揭示文件的方法所用之壓控振盪器輸出訊號的波形圖;第14圖為調諧LC壓控振盪器的方法的流程圖。 Figure 1 is a block diagram of an exemplary tuned array selection circuit, decoder, and LC voltage controlled oscillator implemented in a phase locked loop; Figure 2 is a block diagram of an exemplary tuned array selection circuit, decoder, and LC voltage controlled oscillator Detailed block diagram; Figure 3 is a diagram of the detailed components of an exemplary tuning array selection circuit, decoder, and LC voltage controlled oscillator; Figure 4 is a schematic diagram of the voltage controlled oscillator adjusting the voltage controlled oscillator output signal; Figure 5 The figure shows the detailed diagram of the tuning array selection circuit; Figure 6 shows the timing diagram of various signals in the tuning array selection circuit during the condition when the voltage controlled oscillator tuning signal is slightly above the analog voltage range; Figure 7 shows the timing diagram of the various signals in the tuning array selection circuit. Timing diagram of various signals in the tuning array selection circuit during conditions where the oscillator tuning signal is significantly higher than the analog voltage range; Figure 8 is a detailed diagram of the LC voltage controlled oscillator; Figure 9 is the LC voltage controlled oscillator The layout plan of Diagrams of different embodiments of controlled oscillators; Figure 12 is a diagram of overflow and underflow detectors implemented using digital components; Figures 13A-13B are voltage controlled oscillator output signals used in previous methods and the present disclosure The waveform diagram of the output signal of the voltage controlled oscillator used in the method of the document; Figure 14 is a flow chart of the method of tuning the LC voltage controlled oscillator.
以下的揭示文件提供許多不同的實施例或實例,以用於實現所提供之標的之不同特徵。組件以及配置的具體實例將在下文中描述,以簡化本揭示文件。當然,這些組件以及配置僅為實例,而非限制本揭示文件。此外,本揭示文件可以重複參照各個實例中的數字及/或字母。此重複是出於簡化與清楚目的,且本身並不指示所論述的各實施例及/或配置之間的關係。 The following disclosure provides many different embodiments or examples for implementing different features of the provided subject matter. Specific examples of components and configurations are described below to simplify this disclosure. Of course, these components and configurations are examples only and do not limit this disclosure document. In addition, this disclosure may repeatedly refer to numbers and/or letters in each instance. This repetition is for simplicity and clarity and does not inherently indicate a relationship between the various embodiments and/or configurations discussed.
應注意,本說明書中對「一個實施例」、「一實施例」、「一示例性實施例」、「示例性」等參考指示所描述的實施例可包含特定特徵、結構或特性,但每個實施例不一定包含此特定特徵、結構或特性。此外,此類片語不一定是指同一實施例。此外,當結合實施例描述特定特徵、結構或特性時,無論是否明確描述,結合其他實施例實現此特徵、結構或特性均在熟習此項技術者的知識範圍內。 It should be noted that references such as “one embodiment”, “an embodiment”, “an exemplary embodiment”, “exemplary” and the like in this specification indicate that the described embodiment may include specific features, structures or characteristics, but each Embodiments do not necessarily include such specific features, structures or characteristics. Furthermore, such phrases are not necessarily referring to the same embodiment. Furthermore, when a particular feature, structure or characteristic is described in connection with an embodiment, whether or not explicitly described, it is within the knowledge of one skilled in the art to implement the feature, structure or characteristic in conjunction with other embodiments.
應理解,本揭示文件中的措辭或用語是出於描述而 非限制之目的,使得本揭示文件中的用語或措辭應由熟習此項技術者根據本文的講解進行解釋。 It should be understood that the wording or terminology used in this disclosure document is for description only. It is intended, without limitation, that the terms or expressions used in this disclosure should be interpreted in accordance with the explanation herein by a person skilled in the art.
鎖相迴路(PLL)可以用於調整其振盪器,使得由振盪器產生的輸出訊號的頻率及/或相位與參考輸入訊號的頻率及/或相位成比例。鎖相迴路包含相位及/或頻率檢測器,此相位及/或頻率檢測器提供用以表示輸出訊號與參考輸入訊號之間在頻率及/或相位上的差異的誤差訊號。此誤差訊號可以被量測,以確保輸出訊號的頻率及/或相位與參考訊號的頻率及/或相位成比例。舉例而言,隨著鎖相迴路調整振盪器,輸出訊號的頻率及/或相位可以逐漸接近參考輸入訊號的頻率及/或相位。當輸出訊號的頻率及相位與參考輸入訊號的頻率及/或相位成比例時,代表鎖相迴路被鎖定至參考輸入訊號上。在一些應用中,鎖相迴路可以採用LC壓控振盪器,以在高級計算及行動應用中產生此輸出訊號。 A phase locked loop (PLL) can be used to adjust its oscillator so that the frequency and/or phase of the output signal produced by the oscillator is proportional to the frequency and/or phase of a reference input signal. The phase locked loop includes a phase and/or frequency detector that provides an error signal representing the difference in frequency and/or phase between the output signal and a reference input signal. This error signal can be measured to ensure that the frequency and/or phase of the output signal is proportional to the frequency and/or phase of the reference signal. For example, as the phase locked loop adjusts the oscillator, the frequency and/or phase of the output signal may gradually approach the frequency and/or phase of the reference input signal. When the frequency and phase of the output signal are proportional to the frequency and/or phase of the reference input signal, it means that the phase locked loop is locked to the reference input signal. In some applications, a phase locked loop can use an LC voltage controlled oscillator to generate this output signal in advanced computing and mobile applications.
第1圖為鎖相迴路100之方塊圖。在本揭示文件中,鎖相迴路100包含調諧陣列選擇電路107、解碼器108以及LC壓控振盪器109。調諧陣列選擇電路107用以接收壓控振盪器調諧訊號101以及參考輸入訊號102二者。壓控振盪器調諧訊號101可以源自鎖相迴路100內部。舉例而言,壓控振盪器調諧訊號101可以由鎖相迴路100內的控制迴路產生。調諧陣列選擇電路107用以利用壓控振盪器調諧訊號101以及參考輸入訊號102來判定壓控振盪器調諧訊號101是高於類比電壓範圍、低於類比電壓範
圍還是在類比電壓範圍內。調諧陣列選擇電路107用以根據此判定結果,產生微調二進位碼訊號104以及粗調二進位碼訊號103。這些二進位碼訊號(103,104)可以連同參考輸入訊號102一起由解碼器108接收。解碼器108可以將這些二進位碼訊號(103,104)轉換成微調選擇訊號106以及粗調選擇訊號105。微調選擇訊號106以及粗調選擇訊號105可以在LC壓控振盪器109處被接收,LC壓控振盪器109可以使用這些選擇訊號(105,106)來選擇適當的微調以及粗調裝置。LC壓控振盪器109亦用以接收壓控振盪器調諧訊號101,且用以產生具有與參考輸入訊號102的頻率成比例的頻率的壓控振盪器輸出訊號110。
Figure 1 is a block diagram of the phase locked
第2圖為調諧陣列選擇電路107、解碼器108以及LC壓控振盪器109的詳細圖式。在第2圖所展示的實例中,調諧陣列選擇電路107包含類比上溢與下溢檢測器201、微調計數器電路202、粗調計數器電路203、邊界檢驗器204以及分頻器205。類比上溢與下溢檢測器201可以接收壓控振盪器調諧訊號101。根據壓控振盪器調諧訊號101為高於類比電壓範圍、低於類比電壓範圍或在類比電壓範圍內的判定結果,類比上溢與下溢檢測器201可以產生上溢訊號208或下溢訊號209。上溢訊號208以及下溢訊號209二者可以與第一降低頻率訊號213以及第二降低頻率訊號214一起在微調計數器電路202處被接收。微調計數器電路202可以用以根據上溢訊號208以及下溢
訊號209來判斷在LC壓控振盪器109的微調陣列207中選擇不同的微調裝置是否適當。微調計數器電路202亦可以用以產生一或複數個頻率準位邊界訊號,頻率準位邊界訊號包含高頻率準位邊界訊號210以及低頻率準位邊界訊號211,與在下文中所描述,產生在寬頻率範圍的上邊界或下邊界處的頻率的微調裝置相對應。微調計數器電路202亦可以用以產生微調二進位碼訊號104,微調二進位碼訊號104對應於在LC壓控振盪器109的微調陣列207中所選擇的適當的微調裝置。
Figure 2 is a detailed diagram of the tuning
調諧陣列選擇電路107可進一步包含粗調計數器電路203。在一個實例中,粗調計數器電路203用以接收頻率準位邊界訊號(210,211)、第二降低頻率訊號214以及粗調二進位碼輸入訊號218。在一個實例中,粗調二進位碼輸入訊號218為輸入訊號,且用於選擇初始粗調二進位碼訊號。粗調計數器電路203可進一步用以產生粗調二進位碼訊號103。在一個實例中,粗調二進位碼訊號103為根據頻率準位邊界訊號(210,211)以及粗調二進位碼輸入訊號218所判定。
Tuned
邊界檢驗器204用以接收粗調二進位碼訊號103以及來自微調計數器電路202的壓控振盪器上溢調諧訊號216與壓控振盪器下溢調諧訊號217。這些訊號可以用於判定調諧陣列選擇電路107的致能是否適當。邊界檢驗器204可以根據此判定來產生致能訊號215,致能訊號215可以用於致能或禁能調諧陣列選擇電路107。
The
調諧陣列選擇電路107亦可包含分頻器205。在一個示例性實施例中,分頻器205可以用以接收輸入參考訊號102。分頻器205接著可以將輸入參考訊號102除以第一預定常數並產生第一降低頻率訊號213。第一降低頻率訊號213可以由微調計數器電路202接收。分頻器205亦可將輸入參考訊號102除以第二預定常數並產生第二降低頻率訊號214,第二降低頻率訊號214可以由微調計數器電路202、粗調計數器電路203以及邊界檢驗器204中的一或複數個鎖存器作為「時脈」輸入被接收,如熟習此項技術者所理解。
Tuned
解碼器108亦展示於第2圖中。解碼器108可以用以接收來自邊界檢驗器204的粗調二進位碼訊號103、來自微調計數器電路202的微調二進位碼訊號104以及參考輸入訊號102。解碼器108可以將粗調二進位碼訊號103以及微調二進位碼訊號104轉換為一或複數個微調選擇訊號106以及一或複數個粗調選擇訊號105。解碼器108可以將二進位碼訊號(103,104)轉換為選擇訊號(105,106),例如,因為選擇訊號(105,106)可以比二進位碼訊號(103,104)更容易地適用於個別裝置的選擇。
第2圖亦展示LC壓控振盪器109。LC壓控振盪器109可以包含粗調陣列206以及微調陣列207。舉例而言,粗調陣列206可以包含複數個粗調裝置,且微調陣列207可以包含複數個微調裝置。粗調陣列206可以用以調
諧LC壓控振盪器109,以產生具有在寬頻率範圍內的頻率的壓控振盪器輸出訊號110。相較之下,微調陣列207可以用以調諧LC壓控振盪器109,以產生具有在窄頻率範圍內的頻率的壓控振盪器輸出訊號110。在一個實例中,此窄頻率範圍位於寬頻率範圍內。
Figure 2 also shows an LC voltage controlled
第3圖為調諧陣列選擇電路107、解碼器108以及LC壓控振盪器109的詳細圖式。第3圖所展示的細節將在下文中進行進一步討論。
Figure 3 is a detailed diagram of the tuning
第4圖為詳細描述LC壓控振盪器109藉由選擇適當的粗調以及微調裝置來調整壓控振盪器輸出訊號110的機制的圖式。根據第4圖所展示的實例,微調裝置可以代表50MHz的窄頻率範圍402。然而,粗調裝置可以代表200MHz的寬頻率範圍401。調諧陣列選擇電路107、解碼器108以及LC壓控振盪器109可以彼此配合,以使用等於微調裝置的頻率步階的步階來調整壓控振盪器輸出訊號110的頻率,進一步減少由此頻率改變引起的轉換抖動(transition jitter)。舉例而言,頻率範圍位於寬頻率範圍401中的高頻率準位所對應的微調裝置可以被選擇。此操作狀態由第4圖中的「Band@10,FINE@7」表示。在此實例中,10以及7為分別用於指示選擇哪個粗調裝置以及哪個微調裝置的變數。若選擇的裝置是與位於寬頻率範圍401中的高頻率準位的頻率範圍相對應的微調裝置,且壓控振盪器調諧訊號101高於類比電壓範圍,則將選擇代表頻率增加的粗調裝置。此情況在第4圖中藉由粗調裝
置從「Band@10」移動至「Band@11」來說明。在第4圖所展示之實例中,此情況對應於壓控振盪器輸出訊號110的頻率所增加的200MHz。然而,與位於寬頻率範圍401中的低準位相對應的微調裝置被選擇。這情況在第4圖中藉由微調裝置從「FINE@7」移動至「FINE@4」來說明。因此,在此實例中,由粗調裝置所代表的頻率已增加200MHz。然而,由微調裝置所代表的頻率已降低150MHz。因此,壓控振盪器輸出訊號110的頻率淨增加50MHz。在鎖相迴路100中引起的轉換抖動,小於由大於50MHz的頻率增加(例如,等於粗調裝置之頻率的頻率增加)所引起的轉換抖動。
Figure 4 is a diagram illustrating in detail the mechanism of the LC voltage controlled
第5圖展示調諧陣列選擇電路107的詳細實行圖式。在第5圖所展示的示例性實施例中,壓控振盪器調諧訊號VTUNE 101可以在類比上溢與下溢檢測器201中的放大器的正端處作為輸入被接收。放大器可以藉由其負端耦合至分壓器531。分壓器531上的第一節點503可以代表高預定值,而分壓器上的第二節點504可以代表低預定值。高預定值503以及低預定值504可以對應於類比電壓範圍的極限。壓控振盪器調諧訊號101可以與高預定值503以及低預定值504進行比較,且放大器可以根據壓控振盪器調諧訊號VTUNE 101是高於類比電壓範圍、低於類比電壓範圍還是位於類比電壓範圍內,產生上溢訊號over_ana 208以及下溢訊號under_ana 209。舉例而言,當壓控振盪器調諧訊號VTUNE 101高於類比電壓範
圍時,可以致能上溢訊號over_ana 208,且當壓控振盪器調諧訊號VTUNE 101低於類比電壓範圍時,可以致能下溢訊號under_ana 209。
Figure 5 shows a detailed implementation diagram of the tuned
上溢訊號208以及下溢訊號209可以由微調計數器電路202作為輸入被接收。舉例而言,上溢訊號over_ana 208可以由第一資料鎖存器532作為輸入被接收,且下溢訊號under_ana 209可以作為傳送至微調計數器電路202中的第二資料鎖存器533的輸入被接收。資料鎖存器(532,533)亦可接收來自分頻器205的第一降低頻率訊號213,且相同的資料鎖存器(532,533)可以產生壓控振盪器上溢調諧訊號ov_rt 216以及壓控振盪器下溢調諧訊號ud_rt 217。壓控振盪器上溢調諧訊號ov_rt 216以及壓控振盪器下溢調諧訊號ud_rt 217可以在第一多工器516處被接收,第一多工器516可以利用這些訊號來產生微調加法器訊號534。微調加法器訊號534可以由第一加法器517接收。第一加法器517的輸出可以由第二邏輯(及)閘523、第一數位比較器518以及第二數位比較器519接收。在一個示例性實施例中,當第一加法器517的輸出等於預定值時,會致能第一數位比較器518的輸出,且當第一加法器517的輸出等於不同的預定值時,會致能第二數位比較器519的輸出。第一數位比較器518的輸出可以對應於微調陣列207中的所選擇的微調裝置與位於寬頻率範圍401中的高準位的頻率相對應的判定。類似地,第二數位比較器519的輸出可以對應於微調陣列207中的
所選擇的微調裝置與位於寬頻率範圍401中的低準位的頻率相對應的判定。
The
第二邏輯(及)閘523的輸出可以作為傳送至第三資料鎖存器520的輸入被接收,且第一數位比較器518的輸出可以作為傳送至第四資料鎖存器521的輸入被接收。第二數位比較器519的輸出可以作為傳送至第五資料鎖存器522的輸入被接收。耦合至第一數位比較器518的第四資料鎖存器521可以產生微調範圍上溢訊號fine_ov 210,且耦合至第二數位比較器519的第五資料鎖存器522可以產生微調範圍下溢訊號fine_ud 211。在一個實例中,微調範圍上溢與下溢訊號(210,211)可以對應於窄頻率範圍402位於寬頻率範圍401中的高準位或低準位的判定。
The output of the second logic (AND)
微調範圍上溢訊號210以及微調範圍下溢訊號211可以在微調計數器電路202中的第一邏輯(或)閘524處被接收,當任一訊號(210,211)被致能時,會致能第一邏輯(或)閘524。第一邏輯(或)閘524的輸出可以在第二邏輯(及)閘523的反相輸入節點處被接收。如前文所討論,第二邏輯(及)閘523的輸出可以在資料鎖存器520處被接收。資料鎖存器520的輸出可以是微調計數器變數fine_count[3:0]501,且在第一加法器517以及有符號至無符號方塊525二者處被接收。在一個實例中,微調計數器變數fine_count[3:0]501為有符號二進位數,其代表正或負的二進位數。有符號至無符號方塊525可以
將此正或負的二進位數轉變為正的二進位數,並產生微調二進位碼訊號fine_bin_out[2:0]104。舉例而言,有符號至無符號方塊525接收值為「1101」的微調計數器變數fine_count[3:0]501,此值對應於十進位數字系統中的-3,並產生值為「001」的微調二進位碼訊號fine_bin_out[2:0]104,此值對應於十進位數字系統中的1。類似地,有符號至無符號方塊525可以接收值為「0011」的微調計數器變數fine_count[3:0]501,此值對應於十進位數字系統中的3,並產生值為「111」的微調二進位碼訊號fine_bin_out[2:0]104,此值對應於十進位數字系統中的7。
The trimming
微調範圍上溢訊號fine_ov 210以及微調範圍下溢訊號fine_ud 211亦可作為傳送至粗調計數器電路203中的第二多工器526的輸入被接收。根據微調範圍上溢訊號fine_ov 210以及微調範圍下溢訊號fine_ud 211,多工器526可以用於根據是否應選擇不同的粗調裝置,來產生輸出訊號535。輸出訊號535可以在第二加法器527處接收。第二加法器527的輸出可以作為傳送至第六資料鎖存器528的輸入被接收。第六鎖存器528的輸出可以與粗調二進位碼輸入訊號band_bin[3:0]218一起在第三加法器530處被接收。在一實施例中,粗調二進位碼輸入訊號band_bin[3:0]218用以設置粗調二進位碼訊號band_bin_out[3:0]103的初始值。第六鎖存器528的輸出亦可耦合至第二加法器527,且第六鎖存器
528的輸出可以是粗調計數器變數coar_count[3:0]502。第三加法器530的輸出可以作為可以由解碼器108接收的粗調二進位碼訊號band_bin_out[3:0]103。
The fine adjustment range
粗調二進位碼訊號band_bin_out[3:0]103可以耦合至邊界檢驗器204中的第三數位比較器505、第四數位比較器506、第五數位比較器507以及第六數位比較器508。在第5圖所展示的示例性實施例中,粗調二進位碼訊號band_bin_out[3:0]103被限制於0與15之間。第三、第四、第五以及第六數位比較器(505,506,507,508)可以輔助邊界檢驗器204,以防止粗調二進位制碼訊號band_bin_out[3:0]103的耗盡以及系統崩潰。舉例而言,在第5圖所展示的實施例中,若粗調二進位碼訊號band_bin_out[3:0]103大於1,則將致能第三數位比較器505的輸出,且若粗調二進位碼訊號band_bin_out[3:0]103小於14,則將致能第四數位比較器506的輸出。若數位比較器二者(505,506)的輸出被致能,則將允許選擇與較大寬頻率範圍401或較低寬頻率401相對應的粗調裝置。因此,第三以及第四數位比較器(505,506)的輸出會耦合至邏輯(及)閘536的單獨輸入。邏輯(及)閘536的輸出耦合至第七資料鎖存器509的輸入,且第七資料鎖存器509的輸出耦合至第四邏輯(及)閘510。邏輯(及)閘510的另一輸入耦合至邏輯(或)閘515,邏輯(或)閘515接收來自微調計數器電路202的壓控振盪器上溢調諧訊號ov_rt 216以及壓控振盪器下溢調
諧訊號ud_rt 217二者作為輸入。第四邏輯(及)閘510的輸出為邏輯(或)閘513的三個輸入的其中之一。邏輯(或)閘513的三個輸入中之各者代表可以致能調諧陣列選擇電路107的條件。舉例而言,當粗調二進位碼訊號band_bin_out[3:0]103等於0時,第五數位比較器507的輸出被致能。此輸出以及壓控振盪器上溢調諧訊號216在第五邏輯(及)閘511處作為輸入被接收。類似地,當粗調二進位碼訊號band_bin_out[3:0]103等於15時,第六數位比較器508的輸出被致能。此輸出與壓控振盪器下溢調諧訊號ud_rt 217一起在邏輯(及)閘512處作為輸入被接收。
The coarse binary code signal band_bin_out[3:0] 103 may be coupled to the third
第七邏輯(或)閘513的輸出與追蹤訊號537一起在第八邏輯(及)閘514處被接收。邏輯(及)閘514的輸出為致能訊號EN 215,用於控制調諧陣列選擇電路107的致能。因此,當第四邏輯(及)閘510、第五邏輯(及)閘511以及第六邏輯(及)閘512全部被禁能時,調諧陣列選擇電路107會被禁能,以防止系統崩潰。
The output of the seventh logic (OR)
第5圖亦展示了分頻器205。在一示例性實施例中,分頻器205接收參考輸入訊號102。分頻器205亦可接收來自邊界檢驗器204的致能訊號EN 215。參考輸入訊號102可以在第九資料鎖存器529處被接收。分頻器205可以用以產生第一降低頻率訊號213,其中第一降低頻率訊號213等於參考輸入訊號102的頻率除以第一預定值。分頻器205亦可用以產生不同的第二降低頻率訊號
214,其中第二降低頻率訊號214等於參考輸入訊號102的頻率除以第二預定值。不同頻率的訊號可以根據不同組件的不同頻率要求,在不同組件處被接收。
Figure 5 also shows
第6圖為展示微調裝置的選擇變化的時序圖。在一示例性實施例中,微調計數器變數fine_count[3:0]501被限制於-4與+4之間。在第6圖所展示的實例中,微調計數器變數fine_count[3:0]501在有符號至無符號方塊525處被接收,且被轉換成微調二進位碼訊號fine_bin_out[2:0]104。粗調計數器變數coar_count[3:0]502可以與無符號二進位碼輸入訊號band_bin[3:0]218結合以產生新的粗調二進位碼訊號band_bin_out[3:0]103。粗調二進位碼訊號band_bin_out[3:0]103被限制於0與15之間。
Figure 6 is a timing diagram showing the selection changes of the trimming device. In an exemplary embodiment, the fine counter variable fine_count[3:0] 501 is limited between -4 and +4. In the example shown in FIG. 6 , the fine counter variable fine_count[3:0] 501 is received at the signed to
鎖相迴路100可以增加壓控振盪器調諧訊號VTUNE 101以維持壓控振盪器輸出訊號110。然而,壓控振盪器調諧訊號101可能會超過類比上溢與下溢檢測器201中的高預定值,導致上溢訊號over_ana 208被致能,並以致能訊號215致能分頻器205。若在第二降低頻率訊號214的64個循環(輸入參考訊號FREF 102的1024個循環)之後,壓控振盪器調諧訊號101仍超越類比上溢與下溢檢測器201中的高預定值,則微調計數器變數fine_count[3:0]501將增加1。微調二進位碼訊號fine_bin_out[2:0]104將增加(例如,從4增加至5),此狀況將稍微增加壓控振盪器輸出訊號110的頻率。在第
6圖的時序圖所展示的實例中,鎖相迴路100將讀出:壓控振盪器輸出訊號110的頻率被充分鎖定至參考輸入訊號102的頻率,壓控振盪器調諧訊號VTUNE 101位於類比電壓範圍中,且調諧陣列選擇電路107的操作將停止。
The phase locked
第7圖為展示選擇粗調陣列206中的另一粗調裝置的操作的時序圖。在第7圖所說明的實例中,微調計數器變數fine_count[3:0]501增加至3,且上溢訊號208仍被致能。此情況觸發高頻率準位邊界訊號fine_ov 210的訊號。在此情況下,粗調計數器變數coar_count[3:0]502從0增加至1,且粗調二進位碼訊號band_bin_out[3:0]103從5增加至6。同時,微調計數器變數fine_count[3:0]501被重置為0,以強制使微調二進位碼訊號fine_bin_out[2:0]104回歸至值4。因此,壓控振盪器輸出訊號110的頻率總共僅增加50MHz。此情況是因為微調計數器變數fine_count[3:0]501的值的變化導致降低了150MHz的頻率,且粗調計數器變數coar_count[3:0]502的值的變化導致增加了200MHz的頻率。
FIG. 7 is a timing diagram illustrating the operation of selecting another coarse adjustment device in the
第8圖為一個LC壓控振盪器109的實施例的詳細圖式。壓控振盪器調諧訊號VTUNE 101可以在LC壓控振盪器109的節點803處被接收,節點803在任一側上耦合至壓控電容器(變容二極體)802。LC壓控振盪器109可以包含微調陣列207以及粗調陣列206。在第8圖所展示的實例中,微調陣列207包含複數個微調裝置804,且
粗調陣列206包含複數個粗調裝置805。在第8圖所展示的實施例中,粗調裝置805以及微調裝置804為電容器。粗調選擇訊號band_th[14:0]105可以作為傳送至粗調陣列206的輸入被接收,且微調選擇訊號fine_th[6:0]106可以作為傳送至微調陣列207的輸入被接收。
Figure 8 is a detailed diagram of an embodiment of an LC voltage controlled
例如,LC壓控振盪器109可以包含2個金屬-氧化物-金屬(metal-oxide-metal,MOM)電容器陣列,如熟習此項技術者所理解。粗調陣列206可以經過設計以覆蓋寬頻率調諧。在一實例中,粗調陣列206可以包含15個步階,每個步階為200MHz。因此,LC壓控振盪器109可以具有3GHz的頻率調諧範圍。微調陣列207可以經過設計以產生小步階。微調陣列207可以僅包含7個步階,每個步階為50MHz。在此實例中,微調裝置804的頻率步階為粗調裝置805的步階的四分之一。此情況以第8圖中的等式801表示。然而,微調裝置步階對粗調裝置步階的比率可以為八分之一、十分之一等。此比率可以視不同設計要求或不同應用而定。
For example, the LC voltage controlled
第9圖為LC壓控振盪器109從上至下的佈局平面圖900。佈局平面圖900包含高品質因數(quality factor,Q)電感器901、恆定輔導(gm)電路902、變容二極體903、微調電容器905以及粗調電容器904,如熟習此項技術者所理解。
Figure 9 is a
第10圖展示本揭示文件的鎖相迴路對於非預期干擾的回應的流程圖。舉例而言,鎖相迴路可能受到測試環 境的影響。非預期雜訊、溫度變化或其他因素可能改變鎖相迴路之鎖定狀態。首先,可能發生非預期雜訊或任何電壓或溫度變化。在此情況下,壓控振盪器調諧訊號VTUNE將增加或減小,以維持鎖定至輸入參考訊號上的壓控振盪器輸出訊號的頻率。此步驟以方塊1001表示。當如箭頭1002所展示,壓控振盪器調諧訊號VTUNE超過上限值時,將致能上溢訊號並將禁能下溢訊號。致能訊號215也將啟用以致能調諧陣列選擇電路。此步驟展示於方塊1005中。在滿足此條件之後,接下來要考慮的是微調二進位碼訊號是否等於上限值,如箭頭1008所表示。在第10圖所展示的實例中,此值為7。因此,若微調二進位碼訊號等於7,則粗調二進位碼訊號將增加1且微調二進位碼訊號將改變為較低準位,此較低準位在此實例中為4。此步驟以方塊1014表示。若微調二進位碼訊號不等於7,則微調二進位碼訊號只會增加1,如方塊1015所展示。 Figure 10 shows a flow chart of the response of the phase locked loop of the present disclosure to unexpected interference. For example, phase locked loops may be affected by the test environment. Unexpected noise, temperature changes, or other factors may change the locking state of the phase-locked loop. First, unexpected noise or any voltage or temperature changes may occur. In this case, the voltage controlled oscillator tuning signal V TUNE will increase or decrease to maintain the frequency of the voltage controlled oscillator output signal locked to the input reference signal. This step is represented by block 1001. When the voltage controlled oscillator tuning signal V TUNE exceeds the upper limit value as shown by arrow 1002, the overflow signal is enabled and the underflow signal is disabled. Enable signal 215 will also enable the enable tuned array selection circuit. This step is shown in block 1005. After meeting this condition, the next thing to consider is whether the fine-tuning binary code signal is equal to the upper limit value, as indicated by arrow 1008. In the example shown in Figure 10, this value is 7. Therefore, if the fine binary signal is equal to 7, the coarse binary signal will be increased by 1 and the fine binary signal will change to a lower level, which is 4 in this example. This step is represented by block 1014. If the trimming binary code signal is not equal to 7, then the trimming binary code signal will only increase by 1, as shown in block 1015.
接下來,必須考慮上溢訊號以及下溢訊號的狀態。若如箭頭1010所展示,上溢訊號以及下溢訊號二者為0,則致能訊號215將被設置為「0」,且調諧陣列選擇電路以及LC壓控振盪器將停止操作,如方塊1006所展示。然而,若如箭頭1009所展示,上溢訊號仍被致能,則調諧陣列選擇電路將會生效,且將再次遵循方塊1005中描述的過程。 Next, the status of the overflow signal and the underflow signal must be considered. If both the overflow signal and the underflow signal are 0 as shown by arrow 1010, then the enable signal 215 will be set to "0" and the tuning array selection circuit and the LC voltage controlled oscillator will cease operation, as shown in block 1006 displayed. However, if the overflow signal is still enabled as shown by arrow 1009, then the tuning array selection circuit will be enabled and the process described in block 1005 will be followed again.
如箭頭1004所展示,當壓控振盪器調諧訊號VTUNE 101低於下限值時,電路會表現類似的行為。當壓
控振盪器調諧訊號VTUNE 101下降至低於類比電壓範圍時,下溢訊號將被致能,且致能訊號215亦將被致能,如方塊1007所展示。在滿足此條件之後,接下來要考慮的是微調二進位碼訊號是否等於下限值,如箭頭1013所展示。在第10圖所展示的實例中,此值為1。因此,若微調二進位碼訊號等於1,則粗調二進位碼訊號將減小1且微調二進位碼訊號將被改變至較高準位,在此實例中,較高準位為4。此步驟由方塊1016表示。若微調二進位碼訊號不等於1,則微調二進位碼訊號將只會減小1,如方塊1017所展示。
As shown by arrow 1004, the circuit will behave similarly when the voltage controlled oscillator
接下來要考慮的是上溢訊號以及下溢訊號的值。若上溢訊號以及下溢訊號二者被禁能,如箭頭1011,則調諧陣列選擇電路將被禁能並停止操作。然而,若如箭頭1012,下溢訊號仍被致能,則調諧陣列選擇電路以及邊界檢驗器將被致能,且致能訊號215將被設置為「1」。儘管可能有非預期雜訊或電壓或溫度變化,但是仍存在壓控振盪器調諧訊號VTUNE位於類比電壓範圍內的可能性,如箭頭1003所表示。在此情況下,致能訊號215將設置為「0」,且將不採取動作,如方塊1006所展示。
The next thing to consider is the value of the overflow signal and the underflow signal. If both the overflow signal and the underflow signal are disabled, as shown by arrow 1011, the tuning array selection circuit will be disabled and cease operation. However, if the underflow signal is still enabled as shown by arrow 1012, then the tuning array selection circuit and the boundary checker will be enabled, and the enable signal 215 will be set to "1". Although there may be unexpected noise or voltage or temperature changes, there is still the possibility that the voltage controlled oscillator tuning signal V TUNE is within the analog voltage range, as indicated by arrow 1003 . In this case, enable
第11A圖、第11B圖、第11C圖、第11D圖、第11E圖以及第11F圖展示了可以利用本揭示文件的實施例的複數個不同壓控振盪器類型。第11A圖展示了互補式LC壓控振盪器。第11D圖展示了僅有n通道的金屬氧化物半導體場效電晶體(MOSFET)的LC壓控振盪器。本 揭示文件的壓控振盪器可以使用偏壓n通道的MOSFET。舉例而言,第11B圖展示了具有偏壓n通道的MOSFET的互補式LC壓控振盪器。此外,第11E圖展示了僅有n通道的MOSFET的LC壓控振盪器,此LC壓控振盪器具有偏壓n通道的MOSFET。利用本揭示文件的實施例的壓控振盪器亦可採用電流鏡。第11C圖展示了具有電流鏡的互補式LC壓控振盪器。類似地,第11F圖展示了具有電流鏡的僅有n通道的MOSFET的LC壓控振盪器。此外,其他在本揭示文件之精神以及範疇內的壓控振盪器也可以被使用。 Figures 11A, 11B, 11C, 11D, 11E, and 11F illustrate several different voltage controlled oscillator types that may utilize embodiments of the present disclosure. Figure 11A shows a complementary LC voltage controlled oscillator. Figure 11D shows an n-channel metal-oxide-semiconductor field-effect transistor (MOSFET) LC voltage-controlled oscillator. Book The voltage controlled oscillator disclosed in the document can be biased using an n-channel MOSFET. As an example, Figure 11B shows a complementary LC voltage controlled oscillator with a biased n-channel MOSFET. In addition, Figure 11E shows an LC voltage controlled oscillator with only n-channel MOSFETs. This LC voltage-controlled oscillator has an n-channel MOSFET biased. Voltage controlled oscillators utilizing embodiments of this disclosure may also employ current mirrors. Figure 11C shows a complementary LC voltage controlled oscillator with a current mirror. Similarly, Figure 11F shows an n-channel MOSFET-only LC voltage controlled oscillator with a current mirror. Additionally, other voltage controlled oscillators may be used within the spirit and scope of this disclosure.
第12圖為以數位形式實現上溢與下溢檢測器的圖式。藉由使用類比數位轉換器1201將壓控振盪器調諧訊號VTUNE 101轉變成16位元數位碼,可以以數位的形式來實現上溢與下溢檢測器。16位元在第12圖中表示為類比數位轉換器1201中的A0至A15。16個單獨位元B0至B15可以用於設置壓控振盪器調諧訊號VTUNE 101的上限以及下限。舉例而言,前8位元B0~B7可以用於設置壓控振盪器調諧訊號VTUNE 101的下限,而後8位元B8~B15可以用於設置壓控振盪器調諧訊號VTUNE 101的上限。透過數位比較器1202,可以將壓控振盪器調諧訊號VTUNE 101與這些上限以及下限進行比較。在一實例中,若供應電壓VDD為0.8V,則1位元可覆蓋50mV。因此,當B0~B5設置為6’b111111,B6~B9設置為4’b0000且B10~B15設置為6’b111111時,下限值被設置為
300mV且上限被設置為500mV。若壓控振盪器調諧訊號VTUNE 101為400mV,則上溢訊號208將被禁能,且下溢訊號209亦將被禁能。若壓控振盪器調諧訊號VTUNE 101為550mV,則上溢訊號將被致能,且下溢訊號將被禁能。然而,若壓控振盪器調諧訊號VTUNE 101為250mV,則上溢訊號208將被禁能,且下溢訊號209將被致能。
Figure 12 shows a diagram of a digital implementation of an overflow and underflow detector. By using an analog-to-
第13A圖以及第13B圖為展示本揭示文件的LC壓控振盪器的實施例的效果所造成的轉換抖動(transition jitter)以及安定時間減少的圖式。與先前方法相比,本揭示文件的實施例所引起的轉換抖動可以減少至四分之一倍。安定時間可以減少至六分之一倍。第13A圖的時序圖展示了使用先前調諧方法的壓控振盪器輸出訊號的波形。在先前方法中,3.5GHz輸出頻率下的轉換可能產生約3.2皮秒的轉換抖動以及約0.3微秒的安定時間。第13B圖的時序圖展示了使用本揭示文件的方法的壓控振盪器輸出訊號的波形。利用本文所採用的系統以及方法,轉換抖動可以減少至0.8皮秒,且安定時間小於50奈秒。 Figures 13A and 13B are diagrams illustrating the reduction in transition jitter and settling time caused by the effects of the LC voltage controlled oscillator embodiment of the present disclosure. Conversion jitter caused by embodiments of the present disclosure can be reduced by up to a factor of four compared to previous methods. Settling time can be reduced by a factor of six. The timing diagram of Figure 13A shows the waveform of the voltage controlled oscillator output signal using the previous tuning method. In the previous approach, transitions at a 3.5GHz output frequency could produce transition jitter of approximately 3.2 picoseconds and a settling time of approximately 0.3 microseconds. The timing diagram of Figure 13B shows the waveform of the output signal of the voltage controlled oscillator using the method of this disclosure document. Using the system and method used in this article, the conversion jitter can be reduced to 0.8 picoseconds and the settling time is less than 50 nanoseconds.
第14圖為調諧LC壓控振盪器的方法1400的流程圖。在一實例中,第一步驟1401為接收壓控振盪器調諧訊號。根據本揭示文件的實例,下一步驟1402為判定壓控振盪器調諧訊號為高於類比電壓範圍、低於類比電壓範圍還是位於類比電壓範圍中。若壓控振盪器調諧訊號高於類比電壓範圍,則本方法中的下一步驟1403為選擇微調裝置來產生位於較高窄頻率範圍中的壓控振盪器輸出訊
號。然而,若壓控振盪器調諧訊號低於類比電壓範圍,則本方法中的下一步驟1404為選擇微調裝置來產生位於較低窄頻率範圍中的壓控振盪器輸出訊號。無論選擇微調裝置來產生位於較高窄頻率範圍中的壓控振盪器輸出訊號還是位於較低窄頻率範圍中的壓控振盪器輸出訊號,下一步驟1405為判定窄頻率範圍是處於寬頻率範圍的高準位還是低準位。
Figure 14 is a flow diagram of a
前文揭示一種鎖相迴路。在一些鎖相迴路的實施例中,本揭示文件的鎖相迴路包含壓控振盪器,壓控振盪器包含粗調陣列以及微調陣列,粗調陣列包含複數個粗調裝置,微調陣列包含複數個微調裝置。本揭示文件的鎖相迴路可用以從微調陣列的複數個微調裝置之中選擇一微調裝置來將壓控振盪器輸出訊號的頻率增加至較高窄頻率範圍內的準位。此種選擇可根據壓控振盪器調諧訊號高於類比電壓範圍的判定進行。 The previous article reveals a phase-locked loop. In some embodiments of the phase locked loop, the phase locked loop of the present disclosure includes a voltage controlled oscillator, the voltage controlled oscillator includes a coarse adjustment array and a fine adjustment array, the coarse adjustment array includes a plurality of coarse adjustment devices, and the fine adjustment array includes a plurality of coarse adjustment devices. Fine adjustment device. The phase locked loop of the present disclosure can be used to select a trimming device from a plurality of trimming devices in the trimming array to increase the frequency of the voltage controlled oscillator output signal to a higher level within a narrow frequency range. This selection can be based on the determination that the voltage controlled oscillator tuning signal is above the analog voltage range.
在一些鎖相迴路的實施例中,壓控振盪器亦可用以從微調陣列的複數個微調裝置之中選擇一微調裝置來將壓控振盪器輸出訊號的頻率減小至較低窄頻率範圍內的準位。此種選擇可根據壓控振盪器調諧訊號低於類比電壓範圍的判定進行。根據壓控振盪器調諧訊號高於類比電壓範圍且窄頻率範圍位於寬頻率範圍內的高準位的判定,壓控振盪器可進一步用以從粗調陣列的複數個粗調裝置之中選擇一粗調裝置來將壓控振盪器輸出訊號的頻率增加至較高寬頻率範圍內的準位。 In some embodiments of the phase locked loop, the voltage controlled oscillator can also be used to select a trimming device from a plurality of trimming devices in the trimming array to reduce the frequency of the output signal of the voltage controlled oscillator to a lower narrow frequency range. level. This selection may be based on the determination that the voltage controlled oscillator tuning signal is below the analog voltage range. Based on the determination that the tuning signal of the voltage controlled oscillator is higher than the analog voltage range and the narrow frequency range is at a high level within the wide frequency range, the voltage controlled oscillator can be further used to select one of the plurality of coarse adjustment devices of the coarse adjustment array. A coarse adjustment device is used to increase the frequency of the voltage controlled oscillator output signal to a higher level within a wide frequency range.
在一些鎖相迴路的實施例中,根據壓控振盪器調諧訊號低於類比電壓範圍且窄頻率範圍位於寬頻率範圍內的低準位的判定,壓控振盪器可進一步用以從粗調陣列的複數個粗調裝置之中選擇一粗調裝置來將壓控振盪器輸出訊號的頻率減小至較低頻率範圍內的準位。 In some phase-locked loop embodiments, the voltage-controlled oscillator may further be used to adjust the voltage-controlled oscillator from a coarse-tuned array based on a determination that the voltage-controlled oscillator tuning signal is below the analog voltage range and that the narrow frequency range is at a low level within the wide frequency range. A coarse adjustment device is selected among a plurality of coarse adjustment devices to reduce the frequency of the output signal of the voltage controlled oscillator to a level within a lower frequency range.
在一些鎖相迴路的實施例中,本揭示文件之壓控振盪器可進一步用以接收一或複數個粗調選擇訊號,以用於從粗調陣列的複數個粗調裝置之中選擇一粗調裝置。此外,壓控振盪器可用以接收一或複數個微調選擇訊號,以用於從微調陣列的複數個微調裝置之中選擇一微調裝置。複數個粗調裝置中之各者可以被選擇來將壓控振盪器輸出訊號調諧至不同的寬頻率範圍。複數個微調裝置中之各者可以被選擇來將壓控振盪器輸出訊號調諧至所選擇的粗調裝置的寬頻率範圍內的不同窄頻率範圍。 In some phase locked loop embodiments, the voltage controlled oscillator of the present disclosure may be further used to receive one or a plurality of coarse adjustment selection signals for selecting a coarse adjustment device from a plurality of coarse adjustment devices in the coarse adjustment array. adjustment device. In addition, the voltage controlled oscillator can be used to receive one or a plurality of trimming selection signals for selecting a trimming device from a plurality of trimming devices in the trimming array. Each of a plurality of coarse tuning devices may be selected to tune the voltage controlled oscillator output signal to a different wide frequency range. Each of the plurality of fine tuning devices may be selected to tune the voltage controlled oscillator output signal to a different narrow frequency range within the wide frequency range of the selected coarse tuning device.
在一些鎖相迴路的實施例中,壓控振盪器可進一步用以當微調陣列產生的壓控振盪器輸出訊號的頻率位於寬頻率範圍內的較高頻率準位且壓控振盪器調諧訊號高於類比電壓範圍時,選擇與寬頻率範圍內的較低頻率準位相對應的微調裝置。透過此種方式,壓控振盪器可以經調諧以產生具有頻率淨增加的壓控振盪器輸出訊號。 In some phase locked loop embodiments, the voltage controlled oscillator can be further used when the frequency of the voltage controlled oscillator output signal generated by the trimming array is at a higher frequency level within a wide frequency range and the voltage controlled oscillator tuning signal is high. In the analog voltage range, select a trimmer corresponding to the lower frequency level within the wide frequency range. In this manner, the voltage controlled oscillator can be tuned to produce a voltage controlled oscillator output signal with a net increase in frequency.
在一些鎖相迴路的實施例中,壓控振盪器亦可進一步用以當微調陣列產生的壓控振盪器輸出訊號的頻率位於寬頻率範圍內的較低頻率準位且壓控振盪器調諧訊號低於類比電壓範圍時,選擇與寬頻率範圍內的較高頻率準位相 對應的微調裝置。透過此種方式,壓控振盪器可以經調諧以產生具有頻率淨減小的壓控振盪器輸出訊號。壓控振盪器輸出訊號的頻率淨增加以及頻率淨減小的幅度可小於寬頻率範圍。壓控振盪器輸出訊號的頻率淨增加以及頻率淨減小在鎖相迴路中引起轉換抖動,此轉換抖動小於由壓控振盪器輸出訊號的頻率增加等於寬頻率範圍所引起的轉換抖動。 In some phase locked loop embodiments, the voltage controlled oscillator can also be further used when the frequency of the voltage controlled oscillator output signal generated by the trimming array is at a lower frequency level within a wide frequency range and the voltage controlled oscillator tuning signal Below the analog voltage range, select the phase phase with a higher frequency level within a wide frequency range. Corresponding fine-tuning device. In this manner, the voltage controlled oscillator can be tuned to produce a voltage controlled oscillator output signal with a net reduction in frequency. The amplitude of the net increase in frequency and the net decrease in frequency of the voltage controlled oscillator output signal may be smaller than the wide frequency range. The net increase in frequency and the net decrease in frequency of the voltage controlled oscillator output signal cause switching jitter in the phase locked loop, which switching jitter is smaller than the switching jitter caused by the frequency increase of the voltage controlled oscillator output signal equal to a wide frequency range.
在一些鎖相迴路的實施例中,本揭示文件之鎖相迴路亦可包含調諧陣列選擇電路。調諧陣列選擇電路可用以接收壓控振盪器調諧訊號,且根據壓控振盪器調諧訊號為高於類比電壓範圍、低於類比電壓範圍或位於類比電壓範圍內,產生粗調二進位位碼選擇訊號以及微調二進位碼選擇訊號。 In some phase locked loop embodiments, the phase locked loop of this disclosure may also include a tuned array selection circuit. The tuning array selection circuit can be used to receive the voltage controlled oscillator tuning signal, and generate a coarse binary bit code selection signal according to whether the voltage controlled oscillator tuning signal is higher than the analog voltage range, lower than the analog voltage range, or within the analog voltage range. and fine-tuning the binary code selection signal.
在一些鎖相迴路的實施例中,微調二進位碼訊號在壓控振盪器調諧訊號高於類比電壓範圍時產生,以指示壓控振盪器輸出訊號的頻率增加至較高窄頻率範圍內的準位,且在壓控振盪器調諧訊號低於類比電壓範圍時,指示壓控振盪器輸出訊號的頻率減小至較低窄頻率範圍內的準位。 In some embodiments of the phase locked loop, the trimming binary code signal is generated when the voltage controlled oscillator tuning signal is higher than the analog voltage range to indicate that the frequency of the voltage controlled oscillator output signal is increased to a higher level within the narrow frequency range. bit, and when the voltage controlled oscillator tuning signal is lower than the analog voltage range, it indicates that the frequency of the voltage controlled oscillator output signal is reduced to a level within a lower narrow frequency range.
在一些鎖相迴路的實施例中,粗調二進位碼訊號在壓控振盪器調諧訊號高於類比電壓範圍且窄頻率範圍位於寬頻率範圍內的高準位時產生,以指示壓控振盪器輸出訊號的頻率增加至較高寬頻率範圍內的準位,且在壓控振盪器調諧訊號低於類比電壓範圍且窄頻率範圍位於寬頻率範圍內的低準位時,指示壓控振盪器輸出訊號的頻率減小至 較低寬頻率範圍內的準位。 In some phase locked loop embodiments, a coarse binary code signal is generated when the voltage controlled oscillator tuning signal is above the analog voltage range and the narrow frequency range is at a high level within the wide frequency range to indicate the voltage controlled oscillator The frequency of the output signal increases to a higher level within the wide frequency range and indicates the voltage controlled oscillator output when the voltage controlled oscillator tuning signal is below the analog voltage range and the narrow frequency range is at a low level within the wide frequency range The frequency of the signal is reduced to level over a lower frequency range.
在一些鎖相迴路的實施例中,本揭示文件之鎖相迴路可進一步包含解碼器。解碼器可用以接收微調二進位碼訊號以及粗調二進位碼訊號,將粗調二進位碼訊號轉換成一或複數個粗調選擇訊號,且將微調二進位碼訊號轉換成一或複數個微調選擇訊號。 In some phase locked loop embodiments, the phase locked loop of the present disclosure may further include a decoder. The decoder can be used to receive the fine-tuning binary code signal and the coarse-tuning binary code signal, convert the coarse-tuning binary code signal into one or more coarse-tuning selection signals, and convert the fine-tuning binary code signal into one or more fine-tuning selection signals. .
在一些鎖相迴路的實施例中,本揭示文件之鎖相迴路亦可包含類比上溢與下溢檢測器、微調計數器電路以及粗調計數器電路。類比上溢與下溢檢測器可用以接收壓控振盪器調諧訊號,且在壓控振盪器調諧訊號高於類比電壓範圍時產生上溢訊號。類比上溢與下溢檢測器亦可用以在壓控振盪器調諧訊號低於類比電壓範圍時產生下溢訊號。 In some phase-locked loop embodiments, the phase-locked loop of the present disclosure may also include analog overflow and underflow detectors, fine-tuning counter circuits, and coarse-tuning counter circuits. The analog overflow and underflow detector can be used to receive the voltage controlled oscillator tuning signal and generate an overflow signal when the voltage controlled oscillator tuning signal is higher than the analog voltage range. Analog overflow and underflow detectors can also be used to generate an underflow signal when the voltage controlled oscillator tuning signal falls below the analog voltage range.
在一些鎖相迴路的實施例中,微調計數器電路可用以接收上溢訊號以及下溢訊號。微調計數器電路亦可用以根據上溢訊號以及下溢訊號的致能來判定壓控振盪器是否可以使用所選擇的微調裝置產生與參考輸入訊號成比例的壓控振盪器輸出訊號。微調計數器電路亦可用以判定所選擇的微調裝置的窄頻率範圍是位於寬頻率範圍內的高準位或低準位,且在窄頻率範圍位於寬頻率範圍內的高準位時,產生高頻率準位邊界訊號。微調計數器電路亦可用以在窄頻率範圍位於寬頻率範圍內的低準位時產生低頻率準位邊界訊號。此外,微調計數器電路可在上溢訊號被致能時產生對應於較高窄頻率範圍的微調二進位碼訊號,且在下溢訊號被致能時產生對應於較低窄頻率範圍的微調二進位碼 訊號。 In some phase locked loop embodiments, the trimming counter circuit may be used to receive overflow signals and underflow signals. The trimming counter circuit can also be used to determine whether the voltage controlled oscillator can use the selected trimming device to generate a voltage controlled oscillator output signal proportional to the reference input signal based on the enablement of the overflow signal and the underflow signal. The fine-tuning counter circuit can also be used to determine whether the narrow frequency range of the selected fine-tuning device is at a high level or a low level within the wide frequency range, and when the narrow frequency range is at a high level within the wide frequency range, a high frequency is generated Level boundary signal. The trimming counter circuit can also be used to generate a low frequency level boundary signal when the narrow frequency range is at a low level within the wide frequency range. In addition, the trimming counter circuit can generate a trimming binary code signal corresponding to a higher narrow frequency range when the overflow signal is enabled, and generate a trimming binary code signal corresponding to a lower narrow frequency range when the underflow signal is enabled. signal.
在一些鎖相迴路的實施例中,本揭示文件之鎖相迴路的粗調計數器電路可用以接收一或複數個頻率準位邊界訊號以及二進位碼輸入訊號,用以判定壓控振盪器是否可以使用所選擇的粗調裝置產生與參考輸入訊號成比例的壓控振盪器輸出訊號。粗調計數器電路可在高頻率準位邊界訊號被致能且壓控振盪器無法使用所選擇的粗調裝置產生與參考輸入訊號成比例的壓控振盪器輸出訊號時,產生對應於較高寬頻率範圍的粗調二進位碼訊號。粗調裝置亦可在低頻率準位邊界訊號被致能且壓控振盪器無法使用所選擇的粗調裝置產生與參考輸入訊號成比例的壓控振盪器輸出訊號時,產生對應於較低寬頻率範圍的粗調二進位碼訊號。 In some embodiments of the phase locked loop, the coarse counter circuit of the phase locked loop of the present disclosure can be used to receive one or more frequency level boundary signals and binary code input signals to determine whether the voltage controlled oscillator can The selected coarse adjustment device is used to produce a voltage controlled oscillator output signal proportional to the reference input signal. The coarse counter circuit generates a signal corresponding to a higher bandwidth when a high frequency level boundary signal is enabled and the VCO is unable to produce a VCO output signal proportional to the reference input signal using the selected coarse device. Coarse binary code signal in the rate range. The coarse adjustment device can also generate a VCO output signal proportional to the reference input signal when the low frequency level boundary signal is enabled and the VCO is unable to produce a VCO output signal proportional to the reference input signal using the selected coarse adjustment device. Coarse binary code signal in the rate range.
在一些鎖相迴路的實施例中,本揭示文件之調諧陣列選擇電路可進一步包含邊界檢驗器,邊界檢驗器用以接收粗調二進位碼訊號,且根據粗調二進位碼訊號來判定粗調裝置是否對應於壓控振盪器輸出訊號頻率範圍的上邊界或下邊界。調諧陣列選擇電路亦可用以在粗調裝置對應於壓控振盪器輸出訊號頻率範圍的上邊界或下邊界時產生致能訊號,致能訊號可以用於禁能調諧陣列選擇電路。 In some embodiments of the phase locked loop, the tuning array selection circuit of the present disclosure may further include a boundary checker. The boundary checker is used to receive the coarse binary code signal and determine the coarse adjustment device according to the coarse binary code signal. Whether it corresponds to the upper or lower boundary of the frequency range of the voltage controlled oscillator output signal. The tuning array selection circuit can also be used to generate an enable signal when the coarse adjustment device corresponds to the upper or lower boundary of the frequency range of the voltage controlled oscillator output signal. The enable signal can be used to disable the tuning array selection circuit.
在一些鎖相迴路的實施例中,本揭示文件之調諧陣列選擇電路亦可包含分頻器,分頻器用以接收參考輸入訊號且根據參考輸入訊號來計算降低頻率訊號的頻率。分頻器亦可用以根據參考輸入訊號來計算降低頻率訊號的頻率, 並產生降低頻率訊號。此降低頻率訊號可以等於參考輸入訊號的頻率除以預定常數。 In some phase locked loop embodiments, the tuned array selection circuit of the present disclosure may also include a frequency divider for receiving a reference input signal and calculating the frequency of the reduced frequency signal based on the reference input signal. The frequency divider can also be used to calculate the frequency of the down-frequency signal based on the reference input signal. and generates a reduced frequency signal. The reduced frequency signal may be equal to the frequency of the reference input signal divided by a predetermined constant.
在本揭示文件之一個示例性實施例中,本揭示文件的粗調裝置以及微調裝置為電容器。 In an exemplary embodiment of the present disclosure, the coarse adjustment device and the fine adjustment device of the present disclosure are capacitors.
本揭示文件亦揭示一種壓控振盪器,此壓控振盪器可包含粗調陣列以及微調陣列。粗調陣列包含複數個粗調裝置,微調陣列包含複數個微調裝置。在本揭示文件之一個示例性實施例中,壓控振盪器可以是電感-電容壓控振盪器。 This disclosure document also discloses a voltage-controlled oscillator, which may include a coarse-tuning array and a fine-tuning array. The coarse adjustment array includes a plurality of coarse adjustment devices, and the fine adjustment array includes a plurality of fine adjustment devices. In an exemplary embodiment of the present disclosure, the voltage controlled oscillator may be an inductor-capacitor voltage controlled oscillator.
在一些壓控振盪器的實施例中,根據壓控振盪器調諧訊號高於類比電壓範圍的判定,壓控振盪器用以從微調陣列的微調裝置之中選擇一微調裝置,以將壓控振盪器輸出訊號的頻率增加至較高窄頻率範圍內。在一些壓控振盪器的實施例中,根據壓控振盪器調諧訊號低於類比電壓範圍的判定,壓控振盪器用以從微調陣列的微調裝置之中選擇一微調裝置,以將壓控振盪器輸出訊號的頻率減小至較低窄頻率範圍內。 In some embodiments of the voltage controlled oscillator, based on the determination that the tuning signal of the voltage controlled oscillator is higher than the analog voltage range, the voltage controlled oscillator is used to select a trimming device from the trimming devices of the trimming array to adjust the voltage controlled oscillator. The frequency of the device output signal increases to a higher narrow frequency range. In some embodiments of the voltage controlled oscillator, based on the determination that the tuning signal of the voltage controlled oscillator is lower than the analog voltage range, the voltage controlled oscillator is used to select a trimming device from the trimming devices of the trimming array to adjust the voltage controlled oscillator. The frequency of the output signal of the converter is reduced to a lower narrow frequency range.
在一些壓控振盪器的實施例中,根據壓控振盪器調諧訊號高於類比電壓範圍且窄頻率範圍位於寬頻率範圍內的高準位的判定,壓控振盪器用以從粗調陣列的粗調裝置之中選擇一粗調裝置,以將壓控振盪器輸出訊號的頻率增加至較高寬頻率範圍內。在一些壓控振盪器的實施例中,根據壓控振盪器調諧訊號低於類比電壓範圍且窄頻率範圍位於寬頻率範圍內的低準位的判定,壓控振盪器用以從粗 調陣列的粗調裝置之中選擇一粗調裝置,以將壓控振盪器輸出訊號的頻率減小至較低寬頻率範圍內。 In some embodiments of the voltage controlled oscillator, the voltage controlled oscillator is used to adjust the voltage controlled oscillator from the coarse tuning array based on a determination that the voltage controlled oscillator tuning signal is above the analog voltage range and that the narrow frequency range is at a high level within the wide frequency range. A coarse adjustment device is selected among the coarse adjustment devices to increase the frequency of the output signal of the voltage controlled oscillator to a higher and wider frequency range. In some embodiments of the voltage controlled oscillator, based on a determination that the voltage controlled oscillator tuning signal is below the analog voltage range and that the narrow frequency range is at a low level within the wide frequency range, the voltage controlled oscillator is used to start the coarse frequency range. A coarse adjustment device is selected among the coarse adjustment devices of the modulation array to reduce the frequency of the output signal of the voltage controlled oscillator to a lower wide frequency range.
在一些壓控振盪器的實施例中,壓控振盪器進一步用以當微調陣列產生的壓控振盪器輸出訊號的頻率位於寬頻率範圍內的高頻率準位且壓控振盪器調諧訊號高於類比電壓範圍時,選擇與寬頻率範圍內的低頻率準位相對應的微調裝置,使得壓控振盪器經調諧以產生具有頻率淨增加的壓控振盪器輸出訊號。當微調陣列產生的壓控振盪器輸出訊號的頻率位於寬頻率範圍內的較低頻率準位且壓控振盪器調諧訊號低於類比電壓範圍時,選擇與寬頻率範圍內的較高頻率準位相對應的微調裝置,使得壓控振盪器經調諧以產生具有頻率淨減小的壓控振盪器輸出訊號。 In some embodiments of the voltage controlled oscillator, the voltage controlled oscillator is further used when the frequency of the voltage controlled oscillator output signal generated by the trimming array is at a high frequency level within a wide frequency range and the voltage controlled oscillator tuning signal is higher than In the analog voltage range, a trimmer corresponding to a low frequency level within a wide frequency range is selected such that the voltage controlled oscillator is tuned to produce a voltage controlled oscillator output signal with a net increase in frequency. When the frequency of the voltage-controlled oscillator output signal generated by the trimming array is at a lower frequency level in the wide frequency range and the voltage-controlled oscillator tuning signal is lower than the analog voltage range, the phase with the higher frequency level in the wide frequency range is selected. The corresponding trimming device causes the voltage controlled oscillator to be tuned to generate a voltage controlled oscillator output signal with a net reduction in frequency.
在一些壓控振盪器的實施例中,壓控振盪器輸出訊號的頻率淨增加以及頻率淨減小的幅度小於寬頻率範圍。 In some embodiments of the voltage controlled oscillator, the net increase in frequency and the net decrease in frequency of the voltage controlled oscillator output signal are smaller than the wide frequency range.
在一些壓控振盪器的實施例中,壓控振盪器輸出訊號的頻率淨增加以及頻率淨減小在鎖相迴路中引起轉換抖動,此轉換抖動小於由壓控振盪器輸出訊號的頻率增加等於寬頻率範圍所引起的轉換抖動。 In some voltage controlled oscillator embodiments, a net increase in frequency and a net decrease in frequency of the voltage controlled oscillator output signal cause switching jitter in the phase locked loop that is less than the frequency increase of the voltage controlled oscillator output signal equal to Conversion jitter caused by wide frequency range.
前述詳細描述亦揭示一種調諧壓控振盪器之調諧方法。在一個實例中,此調諧方法可包含接收壓控振盪器調諧訊號之第一步驟。此調諧方法可進一步包含判定壓控振盪器調諧訊號為高於類比電壓範圍、低於類比電壓範圍或位於類比電壓範圍內之步驟。此調諧方法之另一步驟可包含當壓控振盪器調諧訊號高於類比電壓範圍時選擇微調 裝置來產生在較高窄頻率範圍內的壓控振盪器輸出訊號。此調諧方法的另一步驟可以是當壓控振盪器調諧訊號低於類比電壓範圍時選擇微調裝置來產生在較低窄頻率範圍內的壓控振盪器輸出訊號。此調諧方法亦可涉及判定窄頻率範圍是處於寬頻率範圍的高準位或低準位之步驟。 The foregoing detailed description also discloses a tuning method for tuning a voltage controlled oscillator. In one example, the tuning method may include the first step of receiving a voltage controlled oscillator tuning signal. The tuning method may further include the step of determining whether the voltage controlled oscillator tuning signal is above the analog voltage range, below the analog voltage range, or within the analog voltage range. Another step in this tuning method may include selecting trim when the voltage controlled oscillator tuning signal is above the analog voltage range device to generate a voltage controlled oscillator output signal within a higher narrow frequency range. Another step of the tuning method may be to select a trimming device to generate a VCO output signal in a lower narrow frequency range when the VCO tuning signal is below the analog voltage range. The tuning method may also involve the step of determining whether the narrow frequency range is at the high or low level of the broad frequency range.
在一些調諧方法的實施例中,調諧壓控振盪器之調諧方法亦可包含選擇對應於較高寬頻率範圍的粗調裝置以及選擇對應於寬頻率範圍內的低準位的微調裝置之步驟。當壓控振盪器調諧訊號高於類比電壓範圍且窄頻率範圍處於寬頻率範圍內的高準位時,可選擇此種粗調裝置及微調裝置。以此方式,壓控振盪器輸出訊號之頻率變化幅度可小於寬頻率範圍。 In some embodiments of the tuning method, the tuning method of tuning the voltage controlled oscillator may also include the steps of selecting a coarse tuning device corresponding to a higher broad frequency range and selecting a fine tuning device corresponding to a low level within the broad frequency range. This coarse adjustment device and fine adjustment device can be selected when the voltage controlled oscillator tuning signal is higher than the analog voltage range and the narrow frequency range is at a high level within the wide frequency range. In this way, the frequency variation amplitude of the voltage controlled oscillator output signal can be smaller than the wide frequency range.
在一些調諧方法的實施例中,調諧壓控振盪器之調諧方法亦可包含選擇對應於較低寬頻率範圍的粗調裝置且選擇對應於寬頻率範圍內的較高準位的微調裝置之步驟。當壓控振盪器調諧訊號高於類比電壓範圍且窄頻率範圍處於寬頻率範圍內的較低準位時,可選擇此種粗調裝置及微調裝置。 In some embodiments of the tuning method, the tuning method of tuning the voltage controlled oscillator may also include the steps of selecting a coarse tuning device corresponding to a lower broad frequency range and selecting a fine tuning device corresponding to a higher level within the broad frequency range. . This coarse adjustment device and fine adjustment device can be selected when the voltage controlled oscillator tuning signal is higher than the analog voltage range and the narrow frequency range is at a lower level within the wide frequency range.
前述內容概述若干實施例之特徵,使得熟習此項技術者可更好地理解本揭示文件之態樣。熟習此項技術者應當瞭解,他們可容易地將本揭示文件用作設計或修改用於實施相同目的及/或達成本文所介紹之實施例之優點的其他製程及結構的基礎。熟習此項技術者亦應當認識到,此類等效構造不脫離本揭示文件之精神及範疇,且他們可在 不脫離本揭示文件之精神及範疇的情況下在本文中作出各種改變、取代及變更。 The foregoing summary summarizes the features of several embodiments so that those skilled in the art may better understand the aspects of this disclosure. Those skilled in the art should appreciate that they may readily use this disclosure as a basis for designing or modifying other processes and structures for carrying out the same purposes and/or achieving the advantages of the embodiments described herein. Those skilled in the art should also realize that such equivalent constructions do not depart from the spirit and scope of this disclosure, and they may Various changes, substitutions and alterations may be made herein without departing from the spirit and scope of this disclosure document.
101:壓控振盪器調諧訊號 101: Voltage controlled oscillator tuning signal
102:參考輸入訊號 102: Reference input signal
103:粗調二進位碼訊號 103: Coarse adjustment of binary code signal
104:微調二進位碼訊號 104: Fine-tuning the binary code signal
105:粗調選擇訊號 105: Coarse adjustment selection signal
106:微調選擇訊號 106: Fine-tuning the selection signal
107:調諧陣列選擇電路 107: Tuning array selection circuit
108:解碼器 108:Decoder
109,LC VCO:電感/電容壓控振盪器 109, LC VCO: Inductor/Capacitor Voltage Controlled Oscillator
110:壓控振盪器輸出訊號 110: Voltage controlled oscillator output signal
201:類比上溢與下溢檢測器 201: Analog Overflow and Underflow Detector
202:微調計數器電路 202: Fine-tuning counter circuit
203:粗調計數器電路 203: Coarse adjustment counter circuit
204:邊界檢驗器 204:Bounds checker
205:分頻器 205:Frequency divider
206:粗調陣列 206: Coarse array
207:微調陣列 207: Fine-tuning array
208:上溢訊號 208: Overflow signal
209:下溢訊號 209: Underflow signal
210:高頻率準位邊界訊號/微調範圍上溢訊號 210: High frequency level boundary signal/fine-tuning range overflow signal
211:低頻率準位邊界訊號/微調範圍下溢訊號 211: Low frequency level boundary signal/fine-tuning range underflow signal
213:第一降低頻率訊號 213: First reduced frequency signal
214:第二降低頻率訊號 214: Second lower frequency signal
215:致能訊號 215: Enable signal
216:壓控振盪器上溢調諧訊號 216: Voltage controlled oscillator overflow tuning signal
217:壓控振盪器下溢調諧訊號 217: Voltage controlled oscillator underflow tuning signal
218:粗調二進位碼輸入訊號 218: Coarse adjustment of binary code input signal
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Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1748368A (en) * | 2003-02-14 | 2006-03-15 | 飞思卡尔半导体公司 | System and method for coarse tuning a phase locked loop (pll) synthesizer using 2-pi slip detection |
CN102412835A (en) * | 2010-05-31 | 2012-04-11 | 安纳帕斯股份有限公司 | Pll, display using the same, and method for timing controller to generate clock using the same |
TWI449340B (en) * | 2006-10-30 | 2014-08-11 | Gct Semiconductor Inc | Phase locked loop and method for compensating temperature thereof |
CN105827238A (en) * | 2015-01-23 | 2016-08-03 | 飞思卡尔半导体公司 | Systems and methods for calibrating a dual port phase locked loop |
US20170373694A1 (en) * | 2016-06-28 | 2017-12-28 | Intel IP Corporation | Frequency based bias voltage scaling for phase locked loops |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010056856A (en) * | 2008-08-28 | 2010-03-11 | Renesas Technology Corp | Semiconductor integrated circuit |
US8953730B2 (en) * | 2012-04-20 | 2015-02-10 | Taiwan Semiconductor Manufacturing Company, Ltd. | Auto frequency calibration for a phase locked loop and method of use |
-
2022
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-
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Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1748368A (en) * | 2003-02-14 | 2006-03-15 | 飞思卡尔半导体公司 | System and method for coarse tuning a phase locked loop (pll) synthesizer using 2-pi slip detection |
TWI449340B (en) * | 2006-10-30 | 2014-08-11 | Gct Semiconductor Inc | Phase locked loop and method for compensating temperature thereof |
CN102412835A (en) * | 2010-05-31 | 2012-04-11 | 安纳帕斯股份有限公司 | Pll, display using the same, and method for timing controller to generate clock using the same |
CN105827238A (en) * | 2015-01-23 | 2016-08-03 | 飞思卡尔半导体公司 | Systems and methods for calibrating a dual port phase locked loop |
US20170373694A1 (en) * | 2016-06-28 | 2017-12-28 | Intel IP Corporation | Frequency based bias voltage scaling for phase locked loops |
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US12052022B2 (en) | 2024-07-30 |
TW202304143A (en) | 2023-01-16 |
US20240348256A1 (en) | 2024-10-17 |
US20230008340A1 (en) | 2023-01-12 |
CN115296665A (en) | 2022-11-04 |
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