TWI812481B - System and method for supplying power to circuit board and test devices in sequence to test circuit board - Google Patents

Abstract

A system and a method for supplying power to a circuit board and test devices in sequence to test the circuit board. By controlling to supply power to a circuit board to be tested, a board test device and expansion test device according a sequence, transmitting a test signal to the circuit board pass through the board test device and the expansion test device, generating a result signal based on the test signal by an electronic component connected to the circuit board, receiving the result signal trough the board test device, and generate a test result of the circuit board, the system and the method can supply power to circuit board and test devices of circuit board in sequence to avoid incorrect test result, and can achieve the effect of improving first pass yield of circuit board and increase test efficiency.

Description

System and method for sequentially supplying power to a circuit board and a test device to test the circuit board

A testing system and a method thereof, particularly a system and method for sequentially supplying power to a circuit board and a testing device to test the circuit board.

Industry 4.0, also known as the fourth industrial revolution, does not simply create new industrial technologies, but focuses on integrating existing industrial technologies, sales processes and product experiences, and establishing adaptive industries through artificial intelligence technology. It integrates customers and business partners into business processes and value processes to provide comprehensive after-sales services, thereby building a new smart industrial world with awareness.

As the wave of Industry 4.0 sweeps across the world, manufacturers are all using intelligent manufacturing to optimize production transformation and enhance competitiveness. Smart manufacturing is based on sensing technology, network technology, automation technology, and artificial intelligence. It realizes product design and manufacturing, enterprise management, and services through the process of perception, human-computer interaction, decision-making, execution, and feedback. of intelligence.

The characteristics of the electronics industry, which include small profits but high turnover, and fierce product price competition, allow industry players to pursue more effective control and optimization of raw materials and production tools, thereby maximizing the efficiency of factory production resources. This includes testing the product after it is manufactured.

Generally speaking, during product testing, power is initially supplied to the test device for testing the product. If there are multiple test devices, power is usually supplied to all test devices at the same time. However, for some circuit boards, such as motherboards, if power is supplied to all test devices connected to it at the same time, unexpected signals may be generated during power supply due to the interconnection between each test device and the circuit board, resulting in The connected test device and/or circuit board cannot be powered on normally or cannot be started smoothly or function abnormally after startup. This will lead to erroneous test results. In addition to reducing the First Pass Yield (FPY), it also requires a lot of manpower. Confirm and eliminate abnormalities with time.

In summary, it can be seen that there has long been a problem in the prior art that supplying power to a circuit board and its test device at the same time may result in failure to test or produce erroneous results. Therefore, it is necessary to propose improved technical means to solve this problem.

In view of the problem in the prior art that supplying power to the circuit board and its test device at the same time may result in failure to produce correct test results, the present invention discloses a system and method for sequentially supplying power to the circuit board and the test device to test the circuit board, wherein:

The system disclosed by the present invention sequentially supplies power to a circuit board and a test device to test the circuit board. It at least includes: a test machine for placing the circuit board to be tested; a power controller; and a card board test device connected to the circuit board to be tested. ; The expansion test device is connected to the circuit board under test; the test control device is connected to the card board test device and the expansion test device, and is used to control the power controller to supply power to the circuit board under test, the card board test device, and Expand the test device, and control the test machine to connect the circuit board under test and the electronic component, and transmit the test signal to the circuit board under test through the card board test device and the expanded test device, so that the test signal passes through the circuit under test connected to the electronic component The board generates a result signal, receives the result signal through the card board test device, and generates test results of the circuit board under test based on the result signal.

The method disclosed in the present invention sequentially supplies power to a circuit board and a test device to test the circuit board. The steps include at least: connecting the circuit board to be tested and the card board test device, the circuit board to be tested and the expansion test device, and placing the circuit board to be tested. The circuit board is on the test machine; the test control device controls the test machine to connect the circuit board under test and the electronic components; the test control device controls the power controller to supply power to the circuit board under test, the card board test device, and the extended test in the first order Device; the test control device transmits the test signal to the circuit board under test through the card board test device and the expansion test device, so that the test signal passes through the circuit board under test connected to the electronic component to generate a result signal, and receives the result signal through the card board test device; The test control device generates test results of the circuit board under test based on the result signal.

The system and method disclosed by the present invention are as described above. The difference between them and the prior art is that the present invention uses the test control device to control the power controller to supply power to the circuit board under test, the card board test device, and the expansion test device in sequence, and through the card The board test device and the expansion test device transmit the test signal to the circuit board under test, so that the test signal passes through the circuit board under test connected to the electronic component to generate a result signal, and the card board test device receives the result signal to generate the test of the circuit board under test. As a result, the problems existing in the previous technology can be solved, and the technical effects of improving the pass rate and increasing the test efficiency can be achieved.

The features and implementations of the present invention will be described in detail below with reference to the drawings and examples. The content is sufficient to enable any person familiar with the relevant art to easily fully understand the technical means used to solve the technical problems of the present invention and implement them accordingly, thereby achieving The effect that the present invention can achieve.

The invention can control the order of power supply to the circuit board and the testing devices required for testing the circuit board when testing the circuit board, so that the circuit board and other testing devices can start smoothly and operate normally.

The system operation of the present invention will be explained below with reference to "Figure 1A", which is a system architecture diagram of sequentially supplying power to a circuit board and a test device to test the circuit board proposed by the present invention. As shown in "Figure 1A", the system of the present invention includes a power controller 110, a card board test device 120, an expansion test device 130, a test machine 150, and a test control device 160. Among them, the test machine 150 and the test control device 160 may be a computing device.

The power controller 110 is connected to the card board test device 120, the expansion test device 130, the test machine 150, the test control device 160, and the circuit board under test 101, and can receive the power control signal transmitted by the test control device 160, and can also control the power supply according to the test control device 160. The received power control signal selects the target of supplying power or stopping power supply (power outage) (including but not limited to test devices such as card board test device 120, expansion test device 130, test machine 150, circuit board under test 101, etc.). In some embodiments, the power controller 110 can also provide power to the testing machine 150 . The power controller 110 may be a programmable logic controller (PLC), and the power control signal may be a PLC control instruction, but the invention is not limited thereto.

The card board test device 120 can be connected to the power controller 110 through a power connection interface (not shown in the figure), connected to the expansion test device 130 and the test control device 160 through a signal input/output interface (not shown in the figure), and connected to the test control device 160 through a test interface (not shown in the figure). (not shown in the figure) is connected to the circuit board 101 under test.

The card test device 120 is responsible for starting after the power controller 110 supplies power, and is responsible for receiving the test signal sent by the test control device 160 through the signal input and output interface. It can also send part of the test signal to the test device through another signal input and output interface. The expansion test device 130 can transmit another part of the test signal to the circuit board under test 101 through the test interface; the card board test device 120 is also responsible for receiving the result signal returned by the circuit board under test 101 through the test interface, and Responsible for transmitting the received result signal back to the test control device 160 through the signal input and output interface.

The expansion test device 130 can be connected to the power controller 110 through a power connection interface (not shown in the figure), and connected to the card board test device 120 and the test control device 160 through a signal input/output interface (not shown in the figure).

The expansion test device 130 is responsible for starting after the power controller 110 is powered, and is responsible for receiving the test signal sent by the test control device 160 through the signal input and output interface, and can send part of the test signal to the card through another signal input and output interface. Board testing device 120.

The test machine 150 can be connected to the power controller 110 through a power connection interface (not shown in the figure), and connected to the test control device 160 through a physical connection cable or a wired network or a wireless network. The test machine 150 can also provide a place for waiting. Test the test position of the circuit board 101 to test the circuit board 101 under test.

Testing station 150 may contain one or more electronic components 151 . The electronic component 151 includes a processor module and a memory (DIMM) module, but the invention is not limited thereto. The processor module includes but is not limited to a central processing unit (CPU) or other processing chips.

The testing machine 150 can determine the electronic component 151 connected to the circuit board 101 under test and determine the position connected to the circuit board 101 under test. In more detail, the test machine 150 can read the component identification data of the electronic component 151 connected to the circuit board 101 and the circuit board 101 according to the card identification data of the circuit board 101 sent by the test control device 160 . The connected position information can be used to obtain the electronic component 151 based on the read component identification data, and the obtained electronic component 151 can be moved to the connection position represented by the obtained position information; the test machine 150 can also receive test control. The device 160 transmits the component identification data and position information, and can obtain the electronic component 151 based on the received component identification data, and move the obtained electronic component 151 to the connection position indicated by the received position information. However, the present invention is not limited to this.

The testing machine 150 is responsible for receiving the connection control signal transmitted by the test control device 160 and is responsible for connecting or separating the electronic component 151 and the circuit board under test 101 placed at the test position of the testing machine 150 with the received connection control signal. . For example, the test machine 150 can lower the electronic component 151 when the received connection control signal indicates the start of connection, so that the electronic component 151 is connected to the circuit board under test 101 placed in the test position, or it can lower the electronic component 151 when the received connection control signal indicates the start of connection. The connection control signal indicates that the electronic component 151 is raised when the connection is completed, so that the electronic component 151 is separated from the circuit board under test 101 placed in the test position without being connected.

The test control device 160 can be connected to the power controller 110, the card board test device 120, and the expansion test device 130 through a signal input/output interface (not shown in the figure), and can be connected to the test machine through a physical connection cable or a wired or wireless network. 150 connections.

The test control device 160 is responsible for determining the first order. For example, the test control device 160 can execute a test script to set the first order corresponding to the circuit board 101 under test or to load a preset first order. However, the test control device 160 The method of determining the first order is not limited to the above.

The test control device 160 is also responsible for generating corresponding power control signals according to the determined first sequence, thereby controlling the power controller 110 to sequentially supply power to the card board test device 120, the expansion test device 130, and the test device according to the determined first sequence. circuit board 101, thereby preventing the card board test device 120, the expansion test device 130, and/or the circuit board under test 101 from being powered on smoothly, resulting in failure to test, or causing the card board test device 120 and/or the expansion test device 130 to function abnormally, resulting in errors. Test results. In addition, the test control device 160 can also generate a corresponding power control signal according to the determined reverse sequence of the first sequence, thereby controlling the power controller 110 to sequentially stop power supply to the card board testing device 120 according to the reverse sequence of the first sequence. , the expansion test device 130 and the circuit board to be tested 101, thereby preventing the card board test device 120 and/or the expansion test device 130 from causing abnormal functions or interfering with the result signal to produce incorrect test results.

In some embodiments, the test control device 160 may also generate a power control signal and transmit it to the power controller 110 to control the power controller 110 to supply power to the card board test device 120, the expansion test device 130, and the waiting device according to the first sequence. When testing the circuit board 101, it is determined whether the card board testing device 120 returns an abnormal signal; the test control device 160 can generate a power control signal and transmit it to the power controller 110 to control the power supply of the power controller 110 according to the first sequence. When an abnormal signal is received, a second sequence different from the first sequence is generated according to the received abnormal signal, and the power control signal is generated again according to the second sequence and transmitted to the power controller 110 to control the power controller 110 according to the second sequence. Power is supplied to the card board test device 120, the expansion test device 130, and the circuit board under test 101 in sequence. Even, the test control device 160 can determine again whether an abnormal signal is received during the process of generating the power control signal according to the generated second sequence and transmitting it to the power controller 110 to control the power supply controller 110 according to the second sequence. If so, Then the test control device 160 can re-determine a third sequence that is different from the first sequence and the second sequence, and control the power supply controller 110 to provide power according to the third sequence until no abnormal signal is received or no sequence can be determined.

The test control device 160 is also responsible for generating connection control signals and transmitting the generated connection control signals to the test machine 150 to control the test machine 150 to connect or separate the circuit board under test 101 and one or more electronic components 151 . Among them, the test control device 160 can generate a connection control signal indicating the start of connection when starting to test the circuit board under test 101, thereby controlling the test machine 150 to connect the circuit board under test 101 and the electronic component 151; the test control device 160 can also When the test is completed or the test is interrupted, a connection control signal indicating the end of the connection is generated to control the testing machine 150 to separate the circuit board 101 under test and the electronic component 151 .

The test control device 160 is also responsible for generating test signals. In some embodiments, the test control device 160 can also generate expected signals corresponding to the test signals. The test control device 160 is also responsible for transmitting test signals to the circuit board under test 101 placed at the test position on the test machine 150 through the card board test device 120 and the expansion test device 130, so that the generated test signals are connected to the electronic components 151 The circuit board under test 101 generates a result signal, and the test control device 160 is also responsible for receiving the result signal through the card board test device 120 (and the expansion test device 130). The test signal generated by the test control device 160 corresponds to the circuit board 101 under test, and the test control device 160 can generate a corresponding test signal according to the identification data of the circuit board 101 under test.

The test control device 160 is also responsible for generating test results of the circuit board under test based on the received result signals. For example, the test control device 160 can compare the result signal with the test signal or the result signal with the expected signal, and generate corresponding test results based on the comparison result.

It should be noted that in "Figure 1A", the card board test device 120 and the circuit board under test 101 can be directly connected through the test interface, but if the card board test device 120 and the circuit board under test 101 cannot be directly connected through the test interface , then the present invention can be as shown in another system architecture diagram in "Figure 1B". The card board testing device 120 and the circuit board to be tested 101 are connected through a switching test device 140, that is, the card board testing device 120 Connected to the switching test device 140, the circuit board 101 to be tested is connected to the switching test device 140. Among them, the switching test device 140 may not require an external power supply, for example, it may be a switching card used for simple signal transmission; the switching testing device 140 may also require an external power supply for signal transmission, and the present invention has no particular limitations.

In "Figure 1B", the power controller 110, the card test device 120, the expansion test device 130, the test machine 150, and the test control device 160 are substantially the same as above, but the power controller 110 may require additional power supply to the converter. Connected to the test device 140, the card board test device 120 needs to pass the switching test device 140 to transmit the test signal to the circuit board under test 101 and receive the result signal generated by the circuit board under test 101. If the switching test device 140 needs power, then The first sequence generated by the test control device 160 may also include the switching test device 140 .

Next, an embodiment will be used to explain the operation process of the present invention, and please refer to "Figure 2A" for the flow chart of the method of sequentially supplying power to a circuit board and a test device to test the circuit board according to the present invention. It is assumed that the circuit board 101 to be tested is a motherboard, but the present invention is not limited to the above.

If the present invention is used on the production line of the circuit board to be tested 101, when the circuit board to be tested 101 enters the test area on the production line, relevant personnel on the production line can first connect the circuit board to be tested 101 to the card board testing device 120 and connect The circuit board to be tested 101 and the expanded test device 130 (step 210). In this embodiment, it is assumed that the card board test device 120 can be connected to some of the control pins of the circuit board 101 under test, and the expansion test device 130 can be connected to the control pins of the circuit board 101 under test. The other part of the foot is connected to the pins.

After the circuit board under test 101 is connected to the card board test device 120 and the expansion test device 130, the test control device 160 can control the test machine 150 to connect the circuit board under test 101 to the electronic component 151 (step 230). In this embodiment, assuming that the electronic component 151 includes a central processing unit and a memory module, the test control device 160 can generate a continuity control signal indicating the start of the test and send it to the test machine 150 when it determines that the test can be started. The machine 150 can determine that the received disconnection control signal indicates the start of testing and press down the electronic components 151 such as the central processing unit and the memory module, so that the central processing unit is inserted into the processor connector of the circuit board 101 under test and the memory is The module is inserted into the memory connection slot of the circuit board 101 under test.

After the test machine 150 connects the circuit board 101 under test and the electronic component 151, the test control device 160 can control the power controller 110 to supply power to the card board test device 120, the expansion test device 130, and the circuit board under test 101 according to the first sequence. (Step 250). In this embodiment, it is assumed that the power controller 110 is a programmable logic controller, the power control signal is a PLC control command, and the test control device 160 can obtain the card identification data (such as model number) of the circuit board under test 101 and execute The test script corresponding to the card board identification data of the circuit board under test 101 determines the first order, for example, the card board test device 120, the expansion test device 130, and the circuit board under test 101. If the PLC control instructions recorded in the test script are as shown in the control instruction table 400 in "Figure 4", then the test control device 160 can first generate the power control signal "01 03" corresponding to the card board test device 120 according to the first sequence. 02 04 05 0A 0A" and sent to the power controller 110, so that the power controller 110, after receiving the above-mentioned power control signal, determines to supply power to the card board testing device 120 according to the received power control signal, thereby allowing the card board to be tested. The device 120 is powered on and started; after the power controller 110 supplies power to the card board test device 120, it can send back a power supply report message to the test control device 160. After that, the test control device 160 can generate the corresponding expansion test device 130 again according to the first sequence. The power control signal "01 03 02 04 05 0B 0A" is sent to the power controller 110, so that the power controller 110 supplies power to the expansion test device 130 after receiving the power control signal "01 03 02 04 05 0B 0A", and then Let the extended test device 130 be powered on and started. Then, after receiving the power supply report message returned by the power controller 110, the test control device 160 can generate the power control signal corresponding to the circuit board under test 101 according to the first sequence again. 01 03 02 04 05 0C 0A" and sent to the power controller 110, so that the power controller 110 supplies power to the circuit board under test 101, and then energizes and starts the circuit board under test 101. In this way, the card board test device 120, expanded test The device 130 and the circuit board under test 101 will be started sequentially instead of simultaneously as conventionally.

After the power controller 110 supplies power to the card board test device 120, the expansion test device 130, and the circuit board under test 101 according to the first sequence determined by the test control device 160, the test control device 160 can communicate with the expansion board through the card board test device 120. The test device 130 transmits the test signal to the circuit board under test 101, so that the test signal passes through the circuit board under test 101 connected to the electronic component 151 to generate a result signal (step 260). In this embodiment, it is assumed that the test script executed by the test control device 160 corresponding to the card identification data of the circuit board under test 101 can generate one or more test signals and send them to the connected card test device 120 and the expansion The test device 130 allows the test signals to pass through the card board test device 120 and the expansion test device 130 to reach the circuit board under test 101, and perform calculations or judgments on each test signal through the electronic components 151 connected to the circuit board under test 101. Generate one or more corresponding result signals.

After the circuit board under test 101 generates the result signal, the test control device 160 can receive the result signal generated by the circuit board under test 101 through the card board testing device 120, and can generate a signal of the circuit board under test 101 based on the received result signal. Test results (step 270).

In this way, through the present invention, the power controller 110 can be controlled by the test control device 160 to supply power to the circuit board under test 101 and the card board test device 120 and the expansion test device 130 for testing the circuit board under test 101 in a certain sequence, to avoid simultaneous power supply. The circuit board under test 101 , the card board test device 120 and the expansion test device 130 are caused to fail to power on or start abnormally, etc.

In the above embodiment, after the test control device 160 receives the result signal generated by the circuit board 101 under test through the card board test device 120 (step 270), the test control device 160 may also perform the process shown in "Figure 2B". The power controller 110 can be controlled to sequentially stop power supply to the circuit board under test 101, the expansion test device 130, and the card board test device 120 according to the reverse order of the determined first order (step 280). For example, the test control device 160 can sequentially generate "01 03 02 04 05 0C 0B" and "01 03 02 04 05 0B 0B" according to the order of the circuit board under test 101, the expansion test device 130, and the card board test device 120. , "01 03 02 04 05 0A 0B" and other power control signals, and are sent to the power controller 110, so that the power controller 110 stops supplying power to the circuit board under test 101 from first to last according to the received power control signal. Test device 130, and card board test device 120.

Afterwards, the test control device 160 can control the test machine 150 to separate the connected circuit board 101 and the electronic component 151 (step 290). For example, the test control device 160 can generate a connection control command indicating the end of the test and transmit the generated connection control command to the test machine 150, so that the test machine determines that the received connection control command indicates the end of the test. , raise the electronic components 151 such as the central processing unit and the memory module, and then separate the circuit board to be tested 101 and the electronic components 151 to prepare for testing the next circuit board.

In addition, in the above embodiment, if the card board test device 120 and the circuit board to be tested 101 cannot be directly connected, as shown in the process of "Figure 3", the personnel on the production line can connect the card board test device 120 and the expansion test device. 130. Connect the card board test device 120 and the transfer test device 140, and connect the transfer test device 140 and the circuit board under test 101, and directly or indirectly connect the transfer test device 140, the card board test device, and the expansion test device 130 The circuit board 101 under test is placed on the testing machine 150 (step 310).

Then, the test control device 160 can control the test machine 150 to connect the electronic component 151 and the circuit board under test 101 (step 330), and can control the power controller 110 to sequentially supply power to the card board test device 120 according to the determined first order. , the expansion test device 130, the switching test device 140, and the circuit board under test 101 (step 350). If the first sequence is the card board test device 120, the expansion test device 130, the switching test device 140, and the circuit board under test 101, then the test control device 160 can generate "01 03 02 04 05 0A 0A" and "01 03" in sequence. 02 04 05 0B 0A", "01 03 02 04 05 0C 0A", "01 03 02 04 05 0D 0A" and other power control signals are sent to the power controller 110, so that after receiving the power control signal, the power controller 110 Power is supplied to the card board test device 120, the expansion test device 130, the switching test device 140, and the circuit board to be tested 101.

Then, the test control device 160 can transmit the generated test signal to the circuit board under test 101 through the card board test device 120, the expansion test device 130, and the switching test device 140, so that the test signal is generated through the circuit board under test 101 Result signal (step 360). The test control device 160 can also receive the result signal generated by the circuit board under test 101 through the switching test device 140 and the card board test device 120, and generate the circuit board under test based on the received result signal. test results (step 370). That is to say, the test control device 160 can output the test signal to the connected card board test device 120 and the expansion test device 130 , so that the test signal first passes through the card board test device 120 and the expansion test device 130 and then passes through the switching test device 140 After arriving at the circuit board under test 101, the electronic component 151 connected to the circuit board under test 101 processes the test signal arriving at the circuit board under test 101 to generate a corresponding result signal and allows the result signal to pass through the circuit board under test 101. The signal is transferred to the test device 140 and then reaches the card test device 120 and is transmitted back to the test control device 160 from the card test device 120 .

After that, the test control device 160 can control the power controller 110 to stop supplying power to the card board test device 120, the expansion test device 130, the transfer test device 140, and the circuit board under test 101 according to the reverse order of the first order (step 380) , and can control the test machine 150 to separate the circuit board 101 under test and the electronic component after the power controller 110 stops supplying power to the card board test device 120, the expansion test device 130, the transfer test device 140, and the circuit board under test 101. 151 (step 390). Among them, since the first order is the card board test device 120, the expansion test device 130, the transfer test device 140, and the circuit board to be tested 101, therefore, the test control device 160 can be based on the circuit board to be tested 101, the transfer test device 140 The expansion test device 130 and the card board test device 120 sequentially generate a power control signal indicating a power outage and transmit the generated power control signal to the power controller 110, so that the power controller 110 operates according to the received power control signal. The power supply is sequentially stopped to the circuit board under test 101, the switching test device 140, the expansion test device 130, and the card board test device 120.

In addition, the present invention can also control the power controller 110 in the test control device 160 to supply power to the card board test device 120, the expansion test device 130, and the circuit board under test 101 according to the first sequence as shown in the process of "Figure 2C" ( After switching to the test device 140) (steps 250 and 350), the test control device 160 can determine whether the abnormal signal returned by the card test device 120 is received (step 253). If not, it indicates that the card test device 120, The expanded test device 130, the circuit board under test 101 (and the switching test device 140) are all powered on smoothly and started normally. If so, it means that the card board testing device 120, the expanded testing device 130, the circuit board under test 101 (and the switching test device) 140) cannot be powered on or started normally, the test control device 160 can generate a second sequence (step 255) that is different from the first sequence, for example, generate the expanded test device 130, the card board test device 120, the circuit under test The second sequence of the board 101 (, switching test device 140), and can control the power controller 110 to sequentially supply power to the expansion test device 130, the card board test device 120, and the circuit board to be tested 101 ( , transfer test device 140) (step 257), that is, the power control signals for the expansion test device 130, the card board test device 120, the circuit board under test 101 (and the transfer test device 140) are sequentially generated and transmitted to The power controller 110 enables the power controller 110 to supply power to the corresponding expansion test device 130, the card board test device 120, and the circuit board to be tested 101 (or the switching test device 140) after receiving the power control signal.

In summary, it can be seen that the difference between the present invention and the prior art is that it has a test control device to control the power controller to supply power to the circuit board to be tested, the card board test device, and the expansion test device in sequence, and through the card board test device and The expanded test device transmits test signals to the circuit board under test, allows the test signal to pass through the circuit board under test connected to the electronic components to generate a result signal, and receives the result signal through the card board test device to generate the test result of the circuit board under test. , this technical means can be used to solve the problem in the previous technology that supplying power to the circuit board and its test device at the same time may lead to the inability to produce correct test results, thereby achieving the technical effects of improving the through rate and increasing the test efficiency.

Furthermore, the method of sequentially supplying power to the circuit board and the test device to test the circuit board of the present invention can be implemented in hardware, firmware, software or a combination of hardware, firmware and software, or in a computer system. It can be implemented in a centralized manner or in a decentralized manner with different components spread across several interconnected computer systems.

Although the embodiments of the present invention are disclosed above, the content described is not intended to directly limit the scope of patent protection of the present invention. Anyone with ordinary knowledge in the technical field to which the present invention belongs can make slight modifications and modifications to the form and details of the implementation of the present invention without departing from the spirit and scope disclosed by the present invention, which shall fall under the patent protection of the present invention. Scope. The scope of patent protection for this invention must still be defined by the scope of the attached patent application.

101: Circuit board to be tested 110:Power controller 120:Card board test device 130:Expanded test device 140: Transfer test device 150:Testing machine 151:Electronic components 160: Test control device 400: Control command list Step 210: Connect the circuit board to be tested and the card board test device, expand the test device, and place the circuit board to be tested on the test machine Step 230: The test control device controls the test machine to connect the circuit board to be tested and the electronic component Step 250: The test control device controls the power controller to supply power to the circuit board under test, the card board test device, and the expansion test device in the first sequence. Step 253: The test control device determines whether it has received the abnormal signal returned by the card board testing device. Step 255: The test control device generates a different second sequence according to the abnormal signal Step 257: The test control device controls the power controller to supply power to the circuit board under test, the card board test device, and the expansion test device in the second sequence. Step 260: The test control device transmits the control signal to the circuit board under test through the card board test device and the expansion test device, so that the control signal passes through the circuit board under test connected to the electronic component to generate a result signal. Step 270: The test control device receives the result signal through the card board testing device, and generates the test result of the circuit board under test based on the result signal. Step 280: The test control device controls the power controller to stop supplying power to the circuit board under test, the card board test device, and the expansion test device according to the reverse sequence of the first sequence. Step 290: The test control device controls the test machine to separate the circuit board to be tested and the electronic components Step 310: Connect the circuit board to be tested to the switching test device, card board test device, and expansion test device, and place the circuit board to be tested on the test machine Step 330: The test control device controls the test machine to connect the circuit board to be tested and the electronic component Step 350: The test control device controls the power controller to supply power to the transfer test device, the circuit board to be tested, the card board test device, and the expansion test device in the first order. Step 360: The test control device transmits the control signal to the circuit board under test through the switching test device, the card board test device and the expansion test device, so that the control signal passes through the circuit board under test connected to the electronic component to generate a result signal. Step 370: The test control device receives the result signal through the switching test device and the card board test device, and generates the test result of the circuit board under test based on the result signal. Step 380: The test control device controls the power controller to stop supplying power to the transfer test device, the circuit board under test, the card board test device, and the expansion test device according to the reverse sequence of the first sequence. Step 390: The test control device controls the test machine to separate the circuit board to be tested and the electronic components

Figure 1A is a system architecture diagram for sequentially supplying power to a circuit board and a test device to test the circuit board according to the present invention. Figure 1B is another system architecture diagram for sequentially supplying power to a circuit board and a test device to test the circuit board according to the present invention. Figure 2A is a flow chart of the method of sequentially supplying power to a circuit board and a test device to test the circuit board according to the present invention. Figure 2B is a flow chart of an additional method of sequentially supplying power to a circuit board and a test device to test the circuit board according to the present invention. Figure 2C is a flow chart of the second sequence of generating power according to the present invention. Figure 3 is a flow chart of another method of sequentially supplying power to a circuit board and a test device to test the circuit board according to the present invention. Figure 4 is a schematic diagram of control instructions according to the embodiment of the present invention.

Step 210: Connect the circuit board to be tested and the card board test device, expand the test device, and place the circuit board to be tested on the test machine

Step 230: The test control device controls the test machine to connect the circuit board to be tested and the electronic component

Step 250: The test control device controls the power controller to supply power to the circuit board under test, the card board test device, and the expansion test device in the first sequence.

Step 260: The test control device transmits the control signal to the circuit board under test through the card board test device and the expansion test device, so that the control signal passes through the circuit board under test connected to the electronic component to generate a result signal.

Step 270: The test control device receives the result signal through the card board testing device, and generates the test result of the circuit board under test based on the result signal.

Claims (10)

A method for sequentially supplying power to a circuit board and a test device to test the circuit board. The method at least includes the following steps: connecting a circuit board to be tested and a card board test device, the circuit board to be tested and an expansion test device, and placing The circuit board under test is on a test machine; a test control device controls the test machine to connect the circuit board under test and at least one electronic component; the test control device controls a power controller to supply power to the circuit board in a first sequence The circuit board under test, the card board test device, and the expansion test device; the test control device sends a test signal to the circuit board under test through the card board test device and the expansion test device, so that the test signal passes through the connection to the circuit board under test. The circuit board under test of at least one electronic component generates a result signal, and receives the result signal through the card board testing device; and the test control device generates a test result of the circuit board under test based on the result signal. The method of sequentially supplying power to a circuit board and a test device to test the circuit board as described in claim 1, wherein the steps of connecting the circuit board under test and the card board test device, the circuit board under test and the expansion test device are more It includes the steps of connecting the circuit board to be tested and a switching test device and connecting the switching test device and the card board testing device. The test control device controls the power controller to supply power to the circuit board under test according to the first sequence. The steps of the card board test device and the expanded test device further include the test control device controlling the power controller to supply power to the circuit board to be tested, the card board test device, the expanded test device, and the first sequence The step of switching the test device, the step of the test control device transmitting the test signal to the circuit board under test through the card board test device and the expansion test device further includes the test control device through the card board test device, the expansion test device device, and the switching test device transmits the The step of sending the test signal to the circuit board under test, and the step of the test control device receiving the result signal through the card board test device further includes the step of the test control device receiving the result signal through the card board test device and the switching test device. steps. The method of sequentially supplying power to a circuit board and a test device to test the circuit board as described in claim 1, wherein the method further includes the test before the test control device controls the power supply controller in the first sequence. The control device sets the steps of the first sequence corresponding to the circuit board under test. The method of sequentially supplying power to a circuit board and a test device to test the circuit board as described in claim 1, wherein the method further includes the test control after the test control device receives the result signal through the card board test device. The device controls the power controller to stop power supply to the circuit board under test, the card board test device, and the expansion test device according to the reverse sequence of the first sequence, and controls the test machine to separate the circuit board under test from the circuit board under test. The steps of at least one electronic component. The method of sequentially supplying power to a circuit board and a test device to test the circuit board as described in claim 1, wherein the method controls the power controller in the test control device to supply power to the circuit board under test, the circuit board under test, and the circuit board under test in the first sequence. After the steps of the card board test device and the expansion test device, the test control device further includes the test control device to determine whether the card board test device returns an abnormal signal, and when receiving the abnormal signal, generates one of the different signals based on the abnormal signal. In the second sequence, the power controller is controlled to supply power to the circuit board to be tested, the card board testing device, and the expanded testing device in the second sequence. A system for sequentially supplying power to a circuit board and a testing device to test the circuit board. The system at least includes: a testing machine for placing a circuit board to be tested; a power controller; and a card board testing device and the circuit board to be tested. circuit board connections; An expansion test device is connected to the circuit board under test; and a test control device is connected to the card board test device and the expansion test device to control the power controller to supply power to the circuit under test in a first sequence. board, the card board test device, and the expansion test device, and control the test machine to connect the circuit board under test and at least one electronic component, and transmit a test signal through the card board test device and the expansion test device to the circuit board under test, causing the test signal to pass through the circuit board under test connected to the at least one electronic component to generate a result signal, receiving the result signal through the card board testing device, and generating the result signal based on the result signal Test results of the circuit board. As claimed in claim 6, the system for sequentially supplying power to a circuit board and a test device to test the circuit board, wherein the system further includes a switching test device for connecting the circuit board to be tested and the card board test device, the The test control device is further used to control the power controller to supply power to the circuit board to be tested, the card board test device, the expansion test device, and the transfer test device in the first sequence, and through the card board test device, The expansion test device and the transfer test device transmit the test signal to the circuit board under test, and receive the result signal through the card board test device and the transfer test device. As claimed in claim 6, the system for sequentially supplying power to a circuit board and a test device to test the circuit board, wherein the test control device is further used to set the first sequence of steps corresponding to the circuit board under test. The system for sequentially supplying power to a circuit board and a test device to test the circuit board as described in claim 6, wherein the test control device is further used to control the power controller to stop supplying power to the waiting device according to the reverse sequence of the first sequence. Test the circuit board, the card board testing device, and the expanded testing device, and control the testing machine to separate the circuit board to be tested and the at least one electronic component. As claimed in claim 6, the system for sequentially supplying power to a circuit board and a test device to test the circuit board, wherein the test control device is further used to control the power controller to supply power to the circuit board under test in the first sequence, The card board test device and the expansion test device determine whether the card board test device returns an abnormal signal, and when receiving the abnormal signal, generate a different second sequence according to the abnormal signal, and control the The power controller supplies power to the circuit board under test, the card board testing device, and the expansion testing device in the second sequence.

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