TWI800916B - 下降檢測器電路及其方法 - Google Patents

下降檢測器電路及其方法 Download PDF

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Publication number
TWI800916B
TWI800916B TW110133150A TW110133150A TWI800916B TW I800916 B TWI800916 B TW I800916B TW 110133150 A TW110133150 A TW 110133150A TW 110133150 A TW110133150 A TW 110133150A TW I800916 B TWI800916 B TW I800916B
Authority
TW
Taiwan
Prior art keywords
detector circuit
droop detector
droop
circuit
detector
Prior art date
Application number
TW110133150A
Other languages
English (en)
Other versions
TW202221338A (zh
Inventor
詹姆斯 Ｒ 隆柏格
Original Assignee
美商聖圖爾科技公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 美商聖圖爾科技公司 filed Critical 美商聖圖爾科技公司
Publication of TW202221338A publication Critical patent/TW202221338A/zh
Application granted granted Critical
Publication of TWI800916B publication Critical patent/TWI800916B/zh

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Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current
    • G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
    • G05F1/575—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices characterised by the feedback circuit
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current
    • G05F1/625—Regulating voltage or current wherein it is irrelevant whether the variable actually regulated is ac or dc
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/125—Discriminating pulses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/02—Arrangements in which the value to be measured is automatically compared with a reference value
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
    • H03K5/14—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals by the use of delay lines
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
    • H03L7/08—Details of the phase-locked loop
    • H03L7/081—Details of the phase-locked loop provided with an additional controlled phase shifter
    • H03L7/0812—Details of the phase-locked loop provided with an additional controlled phase shifter and where no voltage or current controlled oscillator is used
    • H03L7/0818—Details of the phase-locked loop provided with an additional controlled phase shifter and where no voltage or current controlled oscillator is used the controlled phase shifter comprising coarse and fine delay or phase-shifting means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Power Engineering (AREA)
  • Nonlinear Science (AREA)
  • Semiconductor Integrated Circuits (AREA)
TW110133150A 2020-11-17 2021-09-07 下降檢測器電路及其方法 TWI800916B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US17/099,821 US11157028B1 (en) 2020-11-17 2020-11-17 Fast precision droop detector
US17/099,821 2020-11-17

Publications (2)

Publication Number Publication Date
TW202221338A TW202221338A (zh) 2022-06-01
TWI800916B true TWI800916B (zh) 2023-05-01

Family

ID=78167907

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110133150A TWI800916B (zh) 2020-11-17 2021-09-07 下降檢測器電路及其方法

Country Status (3)

Country Link
US (1) US11157028B1 (zh)
CN (1) CN113572456B (zh)
TW (1) TWI800916B (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11640834B2 (en) * 2020-10-24 2023-05-02 Mediatek Singapore Pte. Ltd. Voltage droop reduction with a secondary power supply
US11496144B2 (en) * 2020-11-17 2022-11-08 Centaur Technology, Inc. Droop reference with programmable filter
US12055991B2 (en) * 2021-12-22 2024-08-06 Advanced Micro Devices, Inc. Fast droop detection circuit

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0477834A (ja) * 1990-07-16 1992-03-11 Nippon Chemicon Corp インサーキットエミュレータ
TWI269520B (en) * 2001-07-24 2006-12-21 Henry H Clinton Apparatus for the high voltage testing of insulated conductors and oscillator circuit for use with same
TW200724950A (en) * 2005-08-19 2007-07-01 Inapac Technology Inc Architecture and method for testing of an integrated circuit device
CN101464492A (zh) * 2008-12-31 2009-06-24 成都华微电子系统有限公司 Fpga及配置prom抗总剂量测试方法及专用电路板
JP2019007823A (ja) * 2017-06-23 2019-01-17 富士電機株式会社 半導体集積装置及びそのゲートスクリーニング試験方法

Family Cites Families (16)

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JP2000347755A (ja) * 1999-06-09 2000-12-15 Mitsubishi Electric Corp 半導体装置
US6621675B2 (en) * 2001-02-02 2003-09-16 Broadcom Corporation High bandwidth, high PSRR, low dropout voltage regulator
JP4421909B2 (ja) * 2004-01-28 2010-02-24 セイコーインスツル株式会社 ボルテージレギュレータ
US7714635B2 (en) * 2007-02-06 2010-05-11 International Business Machines Corporation Digital adaptive voltage supply
US7880554B2 (en) * 2009-02-03 2011-02-01 Qualcomm Incorporated Periodic timing jitter reduction in oscillatory systems
US8648645B2 (en) * 2010-05-25 2014-02-11 Oracle International Corporation Microprocessor performance and power optimization through self calibrated inductive voltage droop monitoring and correction
US8841893B2 (en) * 2010-12-16 2014-09-23 International Business Machines Corporation Dual-loop voltage regulator architecture with high DC accuracy and fast response time
US8847777B2 (en) * 2011-03-25 2014-09-30 Apple Inc. Voltage supply droop detector
JP6038516B2 (ja) * 2011-09-15 2016-12-07 エスアイアイ・セミコンダクタ株式会社 ボルテージレギュレータ
US8710913B2 (en) * 2012-05-03 2014-04-29 Intel Mobile Communications GmbH Circuit arrangement and method for operating a circuit arrangement
CN103345299B (zh) * 2013-07-24 2016-03-30 华为技术有限公司 一种电压调整方法及相应的hpm、芯片和芯片系统
EP3479185A4 (en) * 2016-07-01 2019-07-31 Chaoyang Semiconductor Jiangyin Technology Co., Ltd. SYSTEM-ON-CHIP (SOC) -VERSORGUNGSABFALLKOMPENSATION
US10423182B2 (en) * 2017-04-04 2019-09-24 Intel Corporation Self-referenced droop detector circuitry
US10855222B2 (en) * 2018-06-29 2020-12-01 Advanced Micro Devices, Inc. Clock synthesizer with integrated voltage droop detection and clock stretching
WO2020053879A1 (en) * 2018-09-10 2020-03-19 INDIAN INSTITUTE OF TECHNOLOGY MADRAS (IIT Madras) Multi-phase low dropout voltage regulator
US11531385B2 (en) * 2018-09-17 2022-12-20 Samsung Electronics Co., Ltd. Voltage droop monitoring circuits, system-on chips and methods of operating the system-on chips

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0477834A (ja) * 1990-07-16 1992-03-11 Nippon Chemicon Corp インサーキットエミュレータ
TWI269520B (en) * 2001-07-24 2006-12-21 Henry H Clinton Apparatus for the high voltage testing of insulated conductors and oscillator circuit for use with same
TW200724950A (en) * 2005-08-19 2007-07-01 Inapac Technology Inc Architecture and method for testing of an integrated circuit device
CN101464492A (zh) * 2008-12-31 2009-06-24 成都华微电子系统有限公司 Fpga及配置prom抗总剂量测试方法及专用电路板
JP2019007823A (ja) * 2017-06-23 2019-01-17 富士電機株式会社 半導体集積装置及びそのゲートスクリーニング試験方法

Also Published As

Publication number Publication date
TW202221338A (zh) 2022-06-01
US11157028B1 (en) 2021-10-26
CN113572456B (zh) 2023-06-23
CN113572456A (zh) 2021-10-29

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