TWI800405B - Test probe and fixing device thereof - Google Patents

Test probe and fixing device thereof Download PDF

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Publication number
TWI800405B
TWI800405B TW111121916A TW111121916A TWI800405B TW I800405 B TWI800405 B TW I800405B TW 111121916 A TW111121916 A TW 111121916A TW 111121916 A TW111121916 A TW 111121916A TW I800405 B TWI800405 B TW I800405B
Authority
TW
Taiwan
Prior art keywords
fixing device
test probe
probe
test
fixing
Prior art date
Application number
TW111121916A
Other languages
Chinese (zh)
Other versions
TW202349005A (en
Inventor
龔旻彰
李尚學
林志信
李曄
陳煌奇
Original Assignee
國巨股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 國巨股份有限公司 filed Critical 國巨股份有限公司
Priority to TW111121916A priority Critical patent/TWI800405B/en
Application granted granted Critical
Publication of TWI800405B publication Critical patent/TWI800405B/en
Publication of TW202349005A publication Critical patent/TW202349005A/en

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TW111121916A 2022-06-14 2022-06-14 Test probe and fixing device thereof TWI800405B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW111121916A TWI800405B (en) 2022-06-14 2022-06-14 Test probe and fixing device thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW111121916A TWI800405B (en) 2022-06-14 2022-06-14 Test probe and fixing device thereof

Publications (2)

Publication Number Publication Date
TWI800405B true TWI800405B (en) 2023-04-21
TW202349005A TW202349005A (en) 2023-12-16

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ID=86949004

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111121916A TWI800405B (en) 2022-06-14 2022-06-14 Test probe and fixing device thereof

Country Status (1)

Country Link
TW (1) TWI800405B (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200605969A (en) * 2004-08-09 2006-02-16 Electro Scient Ind Inc Self-cleaning lower contact
TW200837354A (en) * 2007-03-13 2008-09-16 Humo Lab Ltd Rotational-type electrode device
CN107271805A (en) * 2016-03-30 2017-10-20 株式会社村田制作所 The characteristic detecting apparatus of electronic unit
TW201814315A (en) * 2016-09-30 2018-04-16 日商慧萌高新科技有限公司 Method for continuously examining electrical characteristics of chip electronic components capable of improving the reliability of electrical characteristic measurement
TW202215582A (en) * 2020-08-28 2022-04-16 日商慧萌高新科技有限公司 Device with roller electrode contacts for chip electronic components inspection The surface of the abrasive powder layer can be in continuous contact with the roller electrode

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200605969A (en) * 2004-08-09 2006-02-16 Electro Scient Ind Inc Self-cleaning lower contact
TW200837354A (en) * 2007-03-13 2008-09-16 Humo Lab Ltd Rotational-type electrode device
CN107271805A (en) * 2016-03-30 2017-10-20 株式会社村田制作所 The characteristic detecting apparatus of electronic unit
TW201814315A (en) * 2016-09-30 2018-04-16 日商慧萌高新科技有限公司 Method for continuously examining electrical characteristics of chip electronic components capable of improving the reliability of electrical characteristic measurement
TW202215582A (en) * 2020-08-28 2022-04-16 日商慧萌高新科技有限公司 Device with roller electrode contacts for chip electronic components inspection The surface of the abrasive powder layer can be in continuous contact with the roller electrode

Also Published As

Publication number Publication date
TW202349005A (en) 2023-12-16

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