TWI800405B - Test probe and fixing device thereof - Google Patents
Test probe and fixing device thereof Download PDFInfo
- Publication number
- TWI800405B TWI800405B TW111121916A TW111121916A TWI800405B TW I800405 B TWI800405 B TW I800405B TW 111121916 A TW111121916 A TW 111121916A TW 111121916 A TW111121916 A TW 111121916A TW I800405 B TWI800405 B TW I800405B
- Authority
- TW
- Taiwan
- Prior art keywords
- fixing device
- test probe
- probe
- test
- fixing
- Prior art date
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW111121916A TWI800405B (en) | 2022-06-14 | 2022-06-14 | Test probe and fixing device thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW111121916A TWI800405B (en) | 2022-06-14 | 2022-06-14 | Test probe and fixing device thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI800405B true TWI800405B (en) | 2023-04-21 |
TW202349005A TW202349005A (en) | 2023-12-16 |
Family
ID=86949004
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW111121916A TWI800405B (en) | 2022-06-14 | 2022-06-14 | Test probe and fixing device thereof |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI800405B (en) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200605969A (en) * | 2004-08-09 | 2006-02-16 | Electro Scient Ind Inc | Self-cleaning lower contact |
TW200837354A (en) * | 2007-03-13 | 2008-09-16 | Humo Lab Ltd | Rotational-type electrode device |
CN107271805A (en) * | 2016-03-30 | 2017-10-20 | 株式会社村田制作所 | The characteristic detecting apparatus of electronic unit |
TW201814315A (en) * | 2016-09-30 | 2018-04-16 | 日商慧萌高新科技有限公司 | Method for continuously examining electrical characteristics of chip electronic components capable of improving the reliability of electrical characteristic measurement |
TW202215582A (en) * | 2020-08-28 | 2022-04-16 | 日商慧萌高新科技有限公司 | Device with roller electrode contacts for chip electronic components inspection The surface of the abrasive powder layer can be in continuous contact with the roller electrode |
-
2022
- 2022-06-14 TW TW111121916A patent/TWI800405B/en active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200605969A (en) * | 2004-08-09 | 2006-02-16 | Electro Scient Ind Inc | Self-cleaning lower contact |
TW200837354A (en) * | 2007-03-13 | 2008-09-16 | Humo Lab Ltd | Rotational-type electrode device |
CN107271805A (en) * | 2016-03-30 | 2017-10-20 | 株式会社村田制作所 | The characteristic detecting apparatus of electronic unit |
TW201814315A (en) * | 2016-09-30 | 2018-04-16 | 日商慧萌高新科技有限公司 | Method for continuously examining electrical characteristics of chip electronic components capable of improving the reliability of electrical characteristic measurement |
TW202215582A (en) * | 2020-08-28 | 2022-04-16 | 日商慧萌高新科技有限公司 | Device with roller electrode contacts for chip electronic components inspection The surface of the abrasive powder layer can be in continuous contact with the roller electrode |
Also Published As
Publication number | Publication date |
---|---|
TW202349005A (en) | 2023-12-16 |
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