TWI800331B - 具壓力檢知單元之壓接機構及作業機 - Google Patents
具壓力檢知單元之壓接機構及作業機 Download PDFInfo
- Publication number
- TWI800331B TWI800331B TW111111415A TW111111415A TWI800331B TW I800331 B TWI800331 B TW I800331B TW 111111415 A TW111111415 A TW 111111415A TW 111111415 A TW111111415 A TW 111111415A TW I800331 B TWI800331 B TW I800331B
- Authority
- TW
- Taiwan
- Prior art keywords
- handler
- detecting unit
- pressing mechanism
- pressure detecting
- pressing
- Prior art date
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW111111415A TWI800331B (zh) | 2022-03-25 | 2022-03-25 | 具壓力檢知單元之壓接機構及作業機 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW111111415A TWI800331B (zh) | 2022-03-25 | 2022-03-25 | 具壓力檢知單元之壓接機構及作業機 |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI800331B true TWI800331B (zh) | 2023-04-21 |
TW202338356A TW202338356A (zh) | 2023-10-01 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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TW111111415A TWI800331B (zh) | 2022-03-25 | 2022-03-25 | 具壓力檢知單元之壓接機構及作業機 |
Country Status (1)
Country | Link |
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TW (1) | TWI800331B (zh) |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130229196A1 (en) * | 2012-03-01 | 2013-09-05 | Kla-Tencor Corporation | Variable pressure four-point coated probe pin device and method |
TW201339588A (zh) * | 2012-03-23 | 2013-10-01 | Hon Tech Inc | 浮動裝置及其應用測試設備 |
US20180292452A1 (en) * | 2017-04-06 | 2018-10-11 | Chroma Ate Inc. | Device for pressing electronic component with different downward forces |
US20190172740A1 (en) * | 2017-12-04 | 2019-06-06 | Chroma Ate Inc. | Modular pressing device capable of generating stage downward forces and electronic device testing apparatus comprising the same |
TW202134616A (zh) * | 2020-03-13 | 2021-09-16 | 致茂電子股份有限公司 | 自適應性調整施力角度之壓力產生裝置 |
TWI748577B (zh) * | 2020-07-24 | 2021-12-01 | 鴻勁精密股份有限公司 | 接合器檢知單元及其應用之作業設備 |
US20220034955A1 (en) * | 2019-01-14 | 2022-02-03 | Rainer Gaggl | Device for testing components under elevated gas pressure |
-
2022
- 2022-03-25 TW TW111111415A patent/TWI800331B/zh active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130229196A1 (en) * | 2012-03-01 | 2013-09-05 | Kla-Tencor Corporation | Variable pressure four-point coated probe pin device and method |
TW201339588A (zh) * | 2012-03-23 | 2013-10-01 | Hon Tech Inc | 浮動裝置及其應用測試設備 |
US20180292452A1 (en) * | 2017-04-06 | 2018-10-11 | Chroma Ate Inc. | Device for pressing electronic component with different downward forces |
US20190172740A1 (en) * | 2017-12-04 | 2019-06-06 | Chroma Ate Inc. | Modular pressing device capable of generating stage downward forces and electronic device testing apparatus comprising the same |
US20220034955A1 (en) * | 2019-01-14 | 2022-02-03 | Rainer Gaggl | Device for testing components under elevated gas pressure |
TW202134616A (zh) * | 2020-03-13 | 2021-09-16 | 致茂電子股份有限公司 | 自適應性調整施力角度之壓力產生裝置 |
TWI748577B (zh) * | 2020-07-24 | 2021-12-01 | 鴻勁精密股份有限公司 | 接合器檢知單元及其應用之作業設備 |
Also Published As
Publication number | Publication date |
---|---|
TW202338356A (zh) | 2023-10-01 |
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