TWI800069B - Drilling quality inspection system and drilling quality inspection method - Google Patents

Drilling quality inspection system and drilling quality inspection method Download PDF

Info

Publication number
TWI800069B
TWI800069B TW110140672A TW110140672A TWI800069B TW I800069 B TWI800069 B TW I800069B TW 110140672 A TW110140672 A TW 110140672A TW 110140672 A TW110140672 A TW 110140672A TW I800069 B TWI800069 B TW I800069B
Authority
TW
Taiwan
Prior art keywords
quality inspection
drilling quality
inspection system
inspection method
drilling
Prior art date
Application number
TW110140672A
Other languages
Chinese (zh)
Other versions
TW202319732A (en
Inventor
周星林
Original Assignee
健鼎科技股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 健鼎科技股份有限公司 filed Critical 健鼎科技股份有限公司
Priority to TW110140672A priority Critical patent/TWI800069B/en
Application granted granted Critical
Publication of TWI800069B publication Critical patent/TWI800069B/en
Publication of TW202319732A publication Critical patent/TW202319732A/en

Links

TW110140672A 2021-11-02 2021-11-02 Drilling quality inspection system and drilling quality inspection method TWI800069B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW110140672A TWI800069B (en) 2021-11-02 2021-11-02 Drilling quality inspection system and drilling quality inspection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW110140672A TWI800069B (en) 2021-11-02 2021-11-02 Drilling quality inspection system and drilling quality inspection method

Publications (2)

Publication Number Publication Date
TWI800069B true TWI800069B (en) 2023-04-21
TW202319732A TW202319732A (en) 2023-05-16

Family

ID=86948811

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110140672A TWI800069B (en) 2021-11-02 2021-11-02 Drilling quality inspection system and drilling quality inspection method

Country Status (1)

Country Link
TW (1) TWI800069B (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109141275A (en) * 2017-06-15 2019-01-04 欣兴电子股份有限公司 Processing method and its machine table and system of application
CN112387604A (en) * 2021-01-04 2021-02-23 深圳和美精艺半导体科技股份有限公司 Method for detecting packaging substrate through AVI (automatic voltage indicator) detector and automatic point finder in networking mode

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109141275A (en) * 2017-06-15 2019-01-04 欣兴电子股份有限公司 Processing method and its machine table and system of application
CN112387604A (en) * 2021-01-04 2021-02-23 深圳和美精艺半导体科技股份有限公司 Method for detecting packaging substrate through AVI (automatic voltage indicator) detector and automatic point finder in networking mode

Also Published As

Publication number Publication date
TW202319732A (en) 2023-05-16

Similar Documents

Publication Publication Date Title
EP4280153A4 (en) Defect detection method, apparatus and system
EP4117333A4 (en) Measurement method and apparatus
EP4322106B8 (en) Defect detection method and apparatus
EP4227900A4 (en) Defect detection method and system
EP4171101A4 (en) Routing configuration method and apparatus
EP4149141A4 (en) Mdt method and apparatus
EP4132064A4 (en) Address acquiring method and apparatus
EP4280659A4 (en) Beam failure detecting method and apparatus
EP4190121A4 (en) Method and apparatus for multi-usim operations
EP4050930A4 (en) Measurement configuration method and apparatus
EP4133773A4 (en) Method and apparatus for failure report
EP4252974A4 (en) Apparatus assembly system and method
EP4138380A4 (en) Method and apparatus for providing image
IL309499A (en) Method and system for anomaly-based defect inspection
EP3916342A4 (en) Inspection method and manufacturing method for structure and inspection apparatus and manufacturing apparatus for structure
EP4080199A4 (en) Inspection apparatus and inspection method
EP4224900A4 (en) Routing method and apparatus
EP4128684A4 (en) Apparatus and method for establishing and maintaining ds-lite tunnel
EP4038573A4 (en) Inspection method and apparatus
TWI800069B (en) Drilling quality inspection system and drilling quality inspection method
EP4231302A4 (en) Test method and test system
EP4246953A4 (en) Configuration method and apparatus
EP4121014A4 (en) Method and apparatus for 3d-micro-patterning
EP4083631A4 (en) Dilution method and dilution apparatus
EP4171098A4 (en) Configuration method and apparatus