TWI800046B - 光學探針 - Google Patents

光學探針 Download PDF

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Publication number
TWI800046B
TWI800046B TW110139150A TW110139150A TWI800046B TW I800046 B TWI800046 B TW I800046B TW 110139150 A TW110139150 A TW 110139150A TW 110139150 A TW110139150 A TW 110139150A TW I800046 B TWI800046 B TW I800046B
Authority
TW
Taiwan
Prior art keywords
optical probe
probe
optical
Prior art date
Application number
TW110139150A
Other languages
English (en)
Other versions
TW202318000A (zh
Inventor
王淇霖
張啟伸
李源欽
Original Assignee
財團法人工業技術研究院
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 財團法人工業技術研究院 filed Critical 財團法人工業技術研究院
Priority to TW110139150A priority Critical patent/TWI800046B/zh
Priority to CN202111320090.9A priority patent/CN116008175A/zh
Priority to US17/555,509 priority patent/US20230127319A1/en
Application granted granted Critical
Publication of TWI800046B publication Critical patent/TWI800046B/zh
Publication of TW202318000A publication Critical patent/TW202318000A/zh

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1814—Diffraction gratings structurally combined with one or more further optical elements, e.g. lenses, mirrors, prisms or other diffraction gratings
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/02—Simple or compound lenses with non-spherical faces
    • G02B3/08—Simple or compound lenses with non-spherical faces with discontinuous faces, e.g. Fresnel lens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/02—Simple or compound lenses with non-spherical faces
    • G02B3/06—Simple or compound lenses with non-spherical faces with cylindrical or toric faces
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1866—Transmission gratings characterised by their structure, e.g. step profile, contours of substrate or grooves, pitch variations, materials
    • G02B5/1871—Transmissive phase gratings
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B1/00—Instruments for performing medical examinations of the interior of cavities or tubes of the body by visual or photographical inspection, e.g. endoscopes; Illuminating arrangements therefor
    • A61B1/00064—Constructional details of the endoscope body
    • A61B1/00071—Insertion part of the endoscope body
    • A61B1/0008—Insertion part of the endoscope body characterised by distal tip features
    • A61B1/00096—Optical elements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00—Systems with reflecting surfaces, with or without refracting elements
    • G02B17/008—Systems specially adapted to form image relays or chained systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/02—Objectives
    • G02B21/04—Objectives involving mirrors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G02B6/26—Optical coupling means
    • G02B6/262—Optical details of coupling light into, or out of, or between fibre ends, e.g. special fibre end shapes or associated optical elements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
  • Optical Couplings Of Light Guides (AREA)
TW110139150A 2021-10-21 2021-10-21 光學探針 TWI800046B (zh)

Priority Applications (3)

Application Number Priority Date Filing Date Title
TW110139150A TWI800046B (zh) 2021-10-21 2021-10-21 光學探針
CN202111320090.9A CN116008175A (zh) 2021-10-21 2021-11-09 光学探针
US17/555,509 US20230127319A1 (en) 2021-10-21 2021-12-20 Optical probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW110139150A TWI800046B (zh) 2021-10-21 2021-10-21 光學探針

Publications (2)

Publication Number Publication Date
TWI800046B true TWI800046B (zh) 2023-04-21
TW202318000A TW202318000A (zh) 2023-05-01

Family

ID=86028692

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110139150A TWI800046B (zh) 2021-10-21 2021-10-21 光學探針

Country Status (3)

Country Link
US (1) US20230127319A1 (zh)
CN (1) CN116008175A (zh)
TW (1) TWI800046B (zh)

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080073518A1 (en) * 2005-02-04 2008-03-27 Izumi Itoh Optical Fiber Probe, Optical Detection Device, And Optical Detection Method
TW200944776A (en) * 2008-03-04 2009-11-01 Kurashiki Boseki Kk Total reflection attenuation type far-ultraviolet spectroscopy and concentration measurement device using the spectroscopy
TW201022837A (en) * 2008-12-04 2010-06-16 King Yuan Electronics Co Ltd Mask with exposure compensation for probe production
TW201102636A (en) * 2009-07-07 2011-01-16 Univ Nat Changhua Education A detection method and system of a micro-crack object by using short-time discrete wavelet transform
US20160282427A1 (en) * 2014-02-19 2016-09-29 Infinitum Solutions, Inc. Integrated optical nanoscale probe measurement of electric fields from electric charges in electronic devices
US20170316795A1 (en) * 2014-02-19 2017-11-02 Infinitum Solutions, Inc. Integrated optical nanoscale probe
US20180143245A1 (en) * 2016-11-21 2018-05-24 Si-Ware Systems Integrated optical probe card and system for batch testing of optical mems structures with in-plane optical axis using micro-optical bench components
CN108700460A (zh) * 2015-12-21 2018-10-23 威里利生命科学有限责任公司 用于原位细胞标记的光谱和空间复用荧光探针
US20210102864A1 (en) * 2019-10-04 2021-04-08 Kabushiki Kaisha Nihon Micronics Optical probe, optical probe array, test system and test method
TW202134628A (zh) * 2020-01-14 2021-09-16 日商日本麥克隆尼股份有限公司 光探針、探針卡、測量系統及測量方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1991012551A1 (en) * 1990-02-14 1991-08-22 Massachusetts Institute Of Technology Lens/zone plate combination for chromatic dispersion correction
US5742431A (en) * 1995-03-30 1998-04-21 Eastman Kodak Company Catadioptric lens system incorporating diffractive achromatization
KR100973149B1 (ko) * 2008-09-05 2010-07-30 한국표준과학연구원 분광엔코딩 방법을 적용한 간섭성 반스톡스 라만산란 내시경
US20200249377A1 (en) * 2019-01-31 2020-08-06 Canon U.S.A., Inc. Diffractive optical device, endoscopic probe, and fabrication methods therefor

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080073518A1 (en) * 2005-02-04 2008-03-27 Izumi Itoh Optical Fiber Probe, Optical Detection Device, And Optical Detection Method
TW200944776A (en) * 2008-03-04 2009-11-01 Kurashiki Boseki Kk Total reflection attenuation type far-ultraviolet spectroscopy and concentration measurement device using the spectroscopy
TW201022837A (en) * 2008-12-04 2010-06-16 King Yuan Electronics Co Ltd Mask with exposure compensation for probe production
TW201102636A (en) * 2009-07-07 2011-01-16 Univ Nat Changhua Education A detection method and system of a micro-crack object by using short-time discrete wavelet transform
US20160282427A1 (en) * 2014-02-19 2016-09-29 Infinitum Solutions, Inc. Integrated optical nanoscale probe measurement of electric fields from electric charges in electronic devices
US20170316795A1 (en) * 2014-02-19 2017-11-02 Infinitum Solutions, Inc. Integrated optical nanoscale probe
CN108700460A (zh) * 2015-12-21 2018-10-23 威里利生命科学有限责任公司 用于原位细胞标记的光谱和空间复用荧光探针
US20180143245A1 (en) * 2016-11-21 2018-05-24 Si-Ware Systems Integrated optical probe card and system for batch testing of optical mems structures with in-plane optical axis using micro-optical bench components
US20210102864A1 (en) * 2019-10-04 2021-04-08 Kabushiki Kaisha Nihon Micronics Optical probe, optical probe array, test system and test method
TW202134628A (zh) * 2020-01-14 2021-09-16 日商日本麥克隆尼股份有限公司 光探針、探針卡、測量系統及測量方法

Also Published As

Publication number Publication date
CN116008175A (zh) 2023-04-25
TW202318000A (zh) 2023-05-01
US20230127319A1 (en) 2023-04-27

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