TWI800002B - Method for designing a digital chromaticity scaling system and a digital chromaticity scaling system thereof - Google Patents
Method for designing a digital chromaticity scaling system and a digital chromaticity scaling system thereof Download PDFInfo
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- TWI800002B TWI800002B TW110135206A TW110135206A TWI800002B TW I800002 B TWI800002 B TW I800002B TW 110135206 A TW110135206 A TW 110135206A TW 110135206 A TW110135206 A TW 110135206A TW I800002 B TWI800002 B TW I800002B
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- scaling system
- digital chromaticity
- chromaticity scaling
- designing
- digital
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TW110135206A TWI800002B (en) | 2021-09-22 | 2021-09-22 | Method for designing a digital chromaticity scaling system and a digital chromaticity scaling system thereof |
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TW110135206A TWI800002B (en) | 2021-09-22 | 2021-09-22 | Method for designing a digital chromaticity scaling system and a digital chromaticity scaling system thereof |
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TW202314207A TW202314207A (en) | 2023-04-01 |
TWI800002B true TWI800002B (en) | 2023-04-21 |
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TW110135206A TWI800002B (en) | 2021-09-22 | 2021-09-22 | Method for designing a digital chromaticity scaling system and a digital chromaticity scaling system thereof |
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Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW201020529A (en) * | 2008-08-22 | 2010-06-01 | Konica Minolta Sensing Inc | Photometric/colorimetric device |
TW201322962A (en) * | 2011-12-07 | 2013-06-16 | Smilden Biotecnnology Co Ltd | Manufacturing method of dental whitening strip and its product |
TW201338764A (en) * | 2012-03-16 | 2013-10-01 | Soek Gam Tjioe | Dental shade matching device |
US20160261839A1 (en) * | 1997-08-25 | 2016-09-08 | Rah Color Technologies Llc | System for distributing and controlling color reproduction at multiple sites |
TW201643575A (en) * | 2015-06-15 | 2016-12-16 | Printing Technology Res Inst | Patchwork type multi-angle color target manufacturing method |
TW201733688A (en) * | 2016-01-07 | 2017-10-01 | 愛克瑪公司 | Optical method to measure the thickness of coatings deposited on substrates |
US20170352326A1 (en) * | 2000-04-11 | 2017-12-07 | Rah Color Technologies Llc | Methods and apparatus for calibrating a color display |
US20180367773A1 (en) * | 2005-08-31 | 2018-12-20 | Rah Color Technologies Llc | Color calibration of color image rendering devices |
US20190331526A1 (en) * | 2016-08-04 | 2019-10-31 | Ophir Optronics Solutions Ltd. | A Photometric Test System for Light Emitting Devices |
TW202105551A (en) * | 2019-02-20 | 2021-02-01 | 美商梅瑞堤儀器公司 | Fiberoptically-coupled measurement system with reduced sensitivity to angularly-driven variation of signals upon reflection from a wafer |
-
2021
- 2021-09-22 TW TW110135206A patent/TWI800002B/en active
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20160261839A1 (en) * | 1997-08-25 | 2016-09-08 | Rah Color Technologies Llc | System for distributing and controlling color reproduction at multiple sites |
US20170352326A1 (en) * | 2000-04-11 | 2017-12-07 | Rah Color Technologies Llc | Methods and apparatus for calibrating a color display |
US20180367773A1 (en) * | 2005-08-31 | 2018-12-20 | Rah Color Technologies Llc | Color calibration of color image rendering devices |
TW201020529A (en) * | 2008-08-22 | 2010-06-01 | Konica Minolta Sensing Inc | Photometric/colorimetric device |
TW201322962A (en) * | 2011-12-07 | 2013-06-16 | Smilden Biotecnnology Co Ltd | Manufacturing method of dental whitening strip and its product |
TW201338764A (en) * | 2012-03-16 | 2013-10-01 | Soek Gam Tjioe | Dental shade matching device |
TW201643575A (en) * | 2015-06-15 | 2016-12-16 | Printing Technology Res Inst | Patchwork type multi-angle color target manufacturing method |
TW201733688A (en) * | 2016-01-07 | 2017-10-01 | 愛克瑪公司 | Optical method to measure the thickness of coatings deposited on substrates |
US20190331526A1 (en) * | 2016-08-04 | 2019-10-31 | Ophir Optronics Solutions Ltd. | A Photometric Test System for Light Emitting Devices |
TW202105551A (en) * | 2019-02-20 | 2021-02-01 | 美商梅瑞堤儀器公司 | Fiberoptically-coupled measurement system with reduced sensitivity to angularly-driven variation of signals upon reflection from a wafer |
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TW202314207A (en) | 2023-04-01 |
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