TWI790185B - Optical analysis system and optical analyzer - Google Patents

Optical analysis system and optical analyzer Download PDF

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TWI790185B
TWI790185B TW111135151A TW111135151A TWI790185B TW I790185 B TWI790185 B TW I790185B TW 111135151 A TW111135151 A TW 111135151A TW 111135151 A TW111135151 A TW 111135151A TW I790185 B TWI790185 B TW I790185B
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light
optical
emitting
emitting elements
optical receiver
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TW202321648A (en
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丁逸聖
陳育宗
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新加坡商兆晶生物科技股份有限公司(新加坡)
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An optical analyzer includes a solid-state light source transmitter, a light splitting or light mixing element, a first optical receiver, and a second optical receiver. The solid-state light source emitter includes a light source. The light source includes a plurality of light-emitting elements, and each emitting light having at least one luminous peak wavelength and at least one wavelength range. The light rays emitted by the light-emitting elements passes through the light splitting or light mixing element to form a first light and a second light. The second light is not absorbed by the fluid after it passes through a fluid to be tested so as to obtain a detection light. The first optical receiver receives the first light. The second optical receiver receives the detection light.

Description

光學分析系統及其光學分析儀Optical analysis system and its optical analyzer

本發明係有關於一種穿透式光學分析的技術領域,特別是有關於一種以兩個光學接收器分別接收光源的光線來判定光源的發光強度是否衰退的光學分析系統及其光學分析儀。The present invention relates to the technical field of penetrating optical analysis, in particular to an optical analysis system and an optical analyzer thereof which use two optical receivers to respectively receive light from a light source to determine whether the luminous intensity of the light source has declined.

現有的光學分析儀中可分為單光束光譜儀與雙光束分光光譜儀,在單光束光譜儀中,其檢測原理係使光源發出兩道檢測光線並分別通過對應之單色器後,再經由切光器的旋轉以調整該兩道檢測光線分別通過位於吸收池中的待測液體,待測液體由於其成分不同而會吸收不同波長的檢測光線,通過吸收池的檢測光線被檢測器接收後,而得到待測液體的吸收光譜,藉此檢測出待測液體的物理或化學性質。然而單光束光譜儀是藉由切光器的鏡面旋轉來達到切換不同頻率的檢測光線,而當鏡面旋轉的速度慢,無法快速切換波長時,若待測物是快速流動的流體,則無法即時地測得完整的吸收光譜,再者,兩道檢測光線皆會先通過吸收池而後被檢測器接收,因此也無法監控原始檢測光線的光強度,而難以即時得知光源強度是否有衰減的情形。Existing optical analyzers can be divided into single-beam spectrometer and double-beam spectrometer. In single-beam spectrometer, the detection principle is to make the light source emit two detection rays and pass through the corresponding monochromator respectively, and then pass through the light cutter. Rotation to adjust the two detection light passes through the liquid to be measured in the absorption cell respectively, the liquid to be measured will absorb detection light of different wavelengths due to its different components, after the detection light passing through the absorption cell is received by the detector, it is obtained The absorption spectrum of the liquid to be tested is used to detect the physical or chemical properties of the liquid to be tested. However, the single-beam spectrometer uses the mirror rotation of the optical chopper to switch the detection light of different frequencies. When the mirror rotation speed is slow, the wavelength cannot be switched quickly. The complete absorption spectrum is measured. Moreover, the two detection lights will first pass through the absorption cell and then be received by the detector. Therefore, it is impossible to monitor the light intensity of the original detection light, and it is difficult to know in real time whether the light source intensity has attenuated.

而在雙光束分光光譜儀中,如第1圖所示,其檢測原理係使用光源1發出光線並透過分光器21使光線的路徑分成檢測光路徑P1與對比光路徑P2,在檢測光路徑P1中,光線通過位於吸收池3中的待測液體,待測液體由於其成分不同而會吸收不同波長的光線,通過吸收池3的光線被第一檢測器4接收,而得到待測液體的吸收光譜,而在對比光路徑P2中,光線可直接被第二檢測器5所接收而形成對比光譜,最後透過上述吸收光譜與對比光譜進行比對並分析檢測出待測液體的物理或化學性質。然而,如果使用多個鏡面,如第1圖所示,增加切光器R2來改變對比光路徑P2的方向,則鏡面除需要加強密閉以防止灰塵外,也由於配置的鏡面數量增加,也使現有的光學分析儀具有較大的體積,而無法製作成便攜式產品。另外,當光線經過分光器R1分光後而導致光強度過低的情況時,若待測液體對光的吸收度較大,則無法形成光譜,另一方面,若分光器R1的角度一旦產生改變也會影響到光強度的變化。In the double-beam spectrometer, as shown in Figure 1, the detection principle is to use the light source 1 to emit light and pass through the beam splitter 21 so that the path of the light is divided into the detection light path P1 and the contrast light path P2, in the detection light path P1 , the light passes through the liquid to be measured in the absorption cell 3, the liquid to be measured will absorb light of different wavelengths due to its different components, the light passing through the absorption cell 3 is received by the first detector 4, and the absorption spectrum of the liquid to be measured is obtained , and in the comparison light path P2, the light can be directly received by the second detector 5 to form a comparison spectrum, and finally the physical or chemical properties of the liquid to be tested are analyzed and detected through the above absorption spectrum and comparison spectrum. However, if multiple mirrors are used, as shown in Figure 1, adding a light chopper R2 to change the direction of the contrast light path P2, the mirrors need to be sealed to prevent dust, and the number of configured mirrors increases. Existing optical analyzers have relatively large volumes and cannot be made into portable products. In addition, when the light intensity is too low after the light is split by the beam splitter R1, if the liquid to be tested has a large absorption of light, the spectrum cannot be formed. On the other hand, if the angle of the beam splitter R1 changes It also affects the change in light intensity.

因此,本發明即在闡述如何藉由創新的硬體設計,有效改善現有的單光束光譜儀與雙光束分光光譜儀所具有的上述等問題,仍是相關產業的開發業者與相關研究人員需持續努力克服與解決之課題。Therefore, the present invention explains how to effectively improve the above-mentioned problems of existing single-beam spectrometers and double-beam spectrometers through innovative hardware design, and developers and researchers in related industries still need to continue to work hard to overcome them. and problems to be solved.

有鑑於此,本發明的目的在於提供一種光學分析系統及其光學分析儀,其具有多個發光元件,可依序發出不同波長範圍的光線,並且藉由設置兩個光學接收器,比較兩個光學接收器接收的光線的差異來判定發光元件發出的光線的光強度是否衰減。In view of this, the purpose of the present invention is to provide an optical analysis system and its optical analyzer, which has a plurality of light-emitting elements, which can sequentially emit light in different wavelength ranges, and by setting two optical receivers, comparing two The difference of the light received by the optical receiver is used to determine whether the light intensity of the light emitted by the light emitting element is attenuated.

本發明的光學分析儀的一實施例包括一固態光源發射器、一均勻混和或分光元件、一第一光學接收器以及一第二光學接收器。固態光源發射器包括一光源,光源包括複數個各放射具有至少一發光峰值波長及至少一波長範圍之光的發光元件,該等發光元件為發光二極體、垂直共振腔面射型雷射或雷射二極體,且複數個發光元件能夠分別呈現一明滅頻率的非連續發光,複數個明滅頻率可以是彼此相同或彼此不同,或者複數個明滅頻率可以是部分相同或部分不同。該等發光元件發出的光線通過均勻混和或分光元件後形成一第一光線以及一第二光線,第二光線係通過一流體待測物後未被流體待測物吸收而得到一檢測光線。第一光學接收器接收第一光線。第二光學接收器接收檢測光線。One embodiment of the optical analyzer of the present invention includes a solid state light source transmitter, a homogeneous mixing or splitting element, a first optical receiver, and a second optical receiver. The solid-state light source transmitter includes a light source, the light source includes a plurality of light-emitting elements each emitting light having at least one luminous peak wavelength and at least one wavelength range, and the light-emitting elements are light-emitting diodes, vertical resonant cavity surface-emitting lasers or A laser diode, and a plurality of light-emitting elements can respectively exhibit discontinuous light with a flickering frequency, and the plurality of flickering frequencies can be the same or different from each other, or the plurality of flickering frequencies can be partly the same or partly different. The light emitted by the light-emitting elements passes through the uniform mixing or light-splitting element to form a first light and a second light. The second light passes through a fluid object to be tested and is not absorbed by the fluid object to obtain a detection light. The first optical receiver receives the first light. The second optical receiver receives the detection light.

在另一實施例中,當第一光線具有一標準光強度時,第二光線之光強度與標準光強度相等,檢測光線與標準光強度之比值為流體待測物之一標準穿透率,而當第一光線具有一工作光強度時,第二光線之光強度與工作光強度相等,檢測光線與工作光強度之比值為流體待測物之一工作穿透率,標準光強度與工作光強度不相同,比較標準穿透率與工作穿透率是否相同,並根據比較的結果判斷流體待測物的組成分變化。In another embodiment, when the first light has a standard light intensity, the light intensity of the second light is equal to the standard light intensity, and the ratio of the detection light to the standard light intensity is a standard transmittance of the fluid to be tested, And when the first light has a working light intensity, the light intensity of the second light is equal to the working light intensity, the ratio of the detection light to the working light intensity is one of the working penetration rate of the fluid to be tested, and the standard light intensity is equal to the working light intensity. If the intensity is different, compare whether the standard penetration rate is the same as the working penetration rate, and judge the composition change of the fluid to be tested according to the comparison result.

在另一實施例中,當第一光線具有一標準光強度時,第一光學接收器接收第一光線並產生一標準光強度訊號,而當第一光線具有一衰減光強度時,第一光學接收器接收第一光線並產生一衰減光強度訊號,比較標準光強度訊號與衰減光強度訊號間的一變化量,分光元件根據變化量調整第一光線的光強度。In another embodiment, when the first light has a standard light intensity, the first optical receiver receives the first light and generates a standard light intensity signal, and when the first light has an attenuated light intensity, the first optical receiver The receiver receives the first light and generates an attenuated light intensity signal, compares a variation between the standard light intensity signal and the attenuated light intensity signal, and the light splitting element adjusts the light intensity of the first light according to the variation.

在另一實施例中,均勻混和或分光元件為一光學積分球,光學積分球包括一光入口、一第一光出口以及一第二光出口,第一光學接收器對準第一光出口,第二光學接收器對準第二光出口,該等發光元件發出的該等光線由光入口進入光學積分球,第一光線從第一光出口出射,第二光線從第二光出口出射。In another embodiment, the uniform mixing or light splitting element is an optical integrating sphere, the optical integrating sphere includes a light entrance, a first light exit and a second light exit, the first optical receiver is aligned with the first light exit, The second optical receiver is aligned with the second light exit, the light rays emitted by the light emitting elements enter the optical integrating sphere through the light entrance, the first light exits from the first light exit, and the second light exits from the second light exit.

在另一實施例中,第一光出口與光入口相對於光學積分球的球心相隔90度的圓心角,第二光出口與光入口相對於光學積分球的球心相隔90度的圓心角,且第一光出口與第二光出口相對於光學積分球的球心相隔90度的圓心角。In another embodiment, the first light exit and the light entrance are separated by a central angle of 90 degrees relative to the center of the optical integrating sphere, and the second light exit is separated from the light entrance by a central angle of 90 degrees relative to the center of the optical integrating sphere , and the first light exit and the second light exit are separated by a central angle of 90 degrees relative to the center of the optical integrating sphere.

在另一實施例中,均勻混和或分光元件為一分光板,分光板具有一通孔,第一光學接收器設置於分光板且與該等發光元件相向設置,該等發光元件發出的該等光線的部分成為第一光線並由第一光學接收器接收,該等發光元件發出的該等光線的另一部分通過該通孔而成為第二光線。In another embodiment, the uniform mixing or light-splitting element is a light-splitting plate, the light-splitting plate has a through hole, the first optical receiver is arranged on the light-splitting plate and opposite to the light-emitting elements, and the light emitted by the light-emitting elements A part of the light becomes the first light and is received by the first optical receiver, and another part of the light emitted by the light-emitting elements passes through the through hole to become the second light.

在另一實施例中,相鄰的二個發光峰值波長所對應的二個發光元件之該等波長範圍部份重疊以形成較該等發光元件中之各者之波長範圍寬之一連續波長範圍,或者相鄰的二個發光峰值波長所對應的二個發光元件之該等波長範圍不重疊。In another embodiment, the wavelength ranges of two light-emitting elements corresponding to two adjacent luminous peak wavelengths partially overlap to form a continuous wavelength range wider than the wavelength range of each of the light-emitting elements , or the wavelength ranges of the two light-emitting elements corresponding to two adjacent luminous peak wavelengths do not overlap.

在另一實施例中,複數個發光元件係依序發光,前述依序發光係指於不同位置的複數個發光元件放射相同該波長範圍之光的複數個發光元件係不同時發光;或者,複數個發光元件係部分同時發光,前述部分同時發光指的是將複數個發光元件,使其中一部分同時發光而同時放射不同波長範圍之光。In another embodiment, a plurality of light-emitting elements are sequentially emitting light, and the aforementioned sequential light-emitting means that a plurality of light-emitting elements in different positions emit light in the same wavelength range and a plurality of light-emitting elements do not emit light at the same time; or, a plurality of A plurality of light-emitting elements are partially emitting light at the same time. The above-mentioned partial light-emitting at the same time refers to a plurality of light-emitting elements, so that some of them emit light at the same time and emit light in different wavelength ranges at the same time.

在另一實施例中,固態光源發射器更包括一基板,量測該等發光元件工作時的一定電流偏壓值,並藉由該等發光元件的定電流偏壓值與一固態光源之PN接面溫度的數學關係式或對應表或圖換算得到固態光源之PN接面溫度,而後再藉由該等發光元件的光強度與PN接面溫度的數學關係式或對應表或圖,得到該等發光元件的發光強度比例,並根據一判斷結果修正第一光學接收器所量測該等發光元件發出的光強度數值。In another embodiment, the solid-state light source transmitter further includes a substrate for measuring a certain current bias value of the light-emitting elements when they are in operation, and by using the constant current bias value of the light-emitting elements and the PN of a solid-state light source The mathematical relational expression or corresponding table or diagram of the junction temperature is converted to obtain the PN junction temperature of the solid-state light source, and then the mathematical relational expression or corresponding table or diagram between the light intensity of the light-emitting elements and the PN junction temperature is obtained. The ratio of the luminous intensity of the luminous elements, and according to a judgment result, the value of the light intensity emitted by the luminous elements measured by the first optical receiver is corrected.

在另一實施例中,本發明的光學分析儀更包括一第一處理器以及一第一顯示裝置,固態光源發射器、第一光學接收器以及第二光學接收器連接於第一處理器,第一處理器控制固態光源發射器依序發出該等光線,第一光學接收器以及第二光學接收器接收的光強度訊號顯示於第一顯示裝置。In another embodiment, the optical analyzer of the present invention further includes a first processor and a first display device, the solid-state light source transmitter, the first optical receiver and the second optical receiver are connected to the first processor, The first processor controls the solid-state light source transmitter to emit the light in sequence, and the light intensity signals received by the first optical receiver and the second optical receiver are displayed on the first display device.

在另一實施例中,本發明的光學分析儀更包括一第一無線通訊模組,其連接於該第一處理器,該第一光學接收器以及該第二光學接收器接收的光強度訊號可經由該第一無線通訊模組傳送至外部的電子裝置,或接收來自外部的電子裝置的控制訊號。In another embodiment, the optical analyzer of the present invention further includes a first wireless communication module connected to the first processor, the light intensity signal received by the first optical receiver and the second optical receiver It can transmit to the external electronic device through the first wireless communication module, or receive the control signal from the external electronic device.

在另一實施例中,該明滅頻率是介於0.05次/秒至50000次/秒之間。In another embodiment, the flickering frequency is between 0.05 times/second and 50000 times/second.

在另一實施例中,該明滅頻率中開啟該發光元件的時間區間為介於0.00001秒至10秒之間。In another embodiment, the time interval for turning on the light-emitting element in the flickering frequency is between 0.00001 second and 10 seconds.

在另一實施例中,該明滅頻率中關閉該發光元件的時間區間為介於0.00001秒至10秒之間。In another embodiment, the time interval for turning off the light-emitting element in the flickering frequency is between 0.00001 second and 10 seconds.

在另一實施例中,相鄰的二個該發光峰值波長彼此相差為介於1nm至80nm之間。In another embodiment, the difference between two adjacent luminescence peak wavelengths is between 1 nm and 80 nm.

在另一實施例中,相鄰的二個該發光峰值波長彼此相差為介於5nm至80nm之間。In another embodiment, the difference between two adjacent luminescence peak wavelengths is between 5 nm and 80 nm.

在另一實施例中,各該發光峰值波長所對應的波長半高寬為介於15nm至50nm之間。In another embodiment, the wavelength half maximum width corresponding to each of the luminous peak wavelengths is between 15 nm and 50 nm.

在另一實施例中,各該發光峰值波長所對應的波長半高寬為介於15nm至40nm之間。In another embodiment, the wavelength half maximum width corresponding to each of the luminous peak wavelengths is between 15 nm and 40 nm.

在另一實施例中,相鄰的二個該發光峰值波長彼此相差為大於或等於0.5nm。In another embodiment, the difference between two adjacent luminous peak wavelengths is greater than or equal to 0.5 nm.

在另一實施例中,相鄰的二個該發光峰值波長彼此相差為介於1nm至80nm之間。In another embodiment, the difference between two adjacent luminescence peak wavelengths is between 1 nm and 80 nm.

在另一實施例中,複數個該發光峰值波長之中的至少一部份的該發光峰值波長所對應的波長半高寬為大於0nm且小於或等於60nm。In another embodiment, at least a part of the peak luminescence wavelengths among the plurality of peak luminescence wavelengths has a wavelength half maximum width greater than 0 nm and less than or equal to 60 nm.

本發明提供一種光學分析系統,其包括光學分析儀以及一液體輸送件,一待測液體於該液體輸送件內輸送,該均勻混和或分光元件與該第二光學接收器設置於該液體輸送件的兩側,該第二光線穿過該液體輸送件並形成該檢測光線而由該第二光學接收器接收。The present invention provides an optical analysis system, which includes an optical analyzer and a liquid conveying member, a liquid to be tested is conveyed in the liquid conveying member, the uniform mixing or light splitting element and the second optical receiver are arranged on the liquid conveying member The second light passes through the liquid conveying element and forms the detection light to be received by the second optical receiver.

本發明的光學分析系統及光學分析儀,藉由光源具有多個發出不同波長範圍的光線的發光元件而且逐一發光,不需要設置先前技術的單色器,可以大幅降低光學分析儀的體積。而且本發明的光學分析儀設有第一光學接收器以及第二光學接收器,可以偵測得知發光元件光強度衰減的狀態。In the optical analysis system and optical analyzer of the present invention, the light source has a plurality of light-emitting elements that emit light in different wavelength ranges and emits light one by one, so there is no need to install a monochromator in the prior art, and the volume of the optical analyzer can be greatly reduced. Moreover, the optical analyzer of the present invention is provided with a first optical receiver and a second optical receiver, which can detect the attenuation state of the light intensity of the light emitting element.

請參閱第2圖及第3圖,其表示本發明的光學分析儀的一實施例。本實施例的光學分析儀100包括一固態光源發射器10、一均勻混和或分光元件20、一第一光學接收器30以及一第二光學接收器40。固態光源發射器10包括一光源,光源包括複數個各放射具有至少一發光峰值波長及至少一波長範圍之光的發光元件13,該等發光元件13為發光二極體、垂直共振腔面射型雷射或雷射二極體,且複數個發光元件13能夠分別呈現一明滅頻率的非連續發光,複數個明滅頻率可以是彼此相同或彼此不同,或者複數個明滅頻率可以是部分相同或部分不同。Please refer to Fig. 2 and Fig. 3, which represent an embodiment of the optical analyzer of the present invention. The optical analyzer 100 of this embodiment includes a solid-state light source transmitter 10 , a uniform mixing or splitting element 20 , a first optical receiver 30 and a second optical receiver 40 . The solid-state light source transmitter 10 includes a light source, and the light source includes a plurality of light-emitting elements 13 each emitting light having at least one luminous peak wavelength and at least one wavelength range. These light-emitting elements 13 are light-emitting diodes, vertical cavity surface-emitting types A laser or a laser diode, and a plurality of light-emitting elements 13 can respectively present a discontinuous light emission with a flickering frequency, and the multiple flickering frequencies can be the same or different from each other, or the multiple flickering frequencies can be partly the same or partly different .

該等發光元件13發出的光線通過均勻混和或分光元件20後形成一第一光線L1以及一第二光線L2,第二光線L2係通過一流體待測物O後未被流體待測物吸收而得到一檢測光線L3。第一光學接收器30接收第一光線L1。第二光學接收器40接收檢測光線L3。其中,當該第一光線L1具有一標準光強度時,該第二光線L2之光強度與該標準光強度相等,該檢測光線L3與該標準光強度之比值為該流體待測物O之一標準穿透率,而當該第一光線L1具有一工作光強度時,該第二光線L2之光強度與該工作光強度相等,該檢測光線L3與該工作光強度之比值為該流體待測物O之一工作穿透率,該標準光強度與該工作光強度不相同,比較該標準穿透率與該工作穿透率是否相同,並根據比較的結果判斷該流體待測物O的組成分變化,例如,該流體待測物O可作為印刷電路板(PCB)、半導體、石化業或食品加工業所需的工作藥液,而該標準穿透率代表該流體待測物O具有正常工作時所需的組成分比例及濃度,當該標準穿透率與該工作穿透率為相同或其差異在可容忍範圍時,可以判斷該流體待測物O的組成仍符合使用者的需求,而當該標準穿透率與該工作穿透率為不相同且其差異在不可容忍範圍時,可以判斷該流體待測物O的組成分比例及濃度發生改變而導致成為非正常工作時所需的工作藥液,而需要將目前的工作藥液進行更換或調整。本發明可透過接收第一光線L1的第一光學接收器30與接收通過流體待測物O的檢測光線L3的第二光學接收器40,以即時地監控或動態連續紀錄目前的流體待測物O的穿透率與其組成分比例及濃度是否符合正常工作時所需的品質,或者進一步推算使用壽命,而預先做好更換或調整流體待測物O的準備作業。The light emitted by the light-emitting elements 13 passes through the uniform mixing or light-splitting element 20 to form a first light L1 and a second light L2, and the second light L2 is not absorbed by the fluid test object after passing through a fluid test object O. A detection light L3 is obtained. The first optical receiver 30 receives the first light L1. The second optical receiver 40 receives the detection light L3. Wherein, when the first light L1 has a standard light intensity, the light intensity of the second light L2 is equal to the standard light intensity, and the ratio of the detection light L3 to the standard light intensity is one of the fluid analyte O Standard transmittance, and when the first light L1 has a working light intensity, the light intensity of the second light L2 is equal to the working light intensity, and the ratio of the detection light L3 to the working light intensity is the fluid to be tested One of the working transmittances of the object O, the standard light intensity is different from the working light intensity, compare whether the standard transmittance is the same as the working transmittance, and judge the composition of the fluid to be tested O according to the comparison result For example, the fluid analyte O can be used as a working liquid for printed circuit board (PCB), semiconductor, petrochemical or food processing industries, and the standard penetration rate represents that the fluid analyte O has a normal The proportion and concentration of the required components during work. When the standard penetration rate is the same as the working penetration rate or the difference is within a tolerable range, it can be judged that the composition of the fluid to be tested O still meets the needs of the user , and when the standard penetration rate is different from the working penetration rate and the difference is within an intolerable range, it can be judged that the composition ratio and concentration of the fluid analyte O have changed, resulting in abnormal working conditions. The required working liquid, and the current working liquid needs to be replaced or adjusted. In the present invention, the first optical receiver 30 that receives the first light L1 and the second optical receiver 40 that receives the detection light L3 that passes through the fluid test object O can be used to monitor or dynamically continuously record the current fluid test object in real time. Whether the penetration rate of O and its composition ratio and concentration meet the quality required for normal work, or further calculate the service life, and make preparations for replacing or adjusting the fluid to be tested O in advance.

該等發光元件13發出的光線通過均勻混和或分光元件20後形成一第一光線L1以及一第二光線L2,第二光線L2係通過一流體待測物O後未被流體待測物吸收而得到一檢測光線L3。第一光學接收器30接收第一光線L1。第二光學接收器40接收檢測光線L3。其中,當該第一光線L1具有一標準光強度時,該第一光學接收器30接收該第一光線L1並產生一標準光強度訊號,而當該第一光線L1具有一衰減光強度時,該第一光學接收器30接收該第一光線L1並產生一衰減光強度訊號,比較該標準光強度訊號與該衰減光強度訊號間的一變化量,該均勻混和或分光元件20根據該變化量調整該第一光線L1的光強度,而得一恆定光強度之量測系統。本發明可透過接收第一光線L1的第一光學接收器30即時監控固態光源發射器10之光源的光強度是否衰減,與光強度訊號衰減的變化量,而進一步調整或更換固態光源發射器10之光源。The light emitted by the light-emitting elements 13 passes through the uniform mixing or light-splitting element 20 to form a first light L1 and a second light L2, and the second light L2 is not absorbed by the fluid test object after passing through a fluid test object O. A detection light L3 is obtained. The first optical receiver 30 receives the first light L1. The second optical receiver 40 receives the detection light L3. Wherein, when the first light L1 has a standard light intensity, the first optical receiver 30 receives the first light L1 and generates a standard light intensity signal, and when the first light L1 has an attenuated light intensity, The first optical receiver 30 receives the first light L1 and generates an attenuated light intensity signal, compares a change amount between the standard light intensity signal and the attenuated light intensity signal, and the uniform mixing or light splitting element 20 according to the change amount Adjust the light intensity of the first light L1 to obtain a measurement system with constant light intensity. The present invention can monitor in real time whether the light intensity of the light source of the solid-state light source transmitter 10 is attenuated through the first optical receiver 30 receiving the first light L1, and the change amount of attenuation of the light intensity signal, so as to further adjust or replace the solid-state light source transmitter 10 The light source.

本實施例的均勻混和或分光元件20為一光學積分球,光學積分球包括一光入口21、一第一光出口22以及一第二光出口23,第一光學接收器30對準第一光出口22,第二光學接收器40對準第二光出口23,該等發光元件13發出的該等光線由光入口21進入光學積分球,第一光線L1從第一光出口22出射,第二光線L2從第二光出口23出射。如第2圖所示,第一光出口22與光入口21相對於光學積分球的球心相隔90度的圓心角,第二光出口23與光入口21相對於光學積分球的球心相隔90度的圓心角,且第一光出口22與第二光出口23相對於光學積分球的球心相隔90度的圓心角。The uniform mixing or light splitting element 20 of the present embodiment is an optical integrating sphere, the optical integrating sphere includes a light entrance 21, a first light exit 22 and a second light exit 23, and the first optical receiver 30 is aimed at the first light exit 22, the second optical receiver 40 is aimed at the second light exit 23, the light rays emitted by the light emitting elements 13 enter the optical integrating sphere through the light entrance 21, the first light L1 exits from the first light exit 22, the second The light L2 exits from the second light outlet 23 . As shown in Figure 2, the first light exit 22 and the light entrance 21 are separated by a central angle of 90 degrees relative to the center of the optical integrating sphere, and the second light exit 23 is separated by 90 degrees from the light entrance 21 relative to the center of the optical integrating sphere. degree, and the first light outlet 22 and the second light outlet 23 are separated by a central angle of 90 degrees relative to the center of the optical integrating sphere.

本實施例的均勻混和或分光元件20的光學積分球設置於一容置殼體6內,固態光源發射器10及第一光學接收器30分別設置於容置殼體6的側壁,容置殼體6具有一開口61,開口61對準第二光出口23,使得第二光線L2可經由開口61從容置殼體6出射。The optical integrating sphere of the uniform mixing or light splitting element 20 of the present embodiment is arranged in a housing 6, the solid-state light source transmitter 10 and the first optical receiver 30 are respectively arranged on the side wall of the housing 6, and the housing The body 6 has an opening 61 , and the opening 61 is aligned with the second light outlet 23 , so that the second light L2 can exit from the housing 6 through the opening 61 .

請參閱第4圖,其表示本發明的光學分析儀的另一實施例。本實施例的部分結構與第2圖的實施例相同,因此相同的元件給予相同的符號並省略其說明。本實施例的均勻混和或分光元件20’ 為一分光板,分光板具有一通孔24,第一光學接收器30設置於分光板且與該等發光元件13相向設置,該等發光元件13發出的該等光線的部分成為第一光線L1並由第一光學接收器30接收,該等發光元件13發出的該等光線的另一部分通過通孔24而成為第二光線L2。第二光線L2通過流體待測物O後形成檢測光線L3,並由第二光學接收器40接收。同樣地,比較第一光線L1與檢測光線L3的強度是否相同,並根據比較的結果調整該等發光元件13發出的該等光線的光強度。Please refer to Fig. 4, which shows another embodiment of the optical analyzer of the present invention. Part of the structure of this embodiment is the same as that of the embodiment in Fig. 2, so the same elements are assigned the same symbols and their descriptions are omitted. The uniform mixing or light-splitting element 20' of this embodiment is a light-splitting plate, and the light-splitting plate has a through hole 24. The first optical receiver 30 is arranged on the light-splitting plate and opposite to the light-emitting elements 13. The light emitted by the light-emitting elements 13 Part of the light becomes the first light L1 and is received by the first optical receiver 30 , and another part of the light emitted by the light emitting elements 13 passes through the through hole 24 to become the second light L2 . The second light L2 passes through the fluid object O to form a detection light L3 and is received by the second optical receiver 40 . Likewise, compare whether the intensity of the first light L1 is the same as that of the detection light L3, and adjust the light intensity of the light emitted by the light emitting elements 13 according to the comparison result.

另外,本發明的固態光源發射器10的光源的發光元件13所發出的光線,其相鄰的二個該發光峰值波長所對應的二個該發光元件13之該等波長範圍部份重疊以形成較該等發光元件13中之各者之該波長範圍寬之一連續波長範圍,或者相鄰的二個該發光峰值波長所對應的二個該發光元件13之該等波長範圍不重疊。In addition, for the light emitted by the light-emitting element 13 of the light source of the solid-state light source emitter 10 of the present invention, the wavelength ranges of the two light-emitting elements 13 corresponding to the two adjacent light-emitting peak wavelengths partially overlap to form A continuous wavelength range wider than the wavelength range of each of the light emitting elements 13 , or the wavelength ranges of the two light emitting elements 13 corresponding to two adjacent luminous peak wavelengths do not overlap.

請參閱第5圖,相鄰的二個該發光峰值波長所對應的二個發光二極體之該等波長範圍部份重疊以形成較該等發光二極體中之各者之該波長範圍寬之一連續波長範圍,該連續波長範圍是介於180nm至2500nm之間。在第2圖中共有三個發光峰值波長及所對應的波長範圍,分別為一第一光線的一第一發光峰值波長(734nm)所對應的該第一波長範圍、一第二光線的一第二發光峰值波長(810nm)所對應的該第二波長範圍及一第三光線的一第三發光峰值波長(882nm)所對應的該第三波長範圍。該第一發光峰值波長與該第二發光峰值波長是相鄰的二個發光峰值波長,同樣地該第二發光峰值波長與該第三發光峰值波長也是相鄰的二個發光峰值波長。該第一發光峰值波長所對應的該第一波長範圍係為介於660nm至780nm之間,該第二光線的該第二發光峰值波長所對應的該第二波長範圍係為介於710nm至850nm,該第一波長範圍與該第二波長範圍在710nm至780nm之間呈現部分重疊,因此該第一波長範圍與該第二波長範圍共同形成660nm至850nm之間的該連續波長範圍。同樣地,該第二發光峰值波長所對應的該第二波長範圍係為介於710nm至850nm,該第三光線的該第三發光峰值波長所對應的該第三波長範圍係為介於780nm至940nm,該第二波長範圍與該第三波長範圍在780nm至850nm之間呈現部分重疊,因此該第二波長範圍與該第三波長範圍共同形成710nm至940nm之間的該連續波長範圍。在本發明中,相鄰的二個該發光峰值波長所對應的二個該發光二極體之該等波長範圍的重疊部分,以重疊愈少則愈佳。當然,相鄰的二個該發光峰值波長所對應的二個該發光二極體之該等波長範圍也可以不重疊,這將於後文中說明。Please refer to Figure 5, the wavelength ranges of the two adjacent light-emitting diodes corresponding to the luminous peak wavelengths partially overlap to form a wavelength range wider than that of each of the light-emitting diodes A continuous wavelength range, the continuous wavelength range is between 180nm and 2500nm. In Figure 2, there are three luminous peak wavelengths and corresponding wavelength ranges, which are respectively the first wavelength range corresponding to a first luminous peak wavelength (734nm) of a first light, and a second wavelength range of a second light. The second wavelength range corresponding to the emission peak wavelength (810nm) and the third wavelength range corresponding to a third emission peak wavelength (882nm) of a third light. The first luminescence peak wavelength and the second luminescence peak wavelength are two adjacent luminescence peak wavelengths, and likewise the second luminescence peak wavelength and the third luminescence peak wavelength are also two adjacent luminescence peak wavelengths. The first wavelength range corresponding to the first luminescence peak wavelength is between 660nm and 780nm, and the second wavelength range corresponding to the second luminescence peak wavelength of the second light is between 710nm and 850nm , the first wavelength range and the second wavelength range partially overlap between 710nm and 780nm, so the first wavelength range and the second wavelength range jointly form the continuous wavelength range between 660nm and 850nm. Similarly, the second wavelength range corresponding to the second luminescence peak wavelength is between 710nm and 850nm, and the third wavelength range corresponding to the third luminescence peak wavelength of the third light is between 780nm and 850nm. 940nm, the second wavelength range and the third wavelength range partially overlap between 780nm and 850nm, so the second wavelength range and the third wavelength range jointly form the continuous wavelength range between 710nm and 940nm. In the present invention, the overlapping portions of the wavelength ranges of the two adjacent light-emitting diodes corresponding to the two adjacent light-emitting peak wavelengths should be as small as possible. Of course, the wavelength ranges of the two light-emitting diodes corresponding to the two adjacent light-emitting peak wavelengths may not overlap, which will be described later.

相鄰的二個該發光峰值波長彼此相差為大於或等於0.5nm,較佳地為介於1nm至80nm之間,更佳地為介於5nm至80nm之間。在第2圖中,相鄰的該第一發光峰值波長(734nm)與該第二發光峰值波長(810nm)彼此相差為76nm,而相鄰的該第二發光峰值波長(810nm)與該第三發光峰值波長(882nm)彼此相差為72nm。除了有特別說明之外,本發明及專利範圍所述之數值範圍的限定總是包括端值,例如前述相鄰的二個該發光峰值波長彼此相差為介於5nm至80nm之間,是指大於或等於5nm而且小於或等於80nm。The difference between two adjacent luminous peak wavelengths is greater than or equal to 0.5 nm, preferably between 1 nm and 80 nm, more preferably between 5 nm and 80 nm. In Figure 2, the difference between the adjacent first luminous peak wavelength (734nm) and the second luminous peak wavelength (810nm) is 76nm, and the adjacent second luminous peak wavelength (810nm) and the third The luminescence peak wavelengths (882 nm) differ from each other by 72 nm. Unless otherwise specified, the limitation of the numerical range described in the present invention and the scope of the patent always includes the end value, for example, the difference between the aforementioned two adjacent luminous peak wavelengths is between 5nm and 80nm, which means greater than Or equal to 5nm and less than or equal to 80nm.

請一併參閱第6圖的第二實施例,第二實施例是第一實施例的衍生實施例,因此第二實施例與第一實施例相同之處就不再贅述。第二實施例與第一實施例不同之處在於第二實施例的該光源係包含五個發光二極體,分別為放射具有一第一發光二極體、放射具有一第四波長範圍之一第四光線的一第四發光二極體、一第二發光二極體、放射具有一第五波長範圍之一第五光線的一第五發光二極體及一第三發光二極體,該第四光線在該第四波長範圍內具有一第四發光峰值波長(772nm),該第五光線在該第五波長範圍內具有一第五發光峰值波長(854nm)。在第3圖中,發光峰值波長由小至大依序為該第一發光峰值波長(734nm)、該第四發光峰值波長(772nm)、該第二發光峰值波長(810nm)、該第五發光峰值波長(854nm)及該第三發光峰值波長(882nm),相鄰的該第一發光峰值波長(734nm)與該第四發光峰值波長(772nm)彼此相差為38nm,相鄰的該第四發光峰值波長(772nm)與該第二發光峰值波長(810nm)彼此相差為38nm,相鄰的該第二發光峰值波長(810nm)與該第五發光峰值波長(854nm)彼此相差為44nm,相鄰的該第五發光峰值波長(854nm)與該第三發光峰值波長(882nm)彼此相差為28nm。Please also refer to the second embodiment in FIG. 6 . The second embodiment is a derivative embodiment of the first embodiment, so the similarities between the second embodiment and the first embodiment will not be repeated here. The difference between the second embodiment and the first embodiment is that the light source of the second embodiment includes five light-emitting diodes, respectively emitting a first light-emitting diode and emitting one of a fourth wavelength range. A fourth light-emitting diode for the fourth light, a second light-emitting diode, a fifth light-emitting diode and a third light-emitting diode emitting a fifth light with a fifth wavelength range, the The fourth light has a fourth luminescence peak wavelength (772nm) within the fourth wavelength range, and the fifth light has a fifth luminescence peak wavelength (854nm) within the fifth wavelength range. In Figure 3, the luminescence peak wavelengths from small to large are the first luminescence peak wavelength (734nm), the fourth luminescence peak wavelength (772nm), the second luminescence peak wavelength (810nm), the fifth luminescence peak wavelength The peak wavelength (854nm) and the third luminescence peak wavelength (882nm), the difference between the adjacent first luminescence peak wavelength (734nm) and the fourth luminescence peak wavelength (772nm) is 38nm, and the adjacent fourth luminescence peak wavelength The difference between the peak wavelength (772nm) and the second luminescence peak wavelength (810nm) is 38nm, the difference between the adjacent second luminescence peak wavelength (810nm) and the fifth luminescence peak wavelength (854nm) is 44nm, and the adjacent The fifth luminescence peak wavelength (854nm) and the third luminescence peak wavelength (882nm) differ from each other by 28nm.

請一併參閱第7圖的第三實施例,第三實施例是第一實施例及第二實施例的衍生實施例,因此第三實施例與第一實施例及第二實施例相同之處就不再贅述。第三實施例與第一實施例不同之處在於第三實施例的該光源係包含12個發光二極體,在第8圖中,12個發光二極體的發光峰值波長由小至大依序為734nm(該第一發光峰值波長)、747nm、760nm、772nm(該第四發光峰值波長)、785nm、798nm、810nm(該第二發光峰值波長)、824nm、839nm、854nm(該第五發光峰值波長)、867nm及882nm(該第三發光峰值波長)。該12個發光二極體的發光峰值波長之中,相鄰的二個該發光峰值波長彼此相差依序分別為13nm、13nm、12nm、13nm、13nm、12nm、14nm、15nm、15nm、13nm及15nm。如果於第一實施例、第二實施例及第三實施例中的該發光元件13是改用雷射二極體,相鄰的二個該發光峰值波長彼此相差可以為大於或等於0.5nm,例如為1nm。Please also refer to the third embodiment in Figure 7. The third embodiment is a derivative embodiment of the first embodiment and the second embodiment, so the third embodiment is the same as the first embodiment and the second embodiment I won't go into details. The difference between the third embodiment and the first embodiment is that the light source of the third embodiment includes 12 light-emitting diodes. The sequence is 734nm (the first luminescence peak wavelength), 747nm, 760nm, 772nm (the fourth luminescence peak wavelength), 785nm, 798nm, 810nm (the second luminescence peak wavelength), 824nm, 839nm, 854nm (the fifth luminescence peak wavelength) peak wavelength), 867nm and 882nm (the third luminescence peak wavelength). Among the luminescence peak wavelengths of the 12 light-emitting diodes, the difference between the two adjacent luminescence peak wavelengths is 13nm, 13nm, 12nm, 13nm, 13nm, 12nm, 14nm, 15nm, 15nm, 13nm and 15nm respectively . If the light-emitting element 13 in the first embodiment, the second embodiment and the third embodiment is a laser diode instead, the difference between two adjacent luminous peak wavelengths can be greater than or equal to 0.5 nm, For example, it is 1 nm.

複數個該發光峰值波長之中的至少一部份的該發光峰值波長所對應的波長半高寬為大於0nm且小於或等於60nm。較佳地,各該發光峰值波長所對應的波長半高寬為大於0nm且小於或等於60nm,例如前述第一實施例、第二實施例及第三實施例中發光峰值波長由小至大依序為734nm(該第一發光峰值波長)、747nm、760nm、772nm(該第四發光峰值波長)、785nm、798nm、810nm(該第二發光峰值波長)、824nm、839nm、854nm(該第五發光峰值波長)、867nm及882nm(該第三發光峰值波長),該第一光線的該第一發光峰值波長所對應的波長半高寬、該第二光線的該第二發光峰值波長所對應的波長半高寬、該第三光線的該第三發光峰值波長所對應的波長半高寬、該第四光線的該第四發光峰值波長所對應的波長半高寬及該第五光線的該第五發光峰值波長所對應的波長半高寬為大於0nm且小於或等於60nm,較佳為介於15nm至50nm之間,更佳為介於15nm至40nm之間。其餘未說明的747nm、760nm、785nm、798nm、824nm、839nm及867nm發光峰值波長所對應的波長半高寬(第4圖)也是為大於0nm且小於或等於60nm,較佳為介於15nm至50nm之間,更佳為介於15nm至40nm之間。於本發明的實驗操作時,前述第一實施例、第二實施例及第三實施例中的發光峰值波長所對應的波長半高寬為55nm;如果該發光元件13是雷射二極體,各該發光峰值波長所對應的波長半高寬為大於0nm且小於或等於60nm,例如為1nm。The wavelength half maximum width corresponding to at least a part of the luminescence peak wavelengths among the plurality of luminescence peak wavelengths is greater than 0 nm and less than or equal to 60 nm. Preferably, the wavelength half maximum width corresponding to each of the luminous peak wavelengths is greater than 0 nm and less than or equal to 60 nm, for example, in the aforementioned first embodiment, second embodiment and third embodiment, the luminous peak wavelengths vary from small to large. The sequence is 734nm (the first luminescence peak wavelength), 747nm, 760nm, 772nm (the fourth luminescence peak wavelength), 785nm, 798nm, 810nm (the second luminescence peak wavelength), 824nm, 839nm, 854nm (the fifth luminescence peak wavelength) peak wavelength), 867nm and 882nm (the third luminescence peak wavelength), the wavelength half maximum width corresponding to the first luminescence peak wavelength of the first light, and the wavelength corresponding to the second luminescence peak wavelength of the second light half maximum width, the wavelength half maximum width corresponding to the third luminous peak wavelength of the third light, the wavelength half maximum width corresponding to the fourth luminous peak wavelength of the fourth light, and the fifth light width of the fifth light The wavelength half maximum width corresponding to the luminescence peak wavelength is greater than 0 nm and less than or equal to 60 nm, preferably between 15 nm and 50 nm, more preferably between 15 nm and 40 nm. The half-maximum wavelength (Figure 4) corresponding to the remaining unexplained 747nm, 760nm, 785nm, 798nm, 824nm, 839nm and 867nm luminous peak wavelengths is also greater than 0nm and less than or equal to 60nm, preferably between 15nm and 50nm between, more preferably between 15nm and 40nm. During the experimental operation of the present invention, the wavelength half maximum width corresponding to the luminous peak wavelength in the first embodiment, the second embodiment and the third embodiment is 55nm; if the light emitting element 13 is a laser diode, The wavelength half maximum width corresponding to each of the emission peak wavelengths is greater than 0 nm and less than or equal to 60 nm, for example, 1 nm.

前述相鄰的二個該發光峰值波長所對應的二個該發光二極體之該等波長範圍也可以不重疊,例如如果前述第一實施例、第二實施例及第三實施例中的各發光峰值波長所對應的波長半高寬為15nm,各發光峰值波長所對應的該波長範圍的寬度(也就是該波長範圍的最大值與最小值的差)為40nm,相鄰的二個該發光峰值波長彼此相差為80nm。又例如如果該發光元件13是雷射二極體,各該發光峰值波長所對應的波長半高寬為1nm,該波長範圍的寬度為4nm,相鄰的二個該發光峰值波長彼此相差為5nm,則相鄰的二個該發光峰值波長所對應的二個該發光元件(雷射二極體)之該等波長範圍不重疊。The aforementioned wavelength ranges of the two light-emitting diodes corresponding to the two adjacent luminous peak wavelengths may not overlap, for example, if each of the aforementioned first embodiment, second embodiment and third embodiment The wavelength half maximum width corresponding to the luminescence peak wavelength is 15nm, the width of the wavelength range corresponding to each luminescence peak wavelength (that is, the difference between the maximum value and the minimum value of the wavelength range) is 40nm, and the two adjacent luminescence The peak wavelengths differ from each other by 80 nm. For another example, if the light-emitting element 13 is a laser diode, the wavelength half maximum width corresponding to each of the luminous peak wavelengths is 1 nm, the width of the wavelength range is 4 nm, and the difference between two adjacent luminous peak wavelengths is 5 nm. , the wavelength ranges of the two light-emitting elements (laser diodes) corresponding to the two adjacent luminous peak wavelengths do not overlap.

較佳地,於第一實施例、第二實施例及第三實施例操作一成像裝置進行該待測物的檢測以產生該待測物光譜圖時,該成像裝置為一手機或平板電腦,如前所述該固態光源發射器10能夠分別控制並使得複數個該發光二極體分別呈現一明滅頻率的非連續發光,複數個該明滅頻率可以是彼此相同或彼此不同,或者複數個該明滅頻率可以是部分相同或部分不同,前述該明滅頻率是介於0.05次/秒至50000次/秒之間,該明滅頻率中開啟(點亮)該發光二極體的時間區間為介於0.00001秒至10秒之間,該明滅頻率中關閉(熄滅)該發光二極體的時間區間為介於0.00001秒至10秒之間,該明滅頻率的週期是指接續的一次開啟(點亮)該發光二極體的時間區間及關閉(熄滅)該發光二極體的時間區間的和,該明滅頻率的週期是該明滅頻率的倒數;換言之,該明滅頻率的週期可以被理解為將複數個該發光二極體連續點亮一點亮時間區間並立即無間斷地連續熄滅一熄滅時間區間的和,該點亮時間區間為介於0.00001秒至10秒之間,該熄滅時間區間為介於0.00001秒至10秒之間。較佳地,該明滅頻率是介於0.5次/秒至50000次/秒之間;更佳地,該明滅頻率是介於5次/秒至50000次/秒之間。複數個該發光二極體呈現非連續發光的樣態可以大幅降低該待測物(A)被該發光二極體所放射的光的熱能所影響,避免含有有機體的該待測物(A)產生質變,因此尤其適合對於熱能敏感的該待測物(A),更尤其適合於該發光二極體所放射該波長範圍的光為近紅外光。Preferably, when operating an imaging device in the first embodiment, the second embodiment and the third embodiment to detect the object to be tested to generate the spectrogram of the object to be tested, the imaging device is a mobile phone or a tablet computer, As mentioned above, the solid-state light source transmitter 10 can separately control and make the plurality of light-emitting diodes respectively present discontinuous light with a flickering frequency. The frequency can be partly the same or partly different. The aforementioned flickering frequency is between 0.05 times/second and 50,000 times/second, and the time interval for turning on (lighting) the light-emitting diode in the flickering frequency is between 0.00001 second Between 0.00001 second and 10 seconds, the time interval for turning off (extinguishing) the light-emitting diode in the flickering frequency is between 0.00001 second and 10 seconds. The sum of the time interval of the diode and the time interval of turning off (extinguishing) the light-emitting diode, the period of the on-off frequency is the reciprocal of the on-off frequency; The diode continuously lights up for a lighting time interval and immediately goes out continuously without interruption for a sum of an extinguishing time interval. The lighting time interval is between 0.00001 seconds and 10 seconds, and the extinguishing time interval is between 0.00001 seconds. to 10 seconds. Preferably, the blinking frequency is between 0.5 times/second and 50000 times/second; more preferably, the blinking frequency is between 5 times/second and 50000 times/second. The plurality of light-emitting diodes exhibiting discontinuous light emission can greatly reduce the influence of the analyte (A) by the heat energy of the light emitted by the light-emitting diodes, and avoid the analyte (A) containing organisms Therefore, it is especially suitable for the analyte (A) that is sensitive to thermal energy, and it is more especially suitable for the light in the wavelength range emitted by the light-emitting diode to be near-infrared light.

另外,複數個發光元件13係依序發光,前述依序發光係指於不同位置的複數個發光元件13放射相同該波長範圍之光的複數個發光元件13係不同時發光;或者,複數個發光元件13係部分同時發光,前述部分同時發光指的是將複數個發光元件13,使其中一部分同時發光而同時放射不同波長範圍之光。In addition, a plurality of light-emitting elements 13 are sequentially emitting light. The aforementioned sequential light-emitting means that the plurality of light-emitting elements 13 at different positions emit light in the same wavelength range. The plurality of light-emitting elements 13 do not emit light at the same time; Parts of the elements 13 emit light at the same time. The above-mentioned simultaneous light emission refers to making a part of the plurality of light emitting elements 13 emit light at the same time and emit light in different wavelength ranges at the same time.

請參閱第8圖,其表示本發明的固態光源發射器的一實施例。本實施例的固態光源發射器10包括一基板11、一溫度感測器12以及複數個發光元件13。該等發光元件13及溫度感測器12設置於基板11的一接面111,量測該等發光元件的偏壓值,並藉由該等發光元件13的該偏壓值與一接面溫度的數學關係式或對應表或圖換算得到該接面111的該接面溫度,而後再藉由該等發光元件13的光強度與該接面溫度的數學關係式或對應表或圖,得到該等發光元件13的發光強度,以判定該等發光元件13的發光強度是否變化,並根據該判斷結果調整該等發光元件13發出的該等光線的光強度。Please refer to FIG. 8, which shows an embodiment of the solid-state light source emitter of the present invention. The solid state light source transmitter 10 of this embodiment includes a substrate 11 , a temperature sensor 12 and a plurality of light emitting elements 13 . The light-emitting elements 13 and the temperature sensor 12 are arranged on a junction 111 of the substrate 11, measure the bias voltage value of the light-emitting elements, and use the bias value of the light-emitting elements 13 and a junction temperature The junction temperature of the junction 111 is obtained by converting the mathematical relational formula or corresponding table or figure, and then the mathematical relational formula or corresponding table or figure between the light intensity of the light emitting elements 13 and the junction temperature is obtained. The light intensity of the light emitting elements 13 is determined to determine whether the light intensity of the light emitting elements 13 changes, and the light intensity of the light emitted by the light emitting elements 13 is adjusted according to the judgment result.

本發明另一實施例中,該固態光源發射器10更包括一基板11,量測該等發光元件13工作時的一定電流偏壓值,並藉由該等發光元件13的該定電流偏壓值與一該固態光源發射器10之PN接面溫度的數學關係式或對應表或圖換算得到該固態光源發射器10之該PN接面溫度,而後再藉由該等發光元件13的光強度與該PN接面溫度的數學關係式或對應表或圖,得到該等發光元件13的發光強度比例,並根據一判斷結果修正該第一光學接收器30所量測該等發光元件13發出的光強度數值。In another embodiment of the present invention, the solid-state light source transmitter 10 further includes a substrate 11, which measures a certain current bias value of the light emitting elements 13 when they are working, and uses the constant current bias value of the light emitting elements 13 to Value and a mathematical relational expression or corresponding table or figure conversion of the PN junction temperature of the solid-state light source emitter 10 to obtain the PN junction temperature of the solid-state light source emitter 10, and then use the light intensity of the light-emitting elements 13 The mathematical relational expression or the corresponding table or figure with the temperature of the PN junction can obtain the luminous intensity ratio of the light emitting elements 13, and correct the light emitted by the light emitting elements 13 measured by the first optical receiver 30 according to a judgment result. Light intensity value.

由於每一個該發光二極體的該發光強度與其接面溫度(junction temperature)係呈反向關係,以及該發光二極體的散熱問題,該發光二極體於該電流密度運作下歷經持續操作時間的增加,則會增加該接面溫度而導致該發光強度減少,因此有必要以一種發光修正方法進行該發光強度的校正。該發光修正方法係依序包含一校正關係取得步驟P01、一量測順向偏壓步驟P02、一比例關係取得步驟P03及一完成校正步驟P04。該發光修正方法係可以接續於該發光方法之後,前述之該光譜檢測方法之該濾波步驟S03及該反轉換步驟S04係接續於該發光修正方法之後,請參見第9A圖。Due to the inverse relationship between the luminous intensity of each of the LEDs and its junction temperature, and the heat dissipation of the LEDs, the LEDs have been continuously operated under the current density. As time increases, the junction temperature will increase and the luminous intensity will decrease. Therefore, it is necessary to correct the luminous intensity with a luminous correction method. The luminescence correction method sequentially includes a calibration relationship acquisition step P01, a forward bias voltage measurement step P02, a proportional relationship acquisition step P03, and a calibration completion step P04. The luminescence correction method can be followed by the luminescence method. The filtering step S03 and the inverse conversion step S04 of the aforementioned spectral detection method are followed by the luminescence correction method. Please refer to FIG. 9A.

校正關係取得步驟P01:取得每一個該發光二極體的該發光強度或相對強度與該接面溫度的數學關係式或對應表或圖,通常由該發光二極體的製造廠商所提供。請參閱第9B圖,為該第四發光二極體的相對強度與該接面溫度的對應圖,該第四發光二極體於該接面溫度為攝氏25度下的該第四發光峰值波長為772nm且相對強度是以100%計算。另外,也取得每一個該發光二極體的順向偏壓(forward voltage)與該接面溫度的數學關係式或對應表或圖,該第四發光二極體於該接面溫度為攝氏25度下的該第四發光峰值波長為772nm且順向偏壓為2伏特。請參閱第9C圖,為該第四發光二極體的順向偏壓與該接面溫度的對應圖。該發光強度或相對強度與該接面溫度的數學關係式或對應表或圖,以及該發光二極體的該順向偏壓與該接面溫度的數學關係式或對應表或圖,兩者的取得方式可以參閱[科學與工程技術期刊 第三卷 第四期 民國九十六年,99~103頁,發光二極體接面溫度的自動量測系統]( Journal of Science and Engineering Technology, Vol. 3, No. 4, pp. 99-103 (2007)),以及中華民國發明專利公開第200818363號所揭露的方式進行,因此不在此贅述。Calibration relationship acquisition step P01: Obtain the mathematical relational formula or corresponding table or graph between the luminous intensity or relative intensity and the junction temperature of each LED, usually provided by the LED manufacturer. Please refer to FIG. 9B, which is the corresponding graph of the relative intensity of the fourth light-emitting diode and the junction temperature, the fourth light-emitting peak wavelength of the fourth light-emitting diode at the junction temperature of 25 degrees Celsius is 772nm and the relative intensity is calculated as 100%. In addition, a mathematical relationship or a corresponding table or graph between the forward voltage and the junction temperature of each light-emitting diode is also obtained. The junction temperature of the fourth light-emitting diode is 25 degrees Celsius. The fourth luminescence peak wavelength at 100°C is 772 nm and the forward bias voltage is 2 volts. Please refer to FIG. 9C , which is a graph corresponding to the forward bias voltage of the fourth light-emitting diode and the junction temperature. The mathematical relationship or corresponding table or graph of the luminous intensity or relative intensity and the junction temperature, and the mathematical relationship or corresponding table or graph of the forward bias voltage of the light emitting diode and the junction temperature, both The way to obtain it can be found in [Journal of Science and Engineering Technology, Vol. . 3, No. 4, pp. 99-103 (2007)), and the method disclosed in the Republic of China Invention Patent Publication No. 200818363, so it is not repeated here.

該量測順向偏壓步驟P02:於開啟(點亮)該發光二極體的時間區間,例如於該明滅頻率中開啟(點亮)該發光二極體的時間區間,同時量測該發光二極體的該順向偏壓。例如於前述實施例二及三之中,該第四發光二極體的該明滅頻率約為90.90次/秒、該明滅頻率中開啟(點亮)該發光二極體的時間區間為1毫秒(1ms)、該明滅頻率中關閉(熄滅)該發光二極體的時間區間為10毫秒(10ms),於該明滅頻率中開啟(點亮) 該第四發光二極體的時間區間,同時量測該第四發光二極體的該順向偏壓為1.9伏特。The step of measuring the forward bias voltage P02: during the time interval of turning on (lighting up) the light-emitting diode, for example, in the time interval of turning on (lighting up) the light-emitting diode in the flickering frequency, measure the luminescence at the same time The forward bias of the diode. For example, in the aforementioned embodiments two and three, the flickering frequency of the fourth light-emitting diode is about 90.90 times per second, and the time interval for turning on (lighting) the light-emitting diode in the flickering frequency is 1 millisecond ( 1ms), the time interval for turning off (extinguishing) the light-emitting diode in the flickering frequency is 10 milliseconds (10ms), and the time interval for turning on (lighting) the fourth light-emitting diode in the flickering frequency, and simultaneously measure The forward bias voltage of the fourth LED is 1.9V.

該比例關係取得步驟P03:將所量測到的該順向偏壓對照前述的該發光二極體的順向偏壓與該接面溫度的數學關係式或對應表或圖,換算得到該接面溫度。例如,將量測到的該第四發光二極體的該順向偏壓為1.9伏特,對照第9C圖而得出該接面溫度為攝氏50度。接著,將換算得到的該接面溫度對照前述的該發光強度或相對強度與該接面溫度的數學關係式或對應表或圖,換算得到該發光強度或相對強度。例如,將對照得出的該接面溫度為攝氏50度,對照第9B圖而得出該第四發光二極體的相對強度為83%。再接續地,將換算得到該發光強度或相對強度,與該發光強度或相對強度與該接面溫度的數學關係式或對應表或圖中的一特定接面溫度下的發光強度或相對強度相比較得出一比例關係。例如,該特定接面溫度為攝氏25度,攝氏25度的該第四發光二極體的相對強度是100%,將該接面溫度為攝氏25度的相對強度是100%除以攝氏50度時的相對強度83%,得出該比例關係為1.20倍。The proportional relationship obtaining step P03: compare the measured forward bias voltage with the mathematical relational expression or corresponding table or figure between the forward bias voltage of the light-emitting diode and the junction temperature, and convert the measured forward bias voltage to obtain the junction temperature. surface temperature. For example, the measured forward bias voltage of the fourth light-emitting diode is 1.9 volts, and the junction temperature is 50 degrees Celsius according to FIG. 9C . Next, the converted junction temperature is compared with the aforementioned mathematical relationship formula or corresponding table or figure between the luminous intensity or relative intensity and the junction temperature to obtain the luminous intensity or relative intensity through conversion. For example, the junction temperature obtained by comparison is 50 degrees Celsius, and the relative intensity of the fourth light-emitting diode is 83% by comparison with FIG. 9B . Next, the converted luminous intensity or relative intensity is compared with the mathematical relationship between the luminous intensity or relative intensity and the junction temperature or the correspondence table or the luminous intensity or relative intensity at a specific junction temperature in the figure A proportional relationship is obtained by comparison. For example, the specific junction temperature is 25 degrees Celsius, the relative intensity of the fourth light-emitting diode at 25 degrees Celsius is 100%, and the relative intensity of the junction temperature of 25 degrees Celsius is 100% divided by 50 degrees Celsius When the relative intensity is 83%, the proportional relationship is 1.20 times.

該完成校正步驟P04:將前述該初始光譜能量分佈曲線中該發光二極體所對應的該波長範圍的該發光強度乘以該比例關係,以達到該發光強度的校正;或者,將所測得有關於該發光二極體所對應的該波長範圍的光譜訊號乘以該比例關係,以達到光譜訊號的校正。所述該波長範圍的光譜訊號可以為前述的該待測物光譜訊號及該背景雜訊構成該待測物時域訊號。例如,該光偵測器或該計算器將該第四發光二極體所對應的該第四發光強度17.7x10 7(a.u.)乘以該比例關係為1.20倍,所得出的發光強度可以視為該第四發光二極體在該特定接面溫度(攝氏25度)的發光強度。 The complete correction step P04: multiply the luminous intensity of the wavelength range corresponding to the light-emitting diode in the initial spectral energy distribution curve by the proportional relationship to achieve the correction of the luminous intensity; or, the measured The spectral signal related to the wavelength range corresponding to the light-emitting diode is multiplied by the proportional relationship to achieve correction of the spectral signal. The spectral signal in the wavelength range may be the aforesaid spectral signal of the analyte and the background noise to form the time-domain signal of the analyte. For example, the light detector or the calculator multiplies the fourth luminous intensity 17.7×10 7 (au) corresponding to the fourth light-emitting diode by the proportional relationship to be 1.20 times, and the obtained luminous intensity can be regarded as The luminous intensity of the fourth light-emitting diode at the specific junction temperature (25 degrees Celsius).

特別說明的是,本發明係將該光源的複數個該發光二極體的至少其中之一該發光二極體、部分的該發光二極體或全部的該發光二極體,依序或同時執行該發光修正方法。較佳地,本發明係將全部的該發光二極體同時執行該發光修正方法,如此得出的光譜能量分佈曲線可以視為在該特定接面溫度(攝氏25度)的光譜能量分佈曲線,以及得出的光譜訊號可以視為在該特定接面溫度(攝氏25度)的光譜訊號。In particular, the present invention refers to at least one of the light-emitting diodes, some of the light-emitting diodes, or all of the light-emitting diodes in the light source, sequentially or simultaneously The luminescence correction method is executed. Preferably, in the present invention, all the light-emitting diodes execute the luminescence correction method at the same time, and the spectral energy distribution curve obtained in this way can be regarded as the spectral energy distribution curve at the specific junction temperature (25 degrees Celsius), And the obtained spectral signal can be regarded as the spectral signal at the specific junction temperature (25 degrees Celsius).

請參閱第10圖,其表示本發明的光學分析系統的一實施例。本實施例的光學分析系統除了包括第2圖所示的光學分析儀100之外,還包括一液體輸送件200,一流體待測物O於液體輸送件200內輸送,均勻混和或分光元件20與第二光學接收器40設置於液體輸送件200的兩側,第二光線L2穿過液體輸送件200並形成該檢測光線L3而由第二光學接收器40接收。雖然第10圖所示的光學分析系統除了包括第2圖所示的光學分析儀100,但本發明不限於此,第4圖所示的光學分析儀也適用於本發明的光學分析系統。Please refer to FIG. 10, which shows an embodiment of the optical analysis system of the present invention. In addition to the optical analyzer 100 shown in FIG. 2, the optical analysis system of the present embodiment also includes a liquid delivery member 200, a fluid to be tested O is transported in the liquid delivery member 200, and a uniform mixing or spectroscopic element 20 The second optical receiver 40 is disposed on both sides of the liquid conveying element 200 , the second light L2 passes through the liquid conveying element 200 and forms the detection light L3 to be received by the second optical receiver 40 . Although the optical analysis system shown in FIG. 10 includes the optical analyzer 100 shown in FIG. 2 , the present invention is not limited thereto, and the optical analyzer shown in FIG. 4 is also applicable to the optical analysis system of the present invention.

請參閱第11圖,其表示本發明的光學分析儀的一實施例的系統方塊圖。本實施例的光學分析儀除了包括前述的固態光源發射器10、均勻混和或分光元件20、第一光學接收器30以及第二光學接收器40以外,本實施例的光學分析儀還包括第一處理器50、第一顯示裝置60及第一無線通訊模組70。固態光源發射器10、第一光學接收器30以及第二光學接收器40連接於第一處理器50,第一處理器50控制固態光源發射器10依序發出該等光線,第一光學接收器30以及第二光學接收器40接收的光強度訊號顯示於第一顯示裝置60,即第一顯示裝置60顯示第二光線L2通過待測物後產生檢測光線L3的吸收光譜。第一無線通訊模組70連接於第一處理器50,第一光學接收器30以及第二光學接收器40接收的光強度訊號可經由第一無線通訊模組70傳送至外部的電子裝置,或接收來自外部的電子裝置的控制訊號。Please refer to FIG. 11, which shows a system block diagram of an embodiment of the optical analyzer of the present invention. In addition to the aforementioned solid-state light source transmitter 10, uniform mixing or light splitting element 20, first optical receiver 30, and second optical receiver 40, the optical analyzer of this embodiment also includes a first optical analyzer. The processor 50 , the first display device 60 and the first wireless communication module 70 . The solid-state light source transmitter 10, the first optical receiver 30 and the second optical receiver 40 are connected to the first processor 50, and the first processor 50 controls the solid-state light source transmitter 10 to emit the light in sequence, and the first optical receiver 30 and the light intensity signals received by the second optical receiver 40 are displayed on the first display device 60 , that is, the first display device 60 displays the absorption spectrum of the detection light L3 generated after the second light L2 passes through the object to be tested. The first wireless communication module 70 is connected to the first processor 50, and the light intensity signals received by the first optical receiver 30 and the second optical receiver 40 can be transmitted to an external electronic device through the first wireless communication module 70, or Receive a control signal from an external electronic device.

請參閱第12圖,其表示本發明的光學分析儀訊號連接的電子裝置的系統方塊圖。外部的電子裝置可以是例如行動裝置或計算機裝置等。外部的電子裝置E包括一第二處理器110、一第二設定單元120、一第二顯示裝置130及一第二無線通訊模組140。第二設定單元120、第二顯示裝置130及第二無線通訊模組140均連接於第二處理器110。第二無線通訊模組140與第一無線通訊模組70形成訊號連接,第一光學接收器30以及第二光學接收器40接收的光強度訊號可經由第一無線通訊模組70及第二無線通訊模組140傳送至外部的電子裝置E,經由第二處理器110傳送至第二顯示裝置130而顯示於第二顯示裝置130。第二設定單元120輸入的設定數值或指令(控制訊號)也經由第二處理器110並由第二無線通訊模組140傳送至第一無線通訊模組70,然後傳送至第一處理器50,而控制固態光源發射器10。Please refer to FIG. 12, which shows a system block diagram of the electronic device for signal connection of the optical analyzer of the present invention. The external electronic device may be, for example, a mobile device or a computer device. The external electronic device E includes a second processor 110 , a second setting unit 120 , a second display device 130 and a second wireless communication module 140 . The second setting unit 120 , the second display device 130 and the second wireless communication module 140 are all connected to the second processor 110 . The second wireless communication module 140 forms a signal connection with the first wireless communication module 70, and the light intensity signals received by the first optical receiver 30 and the second optical receiver 40 can pass through the first wireless communication module 70 and the second wireless communication module 70. The communication module 140 transmits to the external electronic device E, transmits to the second display device 130 through the second processor 110 and displays on the second display device 130 . The setting value or instruction (control signal) input by the second setting unit 120 is also sent to the first wireless communication module 70 by the second wireless communication module 140 through the second processor 110, and then sent to the first processor 50, Instead, the solid state light source emitter 10 is controlled.

綜上所述,本發明與現有技術與產品相較之下,本發明具有以下優點之一:In summary, compared with the prior art and products, the present invention has one of the following advantages:

本發明目的之一藉由光源具有多個發出不同波長範圍的光線的發光元件而且逐一發光,不需要設置先前技術的單色器,可以大幅降低光學分析儀的體積。而且本發明的光學分析儀設有第一光學接收器以及第二光學接收器,可以偵測得知發光元件光強度衰減的狀態。One of the objectives of the present invention is that the light source has a plurality of light-emitting elements that emit light in different wavelength ranges and emit light one by one, without the need for a monochromator in the prior art, so that the volume of the optical analyzer can be greatly reduced. Moreover, the optical analyzer of the present invention is provided with a first optical receiver and a second optical receiver, which can detect the attenuation state of the light intensity of the light emitting element.

本發明目的之一透過該均勻混和或分光元件為光學積分球之技術特徵,由於光學積分球的體積較小,可用以解決過去使用切光器所造成的體積大而攜帶不便的問題,再者,光學積分球能使光線均勻混和後由特定的第一光出口與第二光出口出射,而進一步地解決過去使用分光器時,可能因分光器角度產生改變所造成光強度的影響。One of the objectives of the present invention is through the technical characteristics of the uniform mixing or light splitting element as an optical integrating sphere. Due to the small size of the optical integrating sphere, it can be used to solve the problem of large volume and inconvenient portability caused by the use of optical choppers in the past. , the optical integrating sphere can make the light evenly mixed and exit from the specific first light outlet and second light outlet, and further solve the influence of light intensity caused by the change of the angle of the beam splitter when using the beam splitter in the past.

本發明目的之一透過該均勻混和或分光元件為分光板之技術特徵,由於分光板所具有的通孔與其配置關係,除了能解決過去使用切光器所造成的體積大而攜帶不便的問題外,也可以透過通孔使部分光線通過,而進一步地解決過去使用分光器時,可能因分光器角度產生改變所造成光強度的影響。One of the objectives of the present invention is that the uniform mixing or light splitting element is the technical feature of the light splitter. Because the through holes of the light splitter and their configuration relationship can solve the problem of large volume and inconvenient portability caused by the use of light cutters in the past , part of the light can also pass through the through hole, so as to further solve the influence of the light intensity that may be caused by the change of the angle of the beam splitter when using the beam splitter in the past.

本發明目的之一可透過接收第一光線的第一光學接收器與接收通過流體待測物的檢測光線的第二光學接收器,以即時地監控或動態連續紀錄目前的流體待測物的穿透率與其組成分比例及濃度是否符合正常工作時所需的品質,或者進一步推算使用壽命,而預先做好更換或調整流體待測物的準備作業。One of the objectives of the present invention is to monitor or dynamically continuously record the current penetration of the fluid to be tested through the first optical receiver that receives the first light and the second optical receiver that receives the detection light that passes through the fluid to be tested. Whether the transmittance and its composition ratio and concentration meet the quality required for normal work, or further calculate the service life, and make preparations for replacing or adjusting the fluid to be tested in advance.

本發明目的之一可透過接收第一光線的第一光學接收器即時監控固態光源發射器之光源的光強度是否衰減,與光強度訊號衰減的變化量,而進一步調整或更換固態光源發射器之光源。One of the objectives of the present invention is to monitor in real time whether the light intensity of the light source of the solid-state light source transmitter is attenuated through the first optical receiver receiving the first light, and the change amount of light intensity signal attenuation, and further adjust or replace the solid-state light source transmitter. light source.

惟以上所述者,僅為本發明之較佳實施例而已,當不能以此限定本發明實施之範圍,即大凡依本發明申請專利範圍及新型說明內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。另外,本發明的任一實施例或申請專利範圍不須達成本發明所揭露之全部目的或優點或特點。此外,摘要部分和標題僅是用來輔助專利文件搜尋之用,並非用來限制本發明之權利範圍。此外,本說明書或申請專利範圍中提及的「第一」、「第二」等用語僅用以命名元件(element)的名稱或區別不同實施例或範圍,而並非用來限制元件數量上的上限或下限。But what is described above is only a preferred embodiment of the present invention, and should not limit the scope of implementation of the present invention with this, that is, all simple equivalent changes and modifications made according to the patent scope of the present invention and the new description content, All still belong to the scope covered by the patent of the present invention. In addition, any embodiment or scope of claims of the present invention does not necessarily achieve all the objectives or advantages or features disclosed in the present invention. In addition, the abstract and the title are only used to assist the search of patent documents, and are not used to limit the scope of rights of the present invention. In addition, terms such as "first" and "second" mentioned in this specification or the scope of the patent application are only used to name elements (elements) or to distinguish different embodiments or ranges, and are not used to limit the number of elements. upper or lower limit.

1:光源 R1:分光器 R2:切光器 3:吸收池 4:第一檢測器 5:第二檢測器 P1:檢測光路徑 P2:對比光路徑 6:容置殼體 10:固態光源發射器 11:基板 12:溫度感測器 13:發光元件 20、20’:均勻混和或分光元件 21:光入口 22:第一光出口 23:第二光出口 24:通孔 30:第一光學接收器 40:第二光學接收器 50:第一處理器 60:第一顯示裝置 61:開口 70:第一無線通訊模組 100:光學分析儀 110:第二處理器 111:接面 120:第二設定單元 130:第二顯示裝置 140:第二無線通訊模組 200:液體輸送件 L1:第一光線 L2:第二光線 L3:檢測光線 O:流體待測物 E:電子裝置1: light source R1: Optical splitter R2: light cutter 3: Absorption pool 4: First detector 5: Second detector P1: Detection light path P2: Contrasting light paths 6:Accommodating the shell 10: Solid state light source transmitter 11: Substrate 12: Temperature sensor 13:Light-emitting element 20, 20': Uniform mixing or light splitting elements 21: Light entrance 22: The first light exit 23: Second light exit 24: Through hole 30: First optical receiver 40: Second optical receiver 50: First Processor 60: The first display device 61: opening 70:The first wireless communication module 100: Optical analyzer 110: second processor 111: interface 120: the second setting unit 130: Second display device 140: Second wireless communication module 200: liquid conveying parts L1: first ray L2: second ray L3: Detect light O: fluid analyte E: electronic device

第1圖為先前技術的光學分析儀的示意圖。 第2圖為本發明的光學分析儀的一實施例的示意圖。 第3圖為第2圖的光學分析儀的剖視圖。 第4圖為本發明的光學分析儀的另一實施例的示意圖。 第5圖為本發明的光學分析儀的固態光源發射器的第一實施例的發光二極體的放射光譜圖。 第6圖為本發明的光學分析儀的固態光源發射器的第二實施例的發光二極體的放射光譜圖。 第7圖為本發明的光學分析儀的固態光源發射器的第三實施例的發光二極體的放射光譜圖。 第8圖為本發明的光學分析儀的固態光源發射器的一實施例的示意圖。 第9A圖為藉由量測溫度校正發光元件的發光強度校正的方法的流程圖。 第9B圖是本發明第四發光二極體的相對強度與接面溫度的對應圖。 第9C圖是本發明第四發光二極體的順向偏壓與接面溫度的對應圖。 第10圖為本發明的光學分析系統的一實施例的示意圖。 第11圖為本發明的光學分析儀的一實施例的系統方塊圖。 第12圖為與本發明的光學分析儀訊號連接的電子裝置的系統方塊圖。 Figure 1 is a schematic diagram of a prior art optical analyzer. Fig. 2 is a schematic diagram of an embodiment of the optical analyzer of the present invention. Fig. 3 is a cross-sectional view of the optical analyzer of Fig. 2 . Fig. 4 is a schematic diagram of another embodiment of the optical analyzer of the present invention. Fig. 5 is an emission spectrum diagram of the light-emitting diode of the first embodiment of the solid-state light source emitter of the optical analyzer of the present invention. Fig. 6 is an emission spectrum diagram of the light-emitting diode of the second embodiment of the solid-state light source emitter of the optical analyzer of the present invention. Fig. 7 is an emission spectrum diagram of the light-emitting diode of the third embodiment of the solid-state light source emitter of the optical analyzer of the present invention. FIG. 8 is a schematic diagram of an embodiment of a solid-state light source emitter of the optical analyzer of the present invention. FIG. 9A is a flow chart of a method for calibrating the luminous intensity of a light emitting device by measuring temperature. FIG. 9B is a corresponding graph of relative intensity and junction temperature of the fourth light-emitting diode of the present invention. FIG. 9C is a corresponding graph of forward bias voltage and junction temperature of the fourth light-emitting diode of the present invention. Fig. 10 is a schematic diagram of an embodiment of the optical analysis system of the present invention. Fig. 11 is a system block diagram of an embodiment of the optical analyzer of the present invention. FIG. 12 is a system block diagram of an electronic device connected to the signal of the optical analyzer of the present invention.

10:固態光源發射器 10: Solid state light source transmitter

20:均勻混和或分光元件 20: Uniform mixing or splitting components

21:分光器 21: Optical splitter

22:切光器 22: Cutter

23:第二光出口 23: Second light exit

30:第一光學接收器 30: First optical receiver

40:第二光學接收器 40: Second optical receiver

L1:第一光線 L1: first ray

L2:第二光線 L2: second ray

L3:檢測光線 L3: Detect light

100:光學分析儀 100: Optical analyzer

O:流體待測物 O: fluid analytes

Claims (21)

一種光學分析儀,其包括: 一固態光源發射器(10),其包括一光源,該光源包括複數個各放射具有至少一發光峰值波長及至少一波長範圍之光的發光元件(13),該等發光元件(13)為發光二極體、垂直共振腔面射型雷射或雷射二極體,且複數個該發光元件(13)能夠分別呈現一明滅頻率的非連續發光,複數個該明滅頻率可以是彼此相同或彼此不同,或者複數個該明滅頻率可以是部分相同或部分不同; 一均勻混和或分光元件(20、20’),該等發光元件(13)發出的光線通過該均勻混和或分光元件(20、20’)後形成一第一光線(L1)以及一第二光線(L2),該第二光線(L2)係通過一流體待測物(O)後未被該流體待測物(O)吸收而得到一檢測光線(L3); 一第一光學接收器(30),接收該第一光線(L1);以及 一第二光學接收器(40),接收該檢測光線(L3); 其中,複數個該發光峰值波長之中的至少一部份的該發光峰值波長所對應的波長半高寬為大於0nm且小於或等於60nm。 An optical analyzer comprising: A solid-state light source transmitter (10), which includes a light source, the light source includes a plurality of light-emitting elements (13) each emitting light having at least one light-emitting peak wavelength and at least one wavelength range, and the light-emitting elements (13) are light-emitting Diodes, vertical resonant cavity surface-emitting lasers or laser diodes, and a plurality of the light-emitting elements (13) can respectively present a discontinuous luminescence of a flickering frequency, and the plurality of flickering frequencies can be the same as each other or each other different, or a plurality of the flickering frequencies may be partly the same or partly different; A uniform mixing or light splitting element (20, 20'), the light emitted by the light emitting elements (13) passes through the uniform mixing or light splitting element (20, 20') to form a first light (L1) and a second light (L2), the second light (L2) passes through a fluid analyte (O) and is not absorbed by the fluid analyte (O) to obtain a detection light (L3); a first optical receiver (30), receiving the first light (L1); and a second optical receiver (40), receiving the detection light (L3); Wherein, at least a part of the plurality of peak luminescence wavelengths has a wavelength half maximum width corresponding to the luminescence peak wavelengths greater than 0 nm and less than or equal to 60 nm. 如請求項1所述之光學分析儀,其中,當該第一光線(L1)具有一標準光強度時,該第二光線(L2)之光強度與該標準光強度相等,該檢測光線(L3)與該標準光強度之比值為該流體待測物(O)之一標準穿透率,而當該第一光線(L1)具有一工作光強度時,該第二光線(L2)之光強度與該工作光強度相等,該檢測光線(L3)與該工作光強度之比值為該流體待測物(O)之一工作穿透率,該標準光強度與該工作光強度不相同,比較該標準穿透率與該工作穿透率是否相同,並根據比較的結果判斷該流體待測物(O)的組成分變化。The optical analyzer as described in Claim 1, wherein, when the first light (L1) has a standard light intensity, the light intensity of the second light (L2) is equal to the standard light intensity, and the detection light (L3 ) to the standard light intensity ratio is the standard transmittance of the fluid analyte (O), and when the first light (L1) has a working light intensity, the light intensity of the second light (L2) Equal to the working light intensity, the ratio of the detection light (L3) to the working light intensity is one of the working transmittances of the fluid object to be tested (O), the standard light intensity is different from the working light intensity, compare the Whether the standard penetration rate is the same as the working penetration rate, and judge the composition change of the fluid analyte (O) according to the comparison result. 如請求項1所述之光學分析儀,其中,當該第一光線(L1)具有一標準光強度時,該第一光學接收器(30)接收該第一光線(L1)並產生一標準光強度訊號,而當該第一光線(L1)具有一衰減光強度時,該第一光學接收器(30)接收該第一光線(L1)並產生一衰減光強度訊號,比較該標準光強度訊號與該衰減光強度訊號間的一變化量,該均勻混和或分光元件(20、20’)根據該變化量調整該第一光線(L1)的光強度。The optical analyzer according to claim 1, wherein, when the first light (L1) has a standard light intensity, the first optical receiver (30) receives the first light (L1) and generates a standard light Intensity signal, and when the first light (L1) has an attenuated light intensity, the first optical receiver (30) receives the first light (L1) and generates an attenuated light intensity signal for comparison with the standard light intensity signal According to a change amount between the attenuated light intensity signal, the uniform mixing or light splitting element (20, 20') adjusts the light intensity of the first light (L1) according to the change amount. 如請求項1所述之光學分析儀,其中該均勻混和或分光元件(20)為一光學積分球,該光學積分球包括一光入口(21)、一第一光出口(22)以及一第二光出口(23),該第一光學接收器(30)對準該第一光出口(22),該第二光學接收器(40)對準該第二光出口(23),該等發光元件(13)發出的該等光線由該光入口(21)進入該光學積分球,該第一光線(L1)從該第一光出口(22)出射,該第二光線(L2)從該第二光出口(23)出射。The optical analyzer as claimed in item 1, wherein the uniform mixing or light splitting element (20) is an optical integrating sphere, and the optical integrating sphere includes a light entrance (21), a first light exit (22) and a first Two light outlets (23), the first optical receiver (30) is aligned with the first light outlet (22), the second optical receiver (40) is aligned with the second light outlet (23), and the light emitting The light emitted by the element (13) enters the optical integrating sphere through the light entrance (21), the first light (L1) exits from the first light exit (22), and the second light (L2) exits from the second light Two light outlets (23) exit. 如請求項4所述之光學分析儀,其中該第一光出口(22)與該光入口(21)相對於該光學積分球的球心相隔90度的圓心角,該第二光出口(23)與該光入口(21)相對於該光學積分球的球心相隔90度的圓心角,且該第一光出口(22)與該第二光出口(23)相對於該光學積分球的球心相隔90度的圓心角。The optical analyzer as described in claim 4, wherein the first light exit (22) and the light entrance (21) are separated by a central angle of 90 degrees relative to the center of the optical integrating sphere, and the second light exit (23 ) and the light entrance (21) are separated by a central angle of 90 degrees relative to the center of the optical integrating sphere, and the first light exit (22) and the second light exit (23) are relative to the sphere of the optical integrating sphere The centers are separated by a central angle of 90 degrees. 如請求項1所述之光學分析儀,其中該均勻混和或分光元件(20’)為一分光板,該分光板具有一通孔(24),該第一光學接收器(30)設置於該分光板且與該等發光元件(13)相向設置,該等發光元件(13)發出的該等光線的部分成為該第一光線(L1)並由該第一光學接收器(30)接收,該等發光元件(13)發出的該等光線的另一部分通過該通孔(24)而成為該第二光線(L2)。The optical analyzer as described in claim 1, wherein the uniform mixing or light splitting element (20') is a light splitter plate, the light splitter plate has a through hole (24), and the first optical receiver (30) is arranged on the light splitter board and set opposite to the light-emitting elements (13), part of the light emitted by the light-emitting elements (13) becomes the first light (L1) and is received by the first optical receiver (30), the Another part of the light emitted by the light emitting element (13) passes through the through hole (24) to become the second light (L2). 如請求項1所述之光學分析儀,其中相鄰的二個該發光峰值波長所對應的二個該發光元件(13)之該等波長範圍部份重疊以形成較該等發光元件(13)中之各者之該波長範圍寬之一連續波長範圍,或者相鄰的二個該發光峰值波長所對應的二個該發光元件(13)之該等波長範圍不重疊。The optical analyzer as described in claim 1, wherein the wavelength ranges of the two light-emitting elements (13) corresponding to the adjacent two light-emitting peak wavelengths partially overlap to form a shorter range than the light-emitting elements (13) The wavelength range of each of them is a wide continuous wavelength range, or the wavelength ranges of the two light-emitting elements (13) corresponding to two adjacent luminous peak wavelengths do not overlap. 如請求項1所述之光學分析儀,其中複數個該發光元件(13)係依序發光,前述依序發光係指於不同位置的複數個該發光元件(13)放射相同該波長範圍之光的複數個該發光元件(13)係不同時發光;或者,複數個該發光元件(13)係部分同時發光,前述部分同時發光指的是將複數個該發光元件(13),使其中一部分同時發光而同時放射不同該波長範圍之光。The optical analyzer as described in Claim 1, wherein a plurality of the light-emitting elements (13) emit light in sequence, and the aforementioned sequential light-emitting means that a plurality of the light-emitting elements (13) at different positions emit light of the same wavelength range The plurality of light-emitting elements (13) do not emit light at the same time; or, the plurality of light-emitting elements (13) partly emit light at the same time. It emits light while emitting light in different wavelength ranges. 如請求項1所述之光學分析儀,其中該固態光源發射器(10)更包括一基板(11),量測該等發光元件(13)工作時的一定電流偏壓值,並藉由該等發光元件(13)的該定電流偏壓值與一該固態光源發射器(10)之PN接面溫度的數學關係式或對應表或圖換算得到該固態光源發射器(10)之該PN接面溫度,而後再藉由該等發光元件(13)的光強度與該PN接面溫度的數學關係式或對應表或圖,得到該等發光元件(13)的發光強度比例,並根據一判斷結果修正該第一光學接收器(30)所量測該等發光元件(13)發出的光強度數值。The optical analyzer as described in claim 1, wherein the solid-state light source transmitter (10) further includes a substrate (11), which measures a certain current bias value of the light-emitting elements (13) when they are working, and through the The PN of the solid-state light source emitter (10) is obtained by converting the constant current bias value of the light-emitting element (13) and the PN junction temperature of the solid-state light source emitter (10) or a corresponding table or figure conversion Junction temperature, and then by the mathematical relationship between the light intensity of the light-emitting elements (13) and the PN junction temperature or the corresponding table or figure, the luminous intensity ratio of the light-emitting elements (13) is obtained, and according to a The judgment result corrects the value of the light intensity emitted by the light emitting elements (13) measured by the first optical receiver (30). 如請求項1所述之光學分析儀,其更包括一第一處理器(50)以及一第一顯示裝置(60),該固態光源發射器(10)、該第一光學接收器(30)以及該第二光學接收器(40)連接於該第一處理器(50),該第一處理器(50)控制該固態光源發射器(10)依序發出該等光線,該第一光學接收器(30)以及該第二光學接收器(40)接收的光強度訊號顯示於該第一顯示裝置(60)。The optical analyzer according to claim 1, further comprising a first processor (50) and a first display device (60), the solid-state light source transmitter (10), the first optical receiver (30) And the second optical receiver (40) is connected to the first processor (50), the first processor (50) controls the solid-state light source transmitter (10) to emit the light in sequence, the first optical receiver The light intensity signal received by the device (30) and the second optical receiver (40) is displayed on the first display device (60). 如請求項10所述之光學分析儀,其更包括一第一無線通訊模組(70),其連接於該第一處理器(50),該第一光學接收器(30)以及該第二光學接收器(40)接收的光強度訊號可經由該第一無線通訊模組(70)傳送至外部的電子裝置,或接收來自外部的電子裝置的控制訊號。The optical analyzer as described in claim 10, further comprising a first wireless communication module (70), which is connected to the first processor (50), the first optical receiver (30) and the second The light intensity signal received by the optical receiver (40) can be transmitted to an external electronic device through the first wireless communication module (70), or receive a control signal from the external electronic device. 如請求項1所述之光學分析儀,其中,該明滅頻率是介於0.05次/秒至50000次/秒之間。The optical analyzer according to claim 1, wherein the flickering frequency is between 0.05 times/second and 50000 times/second. 如請求項12所述之光學分析儀,其中,該明滅頻率中開啟該發光元件(13)的時間區間為介於0.00001秒至10秒之間。The optical analyzer according to claim 12, wherein the time interval for turning on the light-emitting element (13) in the flickering frequency is between 0.00001 second and 10 seconds. 如請求項13所述之光學分析儀,其中,該明滅頻率中關閉該發光元件(13)的時間區間為介於0.00001秒至10秒之間。The optical analyzer according to claim 13, wherein the time interval for turning off the light-emitting element (13) in the flickering frequency is between 0.00001 second and 10 seconds. 如請求項1所述之光學分析儀,其中,相鄰的二個該發光峰值波長彼此相差為介於1nm至80nm之間。The optical analyzer according to claim 1, wherein the difference between two adjacent luminous peak wavelengths is between 1 nm and 80 nm. 如請求項15所述之光學分析儀,其中,相鄰的二個該發光峰值波長彼此相差為介於5nm至80nm之間。The optical analyzer according to claim 15, wherein the difference between two adjacent luminescence peak wavelengths is between 5nm and 80nm. 如請求項16所述之光學分析儀,其中,各該發光峰值波長所對應的波長半高寬為介於15nm至50nm之間。The optical analyzer according to claim 16, wherein the wavelength half maximum width corresponding to each of the emission peak wavelengths is between 15nm and 50nm. 如請求項17所述之光學分析儀,其中,各該發光峰值波長所對應的波長半高寬為介於15nm至40nm之間。The optical analyzer according to claim 17, wherein the wavelength half maximum width corresponding to each of the emission peak wavelengths is between 15nm and 40nm. 如請求項1所述之光學分析儀,其中,相鄰的二個該發光峰值波長彼此相差為大於或等於0.5nm。The optical analyzer according to Claim 1, wherein the difference between two adjacent luminous peak wavelengths is greater than or equal to 0.5 nm. 如請求項19所述之光學分析儀,其中,相鄰的二個該發光峰值波長彼此相差為介於1nm至80nm之間。The optical analyzer according to claim 19, wherein the difference between two adjacent luminescence peak wavelengths is between 1 nm and 80 nm. 一種光學分析系統,其包括: 一如請求項1至20中任一項所述之光學分析儀(100);以及 一液體輸送件(200),該流體待測物(O)於該液體輸送件(200)內輸送,該均勻混和或分光元件(20、20’)與該第二光學接收器(40)設置於該液體輸送件(200)的兩側,該第二光線(L2)穿過該液體輸送件(200)並形成該檢測光線(L3)而由該第二光學接收器(40)接收。 An optical analysis system comprising: An optical analyzer (100) according to any one of claims 1 to 20; and A liquid conveying element (200), the fluid analyte (O) is transported in the liquid conveying element (200), the uniform mixing or light splitting element (20, 20') is arranged with the second optical receiver (40) On both sides of the liquid conveying element (200), the second light (L2) passes through the liquid conveying element (200) and forms the detection light (L3) to be received by the second optical receiver (40).
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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004361149A (en) * 2003-06-02 2004-12-24 Tdk Corp Water content measuring instrument
CN207882158U (en) * 2018-02-10 2018-09-18 肖健 Urine intelligent analysis system
CN111727354A (en) * 2018-02-08 2020-09-29 横河电机株式会社 Measuring device and measuring method

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004361149A (en) * 2003-06-02 2004-12-24 Tdk Corp Water content measuring instrument
CN111727354A (en) * 2018-02-08 2020-09-29 横河电机株式会社 Measuring device and measuring method
CN207882158U (en) * 2018-02-10 2018-09-18 肖健 Urine intelligent analysis system

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