TWI784539B - Burn-in equipment - Google Patents
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Abstract
一種燒機設備,包含一機櫃、複數連接裝置與一燒機測試系統,該機櫃包含一櫃體以及複數載板,該複數載板間隔設置於該櫃體的容置空間中,該複數連接裝置裝設於該機櫃中,各該連接裝置包含一電路基板與至少一轉接座,該電路基板具有複數負載區域,該複數負載區域的位置彼此分離,該電路基板於各該負載區域設有複數接點,該至少一轉接座可拆組的設置在該電路基板並電連接該複數接點,各該轉接座具有至少一待測元件連接器,該機櫃的各該載板設有該複數連接裝置中的至少一連接裝置,該燒機測試系統裝設於該機櫃中並電連接該複數連接裝置。A burn-in equipment, comprising a cabinet, a plurality of connection devices and a burn-in test system, the cabinet includes a cabinet body and a plurality of carrier boards, the plurality of carrier boards are arranged at intervals in the accommodation space of the cabinet body, the plurality of connection devices Installed in the cabinet, each connecting device includes a circuit substrate and at least one adapter seat, the circuit substrate has a plurality of load areas, the positions of the plurality of load areas are separated from each other, and the circuit substrate is provided with a plurality of Contacts, the at least one transfer base is detachably arranged on the circuit board and electrically connected to the plurality of contacts, each of the transfer bases has at least one DUT connector, and each of the carrier boards of the cabinet is provided with the At least one connection device in the plurality of connection devices, the burn-in test system is installed in the cabinet and electrically connected to the plurality of connection devices.
Description
本發明係關於一種燒機設備,尤指一種用於電子元件執行燒機程序使用之燒機測試設備。 The invention relates to a burn-in device, in particular to a burn-in testing device used for executing a burn-in program for electronic components.
現有電子元件於出廠前,為了確保電子元件之功能正確與可靠度,須進行燒機程序(burn in),藉由燒機程序模擬電子元件的負載狀態進行測試。 Before the existing electronic components leave the factory, in order to ensure the correct function and reliability of the electronic components, a burn-in procedure (burn in) must be carried out, and the load state of the electronic components is simulated by the burn-in program for testing.
請參考圖9,習知燒機手段是將待測的電子元件(後稱待測元件60)分別連接一電源供應器50、一負載裝置51與一量測裝置52,由一控制裝置53調控該電源供應器50輸出至該待測元件60的測試電源的大小,該負載裝置51可為電子負載(electronic load)或客製水泥電阻,該量測裝置52可電連接該待測元件60的輸出端以量測其輸出電壓及/或電流,該控制裝置53從該量測裝置52接收其量測資料,該控制裝置52可將所述量測資料儲存在儲存裝置(例如硬碟),並可透過顯示器呈現量測資料給使用者檢視。
Please refer to FIG. 9 , the conventional burn-in method is to connect the electronic component to be tested (hereinafter referred to as the component to be tested 60 ) to a
然而,由於待測元件60的型號多元,不同型號的待測元件60所能承受的負載量也彼此不同,由此可見,該負載裝置51的阻抗必須因應待測元件60的型號而隨時調整、替換或客製化製作,導致習知燒機過程難以簡化。
However, due to the multiple types of the
本發明之目的在於提供一種燒機設備,以期改善習知燒機過程難以簡化的缺點。 The object of the present invention is to provide a burn-in device, in order to improve the disadvantage of the conventional burn-in process that is difficult to simplify.
為了達成前述目的,本發明所提出之燒機設備係包含: 一機櫃,其包含一櫃體以及複數載板,該櫃體中具有一容置空間,該複數載板間隔設置於該櫃體的容置空間中;複數連接裝置,裝設於該機櫃中,各該連接裝置包含:一電路基板,具有複數負載區域,該複數負載區域的位置彼此分離,該電路基板於各該負載區域設有複數接點;及至少一轉接座,可拆組的設置在該電路基板並電連接該複數接點,各該轉接座具有至少一待測元件連接器;該機櫃的各該載板設有該複數連接裝置中的至少一連接裝置;以及一燒機測試系統,裝設於該機櫃中並電連接該複數連接裝置。 In order to achieve the aforementioned goals, the burn-in equipment proposed by the present invention includes: A cabinet, which includes a cabinet body and a plurality of carrier boards, the cabinet body has an accommodating space, and the plurality of carrier boards are arranged at intervals in the accommodating space of the cabinet body; a plurality of connection devices are installed in the cabinet body, Each of the connection devices includes: a circuit substrate with a plurality of load areas, the positions of the plurality of load areas are separated from each other, and the circuit substrate is provided with a plurality of contacts in each of the load areas; and at least one adapter seat, which can be disassembled. The plurality of contacts are electrically connected to the circuit board, each of the adapters has at least one DUT connector; each of the carrier boards of the cabinet is provided with at least one of the plurality of connection devices; and a burner The test system is installed in the cabinet and electrically connected to the plurality of connecting devices.
藉由前述燒機設備,針對不同型號的待測元件僅須更換對應的轉接座,而且本發明燒機設備包含設於機櫃中的燒機測試系統以及電路基板為共用型之構造,故針對不同型號的待測元件僅須更換對應的轉接座即可,且轉接座的體積小、重量輕,讓操作人員能夠更簡便而省力地取置轉接座,具有簡化燒機過程的功效。 With the aforementioned burn-in equipment, it is only necessary to replace the corresponding adapter base for different types of components to be tested, and the burn-in equipment of the present invention includes a burn-in test system and a circuit board in the cabinet. Different types of components under test only need to replace the corresponding adapter base, and the adapter base is small in size and light in weight, allowing the operator to pick and place the adapter base more easily and with less effort, which has the effect of simplifying the burn-in process .
此外,本發明燒機設備亦具備高度空間充分利用之特性,本發明燒機設備利用機櫃中之容置空間設置多個間隔排列之載板,並以載板提供通用型的電路基板設置,並提供與待測元件相匹配之轉接座設置,在使用過程中,待測元件能集中分層設置之載板上方,並與電路基板上之轉接座電性連接,使該燒機設備具備高度空間充分利用之特性。 In addition, the burn-in equipment of the present invention also has the characteristics of fully utilizing the height space. The burn-in equipment of the present invention utilizes the accommodation space in the cabinet to arrange a plurality of carrier boards arranged at intervals, and the carrier board provides a general-purpose circuit board arrangement, and Provide an adapter set that matches the component to be tested. During use, the components to be tested can be concentrated on the top of the carrier board that is arranged in layers and electrically connected to the adapter seat on the circuit board, so that the burner equipment has The characteristics of making full use of height space.
10:機櫃 10: cabinet
11:櫃體 11: Cabinet
110:容置空間 110:Accommodating space
12:載板 12: carrier board
13:前側板 13: Front side panel
14:抽屜滑軌 14: Drawer slides
20:連接裝置 20: Connection device
21:電路基板 21: Circuit substrate
210:負載區域 210: load area
211:測試電源接點 211: Test power contacts
212:負載接點 212: Load contact
213:插針座 213: pin seat
22:轉接座 22: adapter seat
220:待測元件連接器 220: DUT connector
221:端子台 221: terminal block
30:待測元件 30: Components under test
31:針腳 31: Pin
41:控制裝置 41: Control device
42:人機介面裝置 42: Human-machine interface device
43:電源供應器 43: Power supply
44:量測裝置 44: Measuring device
45:負載裝置 45:Load device
46:儲存裝置 46: storage device
50:電源供應器 50: Power supply
51:負載裝置 51: Load device
52:量測裝置 52: Measuring device
53:控制裝置 53: Control device
60:待測元件 60: Components under test
圖1:本發明燒機設備的實施例的前視平面示意圖。 Fig. 1: a schematic front plan view of an embodiment of the burn-in equipment of the present invention.
圖2:本發明燒機設備的實施例的局部放大示意圖。 Fig. 2: A partially enlarged schematic diagram of an embodiment of the burn-in equipment of the present invention.
圖3:本發明中,電路基板的俯視平面示意圖。 Fig. 3: In the present invention, a schematic top plan view of a circuit substrate.
圖4:本發明中,燒機測試系統的實施例的方塊示意圖。 Fig. 4: A schematic block diagram of an embodiment of a burn-in test system in the present invention.
圖5:本發明中,電路基板與轉接座的結合結構的俯視平面示意圖(一)。 Fig. 5: In the present invention, a top plan view (1) of the combined structure of the circuit substrate and the adapter seat.
圖6:本發明中,電路基板與轉接座的結合結構的俯視平面示意圖(二)。 Fig. 6: In the present invention, a top plan view (2) of the combined structure of the circuit substrate and the adapter seat.
圖7:本發明中,電路基板與轉接座的結合結構的俯視平面示意圖(三)。 Fig. 7: In the present invention, a top plan view (3) of the combined structure of the circuit substrate and the adapter seat.
圖8:本發明中,電路基板與轉接座的結合結構的俯視平面示意圖(四)。 Fig. 8: In the present invention, a schematic top plan view (4) of the combined structure of the circuit substrate and the adapter seat.
圖9:習知對一待測元件進行燒機測試的方塊示意圖。 FIG. 9 : A schematic block diagram of a conventional burn-in test for a DUT.
本發明燒機設備的實施例包含一機櫃、複數連接裝置與一燒機測試系統,各該連接裝置用以連接待測元件,由該燒機測試系統對所述待測元件實施燒機測試,其中,所述待測元件可為積體電路元件(Integrated Circuit,IC),例如直流/直流電源轉換器或交流/直流電源轉換器的IC產品。 An embodiment of the burn-in device of the present invention includes a cabinet, a plurality of connection devices and a burn-in test system, each of the connection devices is used to connect the components to be tested, and the burn-in test system performs a burn-in test on the components to be tested, Wherein, the component under test may be an integrated circuit component (Integrated Circuit, IC), such as an IC product of a DC/DC power converter or an AC/DC power converter.
如圖1及圖2所示,該機櫃10包含一櫃體11以及複數載板12,該櫃體11中具有一個或一個以上之容置空間110,該複數載板12係間隔設置於該櫃體11的容置空間110中。如圖1及圖2所示的實施例中,其揭示櫃體11中具有開口朝前的一容置空間110,且櫃體11的前側於該開口之側邊處具有一前側板13,該複數載板12係於該容置空間呈上下間隔排列,各該載板12兩側分別結合一抽屜滑軌14連接該櫃體11之側壁,使所述載板12藉由兩側的抽屜滑軌14能被操作自該櫃體11之容置空間110朝前拉出及推入該容置空間110中。
As shown in Figures 1 and 2, the
如圖1與圖2所示,該複數連接裝置20裝設於該機櫃10中,且該機櫃10的各該載板12設有該複數連接裝置20中的至少一連接裝置20,在圖1與圖2所示的實施例中,每個載板12上可設有兩個所述連接裝置20。各該連接裝置20包含一電路基板21與至少一轉接座22,該電路基板21與該至少一轉接座22可為印刷電路板(PCB),故該電路基板21與該至少一轉接座22具有電子電路布局(layout),該至少一轉接座22用以連接待測元件30。其中,該電路基板21是固
定在該載板12上,請參考圖3,該電路基板21的頂面具有複數負載區域210,該複數負載區域210的位置彼此分離,該電路基板21於各該負載區域210設有複數接點,該複數接點包含複數測試電源接點211與複數負載接點212,其電連接該電路基板21的電子電路布局。如圖3所示的實施例,該電路基板21具有呈矩陣排列結構的八個負載區域210。該至少一轉接座22可拆組的設置在該電路基板21並電連接該複數接點,各該轉接座22具有至少一待測元件連接器220,其電連接該轉接座22的電子電路布局,各該待測元件連接器220可為複數端子柱或導電彈性夾片,其中,各該端子柱為具導電性的中空圓柱體,各該端子柱或導電彈性夾片豎立在該轉接座22的頂面,該複數端子柱或導電彈性夾片的位置係對應待測元件30的針腳31(pin)位置,是以,一個待測元件30即能在一組待測元件連接器220上插拔。
As shown in Figures 1 and 2, the plurality of
該轉接座22與該電路基板21的結合方式可透過插針(pin)與端子台,例如圖2所示,該轉接座22的底面可設置透過其電子電路布局電連接該待測元件連接器220的端子台221,該電路基板21的每個負載區域210的頂面可設置有透過其電子電路布局電連接其測試電源接點211與複數負載接點212的插針座213,該轉接座22上的端子台221可拆組的連接該電路基板21上的插針座213,即插針座213的插針能插入並連接端子台221的插孔,使該轉接座22的電子電路布局與該電路基板21的電子電路布局構成電性連接。是以,透過上述連接架構,當該轉接座22設置在該電路基板21時,該轉接座22的待測元件連接器220即可電連接該電路基板21之負載區域210的測試電源接點211與負載接點212;又當該待測元件30設置在該轉接座22的待測元件連接器220時,該待測元件30能透過該轉接座22而電連接該電路基板21之負載區域210的測試電源接點211與負載接點212。
The connection between the
該燒機測試系統裝設於該機櫃10中並電連接該複數連接裝置20,請參考圖4,該燒機測試系統可包含一控制裝置41與電連接該控制裝置41的一人機介面裝置42、複數電源供應器43、複數量測裝置44、複數負載裝置45與一儲存裝置46,其中,圖4僅以一個電源供應器43、一個量測裝置44與一個負載裝置45舉例說明,一個連接裝置20可對應連接一個電源供應器43、一個量測裝置44與一個負載裝置45。該電源供應器43、該量測裝置44與該負載裝置45可電連接該連接裝置20的電路基板21的電子電路布局,以與所述待測元件30構成電性連接,該控制裝置41可調控該電源供應器43輸出至各待測元件的測試電源的大小,該負載裝置45可為電子負載(electronic load),該量測裝置44可為數位電表以量測待測元件30的輸出電壓及/或電流,該控制裝置41從該量測裝置44接收其量測資料,該控制裝置41可將所述量測資料儲存在儲存裝置46(例如硬碟),並可透過該人機介面裝置42的顯示器呈現量測資料給使用者檢視。如圖1所示,該人機介面裝置42可裝設於該櫃體11之前側板13,以供操作人員檢視及操作,舉例來說,該人機介面裝置42可為觸控顯示面板。
The burn-in test system is installed in the
本發明的連接裝置20能因應各式待測元件30而包含數種態樣,且透過該電路基板21與該轉接座22的電子電路布局,讓複數負載區域210的接點形成並聯連接,讓複數待測元件連接器220形成並聯連接,使複數負載區域210與複數待測元件連接器220可分配或平均分配該負載裝置45的負載量,舉例說明如下。
The
1、態樣一 1. State one
請參考圖2與圖5,該至少一轉接座22為複數轉接座22,該複數轉接座22的數量與該電路基板21之該複數負載區域210的數量相同,舉例來說,該複數轉接座22的數量可為八個,該電路基板21之該複數負載區域210的數量亦為八個,以形成一對一的對應連接,即一個轉接座22設置在一個負載區
域210。如前所述,每個轉接座22可設有一個或多個待測元件連接器220,當各該轉接座22設有複數待測元件連接器220時,請參考圖2與圖5以每個轉接座22設有兩組待測元件連接器220為例,其分別供設置待測元件30,各該待測元件30透過該轉接座22和該電路基板21的電子電路布局而與該電源供應器43、該負載裝置45、該量測裝置44構成訊號連接,使各該待測元件30能接受測試,是以,以圖5所示的實施例而言,該電路基板21上設有八個轉接座22,每個轉接座22設有兩個待測元件30,故該連接裝置20一共設有十六個待測元件30。當該負載裝置45的加載量為600瓦特(W),每個待測元件30相當於分配到37.5瓦特(W)的負載量,所述加載量是指該負載裝置45所模擬出的負載量的功率上限。再舉一例,請參考圖6,當每個轉接座22僅設有單一個待測元件30,且該負載裝置45的加載量為600瓦特(W)時,每個待測元件30相當於分配到75瓦特(W)的負載量。是以,每個轉接座22可視需求設有不同數量的待測元件連接器220以供連接待測元件30,待測元件30的負載量可依前述範例類推。
Please refer to FIG. 2 and FIG. 5, the at least one
2、態樣二 2. Pattern 2
該至少一轉接座22為複數轉接座22,該複數轉接座22的數量少於該電路基板21之該複數負載區域210的數量,各該轉接座22的待測元件連接器220電連接該電路基板21之至少二個負載區域210的接點,也就是說,各該轉接座22的待測元件連接器220電連接該電路基板21之部分負載區域210的測試電源接點211與負載接點212,亦即一個轉接座22可對應設置在多個負載區域210,而為一對多的設置結構。請參考圖7為例,每個轉接座22設置在兩個負載區域210,各該轉接座22的底面設有複數端子台221,該複數端子台221的位置對應於該兩負載區域210之插針座213的位置而能對應插接,每個轉接座22可設有單一個或多個待測元件連接器220,圖7僅以一個待測元件連接器220為例,以供設置一個待測元件30。整體來看,圖7所示的該連接裝置20一共設有四個
待測元件30,當該負載裝置45的加載量為600瓦特(W),每個待測元件30相當於分配到150瓦特(W)的負載量。是以,每個轉接座22可視需求設有不同數量的待測元件連接器220以供連接待測元件30,待測元件30的負載量可依前述範例類推。
The at least one
3、態樣三 3. Pattern three
該至少一轉接座22為單一轉接座22,該轉接座22的待測元件連接器220電連接該電路基板21之所有該複數負載區域210的接點,亦即一個轉接座22的底面設有複數端子台221,該複數端子台221的位置對應於該複數負載區域210之插針座213的位置而能對應插接,而為一對多的設置結構。請參考圖8為例,該轉接座22可設有單一個待測元件連接器220以供設置一個待測元件30,當該負載裝置45的加載量為600瓦特(W),該待測元件30相當於分配到600瓦特(W)的負載量。是以,每個轉接座22可視需求設有不同數量的待測元件連接器220以供連接待測元件30,待測元件30的負載量可依前述範例類推。
The at least one
需說明的是,前述態樣的電路架構僅為範例,實際應用時,各該轉接座22上的電子電路布局可因應測試需求及各式待測元件30的屬性而有多元、彈性設計。此外,各該轉接座22的尺寸及其底面設有對應數量與對應位置的端子台221,以供能對應插設在多個負載區域210的插針座213。
It should be noted that the above-mentioned circuit structure is only an example, and in actual application, the electronic circuit layout on each of the
綜上所述,在本發明中,針對不同型號的待測元件30僅須設置、更換對應的轉接座22,且本發明燒機設備包含設於機櫃10中的燒機測試系統以及電路基板21為共用型之構造,針對不同型號的待測元件30僅須更換對應的轉接座22即可,且轉接座22的體積小、重量輕,讓操作人員能夠更簡便而省力地取置轉接座22,具有簡化燒機過程的功效。本發明燒機設備還能進一步令該櫃體中具有開口朝前的一所述容置空間110,該櫃體11的前側具有前側板13,該複數載板12於該容置空間110呈上下間隔排列,使該櫃體11更能充分利
用空間提供多組待測元件30執行燒機程序。再者,本明燒機設備還能進一步令該櫃體11中之各該載板12兩側分別結合抽屜滑軌14連接該櫃體11,使所述載板12能被操作而自該櫃體11之容置空間110移出及送入該容置空間110中,以便於待測元件30於櫃體11內之電路基板21上的轉接座22上之拆組作業。
To sum up, in the present invention, it is only necessary to set and replace the corresponding
10:機櫃 10: cabinet
11:櫃體 11: Cabinet
110:容置空間 110:Accommodating space
12:載板 12: carrier board
13:前側板 13: Front side panel
14:抽屜滑軌 14: Drawer slides
20:連接裝置 20: Connection device
21:電路基板 21: Circuit substrate
22:轉接座 22: adapter seat
30:待測元件 30: Components under test
42:人機介面裝置 42: Human-machine interface device
Claims (7)
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