TWI784539B - Burn-in equipment - Google Patents

Burn-in equipment Download PDF

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Publication number
TWI784539B
TWI784539B TW110118518A TW110118518A TWI784539B TW I784539 B TWI784539 B TW I784539B TW 110118518 A TW110118518 A TW 110118518A TW 110118518 A TW110118518 A TW 110118518A TW I784539 B TWI784539 B TW I784539B
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burn
adapter
cabinet
load
dut
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TW110118518A
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Chinese (zh)
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TW202246786A (en
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甘明達
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捷拓科技股份有限公司
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Publication of TW202246786A publication Critical patent/TW202246786A/en

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Abstract

一種燒機設備,包含一機櫃、複數連接裝置與一燒機測試系統,該機櫃包含一櫃體以及複數載板,該複數載板間隔設置於該櫃體的容置空間中,該複數連接裝置裝設於該機櫃中,各該連接裝置包含一電路基板與至少一轉接座,該電路基板具有複數負載區域,該複數負載區域的位置彼此分離,該電路基板於各該負載區域設有複數接點,該至少一轉接座可拆組的設置在該電路基板並電連接該複數接點,各該轉接座具有至少一待測元件連接器,該機櫃的各該載板設有該複數連接裝置中的至少一連接裝置,該燒機測試系統裝設於該機櫃中並電連接該複數連接裝置。A burn-in equipment, comprising a cabinet, a plurality of connection devices and a burn-in test system, the cabinet includes a cabinet body and a plurality of carrier boards, the plurality of carrier boards are arranged at intervals in the accommodation space of the cabinet body, the plurality of connection devices Installed in the cabinet, each connecting device includes a circuit substrate and at least one adapter seat, the circuit substrate has a plurality of load areas, the positions of the plurality of load areas are separated from each other, and the circuit substrate is provided with a plurality of Contacts, the at least one transfer base is detachably arranged on the circuit board and electrically connected to the plurality of contacts, each of the transfer bases has at least one DUT connector, and each of the carrier boards of the cabinet is provided with the At least one connection device in the plurality of connection devices, the burn-in test system is installed in the cabinet and electrically connected to the plurality of connection devices.

Description

燒機設備Burn-in equipment

本發明係關於一種燒機設備,尤指一種用於電子元件執行燒機程序使用之燒機測試設備。 The invention relates to a burn-in device, in particular to a burn-in testing device used for executing a burn-in program for electronic components.

現有電子元件於出廠前,為了確保電子元件之功能正確與可靠度,須進行燒機程序(burn in),藉由燒機程序模擬電子元件的負載狀態進行測試。 Before the existing electronic components leave the factory, in order to ensure the correct function and reliability of the electronic components, a burn-in procedure (burn in) must be carried out, and the load state of the electronic components is simulated by the burn-in program for testing.

請參考圖9,習知燒機手段是將待測的電子元件(後稱待測元件60)分別連接一電源供應器50、一負載裝置51與一量測裝置52,由一控制裝置53調控該電源供應器50輸出至該待測元件60的測試電源的大小,該負載裝置51可為電子負載(electronic load)或客製水泥電阻,該量測裝置52可電連接該待測元件60的輸出端以量測其輸出電壓及/或電流,該控制裝置53從該量測裝置52接收其量測資料,該控制裝置52可將所述量測資料儲存在儲存裝置(例如硬碟),並可透過顯示器呈現量測資料給使用者檢視。 Please refer to FIG. 9 , the conventional burn-in method is to connect the electronic component to be tested (hereinafter referred to as the component to be tested 60 ) to a power supply 50 , a load device 51 and a measuring device 52 respectively, and to be regulated by a control device 53 The power supply 50 outputs the size of the test power to the DUT 60, the load device 51 can be an electronic load (electronic load) or a custom cement resistor, and the measuring device 52 can be electrically connected to the DUT 60 The output terminal is used to measure its output voltage and/or current, the control device 53 receives its measurement data from the measurement device 52, and the control device 52 can store the measurement data in a storage device (such as a hard disk), And the measurement data can be presented to the user through the display.

然而,由於待測元件60的型號多元,不同型號的待測元件60所能承受的負載量也彼此不同,由此可見,該負載裝置51的阻抗必須因應待測元件60的型號而隨時調整、替換或客製化製作,導致習知燒機過程難以簡化。 However, due to the multiple types of the DUT 60, the loads that the DUT 60 of different types can withstand are also different from each other. It can be seen that the impedance of the load device 51 must be adjusted at any time according to the type of the DUT 60. Replacement or customized production makes it difficult to simplify the conventional burn-in process.

本發明之目的在於提供一種燒機設備,以期改善習知燒機過程難以簡化的缺點。 The object of the present invention is to provide a burn-in device, in order to improve the disadvantage of the conventional burn-in process that is difficult to simplify.

為了達成前述目的,本發明所提出之燒機設備係包含: 一機櫃,其包含一櫃體以及複數載板,該櫃體中具有一容置空間,該複數載板間隔設置於該櫃體的容置空間中;複數連接裝置,裝設於該機櫃中,各該連接裝置包含:一電路基板,具有複數負載區域,該複數負載區域的位置彼此分離,該電路基板於各該負載區域設有複數接點;及至少一轉接座,可拆組的設置在該電路基板並電連接該複數接點,各該轉接座具有至少一待測元件連接器;該機櫃的各該載板設有該複數連接裝置中的至少一連接裝置;以及一燒機測試系統,裝設於該機櫃中並電連接該複數連接裝置。 In order to achieve the aforementioned goals, the burn-in equipment proposed by the present invention includes: A cabinet, which includes a cabinet body and a plurality of carrier boards, the cabinet body has an accommodating space, and the plurality of carrier boards are arranged at intervals in the accommodating space of the cabinet body; a plurality of connection devices are installed in the cabinet body, Each of the connection devices includes: a circuit substrate with a plurality of load areas, the positions of the plurality of load areas are separated from each other, and the circuit substrate is provided with a plurality of contacts in each of the load areas; and at least one adapter seat, which can be disassembled. The plurality of contacts are electrically connected to the circuit board, each of the adapters has at least one DUT connector; each of the carrier boards of the cabinet is provided with at least one of the plurality of connection devices; and a burner The test system is installed in the cabinet and electrically connected to the plurality of connecting devices.

藉由前述燒機設備,針對不同型號的待測元件僅須更換對應的轉接座,而且本發明燒機設備包含設於機櫃中的燒機測試系統以及電路基板為共用型之構造,故針對不同型號的待測元件僅須更換對應的轉接座即可,且轉接座的體積小、重量輕,讓操作人員能夠更簡便而省力地取置轉接座,具有簡化燒機過程的功效。 With the aforementioned burn-in equipment, it is only necessary to replace the corresponding adapter base for different types of components to be tested, and the burn-in equipment of the present invention includes a burn-in test system and a circuit board in the cabinet. Different types of components under test only need to replace the corresponding adapter base, and the adapter base is small in size and light in weight, allowing the operator to pick and place the adapter base more easily and with less effort, which has the effect of simplifying the burn-in process .

此外,本發明燒機設備亦具備高度空間充分利用之特性,本發明燒機設備利用機櫃中之容置空間設置多個間隔排列之載板,並以載板提供通用型的電路基板設置,並提供與待測元件相匹配之轉接座設置,在使用過程中,待測元件能集中分層設置之載板上方,並與電路基板上之轉接座電性連接,使該燒機設備具備高度空間充分利用之特性。 In addition, the burn-in equipment of the present invention also has the characteristics of fully utilizing the height space. The burn-in equipment of the present invention utilizes the accommodation space in the cabinet to arrange a plurality of carrier boards arranged at intervals, and the carrier board provides a general-purpose circuit board arrangement, and Provide an adapter set that matches the component to be tested. During use, the components to be tested can be concentrated on the top of the carrier board that is arranged in layers and electrically connected to the adapter seat on the circuit board, so that the burner equipment has The characteristics of making full use of height space.

10:機櫃 10: cabinet

11:櫃體 11: Cabinet

110:容置空間 110:Accommodating space

12:載板 12: carrier board

13:前側板 13: Front side panel

14:抽屜滑軌 14: Drawer slides

20:連接裝置 20: Connection device

21:電路基板 21: Circuit substrate

210:負載區域 210: load area

211:測試電源接點 211: Test power contacts

212:負載接點 212: Load contact

213:插針座 213: pin seat

22:轉接座 22: adapter seat

220:待測元件連接器 220: DUT connector

221:端子台 221: terminal block

30:待測元件 30: Components under test

31:針腳 31: Pin

41:控制裝置 41: Control device

42:人機介面裝置 42: Human-machine interface device

43:電源供應器 43: Power supply

44:量測裝置 44: Measuring device

45:負載裝置 45:Load device

46:儲存裝置 46: storage device

50:電源供應器 50: Power supply

51:負載裝置 51: Load device

52:量測裝置 52: Measuring device

53:控制裝置 53: Control device

60:待測元件 60: Components under test

圖1:本發明燒機設備的實施例的前視平面示意圖。 Fig. 1: a schematic front plan view of an embodiment of the burn-in equipment of the present invention.

圖2:本發明燒機設備的實施例的局部放大示意圖。 Fig. 2: A partially enlarged schematic diagram of an embodiment of the burn-in equipment of the present invention.

圖3:本發明中,電路基板的俯視平面示意圖。 Fig. 3: In the present invention, a schematic top plan view of a circuit substrate.

圖4:本發明中,燒機測試系統的實施例的方塊示意圖。 Fig. 4: A schematic block diagram of an embodiment of a burn-in test system in the present invention.

圖5:本發明中,電路基板與轉接座的結合結構的俯視平面示意圖(一)。 Fig. 5: In the present invention, a top plan view (1) of the combined structure of the circuit substrate and the adapter seat.

圖6:本發明中,電路基板與轉接座的結合結構的俯視平面示意圖(二)。 Fig. 6: In the present invention, a top plan view (2) of the combined structure of the circuit substrate and the adapter seat.

圖7:本發明中,電路基板與轉接座的結合結構的俯視平面示意圖(三)。 Fig. 7: In the present invention, a top plan view (3) of the combined structure of the circuit substrate and the adapter seat.

圖8:本發明中,電路基板與轉接座的結合結構的俯視平面示意圖(四)。 Fig. 8: In the present invention, a schematic top plan view (4) of the combined structure of the circuit substrate and the adapter seat.

圖9:習知對一待測元件進行燒機測試的方塊示意圖。 FIG. 9 : A schematic block diagram of a conventional burn-in test for a DUT.

本發明燒機設備的實施例包含一機櫃、複數連接裝置與一燒機測試系統,各該連接裝置用以連接待測元件,由該燒機測試系統對所述待測元件實施燒機測試,其中,所述待測元件可為積體電路元件(Integrated Circuit,IC),例如直流/直流電源轉換器或交流/直流電源轉換器的IC產品。 An embodiment of the burn-in device of the present invention includes a cabinet, a plurality of connection devices and a burn-in test system, each of the connection devices is used to connect the components to be tested, and the burn-in test system performs a burn-in test on the components to be tested, Wherein, the component under test may be an integrated circuit component (Integrated Circuit, IC), such as an IC product of a DC/DC power converter or an AC/DC power converter.

如圖1及圖2所示,該機櫃10包含一櫃體11以及複數載板12,該櫃體11中具有一個或一個以上之容置空間110,該複數載板12係間隔設置於該櫃體11的容置空間110中。如圖1及圖2所示的實施例中,其揭示櫃體11中具有開口朝前的一容置空間110,且櫃體11的前側於該開口之側邊處具有一前側板13,該複數載板12係於該容置空間呈上下間隔排列,各該載板12兩側分別結合一抽屜滑軌14連接該櫃體11之側壁,使所述載板12藉由兩側的抽屜滑軌14能被操作自該櫃體11之容置空間110朝前拉出及推入該容置空間110中。 As shown in Figures 1 and 2, the cabinet 10 includes a cabinet body 11 and a plurality of carrier boards 12, the cabinet body 11 has one or more than one accommodating spaces 110, and the plurality of carrier boards 12 are arranged at intervals in the cabinet In the accommodating space 110 of the body 11. In the embodiment shown in Fig. 1 and Fig. 2, it discloses that there is an accommodating space 110 with an opening facing forward in the cabinet body 11, and the front side of the cabinet body 11 has a front side plate 13 at the side of the opening, the A plurality of carrier boards 12 are arranged at intervals up and down in the accommodating space, and each of the carrier boards 12 is combined with a drawer slide rail 14 to connect to the side wall of the cabinet body 11, so that the carrier board 12 slides through the drawers on both sides. The rail 14 can be pulled out from the accommodating space 110 of the cabinet body 11 and pushed into the accommodating space 110 by operation.

如圖1與圖2所示,該複數連接裝置20裝設於該機櫃10中,且該機櫃10的各該載板12設有該複數連接裝置20中的至少一連接裝置20,在圖1與圖2所示的實施例中,每個載板12上可設有兩個所述連接裝置20。各該連接裝置20包含一電路基板21與至少一轉接座22,該電路基板21與該至少一轉接座22可為印刷電路板(PCB),故該電路基板21與該至少一轉接座22具有電子電路布局(layout),該至少一轉接座22用以連接待測元件30。其中,該電路基板21是固 定在該載板12上,請參考圖3,該電路基板21的頂面具有複數負載區域210,該複數負載區域210的位置彼此分離,該電路基板21於各該負載區域210設有複數接點,該複數接點包含複數測試電源接點211與複數負載接點212,其電連接該電路基板21的電子電路布局。如圖3所示的實施例,該電路基板21具有呈矩陣排列結構的八個負載區域210。該至少一轉接座22可拆組的設置在該電路基板21並電連接該複數接點,各該轉接座22具有至少一待測元件連接器220,其電連接該轉接座22的電子電路布局,各該待測元件連接器220可為複數端子柱或導電彈性夾片,其中,各該端子柱為具導電性的中空圓柱體,各該端子柱或導電彈性夾片豎立在該轉接座22的頂面,該複數端子柱或導電彈性夾片的位置係對應待測元件30的針腳31(pin)位置,是以,一個待測元件30即能在一組待測元件連接器220上插拔。 As shown in Figures 1 and 2, the plurality of connection devices 20 are installed in the cabinet 10, and each of the carrier boards 12 of the cabinet 10 is provided with at least one connection device 20 in the plurality of connection devices 20, as shown in Figure 1 In the embodiment shown in FIG. 2 , two connecting devices 20 may be provided on each carrier board 12 . Each of the connection devices 20 includes a circuit substrate 21 and at least one adapter seat 22, the circuit substrate 21 and the at least one adapter seat 22 can be printed circuit boards (PCB), so the circuit substrate 21 and the at least one adapter The seat 22 has an electronic circuit layout, and the at least one adapter seat 22 is used for connecting the DUT 30 . Wherein, the circuit substrate 21 is a solid Fixed on the carrier board 12, please refer to FIG. 3, the top surface of the circuit substrate 21 has a plurality of load regions 210, the positions of the plurality of load regions 210 are separated from each other, and the circuit substrate 21 is provided with a plurality of connections in each of the load regions 210. The plurality of contacts includes a plurality of test power contacts 211 and a plurality of load contacts 212 , which are electrically connected to the electronic circuit layout of the circuit substrate 21 . In the embodiment shown in FIG. 3 , the circuit substrate 21 has eight load regions 210 arranged in a matrix. The at least one adapter base 22 is detachably arranged on the circuit board 21 and electrically connected to the plurality of contacts. Each adapter base 22 has at least one DUT connector 220, which is electrically connected to the adapter base 22. Electronic circuit layout, each of the DUT connectors 220 can be a plurality of terminal posts or conductive elastic clips, wherein each of the terminal posts is a hollow cylinder with conductivity, and each of the terminal posts or conductive elastic clips is erected on the On the top surface of the adapter base 22, the positions of the plurality of terminal columns or the conductive elastic clips correspond to the positions of the pins 31 (pins) of the DUT 30, so that one DUT 30 can be connected to a group of DUTs. Connector 220.

該轉接座22與該電路基板21的結合方式可透過插針(pin)與端子台,例如圖2所示,該轉接座22的底面可設置透過其電子電路布局電連接該待測元件連接器220的端子台221,該電路基板21的每個負載區域210的頂面可設置有透過其電子電路布局電連接其測試電源接點211與複數負載接點212的插針座213,該轉接座22上的端子台221可拆組的連接該電路基板21上的插針座213,即插針座213的插針能插入並連接端子台221的插孔,使該轉接座22的電子電路布局與該電路基板21的電子電路布局構成電性連接。是以,透過上述連接架構,當該轉接座22設置在該電路基板21時,該轉接座22的待測元件連接器220即可電連接該電路基板21之負載區域210的測試電源接點211與負載接點212;又當該待測元件30設置在該轉接座22的待測元件連接器220時,該待測元件30能透過該轉接座22而電連接該電路基板21之負載區域210的測試電源接點211與負載接點212。 The connection between the adapter base 22 and the circuit substrate 21 can be through a pin (pin) and a terminal block. For example, as shown in FIG. The terminal block 221 of the connector 220, the top surface of each load area 210 of the circuit substrate 21 can be provided with a pin seat 213 electrically connecting its test power contact 211 and a plurality of load contacts 212 through its electronic circuit layout, the The terminal block 221 on the adapter base 22 is detachably connected to the pin block 213 on the circuit board 21, that is, the pins of the pin block 213 can be inserted into and connected to the jack of the terminal block 221, so that the adapter block 22 The electronic circuit layout of the circuit board 21 is electrically connected with the electronic circuit layout of the circuit substrate 21 . Therefore, through the above-mentioned connection structure, when the adapter base 22 is arranged on the circuit substrate 21, the DUT connector 220 of the adapter base 22 can be electrically connected to the test power supply terminal of the load area 210 of the circuit substrate 21. point 211 and load contact 212; and when the DUT 30 is arranged on the DUT connector 220 of the adapter base 22, the DUT 30 can be electrically connected to the circuit board 21 through the adapter base 22 Test the power contact 211 and the load contact 212 of the load area 210 .

該燒機測試系統裝設於該機櫃10中並電連接該複數連接裝置20,請參考圖4,該燒機測試系統可包含一控制裝置41與電連接該控制裝置41的一人機介面裝置42、複數電源供應器43、複數量測裝置44、複數負載裝置45與一儲存裝置46,其中,圖4僅以一個電源供應器43、一個量測裝置44與一個負載裝置45舉例說明,一個連接裝置20可對應連接一個電源供應器43、一個量測裝置44與一個負載裝置45。該電源供應器43、該量測裝置44與該負載裝置45可電連接該連接裝置20的電路基板21的電子電路布局,以與所述待測元件30構成電性連接,該控制裝置41可調控該電源供應器43輸出至各待測元件的測試電源的大小,該負載裝置45可為電子負載(electronic load),該量測裝置44可為數位電表以量測待測元件30的輸出電壓及/或電流,該控制裝置41從該量測裝置44接收其量測資料,該控制裝置41可將所述量測資料儲存在儲存裝置46(例如硬碟),並可透過該人機介面裝置42的顯示器呈現量測資料給使用者檢視。如圖1所示,該人機介面裝置42可裝設於該櫃體11之前側板13,以供操作人員檢視及操作,舉例來說,該人機介面裝置42可為觸控顯示面板。 The burn-in test system is installed in the cabinet 10 and electrically connected to the plurality of connection devices 20, please refer to FIG. 4, the burn-in test system may include a control device 41 and a human-machine interface device 42 electrically connected to the control device 41 , a plurality of power supplies 43, a plurality of measurement devices 44, a plurality of load devices 45 and a storage device 46, wherein, Figure 4 is only an example of a power supply 43, a measurement device 44 and a load device 45, a connection The device 20 can be correspondingly connected with a power supply 43 , a measuring device 44 and a load device 45 . The power supply 43, the measuring device 44 and the load device 45 can be electrically connected to the electronic circuit layout of the circuit substrate 21 of the connection device 20, so as to form an electrical connection with the device under test 30, and the control device 41 can be Regulate the size of the test power output from the power supply 43 to each DUT, the load device 45 can be an electronic load, and the measuring device 44 can be a digital ammeter to measure the output voltage of the DUT 30 and/or current, the control device 41 receives its measurement data from the measurement device 44, the control device 41 can store the measurement data in the storage device 46 (such as a hard disk), and can The display of the device 42 presents the measurement data for the user to view. As shown in FIG. 1 , the human-machine interface device 42 can be installed on the front side panel 13 of the cabinet body 11 for inspection and operation by operators. For example, the human-machine interface device 42 can be a touch display panel.

本發明的連接裝置20能因應各式待測元件30而包含數種態樣,且透過該電路基板21與該轉接座22的電子電路布局,讓複數負載區域210的接點形成並聯連接,讓複數待測元件連接器220形成並聯連接,使複數負載區域210與複數待測元件連接器220可分配或平均分配該負載裝置45的負載量,舉例說明如下。 The connection device 20 of the present invention can include several forms in response to various DUTs 30, and through the electronic circuit layout of the circuit substrate 21 and the adapter seat 22, the contacts of the plurality of load areas 210 are connected in parallel, The plurality of DUT connectors 220 are connected in parallel so that the plurality of load regions 210 and the plurality of DUT connectors 220 can distribute or evenly distribute the load of the load device 45 , as illustrated below.

1、態樣一 1. State one

請參考圖2與圖5,該至少一轉接座22為複數轉接座22,該複數轉接座22的數量與該電路基板21之該複數負載區域210的數量相同,舉例來說,該複數轉接座22的數量可為八個,該電路基板21之該複數負載區域210的數量亦為八個,以形成一對一的對應連接,即一個轉接座22設置在一個負載區 域210。如前所述,每個轉接座22可設有一個或多個待測元件連接器220,當各該轉接座22設有複數待測元件連接器220時,請參考圖2與圖5以每個轉接座22設有兩組待測元件連接器220為例,其分別供設置待測元件30,各該待測元件30透過該轉接座22和該電路基板21的電子電路布局而與該電源供應器43、該負載裝置45、該量測裝置44構成訊號連接,使各該待測元件30能接受測試,是以,以圖5所示的實施例而言,該電路基板21上設有八個轉接座22,每個轉接座22設有兩個待測元件30,故該連接裝置20一共設有十六個待測元件30。當該負載裝置45的加載量為600瓦特(W),每個待測元件30相當於分配到37.5瓦特(W)的負載量,所述加載量是指該負載裝置45所模擬出的負載量的功率上限。再舉一例,請參考圖6,當每個轉接座22僅設有單一個待測元件30,且該負載裝置45的加載量為600瓦特(W)時,每個待測元件30相當於分配到75瓦特(W)的負載量。是以,每個轉接座22可視需求設有不同數量的待測元件連接器220以供連接待測元件30,待測元件30的負載量可依前述範例類推。 Please refer to FIG. 2 and FIG. 5, the at least one adapter seat 22 is a plurality of adapter seats 22, and the number of the plurality of adapter seats 22 is the same as the number of the plurality of load areas 210 of the circuit substrate 21. For example, the The number of the plurality of adapters 22 can be eight, and the number of the plurality of load areas 210 of the circuit substrate 21 is also eight, so as to form a one-to-one corresponding connection, that is, one adapter 22 is arranged in one load area Domain 210. As mentioned above, each adapter base 22 can be provided with one or more DUT connectors 220. When each adapter base 22 is provided with a plurality of DUT connectors 220, please refer to FIG. 2 and FIG. 5 Take two sets of DUT connectors 220 provided on each adapter base 22 as an example, which are respectively used for setting DUTs 30 , and each DUT 30 passes through the electronic circuit layout of the adapter base 22 and the circuit substrate 21 And form a signal connection with the power supply 43, the load device 45, and the measuring device 44, so that each of the DUTs 30 can be tested. Therefore, in the embodiment shown in FIG. 5, the circuit substrate 21 is provided with eight adapters 22, and each adapter 22 is provided with two DUTs 30, so the connecting device 20 is provided with sixteen DUTs 30 in total. When the load of the load device 45 is 600 watts (W), each element under test 30 is equivalent to a load of 37.5 watts (W), and the load is the load simulated by the load device 45 power ceiling. For another example, please refer to Fig. 6, when each adapter base 22 is only provided with a single DUT 30, and when the loading capacity of the load device 45 is 600 watts (W), each DUT 30 is equivalent to Distributed to a load of 75 watts (W). Therefore, each adapter base 22 may be provided with a different number of DUT connectors 220 for connecting the DUT 30 according to requirements, and the load capacity of the DUT 30 can be deduced according to the foregoing example.

2、態樣二 2. Pattern 2

該至少一轉接座22為複數轉接座22,該複數轉接座22的數量少於該電路基板21之該複數負載區域210的數量,各該轉接座22的待測元件連接器220電連接該電路基板21之至少二個負載區域210的接點,也就是說,各該轉接座22的待測元件連接器220電連接該電路基板21之部分負載區域210的測試電源接點211與負載接點212,亦即一個轉接座22可對應設置在多個負載區域210,而為一對多的設置結構。請參考圖7為例,每個轉接座22設置在兩個負載區域210,各該轉接座22的底面設有複數端子台221,該複數端子台221的位置對應於該兩負載區域210之插針座213的位置而能對應插接,每個轉接座22可設有單一個或多個待測元件連接器220,圖7僅以一個待測元件連接器220為例,以供設置一個待測元件30。整體來看,圖7所示的該連接裝置20一共設有四個 待測元件30,當該負載裝置45的加載量為600瓦特(W),每個待測元件30相當於分配到150瓦特(W)的負載量。是以,每個轉接座22可視需求設有不同數量的待測元件連接器220以供連接待測元件30,待測元件30的負載量可依前述範例類推。 The at least one adapter base 22 is a plurality of adapter bases 22, the number of the plurality of adapter bases 22 is less than the number of the plurality of load areas 210 of the circuit board 21, and the DUT connector 220 of each of the adapter bases 22 Electrically connect the contacts of at least two load areas 210 of the circuit substrate 21, that is, the DUT connectors 220 of each adapter 22 are electrically connected to the test power contacts of the partial load areas 210 of the circuit substrate 21 211 and load contact 212 , that is, one adapter 22 can be correspondingly arranged in a plurality of load areas 210 , which is a one-to-many arrangement structure. Please refer to FIG. 7 as an example, each adapter base 22 is arranged in two load areas 210, and the bottom surface of each adapter base 22 is provided with a plurality of terminal blocks 221, and the positions of the plurality of terminal blocks 221 correspond to the two load areas 210. The position of the pin socket 213 can be plugged correspondingly. Each adapter seat 22 can be provided with a single or multiple DUT connectors 220. FIG. 7 only takes one DUT connector 220 as an example for One element under test 30 is set. On the whole, the connecting device 20 shown in FIG. 7 is provided with four For the components under test 30 , when the load of the load device 45 is 600 watts (W), each component under test 30 is equivalent to a load of 150 watts (W). Therefore, each adapter base 22 may be provided with a different number of DUT connectors 220 for connecting the DUT 30 according to requirements, and the load capacity of the DUT 30 can be deduced according to the foregoing example.

3、態樣三 3. Pattern three

該至少一轉接座22為單一轉接座22,該轉接座22的待測元件連接器220電連接該電路基板21之所有該複數負載區域210的接點,亦即一個轉接座22的底面設有複數端子台221,該複數端子台221的位置對應於該複數負載區域210之插針座213的位置而能對應插接,而為一對多的設置結構。請參考圖8為例,該轉接座22可設有單一個待測元件連接器220以供設置一個待測元件30,當該負載裝置45的加載量為600瓦特(W),該待測元件30相當於分配到600瓦特(W)的負載量。是以,每個轉接座22可視需求設有不同數量的待測元件連接器220以供連接待測元件30,待測元件30的負載量可依前述範例類推。 The at least one adapter 22 is a single adapter 22, and the DUT connector 220 of the adapter 22 is electrically connected to the contacts of all the multiple load areas 210 of the circuit board 21, that is, one adapter 22 A plurality of terminal blocks 221 are arranged on the bottom surface of the plurality of load areas 210, and the positions of the plurality of terminal blocks 221 are corresponding to the positions of the pin blocks 213 of the plurality of load areas 210, so that they can be plugged correspondingly, and it is a one-to-many arrangement structure. Please refer to FIG. 8 as an example, the adapter base 22 can be provided with a single DUT connector 220 for setting a DUT 30, when the loading capacity of the load device 45 is 600 watts (W), the DUT Element 30 corresponds to a load assigned to 600 watts (W). Therefore, each adapter base 22 may be provided with a different number of DUT connectors 220 for connecting the DUT 30 according to requirements, and the load capacity of the DUT 30 can be deduced according to the foregoing example.

需說明的是,前述態樣的電路架構僅為範例,實際應用時,各該轉接座22上的電子電路布局可因應測試需求及各式待測元件30的屬性而有多元、彈性設計。此外,各該轉接座22的尺寸及其底面設有對應數量與對應位置的端子台221,以供能對應插設在多個負載區域210的插針座213。 It should be noted that the above-mentioned circuit structure is only an example, and in actual application, the electronic circuit layout on each of the adapter sockets 22 can be designed in multiple ways and flexibly according to the test requirements and the properties of various DUTs 30 . In addition, the size and the bottom surface of each adapter seat 22 are provided with a corresponding number and a corresponding position of the terminal blocks 221 for correspondingly inserting the pin blocks 213 in a plurality of load areas 210 .

綜上所述,在本發明中,針對不同型號的待測元件30僅須設置、更換對應的轉接座22,且本發明燒機設備包含設於機櫃10中的燒機測試系統以及電路基板21為共用型之構造,針對不同型號的待測元件30僅須更換對應的轉接座22即可,且轉接座22的體積小、重量輕,讓操作人員能夠更簡便而省力地取置轉接座22,具有簡化燒機過程的功效。本發明燒機設備還能進一步令該櫃體中具有開口朝前的一所述容置空間110,該櫃體11的前側具有前側板13,該複數載板12於該容置空間110呈上下間隔排列,使該櫃體11更能充分利 用空間提供多組待測元件30執行燒機程序。再者,本明燒機設備還能進一步令該櫃體11中之各該載板12兩側分別結合抽屜滑軌14連接該櫃體11,使所述載板12能被操作而自該櫃體11之容置空間110移出及送入該容置空間110中,以便於待測元件30於櫃體11內之電路基板21上的轉接座22上之拆組作業。 To sum up, in the present invention, it is only necessary to set and replace the corresponding adapter base 22 for different types of DUTs 30, and the burn-in equipment of the present invention includes a burn-in test system and a circuit board arranged in the cabinet 10 21 is a shared structure. For different types of DUTs 30, only the corresponding adapter 22 needs to be replaced, and the adapter 22 is small in size and light in weight, allowing the operator to take and place it more easily and with less effort The adapter seat 22 has the effect of simplifying the burn-in process. The burn-in equipment of the present invention can further make the cabinet body have an accommodating space 110 with an opening facing forward, the front side of the cabinet body 11 has a front side plate 13, and the plurality of carrier boards 12 are up and down in the accommodating space 110 Arranged at intervals, the cabinet body 11 can be fully utilized Use the space to provide multiple sets of DUTs 30 to execute the burn-in program. Moreover, the Ming burning machine equipment can further make the two sides of each of the carrier boards 12 in the cabinet body 11 respectively combined with the drawer slide rails 14 to connect the cabinet body 11, so that the carrier board 12 can be operated and removed from the cabinet body. The accommodating space 110 of the body 11 is moved out and brought into the accommodating space 110 , so as to facilitate the disassembly operation of the component under test 30 on the adapter seat 22 on the circuit board 21 in the cabinet body 11 .

10:機櫃 10: cabinet

11:櫃體 11: Cabinet

110:容置空間 110:Accommodating space

12:載板 12: carrier board

13:前側板 13: Front side panel

14:抽屜滑軌 14: Drawer slides

20:連接裝置 20: Connection device

21:電路基板 21: Circuit substrate

22:轉接座 22: adapter seat

30:待測元件 30: Components under test

42:人機介面裝置 42: Human-machine interface device

Claims (7)

一種燒機設備,其包含:一機櫃,其包含一櫃體以及複數載板,該櫃體中具有一容置空間,該複數載板間隔設置於該櫃體的容置空間中;複數連接裝置,裝設於該機櫃中,各該連接裝置包含:一電路基板,具有複數負載區域,該複數負載區域的位置彼此分離,該電路基板於各該負載區域設有複數接點;及至少一轉接座,可拆組的設置在該電路基板並電連接該複數接點,其中,一個所述轉接座對應設置在該複數負載區域中的至少二負載區域,各該轉接座具有至少一待測元件連接器,且各該轉接座的待測元件連接器電連接所對應之該至少二負載區域的接點;該機櫃的各該載板設有該複數連接裝置中的至少一連接裝置;以及一燒機測試系統,裝設於該機櫃中並電連接該複數連接裝置。 A kind of burn-in equipment, which includes: a cabinet, which includes a cabinet body and a plurality of carrier boards, the cabinet body has an accommodating space, and the plurality of carrier boards are arranged at intervals in the accommodating space of the cabinet body; the plurality of connecting devices , installed in the cabinet, each of the connection devices includes: a circuit substrate with a plurality of load areas, the positions of the plurality of load areas are separated from each other, the circuit substrate is provided with a plurality of contacts in each of the load areas; and at least one turn The socket is detachably arranged on the circuit substrate and electrically connected to the plurality of contacts, wherein one of the adapters is corresponding to at least two load areas in the plurality of load areas, and each of the adapters has at least one a connector of the component under test, and the contacts of the at least two load areas corresponding to the electrical connection of the connector of the component under test of each adapter; device; and a burn-in test system installed in the cabinet and electrically connected to the plurality of connection devices. 如請求項1所述之燒機設備,其中,該櫃體的前側具有一前側板,該複數載板於該容置空間呈上下間隔排列。 The burn-in equipment as described in Claim 1, wherein the front side of the cabinet has a front side plate, and the plurality of carrier plates are arranged at intervals up and down in the accommodating space. 如請求項1或2所述之燒機設備,其中,各該載板兩側分別結合一抽屜滑軌連接該櫃體。 The burn-in equipment as described in claim 1 or 2, wherein, the two sides of each carrier board are respectively connected with a drawer slide rail to connect with the cabinet body. 如請求項1所述的燒機設備,其中,各該轉接座的該至少一待測元件連接器為複數待測元件連接器。 The burn-in device as claimed in claim 1, wherein the at least one DUT connector of each adapter base is a plurality of DUT connectors. 如請求項1所述的燒機設備,其中,各該轉接座的該至少一待測元件連接器為單一待測元件連接器。 The burn-in device as claimed in claim 1, wherein the at least one DUT connector of each adapter base is a single DUT connector. 如請求項1所述的燒機設備,其中,該至少一轉接座為複數轉接座。 The burn-in device according to claim 1, wherein the at least one adapter base is a plurality of adapter bases. 如請求項1所述的燒機設備,其中,該至少一轉接座為單一轉接座,其待測元件連接器電連接該電路基板之該複數負載區域的接點。 The burn-in device as claimed in claim 1, wherein the at least one adapter base is a single adapter base, and the DUT connector of the adapter is electrically connected to the contact points of the plurality of load areas of the circuit board.
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US11796589B1 (en) 2022-10-21 2023-10-24 AEM Holdings Ltd. Thermal head for independent control of zones
US11828796B1 (en) 2023-05-02 2023-11-28 AEM Holdings Ltd. Integrated heater and temperature measurement
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TW201433797A (en) * 2013-02-27 2014-09-01 Chroma Ate Inc Testing device for testing semiconductor circuit and converting module thereof
CN109655694A (en) * 2018-12-29 2019-04-19 深圳市时创意电子有限公司 A kind of more enablings turnover aging testing apparatus that can load power supply automatically

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TW568279U (en) * 2003-02-25 2003-12-21 Advanced Semiconductor Eng Burn-in board and aging test apparatus for integrated circuit
TW201433797A (en) * 2013-02-27 2014-09-01 Chroma Ate Inc Testing device for testing semiconductor circuit and converting module thereof
CN109655694A (en) * 2018-12-29 2019-04-19 深圳市时创意电子有限公司 A kind of more enablings turnover aging testing apparatus that can load power supply automatically

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Publication number Priority date Publication date Assignee Title
US11796589B1 (en) 2022-10-21 2023-10-24 AEM Holdings Ltd. Thermal head for independent control of zones
US11828795B1 (en) * 2022-10-21 2023-11-28 AEM Holdings Ltd. Test system with a thermal head comprising a plurality of adapters for independent thermal control of zones
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