TWI781943B - Method for producing coating composition and method for producing photoresist laminate - Google Patents
Method for producing coating composition and method for producing photoresist laminate Download PDFInfo
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- TWI781943B TWI781943B TW106122509A TW106122509A TWI781943B TW I781943 B TWI781943 B TW I781943B TW 106122509 A TW106122509 A TW 106122509A TW 106122509 A TW106122509 A TW 106122509A TW I781943 B TWI781943 B TW I781943B
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- aforementioned
- fluorine
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- 239000008199 coating composition Substances 0.000 title claims abstract description 41
- 238000004519 manufacturing process Methods 0.000 title claims description 67
- 229920002120 photoresistant polymer Polymers 0.000 title claims description 52
- 229920000642 polymer Polymers 0.000 claims abstract description 61
- 239000011248 coating agent Substances 0.000 claims abstract description 59
- 238000000576 coating method Methods 0.000 claims abstract description 59
- 229910052731 fluorine Inorganic materials 0.000 claims abstract description 53
- 239000000463 material Substances 0.000 claims abstract description 51
- 238000001914 filtration Methods 0.000 claims abstract description 39
- 125000001153 fluoro group Chemical group F* 0.000 claims abstract description 35
- 239000007788 liquid Substances 0.000 claims abstract description 31
- 239000002904 solvent Substances 0.000 claims abstract description 25
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 claims abstract description 24
- 239000011737 fluorine Substances 0.000 claims abstract description 24
- 239000000203 mixture Substances 0.000 claims abstract description 16
- 125000004430 oxygen atom Chemical group O* 0.000 claims abstract description 15
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 claims abstract description 13
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims abstract description 12
- IUHFWCGCSVTMPG-UHFFFAOYSA-N [C].[C] Chemical group [C].[C] IUHFWCGCSVTMPG-UHFFFAOYSA-N 0.000 claims abstract description 8
- 229910052801 chlorine Inorganic materials 0.000 claims abstract description 8
- 125000006551 perfluoro alkylene group Chemical group 0.000 claims abstract description 7
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims abstract description 5
- 125000002023 trifluoromethyl group Chemical group FC(F)(F)* 0.000 claims abstract description 4
- 229920002313 fluoropolymer Polymers 0.000 claims description 47
- 238000000034 method Methods 0.000 claims description 47
- 239000004811 fluoropolymer Substances 0.000 claims description 45
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 16
- -1 ammonium ions Chemical class 0.000 claims description 15
- 239000003960 organic solvent Substances 0.000 claims description 13
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 claims description 9
- BTANRVKWQNVYAZ-UHFFFAOYSA-N butan-2-ol Chemical compound CCC(C)O BTANRVKWQNVYAZ-UHFFFAOYSA-N 0.000 claims description 9
- 239000011148 porous material Substances 0.000 claims description 9
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 8
- 239000004743 Polypropylene Substances 0.000 claims description 8
- 150000001298 alcohols Chemical class 0.000 claims description 8
- 229920001155 polypropylene Polymers 0.000 claims description 8
- 238000004528 spin coating Methods 0.000 claims description 8
- 239000002033 PVDF binder Substances 0.000 claims description 7
- 229920002981 polyvinylidene fluoride Polymers 0.000 claims description 7
- 229910052799 carbon Inorganic materials 0.000 claims description 6
- 125000001309 chloro group Chemical group Cl* 0.000 claims description 6
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 5
- 239000004952 Polyamide Substances 0.000 claims description 5
- 125000004432 carbon atom Chemical group C* 0.000 claims description 5
- 229920002647 polyamide Polymers 0.000 claims description 5
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 claims description 4
- 239000003365 glass fiber Substances 0.000 claims description 3
- 239000003795 chemical substances by application Substances 0.000 claims 1
- 239000000654 additive Substances 0.000 abstract description 10
- 239000000126 substance Substances 0.000 abstract description 9
- 239000002562 thickening agent Substances 0.000 abstract description 7
- 239000000470 constituent Substances 0.000 abstract description 6
- QGZKDVFQNNGYKY-UHFFFAOYSA-O Ammonium Chemical compound [NH4+] QGZKDVFQNNGYKY-UHFFFAOYSA-O 0.000 abstract description 3
- 229910052739 hydrogen Inorganic materials 0.000 abstract 2
- 239000000243 solution Substances 0.000 description 62
- 150000001875 compounds Chemical class 0.000 description 27
- 239000002243 precursor Substances 0.000 description 15
- 230000000694 effects Effects 0.000 description 11
- 239000000047 product Substances 0.000 description 9
- 239000004094 surface-active agent Substances 0.000 description 9
- 239000000706 filtrate Substances 0.000 description 8
- 239000000178 monomer Substances 0.000 description 8
- 125000000217 alkyl group Chemical group 0.000 description 6
- 230000015572 biosynthetic process Effects 0.000 description 6
- 102100023698 C-C motif chemokine 17 Human genes 0.000 description 5
- 101000978362 Homo sapiens C-C motif chemokine 17 Proteins 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 239000012046 mixed solvent Substances 0.000 description 5
- 230000000379 polymerizing effect Effects 0.000 description 5
- 238000001035 drying Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 229920002125 Sokalan® Polymers 0.000 description 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 3
- 239000007864 aqueous solution Substances 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 125000000524 functional group Chemical group 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 239000004584 polyacrylic acid Substances 0.000 description 3
- 238000003756 stirring Methods 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- NBUKAOOFKZFCGD-UHFFFAOYSA-N 2,2,3,3-tetrafluoropropan-1-ol Chemical compound OCC(F)(F)C(F)F NBUKAOOFKZFCGD-UHFFFAOYSA-N 0.000 description 2
- HZAXFHJVJLSVMW-UHFFFAOYSA-N 2-Aminoethan-1-ol Chemical compound NCCO HZAXFHJVJLSVMW-UHFFFAOYSA-N 0.000 description 2
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- QUSNBJAOOMFDIB-UHFFFAOYSA-N Ethylamine Chemical compound CCN QUSNBJAOOMFDIB-UHFFFAOYSA-N 0.000 description 2
- XLYOFNOQVPJJNP-ZSJDYOACSA-N Heavy water Chemical compound [2H]O[2H] XLYOFNOQVPJJNP-ZSJDYOACSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 150000007513 acids Chemical class 0.000 description 2
- 239000003513 alkali Substances 0.000 description 2
- 125000002947 alkylene group Chemical group 0.000 description 2
- 150000001412 amines Chemical class 0.000 description 2
- 230000003667 anti-reflective effect Effects 0.000 description 2
- 239000002775 capsule Substances 0.000 description 2
- 150000001721 carbon Chemical group 0.000 description 2
- CREMABGTGYGIQB-UHFFFAOYSA-N carbon carbon Chemical group C.C CREMABGTGYGIQB-UHFFFAOYSA-N 0.000 description 2
- 239000011203 carbon fibre reinforced carbon Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000005227 gel permeation chromatography Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 2
- 239000011368 organic material Substances 0.000 description 2
- 238000006116 polymerization reaction Methods 0.000 description 2
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 2
- 239000004810 polytetrafluoroethylene Substances 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- WGYKZJWCGVVSQN-UHFFFAOYSA-N propylamine Chemical compound CCCN WGYKZJWCGVVSQN-UHFFFAOYSA-N 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 238000001291 vacuum drying Methods 0.000 description 2
- BYEAHWXPCBROCE-UHFFFAOYSA-N 1,1,1,3,3,3-hexafluoropropan-2-ol Chemical compound FC(F)(F)C(O)C(F)(F)F BYEAHWXPCBROCE-UHFFFAOYSA-N 0.000 description 1
- CWIFAKBLLXGZIC-UHFFFAOYSA-N 1,1,2,2-tetrafluoro-1-(2,2,2-trifluoroethoxy)ethane Chemical group FC(F)C(F)(F)OCC(F)(F)F CWIFAKBLLXGZIC-UHFFFAOYSA-N 0.000 description 1
- RRZIJNVZMJUGTK-UHFFFAOYSA-N 1,1,2-trifluoro-2-(1,2,2-trifluoroethenoxy)ethene Chemical class FC(F)=C(F)OC(F)=C(F)F RRZIJNVZMJUGTK-UHFFFAOYSA-N 0.000 description 1
- WOAHJDHKFWSLKE-UHFFFAOYSA-N 1,2-benzoquinone Chemical compound O=C1C=CC=CC1=O WOAHJDHKFWSLKE-UHFFFAOYSA-N 0.000 description 1
- LXOFYPKXCSULTL-UHFFFAOYSA-N 2,4,7,9-tetramethyldec-5-yne-4,7-diol Chemical compound CC(C)CC(C)(O)C#CC(C)(O)CC(C)C LXOFYPKXCSULTL-UHFFFAOYSA-N 0.000 description 1
- JCMNMOBHVPONLD-UHFFFAOYSA-N 3,3,4,4,5,5,6,6,6-nonafluorohexan-1-ol Chemical compound OCCC(F)(F)C(F)(F)C(F)(F)C(F)(F)F JCMNMOBHVPONLD-UHFFFAOYSA-N 0.000 description 1
- GRJRKPMIRMSBNK-UHFFFAOYSA-N 3,3,4,4,5,5,6,6,7,7,8,8,8-tridecafluorooctan-1-ol Chemical compound OCCC(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F GRJRKPMIRMSBNK-UHFFFAOYSA-N 0.000 description 1
- NECRQCBKTGZNMH-UHFFFAOYSA-N 3,5-dimethylhex-1-yn-3-ol Chemical compound CC(C)CC(C)(O)C#C NECRQCBKTGZNMH-UHFFFAOYSA-N 0.000 description 1
- XWCDCDSDNJVCLO-UHFFFAOYSA-N Chlorofluoromethane Chemical compound FCCl XWCDCDSDNJVCLO-UHFFFAOYSA-N 0.000 description 1
- 229920001410 Microfiber Polymers 0.000 description 1
- 239000004677 Nylon Substances 0.000 description 1
- 229920003171 Poly (ethylene oxide) Polymers 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 239000006096 absorbing agent Substances 0.000 description 1
- HSFWRNGVRCDJHI-UHFFFAOYSA-N alpha-acetylene Natural products C#C HSFWRNGVRCDJHI-UHFFFAOYSA-N 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- 239000005388 borosilicate glass Substances 0.000 description 1
- 230000003197 catalytic effect Effects 0.000 description 1
- AFYPFACVUDMOHA-UHFFFAOYSA-N chlorotrifluoromethane Chemical compound FC(F)(F)Cl AFYPFACVUDMOHA-UHFFFAOYSA-N 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 125000005265 dialkylamine group Chemical group 0.000 description 1
- 235000014113 dietary fatty acids Nutrition 0.000 description 1
- ZBCBWPMODOFKDW-UHFFFAOYSA-N diethanolamine Chemical compound OCCNCCO ZBCBWPMODOFKDW-UHFFFAOYSA-N 0.000 description 1
- HPNMFZURTQLUMO-UHFFFAOYSA-N diethylamine Chemical compound CCNCC HPNMFZURTQLUMO-UHFFFAOYSA-N 0.000 description 1
- RTZKZFJDLAIYFH-UHFFFAOYSA-N ether Substances CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 1
- LYCAIKOWRPUZTN-UHFFFAOYSA-N ethylene glycol Natural products OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 229930195729 fatty acid Natural products 0.000 description 1
- 239000000194 fatty acid Substances 0.000 description 1
- XUCNUKMRBVNAPB-UHFFFAOYSA-N fluoroethene Chemical class FC=C XUCNUKMRBVNAPB-UHFFFAOYSA-N 0.000 description 1
- 230000007062 hydrolysis Effects 0.000 description 1
- 238000006460 hydrolysis reaction Methods 0.000 description 1
- 230000003301 hydrolyzing effect Effects 0.000 description 1
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 125000004492 methyl ester group Chemical group 0.000 description 1
- 239000003658 microfiber Substances 0.000 description 1
- 125000006502 nitrobenzyl group Chemical group 0.000 description 1
- IJGRMHOSHXDMSA-UHFFFAOYSA-N nitrogen Substances N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 229920001778 nylon Polymers 0.000 description 1
- 150000007524 organic acids Chemical class 0.000 description 1
- 235000005985 organic acids Nutrition 0.000 description 1
- 150000004714 phosphonium salts Chemical class 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- BWJUFXUULUEGMA-UHFFFAOYSA-N propan-2-yl propan-2-yloxycarbonyloxy carbonate Chemical compound CC(C)OC(=O)OOC(=O)OC(C)C BWJUFXUULUEGMA-UHFFFAOYSA-N 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 125000001273 sulfonato group Chemical class [O-]S(*)(=O)=O 0.000 description 1
- 230000008719 thickening Effects 0.000 description 1
- 125000005270 trialkylamine group Chemical group 0.000 description 1
- 230000002087 whitening effect Effects 0.000 description 1
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/11—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having cover layers or intermediate layers, e.g. subbing layers
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D127/00—Coating compositions based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a halogen; Coating compositions based on derivatives of such polymers
- C09D127/02—Coating compositions based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a halogen; Coating compositions based on derivatives of such polymers not modified by chemical after-treatment
- C09D127/12—Coating compositions based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a halogen; Coating compositions based on derivatives of such polymers not modified by chemical after-treatment containing fluorine atoms
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D71/00—Semi-permeable membranes for separation processes or apparatus characterised by the material; Manufacturing processes specially adapted therefor
- B01D71/02—Inorganic material
- B01D71/04—Glass
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D71/00—Semi-permeable membranes for separation processes or apparatus characterised by the material; Manufacturing processes specially adapted therefor
- B01D71/06—Organic material
- B01D71/26—Polyalkenes
- B01D71/262—Polypropylene
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D71/00—Semi-permeable membranes for separation processes or apparatus characterised by the material; Manufacturing processes specially adapted therefor
- B01D71/06—Organic material
- B01D71/30—Polyalkenyl halides
- B01D71/32—Polyalkenyl halides containing fluorine atoms
- B01D71/34—Polyvinylidene fluoride
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D71/00—Semi-permeable membranes for separation processes or apparatus characterised by the material; Manufacturing processes specially adapted therefor
- B01D71/06—Organic material
- B01D71/56—Polyamides, e.g. polyester-amides
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D7/00—Processes, other than flocking, specially adapted for applying liquids or other fluent materials to particular surfaces or for applying particular liquids or other fluent materials
- B05D7/24—Processes, other than flocking, specially adapted for applying liquids or other fluent materials to particular surfaces or for applying particular liquids or other fluent materials for applying particular liquids or other fluent materials
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L33/00—Compositions of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides or nitriles thereof; Compositions of derivatives of such polymers
- C08L33/04—Homopolymers or copolymers of esters
- C08L33/14—Homopolymers or copolymers of esters of esters containing halogen, nitrogen, sulfur, or oxygen atoms in addition to the carboxy oxygen
- C08L33/16—Homopolymers or copolymers of esters containing halogen atoms
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D129/00—Coating compositions based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an alcohol, ether, aldehydo, ketonic, acetal, or ketal radical; Coating compositions based on hydrolysed polymers of esters of unsaturated alcohols with saturated carboxylic acids; Coating compositions based on derivatives of such polymers
- C09D129/10—Homopolymers or copolymers of unsaturated ethers
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D133/00—Coating compositions based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Coating compositions based on derivatives of such polymers
- C09D133/02—Homopolymers or copolymers of acids; Metal or ammonium salts thereof
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D201/00—Coating compositions based on unspecified macromolecular compounds
- C09D201/02—Coating compositions based on unspecified macromolecular compounds characterised by the presence of specified groups, e.g. terminal or pendant functional groups
- C09D201/04—Coating compositions based on unspecified macromolecular compounds characterised by the presence of specified groups, e.g. terminal or pendant functional groups containing halogen atoms
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D5/00—Coating compositions, e.g. paints, varnishes or lacquers, characterised by their physical nature or the effects produced; Filling pastes
- C09D5/004—Reflecting paints; Signal paints
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D7/00—Features of coating compositions, not provided for in group C09D5/00; Processes for incorporating ingredients in coating compositions
- C09D7/20—Diluents or solvents
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/091—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
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Abstract
本發明提供一種塗覆用組成物,其可於不提高塗覆液中膜構成物質濃度且未使用增稠劑等添加劑下使膜厚增厚。 本發明係將含有含氟聚合物及溶劑之被處理溶液以氟原子含量為70質量%以下之濾材過濾而獲得塗覆用組成物,前述含氟聚合物具有-[CX1 X2 -CY1 (Rf1 -COOM1 )]-所示單元。X1 及X2 係H、F或Cl;Y1 係H、F、Cl、甲基或三氟甲基;Rf1 係可於碳-碳原子間含有醚性氧原子之全氟伸烷基,或是可於碳-碳原子間含有醚性氧原子之氧基全氟伸烷基;-COOM1 係-COOH或COOZ1 (Z1 為氫原子可被取代之銨離子)。The present invention provides a composition for coating that can increase the film thickness without increasing the concentration of film constituent substances in a coating liquid and without using additives such as thickeners. In the present invention, a coating composition is obtained by filtering a solution to be treated containing a fluorine-containing polymer and a solvent through a filter material with a fluorine atom content of 70% by mass or less. The above-mentioned fluorine-containing polymer has -[CX 1 X 2 -CY 1 (Rf 1 -COOM 1 )] - unit indicated. X 1 and X 2 are H, F or Cl; Y 1 is H, F, Cl, methyl or trifluoromethyl; Rf 1 is a perfluoroalkylene group that may contain an etheric oxygen atom between carbon-carbon atoms , or an oxyperfluoroalkylene group that may contain an etheric oxygen atom between carbon-carbon atoms; -COOM 1 is -COOH or COOZ 1 (Z 1 is an ammonium ion that can be replaced by a hydrogen atom).
Description
本發明係關於一種塗覆用組成物之製造方法,特別是關於一種可有用於在光阻層上形成抗反射膜的塗覆用組成物之製造方法。亦關於一種製造表面具有抗反射膜之光阻積層體之方法。The present invention relates to a method for producing a coating composition, in particular to a method for producing a coating composition useful for forming an antireflection film on a photoresist layer. It also relates to a method for manufacturing a photoresist laminate with an antireflection film on its surface.
於半導體等之製程中會使用光學微影術,例如於半導體電路之製程中包含有一形成光阻圖案(resist pattern)的步驟。 若對已形成在基板上之光阻層照射曝光的光,則除了入射至光阻層的光以外,還會產生來自基板表面的反射光及該反射光進一步在光阻層表面反射的光等,該等反射光會形成干涉而產生駐波。這種駐波會成為光阻圖案尺寸變動或形狀崩壞等的原因。 又亦會有在存在高低差的面上形成微細光阻圖案的情形。在這種情況下,尤其會讓駐波造成之尺寸變動或形狀崩壞加劇(駐波效應)。Optical lithography is used in the manufacturing process of semiconductors, for example, a step of forming a resist pattern is included in the manufacturing process of semiconductor circuits. When the photoresist layer formed on the substrate is irradiated with exposure light, in addition to the light incident on the photoresist layer, reflected light from the surface of the substrate and light reflected on the surface of the photoresist layer by the reflected light are also generated. , the reflected light will form interference and produce standing waves. Such standing waves cause dimensional fluctuations, shape collapse, and the like of photoresist patterns. In addition, there may be a case where a fine photoresist pattern is formed on a surface with a difference in height. In this case, especially the dimensional change or shape collapse caused by the standing wave is exacerbated (standing wave effect).
迄今,作為抑制駐波效應之方法,已提案有在光阻材料中加入吸光劑之方法、於光阻層上表面設置抗反射膜之方法(TARC法)、於光阻層下表面設置抗反射膜之方法(BARC法)等。 TARC法或BARC法是緊鄰光阻層設置折射率低於該光阻層之抗反射膜層的方法,且抗反射膜之折射率愈低愈可獲得高抗反射效果。So far, as a method of suppressing the standing wave effect, a method of adding a light absorbing agent to the photoresist material, a method of disposing an anti-reflection film on the upper surface of the photoresist layer (TARC method), and disposing an antireflection film on the lower surface of the photoresist layer have been proposed. Membrane method (BARC method), etc. The TARC method or BARC method is a method in which an anti-reflection film layer with a lower refractive index than the photoresist layer is placed adjacent to the photoresist layer, and the lower the refractive index of the anti-reflection film, the higher the anti-reflection effect can be obtained.
專利文獻1中記載有一種組成物可作為使用於TARC法之塗覆用組成物,該組成物係使CF2 =CFOCF2 CF2 CF2 COOCH3 聚合而製得具有直鏈狀氧基全氟伸烷基作為側鏈之前驅聚合物之後,將該前驅聚合物之側鏈末端之甲酯基轉換成-COOH獲得聚合物,並使該聚合物溶解於水與甲醇之混合溶劑而成。Patent Document 1 describes a composition that can be used as a coating composition used in the TARC method. The composition is made by polymerizing CF 2 ═CFOCF 2 CF 2 CF 2 COOCH 3 to obtain a linear oxy-perfluoro After the alkylene group is used as the side chain precursor polymer, the methyl ester group at the end of the side chain of the precursor polymer is converted into -COOH to obtain a polymer, and the polymer is dissolved in a mixed solvent of water and methanol.
已知一般而言在TARC法,為了獲得優異之抗反射效果,抗反射膜之理想折射率為光阻層之折射率n的平方根(√n),且理想的膜厚為λ/4m(λ為放射線之波長,m為抗反射膜之折射率)的奇數倍(例如專利文獻2之段落[0004])。 先前技術文獻 專利文獻It is known that generally in the TARC method, in order to obtain an excellent anti-reflection effect, the ideal refractive index of the anti-reflective film is the square root (√n) of the refractive index n of the photoresist layer, and the ideal film thickness is λ/4m(λ is the wavelength of the radiation, and m is an odd multiple of the refractive index of the antireflection film (for example, paragraph [0004] of Patent Document 2). Prior Art Documents Patent Documents
專利文獻1:日本專利第3965740號公報 專利文獻2:日本專利第4910829號公報Patent Document 1: Japanese Patent No. 3965740 Patent Document 2: Japanese Patent No. 4910829
發明概要 發明欲解決之課題 近年來,隨著LSI的高積體化與高速化不停地追求半導體電路之微細化。為了對應此種需求,形成光阻圖案時所使用之曝光光源的短波長化正持續不斷進行。 例如在64M位元DRAM(動態隨機存取記憶體)之量產製程中,是使用KrF準分子雷射(248nm)作為曝光光源,而在256M位元或1G位元以上之DRAM的製造上,則是使用更短波長之ArF準分子雷射(193nm)或F2 雷射(157nm)。SUMMARY OF THE INVENTION PROBLEMS TO BE SOLVED BY THE INVENTION In recent years, miniaturization of semiconductor circuits has been continuously pursued along with the high integration and high speed of LSIs. In order to meet such demands, the wavelength reduction of the exposure light source used for forming a resist pattern continues. For example, in the mass production process of 64M-bit DRAM (Dynamic Random Access Memory), KrF excimer laser (248nm) is used as the exposure light source, while in the manufacture of 256M-bit or more than 1G-bit DRAM, ArF excimer laser (193nm) or F2 laser (157nm ) with shorter wavelength is used.
若半導體電路如所述更微細化的話,就算是在以往之較粗線寬上幾可忽視之微小缺陷亦會受到重大的影響。因此,TARC要求要有連這等微小缺陷都能抑制之高抗反射效果,且更微細地調整抗反射膜之膜厚的技術變得越發重要。 作為調整抗反射膜之膜厚的方法,舉例來說為了將膜厚變薄,降低塗覆液中之膜構成物質濃度的方法是有效而且簡便的。另一方面,要使膜厚增厚,雖然提高膜構成物質濃度的方法最為簡便,卻會使塗覆液黏度變高而增加對裝置的負擔,其結果將導致製程數增加且成本大幅上升。於是雖然可考慮添加增稠劑來提高黏度的方法,但添加增稠劑的話卻有抗反射膜之折射率變高的問題。 本發明之課題在於提供一種塗覆用組成物之製造方法及使用了該組成物之光阻積層體之製造方法,可於不提高膜構成物質濃度且不使用增稠劑等添加劑下使膜厚增厚。 用以解決課題之手段If semiconductor circuits are miniaturized as mentioned above, even tiny defects that are almost negligible on the conventionally thicker line widths will be greatly affected. Therefore, TARC requires a high anti-reflection effect that can suppress even such small defects, and the technology of finer adjustment of the film thickness of the anti-reflection film becomes more and more important. As a method of adjusting the film thickness of the antireflection film, for example, a method of reducing the concentration of the film constituent substance in the coating liquid in order to reduce the film thickness is effective and simple. On the other hand, to increase the film thickness, increasing the concentration of film constituent substances is the easiest method, but it will increase the viscosity of the coating liquid and increase the burden on the device. As a result, the number of processes will increase and the cost will increase significantly. Therefore, although a method of increasing the viscosity by adding a thickener can be considered, there is a problem that the refractive index of the antireflection film increases when the thickener is added. The subject of the present invention is to provide a method for producing a coating composition and a method for producing a photoresist laminate using the composition, which can reduce the film thickness without increasing the concentration of film constituent substances and without using additives such as thickeners. thickened. means to solve problems
本發明提供具有以下[1]~[12]之構成的塗覆用組成物之製造方法及使用方法以及光阻積層體之製造方法。 [1]一種塗覆用組成物之製造方法,其特徵在於:將含有含氟聚合物及溶劑之被處理溶液以氟原子含量為70質量%以下之濾材過濾而獲得塗覆用組成物,前述含氟聚合物具有下式(1)所示單元: -[CX1 X2 -CY1 (Rf1 -COOM1 )]- ・・・(1) (式中,X1 及X2 各自獨立表示氫原子、氟原子或氯原子;Y1 表示氫原子、氟原子、氯原子、甲基或三氟甲基;Rf1 表示可於碳-碳原子間含有醚性氧原子之直鏈狀或分枝狀全氟伸烷基,或是可於碳-碳原子間含有醚性氧原子之直線狀或分枝狀氧基全氟伸烷基,且Rf1 之碳數在不具前述醚性氧原子時為1~10,在具有前述醚性氧原子時則為2~10;-COOM1 表示-COOH或COOZ1 (Z1 為可被取代之銨離子))。The present invention provides a method for producing and using a coating composition having the following constitutions [1] to [12], and a method for producing a photoresist laminate. [1] A method for producing a coating composition, characterized in that the coating composition is obtained by filtering a solution to be treated containing a fluorine-containing polymer and a solvent through a filter medium having a fluorine atom content of 70% by mass or less. Fluoropolymers have units represented by the following formula (1): -[CX 1 X 2 -CY 1 (Rf 1 -COOM 1 )]- ・・・(1) (wherein, X 1 and X 2 independently represent hydrogen atom, fluorine atom or chlorine atom; Y 1 represents a hydrogen atom, fluorine atom, chlorine atom, methyl or trifluoromethyl; Rf 1 represents a linear or branched chain that may contain an etheric oxygen atom between carbon-carbon atoms Dendritic perfluoroalkylene groups, or linear or branched oxyperfluoroalkylene groups that may contain etheric oxygen atoms between carbon-carbon atoms, and the number of carbon atoms in Rf 1 does not have the aforementioned etheric oxygen atoms When it is 1~10, it is 2~10 when it has the aforementioned etheric oxygen atom; -COOM 1 means -COOH or COOZ 1 (Z 1 is an ammonium ion that can be substituted)).
[2]如[1]之製造方法,其中X1 、X2 及Y1 皆為氟原子。 [3]如[1]或[2]之製造方法,其中相對於構成含氟聚合物之總單元,前述式(1)所示單元之含量為50~100莫耳%。 [4]如[1]至[3]中任一項之製造方法,其中前述含氟聚合物之數量平均分子量為1,000~30,000。 [5]如[1]至[4]中任一項之製造方法,其中前述被處理溶液中之前述含氟聚合物含量為1~25質量%。 [6]如[1]至[5]中任一項之製造方法,其中前述溶劑為水、親水性有機溶劑或水與親水性有機溶劑之混合溶劑。 [7]如[1]至[6]中任一項之製造方法,其中前述濾材為聚二氟亞乙烯、聚醯胺、聚丙烯或玻璃纖維。 [8]如[1]至[7]中任一項之製造方法,其中前述濾材之孔徑為0.2~5.0μm。[2] The production method according to [1], wherein X 1 , X 2 and Y 1 are all fluorine atoms. [3] The production method according to [1] or [2], wherein the content of the units represented by the aforementioned formula (1) is 50 to 100 mol% with respect to the total units constituting the fluoropolymer. [4] The production method according to any one of [1] to [3], wherein the number average molecular weight of the fluoropolymer is 1,000 to 30,000. [5] The production method according to any one of [1] to [4], wherein the content of the fluoropolymer in the solution to be treated is 1 to 25% by mass. [6] The production method according to any one of [1] to [5], wherein the solvent is water, a hydrophilic organic solvent, or a mixed solvent of water and a hydrophilic organic solvent. [7] The production method according to any one of [1] to [6], wherein the filter material is polyvinylidene fluoride, polyamide, polypropylene or glass fiber. [8] The production method according to any one of [1] to [7], wherein the filter material has a pore diameter of 0.2 to 5.0 μm.
[9]一種塗覆用組成物之使用方法,係使用如前述[1]至[8]中任一項之製造方法所製得之塗覆用組成物來形成設在光阻層表面上之抗反射膜。 [10]一種光阻積層體之製造方法,其特徵在於:從以如前述[1]至[8]中任一項之製造方法製得之塗覆用組成物製得含該組成物之塗覆液,繼而將前述塗覆液塗佈於光阻層表面上,以製造一於光阻層表面上設有抗反射膜之光阻積層體。 [11]如[10]之製造方法,其中前述塗覆液中含前述含氟聚合物之聚合物的含量為1~10質量%,且前述聚合物含量中之前述含氟聚合物含量為50~100質量%。 [12]如[10]或[11]之製造方法,其係以旋塗法塗佈前述塗覆液。 發明效果[9] A method of using the coating composition, which is to use the coating composition prepared by the production method of any one of the above-mentioned [1] to [8] to form a coating on the surface of the photoresist layer. anti-reflective film. [10] A method for producing a photoresist laminate, characterized in that: a coating containing the composition is obtained from the coating composition prepared by the production method according to any one of the aforementioned [1] to [8]. coating solution, and then coating the aforementioned coating solution on the surface of the photoresist layer to manufacture a photoresist laminate with an anti-reflection film on the surface of the photoresist layer. [11] The production method according to [10], wherein the content of the polymer containing the fluoropolymer in the coating solution is 1 to 10% by mass, and the content of the fluoropolymer in the polymer content is 50% ~100% by mass. [12] The production method according to [10] or [11], wherein the coating liquid is applied by a spin coating method. Invention effect
依據本發明之塗覆用組成物之製造方法,可製得一種於不提高膜構成物質的濃度且不使用增稠劑等添加劑下就可使膜厚增厚之塗覆用組成物。 依據本發明之光阻積層體之製造方法,可於不提高塗覆液中之膜構成物質濃度且不使用增稠劑等添加劑下,增厚形成於光阻層表面上之抗反射膜的膜厚。According to the production method of the coating composition of the present invention, a coating composition that can increase the film thickness without increasing the concentration of film constituent substances and without using additives such as thickeners can be produced. According to the manufacturing method of the photoresist laminated body of the present invention, the antireflection film formed on the surface of the photoresist layer can be thickened without increasing the concentration of the film constituent substances in the coating solution and without using additives such as thickeners. thick.
用以實施發明之形態 [塗覆用組成物之製造方法] 於本發明之塗覆用組成物之製造方法,係將含有具有上式(1)所示單元(以下亦記作「單元(1)」)之含氟聚合物(以下亦記作「含氟聚合物(A)」)及溶劑的被處理溶液進行過濾,並將所得之濾液用於塗覆用組成物。 塗覆用組成物於無損本發明效果之範圍內可含有含氟聚合物(A)以外的聚合物(以下亦記作「其他聚合物」)。有時會將含氟聚合物與其他聚合物一併僅稱作「聚合物」。使塗覆用組成物中含有其他聚合物時,可於過濾前作添加亦可於過濾後作添加。從使組成之穩定性提升之觀點來看,則宜於過濾前作添加。 塗覆用組成物可按照需要含有前述聚合物以外之成分(以下亦記作「其他成分」)。使塗覆用組成物中含有其他成分時,可於過濾前作添加亦可於過濾後作添加。從使組成之穩定性提升之觀點來看,則宜於過濾前作添加。Modes for Carrying Out the Invention [Method for Producing Coating Composition] In the method for producing the coating composition of the present invention, a unit having the above formula (1) (hereinafter also referred to as "unit (1) )")) (hereinafter also referred to as "fluoropolymer (A)") and a solvent to be treated are filtered, and the obtained filtrate is used for a coating composition. The coating composition may contain polymers other than the fluorinated polymer (A) (hereinafter also referred to as "other polymers") within the range that does not impair the effect of the present invention. Fluoropolymers are sometimes collectively referred to as "polymers" together with other polymers. When other polymers are contained in the coating composition, they may be added before or after filtration. From the viewpoint of improving the stability of the composition, it is preferable to add it before filtration. The coating composition may contain components other than the aforementioned polymers (hereinafter also referred to as "other components") as needed. When other components are contained in the coating composition, they may be added before filtration or after filtration. From the viewpoint of improving the stability of the composition, it is preferable to add it before filtration.
於單元(1)中,X1 及X2 各自獨立表示氫原子、氟原子或氯原子。從原料之易取得性之觀點來看,以氫原子或氟原子為佳。從含氟聚合物(A)中之氟原子含量夠高且使用含氟聚合物(A)製得之抗反射膜之短波長帶折射率容易變低之觀點來看,X1 及X2 以氟原子為佳。 Y1 表示氫原子、氟原子、氯原子、甲基或三氟甲基。從原料之易取得性之觀點來看以氟原子為佳。In unit ( 1 ), X1 and X2 each independently represent a hydrogen atom, a fluorine atom or a chlorine atom. From the viewpoint of easy availability of raw materials, hydrogen atoms or fluorine atoms are preferred. From the point of view that the content of fluorine atoms in the fluoropolymer (A) is high enough and the short - wavelength band refractive index of the antireflection film made by using the fluoropolymer ( A ) is likely to be low, X1 and X2 are in the range of Fluorine atoms are preferred. Y 1 represents a hydrogen atom, a fluorine atom, a chlorine atom, a methyl group or a trifluoromethyl group. From the viewpoint of easy availability of raw materials, fluorine atoms are preferable.
Rf1 係直鏈狀或分枝狀全氟伸烷基,或是直鏈狀或分枝狀氧基全氟伸烷基。該全氟伸烷基或氧基全氟伸烷基可於碳-碳原子間含有醚性氧原子。 全氟伸烷基係指鍵結於伸烷基之碳原子上的氫原子全為氟原子所取代之基。 氧基全氟伸烷基係指全氟伸烷基隔著醚鍵(-O-)鍵結於式(1)中Y1 所鍵結之碳原子上。 所謂「碳-碳原子間含有醚性氧原子」係指在構成全氟伸烷基或氧基全氟伸烷基之碳鏈中間(碳-碳原子間)插入有醚鍵結性氧原子。 Rf1 於碳-碳原子間不具醚性氧原子時Rf1 之碳數為1~10,宜為1~6,3~6尤佳。Rf1 之碳數在Rf1 於碳-碳原子間具有醚性氧原子時,Rf1 之碳數則為2~10,宜為2~6,3~6尤佳。該碳數若為前述範圍之下限值以上,則含氟聚合物(A)中之氟原子含量會變得夠高,而使用含氟聚合物(A)製得之抗反射膜之短波長帶中的折射率會變低。該碳數為前述範圍之上限值以下的話,則含氟聚合物(A)對水之溶解性優異。Rf 1 is a linear or branched perfluoroalkylene group, or a linear or branched oxyperfluoroalkylene group. The perfluoroalkylene group or oxyperfluoroalkylene group may contain an etheric oxygen atom between carbon-carbon atoms. Perfluoroalkylene refers to a group in which all the hydrogen atoms bonded to the carbon atoms of the alkylene group are replaced by fluorine atoms. The oxyperfluoroalkylene group refers to that the perfluoroalkylene group is bonded to the carbon atom to which Y1 in formula ( 1 ) is bonded via an ether bond (-O-). "Containing an etheric oxygen atom between carbon-carbon atoms" means that an ether-bonding oxygen atom is inserted in the middle of the carbon chain (between carbon-carbon atoms) constituting the perfluoroalkylene group or oxyperfluoroalkylene group. When Rf 1 does not have an etheric oxygen atom between carbon-carbon atoms, the carbon number of Rf 1 is 1-10, preferably 1-6, especially preferably 3-6. The carbon number of Rf 1 is 2~10, preferably 2~6, especially 3~6, when Rf 1 has an etheric oxygen atom between carbon-carbon atoms. If the carbon number is above the lower limit of the aforementioned range, the content of fluorine atoms in the fluoropolymer (A) will become sufficiently high, and the short-wavelength antireflection film made of the fluoropolymer (A) will The refractive index in the ribbon will become lower. When this carbon number is below the upper limit of the said range, the solubility with respect to water of a fluoropolymer (A) is excellent.
於單元(1)中,-COOM1 為-COOH或COOZ1 (Z1 為可被氫原子取代之銨離子)。 Z1 可舉NH4 + 、或NH4 + 之1個以上氫原子以烷基或具羥基之烷基取代者。烷基以碳數1~6之烷基為佳。Z1 以-NR1 R2 R3 R4+ (R1 ~R4 各自獨立為氫原子或碳數1~3之烷基)為佳,尤其就可使用於多種用途之觀點及低成本之觀點來說以NH4 + 尤佳。In unit (1), -COOM 1 is -COOH or COOZ 1 (Z 1 is an ammonium ion which may be substituted by a hydrogen atom). Z 1 is NH 4 + , or one or more hydrogen atoms of NH 4 + are substituted with an alkyl group or an alkyl group having a hydroxyl group. The alkyl group is preferably an alkyl group with 1 to 6 carbon atoms. Z 1 is preferably -NR 1 R 2 R 3 R 4+ (R 1 to R 4 are each independently a hydrogen atom or an alkyl group with 1 to 3 carbons), especially from the viewpoint of being applicable to various purposes and low cost Viewpoint is best with NH 4+ .
作為單元(1)之理想的例子,可列舉下述單元(a1)~(a6)。As a desirable example of the unit (1), the following units (a1)-(a6) are mentioned.
[化1] [chemical 1]
含氟聚合物(A)亦可含有不具-COOM1 之單元(以下亦記作「單元(2)」)。 單元(2)可舉以CF2 =CF2 、CH2 =CF2 、CF2 =CFCl等氟乙烯類、全氟乙烯基醚類、碳數3以上之全氟烯烴類等聚合性全氟化合物類為主體之單元等。The fluorine-containing polymer (A) may also contain a unit not containing -COOM 1 (hereinafter also referred to as "unit (2)"). Unit (2) can be polymerizable perfluorinated compounds such as fluoroethylenes such as CF 2 =CF 2 , CH 2 =CF 2 , CF 2 =CFCl, perfluorovinyl ethers, perfluoroolefins with 3 or more carbon atoms A class is a unit of a subject, etc.
相對於構成含氟聚合物(A)之總單元,含氟聚合物(A)中之單元(1)含量宜為50莫耳%以上,較佳為70莫耳%以上,100莫耳%尤佳。單元(1)之含量在前述範圍之下限值以上的話,則含氟聚合物(A)對鹼水溶液之溶解性優異。Relative to the total units constituting the fluoropolymer (A), the content of the unit (1) in the fluoropolymer (A) is preferably at least 50 mol%, preferably at least 70 mol%, especially 100 mol%. good. When the content of the unit (1) is more than the lower limit of the aforementioned range, the solubility of the fluoropolymer (A) to an aqueous alkali solution is excellent.
含氟聚合物(A)之數量平均分子量宜為1,000~30,000,較佳為1,500~5,000,2,500~3,500尤佳。 數量平均分子量為前述下限值以上的話,則含氟聚合物(A)之造膜性優異,且在平坦部之膜厚均勻性優異。若為前述上限值以下的話,則含氟聚合物(A)於塗佈時對高低差之順應性優異,從而於光阻層表面具有凹凸時,要覆蓋整個凸部及凹部表面所需之塗佈量少量即可。又對鹼水溶液之溶解性優異。The number average molecular weight of the fluoropolymer (A) is preferably 1,000-30,000, more preferably 1,500-5,000, and especially preferably 2,500-3,500. When the number average molecular weight is more than the above lower limit, the fluoropolymer (A) has excellent film-forming properties and excellent uniformity of film thickness in the flat portion. If it is below the aforementioned upper limit, the fluorine-containing polymer (A) is excellent in compliance with height differences during coating, so that when the surface of the photoresist layer has unevenness, it is necessary to cover the entire surface of the protrusions and recesses. A small amount of coating is sufficient. It also has excellent solubility in alkaline aqueous solution.
既為含氟聚合物(A)且-COOM1 為-COOH的聚合物之製造方法雖然並未受到特別限定,但以以下之方法(1)或方法(2)為佳。 方法(1):使具有可轉換成「-COOH」之前驅官能基的單體聚合而聚合出前驅聚合物之後,將前驅官能基轉換為「-COOH」之方法。 方法(2):使不具前驅官能基之含氟單體聚合之後,於該聚合物之一部分導入「-COOH」之方法。The method for producing a polymer in which -COOM 1 is -COOH which is the fluoropolymer (A) is not particularly limited, but the following method (1) or method (2) is preferable. Method (1): After polymerizing a monomer having a precursor functional group that can be converted to "-COOH" to polymerize a precursor polymer, the method of converting the precursor functional group to "-COOH". Method (2): After polymerizing a fluorine-containing monomer without a precursor functional group, introduce "-COOH" into a part of the polymer.
方法(1)可舉如下方法:將CX1 X2 =CY1 (Rf1 -COOCH3 )[於此處,X1 、X2 、Y1 、Rf1 係與式(1)相同]所示之含氟單體(以下亦記作「含氟單體(1)」)聚合而獲得前驅聚合物之後,將-COOCH3 部分進行水解。Method (1) can be exemplified as follows: CX 1 X 2 =CY 1 (Rf 1 -COOCH 3 ) [Here, X 1 , X 2 , Y 1 , Rf 1 are the same as formula (1)] After polymerizing the fluorine-containing monomer (hereinafter also referred to as "fluorine-containing monomer (1)") to obtain a precursor polymer, the -COOCH 3 part is hydrolyzed.
將前驅聚合物之-COOCH3 部分進行水解而獲得含氟聚合物(A)之方法並無特別限定。可舉例如將前驅聚合物連同水或含水之介質一起攪拌之方法。且前述攪拌宜於加熱下實施。而此時的水或前述介質之溫度宜為50~150℃。 前述介質以水與親水性有機溶劑之混合溶劑為佳。從與水的溶解性優異之觀點來看,作為親水性有機溶劑以醇類為佳,其中從與前驅聚合物之溶解性亦優異之觀點來看,以含氟醇為佳。含氟醇以氟原子含量為50重量%以上之化合物為佳,可舉例如2-(全氟丁基)乙醇、2-(全氟己基)乙醇、六氟異丙醇、2,2,3,3-四氟丙醇等。混合溶劑中之水與親水性有機溶劑之質量比以3:7~9:1為佳,4:6~6:4尤佳。為前述範圍的話則前驅聚合物容易溶解。The method for obtaining the fluoropolymer (A) by hydrolyzing the -COOCH 3 moiety of the precursor polymer is not particularly limited. Examples include stirring the precursor polymer together with water or a medium containing water. And the aforementioned stirring is preferably implemented under heating. At this time, the temperature of the water or the aforementioned medium should be 50~150°C. The aforementioned medium is preferably a mixed solvent of water and a hydrophilic organic solvent. Alcohols are preferred as the hydrophilic organic solvent from the viewpoint of excellent solubility in water, and among them, fluorine-containing alcohols are preferred from the viewpoint of excellent solubility with the precursor polymer. The fluorine-containing alcohol is preferably a compound with a fluorine atom content of more than 50% by weight, such as 2-(perfluorobutyl)ethanol, 2-(perfluorohexyl)ethanol, hexafluoroisopropanol, 2,2,3 , 3-Tetrafluoropropanol, etc. The mass ratio of water in the mixed solvent to the hydrophilic organic solvent is preferably 3:7~9:1, especially 4:6~6:4. When it is the said range, a precursor polymer will dissolve easily.
作為方法(2)之例子則可舉如下方法:將CX1 X2 =CY1 (Rf1 -CCl3 )所示之含氟單體聚合之後,添加硫酸與水,將-CCl3 轉換成COOH。As an example of method (2), the following method can be cited: After polymerizing the fluorine-containing monomer represented by CX 1 X 2 =CY 1 (Rf 1 -CCl 3 ), sulfuric acid and water are added to convert -CCl 3 into COOH .
既為含氟聚合物(A)且-COOM1 為-COOZ1 的聚合物之製造方法可舉如下之方法:以方法(1)或方法(2)製得具有-COOH之聚合物,接著添加氨或有機胺以將-COOH轉換成-COOZ1 。 有機胺可列舉乙胺、丙胺等單烷基胺類;二乙胺等二烷基胺類;三乙胺等三烷基胺類;乙醇胺、二乙醇胺等烷醇胺類等。該等可單獨使用1種亦可併用2種以上。The method for producing a polymer that is both a fluorine-containing polymer (A) and -COOM 1 is -COOZ 1 can be exemplified as follows: a polymer with -COOH is prepared by method (1) or method (2), and then adding Ammonia or an organic amine to convert -COOH to -COOZ 1 . Examples of organic amines include monoalkylamines such as ethylamine and propylamine; dialkylamines such as diethylamine; trialkylamines such as triethylamine; and alkanolamines such as ethanolamine and diethanolamine. These may be used individually by 1 type and may use 2 or more types together.
作為其他聚合物可舉如聚丙烯酸。其他聚合物之數量平均分子量宜為1,000~30,000,較佳為1,500~5,000,2,500~3,500尤佳。 於本發明中,將含氟聚合物(A)與其他聚合物之合計稱作聚合物含量。聚合物含量中,含氟聚合物(A)之含量宜為50質量%以上,較佳為70質量%以上,100質量%尤佳。Examples of other polymers include polyacrylic acid. The number average molecular weight of other polymers is preferably 1,000-30,000, more preferably 1,500-5,000, and most preferably 2,500-3,500. In the present invention, the total of the fluoropolymer (A) and other polymers is referred to as the polymer content. In the polymer content, the content of the fluoropolymer (A) is preferably at least 50% by mass, preferably at least 70% by mass, particularly preferably 100% by mass.
於無損本發明效果之範圍內,可含有界面活性劑和界面活性劑以外之添加劑作為其他成分。 界面活性劑有助於改善例如塗佈時之可濕性、所形成膜之均勻性。 界面活性劑可舉例如氟系有機酸之胺鹽等。具體來說,可列舉具有多氟烷基與聚氧伸乙基之化合物(3M公司製,製品名:Fluorad「FC-430」、「FC-4430」等)、乙炔二醇及對其加成聚氧乙烯之化合物(Air Products公司製,製品名:「Surfynol 104」、「Surfynol 420」)、烷基磺酸及烷基苯磺酸類(例如Nikko Chemicals公司製,製品名:NIKKOL「SBL-2N-27」等)及含羥基且不含聚氧伸乙基之化合物(聚甘油脂肪酸酯等)等。 界面活性劑之含量過多的話恐導致抗反射膜的白化,且進一步會擴散到抗反射膜下層之光阻膜中而引起曝光不良。再加上因添加非全氟化合物之界面活性劑會提高抗反射膜的折射率,故相對於聚合物含量,界面活性劑之含量宜為10質量%以下,5質量%以下尤佳。Surfactants and additives other than surfactants may be contained as other components within the range that does not impair the effects of the present invention. The surfactant helps to improve, for example, wettability at the time of coating, uniformity of formed film. Surfactants include, for example, amine salts of fluorine-based organic acids. Specifically, compounds having polyfluoroalkyl groups and polyoxyethylene groups (manufactured by 3M Corporation, product names: Fluorad "FC-430", "FC-4430", etc.), acetylene glycol, and addition thereof Polyoxyethylene compounds (manufactured by Air Products, product names: "Surfynol 104", "Surfynol 420"), alkylsulfonic acids and alkylbenzenesulfonic acids (such as Nikko Chemicals, product names: NIKKOL "SBL-2N -27", etc.) and compounds containing hydroxyl groups and not containing polyoxyethylene groups (polyglyceryl fatty acid esters, etc.). If the content of the surfactant is too high, it may cause the whitening of the anti-reflection film, and further diffuse into the photoresist film under the anti-reflection film, causing poor exposure. In addition, the addition of surfactants other than perfluorinated compounds will increase the refractive index of the antireflection film, so the content of surfactants should be less than 10% by mass, preferably less than 5% by mass, relative to the polymer content.
界面活性劑以外之添加劑可舉在抗反射膜形成用之塗覆用組成物中眾所周知之添加劑。 作為具體例可列舉鎓鹽、含鹵化烷基之化合物、鄰醌二疊氮(o-quinone diazide)化合物、硝芐基化合物、磺酸酯化合物、碸化合物等光酸產生劑。 因添加非全氟化合物之添加劑會提高抗反射膜之折射率,故塗覆用組成物中界面活性劑以外之添加劑的合計含量在聚合物含量中以10質量%以下為佳,5質量%以下尤佳。Additives other than the surfactant include well-known additives for coating compositions for antireflection film formation. Specific examples include photoacid generators such as onium salts, halogenated alkyl-containing compounds, o-quinone diazide compounds, nitrobenzyl compounds, sulfonate compounds, and phosphonium compounds. Since the addition of additives other than perfluorinated compounds will increase the refractive index of the antireflection film, the total content of additives other than surfactants in the coating composition is preferably 10% by mass or less, 5% by mass or less in the polymer content Excellent.
要被濾材過濾之被處理溶液含有含氟聚合物(A)及溶劑。且含氟聚合物(A)宜為經以前述方法(1)或方法(2)製成者。 被處理溶液中之溶劑以水、親水性有機溶劑以及水與親水性有機溶劑之混合溶劑為佳。親水性有機溶劑可列舉甲醇、乙醇、異丙醇、2-丁醇及含氟醇等醇類。含氟醇可舉於前述水解使用之作為親水性有機溶劑所列舉之含氟醇為例。 被處理溶液中之溶劑可為製造含氟聚合物(A)時所使用之溶劑,亦可為含氟聚合物(A)製造後所添加之溶劑,且亦可為這兩者之混合物。 即,可將使用溶劑製造含氟聚合物(A)所得之液體作為被處理溶液供於過濾。亦可於使用溶劑製造含氟聚合物(A)所得之液體中添加溶劑來作為被處理溶液。亦可於使用溶劑製造含氟聚合物(A)所得之液體經乾燥後添加溶劑來作為被處理溶液。又,亦可於無使用溶劑下製造含氟聚合物(A),並按照需要使其乾燥後添加溶劑來作為被處理溶液。The solution to be treated to be filtered by the filter material contains the fluoropolymer (A) and the solvent. And the fluorine-containing polymer (A) is preferably produced by the aforementioned method (1) or method (2). The solvent in the solution to be treated is preferably water, a hydrophilic organic solvent, or a mixed solvent of water and a hydrophilic organic solvent. Examples of the hydrophilic organic solvent include alcohols such as methanol, ethanol, isopropanol, 2-butanol, and fluorine-containing alcohols. The fluorine-containing alcohols are exemplified by the fluorine-containing alcohols listed as the hydrophilic organic solvent used in the aforementioned hydrolysis. The solvent in the solution to be treated may be the solvent used in the production of the fluoropolymer (A), or the solvent added after the production of the fluoropolymer (A), or a mixture of the two. That is, the liquid obtained by producing the fluoropolymer (A) using a solvent can be subjected to filtration as a solution to be treated. A solvent may be added to a liquid obtained by producing the fluorinated polymer (A) using a solvent to make a solution to be treated. A solvent may be added to the liquid obtained by producing the fluorine-containing polymer (A) using a solvent, after drying, as a solution to be treated. Moreover, the fluorine-containing polymer (A) can also be produced without using a solvent, it can make it dry as needed, and a solvent can be added and it can make it the solution to be processed.
被處理溶液中之含氟聚合物的含量宜為1~25質量%,較佳為1~10質量%,2~5質量%尤佳。含氟聚合物的含量為前述範圍之下限值以上的話,抗反射膜之膜厚將會變得夠厚,若為上限值以下的話因溶液黏度變得夠低所以過濾時間變短,且不易發生堵塞等故障。The content of the fluoropolymer in the solution to be treated is preferably 1-25% by mass, more preferably 1-10% by mass, especially preferably 2-5% by mass. If the content of the fluoropolymer is above the lower limit of the aforementioned range, the film thickness of the antireflection film will become thick enough, and if it is below the upper limit, the filtration time will be shortened because the viscosity of the solution will become sufficiently low, and Not prone to blockage and other failures.
於本發明中係使用氟原子含量為70質量%以下之濾材過濾被處理溶液。即便在過濾後濾液中之含氟聚合物之含量亦幾乎無變化。 藉由減少濾材之氟原子含量,將含濾液之塗覆液完成製膜時之膜厚會增大。濾材之氟原子含量宜為70質量%以下,60質量%以下尤佳。亦可為零。濾材之氟原子含量為70質量%以下的話,進行過濾所致之膜厚增加量會夠大,所以作為控制膜厚之方法而言是有效的。 作為氟原子含量為70質量%以下之濾材材質的例子可舉聚二氟亞乙烯(PVDF)、聚醯胺、聚丙烯(PP)等有機材料及玻璃等無機材料。從組成物中之金屬不純物濃度上升之可能性低之觀點來看以有機材料為佳。 1個濾材由氟原子含量相異之2種以上材料構成時,僅需至少1種材料之氟原子含量在前述範圍內即可。In the present invention, the solution to be treated is filtered using a filter material with a fluorine atom content of 70% by mass or less. The content of the fluoropolymer in the filtrate hardly changed even after filtration. By reducing the fluorine atom content of the filter material, the film thickness of the coating solution containing the filtrate will increase when the film is formed. The fluorine atom content of the filter material is preferably less than 70% by mass, more preferably less than 60% by mass. Can also be zero. If the fluorine atom content of the filter material is 70% by mass or less, the film thickness increase due to filtration is sufficiently large, so it is effective as a method for controlling the film thickness. Examples of the filter material having a fluorine atom content of 70% by mass or less include organic materials such as polyvinylidene fluoride (PVDF), polyamide, polypropylene (PP), and inorganic materials such as glass. Organic materials are preferable from the viewpoint that the possibility of increasing the concentration of metal impurities in the composition is low. When one filter material is composed of two or more materials with different fluorine atom contents, it is only necessary that the fluorine atom content of at least one material is within the aforementioned range.
濾材之孔徑宜為0.2~5.0μm,較佳為0.2~1.0μm,0.2~0.5μm尤佳。 濾材之形狀及過濾方法並無特別限定。可使用眾所周知之過濾裝置及過濾方法來實施。且過濾可於常溫下進行。 譬如,用一般所用之使用了膠囊過濾器之加壓過濾亦能發揮效果。 過濾速度(線速度)雖然並無特別限制,但可舉例如0.001~1.0cm/秒,宜為0.003~0.5cm/秒。The pore diameter of the filter material is preferably 0.2-5.0 μm, more preferably 0.2-1.0 μm, especially 0.2-0.5 μm. The shape of the filter material and the filtering method are not particularly limited. It can be carried out using well-known filtering devices and filtering methods. And the filtration can be carried out at normal temperature. For example, pressurized filtration using a capsule filter, which is generally used, is also effective. Although the filtration speed (linear speed) is not particularly limited, it is, for example, 0.001 to 1.0 cm/sec, preferably 0.003 to 0.5 cm/sec.
[塗覆液] 本發明中之塗覆液可使用前述塗覆用組成物製得。所謂塗覆液係塗佈於塗佈對象物(光阻層等)上之溶液。 塗覆液可直接使用塗覆用組成物,亦可進一步添加溶劑來作使用。塗覆液中之溶劑包含其理想形態係與被處理溶液中之溶劑相同。 前述其他聚合物及前述其他成分之一部分或全部不含於塗覆用組成物中而是於調製塗覆液時作添加。 亦可使塗覆用組成物中含有前述其他聚合物及前述其他成分之一部分,並於調製塗覆液時添加其餘部分。 塗覆液中之聚合物含量,以塗佈性優異之觀點來看宜為10質量%以下,較佳為7質量%以下,5質量%以下尤佳。以容易形成具必要膜厚之抗反射膜之觀點來看,宜為1質量%以上,較佳為2質量%以上,4質量%以上尤佳。 相對於塗覆液中之含氟聚合物(A)與其他聚合物之合計,含氟聚合物(A)之含量宜為50質量%以上,較佳為70質量%以上,100質量%尤佳。[Coating Liquid] The coating liquid in the present invention can be prepared using the aforementioned coating composition. The term "coating liquid" refers to a solution that is applied on an object to be coated (photoresist layer, etc.). The coating liquid may use the coating composition as it is, or may further add a solvent for use. The solvent in the coating solution is ideally the same as the solvent in the solution to be treated. Some or all of the above-mentioned other polymers and the above-mentioned other components are not contained in the coating composition but are added when preparing the coating liquid. It is also possible to make the above-mentioned other polymer and part of the above-mentioned other components contained in the composition for coating, and to add the rest when preparing a coating liquid. The polymer content in the coating liquid is preferably 10% by mass or less, preferably 7% by mass or less, particularly preferably 5% by mass or less, from the viewpoint of excellent coatability. From the viewpoint of easily forming an antireflection film having a necessary film thickness, it is preferably at least 1% by mass, preferably at least 2% by mass, and particularly preferably at least 4% by mass. The content of the fluoropolymer (A) is preferably at least 50% by mass, preferably at least 70% by mass, particularly preferably 100% by mass, based on the total of the fluoropolymer (A) and other polymers in the coating liquid .
[光阻積層體之製造方法] 於本發明中所謂光阻積層體係指於光阻層表面上設有抗反射膜之積層體。 本發明之光阻積層體之製造方法,係以本發明之製造方法製得塗覆用組成物,其次製得含有前述塗覆用組成物之塗覆液,繼而塗佈前述塗覆液,而製造一於光阻層表面上設有抗反射膜之光阻積層體。[Manufacturing method of photoresist laminate] In the present invention, the so-called photoresist laminate system refers to a laminate provided with an antireflection film on the surface of the photoresist layer. The manufacturing method of the photoresist laminate of the present invention is to prepare the coating composition by the manufacturing method of the present invention, then prepare the coating liquid containing the aforementioned coating composition, and then apply the aforementioned coating liquid, and Manufacture a photoresist laminate with an antireflection film on the surface of the photoresist layer.
於光阻層表面上塗佈塗覆液之方法,可使用眾所周知之方法。從抗反射膜之均勻性及製造之簡便性之觀點來看以旋塗法為佳。 塗佈了塗覆液後會按照需要將溶劑去除。去除溶劑之方法則宜為使用例如熱板或烘箱進行加熱乾燥。以乾燥條件而言,譬如使用熱板時,以於80~150℃之溫度下進行5~30分鐘之條件為佳。As a method of coating the coating liquid on the surface of the photoresist layer, a well-known method can be used. From the viewpoint of the uniformity of the antireflection film and the ease of manufacture, the spin coating method is preferable. After the coating liquid is applied, the solvent is removed as necessary. The method for removing the solvent is preferably heating and drying using, for example, a hot plate or an oven. In terms of drying conditions, for example, when using a hot plate, it is better to carry out at a temperature of 80-150°C for 5-30 minutes.
本發明之光阻積層體之製造方法,可適合用在下述方法上:於基板上形成光阻層,並於光阻層表面上形成抗反射膜而製成為光阻積層體,將該光阻積層體予以曝光之後,接著使用鹼水溶液進行顯影而形成光阻圖案。 以本發明之製造方法製得塗覆液,並用此形成前述抗反射膜,藉此,駐波效應會受到抑制而可抑制光阻圖案之尺寸變動及形狀崩壞。又該抗反射膜對鹼水溶液之溶解性良好,從而可同時進行顯影及抗反射膜之去除。 又,光阻層是由所謂化學增幅型光阻(利用藉曝光生成之質子的觸媒作用)構成的層時,若曝光後光阻層被放置於大氣中就容易發生光阻表面變質。在該光阻層表面上若具有以本發明之製造方法所得之抗反射膜,還可作為保護膜發揮機能來防止光阻層表面變質。The method for producing a photoresist laminate of the present invention can be suitably used in the following method: forming a photoresist layer on a substrate, forming an anti-reflection film on the surface of the photoresist layer to make a photoresist laminate, and using the photoresist After the laminate is exposed, it is developed using an aqueous alkali solution to form a photoresist pattern. The coating liquid prepared by the manufacturing method of the present invention is used to form the aforementioned anti-reflection film, whereby the standing wave effect is suppressed and the dimensional change and shape collapse of the photoresist pattern can be suppressed. In addition, the anti-reflection film has good solubility in alkaline aqueous solution, so that the development and removal of the anti-reflection film can be carried out at the same time. Also, when the photoresist layer is a so-called chemically amplified photoresist (using the catalytic effect of protons generated by exposure), if the photoresist layer is left in the atmosphere after exposure, the photoresist surface will easily deteriorate. If there is an antireflection film obtained by the manufacturing method of the present invention on the surface of the photoresist layer, it can also function as a protective film to prevent the surface of the photoresist layer from deteriorating.
[作用、機制] 依據本發明,如後述實施例所示,經以氟原子含量為70質量%以下之濾材過濾所得之塗覆用組物成物與將過濾前之被處理液直接用作塗覆用組物成物的情況相較之下,即便聚合物含量相等,製膜完成時之膜厚亦會變得較厚。 獲得如此效果的理由雖然並不明確,但經本案發明人等詳細調查了過濾前後之成分組成變化後明確得知:濾材之氟原子含量為70質量%以下時,經過過濾操作,於19 F-NMR中以三氟氯甲烷為基準於-119(負119)ppm附近具波峰之化合物(以下亦記作「-119ppm之化合物」)的含量顯著地減低。吾人認為此化合物含量的減低有助於膜厚的增加。又認為此化合物容易吸附於氟原子含量為70質量%以下之濾材。 具體來說,塗覆液中-119ppm之化合物含量宜小於0.95質量%。 實施例[Function, Mechanism] According to the present invention, as shown in the following examples, the composition for coating obtained by filtering the filter material with a fluorine atom content of 70% by mass or less is directly used as the coating composition before filtering. In comparison with the case of coating the composition, even if the polymer content is the same, the film thickness at the time of film formation will become thicker. Although the reason for obtaining such an effect is not clear, it is clearly known after the inventors of this case have investigated the composition changes before and after filtration in detail: when the fluorine atom content of the filter material is 70% by mass or less, after the filtration operation, at 19 F- In NMR, the content of the compound having a peak around -119 (minus 119) ppm based on chlorotrifluoromethane (hereinafter also referred to as "compound of -119 ppm") was significantly reduced. It is believed that a reduction in the content of this compound contributes to an increase in film thickness. It is also believed that this compound is easily adsorbed on filter materials with a fluorine atom content of 70% by mass or less. Specifically, the content of the -119 ppm compound in the coating liquid is preferably less than 0.95% by mass. Example
以下使用實施例進一步詳細說明本發明,惟本發明不侷限於該等實施例。 測定方法及評價方法係使用了以下方法。The following examples are used to further describe the present invention in detail, but the present invention is not limited to these examples. As the measurement method and evaluation method, the following methods were used.
[數量平均分子量] 聚合物之數量平均分子量的值是依據凝膠滲透層析(GPC)法所得之聚苯乙烯(PS)換算分子量。 [聚合物含量] 採集2mL之塗覆用組成物至樣品瓶(vial container)(20mL)中,並於80℃下真空乾燥3小時。藉測定樣品瓶乾燥前後之質量算出溶液中之聚合物含量(單位:質量%)。 [膜厚及折射率] 以旋塗法(每分鐘3,000轉,180秒)將塗覆液塗佈於矽晶片上,並使其於已溫度調節至150℃之熱板上乾燥5分鐘而形成膜(抗反射膜)。並利用橢圓偏光計測定膜厚及193nm之折射率。塗覆液之使用量規定為2mL。 於此處,統一規定塗覆液之使用量及塗覆條件來比較所得之膜的膜厚。[Number Average Molecular Weight] The value of the number average molecular weight of the polymer is a polystyrene (PS) equivalent molecular weight obtained by gel permeation chromatography (GPC) method. [Polymer content] 2 mL of the composition for coating was collected into a vial container (20 mL), and vacuum-dried at 80° C. for 3 hours. Calculate the polymer content in the solution by measuring the mass of the sample bottle before and after drying (unit: mass %). [Film thickness and refractive index] Spin coating (3,000 revolutions per minute, 180 seconds) to coat the coating solution on the silicon wafer, and dry it on a hot plate adjusted to 150°C for 5 minutes to form film (anti-reflection film). The film thickness and the refractive index at 193 nm were measured by an ellipsometer. The usage amount of the coating liquid is stipulated as 2mL. Here, the usage-amount of coating liquid and coating conditions were prescribed|regulated uniformly, and the film thickness of the obtained film was compared.
「-119ppm之化合物含量」 將重水及1,1,1,3,3,3-六氟-2-異丙醇(HFIP)混合於塗覆用組成物中,並於調整成使聚合物含量成為2質量%之後測定19 F-NMR。 自所得圖表,以HFIP為標準物質且以三氟氯甲烷為基準算出於-119ppm附近具波峰之化合物(-119ppm之化合物)的含量(單位:質量%)。"Compound content of -119ppm" Mix heavy water and 1,1,1,3,3,3-hexafluoro-2-isopropanol (HFIP) in the coating composition, and adjust to make the polymer content 19 F-NMR was measured after reaching 2% by mass. From the obtained graph, the content (unit: mass %) of the compound having a peak near -119 ppm (compound of -119 ppm) was calculated using HFIP as a standard substance and based on chlorofluoromethane.
[製造例1:含氟聚合物(A1)及溶液(1)之製造] 於反應容器中裝入50g作為單體的CF2 =CFOCF2 CF2 CF2 COOCH3 (分子量306)及0.60g作為起始劑溶液的過氧二碳酸二異丙酯溶液(濃度50質量%,且溶媒為CF3 CH2 OCF2 CF2 H),然後將系統內以氮氣取代。其次,一面加熱使內溫成為40℃一面攪拌,進行了72小時聚合反應。聚合反應結束後,於80℃下真空乾燥3小時而獲得21.5g之前驅聚合物。前驅聚合物之數量平均分子量為3,300。 繼而,將前驅聚合物之側鏈末端之甲基予以水解轉換成羧基。即,在可分離式燒瓶內,於80℃下攪拌前驅聚合物與水12小時進行水解,而獲得含氟聚合物(A1)含量為18質量%之水溶液(溶液(1))。 可藉由在80℃下將溶液(1)真空乾燥3小時來取出含氟聚合物(A1)單體。[Manufacturing Example 1: Manufacture of Fluoropolymer (A1) and Solution (1)] 50 g of CF 2 =CFOCF 2 CF 2 CF 2 COOCH 3 (molecular weight: 306) and 0.60 g of CF 2 =CFOCF 2 CF 2 COOCH 3 (molecular weight: 306) and 0.60 g as The diisopropyl peroxydicarbonate solution of the starter solution (concentration: 50% by mass, and the solvent is CF 3 CH 2 OCF 2 CF 2 H), and then the system was replaced with nitrogen. Next, stirring was carried out while heating so that the internal temperature became 40° C., and a polymerization reaction was performed for 72 hours. After completion of the polymerization reaction, vacuum drying was carried out at 80° C. for 3 hours to obtain 21.5 g of a precursor polymer. The number average molecular weight of the precursor polymer was 3,300. Then, the methyl group at the end of the side chain of the precursor polymer is hydrolyzed and converted into a carboxyl group. That is, the precursor polymer and water were stirred and hydrolyzed at 80°C for 12 hours in a separable flask to obtain an aqueous solution (solution (1)) having a fluoropolymer (A1) content of 18% by mass. The fluoropolymer (A1) monomer can be taken out by vacuum-drying the solution (1) at 80° C. for 3 hours.
[製造例2:被處理溶液(2)~(4)及使用了其等之塗覆用組成物之製造] 製造出含有製造例1所得含氟聚合物(A1)且溶劑相異之被處理溶液(2)~(4)。各被處理溶液中之含氟聚合物含量係設成容易以旋塗法製膜之濃度。 被處理溶液(2)之製造:將溶液(1)以水稀釋,製造出含氟聚合物(A1)含量為5質量%之被處理溶液(2)。 被處理溶液(3)之製造:從溶液(1)取出含氟聚合物(A1)單體,並添加2-丁醇而製造出含氟聚合物(A1)含量為3質量%之被處理溶液(3)。 被處理溶液(4)之製造:從溶液(1)取出含氟聚合物(A1)單體,並添加2,2,3,3-四氟丙醇(TFPO)而製造出含氟聚合物(A1)含量為4質量%之被處理溶液(4)。[Manufacture Example 2: Manufacture of Treated Solutions (2) to (4) and Coating Compositions Using Them] A treated solution containing the fluoropolymer (A1) obtained in Production Example 1 and in a different solvent was produced Solution (2)~(4). The content of the fluoropolymer in each solution to be treated is set to a concentration that is easy to form a film by spin coating. Preparation of the treated solution (2): The solution (1) was diluted with water to prepare the treated solution (2) with a fluoropolymer (A1) content of 5% by mass. Production of the treated solution (3): The fluoropolymer (A1) monomer was taken out from the solution (1), and 2-butanol was added to prepare a treated solution with a fluoropolymer (A1) content of 3% by mass (3). Preparation of the treated solution (4): Take out the fluoropolymer (A1) monomer from the solution (1), and add 2,2,3,3-tetrafluoropropanol (TFPO) to produce the fluoropolymer ( A1) The solution to be treated (4) having a content of 4% by mass.
使用被處理溶液(2)~(4)製造塗覆用組成物(2)~(4),並直接作為塗覆液(2)~(4)。 例1、11、21為無過濾之比較例,例2、12、17、22為濾材之氟原子含量超過70%之比較例,而例3~5、例13~16、例23~28則為實施例。 於過濾步驟中,係使用了材質相異之下述濾材(1)~(5)作為濾材。各濾材之氟原子含量係如表1~3所示。Coating compositions (2) to (4) are manufactured using the solutions to be treated (2) to (4), and directly used as coating liquids (2) to (4). Examples 1, 11, and 21 are comparative examples without filtration, examples 2, 12, 17, and 22 are comparative examples in which the fluorine atom content of the filter material exceeds 70%, and examples 3~5, 13~16, and 23~28 are For example. In the filtering step, the following filter materials (1) to (5) with different materials are used as filter materials. The fluorine atom content of each filter material is shown in Table 1~3.
[所使用之濾材] 濾材(1):材質為聚四氟乙烯,TOMSIC公司製,TITAN2-PTFE(製品名)。且準備了孔徑1.0μm、0.45μm及0.2μm三種。 濾材(2):材質為聚二氟亞乙烯,TOMSIC公司製,TITAN2-PVDF(製品名)。且準備了0.45μm及0.2μm二種。 濾材(3):材質為聚醯胺,TOMSIC公司製,TITAN2-NYLON(製品名)。且準備了孔徑1.5μm、0.45μm及0.2μm三種。 濾材(4)PP:材質為聚丙烯,TOMSIC公司製,TITAN2-Polypropyren(製品名)。且準備了0.45μm及0.2μm二種。 濾材(5):材質為硼矽玻璃,TOMSIC公司製,TITAN2-Glass Microfiber(製品名),孔徑1.0μm。[Used filter material] Filter material (1): The material is polytetrafluoroethylene, manufactured by TOMSIC Corporation, TITAN2-PTFE (product name). In addition, three types of pore sizes of 1.0 μm, 0.45 μm, and 0.2 μm were prepared. Filter material (2): The material is polyvinylidene fluoride, manufactured by TOMSIC, TITAN2-PVDF (product name). In addition, two types of 0.45 μm and 0.2 μm were prepared. Filter material (3): The material is polyamide, manufactured by TOMSIC, TITAN2-NYLON (product name). In addition, three types of pore diameters of 1.5 μm, 0.45 μm, and 0.2 μm were prepared. Filter material (4) PP: The material is polypropylene, manufactured by TOMSIC, TITAN2-Polypropylene (product name). In addition, two types of 0.45 μm and 0.2 μm were prepared. Filter material (5): made of borosilicate glass, TITAN2-Glass Microfiber (product name), manufactured by TOMSIC, with a pore size of 1.0 μm.
[例1:無過濾] 不過濾被處理溶液(2)並將之直接作為塗覆液(2)使用。 測定塗覆液(2)中之聚合物含量及-119ppm之化合物含量。且以旋塗法製膜並測定膜厚。將結果示於表1(以下相同)。[Example 1: No filtration] The solution to be treated (2) was used as the coating solution (2) without filtering it. The polymer content and -119 ppm compound content in the coating solution (2) were measured. In addition, a film was formed by a spin coating method and the film thickness was measured. The results are shown in Table 1 (the same applies hereinafter).
[例2~5] 使用表1所示濾材於過濾速度0.2cm/秒下將被處理溶液(2)進行注射器過濾,並將濾液作為塗覆液(2)。且進行與例1相同之測定。[Example 2~5] Syringe-filter the solution (2) to be treated using the filter material shown in Table 1 at a filtration rate of 0.2 cm/sec, and use the filtrate as the coating solution (2). And carry out the same measurement as Example 1.
[例11:無過濾] 不過濾被處理溶液(3)並將之直接作為塗覆液(3)使用。 測定塗覆液(3)中之聚合物含量及-119ppm之化合物含量。且以旋塗法製膜並測定膜厚及折射率。將結果示於表2(以下相同)。[Example 11: No filtration] The solution to be treated (3) was used as the coating solution (3) without filtration. The polymer content and -119 ppm compound content in the coating liquid (3) were measured. And the film was prepared by the spin coating method and the film thickness and refractive index were measured. The results are shown in Table 2 (the same applies hereinafter).
[例12~16] 使用表2所示濾材於過濾速度(線速度)0.2cm/秒下將被處理溶液(3)進行注射器過濾,並將濾液作為塗覆液(3)。且進行與例11相同之測定。表中之「-」表示未測定(以下皆同)。[Examples 12-16] Syringe-filter the solution (3) to be treated using the filter material shown in Table 2 at a filtration velocity (linear velocity) of 0.2 cm/sec, and use the filtrate as the coating solution (3). And carry out the same measurement as Example 11. "-" in the table means not determined (the same applies hereinafter).
[例17] 將於被處理溶液(3)中添加了聚丙烯酸使濃度成為0.2質量%之液體,使用表2所示濾材於過濾速度(線速度)0.2cm/秒下進行注射器過濾,並將濾液作為塗覆液(3)。且進行與例11相同之測定。[Example 17] A liquid in which polyacrylic acid was added to the treated solution (3) so that the concentration became 0.2% by mass was syringe-filtered using the filter material shown in Table 2 at a filtration speed (linear velocity) of 0.2 cm/sec, and the The filtrate was used as the coating liquid (3). And carry out the same measurement as Example 11.
[例21:無過濾] 不過濾被處理溶液(4)並將之直接作為塗覆液(4)使用。 測定塗覆液(4)中之聚合物含量。且以旋塗法製膜並測定膜厚。將結果示於表3(以下皆同)。[Example 21: No filtration] The solution to be treated (4) was used as the coating solution (4) without filtering it. The polymer content in the coating solution (4) was measured. In addition, a film was formed by a spin coating method and the film thickness was measured. The results are shown in Table 3 (the same applies hereinafter).
[例22~25] 使用表3所示濾材於過濾速度(線速度)0.2cm/秒下將被處理溶液(4)進行注射器過濾,並將濾液作為塗覆液(4)。且進行與例21相同之測定。[Example 22~25] Use the filter material shown in Table 3 to syringe filter the solution (4) to be treated at a filtration speed (linear velocity) of 0.2 cm/sec, and use the filtrate as the coating solution (4). And the same measurement as in Example 21 was carried out.
[例26~28] 使用安裝有濾材(4)之膠囊過濾器,且以表4所示之過濾速度加壓過濾被處理溶液(3)並將濾液作為塗覆液(5)。且進行與例1相同之測定。[Example 26~28] Use a capsule filter equipped with a filter material (4), pressurize and filter the solution to be treated (3) at the filtration rate shown in Table 4, and use the filtrate as the coating solution (5). And carry out the same measurement as Example 1.
[表1] [Table 1]
[表2] [Table 2]
[表3] [table 3]
[表4] [Table 4]
圖1係針對例1~5,將塗覆液中-119ppm之化合物含量與製膜後之膜厚的關係揭示於圖表中。Fig. 1 shows the relationship between the -119ppm compound content in the coating liquid and the film thickness after film formation in the chart for Examples 1 to 5.
如表1之結果所示般,濾材之氟原子含量為70質量%以下之例3~5,塗覆液中-119ppm之化合物含量小於0.95質量%,相對於例1來說聚合物含量雖為相等但膜厚卻顯著地增加了。 另一方面,濾材之氟原子含量為76質量%之例2,塗覆液中-119ppm之化合物含量為0.95質量%以上,與例1之膜厚的差小。具體來說,由於例1製膜後之膜厚的平均值為33.5nm(試樣數5)且3σ=1.5(σ為標準偏差),故例2製膜後之膜厚35.0nm判定為無顯著差異。 按照表2及表3之結果,就濾材之氟原子含量與膜厚之關係亦可看到相同的傾向。 從圖1之結果可知,塗覆用組成物中-119ppm之化合物含量與製膜後之膜厚之間係有所相關,且-119ppm之化合物含量愈低膜厚會變得愈厚。 如表示2所示,-119ppm之化合物經以氟原子含量低的濾材過濾時會更加減少。 濾材之材質相同時,有孔徑愈小-119ppm之化合物更加減少之趨勢。 比較表2之例11、12及15的話可知,即便藉由過濾使得-119ppm之化合物含量減少,對膜之折射率亦無影響。 例17所得之塗覆用組成物因添加有具增稠作用之聚丙烯酸,故與例12相較下膜厚雖然有增加,但折射率卻上升了。 從例15及26~28之結果可確認若濾材及孔徑相同,則不論過濾速度及過濾方法為何都有使膜厚增加之效果。 如所述藉由使用氟原子含量為70質量%以下之濾材進行過濾,則即便不增加塗覆用組成物中之聚合物含量且未使用增稠劑等添加劑,亦能使膜厚增加。 產業上之可利用性As shown in the results of Table 1, the fluorine atom content of the filter material is 70% by mass or less in Examples 3-5, and the compound content of -119ppm in the coating solution is less than 0.95% by mass. Compared with Example 1, the polymer content is equal but the film thickness increased significantly. On the other hand, in Example 2 in which the fluorine atom content of the filter material is 76% by mass, the -119ppm compound content in the coating solution is 0.95% by mass or more, and the film thickness difference from Example 1 is small. Specifically, since the average value of the film thickness after film formation in Example 1 is 33.5nm (the number of samples is 5) and 3σ=1.5 (σ is the standard deviation), the film thickness of 35.0nm after film formation in Example 2 is judged as no Significant difference. According to the results in Table 2 and Table 3, the same tendency can be seen in the relationship between the fluorine atom content of the filter material and the film thickness. From the results in Figure 1, it can be seen that there is a relationship between the -119ppm compound content in the coating composition and the film thickness after film formation, and the lower the -119ppm compound content, the thicker the film thickness will become. As shown in Table 2, the compound at -119ppm will be reduced even more when filtered through a filter material with low fluorine atom content. When the material of the filter material is the same, there is a tendency that the smaller the pore size-119ppm compound is, the less it will be. Comparing Examples 11, 12 and 15 in Table 2, it can be seen that even if the content of the -119 ppm compound is reduced by filtration, the refractive index of the film is not affected. In the coating composition obtained in Example 17, polyacrylic acid with a thickening effect was added, so compared with Example 12, although the film thickness was increased, the refractive index was increased. From the results of Examples 15 and 26~28, it can be confirmed that if the filter material and pore size are the same, the film thickness can be increased regardless of the filtration speed and filtration method. By filtering using a filter material having a fluorine atom content of 70% by mass or less as described above, the film thickness can be increased without increasing the polymer content in the coating composition and without using additives such as thickeners. Industrial availability
本發明之塗覆用組成物對形成設在光阻層表面上的抗反射膜是有用的。 另外,在此引用已於2016年07月13日提出申請之日本專利申請案2016-138762號之說明書、申請專利範圍、圖式及摘要之全部內容,並將其納入作為本發明說明書之揭示。The coating composition of the present invention is useful for forming an antireflection film provided on the surface of a photoresist layer. In addition, the entire contents of the specification, scope of claims, drawings and abstract of Japanese Patent Application No. 2016-138762 filed on July 13, 2016 are cited here, and incorporated as disclosure of the specification of the present invention.
(無)(none)
圖1係顯示實施例及比較例之結果的圖表。Fig. 1 is a graph showing the results of Examples and Comparative Examples.
(無)(none)
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