TWI775206B - Gas tightness detection equipment and gas tightness detection method - Google Patents

Gas tightness detection equipment and gas tightness detection method Download PDF

Info

Publication number
TWI775206B
TWI775206B TW109138393A TW109138393A TWI775206B TW I775206 B TWI775206 B TW I775206B TW 109138393 A TW109138393 A TW 109138393A TW 109138393 A TW109138393 A TW 109138393A TW I775206 B TWI775206 B TW I775206B
Authority
TW
Taiwan
Prior art keywords
chamber
pressurizing
value
tested
quartz resonator
Prior art date
Application number
TW109138393A
Other languages
Chinese (zh)
Other versions
TW202219477A (en
Inventor
曾世長
Original Assignee
加高電子股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 加高電子股份有限公司 filed Critical 加高電子股份有限公司
Priority to TW109138393A priority Critical patent/TWI775206B/en
Publication of TW202219477A publication Critical patent/TW202219477A/en
Application granted granted Critical
Publication of TWI775206B publication Critical patent/TWI775206B/en

Links

Images

Abstract

Gas tightness detection equipment and a gas tightness detection method are provided. The gas tightness detection equipment includes a supporter, a pressurizing system and a detection system. In the tightness detection method, at first, a crystal oscillator under test is transmitted to a chamber of the pressurizing system, and a gas-tight state of the chamber is maintained. Thereafter, the pressurizing system is used to perform a first pressurizing stage, a second pressurizing stage and a recycling stage. The first pressurizing stage is performed to provide pressurizing gas to the chamber to increase the atmospheric pressure of the chamber to a first atmospheric pressure. The second pressurizing stage is performed to provide the pressurizing gas to the chamber to increase the atmospheric pressure of the chamber to a second atmospheric pressure. The recycling stage is performed to recycle the pressurizing gas from the chamber. In the second pressurizing stage, a resistance value of the crystal oscillator under test is detected, and the gas tightness of the crystal oscillator under test is determined in accordance with the resistance value.

Description

氣密檢測設備與氣密檢測方法Air tightness testing equipment and air tightness testing method

本發明是有關於一種氣密檢測設備與氣密檢測方法,且特別是有關於一種石英諧振器之氣密檢測設備與氣密檢測方法。The present invention relates to an airtight detection device and an airtight detection method, and in particular to an airtight detection device and an airtight detection method of a quartz resonator.

隨著科技的進步,各種數位電子產品,例如數位電視、數位相機、數位手錶逐漸取代了傳統的類比電子產品。在數位電子產品中,邏輯電路和時序電路是重要的關鍵元件。一般而言,時序電路大多採用石英諧振器來提供邏輯電路所需的時脈。在石英諧振器的製造過程中,石英諧振器的封裝是影響石英諧振器可靠度的指標之一。為了檢測石英諧振器的封裝氣密性是否正常,通常會利用液體加壓法來對石英諧振器的氣密性進行檢測。然而,液體加壓法的檢測準確率不高,且檢測過程容易損壞石英諧振器,故需要一種新的氣密檢測設備與氣密檢測方法來改善習知技術的缺點。With the advancement of technology, various digital electronic products, such as digital televisions, digital cameras, and digital watches, have gradually replaced traditional analog electronic products. In digital electronic products, logic circuits and sequential circuits are important key components. Generally speaking, most sequential circuits use quartz resonators to provide the clock pulses required by logic circuits. In the manufacturing process of the quartz resonator, the packaging of the quartz resonator is one of the indicators affecting the reliability of the quartz resonator. In order to detect whether the air tightness of the quartz resonator is normal, the air tightness of the quartz resonator is usually tested by a liquid pressurizing method. However, the detection accuracy of the liquid pressurization method is not high, and the quartz resonator is easily damaged during the detection process. Therefore, a new airtightness detection device and an airtightness detection method are required to improve the shortcomings of the prior art.

本發明之一方面提供一種氣密檢測設備,其可提高石英諧振器的氣密檢測準確率,且減少不良石英諧振器外流至客戶的端機率。此氣密檢測設備包含承載盤、加壓系統以及檢測系統。承載盤係用以承載至少一待測石英諧振器。加壓系統包含腔室、回收儲氣筒以及主要儲氣筒。腔室係用以容置承載盤,其中腔室具有腔室入口,當承載盤由腔室入口進入腔室後,腔室入口關閉,以使腔室維持氣密狀態。回收儲氣筒係用以於第一加壓階段中,供應加壓氣體至腔室來將腔室加壓至第一氣壓值,以及用以於回收階段中從腔室回收加壓氣體。主要儲氣筒係用以於第二加壓階段中,供應加壓氣體至腔室,以將腔室加壓至第二氣壓值,其中第二加壓階段接續於第一加壓階段,回收階段接續於第二加壓階段,第二氣壓值大於第一氣壓值。檢測系統係用以於第二加壓階段中檢測待測石英諧振器之阻值,並根據此阻值來進行氣密檢測步驟,以判斷待測石英諧振器之氣密性是否正常。One aspect of the present invention provides an airtight detection device, which can improve the airtightness detection accuracy of a quartz resonator and reduce the probability of a defective quartz resonator flowing out to a client. The airtight testing equipment includes a carrier plate, a pressurizing system and a testing system. The carrying plate is used for carrying at least one quartz resonator to be tested. The pressurized system contains the chamber, the recovery air reservoir, and the main air reservoir. The chamber is used for accommodating the carrier plate, wherein the chamber has a chamber inlet. After the carrier plate enters the chamber through the chamber inlet, the chamber inlet is closed to keep the chamber airtight. The recovery gas storage cylinder is used for supplying pressurized gas to the chamber to pressurize the chamber to the first gas pressure value in the first pressurizing stage, and for recovering the pressurized gas from the chamber in the recovery stage. The main gas storage cylinder is used for supplying pressurized gas to the chamber in the second pressurizing stage, so as to pressurize the chamber to the second gas pressure value, wherein the second pressurizing stage is successive to the first pressurizing stage, and the recovery stage is Following the second pressurizing stage, the second air pressure value is greater than the first air pressure value. The detection system is used to detect the resistance value of the quartz resonator to be tested in the second pressurizing stage, and to perform an airtight detection step according to the resistance value, so as to judge whether the airtightness of the quartz resonator to be tested is normal.

在一些實施例中,加壓系統更包含第一閥門、第二閥門以及至少一第三閥門。第一閥門係設置於腔室與主要儲氣筒之間,以控制主要儲氣筒對腔室供應加壓氣體。第二閥門係設置於腔室與回收儲氣筒之間,以控制回收儲氣筒對腔室供應加壓氣體,或控制回收儲氣筒從腔室回收加壓氣體。第三閥門係設置於腔室與排氣管道之間,以控制腔室透過排氣管道排出加壓氣體,以進行洩壓。In some embodiments, the pressurizing system further includes a first valve, a second valve and at least one third valve. The first valve is arranged between the chamber and the main air storage cylinder to control the main air storage cylinder to supply pressurized gas to the chamber. The second valve is disposed between the chamber and the recovery gas storage cylinder, to control the recovery gas storage cylinder to supply pressurized gas to the chamber, or to control the recovery gas storage cylinder to recover the pressurized gas from the chamber. The third valve is arranged between the chamber and the exhaust duct to control the chamber to discharge pressurized gas through the exhaust duct for pressure relief.

在一些實施例中,在前述之氣密檢測步驟中,首先計算待測石英諧振器之阻值與標準阻值之差值。然後,判斷此差值是否位於標準差值範圍內。當此差值位於標準差值範圍內時,判定待測石英諧振器之氣密性為正常。In some embodiments, in the aforementioned airtight detection step, the difference between the resistance value of the quartz resonator to be tested and the standard resistance value is first calculated. Then, determine whether the difference is within the standard deviation range. When the difference is within the standard deviation range, it is determined that the air tightness of the quartz resonator to be tested is normal.

在一些實施例中,檢測系統更用進行特性檢測步驟。在此特性檢測步驟中,首先獲取待測石英諧振器之頻率偏差量、阻抗值以及靜態電容值。然後,判斷頻率偏差量是否位於標準偏差量範圍內,並提供第一判斷結果。接著,判斷阻抗值是否位於標準阻抗值範圍內,並提供第二判斷結果。判斷靜態電容值是否位於標準靜態電容值範圍內,並提供第三判斷結果。當第一判斷結果、第二判斷結果以及第三判斷結果之一者為否時,決定此待測石英諧振器為重測品,並於承載盤離開腔室後,取出此重測品,以再次對此重測品進行氣密檢測步驟。In some embodiments, the detection system further performs the characteristic detection step. In this characteristic detection step, the frequency deviation, impedance value and static capacitance value of the quartz resonator to be tested are obtained first. Then, it is judged whether the frequency deviation is within the standard deviation range, and a first judgment result is provided. Next, it is determined whether the impedance value is within the standard impedance value range, and a second determination result is provided. It is judged whether the static capacitance value is within the standard static capacitance value range, and a third judgment result is provided. When one of the first judgment result, the second judgment result and the third judgment result is no, it is determined that the quartz resonator to be tested is the re-measured product, and after the carrier plate leaves the chamber, the re-measured product is taken out for re-testing again. Perform the air tightness test procedure on this retest.

在一些實施例中,前述之第二氣壓值為4.7公斤/平方公分~5.0公斤/平方公分。In some embodiments, the aforementioned second air pressure value is 4.7 kg/cm 2 to 5.0 kg/cm 2 .

本發明之一方面提供一種氣密檢測方法,其可提高石英諧振器的氣密檢測準確率,且減少不良石英諧振器外流至客戶端的機率。在此氣密檢測方法中,首先將待測石英諧振器送入加壓系統之腔室中。接著,封閉腔室,以使腔室維持氣密狀態。然後,利用加壓系統來對腔室進行加壓步驟。在加壓步驟中,首先進行第一加壓階段,以利用回收儲氣桶來供應加壓氣體至腔室,加壓時打開腔室與回收儲氣桶間的閥門,使壓縮在回收儲氣桶中的空氣釋放至腔室中,待腔室與回收儲氣桶中的壓力平衡,關閉閥門,達到第一氣壓值。接著,進行第二加壓階段,以利用主要儲氣桶來供應加壓氣體至腔室,加壓時打開腔室與主要儲氣桶間的閥門,使壓縮在主要儲氣桶中的空氣釋放至腔室中,待腔室與主要儲氣桶中的壓力平衡,關閉閥門,達到第二氣壓值。其中第二加壓階段接續於第一加壓階段,第二氣壓值大於第一氣壓值。然後,進行回收階段,將腔室中的壓縮氣體儲存至回收儲氣桶,腔室洩氣時,打開腔室與回收儲氣桶間的閥門,使腔室中的壓縮氣體釋放至回收儲氣桶,待平衡壓力後,關閉閥門,完成氣體的回收,回收的氣體用來供應下次檢測時之第一加壓階段。其中,在第二加壓階段中,檢測待測石英諧振器之阻值,並根據此阻值來進行氣密檢測步驟,以判斷待測石英諧振器之氣密性是否正常。其中,利用腔室洩氣時將壓縮氣體回收至回收儲氣桶,可節省製程成本。One aspect of the present invention provides an airtight detection method, which can improve the airtightness detection accuracy of a quartz resonator, and reduce the probability of a defective quartz resonator flowing out to a client. In this airtight detection method, the quartz resonator to be tested is first sent into the chamber of the pressurized system. Next, the chamber is closed to maintain the airtight state of the chamber. The chamber is then subjected to a pressurizing step using a pressurizing system. In the pressurizing step, the first pressurizing stage is firstly performed to use the recovery gas storage tank to supply pressurized gas to the chamber, and during pressurization, the valve between the chamber and the recovery gas storage tank is opened, so that the compressed air is compressed in the recovery gas storage tank. The air in the barrel is released into the chamber, and after the chamber and the pressure in the recovery air storage barrel are balanced, the valve is closed to reach the first air pressure value. Next, a second pressurizing stage is performed to supply pressurized gas to the chamber using the main gas storage tank, and during pressurization, the valve between the chamber and the main gas storage tank is opened to release the air compressed in the main gas storage tank To the chamber, after the chamber and the pressure in the main gas storage tank are balanced, the valve is closed to reach the second air pressure value. The second pressurizing stage is consecutive to the first pressurizing stage, and the second air pressure value is greater than the first air pressure value. Then, in the recovery stage, the compressed gas in the chamber is stored in the recovery gas storage tank. When the chamber is deflated, the valve between the chamber and the recovery gas storage tank is opened to release the compressed gas in the chamber to the recovery gas storage tank. , After balancing the pressure, close the valve to complete the recovery of the gas, and the recovered gas is used to supply the first pressurizing stage in the next detection. Wherein, in the second pressurizing stage, the resistance value of the quartz resonator to be tested is detected, and the air tightness detection step is performed according to the resistance value, so as to judge whether the air tightness of the quartz resonator to be tested is normal. Among them, the compressed gas is recovered to the recovery gas storage tank when the chamber is deflated, which can save the process cost.

在一些實施例中,在前述之氣密檢測步驟中,首先計算待測石英諧振器之阻值與標準阻值之間的差值。然後,判斷此差值是否位於標準差值範圍內。當差值位於標準差值範圍內時,判定待測石英諧振器之氣密性為正常。In some embodiments, in the aforementioned airtight detection step, the difference between the resistance value of the quartz resonator to be tested and the standard resistance value is first calculated. Then, determine whether the difference is within the standard deviation range. When the difference is within the standard deviation range, it is determined that the air tightness of the quartz resonator to be tested is normal.

在一些實施例中,前述之氣密檢測方法更包含在第二加壓階段中,進行特性檢測步驟。在此特性檢測步驟中,首先獲取該待測石英諧振器之頻率偏差量、阻抗值以及靜態電容值。然後,判斷頻率偏差量是否位於標準偏差量範圍內,並提供第一判斷結果。接著,判斷阻抗值是否位於標準阻抗值範圍內,並提供第二判斷結果。然後,判斷靜態電容值是否位於標準靜態電容值範圍內,並提供第三判斷結果。當第一判斷結果、第二判斷結果以及第三判斷結果之一者為否時,決定此待測石英諧振器為重測品,並於承載盤離開腔室後,取出此重測品,以再次對此重測品進行氣密檢測步驟。In some embodiments, the aforementioned air tightness detection method further includes a characteristic detection step in the second pressurizing stage. In this characteristic detection step, the frequency deviation, impedance value and static capacitance value of the quartz resonator to be tested are obtained first. Then, it is judged whether the frequency deviation is within the standard deviation range, and a first judgment result is provided. Next, it is determined whether the impedance value is within the standard impedance value range, and a second determination result is provided. Then, it is determined whether the static capacitance value is within the standard static capacitance value range, and a third determination result is provided. When one of the first judgment result, the second judgment result and the third judgment result is no, it is determined that the quartz resonator to be tested is the re-measured product, and after the carrier plate leaves the chamber, the re-measured product is taken out for re-testing again. Perform the air tightness test procedure on this retest.

在一些實施例中,前述之第二氣壓值為4.7公斤/平方公分~5.0公斤/平方公分。In some embodiments, the aforementioned second air pressure value is 4.7 kg/cm 2 to 5.0 kg/cm 2 .

在一些實施例中,前述之第二加壓階段將腔室加壓至第二氣壓值後,維持第二氣壓值3.0分鐘。In some embodiments, after the aforementioned second pressurizing stage pressurizes the chamber to the second air pressure value, the second air pressure value is maintained for 3.0 minutes.

關於本文中所使用之『第一』、『第二』、…等,並非特別指次序或順位的意思,其僅為了區別以相同技術用語描述的元件或操作。The terms "first", "second", .

請參照圖1,其係繪示根據本發明實施例之氣密檢測設備100的功能方塊示意圖。氣密檢測設備100包含承載盤110、加壓系統120以及檢測系統130。承載盤110係用以承載至少一個待測石英諧振器OSC。加壓系統120係用以接收承載盤110,並提供高壓環境。檢測系統130係用以於此高壓環境中對待測石英諧振器OSC進行氣密檢測步驟,以判斷待測石英諧振器OSC之氣密性是否正常。Please refer to FIG. 1 , which is a functional block diagram of an airtightness detection apparatus 100 according to an embodiment of the present invention. The air tightness detection apparatus 100 includes a carrier plate 110 , a pressurization system 120 and a detection system 130 . The carrier plate 110 is used for carrying at least one quartz resonator OSC to be tested. The pressurization system 120 is used to receive the carrier tray 110 and provide a high pressure environment. The detection system 130 is used to perform the airtightness detection step of the quartz resonator OSC to be tested in the high-voltage environment, so as to determine whether the airtightness of the quartz resonator OSC to be tested is normal.

請同時參照圖2、圖3a以及圖3b,圖2係繪示根據本發明實施例之氣密檢測設備100所適用之氣密檢測方法200的流程示意圖,圖3a-3b係繪示根據本發明實施例之氣密檢測設備100的結構上視圖。在氣密檢測方法200中,首先進行步驟210,以將待測石英諧振器OSC送入加壓系統120中。在本發明之一實施例中,待測石英諧振器OSC係置放於承載盤110上。承載盤110具有容置空間來容納待測石英諧振器OSC,例如承載盤163的槽孔SL。當待測石英諧振器OSC皆置入承載盤110之槽孔後,將承載盤110置放於平台140上,再透過軌道裝置150來送入加壓系統120之腔室121中,如圖3a所示。然而,本發明之實施例並不受限於此。在本發明之其他實施例中,承載盤110亦可利用機器手臂來置入加壓系統120之腔室121中。當承載盤110進入腔室121後,腔室121的出入口便會關閉,以使腔室121維持氣密狀態。Please refer to FIG. 2 , FIG. 3 a and FIG. 3 b at the same time. FIG. 2 is a schematic flowchart of an air tightness detection method 200 applicable to the air tightness detection apparatus 100 according to an embodiment of the present invention, and FIGS. 3 a to 3 b are diagrams according to the present invention. The top view of the structure of the air tightness detection apparatus 100 of the embodiment. In the airtight detection method 200 , step 210 is first performed to send the quartz resonator OSC to be tested into the pressurizing system 120 . In an embodiment of the present invention, the quartz resonator OSC to be tested is placed on the carrier plate 110 . The carrier plate 110 has an accommodating space for accommodating the quartz resonator OSC to be tested, such as the slot SL of the carrier plate 163 . After the quartz resonator OSCs to be tested are all placed in the slots of the carrier plate 110, the carrier plate 110 is placed on the platform 140, and then sent into the chamber 121 of the pressurizing system 120 through the rail device 150, as shown in FIG. 3a shown. However, embodiments of the present invention are not limited thereto. In other embodiments of the present invention, the carrier plate 110 can also be placed into the chamber 121 of the pressurizing system 120 by a robot arm. When the carrier plate 110 enters the chamber 121 , the entrance and exit of the chamber 121 are closed, so that the chamber 121 is kept in an airtight state.

接著,進行步驟220,以利用加壓系統120來於腔室121中產生高壓環境,並於此高壓環境下利用檢測系統130來對承載盤110上的每個待測石英諧振器OSC進行氣密檢測步驟,以判斷每個待測石英諧振器OSC之氣密性是否正常。在本發明之一實施例中,檢測系統130包含設置於腔室121中之一檢測治具(未繪示),此檢測治具係接觸待測石英諧振器OSC的接腳,以利檢測系統130於高壓環境下量測待測石英諧振器OSC的電子特性,例如頻率值、阻抗值(RR)、靜態電容值。然而,本發明之實施例並不受限於此。在本發明之其他實施例中,檢測系統130所量測的電子特性可根據使用者需求增加或減少。Next, step 220 is performed to use the pressurizing system 120 to generate a high pressure environment in the chamber 121 , and use the detection system 130 to airtight each quartz resonator OSC on the carrier plate 110 under the high pressure environment The detection step is to judge whether the air tightness of each quartz resonator OSC to be tested is normal. In one embodiment of the present invention, the detection system 130 includes a detection fixture (not shown) disposed in the chamber 121, and the detection fixture contacts the pins of the quartz resonator OSC to be tested, so as to facilitate the detection system 130 measures the electronic characteristics of the OSC of the quartz resonator to be measured, such as frequency value, impedance value (RR), and static capacitance value in a high-voltage environment. However, embodiments of the present invention are not limited thereto. In other embodiments of the present invention, the electronic properties measured by the detection system 130 can be increased or decreased according to user requirements.

在本發明之實施例中,檢測系統130係利用待測石英諧振器OSC的阻值來判斷待測石英諧振器OSC的氣密性是否正常。例如,在待測石英諧振器OSC進行檢測前,先記錄待測石英諧振器OSC在常壓狀態下的阻值,以作為待測石英諧振器OSC的標準阻值。在步驟220中,計算待測石英諧振器OSC在高壓環境下的阻值與此標準阻值之差值,並判斷此差值是否位於預設之標準差值範圍內。若此差值位於標準差值範圍內,則判定待測石英諧振器OSC之氣密性正常。反之,若此差值位於標準差值範圍外,則判定待測石英諧振器OSC之氣密性異常,其為異常品。In the embodiment of the present invention, the detection system 130 uses the resistance value of the quartz resonator OSC to be tested to determine whether the air tightness of the quartz resonator OSC to be tested is normal. For example, before the quartz resonator OSC to be tested is detected, the resistance value of the quartz resonator OSC to be tested under normal pressure is recorded as the standard resistance value of the quartz resonator OSC to be tested. In step 220, the difference between the resistance value of the quartz resonator OSC to be tested under the high voltage environment and the standard resistance value is calculated, and it is determined whether the difference value is within a predetermined standard deviation value range. If the difference is within the standard deviation range, it is determined that the airtightness of the OSC of the quartz resonator to be tested is normal. On the contrary, if the difference is outside the standard deviation range, it is determined that the air tightness of the quartz resonator OSC to be tested is abnormal, and it is an abnormal product.

另外,由於步驟220另量測了待測石英諧振器OSC的頻率值、阻抗值(RR)以及靜態電容值,故可利用頻率值、阻抗值以及靜態電容值來判斷是否需要重新檢測待測石英諧振器OSC。例如,在待測石英諧振器OSC進行檢測前,先記錄待測石英諧振器OSC在常壓狀態下的頻率值,以作為待測石英諧振器OSC的標準頻率值。然後,計算待測石英諧振器OSC在高壓環境下的頻率值與標準頻率值間的頻率偏差量。接著,判斷頻率偏差量是否位於預設的標準偏差量範圍內,並提供第一判斷結果。又例如,判斷待測石英諧振器OSC在高壓環境下的阻抗值與是否位於預設的標準阻抗值範圍內,並提供第二判斷結果。再例如,判斷待測石英諧振器OSC在高壓環境下的靜態電容值是否位於預設之標準靜態電容值範圍內,並提供第三判斷結果。當前述之第一判斷結果、第二判斷結果以及第三判斷結果之一者為否時,判定此待測石英諧振器OSC為重測品,其需再次進行檢測。In addition, since step 220 additionally measures the frequency value, impedance value (RR) and static capacitance value of the OSC of the quartz resonator to be tested, the frequency value, impedance value and static capacitance value can be used to determine whether it is necessary to re-detect the quartz to be tested. Resonator OSC. For example, before the quartz resonator OSC to be tested is detected, the frequency value of the quartz resonator OSC to be tested under normal pressure is recorded as the standard frequency value of the quartz resonator OSC to be tested. Then, calculate the frequency deviation between the frequency value of the quartz resonator OSC to be tested under the high pressure environment and the standard frequency value. Next, it is judged whether the frequency deviation is within a preset standard deviation range, and a first judgment result is provided. For another example, it is determined whether the impedance value of the quartz resonator OSC to be tested in a high-voltage environment is within a preset standard impedance value range, and a second determination result is provided. For another example, it is determined whether the static capacitance value of the quartz resonator OSC to be tested under a high voltage environment is within a predetermined standard static capacitance value range, and a third determination result is provided. When one of the aforementioned first determination result, second determination result and third determination result is negative, it is determined that the quartz resonator OSC to be tested is a re-tested product, which needs to be tested again.

在步驟220檢測完成後,接著進行步驟230,以將重測品和異常品選出,如圖3b所示。在本發明之實施例中,氣密檢測設備100更包含選別系統160,其包含平台161、機器手臂162以及承載盤163。平台161係用以接收承載盤110,並將承載盤110移動至機器手臂162的工作區域,以利機器手臂162將承載盤110中的重測品挑出,並置放於承載盤163中,以及將異常品挑出並放置於容器170中。在本發明實施例中,步驟220會紀錄異常品和重測品在承載盤110上的位置,以利機器手臂162將異常品和重測品挑出。After the detection in step 220 is completed, step 230 is followed to select the retested product and the abnormal product, as shown in FIG. 3 b . In the embodiment of the present invention, the air tightness detection apparatus 100 further includes a sorting system 160 , which includes a platform 161 , a robot arm 162 and a carrier plate 163 . The platform 161 is used to receive the carrier tray 110 and move the carrier tray 110 to the working area of the robot arm 162, so that the robot arm 162 can pick out the re-measurement product in the carrier tray 110 and place it in the carrier tray 163, and Anomalies are picked out and placed in container 170 . In the embodiment of the present invention, step 220 records the position of the abnormal product and the re-tested product on the carrier tray 110, so that the robot arm 162 can pick out the abnormal product and the re-tested product.

當承載盤110中的重測品皆被挑出置放於承載盤163後,承載盤163會被置放於氣密檢測設備100之平台140上,以再次對承載盤163上的重測品進行檢測(前述之步驟220),其中當重測品進行檢測後,依舊被判定為重測品時,會再次對此重測品進行重測。After all the re-measured items in the carrier tray 110 are picked out and placed on the carrier tray 163 , the carrier tray 163 will be placed on the platform 140 of the airtight testing apparatus 100 to re-test the re-measured items on the carrier tray 163 again. Perform detection (the aforementioned step 220 ), wherein after the re-tested product is still determined to be a re-tested product, the re-tested product will be re-tested again.

請參照圖4,其係繪示根據本發明實施例之加壓系統120的簡單結構示意圖。加壓系統120包含前述之腔室121、主要儲氣筒122、回收儲氣筒123、第一閥門124、第二閥門125以及第三閥門126。第一閥門124係設置於腔室121與主要儲氣筒122之間,以控制主要儲氣筒122對腔室121供應加壓氣體。第二閥門125係設置於腔室121與回收儲氣筒123之間,以控制回收儲氣筒123對腔室121供應加壓氣體,或控制回收儲氣筒123從腔室121回收加壓氣體。第三閥門126係設置於腔室121與排氣管道OU之間,以控制腔室121透過排氣管道OU排出加壓氣體,以進行腔室121的洩壓。Please refer to FIG. 4 , which is a schematic diagram of a simple structure of a pressurizing system 120 according to an embodiment of the present invention. The pressurizing system 120 includes the aforementioned chamber 121 , a main air tank 122 , a recovery air tank 123 , a first valve 124 , a second valve 125 and a third valve 126 . The first valve 124 is disposed between the chamber 121 and the main gas storage cylinder 122 to control the main gas storage cylinder 122 to supply pressurized gas to the chamber 121 . The second valve 125 is disposed between the chamber 121 and the recovery gas storage cylinder 123 to control the recovery gas storage cylinder 123 to supply pressurized gas to the chamber 121 , or control the recovery gas storage cylinder 123 to recover pressurized gas from the chamber 121 . The third valve 126 is disposed between the chamber 121 and the exhaust pipe OU to control the chamber 121 to discharge pressurized gas through the exhaust pipe OU, so as to relieve the pressure of the chamber 121 .

請參照圖5,其係繪示在前述步驟220中,利用加壓系統120來提供高壓環境之步驟500的流程示意圖。在本實施例中,步驟500包含第一加壓階段510、第二加壓階段520以及回收階段530。在第一加壓階段510中,開啟第二閥門125,以利用回收儲氣筒123供應加壓氣體至腔室121來將腔室121加壓至第一氣壓值。在本發明之實施例中,回收儲氣筒123係回收前次加壓步驟所留下的加壓氣體,並於第一加壓階段510中提供加壓氣體至腔室121。在本實施例中,回收儲氣筒123在回收後具有2公斤/平方公分的氣壓值,並據此來提供加壓氣體至腔室121。在第二加壓階段520中,關閉第二閥門125並開啟第一閥門124,以利用主要儲氣筒122來供應加壓氣體至腔室121,以將腔室121加壓至第二氣壓值。在本實施例中,主要儲氣筒122具有5公斤/平方公分的氣壓值,其可將腔室121加壓至4.7公斤/平方公分~5.0公斤/平方公分(第二氣壓值),並維持3.0分鐘。在腔室121之壓力達到4.7公斤/平方公分~5.0公斤/平方公分後,前述之步驟220便會對待測石英諧振器OSC進行檢測。Please refer to FIG. 5 , which is a schematic flowchart of the step 500 of using the pressurizing system 120 to provide a high-pressure environment in the aforementioned step 220 . In this embodiment, step 500 includes a first pressurization stage 510 , a second pressurization stage 520 and a recovery stage 530 . In the first pressurizing stage 510 , the second valve 125 is opened to supply pressurized gas to the chamber 121 from the recovery gas cylinder 123 to pressurize the chamber 121 to the first gas pressure value. In the embodiment of the present invention, the recovery gas storage cylinder 123 recovers the pressurized gas left by the previous pressurizing step, and provides the pressurized gas to the chamber 121 in the first pressurizing stage 510 . In this embodiment, the recovery gas storage cylinder 123 has a gas pressure value of 2 kg/cm2 after recovery, and supplies pressurized gas to the chamber 121 accordingly. In the second pressurizing stage 520 , the second valve 125 is closed and the first valve 124 is opened to supply pressurized gas to the chamber 121 from the main gas reservoir 122 to pressurize the chamber 121 to the second gas pressure value. In this embodiment, the main air storage cylinder 122 has an air pressure of 5 kg/cm 2 , which can pressurize the chamber 121 to 4.7 kg/cm 2 to 5.0 kg/cm 2 (the second air pressure value), and maintain a pressure of 3.0 minute. After the pressure of the chamber 121 reaches 4.7 kg/cm 2 to 5.0 kg/cm 2 , the aforementioned step 220 will detect the OSC of the quartz resonator to be tested.

在檢測完成後,進行回收階段530。在回收階段530中,關閉第一閥門124並開啟第二閥門125,以利用回收儲氣桶123來從腔室121回收加壓氣體。在本實施例中,當回收儲氣筒123具有2公斤/平方公分的氣壓值後,關閉第二閥門125並開啟第三閥門126,以利用排氣管道OU來進行洩壓。After the detection is complete, the recovery stage 530 proceeds. In the recovery stage 530 , the first valve 124 is closed and the second valve 125 is opened to recover the pressurized gas from the chamber 121 using the recovery gas storage tank 123 . In the present embodiment, when the recovery air storage cylinder 123 has an air pressure value of 2 kg/cm 2 , the second valve 125 is closed and the third valve 126 is opened, so as to use the exhaust pipe OU to relieve pressure.

由以上說明可知,本發明實施例之氣密檢測設備100與氣密檢測方法200係利用加壓的方式來檢測待測石英諧振器之氣密性,其中氣密檢測設備100可回收加壓氣體來降低檢測的成本,而氣密檢測方法200則透過量測待測石英諧振器的多個電子特性來輔助判斷待測石英諧振器是否需要重測或異常。故,本發明實施例之氣密檢測設備與氣密檢測方法可提高石英諧振器的檢測準確率並降低檢測所需之成本。It can be seen from the above description that the airtightness detection apparatus 100 and the airtightness detection method 200 according to the embodiments of the present invention use pressure to detect the airtightness of the quartz resonator to be tested, wherein the airtightness detection apparatus 100 can recover the pressurized gas In order to reduce the cost of detection, the airtightness detection method 200 assists in determining whether the quartz resonator to be tested needs to be re-measured or abnormal by measuring a plurality of electronic characteristics of the quartz resonator to be tested. Therefore, the airtightness detection apparatus and the airtightness detection method of the embodiments of the present invention can improve the detection accuracy of the quartz resonator and reduce the cost required for detection.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed above by the embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the technical field can make some changes and modifications without departing from the spirit and scope of the present invention. Therefore, The protection scope of the present invention shall be determined by the scope of the appended patent application.

100:氣密檢測設備 110:承載盤 120:加壓系統 121:腔室 122:主要儲氣筒 123:回收儲氣筒 124:第一閥門 125:第二閥門 126:第三閥門 130:檢測系統 140:平台 150:軌道裝置 160:選別系統 161:平台 162:機器手臂 163:承載盤 170:容器 200:氣密檢測方法 210~230:步驟 500:步驟 510~530:步驟 OSC:待測石英諧振器 SL:槽孔 100: Air tightness testing equipment 110: Carrier plate 120: Pressurized system 121: Chamber 122: Main air reservoir 123: Recycle Air Tank 124: The first valve 125: Second valve 126: The third valve 130: Detection System 140: Platform 150: Track Device 160: Selection System 161: Platform 162: Robot Arm 163: Carrier plate 170: Container 200: Air tightness detection method 210~230: Steps 500: Steps 510~530: Steps OSC: Quartz resonator to be tested SL: slotted hole

圖1係繪示根據本發明實施例之氣密檢測設備的功能方塊示意圖。 圖2係繪示根據本發明實施例之氣密檢測設備所適用之氣密檢測方法的流程示意圖。 圖3a和圖3b係繪示本發明實施例之氣密檢測設備的結構上視圖。 圖4係繪示根據本發明實施例之加壓系統的簡單結構示意圖。 圖5 係繪示利用加壓系統來提供高壓環境之步驟的流程示意圖。 FIG. 1 is a functional block diagram illustrating an air tightness detection apparatus according to an embodiment of the present invention. FIG. 2 is a schematic flowchart of an airtight detection method to which the airtightness detection apparatus according to an embodiment of the present invention is applicable. 3a and 3b are top views of the structure of the air tightness detection apparatus according to the embodiment of the present invention. FIG. 4 is a schematic diagram illustrating a simple structure of a pressurizing system according to an embodiment of the present invention. FIG. 5 is a schematic flow chart illustrating the steps of using a pressurized system to provide a high pressure environment.

none

200:氣密檢測方法 200: Air tightness detection method

210~230:步驟 210~230: Steps

Claims (10)

一種氣密檢測設備,包含:一承載盤,用以承載至少一待測石英諧振器;一加壓系統,包含:一腔室,用以容置該承載盤,其中該腔室具有一腔室入口,當該承載盤由該腔室入口進入該腔室後,該腔室入口關閉,以使該腔室維持氣密狀態;一回收儲氣筒,用以於一第一加壓階段中,供應加壓氣體至該腔室來將該腔室加壓至一第一氣壓值,以及用以於一回收階段中從該腔室回收加壓氣體;以及一主要儲氣筒,用以於一第二加壓階段中,供應加壓氣體至該腔室,以將該腔室加壓至一第二氣壓值,其中該第二加壓階段接續於該第一加壓階段,該回收階段接續於該第二加壓階段,該第二氣壓值大於該第一氣壓值;以及一檢測系統,用以於該第二加壓階段中檢測該至少一待測石英諧振器之一阻值,並根據該阻值來進行一氣密檢測步驟,以判斷該至少一待測石英諧振器之氣密性是否正常;其中該第一氣壓值大於一大氣壓力,且小於該第二氣壓值。 An air tightness detection device, comprising: a carrier plate for carrying at least one quartz resonator to be tested; a pressurization system, comprising: a chamber for accommodating the carrier plate, wherein the chamber has a chamber an inlet, when the carrier plate enters the chamber from the chamber inlet, the chamber inlet is closed to keep the chamber airtight; a recovery air storage cylinder is used for supplying in a first pressurizing stage pressurizing gas to the chamber for pressurizing the chamber to a first gas pressure value and for recovering pressurized gas from the chamber in a recovery stage; and a main gas reservoir for a second gas pressure In the pressurizing stage, pressurized gas is supplied to the chamber to pressurize the chamber to a second gas pressure value, wherein the second pressurizing stage is subsequent to the first pressurizing stage, and the recovery stage is subsequent to the In the second pressurizing stage, the second air pressure value is greater than the first air pressure value; and a detection system is used for detecting a resistance value of the at least one quartz resonator to be tested in the second pressurizing stage, and according to the The resistance value is used to perform an airtightness detection step to determine whether the airtightness of the at least one quartz resonator to be tested is normal; wherein the first air pressure value is greater than an atmospheric pressure and smaller than the second air pressure value. 如申請專利範圍第1項所述之氣密檢測設備,其中該加壓系統更包含: 一第一閥門,設置於該腔室與該主要儲氣筒之間,以控制該主要儲氣筒對該腔室供應加壓氣體;一第二閥門,設置於該腔室與該回收儲氣筒之間,以控制該回收儲氣筒對該腔室供應加壓氣體,或控制該回收儲氣筒從該腔室回收加壓氣體;以及至少一第三閥門,設置於該腔室與一排氣管道之間,以控制該腔室透過該排氣管道排出加壓氣體,以進行洩壓。 The air tightness detection equipment as described in item 1 of the scope of the application, wherein the pressurization system further comprises: A first valve is arranged between the chamber and the main gas storage cylinder to control the main gas storage cylinder to supply pressurized gas to the chamber; a second valve is arranged between the chamber and the recovery gas storage cylinder , to control the recovery gas storage cylinder to supply pressurized gas to the chamber, or control the recovery gas storage cylinder to recover pressurized gas from the chamber; and at least one third valve, arranged between the chamber and an exhaust pipe , so as to control the chamber to discharge the pressurized gas through the exhaust pipe for pressure relief. 如申請專利範圍第1項所述之氣密檢測設備,其中該檢測系統所進行之該氣密檢測步驟包含:計算該至少一待測石英諧振器之該阻值與一標準阻值之一差值;以及判斷該差值是否位於一標準差值範圍內;當該差值位於該標準差值範圍內時,判定該至少一待測石英諧振器之氣密性為正常。 The airtight detection device as described in claim 1, wherein the airtight detection step performed by the detection system comprises: calculating a difference between the resistance value of the at least one quartz resonator to be measured and a standard resistance value and judging whether the difference is within a standard deviation range; when the difference is within the standard deviation range, it is judged that the airtightness of the at least one quartz resonator to be tested is normal. 如申請專利範圍第3項所述之氣密檢測設備,其中該檢測系統更用進行一特性檢測步驟,該特性檢測步驟包含:獲取該至少一待測石英諧振器之一頻率偏差量、一阻抗值以及一靜態電容值:判斷該頻率偏差量是否位於一標準偏差量範圍內,並提供一第一判斷結果;判斷該阻抗值是否位於一標準阻抗值範圍內,並提供一 第二判斷結果;以及判斷該靜態電容值是否位於一標準靜態電容值範圍內,並提供一第三判斷結果;其中,當該第一判斷結果、該第二判斷結果以及該第三判斷結果之一者為否時,決定該至少一待測石英諧振器為一重測品,並於該承載盤離開該腔室後,取出該重測品,以再次對該重測品進行該氣密檢測步驟。 The air-tightness detection device as described in claim 3, wherein the detection system is further used to perform a characteristic detection step, and the characteristic detection step comprises: acquiring a frequency deviation, an impedance of the at least one quartz resonator to be measured value and a static capacitance value: determine whether the frequency deviation is within a standard deviation range, and provide a first judgment result; determine whether the impedance value is within a standard impedance value range, and provide a the second judgment result; and judge whether the static capacitance value is within a standard static capacitance value range, and provide a third judgment result; wherein, when the first judgment result, the second judgment result and the third judgment result are among the When one is no, it is determined that the at least one quartz resonator to be tested is a re-tested product, and after the carrier plate leaves the chamber, the re-tested product is taken out to perform the air tightness detection step on the re-tested product again . 如申請專利範圍第1項所述之氣密檢測設備,其中該第二氣壓值為4.7公斤/平方公分~5.0公斤/平方公分。 The air-tightness detection device as described in item 1 of the patent application scope, wherein the second air pressure value is 4.7 kg/cm 2 to 5.0 kg/cm 2 . 一種氣密檢測方法,包含:將一待測石英諧振器送入一加壓系統之一腔室中;封閉該腔室,以使該腔室維持氣密狀態;利用該加壓系統來對該腔室進行一加壓步驟,其中該加壓步驟包含:進行一第一加壓階段,以利用一回收儲氣桶來供應加壓氣體至該腔室來將該腔室加壓至一第一氣壓值;進行一第二加壓階段,以利用一主要儲氣桶來供應加壓氣體至該腔室來將該腔室加壓至一第二氣壓值,其中該第二加壓階段接續於該第一加壓階段,該第二氣壓值大於該第一氣壓值;以及進行一回收階段,以利用該回收儲氣桶來從該腔室回 收加壓氣體;以及於該第二加壓階段中,檢測該待測石英諧振器之一阻值,並根據該阻值來進行一氣密檢測步驟,以判斷該待測石英諧振器之氣密性是否正常;其中該第一氣壓值大於一大氣壓力,且小於該第二氣壓值。 An airtight detection method, comprising: sending a quartz resonator to be tested into a chamber of a pressurizing system; sealing the chamber to keep the chamber airtight; using the pressurizing system to The chamber is subjected to a pressurizing step, wherein the pressurizing step includes: performing a first pressurizing stage, to use a recovery gas storage tank to supply pressurized gas to the chamber to pressurize the chamber to a first pressurizing stage air pressure value; performing a second pressurizing stage to pressurize the chamber to a second air pressure value by supplying pressurized gas to the chamber using a main gas storage tank, wherein the second pressurizing stage is followed by In the first pressurizing stage, the second air pressure value is greater than the first air pressure value; and a recovery stage is performed to use the recovery gas storage tank to return from the chamber collecting pressurized gas; and in the second pressurizing stage, detecting a resistance value of the quartz resonator to be tested, and performing an airtight detection step according to the resistance value to determine the airtightness of the quartz resonator to be tested Whether the air pressure is normal; wherein the first air pressure value is greater than an atmospheric pressure and smaller than the second air pressure value. 如申請專利範圍第6項所述之氣密檢測方法,其中該氣密檢測步驟包含:計算該待測石英諧振器之該阻值與一標準阻值之一差值;以及判斷該差值是否位於一標準差值範圍內;其中,當該差值位於該標準差值範圍內時,判定該待測石英諧振器之氣密性為正常。 The airtight detection method as described in claim 6, wherein the airtight detection step comprises: calculating a difference between the resistance value of the quartz resonator to be measured and a standard resistance value; and judging whether the difference value is is within a standard deviation value range; wherein, when the difference value is within the standard deviation value range, it is determined that the air tightness of the quartz resonator to be tested is normal. 如申請專利範圍第7項所述之氣密檢測方法,更包含:於該第二加壓階段中,進行一特性檢測步驟,其中該特性檢測步驟包含:獲得該待測石英諧振器之一頻率偏差量、一阻抗值以及一靜態電容值:判斷該頻率偏差量是否位於一標準偏差量範圍內,並提供一第一判斷結果;判斷該阻抗值是否位於一標準阻抗值範圍內,並提供一 第二判斷結果;以及判斷該靜態電容值是否位於一標準靜態電容值範圍內,並提供一第三判斷結果;其中,當該第一判斷結果、該第二判斷結果以及該第三判斷結果之一者為否時,決定該待測石英諧振器為一重測品,並於該承載盤離開該腔室後,取出該重測品,以再次對該重測品進行該氣密檢測步驟。 The air-tightness detection method described in item 7 of the scope of the patent application further comprises: in the second pressurizing stage, performing a characteristic detection step, wherein the characteristic detection step comprises: obtaining a frequency of the quartz resonator to be measured Deviation, an impedance value, and a static capacitance value: determine whether the frequency deviation is within a standard deviation range, and provide a first judgment result; determine whether the impedance value is within a standard impedance value range, and provide a the second judgment result; and judge whether the static capacitance value is within a standard static capacitance value range, and provide a third judgment result; wherein, when the first judgment result, the second judgment result and the third judgment result are among the When one is no, it is determined that the quartz resonator to be tested is a re-tested product, and after the carrier plate leaves the chamber, the re-tested product is taken out to perform the airtight detection step on the re-tested product again. 如申請專利範圍第6項所述之氣密檢測方法,其中該第二氣壓值為4.7公斤/平方公分~5.0公斤/平方公分。 The air tightness detection method described in item 6 of the scope of the patent application, wherein the second air pressure value is 4.7 kg/cm 2 to 5.0 kg/cm 2 . 如申請專利範圍第9項所述之氣密檢測方法,其中該第二加壓階段將該腔室加壓至該第二氣壓值後,維持該第二氣壓值3.0分鐘。 The air tightness detection method as described in claim 9, wherein after the second pressurizing stage pressurizes the chamber to the second air pressure value, the second air pressure value is maintained for 3.0 minutes.
TW109138393A 2020-11-04 2020-11-04 Gas tightness detection equipment and gas tightness detection method TWI775206B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW109138393A TWI775206B (en) 2020-11-04 2020-11-04 Gas tightness detection equipment and gas tightness detection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW109138393A TWI775206B (en) 2020-11-04 2020-11-04 Gas tightness detection equipment and gas tightness detection method

Publications (2)

Publication Number Publication Date
TW202219477A TW202219477A (en) 2022-05-16
TWI775206B true TWI775206B (en) 2022-08-21

Family

ID=82558939

Family Applications (1)

Application Number Title Priority Date Filing Date
TW109138393A TWI775206B (en) 2020-11-04 2020-11-04 Gas tightness detection equipment and gas tightness detection method

Country Status (1)

Country Link
TW (1) TWI775206B (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010276445A (en) * 2009-05-28 2010-12-09 Seiko Epson Corp Airtight inspection apparatus and airtight inspection method for piezoelectric device
TW201511140A (en) * 2013-09-12 2015-03-16 jun-xian Li Pressure container and method of forming airtight pressure environment
CN104535282A (en) * 2014-11-24 2015-04-22 应达利电子(深圳)有限公司 Airtightness detecting method and device of quartz crystal resonator

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010276445A (en) * 2009-05-28 2010-12-09 Seiko Epson Corp Airtight inspection apparatus and airtight inspection method for piezoelectric device
TW201511140A (en) * 2013-09-12 2015-03-16 jun-xian Li Pressure container and method of forming airtight pressure environment
CN104535282A (en) * 2014-11-24 2015-04-22 应达利电子(深圳)有限公司 Airtightness detecting method and device of quartz crystal resonator

Also Published As

Publication number Publication date
TW202219477A (en) 2022-05-16

Similar Documents

Publication Publication Date Title
US6635379B2 (en) Battery sealing inspection method
CN105651464B (en) For scaling method after the leak detection sensitivities of Large Spacecraft leak detection
US6593026B1 (en) Sealed battery and method for manufacturing sealed battery
CN109540408A (en) Air tightness detection method and device
CN112146818B (en) Double-station ultrasensitive leak detection method and system applied to packaging of electronic components
WO2005110780A1 (en) Tire pressure leak detection method and system
KR20040065522A (en) Method for leak testing of electrochemical elements
CN103335791A (en) Helium mass spectrum fine leak detecting method bead on quantitatively determined maximum detection waiting time
CN109341979B (en) Nitrogen and helium leak detection system
CN109540421A (en) Air tightness detection device and method
CN102121963B (en) Method and equipment for detecting crude leakage of surface-mount quartz resonator
JP2500488B2 (en) Leak test method and leak test device
TWI775206B (en) Gas tightness detection equipment and gas tightness detection method
CN208239037U (en) A kind of valve seal device for detecting performance
CN101750192A (en) Low gas consumption detection method of pressure helium leakage detector
CN103398830A (en) Oil chamber sealing leak detection device and method of on-load tap-changer
CN103063381A (en) Method and device for vacuum cavity leakage detection for sensors with vacuum reference cavities
CN110542518B (en) Method and equipment for testing sealing performance of adhesive assembly
US7150936B2 (en) Sealed battery and method for manufacturing sealed battery
JP3983479B2 (en) Battery leakage inspection device
CN108534963A (en) A kind of water proofing property detection method and system
JPH10232179A (en) Method for inspecting leak of fine part and apparatus for inspecting leak using the same
JP4091367B2 (en) Leak inspection method
CN114441098A (en) Air tightness detection device and air tightness detection method
CN201133863Y (en) Gas-tight seal measuring apparatus

Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent