TWI773553B - High-precision and portable instrument for billet half lens - Google Patents

Abstract

An optical instrument for Billet half lens realizes the principle of Billet half lens. It combines two Fresnel lenses, and sets the two lenses into an adjustable device. The invention discloses a high-precision and portable instrument for Billet half lens. This instrument includes an optical module and a measuring module. For the experiment of Billet half lens, two Fresnel lenses and the slit between them are illuminated by the laser light source. It creates a physical interference pattern on the screen through the slit. Using the vernier height gauge on the instrument to measure the distance between the laser light source and the Fresnel lenses, the high-precision infrared distance meter is used to measure the distance between the laser light source and the Fresnel lenses, and the Micrometer Micro-adjust Frame is also used for adjusting and measuring the slit width between two Fresnel lenses. Interference patterns corresponding to different variables can be observed on the screen.

Description

High Precision Portable Bieler Cut Lens Instrument

The invention relates to an optical experimental instrument; in particular, to the experiment of the Bieler cut lens, the instrument uses a micrometer fine-tuning frame to fix two pieces of Fresnel lenses, and can adjust the distance between the two lenses, especially to realize the Beeler cut lens. The principle of the lens and the distance between the two lenses can be measured and fine-tuned in experiments. Use the vernier height gauge on the instrument to measure the distance between the laser light and the lens, and use a high-precision infrared rangefinder to measure the distance between the interference image and the lens. The present invention especially realizes an optical experiment demonstration instrument which is easy to operate, easy to carry, easy to adjust and easy to operate.

Bieler's tangential lens is a famous theory in modern optics. This theory is completely different from the double-slit interference principle in classical optics, but it can produce the same interference result as double-slit interference.

In the theory of Bieler's cross-cut lens, when a single divergent light beam passes through two separate semicircular convex lenses, when the light beam passes through the two semicircular lenses, it will be focused into two light sources and then diverged again to form an interference pattern on the screen. , it is difficult to realize this theory as an experimental demonstration: First, because the shape of the convex lens itself is difficult to use a fixture to fix, when the distance between the two semi-circular convex lenses is widened, the semi-circular convex lens sheet is easy to be fixed because the fixture cannot be used. good, and skew is generated, which in turn affects the experimental results. In addition, when a convex lens is used as the lens of the experimental instrument, the thickness of the lens will become thicker with the increase of magnification, which will increase the difficulty of using a fixture to fix it, and also increase the difficulty of replacing the lens.

In addition, it is inconvenient to measure the distance between the convex lens sheets and the distance between the convex lens and the screen, and it is necessary to use a micrometer or other measuring tools to measure one by one.

Furthermore, most of the optical experimental instruments are bulky, difficult to carry, difficult to assemble, complicated to operate, and difficult to carry out promotion and teaching demonstration activities.

Therefore, how to easily move the two semi-circular lenses so that the semi-circular lenses are not skewed, and how to carry them easily for measurement has become one of the problems to be solved by those skilled in the art.

Therefore, the object of the present invention is to provide an apparatus for realizing the principle of Bieler's cross-cut lens.

The technical solution adopted by the present invention is to provide a high-precision portable Bieler cross-section lens instrument, which includes an optical module and a measurement module. The optical module includes a micrometer fine-tuning frame and two Fresnel lenses, the precision of the micrometer fine-tuning frame is 0.001mm, and the two Fresnel lenses are cut in half by a complete Fresnel lens with a diameter of 10cm and a thread of 0.1mm. The two Fresnel lenses are respectively mounted on the movable toe and the fixed toe of the micrometer fine-tuning frame. Rotating the knob of the micrometer fine-tuning frame can move the position of the movable toe of the micrometer to adjust the distance between the two Fresnel lenses, and simultaneously measure the distance between the two Fresnel lenses. The distance between the two Fresnel lenses. A measuring module includes a vernier height gauge, a laser light source, a power source, and an infrared rangefinder. There are hexagonal cylinders on both sides of the vernier height gauge as the base of the Bieler cut-lens instrument, The front side of one of the hexagonal cylinder bases is used to install the micrometer fine-tuning frame, the upper side of the hexagonal cylinder base is used to install the infrared rangefinder, the laser light source is installed on the vernier sub-ruler on the vernier height ruler, the power supply Installed on the right side of the laser light source, the infrared rangefinder is used to measure the distance between the image on the screen and the Fresnel lens.

The above-mentioned high-precision portable Bieler cut lens instrument, wherein the hexagonal A rotatable metal support frame is arranged on the upper side of the cylindrical base to provide a base for the infrared range finder.

In the above-mentioned high-precision portable Bieler cross-cut lens instrument, the back of the infrared range finder and the rotatable metal support frame are provided with a devil felt, so that the infrared range finder can be easily disassembled and stored.

The effect of the present invention is to realize and enhance the principle of the Bieler cut lens as an experimental instrument for precise adjustment and measurement of the distance between the lenses and easy to carry. The optical module provided by the present invention, the rotating shaft of the micrometer fine-tuning frame can be finely adjusted and finely measured. The distance between the two Fresnel lenses, the application of the Fresnel lens makes it easy to fix the lens on the micrometer, the measuring module provided by the present invention, the infrared rangefinder can accurately measure the two Fresnel lenses and the interference The distance between the images, the vernier height gauge can adjust and measure the distance between the laser light source and the Fresnel lens, saving the time required to measure the above distances one by one; The lens cutting instrument is small in size and can be stored in an experimental instrument box, which is convenient to carry and use in teaching demonstrations.

In order to make the above-mentioned features and advantages of the present invention easier to understand, the following examples are given and described in detail with the accompanying drawings. invention is restricted.

A: High-precision portable Bieler cross-cut lens instrument

B: Optical module

B1: Fresnel lens

B2: Micrometer Micrometer Holder

C: Measurement module

C1: vernier height gauge

C11: Hexagonal Cylinder Base

C12: vernier sub-ruler

C2: Laser light source

C3: Power

C4: Infrared rangefinder

D: Interferometric imaging

E: rotatable metal support frame

The first figure is a schematic diagram of the use state of the present invention.

The second figure is a front view of the present invention.

The third figure is a rear view of the present invention.

The fourth figure is a left side view of the present invention.

The fifth figure is a right side view of the present invention.

The sixth figure is a bottom view of the present invention

Figure 7 is a top view of the present invention

The present invention is further described below with reference to the accompanying drawings and specific embodiments, but not as a limitation of the present invention.

Generally according to the present invention, the high-precision portable Bieler lens instrument A includes an optical module B and a measurement module C. Please refer to Figure 1, Figure 2 and Figure 7, operate the high-precision portable Bieler lens instrument A to slide the vernier scale C12 of the vernier height scale C1 to adjust the laser light source and the two Fresnel lenses The distance between B1 and the two Fresnel lenses B1 is cut into two pieces from a complete Fresnel lens with a 10cm thread and 0.1 thread. They are respectively installed on the movable toe and fixed toe of the micrometer. Rotate the knob of the micrometer fine-tuning bracket B2 to change the movable Toe position to adjust the distance between the two Fresnel lenses B1. Install the infrared rangefinder C4 on the base in front of the vernier height gauge, and finally press the switch of the power supply C3, so that the laser light source C2 forms an interference image D on the screen through the two Fresnel lenses B1, through the vernier height gauge, The value displayed by the micrometer trimmer and the infrared rangefinder is used as the measurement data.

A: High-precision portable Bieler cross-cut lens instrument

B: Optical module

B1: Fresnel lens

B2: Micrometer Micrometer Holder

C: Measurement module

C1: vernier height gauge

C11: Hexagonal Cylinder Base

C12: vernier sub-ruler

C2: Laser light source

C3: Power

C4: Infrared rangefinder

D: Interferometric imaging

E: rotatable metal support frame

Claims (6)

A Bieler cut lens instrument, which includes: an optical module, which includes a micrometer fine-tuning frame, two Fresnel lenses; a measuring module, which includes a vernier height gauge, a laser light source, a power supply, and a Infrared rangefinder, the vernier height gauge uses the hexagonal cylinders on both sides as the base of the Bieler cross-cut lens instrument, and the front side of the base of a hexagonal cylinder is used to install the micrometer fine-tuning frame, the six The upper side of the prism base is used to install an infrared rangefinder. The laser light source is installed on the vernier sub-ruler on the vernier height gauge. The power supply is installed on the right side of the laser light source. The infrared rangefinder is used to measure the screen. The distance between the image and the Fresnel lens. The Bieler cross-cut lens instrument according to claim 1, wherein in the measurement module, the laser light source and the power supply can slide on the vernier height scale simultaneously. The Bieler cross-section lens instrument as claimed in claim 1, wherein in the optical module, the two Fresnel lenses are arranged on the micrometer fine adjustment frame, and the two Fresnel lenses are adjusted by rotating the knob of the micrometer fine adjustment frame The distance between the two Fresnel lenses can be measured at the same time. The Bieler cut lens instrument according to claim 1, wherein in the optical module, the two Fresnel lenses are Fresnel lenses with a diameter of 10 cm and a thread of 0.1 mm. The Bieler cross-cut lens instrument according to claim 1, wherein in the optical module, the precision of the micrometer is 0.001 mm. The Bieler cross-cut lens instrument as claimed in claim 1, wherein in the measuring module, a rotatable metal support frame is arranged on the upper side of the hexagonal cylinder base of the vernier height gauge, which is used for infrared ranging The base of the instrument.

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