TWI762218B - Inspection system of driving circuit - Google Patents

Inspection system of driving circuit Download PDF

Info

Publication number
TWI762218B
TWI762218B TW110106802A TW110106802A TWI762218B TW I762218 B TWI762218 B TW I762218B TW 110106802 A TW110106802 A TW 110106802A TW 110106802 A TW110106802 A TW 110106802A TW I762218 B TWI762218 B TW I762218B
Authority
TW
Taiwan
Prior art keywords
transistor
signal line
detection
circuit
signal
Prior art date
Application number
TW110106802A
Other languages
Chinese (zh)
Other versions
TW202234081A (en
Inventor
奚鵬博
林振祺
Original Assignee
友達光電股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 友達光電股份有限公司 filed Critical 友達光電股份有限公司
Priority to TW110106802A priority Critical patent/TWI762218B/en
Application granted granted Critical
Publication of TWI762218B publication Critical patent/TWI762218B/en
Publication of TW202234081A publication Critical patent/TW202234081A/en

Links

Images

Abstract

An inspection system of driving circuit includes a gate driving circuit, an inspection circuit and a switch circuit. The inspection circuit is coupled to a first signal line. The switch circuit is coupled to a second signal line. During a first period, the first signal line sends an activating signal to the inspection circuit. The second signal line sends a closing signal to the switch circuit. The inspection circuit executes an inspection operation and outputs a sensing voltage through the sensing terminal. The switch circuit is tumed off. During a second period, the first signal line sends a closing signal to the inspection circuit. The second signal line emits an activating signal to the switch circuit. The inspection circuit is turned off and outputs a first operating voltage on the sensing terminal. The switch circuit is turned on.

Description

驅動電路檢測系統 Drive circuit detection system

本發明關於一種利用檢測電路和切換電路的配置來執行檢測動作之驅動電路檢測系統。 The present invention relates to a drive circuit detection system that performs a detection action using a configuration of a detection circuit and a switching circuit.

一般而言,面板的驅動電路為電流型驅動電路,面板的驅動電路所利用的檢測方式多為直接性電流抽載,其通常為單一檢測路徑而僅能檢測面板的驅動電路的部分元件的運作狀況,而未能檢測面板的驅動電路的短路或開路狀況,如何解決前述癥結點,遂成為待解決的問題。 Generally speaking, the driving circuit of the panel is a current-type driving circuit, and the detection method used by the driving circuit of the panel is mostly direct current pumping, which is usually a single detection path and can only detect the operation of some components of the driving circuit of the panel. However, the short-circuit or open-circuit condition of the driving circuit of the panel cannot be detected, and how to solve the above-mentioned crux of the problem has become a problem to be solved.

綜觀前所述,本發明之發明者思索並設計一種驅動電路檢測系統,以期針對習知技術之缺失加以改善,進而增進產業上之實施利用。 In view of the foregoing, the inventors of the present invention have considered and designed a driving circuit detection system, in order to improve the deficiencies of the prior art, thereby enhancing the implementation and utilization in the industry.

有鑑於上述習知之問題,本發明的目的在於提供一種驅動電路檢測系統,用以解決習知技術中所面臨之問題。 In view of the above-mentioned conventional problems, an object of the present invention is to provide a driving circuit detection system to solve the problems faced in the conventional technology.

基於上述目的,本發明提供一種驅動電路檢測系統,其包括閘極驅動電路、檢測電路以及切換電路。檢測電路耦接第一訊號線。切換電路耦接第二訊號線。其中,於第一時間,第一訊號線發出啟動訊號至檢測電路,第二訊號線發出關閉訊號至切換電路,檢測電路進行檢測動作並於檢測端輸出感測 電壓,切換電路關閉;於第二時間,第一訊號線發出關閉訊號至檢測電路,第二訊號線發出啟動訊號至切換電路,檢測電路關閉並於檢測端輸出第一工作電壓,切換電路導通。 Based on the above object, the present invention provides a driving circuit detection system, which includes a gate driving circuit, a detection circuit and a switching circuit. The detection circuit is coupled to the first signal line. The switching circuit is coupled to the second signal line. Among them, at the first time, the first signal line sends a start-up signal to the detection circuit, the second signal line sends a shutdown signal to the switching circuit, the detection circuit performs the detection action and outputs the sense at the detection end voltage, the switching circuit is turned off; at the second time, the first signal line sends a shutdown signal to the detection circuit, the second signal line sends a start signal to the switching circuit, the detection circuit is turned off and the first working voltage is output at the detection terminal, and the switching circuit is turned on.

在本發明的實施例中,檢測電路包括第一電晶體、第二電晶體以及第三電晶體,切換電路包括第四電晶體。 In an embodiment of the present invention, the detection circuit includes a first transistor, a second transistor, and a third transistor, and the switching circuit includes a fourth transistor.

在本發明的實施例中,第一電晶體的控制端連接第一訊號線,第一電晶體的第二端、第二電晶體的控制端及第三電晶體的第二端互相連接,第二電晶體的第二端連接檢測端,第三電晶體和第四電晶體的控制端分別連接第二訊號線。 In the embodiment of the present invention, the control end of the first transistor is connected to the first signal line, the second end of the first transistor, the control end of the second transistor and the second end of the third transistor are connected to each other, the first The second terminal of the two transistors is connected to the detection terminal, and the control terminals of the third transistor and the fourth transistor are respectively connected to the second signal line.

在本發明的實施例中,於第一時間,第一訊號線發出啟動訊號使第一電晶體和第二電晶體導通,第二訊號線發出關閉訊號使第三電晶體和第四電晶體關閉,檢測電路進行檢測動作,第二電晶體於檢測端輸出感測電壓;於第二時間,第一訊號線發出關閉訊號使第一電晶體關閉,第二訊號線發出啟動訊號使第三電晶體和第四電晶體導通,第二電晶體於檢測端輸出第一工作電壓。 In the embodiment of the present invention, at the first time, the first signal line sends a start-up signal to turn on the first transistor and the second transistor, and the second signal line sends a turn-off signal to turn off the third transistor and the fourth transistor , the detection circuit performs the detection action, and the second transistor outputs the sensing voltage at the detection end; at the second time, the first signal line sends a shutdown signal to turn off the first transistor, and the second signal line sends a start signal to make the third transistor and the fourth transistor is turned on, and the second transistor outputs the first working voltage at the detection terminal.

在本發明的實施例中,檢測電路包括第一電晶體及第二電晶體,切換電路包括第三電晶體和第四電晶體。 In an embodiment of the present invention, the detection circuit includes a first transistor and a second transistor, and the switching circuit includes a third transistor and a fourth transistor.

在本發明的實施例中,第一電晶體的控制端連接第一訊號線,第一電晶體的第二端和第二電晶體的控制端互相連接,第二電晶體的第二端連接檢測端,第三電晶體的控制端連接第二訊號線,第三電晶體的控制端連接第四電晶體的控制端,第三電晶體的第一端和第四電晶體的第一端互相連接。 In the embodiment of the present invention, the control terminal of the first transistor is connected to the first signal line, the second terminal of the first transistor and the control terminal of the second transistor are connected to each other, and the second terminal of the second transistor is connected to the detection terminal, the control terminal of the third transistor is connected to the second signal line, the control terminal of the third transistor is connected to the control terminal of the fourth transistor, the first terminal of the third transistor and the first terminal of the fourth transistor are connected to each other .

在本發明的實施例中,於第一時間,第一訊號線發出啟動訊號使第一電晶體和第二電晶體導通,第二訊號線發出關閉訊號使第三電晶體和第四 電晶體關閉,檢測電路進行檢測動作,第二電晶體於檢測端輸出感測電壓;於第二時間,第一訊號線發出關閉訊號使第一電晶體關閉,第二訊號線發出啟動訊號使第三電晶體和第四電晶體導通,第二電晶體於檢測端輸出第一工作電壓。 In the embodiment of the present invention, at the first time, the first signal line sends a start-up signal to turn on the first transistor and the second transistor, and the second signal line sends a turn-off signal to turn the third transistor and the fourth transistor on. The transistor is turned off, the detection circuit performs the detection action, and the second transistor outputs a sensing voltage at the detection end; at the second time, the first signal line sends a shutdown signal to turn off the first transistor, and the second signal line sends a start signal to make the first transistor turn off. The third transistor and the fourth transistor are turned on, and the second transistor outputs the first working voltage at the detection end.

在本發明的實施例中,本發明進一步包括感測訊號線,感測訊號線耦接閘極驅動電路,感測訊號線使閘極驅動電路切換於第一時間和第二時間。 In an embodiment of the present invention, the present invention further includes a sensing signal line, the sensing signal line is coupled to the gate driving circuit, and the sensing signal line enables the gate driving circuit to switch between the first time and the second time.

在本發明的實施例中,本發明進一步包括高電壓線和第五電晶體,高電壓線連接閘極驅動電路,第五電晶體的控制端連接第二訊號線,第五電晶體的第一端連接高電壓線,第五電晶體的第二端連接感測訊號線。 In an embodiment of the present invention, the present invention further includes a high-voltage line and a fifth transistor, the high-voltage line is connected to the gate driving circuit, the control end of the fifth transistor is connected to the second signal line, and the first The terminal is connected to the high voltage line, and the second terminal of the fifth transistor is connected to the sensing signal line.

一種顯示面板,具有顯示區及圍繞顯示區之非顯示區,顯示面板包括像素單元以及前文所述之驅動電路檢測系統,像素單元設置於顯示區,驅動電路檢測系統設置於非顯示區以控制像素單元的顯示。 A display panel has a display area and a non-display area surrounding the display area, the display panel includes a pixel unit and the aforementioned driving circuit detection system, the pixel unit is arranged in the display area, and the driving circuit detection system is arranged in the non-display area to control the pixels display of the unit.

承上所述,本發明之驅動電路檢測系統,利用檢測電路以及切換電路,檢測閘極驅動電路的短路和開路,確保閘極驅動電路的正常運作。 As mentioned above, the driving circuit detection system of the present invention utilizes the detection circuit and the switching circuit to detect the short circuit and open circuit of the gate driving circuit, so as to ensure the normal operation of the gate driving circuit.

10:檢測電路 10: Detection circuit

20:切換電路 20: Switching circuit

AT:第一訊號線 AT: the first signal line

AT_SIG:檢測端 AT_SIG: detection end

AT_Sense[EM],AT_Sense[Scan]:感測訊號線 AT_Sense[EM],AT_Sense[Scan]: Sensing signal line

C1~C3:電容 C1~C3: Capacitor

CLK_EM1~CLK_EM2,CLK1~CLK3:工作頻率 CLK_EM1~CLK_EM2, CLK1~CLK3: Operating frequency

D1~D4,D10~D40,D_1~D_6,D_E1~D_E6:第一端 D1~D4, D10~D40, D_1~D_6, D_E1~D_E6: the first end

DS:顯示區 DS: Display area

G1~G4,G10~G40,G_1~G_6,G_E1~G_E6:控制端 G1~G4, G10~G40, G_1~G_6, G_E1~G_E6: Control terminal

NDS:非顯示區 NDS: non-display area

PX[n-1]~[n+1]:像素單元 PX[n-1]~[n+1]: pixel unit

GOA1,GOA2:閘極驅動電路 GOA1, GOA2: gate driver circuit

ST1~ST6,ET1~ET6:電晶體 ST1~ST6, ET1~ET6: Transistor

STV_EM:標準電壓線 STV_EM: Standard Voltage Line

S1~S4,S10~S40,S_1~S_6,S_E1~S_E6:第二端 S1~S4, S10~S40, S_1~S_6, S_E1~S_E6: the second terminal

S[n],EM[n]:掃描線 S[n],EM[n]: scan line

S[n-1]:前一級掃描線 S[n-1]: previous scan line

T1,T10:第一電晶體 T1, T10: first transistor

T2,T20:第二電晶體 T2, T20: The second transistor

T3,T30:第三電晶體 T3, T30: The third transistor

T4,T40:第四電晶體 T4, T40: Fourth transistor

T51,T52:第五電晶體 T51, T52: Fifth transistor

VGH:第一高電壓線 VGH: first high voltage line

VGL:第二高電壓線 VGL: Second High Voltage Line

XAT:第二訊號線 XAT: The second signal line

第1圖為本發明之驅動電路檢測系統之第一實施例的配置圖。 FIG. 1 is a configuration diagram of a first embodiment of the drive circuit detection system of the present invention.

第2圖為本發明之驅動電路檢測系統之第一實施例於第一時間的示意圖。 FIG. 2 is a schematic diagram of the first embodiment of the driving circuit detection system of the present invention at a first time.

第3圖為本發明之驅動電路檢測系統之第一實施例於第二時間的示意圖。 FIG. 3 is a schematic diagram of the first embodiment of the driving circuit detection system of the present invention at a second time.

第4圖為本發明之驅動電路檢測系統之第二實施例的配置圖。 FIG. 4 is a configuration diagram of a second embodiment of the drive circuit detection system of the present invention.

第5圖為本發明之驅動電路檢測系統之第二實施例於第一時間的示意圖。 FIG. 5 is a schematic diagram of the second embodiment of the driving circuit detection system of the present invention at the first time.

第6圖為本發明之驅動電路檢測系統之第二實施例於第二時間的示意圖。 FIG. 6 is a schematic diagram of the second embodiment of the driving circuit detection system of the present invention at a second time.

第7圖為本發明之顯示面板之配置圖。 FIG. 7 is a configuration diagram of the display panel of the present invention.

本發明之優點、特徵以及達到之技術方法將參照例示性實施例及所附圖式進行更詳細地描述而更容易理解,且本發明可以不同形式來實現,故不應被理解僅限於此處所陳述的實施例,相反地,對所屬技術領域具有通常知識者而言,所提供的實施例將使本揭露更加透徹與全面且完整地傳達本發明的範疇,且本發明將僅為所附加的申請專利範圍所定義。 The advantages, features, and technical means of achieving the present invention will be more easily understood by being described in more detail with reference to the exemplary embodiments and the accompanying drawings, and the present invention may be implemented in different forms, so it should not be construed as being limited to what is described herein. Rather, the embodiments are provided so that this disclosure will be thorough, complete and complete to convey the scope of the invention to those of ordinary skill in the art, and the invention will only be appended Defined by the scope of the patent application.

應當理解的是,儘管術語「第一」、「第二」等在本發明中可用於描述各種元件、部件、區域、層及/或部分,但是這些元件、部件、區域、層及/或部分不應受這些術語的限制。這些術語僅用於將一個元件、部件、區域、層及/或部分與另一個元件、部件、區域、層及/或部分區分開。因此,下文討論的「第一元件」、「第一部件」、「第一區域」、「第一層」及/或「第一部分」可以被稱為「第二元件」、「第二部件」、「第二區域」、「第二層」及/或「第二部分」,而不悖離本發明的精神和教示。 It will be understood that although the terms "first", "second", etc. may be used herein to describe various elements, components, regions, layers and/or sections, these elements, components, regions, layers and/or sections You should not be limited by these terms. These terms are only used to distinguish one element, component, region, layer and/or section from another element, component, region, layer and/or section. Thus, "first element", "first feature", "first region", "first layer" and/or "first portion" discussed below may be referred to as "second element", "second feature" , "Second Area", "Second Layer" and/or "Second Section" without departing from the spirit and teachings of the present invention.

另外,術語「包括」及/或「包含」指所述特徵、區域、整體、步驟、操作、元件及/或部件的存在,但不排除一個或多個其他特徵、區域、整體、步驟、操作、元件、部件及/或其組合的存在或添加。 Additionally, the terms "comprising" and/or "comprising" refer to the presence of stated features, regions, integers, steps, operations, elements and/or components, but do not exclude one or more other features, regions, integers, steps, operations , elements, components and/or the presence or addition of combinations thereof.

除非另有定義,本發明所使用的所有術語(包括技術和科學術語)具有與本發明所屬技術領域的普通技術人員通常理解的相同含義。將進一步理解的是,諸如在通常使用的字典中定義的那些術語應當被解釋為具有與它們在 相關技術和本發明的上下文中的含義一致的定義,並且將不被解釋為理想化或過度正式的意義,除非本文中明確地這樣定義。 Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. It will be further understood that terms such as those defined in commonly used dictionaries should be construed as having the same Definitions are consistent with the meanings in the context of the related art and the present invention, and are not to be construed in an idealized or overly formal sense unless explicitly so defined herein.

請參閱第1圖,其本發明之驅動電路檢測系統之第一實施例的配置圖。如第1圖所示,本發明之驅動電路檢測系統,其包括閘極驅動電路GOA1、檢測電路10以及切換電路20,檢測電路10和切換電路20皆連接於閘極驅動電路GOA1。檢測電路10耦接第一訊號線AT。切換電路20耦接第二訊號線XAT。其中,於第一時間,第一訊號線AT發出啟動訊號至檢測電路10,第二訊號線XAT發出關閉訊號至切換電路20,檢測電路10進行檢測動作並於檢測端AT_SIG輸出感測電壓,切換電路20關閉;於第二時間,第一訊號線AT發出關閉訊號至檢測電路10,第二訊號線XAT發出啟動訊號至切換電路20,檢測電路10關閉並於檢測端AT_SIG輸出第一工作電壓,切換電路20導通。 Please refer to FIG. 1 , which is a configuration diagram of the first embodiment of the driving circuit detection system of the present invention. As shown in FIG. 1, the driving circuit detection system of the present invention includes a gate driving circuit GOA1, a detection circuit 10 and a switching circuit 20. The detection circuit 10 and the switching circuit 20 are both connected to the gate driving circuit GOA1. The detection circuit 10 is coupled to the first signal line AT. The switching circuit 20 is coupled to the second signal line XAT. Wherein, at the first time, the first signal line AT sends an activation signal to the detection circuit 10, the second signal line XAT sends a shutdown signal to the switching circuit 20, the detection circuit 10 performs a detection operation and outputs a sensing voltage at the detection terminal AT_SIG, and switches The circuit 20 is turned off; at the second time, the first signal line AT sends a shutdown signal to the detection circuit 10, the second signal line XAT sends an enable signal to the switching circuit 20, the detection circuit 10 is turned off and outputs the first working voltage at the detection terminal AT_SIG, The switching circuit 20 is turned on.

其中,閘極驅動電路GOA1為6T1C的配置且其包括電晶體ST1~ST6和電容C1,檢測電路10包括第一電晶體T1、第二電晶體T2以及第三電晶體T3,切換電路20包括第四電晶體T4。電晶體ST1和第二電晶體T2的第一端D2相連,電晶體ST1的控制端G_1和第二端S_1之間有電容C1,電晶體ST1的第一端D_1連接工作頻率線(其有3種工作頻率,分別為CLK1、CLK2和CLK3,電晶體ST1僅操作於單一工作頻率,亦即,電晶體ST1操作於工作頻率CLK1;或者,電晶體ST1操作於工作頻率CLK2;或者,電晶體ST1操作於工作頻率CLK3),電晶體ST1的第二端S_1連接掃描線S[n];電晶體ST2的第二端S_2連接電晶體ST1的控制端G_1,電晶體ST2的控制端G_2連接第一電晶體T1的第一端D1,電晶體ST2的第一端D_2連接電晶體ST4的第一端D_4;電晶體ST3的第一端D_3連接第一電晶體T1的第一端D1,電晶體ST3的控制 端G_3連接工作頻率線,電晶體ST3的第二端S_3連接第四電晶體T4的控制端G_4;電晶體ST4的第一端D_4連接電晶體ST2的第一端D_2,電晶體ST4的第二端S_4連接第一高電壓線VGH(其所發出的電壓為第一工作電壓);電晶體ST5的第一端D_5連接電晶體ST3的第二端S_3,電晶體ST5的第二端S_5連接第一高電壓線VGH,電晶體ST5的控制端G_5連接電晶體T6的第二端S_6;電晶體ST6的控制端G_6連接前一級掃描線S[n-1],電晶體ST6的第一端D_6連接第四電晶體T4的第二端S4。 The gate drive circuit GOA1 has a 6T1C configuration and includes transistors ST1 to ST6 and a capacitor C1, the detection circuit 10 includes a first transistor T1, a second transistor T2 and a third transistor T3, and the switching circuit 20 includes a first transistor T1, a second transistor T2, and a third transistor T3. Four transistors T4. The transistor ST1 is connected to the first terminal D2 of the second transistor T2, a capacitor C1 is provided between the control terminal G_1 and the second terminal S_1 of the transistor ST1, and the first terminal D_1 of the transistor ST1 is connected to the working frequency line (which has 3 There are two operating frequencies, namely CLK1, CLK2 and CLK3, and the transistor ST1 only operates at a single operating frequency, that is, the transistor ST1 operates at the operating frequency CLK1; or the transistor ST1 operates at the operating frequency CLK2; or, the transistor ST1 Operating at the operating frequency CLK3), the second end S_1 of the transistor ST1 is connected to the scan line S[n]; the second end S_2 of the transistor ST2 is connected to the control end G_1 of the transistor ST1, and the control end G_2 of the transistor ST2 is connected to the first The first end D1 of the transistor T1 and the first end D_2 of the transistor ST2 are connected to the first end D_4 of the transistor ST4; the first end D_3 of the transistor ST3 is connected to the first end D1 of the first transistor T1, and the transistor ST3 control The terminal G_3 is connected to the working frequency line, the second terminal S_3 of the transistor ST3 is connected to the control terminal G_4 of the fourth transistor T4; the first terminal D_4 of the transistor ST4 is connected to the first terminal D_2 of the transistor ST2, and the second terminal of the transistor ST4 The terminal S_4 is connected to the first high voltage line VGH (the voltage it sends out is the first working voltage); the first terminal D_5 of the transistor ST5 is connected to the second terminal S_3 of the transistor ST3, and the second terminal S_5 of the transistor ST5 is connected to the first terminal S_5 of the transistor ST5. A high voltage line VGH, the control terminal G_5 of the transistor ST5 is connected to the second terminal S_6 of the transistor T6; the control terminal G_6 of the transistor ST6 is connected to the previous scan line S[n-1], and the first terminal D_6 of the transistor ST6 The second terminal S4 of the fourth transistor T4 is connected.

第一電晶體T1的控制端G1連接第一訊號線AT,第一電晶體T1的第二端S1、第二電晶體T2的控制端G2及第三電晶體T3的第二端S3互相連接,第二電晶體T2的第二端S2連接檢測端AT_SIG,第三電晶體T3和第四電晶體T4的控制端G3和G4分別連接第二訊號線XAT,第四電晶體T4的第一端D4連接第二高電壓線VGL(其所發出的電壓為第二工作電壓),第二高電壓線VGL連接電晶體ST2的控制端G_2和第一電晶體T1的第一端D1。 The control terminal G1 of the first transistor T1 is connected to the first signal line AT, the second terminal S1 of the first transistor T1, the control terminal G2 of the second transistor T2 and the second terminal S3 of the third transistor T3 are connected to each other, The second terminal S2 of the second transistor T2 is connected to the detection terminal AT_SIG, the control terminals G3 and G4 of the third transistor T3 and the fourth transistor T4 are respectively connected to the second signal line XAT, and the first terminal D4 of the fourth transistor T4 Connected to the second high voltage line VGL (the voltage generated by the second high voltage line VGL is the second working voltage), the second high voltage line VGL is connected to the control terminal G_2 of the transistor ST2 and the first terminal D1 of the first transistor T1.

請參閱第2圖,其為本發明之驅動電路檢測系統之第一實施例於第一時間的示意圖。如第2圖所示,本發明之第一實施例於第一時間時(其為短路/開路的測試時間),第一訊號線AT發出啟動訊號,第二訊號線XAT發出關閉訊號,第一電晶體T1和第二電晶體T2導通,第三電晶體T3、第四電晶體T4以及電晶體ST1為關閉,由於第三電晶體T3的關閉,使前一級掃描線S[n-1]的訊號從電晶體ST6的控制端G_6輸入並流經電晶體ST5的控制端G_5及電晶體ST2的第一端D_2,電晶體ST2、電晶體ST5和電晶體ST6為導通的狀態,對電容C1充電,透過第二電晶體T2的導通而於檢測端AT_SIG輸出感測電壓,根據感測電壓的數值,判斷閘極驅動電路GOA1是否正常運作。 Please refer to FIG. 2 , which is a schematic diagram of the first embodiment of the driving circuit detection system of the present invention at the first time. As shown in FIG. 2 , in the first embodiment of the present invention, at the first time (which is the test time for short circuit/open circuit), the first signal line AT sends out an enable signal, the second signal line XAT sends out an off signal, and the first signal line AT sends out an off signal. The transistor T1 and the second transistor T2 are turned on, and the third transistor T3, the fourth transistor T4 and the transistor ST1 are turned off. Because the third transistor T3 is turned off, the scanning line S[n-1] of the previous stage is turned off. The signal is input from the control terminal G_6 of the transistor ST6 and flows through the control terminal G_5 of the transistor ST5 and the first terminal D_2 of the transistor ST2. The transistor ST2, the transistor ST5 and the transistor ST6 are in a conducting state, charging the capacitor C1 , through the conduction of the second transistor T2, the sensing voltage is output at the detection terminal AT_SIG, and according to the value of the sensing voltage, it is determined whether the gate driving circuit GOA1 operates normally.

請參閱第3圖,其為本發明之驅動電路檢測系統之第一實施例於第二時間的示意圖。如第3圖所示,本發明之第一實施例於第二時間時(其為驅動時間),第一訊號線AT發出關閉訊號,第二訊號線XAT發出啟動訊號,第一電晶體T1關閉,第二電晶體T2、第三電晶體T3以及第四電晶體T4皆為導通,使前一級掃描線S[n-1]的訊號從電晶體ST6的控制端G_6輸入並流經電晶體ST5的控制端G_5及電晶體ST2的第一端D_2,經過電晶體ST5的控制端G_5的前一級掃描線S[n-1]的訊號輸入至電晶體ST4的控制端G_4和第三電晶體T3的第一端D3,閘極驅動電路GOA1處於驅動狀態,透過第二電晶體T2的導通而於檢測端AT_SIG輸出第一工作電壓。 Please refer to FIG. 3 , which is a schematic diagram of the first embodiment of the driving circuit detection system of the present invention at a second time. As shown in FIG. 3 , in the first embodiment of the present invention, at the second time (which is the driving time), the first signal line AT sends a shutdown signal, the second signal line XAT sends an enable signal, and the first transistor T1 is turned off , the second transistor T2, the third transistor T3 and the fourth transistor T4 are all turned on, so that the signal of the previous scan line S[n-1] is input from the control terminal G_6 of the transistor ST6 and flows through the transistor ST5 The control terminal G_5 of the transistor ST2 and the first terminal D_2 of the transistor ST2 are input to the control terminal G_4 of the transistor ST4 and the third transistor T3 through the signal of the previous scan line S[n-1] of the control terminal G_5 of the transistor ST5 The first terminal D3 of the gate driving circuit GOA1 is in a driving state, and the first working voltage is output at the detection terminal AT_SIG through the conduction of the second transistor T2.

請參閱第4圖,其為本發明之驅動電路檢測系統之第二實施例的配置圖。如第4圖所示,本發明之驅動電路檢測系統,其包括閘極驅動電路GOA2、檢測電路10以及切換電路20,檢測電路10和切換電路20皆連接於閘極驅動電路GOA2,其配置關係與第一實施例類似,於此不再加以重新敘述相似之處,但本發明之第二實施例與第一實施例仍有不同之處,其差異:檢測電路10包括第一電晶體T10及第二電晶體T20,切換電路20包括第三電晶體T3和第四電晶體T4,閘極驅動電路GOA1包括電晶體ET1~ET6及電容C2和C3。 Please refer to FIG. 4 , which is a configuration diagram of the second embodiment of the driving circuit detection system of the present invention. As shown in FIG. 4, the driving circuit detection system of the present invention includes a gate driving circuit GOA2, a detection circuit 10 and a switching circuit 20. The detection circuit 10 and the switching circuit 20 are both connected to the gate driving circuit GOA2, and their configuration relationship Similar to the first embodiment, the similarities will not be repeated here, but the second embodiment of the present invention is still different from the first embodiment. The difference is that the detection circuit 10 includes a first transistor T10 and a The second transistor T20, the switching circuit 20 includes a third transistor T3 and a fourth transistor T4, and the gate driving circuit GOA1 includes transistors ET1-ET6 and capacitors C2 and C3.

其中,電晶體ET1的第一端D_E1連接第二高電壓線VGL,電晶體ET1的第二端S_E1連接掃描線EM[n],電晶體ET1的控制端G_E1連接電容C2的一端,電容C2的另一端連接工作頻率線(其有2種頻率,分別為CLK_EM1和CLK_EM2,電容C2僅操作於1種頻率,電容C2操作於工作頻率CLK_EM1,或者,電容C2操作於工作頻率CLK_EM2);電晶體ET2的第一端D_E2連接電晶體ET1的控制端G_E1,電晶體ET2的第二端S_E2連接第一高電壓線VGH,電晶體ET2 的控制端G_E2連接第三電晶體T30的第二端S30;電晶體ET3的第一端D_E3連接第二高電壓線VGL,電晶體ET3的第二端S_E3連接第三電晶體T30的第一端D30,電晶體ET3的控制端G_E3連接電容C3的一端,電容C3的另一端連接工作頻率線(其有2種頻率,分別為CLK_EM1和CLK_EM2,電容C3僅操作於1種頻率,電容C3操作於工作頻率CLK_EM1,或者,電容C3操作於工作頻率CLK_EM2);電晶體ET4的第一端D_E4連接第四電晶體T40的第二端S40,電晶體ET4的第二端S_E4連接第一高電壓線VGH,電晶體ET4的控制端G_E4連接電晶體ET6的第二端S_E6;電晶體ET5的第一端D_E5連接電容C3的一端,電晶體ET5的第二端S_E5連接第一高電壓線VGH,電晶體ET5的控制端G_E5連接標準電壓線STV_EM;電晶體ET6的第一端D_E6連接標準電壓線STV_EM,電晶體ET6的控制端G_E6連接工作頻率線(其有2種頻率,分別為CLK_EM1和CLK_EM2,電晶體ET6僅操作於1種頻率,電晶體ET6操作於工作頻率CLK_EM1,或者,電晶體ET6操作於工作頻率CLK_EM2)。 The first end D_E1 of the transistor ET1 is connected to the second high voltage line VGL, the second end S_E1 of the transistor ET1 is connected to the scan line EM[n], the control end G_E1 of the transistor ET1 is connected to one end of the capacitor C2, and the The other end is connected to the working frequency line (it has two frequencies, CLK_EM1 and CLK_EM2 respectively, the capacitor C2 only operates at one frequency, the capacitor C2 operates at the working frequency CLK_EM1, or the capacitor C2 operates at the working frequency CLK_EM2); transistor ET2 The first terminal D_E2 of the transistor is connected to the control terminal G_E1 of the transistor ET1, the second terminal S_E2 of the transistor ET2 is connected to the first high voltage line VGH, and the transistor ET2 The control terminal G_E2 is connected to the second terminal S30 of the third transistor T30; the first terminal D_E3 of the transistor ET3 is connected to the second high voltage line VGL, and the second terminal S_E3 of the transistor ET3 is connected to the first terminal of the third transistor T30 D30, the control terminal G_E3 of the transistor ET3 is connected to one end of the capacitor C3, and the other end of the capacitor C3 is connected to the working frequency line (it has two frequencies, CLK_EM1 and CLK_EM2 respectively, the capacitor C3 only operates at one frequency, and the capacitor C3 operates at The working frequency CLK_EM1, or the capacitor C3 operates at the working frequency CLK_EM2); the first end D_E4 of the transistor ET4 is connected to the second end S40 of the fourth transistor T40, and the second end S_E4 of the transistor ET4 is connected to the first high voltage line VGH , the control terminal G_E4 of the transistor ET4 is connected to the second terminal S_E6 of the transistor ET6; the first terminal D_E5 of the transistor ET5 is connected to one end of the capacitor C3, the second terminal S_E5 of the transistor ET5 is connected to the first high voltage line VGH, the transistor The control terminal G_E5 of ET5 is connected to the standard voltage line STV_EM; the first terminal D_E6 of the transistor ET6 is connected to the standard voltage line STV_EM, and the control terminal G_E6 of the transistor ET6 is connected to the working frequency line (which has two frequencies, CLK_EM1 and CLK_EM2, respectively, the electrical The crystal ET6 operates at only one frequency, the transistor ET6 operates at the operating frequency CLK_EM1, or the transistor ET6 operates at the operating frequency CLK_EM2).

第一電晶體T10的第一端D10連接第二高電壓線VGL,第一電晶體T10的第二端S10連接第二電晶體T20的控制端G20,第一電晶體T10的控制端G10連接第一訊號線AT;第二電晶體T20的第一端D20連接掃描線EM[n],第二電晶體T20的第二端S20連接檢測端AT_SIG,第二電晶體T20的控制端G20連接電晶體ET2的控制端G_E2;第三電晶體T30的控制端G30連接第二訊號線XAT;第四電晶體T40的第一端D40連接第三電晶體T30的第一端D30,第四電晶體T40的控制端G40連接第三電晶體T30的控制端G30。 The first terminal D10 of the first transistor T10 is connected to the second high voltage line VGL, the second terminal S10 of the first transistor T10 is connected to the control terminal G20 of the second transistor T20, and the control terminal G10 of the first transistor T10 is connected to the first transistor T10. A signal line AT; the first end D20 of the second transistor T20 is connected to the scan line EM[n], the second end S20 of the second transistor T20 is connected to the detection end AT_SIG, and the control end G20 of the second transistor T20 is connected to the transistor The control terminal G_E2 of ET2; the control terminal G30 of the third transistor T30 is connected to the second signal line XAT; the first terminal D40 of the fourth transistor T40 is connected to the first terminal D30 of the third transistor T30, and the The control terminal G40 is connected to the control terminal G30 of the third transistor T30.

請參閱第5圖,為本發明之驅動電路檢測系統之第二實施例於第一時間的示意圖。如第5圖所示,本發明之第二實施例於第一時間時(其為短路/ 開路的測試時間),第一訊號線AT發出啟動訊號,第二訊號線XAT發出關閉訊號,由於第一訊號線AT的啟動訊號輸入至第一電晶體T10的控制端G10和第二電晶體T20的控制端G20,使第一電晶體T10為導通,第一電晶體T10的第二端S10因而輸出,導致第二電晶體T20和電晶體ET2為導通,由於第二訊號線XAT的關閉訊號輸入至第三電晶體T30的控制端G30和第四電晶體T40的控制端G40,使第三電晶體T30和第四電晶體T40為關閉,電晶體ET1因為其控制端G_E1和第二端S_E1的偏壓小於臨界電壓,電晶體ET6因為其控制端G_E6和第二端S_E6的偏壓小於臨界電壓,使電晶體ET1和ET6為關閉,透過標準電壓線STV_EM的電壓輸入至電晶體ET5並流經電晶體ET3和第一電晶體T10,檢測閘極驅動電路GOA2的短路/開路的情況,於檢測端AT_SIG輸出感測電壓,根據感測電壓的數值,判斷閘極驅動電路GOA2是否正常運作。 Please refer to FIG. 5 , which is a schematic diagram of the second embodiment of the driving circuit detection system of the present invention at the first time. As shown in FIG. 5, the second embodiment of the present invention is at the first time (which is a short circuit/ Open circuit test time), the first signal line AT sends out a start signal, and the second signal line XAT sends out a shutdown signal, since the start signal of the first signal line AT is input to the control terminal G10 of the first transistor T10 and the second transistor T20 The control terminal G20 of the first transistor T10 is turned on, and the second terminal S10 of the first transistor T10 is outputted, resulting in the conduction of the second transistor T20 and the transistor ET2, due to the close signal input of the second signal line XAT To the control terminal G30 of the third transistor T30 and the control terminal G40 of the fourth transistor T40, the third transistor T30 and the fourth transistor T40 are turned off. The bias voltage is less than the threshold voltage. Because the bias voltage of the control terminal G_E6 and the second terminal S_E6 of the transistor ET6 is less than the threshold voltage, the transistors ET1 and ET6 are turned off, and the voltage of the standard voltage line STV_EM is input to the transistor ET5 and flows through The transistor ET3 and the first transistor T10 detect the short-circuit/open-circuit condition of the gate drive circuit GOA2, output a sensing voltage at the detection terminal AT_SIG, and determine whether the gate drive circuit GOA2 operates normally according to the value of the sensed voltage.

請參閱第6圖,其為本發明之驅動電路檢測系統之第二實施例於第二時間的示意圖。如第6圖所示,本發明之第二實施例於第二時間時(其為驅動時間),第一訊號線AT發出關閉訊號,第二訊號線XAT發出啟動訊號,由於第一訊號線AT的關閉訊號輸入至第一電晶體T10的控制端G10,第一電晶體T10為關閉,由於第二訊號線XAT的啟動訊號輸入至第三電晶體T30的控制端G30和第四電晶體T40的控制端G40,第三電晶體T30和第四電晶體T40為導通,進而導通電晶體ET2和第二電晶體T20,此時電晶體ET1~ET6皆為導通狀態,閘極驅動電路GOA2處於驅動狀態,於檢測端AT_SIG輸出第一工作電壓。 Please refer to FIG. 6 , which is a schematic diagram of the second embodiment of the driving circuit detection system of the present invention at a second time. As shown in FIG. 6 , in the second embodiment of the present invention, at the second time (which is the driving time), the first signal line AT sends out an off signal, and the second signal line XAT sends out an enable signal. The shutdown signal of the first transistor T10 is input to the control terminal G10 of the first transistor T10, and the first transistor T10 is turned off, because the start signal of the second signal line XAT is input to the control terminal G30 of the third transistor T30 and the fourth transistor T40. At the control terminal G40, the third transistor T30 and the fourth transistor T40 are turned on, and then the transistor ET2 and the second transistor T20 are turned on. At this time, the transistors ET1 to ET6 are all turned on, and the gate driving circuit GOA2 is in the driving state , and output the first working voltage at the detection terminal AT_SIG.

請參閱第7圖,其為本發明之顯示面板之配置圖。如第7圖所示,本發明之顯示面板,具有顯示區DS及圍繞顯示區DS之非顯示區NDS,其包括多個閘極驅動電路GOA2、多個閘極驅動電路GOA1[n-1]~[n+1]以及像素單 元PX[n-1]~[n+1],多個閘極驅動電路GOA2、多個閘極驅動電路GOA1[n-1]~[n+1]設置於非顯示區NDS,像素單元PX[n-1]~[n+1]設置於顯示區DS。多個閘極驅動電路GOA1[n-1]~[n+1]如第1圖至第3圖所示的配置和作動關係,多個閘極驅動電路GOA2如第4圖至第6圖所示的配置和作動關係,各閘極驅動電路GOA2和各閘極驅動電路GOA1相連,各閘極驅動電路GOA1[n-1]~[n+1]和各像素單元PX[n-1]~[n+1]相連,多個閘極驅動電路GOA2和多個閘極驅動電路GOA1[n-1]~[n+1]共同控制像素單元PX[n-1]~[n+1]的顯示。 Please refer to FIG. 7 , which is a configuration diagram of the display panel of the present invention. As shown in FIG. 7, the display panel of the present invention has a display area DS and a non-display area NDS surrounding the display area DS, and includes a plurality of gate driving circuits GOA2 and a plurality of gate driving circuits GOA1[n-1] ~[n+1] and the pixel list Elements PX[n-1]~[n+1], multiple gate drive circuits GOA2, multiple gate drive circuits GOA1[n-1]~[n+1] are arranged in the non-display area NDS, the pixel unit PX [n-1]~[n+1] are set in the display area DS. A plurality of gate drive circuits GOA1[n-1]~[n+1] are shown in Fig. 1 to Fig. 3 in their arrangement and operation relationship, and a plurality of gate drive circuits GOA2 are shown in Fig. 4 to Fig. 6 As shown in the configuration and operation relationship shown, each gate driver circuit GOA2 is connected to each gate driver circuit GOA1, and each gate driver circuit GOA1[n-1]~[n+1] is connected to each pixel unit PX[n-1]~ [n+1] are connected, and multiple gate drive circuits GOA2 and multiple gate drive circuits GOA1[n-1]~[n+1] jointly control the pixel units PX[n-1]~[n+1]. show.

第一訊號線AT分別連接多個閘極驅動電路GOA2、多個閘極驅動電路GOA1[n-1]~[n+1],第二訊號線XAT分別連接多個閘極驅動電路GOA2、多個閘極驅動電路GOA1[n-1]~[n+1],第五電晶體T51分別連接感測訊號線AT_Sense[Scan]、第一高電壓線VGH和第一訊號線AT,第五電晶體T52分別連接感測訊號線AT_Sense[EM]、第一高電壓線VGH和第一訊號線AT,感測訊號線AT_Sense[Scan]連接多個閘極驅動電路GOA1[n-1]~[n+1],感測訊號線AT_Sense[EM]連接多個閘極驅動電路GOA2。透過第五電晶體T51、感測訊號線AT_Sense[Scan]以及第一訊號線AT的控制,使多個閘極驅動電路GOA1[n-1]~[n+1]之其一處於檢測開路/短路期間,檢測各閘極驅動電路GOA1[n-1]~[n+1]的運作狀況;透過第五電晶體T52、感測訊號線AT_Sense[EM]以及第一訊號線AT的控制,使多個閘極驅動電路GOA2之其一處於檢測開路/短路期間,檢測各閘極驅動電路GOA2的運作狀況。 The first signal line AT is respectively connected to a plurality of gate driving circuits GOA2, a plurality of gate driving circuits GOA1[n-1]~[n+1], and the second signal line XAT is respectively connected to a plurality of gate driving circuits GOA2, a plurality of gate driving circuits GOA1[n-1]~[n+1]. The gate driving circuits GOA1[n-1]~[n+1], the fifth transistor T51 is respectively connected to the sensing signal line AT_Sense[Scan], the first high voltage line VGH and the first signal line AT, the fifth transistor T51 is connected to the sensing signal line AT_Sense[Scan], the first high voltage line VGH and the first signal line AT respectively. The crystal T52 is respectively connected to the sensing signal line AT_Sense[EM], the first high voltage line VGH and the first signal line AT, and the sensing signal line AT_Sense[Scan] is connected to a plurality of gate driving circuits GOA1[n-1]~[n +1], the sensing signal line AT_Sense[EM] is connected to a plurality of gate driving circuits GOA2. Through the control of the fifth transistor T51, the sensing signal line AT_Sense[Scan] and the first signal line AT, one of the plurality of gate driving circuits GOA1[n-1]~[n+1] is in the detection of open circuit/ During the short circuit, the operation status of each gate drive circuit GOA1[n-1]~[n+1] is detected; through the control of the fifth transistor T52, the sensing signal line AT_Sense[EM] and the first signal line AT, the One of the plurality of gate drive circuits GOA2 is in the open/short detection period, and the operation status of each gate drive circuit GOA2 is detected.

觀前所述,本發明之驅動電路檢測系統,利用檢測電路10以及切換電路20,檢測閘極驅動電路GOA1和GOA2的短路和開路,確保閘極驅動電路GOA1和GOA2的正常運作。 As mentioned above, the driving circuit detection system of the present invention utilizes the detection circuit 10 and the switching circuit 20 to detect the short circuit and open circuit of the gate driving circuits GOA1 and GOA2 to ensure the normal operation of the gate driving circuits GOA1 and GOA2.

以上所述僅為舉例性,而非為限制性者。任何未脫離本發明之精神與範疇,而對其進行之等效修改或變更,均應包含於後附之申請專利範圍中。 The above description is exemplary only, not limiting. Any equivalent modifications or changes that do not depart from the spirit and scope of the present invention shall be included in the appended patent application scope.

10:檢測電路 10: Detection circuit

20:切換電路 20: Switching circuit

AT:第一訊號線 AT: the first signal line

AT_SIG:檢測端 AT_SIG: detection end

CLK1~CLK3:工作頻率 CLK1~CLK3: Operating frequency

C1:電容 C1: Capacitor

D_1~D_6,D1~D4:第一端 D_1~D_6, D1~D4: The first end

G_1~G_6,G1~G4:控制端 G_1~G_6, G1~G4: Control terminal

S_1~S_6,S1~S4:第二端 S_1~S_6, S1~S4: the second end

ST1~ST6:電晶體 ST1~ST6: Transistor

S[n~1]:前一級掃描線 S[n~1]: previous scan line

S[n]:掃描線 S[n]: scan line

T1:第一電晶體 T1: first transistor

T2:第二電晶體 T2: Second transistor

T3:第三電晶體 T3: The third transistor

T4:第四電晶體 T4: Fourth transistor

VGH:第一高電壓線 VGH: first high voltage line

VGL:第二高電壓線 VGL: Second High Voltage Line

XAT:第二訊號線 XAT: The second signal line

Claims (10)

一種驅動電路檢測系統,其包括:一閘極驅動電路;一檢測電路,耦接一第一訊號線;以及一切換電路,耦接一第二訊號線;其中,於一第一時間,該第一訊號線發出一啟動訊號至該檢測電路,該第二訊號線發出一關閉訊號至該切換電路,該檢測電路進行一檢測動作並於一檢測端輸出一感測電壓,該切換電路關閉;於一第二時間,該第一訊號線發出一關閉訊號至該檢測電路,該第二訊號線發出一啟動訊號至該切換電路,該檢測電路關閉並於該檢測端輸出一第一工作電壓,該切換電路導通。 A driving circuit detection system, comprising: a gate driving circuit; a detection circuit coupled to a first signal line; and a switching circuit coupled to a second signal line; wherein, at a first time, the first signal line A signal line sends an activation signal to the detection circuit, the second signal line sends a shutdown signal to the switching circuit, the detection circuit performs a detection operation and outputs a sensing voltage at a detection terminal, and the switching circuit is turned off; At a second time, the first signal line sends a shutdown signal to the detection circuit, the second signal line sends a start signal to the switching circuit, the detection circuit is turned off and outputs a first operating voltage at the detection terminal, the The switching circuit is turned on. 如請求項1所述之驅動電路檢測系統,其中該檢測電路包括一第一電晶體、一第二電晶體以及一第三電晶體,該切換電路包括一第四電晶體。 The driving circuit detection system of claim 1, wherein the detection circuit includes a first transistor, a second transistor and a third transistor, and the switching circuit includes a fourth transistor. 如請求項2所述之驅動電路檢測系統,其中,該第一電晶體的一控制端連接該第一訊號線,該第一電晶體的一第二端、該第二電晶體的該控制端及該第三電晶體的該第二端互相連接,該第二電晶體的該第二端連接該檢測端,該第三電晶體和該第四電晶體的該控制端分別連接該第二訊號線。 The driving circuit detection system of claim 2, wherein a control end of the first transistor is connected to the first signal line, a second end of the first transistor, and the control end of the second transistor and the second terminal of the third transistor are connected to each other, the second terminal of the second transistor is connected to the detection terminal, and the control terminals of the third transistor and the fourth transistor are respectively connected to the second signal Wire. 如請求項3所述之驅動電路檢測系統,於該第一時間,該第一訊號線發出該啟動訊號使該第一電晶體和該第二電晶體導通,該第二訊號線發出該關閉訊號使該第三電晶體和該第四電晶體關閉,該檢測電路進行該檢測動作,該第二電晶體 於該檢測端輸出該感測電壓;於該第二時間,該第一訊號線發出該關閉訊號使該第一電晶體關閉,該第二訊號線發出該啟動訊號使該第三電晶體和該第四電晶體導通,該第二電晶體於該檢測端輸出該第一工作電壓。 According to the driving circuit detection system of claim 3, at the first time, the first signal line sends the enable signal to turn on the first transistor and the second transistor, and the second signal line sends the turn-off signal The third transistor and the fourth transistor are turned off, the detection circuit performs the detection action, and the second transistor The sensing voltage is output from the detection terminal; at the second time, the first signal line sends the off signal to turn off the first transistor, and the second signal line sends the start signal to make the third transistor and the The fourth transistor is turned on, and the second transistor outputs the first working voltage at the detection terminal. 如請求項1所述之驅動電路檢測系統,其中該檢測電路包括一第一電晶體及一第二電晶體,該切換電路包括一第三電晶體和一第四電晶體。 The driving circuit detection system of claim 1, wherein the detection circuit includes a first transistor and a second transistor, and the switching circuit includes a third transistor and a fourth transistor. 如請求項5所述之驅動電路檢測系統,其中,該第一電晶體的一控制端連接該第一訊號線,該第一電晶體的一第二端和該第二電晶體的該控制端互相連接,該第二電晶體的該第二端連接該檢測端,該第三電晶體的該控制端連接該第二訊號線,該第三電晶體的該控制端連接該第四電晶體的該控制端,該第三電晶體的一第一端和該第四電晶體的該第一端互相連接。 The driving circuit detection system of claim 5, wherein a control end of the first transistor is connected to the first signal line, a second end of the first transistor and the control end of the second transistor connected to each other, the second end of the second transistor is connected to the detection end, the control end of the third transistor is connected to the second signal line, the control end of the third transistor is connected to the fourth transistor The control terminal, a first terminal of the third transistor and the first terminal of the fourth transistor are connected to each other. 如請求項6所述之驅動電路檢測系統,於該第一時間,該第一訊號線發出該啟動訊號使該第一電晶體和該第二電晶體導通,該第二訊號線發出該關閉訊號使該第三電晶體和該第四電晶體關閉,該檢測電路進行該檢測動作,該第二電晶體於該檢測端輸出該感測電壓;於該第二時間,該第一訊號線發出該關閉訊號使該第一電晶體關閉,該第二訊號線發出該啟動訊號使該第三電晶體和該第四電晶體導通,該第二電晶體於該檢測端輸出該第一工作電壓。 According to the driving circuit detection system of claim 6, at the first time, the first signal line sends the enable signal to turn on the first transistor and the second transistor, and the second signal line sends the turn-off signal The third transistor and the fourth transistor are turned off, the detection circuit performs the detection action, the second transistor outputs the sensing voltage at the detection end; at the second time, the first signal line sends the detection The off signal turns off the first transistor, the second signal line sends out the start signal to turn on the third transistor and the fourth transistor, and the second transistor outputs the first operating voltage at the detection end. 如請求項1所述之驅動電路檢測系統,進一步包括一感測訊號線,該感測訊號線耦接該閘極驅動電路,該感測訊號線使 該閘極驅動電路切換於該第一時間和該第二時間。 The driving circuit detection system of claim 1, further comprising a sensing signal line, the sensing signal line is coupled to the gate driving circuit, the sensing signal line enables The gate driving circuit switches between the first time and the second time. 如請求項8所述之驅動電路檢測系統,進一步包括一高電壓線和一第五電晶體,該高電壓線連接該閘極驅動電路,該第五電晶體的一控制端連接該第二訊號線,該第五電晶體的一第一端連接該高電壓線,該第五電晶體的一第二端連接該感測訊號線。 The driving circuit detection system of claim 8, further comprising a high voltage line and a fifth transistor, the high voltage line is connected to the gate driving circuit, and a control end of the fifth transistor is connected to the second signal line, a first end of the fifth transistor is connected to the high voltage line, and a second end of the fifth transistor is connected to the sensing signal line. 一種顯示面板,具有一顯示區及圍繞該顯示區之一非顯示區,該顯示面板包括一像素單元以及如請求項1至請求項9所述之驅動電路檢測系統,該像素單元設置於該顯示區,該驅動電路檢測系統設置於該非顯示區以控制該像素單元的顯示。 A display panel having a display area and a non-display area surrounding the display area, the display panel comprising a pixel unit and the drive circuit detection system as described in claim 1 to claim 9, the pixel unit is arranged on the display area, the driving circuit detection system is arranged in the non-display area to control the display of the pixel unit.
TW110106802A 2021-02-25 2021-02-25 Inspection system of driving circuit TWI762218B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW110106802A TWI762218B (en) 2021-02-25 2021-02-25 Inspection system of driving circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW110106802A TWI762218B (en) 2021-02-25 2021-02-25 Inspection system of driving circuit

Publications (2)

Publication Number Publication Date
TWI762218B true TWI762218B (en) 2022-04-21
TW202234081A TW202234081A (en) 2022-09-01

Family

ID=82198988

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110106802A TWI762218B (en) 2021-02-25 2021-02-25 Inspection system of driving circuit

Country Status (1)

Country Link
TW (1) TWI762218B (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040207018A1 (en) * 2001-10-11 2004-10-21 Jang Yong-Kyu Thin film transistor array panel having a means for visual inspection and a method of performing visual inspection
CN101256294A (en) * 2007-02-26 2008-09-03 爱普生映像元器件有限公司 Electro-optical device, semiconductor device, display device, and electronic apparatus having the display device
TW201400958A (en) * 2012-06-29 2014-01-01 Au Optronics Corp Display panel and method for inspecting thereof
US20140361961A1 (en) * 2012-02-08 2014-12-11 Panasonic Corporation El display device and production method therefor
TW201926308A (en) * 2017-11-28 2019-07-01 日商索尼半導體解決方案公司 Display device and electronic apparatus
TW202030709A (en) * 2019-01-31 2020-08-16 友達光電股份有限公司 Pixel circuit and repair method thereof

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040207018A1 (en) * 2001-10-11 2004-10-21 Jang Yong-Kyu Thin film transistor array panel having a means for visual inspection and a method of performing visual inspection
CN101256294A (en) * 2007-02-26 2008-09-03 爱普生映像元器件有限公司 Electro-optical device, semiconductor device, display device, and electronic apparatus having the display device
US20140361961A1 (en) * 2012-02-08 2014-12-11 Panasonic Corporation El display device and production method therefor
TW201400958A (en) * 2012-06-29 2014-01-01 Au Optronics Corp Display panel and method for inspecting thereof
TW201926308A (en) * 2017-11-28 2019-07-01 日商索尼半導體解決方案公司 Display device and electronic apparatus
TW202030709A (en) * 2019-01-31 2020-08-16 友達光電股份有限公司 Pixel circuit and repair method thereof

Also Published As

Publication number Publication date
TW202234081A (en) 2022-09-01

Similar Documents

Publication Publication Date Title
US10210835B2 (en) Gate driver on array circuit and driving method thereof, and display device
US10269289B2 (en) Shift register and control method thereof
JP4034362B2 (en) Shift registers used as select line scanners for liquid crystal displays
KR20040053639A (en) Device of driving display device
WO2016141652A1 (en) Shift register unit, shift register, display panel and display device
US10474267B2 (en) Touch display apparatus
US20090051639A1 (en) Method and device for reducing voltage stress at bootstrap point in electronic circuits
US20200167055A1 (en) A shift-register circuit, gate drive circuit, liquid crystal display and touch panel
US9377994B2 (en) Gate driver circuit
US20140002438A1 (en) Source driver and liquid crystal display device
US10782808B2 (en) Shift register and touch display apparatus thereof
JP2020529620A (en) Scanning drive circuit and its drive method, display device
US20150091822A1 (en) Gate driving circuit, gate line driving method and display apparatus
CN104183222B (en) Display device
CN108287624A (en) A kind of embedded touch driving circuit, touch panel and driving method
WO2018209742A1 (en) Time sequence driving circuit for liquid crystal display panel, driving circuit and liquid crystal display panel
TWI762218B (en) Inspection system of driving circuit
WO2019223550A1 (en) Shift register, gate drive circuit and display device
US7443373B2 (en) Semiconductor device and the method of testing the same
CN114120913A (en) Power supply and display device including the same
CN110189682B (en) Grid driving circuit and display panel thereof
JP2020523683A (en) In-cell type touch panel test circuit
US10211821B2 (en) Clock signal transmission circuit and driving method thereof, gate driving circuit, and display device
US8405438B2 (en) Semiconductor circuit and method of retrieving signal to semiconductor circuit
TW201705117A (en) Display and driving method thereof