TWI754508B - Apparatus and growth process of monocrystal - Google Patents
Apparatus and growth process of monocrystal Download PDFInfo
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- TWI754508B TWI754508B TW109146672A TW109146672A TWI754508B TW I754508 B TWI754508 B TW I754508B TW 109146672 A TW109146672 A TW 109146672A TW 109146672 A TW109146672 A TW 109146672A TW I754508 B TWI754508 B TW I754508B
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/22—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/203—Controlling or regulating the relationship of pull rate (v) to axial thermal gradient (G)
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Abstract
Description
本發明是關於矽片製備領域,特別是關於一種單晶生長設備及生長方法。 The present invention relates to the field of silicon wafer preparation, in particular to a single crystal growth device and a growth method.
直拉法是現有的一種常用的單晶生長方法,又稱為切克勞斯基法(Czochralski method),簡稱CZ法。CZ法的特點是在一個直筒型的爐體中,用石墨電阻加熱,將裝在高純度石英坩堝中的多晶矽熔化,然後將籽晶插入熔體表面進行熔接,同時轉動籽晶,再反轉坩堝,籽晶緩慢向上提升,經過引晶、放肩、轉肩、等徑生長、收尾等過程,最終長成所需直徑和長度的晶棒。 The Czochralski method is a commonly used single crystal growth method, also known as the Czochralski method, or the CZ method for short. The characteristic of CZ method is that in a straight-tube furnace body, graphite resistance heating is used to melt the polysilicon in a high-purity quartz crucible, and then the seed crystal is inserted into the surface of the melt for welding, and the seed crystal is rotated at the same time, and then reversed. In the crucible, the seed crystal is slowly lifted upwards, and finally grows into a crystal rod of the required diameter and length through the processes of seeding, shoulder placement, shoulder rotation, equal diameter growth, and finishing.
液口距對單晶生長介面軸向溫度梯度影響較大,液口距變化導致拉晶的穩態發生變化,軸向溫度梯度也會發生變化,邊緣的溫度梯度和中心的溫度梯度差異隨著等徑長度的增加而發生變化。該現象對生長無缺陷單晶有著嚴重的不利影響。通常在一定的範圍內,液口距越大,軸向溫度梯度越平緩。因此在拉晶過程中,在不同的等徑長度通過改變坩堝的提升速度以控制液口距來改變軸向溫度梯度。因為在單晶矽生長過程中,矽原料被不斷熔融消耗,導致坩堝內的熔融液面不斷下降,故為了將液面保持在一個固定的位置(即確保 液口距,即熔融矽液面至導流筒的距離這個參數不變),現有技術中通常是在單晶生長過程中按一定的速度將坩堝進行提升,即通過改變坩堝提拉速度改變坩堝位置以確保液口距不變。坩堝的提升速度通常藉由對單晶矽生長速度、單晶矽直徑、石英坩堝直徑、熔體密度等參數綜合計算得到,比如在等徑過程中如果需要液口距小一點,那坩堝就升的快一點。但現有技術中在採用調整坩堝位置來調整液口距時並沒有在等徑前期考慮坩堝位置對拉晶品質的影響,不能保證液面和熱場的相對位置,在等徑過程中調整坩堝位置會破壞拉晶的穩態,且調整緩慢。 The liquid port distance has a great influence on the axial temperature gradient of the single crystal growth interface. The change of the liquid port distance causes the steady state of crystal pulling to change, and the axial temperature gradient also changes. The temperature gradient at the edge and the temperature gradient in the center vary with changes as the length of the equal diameter increases. This phenomenon has serious adverse effects on the growth of defect-free single crystals. Usually within a certain range, the larger the liquid port distance, the smoother the axial temperature gradient. Therefore, in the process of crystal pulling, the axial temperature gradient can be changed by changing the lifting speed of the crucible to control the distance between the liquid openings at different equal diameter lengths. During the growth of single crystal silicon, the silicon raw material is continuously melted and consumed, resulting in the continuous drop of the molten liquid level in the crucible. The distance between the liquid openings, that is, the distance from the molten silicon liquid level to the diversion cylinder, remains unchanged. In the prior art, the crucible is usually lifted at a certain speed during the single crystal growth process, that is, the crucible is changed by changing the crucible pulling speed. position to ensure that the distance between the ports remains unchanged. The lifting speed of the crucible is usually calculated by comprehensively calculating the parameters such as the growth rate of single crystal silicon, the diameter of single crystal silicon, the diameter of the quartz crucible, and the melt density. faster. However, in the prior art, when adjusting the position of the crucible to adjust the liquid port distance, the influence of the position of the crucible on the crystal pulling quality was not considered in the early stage of the equal diameter, and the relative position of the liquid level and the thermal field could not be guaranteed, and the position of the crucible was adjusted during the equal diameter process. It will destroy the steady state of crystal pulling, and the adjustment will be slow.
鑒於以上所述現有技術的缺點,本發明的目的在於提供一種單晶生長設備及生長方法,用於解決現有技術中在採用調整坩堝位置來調整液口距時並沒有在等徑前期考慮坩堝位置對拉晶品質的影響,不能保證液面和熱場的相對位置,在等徑過程中調整坩堝位置會破壞拉晶的穩態,且調整緩慢等問題。 In view of the above-mentioned shortcomings of the prior art, the purpose of the present invention is to provide a single crystal growth device and a growth method, which are used to solve the problem that in the prior art, the crucible position is not considered in the early stage of the equal diameter when adjusting the position of the crucible to adjust the liquid port distance. The influence on the crystal pulling quality cannot guarantee the relative position of the liquid level and the thermal field. Adjusting the position of the crucible during the equal diameter process will destroy the steady state of the crystal pulling, and the adjustment will be slow.
為實現上述目的及其他相關目的,本發明提供一種單晶生長設備,所述單晶生長設備包括爐體、坩堝、加熱器及導流組件,所述導流組件包括導流筒及導流筒提拉裝置,所述坩堝位於所述爐體內,用於承載熔融矽,所述加熱器設置於所述爐體內,且位於所述坩堝的週邊,用於對所述坩堝進行加熱;所述導流筒設置於所述爐體內,與所述導流筒提拉裝置連接,所述導流筒自所述坩堝的外側延伸到所述熔融矽的上方,所述導流筒提拉裝置包含控制器,所述導流筒在所述控制器的控制下上下移動,以改變所述導流筒與所述熔融矽液面的間距。 In order to achieve the above object and other related objects, the present invention provides a single crystal growth device, the single crystal growth device includes a furnace body, a crucible, a heater and a flow guide assembly, and the flow guide assembly includes a flow guide tube and a flow guide tube A pulling device, the crucible is located in the furnace body to carry molten silicon, the heater is arranged in the furnace body and is located at the periphery of the crucible, and is used for heating the crucible; the guide The flow tube is arranged in the furnace body and is connected with the guide tube pulling device. The flow guide tube extends from the outer side of the crucible to the top of the molten silicon. The guide tube pulling device includes a control The guide tube moves up and down under the control of the controller to change the distance between the guide tube and the molten silicon liquid level.
於一實施例中,所述導流筒提拉裝置還包括連桿及電機,所述連桿一端與所述導流筒相連接,另一端向上延伸到所述爐體外,所述電機與所述連桿及所述控制器相連接,所述電機在所述控制器的控制下驅動所述連桿帶動所述導流筒上下移動。 In one embodiment, the guide tube pulling device further includes a connecting rod and a motor, one end of the connecting rod is connected with the guide tube, and the other end extends upward to the outside of the furnace, and the motor is connected to the The connecting rod is connected with the controller, and the motor drives the connecting rod to drive the guide tube to move up and down under the control of the controller.
於一實施例中,所述連桿為多個,所述多個連桿對稱設置於所述導流筒上。 In one embodiment, there are multiple connecting rods, and the multiple connecting rods are symmetrically arranged on the guide tube.
於一實施例中,所述導流筒包括耳部及錐形筒部,所述耳部一端與所述爐體的內壁相鄰,另一端向所述爐體的中線方向延伸,所述錐形筒部一端與所述耳部遠離所述爐體內壁的一端相連接,另一端延伸到所述坩堝的上方,所述連桿與所述耳部相連接。 In one embodiment, the guide tube includes an ear portion and a conical cylindrical portion, one end of the ear portion is adjacent to the inner wall of the furnace body, and the other end extends toward the centerline of the furnace body, so the One end of the conical cylindrical portion is connected with one end of the ear portion away from the inner wall of the furnace, and the other end extends above the crucible, and the connecting rod is connected with the ear portion.
於一實施例中,所述控制器為可編程邏輯控制器(Programmable Logic Controller,PLC),所述PLC控制器還與單晶提拉裝置相連接。 In one embodiment, the controller is a programmable logic controller (Programmable Logic Controller, PLC), and the PLC controller is also connected to the single crystal pulling device.
於一實施例中,當單晶等徑長度變化a毫米(mm),單晶長度變化a過程中籽晶提拉速度為b毫米/分(mm/min);若液口距每增加c mm時,則導流筒以c*b/a mm/min的速度向上移動。 In one embodiment, when the equal diameter length of the single crystal changes by a millimeter (mm), the pulling speed of the seed crystal during the change in the length of the single crystal a is b millimeters/min (mm/min). , the guide tube moves upward at the speed of c*b/a mm/min.
於一實施例中,所述單晶生長設備還包括堝升系統,用於在單晶生長過程中驅動所述坩堝以一預設恆定速度向上移動。 In one embodiment, the single crystal growth apparatus further includes a crucible lifting system for driving the crucible to move upward at a preset constant speed during the single crystal growth process.
本發明還提供一種單晶生長方法,所述單晶生長方法在單晶生長過程中,通過上下移動導流筒,以改變導流筒與坩堝內的熔融矽的間距,由此調整單晶生長過程中的軸向溫度梯度。 The present invention also provides a single crystal growth method. In the single crystal growth process, the guide cylinder is moved up and down to change the distance between the guide cylinder and the molten silicon in the crucible, thereby adjusting the growth of the single crystal. Axial temperature gradient in the process.
於一實施例中,所述導流筒的移動速度為0~0.1mm/min,移動區間為0~20mm。 In one embodiment, the moving speed of the guide tube is 0-0.1 mm/min, and the moving interval is 0-20 mm.
於一實施例中,單晶生長過程中,所述坩堝以一預設恆定速度向上移動。 In one embodiment, the crucible moves upward at a predetermined constant speed during single crystal growth.
如上所述,本發明的單晶生長設備及單晶生長方法,具有以下有益效果:本發明的單晶生長設備通過添加導流筒聯動裝置,以在需要時通過調整導流筒的高度來改變液口距,在整個過程中晶體提拉速度和坩堝上升速度無任何調整,從而達到改變單晶生長過程中的軸向溫度梯度的目的,確保液面和熱場的相對位置,在等徑過程中維持拉晶的穩態,且調整操作簡單,調整精度高,有利於提高單晶生長品質。 As described above, the single crystal growth apparatus and the single crystal growth method of the present invention have the following beneficial effects: the single crystal growth apparatus of the present invention can be changed by adjusting the height of the guide tube by adding a guide tube linkage device when necessary. There is no adjustment of the crystal pulling speed and the crucible rising speed during the whole process, so as to achieve the purpose of changing the axial temperature gradient during the single crystal growth process, and ensure the relative position of the liquid level and the thermal field. The steady state of crystal pulling is maintained, and the adjustment operation is simple and the adjustment precision is high, which is beneficial to improve the growth quality of the single crystal.
11:爐體 11: Furnace body
12:坩堝 12: Crucible
13:加熱器 13: Heater
14:導流筒 14: Guide tube
141:耳部 141: Ears
142:錐形筒部 142: Conical barrel
151:連桿 151: connecting rod
152:電機 152: Motor
153:控制器 153: Controller
16:熔融矽 16: Fused Silicon
17:石墨層 17: Graphite layer
18:石墨端蓋 18: Graphite end cap
21:籽晶 21: seed crystal
22:單晶提拉裝置 22: Single crystal pulling device
23:坩堝驅動裝置 23: Crucible drive device
d:液口距 d: distance between liquid ports
圖1顯示為本發明的單晶生長設備的結構示意圖。 FIG. 1 is a schematic diagram showing the structure of the single crystal growth apparatus of the present invention.
圖2顯示為採用本發明的單晶生長設備調整液口距和導流筒速度之間的關係示意圖。 FIG. 2 is a schematic diagram showing the relationship between the adjustment of the liquid orifice distance and the speed of the guide tube using the single crystal growth apparatus of the present invention.
以下通過特定的具體實例說明本發明的實施方式,本領域技術人員可由本說明書所揭露的內容輕易地瞭解本發明的其他優點與功效。本發明還可以通過另外不同的具體實施方式加以實施或應用,本說明書中的各項細節也可以基於不同觀點與應用,在沒有背離本發明的精神下進行各種修飾或改變。 The embodiments of the present invention are described below through specific specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification. The present invention can also be implemented or applied through other different specific embodiments, and various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of the present invention.
請參閱圖1至圖2,需要說明的是,本實施例中所提供的圖示僅以示意方式說明本發明的基本構想,雖圖示中僅顯示與本發明中有關的組件而非按照實際實施時的元件數目、形狀及尺寸繪製,其實際實施時各元件的型態、數量及比例可為一種隨意的改變,且其元件佈局型態也可能更為複雜。 Please refer to FIG. 1 to FIG. 2 , it should be noted that the diagrams provided in this embodiment only illustrate the basic concept of the present invention in a schematic way, although the diagrams only show the components related to the present invention rather than according to the actual The number, shape and size of the components are drawn during the implementation, and the type, number and ratio of the components can be arbitrarily changed in the actual implementation, and the layout of the components may also be more complicated.
如圖1所示,本發明提供一種單晶生長設備,包括爐體11、坩堝12、加熱器13及導流組件,所述導流組件包括導流筒14及導流筒提拉裝置;所述爐體11為單晶生長的主體,所述坩堝12、加熱器13及導流筒14均位於所述爐體11內;所述坩堝12用於承載熔融矽16,所述坩堝12的材質包括但不限於石英和石墨中的一種,比如在一示例中,所述坩堝12包括石墨坩堝和位於所述石墨坩堝內的石英坩堝;且在需要時所述坩堝12內表面可以有其他材質的塗層,比如碳化矽塗層;所述加熱器13位於所述坩堝12的週邊且較佳位於整個坩堝的週邊周向上,以對坩堝均勻加熱;加熱器13通過對所述坩堝12進行加熱,以將所述坩堝12內的固態矽料熔融為液態的熔融矽16,所述導流筒14與所述導流筒提拉裝置相連接,且所述導流筒14自所述坩堝12的外側延伸到所述熔融矽16的上方,且通常所述導流筒14與所述熔融矽16具有間距;所述導流筒提拉裝置包含控制器153,所述導流筒14在所述控制器153的控制下上下移動,以改變所述導流筒14與所述熔融矽16液面的間距,由此調整單晶生長過程中的軸向溫度梯度。本發明的單晶生長設備通過添加導流筒提拉裝置,以在需要時通過調整導流筒的高度來改變液口距d,而無需改變坩堝提升速度,可以使坩堝位置保持相對固定,從而在每一爐中使加熱器、坩堝及坩堝以下的下部熱場的相對位置保持不變,保證每一爐矽單晶生長條件恆定一致,有利於確保生產品質的穩定一致性。該方法調整快速有效,相較於傳統方法中通過調整坩堝位置調整液口距d的方法,可以更加快速地調整液口距。
As shown in FIG. 1 , the present invention provides a single crystal growth equipment, including a
需要說明的是,坩堝12中的矽料初始狀態通常為固態,經受熱熔融後變成熔融矽16,而導流筒14與熔融矽16之間的間距是指導流筒14最低點位置與熔融矽16液面之間的距離,也即業界俗稱的液口距d。導流筒14是組成石墨熱場的一部分,在單晶生長過程中通過所述導流筒14將惰性氣體,比如將氬氣由上而下導入到熔融矽16上方,可以帶走熔融矽16上方的氧化矽(SiO),並對單
晶矽棒進行降溫,增大其軸向溫度梯度(即單晶的縱向生長方向的溫度),使單晶快速生長。液口距d在矽單晶生長等徑過程中是一個很重要的參數,液口距d過大或過小都不利於單晶生長,且等徑不同的單晶長度處對應有不同的液口距d值。單晶生長過程中為確保單晶生長的品質需儘量在等徑生長時保持液口距d不變。現有技術中都是在單晶生長過程中通過提升坩堝以彌補因熔融矽消耗導致液口距d增大的問題,但通過改變坩堝提拉速度調整坩堝位置來調整液口距d會改變熔體和加熱器的相對位置,使熔體中對流不穩定,即單晶穩定的生長條件遭到破壞,會造成矽單晶生長拉速不穩定,降低矽單晶品質。而本發明通過調整導流筒的位置以維持單晶生長過程中的穩態,可以將對單晶生長的不良影響降到最低,有利於提高單晶生長品質。
It should be noted that the initial state of the silicon material in the
作為示例,所述導流筒提拉裝置還包括連桿151及電機152,所述連桿151一端與所述導流筒14相連接,另一端向上延伸到所述爐體11外,且可上下移動,所述電機152與所述連桿151及所述控制器153相連接,所述電機152在所述控制器153的控制下驅動所述連桿151帶動所述導流筒14上下移動。
As an example, the guide tube pulling device further includes a connecting
作為示例,所述導流筒14包括耳部141及錐形筒部142,所述耳部141一端與所述爐體11的內壁相鄰(該端與氣體源相連通),另一端向所述爐體11的中線方向延伸,所述錐形筒部142一端與所述耳部141遠離所述爐體11內壁的一端相連接,另一端延伸到所述熔融矽16的上方,所述連桿151與所述耳部141相連接。所述耳部141呈水準狀態,將連桿151與耳部141垂直連接,確保在提拉導流筒14的過程中是呈直線上下運動,以精確控制提拉速度。所述錐形筒部142呈傾斜狀,且與水平面的夾角可為30~75°,以將惰性氣體均勻輸送至熔融矽表面,避免造成液面波動。且所述錐形筒部142的尺寸可沿朝向所述坩堝12的方向逐漸增大,即呈喇叭狀,以使惰性氣體更加均勻地供應至熔融矽表面,提高同一平面上的溫度均衡性,以確保單晶等徑生長過程中的溫度均衡性。
As an example, the
作為示例,所述連桿151為多個,所述多個連桿151對稱設置於所述導流筒14上,比如所述連桿151為兩個,兩個連桿151以所述爐體11的中線為中心對稱分佈。通過對稱分佈的多個連桿,以確保所述導流筒在上下移動過程中保持平穩。
As an example, there are multiple connecting
作為示例,所述控制器153較佳為PLC控制器,以便於系統的擴展,通過PLC控制器計算並回饋給控制導流筒14上下移動的高精度電機152,以精確調整液口距d。所述PLC控制器較佳還與單晶提拉裝置22相連接,或者說單晶提拉裝置22和導流筒提拉裝置可以通過同一PLC控制器驅動,可以根據單晶生長情況及時調整晶棒提拉速度和/或導流筒提拉速度。需要說明的是,所述單晶提拉裝置22通常包括提拉繩及與提拉繩相連接的電機部分,PLC控制器與電機部分連接,提拉繩另一端與籽晶21相連接,籽晶21與坩堝12內的熔融矽16接觸,待籽晶21表面稍熔後,提拉並轉動提拉繩,使熔體處於過冷狀態而結晶於籽晶21上,在不斷提拉和旋轉過程中,生長出圓柱狀晶體。隨著單晶的不斷生長,坩堝內的熔融矽液面不斷下降,為了保持恆定的單晶生長條件,作為示例,所述單晶生長設備還包括堝升系統(未示出),用於在單晶生長過程中驅動所述坩堝12以一預設恆定速度向上移動,在完成所需長度的單晶生長後,還可以驅動所述坩堝12下降以使晶棒脫離矽熔液液面。作為示例,該堝升系統也可以通過所述PLC控制器進行控制,確保各部件之間保持聯動。
As an example, the
為精確控制導流筒14的提拉速度,所述電機152需要有較佳的控制精度。本實施例中,作為示例,所述電機152的提拉精度,也即最小移動速度為0.001mm/min。本發明中,連桿151做上下直線移動,電機152的移動速度即為導流筒14的移動速度,也即單位長度上液口距d的變化量。
In order to precisely control the pulling speed of the
作為示例,所述單晶生長設備還包括石墨層17,位於所述爐體11和所述加熱器13之間,所述石墨層17可以實現保溫隔熱作用。在進一步的示例
中,所述單晶生長設備還包括石墨端蓋18,所述石墨端蓋18位於所述石墨層17的頂部,且位於所述導流筒14的耳部141的下部,通過所述石墨層17和石墨端蓋18的共同作用,以減少熱量散失。
As an example, the single crystal growth apparatus further includes a
作為示例,所述單晶生長設備還包括坩堝驅動裝置23,位於所述坩堝12底部,以在需要時驅動所述坩堝12旋轉。當然,該坩堝驅動裝置23也可以作為前述的堝升系統,用於在單晶生長過程中驅動所述坩堝以一預設恆定速度向上移動。
As an example, the single crystal growth apparatus further includes a
所述導流筒的提升拉速與液口距及單晶等徑長度等參數密切相關。在一較佳示例中,當單晶等徑長度變化範圍a mm,單晶長度變化a過程中籽晶提拉速度為b mm/min,若液口距每增加c mm時,則導流筒以c*b/a(mm/min)的速度向上移動,其中,a,b,c均是根據單晶生長需要所設定的固定值。比如,當單晶等徑長度為1000~1050mm(即單晶等徑長度變化a為50mm),單晶長度變化過程中籽晶提拉速度b為1mm/min,若液口距每需增加1mm,則導流筒以1*1/50=0.02mm/min的速度向上移動。 The lifting and pulling speed of the guide tube is closely related to parameters such as the distance between the liquid ports and the length of the single crystal equal diameter. In a preferred example, when the diameter of the single crystal varies in the range of a mm, the pulling speed of the seed crystal during the change in the length of the single crystal a is b mm/min. Move upward at the speed of c*b/a (mm/min), where a, b, and c are all fixed values set according to the needs of single crystal growth. For example, when the equal diameter length of the single crystal is 1000~1050mm (that is, the change in the equal diameter length of the single crystal a is 50mm), the seed crystal pulling speed b during the change of the single crystal length is 1mm/min. , the guide tube moves upward at a speed of 1*1/50=0.02mm/min.
在一示例中,根據晶體長度設定液口距,兩者對應關係如表1所示:
當然,需要特別說明的是,上述資料並不是限制性的而僅是示例性的。實際上晶體長度、液口距、籽晶提拉速度等參數都可以根據需要進行設定,而且這些參數和拉晶爐大小、熱場尺寸、製程參數等都有很大的關係,因而本發明並非對具體參數的限制。重要的是採用本發明在單晶生長過程中可以根據需要通過調整導流筒的高度來改變液口距,而無需改變坩堝上升速度,可以使坩堝位置保持相對固定,從而在每一爐中使加熱器、坩堝及坩堝以下的下部熱場的相對位置保持不變,保證每一爐矽單晶生長條件恆定一致,以確保生產品質的穩定一致性。 Of course, it should be noted that the above-mentioned information is not restrictive but only exemplary. In fact, parameters such as crystal length, liquid port distance, and seed crystal pulling speed can be set as required, and these parameters have a great relationship with the size of the crystal pulling furnace, thermal field size, process parameters, etc., so the present invention is not Restrictions on specific parameters. What is important is that in the single crystal growth process of the present invention, the liquid opening distance can be changed by adjusting the height of the guide tube according to the needs, without changing the crucible rising speed, the position of the crucible can be kept relatively fixed, so that in each furnace The relative positions of the heater, the crucible and the lower thermal field below the crucible remain unchanged to ensure the constant and consistent growth conditions of silicon single crystals in each furnace, so as to ensure the stable and consistent production quality.
若如上表所示設定好參數後,在晶體生長過程中,隨著設定液口距的參數,通過PLC控制器驅動電機按一定速度對導流筒進行提拉,由此改變導流筒高度,液口距和導流筒速度的對應關係如圖2所示(該對應關係的前提是籽晶提拉速度為1mm/min),其中,曲線為設定液口距,曲線為導流筒速度。 If the parameters are set as shown in the above table, during the crystal growth process, along with the parameters of the liquid port distance, the PLC controller drives the motor to pull the guide tube at a certain speed, thereby changing the height of the guide tube. The corresponding relationship between the liquid port distance and the speed of the guide tube is shown in Figure 2 (the premise of the corresponding relationship is that the seed crystal pulling speed is 1mm/min), where the curve To set the port distance, the curve is the velocity of the guide tube.
採用本發明的單晶生長設備進行單晶生長,在整個單晶生長過程中僅需調整導流筒的提升拉伸,而晶體提拉速度和坩堝上升速度無需任何調整,因而不會改變液面和熱場的相對位置,由此可以實現穩定的晶體生長,有利於提高單晶生長品質。 The single crystal growth equipment of the present invention is used for single crystal growth. During the entire single crystal growth process, only the lifting and stretching of the guide tube needs to be adjusted, and the crystal pulling speed and the crucible lifting speed do not need any adjustment, so the liquid level will not be changed. and the relative position of the thermal field, so that stable crystal growth can be achieved, which is beneficial to improve the quality of single crystal growth.
本發明還提供一種單晶生長方法,所述單晶生長方法可以依前述任一項所述的單晶生長設備進行,故對所述單晶生長設備的介紹還請參考前述內容,出於簡潔的目的不贅述。所述單晶生長方法在單晶生長過程中,通過上下移動導流筒,以改變導流筒與熔融矽的間距(即液口距),由此調整單晶生長過程中的軸向溫度梯度。本發明無需調整晶體提拉速度和坩堝上升速度,因而不會改變液面和熱場的相對位置,有利於穩定單晶生長條件,有利於生長出高品質的單晶。 The present invention also provides a single crystal growth method. The single crystal growth method can be performed according to any one of the single crystal growth equipment described above. Therefore, for the introduction of the single crystal growth equipment, please refer to the foregoing content. For brevity The purpose is not repeated. In the single crystal growth method, in the single crystal growth process, the guide tube is moved up and down to change the distance between the guide tube and the molten silicon (ie, the liquid port distance), thereby adjusting the axial temperature gradient during the single crystal growth process. . The invention does not need to adjust the crystal pulling speed and the crucible rising speed, so the relative position of the liquid level and the thermal field will not be changed, which is beneficial to stabilize the single crystal growth conditions and to grow high-quality single crystals.
作為示例,所述導流筒的移動速度為0~0.1mm/min,移動區間為0~20mm。當然,需要說明的是,根據不同的生長需要,導流筒可以是向上移動或向下移動,因而上述數值是絕對值而不是相對值,即導流筒向上與向下的移動範圍都是0~20mm。且作為示例,在單晶生長過程中,所述坩堝以一預設恆定速度向上移動。 As an example, the moving speed of the guide tube is 0-0.1 mm/min, and the moving interval is 0-20 mm. Of course, it should be noted that, according to different growth needs, the guide tube can move up or down, so the above values are absolute values rather than relative values, that is, the upward and downward movement ranges of the guide tube are both 0 ~20mm. And as an example, during the growth of a single crystal, the crucible moves upward at a predetermined constant speed.
綜上所述,本發明提供一種單晶生長設備及單晶生長方法。設備包括爐體、坩堝、加熱器及導流組件,所述導流組件包括導流筒及導流筒提拉裝置;所述坩堝、加熱器及導流筒均位於所述爐體內;所述坩堝用於承載熔融矽,所述加熱器位於所述坩堝的週邊,用於對所述坩堝進行加熱,所述導流筒與所述導流筒提拉裝置連接,並自所述坩堝的外側延伸到所述熔融矽的上方,且所述導流筒與所述熔融矽具有間距;所述導流筒提拉裝置包含控制器,所述導流筒在所述控制器的控制下上下移動,以改變所述導流筒與所述熔融矽液面的間距。本發明的單晶生長設備通過添加導流筒聯動裝置,以在需要時通過調整導流筒的高度來改變液口距,在整個過程中晶體提拉速度和坩堝上升速度無任何調整,從而達到改變單晶生長過程中的軸向溫度梯度的目的,確保液面和熱場的相對位置,在等徑過程中維持拉晶的穩態,且調整操作簡單,調整精度高,有利於提高單晶生長品質。 In summary, the present invention provides a single crystal growth apparatus and a single crystal growth method. The equipment includes a furnace body, a crucible, a heater and a guide assembly, the guide assembly includes a guide tube and a guide tube pulling device; the crucible, the heater and the guide tube are all located in the furnace body; the The crucible is used to carry molten silicon, the heater is located at the periphery of the crucible, and is used to heat the crucible, the guide tube is connected with the guide tube pulling device, and is from the outside of the crucible extending above the molten silicon, and the guide tube is spaced from the molten silicon; the guide tube pulling device includes a controller, and the guide tube moves up and down under the control of the controller , so as to change the distance between the guide tube and the molten silicon liquid level. The single crystal growth equipment of the present invention adds a guide tube linkage device to change the liquid port distance by adjusting the height of the guide tube when necessary, and the crystal pulling speed and the crucible rising speed are not adjusted in the whole process, so as to achieve The purpose of changing the axial temperature gradient during the single crystal growth process, ensuring the relative position of the liquid level and the thermal field, maintaining the steady state of crystal pulling in the process of equal diameter, and the adjustment operation is simple and the adjustment precision is high, which is conducive to improving the single crystal growth quality.
上述實施例僅例示性說明本發明的原理及其功效,而非用於限制本發明。任何熟悉此技術的人士皆可在不違背本發明的精神及範疇下,對上述實施例進行修飾或改變。因此,舉凡所屬技術領域中具有通常知識者在未脫離本發明所揭示的精神與技術思想下所完成的一切等效修飾或改變,仍應由本發明的申請專利範圍所涵蓋。 The above-mentioned embodiments merely illustrate the principles and effects of the present invention, but are not intended to limit the present invention. Anyone skilled in the art can modify or change the above embodiments without departing from the spirit and scope of the present invention. Therefore, all equivalent modifications or changes made by those with ordinary knowledge in the technical field without departing from the spirit and technical idea disclosed in the present invention should still be covered by the scope of the patent application of the present invention.
11:爐體 11: Furnace body
12:坩堝 12: Crucible
13:加熱器 13: Heater
14:導流筒 14: Guide tube
141:耳部 141: Ears
142:錐形筒部 142: Conical barrel
151:連桿 151: connecting rod
152:電機 152: Motor
153:控制器 153: Controller
16:熔融矽 16: Fused Silicon
17:石墨層 17: Graphite layer
18:石墨端蓋 18: Graphite end cap
21:籽晶 21: seed crystal
22:單晶提拉裝置 22: Single crystal pulling device
23:坩堝驅動裝置 23: Crucible drive device
d:液口距 d: distance between liquid ports
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