TWI749832B - Etching solution, touch panel and manufacturing method thereof - Google Patents
Etching solution, touch panel and manufacturing method thereof Download PDFInfo
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
- G06F3/0445—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means using two or more layers of sensing electrodes, e.g. using two layers of electrodes separated by a dielectric layer
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- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
- G06F3/0446—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means using a grid-like structure of electrodes in at least two directions, e.g. using row and column electrodes
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Abstract
Description
本發明涉及一種蝕刻液、觸控面板及其製作方法。The invention relates to an etching solution, a touch panel and a manufacturing method thereof.
近年來,透明導體可同時讓光穿過並提供適當的導電性,因而常應用於許多顯示或觸控相關的裝置中。一般而言,透明導體可以是各種金屬氧化物,例如氧化銦錫(Indium Tin Oxide,ITO)、氧化銦鋅(Indium Zinc Oxide,IZO)、氧化鎘錫(Cadmium Tin Oxide,CTO)或摻鋁氧化鋅(Aluminum-doped Zinc Oxide,AZO)。然而,這些金屬氧化物薄膜並不能滿足顯示裝置的可撓性需求。因此,現今發展出了多種可撓性的透明導體,例如利用奈米線等材料所製作的透明導體。In recent years, transparent conductors can allow light to pass through at the same time and provide appropriate conductivity, so they are often used in many display or touch-related devices. Generally speaking, the transparent conductor can be a variety of metal oxides, such as indium tin oxide (ITO), indium zinc oxide (IZO), cadmium tin oxide (Cadmium Tin Oxide, CTO), or aluminum-doped oxide. Zinc (Aluminum-doped Zinc Oxide, AZO). However, these metal oxide films cannot meet the flexibility requirements of the display device. Therefore, a variety of flexible transparent conductors have been developed today, such as transparent conductors made of materials such as nanowires.
然而,所述的奈米線的製程技術尚有許多需要解決的問題,例如利用奈米線製作觸控電極,奈米線與周邊區的引線在進行對位時需預留對位元誤差區域,所述對位元誤差區域造成周邊區的引線尺寸無法縮減,進而導致周邊區的寬度較大,尤其採用卷對卷(Roll to Roll)製程,基材的形變量導致所述對位元誤差區域的尺寸更加放大(如150um),使得周邊區的寬度最小僅達到2.5mm,故無法滿足顯示器的窄邊框需求。再者,蝕刻液的選擇也是一個問題。However, there are still many problems that need to be solved in the process technology of nanowires. For example, when using nanowires to make touch electrodes, the leads of the nanowires and the surrounding area need to be reserved for alignment errors. , The alignment error area causes the lead size of the peripheral area to be unable to be reduced, which in turn leads to a larger width of the peripheral area. In particular, the roll to roll (Roll to Roll) process is adopted, and the deformation of the substrate causes the alignment error The size of the area is more enlarged (such as 150um), so that the minimum width of the peripheral area is only 2.5mm, so it cannot meet the needs of the narrow bezel of the display. Furthermore, the choice of etching solution is also a problem.
本發明的部分實施方式中,通過蝕刻液直接進行金屬奈米線層或金屬層的圖案化,以達到簡化製程的目的,進而控制製作成本。蝕刻液可以提供良好的蝕刻特性。In some embodiments of the present invention, the patterning of the metal nanowire layer or the metal layer is directly performed by the etching solution, so as to achieve the purpose of simplifying the manufacturing process and controlling the manufacturing cost. The etching solution can provide good etching characteristics.
本發明的部分實施方式中,通過金屬奈米線層與金屬層的一次性蝕刻,藉以達到不需預留對位時的對位元誤差區域的效果,以形成寬度較小的周邊引線,進而滿足窄邊框的需求。In some embodiments of the present invention, a one-time etching of the metal nanowire layer and the metal layer is used to achieve the effect of not needing to reserve an alignment error area during alignment, so as to form a peripheral lead with a smaller width. Meet the needs of narrow bezels.
本發明的部分實施方式中,通過金屬奈米線層與金屬層的分步驟蝕刻,藉以達到不需預留對位時的對位元誤差區域的效果,以形成寬度較小的周邊引線,進而滿足窄邊框的需求。同時由於蝕刻液只選擇性地蝕刻金屬奈米線層,而不蝕刻金屬層,從而避免了周邊區及顯示區的金屬奈米線層蝕刻不完全或對周邊區的金屬層造成側蝕的問題。In some embodiments of the present invention, the step-by-step etching of the metal nanowire layer and the metal layer is used to achieve the effect of eliminating the need to reserve an alignment error area when alignment, so as to form a peripheral lead with a smaller width, and then Meet the needs of narrow bezels. At the same time, the etching solution only selectively etches the metal nanowire layer, not the metal layer, thereby avoiding the problem of incomplete etching of the metal nanowire layer in the peripheral area and the display area or side etching of the metal layer in the peripheral area. .
根據本發明的部分實施方式,一種觸控面板的製作方法,包含:提供一基板,其中該基板具有一顯示區與一周邊區;設置一金屬層與一金屬奈米線層,其中該金屬奈米線層的一第一部分位於該顯示區,該金屬奈米線層的一第二部分與該金屬層位於該周邊區;及進行一圖案化步驟,其中該圖案化步驟包括利用可蝕刻該金屬層與該金屬奈米線層的一蝕刻液將該金屬層形成多個周邊引線並同時將該金屬奈米線層的該第二部分形成多個蝕刻層,其中該蝕刻液包括0.2-40 wt%的雙氧水、0.2-20 wt%的酸類、0.1-10 wt%的金屬緩蝕劑、0.1-10 wt%的安定劑以及餘量的溶劑。According to some embodiments of the present invention, a method for fabricating a touch panel includes: providing a substrate, wherein the substrate has a display area and a peripheral area; disposing a metal layer and a metal nanowire layer, wherein the metal nano A first portion of the wire layer is located in the display area, a second portion of the metal nanowire layer and the metal layer are located in the peripheral area; and performing a patterning step, wherein the patterning step includes using the metal layer to be etched An etching solution with the metal nanowire layer forms the metal layer into a plurality of peripheral leads and simultaneously forms a plurality of etching layers on the second part of the metal nanowire layer, wherein the etching solution includes 0.2-40 wt% Of hydrogen peroxide, 0.2-20 wt% acid, 0.1-10 wt% metal corrosion inhibitor, 0.1-10 wt% stabilizer and the balance solvent.
於本發明的部分實施方式中,圖案化步驟還包括利用該蝕刻液將該金屬奈米線層的該第一部分形成一觸控感應電極,該觸控感應電極設置於該基板的該顯示區,該觸控感應電極電性連接該些周邊引線。In some embodiments of the present invention, the patterning step further includes using the etching solution to form the first portion of the metal nanowire layer into a touch sensing electrode, and the touch sensing electrode is disposed on the display area of the substrate, The touch sensing electrode is electrically connected to the peripheral leads.
於本發明的部分實施方式中,金屬緩蝕劑包含有含氮、含硫或含羥基的、具有表面活性的有機化合物、巰基苯並噻唑、苯並三唑和甲基苯並三唑中的至少一種。In some embodiments of the present invention, the metal corrosion inhibitor includes nitrogen-containing, sulfur-containing or hydroxyl-containing organic compounds with surface activity, mercaptobenzothiazole, benzotriazole and tolyltriazole. At least one.
於本發明的部分實施方式中,安定劑包含有乙二胺四乙酸、二乙烯三胺五乙酸、羥乙基乙二胺三乙酸、二乙胺五乙酸、N-羥乙基乙二胺三乙酸和聚丙烯酸胺中的至少一種。In some embodiments of the present invention, the stabilizer includes ethylenediaminetetraacetic acid, diethylenetriaminepentaacetic acid, hydroxyethylethylenediaminetriacetic acid, diethylaminepentaacetic acid, and N-hydroxyethylethylenediaminetriacetic acid. At least one of acetic acid and polyacrylamide.
於本發明的部分實施方式中,設置該金屬層與該金屬奈米線層包括:設置該金屬層於該周邊區;及接著設置該金屬奈米線層於該顯示區與該周邊區,該第一部分位於該顯示區而成形於該基板上,該第二部分位於該周邊區而成形於該金屬層上。In some embodiments of the present invention, disposing the metal layer and the metal nanowire layer includes: disposing the metal layer in the peripheral area; and then disposing the metal nanowire layer in the display area and the peripheral area, the The first part is located in the display area and is formed on the substrate, and the second part is located in the peripheral area and is formed on the metal layer.
於本發明的部分實施方式中,設置該金屬層於該周邊區包括:將該金屬層成形於該周邊區與該顯示區;及移除位於該顯示區的該金屬層。In some embodiments of the present invention, disposing the metal layer in the peripheral area includes: forming the metal layer in the peripheral area and the display area; and removing the metal layer located in the display area.
於本發明的部分實施方式中,蝕刻液的成分包括1.0-10.0 wt%的雙氧水、1.0-5.0 wt%的酸類、2.0-7.0 wt%的金屬緩蝕劑、3.0-8.0 wt%的安定劑以及餘量的溶劑。In some embodiments of the present invention, the composition of the etching solution includes 1.0-10.0 wt% hydrogen peroxide, 1.0-5.0 wt% acid, 2.0-7.0 wt% metal corrosion inhibitor, 3.0-8.0 wt% stabilizer, and The remainder of the solvent.
於本發明的部分實施方式中,圖案化步驟還包括利用該蝕刻液將該金屬層形成多個標記,該些蝕刻層包括多個第一覆蓋物及多個第二覆蓋物,每一該些第一覆蓋物設置在對應的該些周邊引線上,每一該些第二覆蓋物設置在對應的該些標記上。In some embodiments of the present invention, the patterning step further includes using the etching solution to form a plurality of marks on the metal layer. The etching layers include a plurality of first coverings and a plurality of second coverings, each of which The first covering is arranged on the corresponding peripheral leads, and each of the second coverings is arranged on the corresponding marks.
於本發明的部分實施方式中,設置該金屬層與該金屬奈米線層包括:設置該金屬奈米線層於該顯示區與該周邊區;及接著設置該金屬層於該周邊區,其中該金屬層位於該第二部分上。In some embodiments of the present invention, disposing the metal layer and the metal nanowire layer includes: disposing the metal nanowire layer in the display area and the peripheral area; and then disposing the metal layer in the peripheral area, wherein The metal layer is on the second part.
於本發明的部分實施方式中,設置該金屬層與該金屬奈米線層包括:設置該金屬層於該周邊區;及接著設置該金屬奈米線層於該顯示區與該周邊區,該第一部分位於該顯示區而成形於該基板上,該第二部分位於該周邊區而成形於該金屬層上。In some embodiments of the present invention, disposing the metal layer and the metal nanowire layer includes: disposing the metal layer in the peripheral area; and then disposing the metal nanowire layer in the display area and the peripheral area, the The first part is located in the display area and is formed on the substrate, and the second part is located in the peripheral area and is formed on the metal layer.
於本發明的部分實施方式中,蝕刻液的成分包括1.0-5.0 wt%的雙氧水、0.1-0.6 wt%的酸類、2.0-7.0 wt%的金屬緩蝕劑、3.0-8.0 wt%的安定劑以及餘量的溶劑。In some embodiments of the present invention, the composition of the etching solution includes 1.0-5.0 wt% hydrogen peroxide, 0.1-0.6 wt% acid, 2.0-7.0 wt% metal corrosion inhibitor, 3.0-8.0 wt% stabilizer, and The remainder of the solvent.
於本發明的部分實施方式中,圖案化步驟還包括利用該蝕刻液將該金屬層形成多個標記,該些蝕刻層包括多個第一中間層及多個第二中間層,每一該些第一中間層設置在對應的該些周邊引線與該基板之間,每一該些第二中間層設置在對應的該些標記與該基板之間。In some embodiments of the present invention, the patterning step further includes using the etching solution to form a plurality of marks on the metal layer. The etching layers include a plurality of first intermediate layers and a plurality of second intermediate layers. The first intermediate layer is arranged between the corresponding peripheral leads and the substrate, and each of the second intermediate layers is arranged between the corresponding marks and the substrate.
於本發明的部分實施方式中,還包括設置一膜層。In some embodiments of the present invention, it further includes providing a film layer.
於本發明的部分實施方式中,製作方法於該基板的一面或雙面進行。In some embodiments of the present invention, the manufacturing method is performed on one side or both sides of the substrate.
於本發明的部分實施方式中,提出一種觸控面板。In some embodiments of the present invention, a touch panel is proposed.
根據本發明的部分實施方式,一種蝕刻液,用於進行一圖案化步驟,包括:0.2-40 wt%的雙氧水、0.2-20 wt%的酸類、0.1-10 wt%的金屬緩蝕劑、0.1-10 wt%的安定劑以及餘量的溶劑。According to some embodiments of the present invention, an etching solution for performing a patterning step includes: 0.2-40 wt% hydrogen peroxide, 0.2-20 wt% acid, 0.1-10 wt% metal corrosion inhibitor, 0.1 -10 wt% stabilizer and the balance solvent.
於本發明的部分實施方式中,酸類包含有機酸、無機酸或其組合。In some embodiments of the present invention, the acids include organic acids, inorganic acids or a combination thereof.
於本發明的部分實施方式中,有機酸包含有羧酸、二羧酸、三羧酸、烷基羧酸、乙酸、乙二酸、苯六甲酸、甲酸、氯乙酸、苯甲酸、三氟乙酸、丙酸和丁酸中的至少一種。In some embodiments of the present invention, organic acids include carboxylic acid, dicarboxylic acid, tricarboxylic acid, alkyl carboxylic acid, acetic acid, oxalic acid, mellitic acid, formic acid, chloroacetic acid, benzoic acid, trifluoroacetic acid , At least one of propionic acid and butyric acid.
於本發明的部分實施方式中,無機酸包含有磷酸、硝酸和鹽酸中的至少一種。In some embodiments of the present invention, the inorganic acid includes at least one of phosphoric acid, nitric acid, and hydrochloric acid.
於本發明的部分實施方式中,金屬緩蝕劑包含有含氮、含硫或含羥基的、具有表面活性的有機化合物、巰基苯並噻唑、苯並三唑和甲基苯並三唑中的至少一種。In some embodiments of the present invention, the metal corrosion inhibitor includes nitrogen-containing, sulfur-containing or hydroxyl-containing organic compounds with surface activity, mercaptobenzothiazole, benzotriazole and tolyltriazole. At least one.
於本發明的部分實施方式中,安定劑包含有乙二胺四乙酸、二乙烯三胺五乙酸、羥乙基乙二胺三乙酸、二乙胺五乙酸、N-羥乙基乙二胺三乙酸和聚丙烯酸胺中的至少一種。In some embodiments of the present invention, the stabilizer includes ethylenediaminetetraacetic acid, diethylenetriaminepentaacetic acid, hydroxyethylethylenediaminetriacetic acid, diethylaminepentaacetic acid, and N-hydroxyethylethylenediaminetriacetic acid. At least one of acetic acid and polyacrylamide.
根據本發明的部分實施方式,一種蝕刻液,用於進行一圖案化步驟,包括:0.01-50 wt%的雙氧水、0.1-10 wt%的金屬緩蝕劑、0.1-10 wt%的安定劑以及餘量的溶劑。According to some embodiments of the present invention, an etching solution for performing a patterning step includes: 0.01-50 wt% hydrogen peroxide, 0.1-10 wt% metal corrosion inhibitor, 0.1-10 wt% stabilizer, and The remainder of the solvent.
根據本發明的部分實施方式,一種觸控面板的製作方法,包含:提供一基板,其中該基板具有一顯示區與一周邊區;設置一金屬層與一金屬奈米線層,其中該金屬奈米線層的一第一部分位於該顯示區,該金屬奈米線層的一第二部分與該金屬層位於該周邊區;及進行一圖案化步驟,其中該圖案化步驟包括使用一蝕刻液該金屬奈米線層進行蝕刻,使用另一蝕刻液對該金屬層進行蝕刻,以將該金屬層形成多個周邊引線並同時將該金屬奈米線層的該第二部分形成多個蝕刻層,其中該蝕刻液包括0.01-50 wt%的雙氧水、0.1-10 wt%的金屬緩蝕劑、0.1-10 wt%的安定劑以及餘量的溶劑。According to some embodiments of the present invention, a method for fabricating a touch panel includes: providing a substrate, wherein the substrate has a display area and a peripheral area; disposing a metal layer and a metal nanowire layer, wherein the metal nano A first portion of the wire layer is located in the display area, a second portion of the metal nanowire layer and the metal layer are located in the peripheral area; and performing a patterning step, wherein the patterning step includes using an etching solution for the metal The nanowire layer is etched, and another etching solution is used to etch the metal layer to form a plurality of peripheral leads on the metal layer and simultaneously form a plurality of etching layers on the second part of the metal nanowire layer, wherein The etching solution includes 0.01-50 wt% hydrogen peroxide, 0.1-10 wt% metal corrosion inhibitor, 0.1-10 wt% stabilizer, and the balance solvent.
以下將以附圖揭露本發明的多個實施方式,為明確說明起見,許多實務上的細節將在以下敘述中一併說明。然而,應瞭解到,這些實務上的細節不應用以限制本發明。也就是說,在本發明部分實施方式中,這些實務上的細節是非必要的。此外,為簡化附圖起見,一些習知慣用的結構與元件在附圖中將以簡單示意的方式為之。Hereinafter, multiple embodiments of the present invention will be disclosed with the accompanying drawings. For clear description, many practical details will be described in the following description. However, it should be understood that these practical details should not be used to limit the present invention. That is to say, in some embodiments of the present invention, these practical details are unnecessary. In addition, in order to simplify the drawings, some conventionally used structures and elements will be shown in the drawings in a simple schematic manner.
關於本文中所使用的“約”、“大約”或“大致”,一般是指數值的誤差或範圍於百分之二十以內,較好地是於百分之十以內,更佳地是於百分之五以內。文中若無明確說明,所提及的數值皆視為近似值,即具有如“約”、“大約”或“大致”所表示的誤差或範圍。Regarding the "about", "approximately" or "approximately" used in this article, the error or range of the index value is generally within 20%, preferably within 10%, and more preferably Within five percent. If there is no clear description in the text, the mentioned values are regarded as approximate values, that is, they have the error or range indicated by "about", "approximately" or "approximately".
本發明提出一種蝕刻液,其成分包括約0.2-40 wt%的雙氧水、約0.2-20 wt%的酸類、約0.1-10 wt%的金屬緩蝕劑、約0.1-10 wt%的安定劑以及餘量的溶劑。通過上述蝕刻液,可利用一次性的蝕刻步驟將第一覆蓋物C1設置於周邊引線120的上表面124,使上下兩層材料不須對位就能將第一覆蓋物C1與周邊引線120成型在預定的位置,故可以達到減少或避免在製程中設置對位元誤差區域的需求,藉以降低周邊區PA的寬度,進而達到顯示器的窄邊框需求。本發明蝕刻液還包括約20wt%-99.9wt%的溶劑。The present invention provides an etching solution, the composition of which includes about 0.2-40 wt% hydrogen peroxide, about 0.2-20 wt% acids, about 0.1-10 wt% metal corrosion inhibitor, about 0.1-10 wt% stabilizer, and The remainder of the solvent. With the above etching solution, the first cover C1 can be disposed on the
本發明還提出一種蝕刻液,其成分包括0.01-50 wt%的雙氧水、0.1-10 wt%的金屬緩蝕劑、0.1-10 wt%的安定劑以及餘量的溶劑。上述蝕刻液,只選擇性蝕刻金屬奈米線層NWL,而不蝕刻金屬層ML,利用分步驟蝕刻將第一覆蓋物C1設置於周邊引線120的上表面124,使上下兩層材料不須對位就能將第一覆蓋物C1與周邊引線120成型在預定的位置,故可以達到減少或避免在製程中設置對位元誤差區域的需求,藉以降低周邊區PA的寬度,進而達到顯示器的窄邊框需求。本發明蝕刻液還包括約30wt%-99.9wt%的溶劑。The present invention also provides an etching solution, the composition of which includes 0.01-50 wt% hydrogen peroxide, 0.1-10 wt% metal corrosion inhibitor, 0.1-10 wt% stabilizer, and the balance solvent. The above-mentioned etching solution selectively etches the metal nanowire layer NWL instead of the metal layer ML. The first cover C1 is arranged on the
請先參閱第2圖至第2B圖,其為根據本發明的部分實施方式的觸控面板100的上視示意圖與剖視示意圖。觸控面板100包含基板110、周邊引線120、第一覆蓋物C1、圖案化層PL以及觸控感應電極TE。參閱第2圖,基板110具有顯示區VA與周邊區PA,周邊區PA設置於顯示區VA的側邊,例如周邊區PA則可為設置於顯示區VA的四周(即涵蓋右側、左側、上側及下側)的框型區域,但在其他實施例中,周邊區PA可為一設置於顯示區VA的左側及下側的L型區域。又如第2圖所示,本實施例共有八組周邊引線120以及與周邊引線120相對應的第一覆蓋物C1設置於基板110的周邊區PA;觸控感應電極TE大致設置於基板110的顯示區VA。Please refer to FIGS. 2 to 2B first, which are schematic top views and schematic cross-sectional views of the
觸控面板100還包含標記140以及第二覆蓋物C2,參閱第2圖,本實施例具有兩組標記140以及與標記140相對應的第二覆蓋物C2設置於基板110的周邊區PA。上述的周邊引線120、標記140、第一覆蓋物C1、第二覆蓋物C2以及觸控感應電極TE的數量可為一或多個,而以下各具體實施例及附圖中所繪製的數量僅為解說之用,並未限制本發明。The
具體而言,請參閱第1A圖至第1C圖,本發明的實施方式中的觸控面板100可依以下方式製作:首先提供基板110,其上具有事先定義的周邊區PA與顯示區VA。接著,形成金屬層ML於周邊區PA (如第1A圖);接著形成金屬奈米線(metal nanowires)層NWL於周邊區PA與顯示區VA(如第1B圖);接著形成圖案化層PL於金屬奈米線層NWL上(如第1C圖);接著依據圖案化層PL進行圖案化,以形成具有圖樣的金屬層ML與金屬奈米線層NWL。以下進行更詳細的說明。Specifically, referring to FIGS. 1A to 1C, the
請參閱第1A圖,形成金屬層ML於基板110的周邊區PA,金屬層ML可經過後續的圖案化而成為周邊引線120。詳細而言,本發明的部分實施方式中金屬層ML可為導電性較佳的金屬所構成,較佳為單層金屬結構,例如銀層、銅層等;或為多層導電結構,例如鉬/鋁/鉬、銅/鎳、鈦/鋁/鈦、鉬/鉻等,上述金屬結構較佳的為不透光,例如可見光(如波長介於400nm-700nm)的光穿透率(Transmission)小於約90%。Referring to FIG. 1A, a metal layer ML is formed on the peripheral area PA of the
在本實施例中,可利用濺鍍方式(例如但不限於物理濺鍍、化學濺鍍等)將前述金屬形成於基板110上。金屬層ML可直接選擇性的成形於周邊區PA而不成形於顯示區VA,或是先整面的形成於周邊區PA與顯示區VA,再通過蝕刻等步驟移除位於顯示區VA的金屬層ML。In this embodiment, the aforementioned metal can be formed on the
在一實施例中,以化學鍍的方式將銅層沉積於基板110的周邊區PA,化學鍍即在無外加電流的情況下借助合適的還原劑,使鍍液中金屬離子在金屬觸媒催化下還原成金屬並鍍覆於其表面,此過程稱之為無電鍍(electroless plating)也稱為化學鍍(chemical plating)或自身催化鍍(autocatalytic plating),是故,本實施例的金屬層ML亦可稱作無電鍍層、化學鍍層或自身催化鍍層。具體而言,可採用例如主成分為硫酸銅的鍍液,其組成可為但不限於:濃度為5g/L的硫酸銅 (copper sulfate),濃度為12g/L的乙二胺四乙酸 (ethylenediaminetetraacetic acid),濃度為5g/L的甲醛 (formaldehyde),無電鍍銅鍍液的pH以氫氧化鈉(sodium hydroxide)調整為約11至13,鍍浴溫度為約50至70℃,浸泡的反應時間為1至5分鐘。在一實施例中,可先形成催化層(圖未示)於基板110的周邊區PA上,由於顯示區VA中並無催化層,故銅層僅沉積於周邊區PA而不成形於顯示區VA。在進行無電鍍的反應時,銅材料可在具有催化/活化能力的催化層上成核,而後靠銅的自我催化繼續成長銅膜。In one embodiment, the copper layer is deposited on the peripheral area PA of the
接著,請參閱第1B圖,將至少包括金屬奈米線的金屬奈米線層NWL,例如奈米銀線(silver nanowires)層、奈米金線(gold nanowires)層或奈米銅線(copper nanowires)層塗布於周邊區PA與顯示區VA;金屬奈米線層NWL的第一部分是位元在顯示區VA,第一部分主要成形於基板110上,而在周邊區PA的第二部分則主要成形於金屬層ML上。在本實施例的具體作法為:將具有金屬奈米線的分散液或漿料(ink)以塗布方法成型於基板110上,並加以乾燥使金屬奈米線覆著於基板110及前述金屬層ML的表面,進而成型為設置於基板110及前述金屬層ML上的金屬奈米線層NWL。而在上述的固化/乾燥步驟之後,溶劑等物質被揮發,而金屬奈米線以隨機的方式分佈於基板110及前述金屬層ML的表面;較佳的,金屬奈米線會固著於基板110及前述金屬層ML的表面上而不至脫落而形成所述的金屬奈米線層NWL,且金屬奈米線可彼此接觸以提供連續電流路徑,進而形成一導電網路(conductive network)。Next, referring to Figure 1B, the metal nanowire layer NWL including at least metal nanowires, such as silver nanowires layer, gold nanowires layer, or copper nanowires nanowires) layer is coated on the peripheral area PA and the display area VA; the first part of the metal nanowire layer NWL is located in the display area VA, the first part is mainly formed on the
在本發明的實施例中,上述分散液可為水、醇、酮、醚、烴或芳族溶劑(苯、甲苯、二甲苯等等);上述分散液亦可包含添加劑、介面活性劑或黏合劑,例如羧甲基纖維素(carboxymethyl cellulose;CMC)、2-羥乙基纖維素(hydroxyethyl Cellulose;HEC)、羥基丙基甲基纖維素(hydroxypropyl methylcellulose;HPMC) 、磺酸酯、硫酸酯、二磺酸鹽、磺基琥珀酸酯、磷酸酯或含氟介面活性劑等等。而所述的含有金屬奈米線的分散液或漿料可以用任何方式成型於基板110及前述金屬層ML的表面,例如但不限於:網版印刷、噴頭塗布、滾輪塗布等工藝;在一種實施例中,可採用卷對卷(roll to roll;RTR)工藝將含有金屬奈米線的分散液或漿料塗布於連續供應的基板110及前述金屬層ML的表面。In the embodiment of the present invention, the above-mentioned dispersion liquid may be water, alcohol, ketone, ether, hydrocarbon or aromatic solvent (benzene, toluene, xylene, etc.); the above-mentioned dispersion liquid may also contain additives, surfactants or bonding agents. Agents, such as carboxymethyl cellulose (CMC), 2-hydroxyethyl cellulose (hydroxyethyl Cellulose; HEC), hydroxypropyl methylcellulose (HPMC), sulfonate, sulfate, Disulfonate, sulfosuccinate, phosphate or fluorine-containing interfacial active agent, etc. The dispersion or slurry containing metal nanowires can be formed on the surface of the
本文所用的“金屬奈米線(metal nanowires)”為一集合名詞,其指包含多個元素金屬、金屬合金或金屬化合物(包括金屬氧化物)的金屬線的集合,其中所含金屬奈米線的數量,並不影響本發明所主張的保護範圍;且單一金屬奈米線的至少一個截面尺寸(即截面的直徑)小於約500 nm,較佳小於約100 nm,且更佳小於約50 nm;而本發明所稱的為“線(wire)”的金屬奈米結構,主要具有高的縱橫比,例如介於約10至 100,000之間,更詳細的說,金屬奈米線的縱橫比(長度:截面的直徑)可大於約10,較佳大於約50,且更佳大於約100;金屬奈米線可以為任何金屬,包括(但不限於)銀、金、銅、鎳及鍍金的銀。而其他用語,諸如絲(silk)、纖維(fiber)、管(tube)等若同樣具有上述的尺寸及高縱橫比,亦為本發明所涵蓋的範疇。As used herein, "metal nanowires" is a collective term that refers to a collection of metal wires containing multiple element metals, metal alloys or metal compounds (including metal oxides), which contain metal nanowires. The number does not affect the scope of protection claimed by the present invention; and at least one cross-sectional dimension (ie the diameter of the cross-section) of a single metal nanowire is less than about 500 nm, preferably less than about 100 nm, and more preferably less than about 50 nm ; And the metal nanostructure called "wire" in the present invention mainly has a high aspect ratio, such as between about 10 and 100,000. In more detail, the aspect ratio of the metal nanowire ( Length: the diameter of the section) can be greater than about 10, preferably greater than about 50, and more preferably greater than about 100; the metal nanowire can be any metal, including (but not limited to) silver, gold, copper, nickel, and gold-plated silver . Other terms, such as silk, fiber, tube, etc., if they also have the above-mentioned size and high aspect ratio, are also covered by the present invention.
接著,請參閱第1C圖,形成圖案化層PL於金屬奈米線層NWL上。在一實施例中,圖案化層PL是利用柔版印刷(flexography)技術將材料直接以具有圖案的結構成型於金屬奈米線層NWL上;換言之,圖案化層PL在成型於工作面(在本實施例即為金屬奈米線層NWL)上的同時就已經具有特定的圖樣,故不需針對塗布後的材料進行圖形化步驟。根據本發明的一或多個具體實例,圖案化層PL是利用凸版印刷、凹版印刷或網版印刷等將待印刷材料依照特定圖樣轉移至金屬奈米線層NWL上。依據前述方法所製作的圖案化層PL可具有印刷側面,有別於傳統的經過曝光顯影或蝕刻等製程所處理成型的側面。在一實施例中,可利用光阻、乾膜等以黃光微影、蝕刻工藝製作圖案化層PL。Next, referring to FIG. 1C, a patterned layer PL is formed on the metal nanowire layer NWL. In one embodiment, the patterned layer PL is formed on the metal nanowire layer NWL in a patterned structure using flexography technology; in other words, the patterned layer PL is formed on the working surface (in In this embodiment, the metal nanowire layer (NWL) already has a specific pattern at the same time, so there is no need to perform a patterning step for the coated material. According to one or more specific examples of the present invention, the patterned layer PL uses relief printing, gravure printing, or screen printing to transfer the material to be printed onto the metal nanowire layer NWL according to a specific pattern. The patterned layer PL produced according to the foregoing method may have a printed side surface, which is different from the side surface that is processed and formed through traditional processes such as exposure, development or etching. In one embodiment, photoresist, dry film, etc. can be used to fabricate the patterned layer PL by yellow light lithography and etching processes.
圖案化層PL可依前述方法形成於周邊區PA,亦可形成於周邊區PA與顯示區VA。位於周邊區PA的圖案化層PL(亦稱第二圖案化層)主要做於周邊區PA的蝕刻遮罩,以用於後述步驟中將周邊區PA的金屬奈米線層NWL與金屬層ML進行圖案化,而位於顯示區VA的圖案化層PL(亦稱第一圖案化層)主要做於顯示區VA的蝕刻遮罩,以用於後述步驟中將顯示區VA的金屬奈米線層NWL進行圖案化。The patterned layer PL can be formed in the peripheral area PA according to the aforementioned method, and can also be formed in the peripheral area PA and the display area VA. The patterned layer PL (also referred to as the second patterned layer) located in the peripheral area PA is mainly used as an etching mask in the peripheral area PA to be used to combine the metal nanowire layer NWL and the metal layer ML in the peripheral area PA in the following steps For patterning, the patterned layer PL (also known as the first patterned layer) located in the display area VA is mainly used as an etching mask in the display area VA for the metal nanowire layer in the display area VA in the following steps NWL is patterned.
本發明實施例並不限制圖案化層PL的材料(即前述的待印刷材料),例如高分子材料包含以下:各類光阻材料、底塗層材料、外塗層材料、保護層材料、絕緣層材料等,而所述高分子材料可為酚醛樹酯、環氧樹酯、壓克力樹酯、PU樹酯、ABS樹酯、胺基樹酯、矽脂樹酯等。而以材料特性而言,圖案化層PL的材料可為光固化型或熱固化型。在一實施例中,圖案化層PL的材料的黏度約200-1500cps,固含量約30-100%。The embodiment of the present invention does not limit the material of the patterned layer PL (that is, the aforementioned material to be printed). For example, the polymer material includes the following: various photoresist materials, undercoating materials, outer coating materials, protective layer materials, and insulating materials. Layer materials, etc., and the polymer material can be phenolic resin, epoxy resin, acrylic resin, PU resin, ABS resin, amino resin, silicone resin, etc. In terms of material characteristics, the material of the patterned layer PL may be a photo-curing type or a heat-curing type. In one embodiment, the material of the patterned layer PL has a viscosity of about 200-1500 cps and a solid content of about 30-100%.
接著進行圖案化,在圖案化步驟之後即可製作如第2圖所示的觸控面板100。在一實施例中,在周邊區PA採用可同時蝕刻金屬奈米線層NWL與金屬層ML的蝕刻液,配合圖案化層PL(亦稱第二圖案化層)形成的蝕刻遮罩以在同一工序中製作具有圖樣的金屬層ML與金屬奈米線層NWL。如第2圖、第2B圖所示,在周邊區PA上所製作出的具有圖樣的金屬層ML即為周邊引線120,而具有圖樣的金屬奈米線層NWL即構成蝕刻層,由於本實施例的蝕刻層位於周邊引線120上,故亦可稱作第一覆蓋物C1;換言之,在圖案化步驟之後,周邊區PA形成由金屬奈米線層NWL的第二部分所構成的第一覆蓋物C1以及由金屬層ML所構成的周邊引線120。在另一實施例中,在周邊區PA上可製作出由金屬奈米線層NWL的第二部分所構成的蝕刻層以及由金屬層ML所構成的周邊引線120與標記140 (請參考第2圖、第2A圖及第2B圖),蝕刻層可包括第一覆蓋物C1與第二覆蓋物C2,第一覆蓋物C1設置於對應的周邊引線120上,第二覆蓋物C2設置於對應的標記140上。在一實施例中,可同時蝕刻金屬奈米線層NWL與金屬層ML指的是對金屬奈米線層NWL與金屬層ML蝕刻速率比值介於約0.1-10或0.01-100。Then, patterning is performed, and after the patterning step, the
根據一具體實施例,金屬奈米線層NWL為奈米銀層,金屬層ML為銅層的情況下,蝕刻液可用於蝕刻銅與銀,例如蝕刻液的成分包括雙氧水,例如約1.0-2.0、5.0-10.0、20.0-40.0或1.0-10.0 wt%;酸類,例如約1.0-5.0、1.0-20.0或0.1-10.0 wt%;金屬緩蝕劑,例如約0.1-10.0、1.0-10.0或2.0-7.0 wt%;安定劑,例如約0.1-10.0、1.0-10.0或3.0-8.0 wt%;以及餘量的溶劑。酸類可包含有機酸、無機酸或其組合,其中有機酸可包含有諸如羧酸、二羧酸、三羧酸、烷基羧酸、乙酸、乙二酸、苯六甲酸、甲酸、氯乙酸、苯甲酸、三氟乙酸、丙酸和丁酸等中的至少一種;無機酸可包含有磷酸、硝酸和鹽酸等中的至少一種。金屬緩蝕劑可包含有含氮、含硫或含羥基的、具有表面活性的有機化合物、巰基苯並噻唑、苯並三唑和甲基苯並三唑中的至少一種。安定劑可包含乙二胺四乙酸、二乙烯三胺五乙酸、羥乙基乙二胺三乙酸、二乙胺五乙酸、N-羥乙基乙二胺三乙酸和聚丙烯酸胺中的至少一種。根據一具體實施例,金屬奈米線層NWL為奈米銀層,金屬層ML為化學鍍銅層的情況下,蝕刻液可用於蝕刻銅與銀,例如蝕刻液的成分包括約1.0-10.0 wt%的雙氧水、約1.0-5.0 wt%的酸類、約2.0-7.0 wt%的金屬緩蝕劑、約3.0-8.0 wt%的安定劑以及餘量的溶劑。根據一具體實施例,金屬奈米線層NWL為奈米銀層,金屬層ML為化學鍍銅鎳層的情況下,蝕刻液可用於蝕刻銅鎳與銀,例如蝕刻液的成分包括約0.2-10.0 wt%的雙氧水、約1.0-20.0 wt%的酸類、約2.0-5.0 wt%的金屬緩蝕劑、約3.0-5.0wt%的安定劑以及餘量的溶劑。According to a specific embodiment, when the metal nanowire layer NWL is a nanosilver layer and the metal layer ML is a copper layer, the etching solution can be used to etch copper and silver. For example, the composition of the etching solution includes hydrogen peroxide, such as about 1.0-2.0 , 5.0-10.0, 20.0-40.0, or 1.0-10.0 wt%; acids, such as about 1.0-5.0, 1.0-20.0, or 0.1-10.0 wt%; metal corrosion inhibitors, such as about 0.1-10.0, 1.0-10.0, or 2.0- 7.0 wt%; stabilizer, for example, about 0.1-10.0, 1.0-10.0, or 3.0-8.0 wt%; and the remainder of the solvent. Acids may include organic acids, inorganic acids, or combinations thereof, where organic acids may include such as carboxylic acid, dicarboxylic acid, tricarboxylic acid, alkyl carboxylic acid, acetic acid, oxalic acid, mellitic acid, formic acid, chloroacetic acid, At least one of benzoic acid, trifluoroacetic acid, propionic acid, butyric acid, etc.; the inorganic acid may include at least one of phosphoric acid, nitric acid, hydrochloric acid, and the like. The metal corrosion inhibitor may include at least one of nitrogen-containing, sulfur-containing or hydroxyl-containing organic compounds with surface activity, mercaptobenzothiazole, benzotriazole, and tolyltriazole. The stabilizer may include at least one of ethylenediaminetetraacetic acid, diethylenetriaminepentaacetic acid, hydroxyethylethylenediaminetriacetic acid, diethylaminepentaacetic acid, N-hydroxyethylethylenediaminetriacetic acid, and polyacrylamide . According to a specific embodiment, when the metal nanowire layer NWL is a nanosilver layer and the metal layer ML is an electroless copper plating layer, the etching solution can be used to etch copper and silver. For example, the composition of the etching solution includes about 1.0-10.0 wt % Hydrogen peroxide, about 1.0-5.0 wt% acid, about 2.0-7.0 wt% metal corrosion inhibitor, about 3.0-8.0 wt% stabilizer and the balance solvent. According to a specific embodiment, when the metal nanowire layer NWL is a nanosilver layer and the metal layer ML is an electroless copper-nickel layer, the etching solution can be used to etch copper-nickel and silver. For example, the composition of the etching solution includes about 0.2- 10.0 wt% hydrogen peroxide, about 1.0-20.0 wt% acids, about 2.0-5.0 wt% metal corrosion inhibitors, about 3.0-5.0 wt% stabilizers, and the balance solvent.
在圖案化的步驟中,還可包括:同時進行在顯示區VA的金屬奈米線層NWL圖案化。換言之,如第1C圖所示,可配合圖案化層PL(亦即第一圖案化層)形成的蝕刻遮罩,利用前述的蝕刻液將顯示區VA的金屬奈米線層NWL的第一部分進行圖案化以製作本實施例的觸控感應電極TE於顯示區VA,觸控感應電極TE可電性連接周邊引線120。具體而言,觸控感應電極TE同樣可為至少包括金屬奈米線的金屬奈米線層,也就是說,圖案化之後的金屬奈米線層NWL在顯示區VA形成觸控感應電極TE,而在周邊區PA形成第一覆蓋物C1,故觸控感應電極TE可通過第一覆蓋物C1與周邊引線120的接觸而達到與周邊引線120達成電性連接進行進行信號的傳輸。而金屬奈米線層NWL在周邊區PA也會形成第二覆蓋物C2,其設置於標記140的上表面144,標記140可以廣泛的被解讀為非電性功能的圖樣,但不以此為限。在本發明的部分實施例中,周邊引線120與標記140可為同層的金屬層ML所製作(即兩者為相同的金屬材料,如前述的化學鍍銅層或是濺鍍銅層);觸控感應電極TE、第一覆蓋物C1與第二覆蓋物C2可為同層的金屬奈米線層NWL所製作。In the step of patterning, it may further include: simultaneously performing NWL patterning of the metal nanowire layer in the display area VA. In other words, as shown in Figure 1C, the etching mask formed by the patterned layer PL (that is, the first patterned layer) can be used to perform the first part of the metal nanowire layer NWL in the display area VA with the aforementioned etching solution. Patterning is used to fabricate the touch sensing electrode TE of this embodiment in the display area VA, and the touch sensing electrode TE can be electrically connected to the
在一實施例中,位於顯示區VA的圖案的寬度可在至少100um以上,故前述蝕刻液不會對顯示區VA的金屬奈米線層NWL造成側蝕的問題。In one embodiment, the width of the pattern in the display area VA can be at least 100 um, so the aforementioned etching solution will not cause the problem of side etching on the metal nanowire layer NWL in the display area VA.
而在另一實施例中,進行圖案化步驟時,在周邊區PA則採用具有選擇性的蝕刻液進行分步驟蝕刻,蝕刻液只用於蝕刻金屬奈米線層NWL,而不蝕刻金屬層ML。詳細地,首先使用蝕刻液對周邊區PA及顯示區VA的金屬奈米線層NWL蝕刻,然後使用另一蝕刻液對周邊區PA的金屬層ML進行蝕刻。以此配合圖案化層PL(亦稱第二圖案化層)形成的蝕刻遮罩以在同一工序中製作具有圖樣的金屬層ML與金屬奈米線層NWL。如第2圖、第2B圖所示,在周邊區PA上所製作出的具有圖樣的金屬層ML即為周邊引線120,而具有圖樣的金屬奈米線層NWL即構成蝕刻層,由於本實施例的蝕刻層位於周邊引線120上,故亦可稱作第一覆蓋物C1;換言之,在圖案化步驟之後,周邊區PA形成由金屬奈米線層NWL的第二部分所構成的第一覆蓋物C1以及由金屬層ML所構成的周邊引線120。在另一實施例中,在周邊區PA上可製作出由金屬奈米線層NWL的第二部分所構成的蝕刻層以及由金屬層ML所構成的周邊引線120與標記140 (請參考第2圖、第2A圖及第2B圖),蝕刻層可包括第一覆蓋物C1與第二覆蓋物C2,第一覆蓋物C1設置於對應的周邊引線120上,第二覆蓋物C2設置於對應的標記140上。In another embodiment, when the patterning step is performed, a selective etching solution is used to perform step-by-step etching in the peripheral area PA. The etching solution is only used to etch the metal nanowire layer NWL, and not the metal layer ML. . In detail, first, the metal nanowire layer NWL of the peripheral area PA and the display area VA is etched with an etching solution, and then another etching solution is used to etch the metal layer ML of the peripheral area PA. In this way, the etching mask formed by the patterned layer PL (also called the second patterned layer) is used to produce the patterned metal layer ML and the metal nanowire layer NWL in the same process. As shown in Figures 2 and 2B, the patterned metal layer ML formed on the peripheral area PA is the
根據另一具體實施例,金屬奈米線層NWL為奈米銀層,金屬層ML為銅層的情況下,蝕刻液只用於蝕刻銀,而不蝕刻銅,例如蝕刻液的成分包括0.01-50 wt%的雙氧水、0.1-10 wt%的金屬緩蝕劑、0.1-10 wt%的安定劑以及餘量的溶劑。金屬緩蝕劑可包含有含氮、含硫或含羥基的、具有表面活性的有機化合物、巰基苯並噻唑、苯並三唑和甲基苯並三唑中的至少一種。安定劑可包含乙二胺四乙酸、二乙烯三胺五乙酸、羥乙基乙二胺三乙酸、二乙胺五乙酸、N-羥乙基乙二胺三乙酸和聚丙烯酸胺中的至少一種。According to another specific embodiment, when the metal nanowire layer NWL is a nanosilver layer and the metal layer ML is a copper layer, the etching solution is only used to etch silver and not copper. For example, the composition of the etching solution includes 0.01- 50 wt% hydrogen peroxide, 0.1-10 wt% metal corrosion inhibitor, 0.1-10 wt% stabilizer and the balance solvent. The metal corrosion inhibitor may include at least one of nitrogen-containing, sulfur-containing or hydroxyl-containing organic compounds with surface activity, mercaptobenzothiazole, benzotriazole, and tolyltriazole. The stabilizer may include at least one of ethylenediaminetetraacetic acid, diethylenetriaminepentaacetic acid, hydroxyethylethylenediaminetriacetic acid, diethylaminepentaacetic acid, N-hydroxyethylethylenediaminetriacetic acid, and polyacrylamide .
由於前述蝕刻液不會蝕刻金屬層ML,從而避免了周邊區PA及顯示區VA的金屬奈米線層NWL蝕刻不完全或對周邊區PA的金屬層ML造成側蝕的問題。Since the aforementioned etching solution does not etch the metal layer ML, the problem of incomplete etching of the metal nanowire layer NWL in the peripheral area PA and the display area VA or side etching of the metal layer ML in the peripheral area PA is avoided.
在圖案化的步驟之後,還可包括:移除圖案化層PL。After the step of patterning, the method may further include: removing the patterned layer PL.
此外,在前述蝕刻步驟之前或之後可塗布膜層與金屬奈米線層NWL (例如第一覆蓋物C1、第二覆蓋物C2或觸控感應電極TE)形成複合結構而具有某些特定的化學、機械及光學特性,例如提供觸控感應電極TE、第一覆蓋物C1、第二覆蓋物C2與基板110的黏著性,或是較佳的實體機械強度,故膜層又可被稱作基質(matrix)。又一方面,使用某些特定的聚合物製作膜層,使觸控感應電極TE、第一覆蓋物C1、第二覆蓋物C2具有額外的抗刮擦及磨損的表面保護,在此情形下,膜層又可被稱作外塗層(overcoat),採用諸如聚丙烯酸酯、環氧樹脂、聚胺基甲酸酯、聚矽烷、聚矽氧、聚(矽-丙烯酸)等可使觸控感應電極TE、第一覆蓋物C1、第二覆蓋物C2具有較高的表面強度以提高耐刮能力。然而,上述僅是說明膜層的其他附加功能/名稱的可能性,並非用於限制本發明。值得說明的是,在一實施例中,用於製作膜層的聚合物在未固化前或在預固化的狀態下可以滲入金屬奈米線之間而形成填充物,當聚合物固化後,金屬奈米線會嵌入膜層之中。也就是說,本發明不限定膜層與金屬奈米線層NWL(例如第一覆蓋物C1、第二覆蓋物C2或觸控感應電極TE)之間的結構。In addition, the film layer and the metal nanowire layer NWL (such as the first cover C1, the second cover C2 or the touch sensing electrode TE) can be coated before or after the aforementioned etching step to form a composite structure with certain specific chemistry. , Mechanical and optical properties, such as providing the touch sensing electrode TE, the adhesion of the first cover C1, the second cover C2 and the
在一實施例中,膜層可為一種光固化材料,其具高透光性、低介電常數、低霧度,以維持顯示區VA的觸控感應電極TE穿透度介於約88%-94%,霧度介於約0-2,面電阻介於約10-150歐姆/平方(ohm/square),上述膜層的光電特性使得膜層與金屬奈米線層NWL的組合符合於顯示區VA的光學及觸控感測的要求。例如,所述複合結構的可見光(如波長介於約400nm-700nm)的光穿透率(Transmission)可大於約80%,且表面電阻率(surface resistance)在約10 至 1000歐姆/平方(ohm/square)之間;較佳地,複合結構的可見光(例如波長介於約400nm-700nm)的光穿透率(Transmission)大於約 85%,且表面電阻率(surface resistance)在約50 至 500歐姆/平方(ohm/square)之間。在本實施方式中,還可包含一固化步驟(例如UV curing)。In one embodiment, the film layer may be a photocurable material with high light transmittance, low dielectric constant, and low haze, so as to maintain the TE penetration of the touch sensing electrode in the display area VA at about 88% -94%, haze is about 0-2, sheet resistance is about 10-150 ohm/square (ohm/square). The photoelectric properties of the above film make the combination of film and metal nanowire layer NWL consistent with The optical and touch sensing requirements of the display area VA. For example, the light transmittance (Transmission) of the visible light (such as the wavelength between about 400nm-700nm) of the composite structure may be greater than about 80%, and the surface resistance (surface resistance) is about 10 to 1000 ohms/square (ohm /square); preferably, the visible light (for example, the wavelength is between about 400nm-700nm) of the composite structure has a light transmittance (Transmission) greater than about 85%, and a surface resistance (surface resistance) of about 50 to 500 Between ohm/square. In this embodiment, a curing step (such as UV curing) may also be included.
第2圖顯示根據本發明的實施方式的觸控面板100的上視示意圖,第2A圖及第2B圖分別為第2圖的A-A線與B-B線的剖面圖。請先參閱第2A圖,如第2A圖所示,周邊引線120與標記140均設置於周邊區PA,第一覆蓋物C1、第二覆蓋物C2分別成型且覆蓋周邊引線120的上表面124與標記140的上表面144。而在本發明的部分實施方式中,金屬奈米線可為奈米銀線。為了方便說明,本文的周邊引線120與標記140的剖面是為一四邊形(例如第2A圖所繪製的長方形),但周邊引線120的側面122與上表面124、與標記140的側面142與上表面144的結構型態或數量皆可依實際應用而變化,並非以本文的文字與附圖所限制。FIG. 2 shows a schematic top view of the
在本實施例中,標記140是設置在周邊區PA的接合區BA,其為對接對位元標記,也就是在將一外部電路板,如在軟性電路板170連接於觸控面板100的步驟(即bonding步驟)用於將軟性電路板170與觸控面板100進行對位元的記號(請配合第2圖)。然而,本發明並不限制標記140的置放位置或功能,例如標記140可以是任何在製程中所需的檢查記號、圖樣或標號,均為本發明保護的範疇。標記140可以具有任何可能的形狀,如圓形、四邊形、十字形、L形、T形等等。另一方面,周邊引線120延伸至接合區BA的部分又可被稱作連接部(bonding section),同於前述實施例,在接合區BA的連接部的上表面同樣被第一覆蓋物C1所覆蓋。In this embodiment, the
如第2A圖及第2B圖所示,在周邊區PA中,相鄰周邊引線120之間具有非導電區域136,以電性阻絕相鄰周邊引線120進而避免短路。也就是說,相鄰周邊引線120的側面122之間具有非導電區域136,而在本實施例中,非導電區域136為一間隙(gap),以隔絕相鄰周邊引線120。而利用圖案化層PL,可採用前述蝕刻液製作上述的間隙,故周邊引線120的側面122與第一覆蓋物C1的側面C1L為一共同蝕刻面,且相互對齊,也就是說利用圖案化層PL作為基準,周邊引線120的側面122與第一覆蓋物C1的側面C1L是在同一個蝕刻步驟中依據圖案化層PL的印刷側面所成型,故印刷側面與共同蝕刻面相互對齊;類似的,標記140的側面142與第二覆蓋物C2的側面C2L為一共同蝕刻面,且相互對齊,且圖案化層PL的印刷側面同樣與共同蝕刻面相互對齊。在一實施例中,第一覆蓋物C1的側面C1L與第二覆蓋物C2的側面C2L會因上述的蝕刻步驟而不會有所述的金屬奈米線存在於其上。再者,圖案化層PL、周邊引線120及第一覆蓋物C1會具有相同或近似的圖樣與尺寸,如均為長直狀等的圖樣,且寬度相同或近似;圖案化層PL、標記140與第二覆蓋物C2也同樣具有相同或近似的圖樣與尺寸,如均為半徑相同或近似的圓形、邊長相同或近似的四邊形等,或其他相同或近似的十字形、L形、T形等的圖樣。As shown in FIGS. 2A and 2B, in the peripheral area PA, there is a
如第2B圖所示,在顯示區VA中,相鄰觸控感應電極TE之間具有非導電區域136,以電性阻絕相鄰觸控感應電極TE進而避免短路。也就是說,相鄰觸控感應電極TE的側壁之間具有非導電區域136,而在本實施例中,非導電區域136為一間隙(gap),以隔絕相鄰觸控感應電極TE;在一實施例中,可採用上述的蝕刻法制作相鄰觸控感應電極TE之間的間隙。在本實施例中,觸控感應電極TE與第一覆蓋物C1可利用同層的金屬奈米線層NWL(如奈米銀線層,或奈米銀線層與膜層所形成的複合層)所製作,故在顯示區VA與周邊區PA的交界處,金屬奈米線層NWL會形成一爬坡結構,以利金屬奈米線層NWL成形並覆蓋周邊引線120的上表面124,而形成所述的第一覆蓋物C1。As shown in FIG. 2B, in the display area VA, there is a
本發明的部分實施方式中,觸控面板100的第一覆蓋物C1設置於周邊引線120的上表面124,第一覆蓋物C1及周邊引線120並在同一蝕刻製程中成型,故可以達到減少或避免在製程中設置對位元誤差區域的需求,藉以降低周邊區PA的寬度,進而達到顯示器的窄邊框需求;且本發明提出的蝕刻液可以同時針對不同區域的材料層,如周邊區PA的金屬/奈米銀與顯示區VA的奈米銀刻蝕出線路,並且有良好直線性以及側蝕量(CD bias)控制,以及不殘留材料於非導電區域136中。具體而言,本發明部分實施方式的觸控面板100的周邊引線120的寬度為約5um至30um,相鄰周邊引線120之間的距離為約5um至30um,或者觸控面板100的周邊引線120的寬度為約3um至20um,相鄰周邊引線120之間的距離為約3um至20um,而周邊區PA的寬度也可以達到約小於2mm的尺寸,較傳統的觸控面板產品縮減約20%或更多的邊框尺寸。In some embodiments of the present invention, the first cover C1 of the
本發明的部分實施方式中,觸控面板100還具有第二覆蓋物C2與標記140,第二覆蓋物C2設置於標記140的上表面144,第二覆蓋物C2與標記140並在同一蝕刻製程中成型。In some embodiments of the present invention, the
第3圖則顯示軟性電路板170與觸控面板100進行對位元後的組裝結構,其中軟性電路板170的電極墊(未繪示)可通過導電膠(未繪示,例如異方性導電膠)電性連接位於基板110上的接合區BA的周邊引線120。於部分實施方式中,位於接合區BA的第一覆蓋物C1可以開設開口(未繪示),而露出周邊引線120,導電膠(例如異方性導電膠)可填入第一覆蓋物C1的開口而直接接觸周邊引線120而形成導電通路。本實施方式中,觸控感應電極TE以非交錯式的排列設置。舉例而言,觸控感應電極TE為沿第一方向D1延伸且在第二方向D2上具有寬度變化的長條型電極,彼此並不產生交錯,但於其他實施方式中,觸控感應電極TE可以具有適當的形狀,而不應以此限制本發明的範圍。本實施方式中,觸控感應電極TE採用單層的配置,其中可以通過檢測各個觸控感應電極TE的自身的電容值變化,而得到觸控位置。Figure 3 shows the assembly structure of the
本發明亦可將上述方法應用於基板110的雙面以製作的雙面型態的觸控面板100,例如可依以下方式製作:首先提供基板110,其上具有事先定義的周邊區PA與顯示區VA。接著,於基板110的相對的第一與第二表面(如上表面與下表面)形成金屬層ML,且金屬層ML位於周邊區PA;接著分別形成金屬奈米線(metal nanowires)層NWL於第一與第二表面的周邊區PA與顯示區VA;接著分別形成圖案化層PL於第一與第二表面的金屬奈米線層NWL上;接著依據圖案化層PL利用前述蝕刻液進行第一與第二表面的圖案化步驟,以在第一與第二表面形成上述觸控感應電極TE與周邊引線120,且第一覆蓋物C1會覆蓋於周邊引線120,如第4圖。本實施例的具體實施方式(例如蝕刻液的組成參數)可參照前文,於此不再贅述。The present invention can also apply the above method to both sides of the
根據本發明的一些實施方式另提出一種雙面觸控面板,其製作方法可為將兩組單面式的觸控面板以同方向或反方向疊合所形成。以反方向疊合為例說明,可將第一組單面式的觸控面板的觸控電極朝上設置(例如最接近使用者,但不以此為限),第二組單面式的觸控面板的觸控電極則朝下設置(例如最遠離使用者,但不以此為限),而以光學膠或其他類似黏合劑將兩組觸控面板的基板組裝固定,藉以組成雙面型態的觸控面板。本實施例的具體實施方式(例如蝕刻液的組成參數)可參照前文,於此不再贅述。According to some embodiments of the present invention, a double-sided touch panel is further proposed. The manufacturing method of the double-sided touch panel can be formed by stacking two sets of single-sided touch panels in the same direction or in the opposite direction. Taking reverse direction stacking as an example, the touch electrodes of the first group of single-sided touch panels can be set up (for example, closest to the user, but not limited to this), and the second group of single-sided touch panels The touch electrodes of the touch panel are arranged downwards (for example, farthest away from the user, but not limited to this), and the two sets of touch panel substrates are assembled and fixed with optical glue or other similar adhesives to form a double-sided Type of touch panel. The specific implementation of this embodiment (for example, the composition parameters of the etching solution) can refer to the foregoing, and will not be repeated here.
第5圖即為本發明實施例的觸控面板100,其包含基板110、在基板110的上下兩表面所形成的觸控感應電極TE(即金屬奈米線層NWL所形成的第一觸控感應電極TE1及第二觸控感應電極TE2)及在基板110的上下表面所形成的周邊引線120;為了附圖的簡潔,第5圖未標示出第一、第二覆蓋物C1、C2。以基板110的上表面觀之,顯示區VA的第一觸控感應電極TE1與周邊區PA的周邊引線120會彼此電性連接以傳遞信號;類似的,以基板110的下表面觀之,顯示區VA的第二觸控感應電極TE2與周邊區PA的周邊引線120會彼此電性連接以傳遞信號。另外,第一觸控感應電極TE1及第二觸控感應電極TE2交錯成型;周邊引線120由金屬層ML構成,其上成形有第一覆蓋物C1(同樣如第5A圖所示)。本實施例還可具有標記140以及與標記140相對應的第二覆蓋物C2設置於基板110的周邊區PA,具體可參照前文內容。Figure 5 is a
請參閱第5圖並配合第5A圖所顯示的剖視圖,在一實施例中,第一觸控感應電極TE1大致位於顯示區VA,其可包含多個沿同一方向(如第一方向D1)延伸的長直條狀的感應電極,而採用前述蝕刻液所去除的區域則可被定義為非導電區域136,以電性阻絕相鄰的感應電極。相似的,第二觸控感應電極TE2大致位於顯示區VA,其可包含多個沿同一方向(如第二方向D2)延伸的長直條狀的感應電極,而去除區則可被定義為非導電區域136,以電性阻絕相鄰的感應電極。第一觸控感應電極TE1及第二觸控感應電極TE2在結構上相互交錯,兩者可組成觸控感應電極TE,以用感應觸碰或控制手勢等。Please refer to FIG. 5 in conjunction with the cross-sectional view shown in FIG. 5A. In one embodiment, the first touch sensing electrode TE1 is substantially located in the display area VA, and it may include a plurality of electrodes extending in the same direction (such as the first direction D1) The long and straight sensing electrode, and the area removed by the aforementioned etching solution can be defined as a
請參閱第6A圖至第6C圖,本發明的另一實施方式中的觸控面板可依以下方式製作:首先提供基板110,其上具有事先定義的周邊區PA與顯示區VA。接著,形成金屬奈米線(metal nanowires)層NWL於周邊區PA與顯示區VA;接著形成金屬層ML於周邊區PA(如第6A圖);接著形成圖案化層PL於金屬奈米線層NWL上(如第6B圖);接著依據圖案化層PL進行圖案化,以形成具有圖樣的金屬層ML與金屬奈米線層NWL(如第6C圖)。本實施例與前述實施例的差異至少在於金屬層ML與金屬奈米線層NWL的成型順序,換言之,本實施例先製作金屬奈米線層NWL,再接著製作金屬層ML。本步驟的具體實施方式可參照前文,例如,通過蝕刻等步驟將圖案化層PL的圖樣轉移至金屬層ML與金屬奈米線層NWL。Referring to FIGS. 6A to 6C, the touch panel in another embodiment of the present invention can be manufactured in the following manner: first, a
本實施例同樣可利用蝕刻液用於蝕刻銅(即金屬層ML)與銀奈米線層(即金屬奈米線層NWL),例如蝕刻液的成分包括雙氧水,例如約1.0-2.0、5.0-10.0、20.0-40.0或1.0-5.0 wt%;酸類,例如約0.1-0.6、1.0-5.0、1.0-20.0或0.1-10.0 wt%;金屬緩蝕劑,例如約0.1-10.0、1.0-10.0或2.0-7.0 wt%;安定劑,例如約0.1-10.0、1.0-10.0或3.0-8.0 wt%;以及餘量的溶劑。酸類可包含有機酸、無機酸或其組合,其中有機酸可包含有諸如羧酸、二羧酸、三羧酸、烷基羧酸、乙酸、乙二酸、苯六甲酸、甲酸、氯乙酸、苯甲酸、三氟乙酸、丙酸和丁酸等中的至少一種;無機酸可包含有磷酸、硝酸和鹽酸等中的至少一種。金屬緩蝕劑可包含有含氮、含硫或含羥基的、具有表面活性的有機化合物、巰基苯並噻唑、苯並三唑和甲基苯並三唑中的至少一種。安定劑可包含乙二胺四乙酸、二乙烯三胺五乙酸、羥乙基乙二胺三乙酸、二乙胺五乙酸、N-羥乙基乙二胺三乙酸和聚丙烯酸胺中的至少一種。根據一具體實施例,金屬奈米線層NWL為奈米銀層,金屬層ML為化學鍍銅層的情況下,蝕刻液可用於蝕刻銅與銀,例如蝕刻液的成分包括約1.0-5.0 wt%的雙氧水、約0.1-0.6 wt%的酸類、約2.0-7.0 wt%的金屬緩蝕劑、約3.0-8.0 wt%的安定劑以及餘量的溶劑。根據一具體實施例,金屬奈米線層NWL為奈米銀層,金屬層ML為化學鍍銅鎳層的情況下,蝕刻液可用於蝕刻銅鎳與銀,例如蝕刻液的成分包括約0.2-10.0 wt%的雙氧水、約0.1-10.0 wt%的酸類、約2.0-5.0 wt%的金屬緩蝕劑、約3.0-5.0wt%的安定劑以及餘量的溶劑。In this embodiment, the etching solution can also be used to etch copper (ie, metal layer ML) and silver nanowire layer (ie, metal nanowire layer NWL). For example, the composition of the etching solution includes hydrogen peroxide, such as about 1.0-2.0, 5.0- 10.0, 20.0-40.0, or 1.0-5.0 wt%; acids, such as about 0.1-0.6, 1.0-5.0, 1.0-20.0, or 0.1-10.0 wt%; metal corrosion inhibitors, such as about 0.1-10.0, 1.0-10.0 or 2.0 -7.0 wt%; stabilizer, for example, about 0.1-10.0, 1.0-10.0, or 3.0-8.0 wt%; and the balance of the solvent. Acids may include organic acids, inorganic acids, or combinations thereof, where organic acids may include such as carboxylic acid, dicarboxylic acid, tricarboxylic acid, alkyl carboxylic acid, acetic acid, oxalic acid, mellitic acid, formic acid, chloroacetic acid, At least one of benzoic acid, trifluoroacetic acid, propionic acid, butyric acid, etc.; the inorganic acid may include at least one of phosphoric acid, nitric acid, hydrochloric acid, and the like. The metal corrosion inhibitor may include at least one of nitrogen-containing, sulfur-containing or hydroxyl-containing organic compounds with surface activity, mercaptobenzothiazole, benzotriazole, and tolyltriazole. The stabilizer may include at least one of ethylenediaminetetraacetic acid, diethylenetriaminepentaacetic acid, hydroxyethylethylenediaminetriacetic acid, diethylaminepentaacetic acid, N-hydroxyethylethylenediaminetriacetic acid, and polyacrylamide . According to a specific embodiment, when the metal nanowire layer NWL is a nanosilver layer and the metal layer ML is an electroless copper plating layer, the etching solution can be used to etch copper and silver. For example, the etching solution includes about 1.0-5.0 wt. % Hydrogen peroxide, about 0.1-0.6 wt% acid, about 2.0-7.0 wt% metal corrosion inhibitor, about 3.0-8.0 wt% stabilizer and the balance solvent. According to a specific embodiment, when the metal nanowire layer NWL is a nanosilver layer and the metal layer ML is an electroless copper-nickel layer, the etching solution can be used to etch copper-nickel and silver. For example, the composition of the etching solution includes about 0.2- 10.0 wt% hydrogen peroxide, about 0.1-10.0 wt% acids, about 2.0-5.0 wt% metal corrosion inhibitors, about 3.0-5.0 wt% stabilizers, and the balance solvent.
圖案化的步驟之後,還包括移除圖案化層PL的步驟。在具體實施例中,可通過有機溶劑或鹼性去膜劑剝除,如:KOH、K2 CO3 、丙二醇甲基醚醋酸酯(Propylene Glycol Methyl Ether Acetate;PGMEA)等。換言之,在上述步驟之後,圖案化層PL會被移除而不殘留於產品的結構中。After the step of patterning, the step of removing the patterned layer PL is further included. In specific embodiments, it can be stripped off by organic solvents or alkaline removers, such as KOH, K 2 CO 3 , Propylene Glycol Methyl Ether Acetate (PGMEA), and the like. In other words, after the above steps, the patterned layer PL will be removed without remaining in the structure of the product.
請參閱第13A圖至第13E圖,在另一實施例中,對於上述先製作金屬奈米線層NWL,再接著製作金屬層ML的情況,觸控面板還能依以下方式製作:首先提供基板110,其上具有事先定義的周邊區PA與顯示區VA。接著,形成金屬奈米線(metal nanowires)層NWL於周邊區PA與顯示區VA。與上述實施例不同的是,接著形成金屬層ML於周邊區PA與顯示區VA (如第13A圖);接著形成圖案化層PL於金屬層ML上(如第13B圖);接著依據圖案化層PL進行圖案化,以形成具有圖樣的金屬層ML與金屬奈米線層NWL。在本實施例中,進行圖案化步驟時,則採用具有選擇性的蝕刻液進行分步驟蝕刻,蝕刻液只用於蝕刻金屬奈米線層NWL,而不蝕刻金屬層ML。詳細地,首先使用另一蝕刻液對周邊區PA及顯示區VA的金屬層ML進行蝕刻(如第13C圖),該另一蝕刻液只蝕刻金屬層ML,而不蝕刻金屬奈米線層NWL,然後使用蝕刻液對周邊區PA及顯示區VA的金屬奈米線層NWL進行蝕刻(如第13D圖)。移除顯示區VA的圖案化層PL,並使用另一蝕刻液對顯示區VA的金屬層ML繼續進行蝕刻,以完全蝕刻除去顯示區VA的金屬層ML(如第13E圖)。最後移除周邊區PA的圖案化層PL。Please refer to Figures 13A to 13E. In another embodiment, for the above-mentioned case where the metal nanowire layer NWL is first fabricated, and then the metal layer ML is fabricated, the touch panel can also be fabricated in the following way: first provide a
根據另一具體實施例,金屬奈米線層NWL為奈米銀層,金屬層ML為銅層的情況下,蝕刻液只用於蝕刻銀,而不蝕刻銅,例如蝕刻液的成分包括0.01-50wt%的雙氧水、0.1-10 wt%的金屬緩蝕劑、0.1-10 wt%的安定劑以及餘量的溶劑。金屬緩蝕劑可包含有含氮、含硫或含羥基的、具有表面活性的有機化合物、巰基苯並噻唑、苯並三唑和甲基苯並三唑中的至少一種。安定劑可包含乙二胺四乙酸、二乙烯三胺五乙酸、羥乙基乙二胺三乙酸、二乙胺五乙酸、N-羥乙基乙二胺三乙酸和聚丙烯酸胺中的至少一種。According to another specific embodiment, when the metal nanowire layer NWL is a nanosilver layer and the metal layer ML is a copper layer, the etching solution is only used to etch silver and not copper. For example, the composition of the etching solution includes 0.01- 50wt% hydrogen peroxide, 0.1-10 wt% metal corrosion inhibitor, 0.1-10 wt% stabilizer and the balance solvent. The metal corrosion inhibitor may include at least one of nitrogen-containing, sulfur-containing or hydroxyl-containing organic compounds with surface activity, mercaptobenzothiazole, benzotriazole, and tolyltriazole. The stabilizer may include at least one of ethylenediaminetetraacetic acid, diethylenetriaminepentaacetic acid, hydroxyethylethylenediaminetriacetic acid, diethylaminepentaacetic acid, N-hydroxyethylethylenediaminetriacetic acid, and polyacrylamide .
由於前述蝕刻液不會蝕刻金屬層ML,從而避免了周邊區PA及顯示區VA的金屬奈米線層NWL蝕刻不完全或對周邊區PA的金屬層ML造成側蝕的問題。Since the aforementioned etching solution does not etch the metal layer ML, the problem of incomplete etching of the metal nanowire layer NWL in the peripheral area PA and the display area VA or side etching of the metal layer ML in the peripheral area PA is avoided.
移除圖案化層PL的步驟。在具體實施例中,可通過有機溶劑或鹼性去膜劑剝除,如:KOH、K2 CO3 、丙二醇甲基醚醋酸酯(Propylene Glycol Methyl Ether Acetate;PGMEA)等。換言之,在上述步驟之後,圖案化層PL會被移除而不殘留於產品的結構中。The step of removing the patterned layer PL. In specific embodiments, it can be stripped off by organic solvents or alkaline removers, such as KOH, K 2 CO 3 , Propylene Glycol Methyl Ether Acetate (PGMEA), and the like. In other words, after the above steps, the patterned layer PL will be removed without remaining in the structure of the product.
本實施例的其他詳細製作方法均可參照前文,與此不再贅述。For other detailed manufacturing methods of this embodiment, reference may be made to the foregoing, and will not be repeated here.
請參閱第7圖,其顯示本發明的實施例所完成的觸控面板100(已移除圖案化層PL),第7A圖、第7B圖分別為第7圖中的A-A、B-B剖面的態樣,A-A剖面可看出位於周邊區PA的態樣,而B-B剖面則可看出位於周邊區PA與顯示區VA的態樣。如第7A圖、第7B圖所示,位於周邊區PA的金屬奈米線層NWL與金屬層ML經過蝕刻步驟(如使用前述的一次性蝕刻液)之後可形成空隙(即非導電區域136),即在周邊區PA形成由金屬奈米線層NWL經圖案化後所構成的蝕刻層以及由金屬層ML所構成的周邊引線120;由於蝕刻層位於周邊引線120與基板110之間,故可稱作第一中間層M1,換言之,周邊引線120下具有同樣被圖案化的第一中間層M1,相鄰周邊引線120之間具有非導電區域136;再者,周邊引線120的側面122與第一中間層M1的側面M1L為一共同蝕刻面,且相互對齊,也就是說在圖案化步驟中利用圖案化層PL的側壁作為基準,周邊引線120的側面122與第一中間層M1的側面M1L是在同一個蝕刻步驟中使用前述的一次性蝕刻液依據圖案化層PL的側壁所成型。由於周邊區PA的結構層是在同一步驟中進行圖案化,故可省略傳統的對位元步驟,進而達到減少或避免在製程中設置對位元誤差區域的需求,藉以降低周邊區PA的寬度,進而達到觸控面板/觸控顯示器的窄邊框需求。Please refer to FIG. 7, which shows the touch panel 100 (with the patterned layer PL removed) completed according to the embodiment of the present invention. In this way, the AA profile can be seen in the peripheral area PA, and the BB profile can be seen in the peripheral area PA and the display area VA. As shown in Figures 7A and 7B, the metal nanowire layer NWL and the metal layer ML located in the peripheral area PA can form voids (ie, non-conductive regions 136) after an etching step (such as using the aforementioned one-time etching solution) That is, in the peripheral area PA, an etching layer formed by patterning the metal nanowire layer NWL and a
在另一實施例中,在周邊區PA上可具有由金屬奈米線層NWL所構成的蝕刻層以及由金屬層ML所構成的周邊引線120與標記140,而蝕刻層可包括第一中間層M1與第二中間層M2,第一中間層M1設置於周邊引線120與基板110之間,第二中間層M2設置於標記140與基板110之間,標記140的側面142與第二中間層M2的側面M2L為一共同蝕刻面,且相互對齊。In another embodiment, the peripheral area PA may have an etching layer composed of a metal nanowire layer NWL and a
而如第7B圖所示,在位於顯示區VA中,金屬奈米線層NWL亦是利用圖案化層PL做為蝕刻遮罩,而在前述的圖案化步驟中形成觸控感應電極TE。在本實施例中,金屬奈米線層NWL會被圖樣化而形成空隙,以形成相鄰觸控感應電極TE之間的非導電區域136。再者,觸控感應電極TE可通過延伸至周邊區PA的金屬奈米線層NWL與周邊引線120形成電性連接。As shown in FIG. 7B, in the display area VA, the metal nanowire layer NWL also uses the patterned layer PL as an etching mask, and the touch sensing electrode TE is formed in the aforementioned patterning step. In this embodiment, the metal nanowire layer NWL is patterned to form voids to form
在另一實施例中,前述的觸控面板100可包括膜層130或保護層。舉例而言,第8圖為膜層130成型於上述第7B圖所示實施例的示意圖。在一實施例中,膜層130是全面性的覆蓋觸控面板100,例如膜層130可設置於顯示區VA與周邊區PA,以覆蓋於觸控感應電極TE、周邊引線120及/或標記140之上。如圖所示,在周邊區PA中,膜層130覆蓋第一周邊引線120上,膜層130並填入相鄰周邊引線120之間的非導電區域136,也就是說,相鄰周邊引線120之間的非導電區域136中具有一與膜層130相同的材料所製成的填充層。另外,以單一組對應的周邊引線120與第一中間層M1而言,膜層130會包圍所述的單一組上下對應的周邊引線120與第一中間層M1。類似的,以單一組對應的標記140與第二中間層M2而言,膜層130會包圍所述的單一組上下對應的標記140與第二中間層M2。In another embodiment, the
而在顯示區VA中,膜層130覆蓋於觸控感應電極TE之上,膜層130並填入相鄰觸控感應電極TE之間的非導電區域136,也就是說,相鄰觸控感應電極TE之間的非導電區域136中具有一與膜層130相同的材料所製成的填充層,藉以隔絕相鄰觸控感應電極TE。In the display area VA, the
而在本發明的部分實施方式中膜層130的材料可以是非導電的樹脂或其他有機材料,舉例而言,膜層130可為聚乙烯(polyethylene;PE)、聚丙烯(Polypropylene;PP)、聚乙烯醇縮丁醛(Polyvinyl butyral;PVB)、聚碳酸酯(polycarbonate;PC)、丙烯腈-丁二烯-苯乙烯共聚物(Acrylonitrile butadiene styrene;ABS)、聚(3,4-伸乙二氧基噻吩)(PEDOT)、聚(苯乙烯磺酸)(PSS)或陶瓷材料等等。在本發明的一種實施方式中,膜層130可為以下聚合物,但不限於此: 聚丙烯酸系樹脂,諸如聚甲基丙烯酸酯(例如,聚(甲基丙烯酸甲酯))、聚丙烯酸酯及聚丙烯腈;聚乙烯醇;聚酯(例如,聚對苯二甲酸乙二酯(PET)、聚酯萘二甲酸酯及聚碳酸酯);具有高芳香度的聚合物,諸如酚醛樹脂或甲酚-甲醛、聚苯乙烯、聚乙烯基甲苯、聚乙烯基二甲苯、聚醯亞胺、聚醯胺、聚醯胺醯亞胺、聚醚醯亞胺、聚硫化物、聚碸、聚伸苯基及聚苯基醚;聚胺基甲酸酯(polyurethane;PU);環氧樹脂;聚烯烴(例如聚丙烯、聚甲基戊烯及環烯烴);纖維素;聚矽氧及其他含矽聚合物(例如聚倍半氧矽烷及聚矽烷);聚氯乙烯(PVC);聚乙酸酯;聚降冰片烯;合成橡膠(例如,乙丙橡膠(ethylene-propylene rubber;EPR)、丁苯橡膠(styrene-Butadiene Rubber;SBR)、三元乙丙橡膠(ethylene-Propylene-Diene Monomer;EPDM);及含氟聚合物(例如,聚偏氟乙烯、聚四氟乙烯(TFE)或聚六氟丙烯);氟-烯烴與烴烯烴的共聚物等。在其他實施例中,可使用以二氧化矽、富鋁紅柱石、氧化鋁、SiC、碳纖維、MgO-Al2
O3
-SiO2
、Al2
O3
-SiO2
或MgO-Al2
O3
-SiO2
-Li2
O等無機材料。於本發明的部分實施方式中,膜層130由絕緣材料所形成。於本發明的部分實施方式中,可以通過旋塗、噴塗、印刷等方式形成膜層130。於部分實施方式中,膜層130的厚度大約為20奈米至10微米、或50奈米至200奈米、或30至100奈米,舉例而言,膜層130的厚度大約可為90奈米或100奈米。In some embodiments of the present invention, the material of the
此外,類似於前述內容,膜層130可與金屬奈米線(例如觸控感應電極TE)形成複合結構而具有某些特定的化學、機械及光學特性,例如提供金屬奈米線與基板110的黏著性,或是較佳的實體機械強度,故膜層130又可被稱作基質(matrix)。值得說明的是,本文的附圖將膜層130與觸控感應電極TE繪製為不同層的結構,但用於製作膜層130的聚合物在未固化前或在預固化的狀態下可以滲入金屬奈米線之間而形成填充物,當聚合物固化後,金屬奈米線會嵌入膜層130之中,也就是說,本發明不特別限定膜層130與金屬奈米線層NWL(例如觸控感應電極TE)之間的結構。值得說明的是,膜層130或保護層可應用於本揭露的實施例,並不以第7B圖所示實施例為限。In addition, similar to the foregoing, the
第9圖則顯示本發明的實施方式中所製作的雙面型態的觸控面板,可依以下方式製作:首先提供基板110,其上具有事先定義的周邊區PA與顯示區VA。接著,於基板110的相對的第一與第二表面(如上表面與下表面)分別形成金屬奈米線層NWL於第一與第二表面的周邊區PA與顯示區VA;接著形成金屬層ML,且金屬層ML位於周邊區PA;接著分別形成圖案化層PL於第一與第二表面的金屬奈米線層NWL及金屬層ML上;接著依據圖案化層PL進行第一與第二表面圖案化,以在第一與第二表面形成第一觸控感應電極TE1、第二觸控感應電極TE2與周邊引線120,且周邊引線120會覆蓋於第一中間層M1。本發明的實施方式還可包含移除圖案化層PL。為了附圖的簡潔,第9圖未標示出第一中間層M1。Fig. 9 shows the double-sided touch panel manufactured in the embodiment of the present invention, which can be manufactured in the following manner: first, a
本步驟的具體實施方式可參照前文,例如,本發明提出的蝕刻液可以同時針對不同區域的材料層,如周邊區PA的金屬/奈米銀與顯示區VA的奈米銀刻蝕出線路,並且有良好直線性以及側蝕量(CD bias)控制,以及不殘留材料於非導電區域136中。另外,本實施例可以直接進行雙面蝕刻製程,有益於簡化製程並提高良率。The specific implementation of this step can refer to the foregoing. For example, the etching solution proposed in the present invention can simultaneously target material layers in different areas, such as metal/nanosilver in the peripheral area PA and nanosilver in the display area VA to etch out lines. And it has good linearity and CD bias control, and no material remains in the
請參考第9圖與第9A圖,第一觸控感應電極TE1形成於基板110的一面(如上表面),第二觸控感應電極TE2則形成於基板110的另一面(如下表面),使第一觸控感應電極TE1、第二觸控感應電極TE2彼此電性絕緣;而電性連接於第一觸控感應電極TE1的周邊引線120則覆蓋第一中間層M1;同理,連接於第二觸控感應電極TE2的周邊引線120則覆蓋其對應的第一中間層M1。第一觸控感應電極TE1為多個沿第一方向D1排列的長條狀電極,第二觸控感應電極TE2為多個沿第二方向D2排列的長條狀電極。如圖所示,長條狀觸控感應電極TE1與長條狀觸控感應電極TE2的延伸方向不同,而互相交錯。第一觸控感應電極TE1與第二觸控感應電極TE2可分別用以傳送控制信號與接收觸控感應信號。自此,可以經由檢測第一觸控感應電極TE1與第二觸控感應電極TE2之間的信號變化(例如電容變化),得到觸控位置。通過此設置,使用者可於基板110上的各點進行觸控感應。本實施例的觸控面板100還可以包含膜層130,其是全面性的覆蓋觸控面板100,也就是說基板110的上下兩面均設置有膜層130,並覆蓋於第一觸控感應電極TE1、第二觸控感應電極TE2以及周邊引線120之上,且膜層130也同樣覆蓋並填入基板110的上下的非導電區域136。Please refer to Figures 9 and 9A, the first touch sensing electrode TE1 is formed on one side of the substrate 110 (such as the upper surface), and the second touch sensing electrode TE2 is formed on the other side of the substrate 110 (the lower surface), so that A touch sensing electrode TE1 and a second touch sensing electrode TE2 are electrically insulated from each other; and a
同於前述實施例,基板110的任一面(如上表面或下表面)還可包括標記140與第二中間層M2。Similar to the foregoing embodiment, any surface (such as the upper surface or the lower surface) of the
第10圖為根據本發明的部分實施方式的觸控面板100的上視示意圖。本實施方式與前述實施方式相似,主要的差異在於:本實施方式中,觸控面板100還包含設置於周邊區PA的遮罩導線160,其主要包圍觸控感應電極TE與周邊引線120,且遮罩導線160會延伸至接合區BA而電性連接於軟性電路板170上的接地端,故遮罩導線160可以遮罩或消除信號干擾或是靜電放電(Electrostatic Discharge,ESD)防護,特別是人手碰到觸控裝置周圍的連接導線而導致的微小電流變化。FIG. 10 is a schematic top view of a
依照前述的製作方法,遮罩導線160與周邊引線120可為同層的金屬層ML所製作(即兩者為相同的金屬材料,例如前述的化學鍍銅層),其上疊有金屬奈米線層NWL(或稱第三覆蓋層),並依照圖案化層PL的圖樣進行蝕刻之後所製成,亦可理解成遮罩導線160為包括金屬奈米線層NWL(或其與膜層的複合層)及金屬層ML的複合結構層,具體可參照第2A圖及第2B圖所示實施例的說明。另外,在另一實施例中,遮罩導線160與周邊引線120可為同層的金屬層ML所製作(即兩者為相同的金屬材料,例如前述的化學鍍銅層),並依照圖案化層PL的圖樣進行蝕刻,再移除圖案化層PL之後所製成,故亦可理解成遮罩導線160為包括金屬奈米線層NWL(或稱第三中間層)及金屬層ML的複合結構層,亦可理解成遮罩導線160為包括金屬奈米線層NWL(或其與膜層的複合層)及金屬層ML的複合結構層,具體可參照第7A圖及第7B圖所示實施例的說明。According to the aforementioned manufacturing method, the
第11圖則顯示本發明單面式的觸控面板100的另一實施例,其為一種單面架橋式(bridge)的觸控面板。此實施例與上述實施例的差異至少在於,成形於基板110上的透明導電層 (即金屬奈米線層NWL)在上述圖案化的步驟後形成的觸控感應電極TE可包括:沿第一方向D1排列的第一觸控感應電極TE1、沿第二方向D2排列的第二觸控感應電極TE2及電性連接兩相鄰的第一觸控感應電極TE1的連接電極CE;另外,絕緣塊164可設置於連接電極CE上,例如以二氧化矽形成絕緣塊164;而橋接導線162再設置於絕緣塊164上,例如以銅/ITO/金屬奈米線等材料形成橋接導線162,並使橋接導線162連接於第二方向D2上相鄰的兩個第二觸控感應電極TE2,絕緣塊164位於連接電極CE與橋接導線162之間,以將連接電極CE以及橋接導線162電性隔絕,以使第一方向D1與第二方向D2上的觸控電極彼此電性隔絕。具體做法可參考前文,於此不再贅述。同於上述實施例,周邊引線120為金屬層ML所製作(例如前述的化學鍍銅層),其上疊層有金屬奈米線層NWL,兩者為使用前述的蝕刻液所成型;類似的,第一觸控感應電極TE1及第二觸控感應電極TE2為使用前述的蝕刻液所成型,而周邊引線120分別連接第一觸控感應電極TE1及第二觸控感應電極TE2。FIG. 11 shows another embodiment of the single-
本發明實施例的觸控面板可與其他電子裝置組裝,例如具觸控功能的顯示器,如可將基板110貼合於顯示元件,例如液晶顯示元件或有機發光二極體(OLED)顯示元件,兩者之間可用光學膠或其他類似黏合劑進行貼合;而觸控感應電極TE上同樣可利用光學膠與外蓋層(如保護玻璃)進行貼合。本發明實施例的觸控面板可應用於可攜式電話、平板電腦、筆記型電腦等等電子設備。The touch panel of the embodiment of the present invention can be assembled with other electronic devices, such as a display with touch function. For example, the
在一部分實施方式中,本文所述的觸控面板100可通過卷對卷(Roll to Roll)製程來製作,卷對卷(Roll to Roll) 塗覆製程使用習知設備且可完全自動化,可顯著降低製造觸控面板的成本。卷對卷塗覆的具體製程如下:首先選用具可撓性的基板110,並使卷帶狀的基板110安裝於兩滾輪之間,利用馬達驅動滾輪,以使基板110可沿兩滾輪之間的移動路徑進行連續性的製程。例如,利用鍍槽進行金屬層ML的沉積、利用儲存槽、噴霧裝置、刷塗裝置及其類似物將含金屬奈米線的漿料則沈積於基板110的表面上並施加固化步驟以形成金屬奈米線層NWL;成型具有圖案的圖案化層PL(例如利用前述柔版印刷方式)於金屬層ML及/或金屬奈米線層NWL上;利用蝕刻槽或噴塗蝕刻液進行圖案化等步驟。隨後,所完成的觸控面板100通過產線最後端的滾輪加以卷出形成觸控感測器卷帶。In some embodiments, the
本實施例的觸控感測器卷帶還可以包含膜層130,其是全面性的覆蓋觸控感測器卷上未裁切的觸控面板100,也就是說膜層130可覆蓋於觸控感測器卷上未裁切的多個觸控面板100上,再被切割分離為個別的觸控面板100。The touch sensor tape of this embodiment may also include a
於本發明的部分實施方式中,基板110較佳為透明基板,詳細而言,可以為一硬式透明基板或一可撓式透明基板,其材料可以選自玻璃、壓克力(polymethylmethacrylate;PMMA)、聚氯乙烯(polyvinyl Chloride;PVC)、聚丙烯(polypropylene;PP)、聚對苯二甲酸乙二醇酯(polyethylene terephthalate;PET)、聚萘二甲酸乙二醇酯(polyethylene naphthalate;PEN)、聚碳酸酯(polycarbonate;PC)、聚苯乙烯(polystyrene;PS)、環烯烴聚合物(Cyclo Olefin Polymers;COP)、環烯烴共聚物(cycloolefin copolymer;COC)等透明材料。In some embodiments of the present invention, the
卷對卷產線可沿基板的移動路徑依需求調整多個塗覆步驟的順序或是可按需求併入任何數目的額外月臺。舉例而言,為了達到適當的後處理製程,即可將壓力滾輪或電漿設備安裝於產線中。The roll-to-roll production line can adjust the sequence of multiple coating steps along the movement path of the substrate as required or can incorporate any number of additional platforms as required. For example, in order to achieve an appropriate post-processing process, pressure rollers or plasma equipment can be installed in the production line.
於部分實施方式中,所形成的金屬奈米線可進一步進行後處理以提高其導電度,此後處理可為包括如加熱、電漿、電暈放電、UV臭氧、壓力或上述製程組合的過程步驟。例如,在固化形成金屬奈米線層NWL的步驟後,可利用滾輪施加壓力於其上,在一實施例中,可通過一或多個滾輪向金屬奈米線層NWL施加50至3400 psi的壓力,較佳為可施加100至1000 psi、200至800 psi或300至500 psi的壓力;而上述施加壓力的步驟較佳地實施在塗布膜層130的步驟之前。於部分實施方式中,可同時進行加熱與壓力之後處理;詳言之,所形成的金屬奈米線可經由如上文所述的一或多個滾輪施加壓力,並同時加熱,例如由滾輪施加的壓力為10至500 psi,較佳為40至100 psi;同時將滾輪加熱至約70℃與200℃之間,較佳至約100℃與175℃之間,其可提高金屬奈米線的導電度。於部分實施方式中,金屬奈米線較佳可暴露於還原劑中進行後處理,例如由奈米銀線組成的金屬奈米線較佳可暴露於銀還原劑中進行後處理,銀還原劑包括硼氫化物,如硼氫化鈉;硼氮化合物,如二甲基胺基硼烷(DMAB);或氣體還原劑,諸如氫氣(H2
)。而所述的暴露時間約10秒至約30分鐘,較佳約1分鐘至約10分鐘。In some embodiments, the formed metal nanowires can be further subjected to post-processing to increase their conductivity. The post-processing can include process steps such as heating, plasma, corona discharge, UV ozone, pressure, or a combination of the above processes. . For example, after the step of curing to form the metal nanowire layer NWL, a roller can be used to apply pressure thereon. In one embodiment, 50 to 3400 psi can be applied to the metal nanowire layer NWL through one or more rollers. The pressure may preferably be 100 to 1000 psi, 200 to 800 psi, or 300 to 500 psi; and the step of applying pressure is preferably implemented before the step of coating the
本實施方式的其他細節大致上如上述實施方式所述,在此不再贅言。The other details of this embodiment are roughly as described in the foregoing embodiment, and will not be repeated here.
本發明的不同實施例的結構可相互引用,並不為上述各具體實施方式的限制。The structures of different embodiments of the present invention can be mutually cited, and are not limited to the foregoing specific embodiments.
本發明的部分實施方式中,通過蝕刻液一次性蝕刻金屬奈米線層NWL或/及金屬層ML,故可以避免對位的過程中所預留的誤差空間,故可有效降低周邊區的寬度。In some embodiments of the present invention, the metal nanowire layer NWL or/and the metal layer ML are etched at one time by the etching solution, so the error space reserved in the alignment process can be avoided, so the width of the peripheral area can be effectively reduced .
本發明的部分實施方式中,將兩層結構(例如上層為金屬奈米線層NWL與下層為金屬層ML,或上層為金屬層ML與下層為金屬奈米線層NWL)可以通過一次性蝕刻以製作周邊區的周邊引線及/或標記,故可以避免對位的過程中所預留的誤差空間,故可有效降低周邊區的寬度。In some embodiments of the present invention, the two-layer structure (for example, the upper layer is the metal nanowire layer NWL and the lower layer is the metal layer ML, or the upper layer is the metal layer ML and the lower layer is the metal nanowire layer NWL) can be etched at one time By making the peripheral leads and/or marks of the peripheral area, the error space reserved in the alignment process can be avoided, so the width of the peripheral area can be effectively reduced.
本發明的部分實施方式中,以上述蝕刻液針對銅層與銀奈米線層進行蝕刻,如第12圖所示,蝕刻60秒後,CD bias為3um。In some embodiments of the present invention, the copper layer and the silver nanowire layer are etched with the above-mentioned etching solution. As shown in FIG. 12, after 60 seconds of etching, the CD bias is 3um.
雖然本發明已以多種實施方式揭露如上,然其並非用以限定本發明,任何熟習此技藝者,在不脫離本發明的精神和範圍內,當可作各種的更動與潤飾,因此本發明的保護範圍當視所附的申請專利範圍所界定的範圍為准。Although the present invention has been disclosed in various embodiments as above, it is not intended to limit the present invention. Anyone familiar with the art can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the present invention The scope of protection shall be subject to the scope defined by the scope of the attached patent application.
100:觸控面板 110:基板 120:周邊引線 122:側面 124:上表面 140:標記 142:側面 144:上表面 130:膜層 136:非導電區域 160:遮罩導線 170:軟性電路板 ML:金屬層 NWL:金屬奈米線層 PL:圖案化層 M1:第一中間層 M1L:側面 M2:第二中間層 M2L:側面 VA:顯示區 PA:周邊區 BA:接合區 TE1:第一觸控感應電極 TE2:第二觸控感應電極 TE:觸控感應電極 C1:第一覆蓋物 C1L:側面 C2:第二覆蓋物 C2L:側面 D1:第一方向 D2:第二方向100: Touch panel 110: substrate 120: Peripheral lead 122: side 124: upper surface 140: mark 142: Side 144: upper surface 130: Membrane 136: Non-conductive area 160: mask wire 170: flexible circuit board ML: Metal layer NWL: Metal Nanowire Layer PL: Patterned layer M1: The first middle layer M1L: side M2: The second middle layer M2L: side VA: Display area PA: Peripheral area BA: junction area TE1: The first touch sensing electrode TE2: second touch sensing electrode TE: Touch sensing electrode C1: First cover C1L: side C2: second cover C2L: side D1: First direction D2: second direction
第1A圖至第1C圖為根據本發明的部分實施方式的觸控面板的製作方法的步驟示意圖。 第2圖為根據本發明的部分實施方式的觸控面板的上視示意圖。 第2A圖為沿第2圖的線A-A的剖面示意圖。 第2B圖為沿第2圖的線B-B的剖面示意圖。 第3圖為根據本發明的部分實施方式的觸控面板與軟性電路板組裝後的上視示意圖。 第4圖為根據本發明的另一實施方式的觸控面板的示意圖。 第5圖為根據本發明的另一實施方式的觸控面板的上視示意圖。 第5A圖為沿第5圖的線A-A的剖面示意圖。 第6A圖至第6C圖為根據本發明的部分實施方式的觸控面板的製作方法的步驟示意圖。 第7圖為根據本發明的另一實施方式的觸控面板的上視示意圖。 第7A圖為沿第7圖的線A-A的剖面示意圖。 第7B圖為沿第7圖的線B-B的剖面示意圖。 第8圖為根據本發明的另一實施方式的觸控面板的示意圖。 第9圖為根據本發明的另一實施方式的觸控面板的上視示意圖。 第9A圖為沿第9圖的線A-A的剖面示意圖。 第10圖為根據本發明的另一實施方式的觸控面板的上視示意圖。 第11圖為根據本發明的另一實施方式的觸控面板的上視示意圖。 第12圖為根據本發明蝕刻後的SEM圖。 第13A圖至第13E圖為根據本發明的部分實施方式的觸控面板的另一製作方法的步驟示意圖。1A to 1C are schematic diagrams of steps of a manufacturing method of a touch panel according to some embodiments of the present invention. FIG. 2 is a schematic top view of a touch panel according to some embodiments of the present invention. Fig. 2A is a schematic cross-sectional view taken along the line A-A in Fig. 2. Fig. 2B is a schematic cross-sectional view taken along the line B-B in Fig. 2. FIG. 3 is a schematic top view of the touch panel and the flexible circuit board after assembly according to some embodiments of the present invention. FIG. 4 is a schematic diagram of a touch panel according to another embodiment of the present invention. FIG. 5 is a schematic top view of a touch panel according to another embodiment of the present invention. Fig. 5A is a schematic cross-sectional view taken along the line A-A in Fig. 5. 6A to 6C are schematic diagrams of steps of a method of manufacturing a touch panel according to some embodiments of the present invention. FIG. 7 is a schematic top view of a touch panel according to another embodiment of the present invention. Fig. 7A is a schematic cross-sectional view taken along the line A-A in Fig. 7. Fig. 7B is a schematic cross-sectional view taken along the line B-B in Fig. 7. FIG. 8 is a schematic diagram of a touch panel according to another embodiment of the present invention. FIG. 9 is a schematic top view of a touch panel according to another embodiment of the present invention. Fig. 9A is a schematic cross-sectional view taken along the line A-A in Fig. 9. FIG. 10 is a schematic top view of a touch panel according to another embodiment of the present invention. FIG. 11 is a schematic top view of a touch panel according to another embodiment of the present invention. Figure 12 is an SEM image after etching according to the present invention. 13A to 13E are schematic diagrams of steps of another manufacturing method of a touch panel according to some embodiments of the present invention.
國內寄存資訊(請依寄存機構、日期、號碼順序註記) 無 國外寄存資訊(請依寄存國家、機構、日期、號碼順序註記) 無Domestic deposit information (please note in the order of deposit institution, date and number) none Foreign hosting information (please note in the order of hosting country, institution, date, and number) none
110:基板110: substrate
ML:金屬層ML: Metal layer
NWL:金屬奈米線層NWL: Metal Nanowire Layer
PL:圖案化層PL: Patterned layer
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI816384B (en) * | 2022-04-29 | 2023-09-21 | 大陸商宸美(廈門)光電有限公司 | Touch sensor and manufacturing method thereof |
US11829539B1 (en) | 2022-05-16 | 2023-11-28 | Tpk Advanced Solutions Inc. | Touch sensor and manufacturing method thereof |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113821125A (en) * | 2021-11-22 | 2021-12-21 | 广东省科学院半导体研究所 | Touch substrate, preparation method thereof, touch module and display device |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102324462A (en) * | 2006-10-12 | 2012-01-18 | 凯博瑞奥斯技术公司 | Transparent conductor and application thereof based on nano wire |
TW201638394A (en) * | 2015-03-26 | 2016-11-01 | 東友精細化工有限公司 | Etchant composition for etching silver-containing thin layer and method of manufacturing array substrate for display device using the same |
TW201816186A (en) * | 2016-06-08 | 2018-05-01 | 易案愛富科技有限公司 | Hydrogen peroxide stabilizer and etching composition containing them |
US20180148645A1 (en) * | 2016-11-29 | 2018-05-31 | Samsung Electronics Co., Ltd. | Etching composition and method for fabricating semiconductor device by using the same |
TW201823516A (en) * | 2016-10-21 | 2018-07-01 | 日商Adeka股份有限公司 | Etching fluid composition and etching method |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10438715B2 (en) * | 2014-11-12 | 2019-10-08 | Samsung Electronics Co., Ltd. | Nanostructure, method of preparing the same, and panel units comprising the nanostructure |
CN109423647B (en) * | 2017-08-28 | 2021-01-15 | 东友精细化工有限公司 | Metal film etching liquid composition and conductive pattern forming method using the same |
CN111857410A (en) * | 2018-01-24 | 2020-10-30 | 祥达光学(厦门)有限公司 | Touch panel |
CN110609631A (en) * | 2018-06-15 | 2019-12-24 | 凯姆控股有限公司 | Touch panel and manufacturing method thereof |
-
2020
- 2020-09-09 CN CN202010943906.2A patent/CN113126831A/en active Pending
- 2020-10-28 TW TW109137488A patent/TWI749832B/en active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102324462A (en) * | 2006-10-12 | 2012-01-18 | 凯博瑞奥斯技术公司 | Transparent conductor and application thereof based on nano wire |
TW201638394A (en) * | 2015-03-26 | 2016-11-01 | 東友精細化工有限公司 | Etchant composition for etching silver-containing thin layer and method of manufacturing array substrate for display device using the same |
TW201816186A (en) * | 2016-06-08 | 2018-05-01 | 易案愛富科技有限公司 | Hydrogen peroxide stabilizer and etching composition containing them |
TW201823516A (en) * | 2016-10-21 | 2018-07-01 | 日商Adeka股份有限公司 | Etching fluid composition and etching method |
US20180148645A1 (en) * | 2016-11-29 | 2018-05-31 | Samsung Electronics Co., Ltd. | Etching composition and method for fabricating semiconductor device by using the same |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI816384B (en) * | 2022-04-29 | 2023-09-21 | 大陸商宸美(廈門)光電有限公司 | Touch sensor and manufacturing method thereof |
US11829539B1 (en) | 2022-05-16 | 2023-11-28 | Tpk Advanced Solutions Inc. | Touch sensor and manufacturing method thereof |
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