TWI748865B - Light-emitting diode display panel testing device and light-emitting diode display panel testing method - Google Patents

Abstract

A light-emitting diode (LED) display panel testing device and a LED display panel testing method are disclosed. The LED display panel testing device includes m first connection wires, n second connection wires and a testing circuit, wherein m and n are positive integers. The LED display panel includes (m*n) LEDs. The first connection wires are coupled to positive electrodes of the n LEDs respectively. The second connection wires are coupled to negative electrodes of the m LEDs respectively. In the LED display panel testing method, the testing circuit can selectively perform at least one of a first testing mode, a second testing mode and a third testing mode on the (m*n) LEDs to find out abnormal LEDs.

Description

Light-emitting diode display panel detection device and light-emitting diode display panel detection method

The present invention relates to a display panel, and particularly relates to a light-emitting diode display panel inspection device and a light-emitting diode display panel inspection method.

Generally speaking, most of the current methods for detecting abnormal LEDs on LED display panels are usually to perform optical detection through ultraviolet light irradiation after the mass transfer is completed, or through image recognition after the system is connected Perform testing.

However, since the above-mentioned traditional detection methods only detect a single light-emitting diode in each inspection, as far as the large number of light-emitting diodes included in the entire display panel is concerned, if all the light-emitting diodes are to be detected, It will inevitably take a very long time, resulting in poor detection efficiency of the light-emitting diode display panel, which needs to be improved urgently.

In view of this, the present invention provides a light-emitting diode display panel inspection device and a light-emitting diode display panel inspection method to effectively solve the above-mentioned problems encountered in the prior art.

A specific embodiment according to the present invention is a light-emitting diode display panel inspection device. In this embodiment, the light-emitting diode display panel inspection device is used to inspect the light-emitting diode display panel. The light-emitting diode display panel includes (m*n) light-emitting diodes, where m and n are both positive integers.

The light-emitting diode display panel detection device includes m first connection lines, n second connection lines, and a detection circuit. Both m and n are positive integers. Each first connection line is respectively coupled to the anodes of n light-emitting diodes. Each second connection line is respectively coupled to the negative electrodes of m light-emitting diodes. The detection circuit is used for selectively executing at least one of the first detection mode, the second detection mode and the third detection mode for the (m*n) light-emitting diodes to detect abnormal light-emitting diodes.

Wherein, in the first detection mode, when any of the n second connection lines is activated, the detection circuit sequentially detects the m first connection lines; when the m first connection lines When any one of the first connecting wires is activated, the detection circuit sequentially detects the n second connecting wires. In the second detection mode, when any one of the second connection lines is activated, the detection circuit detects the m first connection lines at the same time. In the third detection mode, when any one of the first connection lines is activated, the detection circuit simultaneously detects the n second connection lines.

In one embodiment, the detection circuit first executes the second detection mode or the third detection mode for abnormality detection, and then determines that the number of abnormal light-emitting diodes detected is greater than one or equal to one.

In one embodiment, if the number of abnormal light-emitting diodes detected is greater than 1, the detection circuit executes the first detection mode to locate the abnormal light-emitting diodes.

In one embodiment, if the number of abnormal light-emitting diodes detected is equal to 1, the detection circuit executes the second detection mode or the third detection mode to locate the abnormal light-emitting diodes.

In one embodiment, in the first detection mode, when any of the second connection wires is activated, the detection circuit sequentially detects whether the current between the m first connection wires and any of the second connection wires is Abnormal; when the any one of the first connection wires act, the detection circuit sequentially detects whether the current between the n second connection wires and the any one of the first connection wires is abnormal.

In one embodiment, in the first detection mode, when the any second connection line is activated, the any second connection line and the remaining (n-1) second connection lines among the n second connection lines The level of the connecting line is opposite; when any one of the first connecting lines is activated, the level of the any one of the first connecting lines is opposite to the other (m-1) of the m first connecting lines .

In one embodiment, in the first detection mode, when the detection circuit detects any one of the first connection lines, the any one of the first connection lines and the rest of the m first connection lines (m-1) The levels of the first connecting lines are opposite; when the detection circuit detects any of the second connecting lines, the any second connecting line is connected to the remaining (n-1) second connecting lines among the n second connecting lines The level of the connecting line is reversed.

In one embodiment, in the second detection mode, the detection circuit simultaneously detects whether the current between the m first connection lines and any of the second connection lines is abnormal.

In one embodiment, in the third detection mode, the detection circuit simultaneously detects whether the current between the n second connection lines and any one of the first connection lines is abnormal.

In one embodiment, when the detection circuit executes the first detection mode, the abnormal conditions that the detection circuit can detect include an open circuit, a short circuit between any one of the first connecting lines and the adjacent first connecting line, and any of the first connecting lines. The short circuit between the two connecting lines and its adjacent second connecting line, the resistance of any one of the (m*n) light-emitting diodes or its connection path is too high, and any second connection The resistance of the line is too high.

In one embodiment, when the detection circuit executes the second detection mode, the abnormal conditions that the detection circuit can detect include an open circuit, a short circuit between any one of the first connecting lines and any one of the second connecting lines, and the any The short circuit between the second connection line and its adjacent second connection line, the resistance of any one of the (m*n) light-emitting diodes or its connection path is too high, and any second The resistance of the connecting wire is too high.

In one embodiment, when the detection circuit executes the third detection mode, the abnormal conditions that the detection circuit can detect include an open circuit, a short circuit between any one of the first connection lines and any one of the second connection lines, and the any The short circuit between the first connection line and its adjacent first connection line, the resistance of any one of the (m*n) light-emitting diodes or its connection path is too high, and any second The resistance of the connecting wire is too high.

Another specific embodiment according to the present invention is a light emitting diode display panel inspection method. In this embodiment, the light-emitting diode display panel inspection method is used to inspect the light-emitting diode display panel. The light-emitting diode display panel includes (m*n) light-emitting diodes, where m and n are both positive integers.

The detection method of a light-emitting diode display panel includes the following steps:

Provide m first connection lines, n second connection lines and a detection circuit, wherein each first connection line is respectively coupled to the anode of n light-emitting diodes and each second connection line is respectively coupled to m light-emitting diodes The negative pole of the polar body; and

The detection circuit TC selectively executes at least one of the first detection mode, the second detection mode, and the third detection mode for the (m*n) light-emitting diodes to detect abnormal light-emitting diodes.

Wherein, in the first detection mode, when any of the n second connection lines is activated, the detection circuit sequentially detects the m first connection lines; when the m first connection lines When any one of the first connecting wires is activated, the detection circuit sequentially detects the n second connecting wires. In the second detection mode, when any one of the second connection lines is activated, the detection circuit detects the m first connection lines at the same time. In the third detection mode, when any one of the first connection lines is activated, the detection circuit simultaneously detects the n second connection lines.

Compared with the prior art, the light-emitting diode display panel inspection device and the light-emitting diode display panel inspection method of the present invention use the output channel of the light-emitting diode display drive circuit to selectively transmit light through three different detection modes. The abnormal detection of all light-emitting diodes of the diode display panel can not only effectively detect a variety of common abnormal conditions of the light-emitting diode display panel (such as open circuit, short circuit or excessive resistance), but also greatly shorten the light emission. The detection time required for the detection of all the light-emitting diodes of the diode display panel can effectively improve the detection efficiency of the light-emitting diode display panel. In addition, the present invention can further determine whether the abnormal light-emitting diode needs to be repaired according to the above-mentioned detection result.

The advantages and spirit of the present invention can be further understood from the following detailed description of the invention and the accompanying drawings.

A specific embodiment according to the present invention is a light-emitting diode display panel inspection device. In this embodiment, the light-emitting diode display panel inspection device is used to inspect the light-emitting diode display panel. The light-emitting diode display panel adopts a passive driving method, but it is not limited to this.

Please refer to FIG. 1. FIG. 1 is a schematic diagram showing the voltage-to-current variation curve of the light-emitting diode. As shown in FIG. 1, before the voltage reaches its threshold voltage VTH, the current IL of the light-emitting diode corresponding to the voltage VL is relatively small. When the voltage exceeds the threshold voltage VTH, the current IH of the light-emitting diode corresponding to the bias voltage VH will be a normal current level.

Next, please refer to Figures 2 to 4. FIG. 2 is a schematic diagram showing when the light-emitting diode display panel inspection device of the present invention operates in the first inspection mode; FIG. 3 is a schematic diagram showing when the light-emitting diode display panel inspection device of the present invention operates in the second inspection mode Schematic diagram; FIG. 4 is a schematic diagram showing when the light-emitting diode display panel inspection device of the present invention operates in the third inspection mode.

As shown in FIGS. 2 to 4, the light emitting diode display panel may include (m*n) light emitting diodes LED11~LEDmn, where m and n are both positive integers. The light-emitting diode display panel detection device includes m first connection wires A1 to Am, n second connection wires C1 to Cn, and a detection circuit TC.

It should be noted that each first connection line is respectively coupled to the anodes of n light-emitting diodes. That is, the first connection line A1 is respectively coupled to the anodes of the n light-emitting diodes LED11~LED1n; the first connection line A2 is respectively coupled to the anodes of the n light-emitting diodes LED21~LED2n; the first connection line A3 is respectively The anodes of n light-emitting diodes LED31~LED3n are coupled; and so on, until the first connecting line Am is respectively coupled to the anodes of n light-emitting diodes LEDm1~LEDmn.

In addition, each second connection line is respectively coupled to the negative electrodes of m light-emitting diodes. That is, the second connecting wire C1 is respectively coupled to the negative poles of m light-emitting diodes LED11~LEDm1; the second connecting wire C2 is respectively coupled to the negative poles of m light-emitting diodes LED12~LEDm2; the second connecting wire C3 is respectively The negative poles of m light-emitting diodes LED13~LEDm3 are coupled; and so on, until the second connecting line Cn is respectively coupled to the negative poles of m light-emitting diodes LED1n~LEDmn.

It should be noted that the light-emitting diode display panel of the present invention adopts a passive driving method, which changes the voltage difference between the first connection line A1~Am and the second connection line C1~Cn to make the light-emitting diode Body luminescence. The detection circuit TC can selectively execute at least one of the first detection mode, the second detection mode, and the third detection mode for (m*n) light-emitting diodes LED11~LEDmn to detect abnormal light-emitting diodes .

As shown in Figure 2, in the first detection mode, when any one of the n second connection lines C1 to Cn is activated, the detection circuit TC will "sequentially" detect the m first connection lines. Connecting wires A1~Am, where j=1~n; when any one of the m first connecting wires A1~Am is activated, the detection circuit TC will “sequentially” detect the n second connecting wires Connecting lines C1~Cn, where i=1~m.

For example, when the second connection line C1 is activated (at this time, the level of the second connection line C1 is opposite to the level of the remaining second connection lines C2~Cn), the detection circuit TC will "sequentially" detect the first connection Line A1 (the level of the first connection line A1 is opposite to the level of the other first connection lines A2~Am), the first connection line A2 (the level of the first connection line A2 at this time is the same as that of the other first connection lines The levels of A1, A3~Am are opposite), the first connection line A3 (the level of the first connection line A3 at this time is opposite to the levels of the other first connection lines A1~A2, A4~Am), ... until the first connection line A3 A connection line Am (at this time, the level of the first connection line Am is opposite to the levels of the remaining first connection lines A1~A(m-1)).

Then, switch to the operation of the second connecting line C2. When the second connection line C2 is activated (the level of the second connection line C2 is opposite to the levels of the remaining second connection lines C1, C3~Cn), the detection circuit TC will "sequentially" detect the first connection line A1 (At this time, the level of the first connection line A1 is opposite to the level of the remaining first connection lines A2~Am), the first connection line A2 (at this time, the level of the first connection line A2 is the same as that of the remaining first connection lines A1, The levels of A3~Am are opposite), the first connection line A3 (at this time, the level of the first connection line A3 is opposite to the levels of the other first connection lines A1~A2, A4~Am), ... until the first connection Line Am (the level of the first connection line Am is opposite to the level of the other first connection lines A1~A(m-1) at this time).

As for the subsequent switching to the second connecting lines C3~Cn in order, the situation can be deduced in the same way, so it will not be repeated here.

When the second connecting lines C1~Cn are all actuated in sequence, they will start to switch to the first connecting line A1~Am to act in sequence.

When the first connection line A1 is activated (the level of the first connection line A1 is opposite to the levels of the other first connection lines A2~Am), the detection circuit TC will "sequentially" detect the second connection line C1 (this When the level of the second connection line C1 is opposite to the level of the other second connection lines C2~Cn), the second connection line C2 (at this time, the level of the second connection line C2 is the same as the other second connection lines C1, C3~ The level of Cn is opposite), the second connection line C3 (the level of the second connection line C3 at this time is opposite to the levels of the other second connection lines C1~C2, C4~Cn), ... until the second connection line Cn (At this time, the level of the second connecting line Cn is opposite to the levels of the remaining second connecting lines C1~C(n-1)).

Then, switch to the operation of the first connecting line A2. When the first connecting wire A2 is activated (at this time, the level of the first connecting wire A2 is opposite to that of the remaining first connecting wires A1, A3~Am), the detection circuit TC will "sequentially" detect the second connecting wire C1 (At this time, the level of the second connecting line C1 is opposite to the levels of the remaining second connecting lines C2~Cn), the second connecting line C2 (at this time, the level of the second connecting line C2 is the same as the remaining second connecting lines C1, The levels of C3~Cn are opposite), the second connection line C3 (at this time, the level of the second connection line C3 is opposite to the levels of the other second connection lines C1~C2, C4~Cn), ... until the second connection Line Cn (the level of the second connection line Cn is opposite to the level of the other second connection lines C1~C(n-1) at this time).

As for the subsequent switching to the first connecting line A3~Am to actuate in sequence, the situation can be deduced in the same way, so it will not be repeated here.

In practical applications, in the first detection mode, when the second connection line C1 is activated, the detection circuit TC "sequentially" detects the first connection line A1, A2, A3,..., Am and the second connection line C1 Whether the current between the two is abnormal, and the level of the second connecting wire C1 is opposite to the other second connecting wires C2, C3,..., Cn; when the first connecting wire A1 is activated, the detection circuit TC detects "in sequence" Whether the current between the second connecting line C1, C2, C3,..., Cn and the first connecting line A1 is abnormal, and the level of the first connecting line A1 and the remaining first connecting lines A2, A3,..., Am at this time on the contrary. The rest can be deduced in the same way, so I will not repeat them here.

Similarly, in the first detection mode, when the second connection line C2 is activated, the detection circuit TC "sequentially" detects the distance between the first connection line A1, A2, A3,..., Am and the second connection line C2 Whether the current is abnormal, and the level of the second connecting wire C2 is opposite to the other second connecting wires C1, C3,..., Cn; when the first connecting wire A2 is activated, the detection circuit TC detects the second “sequentially” Whether the current between the connecting lines C1, C2, C3,..., Cn and the first connecting line A2 is abnormal, and at this time, the first connecting line A2 and the remaining first connecting lines A1, A3,..., Am have opposite levels. The rest can be deduced in the same way, so I will not repeat them here.

In the first detection mode, when the detection circuit TC detects the first connection line A1, the first connection line A1 and the remaining first connection lines A2, A3,..., Am have the opposite levels; when the detection circuit TC detects the first connection line A1 When the second connection line C1 is connected, the level of the second connection line C1 is opposite to the other second connection lines C2, C3,..., Cn. The rest can be deduced in the same way, so I will not repeat them here.

Similarly, in the first detection mode, when the detection circuit TC detects the first connection line A2, the first connection line A2 and the other first connection lines A1, A3,..., Am have opposite levels; when the detection circuit TC When the second connection line C2 is detected, the level of the second connection line C2 is opposite to the other second connection lines C1, C3,..., Cn. The rest can be deduced in the same way, so I will not repeat them here.

In practical applications, when the detection circuit TC executes the first detection mode, the detection circuit TC can detect a variety of common abnormal conditions of the light-emitting diode display panel, such as an open light-emitting diode, the first connection line and its neighboring first Abnormal conditions such as short circuit between connecting wires, short circuit between the second connecting wire and its adjacent second connecting wire, excessive resistance of the light-emitting diode or connection path, and excessive resistance of the second connecting wire, but not Limited by this.

As shown in Figure 3, in the second detection mode, when any of the n second connection lines C1 to Cn is activated, the detection circuit TC will "simultaneously" detect the m first connections Line A1~Am, where j=1~n.

For example, when the second connection line C1 is activated (the level of the second connection line C1 is opposite to the level of the remaining second connection lines C2~Cn), the detection circuit TC will "simultaneously" detect the first connection line A1, A2, A3,..., Am. Similarly, when the second connection line C2 is activated (the level of the second connection line C2 is opposite to the levels of the other second connection lines C1, C3~Cn), the detection circuit TC will "simultaneously" detect the first connection Lines A1, A2, A3,..., Am. The rest can be deduced in the same way, so I will not repeat them here.

In practical applications, in the second detection mode, when the second connection line C1 is activated (at this time, the level of the second connection line C1 is opposite to the levels of the remaining second connection lines C2~Cn), the detection circuit TC is "Simultaneously" detect whether the current between the first connection line A1, A2, A3, ..., Am and the second connection line C1 is abnormal. In the same way, when the second connection line C2 is activated (the level of the second connection line C2 is opposite to the levels of the remaining second connection lines C1, C3~Cn), the detection circuit TC detects the first connection "simultaneously" Whether the current between the lines A1, A2, A3,..., Am and the second connecting line C2 is abnormal. The rest can be deduced in the same way, so I will not repeat them here.

When the detection circuit TC executes the second detection mode, the detection circuit TC can detect a variety of common abnormal conditions of the light-emitting diode display panel, such as an open light-emitting diode, a short circuit between the first connection line and the second connection line, Abnormal conditions such as a short circuit between the second connection line and its adjacent second connection line, excessive resistance of the light-emitting diode or connection path, and excessive resistance of the second connection line, but not limited to this.

As shown in Figure 4, in the third detection mode, when any one of the m first connection wires A1~Am is activated, the detection circuit TC will "simultaneously" detect the n second connections Line C1~Cn, where i=1~m.

For example, when the first connection wire A1 is activated (the level of the first connection wire A1 is opposite to the level of the other first connection wires A2~Am), the detection circuit TC will "simultaneously" detect the second connection wire C1, C2, C3,..., Cn. In the same way, when the first connection wire A2 is activated (at this time, the level of the first connection wire A2 is opposite to that of the other first connection wires A1, A3~Am), the detection circuit TC will "simultaneously" detect the second connection Lines C1, C2, C3,..., Cn. The rest can be deduced in the same way, so I will not repeat them here.

In practical applications, in the third detection mode, when the first connection wire A1 is activated (at this time, the level of the first connection wire A1 is opposite to the level of the other first connection wires A2~Am), the detection circuit is at the same time It is detected whether the current between the second connection line C1, C2, C3,..., Cn and the first connection line A1 is abnormal. In the same way, when the first connecting wire A2 is activated (at this time, the level of the first connecting wire A2 is opposite to that of the remaining first connecting wires A1, A3~Am), the detection circuit detects the second connecting wire C1 at the same time. Whether the current between C2, C3,..., Cn and the first connecting line A2 is abnormal. The rest can be deduced in the same way, so I will not repeat them here.

When the detection circuit TC executes the third detection mode, the detection circuit TC can detect many common abnormal conditions of the light-emitting diode display panel, such as open light-emitting diode, short circuit between the first connection line and the second connection line, and the first connection line. Abnormal conditions such as a short circuit between a connection line and its adjacent first connection line, excessive resistance of the light-emitting diode or connection path, and excessive resistance of the second connection line, but not limited to this.

It should be noted that the detection circuit TC of the present invention may first execute the second detection mode or the third detection mode for abnormal detection, and then determine that the number of abnormal light-emitting diodes detected is greater than one or equal to one.

If the number of abnormal light-emitting diodes detected by the detection circuit TC is greater than 1, it means that the light-emitting diode display panel has multiple different light-emitting diodes with abnormal conditions. Therefore, the detection circuit TC needs to perform more detailed detections. The first detection mode is used to locate the abnormal LEDs; if the number of abnormal LEDs detected by the detection circuit TC is equal to 1, it means that only one LED of the LED display panel is abnormal If the condition occurs, the detection circuit TC only needs to execute the second detection mode or the third detection mode to smoothly locate the light-emitting diode that has an abnormal condition.

Thereby, the detection circuit TC of the present invention can quickly and accurately find out one or more light-emitting diodes with abnormal conditions in the light-emitting diode display panel, and can further determine whether it is necessary to detect abnormalities according to the detection results. The light-emitting diode performs subsequent repair operations.

Please refer to Figures 5 to 10 respectively. Figures 5 to 10 respectively illustrate the light-emitting diode display panel detection device of the present invention applied to the light-emitting diode open detection (Open) detection and the light-emitting diode short circuit (Short) detection. , Short-circuit detection between two adjacent first connection lines, short-circuit detection between two adjacent second connection lines, detection of whether the resistance value of the light-emitting diode or its coupling path is too high, the second connection Schematic diagram of detecting whether the resistance of the wire is too high.

As shown in FIG. 5, the detection circuit TC can execute the first detection mode, the second detection mode, or the third detection mode to detect that the light-emitting diode LED11 has an open circuit OP.

For example, in the first detection mode, when the second connection line C1 is activated, the detection circuit TC can provide the voltage VH on the first connection line A1 and provide zero voltage on the remaining first connection lines A2~Am, and in the first connection line A2~Am. The two connecting wires C1 provide zero voltage and the remaining second connecting wires C2 to Cn provide a voltage VH to detect whether the current of the first connecting wire A1 is much smaller than the current IH corresponding to the voltage VH. If the measured current is much smaller than the current IH, it means there is an open OP phenomenon here. The rest can be deduced by analogy, so I won’t repeat them here.

As shown in FIG. 6, the detection circuit TC can execute the first detection mode, the second detection mode, or the third detection mode to detect the occurrence of a short circuit SH between the first connection line A1 and the second connection line C1.

For example, in the second detection mode, when the second connection line C1 is activated, the detection circuit TC can provide the voltage VL on both the first connection lines A1~Am, and provide the zero voltage on the second connection line C1 and the rest The second connecting wires C2~Cn provide the voltage VH to detect whether the current of the first connecting wires A1~Am is much larger than the current IL corresponding to the voltage VL. If the measured current is much larger than the current IL, it means there is a short-circuit SH phenomenon here. The rest can be deduced by analogy, so I won’t repeat them here.

As shown in FIG. 7, the detection circuit TC can execute the first detection mode, the second detection mode, or the third detection mode to detect a short circuit SH between two adjacent first connecting lines A1 and A2.

For example, in the first detection mode, when the second connection line C1 is activated, the detection circuit TC can provide a voltage VL on the first connection line A1 and a zero voltage on the remaining first connection lines A2~Am, and The second connection line C1 provides zero voltage and the remaining second connection lines C2~Cn provide voltage VH to detect whether the current of the first connection line A1 is much greater than the current IL corresponding to the voltage VL; then, when switching to the first connection line In the case of A2, the detection circuit TC can provide a voltage VL on the first connection line A2 and a zero voltage on the remaining first connection lines A1, A3~Am, and provide a zero voltage on the second connection line C1 and on the remaining second connection lines C2 ~Cn provides the voltage VH to detect whether the current of the first connection line A2 is much greater than the current IL corresponding to the voltage VL. In this embodiment, the measured current of the first connection line A1 and the current of the first connection line A2 are both much larger than the current IL, which means that there is a short circuit SH between the adjacent first connection lines A1 and A2. Phenomenon. The rest can be deduced by analogy, so I won’t repeat them here.

As shown in FIG. 8, the detection circuit TC can execute the first detection mode, the second detection mode, or the third detection mode to detect the occurrence of a short circuit SH between two adjacent second connecting lines C1 and C2.

For example, in the second detection mode, the detection circuit TC can provide the voltage VL on the first connection line A1~Am, and provide the zero voltage on the second connection line C1 and provide the voltage on the remaining second connection lines C2~Cn VH, to detect whether the current of the first connection line A1~Am is much smaller than the current IH corresponding to the voltage VH; then, when switching to the second connection line C2, the detection circuit TC can be provided on the first connection line A1~Am Voltage VL, and provide zero voltage on the second connection line C2 and provide voltage VH on the remaining second connection lines C1, C3~Cn to detect whether the current of the first connection line A1~Am is much smaller than the current IH corresponding to the voltage VH . In this embodiment, the current measured under the above two switching conditions will be much smaller than the current IH corresponding to the voltage VH, which means that there is a short-circuit SH between the adjacent second connecting lines C1 and C2. . The rest can be deduced by analogy, so I won’t repeat them here.

As shown in FIG. 9, the detection circuit TC can execute the first detection mode, the second detection mode, or the third detection mode to detect whether the resistance value R of the light emitting diode (such as the LED 11) or its coupling path is too high.

For example, in the second detection mode, the detection circuit TC can provide the voltage VH on the first connection line A1~Am, and provide the zero voltage on the second connection line C1 and provide the voltage on the remaining second connection lines C2~Cn VH, to detect whether the current of the first connection line A1 is less than the current IH corresponding to the voltage VH, and the current of the remaining first connection lines A2~Am will be less than the current IL corresponding to the voltage VL. If the current of the first connection wire A1 is less than the current IH corresponding to the voltage VH and the currents of the remaining first connection wires A2~Am are less than the current IL corresponding to the voltage VL, it represents the light emitting diode LED11 (or its coupling path) If the resistance value R is too high, it may cause insufficient brightness. The rest can be deduced by analogy, so I won’t repeat them here.

As shown in FIG. 10, the detection circuit TC can execute the first detection mode, the second detection mode, or the third detection mode to detect whether the resistance value R of the second connection line (for example, C1) is too high. Excessive resistance of the first connecting wire or the second connecting wire may cause uneven display brightness of the light emitting diode display panel.

For example, in the first detection mode, when the second connection line C1 is activated, the detection circuit TC can provide the voltage VH on the first connection line A1 and provide zero voltage on the remaining first connection lines A2~Am, and in the first connection line A2~Am. The two connecting wires C1 provide zero voltage and the remaining second connecting wires C2 to Cn provide voltage VH to detect whether the current of the first connecting wire A1 is less than the current IH corresponding to the voltage VH. Then, when switching to the first connection line A2, the detection circuit TC can provide the voltage VH on the first connection line A2 and provide zero voltage on the remaining first connection lines A1, A3~Am to detect the current of the first connection line A2 Is it smaller than the current IH corresponding to the voltage VH. By analogy, since the resistance value R of the second connecting wire C1 is too high, the currents of the first connecting wires A1 to Am detected by the detection circuit TC are all smaller than the current IH. As for switching to the other second connecting lines C2~Cn to act, since the resistance value R of the second connecting lines C2~Cn is not too high, there is no case where the current of the first connecting line A1~Am is less than the current IH.

Please refer to FIG. 11. FIG. 11 is a schematic diagram showing the range of the current detection result. As shown in Figure 11, when the above-mentioned various abnormal phenomena occur, there will be different correspondences between voltage and current. Among them, IO is the current value of the open circuit judgment; IS is the current value of the short-circuit judgment; IR is the current value of the high resistance judgment.

Under different voltages VCA, when the current ID ≤ the open circuit judgment current value IO, it means that there is an open circuit OP phenomenon; when the current ID ≥ the short circuit judgment current value Is, it represents a short circuit SH phenomenon occurs. In addition, because the resistance value R is too high, it will cause the voltage drop of the light-emitting diode, so under the same bias condition, a smaller high resistance judgment current value IR will be obtained (as shown in the high resistance region HR in Figure 11). ). As for passing the detection area PASS, it means that there is no abnormal situation, so it can pass the detection.

Another specific embodiment according to the present invention is a light emitting diode display panel inspection method.

In this embodiment, the light-emitting diode display panel inspection method is used to inspect the light-emitting diode display panel. The light-emitting diode display panel includes (m*n) light-emitting diodes, where m and n are both positive integers. The detection method of a light-emitting diode display panel includes the following steps:

Provide m first connection lines, n second connection lines and a detection circuit, wherein each first connection line is respectively coupled to the anode of n light-emitting diodes and each second connection line is respectively coupled to m light-emitting diodes The negative pole of the polar body; and

The detection circuit TC selectively executes at least one of the first detection mode, the second detection mode, and the third detection mode for the (m*n) light-emitting diodes to detect abnormal light-emitting diodes.

In the first detection mode, when any of the n second connection lines is activated, the detection circuit sequentially detects the m first connection lines; when any of the m first connection lines When a first connection line is activated, the detection circuit sequentially detects the n second connection lines. In the second detection mode, when the second connection line is activated, the detection circuit detects the m first connection lines at the same time. In the third detection mode, when any one of the m first connection lines is activated, the detection circuit detects the n second connection lines at the same time.

Please refer to FIG. 12. FIG. 12 is a flowchart of the light-emitting diode display panel inspection method in this embodiment.

As shown in FIG. 12, the detection method of a light-emitting diode display panel may include the following steps:

Step S11: the detection circuit is switched to the second detection mode or the third detection mode;

Step S12: Perform abnormality detection;

If the abnormality detection result of step S12 is yes, then perform step S13: determine whether the number of abnormal light-emitting diodes detected is greater than one; if the abnormality detection result of step S12 is no, then perform step S16: complete the abnormality detection;

If the judgment result of step S13 is yes, that is, the number of abnormal light-emitting diodes is greater than 1, then steps S14~S16 are performed in sequence: the detection circuit switches to the first detection mode and locates the abnormal light-emitting diodes to complete the abnormality Detection; if the judgment result of step S13 is no, that is, the number of abnormal light-emitting diodes is equal to 1, then directly execute steps S15 and S16: after the abnormal light-emitting diodes are located, the abnormality detection is completed;

Step S17: After the abnormality detection is completed, it is determined whether the abnormal light-emitting diode needs to be repaired;

If the judgment result of step S17 is yes, then step S18: repair the abnormal light-emitting diode is executed; and if the judgment result of step S17 is no, then the whole light-emitting diode display panel inspection process is ended.

Compared with the prior art, the light-emitting diode display panel inspection device and the light-emitting diode display panel inspection method of the present invention use the output channel of the light-emitting diode display drive circuit to selectively transmit light through three different detection modes. The abnormal detection of all light-emitting diodes of the diode display panel can not only effectively detect a variety of common abnormal conditions of the light-emitting diode display panel (such as open circuit, short circuit or excessive resistance), but also greatly shorten the light emission. The detection time required for the detection of all the light-emitting diodes of the diode display panel can effectively improve the detection efficiency of the light-emitting diode display panel. In addition, the present invention can further determine whether the abnormal light-emitting diode needs to be repaired according to the above-mentioned detection result.

Based on the above detailed description of the preferred embodiments, it is hoped that the characteristics and spirit of the present invention can be described more clearly, and the scope of the present invention is not limited by the preferred embodiments disclosed above. On the contrary, its purpose is to cover various changes and equivalent arrangements within the scope of the patent for which the present invention is intended.

S11~S18: steps VTH: critical voltage ITH: critical current I: current IH: current IL: current V: voltage VH: Voltage VL: Voltage TC: detection circuit A1~Am: the first connection line C1~Cn: second connection line LED11~LEDmn: light-emitting diode OP: Open SH: short circuit R: resistance value PASS: Pass the detection area IS: Short circuit judgment current value IR: High resistance judgment current value IO: Open circuit judgment current value HR: High resistance area ID: current VCA: Voltage

The drawings of the present invention are described as follows: Fig. 1 is a schematic diagram showing the variation curve of the voltage difference of the light-emitting diode versus the current. FIG. 2 is a schematic diagram showing when the light-emitting diode display panel inspection device of the present invention operates in the first inspection mode. FIG. 3 is a schematic diagram showing when the light-emitting diode display panel inspection device of the present invention operates in a second inspection mode. 4 is a schematic diagram showing when the light-emitting diode display panel inspection device of the present invention operates in the third inspection mode. FIG. 5 is a schematic diagram illustrating the application of the light-emitting diode display panel inspection device of the present invention to the light-emitting diode open detection. FIG. 6 is a schematic diagram showing the application of the light-emitting diode display panel inspection device of the present invention for short-circuit detection between the first connection line and the second connection line. FIG. 7 is a schematic diagram illustrating the application of the light-emitting diode display panel inspection device of the present invention to short-circuit (Short) detection between two first connecting lines. FIG. 8 is a schematic diagram showing the application of the light-emitting diode display panel inspection device of the present invention to short-circuit (Short) detection between two second connecting lines. FIG. 9 is a schematic diagram of the light-emitting diode display panel detection device of the present invention detecting whether the resistance value of the light-emitting diode or its coupling path is too high. FIG. 10 is a schematic diagram of the light-emitting diode display panel detection device of the present invention detecting whether the resistance value of the second connection line is too high. FIG. 11 is a schematic diagram showing the range of current detection results. FIG. 12 shows a flow chart of a method for detecting a light-emitting diode display panel according to another preferred embodiment of the present invention.

S11~S18: steps

Claims (2)

A method for detecting a light-emitting diode display panel is used to detect a light-emitting diode display panel. The light-emitting diode display panel includes (m*n) light-emitting diodes, wherein m and n are both positive integers. The detection method of a light-emitting diode display panel includes the following steps: providing m first connection lines, n second connection lines, and a detection circuit, wherein each first connection line is respectively coupled to the anode of n light-emitting diodes and Each second connecting line is respectively coupled to the negative poles of m light-emitting diodes; and the detection circuit selectively executes a first detection mode, a second detection mode, and the (m*n) light-emitting diodes At least one of a third detection mode to detect abnormal light-emitting diodes; wherein, in the first detection mode, when any one of the n second connection lines is activated, the The detection circuit sequentially detects the m first connection lines. When any one of the m first connection lines is activated, the detection circuit sequentially detects the n second connection lines; In the detection mode, when any one of the second connecting wires is activated, the detection circuit detects the m first connecting wires at the same time; in the third detection mode, when the any one of the first connecting wires is activated, the detecting circuit Detect the n second connection lines at the same time; in the first detection mode, when any second connection line is activated, the any second connection line and the rest of the n second connection lines (n- 1) The level of the second connecting line is opposite; when any one of the first connecting lines is activated, the any one of the first connecting lines is connected to the remaining (m-1) of the m first connecting lines The levels of the lines are reversed. A light-emitting diode display panel detection device is used to detect a light-emitting diode display panel. The light-emitting diode display panel includes (m*n) light-emitting diodes, where m and n are both positive integers. The light-emitting diode display panel detection device includes: m first connection lines, each first connection line is respectively coupled to the positive poles of n light-emitting diodes; n second connection lines, each second connection line is respectively coupled to the negative poles of m light-emitting diodes; And a detection circuit for selectively executing at least one of a first detection mode, a second detection mode, and a third detection mode for the (m*n) light-emitting diodes to detect abnormalities Light emitting diode; wherein, in the first detection mode, when any second connection line of the n second connection lines actuates, the detection circuit sequentially detects the m first connection lines, when the When any one of the m first connection wires is activated, the detection circuit sequentially detects the n second connection wires; in the second detection mode, when any of the second connection wires is activated, The detection circuit detects the m first connection wires at the same time; in the third detection mode, when any one of the first connection wires is activated, the detection circuit detects the n second connection wires at the same time; in the first detection mode In the mode, when the any second connection line is activated, the level of the any second connection line is opposite to the remaining (n-1) second connection lines of the n second connection lines; when the any When a first connecting line is activated, the level of any one of the first connecting lines is opposite to the remaining (m-1) first connecting lines of the m first connecting lines.

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