TWI748731B - Chip over current and over temperature protection method - Google Patents

Abstract

A chip over current and over temperature protection method is disclosed. The current supply is controlled by a control module. The protection method includes detecting an output current of the chip by a current detection module and sensing an operation temperature of the chip by a temperature sensing module. When the output current reaches a current threshold value, the control module maintains the output current at the current threshold value. When the output current is maintained for a current maintain time, the control module stop the current supply to the chip. When the operation temperature is back to a restart threshold value, the control module continuously stop current supply for a close delay time, then restart the current supply to the chip.

Description

Chip overcurrent and overtemperature protection method

The invention relates to a chip overcurrent and overtemperature protection method, in particular to a chip overcurrent and overtemperature protection method that can reduce power consumption and average temperature without adjusting the overcurrent threshold and the overtemperature threshold.

Inside the computer system or various electronic devices, various control chips and drive chips have been installed to realize the operation of various control circuits and drive circuits. Today’s chip volume is developing towards miniaturization, and the frequency and performance of operation have also been greatly improved. A slight abnormality in the circuit design or production process of the chip may affect the function of the chip and cause abnormal current drive and operation inside the chip. The temperature inside may also increase substantially accordingly.

The existing chip will be equipped with an over-current protection or over-temperature protection mechanism. When the internal current reaches a critical value, the current is controlled to prevent the store flow from continuously increasing until the abnormality is eliminated and the normal operating current is restored. Over-temperature protection is to close the circuit or activate the cooling device when the temperature reaches a critical value to prevent the wafer temperature from rising continuously. However, under these protection mechanisms, the critical values of overcurrent and overtemperature are often preset fixed values, which are difficult to adjust according to the demand of the chip. As a result, excessive power consumption or excessive temperature is consumed in the process of protecting the chip. Risk of chip damage.

In summary, the inventor of the present invention considered and designed a chip overcurrent and overtemperature protection method, in order to improve the problems of the conventional technology, and further enhance the industrial application.

In view of the problems described in the prior art, the purpose of the present invention is to provide a chip over-current and over-temperature protection method to avoid chip damage caused by excessive current or high temperature during operation of the chip.

Based on the above objective, the present invention provides a chip overcurrent and overtemperature protection method. A control module controls the current supply of the chip. The chip protection method includes: detecting the passing current of the chip by the current detection module; The sensing module senses the operating temperature of the chip; when the passing current reaches the current threshold, the control module maintains the passing current at the current threshold; when the holding current threshold continues to reach the current holding time, the control module stops the current supply to the chip ; And when the operating temperature returns to the restart threshold, the control module continues to stop the current supply for the shutdown delay time, and restarts the current supply of the chip.

Preferably, the current maintaining time may include when the operating temperature reaches the temperature threshold, the control module stops the current supply to the chip.

Preferably, the shutdown delay time may include when the operating temperature drops to the restart temperature value, the control module restarts the current supply of the chip.

Preferably, the chip over-current and over-temperature protection method may further include: when the chip's current supply is restarted, if the passing current is still at the current threshold, the control module maintains the passing current at the current threshold; when the current threshold is maintained When the current sustaining time is continuously reached, the control module stops the current supply of the chip; and when the operating temperature returns to the restart threshold, the control module continues to stop the current supply for the off delay time, and then restarts the current supply of the chip.

Preferably, the chip overcurrent and overtemperature protection method may further include: when the chip's current supply is restarted, if the passing current is lower than the current threshold, the current detection module continuously detects whether the passing current reaches the current threshold.

Preferably, the turn-off delay time can be twice the current holding time.

Preferably, the temperature threshold may be 150°C, and the restart threshold may be 110°C.

In summary, according to the chip overcurrent and overtemperature protection method of the present invention, it can have one or more of the following advantages:

(1) This chip over-current and over-temperature protection method can reduce the power consumption of chip operation and improve the efficiency of chip operation without changing the current threshold, temperature threshold and restart threshold.

(2) This chip over-current and over-temperature protection method can reduce the average temperature of the chip without changing the current threshold, temperature threshold and restart threshold, avoiding damage to the chip due to high temperature, and increasing the durability of the chip. Reliability.

(3) This chip over-current and over-temperature protection method can prevent the chip from being damaged due to excessive current or operating temperature during operation, and increase the service life of the chip.

In order to facilitate the reviewers to understand the technical features, content and advantages of the present invention and the effects that can be achieved, the present invention is described in detail with the accompanying drawings and in the form of embodiment expressions as follows, and the diagrams used therein are The subject matter is only for the purpose of illustration and auxiliary description, and may not be the true proportions and precise configuration after the implementation of the invention. Therefore, it should not be interpreted in terms of the proportions and configuration relationships of the attached drawings, and should not limit the scope of rights of the present invention in actual implementation. Hexian stated.

Please refer to FIG. 1, which is a flowchart of a chip overcurrent and overtemperature protection method according to an embodiment of the present invention. As shown in the figure, the chip over-current and over-temperature protection method includes the following steps (S11~S15):

Step S11: Detect the passing current of the chip by the current detection module. For the chips in electronic devices, including various driving chips and control chips, related sensing elements can be set to monitor the operating status of the chips to prevent the chips from being damaged due to abnormal electrical properties or temperature. First, set up a current detection module in the chip, which can be a comparison circuit, connected to the selected operation node in the chip circuit, to detect whether the current through the operation node exceeds the critical current, and then determine whether there is a circuit abnormality in the chip Or short-circuit and cause abnormal operation.

Step S12: Sensing the operating temperature of the chip by the temperature sensing module. In addition to detecting the passing current of the chip, a temperature sensing module is also provided to sense the operating temperature of the chip. For example, a temperature sensor is set to measure the temperature of the predetermined contacts in the chip. When the chip is in operation, the operating temperature range is set, and related heat dissipation or cooling devices are also designed to reduce the operating temperature. If the operating temperature exceeds the set critical temperature, it may affect the operation of the chip, and even cause internal circuit damage and affect the chip The original function.

Step S13: When the passing current reaches the current threshold, the control module maintains the passing current at the current threshold. The current detection module in the chip will continuously detect the passing current of the chip. When the passing current exceeds the preset current threshold, in order to protect the internal circuits of the chip, the chip's control module will control the passing current to maintain the current threshold. Avoid the continuous increase of the current through which the internal circuit can withstand the load. In this embodiment, the control module includes an overcurrent protection circuit. When the through current of the operating node continues to increase to reach the current threshold, the overcurrent protection circuit is activated to lock the through current at a fixed value.

Step S14: When the maintenance current threshold value continues to reach the current maintenance time, the control module stops the current supply of the chip. When the over-current protection circuit is activated, the through current of the chip will continue to be maintained at the current threshold until the cause of the through current rise is removed, that is, when the through current is detected to decrease or return to normal, the lock will be released. However, continuously maintaining the passing current at a high current condition will continue to increase the power consumption of the chip and the entire electronic device, causing unnecessary waste. Therefore, when the current threshold value is maintained for a preset current sustaining time, the control module The current supply of the chip is cut off, that is, the operating circuit system of the chip is turned off to reduce the current to zero, so that the chip no longer consumes power continuously, and reduces the power consumption of the chip.

Under the goal of reducing chip power consumption, the most direct way of operation is to lower the current threshold, so that the overall current supply can be reduced, but the current threshold set by the general over-current protection circuit is fixed, and it is difficult to directly change it to match. Different chip requirements. Therefore, by shutting down the chip system after the current maintenance time to stop the current supply, the power consumption can be reduced without changing the preset current threshold.

In this embodiment, the preset current holding time can be determined in accordance with the operating temperature sensed by the temperature sensing module. As the operating current continues to rise, it is often accompanied by an increase in operating temperature, which will cause the passing current to rise. Until the cause is resolved, the operating temperature of the wafer will continue to rise. When the operating temperature sensed by the temperature sensing module reaches the temperature threshold, the over-temperature protection circuit of the control module closes the operating circuit system of the chip, so that the passing current is reduced to zero, which not only reduces power consumption, but also shuts down System to cool down the wafer. In another embodiment, the preset current maintenance time can also be a fixed preset time interval, that is, the current supply is cut off at a fixed time to reduce the power consumption of the chip.

Step S15: When the operating temperature returns to the restart threshold, the control module restarts the current supply of the chip after continuously stopping the current supply for the off delay time. Since the control module will close the circuit so that the chip no longer receives current supply, the operating temperature of the chip will decrease over time when it is not operating. When the operating temperature sensed by the temperature sensing circuit drops to the restart threshold, the The temperature protection circuit should restart the chip to resume operation. However, in order to reduce the operating temperature of the chip, a control circuit is provided in the control module. The time for the chip to restore power is delayed, increasing the time for the chip to cool down.

In this embodiment, the turn-off delay time can be a preset fixed time, for example, the turn-off delay time is twice the current holding time. When the temperature sensing circuit senses that the operating temperature reaches the restart threshold, the control circuit delays twice. The current is maintained for the time, so that the chip restarts after the turn-off delay time has elapsed. In another embodiment, the turn-off delay time can also be matched with the temperature sensing module. When the operating temperature continues to drop to the temperature threshold, the current supply to the chip is restarted. Delaying the restart time of the chip is mainly to reduce the temperature of the chip. However, the general over-temperature protection circuit, the temperature threshold for starting the over-temperature protection and the restart threshold for power recovery are fixed, and it is difficult to adjust with the demand of the chip. When the normal temperature operating range of the wafer is low, the operating temperature can be further reduced by the turn-off delay time, thereby reducing the average temperature of the wafer to conform to the normal operating range of the wafer, and avoiding damage to the circuit or structure of the wafer caused by high temperature.

Please refer to FIG. 2, which is a flowchart of a chip over-current and over-temperature protection method according to another embodiment of the present invention. As shown in the figure, the chip over-current and over-temperature protection method includes the following steps (S21~S26):

Step S21: Detect the passing current of the chip by the current detection module; Step S22: Detect the operating temperature of the chip by the temperature detection module; Step S23: When the passing current reaches the current threshold, the control module maintains Pass the current to the current threshold; Step S24: When the maintenance current threshold continues to reach the current maintenance time, the control module stops the current supply to the chip; and Step S25: When the operating temperature returns to the restart threshold, the control module continues to stop the current After the supply shutdown delay time, the current supply to the chip is restarted. The content of the above steps S21 to S25 corresponds to the steps S11 to S15 of the foregoing embodiment, and the same technical content will not be described repeatedly, please refer to the description in Figure 1.

Different from the foregoing embodiment, this embodiment includes step S26: judging whether the through current is still the current threshold value. If yes, return to step S23: when the passing current reaches the current threshold, the control module maintains the passing current at the current threshold. After step S25 is over, restart the chip operating system to supply power to the chip. If it is determined that the passing current is still maintained at the current threshold, it means that the chip is still in an overcurrent state, and the problem of excessive current is not solved. At this time, the control mode The group will continue to maintain the passing current at the current threshold, and also after the current holding time has elapsed, stop the current supply to the chip to reduce power consumption. In addition, when the operating temperature returns to the restart threshold, the control module continues to stop the current supply for a shutdown delay time before restarting the current supply to the chip. Since the overcurrent state may be caused by a short circuit or open circuit, it cannot be eliminated immediately. Therefore, repeating the operation process of this embodiment can continuously reduce the power consumption and average temperature of the chip until the abnormal circuit state is eliminated.

Also in step S26, when the abnormal state is eliminated, the passing current of the chip should return to normal and drop below the current threshold. At this time, the operation of the chip returns to normal. Return to step S21 to continuously monitor the passing current and step S22 to sense the operating temperature. , If there is an abnormality in the passing current or the operating temperature, the subsequent steps of over-current and over-temperature protection will be continued.

Please refer to FIG. 3, which is a schematic diagram of a chip over-current and over-temperature protection method according to an embodiment of the present invention. The actual operating state of the chip, the operating temperature T sensed by the temperature sensing module and the passing current I sensed by the current sensing module, the temperature and current magnitude displayed on the time axis t are shown in the figure. At the initial time t0, the chip receives current and starts, but the internal circuit of the chip is short-circuited or open, causing the circuit to operate abnormally. The passing current I continues to rise after exceeding the operating current, and the operating temperature T of the chip also continues to rise accordingly. . At the first time point t1, the passing current I reaches the current threshold I _OCP , in order to protect the chip, the overcurrent protection circuit will lock the circuit and control the passing current I to maintain the current threshold I _OCP without rising anymore, waiting for failure or abnormality exclude.

However, when the passing current I is continuously maintained at the current threshold I _OCP , the chip is still in an abnormal operation state, and the high current also continues to increase the operating temperature T of the chip. In order to avoid the continuous increase in temperature and reduce the power consumption of the chip, when maintaining When the time reaches the preset current maintenance time t _det , the control module of the chip turns off the chip operating system and stops the current supply to the chip, that is, at the second time point t2, the passing current I drops to zero. In the present embodiment, the current is maintained for the time t _det operating temperature reaches the threshold temperature T _D, through the protection circuit of the system has power control module, such that the wafer can cool the wafer to protect the circuit. When the chip is turned off for a period of time t _{c and} reaches the third time point t3, the operating temperature T drops to the restart threshold value _TR . At this time, the over-temperature protection circuit should restore power to restart the chip, but the control module of the chip further delays its shutdown for a period of time After the delay time t _delay , the chip is restarted at the fourth time point t4 to re-provide the current supply of the chip.

Since the current supply is zero between the second time point t2 and the third time point t3, no electrical energy consumption will be generated. If the off time t _c is twice the current maintenance time t _det , from the first time point t1 Between the third time point t3, the power consumption of the chip is 1/3 of the power consumption when the _{original passing current continues to be the current threshold I OCP.} When the present embodiment further extends the turn-off delay time t _delay , if it is the turn-off delay time t _delay, it is also twice the current holding time t _det . From the first time point t1 to the fourth time point t4, the power of the chip The power consumption is 1/5 of the power consumption when the original passing current continues to be at the current threshold I _OCP. Under the condition that the preset current threshold I _OCP , temperature threshold T _D, and restart threshold _{TR are} not changed, the power consumption of the chip is effectively reduced, and unnecessary power waste is avoided.

On the other hand, if the original threshold temperature of 150 deg.] C and T _D restart threshold T _R of 110 deg.] C, the average temperature of the wafer should be the average of both 130 ℃. However, in this embodiment, after the operating temperature T drops to the restart threshold _TR , the turn-off delay time t _{delay is} further delayed for a period of time. Similarly, the above-mentioned turn-off time t _c and the turn-off delay time t _delay are both the current maintenance time t _det Calculated by 2 times of, when the fourth time point t4, the real restart temperature T _O should be 70°C. The average temperature of the wafer is therefore decreased to 110 deg.] C, the average temperature of the wafer decreased contrast of 20 ℃, when the temperature threshold T _D T _R and restart thresholds are not changed, effectively reducing the average temperature of the wafer.

When the system restarts at the fourth time t4, the chip passing current I is re-supplied. At this time, if the abnormality of the chip has not been eliminated, the chip passing current I will still reach the current threshold I _OCP . At this time, the aforementioned protection method is repeated to maintain the passing the threshold current of the current I I in _{the OCP,} elapsed time t _det current is maintained after the fifth time point t5 shut down the system, to stop the current supply of the wafer, when the wafer is at operating temperature T drops to the sixth time point t6 _{R & lt} restart threshold T and further delayed by a delay the closing time t _delay, the seventh time point t7 reaches restart temperature T _O, the recovery current supply to restart the system. Repeat the above-mentioned over-current and over-temperature protection process until the chip is abnormally eliminated, and the passing current I returns to _{the normal working current lower than the current threshold I OCP} . At this time, the chip’s current detection module and temperature sensing module The passing current I and the operating temperature T are continuously monitored, and when the passing current I reaches the current threshold I _OCP again, the above-mentioned over-current and over-temperature protection procedures are re-executed.

The above descriptions are merely illustrative, and not restrictive. Any equivalent modifications or alterations that do not depart from the spirit and scope of the present invention shall be included in the scope of the appended patent application.

I: Through current I _OCP : Current threshold S11~S15, S21~S26: Step T: Operating temperature T _D : Temperature threshold T _R : Restart threshold T _O : Restart temperature t: Time axis t0: Start time t1: first time point t2: second time point t3: third time point t4: fourth time point t5: fifth time point t6: sixth time point t7: seventh time point t _c : closing time t _delay : Turn-off delay time t _det : current maintenance time

In order to make the technical features, content and advantages of the present invention and the effects it can achieve more obvious, the present invention is illustrated with the following drawings: FIG. 1 is a flowchart of a chip overcurrent and overtemperature protection method according to an embodiment of the present invention. FIG. 2 is a flowchart of a chip overcurrent and overtemperature protection method according to another embodiment of the invention. FIG. 3 is a schematic diagram of a chip overcurrent and overtemperature protection method according to an embodiment of the present invention.

S11~S15: steps

Claims (7)

A chip over-current and over-temperature protection method. A control module controls the current supply of a chip. The chip protection method includes: Detect a passing current of the chip by a current detection module; Sensing an operating temperature of the chip by a temperature sensing module; When the through current reaches a current threshold, the control module maintains the through current at the current threshold; When the current threshold is maintained for a current sustaining time, the control module stops the current supply of the chip; and When the operating temperature returns to a restart threshold, the control module continues to stop the current supply for a turn-off delay time, and then restarts the current supply of the chip. The chip overcurrent and overtemperature protection method of claim 1, wherein the current maintenance time includes when the operating temperature reaches a temperature threshold, the control module stops the current supply of the chip. The chip overcurrent and overtemperature protection method according to claim 1, wherein the shutdown delay time includes when the operating temperature drops to a restart temperature value, the control module restarts the current supply of the chip. The chip overcurrent and overtemperature protection method as described in claim 1, further comprising: When the current supply of the chip is restarted, if the through current is still at the current threshold, the control module maintains the through current at the current threshold; When the current threshold is maintained for the current sustaining time, the control module stops the current supply of the chip; and When the operating temperature returns to the restart threshold, the control module continues to stop the current supply for the shutdown delay time, and then restarts the current supply of the chip. The chip overcurrent and overtemperature protection method as described in claim 1, further comprising: When the current supply of the chip is restarted, if the through current is lower than the current threshold, the current detection module continuously detects whether the through current reaches the current threshold. The chip over-current and over-temperature protection method according to claim 1, wherein the turn-off delay time is twice the current holding time. The chip overcurrent and overtemperature protection method according to claim 2, wherein the temperature threshold is 150°C, and the restart threshold is 110°C.

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