TWI729825B - Driving circuit and shift register - Google Patents
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Abstract
Description
本發明是有關於一種驅動電路與移位暫存器。 The invention relates to a driving circuit and a shift register.
液晶顯示器具有低幅射、低功率等優點,已成為顯示器市場主流。 Liquid crystal displays have the advantages of low radiation and low power, and have become the mainstream of the display market.
液晶顯示器的閘極驅動電路包括複數個移位暫存器。目前的移位暫存器可能具有某些缺點,例如,電路尺寸較大、上升時間與下降時間過長導致操作速度緩慢、需要額外的控制信號導致架構較為複雜。 The gate drive circuit of the liquid crystal display includes a plurality of shift registers. The current shift register may have some disadvantages, for example, the circuit size is large, the rise time and the fall time are too long, which results in slow operation speed, and the need for additional control signals results in a complex structure.
根據本案一實例,提出一種移位暫存器,包括:一掃描電路;一模式控制電路;以及一同步電路,耦接至該掃描電路與該模式控制電路,其中,該模式控制電路決定該移位暫存器操作於一掃描模式或一同步模式;於該掃描模式下,該掃描電路輸出一本級輸出信號;以及於該同步模式下,該同步電路輸出該本級輸出信號。 According to an example of this case, a shift register is proposed, including: a scanning circuit; a mode control circuit; and a synchronization circuit, coupled to the scanning circuit and the mode control circuit, wherein the mode control circuit determines the shift The bit register operates in a scan mode or a synchronization mode; in the scan mode, the scan circuit outputs an output signal of the current stage; and in the synchronization mode, the synchronization circuit outputs the output signal of the current stage.
根據本案一實例,提出一種驅動電路,包括複數級移位暫存器。各該些移位暫存器包括:一掃描電路;一模式控制電路;以及一同步電路,耦接至該掃描電路與該模式 控制電路,其中,該模式控制電路決定該移位暫存器操作於一掃描模式或一同步模式;於該掃描模式下,該些移位暫存器的該些掃描電路依序輸出複數個本級輸出信號;以及於該同步模式下,該些移位暫存器的該些同步電路同步輸出該些本級輸出信號。 According to an example of this case, a driving circuit including a plurality of stages of shift registers is proposed. Each of the shift registers includes: a scanning circuit; a mode control circuit; and a synchronization circuit coupled to the scanning circuit and the mode A control circuit, wherein the mode control circuit determines that the shift register is operated in a scan mode or a synchronization mode; in the scan mode, the scan circuits of the shift registers sequentially output a plurality of copies Stage output signal; and in the synchronization mode, the synchronization circuits of the shift registers synchronously output the current stage output signals.
為了對本發明之上述及其他方面有更佳的瞭解,下文特舉實施例,並配合所附圖式詳細說明如下: In order to have a better understanding of the above and other aspects of the present invention, the following specific examples are given in conjunction with the accompanying drawings to describe in detail as follows:
100:移位暫存器 100: shift register
110:掃描電路 110: Scanning circuit
130:模式控制電路 130: Mode control circuit
150:同步電路 150: Synchronous circuit
112:掃描控制電路 112: Scan control circuit
114:掃描下拉電路 114: Scan pull-down circuit
116:掃描上拉電路 116: Scanning pull-up circuit
152:同步控制電路 152: Synchronous control circuit
154:同步下拉電路 154: Synchronous pull-down circuit
156:同步上拉電路 156: Synchronous pull-up circuit
T1~T14:電晶體 T1~T14: Transistor
C:電容 C: Capacitance
第1圖繪示根據本案一實施例的移位暫存器的電路架構圖。 FIG. 1 shows a circuit structure diagram of a shift register according to an embodiment of the present application.
第2A圖至第2L圖顯示本案實施例的移位暫存器的操作與信號時序圖。 Figures 2A to 2L show the operation and signal timing diagrams of the shift register of the embodiment of the present application.
第3圖顯示本案實施例的多個移位暫存器在同步模式與掃描模式下的信號時序圖。 FIG. 3 shows the signal timing diagram of the multiple shift registers in the synchronous mode and the scan mode of the embodiment of this case.
本說明書的技術用語係參照本技術領域之習慣用語,如本說明書對部分用語有加以說明或定義,該部分用語之解釋係以本說明書之說明或定義為準。本揭露之各個實施例分別具有一或多個技術特徵。在可能實施的前提下,本技術領域具有通常知識者可選擇性地實施任一實施例中部分或全部的技術特徵,或者選擇性地將這些實施例中部分或全 部的技術特徵加以組合。 The technical terms in this specification refer to the customary terms in the technical field. If there are descriptions or definitions for some terms in this specification, the explanation of the part of the terms is based on the description or definitions in this specification. Each embodiment of the present disclosure has one or more technical features. Under the premise of possible implementation, those skilled in the art can selectively implement some or all of the technical features in any embodiment, or selectively combine some or all of the technical features in any of the embodiments. The technical features of the department are combined.
請參照第1圖,其繪示根據本案一實施例的移位暫存器的電路架構圖。液晶顯示裝置的閘極驅動電路可以包括多級的移位暫存器。第1圖的本案實施例的移位暫存器可用以實現各級移位暫存器。 Please refer to FIG. 1, which shows a circuit structure diagram of a shift register according to an embodiment of the present application. The gate drive circuit of the liquid crystal display device may include a multi-stage shift register. The shift register of the embodiment of the present application shown in FIG. 1 can be used to implement various levels of shift register.
如第1圖所示,本案實施例的移位暫存器100包括:掃描電路110、模式控制電路130與同步電路150。同步電路150耦接至掃描電路110與模式控制電路130。掃描電路110包括:掃描控制電路112、掃描下拉電路114與掃描上拉電路116。同步電路150包括:同步控制電路152、同步下拉電路154與同步上拉電路156。掃描控制電路112包括電晶體T1~T4。掃描下拉電路114包括電晶體T5。掃描上拉電路116包括電晶體T6。模式控制電路130包括電晶體T7~T8。同步控制電路152包括電晶體T9~T12與電容C。同步下拉電路154包括電晶體T13。同步上拉電路156包括電晶體T14。
As shown in FIG. 1, the
電晶體T1包括:源極,接收起始信號STV或前一級移位暫存器的輸出信號或前幾級移位暫存器的輸出信號;閘極,接收時脈信號CK1~CK3之一;以及汲極,耦接至節點SQ。在本案實施例中,於第N級移位暫存器中(N為正整數),電晶體T1的閘極接收時脈信號CK3;於第N+1級移位暫存器中,電晶體T1的閘極接收時脈信號CK1;於第N+2級移位暫存器中,電晶體T1的閘極接收時脈信號CK2。 Transistor T1 includes: a source, which receives the start signal STV or the output signal of the previous stage of shift register or the output signal of the previous stages of shift register; the gate, which receives one of the clock signals CK1~CK3; And the drain is coupled to the node SQ. In the embodiment of this case, in the Nth stage shift register (N is a positive integer), the gate of the transistor T1 receives the clock signal CK3; in the N+1 stage shift register, the transistor The gate of T1 receives the clock signal CK1; in the N+2 stage shift register, the gate of the transistor T1 receives the clock signal CK2.
電晶體T2包括:源極,接收參考電壓VGH(其為高位準參考電壓);閘極,耦接至節點SQ;以及汲極,耦接至節點SBT。 The transistor T2 includes: a source, which receives a reference voltage VGH (which is a high-level reference voltage); a gate, which is coupled to the node SQ; and a drain, which is coupled to the node SBT.
電晶體T3包括:源極,接收參考電壓VGH;閘極,耦接至節點SBT;以及汲極,耦接至節點SQ。 The transistor T3 includes: a source, which receives the reference voltage VGH; a gate, which is coupled to the node SBT; and a drain, which is coupled to the node SQ.
電晶體T4包括:源極,耦接至節點SBT;閘極與汲極,接收時脈信號CK1~CK3之一者。在本案實施例中,於第N級移位暫存器中(N為正整數),電晶體T4的汲極接收時脈信號CK2;於第N+1級移位暫存器中,電晶體T4的汲極接收時脈信號CK3;於第N+2級移位暫存器中,電晶體T4的汲極接收時脈信號CK1。 The transistor T4 includes: a source, which is coupled to the node SBT; a gate and a drain, which receive one of the clock signals CK1 to CK3. In the embodiment of this case, in the Nth stage shift register (N is a positive integer), the drain of the transistor T4 receives the clock signal CK2; in the N+1 stage shift register, the transistor The drain of T4 receives the clock signal CK3; in the N+2 stage shift register, the drain of the transistor T4 receives the clock signal CK1.
電晶體T5包括:源極,接收參考電壓VGH;閘極,耦接至節點SBT;以及汲極,輸出本級輸出信號SQ_OUT。 The transistor T5 includes: a source, which receives the reference voltage VGH; a gate, which is coupled to the node SBT; and a drain, which outputs the output signal SQ_OUT of this stage.
電晶體T6包括:源極,輸出本級輸出信號SQ_OUT;閘極,耦接至節點SQ;以及汲極,接收時脈信號CK1~CK3之一者。在本案實施例中,於第N級移位暫存器中(N為正整數),電晶體T6的汲極接收時脈信號CK1;於第N+1級移位暫存器中,電晶體T6的汲極接收時脈信號CK2;於第N+2級移位暫存器中,電晶體T6的汲極接收時脈信號CK3。 The transistor T6 includes: a source, which outputs the output signal SQ_OUT of the current stage; a gate, which is coupled to the node SQ; and a drain, which receives one of the clock signals CK1~CK3. In the embodiment of this case, in the Nth stage shift register (N is a positive integer), the drain of the transistor T6 receives the clock signal CK1; in the N+1 stage shift register, the transistor The drain of T6 receives the clock signal CK2; in the N+2 stage shift register, the drain of the transistor T6 receives the clock signal CK3.
電晶體T7包括:源極,接收參考電壓VGH;閘極,接收模式控制信號FL1;以及汲極,耦接至節點SQ。 The transistor T7 includes: a source, which receives the reference voltage VGH; a gate, which receives the mode control signal FL1; and a drain, which is coupled to the node SQ.
電晶體T8包括:源極,接收參考電壓VGH;閘 極,接收模式控制信號FL1;以及汲極,耦接至節點SBT。 Transistor T8 includes: source, receiving reference voltage VGH; gate Pole, receiving mode control signal FL1; and drain pole, coupled to node SBT.
電晶體T9包括:源極,接收參考電壓VGL(其為低位準參考電壓);閘極,接收控制信號CL2;以及汲極,耦接至節點QB2。 The transistor T9 includes: a source, which receives a reference voltage VGL (which is a low-level reference voltage); a gate, which receives a control signal CL2; and a drain, which is coupled to the node QB2.
電晶體T10包括:源極,耦接至節點QB2;閘極,接收控制信號CL3;以及汲極,接收參考電壓VGH。 The transistor T10 includes: a source, which is coupled to the node QB2; a gate, which receives the control signal CL3; and a drain, which receives the reference voltage VGH.
電晶體T11包括:源極,耦接至節點Q2;閘極,接收控制信號CL2;以及汲極,接收參考電壓VGH。 The transistor T11 includes: a source, which is coupled to the node Q2; a gate, which receives the control signal CL2; and a drain, which receives the reference voltage VGH.
電晶體T12包括:源極,接收參考電壓VGL;閘極,接收控制信號CL1;以及汲極,耦接至節點Q2。 The transistor T12 includes: a source, which receives the reference voltage VGL; a gate, which receives the control signal CL1; and a drain, which is coupled to the node Q2.
電容C耦接於節點Q2與本級輸出信號SQ_OUT之間。 The capacitor C is coupled between the node Q2 and the output signal SQ_OUT of this stage.
電晶體T13包括:源極,接收參考電壓VGL;閘極,耦接至節點Q2;以及汲極,輸出本級輸出信號SQ_OUT。 The transistor T13 includes: a source, which receives the reference voltage VGL; a gate, which is coupled to the node Q2; and a drain, which outputs the output signal SQ_OUT of this stage.
電晶體T14包括:源極,輸出本級輸出信號SQ_OUT;閘極,耦接至節點QB2;以及汲極,接收參考電壓VGH。 The transistor T14 includes: a source, which outputs the output signal SQ_OUT of the current stage; a gate, which is coupled to the node QB2; and a drain, which receives the reference voltage VGH.
現將說明本案實施例的移位暫存器的操作。第2A圖至第2L圖顯示本案實施例的移位暫存器的操作與信號時序圖。在底下,移位暫存器先操作於同步模式,之後切換至掃描模式為例做說明,當知本案並不受限於此。於其他可能實施例中,移位暫存器先操作於掃描模式,之後切換至同步模 式,此亦在本案精神範圍內。當模式控制信號FL1為第一邏輯狀態(例如但不受限於,邏輯低)時,移位暫存器操作於同步模式;以及當模式控制信號FL1為第二邏輯狀態(例如但不受限於,邏輯高)時,移位暫存器操作於掃描模式。 The operation of the shift register of the embodiment of this case will now be explained. Figures 2A to 2L show the operation and signal timing diagrams of the shift register of the embodiment of the present application. Below, the shift register operates in the synchronous mode first, and then switches to the scan mode as an example for illustration. It should be understood that this case is not limited to this. In other possible embodiments, the shift register operates in the scan mode first, and then switches to the synchronous mode This is also within the spirit of this case. When the mode control signal FL1 is in the first logic state (for example, but not limited to, logic low), the shift register operates in the synchronous mode; and when the mode control signal FL1 is in the second logic state (for example, but not limited to, logic low) At logic high), the shift register operates in scan mode.
如第2A圖所示,於同步模式的初始階段P1時,模式控制信號FL1是L,使得電晶體T7與T8導通。參考電壓VGH透過電晶體T7與T8而分別進入到電晶體T6與T5的閘極,所以,電晶體T6與T5被關閉。電晶體T6與T5是掃描電路110的輸出電晶體,在同步模式下,將電晶體T6與T5關閉才不會影響輸出。此外,於同步模式下,掃描電路110為關閉(亦即,電晶體T1~T6皆關閉)。故而,於底下在說明同步模式時,將說明同步電路150的電晶體T9~T14的導通與關閉狀態。電晶體T1的閘極接收時脈信號CK3,而電晶體T6的源極則接收時脈信號CK1。由於時脈信號CK3為H,所以,電晶體T1被關閉,起始信號STV無法進入至本級移位暫存器。由於控制信號CL1為H,電晶體T12被關閉,而控制信號CL2為L,電晶體T9與T11都為導通。由於電晶體T9為導通,將參考電壓VGL導至電晶體T14的閘極,使得電晶體T14也為導通,故而,電晶體T14可以輸出為H(參考電壓VGH)的本級輸出信號SQ_OUT。由於電晶體T11為導通,使得參考電壓VGH導入至節點Q2,讓電晶體T13被關閉。
As shown in Figure 2A, in the initial phase P1 of the synchronization mode, the mode control signal FL1 is L, so that the transistors T7 and T8 are turned on. The reference voltage VGH passes through the transistors T7 and T8 and enters the gates of the transistors T6 and T5, respectively, so the transistors T6 and T5 are turned off. Transistors T6 and T5 are the output transistors of the
請參考第2B圖,其顯示在同步模式的保持階段 P2。由於保持階段P2下的信號時序基本上相同於初始階段P1下的信號時序,故而,其細節說明在此省略。 Please refer to Figure 2B, which is shown in the hold phase of the synchronization mode P2. Since the signal timing in the holding phase P2 is basically the same as the signal timing in the initial phase P1, the detailed description is omitted here.
請參考第2C圖,其顯示在同步模式的下拉階段P3。如第2C圖所示,控制信號CL1為L,電晶體T12為導通,參考電壓VGL透過電晶體T12而導到節點Q2,將電晶體T13導通。控制信號CL2為H,將電晶體T9與T11關閉。控制信號CL3為L,將電晶體T10導通,所以,將電晶體T14的閘極電壓拉高至參考電壓VGH,使得電晶體T14被關閉。由於電晶體T14被關閉而電晶體T13為導通,電晶體T13將本級輸出信號SQ_OUT拉低至L。 Please refer to Figure 2C, which is shown in the pull-down phase P3 of the synchronization mode. As shown in FIG. 2C, the control signal CL1 is L, the transistor T12 is turned on, and the reference voltage VGL is conducted through the transistor T12 to the node Q2, turning the transistor T13 on. The control signal CL2 is H, turning off the transistors T9 and T11. The control signal CL3 is L, which turns on the transistor T10. Therefore, the gate voltage of the transistor T14 is pulled up to the reference voltage VGH, so that the transistor T14 is turned off. Since the transistor T14 is turned off and the transistor T13 is turned on, the transistor T13 pulls the output signal SQ_OUT of this stage down to L.
請參考第2D圖,其顯示在同步模式的上拉階段P4。如第2D圖所示,控制信號CL1為H,所以,電晶體T12關閉。控制信號CL2為L,電晶體T9與T11被打開。控制信號CL3為H,將電晶體T10關閉。電晶體T9導通且電晶體T10關閉,使得參考電壓VGL導入至電晶體T14的閘極,將電晶體T14導通。由於電晶體T11為導通,將參考電壓VGH導入至節點Q2,使得電晶體T13為關閉。由於電晶體T14導通且電晶體T13關閉,所以電晶體T14輸出為H的本級輸出信號SQ_OUT。 Please refer to Figure 2D, which is shown in the pull-up phase P4 of the synchronous mode. As shown in Figure 2D, the control signal CL1 is H, so the transistor T12 is turned off. The control signal CL2 is L, and the transistors T9 and T11 are turned on. The control signal CL3 is H, turning off the transistor T10. The transistor T9 is turned on and the transistor T10 is turned off, so that the reference voltage VGL is introduced to the gate of the transistor T14, and the transistor T14 is turned on. Since the transistor T11 is turned on, the reference voltage VGH is introduced to the node Q2, so that the transistor T13 is turned off. Since the transistor T14 is turned on and the transistor T13 is turned off, the output of the transistor T14 is the H-level output signal SQ_OUT.
請參考第2E圖,其顯示在同步模式的保持階段P5,保持階段P5是為了後續的掃描模式做準備。控制信號CL1為H,電晶體T12關閉。控制信號CL2轉為H,使得電 晶體T9與T11關閉。控制信號CL3轉為L,使得電晶體T10為導通,將電晶體T14的閘極電壓拉高,電晶體T14被關閉。電晶體T14與T13皆為關閉,所以,本級輸出信號SQ_OUT維持H的準位。 Please refer to Figure 2E, which shows that in the hold phase P5 of the synchronization mode, the hold phase P5 is to prepare for the subsequent scan mode. The control signal CL1 is H, and the transistor T12 is turned off. The control signal CL2 turns to H, so that the Crystals T9 and T11 are closed. The control signal CL3 turns to L, so that the transistor T10 is turned on, the gate voltage of the transistor T14 is pulled up, and the transistor T14 is turned off. The transistors T14 and T13 are both off, so the output signal SQ_OUT of this stage maintains the H level.
請參考第2F圖,其顯示在同步模式的保持階段P6。保持階段P6的信號時序基本上相同於保持階段P5的信號時序。電晶體T14與T13皆為關閉,所以,本級輸出信號SQ_OUT維持H的準位。 Please refer to Figure 2F, which is shown in the hold phase P6 of the synchronization mode. The signal timing of the holding phase P6 is basically the same as the signal timing of the holding phase P5. The transistors T14 and T13 are both off, so the output signal SQ_OUT of this stage maintains the H level.
請參考第2G圖,其顯示在掃描模式的初始階段P7。由於進入掃描模式,所以,模式控制信號FL1轉為H,電晶體T7與T8關閉。另外,在掃描模式下,T9-T14皆為關閉。時脈信號CK1為L,時脈信號CK1輸入至電晶體T6的源極(如果在這一級移位暫存器是這樣的話,則在下一級移位暫存器內,時脈信號CK2輸入至電晶體T6的源極,在下二級移位暫存器內,則是時脈信號CK3輸入至電晶體T6的源極)。時脈信號CK2為H,時脈信號CK2輸入至電晶體T4的源極與閘極,電晶體T4為關閉(在這一級移位暫存器是這樣的話,在下一級移位暫存器內,則是時脈信號CK3輸入至電晶體T4的源極,在下二級移位暫存器內,則是時脈信號CK1輸入至電晶體T4的源極)。時脈信號CK3為H,電晶體T1為關閉。由於前一個階段P6,電晶體T2的閘極電壓(亦即節點SQ)仍為H,電晶體T2維持關閉。同樣地,由於前一個階段P6,節 點SBT仍為H,電晶體T3維持關閉。亦即,在這個階段P7中,全部的電晶體T1~T14皆為關閉,且本級輸出信號SQ_OUT維持前一個階段的準位。 Please refer to Figure 2G, which is shown at P7 in the initial stage of the scan mode. Since it enters the scan mode, the mode control signal FL1 turns to H, and the transistors T7 and T8 are turned off. In addition, in scan mode, T9-T14 are all closed. The clock signal CK1 is L, and the clock signal CK1 is input to the source of the transistor T6 (if this is the case in this stage of the shift register, then in the next stage of the shift register, the clock signal CK2 is input to the electric The source of the transistor T6 is the clock signal CK3 input to the source of the transistor T6 in the next two-level shift register). The clock signal CK2 is H, the clock signal CK2 is input to the source and gate of the transistor T4, and the transistor T4 is turned off (if this is the case in this stage of shift register, in the next stage of shift register, The clock signal CK3 is input to the source of the transistor T4, and in the next two-level shift register, the clock signal CK1 is input to the source of the transistor T4). The clock signal CK3 is H, and the transistor T1 is off. Due to the previous stage P6, the gate voltage of the transistor T2 (that is, the node SQ) is still H, and the transistor T2 remains closed. Similarly, due to the previous stage P6, the section The point SBT is still H, and the transistor T3 remains closed. That is, in this stage P7, all the transistors T1 to T14 are turned off, and the output signal SQ_OUT of this stage maintains the level of the previous stage.
請參考第2H圖,其顯示在掃描模式的保持階段P8。時脈信號CK1為H。時脈信號CK2為L,將電晶體T4導通,使得節點SBT轉為L,將電晶體T3導通,也將電晶體T5導通,將本級輸出信號SQ_OUT維持於H(由電晶體T5來提供參考電壓VGH至本級輸出信號SQ_OUT)。由於電晶體T3導通,參考電壓VGH導入至節點SQ,將電晶體T2與T6關閉。時脈信號CK3仍為H,電晶體T1仍為關閉。 Please refer to Figure 2H, which is shown in the hold phase P8 of the scan mode. The clock signal CK1 is H. The clock signal CK2 is L, the transistor T4 is turned on, the node SBT is turned to L, the transistor T3 is turned on, and the transistor T5 is turned on, and the output signal SQ_OUT of this stage is maintained at H (the transistor T5 provides a reference Voltage VGH to the output signal SQ_OUT of this stage). Since the transistor T3 is turned on, the reference voltage VGH is introduced to the node SQ, and the transistors T2 and T6 are turned off. The clock signal CK3 is still H, and the transistor T1 is still off.
請參考第2I圖,其顯示在掃描模式的保持階段P9。時脈信號CK1仍為H。時脈信號CK2為H,將電晶體T4關閉。時脈信號CK3為L,電晶體T1導通而讓起始信號STV進入(起始信號STV此時為L),將節點SQ拉為L,將電晶體T2導通。由於電晶體T2導通,參考電壓VGH進入至節點SBT,將電晶體T3與T5關閉。由於節點SQ為L,將電晶體T6導通,使得本級輸出信號SQ_OUT等於時脈信號CK1(其為H,由電晶體T6提供)。 Please refer to Figure 2I, which is shown in the hold phase P9 of the scan mode. The clock signal CK1 is still H. The clock signal CK2 is H, turning off the transistor T4. The clock signal CK3 is L, the transistor T1 is turned on to allow the start signal STV to enter (the start signal STV is L at this time), the node SQ is pulled to L, and the transistor T2 is turned on. Since the transistor T2 is turned on, the reference voltage VGH enters the node SBT, turning off the transistors T3 and T5. Since the node SQ is L, the transistor T6 is turned on, so that the output signal SQ_OUT of this stage is equal to the clock signal CK1 (which is H and is provided by the transistor T6).
請參考第2J圖,其顯示在掃描模式的下拉階段P10。時脈信號CK1為L。時脈信號CK2為H,電晶體T4關閉。時脈信號CK3為H,電晶體T1為關閉。因為前一個階段的節點SQ為L,而瞬間的時脈信號CK1轉為L,使得節點 SQ由L更拉低至L’,電晶體T6仍導通,故將本級輸出信號SQ_OUT拉低為L。由於節點SQ為L’,使得電晶體T2為導通,將節點SBT拉高為參考電壓VGH,電晶體T3與T5為關閉。 Please refer to Figure 2J, which is shown in the pull-down stage P10 of the scan mode. The clock signal CK1 is L. The clock signal CK2 is H, and the transistor T4 is turned off. The clock signal CK3 is H, and the transistor T1 is off. Because the node SQ in the previous stage is L, and the instantaneous clock signal CK1 turns to L, making the node SQ is further pulled down from L to L', and the transistor T6 is still turned on, so the output signal SQ_OUT of this stage is pulled down to L. Since the node SQ is L', the transistor T2 is turned on, the node SBT is pulled up to the reference voltage VGH, and the transistors T3 and T5 are turned off.
請參考第2K圖,其顯示在掃描模式的上拉階段P11。時脈信號CK1為H。時脈信號CK2為L,電晶體T4導通,將節點SBT拉低,電晶體T5與T3導通,由於電晶體T3為導通,參考電壓VGH透過電晶體T3將節點SQ拉高,電晶體T6被關閉。由於電晶體T5為導通,參考電壓VGH透過電晶體T5將本級輸出信號SQ_OUT拉高。時脈信號CK3為H,電晶體T1關閉。 Please refer to Figure 2K, which is shown in the pull-up phase P11 of the scan mode. The clock signal CK1 is H. The clock signal CK2 is L, the transistor T4 is turned on, and the node SBT is pulled low, and the transistors T5 and T3 are turned on. Because the transistor T3 is turned on, the reference voltage VGH pulls the node SQ high through the transistor T3, and the transistor T6 is turned off . Since the transistor T5 is turned on, the reference voltage VGH pulls the output signal SQ_OUT of this stage high through the transistor T5. The clock signal CK3 is H, and the transistor T1 is turned off.
請參考第2L圖,其顯示在掃描模式的保持階段P12。時脈信號CK1為H。時脈信號CK2為H,電晶體T4關閉,節點SBT維持為L而將電晶體T3與T5導通。電晶體T3導通,參考電壓VGH透過電晶體T3將節點SQ拉為H。由於電晶體T5導通,參考電壓VGH透過電晶體T5將本級輸出信號SQ_OUT拉高。時脈信號CK3為L,電晶體T1導通,將起始信號STV導入至節點SQ,節點SQ為H將電晶體T6與T2關閉。之後,本級輸出信號SQ_OUT維持為H,直到下一個圖框才會動作(下一個圖框的「同步模式」)。 Please refer to Figure 2L, which is shown in the hold phase P12 of the scan mode. The clock signal CK1 is H. The clock signal CK2 is H, the transistor T4 is turned off, the node SBT is maintained at L, and the transistors T3 and T5 are turned on. The transistor T3 is turned on, and the reference voltage VGH pulls the node SQ to H through the transistor T3. Since the transistor T5 is turned on, the reference voltage VGH pulls the output signal SQ_OUT of this stage high through the transistor T5. The clock signal CK3 is L, the transistor T1 is turned on, the start signal STV is introduced to the node SQ, and the node SQ is H to turn off the transistors T6 and T2. After that, the output signal SQ_OUT of this stage is maintained at H, and will not act until the next frame (the "synchronous mode" of the next frame).
現請參考第3圖,其顯示本案實施例的多個移位暫存器在同步模式與掃描模式下的信號時序圖。於第3圖中, SQ_OUT(1)~SQ_OUT(4)代表4個移位暫存器的輸出信號,但當知本案並不受限於此。如第3圖所示,於同步模式下,所有的移位暫存器的該些同步電路皆同步輸出本級輸出信號;以及,於掃描模式下,所有的移位暫存器的該些掃描電路則依序輸出本級輸出信號。 Please refer to FIG. 3, which shows the signal timing diagram of the multiple shift registers in the embodiment of the present application in the synchronous mode and the scan mode. In Figure 3, SQ_OUT(1)~SQ_OUT(4) represent the output signals of 4 shift registers, but this case is not limited to this. As shown in Figure 3, in the synchronous mode, the synchronous circuits of all the shift registers synchronously output the output signal of the current stage; and, in the scan mode, the scans of all the shift registers The circuit outputs the output signal of this stage in sequence.
本案上述實施例中,由於無需額外的控制信號來進行控制,所以其架構較為精簡。此外,輸出能力得到加強,且上升時間與下降時間也得到改善。 In the above-mentioned embodiment of this case, since no additional control signal is required for control, the structure is relatively simple. In addition, the output capacity has been strengthened, and the rise time and fall time have also been improved.
綜上所述,雖然本發明已以實施例揭露如上,然其並非用以限定本發明。本發明所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾。因此,本發明之保護範圍當視後附之申請專利範圍所界定者為準。 In summary, although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention. Those with ordinary knowledge in the technical field to which the present invention belongs can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention shall be subject to those defined by the attached patent application scope.
100:移位暫存器 100: shift register
110:掃描電路 110: Scanning circuit
130:模式控制電路 130: Mode control circuit
150:同步電路 150: Synchronous circuit
112:掃描控制電路 112: Scan control circuit
114:掃描下拉電路 114: Scan pull-down circuit
116:掃描上拉電路 116: Scanning pull-up circuit
152:同步控制電路 152: Synchronous control circuit
154:同步下拉電路 154: Synchronous pull-down circuit
156:同步上拉電路 156: Synchronous pull-up circuit
T1~T14:電晶體 T1~T14: Transistor
C:電容 C: Capacitance
Claims (7)
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Citations (2)
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US4995039A (en) * | 1987-09-25 | 1991-02-19 | Mitsubishi Denki Kabushiki Kaisha | Circuit for transparent scan path testing of integrated circuit devices |
US20140173247A1 (en) * | 2011-07-20 | 2014-06-19 | Freescale Semiconductor, Inc. | Processing apparatus and method of synchronizing a first processing unit and a second processing unit |
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US4995039A (en) * | 1987-09-25 | 1991-02-19 | Mitsubishi Denki Kabushiki Kaisha | Circuit for transparent scan path testing of integrated circuit devices |
US20140173247A1 (en) * | 2011-07-20 | 2014-06-19 | Freescale Semiconductor, Inc. | Processing apparatus and method of synchronizing a first processing unit and a second processing unit |
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