TWI725436B - Ultrasound probe check system and ultrasound probe identification method - Google Patents

Ultrasound probe check system and ultrasound probe identification method Download PDF

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TWI725436B
TWI725436B TW108118256A TW108118256A TWI725436B TW I725436 B TWI725436 B TW I725436B TW 108118256 A TW108118256 A TW 108118256A TW 108118256 A TW108118256 A TW 108118256A TW I725436 B TWI725436 B TW I725436B
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ultrasonic probe
generate
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connection interface
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TW202042749A (en
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宋沛倫
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佳世達科技股份有限公司
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Abstract

An ultrasound probe check system includes a connection interface, memory and a controller. The connection interface is coupled to an ultrasound probe for receiving a first receiving signal. The memory is used to store an ultrasound probe database. The controller is coupled to the connection interface and the memory for generating a first characteristic image according to the first receiving signal, comparing the first characteristic image and a group of built-in images to generate a first group of similarities, and when the first group of similarities and a second group of similarities in the ultrasound probe database are at least partially unmatched, determining that the ultrasound probe is faulty.

Description

超音波探頭檢驗系統及超音波探頭檢驗方法 Ultrasonic probe inspection system and ultrasonic probe inspection method

本發明關於超音波技術,特別是一種超音波探頭檢驗系統及超音波探頭檢驗方法。 The invention relates to ultrasonic technology, in particular to an ultrasonic probe inspection system and an ultrasonic probe inspection method.

超音波為超過20kHz的音波,被廣泛應用於醫學、工業等眾多領域。超音波設備例如超音波診斷儀用於掃描人體內器官、組織及胎兒。在使用時,不同超音波探頭可於相同的超音波設備上替換使用,使用者有可能因為使用到品質不佳或損壞的超音波探頭而使超音波設備無法產生清楚的掃描影像。在相關技術中透過量測超音波探頭的阻抗來判斷超音波探頭的品質,然而採用量測阻抗的方式需要在超音波設備上增加阻抗量測電路及在超音波探頭上增加用於阻抗量測的控制訊號的控制線路,不利於縮小超音波探頭尺寸及節省製造成本。 Ultrasound is a sound wave over 20kHz, which is widely used in many fields such as medicine and industry. Ultrasonic equipment such as ultrasonic diagnostic equipment is used to scan human internal organs, tissues and fetuses. In use, different ultrasound probes can be used interchangeably on the same ultrasound equipment. Users may use poor quality or damaged ultrasound probes and the ultrasound equipment may not be able to produce clear scan images. In the related technology, the quality of the ultrasonic probe is judged by measuring the impedance of the ultrasonic probe. However, the impedance measurement method requires an impedance measurement circuit on the ultrasonic equipment and an impedance measurement on the ultrasonic probe. The control circuit of the control signal is not conducive to reducing the size of the ultrasonic probe and saving the manufacturing cost.

因此,需要發展出一種超音波探頭檢驗系統及超音波探頭檢驗方法,不須量測超音波探頭的阻抗即可得知超音波探頭是否合格。 Therefore, it is necessary to develop an ultrasonic probe inspection system and an ultrasonic probe inspection method, which can know whether the ultrasonic probe is qualified without measuring the impedance of the ultrasonic probe.

本發明實施例提供一種超音波探頭檢驗系統,包含連接介面、記憶體及控制器。連接介面耦接於超音波探頭,用以從超音波探頭接收第一接收訊號。記憶體用以儲存超音波探頭資料庫。控制器耦接於連接介面及記憶體,用以依據第一接收訊號產生第一特徵圖像,將第一特徵圖像及一組內建圖像進行 比較以產生第一組相似度,及當第一組相似度與超音波探頭資料庫中的第二組相似度之間至少部分的相似度不匹配時,判定超音波探頭不合格。 The embodiment of the present invention provides an ultrasonic probe inspection system, which includes a connection interface, a memory and a controller. The connection interface is coupled to the ultrasonic probe for receiving the first received signal from the ultrasonic probe. The memory is used to store the ultrasonic probe database. The controller is coupled to the connection interface and the memory, and is used to generate a first feature image according to the first received signal, and perform the first feature image and a set of built-in images The comparison is performed to generate the first set of similarities, and when at least part of the similarities between the first set of similarities and the second set of similarities in the ultrasound probe database do not match, the ultrasound probe is determined to be unqualified.

本發明實施例提供另一種種超音波探頭檢驗方法,包含:連接介面從超音波探頭接收第一接收訊號;依據第一接收訊號產生第特徵圖像;將第一特徵圖像及一組內建圖像進行比較以產生第一組相似度;及當第一組相似度與超音波探頭資料庫中的第二組相似度之間至少部分的相似度不匹配時,判定超音波探頭不合格。 An embodiment of the present invention provides another ultrasonic probe inspection method, which includes: a connection interface receives a first received signal from the ultrasonic probe; a first characteristic image is generated according to the first received signal; and the first characteristic image and a set of built-in The images are compared to generate a first set of similarities; and when at least part of the similarities between the first set of similarities and the second set of similarities in the ultrasound probe database does not match, the ultrasound probe is determined to be unqualified.

10:超音波探頭檢驗系統 10: Ultrasonic probe inspection system

100:連接介面 100: connection interface

102:控制器 102: Controller

104:記憶體 104: memory

1040:超音波探頭資料庫 1040: Ultrasonic Probe Database

12:超音波探頭 12: Ultrasonic probe

120:纜線 120: Cable

122:轉換器 122: converter

124:匹配層 124: matching layer

126:聲透鏡 126: Acoustic lens

4:超音波探頭檢驗方法 4: Ultrasonic probe inspection method

S400至S416:步驟 S400 to S416: steps

第1圖係為本發明實施例中超音波探頭檢驗系統的示意圖。 Figure 1 is a schematic diagram of an ultrasonic probe inspection system in an embodiment of the present invention.

第2圖和第3圖分別顯示同個超音波探頭於不同時間產生的第二特徵圖像及第一特徵圖像。 Figures 2 and 3 respectively show the second characteristic image and the first characteristic image produced by the same ultrasound probe at different times.

第4圖係為本發明實施例中超音波探頭檢驗方法的流程圖。 Figure 4 is a flowchart of the ultrasonic probe inspection method in the embodiment of the present invention.

第1圖係為本發明實施例中超音波探頭檢驗系統10的示意圖,超音波探頭檢驗系統10可包含連接介面100、控制器102及記憶體104。控制器102可耦接於連接介面100及記憶體104。連接介面100可透過纜線120耦接於超音波探頭12。超音波探頭檢驗系統10可以是獨立的超音波設備,可耦接各種不同的超音波探頭12。超音波探頭12的種類可以是線型(linear)、扇形(sector)、弧形(convex)或其他種類。超音波探頭12可能因為未適當地與連接介面100連接,或是因為長期使用 而導致元件功能衰退或超音波探頭12與異物碰觸致使元件故障,而無法正確輸出訊號。此時可以使用超音波探頭檢驗系統10來檢驗超音波探頭12是否合格,以防止使用者使用不合格的超音波探頭12造成錯誤的診斷。 FIG. 1 is a schematic diagram of the ultrasonic probe inspection system 10 in an embodiment of the present invention. The ultrasonic probe inspection system 10 may include a connection interface 100, a controller 102 and a memory 104. The controller 102 can be coupled to the connection interface 100 and the memory 104. The connection interface 100 can be coupled to the ultrasonic probe 12 through a cable 120. The ultrasonic probe inspection system 10 may be an independent ultrasonic device, which may be coupled to various ultrasonic probes 12. The type of the ultrasonic probe 12 may be linear, sector, convex or other types. The ultrasonic probe 12 may be improperly connected to the connection interface 100, or because of long-term use As a result, the function of the component is degraded or the ultrasonic probe 12 touches a foreign object, causing the component to malfunction, and the signal cannot be output correctly. At this time, the ultrasonic probe inspection system 10 can be used to inspect whether the ultrasonic probe 12 is qualified, so as to prevent the user from using the unqualified ultrasonic probe 12 to cause erroneous diagnosis.

超音波探頭12可發射超音波,如20kHz到10MHz之間的頻率的超音波,及接收超音波通過不同介質介面時產生的反射波,並將接收到的反射波轉換為接收訊號。超音波探頭12包含纜線120、複數個轉換器122、匹配層124及聲透鏡126。超音波探頭辨識系統10可透過纜線120傳送交流電壓以控制複數個轉換器122,及透過纜線120從複數個轉換器122接收接收訊號。纜線120可包含複數條電線分別耦接複數個轉換器122,超音波探頭辨識系統10可透過複數條電線傳送專門的交流電壓以分別控制複數個轉換器122,及分別從複數個轉換器122接收接收訊號。匹配層124可具有合適的音阻(acoustic impedance)以提供轉換器122及接觸物體之間較佳的匹配,幫助大部分的超音波進入接觸物體。聲透鏡126可為超音波可穿透的塑膠鏡片,用於隔絕及保護超音波探頭12。複數個轉換器122可以陣列形式設置,並可為壓電(piezoelectric)轉換器或電容式(capacitive)轉換器,例如複數個轉換器122可包含128或256個通道的壓電轉換器。每個轉換器122皆可獨立運作,可獨立依據施加的交流電壓的振幅和/或頻率產生超音波,及可獨立將收到的反射訊號轉換為接收訊號。複數個轉換器122可依序或同時依據相同或不同的施加電壓產生對應的超音波,或依序或同時將相同或不同的反射訊號轉換為對應的接收訊號。例如,複數個轉換器122可依序依據100V的交流電壓產生具有20kHz的超音波,及依序依據120V的交流電壓產生具有30kHz的超音波,或依序將接收到之20kHz的反射訊號轉換為100V的交流電壓,及依序將接收到之30kHz的反射訊號轉換為120V的交流電壓。超音波探頭12發射的超音波可輕易穿透水或人體,但在空氣中會快速衰減且幾乎不傳導。由於轉換器122的材料均勻度或 切割形狀的差異,複數個轉換器122之間會有些微差異,其壓電轉換特性也不會完全相同,再加上各個超音波探頭12的轉換器122、匹配層124及聲透鏡126在製程中可能因程序、溫度或元件密度的些微差距對超音波的產生或傳導效果在對應每一個轉換器122單元的位置不會一模一樣,因此相同的超音波通過每一隻不同的超音波探頭前端時所接收到的產生的接收訊號不會相同,因此每個超音波探頭12在相同條件下產生的反射訊號可為獨特的,反映出其轉換器122、匹配層124及聲透鏡126的特性。對於同一個超音波探頭12來說,由於複數個轉換器122中之某些轉換器122可因為長期使用或撞擊而產生碎裂、變質或損壞,或是與連接介面100的連接不穩固而減低超音波強度或無法產生超音波,在不同時間產生的反射訊號也可有所差異。 The ultrasonic probe 12 can emit ultrasonic waves, such as ultrasonic waves with a frequency between 20 kHz and 10 MHz, and receive reflected waves generated when the ultrasonic waves pass through different media interfaces, and convert the received reflected waves into receiving signals. The ultrasonic probe 12 includes a cable 120, a plurality of converters 122, a matching layer 124 and an acoustic lens 126. The ultrasonic probe identification system 10 can transmit AC voltage through the cable 120 to control the plurality of converters 122, and receive signals from the plurality of converters 122 through the cable 120. The cable 120 may include a plurality of wires respectively coupled to a plurality of converters 122, and the ultrasonic probe identification system 10 may transmit a special AC voltage through the plurality of wires to control the plurality of converters 122 respectively, and from the plurality of converters 122 respectively. Receive the receive signal. The matching layer 124 may have an appropriate acoustic impedance to provide a better match between the converter 122 and the contact object, and help most of the ultrasonic waves enter the contact object. The acoustic lens 126 may be a plastic lens transparent to ultrasonic waves, and is used to isolate and protect the ultrasonic probe 12. The plurality of converters 122 may be arranged in an array, and may be piezoelectric converters or capacitive converters. For example, the plurality of converters 122 may include piezoelectric converters with 128 or 256 channels. Each converter 122 can operate independently, can independently generate ultrasonic waves according to the amplitude and/or frequency of the applied AC voltage, and can independently convert the received reflected signal into a received signal. The plurality of converters 122 can sequentially or simultaneously generate corresponding ultrasonic waves according to the same or different applied voltages, or sequentially or simultaneously convert the same or different reflected signals into corresponding received signals. For example, a plurality of converters 122 may sequentially generate ultrasonic waves with 20 kHz according to an AC voltage of 100V, and generate ultrasonic waves with 30 kHz according to an AC voltage of 120V in sequence, or sequentially convert the received reflected signals of 20 kHz into 100V AC voltage, and sequentially convert the received 30kHz reflection signal into 120V AC voltage. The ultrasonic wave emitted by the ultrasonic probe 12 can easily penetrate water or the human body, but it decays rapidly in the air and is almost non-conducting. Due to the material uniformity of the converter 122 or The difference of the cutting shape, there will be some slight differences between the plurality of converters 122, and their piezoelectric conversion characteristics will not be exactly the same. In addition, the converter 122, matching layer 124 and acoustic lens 126 of each ultrasonic probe 12 are in the process of manufacturing. It is possible that due to the slight difference in program, temperature or component density, the ultrasonic generation or conduction effect will not be exactly the same in the position of each converter 122 unit. Therefore, when the same ultrasonic wave passes through each different ultrasonic probe front end The received signals generated will not be the same. Therefore, the reflected signals generated by each ultrasonic probe 12 under the same conditions can be unique, reflecting the characteristics of the converter 122, the matching layer 124 and the acoustic lens 126. For the same ultrasonic probe 12, some of the converters 122 in the plurality of converters 122 may be broken, deteriorated or damaged due to long-term use or impact, or the connection with the connection interface 100 may be unstable and reduced The intensity of the ultrasonic wave may not be able to produce the ultrasonic wave, and the reflected signal produced at different times may also be different.

在某些實施例中,當超音波探頭12於剛出廠時,超音波探頭12可在空氣介質內未接觸其他物件的狀況下發送預設訊號,該些預設訊號為超音波信號不易在空氣中傳遞,因此會由匹配層124及聲透鏡126反射而由轉換器122接收其相應的反射訊號,及將反射訊號轉換為第二接收訊號。在其他實施例中,超音波探頭12可也可放置於其他介質內如水等,接著發送預設訊號,接收其相應的反射訊號,及將反射訊號轉換為第二接收訊號。在本發明也可以使超音波探頭12面對一個超音波訊號源,直接接收超音波訊號源發射的預設訊號。連接介面100可從超音波探頭12接收第二接收訊號,控制器102可依據第二接收訊號產生第二特徵圖像以及將第二特徵圖像及一組內建圖像進行比較以產生第二組相似度,並將第二組相似度以及其產生時間儲存於記憶體104內之超音波探頭資料庫1040。在某些實施例中,第二組相似度可為控制器102前次針對超音波探頭12產生的一組相似度。之後在超音波探頭檢驗系統10上再次使用超音波探頭12時,超音波探頭12可依照產生第二接收訊號相同的方式在空氣介質或其他介質內發送 預設訊號,接收其相應的反射訊號,及將反射訊號轉換為第一接收訊號。連接介面100可從超音波探頭12接收第一接收訊號。控制器102可依據接收訊號產生第一特徵圖像,接著比較第一特徵圖像及該組內建圖像以產生第一組相似度。第2圖和第3圖分別顯示同個超音波探頭12於不同時間產生的第二特徵圖像及第一特徵圖像,其中粗細亮度不一的複數條平行線顯示匹配層124及聲透鏡126的超音波反射。第3圖區域A及B的缺口顯示對應轉換器122因為碎裂、變質或損壞或與連接介面100的連接不穩固而無法產生超音波或產生較弱的超音波。超音波探頭12的特徵圖像不但可在水平方向上顯示匹配層124及聲透鏡126的特徵,也可在垂直方向上顯示複數個轉換器122的特徵。 In some embodiments, when the ultrasonic probe 12 is just shipped from the factory, the ultrasonic probe 12 can send preset signals without contacting other objects in the air medium. These preset signals are ultrasonic signals that are not easy to be in the air. Therefore, it is reflected by the matching layer 124 and the acoustic lens 126, and the corresponding reflected signal is received by the converter 122, and the reflected signal is converted into a second received signal. In other embodiments, the ultrasonic probe 12 can also be placed in other media such as water, and then send a preset signal, receive its corresponding reflection signal, and convert the reflection signal into a second reception signal. In the present invention, the ultrasonic probe 12 can also face an ultrasonic signal source and directly receive the preset signal emitted by the ultrasonic signal source. The connection interface 100 can receive the second received signal from the ultrasonic probe 12, and the controller 102 can generate a second feature image according to the second received signal and compare the second feature image with a set of built-in images to generate a second feature image. Group similarity, and store the second group of similarity and its generation time in the ultrasonic probe database 1040 in the memory 104. In some embodiments, the second set of similarities may be a set of similarities generated by the controller 102 for the ultrasonic probe 12 last time. Later, when the ultrasonic probe 12 is used again on the ultrasonic probe inspection system 10, the ultrasonic probe 12 can be sent in the air medium or other medium in the same way as the second received signal is generated. The preset signal receives its corresponding reflected signal, and converts the reflected signal into the first received signal. The connection interface 100 can receive the first received signal from the ultrasonic probe 12. The controller 102 can generate a first characteristic image according to the received signal, and then compare the first characteristic image and the set of built-in images to generate a first set of similarities. Figures 2 and 3 respectively show the second feature image and the first feature image generated by the same ultrasonic probe 12 at different times, wherein a plurality of parallel lines of different thickness and brightness show the matching layer 124 and the acoustic lens 126 Ultrasonic reflection. The gaps in areas A and B in FIG. 3 show that the corresponding converter 122 is broken, deteriorated, or damaged, or the connection with the connection interface 100 is unstable, and cannot generate ultrasonic waves or generate weak ultrasonic waves. The characteristic image of the ultrasonic probe 12 can not only display the characteristics of the matching layer 124 and the acoustic lens 126 in the horizontal direction, but also display the characteristics of a plurality of transducers 122 in the vertical direction.

由於反射訊號可反映出超音波探頭12在不同時間的差異,依據反射訊號產生的特徵圖像及第一組相似度、第二組相似度也可反映出超音波探頭12在不同時間的差異。控制器102可比較第一組相似度及超音波探頭資料庫1040中的第二組相似度以判定超音波探頭12是否合格。當第一組相似度與超音波探頭資料庫1040中的第二組相似度之間所有的相似度都匹配時,第一組相似度及第二組相似度可分別對應同一個超音波探頭12在不同時間的量測且超音波探頭12的訊號品質穩定,控制器102可判定超音波探頭12為合格;當第一組相似度與超音波探頭資料庫1040中的第二組相似度之間至少部分的相似度不匹配且剩餘部分的相似度都匹配時,第一組相似度及第二組相似度可分別對應同一個超音波探頭12在不同時間的量測且超音波探頭12的訊號品質可能因為使用狀況或連接狀況不佳而降低,控制器102可判定超音波探頭12為不合格。第一組相似度包含複數個相似度,第二組相似度也包含複數個相似度。當第一組相似度中之一相似度超出第二組相似度中之一對應相似度的容忍值時,控制器102可判定第一組相似度中之該相似度與第二組相似度中之該對應相似度不匹配;當第一組相似度 中之一相似度未超出第二組相似度中之一對應相似度的容忍值時,控制器102可判定第一組相似度中之該相似度與第二組相似度中之該對應相似度互相匹配。容忍值可例如為0.2%。當判定超音波探頭12不合格後,控制器102可藉由顯示輸出或其他輸出方式通知使用者檢查連接介面100和超音波探頭12的連接狀況。 Since the reflected signal can reflect the difference of the ultrasonic probe 12 at different times, the characteristic image generated according to the reflected signal and the first group of similarities and the second group of similarities can also reflect the difference of the ultrasonic probe 12 at different times. The controller 102 can compare the first group of similarities with the second group of similarities in the ultrasonic probe database 1040 to determine whether the ultrasonic probe 12 is qualified. When all the similarities between the first group of similarities and the second group of similarities in the ultrasound probe database 1040 match, the first group of similarities and the second group of similarities can respectively correspond to the same ultrasound probe 12 At different times of measurement and the signal quality of the ultrasonic probe 12 is stable, the controller 102 can determine that the ultrasonic probe 12 is qualified; when the first set of similarities is between the second set of similarities in the ultrasonic probe database 1040 When at least part of the similarities do not match and the remaining similarities are matched, the first group of similarities and the second group of similarities can respectively correspond to the measurement of the same ultrasonic probe 12 at different times and the signal of the ultrasonic probe 12 The quality may be reduced due to poor usage or connection conditions, and the controller 102 may determine that the ultrasonic probe 12 is unqualified. The first group of similarities includes a plurality of similarities, and the second group of similarities also includes a plurality of similarities. When one of the similarities in the first group of similarities exceeds the tolerance value of one of the similarities in the second group of similarities, the controller 102 may determine that the similarities in the first group of similarities are equal to those in the second group of similarities. The corresponding similarity does not match; when the first set of similarities When one of the similarities does not exceed the tolerance value of the corresponding similarity of one of the second group of similarities, the controller 102 may determine the similarity in the first group of similarities and the corresponding similarity in the second group of similarities Match each other. The tolerance value may be 0.2%, for example. When the ultrasonic probe 12 is determined to be unqualified, the controller 102 can notify the user to check the connection status of the connection interface 100 and the ultrasonic probe 12 through a display output or other output methods.

控制器102可載入人工類神經網路,例如卷積類神經網路或其他相似度演算法以依據特徵圖像及該組內建圖像產生超音波探頭12的第一組相似度或第二組相似度。卷積類神經網路或其他相似度演算法可於出廠時訓練完成並安裝於超音波探頭檢驗系統10之內。每個超音波探頭檢驗系統10內可安裝相同或不同的卷積類神經網路或其他相似度演算法。該組內建圖像可包含1或更多個不同的內建圖像,內建圖像的數目越多,第一組相似度及第二組相似度的辨識度越精確。該組內建圖像可儲存於記憶體104內,並可做為相似度比較的基準。在某些實施例中,該組內建圖像可包含複數個超音波探頭在空氣介質內未接觸其他物件的狀況下發送預設訊號,以及依據所接收到的訊號產生的複數個特徵圖像。例如,該組內建圖像可包含100個超音波探頭在空氣介質內未接觸其他物件的狀況下所產生的100個特徵圖像。在其他實施例中,該組內建圖像可包含複數個任意圖像,例如球的圖像、門的圖像、杯子的圖像、或其他圖像。控制器102可另將第一組相似度以及其產生時間儲存於記憶體104內之超音波探頭資料庫1040。因此超音波探頭資料庫1040可包含在超音波探頭檢驗系統10上在不同時間使用之相同超音波探頭12的對應組相似度。在某些實施例中,超音波探頭資料庫1040中超音波探頭的對應組相似度為經過編碼後的對應組相似度,例如對應組相似度的雜湊碼(hash code),或對應組相似度中所有相似度的乘積。表格1顯示超音波探頭資料庫1040的實施例,其中X2a、X2b分別表示同個超音波探頭X2的在2個不同時間t1、t2所產生的對應組相似度的辨識值,時間t1比時間t2早,N1到N100 表示100組內建圖像的辨識值。在本實施例中,超音波探頭X2在時間t1的產生的對應組相似度X2a為[0.25 0.002 0.3…0.02],表示超音波探頭X2在時間t1的產生的特徵圖像和內建圖像N1為0.25%相似,和內建圖像N2為0.002%相似,和內建圖像N3為0.3%相似,和內建圖像N100為0.02%相似;超音波探頭X2在時間t2的產生的對應組相似度X2b為[0.0002 0.002 0.3…0.02],表示超音波探頭X2在時間t2的產生的特徵圖像和內建圖像N1為0.0002%相似,和內建圖像N2為0.002%相似,和內建圖像N3為0.3%相似,和內建圖像N100為0.02%相似。對應組相似度X2a、X2b的第一個相似度不匹配,其餘相似度皆匹配,因此控制器102可判定對應組相似度X2a、X2b對應相同的超音波探頭12,且超音波探頭12不合格。 The controller 102 can load an artificial neural network, such as a convolutional neural network or other similarity algorithms, to generate the first group of similarities or the first group of similarities of the ultrasonic probe 12 based on the feature image and the group of built-in images. Two sets of similarity. Convolutional neural networks or other similarity algorithms can be trained and installed in the ultrasonic probe inspection system 10 at the factory. The same or different convolutional neural networks or other similarity algorithms can be installed in each ultrasonic probe inspection system 10. The group of built-in images may include one or more different built-in images. The more the number of built-in images, the more accurate the recognition of the first group of similarities and the second group of similarities. The set of built-in images can be stored in the memory 104 and can be used as a benchmark for similarity comparison. In some embodiments, the set of built-in images may include a plurality of ultrasound probes that send preset signals without contacting other objects in the air medium, and a plurality of characteristic images generated based on the received signals . For example, the set of built-in images may include 100 characteristic images generated by 100 ultrasonic probes in the air medium without touching other objects. In other embodiments, the set of built-in images may include a plurality of arbitrary images, such as an image of a ball, an image of a door, an image of a cup, or other images. The controller 102 may further store the first group of similarities and the generation time thereof in the ultrasonic probe database 1040 in the memory 104. Therefore, the ultrasonic probe database 1040 may include the similarity of corresponding groups of the same ultrasonic probe 12 used in the ultrasonic probe inspection system 10 at different times. In some embodiments, the corresponding group similarity of the ultrasound probe in the ultrasound probe database 1040 is the corresponding group similarity after encoding, for example, the hash code of the corresponding group similarity, or the corresponding group similarity. The product of all similarities. Table 1 shows an embodiment of the ultrasonic probe database 1040, where X2a and X2b respectively represent the identification value of the similarity of the corresponding group generated by the same ultrasonic probe X2 at two different times t1 and t2. Time t1 is longer than time t2. Early, N1 to N100 Represents the identification value of 100 sets of built-in images. In this embodiment, the corresponding group similarity X2a generated by the ultrasonic probe X2 at time t1 is [0.25 0.002 0.3...0.02], which represents the characteristic image and the built-in image N1 generated by the ultrasonic probe X2 at time t1 Similar to 0.25%, similar to 0.002% of the built-in image N2, 0.3% similar to the built-in image N3, and 0.02% similar to the built-in image N100; the corresponding group generated by the ultrasound probe X2 at time t2 The similarity X2b is [0.0002 0.002 0.3...0.02], which means that the feature image generated by the ultrasonic probe X2 at time t2 is similar to the built-in image N1 of 0.0002%, and the built-in image N2 is 0.002% similar, and the internal The built-in image N3 is 0.3% similar, and the built-in image N100 is 0.02% similar. The first similarity of the corresponding group of similarities X2a, X2b does not match, and the remaining similarities are all matched, so the controller 102 can determine that the corresponding group of similarities X2a, X2b correspond to the same ultrasonic probe 12, and the ultrasonic probe 12 is unqualified .

Figure 108118256-A0305-02-0010-1
Figure 108118256-A0305-02-0010-1

由於超音波探頭的元件隨使用時間老化為難以避免的缺陷,因此當超音波探頭12於剛出廠時,連接介面100可從超音波探頭12接收第二接收訊號,控制器102可依據第二接收訊號產生第二特徵圖像,並將第二特徵圖像儲存於記憶體104。當使用超音波探頭12一段預設時間後,控制器102可將第二特徵圖像加權對應預設時間的衰減值以產生第三特徵圖像及將第三特徵圖像及該組內建圖像進行比較以產生第二組相似度,並將第二組相似度儲存於記憶體104。由於複數個轉換器122的壓電轉換效率會隨時間衰退,所以控制器102可利用其使用時間估計衰減的特徵圖像,並依據衰減的特徵圖像重新產生第二組相似度。控制器102可依據前述方式比較第一組相似度及第二組相似度以判定超音波探頭12是否合格。 Since the components of the ultrasonic probe age over time and become an inevitable defect, when the ultrasonic probe 12 is just shipped from the factory, the connection interface 100 can receive the second reception signal from the ultrasonic probe 12, and the controller 102 can receive the second signal according to the second reception. The signal generates a second characteristic image, and the second characteristic image is stored in the memory 104. After the ultrasonic probe 12 is used for a preset period of time, the controller 102 can weight the second characteristic image corresponding to the attenuation value of the preset time to generate a third characteristic image and combine the third characteristic image and the set of built-in images The images are compared to generate a second set of similarities, and the second set of similarities are stored in the memory 104. Since the piezoelectric conversion efficiency of the plurality of converters 122 degrades with time, the controller 102 can estimate the attenuated characteristic image by using the time of use thereof, and regenerate the second set of similarities based on the attenuated characteristic image. The controller 102 can compare the first group of similarities with the second group of similarities according to the aforementioned method to determine whether the ultrasonic probe 12 is qualified.

在其他實施例中,當超音波探頭12於在超音波探頭檢驗系統10上首次使用時,連接介面100可從超音波探頭12接收初始接收訊號,控制器102可依據初始接收訊號產生初始特徵圖像,並將初始特徵圖像及該組內建圖像進行比較以產生初始組相似度。當在超音波探頭檢驗系統10上再次使用超音波探頭12時,控制器102可將第一組相似度及超音波探頭12的初始組相似度相比以判定超音波探頭12的品質是否穩定。當第一組相似度超過超音波探頭12的初始組相似度的容忍值時,控制器102可判定超音波探頭12的品質已惡化,及通知使用者。由於超音波探頭12的品質已惡化,可能無法正常運作,使用者可移除正在使用的超音波探頭12並替換其他的超音波探頭12。 In other embodiments, when the ultrasonic probe 12 is used in the ultrasonic probe inspection system 10 for the first time, the connection interface 100 can receive the initial received signal from the ultrasonic probe 12, and the controller 102 can generate the initial characteristic map according to the initial received signal. Image, and compare the initial feature image with the set of built-in images to generate the initial set similarity. When the ultrasonic probe 12 is used again on the ultrasonic probe inspection system 10, the controller 102 may compare the first group similarity with the initial group similarity of the ultrasonic probe 12 to determine whether the quality of the ultrasonic probe 12 is stable. When the similarity of the first group exceeds the tolerance value of the initial group similarity of the ultrasonic probe 12, the controller 102 may determine that the quality of the ultrasonic probe 12 has deteriorated, and notify the user. Since the quality of the ultrasonic probe 12 has deteriorated and may not work normally, the user can remove the ultrasonic probe 12 being used and replace other ultrasonic probes 12.

第4圖係為本發明實施例中超音波探頭檢驗方法4的流程圖。超音波探頭檢驗方法4適用於超音波探頭檢驗系統10,且包含步驟S400至S416,其中步驟S400至S404用於在超音波探頭12於剛出廠時產生超音波探頭12的第二組相似度,步驟S406至S410用於在超音波探頭12使用一段時間後產生超音波探頭12的第一組相似度,步驟S410至S416用於檢驗超音波探頭12是否合格。任何合理的技術變更或是步驟調整都屬於本發明所揭露的範疇。以下詳細說明步驟S400至S416: 步驟S400:當超音波探頭12於剛出廠時,連接介面100從超音波探頭12接收第二接收訊號;步驟S402:利用第二接收訊號產生第二特徵圖像;步驟S404:使用第二特徵圖像及一組內建圖像進行比較以產生第二組相似度;步驟S406:連接介面100從超音波探頭12接收第一接收訊號; 步驟S408:依據第一接收訊號產生第一特徵圖像;步驟S410:將第一特徵圖像及組內建圖像進行比較以產生第一組相似度;步驟S412:第一組相似度與第二組相似度之間至少部分的相似度不匹配?若是,執行步驟S414,若否,執行步驟S416;步驟S414:判定超音波探頭12不合格。 Figure 4 is a flowchart of the ultrasonic probe inspection method 4 in the embodiment of the present invention. Ultrasonic probe inspection method 4 is applicable to the ultrasonic probe inspection system 10, and includes steps S400 to S416, where steps S400 to S404 are used to generate a second set of similarities of the ultrasonic probe 12 when the ultrasonic probe 12 is just shipped from the factory. Steps S406 to S410 are used to generate the first set of similarities of the ultrasonic probe 12 after the ultrasonic probe 12 is used for a period of time, and steps S410 to S416 are used to check whether the ultrasonic probe 12 is qualified. Any reasonable technical changes or step adjustments belong to the scope disclosed by the present invention. The steps S400 to S416 are described in detail below: Step S400: When the ultrasonic probe 12 is just shipped from the factory, the connection interface 100 receives the second received signal from the ultrasonic probe 12; Step S402: Use the second received signal to generate a second feature image; Step S404: Use the second feature map The image and a set of built-in images are compared to generate a second set of similarities; step S406: the connection interface 100 receives the first received signal from the ultrasonic probe 12; Step S408: Generate a first feature image according to the first received signal; Step S410: Compare the first feature image and the group of built-in images to generate a first group of similarities; Step S412: The first group of similarities is compared with the first group of similarities At least part of the similarity between the two sets of similarities does not match? If yes, execute step S414, if not, execute step S416; step S414: determine that the ultrasonic probe 12 is unqualified.

步驟S416:判定超音波探頭12合格。 Step S416: It is determined that the ultrasonic probe 12 is qualified.

步驟S400至S416的說明已於前文中詳述,因此其細節於此將不再贅述。藉由步驟S400至S416可檢驗超音波探頭12是否合格,因此可通知使用者並讓使用者判斷是否要繼續使用目前的超音波探頭12,或是替換其他超音波探頭12。 The description of steps S400 to S416 has been described in detail above, so the details will not be repeated here. Through steps S400 to S416, it is possible to check whether the ultrasonic probe 12 is qualified. Therefore, the user can be notified and let the user determine whether to continue using the current ultrasonic probe 12 or replace other ultrasonic probes 12.

綜上所述,本發明之超音波探頭檢驗系統10及超音波探頭檢驗方法4藉由超音波探頭之特徵圖像的相似度的變化來判斷超音波探頭的品質,不須額外的阻抗量測電路及控制線路即可得知超音波探頭是否合格,可縮小超音波探頭尺寸及節省製造成本。 In summary, the ultrasonic probe inspection system 10 and the ultrasonic probe inspection method 4 of the present invention judge the quality of the ultrasonic probe by the change of the similarity of the characteristic image of the ultrasonic probe without additional impedance measurement. The circuit and control circuit can know whether the ultrasonic probe is qualified, which can reduce the size of the ultrasonic probe and save the manufacturing cost.

以上所述僅為本發明之較佳實施例,凡依本發明申請專利範圍所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。 The foregoing descriptions are only preferred embodiments of the present invention, and all equivalent changes and modifications made in accordance with the scope of the patent application of the present invention should fall within the scope of the present invention.

4:超音波探頭檢驗方法 4: Ultrasonic probe inspection method

S400至S416:步驟 S400 to S416: steps

Claims (7)

一種超音波探頭檢驗系統,包含:一連接介面,耦接於一超音波探頭;一記憶體,用以儲存一超音波探頭資料庫;及一控制器,耦接於該連接介面及該記憶體;其中當該超音波探頭於剛出廠時,該連接介面從該超音波探頭接收一第二接收訊號,該控制器依據該第二接收訊號產生一第二特徵圖像以及將該第二特徵圖像及該組內建圖像進行比較以產生該第二組相似度,及將該第二組相似度儲存於該超音波探頭資料庫;當該超音波探頭使用一預設時間後,該連接介面從該超音波探頭接收一第一接收訊號,該控制器依據該第一接收訊號產生一第一特徵圖像,將該第一特徵圖像及一組內建圖像進行比較以產生一第一組相似度,及當該第一組相似度與該第二組相似度之間至少部分的相似度不匹配時,判定該超音波探頭不合格。 An ultrasonic probe inspection system, comprising: a connection interface coupled to an ultrasonic probe; a memory for storing an ultrasonic probe database; and a controller coupled to the connection interface and the memory ; Wherein when the ultrasonic probe just leaves the factory, the connection interface receives a second received signal from the ultrasonic probe, the controller generates a second feature image and the second feature map according to the second received signal Compare the image and the set of built-in images to generate the second set of similarities, and store the second set of similarities in the ultrasound probe database; when the ultrasound probe is used for a preset time, the connection The interface receives a first received signal from the ultrasonic probe, the controller generates a first characteristic image according to the first received signal, and compares the first characteristic image with a set of built-in images to generate a first A set of similarities, and when at least part of the similarities between the first set of similarities and the second set of similarities do not match, the ultrasonic probe is determined to be unqualified. 如請求項1所述之超音波探頭檢驗系統,其中該第一組相似度包含複數個相似度,當該些相似度中之一相似度超出該第二組相似度中之一對應相似度的容忍值時,該控制器判定該些相似度中之該相似度與該第二組相似度中之該對應相似度不匹配。 The ultrasonic probe inspection system according to claim 1, wherein the first group of similarities includes a plurality of similarities, and when one of the similarities exceeds the corresponding similarity of one of the second group of similarities When the tolerance value is used, the controller determines that the similarity in the similarities does not match the corresponding similarity in the second set of similarities. 一種超音波探頭檢驗系統,包含:一連接介面,耦接於一超音波探頭;一記憶體,用以儲存一超音波探頭資料庫;及 一控制器,耦接於該連接介面及該記憶體;其中當該超音波探頭於剛出廠時,該連接介面從該超音波探頭接收一第二接收訊號,該控制器依據該第二接收訊號產生一第二特徵圖像;當該超音波探頭使用一預設時間後,該連接介面從該超音波探頭接收一第一接收訊號,該控制器將該第二特徵圖像加權一衰減值產生一第三特徵圖像,該衰減值對應該預設時間,該控制器將該第三特徵圖像及一組內建圖像進行比較以產生該第二組相似度,將該第二組相似度儲存於該超音波探頭資料庫,依據該第一接收訊號產生一第一特徵圖像,將該第一特徵圖像及該組內建圖像進行比較以產生一第一組相似度,及當該第一組相似度與該第二組相似度之間至少部分的相似度不匹配時,判定該超音波探頭不合格。 An ultrasonic probe inspection system, comprising: a connection interface coupled to an ultrasonic probe; a memory for storing an ultrasonic probe database; and A controller coupled to the connection interface and the memory; wherein when the ultrasound probe is just shipped from the factory, the connection interface receives a second reception signal from the ultrasound probe, and the controller is based on the second reception signal Generate a second characteristic image; when the ultrasonic probe is used for a preset time, the connection interface receives a first received signal from the ultrasonic probe, and the controller weights the second characteristic image by an attenuation value to generate A third characteristic image, the attenuation value corresponding to a preset time, the controller compares the third characteristic image with a set of built-in images to generate the second set of similarities, and the second set of similarities The degree is stored in the ultrasound probe database, a first characteristic image is generated according to the first received signal, the first characteristic image and the set of built-in images are compared to generate a first set of similarity, and When at least part of the similarity between the first group of similarities and the second group of similarities does not match, it is determined that the ultrasonic probe is unqualified. 如請求項1或3所述之超音波探頭檢驗系統,其中該控制器將該第一組相似度及該超音波探頭的一組初始相似度相比以判定該超音波探頭的品質是否穩定,及當該第一組相似度超過該超音波探頭的該組初始相似度的容忍值時,該控制器判定該超音波探頭的品質已惡化。 The ultrasonic probe inspection system according to claim 1 or 3, wherein the controller compares the first set of similarities with a set of initial similarities of the ultrasonic probe to determine whether the quality of the ultrasonic probe is stable, And when the first group of similarity exceeds the tolerance value of the initial similarity of the ultrasound probe, the controller determines that the quality of the ultrasound probe has deteriorated. 如請求項1或3所述之超音波探頭檢驗系統,其中該控制器載入一人工類神經網路以依據該特徵圖像及該組內建圖像產生該第一組相似度。 The ultrasonic probe inspection system according to claim 1 or 3, wherein the controller loads an artificial neural network to generate the first set of similarities based on the characteristic image and the set of built-in images. 一種超音波探頭檢驗方法,包含:當一超音波探頭於剛出廠時,一連接介面從該超音波探頭接收一第二接收訊號;利用該第二接收訊號產生一第二特徵圖像; 使用該第二特徵圖像及一組內建圖像進行比較以產生一第二組相似度;當該超音波探頭使用一預設時間後,該連接介面從該超音波探頭接收一第一接收訊號;依據該第一接收訊號產生一第一特徵圖像;將該第一特徵圖像及該組內建圖像進行比較以產生一第一組相似度;及當該第一組相似度與該第二組相似度之間至少部分的相似度不匹配時,判定該超音波探頭不合格。 An ultrasonic probe inspection method, comprising: when an ultrasonic probe is just shipped from the factory, a connection interface receives a second received signal from the ultrasonic probe; using the second received signal to generate a second characteristic image; Use the second characteristic image and a set of built-in images to compare to generate a second set of similarities; when the ultrasound probe is used for a preset time, the connection interface receives a first reception from the ultrasound probe Signal; generate a first feature image according to the first received signal; compare the first feature image and the set of built-in images to generate a first set of similarities; and when the first set of similarities is When at least part of the similarities between the second group of similarities do not match, the ultrasonic probe is determined to be unqualified. 一種超音波探頭檢驗方法,包含:當一超音波探頭於剛出廠時,一連接介面從一超音波探頭接收一第二接收訊號;利用該第二接收訊號產生一第二特徵圖像;當該超音波探頭使用一預設時間後,將該第二特徵圖像加權一衰減值以產生一第三特徵圖像,該衰減值對應該預設時間;該控制器將該第三特徵圖像及一組內建圖像進行比較以產生一第二組相似度;當該超音波探頭使用一預設時間後,該連接介面從該超音波探頭接收一第一接收訊號;依據該第一接收訊號產生一第一特徵圖像;將該第一特徵圖像及該組內建圖像進行比較以產生一第一組相似度;及當該第一組相似度與該第二組相似度之間至少部分的相似度不匹配時,判定該超音波探頭不合格。 An ultrasonic probe inspection method includes: when an ultrasonic probe is just shipped from the factory, a connection interface receives a second receiving signal from an ultrasonic probe; using the second received signal to generate a second characteristic image; After the ultrasound probe is used for a preset time, the second feature image is weighted by an attenuation value to generate a third feature image, the attenuation value corresponding to the preset time; the controller uses the third feature image and A set of built-in images are compared to generate a second set of similarities; when the ultrasound probe is used for a preset time, the connection interface receives a first reception signal from the ultrasound probe; according to the first reception signal Generate a first feature image; compare the first feature image and the set of built-in images to generate a first set of similarities; and when the first set of similarities are between the second set of similarities When at least part of the similarity does not match, the ultrasonic probe is judged to be unqualified.
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TW201441612A (en) * 2013-04-22 2014-11-01 Qisda Corp Device and method for detecting performance of ultrasonic probe and compensation

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