TWI722729B - Stone image analysis method based on stone processing - Google Patents

Stone image analysis method based on stone processing Download PDF

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TWI722729B
TWI722729B TW108147174A TW108147174A TWI722729B TW I722729 B TWI722729 B TW I722729B TW 108147174 A TW108147174 A TW 108147174A TW 108147174 A TW108147174 A TW 108147174A TW I722729 B TWI722729 B TW I722729B
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stone
image
position information
processing
image analysis
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TW202124913A (en
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陳清芳
陳佳緯
魏川濱
郭志成
唐政宏
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財團法人石材暨資源產業研究發展中心
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一種基於石材加工的石材影像分析方法,由一影像分析系統執行,該影像分析系統包括一拍攝單元,該方法適用於分析一由該拍攝單元拍攝一待加工石材的一待加工石材影像,並包含以下步驟:(A)根據該待加工石材影像獲得至少一拍攝設定資料;(B) 根據該至少一拍攝設定資料拍攝該待加工石材,以獲得至少一對應該至少一拍攝設定資料的目標影像;(C)將該至少一目標影像進行灰階化以及二值化轉換,以獲得至少一轉換後影像;及(D)分析該至少一轉換後影像以產生一包括一相關於該待加工石材的邊緣位置的邊緣位置資訊的分析資料。A stone image analysis method based on stone processing is executed by an image analysis system. The image analysis system includes a shooting unit. The method is suitable for analyzing an image of a stone to be processed taken by the shooting unit, and includes The following steps: (A) Obtain at least one shooting setting data according to the image of the stone to be processed; (B) Shoot the stone to be processed according to the at least one shooting setting data to obtain at least one pair of target images that should be at least one shooting setting data; (C) Perform gray-scale and binarization conversion on the at least one target image to obtain at least one converted image; and (D) analyze the at least one converted image to generate an image including an image related to the stone to be processed The analysis data of the edge position information of the edge position.

Description

基於石材加工的石材影像分析方法Stone image analysis method based on stone processing

本發明是有關於一種影像分析方法,特別是指一種基於石材加工的石材影像分析方法。The invention relates to an image analysis method, in particular to a stone image analysis method based on stone processing.

在石材加工的產業中,業者在加工石材前,必須先量測石材的形狀大小,才能進行加工。現有的量測方式,是以人工利用尺規量測石材,以獲得石材的形狀大小。In the stone processing industry, the industry must measure the shape and size of the stone before processing the stone. The existing measurement method is to manually measure the stone with a ruler to obtain the shape and size of the stone.

然而,以人工的量測石材的形狀大小非常的耗時,再者,因石材形狀變化甚多,如遇不規則的複雜形狀的石材量測起來更為耗時耗力。However, it is very time-consuming to measure the shape and size of the stone manually. Moreover, because the shape of the stone changes a lot, it is more time-consuming and labor-intensive to measure the irregular and complex shape of the stone.

有鑑於此,故如何提供一種能提高量測石材效率的方法,即為本創作所欲解決之首要課題。In view of this, how to provide a method that can improve the efficiency of measuring stone is the primary subject of this creation.

因此,本發明的目的,即在提供一種能提高量測石材效率的基於石材加工的石材影像分析方法。Therefore, the purpose of the present invention is to provide a stone image analysis method based on stone processing that can improve the efficiency of measuring stone.

於是,本發明基於石材加工的石材影像分析方法,由一影像分析系統執行,該影像分析系統包括一拍攝單元,該方法適用於分析一由該拍攝單元拍攝一待加工石材的一待加工石材影像,並包含一步驟(A)、一步驟(B)、一步驟(C),及一步驟(D)。Therefore, the stone image analysis method based on stone processing of the present invention is executed by an image analysis system. The image analysis system includes a photographing unit. The method is suitable for analyzing an image of a stone to be processed taken by the photographing unit of a stone to be processed. , And includes one step (A), one step (B), one step (C), and one step (D).

在該步驟(A)中,該影像分析系統根據該待加工石材影像獲得至少一拍攝設定資料。In the step (A), the image analysis system obtains at least one shooting setting data according to the image of the stone to be processed.

在該步驟(B)中,該影像分析系統根據該至少一拍攝設定資料拍攝該待加工石材,以獲得至少一對應該至少一拍攝設定資料的目標影像。In the step (B), the image analysis system photographs the stone to be processed according to the at least one photographing setting data to obtain at least one target image corresponding to the at least one photographing setting data.

在該步驟(C)中,該影像分析系統將該至少一目標影像進行灰階化以及二值化轉換,以獲得至少一轉換後影像。In the step (C), the image analysis system performs gray-scale and binarization conversion on the at least one target image to obtain at least one converted image.

在該步驟(D)中,該影像分析系統分析該至少一轉換後影像以產生一包括一相關於該待加工石材的邊緣位置的邊緣位置資訊的分析資料。In the step (D), the image analysis system analyzes the at least one converted image to generate an analysis data including edge position information related to the edge position of the stone to be processed.

本發明之功效在於:藉由該影像分析系統分析該至少一轉換後影像後,產生包括該邊緣位置資訊的該分析資料,以快速獲得該待加工石材的形狀大小。The effect of the present invention is that after analyzing the at least one converted image by the image analysis system, the analysis data including the edge position information is generated to quickly obtain the shape and size of the stone to be processed.

在本發明被詳細描述前,應當注意在以下的說明內容中,類似的元件是以相同的編號來表示。Before the present invention is described in detail, it should be noted that in the following description, similar elements are represented by the same numbers.

參閱圖1,本發明基於石材加工的石材影像分析方法的一實施例,由一影像分析系統1,該影像分析系統1包含一儲存單元11、一拍攝單元12,及一電連接該儲存單元11及該拍攝單元12的處理單元13,本發明基於石材加工的石材影像分析方法的該實施例適用於分析一由該拍攝單元12拍攝一待加工石材的一待加工石材影像(如圖2所示)。Referring to FIG. 1, an embodiment of the stone image analysis method based on stone processing of the present invention consists of an image analysis system 1. The image analysis system 1 includes a storage unit 11, a shooting unit 12, and an electrical connection to the storage unit 11 And the processing unit 13 of the photographing unit 12, this embodiment of the stone image analysis method based on stone processing of the present invention is suitable for analyzing a stone to be processed image of a stone to be processed taken by the photographing unit 12 (as shown in FIG. 2 ).

該儲存單元11儲存一加工參數資料,該加工參數資料包括一切割形狀,及一相關於該切割形狀的切割尺寸,該切割形狀例如為矩形、圓形、三角形、橢圓等任意形狀。The storage unit 11 stores a processing parameter data. The processing parameter data includes a cutting shape and a cutting size related to the cutting shape. The cutting shape is, for example, any shape such as a rectangle, a circle, a triangle, or an ellipse.

該拍攝單元12包括一場域光源裝置及一電荷耦合裝置(Charge-coupled Device, CCD)。值得注意的是,在本實施例中,使用者可根據需求控制該場域光源裝置,以致該場域光源裝置給予最佳光源。The photographing unit 12 includes a field light source device and a charge-coupled device (CCD). It is worth noting that in this embodiment, the user can control the field light source device according to requirements, so that the field light source device provides the best light source.

參閱圖1及圖3,說明該影像分析系統1如何執行本發明基於石材加工的石材影像分析方法之該實施例。以下詳細說明該實施例所包含的步驟。1 and 3, it is explained how the image analysis system 1 implements the embodiment of the stone image analysis method based on stone processing of the present invention. The steps included in this embodiment are described in detail below.

在步驟21中,該處理單元13根據該待加工石材影像獲得至少一拍攝設定資料,每一拍攝設定資料包括相關於該影像拍攝單元12的一快門速度及一光圈值之其中至少一者。值得注意的是,在本實施例中,該處理單元13係根據該待加工石材影像獲得一第一拍攝設定資料及一第二拍攝設定資料,在其他實施方式中,該處理單元13亦可根據該待加工石材影像僅獲得一拍攝設定資料,不以此為限。In step 21, the processing unit 13 obtains at least one shooting setting data according to the image of the stone to be processed, and each shooting setting data includes at least one of a shutter speed and an aperture value related to the image shooting unit 12. It is worth noting that in this embodiment, the processing unit 13 obtains a first shooting setting data and a second shooting setting data according to the image of the stone to be processed. In other embodiments, the processing unit 13 may also be based on The image of the stone to be processed only obtains a shooting setting data, which is not limited to this.

在步驟22中,該處理單元13控制該拍攝單元12根據該至少一拍攝設定資料拍攝該待加工石材,以獲得至少一對應該至少一拍攝設定資料的目標影像。值得注意的是,在本實施例中,該處理單元13係控制該拍攝單元12根據該第一拍攝設定資料及該第二拍攝設定資料拍攝該待加工石材,以獲得一對應該第一拍攝設定資料的第一目標影像及一對應該第二拍攝設定資料的第二目標影像,在其他實施方式中,該處理單元13亦可僅根據該拍攝設定資料獲得一目標影像,不以此為限。In step 22, the processing unit 13 controls the photographing unit 12 to photograph the stone to be processed according to the at least one photographing setting data to obtain at least one target image corresponding to the at least one photographing setting data. It is worth noting that in this embodiment, the processing unit 13 controls the photographing unit 12 to photograph the stone to be processed according to the first photographing setting data and the second photographing setting data to obtain a corresponding first photographing setting. The first target image of the data and the second target image corresponding to the second shooting setting data. In other embodiments, the processing unit 13 may also obtain a target image only according to the shooting setting data, and it is not limited to this.

在步驟23中,該處理單元13將該至少一目標影像進行灰階化以及二值化轉換,以獲得至少一轉換後影像。值得注意的是,在本實施例中,該處理單元13係將該第一目標影像及該第二目標影像進行灰階化以及二值化,以獲得一對應該第一目標影像的第一轉換後影像(如圖4所示)及一對應該第二目標影像的第二轉換後影像(如圖5所示),在其他實施方式中,該處理單元13亦可僅根據該目標影像獲得一轉換後影像,不以此為限。In step 23, the processing unit 13 performs grayscale and binarization conversion on the at least one target image to obtain at least one converted image. It is worth noting that in this embodiment, the processing unit 13 gray-scales and binarizes the first target image and the second target image to obtain a first conversion corresponding to the first target image The rear image (as shown in FIG. 4) and the second converted image (as shown in FIG. 5) corresponding to the second target image. In other embodiments, the processing unit 13 may also obtain one based on the target image only. The converted image is not limited to this.

在步驟24中,該處理單元13分析該至少一轉換後影像以產生一分析資料,該分析資料包括一相關於該待加工石材的邊緣位置的邊緣位置資訊,及一相關於至少一瑕疵圖形之位置的瑕疵位置資訊。值得注意的是,在本實施例中,該處理單元13係分析該第一轉換後影像獲得該邊緣位置資訊,及分析該第二轉換後影像獲得該瑕疵位置資訊,在其他實施方式中,該處理單元13亦可根據該轉換後影像以產生僅包括邊緣位置資訊的分析資料,不以此為限。In step 24, the processing unit 13 analyzes the at least one converted image to generate an analysis data, the analysis data includes an edge position information related to the edge position of the stone to be processed, and an edge position information related to at least one defect pattern Defect location information of the location. It is worth noting that in this embodiment, the processing unit 13 analyzes the first converted image to obtain the edge position information, and analyzes the second converted image to obtain the defect position information. In other embodiments, the The processing unit 13 can also generate analysis data including only edge position information according to the converted image, and it is not limited to this.

值得一提的是,由於本發明之特徵並不在於熟知此技藝者所已知的將該至少一轉換後影像中的該待加工石材的該邊緣位置及該至少一瑕疵圖形之位置換算成實際上該待加工石材的相對位置的換算方法,為了簡潔,故在此省略了他們的細節。It is worth mentioning that the feature of the present invention does not lie in converting the edge position of the stone to be processed in the at least one converted image and the position of the at least one defect pattern into actual The above conversion method of the relative position of the stone to be processed is for the sake of brevity, so their details are omitted here.

在步驟25中,該處理單元13根據該分析資料該加工參數資料,產生一相關於一加工路徑的加工路徑位置資訊,該加工路徑位置資訊所相關的該加工路徑相關於該加工參數資料的該切割形狀。In step 25, the processing unit 13 generates processing path position information related to a processing path based on the analysis data and the processing parameter data. The processing path related to the processing path position information is related to the processing parameter data. Cut shape.

搭配參閱圖6,步驟25包括以下子步驟。Refer to FIG. 6 in conjunction, step 25 includes the following sub-steps.

在步驟251中,該處理單元13根據該分析資料的該邊緣位置資訊及該瑕疵位置資訊,獲得一相關於該待加工石材內的一最大內接矩形(如圖7所示)之位置的矩形位置資訊,其中該最大內接矩形內不包括該至少一瑕疵圖形。要特別注意的是,在本實施例中,該處理單元13是利用遍歷中心擴散法(traversal center diffusion method)或旋轉直方圖法(rotation histogram method)獲得該最大內接矩形。值得注意的是,在其他實施方式中,該處理單元13亦可僅根據該分析資料的該邊緣位置資訊獲得該矩形位置資訊,不以此為限。In step 251, the processing unit 13 obtains a rectangle related to the position of a largest inscribed rectangle (as shown in FIG. 7) in the stone to be processed based on the edge position information and the defect position information of the analysis data. Location information, wherein the at least one defect pattern is not included in the largest inscribed rectangle. It should be particularly noted that in this embodiment, the processing unit 13 uses the traversal center diffusion method or the rotation histogram method to obtain the maximum inscribed rectangle. It is worth noting that in other embodiments, the processing unit 13 may also obtain the rectangular position information only according to the edge position information of the analysis data, and it is not limited to this.

在步驟252中,該處理單元13根據該加工參數資料及該矩形位置資訊,產生該加工路徑位置資訊,其中,該加工路徑在該最大內接矩形內。In step 252, the processing unit 13 generates the processing path position information according to the processing parameter data and the rectangle position information, wherein the processing path is within the maximum inscribed rectangle.

綜上所述,本發明基於石材加工的石材影像分析方法,藉由該處理單元13分析該至少一轉換後影像後,產生該分析資料,以根據該分析資料的該邊緣位置資訊,快速獲得該待加工石材的形狀大小,再根據該分析資料的該瑕疵位置資訊獲得該矩形位置資訊,最後,根據該加工參數資料及該矩形位置資訊,自動產生該加工路徑位置資訊,故確實能達成本發明的目的。In summary, the stone image analysis method of the present invention is based on stone processing. After the processing unit 13 analyzes the at least one converted image, the analysis data is generated to quickly obtain the edge position information of the analysis data. According to the shape and size of the stone to be processed, the rectangle position information is obtained according to the defect position information of the analysis data. Finally, the processing path position information is automatically generated according to the processing parameter data and the rectangle position information, so it can indeed achieve the invention the goal of.

惟以上所述者,僅為本發明的實施例而已,當不能以此限定本發明實施的範圍,凡是依本發明申請專利範圍及專利說明書內容所作的簡單的等效變化與修飾,皆仍屬本發明專利涵蓋的範圍內。However, the above are only examples of the present invention. When the scope of implementation of the present invention cannot be limited by this, all simple equivalent changes and modifications made in accordance with the scope of the patent application of the present invention and the content of the patent specification still belong to Within the scope of the patent of the present invention.

1:影像分析系統1: Image analysis system

11:儲存單元11: storage unit

12:拍攝單元12: Shooting unit

13:處理單元13: processing unit

21~25:步驟21~25: Step

251、252:步驟251, 252: Steps

本發明的其他的特徵及功效,將於參照圖式的實施方式中清楚地呈現,其中: 圖1是一方塊圖,說明用來實施本發明基於石材加工的石材影像分析方法的一實施例的一影像分析系統; 圖2是一示意圖,說明一待加工石材影像; 圖3是一流程圖,說明本發明基於石材加工的石材影像分析方法的該實施例; 圖4是一示意圖,說明一第一轉換後影像; 圖5是一示意圖,說明一第二轉換後影像; 圖6是一流程圖,輔助說明圖3步驟25之子步驟;及 圖7是一示意圖,說明一待加工石材內的一最大內接矩形。 Other features and effects of the present invention will be clearly presented in the embodiments with reference to the drawings, in which: FIG. 1 is a block diagram illustrating an image analysis system used to implement an embodiment of the stone image analysis method based on stone processing of the present invention; Figure 2 is a schematic diagram illustrating an image of a stone to be processed; Figure 3 is a flowchart illustrating the embodiment of the stone image analysis method based on stone processing of the present invention; Figure 4 is a schematic diagram illustrating a first converted image; Figure 5 is a schematic diagram illustrating a second converted image; Fig. 6 is a flowchart to assist in explaining the sub-steps of step 25 in Fig. 3; and Fig. 7 is a schematic diagram illustrating a largest inscribed rectangle in a stone to be processed.

21~25:步驟 21~25: Step

Claims (8)

一種基於石材加工的石材影像分析方法,由一影像分析系統執行,該影像分析系統儲存一加工參數資料,該影像分析系統包括一拍攝單元,該方法適用於分析一由該拍攝單元拍攝一待加工石材的一待加工石材影像,並包含以下步驟:(A)根據該待加工石材影像獲得至少一拍攝設定資料;(B)根據該至少一拍攝設定資料拍攝該待加工石材,以獲得至少一對應該至少一拍攝設定資料的目標影像;(C)將該至少一目標影像進行灰階化以及二值化轉換,以獲得至少一轉換後影像;(D)分析該至少一轉換後影像以產生一包括一相關於該待加工石材的邊緣位置的邊緣位置資訊的分析資料;及(E)根據該分析資料的該邊緣位置資訊及該加工參數資料,產生一相關於一加工路徑的加工路徑位置資訊。 A stone image analysis method based on stone processing is executed by an image analysis system, the image analysis system stores a processing parameter data, the image analysis system includes a shooting unit, the method is suitable for analyzing a shooting by the shooting unit to be processed An image of the stone to be processed, and includes the following steps: (A) Obtain at least one shooting setting data according to the image of the stone to be processed; (B) Shoot the stone to be processed according to the at least one shooting setting data to obtain at least one pair At least one target image of the setting data should be captured; (C) the at least one target image is gray-scaled and binarized to obtain at least one converted image; (D) the at least one converted image is analyzed to generate a Including an analysis data of edge position information related to the edge position of the stone to be processed; and (E) generating a processing path position information related to a processing path based on the edge position information of the analysis data and the processing parameter data . 如請求項1所述的基於石材加工的石材影像分析方法,其中,在步驟(A)中,每一拍攝設定資料包括相關於該影像拍攝單元的一快門速度及一光圈值之其中至少一者。 The stone image analysis method based on stone processing according to claim 1, wherein, in step (A), each shooting setting data includes at least one of a shutter speed and an aperture value related to the image shooting unit . 如請求項1所述的基於石材加工的石材影像分析方法,其中,步驟(E)包括以下子步驟:(E-1)根據該分析資料的該邊緣位置資訊,獲得一相關於該待加工石材內的一最大內接矩形之位置的矩形位置資訊;及 (E-2)根據該加工參數資料及該矩形位置資訊,產生該加工路徑位置資訊。 The stone image analysis method based on stone processing according to claim 1, wherein step (E) includes the following sub-steps: (E-1) according to the edge position information of the analysis data, obtain an information related to the stone to be processed Rectangle position information of the position of the largest inscribed rectangle within; and (E-2) According to the processing parameter data and the rectangle position information, generate the processing path position information. 如請求項3所述的基於石材加工的石材影像分析方法,該加工參數資料包括一切割形狀,及一相關於該切割形狀的切割尺寸,其中,在步驟(E-2)中,該加工路徑位置資訊所相關的該加工路徑相關於該切割形狀,且該加工路徑在該最大內接矩形內。 According to the stone image analysis method based on stone processing according to claim 3, the processing parameter data includes a cutting shape and a cutting size related to the cutting shape, wherein, in step (E-2), the processing path The processing path related to the position information is related to the cutting shape, and the processing path is within the maximum inscribed rectangle. 如請求項1所述的基於石材加工的石材影像分析方法,其中,在步驟(A)中,該影像分析系統係根據該待加工石材影像獲得一第一拍攝設定資料及一第二拍攝設定資料,在步驟(B)中,該影像分析系統係根據該第一拍攝設定資料及該第二拍攝設定資料拍攝該待加工石材,以獲得一對應該第一拍攝設定資料的第一目標影像及一對應該第二拍攝設定資料的第二目標影像,在步驟(C)中,該影像分析系統係將該第一目標影像及該第二目標影像進行灰階化以及二值化轉換,以獲得一對應該第一目標影像的第一轉換後影像及一對應該第二目標影像的第二轉換後影像,在步驟(D)中,該分析資料還包括一相關於至少一瑕疵圖形的瑕疵位置資訊,且該影像分析系統分析該第一轉換後影像獲得該邊緣位置資訊,及分析該第二轉換後影像獲得該瑕疵位置資訊。 The stone image analysis method based on stone processing according to claim 1, wherein, in step (A), the image analysis system obtains a first shooting setting data and a second shooting setting data according to the image of the stone to be processed In step (B), the image analysis system shoots the stone to be processed according to the first shooting setting data and the second shooting setting data to obtain a first target image and a first target image corresponding to the first shooting setting data Corresponding to the second target image of the second shooting setting data, in step (C), the image analysis system performs gray-scale and binarization conversion on the first target image and the second target image to obtain a The first converted image corresponding to the first target image and the second converted image corresponding to the second target image. In step (D), the analysis data further includes defect location information related to at least one defect pattern And the image analysis system analyzes the first converted image to obtain the edge position information, and analyzes the second converted image to obtain the defect position information. 如請求項5所述的基於石材加工的石材影像分析方法,該影像分析系統儲存一加工參數資料,在步驟(D)後還包含以下步驟: (F)根據該分析資料的該邊緣位置資訊與該瑕疵位置資訊,及該加工參數資料,產生一相關於一加工路徑的加工路徑位置資訊。 For the stone image analysis method based on stone processing described in claim 5, the image analysis system stores a processing parameter data, and further includes the following steps after step (D): (F) According to the edge position information and the defect position information of the analysis data, and the processing parameter data, generate a processing path position information related to a processing path. 如請求項6所述的基於石材加工的石材影像分析方法,其中,步驟(F)包括以下子步驟:(F-1)根據該分析資料的該邊緣位置資訊及該瑕疵位置資訊,獲得一相關於該待加工石材內的一最大內接矩形之位置的矩形位置資訊;及(F-2)根據該加工參數資料及該矩形位置資訊,產生該加工路徑位置資訊。 The stone image analysis method based on stone processing according to claim 6, wherein, step (F) includes the following sub-steps: (F-1) obtaining a correlation based on the edge position information and the defect position information of the analysis data Rectangular position information of the position of a largest inscribed rectangle in the stone to be processed; and (F-2) generate the processing path position information based on the processing parameter data and the rectangular position information. 如請求項7所述的基於石材加工的石材影像分析方法,其中,在步驟(F-1)中,該最大內接矩形內不包括該至少一瑕疵圖形。 The stone image analysis method based on stone processing according to claim 7, wherein, in step (F-1), the at least one defect pattern is not included in the largest inscribed rectangle.
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US5436736A (en) * 1991-03-15 1995-07-25 Canon Kabushiki Kaisha Image processing apparatus
US6134343A (en) * 1996-09-24 2000-10-17 Cognex Corporation System or method for detecting defect within a semi-opaque enclosure
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