TWI720367B - Processor module with integrated packaged power converter - Google Patents
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- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
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- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
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- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0213—Electrical arrangements not otherwise provided for
- H05K1/0254—High voltage adaptations; Electrical insulation details; Overvoltage or electrostatic discharge protection ; Arrangements for regulating voltages or for using plural voltages
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- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
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Abstract
Description
本發明係關於一種用於集成電路的電源轉換器。 The invention relates to a power converter for integrated circuits.
諸如降壓轉換器的開關電感型DC-DC電源轉換器(switched inductor DC-DC power converter)提供從高電壓電位到低電壓電位的電源轉換。這些類型的轉換器被用於廣泛且多種多樣的一組應用中。一個典型的應用是用於微處理器和其他靈敏的或高性能的集成電路的電源供應器的轉換和調節。 A switched inductor DC-DC power converter, such as a buck converter, provides power conversion from a high voltage potential to a low voltage potential. These types of converters are used in a wide and diverse set of applications. A typical application is the conversion and regulation of power supplies for microprocessors and other sensitive or high-performance integrated circuits.
在目前的微電子系統中,電源轉換器的部件(例如,電源控制集成電路、電源開關、電感器(一個或更多個)以及電容 器)被安裝在離處理器很遠的側向垂直距離處的電路板上,所述電路板消耗從電源轉換器輸出的功率。由於將電流從電路板上的電源轉換器傳送到處理器晶片的互連部分中的熱傳導損耗(P=I2R損耗),這個大的距離導致大量功率損耗。附加功率損耗是由通常存在於從電路板到處理器晶片或模具的互連部分中的大的AC阻抗引起的,因為處理器電流消耗的動態變化將引起顯著的供應電壓偏差,這些供應電壓偏差迫使低效的供應電壓裕度確保供應不會降至用於處理器晶片的正確操作的最小需要電壓電位以下。例如,如果用於處理器的正確操作的最小供應電壓為0.7V,但是“最壞情況”負載電流瞬態可能在電源傳輸互連部分的整個阻抗上、在100mV的供應電壓上引起瞬態誤差,則有必要為處理器晶片供應>0.8V以確保在“最壞情況”負載電流瞬態的情況下,供應電壓不會降至0.7V以下。這個供應電壓裕度對於處理器晶片導致大於15%的附加功耗。這樣的公知系統的實施例在圖1中被圖示說明。 In current microelectronic systems, the components of the power converter (for example, power control integrated circuits, power switches, inductor(s), and capacitors) are installed at a large lateral vertical distance from the processor The circuit board consumes the power output from the power converter. This large distance results in a large amount of power loss due to the thermal conduction loss (P=I 2 R loss) in the interconnection portion that transfers current from the power converter on the circuit board to the processor chip. The additional power loss is caused by the large AC impedance that usually exists in the interconnection from the circuit board to the processor chip or mold, because the dynamic changes in the processor current consumption will cause significant supply voltage deviations. These supply voltage deviations Forcing an inefficient supply voltage margin ensures that the supply does not fall below the minimum required voltage potential for proper operation of the processor chip. For example, if the minimum supply voltage for the correct operation of the processor is 0.7V, but the "worst case" load current transient may cause a transient error on the 100mV supply voltage across the entire impedance of the power transmission interconnection. , It is necessary to supply >0.8V to the processor chip to ensure that the supply voltage will not drop below 0.7V under the "worst case" load current transient. This supply voltage margin causes more than 15% of additional power consumption for the processor chip. An embodiment of such a known system is illustrated in FIG. 1.
已經做出了將電源轉換器集成到處理器封裝基板上的一些嘗試。在這樣做時,電源供應調節器和處理器晶片之間的電互連部分的電阻和AC阻抗被減小,使得可以減小熱傳導損耗和供 應電壓裕度損耗。然而,這樣的嘗試不能實現小得足以被集成在處理器封裝件中的高效的電源轉換器實施,並且通常對系統引發附加的性能或功能性損害,諸如電端子從處理器封裝基板的移除,這使進出處理器的數據帶寬減小。 Some attempts have been made to integrate power converters on the processor package substrate. In doing so, the resistance and AC impedance of the electrical interconnection between the power supply regulator and the processor chip are reduced, making it possible to reduce heat conduction loss and power supply. Should the voltage margin loss. However, such attempts cannot achieve high-efficiency power converters that are small enough to be implemented in the processor package, and often cause additional performance or functional damage to the system, such as removal of electrical terminals from the processor package substrate , Which reduces the data bandwidth in and out of the processor.
克服本領域中的這些及其他缺陷中的一個或更多個將是期望的。 It would be desirable to overcome one or more of these and other deficiencies in the art.
本文所描述的示例實施方案具有創新的特徵,其中沒有一個是不可或缺的或單獨地用於它們的期望屬性。以下描述和附圖詳細地闡述本公開的某些說明性實現,這些實現指示可以實現本公開的各種原理的幾種示例性方式。然而,說明性實施方案並不窮舉本公開的許多可能的實施方案。在不限制權利要求的範圍的情況下,有利的特徵中的一些現在將被總結。本公開的以下詳細描述在結合附圖考慮時,本公開的其他目的、優點和新穎的特徵將在以下詳細描述中被闡述,附圖意圖圖示說明、而非限制本發明。 The example embodiments described herein have innovative features, none of which are indispensable or used alone for their desired attributes. The following description and drawings set forth in detail certain illustrative implementations of the present disclosure, which indicate several exemplary ways in which various principles of the present disclosure can be implemented. However, the illustrative embodiments are not exhaustive of the many possible embodiments of the present disclosure. Without limiting the scope of the claims, some of the advantageous features will now be summarized. The following detailed description of the present disclosure is considered in conjunction with the accompanying drawings, and other purposes, advantages and novel features of the present disclosure will be set forth in the following detailed description. The accompanying drawings are intended to illustrate rather than limit the present invention.
本發明的一方面是針對一種組件,所述組件包括:處理器模組,所述處理器模組包括:具有相對的第一側和第二側的處 理器封裝基板;被安裝在處理器封裝基板的第一側上的處理器晶片;以及被設置在處理器封裝基板的第二側上的電端接部分陣列;以及被設置在處理器封裝基板的第二側上的電源管理模組,所述電源管理模組包括:電源管理封裝基板;以及被安裝在電源管理封裝基板上的電源轉換器晶片,所述電源轉換器晶片被設置在電源管理封裝基板和處理器封裝基板的第一側或第二側之間。 One aspect of the present invention is directed to a component, the component includes: a processor module, the processor module includes: a first side and a second side opposite to the The processor package substrate; the processor chip mounted on the first side of the processor package substrate; and the array of electrical termination portions provided on the second side of the processor package substrate; and the processor package substrate The power management module on the second side of the power management module, the power management module includes: a power management package substrate; and a power converter chip mounted on the power management package substrate, the power converter chip is set in the power management Between the package substrate and the first side or the second side of the processor package substrate.
在一個或更多個實施方案中,電源轉換器晶片被設置在電源管理封裝基板和處理器封裝基板的第二側之間。在一個或更多個實施方案中,處理器封裝基板和電源管理封裝基板每個包括有機聚合物和導電互連部分,所述導電互連部分跨相應基板的第一側和第二側延伸。在一個或更多個實施方案中,電源轉換器晶片通過處理器封裝基板中的導電互連部分與處理器晶片進行電通信。 In one or more embodiments, the power converter die is disposed between the power management package substrate and the second side of the processor package substrate. In one or more embodiments, the processor package substrate and the power management package substrate each include an organic polymer and a conductive interconnect portion that extends across the first side and the second side of the corresponding substrate. In one or more embodiments, the power converter die is in electrical communication with the processor die through conductive interconnects in the processor package substrate.
在一個或更多個實施方案中,電源轉換器模組的高度小於或等於處理器封裝基板的第二側的電端接部分的高度,所述高度是相對於與由處理器封裝基板的第二側限定的平面正交的軸線測得的。在一個或更多個實施方案中,電源轉換器的高度小於或等於1mm,並且電端接部分陣列包括球柵陣列。 In one or more embodiments, the height of the power converter module is less than or equal to the height of the electrical termination portion on the second side of the processor package substrate, and the height is relative to the first side of the processor package substrate. Measured on the axis perpendicular to the plane defined on both sides. In one or more embodiments, the height of the power converter is less than or equal to 1 mm, and the array of electrical termination portions includes a ball grid array.
在一個或更多個實施方案中,所述組件還包括被設置在電源管理模組的相對的第一側和第二側上的電端接部分。在一個或更多個實施方案中,電源管理模組包括從電源管理模組的第一側延伸的第一導電螺柱和第二導電螺柱,電源轉換器晶片被設置在第一導電螺柱和第二導電螺柱之間並且與第一導電螺柱和第二導電螺柱進行電通信,第一導電螺柱將供應電流傳導到處理器封裝基板的第二側上的第一電互連部分,第二導電螺柱從處理器封裝基板的第二側上的第二電互連部分傳導地電流。在一個或更多個實施方案中,電源管理模組的第一側上的大於50%的電端接部分被電耦合到供應電源和地,並且電源管理模組的第二側上的大於50%的電端接部分被電耦合到輸入電源和地。在一個或更多個實施方案中,電源管理模組的第二側上的電端接部分包括球柵陣列。 In one or more embodiments, the assembly further includes electrical termination portions disposed on opposite first and second sides of the power management module. In one or more embodiments, the power management module includes a first conductive stud and a second conductive stud extending from the first side of the power management module, and the power converter chip is disposed on the first conductive stud. Electrically communicate with the second conductive stud and with the first conductive stud and the second conductive stud, the first conductive stud conducts the supply current to the first electrical interconnection on the second side of the processor package substrate In part, the second conductive stud conducts ground current from the second electrical interconnection portion on the second side of the processor package substrate. In one or more embodiments, greater than 50% of the electrical termination portion on the first side of the power management module is electrically coupled to the supply power and ground, and greater than 50% on the second side of the power management module % Of the electrical termination is electrically coupled to the input power supply and ground. In one or more embodiments, the electrical termination portion on the second side of the power management module includes a ball grid array.
在一個或更多個實施方案中,球柵陣列和電源管理模組的組合高度小於或等於處理器模組中的電端接部分陣列的高度,所述組合高度以及所述高度是相對於與由處理器封裝基板的第二側限定的平面正交的軸線測得的。在一個或更多個實施方案中,處理器模組中的電端接部分陣列包括球柵陣列。在一個或更多個 實施方案中,被設置在電源管理模組的第二側上的電端接部分包括球柵陣列、焊盤柵陣列或針柵陣列。在一個或更多個實施方案中,被設置在電源管理模組的第二側是的電端接部分被設計為與電插座緊密配合。 In one or more embodiments, the combined height of the ball grid array and the power management module is less than or equal to the height of the electrical termination part array in the processor module, and the combined height and the height are relative to and Measured on an axis orthogonal to the plane defined by the second side of the processor package substrate. In one or more embodiments, the array of electrical termination portions in the processor module includes a ball grid array. In one or more In an embodiment, the electrical termination portion provided on the second side of the power management module includes a ball grid array, a pad grid array, or a pin grid array. In one or more embodiments, the electrical termination part provided on the second side of the power management module is designed to closely fit with the electrical socket.
在一個或更多個實施方案中,處理器晶片包括矽。在一個或更多個實施方案中,電源轉換器晶片包括氮化矽或氮化鎵。在一個或更多個實施方案中,電源轉換器晶片包括:多層佈線網絡;以及被集成在多層佈線網絡的頂部上的電感器。在一個或更多個實施方案中,電感器包括導電繞組,所述導電繞組包括:被形成在被設置在多層佈線網絡上面的第一集成平面中的第一引線;被形成在被設置在第一集成平面上面的第二集成平面中的第二引線;以及被形成在第一引線和第二引線之間的導電VIA,所述導電VIA將第一引線電連接到第二引線。 In one or more embodiments, the processor wafer includes silicon. In one or more embodiments, the power converter die includes silicon nitride or gallium nitride. In one or more embodiments, the power converter chip includes: a multilayer wiring network; and an inductor integrated on top of the multilayer wiring network. In one or more embodiments, the inductor includes a conductive winding including: a first lead formed in a first integration plane disposed on the multilayer wiring network; A second lead in a second integration plane above an integration plane; and a conductive VIA formed between the first lead and the second lead, the conductive VIA electrically connecting the first lead to the second lead.
在一個或更多個實施方案中,所述組件還包括多個所述電源轉換器晶片,每個電源轉換器晶片被安裝在電源管理封裝基板上。在一個或更多個實施方案中,第一電源轉換器晶片在第一供應電壓下輸出第一供應電流,並且第二電源轉換器晶片在第二供應電壓下輸出第二供應電流。在一個或更多個實施方案中,第 一供應電壓不同於第二供應電壓。在一個或更多個實施方案中,電源管理模組包括一個或更多個電容器、一個或更多個電感器、一個或更多個變壓器、或前述中的任何的組合。 In one or more embodiments, the assembly further includes a plurality of the power converter chips, and each power converter chip is mounted on a power management package substrate. In one or more embodiments, the first power converter chip outputs a first supply current at a first supply voltage, and the second power converter chip outputs a second supply current at a second supply voltage. In one or more embodiments, the first A supply voltage is different from the second supply voltage. In one or more embodiments, the power management module includes one or more capacitors, one or more inductors, one or more transformers, or a combination of any of the foregoing.
在一個或更多個實施方案中,處理器模組和電源管理模組相對于彼此對齊且居中以減小電流在處理器模組和電源管理模組之間行進的距離。在一個或更多個實施方案中,電源管理模組由晶圓級封裝件組成。 In one or more embodiments, the processor module and the power management module are aligned and centered relative to each other to reduce the distance that current travels between the processor module and the power management module. In one or more embodiments, the power management module is composed of wafer-level packages.
本發明的另一方面是針對一種電源管理模組,所述電源管理模組包括:具有相對的第一側和第二側的電源管理封裝基板;被安裝在電源管理封裝基板的第一側上的多個電源轉換器晶片,所述電源轉換器晶片被設置在處理器封裝基板的第一側或所述第二側與電源管理封裝基板之間;從電源管理基板的第一側延伸的多個導電螺柱,其中每個電源轉換器晶片被設置在相鄰的第一導電螺柱和第二導電螺柱之間;以及被設置在電源管理封裝基板的第二側上的電端接部分陣列。 Another aspect of the present invention is directed to a power management module. The power management module includes: a power management package substrate having opposite first and second sides; mounted on the first side of the power management package substrate The power converter chip is arranged between the first side or the second side of the processor package substrate and the power management package substrate; the power converter chip extends from the first side of the power management substrate Conductive studs, where each power converter chip is disposed between adjacent first and second conductive studs; and an electrical termination portion disposed on the second side of the power management package substrate Array.
在一個或更多個實施方案中,每個電源轉換器晶片包括:多層佈線網絡;以及被集成在多層佈線網絡的頂部上的電感器。在一個或更多個實施方案中,電感器包括導電繞組,所述導 電繞組包括:被形成在被設置在多層佈線網絡上面的第一集成平面中的第一引線;被形成在被設置在第一集成平面上面的第二集成平面中的第二引線;以及被形成在第一引線和第二引線之間的導電VIA,所述導電VIA將第一引線電連接到第二引線。在一個或更多個實施方案中,電感器包括平面磁芯,並且導電繞組以大體螺旋形的方式圍繞平面磁芯轉圈。在一個或更多個實施方案中,電感器包括磁包層電感器。在一個或更多個實施方案中,電源管理封裝基板和每個電源轉換器晶片包括晶圓級封裝件。 In one or more embodiments, each power converter die includes: a multilayer wiring network; and an inductor integrated on top of the multilayer wiring network. In one or more embodiments, the inductor includes a conductive winding, the conductive The electrical winding includes: a first lead formed in a first integration plane provided above the multilayer wiring network; a second lead formed in a second integration plane provided above the first integration plane; and formed A conductive VIA between the first lead and the second lead, the conductive VIA electrically connecting the first lead to the second lead. In one or more embodiments, the inductor includes a planar magnetic core, and the conductive winding turns around the planar magnetic core in a generally helical manner. In one or more embodiments, the inductor includes a magnetically clad inductor. In one or more embodiments, the power management package substrate and each power converter die include wafer-level packages.
20A、20B、20C、40、50:組件 20A, 20B, 20C, 40, 50: components
200:處理器 200: processor
201、220:中心點 201, 220: Center point
210、410:處理器封裝基板 210, 410: processor package substrate
212:第一側 212: first side
214:第二側 214: second side
215:處理器封裝電端子 215: processor package electrical terminals
216:導電層 216: conductive layer
218:導電柱 218: Conductive column
22、42:處理器模組 22, 42: processor module
220:電源管理封裝基板 220: Power management package substrate
230、430、530:電源轉換器晶片 230, 430, 530: power converter chip
24、44、54:電源管理模組 24, 44, 54: power management module
240:電源管理封裝基板 240: Power management package substrate
245:電源管理封裝電端子 245: Power management package electrical terminals
250:間隙 250: Clearance
260:導電螺柱 260: Conductive stud
270、280:截面高度 270, 280: Section height
400:處理器晶片 400: processor chip
402:可選的存儲器晶片 402: Optional memory chip
404:可選的解耦電容器 404: Optional decoupling capacitor
406:可選的加速計晶片 406: Optional accelerometer chip
531:變壓器 531: Transformer
532:電感器 532: Inductor
60:小晶片 60: small chip
600:電源轉換器 600: power converter
610:電源轉換器基板 610: Power converter substrate
620:反饋控制電路 620: feedback control circuit
630:接口電路 630: interface circuit
640:調節電路 640: regulation circuit
650:電源系 650: Power System
651A、651B:相位 651A, 651B: Phase
660A:電源開關 660A: Power switch
662、662A:PMOS晶體管柵極 662, 662A: PMOS transistor gate
664、664A:NMOS晶體管柵極 664, 664A: NMOS transistor gate
670、670A:薄膜電感器 670, 670A: thin film inductors
70、80:截面 70, 80: cross section
700:多層佈線網絡 700: Multilayer wiring network
720:佈線平面 720: Wiring plane
722:集成平面 722: Integrated plane
730:IC晶片接觸結構 730: IC chip contact structure
750、750’:引線段 750, 750’: Lead section
740、740’:導電VIA 740, 740’: Conductive VIA
760:電介質絕緣材料 760: Dielectric insulating material
775:主平面 775: main plane
770:磁芯電感器 770: Magnetic Core Inductor
780:導電繞組 780: conductive winding
785:平面磁芯 785: Planar core
870:磁包層電感器 870: Magnetically Clad Inductor
875:鐵磁軛 875: Ferromagnetic Yoke
880:導電繞組 880: conductive winding
VDD:供應電壓 V DD : supply voltage
VIN:輸入電壓 V IN : Input voltage
Vo:輸出電壓 Vo: output voltage
圖1係先前技術的組件的示意圖。 Figure 1 is a schematic diagram of a prior art component.
圖2A、2B和2C係本發明之一個或更多個相應的實施方案的組件的截面圖。 Figures 2A, 2B, and 2C are cross-sectional views of components of one or more corresponding embodiments of the present invention.
圖3包括圖2A所示的截面中的某些部件之間的電關係的表示圖。 FIG. 3 includes a representation of the electrical relationship between certain components in the cross-section shown in FIG. 2A.
圖4係本發明之一個或更多個實施方案的組件的框圖。 Figure 4 is a block diagram of the components of one or more embodiments of the present invention.
圖5係本發明之一個或更多個實施方案的組件的框圖。 Figure 5 is a block diagram of the components of one or more embodiments of the present invention.
圖6係本發明之一個或更多個實施方案的開關電感型DC-DC電源轉換器小晶片的示意圖。 Fig. 6 is a schematic diagram of a switch inductor type DC-DC power converter chiplet according to one or more embodiments of the present invention.
圖7是根據圖6所示之第一實施方案的開關電感型DC-DC電源轉換器小晶片的代表性截面圖。 FIG. 7 is a representative cross-sectional view of the switch inductor type DC-DC power converter chiplet according to the first embodiment shown in FIG. 6.
圖8是根據圖6所示之第二實施方案的開關電感型DC-DC電源轉換器小晶片的代表性截面圖。 FIG. 8 is a representative cross-sectional view of the switch-inductance type DC-DC power converter chiplet according to the second embodiment shown in FIG. 6.
為能讓 貴審查委員能更瞭解本發明之技術內容,特舉較佳具體實施例說明如下。 In order to allow your reviewer to better understand the technical content of the present invention, preferred specific embodiments are described as follows.
一種電源管理模組包括被安裝在電源管理封裝基板上的一個或更多個電源轉換器晶片。所述電源管理模組包括在相對的第一側和第二側上的電觸點。第一電觸點(例如,導電螺柱)延伸到電源管理模組的第一側。每個電源轉換器晶片被設置在相鄰的電觸點之間。第二電觸點(例如,球柵陣列(ball grid array)、焊盤柵陣列(land grid array)或針柵陣列(pin grid array))被設置在電源轉換器模組的第二側(例如,在電源管理封裝基板的與電源轉換器晶片(一個或更多個)相對的一側)上。 A power management module includes one or more power converter chips mounted on a power management package substrate. The power management module includes electrical contacts on opposite first and second sides. The first electrical contact (for example, a conductive stud) extends to the first side of the power management module. Each power converter chip is placed between adjacent electrical contacts. The second electrical contacts (for example, ball grid array, land grid array, or pin grid array) are arranged on the second side of the power converter module (for example, , On the side of the power management package substrate opposite to the power converter chip(s).
電源管理模組可以被安裝在處理器模組上以將電源供應給處理器模組中的一個或更多個處理器晶片。在一個實施例中,處理器晶片(一個或更多個)被安裝在處理器封裝基板的第 一側上,並且電源管理模組被安裝在處理器封裝基板的相對的第二側上。電源管理模組中的第一電觸點可以將電源轉換器晶片(一個或更多個)電連接到處理器封裝基板中的導電互連部分,所述導電互連部分被電耦合到處理器晶片(一個或更多個)。電源管理模組和處理器模組可以相對於彼此居中且對齊,或者它們可以彼此側向偏移。在另一實施方案中,處理器管理模組和處理器晶片(一個或更多個)被安裝在處理器封裝基板的同一側。 The power management module can be installed on the processor module to supply power to one or more processor chips in the processor module. In one embodiment, the processor chip(s) are mounted on the first part of the processor package substrate. On one side, and the power management module is mounted on the opposite second side of the processor package substrate. The first electrical contact in the power management module can electrically connect the power converter chip(s) to the conductive interconnect portion in the processor package substrate, the conductive interconnect portion being electrically coupled to the processor Wafer (one or more). The power management module and the processor module can be centered and aligned with respect to each other, or they can be laterally offset from each other. In another embodiment, the processor management module and the processor chip(s) are mounted on the same side of the processor package substrate.
圖2A是根據一個或更多個實施方案的組件20A的截面。組件20A包括片上系統(system-on-a-chip,SoC)或處理器(一般地,處理器)200、處理器封裝基板210、電源管理封裝基板220以及一個或更多個電源轉換器晶片230。處理器200被安裝在處理器封裝基板210的第一側212,例如通過引線鍵合(wire bonding)、倒裝式晶片附連(flip-chip attachment)、或如本領域中公知的其他方法。處理器200和處理器封裝基板210形成處理器模組22。處理器200可以包括處理器晶片(例如,中央處理單元或圖形處理單元)、一個或更多個存儲器晶片(例如,動態隨機存取存儲器或DRAM、高帶寬存儲器等)、輸入/輸出端口等。用於處理器200晶片的基板或模具可以包括矽(諸如絕緣體上矽
(silicon-on-insulator,SOI)、摻雜的矽(例如,用於互補金屬-氧化物-半導體(complementary metal-oxide-semiconductor,CMOS))、或其他形式的矽、或絕緣體(諸如結晶二氧化矽)。
Figure 2A is a cross-section of
電源管理封裝基板220被安裝在處理器封裝基板210的第二側214。如圖所示,處理器模組22和電源管理模組24相對於彼此居中且對齊。例如,電源管理封裝基板220和處理器200相對於彼此居中且對齊以使得電源管理封裝基板220和處理器200的中心點220、201分別對齊。電源管理模組24和處理器200晶片的對齊對於縮短處理器200晶片和電源管理模組24之間的總距離、並因此減小將電源從電源管理模組24傳送到處理器200的互連部分的寬帶電阻抗是期望的。在用於處理器晶片的有機封裝基板的常見的商業實現中,封裝基板通常為小於1mm厚,而寬度可以大於50mm。因此,當電源管理模組24被安裝在處理器封裝基板210的第二側214、而不是被安裝在處理器封裝基板210的第一側212時,處理器晶片和電源模組之間的有效電阻和電阻抗可以較低。然而,在其他實施方案中,電源管理封裝基板220和處理器200可以彼此水平偏移,例如沿著位於由處理器封裝基板210的第一側212或第二側214限定的平面中的軸線。
The power
電源管理封裝基板220包括一個或更多個電源轉換器晶片230,所述一個或更多個電源轉換器晶片230被安裝在電源管理封裝基板240的第一側以形成電源管理模組24。另外,電源管理封裝基板220可以包括如本文所描述的一個或更多個分立無源電部件。
The power
處理器封裝電端子陣列215被設置在處理器封裝基板210的第二側。處理器封裝電端子215經由處理器封裝互連部分提供與處理器200的數據信號輸入/輸出連接,所述處理器封裝互連部分包括形成處理器封裝基板210的導電層216和導電柱218。導電層216和導電柱218可以包括銅、金、鋁和/或另一導電材料。處理器封裝電端子215可以包括球柵陣列(ball grid array,BGA)(例如,如圖2A所示)、焊盤柵陣列(land grid array,LGA)和/或針柵陣列(pin grid array,PGA)、或其他自定義的插座連接(socket connection)。
The processor package electrical
電源管理模組24被設置在處理器封裝電端子215的陣列的間隙250中。電源管理封裝電端子陣列245被設置在電源管理封裝基板240的第二側。至少一些電源管理封裝電端子245提供與電源轉換器晶片230的電源輸入連接(例如,以傳導電流),
並且可選地,至少一些電源管理封裝電端子245可以提供與處理器200的數據信號輸入/輸出連接。在一些實施方案中,大部分(例如,大於50%)的電源管理封裝電端子245提供與電源轉換器晶片230的電源輸入連接和地連接。
The
電源管理封裝電端子245和處理器封裝電端子215可以包括相同類型的電端子。例如,電源管理封裝電端子245和處理器封裝電端子215可以包括BGA、LGA和/或PGA。在一些實施方案中,電源管理封裝電端子245和處理器封裝電端子215中的一個或兩個被配置或被設計為與電插座緊密配合。被配置或被設計為與電插座緊密配合的電端子的實施例包括LGA和/或PGA。
The power management package
導電螺柱或導電柱(一般地,導電螺柱)260的陣列被設置在電源管理封裝基板220中。每個電源轉換器晶片230被設置在相鄰的導電螺柱260之間。導電螺柱260與電源轉換器晶片230和導電層216和/或導電柱218進行電通信以提供將輸出電源從電源轉換器晶片230發送到處理器200的電傳導路徑。導電螺柱260中的一個或更多個傳導供應電源(例如,供應電壓VDD下的供應電流),並且導電螺柱260中的一個或更多個被接地,並且從處理器200傳導地電流,例如,如圖3所示。例如,第一導
電螺柱260將供應電源(例如,供應電壓VDD下的供應電流)傳導到電源管理封裝基板220中的第一互連部分(例如,第一導電柱218),並且第二導電螺柱260從電源管理封裝基板220中的第二互連部分(例如,第二導電柱218)傳導地電流。第一導電柱和第二導電柱218與處理器200進行電通信。在一些實施方案中,導電螺柱260還用於在處理器200和電源模組24之間發送電信號。因此,電源管理模組24在兩側具有電端接部分:在第一側或頂側的導電螺柱260以及在第二側或底側的電源管理封裝電端接部分245。
Conductive studs or an array of conductive studs (generally, conductive studs) 260 are provided in the power
當電源管理封裝基板220和處理器200相對於彼此居中且對齊時,如圖2A所示,流過導電螺柱260的輸出電源垂直地行進通過導電柱218到達處理器200。然而,當電源管理封裝基板220和處理器200相對于彼此水平偏移時,流過導電螺柱260的輸出電源水平地行進通過導電層216並且垂直地行進通過導電柱218到達處理器200。儘管兩種配置被構想,但是認識到,使電源管理封裝基板220和處理器200對齊且居中縮短輸出電源/電流必須行進的距離,這使通過電源管理模組24和處理器200之間的處理器封裝互連部分(例如,導電層216和導電柱218)的損耗和電
阻減小。例如,輸出電源/電流必須行進的縮短的距離可以使將電源從電源管理模組24傳送到處理器200的互連部分的寬帶電阻抗減少。
When the power
在一些實施方案中,電源管理模組24(包括電源管理封裝基板220、電源轉換器晶片230以及電源管理封裝電端子245)具有截面高度270,截面高度270小於或等於處理器封裝電端子215的截面高度280以使得電源管理模組24可以在不垂直地延伸超過處理器封裝電端子215的情況下裝配在處理器封裝電端子215的旁邊(如圖2A所示)。在一些實施方案中,處理器封裝電端子215具有以下截面高度280:大約1mm、大約0.8mm、大約0.6mm、前述截面高度中的任何兩個之間的任何截面高度或範圍、或更小的截面高度。如本文所使用的,“大約”意指加上或減去相關值的10%。
In some embodiments, the power management module 24 (including the power
電源管理模組24的截面高度270小於或等於處理器封裝電端子215的對應的截面高度280,例如小於或等於大約1mm、小於或等於大約0.8mm、小於或等於大約0.6mm、或處理器封裝電端子215的其他截面高度280。在特定的實施方案中,當處理器封裝電端子215包括BGA和/或PGA時,電源管理模組24的截面
高度270小於或等於處理器封裝電端子215的對應的截面高度280。在其他實施方案中,電源管理模組24的截面高度270可以大於或等於處理器封裝電端子215的截面高度280,例如當處理器封裝電端子215包括LGA時。
The
處理器封裝基板210和/或電源管理封裝基板220可以包括有機聚合物材料、樹脂、環氧樹脂、熱塑性塑料、預浸材料和/另一材料。在一些實施方案中,電源管理封裝基板220和電源管理晶片(一個或更多個)包括晶圓級封裝件,諸如晶片規格封裝件或扇出封裝件。晶圓級封裝件可以減小電源管理模組24的截面高度270或輪廓,這使得電源管理模組24可以裝配在處理器封裝電端子215(諸如BGA)的更小的截面高度280內。例如,使用扇出晶圓級封裝件,電源管理模組24的截面高度270可以為大約0.5mm。注意,就晶圓級封裝件來說,電源管理封裝基板被製作在電源轉換器晶片和聚合物填充材料上。
The
在操作中,如圖3所示,具有輸入電壓VIN的電流被發送到電源管理封裝電端子245,電源管理封裝電端子245將該電流電傳導到電源轉換器晶片230。電源轉換器晶片230將輸入電壓VIN向下轉換為供應電壓VDD。供應電壓VDD下的電流然後經由導
電螺柱260和導電柱218(可選地,還有導電層216)被發送到處理器200。在一個實施例中,輸入電壓VIN為大約2V,並且供應電壓VDD為大約0.8V。在一些實施方案中,輸入電壓VIN為大約5V、大約12V、大約48V或另一輸入電壓。在一些實施方案中,供應電壓VDD為大約1.8V、1.2V、1.2V至0.4V或另一輸出電壓。在一些實施方案中,電源轉換器晶片230中的一個或更多個將輸入電壓VIN向下轉換為第一供應電壓VDD1,並且電源轉換器晶片230中的一個或更多個將輸入電壓VIN向下轉換為不同於第一供應電壓VDD1的第二供應電壓VDD2。例如,第一供應電壓VDD1可以被用來給處理器模組22中的第一晶片(例如,其需要第一電流(例如,200A))供電,並且第二供應電壓VDD2可以被用來給處理器模組22中的第二晶片(例如,其需要第二電流(例如,20A))供電。
In operation, as shown in FIG. 3, a current having an input voltage V IN is sent to the power management package
圖2B是根據另一實施方案的組件20B的截面。組件20B與組件20A是相同的,除了處理器晶片200和電源管理模組24是側向偏移的之外。
Figure 2B is a cross-section of a
圖2C是根據另一實施方案的組件20C的截面。組件20C與組件20A是相同的,除了處理器晶片200和電源管理模組24被
設置在處理器封裝基板210的同一側上之外。另外,電源管理封裝基板220僅在一側上包括電觸點(電源管理封裝電端子245)。電源管理基板220不包括導電螺柱260。在其他實施方案中,電源管理封裝基板220僅在一側上包括導電螺柱260,並且不包括電源管理封裝電端子245。
Figure 2C is a cross-section of a
圖4是根據一個或更多個實施方案的組件40的框圖。組件40包括處理器模組42和電源管理模組44。處理器模組42包括一個或更多個處理器晶片400、可選的存儲器晶片402、可選的解耦電容器404、可選的加速計晶片406以及處理器封裝基板410。在一些實施方案中,處理器晶片(一個或更多個)400、可選地還有存儲器晶片(一個或更多個)402與處理器/SoC 200是相同的或不同的。處理器晶片(一個或更多個)400、可選的存儲器晶片(一個或更多個)402、可選的解耦電容器404以及可選的加速計晶片406被安裝在處理器封裝基板410的第一側上,諸如通過引線鍵合、倒裝式晶片附連或本領域中公知的其他方法。
Figure 4 is a block diagram of
電源管理模組44包括一個或更多個電源轉換器晶片430、可選的解耦電容器434以及電源管理封裝基板420。電源轉換器晶片(一個或更多個)430和可選的解耦電容器434被安裝在
電源管理封裝基板420上,諸如通過引線鍵合、倒裝式晶片附連或本領域中公知的其他方法。在一些實施方案中,電源轉換器晶片(一個或更多個)430包括被集成到多層佈線網絡中的薄膜電源電感器,諸如磁芯電感器或磁包層電感器(magnetic clad inductor)。例如,電源轉換器晶片(一個或更多個)430可以與2018年4月19日公佈的標題為“集成開關電感型電源轉換器(Integrated Switched Inductor Power Converter)”的美國專利申請公開No.2018/0110123中公開的電源轉換器晶片和小晶片是相同的或不同的,該申請通過引用併入本文。
The
電源管理模組44可以被安裝在處理器封裝基板410的第二側上,例如如圖2和圖3所示。可替換地,電源管理模組44、處理器晶片(一個或更多個)400、存儲器晶片(一個或更多個)402、可選的解耦電容器404以及可選的加速計晶片406可以被安裝在處理器封裝基板410的同一側(例如,第一側)上。
The
處理器模組42和電源管理模組44可以與處理器模組22和電源管理模組24是相同的或不同的。因此,組件40可以與組件20A、20B和/或20C是相同的或不同的。
The
圖5是根據一個或更多個實施方案的組件50的框圖。組件50包括處理器模組42和電源管理模組54。電源管理模組54包括一個或更多個電源轉換器晶片530、一個或更多個變壓器531、一個或更多個電感器532以及解耦電容器434。在這個實施方案中,電源轉換器晶片(一個或更多個)530不像上面關於電源轉換器晶片(一個或更多個)430所描述的那樣包括集成的薄膜電源電感器。相反,電源管理模組54包括分別沒有被設置在與電源轉換器晶片(一個或更多個)530相同的晶片(一個或更多個)上的電感器(一個或更多個)532和變壓器(一個或更多個)531。
Figure 5 is a block diagram of
圖6是根據一個或更多個實施方案的開關電感型DC-DC電源轉換器小晶片60的示意圖。開關電感型DC-DC電源轉換器小晶片60可以包括在電源轉換器晶片(一個或更多個)230和/或430中,在一些實施方案中,電源轉換器晶片(一個或更多個)230和/或430包括多個這樣的小晶片60。開關電感型DC-DC電源轉換器小晶片60包括被製作和/或集成在常見的電源轉換器基板610(諸如矽基板)上的開關電感型DC-DC電源轉換器600。開關電感型DC-DC電源轉換器600包括反饋控制電路620、接口電路630、調節電路640以及電源系(power train)650。
FIG. 6 is a schematic diagram of a switched inductor type DC-DC
電源系650被劃分為相位651A、651B(一般地,相位651N)。每個相位651N包括單獨的電源開關660N和單獨的薄膜電感器670N。每個電源開關660N可以是分別包括PMOS晶體管柵極662N和NMOS晶體管柵極664N的CMOS電源開關。每個晶體管柵極662N、664N可以包括按共源共柵配置串聯的兩個開關。在一些實施方案中,高側開關和低側開關這二者都由NMOS晶體管(例如,晶體管柵極664N)組成。
The
例如,相位600A包括電源開關660A和薄膜電感器670A。電源開關660A分別包括PMOS晶體管柵極662A和NMOS晶體管柵極664A。相位651B與相位651A是相同的,因此,包括它自己的電源開關660B和薄膜電感器670B(在圖6中沒有圖示說明)。開關電感型DC-DC電源轉換器小晶片60可以根據期望包括附加的相位600N。每個相位600N與其他相位600N電並聯。公共輸出端子將每個相位500N的輸出電耦合到輸出電源線。公共輸入端子將每個相位500N的輸入電耦合到輸入電源線。
For example, phase 600A includes
反饋控制電路620被配置為斷開和閉合PMOS晶體管柵極662N和NMOS晶體管柵極664N。當PMOS晶體管柵極662N斷開時,對應的NMOS晶體管柵極664N被閉合,反之亦然。斷
開和閉合每組PMOS晶體管柵極662N和NMOS晶體管柵極664N在半橋節點665N的輸出處產生對應的脈寬調製(pulse width modulation,PWM)信號。PWM信號的頻率可以如本領域中公知的那樣被配置在反饋控制電路中。反饋控制電路620調整PWM信號的占空比以提高或降低輸出電壓Vo以使得輸出電壓Vo等於目標輸出電壓,諸如VDD。如圖6所示,反饋控制電路620通過負載供應電壓感測反饋線和負載地感測反饋線來監視輸出電壓Vo。單獨的供應電壓感測線和地參考感測線使得電源轉換器小晶片60可以獨立於電源傳輸信道地測量負載下的輸出電壓。另外,控制電路620可以改變被電連接到負載電流的相位600N的數量以改進電源轉換效率或者隨著處理器要求動態地改變而快速地供應更多的或更少的電流。例如,控制電路620可以響應於負載電流增大來增加被電連接到負載電流的相位600N的數量。
The feedback control circuit 620 is configured to open and close the PMOS transistor gate 662N and the NMOS transistor gate 664N. When the PMOS transistor gate 662N is open, the corresponding NMOS transistor gate 664N is closed, and vice versa. Opening and closing each group of PMOS transistor gate 662N and NMOS transistor gate 664N generates a corresponding pulse width modulation (PWM) signal at the output of the half-bridge node 665N. The frequency of the PWM signal can be configured in the feedback control circuit as known in the art. The feedback control circuit 620 adjusts the duty ratio of the PWM signal to increase or decrease the output voltage Vo so that the output voltage Vo is equal to the target output voltage, such as V DD . As shown in FIG. 6, the feedback control circuit 620 monitors the output voltage Vo through the load supply voltage sensing feedback line and the load ground sensing feedback line. Separate supply voltage sensing lines and ground reference sensing lines enable the
反饋控制電路620計算電壓誤差,所述電壓誤差是輸出電壓Vo和目標輸出電壓之間的差值。目標輸出電壓可以被手動設置或者基於負載(例如,處理器200的負載)的規範被預先編程。如果存在正值的電壓誤差(例如,輸出電壓Vo大於目標輸出電壓),則反饋控制電路620可以通過減少由電源開關660產生的 PWM信號的占空比來做出響應。如果存在負值的電壓誤差(例如,實際輸出電壓Vo小於目標輸出電壓),則反饋控制電路620可以通過增大由電源開關660產生的PWM信號的占空比來做出響應。 The feedback control circuit 620 calculates a voltage error, which is the difference between the output voltage Vo and the target output voltage. The target output voltage may be manually set or pre-programmed based on the specification of the load (for example, the load of the processor 200). If there is a positive voltage error (for example, the output voltage Vo is greater than the target output voltage), the feedback control circuit 620 can reduce the voltage generated by the power switch 660 The duty cycle of the PWM signal responds. If there is a negative voltage error (for example, the actual output voltage Vo is less than the target output voltage), the feedback control circuit 620 may respond by increasing the duty cycle of the PWM signal generated by the power switch 660.
接口電路630在小晶片60或電路上的一個或更多個電觸點和小晶片60或電路外的一個或更多個電觸點之間提供一個接口連接或更多個接口連接。
The
調節電路640被配置為根據由控制電路620產生的PWM信號來斷開和閉合PMOS晶體管柵極662和NMOS晶體管柵極664。
The
薄膜電感器670和輸出電容器680形成低通濾波器。如本文所描述的,薄膜電感器670被形成在電源轉換器基板610的多層佈線網絡中。薄膜電感器670可以包括磁芯電感器和/或磁包層電感器。
The
圖7是根據第一實施方案的圖6所示的開關電感型DC-DC電源轉換器小晶片60的代表性截面70。在圖7所示的實施方案中,薄膜電感器670包括被集成在多層佈線網絡700的頂部上的磁芯電感器770。
FIG. 7 is a
截面60圖示說明被製作在電源轉換器基板110上的PMOS晶體管柵極662和NMOS晶體管柵極664。多層佈線網絡200在PMOS晶體管柵極662和NMOS晶體管柵極664、磁芯電感器770以及IC晶片接觸結構730之間提供電連接。多層佈線網絡700被佈置到佈線平面720中。圖7描繪4個佈線平面70,但對平面的任何實際數量沒有限制。每個佈線平面720包含引線段750。不同佈線平面720的引線段750之間的電連接由導電VIA 740提供。IC晶片接觸結構730可以是C4觸點、焊接凸點或銅凸塊,但是用於晶片的外部通信的任何其他的觸點是可接受的,並沒有限制。觸點730通過電源管理封裝(例如,電源管理封裝基板220)中的電互連部分被電耦合到電源管理模組(例如,電源管理模組24)中的導電螺柱。多層佈線網絡700中的空間被填充電介質絕緣材料760,諸如SiO2。
The
具有單個平面磁芯785的磁芯電感器670被集成在多層佈線網絡700的頂部上。平面磁芯785的主平面775與佈線平面720基本上是平行的。磁芯電感器770的在平面磁芯785的外部上形成大體螺旋形的導電繞組780由引線段750’和VIA 740’分段構成,引線段750’和VIA 740’被設置在形成在多層佈線網絡700的
頂部上的至少兩個集成平面722中。形成繞組780的部分的VIA 740’垂直於主平面775,並且將至少兩個集成平面722中的引線段750’電互連。
The
磁芯785可以包括鐵磁材料,諸如Co、Ni和/或Fe,包括它們的合金,諸如NixFey或CoxNiyFez。另外,或者在替換方案中,磁芯785可以包括多個層。所述層可以包括鐵磁層(例如,Co、Ni和/或Fe,Co、Ni和/或Fe的合金等)和非鐵磁層的交替層。例如,非鐵磁層可以是或者可以包括絕緣材料,諸如鐵磁材料氧化物(例如,CoxOy、NixOy和/或FexOy)。
The
在一些實施方案中,接口層可以被沉積在絕緣材料層上。接口層可以在製作工藝中被用來幫助將下一個鐵磁層沉積到絕緣材料層上。包括接口層的材料可以被選擇來改進鐵磁層和絕緣材料層之間的粘附和/或減小鐵磁層和絕緣材料層之間的接口處的粗糙度。減小鐵磁層和絕緣材料層之間的接口處的粗糙度可以減小對於磁芯180的矯頑力。改進鐵磁層和絕緣材料層之間的粘附力可以降低膜脫層(delamination)的可能性。另外,接口層可以用作鐵磁層和絕緣材料層之間的擴散屏障或獲得者(getter)以防止材料組分從絕緣材料層擴散到鐵磁層。最後,接口層可以被
選擇來減小或補償磁芯785中的機械膜應力。接口層可以由Ta、Ti、W、Cr或Pt、或前述中的任何的組合組成,這依鐵磁材料和絕緣材料層的具體選擇而定。
In some embodiments, the interface layer may be deposited on the insulating material layer. The interface layer can be used in the manufacturing process to help deposit the next ferromagnetic layer on the insulating material layer. The material including the interface layer may be selected to improve the adhesion between the ferromagnetic layer and the insulating material layer and/or reduce the roughness at the interface between the ferromagnetic layer and the insulating material layer. Reducing the roughness at the interface between the ferromagnetic layer and the insulating material layer can reduce the coercive force for the magnetic core 180. Improving the adhesion between the ferromagnetic layer and the insulating material layer can reduce the possibility of film delamination. In addition, the interface layer may serve as a diffusion barrier or getter between the ferromagnetic layer and the insulating material layer to prevent material components from diffusing from the insulating material layer to the ferromagnetic layer. Finally, the interface layer can be
Choose to reduce or compensate the mechanical film stress in the
在一些實施方案中,非鐵磁層可以是或者可以包括電流整流層。例如,電流整流層可以基於肖特基二極管。可以將以下序列電沉積到鐵磁層上:半傳導層--具有小於鐵磁層的工作功能的p型或具有大於鐵磁層的工作功能的n型;接著是接口金屬層--具有小於p型半導體材料的工作功能或大於n型半導體材料的工作功能。然後,繼續下一個鐵磁層,依此類推。可替換地,為了整流,可以在非鐵磁層中使用半導體p-n連接點。任何半導體都可以是合適的,將必須基於幾個準則(例如沒有限制地,與p部分和n部分的磁性材料的接觸容易程度、可以將結做成多窄)以及其他準則來選擇一個。 In some embodiments, the non-ferromagnetic layer may be or may include a current rectifying layer. For example, the current rectifying layer can be based on Schottky diodes. The following sequence can be electrodeposited on the ferromagnetic layer: semi-conductive layer-p-type with a working function smaller than that of the ferromagnetic layer or n-type with a working function larger than that of the ferromagnetic layer; followed by the interface metal layer-with a working function smaller than The working function of the p-type semiconductor material may be greater than that of the n-type semiconductor material. Then, continue to the next ferromagnetic layer, and so on. Alternatively, for rectification, semiconductor p-n junctions can be used in the non-ferromagnetic layer. Any semiconductor can be suitable, and one will have to be selected based on several criteria (such as, without limitation, ease of contact with the magnetic material of the p-part and n-part, how narrow the junction can be made) and other criteria.
在一些實施方案中,磁芯電感器770與美國專利申請No.15/391,278、美國專利申請公開No.2014/0071636和/或美國專利No.9.647,953中描述的電感器中的一個或更多個是相同的、基本上相同的或類似的,這些申請和專利特此通過引用併入。在一些實施方案中,開關電感型DC-DC電源轉換器小晶片60和截面
70包括多個電感器,其中每個可以與電感器670是相同的或類似的。所述多個電感器可以彼此電並聯佈置、彼此電串聯佈置、或按它們的組合佈置。所述多個電感器可以被集成在相同的集成平面222中或不同的集成平面中。
In some embodiments, the
圖8是根據第二實施方案的圖1所示的開關電感型DC-DC電源轉換器小晶片60的代表性截面80。截面80與截面70是相同的或基本上相同的,除了如下所描述的那樣。在圖8所示的實施方案中,薄膜電感器670包括被集成在多層佈線網絡700的頂部上的磁包層電感器870。磁包層電感器870包括環繞導電繞組880的鐵磁軛875。鐵磁軛875可以包括Co、Ni和/或Fe,諸如NixFey或如本領域中公知的另一材料。導電繞組880形成軛875被設置于其上方的大體螺旋形。
FIG. 8 is a
導電繞組880由至少兩個集成平面722中的引線段750’和VIA 740’分段構成。形成繞組880的部分的VIA 740’將所述至少兩個集成平面722互連。注意,頂部集成平面722中的引線段750’在圖8中沒有被圖示說明,因為它們在截面80中將是看不見的。
The conductive winding 880 is composed of at least two lead segments 750' and VIA 740' segments in the
在一些實施方案中,開關電感型DC-DC電源轉換器小晶片60和截面80包括多個電感器,其中每個與電感器870是相同的或類似的。所述多個電感器可以彼此電並聯佈置、彼此電串聯佈置、或按它們的組合佈置。所述多個電感器可以被集成在相同的集成平面722中或不同的集成平面722中。在一些實施方案中,開關電感型DC-DC電源轉換器小晶片60包括一個或更多個電感器770和一個或更多個電感器870。
In some embodiments, the switched inductor type DC-DC
需注意的是,上述實施方式僅例示本發明之較佳實施例,為避免贅述,並未詳加記載所有可能的變化組合。然而,本領域之通常知識者應可理解,上述各模組或元件未必皆為必要。且為實施本發明,亦可能包含其他較細節之習知模組或元件。各模組或元件皆可能視需求加以省略或修改,且任兩模組間未必不存在其他模組或元件。只要不脫離本發明基本架構者,皆應為本專利所主張之權利範圍,而應以專利申請範圍為準。 It should be noted that the above-mentioned implementation manners are only examples of preferred embodiments of the present invention, and in order to avoid redundant description, all possible variations and combinations are not described in detail. However, those skilled in the art should understand that not all of the above-mentioned modules or components are necessary. In order to implement the present invention, other detailed conventional modules or components may also be included. Each module or component may be omitted or modified as required, and there may not be other modules or components between any two modules. As long as it does not deviate from the basic structure of the present invention, the scope of the rights claimed in this patent shall be the scope of the patent application.
20A:組件 20A: Components
200:處理器 200: processor
201、220:中心點 201, 220: Center point
210:處理器封裝基板 210: processor package substrate
212:第一側 212: first side
214:第二側 214: second side
215:處理器封裝電端子 215: processor package electrical terminals
216:導電層 216: conductive layer
218:導電柱 218: Conductive column
22:處理器模組 22: processor module
220:電源管理封裝基板 220: Power management package substrate
230:電源轉換器晶片 230: power converter chip
24:電源管理模組 24: Power Management Module
240:電源管理封裝基板 240: Power management package substrate
245:電源管理封裝電端子 245: Power management package electrical terminals
250:間隙 250: Clearance
260:導電螺柱 260: Conductive stud
270、280:截面高度 270, 280: Section height
Claims (30)
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PCT/US2018/048290 WO2020046276A1 (en) | 2018-08-28 | 2018-08-28 | Processor module with integrated packaged power converter |
USPCT/US18/48290 | 2018-08-28 |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20080164605A1 (en) * | 2007-01-08 | 2008-07-10 | United Microelectronics Corp. | Multi-chip package |
TW201030938A (en) * | 2008-12-23 | 2010-08-16 | Intersil Inc | Co-packaging approach for power converters based on planar devices, structure and method |
TW201433073A (en) * | 2013-01-22 | 2014-08-16 | Power Integrations Inc | Controller, integrated circuit package, power converter, and method for controlling an isolated power converter |
US20150043171A1 (en) * | 2013-08-07 | 2015-02-12 | Taiyo Yuden Co., Ltd. | Circuit module |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
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US20080116589A1 (en) | 2006-11-17 | 2008-05-22 | Zong-Fu Li | Ball grid array package assembly with integrated voltage regulator |
US9177944B2 (en) * | 2010-12-03 | 2015-11-03 | Xilinx, Inc. | Semiconductor device with stacked power converter |
EP3133645A1 (en) * | 2013-03-04 | 2017-02-22 | Dialog Semiconductor GmbH | Chip on chip attach (passive ipd and pmic) flip chip bga using new cavity bga substrate |
US20150255411A1 (en) * | 2014-03-05 | 2015-09-10 | Omkar G. Karhade | Die-to-die bonding and associated package configurations |
KR102287396B1 (en) * | 2014-10-21 | 2021-08-06 | 삼성전자주식회사 | SYSTEM ON PACKAGE (SoP) MODULE AND MOBILE COMPUTING DEVICE HAVING THE SoP |
US10665579B2 (en) | 2016-02-16 | 2020-05-26 | Xilinx, Inc. | Chip package assembly with power management integrated circuit and integrated circuit die |
KR102663810B1 (en) | 2016-12-30 | 2024-05-07 | 삼성전자주식회사 | electronic device package |
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20080164605A1 (en) * | 2007-01-08 | 2008-07-10 | United Microelectronics Corp. | Multi-chip package |
TW201030938A (en) * | 2008-12-23 | 2010-08-16 | Intersil Inc | Co-packaging approach for power converters based on planar devices, structure and method |
TW201433073A (en) * | 2013-01-22 | 2014-08-16 | Power Integrations Inc | Controller, integrated circuit package, power converter, and method for controlling an isolated power converter |
US20150043171A1 (en) * | 2013-08-07 | 2015-02-12 | Taiyo Yuden Co., Ltd. | Circuit module |
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TW202010091A (en) | 2020-03-01 |
EP3841610A1 (en) | 2021-06-30 |
WO2020046276A1 (en) | 2020-03-05 |
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