TWI719660B - Light detection device - Google Patents
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Abstract
一種光偵測裝置,適用於偵測一光源發出的一具有強度變化的待測光。該光偵測裝置包含一陣列式光譜儀、一光電探測器,及一中控單元。該陣列式光譜儀適用於偵測該待測光,並輸出一第一偵測訊號。該光電探測器位於該陣列式光譜儀旁,適用於偵測該待測光,並輸出一第二偵測訊號。該中控單元包括一運算模組,該運算模組將該第一偵測訊號與該第二偵測訊號中分別對應該待測光的強光區段的部分與弱光區段的部分進行運算整合,以取得一相關於該待測光的光強度變化。本發明可用於偵測該光源發出的連續、多重變化的待測光,而且偵測快速且靈敏度高。 A light detecting device is suitable for detecting a light to be measured with intensity variation emitted by a light source. The light detection device includes an array spectrometer, a photodetector, and a central control unit. The array spectrometer is suitable for detecting the light to be measured and outputting a first detection signal. The photodetector is located beside the array spectrometer and is suitable for detecting the light to be measured and outputting a second detection signal. The central control unit includes an arithmetic module, and the arithmetic module performs calculations on the part of the first detection signal and the part of the second detection signal corresponding to the strong light section and the weak light section of the light to be measured, respectively Integration to obtain a light intensity change related to the light to be measured. The invention can be used to detect continuous and multiple changes of the light to be measured from the light source, and the detection is fast and sensitive.
Description
本發明是有關於一種光偵測裝置,特別是指一種對於強光與弱光的偵測靈敏度皆良好、且偵測快速的光偵測裝置。 The present invention relates to a light detection device, in particular to a light detection device that has good detection sensitivity for both strong light and weak light and fast detection.
陣列式光譜儀可用於測量光強度,但使用陣列式光譜儀測量光強的動態範圍(Dynamic range)受到曝光時間、光強度的影響。陣列式光譜儀用於檢測強光時表現良好,但因其對弱光(例如1流明)的靈敏度較低,檢測弱光時,就需要拉長曝光時間,但曝光時間增加時,同時也會增加測量的時間以及熱噪聲(Thermal noise)。目前雖可搭配降溫裝置來進行光偵測,達到抑制熱噪聲的效果,但是對於測量時間拉長的問題仍無法改善,而且該降溫裝置有可能降低陣列式光譜儀的一測量響應度,反而要再增加所需的曝光時間。因此,如何提升測量儀器的靈敏度,使其對於弱光有良好的偵測效果,並能縮短偵測時間,為一重要課題。 Array spectrometers can be used to measure light intensity, but the dynamic range of using array spectrometers to measure light intensity (Dynamic range) is affected by exposure time and light intensity. The array spectrometer performs well when used to detect strong light, but because of its low sensitivity to weak light (such as 1 lumen), when detecting weak light, it needs to extend the exposure time, but when the exposure time increases, it will increase at the same time. Measurement time and thermal noise (Thermal noise). Although it can be used with a cooling device to perform light detection and achieve the effect of suppressing thermal noise, the problem of prolonged measurement time cannot be improved, and the cooling device may reduce the measurement response of the array spectrometer. Increase the required exposure time. Therefore, how to improve the sensitivity of the measuring instrument so that it has a good detection effect for low light and can shorten the detection time is an important issue.
因此,本發明之目的,即在提供一種偵測快速、靈敏度高的光偵測裝置。 Therefore, the purpose of the present invention is to provide a light detection device with fast detection and high sensitivity.
於是,本發明光偵測裝置,適用於偵測一光源發出的一具有強度變化的待測光。該光偵測裝置包含一陣列式光譜儀、一光電探測器,及一中控單元。 Therefore, the light detecting device of the present invention is suitable for detecting a light to be measured with a change in intensity emitted by a light source. The light detection device includes an array spectrometer, a photodetector, and a central control unit.
該陣列式光譜儀適用於偵測該待測光,並輸出一第一偵測訊號。該光電探測器位於該陣列式光譜儀旁,適用於偵測該待測光,並輸出一第二偵測訊號。該中控單元訊號連接該陣列式光譜儀與該光電探測器,該中控單元包括一運算模組,該運算模組將該第一偵測訊號中對應該待測光的一強光區段的部分與該第二偵測訊號中對應該待測光的一弱光區段的部分進行運算整合,以取得一相關於該待測光的光強度變化。 The array spectrometer is suitable for detecting the light to be measured and outputting a first detection signal. The photodetector is located beside the array spectrometer and is suitable for detecting the light to be measured and outputting a second detection signal. The central control unit signal is connected to the array spectrometer and the photodetector, the central control unit includes an arithmetic module, and the arithmetic module corresponds to the portion of the first detection signal of a strong light section to be measured Perform calculation integration with a part of the second detection signal corresponding to a weak light section of the light to be measured to obtain a light intensity change related to the light to be measured.
本發明之功效在於:該相關於該待測光的光強度變化是藉由該陣列式光譜儀,搭配該光電探測器對於該弱光區段之高靈敏度與快速偵測能力而獲得,使本發明可用於偵測該光源發出的連續、多重變化的待測光,而且偵測快速且靈敏度高。 The effect of the present invention is that the light intensity change related to the light to be measured is obtained by the array spectrometer, combined with the high sensitivity and rapid detection capability of the photodetector for the weak light section, so that the present invention can be used It is used to detect the continuous and multiple changes of the light to be measured from the light source, and the detection is fast and sensitive.
1:光源 1: light source
2:陣列式光譜儀 2: Array spectrometer
21:感光元件 21: photosensitive element
3:光電探測器 3: photodetector
31:光圈 31: Aperture
4:光傳導單元 4: Light transmission unit
41:第一光纖模組 41: The first optical fiber module
411:第一光纖 411: First fiber
42:第二光纖模組 42: The second optical fiber module
421:第二光纖 421: second fiber
5:中控單元 5: Central control unit
51:運算模組 51: Computing Module
本發明之其他的特徵及功效,將於參照圖式的實施方式中清楚地呈現,其中: 圖1是本發明光偵測裝置的一實施例的一裝置示意圖;圖2是該實施例的一功能方塊示意圖;圖3是該實施例的一光傳導單元的一實施態樣示意圖;及圖4是一待測光的光強度隨著輸入電力而變化的關係示意圖,圖中將一第一偵測訊號(曲線1)與一第二偵測訊號(曲線2)運算整合後,得到一相關於該待測光的光強度變化(曲線3)。 Other features and effects of the present invention will be clearly presented in the embodiments with reference to the drawings, in which: 1 is a schematic diagram of an embodiment of the light detection device of the present invention; FIG. 2 is a functional block diagram of the embodiment; FIG. 3 is a schematic diagram of an implementation of a light transmission unit of the embodiment; and 4 is a schematic diagram of the relationship between the light intensity of the light to be measured and the input power. In the figure, a first detection signal (curve 1) and a second detection signal (curve 2) are calculated and integrated to obtain a correlation The light intensity change of the light to be measured (curve 3).
參閱圖1、2、3、4,本發明光偵測裝置之一實施例,適用於偵測一光源1發出的一具有強度變化的待測光(即,該待測光由一強光區段與一弱光區段所組成)。本實施例的光偵測裝置包含一陣列式光譜儀2、一光電探測器3、一光傳導單元4,以及一中控單元5。
Referring to Figures 1, 2, 3, and 4, an embodiment of the light detecting device of the present invention is suitable for detecting a light to be measured with a change in intensity emitted by a light source 1 (that is, the light to be measured is composed of a strong light section and A low-light section). The light detection device of this embodiment includes an array spectrometer 2, a
該陣列式光譜儀2適用於偵測該待測光,並依偵測結果輸出一第一偵測訊號(其包含強光區段訊號與弱光區段訊號)。該陣列式光譜儀2可偵測的光強範圍大於或等於106顆光子/秒,因此能用於偵測強光。該陣列式光譜儀2包括數個用於偵測該待測光的感光元件21,該等感光元件21各自為一感光耦合元件(Charge Coupled Device,CCD)或一互補式金屬氧化物半導體
(Complementary Metal-Oxide-Semiconductor,CMOS)感光元件,但不限於此。
The array spectrometer 2 is suitable for detecting the light to be measured, and outputs a first detection signal (which includes a strong light section signal and a low light section signal) according to the detection result. The spectrometer 2 array detectable range of light intensity is greater than or equal to 10 6 photons / sec, and therefore can be used to detect light. The array spectrometer 2 includes a plurality of
該光電探測器3位於該陣列式光譜儀2旁,並適用於偵測該待測光,並依偵測結果輸出一第二偵測訊號(其包含強光區段訊號與弱光區段訊號)。在此實施例中,該光電探測器3包括一個光圈31,該光圈31先調整該待測光的該弱光區段的光強度後,該光電探測器3再將調整後的該待測光轉換成一電訊號,以偵測調整後的該待測光以輸出該第二偵測訊號。該光電探測器3的偵測靈敏度高,針對弱光具有優異、快速的偵測能力,該光電探測器3可偵測的光強範圍大於或等於1顆光子/秒,且小於或等於1010顆光子/秒,因此能用於偵測弱光。該光電探測器3為,例如,一光電倍增管(Photomultiplier,簡稱PMT)、一雪崩光電二極體(Avalanche photodiode,簡稱APD),或一光感測器(Photo sensor)。
The
該光傳導單元4適用於將該光源1所發出的該待測光傳導至該陣列式光譜儀2與該光電探測器3。在此實施例中,該光傳導單元4包括一訊號連接在該光源1與該陣列式光譜儀2間的第一光纖模組41,以及一連接在該光源1與該光電探測器3間的第二光纖模組42。該第一光纖模組41用於將該待測光傳輸至該陣列式光譜儀2。該第二光纖模組42用於將該待測光傳輸至該光電探測器3。需說明的是,在此實施例中,該第一光纖模組41包括多根第一光纖
411(例如,包括六根第一光纖411),該第二光纖模組42包括一根第二光纖421,但不限於此。
The light conducting
該中控單元5訊號連接該陣列式光譜儀2與該光電探測器3。該中控單元5為,例如,一具有運算功能的電腦,並包括一運算模組51。該運算模組51將該第一偵測訊號(如圖4的曲線1)與該第二偵測訊號(如圖4的曲線2)進行運算整合,以取得一相關於該待測光的光強度變化(如圖4的曲線3)。
The
詳細來說,本發明使用時,該光源1啟動發出該待測光,該光源1例如一發光二極體,該光源1的發光強度會隨著一輸入電力大小而改變。舉例來說,可對該光源1施加電流或電壓作為該輸入電力。在本實施例中,以施加電壓為例,圖4的橫軸的輸入電力即為電壓值。經由該光傳導單元4將該待測光(即,強光區段與弱光區段同時)傳導至該陣列式光譜儀2與該光電探測器3。因該待測光的光強度有強弱變化,因此本發明採用該陣列式光譜儀2搭配該光電探測器3,兩者分別對強光與弱光有靈敏的偵測,且兩者可偵測的範圍有部分重疊。當該待測光變化到較高強度、高亮度時(即,該強光區段),由該陣列式光譜儀2所偵測到的該第一偵測訊號作為主要的光強度偵測訊號區段,相對地,當該待測光變化到較低強度、低亮度時(即,該弱光區段),由該光電探測器3所偵測到的該第二偵測訊號作為主要的光強度偵測訊號區段。該陣列式光譜儀2
與該光電探測器3偵測後分別輸出該第一偵測訊號與該第二偵測訊號給該中控單元5,且該運算模組51根據一線性外插法將該第一偵測訊號中對應該待測光的該強光區段的部分與該第二偵測訊號中對應該待測光的該弱光區段的部分進行運算整合,即可得到該相關於該待測光的完整光強度變化。
In detail, when the present invention is used, the
需要說明的是,圖4中用於代表該第一偵測訊號的一曲線1,與用於代表該第二偵測訊號的一曲線2,僅表示曲線驅勢而非絕對的具體數值。其中,因該陣列式光譜儀2偵測強度較低的光時較不靈敏,因此會如該曲線1所示,該第一偵測訊號的前段訊號高低起伏,雜訊較多。故在光強度較低的範圍,以該曲線2的量測結果為主(即,當該待測光變化到該弱光區段時,由該光電探測器3所偵測到的該第二偵測訊號作為主要的光強度偵測訊號區段)。而該運算模組51藉由該線性外插法來對該等第一與第二偵測訊號進行運算校正,以將該等第一與第二偵測訊號整合並得到該曲線3。舉例來說,取該曲線1訊號良好的部分,假設該曲線1中圓圈畫記處的光強度訊號讀值為1,其對應於該曲線2中的圓圈畫記處的光強度訊號讀值為10,藉由該線性外插法來將該等曲線1、2進行運算後,可得到該曲線2讀值為9的點,相當於該曲線1中讀值為0.9的點,依此類推。如此,就可得到該曲線1與該曲線2的對應關係,且將該曲
線1映射至該曲線2以得到該曲線3。需要說明的是,本實施例的舉例中,該曲線3僅呈現光強度變化的驅勢,並未用於代表具體數值。
It should be noted that a
綜上所述,從該相關於該待測光的光強度變化之曲線3可得知,曲線3的強光區段與弱光區段分別是相關於該陣列式光譜儀2所偵測到的該第一偵測訊號的強光區段,及該光電探測器3所偵測的該第二偵測訊號的弱光區段,藉由搭配該光電探測器3對於弱光之高靈敏度與快速偵測能力,從而可彌補以往僅採用陣列式光譜儀來檢測光時,於弱光偵測時必需拉長曝光時間的問題。因此,本發明可用於偵測該光源1發出的連續、多重變化的待測光,對於其中的強光與弱光區段都能高靈敏、快速地偵測。本發明此種結合該陣列式光譜儀2與該光電探測器3的光偵測裝置,偵測時間快速,相較於以往僅採用陣列式光譜儀來進行偵測,偵測時間快了10倍以上。
In summary, from the
惟以上所述者,僅為本發明之實施例而已,當不能以此限定本發明實施之範圍,凡是依本發明申請專利範圍及專利說明書內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。 However, the above are only examples of the present invention. When the scope of implementation of the present invention cannot be limited by this, all simple equivalent changes and modifications made in accordance with the scope of the patent application of the present invention and the content of the patent specification still belong to This invention patent covers the scope.
1:光源 1: light source
2:陣列式光譜儀 2: Array spectrometer
3:光電探測器 3: photodetector
4:光傳導單元 4: Light transmission unit
41:第一光纖模組 41: The first optical fiber module
42:第二光纖模組 42: The second optical fiber module
5:中控單元 5: Central control unit
51:運算模組 51: Computing Module
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US5432609A (en) * | 1993-01-06 | 1995-07-11 | Minolta Co., Ltd. | Two-dimensional colorimeter |
TWI427276B (en) * | 2009-04-06 | 2014-02-21 | Himax Display Inc | Light sensing circuit and method thereof |
CN102313598A (en) * | 2011-07-25 | 2012-01-11 | 四川中测科技投资有限公司 | Tester based on light splitting spectrum luminosity and night vision radiation intensity and test method thereof |
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