TWI707627B - Burn-in apparatus with enhance structure and method for using the same - Google Patents

Burn-in apparatus with enhance structure and method for using the same Download PDF

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TWI707627B
TWI707627B TW109105980A TW109105980A TWI707627B TW I707627 B TWI707627 B TW I707627B TW 109105980 A TW109105980 A TW 109105980A TW 109105980 A TW109105980 A TW 109105980A TW I707627 B TWI707627 B TW I707627B
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burn
circuit board
base
processor
assembly
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TW202133710A (en
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孫偉志
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孫偉志
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Abstract

The invention discloses a burn-in apparatus having at least one burn-in socket mounted on a circuit board. The burn-in socket includes a socket assembly mounted to the circuit board for receiving a processor and a frame mounted to the circuit board in a position corresponding to the socket assembly. The frame holds a fan in order to define a flow path vertical to the circuit board.

Description

具有結構強化之燒機裝置及其使用方法 Burn-in device with structure strengthening and its use method

本發明係關於一種用於處理器測試的燒機裝置,尤其是關於經結構強化的燒機裝置及其使用方法。 The present invention relates to a burn-in device for processor testing, in particular to a structure-strengthened burn-in device and a method of use thereof.

經封裝後的積體電路(IC),通常需要經過一定時間的燒機測試(burn in test),以確保IC產品可以在嚴苛環境下運作。第一圖顯示一種已知燒機裝置的示意圖。經封裝後的一處理器(100)被容置於固定在電路板(101)上的一機座總成(102)並電性連接至多個接觸(未顯示)。備有多個散熱單元的一蓋總成(103)對處理器(100)進行壓制並以一熱接觸部接觸處理器(100)的表面。蓋總成(103)屬按壓構件,其會對燒機測試中的處理器(100)和電路板(101)產生應力,而不當的應力會造成處理器損毀或電路板變形。燒機測試期間,處理器(100)產生的熱會傳遞至封裝表面並經由蓋總成(103)的散熱單元,如熱沉表面,釋放至空氣中。隨著5G和AI時代的來臨,燒機測試也變得更加嚴苛,即燒機溫度隨之提高。 The packaged integrated circuit (IC) usually needs a certain period of burn in test to ensure that the IC product can operate in a harsh environment. The first figure shows a schematic diagram of a known burn-in device. The packaged processor (100) is housed in a base assembly (102) fixed on the circuit board (101) and electrically connected to a plurality of contacts (not shown). A cover assembly (103) equipped with a plurality of heat dissipation units presses the processor (100) and contacts the surface of the processor (100) with a thermal contact part. The cover assembly (103) is a pressing member, which will produce stress on the processor (100) and the circuit board (101) in the burn-in test, and improper stress may cause damage to the processor or deformation of the circuit board. During the burn-in test, the heat generated by the processor (100) is transferred to the package surface and released into the air via the heat dissipation unit of the cover assembly (103), such as the surface of the heat sink. With the advent of the 5G and AI era, the burn-in test has become more stringent, that is, the burn-in temperature will increase.

然而,上述設計的散熱機制可能無法滿足進階的燒機測試。事實上,根據經驗,經歷燒機測試的處理器,其所產生的熱大約有百分之三十會傳遞至封裝表面,而其他的百分之七十則會聚集在處理器的底部。換言之,蓋總成 (103)最多僅能應付處理器三成的熱,其他則必須由機座總成(102)的本體排除。雖然未顯示,機座總成(102)內部有相當的空間需要配置高密度的訊號線,並無足夠的空間容納更多的散熱單元。燒機測試中,累積於處理器底部的熱被散除的效果仍有限。 However, the heat dissipation mechanism designed above may not meet the advanced burn-in test. In fact, according to experience, about 30% of the heat generated by a processor undergoing burn-in testing will be transferred to the package surface, while the other 70% will be concentrated on the bottom of the processor. In other words, the cover assembly (103) It can only deal with 30% of the heat of the processor at most, and the rest must be removed by the body of the base assembly (102). Although not shown, there is a considerable space inside the base assembly (102) that requires high-density signal lines, and there is not enough space to accommodate more heat dissipation units. During the burn-in test, the heat accumulated at the bottom of the processor has a limited effect on being dissipated.

因此,有必要發展一種可提升燒機裝置底部散熱能力的一種手段。較佳地,機座總成的散熱能力也需要一併提升。 Therefore, it is necessary to develop a means to improve the heat dissipation capacity of the bottom of the burning device. Preferably, the heat dissipation capacity of the base assembly also needs to be improved.

本發明提供了一種燒機裝置,具有至少一燒機座及一電路板,該電路板具有一正面和一背面,該燒機座包含:一機座總成,具有用於容置一處理器的一容置空間,該機座總成的一底部連接該電路板的正面;及一結構框,固定於該電路板的背面且與該機座總成的容置空間為位置相對,該結構框固持有一風扇,該風扇定義垂直於該電路板的背面的一流體路徑。 The invention provides a burn-in device, which has at least one burn-in base and a circuit board. The circuit board has a front and a back. The burn-in base includes: a base assembly with a base for accommodating a processor A accommodating space of the base assembly is connected to the front side of the circuit board; and a structural frame fixed on the back of the circuit board and opposite to the accommodating space of the base assembly, the structure The frame holds a fan that defines a fluid path perpendicular to the back of the circuit board.

在一具體實施例中,該燒機座還包含:一蓋總成,與該機座總成樞轉連接,且該蓋總成具有一熱接觸部,該熱接觸部被配置成當蓋總成覆蓋該機座總成時與該容置空間中的處理器接觸。 In a specific embodiment, the burning base further includes: a cover assembly pivotally connected to the base assembly, and the cover assembly has a thermal contact portion configured to act as the cover assembly When covering the base assembly, it contacts the processor in the accommodating space.

在一具體實施例中,該機座總成具有一外座和一內座,該內座定義該容置空間且該內座容置於該外座中,該內座具有多個第一缺口,該外座具有多個第二缺口,該等第一缺口與該等第二缺口定義該處理器的多個側向散熱路徑。 In a specific embodiment, the base assembly has an outer seat and an inner seat, the inner seat defines the accommodating space and the inner seat is accommodated in the outer seat, and the inner seat has a plurality of first notches The outer seat has a plurality of second notches, and the first notches and the second notches define a plurality of lateral heat dissipation paths of the processor.

在一具體實施例中,該機座總成具有一外座和一內座,該內座定義該容置空間且該內座容置於該外座中,該內座具有一第一缺口,該外座具有多個第二缺口,該第一缺口與該等第二缺口相鄰,且該等第二缺口將該第一缺口的側向散熱路徑分流。 In a specific embodiment, the base assembly has an outer seat and an inner seat, the inner seat defines the accommodating space and the inner seat is accommodated in the outer seat, and the inner seat has a first notch, The outer seat has a plurality of second notches, the first notches are adjacent to the second notches, and the second notches divide the lateral heat dissipation path of the first notch.

在一具體實施例中,該結構框具有一外壁和一內壁,該結構框自其外壁延伸有連接該電路板背面的多個固定臂,該結構框的內壁定義一鏤空以容置該風扇。 In a specific embodiment, the structural frame has an outer wall and an inner wall, the structural frame extends from the outer wall with a plurality of fixing arms connected to the back of the circuit board, and the inner wall of the structural frame defines a hollow to accommodate the fan.

本發明的另一目的在於提供一種使用燒機裝置的方法,包含:提供一燒機座於一電路板的正面,該燒機座包含一機座總成和一蓋總成,該機座總成容置一處理器且該處理器受到該蓋總成的壓制;提供一結構框於該電路板的背面相對於該蓋總成的壓制位置,且該結構框固持一風扇,該風扇定義垂直於該電路板的背面的一流體路徑;提供一測試訊號至該燒機座以測試該處理器;及提供一控制訊號至該風扇以控制轉速。 Another object of the present invention is to provide a method of using a burn-in device, including: providing a burn-in base on the front of a circuit board, the burn-in base includes a base assembly and a cover assembly, the base assembly A processor is accommodated and the processor is pressed by the cover assembly; a structural frame is provided on the back of the circuit board relative to the pressing position of the cover assembly, and the structural frame holds a fan, and the fan defines a vertical A fluid path on the back of the circuit board; providing a test signal to the burn-in base to test the processor; and providing a control signal to the fan to control the speed.

在一具體實施例中,該蓋總成還具有一溫度感應單元用於產生一感應訊號,該方法還包含:基於該感應訊號產生該控制訊號。 In a specific embodiment, the cover assembly further has a temperature sensing unit for generating a sensing signal, and the method further includes: generating the control signal based on the sensing signal.

100:處理器 100: processor

101:電路板 101: circuit board

102:機座總成 102: base assembly

103:蓋總成 103: cover assembly

200:燒機座 200: Burn the base

210:機座總成 210: base assembly

211:外座 211: Outer Block

212:內座 212: inner seat

213:底板 213: bottom plate

214:彈簧 214: Spring

215:第一缺口 215: The first gap

216:第二缺口 216: The second gap

220:蓋總成 220: cover assembly

221:熱接觸部 221: Thermal Contact

300:電路板 300: circuit board

301:正面 301: positive

302:背面 302: Back

400:結構框 400: structure frame

401:外壁 401: Outer Wall

402:內壁 402: Inner Wall

403:固定臂 403: fixed arm

500:風扇 500: Fan

第一圖顯示燒機裝置的先前技術示意圖。 The first figure shows the prior art schematic diagram of the burn-in device.

第二圖顯示本發明燒機裝置的側視剖面圖(打開)。 The second figure shows a side sectional view (open) of the burning device of the present invention.

第三圖顯示本發明燒機裝置的側視剖面圖(關閉)。 The third figure shows a side sectional view (closed) of the burning device of the present invention.

第四圖顯示本發明燒機裝置的另一側視剖面圖(關閉)。 The fourth figure shows another side cross-sectional view of the burning device of the present invention (closed).

第五圖顯示本發明燒機座的俯視圖(無蓋總成)。 The fifth figure shows a top view of the burn-in base of the present invention (without cover assembly).

第六圖顯示本發明燒機裝置的一立體透視圖(打開)。 The sixth figure shows a perspective view (opened) of the burning device of the present invention.

第七圖顯示本發明燒機裝置的結構框。 The seventh figure shows the structural frame of the burning device of the present invention.

本發明之實施方式將於下文中,參照本發明的理想實施方式的示意圖來進行描述。該等圖示中的形狀、設置方式會因製造技術、設計及/或公差 而有所不同。因此,本發明文中所說明的實施方式不應被視為是用來將本發明結構侷限在特定的元件或形狀,其應包含任何因製作所造成在形狀方面的差異。 The embodiments of the present invention will be described below with reference to schematic diagrams of ideal embodiments of the present invention. The shapes and settings in these illustrations will vary depending on manufacturing technology, design and/or tolerances It's different. Therefore, the embodiments described in the text of the present invention should not be regarded as being used to limit the structure of the present invention to specific elements or shapes, and should include any difference in shape caused by manufacturing.

第二圖及第三圖分別示意本發明燒機裝置打開和關閉狀態的一實施例側視剖面圖。本發明燒機裝置具有至少一燒機座(200,圖中僅顯示一個)及一電路板(300)。待測試封裝的晶片或處理器於燒機座(200)中進行所謂的燒機測試,以評估處理器的耐熱能力。電路板(300)具有一正面(301)和一背面(302)。燒機座(200)與電路版(300)訊號連接,一訊號源(未顯示)經由所述訊號連接將燒機測試訊號傳遞至處理器,以執行測試。本實施例揭露一種具有按壓構件的燒機座(200),主要包含一機座總成(210)及樞轉連接至機座總成(210)的一蓋總成(220)。機座總成(210)的一底部固接至電路板(300)的正面(301)且機座總成(210)的底部具有多個金屬接觸,用於電性連接電路板的導線。機座總成(210)的一頂部則配置成可容置一適當尺寸的處理器且頂部也有配置與處理器電性連接的多個金屬接觸。位於機座總成(210)定部和底部的金屬接觸也是電性連接的關係,例如經由導線或導通孔。 The second figure and the third figure respectively show a side sectional view of an embodiment of the burning device of the present invention in the opened and closed state. The burn-in device of the present invention has at least one burn-in base (200, only one is shown in the figure) and a circuit board (300). The packaged chip or processor to be tested is subjected to a so-called burn-in test in the burn-in base (200) to evaluate the heat resistance of the processor. The circuit board (300) has a front side (301) and a back side (302). The burn-in base (200) is connected to the circuit board (300) for signals, and a signal source (not shown) transmits the burn-in test signal to the processor through the signal connection to perform the test. This embodiment discloses a burn-in base (200) with a pressing member, which mainly includes a base assembly (210) and a cover assembly (220) pivotally connected to the base assembly (210). A bottom of the base assembly (210) is fixedly connected to the front surface (301) of the circuit board (300) and the bottom of the base assembly (210) has a plurality of metal contacts for electrically connecting wires of the circuit board. A top of the base assembly (210) is configured to accommodate a processor of an appropriate size, and a plurality of metal contacts are configured to be electrically connected to the processor at the top. The metal contacts at the fixed part and the bottom of the base assembly (210) are also in an electrical connection relationship, for example, via wires or via holes.

蓋總成(220)經由轉軸與機座總成(210)連接,且選擇性覆蓋機座總成(210)的頂部。關閉時,蓋總成(220)覆蓋機座總成(210)的頂部且接觸處理器的封裝表面,以協助散熱。蓋總成(220)可具有多個散熱單元,像是熱沉、熱導管、風扇、均熱板等。如圖所示,蓋總成(220)具有一熱接觸部(221),其以適當的面積接觸容置於機座總成(210)頂部的處理器封裝表面。熱接觸部(221)為高導熱材質,且可進一步連接其他散熱單元,像是熱導管、熱沉(散熱鰭片)和風扇,使燒機過程中處理器上方的熱可由蓋總成(220)排除。 The cover assembly (220) is connected to the base assembly (210) via a rotating shaft, and selectively covers the top of the base assembly (210). When closed, the cover assembly (220) covers the top of the base assembly (210) and contacts the packaging surface of the processor to assist heat dissipation. The cover assembly (220) may have multiple heat dissipation units, such as heat sinks, heat pipes, fans, heat spreaders, etc. As shown in the figure, the cover assembly (220) has a thermal contact portion (221), which contacts the processor package surface on the top of the base assembly (210) with an appropriate area. The thermal contact part (221) is made of high thermal conductivity material, and can be further connected to other heat dissipation units, such as heat pipes, heat sinks (heat dissipation fins) and fans, so that the heat above the processor during the burn-in process can be )exclude.

為了使蓋總成(220)的熱接觸部(221)有效接觸封裝表面,機座總成(210)可進一步配置一壓制總成(省略未示)來確保蓋總成(220)蓋上後位於正確的位置。為了避免過大的壓力,所述壓制總成可包含彈性構件。例如,壓制總成可為樞轉連接至機座總成(210)的一槓桿,而在連接處的轉軸可配置一緩衝彈簧。蓋總成(220)還具有一溫度感應單元(未顯示),其可配置於熱接觸部(221),以根據熱接觸部(221)的溫度產生一感應訊號。 In order to make the thermal contact portion (221) of the cover assembly (220) effectively contact the packaging surface, the base assembly (210) can be further equipped with a pressing assembly (not shown) to ensure that the cover assembly (220) is covered In the right place. In order to avoid excessive pressure, the pressing assembly may include an elastic member. For example, the pressing assembly may be a lever pivotally connected to the base assembly (210), and the rotating shaft at the connection may be equipped with a buffer spring. The cover assembly (220) also has a temperature sensing unit (not shown), which can be disposed on the thermal contact portion (221) to generate a sensing signal according to the temperature of the thermal contact portion (221).

本發明燒機座還包含一結構框(400),固定於電路板(300)的背面(302)且與機座總成(210)相對。具體而言,結構框(400)是位於相對於蓋總成(220)按壓方向的位置上。結構框(400)的尺寸係經適當選擇,以避免電路板(300)被按壓而變形。參閱第七圖顯示本發明燒之裝置的結構框(400)的一實施例。結構框(400)具有一外壁(401)和一內壁(402)。結構框(400)基本上為矩形框,其自外壁(401)延伸有連接電路板背面(302)的多個固定臂(403),內壁(402)則定義一鏤空以容置一風扇(500),其訊號連接至電路板上的一控制器(未顯示),藉此該風扇(500)定義垂直於電路板的背面(302)的一流體路徑。換言之,在處理器底部、機座總成(210)底部或電路板(300)累積的熱得以更有效率地排除,提升機座總成(210)以及電路板(300)的保護。可替代地,單一鏤空可不限於容置單一風扇(500),更多並排或堆疊在一起的風扇也是可行的。雖然未顯示,在某些實施例中,結構框(400)可被配置成具有多個鏤空以容置更多的風扇(500)。 The burning machine base of the present invention also includes a structural frame (400), which is fixed on the back side (302) of the circuit board (300) and opposite to the machine base assembly (210). Specifically, the structural frame (400) is located at a position relative to the pressing direction of the cover assembly (220). The size of the structure frame (400) is appropriately selected to prevent the circuit board (300) from being pressed and deformed. Referring to the seventh figure, an embodiment of the structural frame (400) of the burning device of the present invention is shown. The structural frame (400) has an outer wall (401) and an inner wall (402). The structural frame (400) is basically a rectangular frame, and a plurality of fixed arms (403) connected to the back of the circuit board (302) extend from the outer wall (401), and the inner wall (402) defines a hollow to accommodate a fan ( 500), the signal is connected to a controller (not shown) on the circuit board, whereby the fan (500) defines a fluid path perpendicular to the back side (302) of the circuit board. In other words, the heat accumulated at the bottom of the processor, the bottom of the base assembly (210) or the circuit board (300) can be removed more efficiently, and the protection of the base assembly (210) and the circuit board (300) is improved. Alternatively, a single hollow may not be limited to accommodating a single fan (500), and more fans side by side or stacked together are also feasible. Although not shown, in some embodiments, the structure frame (400) may be configured to have multiple hollows to accommodate more fans (500).

第四圖示意本發明燒機裝置的另一側視剖面圖。機座總成(210)具有一外座(211)、一內座(212)和一底板(213)。內座(212)容置於外座(211)中,且內座(212)定義待測處理器的一容置空間,其內部具有多個金屬 接觸。底板(213)容置於外座(211)中且位於內座(212)的下方。內座(212)經由多個彈簧(214)連接至且懸浮在底板(213)上方。因此,被按壓的處理器可獲得緩衝。此外,內座(212)和底板(213)之間的導線也可配置成具有彈性結構,避免被按壓而損壞。底板(213)可提供有固定銷(未顯示)以利與電路板(300)固接。 The fourth figure illustrates another side sectional view of the burning device of the present invention. The base assembly (210) has an outer seat (211), an inner seat (212) and a bottom plate (213). The inner seat (212) is accommodated in the outer seat (211), and the inner seat (212) defines an accommodating space for the processor to be tested, and has a plurality of metal contact. The bottom plate (213) is accommodated in the outer seat (211) and located below the inner seat (212). The inner seat (212) is connected to and suspended above the bottom plate (213) via a plurality of springs (214). Therefore, the pressed processor can get buffer. In addition, the wires between the inner seat (212) and the bottom plate (213) can also be configured to have an elastic structure to avoid being damaged by being pressed. The bottom plate (213) may be provided with fixing pins (not shown) to facilitate the fixing to the circuit board (300).

第五圖顯示本發明燒機座的俯視圖(蓋總成被省略)。如圖所示,內座(212)中具有多個金屬接點陣列。此外,內座(212)具有一對第一缺口(214),其與待測處理器的容置空間連通並橫向延伸至外座(211)。外座(211)在相對於第一缺口(215)處具有兩個第二缺口(216),其與第一缺口(215)連通並橫向延伸至外座(211)的外側。如圖所示,第一缺口(215)與對應的第二缺口(216)定義待測處理器的多個側向散熱路徑。這些結構及其定義的散熱路徑可於第六圖中的顯示更為清楚,如箭頭所示。據此,本發明燒機座也可提升側向的散熱能力。 The fifth figure shows a top view of the burning machine base of the present invention (the cover assembly is omitted). As shown in the figure, the inner seat (212) has a plurality of metal contact arrays. In addition, the inner seat (212) has a pair of first notches (214) which communicate with the accommodating space of the processor under test and extend laterally to the outer seat (211). The outer seat (211) has two second notches (216) relative to the first notch (215), which communicate with the first notch (215) and extend laterally to the outside of the outer seat (211). As shown in the figure, the first notch (215) and the corresponding second notch (216) define multiple lateral heat dissipation paths of the processor under test. These structures and their defined heat dissipation paths can be shown more clearly in Figure 6, as shown by the arrows. Accordingly, the burn-in base of the present invention can also improve the lateral heat dissipation capability.

使用本發明燒機裝置進行測試的過程中,一控制器或一訊號源會提供測試訊號經由電路板至燒機座。同時,控制器可提供一控制訊號令風扇啟動。隨著,待測試處理器的溫度提高,蓋總成的熱接觸部中的溫度感應單元會傳送感應訊號至控制器。控制器可基於該感應訊號產生控制訊號並決定馬達的轉速。 During the test using the burn-in device of the present invention, a controller or a signal source will provide a test signal to the burn-in base via the circuit board. At the same time, the controller can provide a control signal to start the fan. As the temperature of the processor to be tested increases, the temperature sensing unit in the thermal contact portion of the cover assembly will transmit a sensing signal to the controller. The controller can generate a control signal based on the sensing signal and determine the speed of the motor.

400:結構框 400: structure frame

401:外壁 401: Outer Wall

402:內壁 402: Inner Wall

403:固定臂 403: fixed arm

500:風扇 500: Fan

Claims (7)

一種燒機裝置,具有至少一燒機座及一電路板,該電路板具有一正面和一背面,該燒機座包含:一機座總成,具有用於容置一處理器的一容置空間,該機座總成的一底部連接該電路板的正面;及一結構框,固定於該電路板的背面且與該機座總成的容置空間為位置相對,該結構框固持有一風扇,藉此排除累積於電路板的熱。 A burn-in device has at least one burn-in base and a circuit board. The circuit board has a front and a back. The burn-in base includes: a base assembly with a housing for accommodating a processor Space, a bottom of the base assembly is connected to the front of the circuit board; and a structural frame fixed on the back of the circuit board and opposite to the accommodating space of the base assembly, the structural frame holds A fan to remove the heat accumulated on the circuit board. 如請求項1所述之燒機裝置,其中該燒機座還包含:一蓋總成,與該機座總成樞轉連接,且該蓋總成具有一熱接觸部,該熱接觸部被配置成當蓋總成覆蓋該機座總成時與該容置空間中的處理器接觸。 The burn-in device according to claim 1, wherein the burn-in base further comprises: a cover assembly pivotally connected to the base assembly, and the cover assembly has a thermal contact portion, the thermal contact portion being It is configured to contact the processor in the accommodating space when the cover assembly covers the base assembly. 如請求項1所述之燒機裝置,其中該機座總成具有一外座和一內座,該內座定義該容置空間且該內座容置於該外座中,該內座具有多個第一缺口,該外座具有多個第二缺口,該等第一缺口與該等第二缺口定義該處理器的多個側向散熱路徑。 The burning device according to claim 1, wherein the base assembly has an outer seat and an inner seat, the inner seat defines the accommodating space and the inner seat is accommodated in the outer seat, and the inner seat has A plurality of first notches, the outer seat has a plurality of second notches, the first notches and the second notches define a plurality of lateral heat dissipation paths of the processor. 如請求項1所述之燒機裝置,其中該機座總成具有一外座和一內座,該內座定義該容置空間且該內座容置於該外座中,該內座具有一第一缺口,該外座具有多個第二缺口,該第一缺口與該等第二缺口相鄰,且該等第二缺口將該第一缺口的側向散熱路徑分流。 The burning device according to claim 1, wherein the base assembly has an outer seat and an inner seat, the inner seat defines the accommodating space and the inner seat is accommodated in the outer seat, and the inner seat has A first notch, the outer seat has a plurality of second notches, the first notch is adjacent to the second notches, and the second notches divide the lateral heat dissipation path of the first notch. 如請求項1所述之燒機裝置,其中該結構框具有一外壁和一內壁,該結構框自其外壁延伸有連接該電路板背面的多個固定臂,該結構框的內壁定義一鏤空以容置該風扇。 The burning device according to claim 1, wherein the structural frame has an outer wall and an inner wall, the structural frame extends from the outer wall with a plurality of fixed arms connected to the back of the circuit board, and the inner wall of the structural frame defines a Hollow out to accommodate the fan. 一種使用燒機裝置的方法,包含:提供一燒機座於一電路板的正面,該燒機座包含一機座總成和一蓋總成,該機座總成容置一處理器且該處理器受到該蓋總成的壓制;提供一結構框於該電路板的背面相對於該蓋總成的壓制位置,且該結構框固持一風扇,該風扇定義垂直於該電路板的背面的一流體路徑;提供一測試訊號至該燒機座以測試該處理器;及提供一控制訊號至該風扇以控制轉速。 A method for using a burn-in device includes: providing a burn-in base on the front of a circuit board, the burn-in base includes a base assembly and a cover assembly, the base assembly accommodates a processor and the The processor is pressed by the cover assembly; a structural frame is provided on the back of the circuit board relative to the pressing position of the cover assembly, and the structural frame holds a fan that defines a vertical to the back of the circuit board Fluid path; providing a test signal to the burn-in base to test the processor; and providing a control signal to the fan to control the speed. 如請求項6所述之方法,其中該蓋總成還具有一溫度感應單元用於產生一感應訊號,該方法還包含:基於該感應訊號產生該控制訊號。 The method according to claim 6, wherein the cover assembly further has a temperature sensing unit for generating a sensing signal, and the method further includes: generating the control signal based on the sensing signal.
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI768663B (en) * 2021-01-19 2022-06-21 伊士博國際商業股份有限公司 Burn-in socket with flexible electrical onnection built therein and elastic member adapted for urn-in socket
TWI808790B (en) * 2022-06-15 2023-07-11 伊士博國際商業股份有限公司 Burn-in socket with built-in buffering mechanism

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CN209373045U (en) * 2018-11-28 2019-09-10 深圳市燕麦科技股份有限公司 A kind of FPC heating test device
CN110703831A (en) * 2019-12-01 2020-01-17 陕西三海电子科技有限公司 Independent heating temperature control device for device aging test

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CN209373045U (en) * 2018-11-28 2019-09-10 深圳市燕麦科技股份有限公司 A kind of FPC heating test device
CN110703831A (en) * 2019-12-01 2020-01-17 陕西三海电子科技有限公司 Independent heating temperature control device for device aging test

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI768663B (en) * 2021-01-19 2022-06-21 伊士博國際商業股份有限公司 Burn-in socket with flexible electrical onnection built therein and elastic member adapted for urn-in socket
TWI808790B (en) * 2022-06-15 2023-07-11 伊士博國際商業股份有限公司 Burn-in socket with built-in buffering mechanism

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