TWI707540B - Method for performing lumen depreciation compensation on optical mechanical keyboard - Google Patents

Method for performing lumen depreciation compensation on optical mechanical keyboard Download PDF

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TWI707540B
TWI707540B TW107141646A TW107141646A TWI707540B TW I707540 B TWI707540 B TW I707540B TW 107141646 A TW107141646 A TW 107141646A TW 107141646 A TW107141646 A TW 107141646A TW I707540 B TWI707540 B TW I707540B
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compensation
infrared light
optical axis
voltage value
intensity
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TW107141646A
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Chinese (zh)
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TW202021275A (en
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陳希聖
王俊升
徐德平
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達方電子股份有限公司
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Abstract

A method for performing lumen depreciation compensation on an optical axis keyboard is provided, wherein the optical axis keyboard may include a plurality of button units, any button unit within the plurality of button units may include an infrared light generator, and the method includes: reading a memory device to obtain using time information of the optical axis keyboard, wherein the using time information indicates accumulated using time of the infrared light generator; based on a mapping table between lumen depreciation and time, obtaining lumen depreciation information of the optical axis keyboard according to the using time information, wherein the mapping table indicates variation of infrared light intensity regarding the accumulated using time of the infrared light generator; and according to the lumen depreciation information, controlling infrared light intensity of the infrared light generator.

Description

對光軸鍵盤進行光衰補償的方法 Method of light decay compensation for optical axis keyboard

本發明係關於光軸鍵盤(或稱光機(optical mechanical)鍵盤,諸如具有透過光感應制動的按鍵之鍵盤),尤指一種對光軸鍵盤進行光衰補償的方法。 The present invention relates to an optical axis keyboard (or called an optical mechanical keyboard, such as a keyboard with a key that transmits light induction braking), and particularly refers to a method of light decay compensation for an optical axis keyboard.

由於光軸鍵盤係利用紅外光產生器所產生之紅外光以及相對應的感測裝置來運作,因此光軸鍵盤的壽命會受到其內的紅外光產生器影響。例如:紅外光產生器因自身特性而有光衰壽命的問題,當所產生的紅外光的強度隨著累計使用時間的增加而減弱,可能造成光軸鍵盤進行掃描時判斷失效。因此,需要一種新穎的方法,來解決光軸鍵盤因光衰壽命所產生的問題。 Since the optical axis keyboard uses the infrared light generated by the infrared light generator and the corresponding sensing device to operate, the life of the optical axis keyboard will be affected by the infrared light generator inside. For example, the infrared light generator has the problem of light decay life due to its own characteristics. When the intensity of the generated infrared light decreases with the increase of the cumulative use time, it may cause the judgment of the optical axis keyboard to fail when scanning. Therefore, a novel method is needed to solve the problem of optical axis keyboard due to light decay life.

本發明之一目的在於提供一種對一光軸鍵盤進行光衰補償的方法,以在沒有副作用或較不可能帶來副作用的狀況下,解決上述問題。 An object of the present invention is to provide a method for compensating for light decay of an optical axis keyboard, so as to solve the above-mentioned problems without side effects or less likely to cause side effects.

本發明之另一目的在於提供一種對一光軸鍵盤進行光衰補償的方法,以偵測光衰的程度並進行相對應的補償。 Another object of the present invention is to provide a method for performing light decay compensation on an optical axis keyboard to detect the degree of light decay and perform corresponding compensation.

本發明至少一實施例提供一種對一光軸鍵盤進行光衰補償的方法,其中該光軸鍵盤包含複數個按鍵單元,該複數個按鍵單元中之任一按鍵單元包含一紅外光產生器,且該方法包含:讀取一記憶裝置以取得該光軸鍵盤的使用時間資訊,其中該使用時間資訊指出該紅外光產生器的累計使用時間;基於一 光衰時間對照表,依據該使用時間資訊取得該光軸鍵盤之光衰資訊,其中該光衰時間對照表指出該紅外線產生器隨累計使用時間的紅外光強度變化;以及依據該光衰資訊,控制該紅外光產生器之紅外光強度。 At least one embodiment of the present invention provides a method for performing light decay compensation on an optical axis keyboard, wherein the optical axis keyboard includes a plurality of key units, and any one of the plurality of key units includes an infrared light generator, and The method includes: reading a memory device to obtain usage time information of the optical axis keyboard, wherein the usage time information indicates the cumulative usage time of the infrared light generator; The light decay time comparison table obtains the light decay information of the optical axis keyboard according to the use time information, wherein the light decay time comparison table indicates the infrared light intensity change of the infrared generator with the cumulative use time; and according to the light decay information, Control the infrared light intensity of the infrared light generator.

本發明至少一實施例提供一種對一光軸鍵盤進行光衰補償的方法,其中該光軸鍵盤包含複數個按鍵單元,該複數個按鍵單元中之任一按鍵單元包含一紅外光產生器以及一偵測元件,且該方法包含:在該光軸鍵盤上電後,透過該偵測元件依據該紅外光產生器所產生之紅外光強度產生一電壓值;依據該電壓值產生該紅外光產生器的補償資訊;將該補償資訊儲存至一記憶裝置中;以及在該光軸鍵盤進行正常運作時,依據該補償資訊增強該紅外光強度。 At least one embodiment of the present invention provides a method for performing light decay compensation on an optical axis keyboard, wherein the optical axis keyboard includes a plurality of key units, and any one of the plurality of key units includes an infrared light generator and an infrared light generator. Detecting element, and the method includes: after the optical axis keyboard is powered on, generating a voltage value according to the infrared light intensity generated by the infrared light generator through the detecting element; and generating the infrared light generator according to the voltage value The compensation information is stored in a memory device; and when the optical axis keyboard is operating normally, the infrared light intensity is enhanced according to the compensation information.

本發明的好處之一在於,本發明能依據該光軸鍵盤中之紅外光產生器的使用狀況,例如光衰狀況,來進行相對應之強度補償,以避免該光軸鍵盤因光衰問題而失效。另外,依據本發明之實施例來進行光衰補償不會大幅增加額外成本,因此,本發明能在沒有副作用或較不可能帶來副作用的狀況下,解決相關技術的問題。 One of the advantages of the present invention is that the present invention can perform corresponding intensity compensation according to the use condition of the infrared light generator in the optical axis keyboard, such as the light decay condition, so as to avoid the optical axis keyboard from being caused by the light decay problem. Invalidate. In addition, performing light attenuation compensation according to the embodiments of the present invention will not greatly increase the additional cost. Therefore, the present invention can solve the related technical problems without side effects or less likely to cause side effects.

100、500:光軸鍵盤 100, 500: optical axis keyboard

10:按鍵陣列 10: Button array

20、50:控制器 20, 50: Controller

30:記憶裝置 30: memory device

40:計時器 40: timer

52:電壓偵測電路 52: Voltage detection circuit

110、110_1、110_2:按鍵單元 110, 110_1, 110_2: key unit

120、120_1、120_2:選擇電路 120, 120_1, 120_2: select circuit

112_1、112_2:紅外光發光二極體 112_1, 112_2: infrared light emitting diode

114_1、114_2:光電晶體 114_1, 114_2: photoelectric crystal

116_1、116_2:負載電阻 116_1, 116_2: load resistance

118_1、118_2:遮光板 118_1, 118_2: shading plate

PT1、PT2、PT_OUT:輸出端子 PT1, PT2, PT_OUT: output terminals

300:光衰時間對照表 300: Light decay time comparison table

600、400:工作流程 600, 400: workflow

410、420、430、 440、450、460、610、620、630、640、650、660、670、680、690:步驟 410, 420, 430, 440, 450, 460, 610, 620, 630, 640, 650, 660, 670, 680, 690: steps

第1圖為依據本發明一實施例之光軸鍵盤的示意圖。 Figure 1 is a schematic diagram of an optical axis keyboard according to an embodiment of the invention.

第2圖為依據本發明一實施例之複數個按鍵單元的示意圖。 Figure 2 is a schematic diagram of a plurality of key units according to an embodiment of the invention.

第3圖為依據本發明一實施例之光衰時間對照表。 Figure 3 is a light decay time comparison table according to an embodiment of the present invention.

第4圖為依據本發明一實施例之對光軸鍵盤進行光衰補償的工作流程。 Figure 4 is a working flow of light decay compensation for an optical axis keyboard according to an embodiment of the present invention.

第5圖為依據本發明一實施例之光軸鍵盤的示意圖。 Figure 5 is a schematic diagram of an optical axis keyboard according to an embodiment of the invention.

第6圖為依據本發明一實施例之對光軸鍵盤進行光衰補償的工作流程。 Figure 6 is a working flow of light decay compensation for an optical axis keyboard according to an embodiment of the present invention.

第1圖為依據本發明一實施例之光軸鍵盤100的示意圖,其中光軸鍵盤100可包含一按鍵陣列10、一控制器20、一記憶裝置30以及一計時器40,且按鍵陣列10可包含複數個按鍵單元諸如按鍵單元110以及對應的選擇電路諸如選擇電路120。在本實施例中,控制器20可耦接至按鍵陣列10中的按鍵單元110以及選擇電路120,且另耦接至記憶裝置30以及計時器40,其中控制器20可利用選擇電路120控制按鍵單元110輸出一輸出電壓(可稱為「PT電壓」,其中PT可表示此電壓為光電晶體的輸出電壓)至控制器20,但本發明不限於此。 Figure 1 is a schematic diagram of an optical axis keyboard 100 according to an embodiment of the present invention. The optical axis keyboard 100 can include a key array 10, a controller 20, a memory device 30, and a timer 40, and the key array 10 can A plurality of key units such as key unit 110 and corresponding selection circuits such as selection circuit 120 are included. In this embodiment, the controller 20 can be coupled to the key unit 110 and the selection circuit 120 in the key array 10, and is also coupled to the memory device 30 and the timer 40. The controller 20 can use the selection circuit 120 to control the keys. The unit 110 outputs an output voltage (which can be called "PT voltage", where PT can indicate that this voltage is the output voltage of the photoelectric crystal) to the controller 20, but the invention is not limited to this.

第2圖為依據本發明一實施例之複數個按鍵單元諸如按鍵單元110_1與110_2的示意圖,其中按鍵單元110_1與110_2中任一者可作為第1圖所示之按鍵單元110的例子,且按鍵單元110_1與110_2可分別耦接至光軸鍵盤100中的選擇電路120_1與120_2。按鍵單元110_1可包含一紅外光產生器諸如紅外光發光二極體(infrared Light-emitting diode,IR LED)112_1、一偵測元件諸如光電晶體(phototransistor)114_1、負載電阻116_1以及遮光板118_1,其中負載電阻116_1耦接於紅外光發光二極體112_1與選擇電路120_1之間;按鍵單元110_2可包含紅外光發光二極體112_2、光電晶體114_2、負載電阻116_2以及遮光板118_2,其中負載電阻116_2耦接於紅外光發光二極體112_2與選擇電路120_2之間;但本發明不限於此。舉例來說,光軸鍵盤100可為(30 * 6)的光軸鍵盤,即光軸鍵盤100可包含180個與按鍵單元110_1或110_2之架構類似的按鍵單元,相關領域者於閱讀以上說明後應可了解不同按鍵單元數量的架構,在此不贅述。 Figure 2 is a schematic diagram of a plurality of key units such as key units 110_1 and 110_2 according to an embodiment of the present invention, wherein any one of the key units 110_1 and 110_2 can be used as an example of the key unit 110 shown in Figure 1, and the keys The units 110_1 and 110_2 can be respectively coupled to the selection circuits 120_1 and 120_2 in the optical axis keyboard 100. The button unit 110_1 may include an infrared light generator such as an infrared light-emitting diode (IR LED) 112_1, a detection element such as a phototransistor 114_1, a load resistor 116_1, and a light-shielding plate 118_1. The load resistor 116_1 is coupled between the infrared light emitting diode 112_1 and the selection circuit 120_1; the key unit 110_2 may include an infrared light emitting diode 112_2, a photoelectric crystal 114_2, a load resistor 116_2, and a light shielding plate 118_2, wherein the load resistor 116_2 is coupled It is connected between the infrared light emitting diode 112_2 and the selection circuit 120_2; but the invention is not limited to this. For example, the optical axis keyboard 100 can be a (30*6) optical axis keyboard, that is, the optical axis keyboard 100 can include 180 key units similar in structure to the key unit 110_1 or 110_2. Those in the related field can read the above description after reading the above description. It should be possible to understand the structure of different button unit numbers, so I won't go into details here.

在本實施例中,由於按鍵單元110_1未被按下,其內的遮光板118_1不會被設置於紅外光發光二極體112_1與光電晶體114_1之間,而由於按鍵單元110_2被按下,其內的遮光板118_2會被設置於紅外光發光二極體112_2與光電晶體114_2之間,如此一來,當光軸鍵盤100依序對按鍵單元110_1與110_2進行掃描 時可依據輸出至輸出端子PT_OUT的電壓位準判斷對應的按鍵單元是否有被按下,其中輸出端子PT_OUT可耦接至第1圖所示之控制器20。例如,當光軸鍵盤開啟選擇電路120_1時,紅外光發光二極體112_1可產生紅外光,而光電晶體114_1可接收到112_1所產生的紅外光而導通,使得耦接至輸出端子PT_OUT的輸出端子PT1從一第一電壓位準(例如一高位準)被拉至一第二電壓位準(例如一低位準);當光軸鍵盤開啟選擇電路120_2時,紅外光發光二極體112_2可產生紅外光,而光電晶體114_2因遮光板118_2無法接收到112_2所產生的紅外光,使得耦接至輸出端子PT_OUT的輸出端子PT2維持在該第一電壓位準。換句話說,當輸出端子PT_OUT的電壓位準為該第一電壓位準,則表示對應的按鍵單元(例如按鍵單元110_2)有被按下,相對地,當輸出端子PT_OUT的電壓位準為該第二電壓位準,則表示對應的按鍵單元(例如按鍵單元110_1)未被按下。熟習此技藝者應可了解與光軸鍵盤100之運作相關的實施細節,為簡明起見,在此不贅述。 In this embodiment, since the key unit 110_1 is not pressed, the light-shielding plate 118_1 in it is not arranged between the infrared light emitting diode 112_1 and the photoelectric crystal 114_1, and because the key unit 110_2 is pressed, it The inner light-shielding plate 118_2 will be arranged between the infrared light emitting diode 112_2 and the photoelectric crystal 114_2, so that when the optical axis keyboard 100 scans the key units 110_1 and 110_2 in sequence At this time, it can be judged whether the corresponding button unit is pressed according to the voltage level output to the output terminal PT_OUT, wherein the output terminal PT_OUT can be coupled to the controller 20 shown in FIG. For example, when the optical axis keyboard turns on the selection circuit 120_1, the infrared light emitting diode 112_1 can generate infrared light, and the photoelectric crystal 114_1 can receive the infrared light generated by 112_1 and conduct, so that it is coupled to the output terminal of the output terminal PT_OUT PT1 is pulled from a first voltage level (for example, a high level) to a second voltage level (for example, a low level); when the optical axis keyboard turns on the selection circuit 120_2, the infrared light emitting diode 112_2 can generate infrared The photoelectric crystal 114_2 cannot receive the infrared light generated by 112_2 due to the light shielding plate 118_2, so that the output terminal PT2 coupled to the output terminal PT_OUT is maintained at the first voltage level. In other words, when the voltage level of the output terminal PT_OUT is the first voltage level, it means that the corresponding key unit (such as the key unit 110_2) has been pressed. On the other hand, when the voltage level of the output terminal PT_OUT is this The second voltage level indicates that the corresponding key unit (for example, the key unit 110_1) is not pressed. Those who are familiar with this art should be able to understand the implementation details related to the operation of the optical axis keyboard 100. For the sake of brevity, it will not be repeated here.

第3圖為依據本發明一實施例之光衰時間對照表300(例如:發光二極體製造商所提供的光衰時間對照表),其中光衰時間對照表300可指出紅外光發光二極體112_1與112_2隨累計使用時間的紅外光強度變化。如第3圖所示,紅外光發光二極體的紅外光強度會隨著時間逐漸衰減。為了避免按鍵單元110_1與110_2因其內的紅外光發光二極體112_1與112_2的光衰問題而失效,控制器20可依據光衰時間對照表300來控制紅外光發光二極體112_1與112_2的紅外光強度。 Figure 3 is a light decay time comparison table 300 according to an embodiment of the present invention (for example, a light decay time comparison table provided by a light-emitting diode manufacturer), where the light decay time comparison table 300 can indicate infrared light emitting diodes The infrared light intensity of the bodies 112_1 and 112_2 changes with the cumulative use time. As shown in Figure 3, the infrared light intensity of the infrared light emitting diode will gradually decay over time. In order to prevent the key units 110_1 and 110_2 from failing due to the light decay of the infrared light emitting diodes 112_1 and 112_2 in them, the controller 20 can control the infrared light emitting diodes 112_1 and 112_2 according to the light decay time comparison table 300 Infrared light intensity.

第4圖為依據本發明一實施例之對光軸鍵盤100進行光衰補償的工作流程400。本發明所提出的方法可依據光軸鍵盤100中的紅外光發光二極體112_1與112_2的累計使用時間,來調整供應給紅外光發光二極體112_1與112_2的電流大小,以補償紅外光發光二極體112_1與112_2的紅外光強度。 FIG. 4 is a work flow 400 for performing light attenuation compensation for the optical axis keyboard 100 according to an embodiment of the present invention. The method proposed in the present invention can adjust the current supplied to the infrared light emitting diodes 112_1 and 112_2 according to the cumulative use time of the infrared light emitting diodes 112_1 and 112_2 in the optical axis keyboard 100 to compensate for the infrared light emission The infrared light intensity of the diodes 112_1 and 112_2.

在步驟410中,光軸鍵盤100上電。 In step 410, the optical axis keyboard 100 is powered on.

在步驟420中,光軸鍵盤100中之控制器20可讀取一記憶裝置諸如記 憶裝置30(例如一快閃記憶體(flash memory))以取得光軸鍵盤100的使用時間資訊,其中該使用時間資訊指出該紅外光產生器的累計使用時間(例如:20000小時)。 In step 420, the controller 20 in the optical axis keyboard 100 can read a memory device such as a memory The memory device 30 (for example, a flash memory) is used to obtain the use time information of the optical axis keyboard 100, wherein the use time information indicates the cumulative use time of the infrared light generator (for example, 20,000 hours).

在步驟430中,基於一光衰時間對照表諸如第3圖所示之光衰時間對照表300,控制器20可依據該使用時間資訊取得光軸鍵盤100之光衰資訊(例如:相對功率為60%)。 In step 430, based on a light decay time comparison table such as the light decay time comparison table 300 shown in Figure 3, the controller 20 can obtain the light decay information of the optical axis keyboard 100 according to the use time information (for example, the relative power is 60%).

在步驟440中,控制器20可依據該光衰資訊來控制紅外光發光二極體112_1與112_2的紅外光強度,例如:將電流調整為1.67倍,如此一來,雖然紅外光發光二極體112_1與112_2的累計使用時間不停增加,其紅外光強度能維持一致而不會衰減。其中上述控制紅外光強度的機制並非對本發明之限制,例如,選擇電路120_1與120_2中每一者可包含一切換式電流源,以供應不同的電流大小;又例如,負載電阻116_1與116_2中每一者可包含一可變電阻,來調整紅外光發光二極體112_1與112_2的紅外光強度。熟習此技藝者應可了解各種針對紅外光強度的調整方法,在此不贅述。 In step 440, the controller 20 can control the infrared light intensity of the infrared light emitting diodes 112_1 and 112_2 according to the light attenuation information, for example, adjust the current to 1.67 times. In this way, although the infrared light emitting diodes The cumulative use time of 112_1 and 112_2 keeps increasing, and its infrared light intensity can maintain the same without attenuation. The above-mentioned mechanism for controlling the intensity of infrared light is not a limitation of the present invention. For example, each of the selection circuits 120_1 and 120_2 may include a switching current source to supply different current levels; for example, each of the load resistors 116_1 and 116_2 One may include a variable resistor to adjust the infrared light intensity of the infrared light emitting diodes 112_1 and 112_2. Those who are familiar with this art should be able to understand various adjustment methods for infrared light intensity, which will not be repeated here.

在步驟450中,控制器20可啟動光軸鍵盤100中的一計時器(諸如計時器40),以使得計時器40開始進行計時,也就是說,在光軸鍵盤100操作的期間,計時器40可產生該使用時間資訊以記錄該累計使用時間。 In step 450, the controller 20 may start a timer (such as timer 40) in the optical axis keyboard 100, so that the timer 40 starts timing, that is, during the operation of the optical axis keyboard 100, the timer 40 can generate the usage time information to record the accumulated usage time.

在步驟460中,光軸鍵盤100可進入正常的操作模式,例如:進行按鍵掃描取得按鍵指令。另外,在光軸鍵100操作的期間,控制器20可依據一特定時間週期來持續地更新儲存於記憶裝置30的該使用時間資訊,以供光軸鍵盤100下一次上電後能取得更新後的使用時間資訊。例如,控制器20每經過該特定時間週期(例如24分鐘)就從計時器40取得累計使用時間,以更新儲存於記憶裝置30的該使用時間資訊所記錄的累計使用時間。 In step 460, the optical axis keyboard 100 can enter a normal operation mode, for example, a key scan is performed to obtain a key command. In addition, during the operation of the optical axis key 100, the controller 20 can continuously update the use time information stored in the memory device 30 according to a specific time period, so that the optical axis keyboard 100 can obtain the updated information after the optical axis keyboard 100 is powered on next time. The usage time information of. For example, the controller 20 obtains the accumulated use time from the timer 40 every time the specific time period (for example, 24 minutes) elapses to update the accumulated use time recorded in the use time information stored in the memory device 30.

在某些實施例中,控制器20可依據一特定時間週期諸如上述特定時 間週期來動態地控制紅外光發光二極體112_1與112_2的紅外光強度,例如:每經過該特定時間週期(例如24分鐘),就讀取一次記憶裝置30以取得光軸鍵盤100的該使用時間資訊,尤指最新的使用時間資訊,並依據該最近的使用時間資訊來控制紅外光發光二極體112_1與112_2的紅外光強度,但本發明不限於此。 In some embodiments, the controller 20 can be based on a specific time period such as the above specific time. To dynamically control the infrared light intensity of the infrared light emitting diodes 112_1 and 112_2 during the time period, for example: every time the specific time period (for example, 24 minutes) passes, the memory device 30 is read once to obtain the use of the optical axis keyboard 100 The time information, especially the latest use time information, is used to control the infrared light intensity of the infrared light emitting diodes 112_1 and 112_2 according to the latest use time information, but the invention is not limited to this.

第5圖為依據本發明一實施例之光軸鍵盤500的示意圖,其中光軸鍵盤500可當作光軸鍵盤100的一個例子。如第5圖所示,控制器50可透過一電壓偵測電路52(例如:類比數位轉換電路)用來接收或偵測按鍵單元110所產生的一輸出電壓(諸如上述PT電壓),以供控制器50依據該輸出電壓值控制按鍵單元110中的紅外光產生器的紅外光強度(紅外光強度的增強量可稱為「IR補償段數」,其中IR表示紅外光)。 FIG. 5 is a schematic diagram of an optical axis keyboard 500 according to an embodiment of the present invention, where the optical axis keyboard 500 can be regarded as an example of the optical axis keyboard 100. As shown in FIG. 5, the controller 50 can receive or detect an output voltage (such as the above-mentioned PT voltage) generated by the key unit 110 through a voltage detection circuit 52 (for example, an analog-to-digital conversion circuit) for supplying The controller 50 controls the infrared light intensity of the infrared light generator in the key unit 110 according to the output voltage value (the enhancement amount of the infrared light intensity can be referred to as the "IR compensation stage number", where IR stands for infrared light).

Figure 107141646-A0305-02-0009-1
Figure 107141646-A0305-02-0009-1
Figure 107141646-A0305-02-0010-2
Figure 107141646-A0305-02-0010-2

表1為偵測到的PT電壓與對應的IR補償段數的對照表的例子,例如,當按鍵單元110所產生的PT電壓為0.2V,其代表按鍵單元110中的紅外光產生器的紅外光強度大於或等於一特定強度,無須進行補償;又例如,當按鍵單元110所產生的PT電壓為0.5V,其代表按鍵單元110中的紅外光產生器的紅外光強度所需的IR補償段數為3。 Table 1 is an example of the comparison table between the detected PT voltage and the corresponding IR compensation segment number. For example, when the PT voltage generated by the key unit 110 is 0.2V, it represents the infrared light of the infrared light generator in the key unit 110 The light intensity is greater than or equal to a specific intensity, no compensation is required; for another example, when the PT voltage generated by the key unit 110 is 0.5V, it represents the IR compensation section required by the infrared light intensity of the infrared light generator in the key unit 110 The number is 3.

在本實施例中,光軸鍵盤500上電後,控制器50(尤指其內的電壓偵測電路52)可接收到透過一偵測元件諸如按鍵單元110中的光電晶體(例如第2圖所示之光電晶體114_1或114_2)所產生的PT電壓,其中該PT電壓係依據按鍵單元110中的紅外光產生器(例如第2圖所示之紅外光發光二極體112_1或112_2)的紅外光強度所產生的一電壓值諸如,例如,在該紅外光強度尚未衰減,即其強度大於一預定強度,該電壓值可低於一預定電壓值(例如0.26V);又例如,該紅外光強度隨著時間衰減而低於該預定強度,該電壓值可高於該預定電壓值(例如0.26V);但本發明不限於此。控制器50可依據該PT電壓產生按鍵單元110中的紅外光產生器的補償資訊,其中該補償資訊可包含一補償強度段數IR_COMP、一異常標幟COMP_WARNING、一重新補償次數IR_RECOMP以及 一初始電壓值PT_INIT。在本實施例中,補償強度段數IR_COMP可表示紅外光強度的增強量(即段數),而初始電壓值PT_INIT可表示在未按下按鍵單元110時其內的光電晶體(例如第2圖所示之光電晶體114_1或114_2)所產生的PT電壓。在一補償運作中,異常標幟COMP_WARNING為真(true)可表示該補償運作為異常(例如:在按鍵單元110被按下時進行掃描,使得控制器50將此結果誤判為光衰所造成),而該異常標幟為假(false)則表示該補償運作為正常。另外,重新補償次數IR_RECOMP可表示該補償運作為異常的連續次數,例如:當該PT電壓所對應到的IR補償段數超過一預定調整段數(例如IR補償段數為5,而該預定調整段數為3),控制器50可先依據該預定調整段數進行補償(或者先不調整段數)並且將重新補償次數IR_RECOMP增加一次。完成一次補償運作後,控制器50可將該補償資訊儲存(或更新)至一記憶裝置(諸如記憶裝置30)中,而光軸鍵盤500即可依據該補償資訊增強按鍵單元110的紅外光強度已進行正常運作諸如鍵盤輸入操作。 In this embodiment, after the optical axis keyboard 500 is powered on, the controller 50 (especially the voltage detection circuit 52 therein) can receive the signal through a detection element such as the photoelectric crystal in the key unit 110 (for example, FIG. 2 The PT voltage generated by the photoelectric crystal 114_1 or 114_2 shown in the figure, where the PT voltage is based on the infrared light generated by the infrared light generator in the key unit 110 (for example, the infrared light emitting diode 112_1 or 112_2 shown in Figure 2) A voltage value generated by the light intensity such as, for example, before the infrared light intensity has not attenuated, that is, its intensity is greater than a predetermined intensity, the voltage value may be lower than a predetermined voltage value (for example, 0.26V); another example, the infrared light The intensity decays with time and is lower than the predetermined intensity, and the voltage value may be higher than the predetermined voltage value (for example, 0.26V); but the present invention is not limited to this. The controller 50 can generate compensation information for the infrared light generator in the key unit 110 according to the PT voltage, where the compensation information can include a compensation intensity segment IR_COMP, an abnormality flag COMP_WARNING, a recompensation number IR_RECOMP, and An initial voltage value PT_INIT. In this embodiment, the number of compensation intensity segments IR_COMP can represent the enhancement of infrared light intensity (that is, the number of segments), and the initial voltage value PT_INIT can represent the photoelectric crystal in it when the button unit 110 is not pressed (for example, Figure 2 The shown photoelectric crystal 114_1 or 114_2) generates the PT voltage. In a compensation operation, if the abnormal flag COMP_WARNING is true (true), it can indicate that the compensation operation is abnormal (for example, scanning is performed when the button unit 110 is pressed, so that the controller 50 misjudges the result as caused by light attenuation) , And the abnormal flag is false (false) means that the compensation operation is normal. In addition, the number of recompensation IR_RECOMP can indicate the number of consecutive times that the compensation operation is abnormal. For example, when the number of IR compensation stages corresponding to the PT voltage exceeds a predetermined number of adjustment stages (for example, the number of IR compensation stages is 5, and the predetermined adjustment The number of segments is 3), and the controller 50 can first perform compensation according to the predetermined adjustment number of segments (or not adjust the number of segments first) and increase the number of recompensation IR_RECOMP by one. After completing a compensation operation, the controller 50 can store (or update) the compensation information in a memory device (such as the memory device 30), and the optical axis keyboard 500 can enhance the infrared light intensity of the key unit 110 according to the compensation information Normal operations such as keyboard input operations have been performed.

請注意,上述補償運作可分別針對光軸鍵盤500中的全部按鍵單元來進行,舉例來說,上述全部按鍵單元均可具有各自的補償資訊以分別進行補償運作,相關領域者於閱讀以上說明後應可了解將上述補償運作類推到全部按鍵單元的實施方式,在此不贅述。為簡明起見,後續實施細節均以單一按鍵單元(諸如按鍵單元110)為例來說明。 Please note that the above compensation operations can be performed on all the key units in the optical axis keyboard 500. For example, all the above key units can have their own compensation information to perform the compensation operations separately. Those in the related field should read the above description after reading the above description. It should be understood that the above-mentioned compensation operation is analogous to the implementation of all key units, and will not be repeated here. For the sake of brevity, the subsequent implementation details are all described with a single key unit (such as the key unit 110) as an example.

在某些實施例中,上述補償運作可能因為光軸鍵盤500被使用者誤按,使得控制器50接收到的PT電壓異常地高於初始電壓值PT_INIT,為了避免控制器50誤認為按鍵單元110需要以非常高的調整量(諸如表1所示之IR補償段數的段數調整量)來進行補償,控制器50需連續地接收到異常地高於初始電壓值PT_INIT的PT電壓多次才會以對應於此PT電壓的調整量進行補償。 In some embodiments, the above compensation operation may be because the optical axis keyboard 500 is mistakenly pressed by the user, so that the PT voltage received by the controller 50 is abnormally higher than the initial voltage value PT_INIT, in order to prevent the controller 50 from mistaking the key unit 110 It needs to be compensated with a very high adjustment amount (such as the adjustment amount of the IR compensation stage number shown in Table 1). The controller 50 needs to continuously receive the PT voltage abnormally higher than the initial voltage value PT_INIT many times before It will be compensated with the adjustment amount corresponding to this PT voltage.

舉例來說,控制器50接收到的PT電壓為0.3V,其大於按鍵單元110 的初始電壓值PT_INIT(例如0.26V),控制器50可依據該電壓值與該初始電壓值之間的差距調整該補償強度段數(例如,依據表1可判斷其對應的IR補償段數為1),由於此調整量(1段)小於一預定調整段數(例如3段),控制器50可依據此調整量調整該補償強度段數IR_COMP(例如從段數1增加為段數2)。 For example, the PT voltage received by the controller 50 is 0.3V, which is greater than the key unit 110 The initial voltage value PT_INIT (for example, 0.26V), the controller 50 can adjust the number of compensation intensity segments according to the difference between the voltage value and the initial voltage value (for example, according to Table 1, it can be judged that the corresponding IR compensation segment number is 1) Since the adjustment amount (1 stage) is less than a predetermined adjustment stage number (for example, 3 stages), the controller 50 can adjust the compensation intensity stage number IR_COMP according to the adjustment amount (for example, increase from stage number 1 to stage number 2) .

又例如,控制器50接收到的PT電壓為0.9V,其大於按鍵單元110的初始電壓值PT_INIT(例如0.26V),控制器50可依據該電壓值與該初始電壓值PT_INIT之間的差距調整補償強度段數IR_COMP(例如,依據表1可判斷其對應的IR補償段數為7),由於此調整量(7段)大於該預定調整段數(例如3段),控制器50在此次補償運作可依據該預定調整段數(3段)來調整補償強度段數IR_COMP,而不是依據此調整量(7段)來調整,或者,控制器50在此次補償運作可先不進行調整,並且將此次補償運作視為異常(例如將異常標幟COMP_WARNING設為「真」),而將重新補償次數IR_RECOMP增加一次,但本發明不限於此。 For another example, the PT voltage received by the controller 50 is 0.9V, which is greater than the initial voltage value PT_INIT (for example, 0.26V) of the key unit 110, and the controller 50 can adjust according to the difference between the voltage value and the initial voltage value PT_INIT The number of compensation intensity segments IR_COMP (for example, it can be judged that the corresponding IR compensation segment number is 7 according to Table 1). Since this adjustment amount (7 segments) is greater than the predetermined number of adjustment segments (for example, 3 segments), the controller 50 is The compensation operation can adjust the compensation intensity IR_COMP according to the predetermined number of adjustment steps (3 steps), instead of adjusting according to the adjustment value (7 steps), or the controller 50 may not make adjustments during this compensation operation. And this compensation operation is regarded as abnormal (for example, the abnormal flag COMP_WARNING is set to "true"), and the number of recompensation IR_RECOMP is increased by one, but the present invention is not limited to this.

再舉一例,依據控制器50所收到的PT電壓與該初始電壓值PT_INIT之間的差距所決定的調整量已連續多次地大於該預定調整段數,換句話說,重新補償次數IR_RECOMP已達到一預定次數(例如三次),控制器50即可將此次補償運作視為正常(並非按鍵誤按所造成)並將異常標幟COMP_WARNING設為「假(false)」,以依據此調整量調整補償強度段數IR_COMP。 For another example, the adjustment amount determined according to the difference between the PT voltage received by the controller 50 and the initial voltage value PT_INIT has been continuously greater than the predetermined number of adjustment stages, in other words, the number of recompensation IR_RECOMP has been When a predetermined number of times (for example, three times) is reached, the controller 50 can regard the compensation operation as normal (not caused by a wrong key press) and set the abnormal flag COMP_WARNING to "false" to adjust the amount based on this Adjust the number of compensation intensity segments IR_COMP.

第6圖為依據本發明一實施例之對光軸鍵盤500進行光衰補償的工作流程600,需注意的是,只要不妨礙本發明的實施,一或多個步驟可於工作流程600中被修改、新增或刪除。 Figure 6 is a work flow 600 for performing light attenuation compensation on the optical axis keyboard 500 according to an embodiment of the present invention. It should be noted that as long as the implementation of the present invention is not hindered, one or more steps can be used in the work flow 600. Modify, add or delete.

在步驟610中,光軸鍵盤500上電。 In step 610, the optical axis keyboard 500 is powered on.

在步驟620中,控制器50可接收按鍵單元110的PT電壓,其中該PT電壓係依據按鍵單元110中之一紅外光產生器(例如第2圖所示之紅外光發光二極 體112_1或112_2)之紅外光強度所產生。 In step 620, the controller 50 may receive the PT voltage of the key unit 110, where the PT voltage is based on one of the infrared light generators in the key unit 110 (for example, the infrared light emitting diode shown in Figure 2 Body 112_1 or 112_2) generated by the infrared light intensity.

在步驟630中,控制器50可判斷該PT電壓是否大於初始電壓值PT_INIT,若是,進入步驟640;否則,進入步驟660。 In step 630, the controller 50 may determine whether the PT voltage is greater than the initial voltage value PT_INIT, if yes, go to step 640; otherwise, go to step 660.

在步驟640中,控制器50可判斷該PT電壓所對應的調整量(例如表1所示之IR補償段數)是否大於一預定調整段數,若是(例如IR補償段數為5而該預定調整段數為3),進入步驟650;否則(例如IR補償段數為2而該預定調整段數為3),進入步驟670。 In step 640, the controller 50 may determine whether the adjustment amount corresponding to the PT voltage (for example, the number of IR compensation stages shown in Table 1) is greater than a predetermined number of adjustment stages, if so (for example, the number of IR compensation stages is 5 and the predetermined If the number of adjustment stages is 3), go to step 650; otherwise (for example, the number of IR compensation stages is 2 and the predetermined number of adjustment stages is 3), go to step 670.

在步驟650中,控制器50可判斷按鍵單元110的重新補償次數IR_RECOMP是否達到一預定次數,若是,進入步驟690;否則,進入步驟680。 In step 650, the controller 50 can determine whether the number of recompensation IR_RECOMP of the key unit 110 reaches a predetermined number, if yes, go to step 690; otherwise, go to step 680.

在步驟660中,由於該PT電壓值不大於初始電壓值PT_INIT,控制器50不需調整補償強度段數IR_COMP即可讓光軸鍵盤500進入正常模式進行按鍵輸入。 In step 660, since the PT voltage value is not greater than the initial voltage value PT_INIT, the controller 50 does not need to adjust the compensation intensity segment IR_COMP to allow the optical axis keyboard 500 to enter the normal mode for key input.

在步驟670中,由於步驟640中所述之調整量不大於該預定調整段數(例如IR補償段數為2而該預定調整段數為3),控制器50可依據該調整量調整補償強度段數IR_COMP(例如:增加2段)。 In step 670, since the adjustment amount described in step 640 is not greater than the predetermined number of adjustment stages (for example, the number of IR compensation stages is 2 and the predetermined number of adjustment stages is 3), the controller 50 may adjust the compensation intensity according to the adjustment amount Number of segments IR_COMP (for example: add 2 segments).

在步驟680中,由於步驟650中所述之重新補償次數IR_RECOMP不大於該預定次數,例如重新補償次數IR_RECOMP為兩次而該預定次數為三次,控制器50可將此次補償運作視為異常,並依據步驟640所述之預定補償段數來調整補償強度段數IR_COMP(例如:增加3段)。 In step 680, since the number of re-compensation IR_RECOMP described in step 650 is not greater than the predetermined number, for example, the number of re-compensation IR_RECOMP is two and the predetermined number is three, the controller 50 can treat this compensation operation as abnormal, The number of compensation intensity segments IR_COMP is adjusted according to the predetermined number of compensation segments described in step 640 (for example, 3 segments are added).

在步驟690中,由於重新補償次數IR_RECOM已達到步驟650所述之預定次數,控制器50可將此次補償運作視為正常,並依據步驟640所述之調整量來調整補償強度段數IR_COMP(例如:增加5段)。 In step 690, since the number of re-compensation IR_RECOM has reached the predetermined number described in step 650, the controller 50 can regard this compensation operation as normal, and adjust the number of compensation intensity segments IR_COMP( For example: add 5 paragraphs).

總結來說,本發明所提出的光衰補償方法能依據按鍵單元中的紅外光產生器的紅外光強度衰減狀況來進行相關的補償運作,此外,依據本發明所 提供的實施例來實施不會增加許多成本,因此,本發明能在沒有副作用或較不會帶來副作用的情況下,解決光軸鍵盤因光衰而造成的按鍵失效問題。以上所述僅為本發明之較佳實施例,凡依本發明申請專利範圍所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。 In summary, the light attenuation compensation method proposed in the present invention can perform related compensation operations according to the infrared light intensity attenuation of the infrared light generator in the key unit. In addition, according to the present invention The implementation of the provided embodiments will not increase a lot of costs. Therefore, the present invention can solve the problem of key failure of the optical axis keyboard due to light decay without side effects or less side effects. The foregoing descriptions are only preferred embodiments of the present invention, and all equivalent changes and modifications made in accordance with the scope of the patent application of the present invention shall fall within the scope of the present invention.

100:光軸鍵盤 100: Optical axis keyboard

10:按鍵陣列 10: Button array

20:控制器 20: Controller

30:記憶裝置 30: memory device

40:計時器 40: timer

110:按鍵單元 110: Button unit

120:選擇電路 120: select circuit

Claims (10)

一種對一光軸鍵盤進行光衰補償的方法,其中該光軸鍵盤包含複數個按鍵單元,該複數個按鍵單元中之任一按鍵單元包含一紅外光產生器,且該方法包含:讀取一記憶裝置以取得該光軸鍵盤的使用時間資訊,其中該使用時間資訊指出該紅外光產生器的累計使用時間;基於一光衰時間對照表,依據該使用時間資訊取得該光軸鍵盤之光衰資訊,其中該光衰時間對照表指出該紅外線產生器隨累計使用時間的紅外光強度變化;以及依據該光衰資訊,控制該紅外光產生器之紅外光強度。 A method for compensating for light decay of an optical axis keyboard, wherein the optical axis keyboard includes a plurality of key units, any one of the plurality of key units includes an infrared light generator, and the method includes: reading a The memory device is used to obtain the usage time information of the optical axis keyboard, wherein the usage time information indicates the cumulative usage time of the infrared light generator; based on a light decay time comparison table, the light decay of the optical axis keyboard is obtained according to the usage time information Information, wherein the light decay time comparison table indicates the infrared light intensity change of the infrared generator with the cumulative use time; and according to the light decay information, the infrared light intensity of the infrared light generator is controlled. 如申請專利範圍第1項所述之方法,另包含:在該光軸鍵盤操作的期間,利用一計時器產生該使用時間資訊,並將該使用時間資訊儲存於該記憶裝置中;以及在該光軸鍵盤操作的期間,每經過一特定時間週期就更新一次儲存於該記憶裝置中之該使用時間資訊。 For example, the method described in item 1 of the scope of patent application further includes: during the operation of the optical axis keyboard, using a timer to generate the use time information, and store the use time information in the memory device; and During the operation of the optical axis keyboard, the use time information stored in the memory device is updated every time a specific time period passes. 如申請專利範圍第2項所述之方法,其中讀取該記憶裝置以取得該光軸鍵盤的該使用時間資訊之步驟另包含:每經過該特定時間週期就讀取一次該記憶裝置以取得該光軸鍵盤的該使用時間資訊。 For the method described in item 2 of the scope of patent application, the step of reading the memory device to obtain the usage time information of the optical axis keyboard further comprises: reading the memory device every time the specific time period elapses to obtain the The use time information of the optical axis keyboard. 一種對一光軸鍵盤進行光衰補償的方法,其中該光軸鍵盤包含複數個按鍵單元,該複數個按鍵單元中之任一按鍵單元包含一紅外光產生器以 及一偵測元件,且該方法包含:在該光軸鍵盤上電後且尚未開始進行正常運作時,透過該偵測元件依據該紅外光產生器所產生之紅外光強度產生一電壓值;依據該電壓值產生該紅外光產生器的補償資訊,其中該補償資訊的至少一部分係用來判斷該按鍵單元是否被誤按;將該補償資訊儲存至一記憶裝置中;以及在該光軸鍵盤進行正常運作時,依據該補償資訊增強該紅外光強度。 A method for performing light attenuation compensation for an optical axis keyboard, wherein the optical axis keyboard includes a plurality of key units, and any one of the plurality of key units includes an infrared light generator to And a detection element, and the method includes: after the optical axis keyboard is powered on and has not yet started normal operation, generating a voltage value based on the intensity of the infrared light generated by the infrared light generator through the detection element; The voltage value generates the compensation information of the infrared light generator, wherein at least a part of the compensation information is used to determine whether the key unit is pressed by mistake; the compensation information is stored in a memory device; and the optical axis keyboard is performed In normal operation, the intensity of the infrared light is enhanced according to the compensation information. 一種對一光軸鍵盤進行光衰補償的方法,其中該光軸鍵盤包含複數個按鍵單元,該複數個按鍵單元中之任一按鍵單元包含一紅外光產生器以及一偵測元件,且該方法包含:在該光軸鍵盤上電後,透過該偵測元件依據該紅外光產生器所產生之紅外光強度產生一電壓值;依據該電壓值產生該紅外光產生器的補償資訊;將該補償資訊儲存至一記憶裝置中;以及在該光軸鍵盤進行正常運作時,依據該補償資訊增強該紅外光強度;其中該補償資訊包含:一補償強度段數,表示該紅外光強度的增強量;一異常標幟,其中在一補償運作中,該異常標幟為真(true)表示該補償運作為異常,而該異常標幟為假(false)則表示該補償運作為正常;一重新補償次數,表示該補償運作為異常的連續次數;以及一初始電壓值,表示在未按下該按鍵單元時該偵測元件所產生之電壓位準。 A method for performing light attenuation compensation for an optical axis keyboard, wherein the optical axis keyboard includes a plurality of key units, any one of the plurality of key units includes an infrared light generator and a detection element, and the method It includes: after the optical axis keyboard is powered on, a voltage value is generated according to the intensity of the infrared light generated by the infrared light generator through the detecting element; the compensation information of the infrared light generator is generated according to the voltage value; the compensation Information is stored in a memory device; and when the optical axis keyboard is operating normally, the infrared light intensity is enhanced according to the compensation information; wherein the compensation information includes: a compensation intensity segment, which represents the amount of enhancement of the infrared light intensity; An abnormal flag, where in a compensation operation, the abnormal flag is true (true) indicates that the compensation operation is abnormal, and the abnormal flag is false (false) indicates that the compensation operation is normal; a number of re-compensation , Indicates the number of consecutive times that the compensation operation is abnormal; and an initial voltage value, indicates the voltage level generated by the detection element when the button unit is not pressed. 如申請專利範圍第5項所述之方法,其中依據該電壓值產生該紅外光產生器的補償資訊之步驟包含:當該電壓值大於該初始電壓值,依據該電壓值與該初始電壓值之間的差距調整該補償強度段數。 For the method described in item 5 of the patent application, the step of generating compensation information of the infrared light generator according to the voltage value includes: when the voltage value is greater than the initial voltage value, based on the difference between the voltage value and the initial voltage value Adjust the number of segments of the compensation intensity. 如申請專利範圍第6項所述之方法,其中依據該電壓值與該初始電壓值之間的差距調整該補償強度段數之步驟包含:當該電壓值與該初始電壓值之間的差距所對應的調整量小於一預定調整段數時,依據該調整量調整該補償強度段數。 The method described in item 6 of the scope of patent application, wherein the step of adjusting the number of compensation intensity segments according to the difference between the voltage value and the initial voltage value includes: when the difference between the voltage value and the initial voltage value is When the corresponding adjustment amount is less than a predetermined number of adjustment stages, the number of compensation intensity stages is adjusted according to the adjustment amount. 如申請專利範圍第6項所述之方法,其中依據該電壓值與該初始電壓值之間的差距調整該補償強度段數之步驟包含:當該電壓值與該初始電壓值之間的差距所對應的調整量大於一預定調整段數時,依據該重新補償次數判斷是否以該調整量調整該補償強度段數。 The method described in item 6 of the scope of patent application, wherein the step of adjusting the number of compensation intensity segments according to the difference between the voltage value and the initial voltage value includes: when the difference between the voltage value and the initial voltage value is When the corresponding adjustment amount is greater than a predetermined number of adjustment stages, it is determined whether to adjust the number of compensation intensity stages with the adjustment amount according to the re-compensation times. 如申請專利範圍第8項所述之方法,其中依據該重新補償次數判斷是否以該調整量調整該補償強度段數之步驟包含:當該重新補償次數達到一預定次數時,依據該調整量調整該補償強度段數。 For example, the method described in item 8 of the scope of patent application, wherein the step of judging whether to adjust the compensation intensity segment number by the adjustment amount according to the number of re-compensation includes: when the number of re-compensation reaches a predetermined number, adjust according to the adjustment amount The number of compensation intensity segments. 如申請專利範圍第8項所述之方法,其中依據該重新補償次數判斷是否以該調整量調整該補償強度段數之步驟包含:當該重新補償次數未達到該預定次數時,依據該預定調整段數調整該補償 強度段數。 For example, the method described in item 8 of the scope of patent application, wherein the step of judging whether to adjust the compensation intensity segment number by the adjustment amount according to the number of recompensation includes: when the number of recompensation does not reach the predetermined number, adjust according to the predetermined number Adjust the compensation Number of intensity segments.
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