TWI676151B - Method and apparatus for improving accuracy of point clouds - Google Patents

Method and apparatus for improving accuracy of point clouds Download PDF

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Publication number
TWI676151B
TWI676151B TW107119450A TW107119450A TWI676151B TW I676151 B TWI676151 B TW I676151B TW 107119450 A TW107119450 A TW 107119450A TW 107119450 A TW107119450 A TW 107119450A TW I676151 B TWI676151 B TW I676151B
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point
point clouds
point cloud
known points
points
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TW107119450A
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TW202001794A (en
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蕭震洋
Cheng-Yang Hsiao
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財團法人中興工程顧問社
Sinotech Engineering Consultants, Inc.
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Abstract

一種用來提升點雲精度之方法與裝置,該方法包含:將一測區中之多群點雲輸入該裝置;選擇兩組已知點,其中該兩組已知點係相異且均勻地分布於該測區;剔除空間差量位於一容許範圍之外的點雲;以座標轉換降低系統誤差,並剔除空間差量位於另一容許範圍之外的點雲;以及對未被剔除的點雲進行權數分配以合併該些點雲。 A method and device for improving the accuracy of a point cloud. The method includes: inputting a plurality of groups of point clouds in a measurement area into the device; selecting two sets of known points, wherein the two sets of known points are different and uniform. Point clouds with spatial differences outside an allowable range; coordinate transformation to reduce system errors and elimination of point clouds with spatial differences outside another allowable range; and points that are not excluded The clouds assign weights to merge the point clouds.

Description

用來提升點雲精度之方法與裝置 Method and device for improving accuracy of point cloud

本發明係關於點雲的處理,尤指一種用來提升點雲精度之方法與裝置。 The invention relates to the processing of point clouds, in particular to a method and device for improving the accuracy of point clouds.

點雲可透過影像對視差或電磁波發射及接收計算等兩種方式產生。已知影像視差計算所得之點雲精度受限於取像設備本身、影像品質、拍攝影像交會角度、照片密度、觀測物體的角度、物體表面平整程度等等;而電磁波發射及接收計算所得點雲精度受限於電磁波發射接受設備、定位設備或環境干擾。故以往增加精度,會從改良儀器、設法控制實驗環境或訓練操作者處理。但在現實環境,更好的儀器設備數量少及需要更多費用,故需要一種使用原儀器而能提升精度的方法與裝置。 Point clouds can be generated by image parallax or calculation of electromagnetic wave transmission and reception. The accuracy of the point cloud calculated from the known image parallax is limited by the imaging equipment itself, the image quality, the intersection angle of the captured image, the photo density, the angle of the observed object, the level of the surface of the object, and so on; and the calculated point cloud of the electromagnetic wave emission and reception Accuracy is limited by electromagnetic wave transmitting and receiving equipment, positioning equipment or environmental interference. Therefore, in the past, increasing accuracy would involve improving the instrument, trying to control the experimental environment, or training the operator. However, in the real environment, the number of better instruments and equipment is small and more costs are needed. Therefore, a method and device that can improve the accuracy by using the original instruments are needed.

本發明之一目的在於提供一種用來提升點雲精度之方法與裝置,以解決上述問題。 An object of the present invention is to provide a method and device for improving the accuracy of a point cloud, so as to solve the above problems.

本發明之另一目的在於提供一種用來提升點雲精度之方法與裝置,以在沒有副作用或較不可能帶來副作用之狀況下提升點雲精度。 Another object of the present invention is to provide a method and a device for improving the accuracy of a point cloud, so as to improve the accuracy of the point cloud without side effects or less likely to cause side effects.

本發明之至少一實施例提供一種用來提升點雲精度之方法。該方法可包含:(a)輸入於一測區中之多群點雲;(b)選擇該多群點雲中之每一者與一參考座標之間的一座標轉換方式;(c)選擇一組第一已知點以及異於該組第一已 知點的一組第二已知點,其中該組第一已知點包含於一參考座標上的多個第一已知點以及於該多群點雲中之每一者的該多個第一已知點,且該組第二已知點包含於該參考座標上的多個第二已知點以及於該多群點雲中之每一者的該多個第二已知點;(d)分別計算該多個點雲中的每一者的該多個第一已知點與該參考座標上的該多個第一已知點之間的空間差量,當一點雲中的該多個第一已知點的任一者的空間差量位於一第一容許範圍之外,則剔除該點雲,並依據步驟(b)中所選擇之該座標轉換方式,分別將未被剔除之點雲轉換至該參考座標以產生轉換後點雲;(e)依據步驟(b)中所選擇之該座標轉換方式,分別將該多個點雲轉換至該參考座標以產生該些轉換後點雲,並分別計算該些轉換後點雲中的每一者的該多個第一已知點與該參考座標上的該多個第一已知點之間的空間差量,當一轉換後點雲中的該多個第一已知點的任一者的空間差量位於一第二容許範圍之外,則剔除該轉換後點雲;(f)收集於步驟(d)與步驟(e)中未被剔除之該些轉換後點雲以作為剩餘轉換後點雲;以及(g)分別計算該些剩餘轉換後點雲之每一者的該多個第二已知點與該參考座標上的該多個第二已知點之間的空間差量,當一剩餘轉換後點雲中的該多個第二已知點的任一者的空間差量位於一第三容許範圍之外,則剔除該些剩餘轉換後點雲。 At least one embodiment of the present invention provides a method for improving the accuracy of a point cloud. The method may include: (a) multi-group point clouds input in a measurement area; (b) selecting a coordinate conversion mode between each of the multi-group point clouds and a reference coordinate; (c) selecting A set of first known points A set of second known points of known points, wherein the set of first known points includes a plurality of first known points on a reference coordinate and the plurality of first known points in each of the multi-point cloud A known point, and the set of second known points includes a plurality of second known points on the reference coordinate and the plurality of second known points in each of the clusters of point clouds; ( d) Calculate the spatial difference between the first plurality of known points of each of the plurality of point clouds and the plurality of first known points on the reference coordinate, respectively. The spatial difference of any one of the plurality of first known points is outside a first allowable range, then the point cloud is eliminated, and according to the coordinate conversion method selected in step (b), it is not removed respectively. The point cloud is converted to the reference coordinate to generate a converted point cloud; (e) According to the coordinate conversion method selected in step (b), the plurality of point clouds are respectively converted to the reference coordinate to generate the converted points. Point cloud, and respectively calculate the number of the plurality of first known points of each of the converted point clouds and the plurality of first known points on the reference coordinate The spatial difference of any of the plurality of first known points in a converted point cloud is outside a second allowable range, the converted point cloud is excluded; (f) collection The converted point clouds not removed in steps (d) and (e) are used as the remaining converted point clouds; and (g) the plurality of each of the remaining converted point clouds are respectively calculated. The spatial difference between the second known point and the plurality of second known points on the reference coordinate, and the spatial difference between any of the plurality of second known points in the point cloud after a residual transformation If the quantity is outside a third allowable range, then the remaining transformed point clouds are excluded.

本發明之至少一實施例提供一種依據上述之方法來運作之分析裝置。該分析裝置可包含一處理電路,用來執行對應於該方法之一組程式碼,以控制該分析裝置依據該方法來運作。 At least one embodiment of the present invention provides an analysis device that operates according to the method described above. The analysis device may include a processing circuit for executing a set of codes corresponding to the method to control the analysis device to operate according to the method.

本發明的好處之一是,本發明能針對點雲本身來提高其精度,並且依據不同的設定,有效地提高點雲的精度或給予重新施測的建議。另外,依據本發明之相關實施例來實施並不會增加許多額外的成本。因此,相關技術的問題可被解決,且整體成本不會增加太多。相較於相關技術,本發明能在沒有副作用或較不可能帶來副作用之狀況下提升點雲精度。 One of the advantages of the present invention is that the present invention can improve the accuracy of the point cloud itself, and effectively improve the accuracy of the point cloud or give suggestions for re-testing according to different settings. In addition, implementation in accordance with the related embodiments of the present invention does not add many additional costs. Therefore, the problems of related technologies can be solved without the overall cost increasing too much. Compared with the related art, the present invention can improve the accuracy of the point cloud without any side effects or less likely to cause side effects.

100‧‧‧分析裝置 100‧‧‧analytical device

110‧‧‧處理電路 110‧‧‧Processing circuit

112C‧‧‧程式碼 112C‧‧‧Code

120‧‧‧儲存裝置 120‧‧‧Storage device

2000‧‧‧工作流程 2000‧‧‧Workflow

2100,2200‧‧‧子流程 2100, 2200 ‧‧‧ Sub-process

202,204,206,208,210,212,214,216,218,220,222,224,226,228,230,232,234,236‧‧‧步驟 202,204,206,208,210,212,214,216,218,220,222,224,226,228,230,232,234,236‧‧‧‧

300‧‧‧參考座標 300‧‧‧ reference coordinates

3101,3102,3103,3104,3105,3106,3107,...,310n,4101,4102,4103,4104,4105,4106,4107,4108,4109,41010,...,410n‧‧‧點雲 310 1 , 310 2 , 310 3 , 310 4 , 310 5 , 310 6 , 310 7 , ..., 310 n , 410 1 , 410 2 , 410 3 , 410 4 , 410 5 , 410 6 , 410 7 , 410 8 , 410 9 , 410 10 , ..., 410 n ‧‧‧point cloud

Ar1,Ar2,Ar3,Br1,Br2,Br3,A1,1,A1,2,A1,3,B1,1,B1,2,B1,3,A2,1,A2,2,A2,3,B2,1,B2,2,B2,3,...,An,1,An,2,An,3,Bn,1,Bn,2,Bn,3,Ar1,1,Ar1,2,Ar1,3,Br1,1,Br1,2,Br1,3,Ar2,1,Ar2,2,Ar2,3,Br2,1,Br2,2,Br2,3,...,Arn,1,Arn,2,Arn,3,Brn,1,Brn,2,Brn,3‧‧‧已知點 Ar 1 , Ar 2 , Ar 3 , Br 1 , Br 2 , Br 3 , A 1,1 , A 1,2 , A 1,3 , B 1,1 , B 1,2 , B 1,3 , A 2 , 1 , A 2,2 , A 2,3 , B 2,1 , B 2,2 , B 2,3 , ..., A n, 1 , A n, 2 , A n, 3 , B n, 1 , B n, 2 , B n, 3 , Ar 1,1 , Ar 1,2 , Ar 1,3 , Br 1,1 , Br 1,2 , Br 1,3 , Ar 2,1 , Ar 2, 2 , Ar 2,3 , Br 2,1 , Br 2,2 , Br 2,3 , ..., Ar n, 1 , Ar n, 2 , Ar n, 3 , Br n, 1 , Br n, 2 , Br n, 3 ‧‧‧known points

第1圖為依據本發明一實施例之一分析裝置的示意圖。 FIG. 1 is a schematic diagram of an analysis device according to an embodiment of the present invention.

第2圖為該方法於本發明一實施例之工作流程的流程圖。 FIG. 2 is a flowchart of the working process of the method in an embodiment of the present invention.

第3圖為依據本發明一實施例之第2圖所示之工作流程中的一子流程。 FIG. 3 is a sub-flow of the workflow shown in FIG. 2 according to an embodiment of the present invention.

第4圖為依據本發明一實施例之第2圖所示之工作流程中的一子流程。 FIG. 4 is a sub-flow in the workflow shown in FIG. 2 according to an embodiment of the present invention.

第5圖為依據本發明一實施例之多群點雲及一參考座標的示意圖。 FIG. 5 is a schematic diagram of a multi-group point cloud and a reference coordinate according to an embodiment of the present invention.

第6圖為依據本發明一實施例之多群轉換後點雲於該參考座標的示意圖。 FIG. 6 is a schematic diagram of a point cloud at the reference coordinate after multi-group conversion according to an embodiment of the present invention.

第7圖為依據本發明一實施例之透過將未被剔除之點雲轉換至該參考座標所產生之轉換後點雲的示意圖。 FIG. 7 is a schematic diagram of a converted point cloud generated by converting an unremoved point cloud to the reference coordinate according to an embodiment of the present invention.

第8圖為依據本發明一實施例之剩餘轉換後點雲於該參考座標上的示意圖。 FIG. 8 is a schematic diagram of the remaining transformed point cloud on the reference coordinate according to an embodiment of the present invention.

第1圖為依據本發明一實施例之一分析裝置100的示意圖。分析裝置100可包含一處理電路110(其可包含至少一處理器、記憶體、晶片組...等,且上述支元件的至少一部分(例如一部分或全部)可透過匯流排彼此耦接)與至少一儲存裝置120(例如一或多個儲存裝置,諸如可攜式記憶裝置、固態硬碟及/或各種嵌入式儲存裝置)。尤其是,處理電路110可用來執行一組程式碼112C以控制分析裝置100依據本發明所提出之方法來運作,但本發明不限於此。分析裝置100的例子可包含(但不限於):個人電腦(諸如桌上型電腦與膝上型電腦)以及伺服器。 FIG. 1 is a schematic diagram of an analysis apparatus 100 according to an embodiment of the present invention. The analysis device 100 may include a processing circuit 110 (which may include at least a processor, a memory, a chipset, etc., and at least a part (for example, a part or all) of the branch components may be coupled to each other through a bus) and At least one storage device 120 (eg, one or more storage devices, such as a portable memory device, a solid state drive, and / or various embedded storage devices). In particular, the processing circuit 110 can be used to execute a set of codes 112C to control the analysis device 100 to operate according to the method proposed by the present invention, but the present invention is not limited thereto. Examples of the analysis device 100 may include, but are not limited to, personal computers (such as desktop and laptop computers) and servers.

第2圖為該方法於本發明一實施例之工作流程2000的流程圖,其中第3圖為依據本發明一實施例之第2圖所示之工作流程2000中的一子流程2100,以 及第4圖為依據本發明一實施例之第2圖所示之工作流程2000中的一子流程2200。 FIG. 2 is a flowchart of the method in a working flow 2000 of an embodiment of the present invention, and FIG. 3 is a sub-flow 2100 in the working flow 2000 shown in FIG. 2 of an embodiment of the present invention, And FIG. 4 is a sub-process 2200 in the workflow 2000 shown in FIG. 2 according to an embodiment of the present invention.

請一併參考第2圖與第5圖,其中第5圖為依據本發明一實施例之多群點雲(諸如點雲{3101,3102,...,310n},其中n為一正整數)及一座標(坐標)諸如參考座標300的示意圖。於步驟202中,一使用者可將一測區中之多群點雲(諸如點雲{3101,3102,...,310n})輸入至分析裝置100並進入步驟204,其中該多群點雲可為來自不同觀測裝置之針對該測區的多群點雲,或者,透過該測區的多組照片對分別產生該多群點雲,例如:一觀測裝置可針對該測區產生十張照片,該十張照片中之任兩者可產生一群點雲,因此,該十張照片共可產生45群點雲,但本發明不限於此。請注意,將該多群點雲輸入置分析裝置100之方式不限於透過該使用者手動輸入,例如:一影像產生器(或掃描裝置)可耦接至分析裝置100,透過該影像產生器產生一或多群點雲後,分析裝置100可自動地(及/或同步地)將該一或多群點雲儲存於一儲存裝置(諸如儲存裝置120)中以供後續步驟使用,但本發明不限於此。 Please refer to FIG. 2 and FIG. 5 together, where FIG. 5 is a multi-group point cloud (such as a point cloud {310 1 , 310 2 , ..., 310 n ) according to an embodiment of the present invention, where n is A positive integer) and a coordinate (coordinate) such as the schematic diagram of the reference coordinate 300. In step 202, a user may input a plurality of groups of point clouds (such as point clouds {310 1 , 310 2 , ..., 310 n }) in a measurement area to the analysis device 100 and proceed to step 204, where the The multi-group point cloud can be a multi-group point cloud for the measurement area from different observation devices, or the multi-group point cloud can be generated through multiple photo pairs of the measurement area, for example, an observation device can target the measurement area. Ten photos are generated, and any two of the ten photos can generate a group of point clouds. Therefore, the ten photos can generate a total of 45 group of point clouds, but the present invention is not limited thereto. Please note that the method of inputting the multi-group point cloud into the analysis device 100 is not limited to manual input by the user. For example, an image generator (or scanning device) may be coupled to the analysis device 100 and generated by the image generator. After one or more clusters of point clouds, the analysis device 100 may automatically (and / or synchronously) store the one or more clusters of points in a storage device (such as storage device 120) for subsequent steps, but the present invention Not limited to this.

於步驟204中,分析裝置100(或該使用者)可選擇點雲{3101,3102,...,310n}中之每一者與參考座標300之間的一座標轉換方式並進入步驟206,其中該座標轉換方式之例子可包含(但不限於):6參數正型轉換、7參數正型轉換、9參數仿射轉換以及12參數仿射轉換,其中7參數正型轉換可作為一預設座標轉換方式,但本發明不限於此。 In step 204, the analysis device 100 (or the user) may select a coordinate conversion mode between each of the point clouds {310 1 , 310 2 , ..., 310 n } and the reference coordinate 300 and enter Step 206, where the example of the coordinate conversion method may include (but not limited to): 6-parameter positive conversion, 7-parameter positive conversion, 9-parameter affine conversion, and 12-parameter affine conversion, of which 7-parameter positive conversion can be used A preset coordinate conversion method, but the present invention is not limited thereto.

於步驟206中,該使用者(或分析裝置100)可選擇一組第一已知點以及異於該組第一已知點的一組第二已知點(其中該組第一已知點以及該第二已知點係均勻分布且盡量地涵蓋該測區)。該組第一已知點可包含於參考座標300上的多個第一已知點(諸如已知點{Ar1,Ar2,Ar3})以及於該多群點雲中之每一者的該多個第一已知點(諸如於點雲3101上的已知點{A1,1,A1,2,A1,3}、於點雲 3102上的已知點{A2,1,A2,2,A2,3}、......以及於點雲310n上的已知點{An,1,An,2,An,3}),且該組第二已知點可包含於參考座標300上的多個第二已知點(諸如已知點{Br1,Br2,Br3})以及於該多群點雲中之每一者的該多個第二已知點(諸如於點雲3101上的已知點{B1,1,B1,2,B1,3}、於點雲3102上的已知點{B2,1,B2,2,B2,3}、......以及於點雲310n上的已知點{Bn,1,Bn,2,Bn,3}),接著,進入子流程2100,但本發明不限於此。請注意,選擇該組第一已知點以及該組第二已知點的方式可包含(但不限於):於取得該多群點雲前,使用者可將一已知物體放置於該測區以作為一已知點;於取得該多群點雲後,分析裝置100可採用影像分析之技術(例如:依據影像之灰度或色彩等,辨識出某一物體的邊界點以作為一已知點)辨識出於不同群的點雲中對應至相同位置的資料點(諸如對應至該測區中之相同位置的已知點A1,1、已知點A2,1、...已知點Nn,1),並以辨識度較高者(例如:灰度或色彩相對鄰近差異大者)作為已知點以供後續分析使用;一掃描裝置將一雷射光以不同的方向或角度打在一物體上後(或者於不同位置的掃描裝置將雷射光打在該物體上),分析裝置100可依據該雷射光反射回來的強度或色彩等資訊辨識出不同群的點雲中對應至相同位置的資料點,並以辨識度較高者(例如:強度較高者)作為已知點以供後續分析使用;以及,透過前述之反射的雷射光,分析裝置100可依據所測得之該物體的表面特徵(諸如材質、紋理、連續性等,但不在此限)辨識出不同群的點雲中對應至相同位置的資料點,並以辨識度較高者作為已知點以供後續分析使用。 In step 206, the user (or analysis device 100) may select a set of first known points and a set of second known points different from the set of first known points (where the set of first known points) And the second known points are evenly distributed and cover the measurement area as much as possible). The set of first known points may include a plurality of first known points (such as known points {Ar 1 , Ar 2 , Ar 3 )) at reference coordinate 300 and each of the multi-point cloud the first plurality of known points (such as at a known point 310 on the cloud point 1 {a 1,1, a 1,2, a 1,3}, in the two known points on the point cloud 310 {a 2,1 , A 2,2 , A 2,3 }, ... and the known points {A n, 1 , A n, 2 , A n, 3 } on the point cloud 310 n , And the set of second known points may include a plurality of second known points (such as known points {Br 1 , Br 2 , Br 3 }) on the reference coordinate 300 and each of the plurality of point clouds. the second plurality of points of known persons (such as a known point in the point cloud 310. 1 {B 1,1, B 1,2, B 1,3}, to a known point 310 on the cloud point of 2 { B 2,1 , B 2,2 , B 2,3 }, ... and known points {B n, 1 , B n, 2 , B n, 3 } on point cloud 310 n ) Then, enter sub-flow 2100, but the present invention is not limited to this. Please note that the method of selecting the first known point in the group and the second known point in the group may include (but not limited to): before obtaining the multi-group point cloud, the user may place a known object on the measurement The area is regarded as a known point; after obtaining the multi-group point cloud, the analysis device 100 may use image analysis techniques (for example, according to the gray or color of the image, etc.) to identify the boundary point of an object as a (Known points) identify data points corresponding to the same position in point clouds from different groups (such as known points A 1,1 , known points A 2,1 , ... that correspond to the same position in the survey area) Known point N n, 1 ), and use the one with higher recognition (for example, the one with relatively large difference in gray or color) as a known point for subsequent analysis; a scanning device sets a laser light in different directions After hitting an object at an angle (or laser light on the object by scanning devices at different positions), the analysis device 100 can identify different groups of point clouds based on information such as the intensity or color of the reflected laser light. Correspond to data points at the same location, and use the one with higher recognition (for example: (Or) as a known point for subsequent analysis; and, through the aforementioned reflected laser light, the analysis device 100 may determine the surface characteristics of the object (such as material, texture, continuity, etc.), but not limited thereto ) Identify the data points corresponding to the same position in the point clouds of different groups, and use the higher recognition as the known point for subsequent analysis.

另外,透過相同(或類似)的影像分析之技術,分析裝置100可辨識出該多群點雲中的每一者的至少一部分(一部分或全部)的資料點分別對應之該測區中的位置(或物體),以供後續之步驟作使用,詳細內容將於後續之段落說明。 In addition, through the same (or similar) image analysis technology, the analysis device 100 can identify at least a part (a part or all) of the data points of each of the plurality of point cloud positions corresponding to the positions in the measurement area, respectively. (Or object) for subsequent steps, details will be explained in subsequent paragraphs.

於本實施例中,該多群點雲中的每一者中的該多個第一已知點的數 量需求以及該多群點雲中的每一者中的該多個第二已知點的數量需求均必須滿足前述之該座標轉換方式的最低需求,例如:6參數正型轉換需要至少兩個點、7參數正型轉換需要至少三個點、9參數仿射轉換需要至少三個點、以及12參數仿射轉換需要至少四個點。於本發明之實施例中,點雲{3101,3102,...,310n}中的每一者包含有三個第一已知點以及三個第二已知點,例如:已知點{A1,1,A1,2,A1,3}可代表點雲3101中的三個第一已知點,以及已知點{B1,1,B1,2,B1,3}可代表點雲3101中的三個第二已知點,點雲{3102,...,310n}以此類推,其每一者均包含三個第一已知點以及三個第二已知點,其中參考座標300上的已知點{Ar1,Ar2,Ar3}(三個第一已知點)以及已知點{Br1,Br2,Br3}(三個第二已知點)分別對應於點雲{3102,...,310n}中的每一者中的六個已知點(三個第一已知點以及三個第二已知點),這只是為了說明之目的而已,並非對本發明之限制。 In this embodiment, the number of the first known points in each of the multi-point cloud and the plurality of second known points in each of the multi-point cloud The quantity requirements must meet the minimum requirements of the aforementioned coordinate conversion method. For example: 6-parameter positive conversion requires at least two points, 7-parameter positive conversion requires at least three points, and 9-parameter affine conversion requires at least three points. , And the 12-parameter affine transformation requires at least four points. In the embodiment of the present invention, each of the point clouds {310 1 , 310 2 , ..., 310 n } includes three first known points and three second known points, for example: known The points {A 1,1 , A 1,2 , A 1,3 } can represent the three first known points in the point cloud 310 1 and the known points {B 1,1 , B 1,2 , B 1 , 3 } can represent the three second known points in the point cloud 310 1 , the point cloud {310 2 , ..., 310 n } and so on, each of which contains three first known points and Three second known points, where the known points {Ar 1 , Ar 2 , Ar 3 } (three first known points) on the reference coordinate 300 and the known points {Br 1 , Br 2 , Br 3 } (Three second known points) correspond to six known points (three first known points and three second known points) in each of the point clouds {310 2 , ..., 310 n } (Known points), this is for the purpose of illustration only, and is not a limitation on the present invention.

請一併參考第5圖以及第6圖,其中第6圖為依據本發明一實施例之多群點雲於該參考座標的示意圖。利用前述之該座標轉換方式,分析裝置100可將第5圖所示之點雲{3101,3102,...,310n}轉換至參考座標300以產生轉換後點雲(諸如第6圖所示之點雲{4101,4102,...,410n}),其中分析裝置100可透過上述之該座標轉換方式將第5圖所示之點雲3101上的已知點{A1,1,A1,2,A1,3,B1,1,B1,2,B1,3}轉換至參考座標300以產生第6圖所示之點雲4101上的已知點{Ar1,1,Ar1,2,Ar1,3,Br1,1,Br1,2,Br1,3},點雲{3102,...,310n}中的每一者的該多個已知點均進行類似之操作,詳細內容將於後續之段落說明。 Please refer to FIG. 5 and FIG. 6 together, where FIG. 6 is a schematic diagram of multiple group point clouds at the reference coordinates according to an embodiment of the present invention. Using the aforementioned coordinate conversion method, the analysis device 100 can convert the point cloud {310 1 , 310 2 , ..., 310 n } shown in FIG. 5 to a reference coordinate 300 to generate a converted point cloud (such as the sixth The point cloud {410 1 , 410 2 , ..., 410 n }) shown in the figure, in which the analysis device 100 can convert the known points on the point cloud 310 1 shown in FIG. 5 through the coordinate transformation method described above. {a 1,1, a 1,2, a 1,3, B 1,1, B 1,2, B 1,3} 300 to coordinate conversion to generate the reference shown in Fig. 6 of the point cloud 4101 Given the points {Ar 1,1 , Ar 1,2 , Ar 1,3 , Br 1,1 , Br 1,2 , Br 1,3 }, the point cloud {310 2 , ..., 310 n } Similar operations are performed for each of the multiple known points, and the details will be explained in the subsequent paragraphs.

請一併參考參考第3圖以及第5圖,於步驟208中,分析裝置100可分別計算點雲{3101,3102,...,310n}中的每一者的該多個第一已知點(諸如於點雲3101上的已知點{A1,1,A1,2,A1,3}、於點雲3102上的已知點{A2,1,A2,2,A2,3}、......以及於點雲310n上的已知點{An,1,An,2,An,3})與參考座標300上之相對應的已知點{Ar1,Ar2,Ar3}之間的空間差量。計算該些空間差量的方式可包含(但不限於): 當一點雲上的已知點座標為(X,Y,Z)且一參考座標上之相對應的已知點座標為(Xr,Yr,Zr),則該點雲上的已知點與該參考座標上的已知點之間的空間差量可透過下列方式計算得知:

Figure TWI676151B_D0001
於本實施例中,點雲{3101,3102,...,310n}中的每一者包含有三個第一已知點,因此分析裝置100可透過計算得到點雲{3101,3102,...,310n}中的每一者的三組空間差量,例如:針對點雲3101,分析裝置100可透過計算得到已知點A1,1與已知點Ar1的空間差量D1,1、已知點A1,2與已知點Ar2的空間差量D1,2、以及已知點A1,3與已知點Ar3的空間差量D1,3;針對點雲3102,分析裝置100可透過計算得到已知點A2,1與已知點Ar1的空間差量D2,1、已知點A2,2與已知點Ar2的空間差量D2,2、以及已知點A2,3與已知點Ar3的空間差量D2,3;以此類推,針對點雲310n,分析裝置100可透過計算得到已知點An,1與已知點Ar1的空間差量Dn,1、已知點An,2與已知點Ar2的空間差量Dn,2、以及已知點An,3與已知點Ar3的空間差量Dn,3。接著,進入步驟210。 Please refer to FIG. 3 and FIG. 5 together. In step 208, the analysis device 100 may calculate the plurality of numbers of each of the point clouds {310 1 , 310 2 , ..., 310 n }. A known point (such as a known point {A 1,1 , A 1,2 , A 1,3 } on point cloud 310 1 ), a known point {A 2,1 , A 2 on point cloud 3102 , 2 , A 2,3 }, ... and the known point {A n, 1 , A n, 2 , A n, 3 }) on the point cloud 310 n with respect to the reference coordinate 300 The spatial difference between the corresponding known points {Ar 1 , Ar 2 , Ar 3 }. The way to calculate these spatial differences may include (but is not limited to): When the known point coordinates on a point cloud are (X, Y, Z) and the corresponding known point coordinates on a reference coordinate are (X r , Y r , Z r ), then the spatial difference between a known point on the point cloud and a known point on the reference coordinate can be calculated by:
Figure TWI676151B_D0001
In this embodiment, each of the point clouds {310 1 , 310 2 , ..., 310 n } includes three first known points, so the analysis device 100 can obtain the point cloud {310 1 by calculation 310 2 , ..., 310 n } for each of the three sets of spatial differences, for example, for the point cloud 310 1 , the analysis device 100 can calculate the known point A 1,1 and the known point Ar 1 through calculation. the spatial difference D 1,1, a 1,2 known point and the known point difference space Ar 2 D 1,2, a 1,3 known point and the point Ar known spatial difference of D 3 1,3 ; For the point cloud 310 2 , the analysis device 100 can calculate the spatial difference D 2,1 between the known point A 2,1 and the known point Ar 1 , and the known point A 2,2 and the known point. Ar spatial difference D 2 2,2, 2,3 and the known point a and the point Ar known spatial difference of 3 D 3; and so on, for the point cloud 310 n, 100 may be analyzed by calculating the means n-known point a to give, Ar 1 point and the known spatial difference D n 1 is 1, n-known point a, point 2 Ar known spatial difference D n 2 is 2, and the known point a n, 3 and Ar known point spatial difference D n 3, and 3. Next, the process proceeds to step 210.

於步驟210中,當一點雲中的該多個第一已知點的任一者之相對應的空間差量位於一第一容許範圍之外,分析裝置100可剔除該點雲。於本實施例中,該第一容許範圍可透過計算該些空間差量的標準差與平均值來決定,例如:在分析裝置100計算出空間差量{D1,D2,...Dm,}(其中m為一正整數)後,空間差量{D1,D2,...Dm,}的標準差σ可透過下列兩方式計算得知:

Figure TWI676151B_D0002
其中Davg為空間差量{D1,D2,...Dm,}的平均值。接著,使用者可依據各自的需求 設定該第一容許範圍,例如:將該第一容許範圍設定為(Davg-2* σ)與(Davg+2* σ)之間的區間;又例如:將該第一容許範圍設定為(Davg-3* σ)與(Davg+3* σ)之間的區間。但本發明不限於此。 In step 210, when the corresponding spatial difference of any one of the plurality of first known points in a point cloud is outside a first allowable range, the analysis device 100 may eliminate the point cloud. In this embodiment, the first allowable range can be determined by calculating the standard deviation and the average value of the spatial differences, for example, the analysis device 100 calculates the spatial differences {D 1 , D 2 , ... D After m ,} (where m is a positive integer), the standard deviation σ of the space difference {D 1 , D 2 , ... D m ,} can be calculated by the following two methods:
Figure TWI676151B_D0002
Where D avg is the average of the spatial differences {D 1 , D 2 , ... D m ,}. Then, the user can set the first allowable range according to their respective needs, for example: set the first allowable range as an interval between (D avg -2 * σ) and (D avg + 2 * σ); for example : This first allowable range is set to an interval between (D avg -3 * σ) and (D avg + 3 * σ). However, the present invention is not limited to this.

於步驟212中,分析裝置100(或該使用者)可依據一數量閾值NTH1決定是否改變該第一容許範圍,當分析裝置100(或該使用者)判斷需改變該第一容許範圍以增加未被剔除之點雲的數量,則於改變(未顯示於圖示中)後進入步驟210,否則,進入步驟214。例如:使用者可將數量閾值NTH1設定為10,假設此狀況下於步驟210中未被剔除之點雲數量為8,使用者(或分析裝置100)可改變該第一容許範圍(例如:從(Davg-2* σ)與(Davg+2* σ)之間的區間改變為(Davg-3* σ)與(Davg+3* σ)之間的區間)以增加未被剔除之點雲的數量。 In step 212, the analysis device 100 (or the user) may decide whether to change the first allowable range according to a quantity threshold NTH1. When the analysis device 100 (or the user) determines that the first allowable range needs to be changed to increase the After the number of removed point clouds is changed (not shown in the figure), the process proceeds to step 210; otherwise, the process proceeds to step 214. For example, the user may set the quantity threshold NTH1 to 10, assuming that the number of point clouds that have not been removed in step 210 in this situation is 8, the user (or the analysis device 100) may change the first allowable range (for example: from (D avg -2 * σ) and (D avg + 2 * σ) changed to the interval between (D avg -3 * σ) and (D avg + 3 * σ)) to increase The number of point clouds.

於步驟214中,分析裝置100可依據前述之該座標轉換方式,將於步驟210中未被剔除之點雲轉換至參考座標300以產生轉換後點雲。請參考第7圖,其中第7圖為依據本發明一實施例之透過將未被剔除之點雲轉換至參考座標300所產生之轉換後點雲的示意圖。假設於步驟210中未被剔除之點雲包含有第7圖所示之點雲3101、點雲3102、點雲3103、點雲3104、點雲3105、點雲3106以及點雲3107,並且於步驟212中分析裝置100(或使用者)決定不改變該第一容許範圍,則分析裝置100可於步驟214中產生如第7圖所示之於參考座標300上的點雲{4101,4102,4103,4104,4105,4106,4107}。接著,進入子流程2200。請注意,於點雲{4102,4103,4104,4105,4106,4107}及點雲{3102,3103,3104,3105,3106,3107}中的每一者中的該多個第一已知點以及該多個第二已知點,為簡明起見,在此省略而不顯示於圖示中。 In step 214, the analysis device 100 may convert the point cloud that has not been removed in step 210 to the reference coordinate 300 according to the aforementioned coordinate conversion method to generate a converted point cloud. Please refer to FIG. 7, which is a schematic diagram of a converted point cloud generated by converting an unremoved point cloud to a reference coordinate 300 according to an embodiment of the present invention. It is assumed that the point cloud not removed in step 210 includes the point cloud 310 1 , the point cloud 310 2 , the point cloud 310 3 , the point cloud 310 4 , the point cloud 310 5 , the point cloud 310 6, and the points shown in FIG. 7. Cloud 310 7 and the analysis device 100 (or user) decides not to change the first allowable range in step 212, the analysis device 100 may generate a point on the reference coordinate 300 as shown in FIG. 7 in step 214 Cloud {410 1 , 410 2 , 410 3 , 410 4 , 410 5 , 410 6 , 410 7 }. Then, enter sub-flow 2200. Please note that for each of point cloud {410 2 , 410 3 , 410 4 , 410 5 , 410 6 , 410 7 } and point cloud {310 2 , 310 3 , 310 4 , 310 5 , 310 6 , 310 7 } The plurality of first known points and the plurality of second known points in one are omitted for brevity and are not shown in the drawings.

請一併參考第4圖與第6圖,其中第6圖為依據本發明一實施例之多群轉換後點雲(諸如點雲{4101,4102,...,410n})於參考座標300的示意圖。於步驟216中,分析裝置100可依據前述之該座標轉換方式,分別將該多群點雲(諸如 第5圖所示之點雲{3101,3102,...,310n})轉換至參考座標300以產生該多群轉換後點雲(諸如第6圖所示之點雲{4101,4102,...,410n}),其中分析裝置100可透過上述之該座標轉換方式將第5圖所示之點雲3101上的已知點{A1,1,A1,2,A1,3,B1,1,B1,2,B1,3}、於點雲3102上的已知點{A2,1,A2,2,A2,3,B2,1,B2,2,B2,3}、......以及於點雲310n上的已知點{An,1,An,2,An,3,Bn,1,Bn,2,Bn,3}轉換至參考座標300以產生第6圖所示之點雲4101上的已知點{Ar1,1,Ar1,2,Ar1,3,Br1,1,Br1,2,Br1,3}、於點雲4102上的已知點{Ar2,1,Ar2,2,Ar2,3,Br2,1,Br2,2,Br2,3}、......以及於點雲410n上的已知點{Arn,1,Arn,2,Arn,3,Brn,1,Brn,2,Brn,3}。但本發明不限於此。 Please refer to FIG. 4 and FIG. 6 together, where FIG. 6 is a point cloud (such as point cloud {410 1 , 410 2 , ..., 410 n )) after multi-group conversion according to an embodiment of the present invention. Reference is made to the diagram of coordinates 300. In step 216, the analysis device 100 can respectively transform the multi-group point cloud (such as the point cloud {310 1 , 310 2 , ..., 310 n }) shown in FIG. 5 according to the aforementioned coordinate transformation method. To the reference coordinate 300 to generate the multi-group transformed point cloud (such as the point cloud {410 1 , 410 2 , ..., 410 n } shown in FIG. 6), wherein the analysis device 100 can convert the coordinate through the above-mentioned coordinate The known points {A 1,1 , A 1,2 , A 1,3 , B 1,1 , B 1,2 , B 1,3 } on the point cloud 310 1 shown in Figure 5 Known points on point cloud 310 2 {A 2,1 , A 2,2 , A 2,3 , B 2,1 , B 2,2 , B 2,3 }, ... Known points {A n, 1 , A n, 2 , A n, 3 , B n, 1 , B n, 2 , B n, 3 } on cloud 310 n are transformed to reference coordinates 300 to produce the location shown in Figure 6 the point cloud 410 shows a known point on the 1 {Ar 1,1, Ar 1,2, Ar 1,3, Br 1,1, Br 1,2, Br 1,3}, at the point cloud 410 2 It has been known points on the {Ar 2,1, Ar 2,2, Ar 2,3, Br 2,1, Br 2,2, Br 2,3}, ...... and 410 n in the point cloud Knowing points {Ar n, 1 , Ar n, 2 , Ar n, 3 , Br n, 1 , Br n, 2 , Br n, 3 }. However, the present invention is not limited to this.

於步驟218中,分析裝置100可分別計算於點雲4101上的已知點{Ar1,1,Ar1,2,Ar1,3}、於點雲4102上的已知點{Ar2,1,Ar2,2,Ar2,3}、......以及於點雲410n上的已知點{Arn,1,Arn,2,Arn,3})與參考座標300上之相對應的已知點{Ar1,Ar2,Ar3}之間的空間差量,例如,針對點雲4101,分析裝置100可透過計算得到已知點Ar1,1與已知點Ar1的空間差量Dr1,1、已知點Ar1,2與已知點Ar2的空間差量Dr1,2、以及已知點Ar1,3與已知點Ar3的空間差量Dr1,3;針對點雲4102,分析裝置100可透過計算得到已知點Ar2,1與已知點Ar1的空間差量Dr2,1、已知點Ar2,2與已知點Ar2的空間差量Dr2,2、以及已知點Ar2,3與已知點Ar3的空間差量Dr2,3;以此類推,針對點雲410n,分析裝置100可透過計算得到已知點Arn,1與已知點Ar1的空間差量Drn,1、已知點Arn,2與已知點Ar2的空間差量Drn,2、以及已知點Arn,3與已知點Ar3的空間差量Drn,3。接著,進入步驟220。 In step 218, analysis device 100 can calculate in a known point on the point cloud 410 1 {Ar 1,1, Ar 1,2 , Ar 1,3}, at a known point on the point cloud 410 2 {Ar 2,1 , Ar 2,2 , Ar 2,3 }, ... and the known points {Ar n, 1 , Ar n, 2 , Ar n, 3 } on the point cloud 410 n and The spatial difference between the corresponding known points {Ar 1 , Ar 2 , Ar 3 } at the reference coordinate 300. For example, for the point cloud 410 1 , the analysis device 100 can obtain the known points Ar 1,1 through calculation. spatial difference Dr 1,1 known point of Ar 1, Ar 1,2 known point and the point Ar known spatial difference of 2 Dr 1,2, l, 3 and Ar known points and known points Ar spatial difference Dr 3 1,3; point cloud for 4102, the analysis device 100 may be obtained with the known points Ar 2, Ar known point spatial difference of 2,1 Dr 1, Ar known point by calculating 2 , Ar 2 and known point spatial difference of 2 Dr 2,2, 2,3 and the known spatial point difference Ar known point Ar 3 of Dr 2,3; so, 410 n for the point cloud, analysis device 100 can be obtained by calculating the known point n-Ar, Ar 1 point and the known spatial difference of Dr n 1, 1, known point n-Ar, Ar 2 and the known spatial points difference Dr n 2 of 2 and a known point Ar n, 3 and have Ar spatial point difference Dr n 3, and 3. Then, the process proceeds to step 220.

於步驟220中,當一轉換後點雲中的該多個第一已知點的任一者之相對應的空間差量位於一第二容許範圍之外,分析裝置100可剔除該轉換後點雲。於本實施例中,該第二容許範圍可透過與決定該第一容許範圍時類似的方式來決定,為簡明起見,與前述之步驟重複的內容在此不再贅述。 In step 220, when the corresponding spatial difference of any one of the plurality of first known points in a transformed point cloud is outside a second allowable range, the analysis device 100 may remove the transformed point cloud. In this embodiment, the second allowable range can be determined in a manner similar to that in determining the first allowable range. For the sake of brevity, the content overlapping with the foregoing steps will not be repeated here.

於步驟222中,分析裝置100(或該使用者)可依據一數量閾值NTH2 決定是否改變該第二容許範圍,當分析裝置100(或該使用者)判斷需改變該第二容許範圍以增加未被剔除之轉換後點雲的數量,則於改變(未顯示於圖示中)後進入步驟220,否則,進入步驟224。為簡明起見,與前述之步驟重複的內容在此不再贅述。 In step 222, the analysis device 100 (or the user) may determine a threshold value NTH2 Decide whether to change the second allowable range. When the analysis device 100 (or the user) determines that the second allowable range needs to be changed to increase the number of point clouds that have not been removed and converted, then change (not shown in the illustration) ) And then proceed to step 220, otherwise, proceed to step 224. For the sake of brevity, the content overlapping with the previous steps will not be repeated here.

請一併參考第2圖與第8圖,其中第8圖為依據本發明一實施例之剩餘轉換後點雲於參考座標300上的示意圖。於步驟224中,分析裝置100可收集於子流程2100中所產生的轉換後點雲以及於子流程2200中未被剔除之轉換後點雲,以作為該剩餘轉換後點雲。例如:假設於子流程2100中所產生的轉換後點雲包含點雲{4101,4102,4103,4104,4105,4106,4107},而於子流程2200未被剔除之轉換後點雲包含點雲{4104,4105,4106,4107,4108,4109,41010},則分析裝置100可收集上述之轉換後點雲作為剩餘轉換後點雲,包含點雲{4101,4102,4103,4104,4105,4106,4107,4104,4105,4106,4107,4108,4109,41010},請注意,其中點雲{4104,4105,4106,4107}重複出現於子流程2100中所產生的轉換後點雲以及子流程2200未被剔除之轉換後點雲,為了避免重複採納相同的點雲,分析裝置100可刪除重複之剩餘轉換後點雲,以將該些剩餘轉換後點雲調整為如第8圖所示之點雲{4101,4102,4103,4104,4105,4106,4107,4108,4109,41010},並進入步驟226。請注意,於點雲{4102,4103,4104,4105,4106,4107,4108,4109,41010}中的每一者中的多個第一已知點以及多個第二已知點,為簡明起見,在此省略而不顯示於圖示中。 Please refer to FIG. 2 and FIG. 8 together, where FIG. 8 is a schematic diagram of the remaining transformed point cloud on the reference coordinate 300 according to an embodiment of the present invention. In step 224, the analysis device 100 may collect the converted point cloud generated in the sub-process 2100 and the converted point cloud not removed in the sub-process 2200 as the remaining converted point cloud. For example: Assume that the transformed point cloud generated in sub-process 2100 contains the point cloud {410 1 , 410 2 , 410 3 , 410 4 , 410 5 , 410 6 , 410 7 }, and it is not removed in sub-process 2200 The point cloud after conversion includes the point cloud {410 4 , 410 5 , 410 6 , 410 7 , 410 8 , 410 9 , 410 10 }, then the analysis device 100 may collect the above-mentioned converted point cloud as the remaining converted point cloud, including Point cloud {410 1 , 410 2 , 410 3 , 410 4 , 410 5 , 410 6 , 410 7 , 410 4 , 410 5 , 410 6 , 410 7 , 410 8 , 410 9 , 410 10 }, please note that among them The point cloud {410 4 , 410 5 , 410 6 , 410 7 } repeatedly appears in the transformed point cloud generated in the sub-process 2100 and the converted point cloud in the sub-process 2200 that has not been removed. In order to avoid the same point cloud being repeatedly adopted The analysis device 100 may delete the duplicate remaining converted point clouds to adjust the remaining converted point clouds to the point clouds shown in FIG. 8 {410 1 , 410 2 , 410 3 , 410 4 , 410 5 , 410 6 , 410 7 , 410 8 , 410 9 , 410 10 }, and proceed to step 226. Please note that there are multiple first known points in each of the point clouds {410 2 , 410 3 , 410 4 , 410 5 , 410 6 , 410 7 , 4108,410 9 , 410 10 } and multiple The second known point is omitted here for brevity and not shown in the figure.

於步驟226中,分析裝置100可利用於步驟206中所選擇之第二已知點,分別計算於步驟224中的該些剩餘轉換後點雲中的每一者的多個第二已知點與參考座標300上之相對應的已知點{Br1,Br2,Br3}之間的空間差量。例如:假設於步驟224中收集所得到的該些剩餘轉換後點雲包含第8圖所示之點雲{4101,4102,4103,4104,4105,4106,4107,4108,4109,41010},針對點雲4101,分析裝置100可透過計算得到已知點Br1,1與已知點Br1的空間差量Drb1,1、已知點Br1,2與已知點 Br2的空間差量Drb1,2、以及已知點Br1,3與已知點Br3的空間差量Drb1,3;針對點雲4102,分析裝置100可透過計算得到已知點Br2,1與已知點Br1的空間差量Drb2,1、已知點Br2,2與已知點Br2的空間差量Drb2,2、以及已知點Br2,3與已知點Br3的空間差量Drb2,3;類似地,針對點雲{4103,4104,4105,4106,4107,4108,4109,41010},分析裝置100均可分別透過計算得到相對應之空間差量。接著,進入步驟228。 In step 226, the analysis device 100 may use the second known points selected in step 206 to separately calculate a plurality of second known points in each of the remaining transformed point clouds in step 224. The spatial difference between the known points {Br 1 , Br 2 , Br 3 } corresponding to the reference coordinates 300. For example: Assume that the remaining transformed point clouds collected in step 224 include the point cloud shown in Figure 8 {410 1 , 410 2 , 410 3 , 410 4 , 410 5 , 410 6 , 410 7 , 410 8, 4109, 41010} for the point cloud 4101, the analysis device 100 may be obtained by calculating the known point and the known point Br Br 1,1 spatial difference 1 Drb 1,1, Br known points 1, 2 with a space known point difference Br 2 Drb 1,2, Br and l, 3 known points with known spatial point difference Br 3 Drb 1,3; point cloud for 4102, the analysis device 100 may be permeable known points calculated point Br Br 2,1 known spatial difference of 1 Drb 2,1, 2,2 & known point Br Br known spatial point difference of 2 Drb 2,2, and known points The spatial difference between Br 2,3 and the known point Br 3 , Drb 2,3 ; similarly, for the point cloud {410 3 , 410 4 , 410 5 , 410 6 , 410 7 , 410 8 , 410 9 , 410 10 } Each of the analysis devices 100 can obtain corresponding spatial differences through calculation. Then, it progresses to step 228.

於步驟228中,當一剩餘轉換後點雲中的該多個第二已知點的任一者之相對應的空間差量位於一第三容許範圍之外,分析裝置100可剔除該剩餘轉換後點雲。於本實施例中,該第三容許範圍可透過與決定該第一容許範圍及該第二容許範圍時類似的方式來決定,為簡明起見,與前述之步驟重複的內容在此不再贅述。 In step 228, when the corresponding spatial difference of any one of the plurality of second known points in the residual point cloud is outside a third allowable range, the analysis device 100 may eliminate the residual conversion. After the point cloud. In this embodiment, the third allowable range can be determined in a manner similar to that when determining the first allowable range and the second allowable range. For the sake of brevity, the content overlapping with the foregoing steps will not be repeated here. .

於步驟230中,分析裝置100(或該使用者)可依據一數量閾值NTH3決定是否改變該第三容許範圍,當分析裝置100(或該使用者)判斷需改變該第三容許範圍以增加未被剔除之剩餘轉換後點雲的數量,則於改變(未顯示於圖示中)後進入步驟228,否則,進入步驟232。為簡明起見,與前述之步驟重複的內容在此不再贅述。 In step 230, the analysis device 100 (or the user) may decide whether to change the third allowable range according to a quantity threshold NTH3. When the analysis device 100 (or the user) determines that the third allowable range needs to be changed to increase the The number of remaining converted point clouds after being eliminated is changed (not shown in the figure) and then proceeds to step 228, otherwise, proceeds to step 232. For the sake of brevity, the content overlapping with the previous steps will not be repeated here.

於步驟232中,當未被剔除之剩餘轉換後點雲的數量為0,則進入步驟234,以重新取得異於步驟202所輸入之多群點雲之新的多群點雲,接著,回到步驟202;否則,進入步驟236。 In step 232, when the number of remaining converted point clouds that have not been removed is 0, the process proceeds to step 234 to obtain a new multi-group point cloud different from the multi-group point cloud input in step 202, and then, returns Go to step 202; otherwise, go to step 236.

於步驟236中,分析裝置100可合併該些未被剔除之剩餘轉換後點雲,以產生精度提升後的點雲。例如,分析裝置100可依據該些未被剔除之剩餘轉換後點雲於步驟226中所計算得到的空間差量,分配相對應的權數給該些未被剔除之剩餘轉換後點雲,以進行後續之點雲合併(例如:加權平均)。例如:點雲4101中的多個第二已知點所對應的空間差量較點雲4102中的多個第二已知點所對應的空間差量小,因此,分析裝置100可分配較高的權數給點雲4101,並分 配較低的權數給點雲4102;又例如,分析裝置100可依據前述之空間差量的標準差、未被剔除的該些剩餘轉換後點雲之來源影像的地面採樣距離(ground sample distance)、未被剔除的該些剩餘轉換後點雲之該些來源影像的精度(諸如照片解析度)或誤差、或一儀器與該測區或一物體之間的測距比值來進行權數的分配,但本發明不限於此。 In step 236, the analysis device 100 may merge the remaining converted point clouds that have not been removed to generate a point cloud with improved accuracy. For example, the analysis device 100 may allocate corresponding weights to the remaining un-removed converted point clouds based on the spatial differences calculated in step 226 of the remaining un-removed converted point clouds. Subsequent point cloud mergers (for example: weighted average). For example, the spatial differences corresponding to the plurality of second known points in the point cloud 410 1 are smaller than the spatial differences corresponding to the plurality of second known points in the point cloud 410 2. Therefore, the analysis device 100 may allocate The higher weight is assigned to the point cloud 410 1 , and the lower weight is assigned to the point cloud 410 2 ; for another example, the analysis device 100 may be based on the aforementioned standard deviation of the spatial difference, and the remaining converted point clouds that have not been removed. Ground sample distance of the source image, the accuracy (such as photo resolution) or error of the source images of the remaining converted point clouds that have not been removed, or an instrument and the measurement area or an object The weighting ratio is used to allocate weights, but the present invention is not limited to this.

於本實施例中,分析裝置100於先前之步驟(諸如步驟206)已可辨識出該多群點雲中的每一者的至少一部分(一部分或全部)的資料點分別對應之該測區中的位置(或物體),因此,熟習此技藝者應可充分地了解點雲合併之操作細節(諸如加權平均),在此不贅述。 In this embodiment, the analysis device 100 has been able to identify at least a part (a part or all) of the data points of each of the plurality of point cloud in the previous step (such as step 206) respectively in the measurement area. Location (or object), therefore, those skilled in this art should be able to fully understand the operation details of point cloud merging (such as weighted average), and will not repeat them here.

請注意,只要不妨礙本發明的實施,一或多個步驟可於該工作流程中被修改、新增或刪除。例如,於步驟212、步驟222或步驟230中,該使用者可依據各自的需求,針對數量閾值NTH1、數量閾值NTH2以及數量閾值NTH3之相關後續步驟作修改(例如:當步驟210之未被剔除之點雲的數量小於數量閾值NTH1(例如:5),則進入步驟234以重新取得多群點雲,並回到步驟202;又例如:當步驟210之未被剔除之點雲的數量等於0,則進入步驟234以重新取得多群點雲,並回到步驟202);再舉一例,於工作流程2000中的子流程2100以及子流程2200的執行順序並非必須依照第2圖所示之順序來進行,換言之,分析裝置100可先進行子流程2200中的步驟,接著在進行子流程2100中的步驟,或者,分析裝置100可並行地進行子流程2100以及子流程2200。再舉一例:依據本實施例,於步驟224中之刪除重複收集之轉換後點雲的操作可於步驟236中進行點雲合併前實施,或者,前述之刪除重複收集之轉換後點雲的操作可於執行步驟224~236的任一者時進行。由於熟習此技藝者在閱讀以上之段落後,已可了解第2圖所示之每一步驟的操作,為簡明起見,相關細節在此不再贅述。 Please note that as long as it does not hinder the implementation of the present invention, one or more steps can be modified, added or deleted in the workflow. For example, in step 212, step 222, or step 230, the user can modify the related subsequent steps of the quantity threshold NTH1, the quantity threshold NTH2, and the quantity threshold NTH3 according to their respective needs (for example, when the step 210 is not removed) If the number of point clouds is less than the number threshold NTH1 (for example: 5), then enter step 234 to re-acquire multiple clusters of point clouds and return to step 202; for example, when the number of unremoved point clouds in step 210 is equal to 0 , Then go to step 234 to re-acquire the multi-group point cloud and return to step 202); for another example, the execution order of sub-process 2100 and sub-process 2200 in the work flow 2000 does not have to follow the order shown in FIG. 2 In other words, the analysis apparatus 100 may perform the steps in the sub-process 2200 first, and then perform the steps in the sub-process 2100, or the analysis apparatus 100 may perform the sub-process 2100 and the sub-process 2200 in parallel. Another example: According to this embodiment, the operation of deleting the duplicated collected point cloud in step 224 may be performed before the point cloud merge is performed in step 236, or the aforementioned operation of deleting the duplicated collected point cloud after conversion is performed. It can be performed when any one of steps 224 to 236 is performed. As the person skilled in this art can understand the operation of each step shown in Figure 2 after reading the above paragraphs, for the sake of brevity, the relevant details will not be repeated here.

相較於先前技術,本發明所提出之方法能針對點雲本身來提高其精 度,而較不受限於使用影像視差計算時因取像設備本身、影像品質、拍攝影像交會角度、照片密度、觀測物體的角度、物體表面平整程度等等的影響,並且利用發達的電腦科學,該使用者能輕易的將大量的點雲資訊輸入至分析裝置100中,快速地完成上述之點雲處理,另外,依據本發明之相關實施例來實施並不會增加許多額外的成本。因此,相關技術的問題可被解決,且整體成本不會增加太多。相較於相關技術,本發明能在沒有副作用或較不可能帶來副作用之狀況下提升點雲精度。 Compared with the prior art, the method proposed by the present invention can improve the accuracy of the point cloud itself. Degrees, without being limited to the use of image parallax calculations due to the imaging equipment itself, image quality, shooting image intersection angle, photo density, observing object angle, object surface flatness, etc., and the use of advanced computer science The user can easily input a large amount of point cloud information into the analysis device 100 to quickly complete the above-mentioned point cloud processing. In addition, the implementation according to the related embodiments of the present invention does not increase many additional costs. Therefore, the problems of related technologies can be solved without the overall cost increasing too much. Compared with the related art, the present invention can improve the accuracy of the point cloud without any side effects or less likely to cause side effects.

以上所述僅為本發明之較佳實施例,凡依本發明申請專利範圍所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。 The above description is only a preferred embodiment of the present invention, and all equivalent changes and modifications made in accordance with the scope of patent application of the present invention shall fall within the scope of the present invention.

Claims (10)

一種用來提升點雲精度之方法,包含:(a)輸入於一測區中之多群點雲;(b)選擇該多群點雲中之每一者與一參考座標之間的一座標轉換方式;(c)選擇一組第一已知點以及異於該組第一已知點的一組第二已知點,其中該組第一已知點包含於一參考座標上的多個第一已知點以及於該多群點雲中之每一者的該多個第一已知點,且該組第二已知點包含於該參考座標上的多個第二已知點以及於該多群點雲中之每一者的該多個第二已知點;(d)分別計算該多個點雲中的每一者的該多個第一已知點與該參考座標上的該多個第一已知點之間的空間差量,其中當一點雲中的該多個第一已知點的任一者的空間差量位於一第一容許範圍之外,則剔除該點雲,並依據步驟(b)中所選擇之該座標轉換方式,分別將未被剔除之點雲轉換至該參考座標以產生轉換後點雲;(e)依據步驟(b)中所選擇之該座標轉換方式,分別將該多個點雲轉換至該參考座標以產生該些轉換後點雲,並分別計算該些轉換後點雲中的每一者的該多個第一已知點與該參考座標上的該多個第一已知點之間的空間差量,當一轉換後點雲中的該多個第一已知點的任一者的空間差量位於一第二容許範圍之外,則剔除該轉換後點雲;(f)收集於步驟(d)與步驟(e)中未被剔除之該些轉換後點雲以作為剩餘轉換後點雲;以及(g)分別計算該些剩餘轉換後點雲之每一者的該多個第二已知點與該參考座標上的該多個第二已知點之間的空間差量,當一剩餘轉換後點雲中的該多個第二已知點的任一者的空間差量位於一第三容許範圍之外,則剔除該些剩餘轉換後點雲。A method for improving the accuracy of a point cloud, comprising: (a) multiple groups of point clouds input in a measurement area; (b) selecting a coordinate between each of the multiple group of point clouds and a reference coordinate Conversion mode; (c) selecting a group of first known points and a group of second known points different from the group of first known points, wherein the group of first known points includes a plurality of reference coordinates A first known point and the plurality of first known points in each of the clusters of point clouds, and the set of second known points includes a plurality of second known points on the reference coordinate, and The plurality of second known points at each of the plurality of point clouds; (d) calculating the plurality of first known points and the reference coordinates of each of the plurality of point clouds separately The spatial difference between the plurality of first known points, wherein when the spatial difference of any one of the plurality of first known points in a point cloud is outside a first allowable range, the Point cloud, and according to the coordinate conversion method selected in step (b), convert the point cloud that has not been removed to the reference coordinate to generate a converted point cloud; (e) According to step (b) The selected coordinate transformation method converts the plurality of point clouds to the reference coordinates to generate the transformed point clouds, and calculates the plurality of first known ones of each of the transformed point clouds, respectively. The spatial difference between the point and the plurality of first known points on the reference coordinate, when the spatial difference between any one of the plurality of first known points in the point cloud is at a second Outside the allowable range, the converted point cloud is eliminated; (f) the converted point clouds collected in steps (d) and (e) are not removed as the remaining converted point clouds; and (g) Calculate the space difference between the plurality of second known points of each of the remaining transformed point clouds and the plurality of second known points on the reference coordinate respectively. If the spatial difference of any one of the plurality of second known points is outside a third allowable range, the remaining transformed point clouds are excluded. 如申請專利範圍第1項所述之方法,另包含:對於步驟(g)中未被剔除的該些剩餘轉換後點雲進行權數分配以進行點雲合併。The method according to item 1 of the scope of patent application, further comprising: performing weight allocation on the remaining converted point clouds that are not excluded in step (g) to perform point cloud merging. 如申請專利範圍第2項所述之方法,其中對於步驟(g)中未被剔除的該些剩餘轉換後點雲進行權數分配以進行點雲合併之步驟中的該權數分配係依據於步驟(d)中所計算的空間差量、於步驟(e)中所計算的空間差量、於步驟(g)中所計算的空間差量、未被剔除的該些剩餘轉換後點雲之來源影像的地面採樣距離(ground sample distance)、未被剔除的該些剩餘轉換後點雲之該些來源影像的精度或誤差、或一儀器與該測區或一物體之間的測距比值來進行。The method according to item 2 of the scope of patent application, wherein the weight assignment of the remaining converted point clouds that are not excluded in step (g) to perform point cloud merger is based on step ( The space difference calculated in d), the space difference calculated in step (e), the space difference calculated in step (g), and the source images of the remaining converted point clouds that have not been removed Ground sample distance, the accuracy or error of the source images of the remaining converted point clouds that have not been removed, or the distance measurement ratio between an instrument and the measurement area or an object. 如申請專利範圍第1項所述之方法,其中於步驟(c)中選擇的該組第一已知點以及該組第二已知點於一點雲中的已知點的最低數量需求係由步驟(b)所選擇之該座標轉換方式來決定。The method according to item 1 of the scope of patent application, wherein the minimum number of known points in the set of first known points and the set of second known points in a point cloud selected in step (c) is determined by The coordinate conversion method selected in step (b) is determined. 如申請專利範圍第1項所述之方法,其中當於步驟(d)中產生的轉換後點雲的數量為0且於步驟(e)中未被剔除的該些轉換後點雲的數量為0時,重新取得多群點雲並回到步驟(a)。The method according to item 1 of the scope of patent application, wherein when the number of converted point clouds generated in step (d) is 0 and the number of the converted point clouds not removed in step (e) is At 0, the multi-group point cloud is reacquired and the process returns to step (a). 如申請專利範圍第1項所述之方法,其中當於步驟(g)中未被剔除的該些剩餘轉換後點雲的數量為0時,重新取得多群點雲並回到步驟(a)。The method according to item 1 of the scope of patent application, wherein when the number of the remaining transformed point clouds that are not removed in step (g) is 0, the multi-group point clouds are reacquired and the process returns to step (a) . 如申請專利範圍第1項所述之方法,其中當於步驟(d)中未被剔除的點雲的數量低於一數量閾值,依據一第一使用者設定選擇性地改變該第一容許範圍、或重新取得多群點雲並回到步驟(a)。The method according to item 1 of the scope of patent application, wherein when the number of point clouds not removed in step (d) is lower than a number threshold, the first allowable range is selectively changed according to a first user setting Or re-acquire multiple clusters of point clouds and return to step (a). 如申請專利範圍第1項所述之方法,其中當於步驟(e)中未被剔除的該些轉換後點雲的數量低於一數量閾值,依據一第二使用者設定選擇性地改變該第二容許範圍、或重新取得多群點雲並回到步驟(a)。The method according to item 1 of the scope of patent application, wherein when the number of the converted point clouds that are not removed in step (e) is lower than a number threshold, the second user setting is selectively changed according to a second user setting. The second allowable range, or re-acquire multiple clusters of point clouds and return to step (a). 如申請專利範圍第1項所述之方法,其中當於步驟(g)中未被剔除的該些剩餘轉換後點雲的數量低於一數量閾值,依據一第三使用者設定選擇性地改變該第三容許範圍、或重新取得多群點雲並回到步驟(a)。The method according to item 1 of the scope of patent application, wherein when the number of the remaining converted point clouds not removed in step (g) is lower than a number threshold, it is selectively changed according to a third user setting This third allowable range, or re-acquire multiple clusters of point clouds, and return to step (a). 一種依據如申請專利範圍第1項所述之方法來運作之分析裝置,該分析裝置包含:一處理電路,用來執行對應於該方法之一組程式碼,以控制該分析裝置依據該方法來運作。An analysis device that operates in accordance with the method described in item 1 of the scope of patent application, the analysis device includes: a processing circuit for executing a set of codes corresponding to the method to control the analysis device to perform according to the method Operation.
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