TWI662296B - Optical alignment detecting device and detecting method thereof - Google Patents

Optical alignment detecting device and detecting method thereof Download PDF

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TWI662296B
TWI662296B TW106143988A TW106143988A TWI662296B TW I662296 B TWI662296 B TW I662296B TW 106143988 A TW106143988 A TW 106143988A TW 106143988 A TW106143988 A TW 106143988A TW I662296 B TWI662296 B TW I662296B
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light source
detected
light
polarization
polarizer
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TW201928452A (en
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洪國智
李朱育
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陽程科技股份有限公司
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Abstract

本發明為有關一種光學對位檢測裝置及其檢測方法,係利用檢測單元之光源發射器投射光源至光束擴展器,將光源進行擴展後再投射至偏光調整單元及待檢測物,使光源穿透偏光調整單元之第一光線偏光片、波片而產生旋轉之圓偏振光,再依序穿透待檢測物及第二光線偏光片後,即被檢測單元之光檢測器接收,由光檢測器進行檢測穿透偏光調整單元及待檢測物之光源,辨別待檢測物與波片產生圓偏振光旋轉方向相同或相反、圓偏振光被抵消或未抵消,光檢測器所接收光源強度趨近於最小值或最大值,可計算出待檢測物之偏光旋轉狀態,達到進行光學式對位之目的。 The invention relates to an optical alignment detecting device and a detecting method thereof, which use a light source emitter of a detecting unit to project a light source to a beam expander, expand the light source, and then project the light to the polarization adjusting unit and the object to be detected, so that the light source penetrates. The first light polarizer and the wave plate of the polarizing adjustment unit generate a circularly polarized light that is rotated, and then sequentially penetrates the object to be detected and the second light polarizer, and is received by the photodetector of the detecting unit, and the photodetector is received by the photodetector. Performing to detect the light source passing through the polarization adjusting unit and the object to be detected, and discriminating that the object to be detected and the wave plate generate the same or opposite direction of rotation of the circularly polarized light, and the circularly polarized light is cancelled or not cancelled, and the intensity of the light source received by the photodetector approaches The minimum or maximum value can be used to calculate the polarization rotation state of the object to be detected for optical alignment.

Description

光學對位檢測裝置及其檢測方法 Optical alignment detecting device and detecting method thereof

本發明係提供一種光學對位檢測裝置及其檢測方法,尤指可對光學鏡片進行偏光檢測之裝置及方法,透過檢測單元及偏光調整單元對待檢測物進行偏光檢測,達到對待檢測物進行光學對位檢測之目的。 The invention provides an optical alignment detecting device and a detecting method thereof, in particular, a device and a method for performing polarization detection on an optical lens, and the polarizing detection of the object to be detected by the detecting unit and the polarization adjusting unit is performed to achieve optical pairing of the object to be detected. The purpose of the bit detection.

按,隨著科技時代的不斷進步與創新,許多日常生活中的事物也都隨著科技進步、而有顯著的改變,例如人們日常生活中觀看的電視或電影等,透過顯示螢幕呈現的影像,也由早期的二維平面影像(2D平面影像,Two Dimension),轉變成為三維立體影像(3D立體影像,Three Dimension),以滿足人們對於觀看影像時的立體視覺影像的不同感受,更隨著三維影像(3D立體影像)畫面所呈現立體視覺效果,則有許多業者利用3D立體影像,演變出各式不同的真實臨場感、身歷其境般的模擬影像境界,例如虛擬實境(Virtual Reality,VR)技術、擴增實境(Augmented Reality,AR)技術、混合實境(Mixed Reality,MR)技術或影像實境(Cinematic Reality,CR)技術等,成為目前應用在各式遊戲、電視或電影等經常應用的技術,提供人們觀看3D立體影像的 視覺觀感。 According to the continuous advancement and innovation of the technological age, many things in daily life have also undergone significant changes with the advancement of science and technology, such as television or movies watched in people's daily lives, through the display of images on the screen. It was also transformed from an early 2D planar image (2D planar image, 2 Dimension) into a 3D stereoscopic image (3D stereoscopic image, 3D stereoscopic image, 3 Dimension image, 3 Dimension image, 3D stereo image, 3D image, 3D image, 3D image, 3D image, 3D image, 3D image, 3D image, 3D image The stereoscopic visual effect of the image (3D stereoscopic image) is realized by many operators using 3D stereoscopic images to evolve various real-world presences and immersive simulated image realms, such as virtual reality (VR). Technology, Augmented Reality (AR) technology, Mixed Reality (MR) technology or Cinematic Reality (CR) technology, etc., has been applied to various games, TV or movies, etc. Frequently applied technology to provide people with 3D stereoscopic images Visual perception.

而關於3D立體影像的呈現,係利用人們的二眼視差(Binocular Parallax)效應所形成,且二眼視差代表二眼因為所處位置不同、視角不同,即導致所見影像內容也略微不同的效應,最後由大腦將二眼所見不同影像予以融合,進而產生3D立體影像;至於立體影像呈現的技術,大致可以區分成需配戴特殊設計眼鏡觀看的戴眼鏡式(Stereoscopic)或者不需配戴眼鏡的裸視觀看之裸眼式(Auto Stereoscopic);其中,關於戴眼鏡式的3D立體影像顯示技術,包括色差式〔即濾光眼鏡(Color Filter Glasses)〕、偏光式〔即偏光眼鏡(Polarizing Glasses)〕以及主動快門式〔即快門眼鏡(Shutter Glasses)〕等各種型式;至於偏光式3D立體影像技術(Polarization 3D),也稱作偏振式3D立體影像技術,請參閱第五、六、七圖所示,配合應用的即是被動式偏光眼鏡,利用光線有〔振動方向〕(a)的原理來分解原始圖像(b),先將圖像(b)分為垂直向偏振光(b1)和水平向偏振光(b2)二組畫面,然後藉由3D眼鏡(c)左、右鏡片(c1、c2)分別採用不同偏振方向的偏光鏡片,以供使用者的左、右眼透過左、右鏡片(c1、c2)分別接收二組畫面,再經由大腦進行合成,以形成立體影像(d)。 The presentation of 3D stereoscopic images is formed by the Binocular Parallax effect, and the binocular parallax represents the effect that the two images are slightly different because of their different positions and different viewing angles. Finally, the brain combines the different images seen by the two eyes to generate 3D stereoscopic images; as for the stereoscopic image presentation technology, it can be roughly divided into Stereoscopic or non-glasses that need to be worn with special design glasses. Auto Stereoscopic for naked-eye viewing; among them, 3D stereoscopic image display technology for wearing glasses, including color difference type (ie, Color Filter Glasses), polarized type (ie, Polarizing Glasses) And active shutter type (ie, Shutter Glasses) and other types; as for polarized 3D stereoscopic imaging technology (Polarization 3D), also known as polarized 3D stereoscopic image technology, please refer to the fifth, sixth, and seventh figures. With the application of passive polarized glasses, the principle of light [vibration direction] (a) is used to decompose the original image (b) First, the image (b) is divided into two groups of vertically polarized light (b1) and horizontally polarized light (b2), and then the left and right lenses (c1, c2) are respectively polarized by 3D glasses (c). The polarizing lens of the direction is for the left and right eyes of the user to receive two sets of pictures through the left and right lenses (c1, c2), and then synthesized through the brain to form a stereoscopic image (d).

雖然裸眼觀看的立體影像呈現,使用者可以不需要配戴特殊設計的眼鏡,即可觀看3D立體影像,則裸眼式之立體顯示技術,例如透鏡式(Lenticular len Type)立體顯像技術,為 利用透鏡將各顯示資訊之光線曲折而分別導向觀看者的左、右眼,其所顯示之立體影像有位置及角度等限制,因此觀看者的觀看位置、角度也會受到較多的限制,而配戴特殊設計眼鏡觀看的眼鏡式3D立體影像顯示技術,因所透過眼鏡呈現的3D立體影像效果較佳,也不易受到觀看位置或角度等限制,仍被大多數業者所應用;惟,因偏光式眼鏡必須經過檢測、對位,以進行調整左、右鏡片的合適偏光角度、偏振方向等,以達到良好的3D立體影像顯示效果,否則容易導致偏光式眼鏡在使用時,因偏光式眼鏡的穿透軸(穿透直線偏光的軸)產生傾斜現象,以致發生串擾(Cross talk),而使偏光式眼鏡的亮度發生變化、轉暗現象等缺失。 Although the stereoscopic image is displayed by the naked eye, the user can view the 3D stereoscopic image without wearing the specially designed glasses, and the naked-eye stereoscopic display technology, such as the Lenticular len Type stereoscopic imaging technology, is The lens is used to bend the light of each display information to the left and right eyes of the viewer respectively, and the displayed stereoscopic image has limitations such as position and angle, so that the viewing position and angle of the viewer are also more restricted. Glasses-type 3D stereoscopic image display technology with special design glasses is better for 3D stereoscopic images presented through glasses, and is not easily restricted by viewing position or angle. It is still used by most operators; The glasses must be tested and aligned to adjust the proper polarization angle and polarization direction of the left and right lenses to achieve a good 3D stereoscopic image display effect. Otherwise, the polarized glasses may be used when polarized glasses are used. The penetrating axis (the axis that penetrates the linearly polarized light) causes a tilt phenomenon, so that cross talk occurs, and the brightness of the polarized glasses is changed, and the darkening phenomenon is missing.

是以,如何解決目前偏光式眼鏡的鏡片不易調整合適偏光角度、偏振方向等之問題與困擾,且鏡片容易因穿透軸傾斜,發生串擾現象等之麻煩與缺失,即為從事此行業之相關廠商所亟欲研究改善之方向所在者。 Therefore, how to solve the problem that the lens of the polarized glasses is difficult to adjust the proper polarization angle and polarization direction, and the lens is easy to be tilted due to the penetrating axis, and the crosstalk phenomenon is troublesome and lacking, which is related to the industry. The manufacturer is eager to study the direction of improvement.

故,發明人有鑑於上述之問題與缺失,乃搜集相關資料,經由多方評估及考量,並以從事於此行業累積之多年經驗,經由不斷試作及修改,始設計出此種可利用檢測單元及偏光調整單元,對待檢測物進行光學對位檢測,以供待檢測物取得合適偏光角度、偏振方向,以降低待檢測物使用時發生穿透軸傾斜、避免發生串擾現象之光學對位檢測裝置及其檢測方法的發明專利誕生者。 Therefore, in view of the above problems and deficiencies, the inventors have collected relevant information, and through multi-party assessment and consideration, and through years of experience in the industry, through continuous trial and modification, the design of such available detection units and The polarizing adjustment unit performs optical alignment detection on the object to be detected, so as to obtain an appropriate polarization angle and polarization direction of the object to be detected, so as to reduce the incidence of the penetration axis when the object to be detected is used, and avoid the occurrence of crosstalk. The birth of the invention patent for its detection method.

本發明之主要目的乃在於該光學對位檢測裝置,其進行檢 測方法,係利用檢測單元之光源發射器投射光源至光束擴展器,將光源進行擴展後再投射至偏光調整單元及待檢測物,使光源穿透偏光調整單元之第一光線偏光片、波片而產生旋轉之圓偏振光,再依序穿透待檢測物及第二光線偏光片後,即被檢測單元之光檢測器接收,由光檢測器進行檢測穿透偏光調整單元及待檢測物之光源,辨別待檢測物與波片產生圓偏振光旋轉方向(左旋或右旋)是否相反或相同,而圓偏振光旋轉方向是否被抵消或未抵消,則光檢測器所接收光源強度趨近於最小值〔0〕或最大值〔不為0〕,即可計算出待檢測物之偏光旋轉狀態,達到對待檢測物進行光學式對位之目的,進行觀看3D影像時,可減少發生穿透軸傾斜、串擾現象,提升使用穩定性功效。 The main object of the present invention is to perform the optical alignment detecting device The measuring method uses the light source emitter of the detecting unit to project the light source to the beam expander, expands the light source, and then projects the light source to the polarization adjusting unit and the object to be detected, so that the light source penetrates the first light polarizing plate and the wave plate of the polarization adjusting unit. The rotating circularly polarized light is generated, and then the object to be detected and the second light polarizer are sequentially penetrated, and then received by the photodetector of the detecting unit, and the photodetector detects the penetrating polarization adjusting unit and the object to be detected. The light source discriminates whether the object to be detected and the wave plate generate circular polarization light rotation direction (left or right rotation) is opposite or the same, and whether the circular polarization light rotation direction is cancelled or not canceled, the light source received by the photodetector is close to The minimum value [0] or the maximum value [not 0] can calculate the polarization rotation state of the object to be detected, and achieve the purpose of optical alignment of the object to be detected. When viewing the 3D image, the penetration axis can be reduced. Tilt, crosstalk, improve the stability of use.

本發明之次要目的乃在於該檢測單元之光源發射器係為雷射光之光源發射器或其它型式光源之光源發射器,以供發射波長為532nm之綠光雷射光源、且功率為20mw等型式之雷射光源,而光源發射器一側具有光源投射孔可向外投射雷射光源,至於光束擴展器一側設有光源接收面對位光源投射孔、另側設有光源擴展面可將雷射光源向外擴充至偏光調整單元以增加待檢測物的檢測面積,則該光束擴展器係為可變光之光束擴展器,且將所接收光源進行2倍~8倍(2x~8x)的倍率放大等方式,進行雷射光源的光束擴展方式。 A secondary object of the present invention is that the light source emitter of the detecting unit is a light source emitter of a laser light or a light source emitter of other types of light sources for emitting a green light laser source having a wavelength of 532 nm and having a power of 20 mw or the like. a type of laser light source, and a light source projection hole on one side of the light source emitter can project a laser light source outward, and a light source receives a light source to receive a projection hole of the surface light source, and a light source expansion surface on the other side can be The laser light source is expanded outward to the polarization adjusting unit to increase the detection area of the object to be detected, and the beam expander is a variable light beam expander, and the received light source is doubled to 8 times (2x~8x). The magnification of the magnification is used to perform the beam expansion method of the laser light source.

本發明之另一目的乃在於該偏光調整單元之第一、第二光線偏光片(Light Polarized),係可分別為含奈米級矽酸鈉之玻璃片(Nanoparticles in Sodium-Silicate Glass)等材質;而波片材料則可為結晶石英( Crystalline Quartz)等材質,並可產生相位延遲1/4波長或其它相位延遲波片等;且受到檢測單元、偏光調整單元檢測之待檢測物,係可為配戴式眼鏡的光學鏡片或其它光學鏡片等。 Another object of the present invention is that the first and second light polarizing sheets of the polarization adjusting unit are respectively made of a material such as Nanoparticles in Sodium-Silicate Glass. And the wave plate material can be crystalline quartz ( Crystalline Quartz) and other materials, and can produce phase delay 1/4 wavelength or other phase retardation wave plate; etc.; and the object to be detected detected by the detecting unit and the polarization adjusting unit can be an optical lens or other optics of the wearing glasses. Lens and so on.

1‧‧‧檢測單元 1‧‧‧Detection unit

11‧‧‧光源發射器 11‧‧‧Light source transmitter

110‧‧‧光源投射孔 110‧‧‧Light source projection hole

12‧‧‧光束擴展器 12‧‧‧beam expander

121‧‧‧光源接收面 121‧‧‧Light source receiving surface

122‧‧‧光源擴展面 122‧‧‧Light source expansion surface

13‧‧‧光檢測器 13‧‧‧Photodetector

131‧‧‧受光面 131‧‧‧Glossy surface

2‧‧‧偏光調整單元 2‧‧‧Polarization adjustment unit

21‧‧‧第一光線偏光片 21‧‧‧First Light Polarizer

22‧‧‧第二光線偏光片 22‧‧‧Second light polarizer

23‧‧‧波片 23‧‧‧ Wave Plate

3‧‧‧待檢測物 3‧‧‧Testables

a‧‧‧振動方向 A‧‧‧vibration direction

b‧‧‧圖像 B‧‧‧ image

b1‧‧‧垂直向偏振光 B1‧‧‧Vertically polarized light

b2‧‧‧水平向偏振光 B2‧‧‧Horizontal polarized light

c‧‧‧3D眼鏡 c‧‧‧3D glasses

c1‧‧‧左鏡片 C1‧‧‧ left lens

c2‧‧‧右鏡片 C2‧‧‧right lens

d‧‧‧立體影像 D‧‧‧3D image

第一圖 係為本發明之立體分解圖。 The first figure is a perspective exploded view of the present invention.

第二圖 係為本發明較佳實施例之立體分解圖。 The second drawing is an exploded perspective view of a preferred embodiment of the present invention.

第三圖 係為本發明檢測方法之流程圖(一)。 The third figure is a flow chart (1) of the detection method of the present invention.

第四圖 係為本發明檢測方法之流程圖(二)。 The fourth figure is a flow chart (2) of the detection method of the present invention.

第五圖 係為習知偏振式3D技術之光線振動方向分解示意圖(一)。 The fifth figure is a schematic diagram of the decomposition of the light vibration direction of the conventional polarization type 3D technology (1).

第六圖 係為習知偏振式3D技術之光線振動方向分解示意圖(二)。 The sixth figure is a schematic diagram of the decomposition of the light vibration direction of the conventional polarization type 3D technology (2).

第七圖 係為習知偏振式3D技術之光線振動方向接收示意圖。 The seventh figure is a schematic diagram of the light vibration direction reception of the conventional polarization type 3D technology.

為達成上述目的與功效,本發明所採用之技術手段及其構造、實施之方法等,茲繪圖就本發明之較佳實施例詳加說明其特徵與功能如下,俾利完全瞭解。 In order to achieve the above objects and effects, the technical means, the structure, the method of the implementation, and the like, which are used in the present invention, are described in detail in the preferred embodiments of the present invention.

請參閱第一、二圖所示,係為本發明之立體分解圖、較佳實施例之立體分解圖,由圖中所示可以清楚看出,本發明之光學對位檢測裝置係包括檢測單元1、偏光調整單元2及待檢測物3,其中:該檢測單元1係包括光源發射器11、光束擴展器12及光檢測器13,且該光源發射器11一側設有光源投射孔110、可向外投射雷射光至光束擴展器12,則光束擴展器12一側設有光源接收面1 21以供接收光源發射器11投射之雷射光源,且光束擴展器12再將所接收之雷射光源由另側之光源擴展面122向外擴展投射,而供位於光源發射器11、光束擴展器12另側之光檢測器13由一側受光面131接收雷射光源。 Please refer to the first and second figures, which are perspective exploded views of the present invention, and perspective exploded views of the preferred embodiment. As can be clearly seen from the figure, the optical alignment detecting device of the present invention includes a detecting unit. 1. The polarization adjusting unit 2 and the object to be detected 3, wherein the detecting unit 1 includes a light source emitter 11, a beam expander 12 and a light detector 13, and the light source emitter 11 is provided with a light source projection hole 110, The laser light can be projected outward to the beam expander 12, and the light source receiving surface 1 is provided with a light source receiving surface 1 21 for receiving the laser light source projected by the light source emitter 11, and the beam expander 12 then spreads the received laser light source outwardly from the other side of the light source expansion surface 122 for the light source emitter 11 to expand the beam. The photodetector 13 on the other side of the device 12 receives the laser light source from the one side light receiving surface 131.

該偏光調整單元2係包括二相對之第一光線偏光片21、第二光線偏光片22及位於第一、第二光線偏光片21、22相對內側並靠近第一光線偏光片21側邊之波片23。 The polarization adjusting unit 2 includes two opposite first ray polarizers 21, second ray polarizers 22, and waves located on opposite sides of the first and second ray polarizers 21, 22 and adjacent to the side of the first ray polarizer 21. Slice 23.

該待檢測物3係可為配戴式眼鏡的光學鏡片。 The object to be detected 3 may be an optical lens of the wearable glasses.

上述各構件於實際應用時,係於檢測單元1的光束擴展器12與光檢測器13之間設置偏光調整單元2,以供第一光線偏光片21、第二光線偏光片22分別設置位於光束擴展器12、光檢測器13的相對內側,並於第一、第二光線偏光片21、22之間設置波片23,再於波片與第二光線偏光片22之間設置待檢測物3,即可透過檢測單元1之光源發射器11由光源投射孔110投射雷射光至光束擴展器12,利用光束擴展器12將雷射光源擴展後、投射至偏光調整單元2、待檢測物3,使雷射光源被光檢測器13接收,達到對待檢測物3進行檢測之目的,而利用檢測單元1、偏光調整單元2及待檢測物3,組構成本發明之光學對位檢測裝置。 In the actual application, the polarizing adjustment unit 2 is disposed between the beam expander 12 and the photodetector 13 of the detecting unit 1 for the first light polarizing film 21 and the second light polarizing film 22 to be respectively disposed in the light beam. The opposite side of the expander 12 and the photodetector 13 is disposed between the first and second ray polarizers 21 and 22, and the object to be detected 3 is disposed between the wave slab and the second ray polarizer 22. The light source emitter 11 of the detecting unit 1 can be used to project the laser light from the light source projection hole 110 to the beam expander 12, and the beam expander 12 expands the laser light source and projects it to the polarization adjusting unit 2 and the object to be detected 3. The laser light source is received by the photodetector 13 to detect the object 3 to be detected, and the optical alignment detecting device of the present invention is constituted by the detecting unit 1, the polarization adjusting unit 2, and the object to be detected 3.

而上述該檢測單元1之光源發射器11,係可為雷射光之光源發射器11或其它光源型式之光源發射器11,以供光源發射器11可發射波長為532nm之綠光雷射光源、且功率可為20mw等,各種型式之雷射光源或是其它型式之光源。 The light source emitter 11 of the detecting unit 1 may be a light source emitter 11 of a laser light or a light source emitter 11 of another light source type, so that the light source emitter 11 can emit a green light laser source with a wavelength of 532 nm. And the power can be 20mw, etc., various types of laser light source or other types of light source.

且上述檢測單元1之光束擴展器12,係為可變光之光束擴展器12,且可將光源接收面121自光源發射器11所接收之光源,進行2倍~8倍(2x~8x)等的倍率放大,再由光源擴展面122將放大的雷射光源向外擴充至偏光調整單元2,以增加待檢測物3接收光源的檢測面積,並投射至光檢測器13,則供光檢測器13接收較大檢測面積的光源,以更準確進行穿透待檢測物3之光源強度、圓偏振光等的檢測。 The beam expander 12 of the detecting unit 1 is a variable light beam expander 12, and the light source receiving surface 121 can be received from the light source 11 by a light source of 2 times to 8 times (2x~8x). The magnification of the magnification is enlarged, and then the amplified laser light source is expanded outward to the polarization adjusting unit 2 by the light source expansion surface 122 to increase the detection area of the light source to be detected by the object 3 to be detected, and is projected to the light detector 13, and the light is detected. The device 13 receives the light source of a larger detection area to more accurately detect the intensity of the light source penetrating the object to be detected 3, the circularly polarized light, and the like.

另,該檢測單元1之光檢測器13,為包括有預設電路佈局、內建應用程式之處理器或晶片等,可進行計算自偏光調整單元2、待檢測物3所接收之光源強度、圓偏振光旋轉方向,以達到對待檢測物3進行光學對位檢測之目的,以供待檢測物3獲得合適的偏光方向、角度等,並於實際應用實施進行觀看3D影像時,可減少發生穿透軸傾斜、串擾等現象。 In addition, the photodetector 13 of the detecting unit 1 is a processor or a chip including a preset circuit layout and a built-in application, and can calculate the intensity of the light source received by the self-polarization adjusting unit 2 and the object to be detected 3, The direction of rotation of the circularly polarized light is used for the purpose of optical alignment detection of the object to be detected 3, so that the object 3 can obtain a suitable polarization direction, angle, etc., and can reduce the occurrence of wear when viewing 3D images in practical applications. Through-axis tilt, crosstalk and other phenomena.

又上述該偏光調整單元2之第一光線偏光片21、第二光線偏光片22(Light Polarized),係可分別為含奈米級矽酸鈉之玻璃片(Nanoparticles in Sodium-Silicate Glass);而波片23材料則為結晶石英(Crystalline Quartz),並可產生相位延遲1/4波長或其它相位延遲波片23等。 Further, the first light polarizing film 21 and the second light polarizing film 22 (Light Polarized) of the polarizing adjusting unit 2 may be Nanoparticles in Sodium-Silicate Glass, respectively; The material of the wave plate 23 is crystalline quartz (Crystalline Quartz), and can generate a phase retardation 1/4 wavelength or other phase retardation wave plate 23 and the like.

至於上述受到該檢測單元1、偏光調整單元2檢測之待檢測物3,係可為配戴式眼鏡的光學鏡片或其它光學鏡片等。 As for the object 3 to be detected detected by the detecting unit 1 and the polarization adjusting unit 2, it may be an optical lens or other optical lens of the wearing glasses.

請參閱第一、二、三、四圖所示,係為本發明之立體分解 圖、較佳實施例之立體分解圖、檢測方法之流程圖(一)、檢測方法之流程圖(二),由圖中所示可以清楚看出,本發明之光學對位檢測裝置,為於實際應用實施時,可利用檢測單元1、偏光調整單元2對待檢測物3進行光學檢測,其檢測之步驟為: Please refer to the first, second, third and fourth figures, which is a three-dimensional decomposition of the present invention. The figure, the exploded view of the preferred embodiment, the flow chart of the detecting method (1), and the flow chart of the detecting method (2), it can be clearly seen from the figure that the optical alignment detecting device of the present invention is When the actual application is implemented, the detection unit 1 and the polarization adjustment unit 2 can be used for optical detection of the object 3, and the detection steps are as follows:

(A)利用檢測單元1之光源發射器11,由光源投射孔110投射雷射光源至光束擴展器12。 (A) Using the light source emitter 11 of the detecting unit 1, the laser light source is projected from the light source projection hole 110 to the beam expander 12.

(B)則由光束擴展器12一側之光源接收面121、接收光源發射器11之光源,並將接收之光源進行擴展後,再由另側之光源擴展面122將光源擴展、投射至偏光調整單元2及待檢測物3。 (B) The light source receiving surface 121 on the side of the beam expander 12 receives the light source of the light source emitter 11 and expands the received light source, and then expands and projects the light source to the polarized light by the light source expansion surface 122 on the other side. The unit 2 and the object to be detected 3 are adjusted.

(C)且光束擴展器12投射光源穿透偏光調整單元2之第一光線偏光片21、波片23,而供第一光線偏光片21、波片23產生左旋或右旋方式旋轉之圓偏振光。 (C) and the beam expander 12 projects the light source to penetrate the first ray polarizer 21 and the wave plate 23 of the polarization adjusting unit 2, and the first ray polarizer 21 and the wave plate 23 generate circular polarization in a left-handed or right-handed manner. Light.

(D)並供光源再依序穿透待檢測物3及第二光線偏光片22後,即被檢測單元1之光檢測器13接收。 (D) and after the light source sequentially penetrates the object to be detected 3 and the second light polarizing film 22, it is received by the photodetector 13 of the detecting unit 1.

(E)即由光檢測器13進行檢測穿透偏光調整單元2及待檢測物3之光源,若待檢測物3與波片23產生偏振光旋轉方向(左旋或右旋)相反,即執行步驟(F);若待檢測物3與波片23產生偏振光旋轉方向(左旋或右旋)相同,即執行步驟(G)。 (E) that is, the light detector 13 detects the light source that passes through the polarization adjusting unit 2 and the object to be detected 3. If the object to be detected 3 and the wave plate 23 are opposite to the direction of rotation of the polarized light (left-handed or right-handed), the steps are performed. (F); if the object to be detected 3 and the wave plate 23 generate the same direction of polarization (left-handed or right-handed), the step (G) is performed.

(F)而圓偏振光穿透待檢測物3後,偏振光旋轉方向(左旋或右旋)完全抵消,還原偏振方向,則供第一光線偏光片21與第二光線偏光片22之穿透軸形成正交,以供光源穿透待檢測物3、第二光線偏光片22時,偏振光源即被抵消,光檢測器13所接收光源強度最小值 〔0〕。 (F) After the circularly polarized light penetrates the object to be detected 3, the direction of polarization of the polarized light (left-handed or right-handed) completely cancels, and the polarization direction is reduced, and the first light-polarizing sheet 21 and the second light-polarizing sheet 22 are penetrated. When the axes are orthogonal to each other for the light source to penetrate the object to be detected 3 and the second light polarizer 22, the polarized light source is cancelled, and the intensity of the light source received by the photodetector 13 is minimum. [0].

(G)待檢測物3與波片23產生偏振光旋轉方向(左旋或右旋)未完全抵消,偏振光源穿透待檢測物3及第二光線偏光片22後產生橢圓偏振光,而經由第二光線偏光片22穿透軸限制,留下穿透軸方向之偏光,則光檢測器13所接收之光源強度不為零〔0〕,並供光檢測器13利用接收光源之強度關系,計算出待檢測物3之偏光旋轉角度〔θ〕。 (G) the direction of rotation of the polarized light (left-handed or right-handed) generated by the object to be detected 3 and the wave plate 23 is not completely canceled, and the polarized light source penetrates the object to be detected 3 and the second light-polarized sheet 22 to generate elliptically polarized light, and The light ray polarizer 22 penetrates the axis to limit the polarization of the light passing through the axis, and the intensity of the light source received by the photodetector 13 is not zero [0], and the light detector 13 calculates the intensity relationship of the receiving light source. The polarization rotation angle [θ] of the object 3 to be detected is determined.

而上述該步驟(A)之檢測單元1,其光源發射器11係可為投射雷射光之光源發射器11或其它光源型式之光源發射器11,以供發射波長為532nm之綠光雷射光源、且功率為20mw等或是其他型式之光源,且光源發射器11一側具有光源投射孔110可向外投射雷射光源,而光束擴展器12一側設有光源接收面121對位光源投射孔110、另側設有光源擴展面122、係可將雷射光源向外擴充至偏光調整單元2,以增加待檢測物3接收光源的檢測面積,並投射至光檢測器13,則供光檢測器13接收較大檢測面積的光源,以更準確進行光源強度之檢測。 In the above-mentioned detecting unit 1 of the step (A), the light source emitter 11 may be a light source emitter 11 for projecting laser light or a light source emitter 11 of other light source type for emitting a green light laser source having a wavelength of 532 nm. And the power is 20mw or the like or other types of light sources, and the light source emitter 11 has a light source projection hole 110 for projecting the laser light source outward, and the beam expander 12 side is provided with the light source receiving surface 121 for the positional light source projection. The hole 110 and the other side are provided with a light source expansion surface 122, which can expand the laser light source outward to the polarization adjusting unit 2 to increase the detection area of the light source to be detected by the object to be detected 3, and project it to the light detector 13, and then supply light. The detector 13 receives a light source of a larger detection area to more accurately detect the intensity of the light source.

且上述該步驟(B)之檢測單元1的光束擴展器12,係為可變光束擴展器,並可將所接收光源進行2倍~8倍(2x~8x)等的倍率放大。 Further, the beam expander 12 of the detecting unit 1 of the above step (B) is a variable beam expander, and the received light source can be amplified by a magnification of 2 times to 8 times (2x to 8x).

另,上述該步驟(C)、(D)之偏光調整單元2的第一、第二光線偏光片21、22(Light Polarized),係可分別為含奈米級矽酸鈉之玻璃片(Nanoparticles in Sodium-Silicate Glass)材質或其他材質等;而波片23材料可為結晶石英(Crystalline Quartz),並可產生相位延遲1/4波長或其它相位延遲波片23等。 In addition, the first and second light polarizing sheets 21 and 22 (Light Polarized) of the polarization adjusting unit 2 of the above steps (C) and (D) are respectively glass sheets containing nanometer sodium citrate (Nanoparticles). In Sodium-Silicate Glass) material or other materials; and the wave plate 23 material may be crystalline quartz (Crystalline Quartz), and may generate a phase retardation 1/4 wavelength or other phase retardation wave plate 23 and the like.

至於上述各步驟中利用檢測單元1、偏光調整單元2進行檢測之待檢測物3,係可為配戴式眼鏡的光學鏡片或其它型式之光學鏡片。 As for the object to be detected 3 detected by the detecting unit 1 and the polarization adjusting unit 2 in the above steps, it may be an optical lens of the wearing glasses or other types of optical lenses.

又,上述步驟(G)中,該檢測單元1之光檢測器13為包括有預設電路佈局、內建應用程式之處理器或晶片等,並利用自偏光調整單元2、待檢測物3所接收光源之強度關系,透過處理器或晶片等予以計算出待檢測物3之偏光旋轉角度〔θ〕,例如:5°、10°、15°、20°或25°等,進而可達到對待檢測物3進行光學對位檢測之目的,以供待檢測物3能獲得合適的偏光方向、角度等,則於實際應用實施進行觀看3D影像時,能減少發生穿透軸傾斜、串擾等現象,提升應用時穩定性之功效。 In the above step (G), the photodetector 13 of the detecting unit 1 is a processor or a chip including a preset circuit layout and a built-in application, and uses the self-polarization adjusting unit 2 and the object to be detected 3 Receiving the intensity relationship of the light source, calculating the polarization rotation angle [θ] of the object to be detected 3 through a processor or a wafer, for example, 5°, 10°, 15°, 20° or 25°, etc., thereby achieving detection The object 3 performs the optical alignment detection purpose, so that the object 3 to be detected can obtain a suitable polarization direction, an angle, etc., and when the 3D image is viewed in practical applications, the phenomenon of penetrating axis tilt and crosstalk can be reduced, and the phenomenon can be improved. The effectiveness of application stability.

是以,以上所述僅為本發明之較佳實施例而已,非因此侷限本發明之專利範圍,本發明之光學對位檢測裝置及其檢測方法,係利用檢測單元1之光源發射器11投射光源至光束擴展器12,將光源進行擴展後投射至偏光調整單元2之第一光線偏光片21、波片23、待檢測物3及第二光線偏光片22後,則供穿透偏光調整單元2、待檢測物3之光源,被檢測單元1之光檢測器13接收,再由光檢測器13利用接收光源強度之關係,進行計算待檢測物3之偏光方向、角度,俾可達到對待檢測物3進行光學對位、檢測之目的,且減少待檢測物3發生穿透軸傾斜、串 擾現象之功效,提升待檢測物3應用時之穩定性,故舉凡可達成前述效果之結構、裝置皆應受本發明所涵蓋,此種簡易修飾及等效結構變化,均應同理包含於本發明之專利範圍內,合予陳明。 Therefore, the above description is only a preferred embodiment of the present invention, and is not limited to the patent scope of the present invention. The optical alignment detecting device and the detecting method thereof of the present invention are projected by the light source emitter 11 of the detecting unit 1. The light source is extended to the beam expander 12, and after the light source is expanded and projected onto the first light polarizing film 21, the wave plate 23, the object to be detected 3, and the second light polarizing film 22 of the polarization adjusting unit 2, the light is transmitted through the polarization adjusting unit. 2. The light source of the object to be detected 3 is received by the photodetector 13 of the detecting unit 1, and the photodetector 13 uses the relationship between the intensity of the receiving light source to calculate the polarization direction and angle of the object 3 to be detected. The object 3 performs optical alignment and detection purposes, and reduces the inclination of the through-axis of the object to be detected 3, and the string The effect of the disturbance phenomenon is to improve the stability of the object to be tested 3, so that the structures and devices that can achieve the aforementioned effects are covered by the present invention, and such simple modifications and equivalent structural changes should be included in the same reason. Within the scope of the patent of the present invention, it is combined with Chen Ming.

故,本發明為主要針對光學對位檢測裝置及其檢測方法進行設計,係利用檢測單元之光源發射器投射光源至光束擴展器,以將光源擴展後、投射至偏光調整單元之第一光線偏光片、波片、待檢測物及第二光線偏光片,最後由檢測單元之光檢測器將光源接收,並依據接收光源強度關係計算待檢測物的偏光方向、角度等,而可達到對待檢測物進行光學對位檢測為主要保護重點,且減少發生穿透軸傾斜、串擾現象,乃僅使待檢測物獲得合適偏光角度之優勢,而於實際應用時更穩定之功效,惟,以上所述僅為本發明之較佳實施例而已,非因此即侷限本發明之專利範圍,故舉凡運用本發明說明書及圖式內容所為之簡易修飾及等效結構變化,均應同理包含於本發明之專利範圍內,合予陳明。 Therefore, the present invention is mainly directed to an optical alignment detecting device and a detecting method thereof, which utilizes a light source emitter of a detecting unit to project a light source to a beam expander to expand the light source and project the first light polarized light to the polarization adjusting unit. The film, the wave plate, the object to be detected and the second light polarizer are finally received by the light detector of the detecting unit, and the polarization direction and angle of the object to be detected are calculated according to the intensity relationship of the receiving light source, thereby achieving the object to be detected Optical alignment detection is the main protection focus, and the occurrence of penetration axis tilt and crosstalk phenomenon is reduced, which only makes the object to be detected have the advantage of obtaining a proper polarization angle, and is more stable in practical application, but only the above The preferred embodiments of the present invention are not intended to limit the scope of the invention, and all modifications and equivalent structural changes made by the description and drawings of the present invention should be construed as equivalent to the invention. Within the scope, it is combined with Chen Ming.

綜上所述,本發明上述之光學對位檢測裝置及其檢測方法於實際執行、實施時,為確實能達到其功效及目的,故本發明誠為一實用性優異之研發,為符合發明專利之申請要件,爰依法提出申請,盼 審委早日賜准本案,以保障發明人之辛苦研發、創設,倘若 鈞局暨貴審查委員有任何稽疑,請不吝來函指示,發明人定當竭力配合,實感德便。 In summary, the optical alignment detecting device and the detecting method thereof according to the present invention can achieve the efficacy and purpose when actually implemented and implemented, so the present invention is an excellent research and development, and is in conformity with the invention patent. The application requirements, 提出 apply in accordance with the law, and hope that the trial committee will grant the case as soon as possible to protect the inventor's hard work in research and development, creation, if there is any doubt in the bureau and your review committee, please do not hesitate to give instructions, the inventor will try his best to cooperate, Real sense of virtue.

Claims (5)

一種光學對位檢測方法,係包括檢測單元、偏光調整單元及待檢測物,而對待檢測物進行檢測之步驟:(A)檢測單元之光源發射器投射光源至光束擴展器;(B)光束擴展器將接收之光源進行擴展後,再將光源投射至偏光調整單元及待檢測物;(C)光束擴展器投射光源穿透偏光調整單元之第一光線偏光片、波片,而供第一光線偏光片、波片產生旋轉之圓偏振光;(D)光源再依序穿透待檢測物及第二光線偏光片後,即被檢測單元之光檢測器接收;(E)光檢測器進行檢測穿透偏光調整單元及待檢測物之光源,若待檢測物與波片產生偏振光旋轉方向相反,即執行步驟(F);若待檢測物與波片產生偏振光旋轉方向相同,即執行步驟(G);(F)圓偏振光穿透待檢測物後,圓偏振光旋轉方向完全抵消,還原圓偏振方向,則供第一光線偏光片與第二光線偏光片之穿透軸形成正交,以供光源穿透待檢測物、第二光線偏光片時,圓偏振光源被抵消,光檢測器接收光源強度趨近於最小值〔0〕;(G)待檢測物與波片產生圓偏振光旋轉方向未完全抵消,偏振光源穿透待檢測物及第二光線偏光片後產生橢圓偏振光,而經由第二光線偏光片穿透軸限制,留下穿透軸方向之橢圓偏振光,則光檢測器所接收之光源強度不為零〔0〕,即由光檢測器利用 接收光源之強度關係,計算出待檢測物之偏光旋轉角度。 An optical alignment detecting method comprising the detecting unit, the polarization adjusting unit and the object to be detected, and detecting the object to be detected: (A) the light source emitter of the detecting unit projects the light source to the beam expander; (B) the beam expanding After expanding the received light source, the light source is projected to the polarization adjusting unit and the object to be detected; (C) the beam expander projecting the light source through the first light polarizer and the wave plate of the polarization adjusting unit for the first light The polarizer and the wave plate generate a rotating circularly polarized light; (D) the light source sequentially passes through the object to be detected and the second light polarizer, and is received by the photodetector of the detecting unit; (E) the photodetector detects Passing through the polarization adjusting unit and the light source of the object to be detected, if the object to be detected and the wave plate are rotated in opposite directions, the step (F) is performed; if the object to be detected and the wave plate are rotated in the same direction, the steps are performed. (G); (F) after the circularly polarized light penetrates the object to be detected, the direction of rotation of the circularly polarized light is completely canceled, and the circular polarization direction is restored, and the transmission axis of the first light polarizer and the second light polarizer are orthogonal to each other. To When the light source penetrates the object to be detected and the second light polarizer, the circularly polarized light source is cancelled, and the light source receives the intensity of the light source to be close to a minimum value [0]; (G) the object to be detected and the wave plate generate a circularly polarized light rotating direction. Not completely canceled, the polarized light source penetrates the object to be detected and the second light polarizer to produce elliptically polarized light, and is restricted by the second light polarizer through the axis, leaving elliptically polarized light in the direction of the axis, and the photodetector The intensity of the received light source is not zero [0], that is, it is utilized by the photodetector The intensity relationship of the light source is received, and the polarization rotation angle of the object to be detected is calculated. 如申請專利範圍第1項所述之光學對位檢測方法,其中該步驟(A)之檢測單元,光源發射器係為雷射光源發射器,以供發射波長為532nm之綠光雷射光源、且功率為20mw,且光源發射器一側具有向外投射雷射光源之光源投射孔,而光束擴展器一側設有對位光源投射孔之光源接收面、另側設有將雷射光源向外擴充至偏光調整單元以增加待檢測物的檢測面積之光源擴展面。 The optical alignment detecting method according to claim 1, wherein the detecting unit of the step (A) and the light source emitter are laser light source emitters for emitting a green light laser source having a wavelength of 532 nm, And the power is 20mw, and the light source emitter side has a light source projection hole for projecting the laser light source outward, and the beam expander side is provided with a light source receiving surface of the alignment light source projection hole, and the other side is provided with a laser light source The light source expansion surface is expanded to the polarization adjustment unit to increase the detection area of the object to be detected. 如申請專利範圍第1項所述之光學對位檢測方法,其中該步驟(B)之檢測單元的光束擴展器,係為可變光束擴展器,且將所接收光源進行2倍~8倍(2x~8x)的倍率放大,該光束擴展器接收光源後投射至偏光調整單元及待檢測物,而於偏光調整單元的第一光線偏光片、波片、待檢測物、第二光線偏光片及光檢測器間形成光源穿透之穿透軸。 The optical alignment detecting method according to claim 1, wherein the beam expander of the detecting unit of the step (B) is a variable beam expander, and the received light source is doubled to 8 times ( 2x~8x) magnification amplification, the beam expander receives the light source and then projects to the polarization adjustment unit and the object to be detected, and the first light polarizer, the wave plate, the object to be detected, the second light polarizer and the polarizing adjustment unit The light detectors form a transmission axis through which the light source penetrates. 如申請專利範圍第1項所述之光學對位檢測方法,其中該步驟(B)之。步驟(C)、(D)之偏光調整單元的第一、第二光線偏光片(Light Polarized),係分別為含奈米級矽酸鈉之玻璃片(Nanoparticles in Sodium-Silicate Glass);而波片材料則為結晶石英(Crystalline Quartz),並產生相位延遲波長或其它相位延遲波片;且受到檢測單元、偏光調整單元檢測之待檢測物係為配戴式眼鏡的光學鏡片。 The optical alignment detecting method according to claim 1, wherein the step (B) is used. The first and second light polarizing sheets of the polarizing adjusting unit of steps (C) and (D) are respectively Nanoparticles in Sodium-Silicate Glass; and the waves are respectively The sheet material is crystalline quartz (Crystalline Quartz), and generates a phase retardation wavelength or other phase retardation wave plate; and the object to be detected detected by the detecting unit and the polarization adjusting unit is an optical lens of the wearing glasses. 如申請專利範圍第1項所述之光學對位檢測方法,其中該檢測單元之 光檢測器為包括有預設電路佈局、內建應用程式之處理器或晶片。 The optical alignment detecting method according to claim 1, wherein the detecting unit The photodetector is a processor or chip that includes a preset circuit layout, a built-in application.
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Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
Joel R. Blum,"An Economical Means for Accurate Azimuthal Alignment of Polarization Optics", 2005 Meadowlark Optics, Inc.
Joel R. Blum,"An Economical Means for Accurate Azimuthal Alignment of Polarization Optics", 2005 Meadowlark Optics, Inc. Turan Erdogan,"A New Class of polarization Optics Designed Specifically for Lasers",Semrock Technical Note Series,/https://www.semrock.com/Data/Sites/1/semrockpdfs/whitepaper_anewclassofpolarizationopticsforlasers.pdf *
Turan Erdogan,"A New Class of polarization Optics Designed Specifically for Lasers",Semrock Technical Note Series,/https://www.semrock.com/Data/Sites/1/semrockpdfs/whitepaper_anewclassofpolarizationopticsforlasers.pdf

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