TWI659214B - Inspection apparatus and a method of operating an inspection apparatus - Google Patents

Abstract

The invention relates to a method for operating a machine tool device. The machine tool includes at least a first mandrel and a second mandrel, and at least a respective first measurement system and a second measurement system for measuring the location of the machine tool. The at least one of the first nominally the same component and the second nominally the same component of the complex array on the second nominally the same point, the method includes: for each set of nominally the same point, sequentially causing the A first relative movement between the component and the measurement system to use one of the measurement systems to measure one of the components; and then cause one of the component and the measurement system to A second relative movement to measure the other of the components using other measurement systems.

Description

Detection equipment and method for operating detection equipment

The present invention relates to a detection device and a method for operating a detection device. In particular, the present invention relates to a machine tool and a method for operating a machine tool.

A computer numerical controller (CNC) machine tool is known, in which a CNC controller controls a plurality of machine axes, thereby allowing a cutting tool to contact a workpiece in a specific position within the capacity of the machine. These axes are controlled by instructions provided in a CNC part program loaded into the machine at the end-user point. Generally, if many nominally the same components need to be used as a part of a large-scale production drill, an identical CNC component program can be run on many identical CNC machines set up in the same way. In some cases, it is not efficient to operate a single mandrel system per CNC machine for the efficiency of space on a factory site or for other reasons. In these cases, some users prefer CNC machines with multiple spindles in a single machine. On these machines, multiple mandrels may be connected to a single CNC controller system that is operated such that each mandrel on the machine performs a nominally the same movement. In some cases, a solid axis may be shared. For example, a common configuration consists of a large workbench controlled by X and Y axis controllers. Above the table there are two mandrels that are controlled by the "Z" axis of the machine. This allows a single part machining program to cut two identical workpieces simultaneously. In this configuration, each mandrel is typically allowed to temporarily shift independently in one of the "Z" directions (typically along the axis of a rotating tool) to allow for differences in the assembly of the cutting tool. However, since the X and Y axes are shared, it is impossible to provide the position and rotation offset of one workpiece independently of each other. Accordingly, these mandrels are said to be "controlled" with each other. On CNC machine tools, mandrel detection is usually used. It is known to use mandrel detection, for example, as a pass / fail inspection and as a method of setting machine offset. In these cases, the CNC can control the manufacturer to provide a programming function that moves the machine until an electrical input is increased by the detection system (for example, when the probe contacts the surface of the workpiece and triggers). At the precise point in time after the electrical input has been received by the CNC controller, the machine controller records the position of its axis and also starts the process of stopping the axis of the machine. Once the machine has been stopped, the machine position at the time of the probe trigger is available in machine variables and can be used by a program to start calculations, including the application of pre-recorded compensation data for proprietary probes, feature size calculations, etc.

The present invention relates to an improvement in the measurement of a plurality of components on a machine tool having a plurality of mandrels (specifically, a plurality of controlled mandrels). For example, as described in more detail below, the present invention relates to a method of operating a machine tool device including at least a first mandrel and a second mandrel and at least a respective first measurement system and a second measurement. system. The method can be used to measure a plurality of points (for example, nominally the same points) on at least a first part and a second part (for example, nominally the same parts) of the machine tool. The method may include performing several (eg, repetitive) machine moves, with each component performing one machine move. Each machine movement may include driving the first and second components and the first and second measurement systems relative to each other. This relative movement of the components and their respective measurement systems can occur together / simultaneously. The output (s) of these different measurement systems can be used for different machine movements. According to a first aspect of the present invention, there is provided a method of operating a detection / positioning (eg, machine tool) device, the device comprising (eg, at least a first mandrel and a second mandrel and) at least a first amount of each Measurement system and second measurement system. The method may include measuring nominally the same points in a plurality of arrays located on at least the respective first component and the second component (eg, positioned in the detection / positioning device, such as a machine tool). The method may include sequentially / continuously for each group of nominally the same points (for example, to make successive measurements of the nominally the same point group) cause a first relative movement between the components and the measurement system One of the components is measured using one of the measurement systems (for example, a first component may be measured by a first probe). The method may include subsequently causing a second relative movement between the components and the measurement system to measure the other of the components using the other measurement system (e.g., a second probe may be used to measure a Second part). In this manner, a first point (for example, a first point on a first object) of each set of measurement points can be collected during the first relative movement and each set of measurements can be collected during the second relative movement. The second point of a point (eg, one of the second objects is nominally the same point). In this way, the nominally identical points of each group are continuously obtained. For example, collecting a first set of nominally identical points before a second set of nominally identical points. It has been found that this method of sequentially collecting the nominally identical points of each group is faster than measuring all the required points of a first object and then repeating the same measurement of the second and any subsequent objects. Accordingly, during the first relative movement, one of the measurement systems may be referred to as active / current use, and one of the measurement systems may be referred to as non-active / current Unused / inhibited, and during the second relative movement, the second measurement systems may be referred to as active / used, and the first measurement systems may be referred to as inactive / currently unused / inhibited . The second relative movement may include a repetition of one of the first relative movements. In other words, the method may include repeating the relative movement between the components and the measurement system to measure the other of the components using other measurement systems. In this way, the first point (for example, a point on the first object) of each group of measurement points can be collected during the first relative movement, and the group of measurement points can be collected during the second / repeated movement. Second point (for example, one of the second objects is nominally the same point). The repeated movement may include a nominally the same movement. For example, this subsequent movement can be used as the initial / first movement using the same machine instructions. The first relative movement may include a movement of a component toward the measurement systems. The second relative movement may include movement of the components away from the measurement systems. In this way, the first point of each set of measurement points can be collected during the movement of the measurement system toward the component, and the first point of each set of measurement points can be collected during the movement of the measurement system away from the component. two points. As will be appreciated, during such movements (eg, during initial and subsequent / repeated movements), two components and / or two measurement systems may be moved together / simultaneously. The at least first component and the second component may include, for example, at least a first tool base and a second tool base (e.g., at least a first mandrel and a second mandrel) mounted in the positioning / detection device. First tool and second tool. Exemplary tools include cutting, grinding, and / or milling tools. The at least first measurement system and the second measurement system may include a first tool mounter and a second tool mounter. The tool mounters may be non-contact tool mounters. The tool mounters may be contact tool mounters. The at least first component and the second component may include at least a first workpiece and a second workpiece. The at least first measurement system and the second measurement system may include one of The first probe and the second probe. The first probe and the second probe may include a contact probe, and the contact probes include a deflectable tip pen. The probes can be configured to provide a signal indicative of stylus deflection. The probes can be configured to provide a signal indicative of the degree of deflection (e.g., can be an analog or scanning probe). The probes can be configured to provide a signal that the deflection has occurred (eg, a threshold deflection has occurred). For example, the first probe and the second probe may be touch-trigger probes. The first probe and the second probe may be the same type. The first measurement system and / or the second measurement system may be configured to wirelessly communicate with a receiver. A separate receiver may be provided to communicate with the first measurement system and the second measurement system. Alternatively, the first measurement system and the second measurement system may communicate with a common / same receiver (eg, a plurality of measurement probes may communicate with a single receiver unit). The first measurement system and / or the second measurement system may be configured to communicate with a receiver via radio signals and / or optical signals. These optical signals may be visible or invisible. Both the at least first measurement system and the second measurement system can be turned on and / or active during movement (eg, during initial and repeated movements). Both the at least first measurement system and the second measurement system may be configured to provide an output (eg, a stylus deflection signal, such as a trigger signal) during movement (eg, during initial and repeated movements). Accordingly, as described in more detail below, a switching (or suppression) method / system can be used to switch between the outputs of a measurement system used during a move. The machine tool device may include a controller configured to receive inputs from only one measurement system. In other words, the controller can have only one measurement system input. The input may include a SKIP signal input. Accordingly, the controller may have only one SKIP input. Optionally, the controller is configured to receive input from multiple (eg, two or more) measurement systems. The controller may have multiple (e.g., two or more) measurement system inputs. Accordingly, the controller may have multiple (eg, two or more) SKIP inputs. The method may include switching between measuring system outputs. This may enable the output of one of the measurement systems to be used for the measurement of the one of the components (e.g., passed to a controller during the measurement), and the The output of the other is used for the measurement of the other of the components (eg, passed to a controller during the measurement). In other words, the method may include switching between the outputs of the at least first measurement system and the second measurement system such that during an initial movement, the output of one of the measurement systems is passed to the controller, And so that during the subsequent / repeating movement, the output of the other of the measurement systems is passed to the controller. As will be understood, this switch can be operated manually. This switching can be achieved by the machine tool controller. It should also be noted that the first measurement system and the second measurement system may share some common components. For example, signal processing or conditioning electronics may be provided by a common processing unit (e.g., circuits for the first measurement system and the second measurement system may be housed in the same housing or provided on the same circuit board) ). If the controller includes more than one SKIP input, the controller can choose which SKIP input (e.g., monitor) it uses. The machine tool device may include an interface, and the at least first measurement system and the second measurement system provide a signal indicating the deflection of the stylus to the interface. The interface may be configured to provide measurement information (e.g., a stylus deflection signal, such as a trigger signal) from one of the measurement systems and the other of the measurement systems to the controller. Switch. For example, consistent with the above paragraph, the interface can be configured to switch between the outputs of the measurement systems such that the output of one of the measurement systems causes the interface to provide a trigger signal to the The controller and the output of the other of the measurement systems causes the interface to provide a trigger signal to the controller during the subsequent / repeated movement. As will be understood, this switch can be operated manually. The switching may be achieved by a machine tool controller that directs the interface (eg, via an M-coded command). The interface may be integrated or separated from the controller entity. If the controller includes more than one SKIP input, an interface can be provided for each SKIP input. Each interface can be connected to / in communication with more than one measurement system. Each interface can be configured to switch between the outputs of such measurement systems. The machine tool device may include a numerical control (NC) machine tool device, such as a computer numerical control (CNC) machine tool device. The method may include moving at least a first tool base and a second tool base (eg, a mandrel) of the positioning device to cause the relative movement. The method may include moving a table of the machine tool to cause the relative movement. The method may include inhibiting one of the measurement systems during a first (e.g., initial) movement; and then inhibiting the other of the measurement systems during a second (e.g., repeated) movement. This suppression may include, for example: ignoring the output of a measurement system; disabling a measurement system (e.g., a probe and / or its respective receiver); preventing the measurement system (e.g., a probe and / or its (Respective receivers) issue a signal about a component (e.g., about stylus deflection) and / or detection of a switching technology / device, such that a measurement system (e.g., The output of the SKIP signal issued to a controller's probe is switched from one measurement system (such as a probe) to another. The method may include monitoring the output from one of the non-acting / suppressing / currently unused measurement systems. The output can be a measurement signal, a component detection signal (such as a trigger signal). For example, the method may include monitoring deflection of non-acting / inhibiting / currently unused probes. The method may include taking an action in response to such an output, such as in response to a determination that one of the things (such as a triggered thing (such as a deflected thing)) has been detected by the suppressed measurement system. This action may, for example, include: stopping motion; and / or issuing an error / warning signal. Optionally, the inhibited measurement system issues one of the intervals (e.g., scheduled / period / regular intervals) indicating whether it has detected something / measured / triggered (e.g., deflected) signal. The controller may include fewer signal inputs than the number of measurement systems present. One of the devices of the type described in WO01 / 55670 can be used to allow different measurement signals to be passed to the machine tool controller. According to a second aspect of the invention, there is provided a machine tool device configured to operate according to a method as described above. A method for operating a machine tool device is also described herein. The machine tool includes at least a first mandrel and a second mandrel, and at least a first measurement system and a second measurement system for measuring are located in the machine tool. Each of at least the first nominally the same part and the second nominally the same part of the complex array is nominally the same point, the method includes: for each group of nominally the same point in order to cause these parts and A first relative movement between the measurement systems to measure one of the components using one of the measurement systems; and then causing a second relative movement between the components and the measurement system (Eg, a repeated move) to measure the other of the components using other measurement systems. The method may further include any of the additional features described herein. A machine tool device configured to operate in accordance with the method may also be provided. This article also describes a method for measuring the position of a measurement point on the surface of a component, the method comprising the step of moving a measurement probe having a deflectable stylus relative to the component, wherein the measurement Measure the point while the measurement probe moves away from the part. A machine tool device configured to operate in accordance with the method may also be provided.

As will be understood, measurement probe providers usually provide inspection software with their devices, which is written into the native language of the CNC controller platform. The software is designed to control the CNC machine tool to make the best use of the detection system provided by the supplier when combined with the capabilities of the CNC machine. For mandrel detection, a function provided by this software is related to the measurement of features-for example, the measurement of a hole or a line feature includes detecting some measured points and then combining them to calculate the required parameters of the feature, Such as size, offset from nominal, shape error, etc. Multiple features can be combined by customer part programs to represent the results of an entire workpiece (for example) to achieve alignment of a workpiece based on one of two measured holes. Within the software, another feature provides the ability to measure individual probe points. This function is then used by the feature-measurement function. This point measurement function can support different measurement strategies, depending on the capabilities of the CNC machine controller. For example, for some CNC controllers, they require a multi-touch measurement strategy to achieve an effective cycle time, while other CNC controllers do not have this requirement. The present invention is a modification of one of the individual point or feature extraction strategies specifically designed for use on a multi-spindle machine. In this modification, according to an exemplary embodiment of the present invention, a command that controls the CNC controller to monitor which input is embedded in the point acquisition function, so that the CNC command that needs to acquire each point is automatically repeated, and each spindle is repeated once . This function is also, for example, by using a SKIP shared device (such as an interface as described below) or by using a built-in controller function to switch the detection input to which the CNC controller responds. After each measurement point on each mandrel, the measurement position is recorded in a set of fixed CNC variables (by CNC controller); the point measurement function can also copy these CNC variables to known positions To be used by feature-calculation or workpiece-calculation functions. In this way, an individual data point of each mandrel probe (installed on the respective mandrel) can be captured, wherein only the touch itself is repeated for each point. By comparing with a strategy whereby the entire part program is repeated for each probe input, this represents a significant cycle time savings. Each feature-calculation function must also take into account the fact that there are now many sets of probe data. For example, the measurement cycle may report the average result or range of results from each mandrel. However, no matter how the data is retrieved, the process is still the same. A similar procedure is applied to the tool set, whereby the same nominally the same tool is loaded into each machine mandrel. Referring first to FIG. 5, a positioning device in the form of a machine tool device 100 is shown, which includes a machine tool 102, a controller 18, a first receiver 12 and a second receiver 14, and an interface 16. A computer may be provided as appropriate, such as PC 104. The machine tool 102 includes a first mandrel 2 for moving a first measuring probe 6 and a second measuring probe 8 relative to a respective first workpiece 20 and a second workpiece 20 ′ on a table 11 and Motor (not shown) of the second spindle 4. Using an encoder or the like, the positions of the first mandrel 2 and the second mandrel 4 (and therefore the positions of the first probe 6 and the second probe 8) are accurately measured in a known manner. These measurements provide mandrel position data defined in the machine coordinate system (x, y, z). The controller 18 (for example, a computer numerical controller "CNC") controls the movement of the first mandrel 2 and the second mandrel 4 in the working area of the machine tool according to a program, and also receives information about Information on mandrel position. The CNC 18 follows a program that controls a machine tool and can be an automatically or manually generated program. The program may be generated on the computer 104, the controller 18, or may be generated anywhere and input into the controller 18, or a combination thereof (e.g., components are generated anywhere and on the controller 18) modify). FIG. 1 schematically shows the first mandrel 2 and the second mandrel 4 of the machine tool 102 and the respective first and second measuring probes 6 and 8 mounted thereon. In this case, each of the first measurement probe and the second measurement probe has a deflectable stylus and is configured to issue a deflection exceeding a threshold value (for example, a mechanical or electrical determination) One of the stylus deflection signals (such as a trigger signal) touches the probe. The first and second mandrels may be controlled together, for example, as described above, such that, for example, they are fixed and movable in at least the x and y directions to drive the probe to the position of the tool Inside the workpiece on the machine table 11. Optionally, the mandrel may be held and fixed, and then the table 11 of the machine tool may be moved (eg, to move the workpiece into the probe). Depending on the situation, a combination of mandrel movement and table movement is possible. The first measurement probe 6 and the second measurement probe 8 are in wireless communication with the respective first receiver 12 and the second receiver 14 (in an alternative embodiment, they may be wired). In the embodiment described and shown, a separate receiver is provided. As will be appreciated, however, a common / single receiver can be used to receive signals from multiple measurement systems / probes. This wireless communication may be, for example, radio or optical (visible or invisible). The first receiver 12 and the second receiver 14 are connected to the interface 16 / communicate with the interface 16, and the interface 16 is connected to a controller 18 / communicate with the controller 18. The interface 16 relays a signal (for example, a trigger signal) from the first measurement probe 6 and the second measurement probe 8 to the SKIP input on the controller 18. In this embodiment, the controller 18 has an output (labeled MODE) that can be used to tell the interface 16 whether to use the first probe 6 or the second probe 8 as one of the sources of the SKIP signal. In use, the first probe 6 and the second probe 8 are used to measure the first nominally identical workpiece 20 and the second nominally identical workpiece 20 ′. In particular, the first probe 6 and the second probe 8 are used to measure the nominal number of complex arrays (eg, pairs) on the first nominally identical workpiece 20 and the second nominally identical workpiece 20 '. Points (eg, the first group is nominally the same points 22, 22 '; the second group is nominally the same points 24, 24'; the third group is nominally the same points 26, 26 'and the The four groups have nominally the same points 28, 28 ') (see Figure 2). In this embodiment, the controller 18 has fewer SKIP inputs than the number of spindles / measuring systems (eg, probes). In particular, in this embodiment, the controller has only one SKIP input and is configured to stop machine movement and record the encoder position once a SKIP signal is received. The method according to an embodiment of the present invention includes sequentially measuring the nominal points of each group (for example, pairs) using a repeating machine movement, wherein the outputs of the first probe 6 and the second probe 8 are sequentially used. For example, initially for the first set of nominally the same points 22, 22 ', the method includes causing a double or repeated machine movement such that by using the first probe 6 and the second probe on the first machine movement One of the eight measures the one of the workpieces 20, 20 ', and then measures the other of the workpiece on the second machine movement by using the other of the first probe 6 and the second probe 8. As will be appreciated, on both movements, both the first probe and the second probe move relative to their respective workpieces (and the two probes can, for example, be in contact at a point that is nominally the same Their respective workpieces), but only one of the first probe and the second probe is actually used for measurement on each movement. This can be achieved, for example, by sequentially opening and closing the probes (and their respective receivers) as needed. For example, the first probe 6 is initially turned on; the movement is performed until a SKIP signal is received; the first probe 6 is turned off; the second probe 8 is turned on and the movement is repeated. However, this embodiment can be slow, especially if it takes a long time to warm up the probes. Optionally, the method may be implemented, for example, by a system configured to suppress one of the measurement systems during an initial move and then suppress the other of the measurement systems during repeated moves. This suppression can be achieved, for example, by deactivating the probe and / or its respective receiver, preventing the probe and / or its respective receiver from issuing a signal regarding stylus deflection and / or a switching technique, such that The probe output issued by the SKIP signal to the controller 18 switches from one probe to another. For example, a switching system (such as interface 16) may be configured to switch between probe outputs for issuing a SKIP signal to the controller 18. Accordingly, in one particular example, the interface 16 switches between signals from the probes it uses. For example, regarding the first set of nominally the same points 22, 22 ', the interface 16 may be configured (e.g., based on a MODE signal from the controller) to use only the stylus from the first probe 6 during the initial movement The deflection signal causes a SKIP signal to be received at the controller 18. Accordingly, during this initial movement, the machine tool will be configured to drive the first mandrel 2 and the second mandrel 4 together / simultaneously (for example, because they are controlled by each other) such that the first measurement probe Each of 6 and the second measuring probe 8 is driven toward their respective workpieces 20, 20 '. When the interface 16 receives a signal indicating the deflection of the stylus of the first probe (because the stylus has been driven into the first workpiece 20), it issues a SKIP signal to the controller 18. Then, the machine tool stops moving and records the position of the encoder of the machine tool, so that it can determine the measurement point of the point 22 to be measured on the first workpiece 20 in the coordinate measurement system of the machine tool. As will be understood, during the initial movement, the stylus of the second probe can also be driven into the second workpiece 20 ', and a stylus deflection signal is issued to the interface, but the interface 16 will not pass this signal to Controller. The machine then makes the same machine movement repeat. However, at this time, the interface 16 may be configured (based on the MODE signal from the controller) to use only the stylus deflection signal from the second probe 8 so that a SKIP signal is received at the controller 18. When the interface 16 receives a signal indicating the deflection of the stylus of the second probe (because the stylus has been driven into the second workpiece 20 '), it issues a SKIP signal to the controller. Then, the machine tool stops moving and records the position of the encoder of the machine tool, so that it can determine the measurement point of the point 22 'to be measured on the second workpiece 20' in the coordinate measurement system of the machine tool. As will be understood, during this repeated movement, the stylus of the first probe can also be driven into the first workpiece 20 and a stylus deflection signal is issued to the interface, but the interface 16 will not pass this signal to Controller 18. Since the nominally the same points are measured in turn, once the first set of nominally the same points 22, 22 'are measured, then the machine tool continues to move to use the same repeated movement technique as described above. Measure the next set (eg, pairs) of nominally identical points (eg, the second set of nominally identical points 24, 24 '). In contrast, a first probe will be used to measure part or all of the points on one of the first components 20 and then a second probe will be used to measure part or all of the points on the second components 20 '. Although the procedure of repeatedly measuring nominally the same points using repeated movements requires more switching between the first probe and the second probe, the cycle time can be significantly reduced by avoiding the need to move around the component multiple times. In the embodiments described above, separate receivers 12, 14 are provided. As will be appreciated, however, a common / single receiver can be used to receive signals from multiple measurement systems / probes. For example, as shown in FIG. 6, both the first measurement probe 6 and the second measurement probe 8 may communicate with the first receiver 12. This can be achieved in various ways, such as by using probes operating at different frequencies and / or by using different signal / coding indicators. Additionally or alternatively, instead of the interface (s) provided between the controller (s) and one of the receiver (s) 12, 14 as described in the above embodiments, the interface 16 may communicate directly with the controller 18 . In this case, for example, the interface may be a part of the controller. Depending on the situation, for example, as shown in FIG. 6, the receiver 12 may be directly inserted into the controller 18. In this case, the controller 18 may issue a MODE signal to the receiver to inform the receiver which probe / trigger signal it wants to receive a SKIP signal. FIG. 7 shows an alternative embodiment in which the controller 18 has the same number of SKIP inputs as the mandrel, such as two SKIP inputs (SKIP1 and SKIP2) in this embodiment. However, although the controller 18 has two SKIP inputs, the controller 18 may not be able to handle the synchronous SKIP signal. For example, a controller may be designed to have two SKIP signal inputs so that the controller can handle SKIP signals from multiple systems, where it is known that synchronous SKIP signal processing will not be required. For example, multiple SKIP inputs may have been provided so that the controller 18 may have dedicated inputs for a probe signal receiver and also for a tool mounter (eg, such as described in more detail below), where it is known that it will not be required Synchronous SKIP signal processing. In the embodiment of FIG. 7, the detection program may be programmed such that the SKIP input monitored / registered by the detection program is switched from one to the other. For example, a macro may be provided to monitor the SKIP1 input in a first movement (or movement into a component, as described in more detail below) and to move (or move away from the component) in a second (eg, repeated) movement , As described in more detail below) to monitor SKIP2 input. A similar procedure can be used for tool setting purposes on multi-spindle machines, as the controller has only one SKIP input. For example, FIG. 3 illustrates an embodiment including the first tool mounter 30 and the second tool mounter 40 used when the first tool 50 and the second tool 52 are provided. These tools may be cutting, milling, grinding tools or the like. In this embodiment, the tool mounters are non-contact tool mounters and are generally referred to as beam splitter tool mounters in particular. As will be understood, other types of tool mounters can be used, including contact tool mounters. Each tool mount includes a transmitter 32, 42 for emitting a light beam and a receiver 34, 44 for detecting the light beam. In this case, the receiver issues a signal (eg, a trigger signal) to the interface 16 when the light beam is destroyed by its respective tool. In the same way as above, a repeating machine movement can be used and signals from each receiver can be used in sequence (for example, by using the MODE signal to tell the interface 16 which receiver signal to use as the source of the SKIP signal) to measure The nominal point on each of the one tool and the second tool is the same. As will be understood, in this case, a nominally identical point of a first set may be, for example, at the tip of a tool, and a nominally identical point of a second set may be a first diameter measurement of the tool And a third set of nominally the same points can be measured as a second diameter of the tool. As above, instead of measuring all points on one of the tools and then measuring the tools by repeating machine movements and using the interface 16 between each movement, Measure all the points on the other one by one in order to measure these nominally the same points. As will be appreciated, repeated movements are "repeated" in the sense that the same point on each workpiece is nominally measured several times (e.g., twice) by the respective measurement system. For example, in the embodiment described above in FIG. 2, the probe 6 is engaged with the measurement point 22 multiple times. As will be appreciated, the first movement and the second movement (and any subsequent movements) need not be the same. For example, they may be performed at different speeds, or the components may be approached from different directions, such as having a different path. However, the path of at least repeated movements is nominally the same. Depending on the circumstances, the speed of these repeated movements may be nominally the same. FIG. 8 shows a further exemplary embodiment of a machine tool according to the invention. As with the other described embodiments, the machine tool of FIG. 8 includes two mandrels 2 and 4. However, the first mandrel 2 and the second mandrel 4 are shown twice in FIG. 8 to show that they may each have a probe 6, 8 to measure the objects 20, 20 'at a certain time period (for example, , As described above in conjunction with FIG. 1), and at another time they may each be measured with a first tool mounter 30 and a second tool mounter 40 (eg, as described above in connection with FIG. 3) One tool 50, 52. Similar to the embodiment of FIG. 7, the controller 18 of the embodiment of FIG. 8 includes two SKIP inputs (SKIP1 and SKIP2). However, in this embodiment, SKIP1 is connected to a first interface unit 16 for the first probe signal receiver 12 and the second probe signal receiver 14 and is connected to a second interface unit 16 'for use. On the first tool mounter 30 and the second tool mounter 40. In this case, one of the macros / programs running on the controller 18 can choose which SKIP input to monitor. Accordingly, during a detection path, the controller 18 may be instructed to monitor one of the signals on the SKIP1 input. In addition, consistent with the description above with reference to FIG. 1, a repeated movement operation may be used to measure the first object 20 and the second object 20 ′, and a MODE signal may be supplied to the first interface 16 to tell the first interface 16. Whether to use the first probe 6 or the second probe 8 as a source of the SKIP signal. For example, the MODE signal to the first interface unit 16 can be used such that in a first movement (or in a movement to a component, as described in more detail below), the first probe 6 / receiver 12 is used The signal publishes a SKIP signal to the controller 18 and causes the second probe 8 / receiver 14 to be used during the second (repeated) movement (or during the movement away from the component, as described in more detail below). The signal issues a SKIP signal to the controller 18. At a different point in time, during a tool setting procedure, the controller 18 may then be instructed to monitor one of the signals on the SKIP2 input. Accordingly, for example, in accordance with the description above with reference to FIG. 3, a repeated movement operation may be used to measure the first and second tools 50 and 52 in the first and second mandrels 2 and 4, and the A MODE signal is supplied to the interface 16 'to tell the interface 16' which receiver (34 or 44) signal is used as the source of the SKIP signal in each movement. 4a and 4b, a further embodiment of the present invention will now be described. 4a and 4b again show the first probe 6 and the second probe 8 for measuring the first nominally identical workpiece 20 and the second nominally identical workpiece 20 '. In a manner similar to one of the examples described above, the nominally identical points 122 and 122 'pairs on each workpiece are sequentially measured. In the example described above, there are repeated movements of the first probe 6 and the second probe 8 towards the first nominally identical workpiece 20 and the second nominally identical workpiece 20 'to allow successive measurements of each pair The points are nominally the same. However, it is also possible to measure a first point 122 using the first probe 6 during the movement of the probe toward the workpiece (ie, by sensing when first contacting the surface of the first workpiece 20), but possibly while the probe is away from The second point 122 'is measured using the second probe 8 during the movement of the workpiece (i.e., by sensing when contact with the surface of the second workpiece 20' is broken). In other words, the first probe 6 may be configured to measure a point during a movement toward a surface, while the second probe may be configured to measure a point during a movement away from the surface. This allows the nominally identical points of each pair to be collected during movement towards the workpiece and then away from one of the workpieces. This can often be faster than using two repeated moves. Fig. 4a illustrates how a pair of nominally identical first points 122 are collected during the movement of the probe towards the workpiece. In particular, Fig. 4a shows the movement of the first probe 6 and the second probe 8 towards the first nominally identical workpiece 20 and the second nominally identical workpiece 20 '. During this movement, the first probe 6 is an "active" probe for measurement. For example, as described above, it is possible to provide an interface for issuing a SKIP signal to a machine tool controller when the deflection of the stylus of the first probe 6 occurs (not shown in FIG. 4a or 4b). After receiving the SKIP signal, the machine tool stops moving and records the position of the encoder of the machine tool, so that it can determine the measurement position of the first point 122 on the first workpiece 20 in the coordinate measurement system of the machine tool. . Therefore, the measurement of the first point 122 is performed in a manner similar to one of the measurements of the first point 22 described above with reference to FIG. 1. Figure 4b illustrates how a pair of nominally identical points 122 'can be collected. After the machine tool has stopped following the reception of the SKIP generated by the deflection of the stylus of the first probe 6, the probe moves away from the workpiece (ie, retracted or retracted from the workpiece). During this movement, the interface is guided by the machine tool controller to select the second probe 8 as the "active" probe for measurement. Therefore, when there is no deflection of the stylus of the second probe 8, the interface issues a signal to the machine tool controller. For example, the SKIP signal from the second probe 8 can be reversed in the interface. Receiving a reverse SKIP signal by the machine tool controller (ie, occurs when the second probe breaks contact with the surface) will cause the machine to temporarily stop at a retraction trigger point. Then, when receiving this reverse SKIP signal, the machine tool controller records the position of the encoder of the machine tool, thereby allowing determination of the second point 122 'on the second workpiece 20' in the coordinate measuring system of the machine tool. position. Once the necessary position data is acquired, continuous movement of the probe can occur immediately (for example, any pause in the movement that is not noticeable to the end user). It should also be noted that if the machine tool controller itself can perform an analog function, the interface may not need to reverse the SKIP signal from the second probe 8. For example, the machine tool controller can be programmed (e.g., via a macro call command or parameter) to reverse a SKIP input, thereby allowing operation in the same manner as above (but without the need for an interface to reverse the SKIP signal to). Those skilled in the art will therefore be able to implement this function differently for different machine tool controllers. As will be appreciated, one of the checks that the second probe 8 has been deflected may occur before the removal of the surface is performed. If this check does not occur, an error signal or warning can be issued. The inspection may include instructing the machine to move the probe a small amount (for example, less than 100 µm, such as about 50 µm) and determine whether the movement was successful. If a "trigger" signal is issued by the active probe (i.e. the second probe in this case), for example because the probe has left the surface (and in this case the SKIP signal has been inverted), then The movement will not be successful and so will know that the probe is not on the surface of the object. It should be noted that the first measurement probe 6 and the second measurement probe 8 will preferably be calibrated for the type of measurement for which they will need to be performed. Therefore, a measurement point can be obtained by driving the probe into a surface (for example, a surface for calibrating an artifact) to perform the calibration of the first measurement probe 6 while being used when the probe is moved away from a surface The obtained measurement points are used to calibrate the second measurement probe 8. In this way, accurate measurement points can be obtained for two movements into a workpiece surface and away from the workpiece surface. Although FIGS. 4a and 4b describe a method for measuring a workpiece using a mandrel-mounted probe, various features of other embodiments described herein can also be implemented in this embodiment. For example, the same technique can also be applied to the measurement of tools using a tool mounter. It should also be noted that although a dual mandrel / workpiece configuration is described, there is no reason why this technique cannot be used on a machine tool with three or more mandrels. If more than two mandrels are provided, measurements during movements in and out of the surface can be combined with repeated movements to allow collection of measurements of nominally the same points on three or more objects. In this way, the cycle time required to measure multiple points on multiple objects can be further reduced. As described above, one of the measurement systems is suppressed during any given movement. Accordingly, if the inhibited measurement system and the component are in a position sensing relationship during a movement (for example, the stylus of the probe has been deflected), it will not issue a SKIP / trigger signal or its SKIP / The trigger signal is ignored and so the machine will continue to move. Therefore, there is a risk of a damaging collision between a suppressed measurement system and a component, for example, if the component is not in its intended position. To prevent this from happening, it can be provided to detect this situation (e.g. to detect deflection of non-acting probes) and to take action in response to it (e.g. to stop the movement of the machine and / or Issue an error / warning signal) as one of the collision detection mechanisms. For example, even when the measurement system is suppressed, a status signal (for example, a primary and secondary deflection status signal) separated from the SKIP signal can be issued by the measurement system. This status signal may be received by a machine tool device (e.g., its controller), and an action is taken when the status signal indicates that the measurement system and the component are in a position sensing relationship (e.g., when the stylus of the probe has been deflected) . In one embodiment, a measurement system (e.g., a suppressed measurement system) may be configured to issue at regular intervals indicating whether the measurement system is in a position sensing relationship with something (e.g., the tip of a probe Whether the pen has been deflected). This signal can be separated from and independent of the SKIP signal. Upon receiving this signal indicating that the measurement system is in a position sensing relationship, the machine tool may, for example, stop motion to avoid damage to the measurement system and / or components, and / or issue an error / warning signal .

2‧‧‧ first mandrel

4‧‧‧ second mandrel

6‧‧‧The first measurement probe

8‧‧‧Second measuring probe

11‧‧‧Workbench

12‧‧‧ the first receiver

14‧‧‧Second receiver

16‧‧‧ Interface / Interface Unit

16'‧‧‧Second Interface Unit / Interface

18‧‧‧ Controller

20‧‧‧First Workpiece / First Part

20'‧‧‧Second workpiece / second part

22, 22'‧‧‧ The first group is nominally the same

24, 24'‧‧‧ The second group is nominally the same

26, 26'‧‧‧The third group is nominally the same

28, 28'‧‧‧ The fourth group is nominally the same

30‧‧‧First Tool Installer

32‧‧‧ launcher

34‧‧‧ Receiver

40‧‧‧Second Tool Installer

42‧‧‧ launcher

44‧‧‧ Receiver

50‧‧‧ First Tool

52‧‧‧Second Tool

100‧‧‧tool machine equipment

102‧‧‧tool machine

104‧‧‧Computer

122, 122'‧‧‧ nominally the same

x‧‧‧coordinates

y‧‧‧coordinates

z‧‧‧coordinates

An embodiment of the present invention will be described with reference to the following drawings, wherein: FIG. 1 is a schematic system diagram of a first embodiment of the present invention; FIG. 2 is a plurality of nominally the same points to be measured using the system of FIG. 1 Schematic diagram of one of the first component and the second component which are nominally the same; Figure 3 is a schematic system diagram of a second embodiment of the present invention; Figures 4a and 4b show a further embodiment of the present invention, in which also Measurements are taken when a measurement probe is moved away from a surface; and Figures 5 to 8 are schematic diagrams showing various system architectures for a machine tool according to the present invention.

Claims (25)

A method of operating a positioning device, the positioning device comprising at least a respective first measuring system and a second measuring system for measuring at least the respective first nominally the same component and the second nominally the same The complex arrays on the components are nominally the same points, and the method includes: for each group of nominally the same points, sequentially causing a first relative movement between the components and the measurement systems in order to use the One of the measurement systems to measure one of the components, and then cause a second relative movement between the components and the measurement systems to use the other measurement system to measure the The other of the parts. The method of claim 1, wherein the second relative movement includes a repetition of one of the first relative movements. The method of claim 1, wherein the first relative movement includes movement of the components toward the measurement system, and the second relative movement includes movement of the components away from the measurement system. The method according to any one of claims 1 to 3, wherein the at least first component and the second component include a first one of at least a first tool base and a second tool base that are installed on the positioning device as appropriate Tools and second tools. The method of claim 4, wherein the at least first measurement system and the second measurement system include a first tool mounter and a second tool mounter. The method of any one of claims 1 to 3, wherein the at least first component and the second component include at least a first workpiece and a second workpiece. The method of claim 6, wherein the at least first measurement system and the second measurement system include first probes installed in at least a first tool base and a second tool base of the positioning device as appropriate And the second probe. The method of claim 7, wherein the first probe and the second probe comprise a contact probe having a deflectable stylus and configured to provide a signal indicative of the stylus deflection. The method of any one of claims 1 to 3, wherein the first measurement system and the second measurement system are configured to wirelessly communicate with a receiver. The method of any one of claims 1 to 3, wherein the positioning device includes a controller configured to receive input from only one measurement system. The method of claim 10, wherein the input includes a SKIP signal input. The method of claim 10, which includes switching between the outputs of the measurement systems such that the output of one of the measurement systems is passed to the controller for the amount of the one of the components. And the output of the other of the measurement systems is passed to the controller for the measurement of the other of the components. The method according to any one of claims 1 to 3, wherein the positioning device includes an interface, and the at least first measurement system and the second measurement system provide a signal indicating the deflection of the stylus to the interface. The method of claim 13, wherein the interface is configured to switch between providing measurement information from one of the measurement systems and the other of the measurement systems to the controller. The method according to any one of claims 1 to 3, wherein the at least first measurement system and the second measurement system are both turned on during the movements. The method according to any one of claims 1 to 3, wherein the positioning device comprises a computer numerically controlled positioning device. The method of any one of claims 1 to 3, wherein the method includes moving at least a first tool base and a second tool base of the positioning device to cause the relative movement. The method of claim 4, wherein the first tool base and the second tool base include a first mandrel and a second mandrel. The method of any one of claims 1 to 3, wherein the method includes moving a table of the positioning device to cause the relative movement. A method as claimed in any one of claims 1 to 3, which includes inhibiting one of the measurement systems during the first relative movement, and then inhibiting the other of the measurement systems during the second relative movement. One. The method according to any one of claims 1 to 3, wherein the positioning device comprises a controller, the controller comprising a smaller number of signal inputs than the number of existing measurement systems. The method of any one of claims 1 to 3, wherein the positioning device is a machine tool device. The method of any one of claims 1 to 3, wherein the positioning device includes at least a first mandrel and a second mandrel. A positioning device configured to operate according to a method as in any one of the preceding claims. The positioning device of claim 24, wherein the positioning device comprises a machine tool device.