TWI648958B - Testing method, testing apparatus and testing system - Google Patents

Abstract

A test method, test device, and test system. Use the controller with a signal generator to test. The controller receives multiple test requests of multiple devices to be tested. The controller selects one of the plurality of test frequencies and the plurality of signal strengths included in the test request as a test item, and generates a notification message based on the test item, and broadcasts the notification message to the device to be tested, so that the sending The device under test including the test request of the test item is frequency-locked. The controller drives the signal generator to generate a test signal corresponding to the test item and transmits a test signal to the device under test.

Description

Test method, test device and test system

The present invention relates to a test architecture, and more particularly to a test method, test apparatus, and test system.

With the ever-changing wireless technology, RF (Radio Frequency) testing has become a routine routine for today's mobile communications industry engineers. Test time is an important factor for mobile terminal equipment, so operators are constantly looking for ways to reduce test time and associated costs. In general, when testing the Rx function of the device under test, it is necessary to test multiple frequencies and signal strengths, for example, high frequency/low energy, medium frequency/high energy, low frequency/high energy, and the like.

The traditional test methods are as follows. The first device under test uses three signal generators to simultaneously transmit high frequency signals, intermediate frequency signals, and low frequency signals to a Device Under Test (DUT), so that the devices under test are sequentially locked for verification. The second device to be tested is a signal generator and a device to be tested, and the signal generator generates a corresponding frequency signal/signal intensity according to the frequency to be tested by the device to be tested, and the device to be tested is generated after the signal is generated. The frequency is locked for verification.

However, the first test method requires multiple signal generators to be set up, and the setup environment is difficult, and in order to prevent mutual interference between signals, a higher isolation splitter is needed. And the number of signal generators required is related to the number of frequency points to be tested. In addition, the number of signal generators of the second test mode is related to the number of devices to be tested, so that the more the number of devices to be tested, the more signal generators are needed, resulting in an increase in setup cost.

The invention provides a test method, a test device and a test system, which use a signal generator to perform frequency lock verification.

The testing method of the present invention includes: receiving a plurality of test requests from a plurality of devices to be tested, wherein each device to be tested is connected to the signal generator; and the plurality of test frequencies and the plurality of signal strengths included in the test request Selecting one of them as a test item, and generating a notification message based on the test item; broadcasting a notification message to the device under test, causing the device under test to transmit the test request including the test item to perform frequency locking; and driving the signal The generator generates a test signal corresponding to the test item and transmits a test signal to the device under test.

In an embodiment of the invention, the testing method further includes: storing the received test request into a queue to be processed; driving the signal generator to generate a test signal corresponding to the test item, and transmitting the test After the signal is sent to the device under test, the selected test frequency or signal strength is deleted from the pending queue; one of the remaining test frequencies and signal strengths in the queue to be processed is selected as the test item, and Regenerating another notification message based on the test item; rebroadcasting another notification message to the device under test; and re-driving the signal generator to generate a test signal corresponding to the test item, and transmitting the test signal to the device under test.

In an embodiment of the invention, the step of selecting one of the test frequency and the signal strength included in the test request as a test item comprises: based on a first in first out (FIFO) The algorithm determines to select one of the test frequency and the signal strength as a test item.

In an embodiment of the invention, the step of selecting one of the test frequency and the signal strength included in the test request as a test item comprises: calculating a request quantity of each test frequency and each signal strength; And select one of the most frequently requested test frequencies or signal strengths as the test item.

In an embodiment of the invention, the step of selecting one of the test frequency and the signal strength included in the test request as a test item comprises: calculating a request quantity of each test frequency and each signal strength; The weight of each test frequency and each signal strength is calculated based on the number of requests corresponding to each test frequency and the received time difference, and the weight of each test frequency or signal strength is selected as the test item.

The testing device of the present invention comprises: a signal generator and a controller. The signal generator is coupled to the plurality of devices to be tested. The controller is coupled to the signal generator, and receives a plurality of test requests from the device under test through the communication device. The controller selects one of the plurality of test frequencies and the plurality of signal strengths included in the test request as a test item, generates a notification message based on the test item, and broadcasts the notification message to the device under test through the communication device. The device to be tested that sends the test request including the test item is frequency-locked; the controller drives the signal generator to generate a test signal corresponding to the test item, and transmits a test signal to the device under test.

In an embodiment of the invention, the testing device further comprises: a signal distributor. The signal distributor includes a receiving terminal and a plurality of output terminals, wherein the receiving terminal is coupled to the signal generator, and the output terminals are respectively coupled to the device to be tested.

The test system of the present invention comprises: a plurality of devices to be tested, a signal generator and a controller. The signal generator is coupled to the device under test. The controller is coupled to the signal generator, and receives a plurality of test requests from the device under test through the communication device. The controller selects one of the plurality of test frequencies and the plurality of signal strengths included in the test request as a test item, generates a notification message based on the test item, and broadcasts the notification message to the test by using a signal transmission manner. The device causes the device under test corresponding to the test request to send a test item to perform frequency locking; the controller drives the signal generator to generate a test signal corresponding to the test item, and transmits a test signal to the device under test.

Based on the above, the controller is used with a signal generator to perform testing, and the controller receives the test request of the device under test, and schedules the test requests, and then causes the signal generator to generate a corresponding signal according to the scheduling. Accordingly, multiple signal generators are not required, which saves equipment costs and avoids signal interference between multiple signal generators.

The above described features and advantages of the invention will be apparent from the following description.

The present invention proposes an architecture that can be applied to multiple test frequency points and multiple devices under test by using one signal generator, and the required test time is the same as the conventional method. In order to clarify the content of the present invention, the following specific examples are given as examples in which the present invention can be implemented.

1 is a block diagram of a test apparatus in accordance with an embodiment of the present invention. The test apparatus 100 includes a signal generator 110, a controller 120, a signal distributor 130, and a communication device 140. The signal distributor 130 is, for example, a splitter. The communication device 140 is, for example, a network card, a WiFi chip, a mobile communication chip, a Bluetooth module, or the like. The signal generator 110 is coupled to a plurality of devices to be tested. The controller 120 is coupled to the signal generator 110 and the communication device 140, and receives a plurality of test requests from the plurality of devices under test through the communication device 140. The signal distributor 130 includes a receiving terminal and a plurality of output terminals. The receiving terminal is coupled to the signal generator 110, and the output terminal is coupled to the device to be tested.

In this embodiment, the controller 120 and the signal generator 110 are integrated into the test device 100. However, in other embodiments, the controller 120 may also be disposed on another host.

The controller 120 is, for example, a central processing unit (CPU), an image processing unit (GPU), a physical processing unit (PPU), a programmable microprocessor (Microprocessor), Embedded control chip, Digital Signal Processor (DSP), Application Specific Integrated Circuits (ASIC) or other similar devices. The controller 120 will read the code segments in the storage device (not shown) to execute the test method. The storage device is, for example, any type of fixed or removable random access memory (RAM), read-only memory (ROM), flash memory (Flash memory), secure digital Secure Digital Memory Card (SD), hard disk or other similar device or a combination of these devices.

2 is a schematic diagram of a test system in accordance with an embodiment of the present invention. Referring to FIG. 2, the test system 200 includes a signal generator 110, a controller 120, a signal distributor 130, and a plurality of devices to be tested 210. Here, the four devices to be tested 210_A to 210_D are described, but not limited thereto. The signal generator 110 transmits the test signal to the devices under test 210_A to 210_D through the signal distributor 130. In conjunction with the above test system 200, an example is given below to detail the steps of the test method.

3 is a flow chart of a test method in accordance with an embodiment of the present invention. Referring to FIG. 2 and FIG. 3, in step S305, the controller 120 receives a plurality of test requests from the devices to be tested 210_A to 210_D, respectively. That is, the devices under test 210_A to 210_D transmit test requests to the controller 120 through the communication device 140, respectively. For example, the devices under test 210_A to 210_D can communicate with the controller 120 through a wired network, a wireless network, or a transmission line or the like.

Next, in step S310, the controller 120 selects one of the plurality of test frequencies and the plurality of signal strengths included in the test request as a test item, and generates a notification message based on the test item. In other words, the controller 120 schedules these test frequencies and signal strengths, and then determines the test items based on the schedule.

Thereafter, in step S315, the controller 120 broadcasts a notification message to the device under test 210 via the communication device 140. That is, the controller 120 notifies all the devices under test 210_A to 210_D through the notification message, so that the devices under test 210_A to 210_D can know which frequency or which intensity to transmit next according to the notification message. If the test item in the notification message is one of the test frequencies sent by the device under test 210_A, the device under test 210_A will perform frequency locking.

Then, in step S320, the controller 120 drives the signal generator 110 to generate a test signal corresponding to the test item, and transmits a test signal to the device under test. For example, assuming that the specified frequency in the test request sent by the device under test 210_A is used as a test item, the device under test 210_A, after receiving the notification message, performs frequency locking to lock the specified frequency. At this time, since the device under test 210_A has been frequency-locked, the device under test 210_A will perform the test at the specified frequency. The device under test (or the host used to control the device under test 210_A) will read parameters such as bit error rate (BER), power level, frequency accuracy, etc. for testing.

In addition, the controller 120 stores the received test request into a queue to be processed. Moreover, after driving the signal generator 110 to generate a test signal corresponding to the test item and transmitting the test signal to the device under test 210, the controller 120 deletes the test frequency or signal strength that has been selected as the test item from the pending queue. And selecting one of the remaining test frequencies and signal strengths in the queue to be tested as a test item, and regenerating another notification message based on the test item, and rebroadcast another notification message to the device under test 210; And re-driving the signal generator 110 to generate a test signal corresponding to the test item, and transmitting the test signal to the device under test 210. The controller 120 will always select one of the pending queues as the test item until there are no items included in the test request in the pending queue.

In the embodiment, for example, the test item may be determined based on a First In First Out (FIFO) algorithm, or the test item may be determined based on the number of requests, or the weight or priority may be calculated to determine the test item. . The embodiment will be described below. For convenience of description, in the following embodiments, only the test request including the test frequency is taken as an example for description. However, in other embodiments, the test request may also include the test frequency and the signal strength, or the test request includes only the signal strength, and the scheduling manner is the same as the following embodiment, and details are not described herein again.

4 is a schematic diagram of a scheduling manner based on a FIFO algorithm in accordance with an embodiment of the present invention. In the present embodiment, at time point T1, the controller 120 receives the test request REQ_A (F1, F2) of the device under test 210_A, and stores the test request REQ_A (F1, F2) to the queue to be processed. At this time, the test frequency F1, F2 is included in the queue to be processed, and therefore, the controller 120 can test the frequency F1 or the test frequency F2 as a test item. Here, the test frequency F1 is taken as the highest priority, but it is not limited thereto. Therefore, at time T2, the controller 120 takes the test frequency F1 as a test item.

Next, at time point T2, the controller 120 receives the test request REQ_B (F3) of the device under test 210_B, and stores the test request REQ_B (F3) to the queue to be processed. Moreover, at time T2, the controller 120 uses the test frequency F1 as a test item, thereby driving the signal generator 110 to generate a test signal corresponding to the test frequency F1.

Thereafter, at time T3, the controller 120 receives the test request REQ_C (F1) of the device under test 210_C and the test request REQ_D (F1) of the device under test 210_D, and tests the request REQ_C (F1) with the test request REQ_D ( F1) Store to the pending queue. Moreover, at time T3, the controller 120 drives the signal generator 110 to generate a test signal corresponding to the test frequency F2.

Next, at time T4, the controller 120 uses the test frequency F3 as a test item according to the first in first out principle, thereby driving the signal generator 110 to generate a test signal corresponding to the test frequency F3. At time point T5, the controller 120 drives the signal generator 110 to generate a test signal corresponding to the test frequency F1. At the time point T5, the test of all the test requests is completed.

In addition, it is also possible to calculate the number of requests for each test frequency to select one of the most frequently requested test frequencies as the test item.

For example, FIG. 5 is a schematic diagram of a scheduling manner based on the number of requests, in accordance with an embodiment of the present invention. At time point T1, the controller 120 receives the test request REQ_A (F1, F2) of the device under test 210_A. The test queues include test frequencies F1 and F2, and the number of requests is 1, respectively. Therefore, the priority of the two test frequencies is the same, and the test frequency F1 is taken as the highest priority, but not limited thereto. Therefore, at time T2, the controller 120 takes the test frequency F1 as a test item.

At time point T2, the controller 120 further receives the test request REQ_B (F3) of the device under test 210_B. At this time, the pending queue includes test frequencies F2 and F3, and the number of requests is 1, respectively. Therefore, the priority of the two test frequencies is the same, and the test frequency F2 is taken as the highest priority, but this is not the case. limit. Therefore, at time T3, the controller 120 takes the test frequency F2 as a test item.

At time point T3, the controller 120 further receives the test request REQ_C (F1) of the device under test 210_C and the test request REQ_D (F1) of the device under test 210_D. At this time, the to-be-processed queue includes test frequencies F3 and F1, wherein the number of requests for the test frequency F3 is 1, and the number of requests for the test frequency F1 is 2. Therefore, the controller 120 takes the test frequency F1 as the highest priority, and at the time point T4, the test frequency F1 as the test item. Then at time point T5, the controller 120 takes the test frequency F3 as a test item.

In addition, in the case where the number of requests is the same, the selection may be further based on the first in first out principle, but it is not limited herein.

In addition, the number of requests for each test frequency may be further calculated, and the weight of each test frequency is calculated based on the number of requests corresponding to each test frequency and the time difference of reception, and then one of the test frequencies with the highest weight is selected as the test item. For example, weight = reception time difference x 2 + number of requests.

Tables 1 to 3 are weight-based scheduling methods in accordance with an embodiment of the present invention. Tables 1 to 3 represent the schedules at time points T2 to T4, respectively.

Table 1  <TABLE border="1" borderColor="#000000" width="85%"><TBODY><tr><td> Time T2 </td></tr><tr><td> Test frequency </ Td><td> Received time point </td><td> Transmitted device under test </td><td> Weight = Receive time difference × 2 + Request quantity </td></tr><tr><td > F1 </td><td> T1 </td><td> 210_A </td><td> Sent </td></tr><tr><td> F2 </td><td> T1 </td><td> 210_A </td><td> (T2-T1)×2+1 </td></tr><tr><td> F3 </td><td> T2 </td ><td> 210_B </td><td> 0+1 </td></tr></TBODY></TABLE>

Table 2  <TABLE border="1" borderColor="#000000" width="85%"><TBODY><tr><td> Time T3 </td></tr><tr><td> Test frequency </ Td><td> Received time point </td><td> Transmitted device under test </td><td> Weight = Receive time difference × 2 + Request quantity </td></tr><tr><td > F2 </td><td> T1 </td><td> 210_A </td><td> Sent </td></tr><tr><td> F3 </td><td> T2 </td><td> 210_B </td><td> (T3-T2)×2+1 </td></tr><tr><td> F1 </td><td> T3 </td ><td> 210_C, 210_D </td><td> 0+2 </td></tr></TBODY></TABLE>

table 3  <TABLE border="1" borderColor="#000000" width="85%"><TBODY><tr><td> Time T4 </td></tr><tr><td> Test frequency </ Td><td> Received time point </td><td> Transmitted device under test </td><td> Weight = Receive time difference × 2 + Request quantity </td></tr><tr><td > F3 </td><td> T2 </td><td> 210_B </td><td> Sent </td></tr><tr><td> F1 </td><td> T3 </td><td> 210_C, 210_D </td><td> (T4-T3)×2+2 </td></tr></TBODY></TABLE>

In Table 1, at time T2, the controller 120 first takes the test frequency F1 as a test item, and then calculates the respective weights of the test frequencies F2, F3. Assuming that the time difference between the time point T2 and the time point T1 is 1, the weight of the test frequency F2 is 3. The test frequency F3 has a weight of 1. Since the weight of the test frequency F2 is greater than the weight of the test frequency F3, the controller 120 takes the test frequency F2 as the test item at the next time point (ie, the time point T3).

In Table 2, as described above, the controller 120 takes the test frequency F2 as a test item at the time point T3, and then calculates the respective weights of the test frequencies F3, F1. Assuming that the time difference between the time point T3 and the time point T2 is 1, the weight of the test frequency F3 is 3. The weight of the test frequency F3 is recalculated to be 3. The number of requests for testing frequency F1 is 2, so its weight is 2. Since the weight of the test frequency F3 is greater than the weight of the test frequency F1, the controller 120 takes the test frequency F3 as the test item at the next time point (ie, the time point T4).

In Table 3, as described above, the controller 120 takes the test frequency F3 as a test item at the time point T4, and then calculates the weight of the test frequency F1. Assuming that the time difference between the time point T3 and the time point T2 is 1, the weight of the test frequency F1 after recalculation is 4. Thereafter, at time point T5, the controller 120 takes the test frequency F1 as a test item.

In summary, the present invention adds a controller to accept test requests sent by the device under test, and schedules the test requests, and then causes the signal generator to generate corresponding signals according to the scheduling. Accordingly, since there is only one signal generator, there is no problem that signals between the plurality of signal generators interfere with each other when the environment is set up, and the equipment cost is further saved.

Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and any one of ordinary skill in the art can make some changes and refinements without departing from the spirit and scope of the present invention. The scope of the invention is defined by the scope of the appended claims.

100‧‧‧Testing device

110‧‧‧Signal Generator

120‧‧‧ Controller

130‧‧‧Signal Dispenser

140‧‧‧Communication equipment

210, 210_A~210_D‧‧‧Device under test

F1～F3‧‧‧ test frequency

REQ_A (F1, F2) ~ REQ_D (F1) ‧ ‧ test request

T1～T5‧‧‧ time point

S305 ~ S320‧‧‧ Test method steps

1 is a block diagram of a test apparatus in accordance with an embodiment of the present invention. 2 is a schematic diagram of a test system in accordance with an embodiment of the present invention. 3 is a flow chart of a test method in accordance with an embodiment of the present invention. 4 is a schematic diagram of a scheduling manner based on a FIFO algorithm in accordance with an embodiment of the present invention. FIG. 5 is a schematic diagram of a scheduling manner based on the number of requests, in accordance with an embodiment of the present invention.

Claims (12)

A test method includes: receiving a plurality of test requests from a plurality of devices to be tested, wherein the devices to be tested are connected to the same one of the signal generators; and the plurality of test frequencies and the plurality of test frequencies included in the test requests Selecting one of the signal strengths as a test item, and generating a notification message based on the test item; broadcasting the notification message to the devices to be tested, so that the test items including the test items of the test item are sent The device performs frequency locking; and drives the signal generator to generate a test signal corresponding to the test item, and transmits the test signal to the devices to be tested. The test method of claim 1, further comprising: storing the received test requests into a pending queue; driving the signal generator to generate the test signal corresponding to the test item And transmitting the test signal to the devices to be tested, deleting the selected test frequencies and one of the signal strengths from the pending queue; the remaining tests from the pending queue Selecting one of the frequency and the signal strengths as the test item, and regenerating another notification message based on the test item; rebroadcasting the other notification message to the devices to be tested; and re-driving the signal generation The test signal corresponding to the test item is generated, and the test signal is transmitted to the devices to be tested. The test method of claim 1, wherein the step of selecting one of the test frequencies and the signal strengths included in the test requests as the test item comprises: based on an advanced first-out algorithm It is decided to select one of the test frequencies and the signal strengths as the test item. The test method of claim 1, wherein the step of selecting one of the test frequencies and the signal strengths included in the test requests as the test item comprises: calculating the test frequencies and The number of requests for each of the signal strengths; and one of the test frequencies or the signal strengths that select the largest number of requests as the test item. The test method of claim 1, wherein the step of selecting one of the test frequencies and the signal strengths included in the test requests as the test item comprises: calculating the test frequencies and The number of requests for each of the signal strengths; calculating a weight of each of the test frequencies and the signal strengths based on the number of the requests corresponding to the test frequencies and the received time difference; selecting the highest weight One of the test frequencies or the signal strength is used as the test item. A test device includes: a signal generator coupled to a plurality of devices to be tested; a controller coupled to the signal generator and receiving a plurality of test requests from the devices to be tested by a communication device; wherein the controller includes a plurality of test frequencies and multiples included in the test requests Selecting one of the signal strengths as a test item, and generating a notification message based on the test item, and broadcasting the notification message to the devices to be tested through the communication device, so that the test requests including the test item are sent. The device under test performs frequency locking; the controller drives the signal generator to generate a test signal corresponding to the test item, and transmits the test signal to the devices to be tested. The test device of claim 6, further comprising: a signal distributor comprising a receiving terminal and a plurality of output terminals, wherein the receiving terminal is coupled to the signal generator, and the output terminals are respectively coupled To the devices to be tested. The test apparatus of claim 6, wherein the controller stores the received test requests into a queue to be processed, and drives the signal generator to generate the corresponding test item. After testing the signal and transmitting the test signal to the devices to be tested, the controller deletes the selected test frequencies and the signal strengths from the pending queue; the controller is to be processed Selecting one of the remaining test frequencies and the signal strengths in the queue as the test item, and regenerating another notification message based on the test item, and rebroadcasting the other notification message to the waiting The controller re-drives the signal generator to generate the test signal corresponding to the test item, and transmits the test signal to the devices to be tested. The test apparatus of claim 6, wherein the controller determines, based on a first-in-first-out algorithm, one of the test frequencies and the signal strengths as the test item. The test apparatus of claim 6, wherein the controller calculates the respective request frequency of the test frequency and the signal strengths, and selects one of the test frequencies or the signal with the largest number of requests. The strength comes as the test item. The test device of claim 6, wherein the controller calculates a respective number of requests for the test frequencies and the signal strengths, and the number of the requests corresponding to the test frequencies and the signal strengths respectively Receiving the time difference, calculating a weight of each of the test frequencies and the signal strengths, and selecting one of the test frequencies or the signal strengths with the highest weight as the test item. A test system includes: a plurality of devices to be tested; a signal generator coupled to the devices to be tested; and a controller coupled to the signal generator and respectively to be tested by the communication device The device receives a plurality of test requests; wherein the controller selects one of the plurality of test frequencies and the plurality of signal strengths included in the test requests as a test item, and generates a notification message based on the test item, And transmitting, by the communication device, the notification message to the devices to be tested, so that the waiting to send the test requests including the test item The measuring device performs a frequency locking; the controller drives the signal generator to generate a test signal corresponding to the test item, and transmits the test signal to the devices to be tested.