TWI642934B - Test strip reading device - Google Patents

Test strip reading device Download PDF

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Publication number
TWI642934B
TWI642934B TW106103050A TW106103050A TWI642934B TW I642934 B TWI642934 B TW I642934B TW 106103050 A TW106103050 A TW 106103050A TW 106103050 A TW106103050 A TW 106103050A TW I642934 B TWI642934 B TW I642934B
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TW
Taiwan
Prior art keywords
test strip
conductive
module
reading device
circuit board
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Application number
TW106103050A
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Chinese (zh)
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TW201827819A (en
Inventor
陳明達
劉凍樑
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華廣生技股份有限公司
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Application filed by 華廣生技股份有限公司 filed Critical 華廣生技股份有限公司
Priority to TW106103050A priority Critical patent/TWI642934B/en
Priority to CN201711430220.8A priority patent/CN108344771B/en
Publication of TW201827819A publication Critical patent/TW201827819A/en
Application granted granted Critical
Publication of TWI642934B publication Critical patent/TWI642934B/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means

Abstract

本發明揭露一種試片讀取裝置,包含一模組上蓋體,設置有至少一試片承靠端以及至少一操作槽,該槽具有複數操作孔,該複數操作孔用以置入複數第一操作行程組件;一接地片,具有與該複數操作孔對應的複數穿孔,供各該複數第一操作行程組件於各該複數操作孔及各該複數穿孔之間移動;一模組下蓋體設置於該操作槽內,設置有複數第二操作行程組件,各該複數第二操作行程組件與該接地片之接觸與分離狀態決定一讀取訊號;一第一電路板,配置於該模組下蓋體底部且具第一導電區及第二導電區;以及一第二電路板,具第三導電區,並與該第二導電區以一連接器進行電連接,獲得試片讀取訊號。 The invention discloses a test strip reading device, which includes a module upper cover body provided with at least one test strip end and at least one operation slot. The slot has a plurality of operation holes for inserting a plurality of first holes. Operation stroke component; a ground piece with a plurality of perforations corresponding to the plurality of operation holes for each of the plurality of first operation stroke components to move between each of the plurality of operation holes and each of the plurality of perforations; a module lower cover is provided In the operation slot, a plurality of second operation stroke components are provided, and the contact and separation status of each of the plurality of second operation stroke components and the ground plate determines a read signal; a first circuit board is arranged under the module The bottom of the cover is provided with a first conductive region and a second conductive region; and a second circuit board is provided with a third conductive region, and is electrically connected to the second conductive region with a connector to obtain a test strip read signal.

Description

試片讀取裝置    Test strip reading device   

本發明關於一種試片讀取裝置,特別是關於一種用以讀取編碼的試片讀取裝置。 The invention relates to a test strip reading device, in particular to a test strip reading device for reading a code.

試片讀取裝置已被應用於讀取特定試片上帶有的樣本或資訊。 Test strip reading devices have been used to read samples or information carried on specific test strips.

如第1A圖所示,將試片讀取模組110嵌入手持裝置如個人數位助理(PDA)甚至手機等裝置,而成為一種個人手持式的簡單分析物量測裝置100。時下手持裝置追求輕薄短小,因此試片讀取模組110也被要求在體積上必須輕薄短小並減少電力消耗,以符合手持裝置及長時間操作的要求。習知的分析物量測裝置100配置有前蓋101、試片讀取模組110、固定試片讀取模組110的限位構件103和背蓋102等組件,透過試片120上承載的生理樣品來量測生理參數(例如血糖濃度、膽固醇數值、尿酸濃度或酸鹼值)。有些分析物量測裝置能夠讀取不同類型的試片,為了讓分析物量測裝置增加或確認能夠分辨試片的類型,可以在試片的某個部位製作編碼區。 As shown in FIG. 1A, the test strip reading module 110 is embedded in a handheld device such as a personal digital assistant (PDA) or even a mobile phone, and becomes a personal handheld simple analyte measurement device 100. Handheld devices are now pursuing lightness, thinness, and shortness. Therefore, the test strip reading module 110 is also required to be thin and short in size and reduce power consumption to meet the requirements of handheld devices and long-term operation. The conventional analyte measuring device 100 is configured with components such as a front cover 101, a test strip reading module 110, a limiting member 103 and a back cover 102 that fix the test strip reading module 110, and is carried through the test strip 120. Physiological samples to measure physiological parameters (such as blood glucose concentration, cholesterol value, uric acid concentration or pH value). Some analyte measurement devices can read different types of test strips. In order for the analyte measurement device to add or confirm that it can distinguish the type of test strip, a coding area can be made at a certain part of the test strip.

例如,如第1A,1B及1C圖所示,試片120插入試片讀取模組110上由模組上試片上承靠端141及試片下承靠端144形成的試片插槽143,在試片120上的某個部位製作深淺不同的複數孔洞122(如第1B圖中虛線圈內的試片120背面),而試片讀取模組110在其模組上蓋體140及模組下蓋體146中對應於該複數孔洞122的位置設置機械式的讀碼機制, 對插入試片讀取模組110的試片120上的複數孔洞122加以偵測與讀取,並進行解碼,以辨別試片120的類型,協助分析物量測裝置選擇適當的試驗配置,同時可以兼具對試片120防偽的功能。 For example, as shown in FIGS. 1A, 1B, and 1C, the test piece 120 is inserted into the test piece reading module 110, and the test piece slot 143 formed by the upper end 141 and the lower end 144 of the test piece on the module. , A plurality of holes 122 (such as the back of the test piece 120 in the virtual circle in FIG. 1B) with different depths are made in a certain position on the test piece 120, and the test piece reading module 110 covers the module cover 140 and the mold A mechanical code reading mechanism is provided in the lower cover 146 of the group corresponding to the plurality of holes 122, and the plurality of holes 122 on the test strip 120 inserted into the test strip reading module 110 are detected and read, and decoded. In order to identify the type of the test strip 120, assist the analyte measurement device to select an appropriate test configuration, and at the same time, it can also have the function of preventing the test strip 120 from being counterfeit.

這種利用機械方式讀取編碼的模組存有一些實際應用於儀器生產組裝方面的問題。如第1B及1C圖所示,試片讀取模組110上偵測與讀取試片編碼信號及分析之組件是配置在同一電路板153上,並且電路板153位於模組上蓋體140及模組下蓋體146中間,接地片190位於模組下蓋體146底部,使得在組裝試片讀取模組110時,各元件擺放及施工的方向(如第1C圖的虛線箭頭所示)變得不一致而需仰賴人工方式組裝,不利於自動化設備組裝。另外,電路板153整合試片編碼的偵測、讀取信號及分析的功能,使得電路板153因功能複雜,其上電子元件增多而必須變厚。由於電路板153位於模組上蓋體140及模組下蓋體146中間,而與模組上蓋體140的操作孔142的區域上下重疊,使得該操作孔142區域的下空間變大,以容納該電路板153,導致試片讀取模組110的空間變大而必須增厚。 This mechanically read coded module has some problems that are actually applied to the production and assembly of the instrument. As shown in Figs. 1B and 1C, the components for detecting and reading the test strip coding signal and analysis on the test strip reading module 110 are arranged on the same circuit board 153, and the circuit board 153 is located on the module upper cover 140 and In the middle of the lower cover 146 of the module, the grounding piece 190 is located at the bottom of the lower cover 146 of the module, so that when the test strip reading module 110 is assembled, the components are placed and constructed in the direction shown by the dotted arrow in FIG. 1C ) Becomes inconsistent and needs to be assembled manually, which is not conducive to the assembly of automated equipment. In addition, the circuit board 153 integrates the functions of detecting, reading signals and analyzing the code of the test strip, so that the circuit board 153 has to be thick due to the complicated functions and the increase of electronic components thereon. Because the circuit board 153 is located between the module upper cover 140 and the module lower cover 146, and overlaps with the area of the operation hole 142 of the module upper cover 140, the lower space of the area of the operation hole 142 becomes larger to accommodate the The circuit board 153 causes the space of the test strip reading module 110 to become large and must be thickened.

另一方面,試片讀取模組所插入之試片120上的檢體樣本,有可能由試片讀取模組110內的操作孔142及電觸部155周圍縫隙流入,而沾染到試片讀取模組110內,例如電路板153上的電子元件(未示出於第1B圖),使試片讀取模組110的檢測功能不準確。為了避免這個問題,在試片讀取模組110設有防污染的阻隔元件160於編碼讀取穿孔的周圍,電觸部155也設有電觸部阻隔元件161,然而阻隔元件160及電觸部阻隔元件161為分開設置,在組裝上較不方便。 On the other hand, the specimen sample on the test strip 120 inserted into the test strip reading module may flow into the gap around the operation hole 142 and the electrical contact portion 155 in the test strip reading module 110 and contaminate the test The electronic components (not shown in FIG. 1B) on the chip reading module 110, such as the circuit board 153, make the detection function of the test chip reading module 110 inaccurate. In order to avoid this problem, the test strip reading module 110 is provided with an anti-pollution blocking element 160 around the code reading perforation. The electric contact portion 155 is also provided with an electric contact blocking element 161. However, the blocking element 160 and the electric contact The partial blocking element 161 is provided separately, which is inconvenient in assembly.

為了達成本發明的目的,本發明提出一種試片讀取裝置,包含:一模組上蓋體,設置有至少一試片承靠端以及至少一操作槽,該槽具有複數操作孔,該複數操作孔用以置入複數第一操作行程組件;一接地片, 具有與該複數操作孔對應的複數穿孔,供各該複數第一操作行程組件於各該複數操作孔及各該複數穿孔之間移動;一模組下蓋體設置於該操作槽內,設置有複數第二操作行程組件,各該複數第二操作行程組件與該接地片之接觸與分離狀態決定一讀取訊號;一第一電路板,配置於該模組下蓋體底部且具第一導電區及第二導電區;以及一第二電路板,具第三導電區,並與該第二導電區以一連接器進行電連接,獲得試片讀取訊號。 In order to achieve the purpose of the present invention, the present invention provides a test strip reading device, including: a module upper cover body, provided with at least one test strip bearing end and at least one operation slot, the slot having a plurality of operation holes, the plurality of operations The hole is used to insert a plurality of first operation stroke components; a grounding plate has a plurality of perforations corresponding to the plurality of operation holes, for each of the plurality of first operation stroke components to move between each of the plurality of operation holes and each of the plurality of perforations A module lower cover is arranged in the operation slot, and a plurality of second operation stroke components are provided, and the contact and separation state of each of the plurality of second operation stroke components and the grounding piece determines a reading signal; a first circuit A board disposed at the bottom of the lower cover of the module and having a first conductive region and a second conductive region; and a second circuit board having a third conductive region and electrically connected to the second conductive region by a connector To get the test strip read signal.

依據本發明的另一觀點,本發明提出一種用以容納一試片的試片讀取裝置,包含:一接地片連接一信號源;複數導電元件,頂抵該試片;一模組上蓋體,設置有至少一試片承靠端,該模組上蓋體包含操作槽,該槽具有複數操作孔,用以容納該複數導電元件的上半部;一模組下蓋體,容納該複數導電元件的下半部,並設置具導電性的複數彈力元件,其中各該複數導電元件與該接地片之接觸與分離狀態決定一編碼訊號;一第一電路板,用以讀取該編碼訊號,該第一電路板具第一導電區及與該第一導電區電性連接的第二導電區;以及一第二電路板,具第三導電區,與該第二導電區以一連接器電性連接,以接收該編碼訊號。 According to another aspect of the present invention, the present invention provides a test strip reading device for accommodating a test strip, comprising: a ground strip connected to a signal source; a plurality of conductive elements abutting against the test strip; and a module cover. At least one test piece bearing end is provided, the upper cover of the module includes an operation slot, the slot has a plurality of operation holes to receive the upper half of the plurality of conductive elements, and a lower cover of the module accommodates the plurality of conductive members The lower half of the element is provided with a plurality of conductive elastic elements, wherein the contact and separation between each of the plurality of conductive elements and the ground plate determines a coded signal; a first circuit board is used to read the coded signal, The first circuit board has a first conductive region and a second conductive region electrically connected to the first conductive region; and a second circuit board has a third conductive region and is electrically connected to the second conductive region by a connector. Sexual connection to receive the encoded signal.

依據本發明的又一觀點,本發明提出一種試片讀取裝置,包含:一接地片,用以傳遞一試片所代表的一編碼訊號,其中該試片用以於其上承載一生物檢測樣本;一第一電路板;以及一第二電路板,獨立於該第一電路板、透過該第一電路板接收該編碼訊號、因應該編碼訊號以決定一相應之生物檢測功能、且分析該生物檢測樣本。 According to another aspect of the present invention, the present invention provides a test strip reading device, including: a ground strip for transmitting a coded signal represented by the test strip, wherein the test strip is used to carry a biological detection on the test strip. A sample; a first circuit board; and a second circuit board, independent of the first circuit board, receiving the encoded signal through the first circuit board, determining a corresponding biological detection function according to the encoded signal, and analyzing the Biological test samples.

一種試片讀取裝置,用以讀取一試片所代表的一編碼訊號,及於其上承載之一生物檢測樣本,該試片讀取裝置包含:一裝置本體,具一第一厚度之一容置空間;一第一電路板,具影響該第一厚度之一第二厚度、設置於該容置空間;以及一第二電路板,具不影響該第一厚度之一第三厚度獨立於該第一電路板、設置於該容置空間之外、透過該第一電路 板接收該編碼訊號、因應該編碼訊號以決定一相應之生物檢測功能、且分析該生物檢測樣本。 A test strip reading device is used to read a coded signal represented by a test strip and a biological detection sample carried thereon. The test strip reading device includes: a device body having a first thickness An accommodation space; a first circuit board having a second thickness that affects the first thickness and disposed in the accommodation space; and a second circuit board having a third thickness that does not affect the first thickness The first circuit board is disposed outside the accommodating space, receives the encoded signal through the first circuit board, determines a corresponding biological detection function according to the encoded signal, and analyzes the biological detection sample.

100‧‧‧試片讀取裝置 100‧‧‧ test strip reading device

101,201‧‧‧前蓋 101,201‧‧‧Front cover

102,202‧‧‧後蓋 102,202‧‧‧back cover

103‧‧‧限位構件 103‧‧‧ limit member

104‧‧‧試片插槽孔 104‧‧‧Slot hole

110,210‧‧‧試片讀取模組 110,210‧‧‧test strip reading module

120,220‧‧‧試片 120,220‧‧‧test strips

122,222‧‧‧孔洞 122,222‧‧‧holes

140,240‧‧‧模組上蓋體 140,240‧‧‧module cover

141,241‧‧‧試片上承靠端 141,241‧‧‧bearing end on test piece

142,242‧‧‧操作孔 142,242‧‧‧Operation holes

143,243‧‧‧試片插槽 143,243‧‧‧‧Slots

144,244‧‧‧試片下承靠端 144,244‧‧‧bearing end

146,246‧‧‧模組下蓋體 146,246‧‧‧The lower cover of the module

160,260,360‧‧‧阻隔元件 160,260,360‧‧‧Barrier elements

161‧‧‧電觸部阻隔元件 161‧‧‧electric contact barrier element

224‧‧‧凸起部 224‧‧‧ raised

225‧‧‧啟動高度 225‧‧‧Start height

230‧‧‧連接器 230‧‧‧ connector

234‧‧‧第一導電區 234‧‧‧The first conductive area

235‧‧‧第二導電區 235‧‧‧Second conductive area

2351‧‧‧第一電觸點 2351‧‧‧First electrical contact

236‧‧‧第三導電區 236‧‧‧The third conductive area

2361‧‧‧第二電觸點 2361‧‧‧Second electrical contact

238‧‧‧第四導電區 238‧‧‧Fourth conductive area

2381‧‧‧第三電觸點 2381‧‧‧Third electrical contact

2382‧‧‧第四電觸點 2382‧‧‧Fourth electrical contact

245‧‧‧操作槽 245‧‧‧operation slot

248‧‧‧遮蔽蓋 248‧‧‧shield cover

250,450‧‧‧啟動元件 250,450‧‧‧Activating components

294‧‧‧穿孔 294‧‧‧perforation

253‧‧‧第一電路板 253‧‧‧First circuit board

254‧‧‧下端 254‧‧‧bottom

255‧‧‧電觸部 255‧‧‧ Electric contact

256‧‧‧第二電路板 256‧‧‧Second circuit board

257‧‧‧電觸部操作孔 257‧‧‧Electric contact operation hole

261,361‧‧‧第一阻隔 261,361‧‧‧First barrier

262,362‧‧‧污染物收集部 262,362‧‧‧‧Pollution Collection Department

263‧‧‧第二阻隔 263‧‧‧Second Barrier

264‧‧‧密封元件 264‧‧‧sealing element

270,450‧‧‧導電元件 270,450‧‧‧ conductive elements

272‧‧‧短路突起 272‧‧‧Short protrusion

280‧‧‧彈力元件 280‧‧‧elastic element

290‧‧‧接地片 290‧‧‧ grounding lug

291‧‧‧信號源 291‧‧‧Signal Source

296‧‧‧固定件 296‧‧‧Fixture

345‧‧‧第一邊壁 345‧‧‧The first side wall

452‧‧‧第一端 452‧‧‧ the first end

454‧‧‧第二端 454‧‧‧ second end

456‧‧‧側邊槽 456‧‧‧Side groove

457‧‧‧第一槽壁 457‧‧‧The first trough wall

458‧‧‧第二槽壁 458‧‧‧Second trough wall

H1‧‧‧試片插槽高度範圍 H1‧‧‧Slot height range

H2‧‧‧啟動高度 H2‧‧‧Start height

P‧‧‧汙染物 P‧‧‧ Pollutants

Vs‧‧‧電子信號 Vs‧‧‧electronic signal

在審視以下的圖式、實施方式詳細說明以及申請專利範圍之後,可以得見本發明其他的觀點和優點。 After examining the following drawings, detailed description of the embodiments, and the scope of patent application, other aspects and advantages of the present invention can be seen.

第1A圖是先前技術中分析物量測裝置的示意圖。 FIG. 1A is a schematic diagram of an analyte measuring device in the prior art.

第1B圖是先前技術中試片欲插入試片讀取模組的立體示意圖。 FIG. 1B is a schematic perspective view of a test strip to be inserted into a test strip reading module in the prior art.

第1C圖是先前技術中試片讀取模組的分解圖。 FIG. 1C is an exploded view of the test strip reading module in the prior art.

第2A圖是本發明試片讀取模組的立體分解示意圖。 FIG. 2A is a three-dimensional exploded view of the test strip reading module of the present invention.

第2B圖是本發明試片讀取模組的後視立體圖。 Fig. 2B is a rear perspective view of the test strip reading module of the present invention.

第2C圖是本發明試片讀取模組底部防污染裝置立體圖。 Figure 2C is a perspective view of the anti-pollution device at the bottom of the test strip reading module of the present invention.

第2D圖是先前技術中試片讀取模組的局部剖面圖。 FIG. 2D is a partial cross-sectional view of a test strip reading module in the prior art.

第2E圖是本發明試片讀取模組及電觸部的局部剖面圖。 Fig. 2E is a partial cross-sectional view of a test strip reading module and an electric contact portion of the present invention.

第3A圖是本發明第一具體實施例中試片插入試片讀取模組的局部剖面圖。 FIG. 3A is a partial cross-sectional view of a test strip inserting test strip reading module in the first embodiment of the present invention.

第3B圖是本發明第二具體實施例中試片插入試片讀取模組的局部剖面圖。 FIG. 3B is a partial cross-sectional view of a test strip inserting test strip reading module in a second embodiment of the present invention.

第3C圖是本發明第三具體實施例中試片插入試片讀取模組的局部剖面圖。 FIG. 3C is a partial cross-sectional view of a test strip inserting test strip reading module in a third embodiment of the present invention.

第4A圖是本發明導電橡膠連接器的示意圖。 Figure 4A is a schematic view of a conductive rubber connector of the present invention.

第4B圖是本發明可撓性連接器的示意圖。 Fig. 4B is a schematic diagram of a flexible connector according to the present invention.

以下提供本發明之試片編碼讀取模組、試片編碼讀取裝置及生物檢測系統的詳細實施例並佐以參考圖式。 Detailed examples of the test strip code reading module, the test strip code reading device, and the biological detection system of the present invention are provided below with reference to the drawings.

如第2A、2B及2E圖所示,試片220插入試片讀取模組210,其中模組210之試片上承靠端241及試片下承靠端244形成試片插槽243。為了加快試片讀取模組210組裝的速度,本發明的試片讀取模組210將偵 測試片220的編碼信號與讀取分析試片220的編碼孔222形成的編碼信號之功能分開設置在兩片不同的電路板上,即偵測試片編碼信號的第一電路板253以及讀取分析試片編碼信號的第二電路板256,其中第二電路板256上並配置一遮蔽蓋248以保護第二電路板256。其中模組上蓋體240下表面設有複數操作孔242用以依序容納第一行程組件包含啟動元件250、一阻隔元件260、設有複數穿孔的一接地片290以及一可容納導電元件270與彈力元件280的模組下蓋體246。第一電路板253設置於模組下蓋體246(或其模組上蓋體240)的底部,以固定件296,例如使用螺絲固定,並將接地片290置於模組上蓋體240與模組下蓋體246之間,亦即將接地片290設置於導電元件270之上。如第2A圖及第2B圖所示,這樣的配置使得試片讀取模組210的第一電路板253、第二電路板256及相關元件分次同方向組裝(如虛線箭頭方向),使得在試片讀取模組210組裝時,不同元件不必在各個階段為了配合其他元件而調整原有擺放的方向,使各元件組裝方向維持一致,因此可輕易轉化為自動化機台組裝,降低人工組配需求以加快組裝速度,提升生產效率。 As shown in FIGS. 2A, 2B, and 2E, the test strip 220 is inserted into the test strip reading module 210. The test strip upper end 241 and the test strip lower end 244 of the module 210 form a test strip slot 243. In order to speed up the assembly speed of the test strip reading module 210, the test strip reading module 210 of the present invention separates the function of encoding the detection signal of the test strip 220 from the encoding signal formed by the analysis of the encoding hole 222 of the test strip 220. It is arranged on two different circuit boards, that is, the first circuit board 253 that detects the encoded signal of the test strip and the second circuit board 256 that reads and analyzes the encoded signal of the test strip. A shielding cover is arranged on the second circuit board 256. 248 to protect the second circuit board 256. The lower surface of the module upper cover 240 is provided with a plurality of operation holes 242 for sequentially accommodating the first stroke component including a starting element 250, a blocking element 260, a grounding plate 290 provided with a plurality of perforations, and a conductive element 270 and The module lower cover 246 of the elastic element 280. The first circuit board 253 is disposed on the bottom of the module lower cover 246 (or the module upper cover 240), and is fixed by a fixing member 296, such as a screw, and the grounding piece 290 is placed on the module upper cover 240 and the module. Between the lower cover bodies 246, the grounding piece 290 is disposed on the conductive element 270. As shown in FIG. 2A and FIG. 2B, such a configuration enables the first circuit board 253, the second circuit board 256, and related components of the test strip reading module 210 to be assembled in the same direction (such as the direction of the dotted arrow), so that When the test strip reading module 210 is assembled, different components do not need to adjust the original placement direction in order to cooperate with other components at each stage, so that the assembly direction of each component is kept consistent, so it can be easily converted into automated machine assembly, reducing labor Match demand to speed up assembly and improve production efficiency.

請參考第1C圖,電路板153與模組下蓋體146上下重疊,因此二者的厚度疊加。而第2A圖中元件較為複雜且具較厚的第三厚度第二電路板256切掉一塊矩形區域,在該矩形區域原有的偵測試片編碼信號的功能移到具第二厚度的第一電路板253位於模組下蓋體246底部。由於第一電路板253功能較為簡單,所以採用厚度更薄的材質,並且被安排在挖空矩形區域的同一側,使得該第一電路板253與第二電路板256在模組下蓋體246的空間中上下錯開,第一電路板253片與第二電路板256沒有上下重疊,使得第一電路板253的第二厚度與第二電路板256的第三厚度沒有疊加,而不影響試片讀取模組210的第一厚度。請參考第2D圖為揭露有關先前技術的電路板153配置方式,其設置於模組上蓋體140及模組下蓋 體146之間。於第2A圖與第3A~3C圖中,有關本發明第一電路板253與該第二電路板256在試片讀取模組210內位置關係,可以了解該第二電路板256位於模組上蓋體240及模組下蓋體246的空間之外,因此可以減低本發明的試片讀取模組210的第一厚度。較佳地,可減少約0.25mm之厚度。 Please refer to FIG. 1C, the circuit board 153 and the module lower cover 146 overlap each other, so the thicknesses of the two are superimposed. In FIG. 2A, the second circuit board 256 has a complicated third component and a thick third thickness. A rectangular area is cut out, and the function of encoding signals of the original detection test piece is moved to the second thick A circuit board 253 is located at the bottom of the lower cover 246 of the module. Because the function of the first circuit board 253 is relatively simple, it uses a thinner material and is arranged on the same side of the hollowed out rectangular area, so that the first circuit board 253 and the second circuit board 256 are under the module cover 246. The first circuit board 253 and the second circuit board 256 do not overlap up and down in the space, so that the second thickness of the first circuit board 253 and the third thickness of the second circuit board 256 do not overlap, without affecting the test piece. The first thickness of the reading module 210. Please refer to FIG. 2D for the layout of the prior art circuit board 153, which is disposed between the module upper cover 140 and the module lower cover 146. In FIGS. 2A and 3A to 3C, regarding the positional relationship between the first circuit board 253 and the second circuit board 256 in the test strip reading module 210 of the present invention, it can be understood that the second circuit board 256 is located in the module Since the upper cover 240 and the module lower cover 246 are outside the space, the first thickness of the test strip reading module 210 of the present invention can be reduced. Preferably, the thickness can be reduced by about 0.25 mm.

請參考第2E圖,試片讀取模組210在相對於試片220上電極的位置,有兩個電觸部255設置於電觸部操作孔257中,與試片上電極進行電連接,以使插入試片讀取模組210的試片220,將其所承載生理樣品量測所得的生理參數之電子信號,傳送至試片讀取模組210的第一電路板253。 Please refer to FIG. 2E. At the position of the test strip reading module 210 relative to the electrode on the test strip 220, two electrical contact portions 255 are disposed in the electrical contact operation hole 257 to electrically connect with the electrodes on the test strip to The test strip 220 inserted into the test strip reading module 210 is configured to transmit the electronic signal of the physiological parameter measured by the physiological sample carried by the test strip 220 to the first circuit board 253 of the test strip reading module 210.

為了能夠克服習知機械式編碼讀取模組所存在的問題,特別是要能兼顧判讀的正確性、防制汙染及提升組裝便利性的功效,因此本發明試片讀取模組210將操作槽245與電觸部操作孔257之邊緣設置一體成形的密封元件264,以便加速組裝並加強污染阻隔功能,如2C圖及2E圖所示,顯示密封元件264與電觸部操作槽257的位置關係。 In order to overcome the problems of the conventional mechanical code reading module, especially to be able to balance the accuracy of the reading, prevent pollution and improve the convenience of assembly, the test strip reading module 210 of the present invention will operate An integrally formed sealing element 264 is provided at the edge of the groove 245 and the edge of the electrical contact operation hole 257, so as to accelerate the assembly and strengthen the pollution blocking function. As shown in FIG. 2C and FIG. relationship.

請參考第2E及3A圖,顯示電觸部操作孔257以及模組上蓋體240之操作槽245與密封元件264各自位置關係,以及模組上蓋體240、模組下蓋體246及第一電路板253位置關係。試片讀取模組210所包含的電觸部255,可與試片220上的電極進行電連接。當試片220插入試片插槽243時,試片220上的工作電極及對電極會與兩個電觸部255進行電接觸。其中電觸部255材質較佳為黃金材質,對應的試片電極材料較佳為黃金材質,例如Rightest® Blood test strip所使用的材料,使得試片產生的電流有較佳的穩定性與傳導性。試片220編碼結構不限於凹洞形狀的設計,其可為其他設計選擇,例如凸塊、鋸齒、排齒、切縫、凹槽及通孔其中之一,並與試片讀取模組210進行組配作動。模組上蓋體240下表面具有一操作槽 245,該操作槽245內設有複數操作孔242用以依序容納第一行程組件包含啟動元件250、一阻隔元件260、設有複數穿孔的一接地片290以及一可容納導電元件270與彈力元件280的模組下蓋體246,該第一電路板253設置於模組上蓋體246的底部,其中該模組下蓋體底部設有穿孔,可供其彈力元件280與第一電路板253之第一導電區234進行電連接,於另一實施例中,試片上蓋體240具有複數操作槽245對應及配置各第一、第二操作行程組件、接地片290及模組下蓋體246。 Please refer to FIGS. 2E and 3A, which show the positional relationship between the electrical contact operation hole 257 and the operation slot 245 of the module upper cover 240 and the sealing element 264, as well as the module upper cover 240, the module lower cover 246, and the first circuit. Board 253 positional relationship. The electrical contact portion 255 included in the test strip reading module 210 can be electrically connected to the electrodes on the test strip 220. When the test piece 220 is inserted into the test piece slot 243, the working electrode and the counter electrode on the test piece 220 are in electrical contact with the two electrical contact portions 255. The material of the electrical contact 255 is preferably gold, and the material of the corresponding test electrode is preferably gold. For example, the material used in the Rightest ® Blood test strip makes the current generated by the test strip have better stability and conductivity. . The test strip 220 coding structure is not limited to the design of the concave shape, it can be other design choices, such as one of bumps, sawtooth, row teeth, slits, grooves and through holes, and is connected with the test strip reading module 210 Perform a matching operation. The lower surface of the module upper cover 240 is provided with an operation slot 245. The operation slot 245 is provided with a plurality of operation holes 242 for sequentially accommodating the first stroke component including a starting element 250, a blocking element 260, and a ground with a plurality of perforations The sheet 290 and a module lower cover 246 that can accommodate the conductive element 270 and the elastic element 280. The first circuit board 253 is disposed on the bottom of the module upper cover 246. The bottom of the module lower cover is provided with a perforation. The elastic element 280 is electrically connected to the first conductive region 234 of the first circuit board 253. In another embodiment, the cover 240 of the test piece has a plurality of operation slots 245 corresponding to and configured with each of the first and second operation stroke components. , The grounding piece 290 and the module lower cover 246.

請參閱第3A圖,其為本發明第一具體實施例中試片插入試片讀取模組210的局部剖面圖,其中本發明的試片讀取模組210包含具有試片插槽的模組上蓋體240、模組下蓋體246、第一電路板253及第二電路板256,如第3A圖所示,試片插槽243與模組上蓋體240一體成型,且該試片插槽243內定義出試片上承靠端241與試片下承靠端244,該兩承靠端界定一高度以容納試片220,使得試片220插入的高度可以在射出成模組上蓋體240時決定,亦即透過單一物件上進行試片220插入高度管控,而該高度係兩承靠端界定出一試片插槽高度,該試片插槽高度範圍H1可定義為一試片厚度加上一適當間隙,如第3A圖所示,當試片厚度為1.0mm,下承靠端與試片底面的間隙設為0.05~0.5mm,故適當試片插槽高度範圍H1則約為1.05mm~1.5mm。 Please refer to FIG. 3A, which is a partial cross-sectional view of a test strip inserted into the test strip reading module 210 in the first specific embodiment of the present invention. The test strip reading module 210 of the present invention includes a mold having a test strip slot. Group upper cover 240, module lower cover 246, first circuit board 253, and second circuit board 256. As shown in FIG. 3A, the test piece slot 243 is integrally formed with the module upper cover 240, and the test piece is inserted. An upper bearing end 241 and a lower bearing end 244 of the test piece are defined in the groove 243. The two bearing ends define a height to accommodate the test piece 220, so that the insertion height of the test piece 220 can be ejected into the module upper cover 240. It is determined at that time, that is, the height of the test strip 220 is controlled through a single object, and the height is defined by the two end ends of a test strip slot height. The test strip slot height range H1 can be defined as a test strip thickness plus The last suitable gap, as shown in Figure 3A, when the thickness of the test piece is 1.0mm, the gap between the lower bearing end and the bottom of the test piece is set to 0.05 ~ 0.5mm, so the appropriate test slot height range H1 is about 1.05 mm ~ 1.5mm.

模組上蓋體240之操作槽245具有一操作孔242,該操作孔內包含第一操作行程組件,而第一操作行程組件包含啟動元件250、阻隔元件260,模組下蓋體246內則包含第二操作行程組件,其中第二操作行程組件包含導電元件270、彈力元件280以及一接地元件290設置於第一操作行組件與第二行程組件之間,在該模組下蓋體246(或其模組上蓋體240)的底部設有第一電路板253,而在該上蓋體240外側配置第二電路板256。第一電路板253上配置第一導電區234及第二導電區235,第一導電區234與第 二導電區235電性連接,第二電路板256上配置第三導電區236,第一電路板253的第二導電區235與第二電路板256上的第三導電區236以連接器230電性相連,連接器230是可撓式電路板(FPC)或是導電橡膠連接器的其中一種,但不限於此。在第4A圖中所示的連接器230為導電橡膠連接器,而在第4B圖中所示的連接器230為軟性電路板(FPC),而電子信號Vs可以經由導電元件270與接地元件290所構成的路徑一路電連接到第一電路板253之接地端(未顯示),如果電子信號Vs是一電壓,則上述的迴路將形成電流。 The operation slot 245 of the module upper cover 240 has an operation hole 242. The operation hole includes a first operation stroke component, and the first operation stroke component includes a starting element 250 and a blocking element 260. The module lower cover 246 includes The second operation stroke assembly, wherein the second operation stroke assembly includes a conductive element 270, an elastic element 280, and a grounding element 290 disposed between the first operation row assembly and the second stroke assembly, and a lower cover 246 (or A first circuit board 253 is provided at the bottom of the module upper cover 240), and a second circuit board 256 is disposed outside the upper cover 240. A first conductive region 234 and a second conductive region 235 are disposed on the first circuit board 253. The first conductive region 234 is electrically connected to the second conductive region 235. A third conductive region 236 is disposed on the second circuit board 256. The first circuit The second conductive region 235 of the board 253 and the third conductive region 236 on the second circuit board 256 are electrically connected by a connector 230. The connector 230 is one of a flexible circuit board (FPC) or a conductive rubber connector. , But not limited to this. The connector 230 shown in FIG. 4A is a conductive rubber connector, and the connector 230 shown in FIG. 4B is a flexible circuit board (FPC), and the electronic signal Vs can pass through the conductive element 270 and the ground element 290 The formed path is electrically connected to the ground terminal (not shown) of the first circuit board 253 all the way. If the electronic signal Vs is a voltage, the above-mentioned circuit will form a current.

在本具體實施例中,接地片290設置於模組上蓋體240與模組下蓋體246之間的位置,使試片讀取模組210的整體厚度相較於圖1C揭露之先前技術的試片讀取模組110,約可降低2~3mm的模組厚度,本具體實施例藉由調整元件間的堆疊順序,使得試片讀取模組210相較於習知技術的試片讀取模組更為輕薄。本發明所使用的彈力元件280並不限於彈簧,其他可提供彈力的元件諸如金屬彈片、金屬簧片(metal dome)都可適用。導電元件270可為柱型、球型元件,但不限定為其他形狀態樣,材質可為金屬材質,例如鋼材。阻隔元件260為一彈性元件,可為橡膠、矽膠材質。在該接地片290,配置複數個穿孔294與操作孔242匹配,以容納複數個阻隔元件260於其中作動。在試片220插入時,複數個阻隔元件260依試片220的孔洞222的編碼設計而穿過該複數個穿孔294上下活動。 In this specific embodiment, the grounding piece 290 is disposed between the module upper cover 240 and the module lower cover 246, so that the overall thickness of the test strip reading module 210 is compared with that of the prior art disclosed in FIG. 1C. The test strip reading module 110 can reduce the module thickness by about 2 ~ 3mm. In this specific embodiment, by adjusting the stacking order between the components, the test strip reading module 210 is compared with the conventional technology. The module is thinner and lighter. The elastic element 280 used in the present invention is not limited to a spring, and other elements capable of providing elastic force such as a metal dome and a metal dome can be applied. The conductive element 270 may be a cylindrical or spherical element, but is not limited to other shapes. The material may be a metal material, such as steel. The blocking element 260 is an elastic element, which can be made of rubber or silicon. A plurality of through holes 294 are arranged on the grounding plate 290 to match the operation holes 242 to accommodate the plurality of blocking elements 260 for operation therein. When the test strip 220 is inserted, the plurality of blocking elements 260 move up and down through the plurality of perforations 294 according to the coding design of the holes 222 of the test strip 220.

如第3A圖所示,當試片220未插入試片讀取模組210時,彈力元件280頂住導電元件270,將導電元件270向上方推擠,短路突起270以因應彈力元件280之推擠而接觸接地片290,因此電子信號Vs可以由接地片290,透過彈力元件280傳送到第一電路板253上的第一導電區234,並經由第一電路板253上的第二導電區235,再經連接器230傳送至第二電路板256上的第三導電區236形成導電迴路,以供第二電路板256 的處理電路讀取以分析電子信號Vs,決定試片的編碼及判定插入試片讀取模組210的試片種類。電子信號Vs為接地信號,也可以是電壓電流信號。 As shown in FIG. 3A, when the test strip 220 is not inserted into the test strip reading module 210, the elastic element 280 is pressed against the conductive element 270, and the conductive element 270 is pushed upward, and the short-circuited protrusion 270 is corresponding to the push of the elastic element 280. The electronic signal Vs can be transmitted from the ground plate 290 to the first conductive region 234 on the first circuit board 253 through the elastic element 280 and pass through the second conductive region 235 on the first circuit board 253. Then, it is transmitted to the third conductive region 236 on the second circuit board 256 via the connector 230 to form a conductive loop, which can be read by the processing circuit of the second circuit board 256 to analyze the electronic signal Vs, determine the coding of the test strip and determine the insertion. Test strip type of the test strip reading module 210. The electronic signal Vs is a ground signal, and may also be a voltage current signal.

如果電子信號Vs是一電壓,則上述的迴路將形成電流。如第3A圖左側操作孔242所示,試片220插入試片讀取模組210後,當啟動元件250對應到不含凸起部224的孔洞222時,啟動元件250未受到擠壓,導電元件270依然與接地片接觸而構成導電狀態,可被判讀為第一編碼訊號。如第3A圖右側操作孔242所示,當啟動元件250對應到試片220的凸起部224而受擠壓時,操作孔242中啟動元件250的位置向下擠壓阻隔元件260,進而使得導電元件270與接地片290構成斷路的狀態,來自信號源291的電子信號Vs無法傳送到第二電路板256的第三導電區236,所以沒有形成迴路以形成電流,則被第二電路板256判讀為第二編碼訊號。此外,啟動元件250受到凸起部224被擠壓的啟動高度H2約為0.4mm~0.8mm之間,幫助第一操作行程組件以及第二操作行程組件的作動能夠有效執行。換句話說,當試片220配置於試片讀取模組210上方時,上述無電流的狀態也就意謂著孔洞222之中存在有凸起部224,這也可以用作是對於試片220上孔洞密碼的解讀。 If the electronic signal Vs is a voltage, the above-mentioned circuit will form a current. As shown in the left operating hole 242 in FIG. 3A, after the test strip 220 is inserted into the test strip reading module 210, when the activation element 250 corresponds to the hole 222 without the protrusion 224, the activation element 250 is not squeezed and is conductive. The element 270 is still in contact with the ground plate to form a conductive state, and can be interpreted as a first coded signal. As shown in the right operation hole 242 in FIG. 3A, when the activation member 250 is pressed corresponding to the convex portion 224 of the test piece 220, the position of the activation member 250 in the operation hole 242 presses the blocking member 260 downward, so that The conductive element 270 and the ground plate 290 form an open circuit state, and the electronic signal Vs from the signal source 291 cannot be transmitted to the third conductive region 236 of the second circuit board 256. Therefore, if a loop is not formed to form a current, the second circuit board 256 Interpreted as a second coded signal. In addition, the starting height H2 of the starting element 250 being squeezed by the convex portion 224 is between about 0.4 mm and 0.8 mm, which helps the first and second operating stroke components to effectively perform their operations. In other words, when the test strip 220 is arranged above the test strip reading module 210, the above-mentioned no-current state means that there is a convex portion 224 in the hole 222, which can also be used for the test strip. Interpretation of the hole password on 220.

因此本領域具有通常知識的人士可以了解本發明的試片讀取裝置的密碼讀取原理。在另一實施方式中,將試片孔洞222(存在有凸起部224的地方設計為導電狀態,而未存在凸起部224的地方則設計為斷路。透過以上具體實施例的配置方式,可依據來自信號源291的電子信號Vs構成電流是否否形成一迴路,而能夠解讀或辨識試片220上單一孔洞的編碼。以二位元編碼為例,其中一種編碼狀態代表0,則另一種編碼狀態代表1;反之亦然。 Therefore, persons with ordinary knowledge in the art can understand the password reading principle of the test strip reading device of the present invention. In another embodiment, the test piece hole 222 (where the convex portion 224 is present is designed to be conductive, and where the convex portion 224 is not present is designed to be open circuit. Through the configuration of the above specific embodiment, it may be Based on whether the electronic signal Vs from the signal source 291 constitutes a current or not, it can decode or identify the code of a single hole on the test strip 220. Take a two-bit code as an example, where one code state represents 0, and the other code The status represents 1; vice versa.

在處理試片讀取模組於使用上常發生的血液或灰塵汙染的問題,本發明提出以下解決方法,但不限於此。請參閱第3B圖,其為本發 明第二具體實施例中試片插入試片讀取模組210的局部剖面圖。第3B圖沿用與第3A圖一樣的元件符號。第3B圖中阻隔元件260與第3A圖中阻隔元件260的不同,為了因應不同形式的阻隔元件260,將導電元件270形狀加以調整以便能與阻隔元件260匹配。 In dealing with the problem of blood or dust contamination that often occurs in the use of the test strip reading module, the present invention proposes the following solutions, but is not limited thereto. Please refer to FIG. 3B, which is a partial cross-sectional view of the test strip inserting test strip reading module 210 in the second embodiment of the present invention. FIG. 3B uses the same element symbols as those in FIG. 3A. The barrier element 260 in FIG. 3B is different from the barrier element 260 in FIG. 3A. In order to respond to different types of the barrier element 260, the shape of the conductive element 270 is adjusted so as to match the barrier element 260.

請參閱第3C圖的另一個具體實施例,各部位的元件配置及作動原理基本與第3B圖的實施例相似,差異在於將阻隔元件260形狀改變,並將啟動元件250與導電元件270結合成為一加長柱狀型的導電元件450,該導電元件450具有用以接觸試片220之孔洞222的第一端452,以及用以抵頂彈力元件280的第二端454,導電元件450具有較靠近第一端452的第一槽壁457以及相對於第一槽壁457的第二槽壁458,第一槽壁457及第二槽壁458之間的空間為側邊槽456。 Please refer to another specific embodiment in FIG. 3C. The component configuration and operation principle of each part are basically similar to the embodiment in FIG. 3B. The difference is that the shape of the blocking element 260 is changed, and the activation element 250 and the conductive element 270 are combined into An elongated columnar conductive element 450 having a first end 452 for contacting the hole 222 of the test piece 220 and a second end 454 for abutting the elastic element 280. The conductive element 450 has a relatively close The first groove wall 457 of the first end 452 and the second groove wall 458 opposite to the first groove wall 457. The space between the first groove wall 457 and the second groove wall 458 is a side groove 456.

如第3C圖左側操作孔242所示,當試片220插入在試片上承靠端241與試片下承靠端244之間所定義的試片插槽243後且導電元件450對應到試片220之孔洞222不含凸起部224時,導電元件450未受到擠壓,使導電元件450之短路突起272的第二槽壁458依然與接地片290接觸,因此電子信號Vs透過接地片290及彈力元件280與第一電路板253的第一導電區234構成導電狀態且形成迴路,而可被判讀為第一編碼訊號。如第3C圖右側操作孔242所示,當導電元件450對應到試片220之凸起部224而受擠壓時,操作孔242中導電元件450的位置向下方移動,進而使得導電元件450之短路突起272的第二槽壁358與該接地片290脫離,使得來自信號源291的電子信號Vs與第一電路板253的第一導電區234構成斷路的狀態。 As shown in the left operating hole 242 of FIG. 3C, when the test piece 220 is inserted into the test piece slot 243 defined between the test piece end 241 and the test piece lower end 244 and the conductive element 450 corresponds to the test piece When the hole 222 of 220 does not include the protrusion 224, the conductive element 450 is not squeezed, so that the second groove wall 458 of the short-circuited protrusion 272 of the conductive element 450 is still in contact with the ground plate 290, so the electronic signal Vs passes through the ground plate 290 and The elastic element 280 and the first conductive region 234 of the first circuit board 253 form a conductive state and form a loop, and can be interpreted as a first coded signal. As shown in the right operation hole 242 in FIG. 3C, when the conductive element 450 is pressed corresponding to the protruding portion 224 of the test piece 220, the position of the conductive element 450 in the operation hole 242 moves downward, thereby making the conductive element 450 The second groove wall 358 of the short-circuiting protrusion 272 is detached from the ground piece 290, so that the electronic signal Vs from the signal source 291 and the first conductive region 234 of the first circuit board 253 form a disconnected state.

如第3C圖所示,每個操作孔242所配置的阻隔元件360為獨立運作,因此不會對其他操作孔242所配置之阻隔元件360的運作造成干涉。由於阻隔元件360較佳為彈性材質,可以隨著導電元件450的上下 移動而形變,所以和第一槽壁457維持匹配的狀態。然而,由於這時接地片290與第一電路板253的第一導電區234之間是在斷路的狀態,來自信號源291的電子信號Vs無法從第一電路板253上的第一導電區234經過各該第二導電區235,然後由連接器230傳送到第二電路板256的第三導電區236,所以沒有形成迴路以形成電流,則被判讀為第二編碼訊號。 As shown in FIG. 3C, the blocking elements 360 disposed in each operation hole 242 operate independently, and therefore do not interfere with the operations of the blocking elements 360 disposed in other operation holes 242. Since the blocking member 360 is preferably made of an elastic material and can be deformed as the conductive member 450 moves up and down, it is maintained in a matched state with the first groove wall 457. However, since the ground plate 290 and the first conductive region 234 of the first circuit board 253 are disconnected at this time, the electronic signal Vs from the signal source 291 cannot pass through the first conductive region 234 on the first circuit board 253. Each of the second conductive regions 235 is then transmitted by the connector 230 to the third conductive region 236 of the second circuit board 256. Therefore, no loop is formed to form a current, and it is interpreted as a second coded signal.

當試片220配置於試片讀取模組210上方時,孔洞222中未有凸起部224時為無電流的狀態。因此本領域具有通常知識的人士可以了解本發明的試片讀取裝置的密碼讀取原理,透過以上實施例的配置方式,可依據來自信號源291的電子信號Vs構成電流與否,而能夠解讀或辨識試片220上單一孔洞的編碼。以二位元編碼為例,其中一種編碼狀態代表0,則另一種編碼狀態代表1;反之亦然。 When the test strip 220 is disposed above the test strip reading module 210, when there is no convex portion 224 in the hole 222, the current is in a non-current state. Therefore, people with ordinary knowledge in the field can understand the password reading principle of the test strip reading device of the present invention. Through the configuration of the above embodiments, the current can be interpreted based on the electronic signal Vs from the signal source 291 and can be interpreted. Or identify the code of a single hole on the test strip 220. Take two-bit encoding as an example, one of the encoding states represents 0, and the other encoding state represents 1; and vice versa.

參考第4A圖,一種以導電橡膠連接器231作為連接器230的實施例,導電橡膠連接器231包含第四導電區238,由彼此電性隔離的複數電觸點構成,該第四導電區238的第一端的第三電觸點2381與第二電路板256上的該第三導電區236匹配並接觸,該第四導電區238的第二端的第四電觸點2382與第一電路板253上的該第二導電區235匹配並接觸,而該第二導電區235與第一導電區234電性連接,使對應連接各該複數編碼信號由第一導電區234經過該第二導電區235及該第四導電區238傳送至該第三導電區236。該第三導電區236之第二電觸點2361的面積與第二導電區235之第一電觸點2351形狀及面積大小相同。各該第三導電區236與第四導電區238第一端的至少2個第三電觸點2381匹配壓合,而各該第二導電區235與第四導電區238第二端的至少2個第四電觸點2382匹配壓合。 Referring to FIG. 4A, an embodiment in which a conductive rubber connector 231 is used as the connector 230. The conductive rubber connector 231 includes a fourth conductive region 238, which is composed of a plurality of electrical contacts electrically isolated from each other. The fourth conductive region 238 The third electrical contact 2381 at the first end of the second terminal matches and contacts the third conductive region 236 on the second circuit board 256. The fourth electrical contact 2382 at the second end of the fourth conductive region 238 is in contact with the first circuit board. The second conductive region 235 on 253 is matched and contacted, and the second conductive region 235 is electrically connected to the first conductive region 234, so that each of the plurality of encoded signals corresponding to the connection passes from the first conductive region 234 to the second conductive region. 235 and the fourth conductive region 238 are transmitted to the third conductive region 236. The area of the second electrical contact 2361 of the third conductive region 236 is the same as that of the first electrical contact 2351 of the second conductive region 235. Each of the third conductive region 236 and at least two third electrical contacts 2381 of the first end of the fourth conductive region 238 are matched and pressed, and each of the second conductive region 235 and at least two of the second end of the fourth conductive region 238 are pressed. The fourth electrical contact 2382 is matched and pressed.

參考第4B圖,一種以可撓式電路板232作為連接器230的實施例,可撓式電路板232包含第四導電區238,該第四導電區238的第一端與第二電路板256上位於連接插座內的該第三導電區236電性連接,該 第四導電區238的第二端與第一電路板253上的該第二導電區235電性連接,第二導電區235匹配並與第一導電區234電性連接,使對應連接各該複數編碼信號由第一導電區234經過該第二導電區235及該第四導電區238傳送至該三導電區236。由於可撓式電路板232因為其長度關係在彎曲部分會造成下垂,使得可撓式電路板232對其下方附近的元件造成干涉,因此在可撓式電路板232下緣加裝一薄型金屬片托住可撓式電路板232,以避免前述問題。 Referring to FIG. 4B, an embodiment in which a flexible circuit board 232 is used as the connector 230, the flexible circuit board 232 includes a fourth conductive region 238, a first end of the fourth conductive region 238 and a second circuit board 256 The third conductive region 236 located in the connection socket is electrically connected, the second end of the fourth conductive region 238 is electrically connected to the second conductive region 235 on the first circuit board 253, and the second conductive region 235 matches And is electrically connected to the first conductive region 234, so that each of the plurality of encoded signals corresponding to the connection is transmitted from the first conductive region 234 to the three conductive regions 236 through the second conductive region 235 and the fourth conductive region 238. Because the flexible circuit board 232 will sag in the bent part due to its length, the flexible circuit board 232 will cause interference with the components below it, so a thin metal sheet is added to the lower edge of the flexible circuit board 232 Support the flexible circuit board 232 to avoid the aforementioned problems.

為解決過去阻隔元件所帶來的問題以及血液不慎進入生理參數測量裝置內部造成的血汙問題,本發明提出的一種解決方案如下,但不限於此。 In order to solve the problems caused by the barrier element in the past and the blood staining problem caused by blood entering the physiological parameter measuring device accidentally, a solution proposed by the present invention is as follows, but is not limited thereto.

如第3A圖所示,當試片插入試片插槽243後,啟動元件250將因應試片220上孔洞222的編碼而上下移動,在移動的同時會擠壓到下方的阻隔元件260,阻隔元件再進一步擠壓導電元件270,藉此解讀試片220上的編碼,其中阻隔元件260為一彈性元件,可為橡膠、矽膠材質,以便作為承載複數個啟動元件250的一體式橡膠膜。此外,阻隔元件260在啟動元件250往下作動時會產生形變,使得啟動元件250在下壓時需要額外的壓力差,另一方面,當外部的汙染物經由操作孔242進入讀取模組時,會被聚集在阻隔元件260的表面,避免汙染物流到下層的電路元件。 As shown in FIG. 3A, after the test strip is inserted into the test slot 243, the starting element 250 will move up and down in response to the coding of the hole 222 on the test strip 220, and it will be squeezed to the lower blocking element 260 while moving, blocking The element further squeezes the conductive element 270 to interpret the code on the test piece 220. The blocking element 260 is an elastic element, which can be made of rubber or silicon rubber, so as to be an integrated rubber film carrying a plurality of starting elements 250. In addition, the blocking element 260 is deformed when the starting element 250 is moved downward, so that the starting element 250 requires an additional pressure difference when it is pushed down. On the other hand, when external contaminants enter the reading module through the operation hole 242, Will be collected on the surface of the barrier element 260 to prevent contaminants from flowing to the underlying circuit elements.

本發明提出的另一種解決方案,如第3B圖所示,當試片插入試片插槽243後,啟動元件250將因應試片上孔洞222的編碼而上下移動,在移動的同時會擠壓到下方的阻隔元件260,阻隔元件再進一步擠壓導電元件270,藉此解讀試片上的編碼,其中阻隔元件包含呈懸臂型的第一阻隔261及平行於邊壁的第二阻隔263,使得各個啟動元件得以獨立運作,不會受到鄰近的操作孔242中的作動影響,而有錯誤讀碼的情形。此外,第一阻隔261在啟動元件250往下作動時會產生形變,使得啟動元件250在 下壓時需要額外的壓力差,讓下方連動的導電元件270作動更加精確,達到準確編碼的目的,另一方面,當外部的汙染物經由操作孔242進入讀取模組時,會被聚集在啟動元件下方兩個呈V型的汙染物收集部262中,而不會直接影響到下層的導電作動方式。 Another solution proposed by the present invention is shown in FIG. 3B. After the test piece is inserted into the test piece slot 243, the starting element 250 will move up and down due to the coding of the hole 222 on the test piece, and it will be squeezed to the same time as it moves. The lower barrier element 260, the barrier element further squeezes the conductive element 270, thereby interpreting the code on the test strip, wherein the barrier element includes a first barrier 261 in a cantilever shape and a second barrier 263 parallel to the side wall, so that each start The components can operate independently, and will not be affected by the actions in the adjacent operation holes 242, and there will be cases of incorrect code reading. In addition, the first barrier 261 will deform when the starting element 250 is actuated downward, so that the starting element 250 needs an additional pressure difference when it is pushed down, so that the conductive element 270 linked below can act more accurately and achieve the purpose of accurate coding. On the other hand, when external pollutants enter the reading module through the operation hole 242, they will be collected in two V-shaped pollutant collection portions 262 under the activation element, without directly affecting the conductive operation mode of the lower layer.

本發明提出的另一種解決方案如第3C圖所示,當試片220插入後,該阻隔元件360會隨著導電元件450的上下移動而形變,該阻隔元件360包含第一阻隔361及第二阻隔363,使各別導電元件450之作動可獨立運作,因此不會發生共用阻隔元件時誤壓到鄰近的導電元件而造成錯誤讀碼的情形。且該第一阻隔361使阻隔元件360在被擠壓的過程中需額外壓力差,使第一阻隔361變形,讓連動之導電元件450作動能更加精確,可增進讀碼的準確性。 Another solution proposed by the present invention is shown in FIG. 3C. After the test piece 220 is inserted, the blocking element 360 will be deformed as the conductive element 450 moves up and down. The blocking element 360 includes a first barrier 361 and a second barrier. The barrier 363 allows the operations of the respective conductive elements 450 to operate independently, so that there is no case where a wrong barrier is pressed to a neighboring conductive element when the barrier element is shared, which causes a wrong reading of the code. In addition, the first barrier 361 causes the barrier element 360 to require an additional pressure difference during the process of being squeezed, deforms the first barrier 361, and makes the kinetic energy of the linked conductive element 450 more accurate, which can improve the accuracy of code reading.

如第3C圖所示,改良後的阻隔元件360配置一汙染物收集裝置362,該汙染物收集部362形成於第一阻隔361及第二阻隔363之間,該第二阻隔363貼近並平行於操作孔的第一邊壁345,該污染物收集部362並和該側邊槽456相匹配。如第3C圖顯示,該汙染物收集部362剖面如一口袋般的凹槽。當有來自試片或是空氣中的污染物P不慎進入試片讀取模組310,汙染物P會被限制在該汙染物收集部362中,不會往下進入模組下層而影響導電作動方式。 As shown in FIG. 3C, the improved barrier element 360 is provided with a pollutant collecting device 362. The pollutant collecting portion 362 is formed between the first barrier 361 and the second barrier 363, and the second barrier 363 is close to and parallel to The first side wall 345 of the operation hole and the pollutant collecting part 362 are matched with the side groove 456. As shown in FIG. 3C, the cross section of the pollutant collecting portion 362 is a pocket-like groove. When the pollutant P from the test strip or the air accidentally enters the test strip reading module 310, the pollutant P will be confined in the pollutant collection part 362, and will not enter the lower layer of the module and affect the conductivity. Mode of action.

第3C圖所示的阻隔元件360與第3B圖的阻隔元件260相較之下,阻隔元件360的第一阻隔361相較第3B圖第一阻隔261之厚度增加且寬度變窄,可使阻隔元件受力更為集中,且阻隔元件360形成個別套筒結構,因此個別套筒在被擠壓的過程中,連結之導電元件450作動能更加精確,不受其他鄰近導電元件450的影響,且阻隔元件360同樣包含汙染物收集部362,如第3C圖中顯示的是剖面如口袋般的U型凹槽,本發明的阻隔元件設計態樣不限於其他類似型態。 The barrier element 360 shown in FIG. 3C is compared with the barrier element 260 in FIG. 3B. The first barrier 361 of the barrier element 360 is thicker and narrower than the first barrier 261 in FIG. 3B. The element is more concentrated in force, and the blocking element 360 forms an individual sleeve structure. Therefore, during the extrusion of the individual sleeve, the kinetic energy of the connected conductive element 450 is more accurate, and it is not affected by other neighboring conductive elements 450. The blocking element 360 also includes a pollutant collecting portion 362. As shown in FIG. 3C, a U-shaped groove with a cross-section like a pocket is shown. The design of the blocking element of the present invention is not limited to other similar types.

實施例:     Example:    

1.一種試片讀取裝置,包含:一模組上蓋體,設置有至少一試片承靠端以及至少一操作槽,該槽具有複數操作孔,該複數操作孔用以置入複數第一操作行程組件;一接地片,具有與該複數操作孔對應的複數穿孔,供各該複數第一操作行程組件於各該複數操作孔及各該複數穿孔之間移動;一模組下蓋體設置於該操作槽內,設置有複數第二操作行程組件,各該複數第二操作行程組件與該接地片之接觸與分離狀態決定一讀取訊號;一第一電路板,配置於該模組下蓋體底部且具第一導電區及第二導電區;以及一第二電路板,具第三導電區,並與該第二導電區以一連接器進行電連接,獲得試片讀取訊號。 1. A test piece reading device comprising: a module upper cover body provided with at least one test piece abutment end and at least one operation slot, the slot having a plurality of operation holes for inserting a plurality of first Operation stroke component; a ground piece with a plurality of perforations corresponding to the plurality of operation holes for each of the plurality of first operation stroke components to move between each of the plurality of operation holes and each of the plurality of perforations; a module lower cover is provided In the operation slot, a plurality of second operation stroke components are provided, and the contact and separation status of each of the plurality of second operation stroke components and the ground plate determines a read signal; a first circuit board is arranged under the module The bottom of the cover is provided with a first conductive region and a second conductive region; and a second circuit board is provided with a third conductive region, and is electrically connected to the second conductive region with a connector to obtain a test strip read signal.

2.如實施例1所述之之試片讀取裝置,其中該模組上蓋體更包含一試片上承靠端與一試片下承靠端,以形成與該模組上蓋體一體成型的一試片插槽,以容納一試片,該試片插槽的高度為該試片的厚度加上一個介於0.05~0.5mm的空隙。 2. The test strip reading device according to embodiment 1, wherein the upper cover of the module further comprises an upper bearing end of the test piece and a lower bearing end of the test piece to form an integrally formed body with the upper cover of the module. A test piece slot is used to accommodate a test piece. The height of the test piece slot is the thickness of the test piece plus a gap between 0.05 and 0.5 mm.

3.如實施例1至2所述之之試片讀取裝置,其中該複數第一操作行程組件包含複數啟動元件,用於接觸該試片上的複數編碼元件。 3. The test strip reading device according to embodiments 1 to 2, wherein the plurality of first operation stroke components includes a plurality of activation elements for contacting the plurality of encoding elements on the test strip.

4.如實施例1至3中任一實施例所述之試片讀取裝置,其中該複數第一操作行程組件更包含複數阻隔元件,配置於該複數啟動元件下方。 4. The test strip reading device according to any one of embodiments 1 to 3, wherein the plurality of first operation stroke components further include a plurality of blocking elements arranged under the plurality of activation elements.

5.如實施例1至4中任一實施例所述之試片讀取裝置,其中該複數第二操作行程組件包含設置於該接地片下方的複數導電元件,以及用以抵頂該複數導電元件的複數彈力元件。 5. The test strip reading device according to any one of embodiments 1 to 4, wherein the plurality of second operation stroke components include a plurality of conductive elements disposed below the ground plate, and resisting the plurality of conductive elements. A plurality of elastic elements.

6.如實施例1至5中任一實施例所述之試片讀取裝置,其中該接地片設置於該模組上蓋體與該模組下蓋體之間各該複數導電元件因應各該複數彈力元件之推擠而接觸該接地片,當各該複數導電元件與該接地片接觸時,形成一導電狀態,以及當各該複數導電元件與該接地片分離時,形成 一未導電狀態。 6. The test strip reading device according to any one of embodiments 1 to 5, wherein the grounding strip is disposed between the upper cover of the module and the lower cover of the module. The plurality of elastic elements are pushed to contact the ground piece, and when each of the plurality of conductive elements is in contact with the ground piece, a conductive state is formed, and when each of the plurality of conductive elements is separated from the ground piece, a non-conductive state is formed.

7.如實施例1至6中任一實施例所述之試片讀取裝置,其中該第一電路板設置於該複數彈力元件下方,經由各該複數導電元件以及該第一導電區以接收該導電狀態以及該未導電狀態。 7. The test strip reading device according to any one of embodiments 1 to 6, wherein the first circuit board is disposed below the plurality of elastic elements, and is received by each of the plurality of conductive elements and the first conductive region. The conductive state and the non-conductive state.

8.如實施例1至7中任一實施例所述之試片讀取裝置,所述試片之編碼元件為孔洞結構,其中當該試片插入該試片插槽時,根據各該複數編碼孔中是否有一凸起部,決定各該複數導電元件與各該接地片是否電接觸,以經由該導電狀態或該未導電狀態判斷該試片上相對於各該複數個操作孔位置的該讀取訊號。 8. The test strip reading device according to any one of embodiments 1 to 7, wherein the coding element of the test strip has a hole structure, wherein when the test strip is inserted into the test strip slot, according to each of the plural numbers Whether or not there is a raised portion in the coding hole determines whether each of the plurality of conductive elements is in electrical contact with each of the ground pieces, so as to judge the reading on the test piece relative to the positions of the plurality of operation holes through the conductive state or the non-conductive state. Get the signal.

9.如實施例1至8中任一實施例所述之試片讀取裝置,其中該第一導電區及第二導電區電性連接。 9. The test strip reading device according to any one of embodiments 1 to 8, wherein the first conductive region and the second conductive region are electrically connected.

10.如實施例1至11中任一實施例所述之試片讀取裝置,其中該連結器為可撓式電路板,其該電路板上配置平行且隔離的複數導線,並與各該第二導電區及各該第三導電區相匹配。 10. The test strip reading device according to any one of embodiments 1 to 11, wherein the connector is a flexible circuit board, and a plurality of parallel and isolated wires are arranged on the circuit board, and are connected to each of the The second conductive region and each of the third conductive regions are matched.

11.如實施例1至12中任一實施例所述之試片讀取裝置,其中該連結器為一導電橡膠連接器,該導電橡膠連接器上配置平行且隔離的第四導電區,並與各該第二導電區及各該第三導電區相匹配進行電性連接。 11. The test strip reading device according to any one of embodiments 1 to 12, wherein the connector is a conductive rubber connector, and a parallel and isolated fourth conductive region is arranged on the conductive rubber connector, and It is electrically connected to each of the second conductive regions and each of the third conductive regions.

12.一種用以容納一試片的試片讀取裝置,包含:一接地片連接一信號源;複數導電元件,頂抵該試片;一模組上蓋體,設置有至少一試片承靠端,該模組上蓋體包含操作槽,該槽具有複數操作孔,用以容納該複數導電元件的上半部;一模組下蓋體,容納該複數導電元件的下半部,並設置具導電性的複數彈力元件,其中各該複數導電元件與該接地片之接觸與分離狀態決定一編碼訊號;一第一電路板,用以讀取該編碼訊號,該第一電路板具第一導電區及與該第一導電區電性連接的第二導電區;以及一第二電路板,具第三導電區,與該第二導電區以一連接器電性連接,以接收該 編碼訊號。13.如實施例12所述之如申請專利範圍第15項所述之試片讀取裝置,其中該接地片與該信號源的一正極及一負極其中之一電性連接。 12. A test strip reading device for accommodating a test strip, comprising: a ground strip connected to a signal source; a plurality of conductive elements abutting against the test strip; a module upper cover provided with at least one test strip support End, the module upper cover includes an operation slot, the slot has a plurality of operation holes for receiving the upper half of the plurality of conductive elements; a module lower cover, which accommodates the lower half of the plurality of conductive elements, and is provided with a tool A conductive plurality of elastic elements, wherein the contact and separation state of each of the plurality of conductive elements and the ground plate determines a coded signal; a first circuit board for reading the coded signal, and the first circuit board has a first conductivity And a second conductive area electrically connected to the first conductive area; and a second circuit board having a third conductive area electrically connected to the second conductive area through a connector to receive the coded signal. 13. The test strip reading device as described in the twelfth aspect of the patent application scope of embodiment 12, wherein the ground strip is electrically connected to one of a positive electrode and a negative electrode of the signal source.

14.如實施例12或13所述之試片讀取裝置,其中該接地片位於該模組上蓋體與該模組下蓋體之間,且具有與該複數操作孔對應的複數穿孔,供各該複數導電元件於各該複數操作孔及各該複數穿孔之間移動。 14. The test strip reading device according to embodiment 12 or 13, wherein the grounding strip is located between the upper cover of the module and the lower cover of the module, and has a plurality of perforations corresponding to the plurality of operation holes. Each of the plurality of conductive elements moves between each of the plurality of operation holes and each of the plurality of perforations.

15.如實施例12至14中任一實施例所述之試片讀取裝置,其中各該複數導電元件為一柱狀導電元件。 15. The test strip reading device according to any one of embodiments 12 to 14, wherein each of the plurality of conductive elements is a columnar conductive element.

16.如實施例12至15中任一實施例所述之試片讀取裝置,其中各該複數導電元件具一第一端,用以接觸該試片上的複數編碼孔,以及一第二端,用以抵頂各該複數彈力元件。 16. The test strip reading device according to any one of embodiments 12 to 15, wherein each of the plurality of conductive elements has a first end for contacting a plurality of coded holes on the test strip, and a second end For abutting each of the plurality of elastic elements.

17.如實施例12至16中任一實施例所述之試片讀取裝置,其中各該複數第一操作行程組件包含被配置於鄰近該第一端的一汙染物收集部,俾收集進入該試片讀取裝置之一汙染物,且其中該柱狀導電元件更具有與該汙染物收集部相匹配的一側邊槽。 17. The test strip reading device according to any one of embodiments 12 to 16, wherein each of the plurality of first operation stroke components includes a pollutant collection portion disposed near the first end, and collects and enters One of the pollutants of the test strip reading device, and the columnar conductive element further has a side groove matching the pollutant collection portion.

18.如實施例12至17中任一實施例所述之試片讀取裝置,其中該模組下蓋體底部配置該彈力元件,用以抵頂該柱狀導電元件,該彈力元件與該第一導電區電性連接。 18. The test strip reading device according to any one of embodiments 12 to 17, wherein the elastic element is arranged at the bottom of the lower cover of the module to abut the columnar conductive element, and the elastic element and the The first conductive region is electrically connected.

19.如實施例12至18中任一實施例所述之試片讀取裝置,該側邊槽具有靠近該第一端的一第一槽壁以及相對於該第一槽壁的一第二槽壁,且該第二槽壁被配置以因應該彈力元件之推擠而接觸該接地片。 19. The test strip reading device according to any one of embodiments 12 to 18, the side groove has a first groove wall near the first end and a second groove wall opposite to the first groove wall. A groove wall, and the second groove wall is configured to contact the grounding piece in response to the pushing of the elastic element.

20.如實施例12至19中任一實施例所述之試片讀取裝置,其中該試片之各該複數編碼孔包含或不包含一凸起部,其中當各該複數編碼孔中包含該凸起部時,該凸起部抵頂該第一端,使各該複數導電元件與該接地片分離而形成一未導電狀態;以及當各該複數編碼孔中不包含該凸起部時,該第一端未被抵頂,使各該複數導電元件與該接地片接觸而形成一導電狀態。 20. The test strip reading device according to any one of embodiments 12 to 19, wherein each of the plurality of coded holes of the test strip includes or does not include a raised portion, wherein when each of the plurality of coded holes includes When the raised portion abuts against the first end, each of the plurality of conductive elements is separated from the ground piece to form a non-conductive state; and when the plurality of encoded holes does not include the raised portion , The first end is not pressed, so that each of the plurality of conductive elements is in contact with the ground sheet to form a conductive state.

21.如實施例12至20中任一實施例所述之試片讀取裝置,其中當該試片插入一試片插槽時,根據各該複數個編碼孔中是否有該凸起部,決定該未導電狀態或該導電狀態,以判斷該試片上相對於各該複數個操作孔位置的該編碼訊號。 21. The test strip reading device according to any one of the embodiments 12 to 20, wherein when the test strip is inserted into a test strip slot, according to whether each of the plurality of coding holes has the convex portion, The non-conductive state or the conductive state is determined to determine the coded signal on the test piece relative to the positions of the plurality of operation holes.

22.如實施例12至21中任一實施例所述之試片讀取裝置,其中當各該複數導電元件在操作時,依據該試片上相對各該複數操作孔之結構,決定各該複數導電元件與各該接地片形成一導電狀態或一未導電狀態,由該導電狀態與該未導電狀態判斷該試片上相對各該複數操作孔的該編碼訊號。 22. The test strip reading device according to any one of embodiments 12 to 21, wherein when each of the plurality of conductive elements is in operation, each of the plurality is determined according to a structure of the test strip relative to each of the plurality of operation holes. The conductive element and each of the ground pieces form a conductive state or a non-conductive state, and the coded signal on the test piece opposite to each of the plurality of operation holes is judged from the conductive state and the non-conductive state.

23.如實施例12至22中任一實施例所述之試片讀取裝置,其中該模組上蓋體容納至少一電觸部,該電觸部一端電連接該試片的至少一電極,另一端連結第一電路板。 23. The test strip reading device according to any one of embodiments 12 to 22, wherein the upper cover of the module accommodates at least one electrical contact portion, and one end of the electrical contact portion is electrically connected to at least one electrode of the test strip, The other end is connected to the first circuit board.

24.一種試片讀取裝置,包含:一接地片,用以傳遞一試片所代表的一編碼訊號,其中該試片用以於其上承載一生物檢測樣本;一第一電路板;以及一第二電路板,獨立於該第一電路板、透過該第一電路板接收該編碼訊號、因應該編碼訊號以決定一相應之生物檢測功能、且分析該生物檢測樣本。 24. A test strip reading device comprising: a ground strip for transmitting a coded signal represented by a test strip, wherein the test strip is used to carry a biological detection sample thereon; a first circuit board; and A second circuit board is independent of the first circuit board, receives the encoded signal through the first circuit board, determines a corresponding biological detection function according to the encoded signal, and analyzes the biological detection sample.

25.一種試片讀取裝置,用以讀取一試片所代表的一編碼訊號,及於其上承載之一生物檢測樣本,該試片讀取裝置包含:一裝置本體,具一第一厚度之一容置空間;一第一電路板,具影響該第一厚度之一第二厚度、設置於該容置空間;以及一第二電路板,具不影響該第一厚度之一第三厚度獨立於該第一電路板、設置於該容置空間之外、透過該第一電路板接收該編碼訊號、因應該編碼訊號以決定一相應之生物檢測功能、且分析該生物檢測樣本。 25. A test strip reading device for reading a coded signal represented by a test strip, and a biological detection sample carried thereon, the test strip reading device comprising: a device body having a first A first circuit board having a second thickness that affects the first thickness and a second thickness disposed in the accommodating space; and a second circuit board having a third thickness that does not affect the first thickness The thickness is independent of the first circuit board, is disposed outside the accommodating space, receives the encoded signal through the first circuit board, determines a corresponding biological detection function according to the encoded signal, and analyzes the biological detection sample.

本發明以上述的較佳實施例與範例作為參考而揭露,本領域一般技藝人士須了解這些例子是用於描述而非限定之意。凡習知此技藝 者,在不脫離本發明的精神與範圍之下,當可做各種組合與修飾,本發明以上述的較佳實施例與範例作為參考而揭露,本領域一般技藝人士須了解這些例子是用於描述而非限定之意。凡習知此技藝者,在不脫離本發明的精神與範圍之下,當可做各種組合與修飾,其仍應其仍應屬在本發明專利的涵蓋範圍之內。 The present invention is disclosed with reference to the above-mentioned preferred embodiments and examples. Those skilled in the art must understand that these examples are used for description rather than limitation. Those skilled in the art can make various combinations and modifications without departing from the spirit and scope of the present invention. The present invention is disclosed with reference to the above-mentioned preferred embodiments and examples. Those skilled in the art must understand These examples are intended to be illustrative and not restrictive. Those skilled in the art can make various combinations and modifications without departing from the spirit and scope of the present invention, which should still be within the scope of the patent of the present invention.

Claims (25)

一種試片讀取裝置,包含:一模組上蓋體,設置有至少一試片承靠端以及至少一操作槽,該槽具有複數操作孔,該複數操作孔用以置入複數第一操作行程組件;一接地片,具有與該複數操作孔對應的複數穿孔,供各該複數第一操作行程組件於各該複數操作孔及各該複數穿孔之間移動;一模組下蓋體設置於該操作槽內,設置有複數第二操作行程組件,各該複數第二操作行程組件與該接地片之接觸與分離狀態決定一讀取訊號;一第一電路板,配置於該模組下蓋體底部且具第一導電區及第二導電區;以及一第二電路板,具第三導電區,並與該第二導電區以一連接器進行電連接,獲得試片讀取訊號。A test strip reading device includes: a module upper cover provided with at least one test strip abutment end and at least one operation slot, the slot having a plurality of operation holes for inserting a plurality of first operation strokes Component; a grounding plate with a plurality of perforations corresponding to the plurality of operation holes for each of the plurality of first operation stroke components to move between each of the plurality of operation holes and each of the plurality of perforations; a lower cover of the module is disposed on the The operation slot is provided with a plurality of second operation stroke components, and the contact and separation status of each of the plurality of second operation stroke components and the grounding piece determines a reading signal; a first circuit board is arranged on the lower cover of the module The bottom is provided with a first conductive region and a second conductive region; and a second circuit board is provided with a third conductive region, and is electrically connected to the second conductive region with a connector to obtain a test strip read signal. 如申請專利範圍第1項所述之試片讀取裝置,其中該模組上蓋體更包含一試片上承靠端與一試片下承靠端,以形成與該模組上蓋體一體成型的一試片插槽,以容納一試片,該試片插槽的高度為該試片的厚度加上一個介於0.05~0.5mm的空隙。The test strip reading device according to item 1 of the scope of patent application, wherein the upper cover of the module further includes an upper bearing end of the test piece and a lower bearing end of the test piece to form an integrally formed body with the upper cover of the module. A test piece slot is used to accommodate a test piece. The height of the test piece slot is the thickness of the test piece plus a gap between 0.05 and 0.5 mm. 如申請專利範圍第1項所述之試片讀取裝置,其中該複數第一操作行程組件包含複數啟動元件,用於接觸該試片上的複數編碼元件。The test strip reading device according to item 1 of the scope of the patent application, wherein the plurality of first operation stroke components includes a plurality of activation elements for contacting the plurality of encoding elements on the test strip. 如申請專利範圍第3項所述之試片讀取裝置,其中該複數第一操作行程組件更包含複數阻隔元件,配置於該複數啟動元件下方。The test strip reading device according to item 3 of the scope of patent application, wherein the plurality of first operation stroke components further include a plurality of blocking elements arranged under the plurality of activating elements. 如申請專利範圍第1項所述之試片讀取裝置,其中該複數第二操作行程組件包含設置於該接地片下方的複數導電元件,以及用以抵頂該複數導電元件的複數彈力元件。The test strip reading device described in item 1 of the scope of the patent application, wherein the plurality of second operation stroke components includes a plurality of conductive elements disposed below the ground plate, and a plurality of elastic elements for abutting the plurality of conductive elements. 如申請專利範圍第5項所述之試片讀取裝置,其中該接地片設置於該模組上蓋體與該模組下蓋體之間各該複數導電元件因應各該複數彈力元件之推擠而接觸該接地片,當各該複數導電元件與該接地片接觸時,形成一導電狀態,以及當各該複數導電元件與該接地片分離時,形成一未導電狀態。The test strip reading device as described in item 5 of the scope of patent application, wherein the ground piece is disposed between the upper cover of the module and the lower cover of the module, each of the plurality of conductive elements responds to the pushing of each of the plurality of elastic elements. When contacting the ground piece, when each of the plurality of conductive elements is in contact with the ground piece, a conductive state is formed, and when each of the plurality of conductive elements is separated from the ground piece, a non-conductive state is formed. 如申請專利範圍第1項所述之試片讀取裝置,其中該第一電路板設置於該複數彈力元件下方,經由各該複數導電元件以及該第一導電區以接收該導電狀態以及該未導電狀態。The test strip reading device according to item 1 of the scope of patent application, wherein the first circuit board is disposed below the plurality of elastic elements, and receives the conductive state and the non-conductive state through each of the plurality of conductive elements and the first conductive region. Conductive state. 如申請專利範圍第3項所述之試片讀取裝置,所述試片之編碼元件為孔洞結構,其中當該試片插入該試片插槽時,根據各該複數編碼孔中是否有一凸起部,決定各該複數導電元件與各該接地片是否電接觸,以經由該導電狀態或該未導電狀態判斷該試片上相對於各該複數個操作孔位置的該讀取訊號。According to the test strip reading device described in item 3 of the scope of patent application, the coding element of the test strip is a hole structure, and when the test strip is inserted into the test strip slot, according to whether there is a protrusion in each of the plurality of coded holes. The starting part determines whether each of the plurality of conductive elements is in electrical contact with each of the ground plates, so as to determine the reading signals on the test piece relative to the positions of the plurality of operation holes through the conductive state or the non-conductive state. 如申請專利範圍第1項所述之試片讀取裝置,其中該第一導電區及第二導電區電性連接。The test strip reading device according to item 1 of the scope of patent application, wherein the first conductive region and the second conductive region are electrically connected. 如申請專利範圍第1項所述之試片讀取裝置,其中該連結器為可撓式電路板,其該電路板上配置平行且隔離的複數導線,並與各該第二導電區及各該第三導電區相匹配。The test strip reading device according to item 1 of the scope of patent application, wherein the connector is a flexible circuit board, and the circuit board is provided with a plurality of parallel and isolated wires, and is connected to each of the second conductive regions and each The third conductive region is matched. 如申請專利範圍第1項所述之試片讀取裝置,其中該連結器為一導電橡膠連接器,該導電橡膠連接器上配置平行且隔離的第四導電區,並與各該第二導電區及各該第三導電區相匹配進行電性連接。The test strip reading device according to item 1 of the scope of patent application, wherein the connector is a conductive rubber connector, and the conductive rubber connector is provided with a parallel and isolated fourth conductive region, and is conductive with each of the second conductive regions. The regions and each of the third conductive regions are matched for electrical connection. 一種用以容納一試片的試片讀取裝置,包含:一接地片連接一信號源;複數導電元件,頂抵該試片;一模組上蓋體,設置有至少一試片承靠端,該模組上蓋體包含操作槽,該槽具有複數操作孔,用以容納該複數導電元件的上半部;一模組下蓋體,容納該複數導電元件的下半部,並設置具導電性的複數彈力元件,其中各該複數導電元件與該接地片之接觸與分離狀態決定一編碼訊號;一第一電路板,用以讀取該編碼訊號,該第一電路板具第一導電區及與該第一導電區電性連接的第二導電區;以及一第二電路板,具第三導電區,與該第二導電區以一連接器電性連接,以接收該編碼訊號。A test strip reading device for accommodating a test strip includes: a ground strip connected to a signal source; a plurality of conductive elements against the test strip; a module upper cover body provided with at least one test strip bearing end, The upper cover of the module includes an operation slot, the slot has a plurality of operation holes for receiving the upper half of the plurality of conductive elements; a lower cover of the module, which accommodates the lower half of the plurality of conductive elements, and is provided with conductivity A plurality of elastic elements, wherein the contact and separation state of each of the plurality of conductive elements and the ground plate determines a coded signal; a first circuit board for reading the coded signal, the first circuit board having a first conductive area and A second conductive region electrically connected to the first conductive region; and a second circuit board having a third conductive region electrically connected to the second conductive region with a connector to receive the coded signal. 如申請專利範圍第12項所述之試片讀取裝置,其中該接地片與該信號源的一正極及一負極其中之一電性連接。The test strip reading device according to item 12 of the scope of patent application, wherein the ground strip is electrically connected to one of a positive electrode and a negative electrode of the signal source. 如申請專利範圍第12項所述之試片讀取裝置,其中該接地片位於該模組上蓋體與該模組下蓋體之間,且具有與該複數操作孔對應的複數穿孔,供各該複數導電元件於各該複數操作孔及各該複數穿孔之間移動。The test strip reading device according to item 12 of the scope of patent application, wherein the ground piece is located between the upper cover of the module and the lower cover of the module, and has a plurality of perforations corresponding to the plurality of operation holes for each The plurality of conductive elements move between each of the plurality of operation holes and each of the plurality of perforations. 如申請專利範圍第12項所述之試片讀取裝置,其中各該複數導電元件為一柱狀導電元件。The test strip reading device according to item 12 of the scope of the patent application, wherein each of the plurality of conductive elements is a columnar conductive element. 如申請專利範圍第15項所述之試片讀取裝置,其中各該複數導電元件具一第一端,用以接觸該試片上的複數編碼孔,以及一第二端,用以抵頂各該複數彈力元件。The test strip reading device according to item 15 of the scope of patent application, wherein each of the plurality of conductive elements has a first end for contacting a plurality of coded holes on the test strip, and a second end for abutting each The plurality of elastic elements. 如申請專利範圍第16項所述之試片讀取裝置,其中鄰近該第一端配置有阻隔元件,該組隔元件具有一汙染物收集部,俾收集進入該試片讀取裝置之一汙染物,且其中該柱狀導電元件更具有與該汙染物收集部相匹配的一側邊槽。The test strip reading device according to item 16 of the scope of patent application, wherein a barrier element is arranged adjacent to the first end, and the set of barrier elements has a pollutant collecting part, which collects one of the pollution entering the test strip reading device. And the columnar conductive element further has a side groove matching the pollutant collection portion. 如申請專利範圍第17項所述之試片讀取裝置,其中該模組下蓋體底部配置該複數彈力元件,用以抵頂該柱狀導電元件,該彈力元件與該第一導電區電性連接。The test strip reading device according to item 17 of the scope of patent application, wherein the plurality of elastic elements are arranged at the bottom of the lower cover of the module to abut the columnar conductive element, and the elastic element is electrically connected to the first conductive region. Sexual connection. 如申請專利範圍第17項所述之試片讀取裝置,該側邊槽具有靠近該第一端的一第一槽壁以及相對於該第一槽壁的一第二槽壁,且該第二槽壁被配置以因應該彈力元件之推擠而接觸該接地片。According to the test piece reading device described in item 17 of the scope of patent application, the side groove has a first groove wall near the first end and a second groove wall opposite to the first groove wall, and the first groove wall is opposite to the first groove wall. The two groove walls are configured to contact the ground piece in response to the pushing of the elastic element. 如申請專利範圍第16項所述之試片讀取裝置,所述該試片上的各該複數編碼孔包含或不包含一凸起部,其中當各該複數編碼孔中包含該凸起部時,該凸起部抵頂該第一端,使各該複數導電元件與該接地片分離而形成一未導電狀態;以及當各該複數編碼孔中不包含該凸起部時,該第一端未被抵頂,使各該複數導電元件與該接地片接觸而形成一導電狀態。According to the test strip reading device described in claim 16 of the scope of patent application, each of the plurality of coded holes on the test strip includes or does not include a raised portion, and when each of the plurality of coded holes includes the raised portion The convex portion abuts against the first end, so that each of the plurality of conductive elements is separated from the ground piece to form a non-conductive state; and when the convex portion is not included in each of the plurality of coded holes, the first end If it is not pressed, each of the plurality of conductive elements is brought into contact with the ground plate to form a conductive state. 如申請專利範圍第20項所述之試片讀取裝置,其中當該試片插入一試片插槽時,根據各該複數個編碼孔中是否有該凸起部,決定該未導電狀態或該導電狀態,以判斷該試片上相對於各該複數個操作孔位置的該編碼訊號。The test strip reading device according to item 20 of the scope of patent application, wherein when the test strip is inserted into a test strip slot, the non-conductive state or the non-conductive state is determined according to whether each of the plurality of coding holes has the convex portion. The conductive state is used to determine the encoded signal on the test piece relative to the positions of the plurality of operation holes. 如申請專利範圍第16項所述之試片讀取裝置,其中當各該複數導電元件在操作時,依據該試片上相對各該複數操作孔之結構,決定各該複數導電元件與各該接地片形成一導電狀態或一未導電狀態,由該導電狀態與該未導電狀態判斷該試片上相對各該複數操作孔的該編碼訊號。The test strip reading device according to item 16 of the scope of patent application, wherein when each of the plurality of conductive elements is in operation, each of the plurality of conductive elements and each of the grounds is determined according to the structure of the test strip relative to each of the plurality of operation holes. The chip forms a conductive state or a non-conductive state, and the coded signals on the test strip opposite each of the plurality of operation holes are determined from the conductive state and the non-conductive state. 如申請專利範圍第12項所述之試片讀取裝置,其中該模組上蓋體容納至少一電觸部,該電觸部一端電連接該試片的至少一電極,另一端連結第一電路板。The test strip reading device according to item 12 of the scope of patent application, wherein the upper cover of the module contains at least one electric contact portion, one end of which is electrically connected to at least one electrode of the test strip, and the other end is connected to the first circuit. board. 一種試片讀取裝置,包含:一模組上蓋體,設置有一操作槽;一模組下蓋體,設置於該操作槽內;一接地片,用以傳遞一試片所代表的一編碼訊號,其中該試片用以於其上承載一生物檢測樣本,且該接地片設置於該模組上蓋體與該模組下蓋體之間;一第一電路板;以及一第二電路板,獨立於該第一電路板、透過該第一電路板接收該編碼訊號、因應該編碼訊號以決定一相應之生物檢測功能、且分析該生物檢測樣本。A test strip reading device includes: an upper cover of a module provided with an operation slot; a lower cover of a module provided in the operation slot; and a ground plate for transmitting an encoded signal represented by a test piece Wherein the test piece is used to carry a biological detection sample thereon, and the ground piece is disposed between the upper cover of the module and the lower cover of the module; a first circuit board; and a second circuit board, It is independent of the first circuit board, receives the encoded signal through the first circuit board, determines a corresponding biological detection function according to the encoded signal, and analyzes the biological detection sample. 一種試片讀取裝置,用以讀取一試片所代表的一編碼訊號,及於其上承載之一生物檢測樣本,該試片讀取裝置包含:一裝置本體,具一第一厚度之一容置空間;一模組上蓋體,設置於該容置空間,該模組上蓋體設置有一操作槽;一模組下蓋體,設置於該操作槽內;一接地片,設置於該模組上蓋體與該模組下蓋體之間;一第一電路板,具影響該第一厚度之一第二厚度、設置於該容置空間;以及一第二電路板,具不影響該第一厚度之一第三厚度獨立於該第一電路板、設置於該容置空間之外、透過該第一電路板接收該編碼訊號、因應該編碼訊號以決定一相應之生物檢測功能、且分析該生物檢測樣本。A test strip reading device is used to read a coded signal represented by a test strip and a biological detection sample carried thereon. The test strip reading device includes: a device body having a first thickness An accommodating space; a module upper cover is disposed in the accommodating space, the module upper cover is provided with an operation slot; a module lower cover is disposed in the operation slot; a grounding plate is disposed in the mold Between the upper cover of the module and the lower cover of the module; a first circuit board having a second thickness affecting one of the first thicknesses and disposed in the accommodation space; and a second circuit board having no influence on the first A third thickness of a thickness is independent of the first circuit board, is disposed outside the accommodating space, receives the encoded signal through the first circuit board, determines a corresponding biological detection function according to the encoded signal, and analyzes The biological test sample.
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TWI803016B (en) * 2020-10-13 2023-05-21 華廣生技股份有限公司 A test strip code reader and analyte detection device

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