TWI639823B - Method, apparatus, and system for detecting thermal sealing defects - Google Patents

Method, apparatus, and system for detecting thermal sealing defects Download PDF

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TWI639823B
TWI639823B TW106126792A TW106126792A TWI639823B TW I639823 B TWI639823 B TW I639823B TW 106126792 A TW106126792 A TW 106126792A TW 106126792 A TW106126792 A TW 106126792A TW I639823 B TWI639823 B TW I639823B
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temperature
container
continuous area
interest
region
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TW106126792A
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TW201910752A (en
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王經緯
楊英魁
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王經緯
楊英魁
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Priority to CN201710820975.2A priority patent/CN109387331A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00Investigating fluid-tightness of structures
    • G01M3/002Investigating fluid-tightness of structures by using thermal means

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Examining Or Testing Airtightness (AREA)
  • Radiation Pyrometers (AREA)

Abstract

一種檢測熱密封缺陷的方法、設備和系統,所述設備包含:一高周波產生器,用以對應一容器之端口上覆蓋的金屬薄膜的位置,施加高周波;一紅外線攝像器,用以在該容器上方感測紅外線輻射,以生成該容器各部分的溫度資料;一處理裝置,用以接收該溫度資料;將溫度資料轉換成一影像;對該影像進行定位,以定義出一感興趣區域;計算不在一合格溫度範圍內的溫度,在該影像的感興趣區域中所佔的連續面積;對該連續面積進行計算,並根據計算結果,判斷是否指示一密封缺陷;以及一輸出裝置,用以指示出該密封缺陷。 A method, a device and a system for detecting a heat-seal defect. The device includes: a high frequency generator for applying a high frequency to a position of a metal film covered on a port of a container; and an infrared camera for applying the same to the container. Sensing infrared radiation from above to generate temperature data for each part of the container; a processing device for receiving the temperature data; converting the temperature data into an image; positioning the image to define an area of interest; calculation is not in The temperature within a qualified temperature range, the continuous area occupied in the region of interest of the image; the continuous area is calculated, and based on the calculation results, it is determined whether a seal defect is indicated; and an output device is used to indicate The seal is defective.

Description

檢測熱密封缺陷的方法、設備及系統 Method, equipment and system for detecting heat seal defect

本揭示係關於一種檢測技術,特別有關一種檢測熱密封缺陷的方法、設備及系統。 The present disclosure relates to a detection technology, and more particularly to a method, a device, and a system for detecting a heat seal defect.

在檢測容器的熱密封缺陷方面,習知技術一般採用紅外線感測器來感測封口處的局部溫度或整個密封區域的平均溫度,並判斷此溫度是否在正常的溫度範圍內,依此來判斷是否存在密封缺陷。另一種習知技術採用紅外線成像儀來取得容器的熱影像,並針對密封缺陷的區域(如破口)計算其平均溫度,將其與一閾值比較,依此決定出容器的密封特性。然而,上述習知技術中,常常因為正常區域的溫度參與了溫度計算,使得檢測結果常常是不準確的。 In terms of detecting the thermal sealing defect of the container, the conventional technology generally uses an infrared sensor to sense the local temperature at the seal or the average temperature of the entire sealed area, and determine whether this temperature is within the normal temperature range, and judge based on this. Whether there are seal defects. Another conventional technique uses an infrared imager to obtain a thermal image of the container, and calculates the average temperature of the sealed defect area (such as a breach), compares it with a threshold value, and determines the sealing characteristics of the container accordingly. However, in the above-mentioned conventional technologies, because the temperature of the normal area is involved in the temperature calculation, the detection result is often inaccurate.

因此,有必要提出一種新的檢測技術,以改善上述習知技術的缺失。 Therefore, it is necessary to propose a new detection technology to improve the lack of the conventional techniques mentioned above.

本揭示的目的在於提供一種檢測熱密封缺陷的方法、設備及系統,以提升密封缺陷檢測的準確性。 The purpose of the present disclosure is to provide a method, a device, and a system for detecting a heat seal defect, so as to improve the accuracy of the seal defect detection.

為達成上述目的,本揭示一方面提供一種檢測熱密封缺陷的方法,其應用於檢測一容器之一端口的密封特性,該容器之端口以一金屬薄膜覆蓋,而在該金屬薄膜上疊置有一蓋體,所述方法包含:對應該容器之端口上覆蓋的金屬薄膜的位置,施加高周波;利用一紅外線攝像器在該容器上方感測紅外線輻射,以生成該容器各部分的溫度資料;將該容器各部分的溫度資料轉換成該容器的一影像;對該容器的影像進行定位,以定義出一感興趣區域(region of interest,ROI);計算不在一合格溫度範圍內的溫度,在該影像的感興趣區域中所佔的連續面積;以及對該連續面積進行計算,並根據計算結果,判斷是否指示一密封缺陷。 In order to achieve the above object, the present disclosure provides a method for detecting a heat seal defect, which is applied to detect a sealing characteristic of a port of a container, the port of the container is covered with a metal film, and a metal film is stacked on the metal film. The cover includes: applying a high frequency to the position of the metal film covered on the port of the container; using an infrared camera to sense infrared radiation above the container to generate temperature data of each part of the container; The temperature data of each part of the container is converted into an image of the container; the image of the container is positioned to define a region of interest (ROI); the temperature is not within a qualified temperature range, and the image is calculated in the image. The continuous area occupied by the region of interest; and calculating the continuous area, and determining whether a seal defect is indicated based on the calculation result.

本揭示另一方面提供一種檢測熱密封缺陷的設備,其應用於檢測一容器之一端口的密封特性,該容器之端口以一金屬薄膜覆蓋,而在該金屬薄膜上疊置有一蓋體,所述設備包含:一高周波產生器,用以對應該容器之端口上覆蓋的金屬薄膜的位置,施加高周波;一紅外線攝像器,用以在該高周波產生器施加該高周波後,在該容器上方感測紅外線輻射,以生成該容器各部分的溫度資料;一處理裝置,與該紅外線攝像器耦接,用以接收該紅外線攝像器生成的該溫度資料;將該容器各部分的溫度資料轉換成該容器的一影像;對該容器的影像進行定位,以定義出一感興趣區域(region of interest,ROI);計算不在一合格溫度範圍內的溫度,在該影像的感興趣區域中所佔的連續面積;對該連續面積進行計算, 並根據計算結果,判斷是否指示一密封缺陷;以及一輸出裝置,與該處理裝置耦接,用以指示該密封缺陷。 Another aspect of the present disclosure is to provide a device for detecting a heat seal defect, which is used to detect the sealing characteristics of a port of a container, the port of the container is covered with a metal thin film, and a cover is stacked on the metal thin film. The device includes: a high frequency generator for applying a high frequency to the position of the metal film covered on the port of the container; and an infrared camera for sensing the high frequency after the high frequency generator applies the high frequency to the container. Infrared radiation to generate temperature data of each part of the container; a processing device coupled to the infrared camera to receive the temperature data generated by the infrared camera; convert the temperature data of each part of the container into the container Positioning an image of the container to define a region of interest (ROI); calculating a temperature that is not within a qualified temperature range and a continuous area occupied by the region of interest of the image ; Calculate the continuous area, According to the calculation result, it is judged whether a seal defect is indicated; and an output device is coupled with the processing device to indicate the seal defect.

本揭示再一方面提供一種檢測熱密封缺陷的系統,其應用於檢測一容器之一端口的密封特性,該容器之端口以一金屬薄膜覆蓋,而在該金屬薄膜上疊置有一蓋體,所述系統包含:一高周波產生器,設置於一生產線上,該生產線上具有一輸送帶,該輸送帶用以輸送複數個裝配有該金屬薄膜和該蓋體之容器,該高周波產生器用以對應每個容器之端口上覆蓋的金屬薄膜的位置,施加高周波;一紅外線攝像器,用以在該高周波產生器施加該高周波後,在每個容器上方感測紅外線輻射,以生成每個容器各部分的溫度資料;一處理裝置,與該紅外線攝像器耦接,用以接收該紅外線攝像器生成的該溫度資料;將該容器各部分的溫度資料轉換成該容器的一影像;對該容器的影像進行定位,以定義出一感興趣區域(region of interest,ROI);計算不在一合格溫度範圍內的溫度,在該影像的感興趣區域中所佔的連續面積;對該連續面積進行計算,並根據計算結果,判斷出該容器是否存在一密封缺陷;以及一移除裝置,與該處理裝置耦接,用以回應該處理裝置判斷出該容器存在該密封缺陷,而從該輸送帶上將該容器移除。 Another aspect of the present disclosure is to provide a system for detecting a heat-sealing defect, which is used to detect the sealing characteristics of a port of a container, the port of the container is covered with a metal film, and a cover is stacked on the metal film. The system includes: a high-frequency generator is disposed on a production line, the production line has a conveyor belt for conveying a plurality of containers equipped with the metal film and the cover, and the high-frequency generator is used to correspond to each High frequency is applied to the position of the metal film covered on the port of each container; an infrared camera is used to sense infrared radiation above each container after the high frequency is applied by the high frequency generator to generate the parts of each container Temperature data; a processing device coupled to the infrared camera for receiving the temperature data generated by the infrared camera; converting the temperature data of each part of the container into an image of the container; Positioning to define a region of interest (ROI); calculate temperatures not within a qualified temperature range The continuous area occupied in the region of interest of the image; calculating the continuous area, and judging whether there is a sealing defect in the container according to the calculation result; and a removing device, coupled with the processing device, using The response processing device determines that the container has the sealing defect, and removes the container from the conveyor belt.

本揭示之檢測熱密封缺陷的方法、設備和系統中,針對感興趣區域進行缺陷檢測,並且對不在合格溫度範圍內的溫度所佔的連續面積進行計算,根據其計算結果,判斷是否存在密封缺陷。由於本揭示採用連續面積來追蹤密封缺陷的溫度分佈,對該容 器之溫度資料的分析更為精確,能夠貼近密封缺陷的表現形式,因此相較於習知的密封缺陷檢測方式,能夠得出更為精確的檢測結果,同時也不會因此降低檢測速度。 In the disclosed method, equipment and system for detecting heat seal defects, defect detection is performed for a region of interest, and a continuous area occupied by a temperature not within a qualified temperature range is calculated. Based on the calculation results, it is determined whether there is a seal defect . Since this disclosure uses a continuous area to track the temperature distribution of sealing defects, The analysis of the temperature data of the device is more accurate and can be closer to the expression form of the sealing defect. Therefore, compared with the conventional sealing defect detection method, a more accurate detection result can be obtained without reducing the detection speed.

11‧‧‧容器 11‧‧‧ container

12‧‧‧端口 12‧‧‧port

13‧‧‧金屬薄膜 13‧‧‧Metal film

14‧‧‧蓋體 14‧‧‧ cover

15‧‧‧隔熱紙 15‧‧‧Insulation paper

20‧‧‧檢測熱密封缺陷的系統 20‧‧‧ System for detecting heat seal defects

21‧‧‧輸送帶 21‧‧‧ conveyor belt

22‧‧‧高周波產生器 22‧‧‧High Frequency Generator

23‧‧‧紅外線攝像器 23‧‧‧ Infrared Camera

24‧‧‧處理裝置 24‧‧‧Processing device

25‧‧‧顯示器 25‧‧‧ Display

26‧‧‧移除裝置 26‧‧‧ Remove device

90‧‧‧單元區域 90‧‧‧ unit area

R1‧‧‧第一半徑 R1‧‧‧first radius

R2‧‧‧第二半徑 R2‧‧‧Second Radius

O‧‧‧圓形 O‧‧‧ round

S31~S37‧‧‧步驟 S31 ~ S37‧‧‧step

S41~S47‧‧‧步驟 S41 ~ S47‧‧‧step

第1圖顯示一個容器的示意圖。 Figure 1 shows a schematic of a container.

第2圖顯示根據本揭示實施例的一種檢測熱密封缺陷的系統。 FIG. 2 illustrates a system for detecting a heat seal defect according to an embodiment of the present disclosure.

第3圖顯示根據本揭示實施例的一種檢測熱密封缺陷的方法。 FIG. 3 shows a method for detecting a heat seal defect according to an embodiment of the present disclosure.

第4圖顯示根據本揭示實施例的另一種檢測熱密封缺陷的方法。 FIG. 4 shows another method for detecting a heat seal defect according to an embodiment of the present disclosure.

第5A圖和第5B圖顯示不存在密封缺陷的影像。 Figures 5A and 5B show images without seal defects.

第6A圖至第6C圖顯示存在密封缺陷的影像。 Figures 6A to 6C show images with sealing defects.

第7圖顯示根據本揭示實施例的一個容器的影像中標示有感興趣區域的示意圖。 FIG. 7 is a schematic diagram showing a region of interest marked in an image of a container according to an embodiment of the present disclosure.

第8圖顯示根據本揭示實施例的一個容器的影像中標示有另一個感興趣區域的示意圖。 FIG. 8 is a schematic diagram showing another region of interest marked in an image of a container according to an embodiment of the present disclosure.

第9圖顯示根據本揭示實施例中對感興趣區域分割為複數個單元區域的示意圖。 FIG. 9 is a schematic diagram of dividing a region of interest into a plurality of unit regions according to an embodiment of the present disclosure.

為使本揭示的目的、技術方案及效果更加清楚、明確,以下參照圖式並舉實施例對本揭示進一步詳細說明。應當理解,此處所描述的具體實施例僅用以解釋本揭示,本揭示說明書所 使用的詞語“實施例”意指用作實例、示例或例證,並不用於限定本揭示。此外,本揭示說明書和所附申請專利範圍中所使用的冠詞「一」一般地可以被解釋為意指「一個或多個」,除非另外指定或從上下文可以清楚確定單數形式。 In order to make the objectives, technical solutions, and effects of the present disclosure more clear and definite, the following further describes the present disclosure in detail with reference to the drawings and examples. It should be understood that the specific embodiments described herein are only used to explain the present disclosure. The word "embodiment" is used as an example, example, or illustration, and is not intended to limit the present disclosure. In addition, the articles "a" and "an" used in this disclosure and the scope of the appended patents may generally be construed to mean "one or more" unless specified otherwise or clear from context to be singular.

本揭示中檢測熱密封缺陷的技術係應用於以高周波使得金屬薄膜生熱的熱密封的情境下。請參閱第1圖,其顯示一個容器的示意圖。一般來說,熱密封技術中,在進行熱密封的動作之前,容器11的端口12以一金屬薄膜(一般採用鋁膜)13覆蓋,蓋體14內側貼附一隔熱紙15,將蓋體14從容器11之端口12旋上,而後將容器11送到生產線上,對容器11施加高周波,高周波使得金屬薄膜13上產生渦電流(eddy current)而生熱,這個熱使得金屬薄膜13上的膠融化,從而金屬薄膜13可以黏著在容器11的端口12上。 The technique of detecting the heat-sealing defect in the present disclosure is applied to a heat-sealing situation in which a metal film generates heat with a high frequency. See Figure 1 for a schematic representation of a container. Generally, in the heat-sealing technology, before performing the heat-sealing action, the port 12 of the container 11 is covered with a metal film (generally an aluminum film) 13, and a heat-insulating paper 15 is attached to the inside of the cover 14 to cover the cover. 14 is screwed on from the port 12 of the container 11, and then the container 11 is sent to the production line. A high frequency is applied to the container 11. The high frequency causes eddy current on the metal thin film 13 and generates heat. This heat causes the The glue is melted so that the metal film 13 can adhere to the port 12 of the container 11.

具體來說,在一個實際的例子中,金屬薄膜13的下表面塗覆一層聚合物薄膜(polymer film)(未圖示),其上表面塗覆一層蠟(未圖示)。當蓋體14旋上時,隔熱紙15透過被擠壓的蠟貼附在金屬薄膜13上。金屬薄膜13受高周波而生熱時,其上方的蠟融化,金屬薄膜13從隔熱紙15脫離而向容器11之端口12移動,其下方的聚合物薄膜變為流體,流到端口12處,從而透過該具有黏性的聚合物薄膜,金屬薄膜13可以將該端口12密封。 Specifically, in a practical example, a lower surface of the metal thin film 13 is coated with a polymer film (not shown), and an upper surface thereof is coated with a layer of wax (not shown). When the cover 14 is screwed on, the heat-insulating paper 15 is attached to the metal film 13 through the extruded wax. When the metal film 13 is heated by high frequency waves, the wax on the metal film 13 melts, the metal film 13 is separated from the heat insulation paper 15 and moves to the port 12 of the container 11, and the polymer film below it becomes a fluid and flows to the port 12, Therefore, through the adhesive polymer film, the metal film 13 can seal the port 12.

一般來說,藥物、健康食品或對密封特性要求較高的物品會採用這種密封方式,本揭示並不限定於容器內之物品的種 類,也不限定於容器的各種構形,只要是運用高周波進行熱密封的技術,都在本揭示意欲保護的範圍內。 Generally speaking, this method of sealing is used for medicines, health foods, or articles that require high sealing characteristics. This disclosure is not limited to the type of articles in containers. The type is not limited to the various configurations of the container, and any technology that uses a high frequency for heat sealing is within the scope of the present disclosure.

請參閱第2圖,其顯示根據本揭示實施例的一種檢測熱密封缺陷的系統20,此一系統20設置於容器11的熱密封生產線上。如第2圖所示,生產線上具有一輸送帶21,其用來輸送複數個容器11,這些容器11已裝配有第1圖所示的金屬薄膜13和蓋體14,也就是,金屬薄膜13覆蓋在容器11的端口12,容器11並旋上蓋體14後,這些容器11被放置到輸送帶21上,並沿著第2圖所示的箭頭方向進行運送。 Please refer to FIG. 2, which shows a system 20 for detecting a heat sealing defect according to an embodiment of the present disclosure. The system 20 is disposed on a heat sealing production line of a container 11. As shown in FIG. 2, the production line has a conveyor belt 21 for conveying a plurality of containers 11, and these containers 11 have been equipped with the metal film 13 and the cover 14 shown in FIG. 1, that is, the metal film 13 After the port 12 of the container 11 is covered, and the container 11 is screwed on, the container 11 is placed on a conveyor belt 21 and transported in the direction of the arrow shown in FIG. 2.

系統20還包括一高周波產生器22、一紅外線攝像器23、一處理裝置24、一輸出裝置(例如一顯示器25)及一移除裝置26。首先,容器11通過高周波產生器22,高周波產生器22對容器11施加高周波,具體來說,高周波產生器22對應每個容器11之端口12上覆蓋的金屬薄膜13的位置施加高周波。施加的高周波使得金屬薄膜13上產生渦電流,生熱而放出紅外線輻射。 The system 20 further includes a high-frequency generator 22, an infrared camera 23, a processing device 24, an output device (such as a display 25), and a removal device 26. First, the container 11 passes the high-frequency generator 22, and the high-frequency generator 22 applies the high-frequency to the container 11. Specifically, the high-frequency generator 22 applies the high-frequency to the position of the metal thin film 13 covered on the port 12 of each container 11. The applied high frequency causes an eddy current to be generated on the metal thin film 13 and generates heat to emit infrared radiation.

在容器11被施加高周波後不久,容器11進入了紅外線攝像器23的視野(field of view),位於容器11上方的紅外線攝像器23感測容器11放出的紅外線輻射,而生成容器11各部分的溫度資料。從第2圖中紅外線攝像器23的配置可知,紅外線攝像器23取得的溫度資料主要是由金屬薄膜13整個平面所貢獻。 Shortly after the high frequency is applied to the container 11, the container 11 enters the field of view of the infrared camera 23. The infrared camera 23 located above the container 11 senses the infrared radiation emitted by the container 11 and generates the parts of the container 11 Temperature data. It can be seen from the configuration of the infrared camera 23 in FIG. 2 that the temperature data acquired by the infrared camera 23 is mainly contributed by the entire plane of the metal thin film 13.

處理裝置24與紅外線攝像器23耦接,紅外線攝像器23生成的溫度資料被傳送到處理裝置24。處理裝置24會將該溫度 資料轉換成影像資料,並對該影像資料進行影像處理,處理後的影像可顯示在顯示器25上。處理裝置24也會根據取得的影像來判斷是否存在熱密封缺陷,例如金屬薄膜13沒有黏貼好而出現的破口,檢測的結果也可顯示在顯示器25上。 The processing device 24 is coupled to the infrared camera 23, and the temperature data generated by the infrared camera 23 is transmitted to the processing device 24. The processing device 24 will set the temperature The data is converted into image data, and image processing is performed on the image data. The processed image can be displayed on the display 25. The processing device 24 also judges whether there is a heat-sealing defect based on the acquired image, for example, a crack that appears when the metal thin film 13 is not adhered well, and the detection result can also be displayed on the display 25.

當檢測存在有熱密封缺陷時,處理裝置24可以發出警示訊號,通知該輸出裝置發出警示,例如發出警示音、顯示器25上顯示警示訊息等,處理裝置24也可控制與其耦接的移除裝置26,將有熱密封缺陷的容器11從輸送帶21上移除。例如,移除裝置26具有一可移動的臂,其可由處理裝置24控制,當該臂伸出時,該臂碰觸容器11,從而將容器11推離輸送帶21,掉落到一密封不良收集區。 When a heat seal defect is detected, the processing device 24 may issue a warning signal to notify the output device to issue a warning, such as a warning sound, a warning message on the display 25, etc. The processing device 24 may also control the removal device coupled thereto. 26. The container 11 with the heat-sealing defect is removed from the conveyor belt 21. For example, the removal device 26 has a movable arm which can be controlled by the processing device 24. When the arm is extended, the arm touches the container 11 and thereby pushes the container 11 away from the conveyor belt 21 and drops to a poor seal Collection area.

請參閱第3圖,其顯示根據本揭示實施例的一種檢測熱密封缺陷的方法。在處理裝置24進行的熱密封檢測上,本揭示改良了習知的檢測方式,而提出一種可提升檢測準確度的熱密封缺陷檢測方法。請配合第2圖參閱第3圖,本揭示之檢測熱密封缺陷的方法包括如下步驟。 Please refer to FIG. 3, which illustrates a method for detecting a heat seal defect according to an embodiment of the present disclosure. In the heat seal detection performed by the processing device 24, the present disclosure improves the conventional detection method, and proposes a heat seal defect detection method that can improve the detection accuracy. Please refer to FIG. 3 with reference to FIG. 2. The method for detecting a heat seal defect of the present disclosure includes the following steps.

步驟S31:對應該容器11之端口12上覆蓋的金屬薄膜13的位置,施加高周波。在此步驟中,高周波產生器22產生高周波,並施加到容器11上,產生的高周波係聚焦於容器11之端口12上覆蓋的金屬薄膜13,從而金屬薄膜13生熱而放出紅外線輻射。 Step S31: A high frequency is applied to the position of the metal thin film 13 covered on the port 12 of the container 11. In this step, the high frequency generator 22 generates a high frequency and applies it to the container 11. The generated high frequency is focused on the metal thin film 13 covered on the port 12 of the container 11, so that the metal thin film 13 generates heat and emits infrared radiation.

步驟S32:利用一紅外線攝像器23在該容器11上方感測紅外線輻射,以生成該容器11各部分的溫度資料。在此步驟中, 容器11透過輸送帶21從高周波產生器22的位置移動到紅外線攝像器23的下方,進入紅外線攝像器23的視野中,此時紅外線攝像器23感測容器11放出的紅外線輻射,而生成容器11各部分的溫度資料,由於金屬薄膜13為一熱源,此溫度資料主要由金屬薄膜13所貢獻,且因為感測角度的配置,紅外線攝像器23可感測到金屬薄膜13整個平面的溫度。 Step S32: Use an infrared camera 23 to sense infrared radiation above the container 11 to generate temperature data of each part of the container 11. In this step, The container 11 moves from the position of the high-frequency generator 22 to the lower portion of the infrared camera 23 through the conveyor belt 21 and enters the field of view of the infrared camera 23. At this time, the infrared camera 23 senses the infrared radiation emitted by the container 11 to generate the container 11 For the temperature data of each part, since the metal thin film 13 is a heat source, this temperature data is mainly contributed by the metal thin film 13, and because of the configuration of the sensing angle, the infrared camera 23 can sense the temperature of the entire flat surface of the metal thin film 13.

步驟S33:將該容器各部分的溫度資料轉換成該容器的一影像。處理裝置24接收紅外線攝像器23生成的溫度資料,並且將該溫度資料轉換成影像,在此過程中,也可對該溫度資料進行過濾,也可對所獲得影像進一步進行影像處理,以優化該影像,或簡化該影像,使得處理速度加快,以在後續缺陷檢測上,能夠達到即時檢出的效果。 Step S33: Convert the temperature data of each part of the container into an image of the container. The processing device 24 receives the temperature data generated by the infrared camera 23 and converts the temperature data into an image. In the process, the temperature data may also be filtered, and the obtained image may be further image processed to optimize the Image, or simplify the image, so that the processing speed is accelerated, so that in the subsequent defect detection, the effect of real-time detection can be achieved.

步驟S34:對該容器的影像進行定位,以定義出一感興趣區域(region of interest,ROI)。一般來說,出現熱密封缺陷的區域大部分情況都是固定的,利用這個特性,在利用影像進行檢測上,可以定位出這些區域,只看這些區域的溫度分佈,即可達到準確的檢測,這樣也能有效縮短缺陷檢測所花費的時間。在準確度方面,只檢測這些區域,也可避免溫度資料被其他不可能出現缺陷的區域影響,而降低準確度。舉例來說,容器11的端口12處常因沒有密封好而出現熱密封缺陷,這時可以檢測端口12周圍的區域即可。 Step S34: Position the image of the container to define a region of interest (ROI). Generally speaking, most of the areas where heat sealing defects occur are fixed. Using this feature, these areas can be located on the image using inspection, and only by looking at the temperature distribution of these areas, accurate detection can be achieved. This can also effectively reduce the time taken for defect detection. In terms of accuracy, only detecting these areas can also avoid the temperature data being affected by other areas where defects are unlikely to occur, and reduce the accuracy. For example, the port 12 of the container 11 often has a heat-sealing defect because it is not properly sealed. At this time, the area around the port 12 can be detected.

步驟S35:計算不在一合格溫度範圍內的溫度,在該影像的感興趣區域中所佔的連續面積。一般來說,若密封確實,金 屬薄膜13的溫度分佈會呈現均勻狀態,若密封不確實而出現破口,在破口處因熱的散逸,溫度會有明顯下降的情形,而使得金屬薄膜13的溫度分佈不平均。若沒有熱散逸,金屬薄膜13各部分的溫度基本上會位在一個溫度區間,亦即合格溫度範圍。若出現破口,熱的流動,使得金屬薄膜13有些地方溫度較低,而少部分範圍溫度升高。在此步驟中,透過對該容器11之影像的感興趣區域進行分析,計算不在合格溫度範圍內的溫度所佔的連續面積,即可判斷出是否存在密封缺陷。舉例來說,透過幾次的試驗抓出合格溫度範圍例如為33至40℃,這時可以計算得出33℃以下和40℃以上的溫度所佔的連續面積。於另一個實施例中,也可針對每個溫度區間計算其連續面積,剔除可能的雜訊後,再將有效的連續面積加總。例如,針對低溫的情況,33℃至32℃計算其連續面積,32℃至31℃計算其連續面積,以此類推至某一設定的低溫值;針對高溫的情況,40℃至41℃計算其連續面積,32℃至31℃計算其連續面積,以此類推至某一設定的高溫值。也可以單針對低溫情況做一次缺陷判斷,單針對高溫情況做一次缺陷判斷,或者將高溫和低溫情況的連續面積相加,一併作缺陷判斷。 Step S35: Calculate the continuous area occupied by the temperature not within a qualified temperature range in the region of interest of the image. Generally, if the seal is The temperature distribution of the metal thin film 13 will be uniform. If the seal is not sure and a breach occurs, the temperature will drop significantly due to heat dissipation at the breach, and the temperature distribution of the metal thin film 13 will be uneven. If there is no heat dissipation, the temperature of each part of the metal thin film 13 will be basically in a temperature interval, that is, a qualified temperature range. If a breach occurs, the flow of heat causes the temperature of the metal thin film 13 to be lower in some places, while the temperature in a small part will increase. In this step, by analyzing the region of interest of the image of the container 11 and calculating the continuous area occupied by the temperature that is not within the acceptable temperature range, it can be determined whether there is a sealing defect. For example, through several tests, the acceptable temperature range is, for example, 33 to 40 ° C. At this time, the continuous area occupied by temperatures below 33 ° C and above 40 ° C can be calculated. In another embodiment, the continuous area can also be calculated for each temperature interval. After eliminating possible noise, the effective continuous area is added up. For example, for low temperature, calculate its continuous area from 33 ° C to 32 ° C, calculate its continuous area from 32 ° C to 31 ° C, and so on to a set low temperature value; for high temperature, calculate it from 40 ° C to 41 ° C Continuous area. Calculate the continuous area from 32 ° C to 31 ° C, and so on to a set high temperature value. It is also possible to make a defect judgment only for a low temperature situation, and a defect judgment for a high temperature situation alone, or to add the continuous areas of high temperature and low temperature situations together to make a defect judgment.

步驟S36:判斷該連續面積是否大於一面積閾值。在此步驟中,可透過試驗得出一面積閾值,作為熱密封缺陷與否的判斷基準。當步驟S35得出的連續面積大於該面積閾值時,判斷出存在熱密封缺陷;而當步驟S35得出的連續面積小於或等於該面積閾值時,判斷出不存在熱密封缺陷。 Step S36: Determine whether the continuous area is greater than an area threshold. In this step, an area threshold can be obtained through the test, which can be used as a criterion for judging the defect of the heat seal. When the continuous area obtained in step S35 is greater than the area threshold, it is determined that there is a heat seal defect; and when the continuous area obtained in step S35 is less than or equal to the area threshold, it is determined that there is no heat seal defect.

步驟S37:指示出一密封缺陷,以回應該連續面積大於該面積閾值的情況。當步驟S36判斷出存在密封缺陷時,處理裝置25可輸出一指示訊號到輸出裝置。輸出裝置可為顯示器25,其可在螢幕上顯示出現密封缺陷的訊息。輸出裝置亦可為一揚聲器,在存在密封缺陷時,其可發出警示音。處理裝置25亦可控制輸出裝置(例如移除裝置26),使其將出現密封缺陷的容器11從輸送帶21移除。 Step S37: Indicate a sealing defect in response to a case where the continuous area is greater than the area threshold. When it is determined in step S36 that there is a sealing defect, the processing device 25 may output an instruction signal to the output device. The output device can be a display 25, which can display a message on the screen that a sealing defect has occurred. The output device can also be a loudspeaker, which can issue a warning sound when there is a sealing defect. The processing device 25 may also control the output device (such as the removal device 26) to remove the container 11 in which the sealing defect occurs from the conveyor belt 21.

請參閱第4圖,其顯示根據本揭示實施例的另一種檢測熱密封缺陷的方法。第4圖顯示的檢測熱密封缺陷的方法中,步驟S41至步驟S45與第3圖中的步驟S31至步驟S35相同或類似,具體可參照上述步驟S31至步驟S35的相關說明。 Please refer to FIG. 4, which illustrates another method for detecting a heat seal defect according to an embodiment of the present disclosure. In the method for detecting a heat seal defect shown in FIG. 4, steps S41 to S45 are the same as or similar to steps S31 to S35 in FIG. 3. For details, refer to the related description of steps S31 to S35.

步驟S46:計算該連續面積的標準差與該感興趣區域的標準差或該感興趣區域去除該連續面積後的區域的標準差的一差值。在此步驟中,可計算該連續面積與該感興趣區域的色階的標準差兩者的差值,也可以計算該連續面積與該感興趣區域去除該連續面積後的區域的色階的標準差兩者的差值。 Step S46: Calculate a difference between the standard deviation of the continuous area and the standard deviation of the region of interest or the standard deviation of the region after the continuous area is removed from the region of interest. In this step, the difference between the continuous area and the standard deviation of the gradation of the region of interest can be calculated, and the standard of the gradation of the region of the continuous area and the region of interest after the continuous area is removed can also be calculated. The difference between the two.

步驟S47:根據該差值的大小,判斷是否指示該密封缺陷。在此步驟中,可以判斷該差值是否大於一閾值,若是,則判斷存在密封缺陷。兩者標準差的差值越大,表示兩區塊的溫度差異較大,表示確實存在密封缺陷;兩者標準差的差值越小,表示兩區塊的溫度差異較小,表示密封缺陷可能不存在。 Step S47: Determine whether to indicate the sealing defect according to the magnitude of the difference. In this step, it can be judged whether the difference is greater than a threshold, and if so, it is judged that there is a sealing defect. The larger the difference between the two standard deviations, the larger the temperature difference between the two blocks, indicating that there is indeed a sealing defect; the smaller the difference between the two standard deviations, the smaller the temperature difference between the two blocks, indicating that the sealing defect may be possible. does not exist.

第4圖所示的實施例中,採用標準差的計算方式中,比較的基準是連續面積的標準差和感興趣區域的標準差(或該感興趣區域去除該連續面積後的區域的標準差),由於其跟自身的圖像作了比對,相較於採用一個固定的閾值(如第3圖所示實施例中的面積閾值)來作判斷,此方式考量了自身的圖像變化,準確度明顯獲得提升。 In the embodiment shown in FIG. 4, in the standard deviation calculation method, the standard of comparison is the standard deviation of the continuous area and the standard deviation of the region of interest (or the standard deviation of the region of the region of interest after the continuous area is removed). ), Because it compares with its own image, compared to using a fixed threshold (such as the area threshold in the embodiment shown in Figure 3) for judgment, this method considers its own image change, Significantly improved accuracy.

上述第3圖的實施例和第4圖的實施例可以單獨執行來判斷是否存在密封缺陷。於另一實施例中,也可先將該連續面積與一面積閾值進行比較,剔除連續面積較小的區域,而後進行標準差比較,這樣也是可行的。 The embodiment of FIG. 3 and the embodiment of FIG. 4 described above can be executed separately to determine whether there is a sealing defect. In another embodiment, it is also possible to first compare the continuous area with an area threshold, remove regions with smaller continuous areas, and then perform standard deviation comparison, which is also feasible.

本揭示之檢測熱密封缺陷的方法中,針對感興趣區域進行缺陷檢測,並且判斷不在合格溫度範圍內的溫度所佔的連續面積是否大於面積閾值及/或該連續面積的標準差與該感興趣區域的標準差或該感興趣區域去除該連續面積後的區域的標準差的差值的大小,從而判斷是否存在密封缺陷。由於本揭示採用連續面積來追蹤密封缺陷的溫度分佈,對該容器之溫度資料的分析更為精確,能夠貼近密封缺陷的表現形式,因此相較於習知的密封缺陷檢測方式,能夠得出更為精確的檢測結果,同時也不會因此降低檢測速度。 In the method for detecting a heat seal defect of the present disclosure, defect detection is performed for a region of interest, and it is determined whether a continuous area occupied by a temperature not within a qualified temperature range is greater than an area threshold and / or a standard deviation of the continuous area and the interest The standard deviation of the region or the difference of the standard deviation of the region after the continuous area is removed from the region of interest, so as to determine whether there is a sealing defect. Because the present disclosure uses continuous area to track the temperature distribution of sealing defects, the temperature data of the container is more accurately analyzed, and it can be closer to the expression form of sealing defects. Therefore, compared with the conventional sealing defect detection method, it is possible to obtain more For accurate detection results, it will not reduce the detection speed.

作為例示說明的,第5A圖和第5B圖顯示不存在密封缺陷的影像,第6A圖至第6C圖顯示存在密封缺陷的影像。第5A圖 和第5B圖的影像中端口12的密封確實而沒有破口,第6A圖至第6C圖中都存在明顯的破口,即被歸類為密封缺陷。 As an example, FIGS. 5A and 5B show images without a sealing defect, and FIGS. 6A to 6C show images with a sealing defect. Figure 5A In the image of Fig. 5B, the seal of port 12 is indeed without cracks, and there are obvious cracks in Figs. 6A to 6C, which are classified as seal defects.

將溫度資料轉換成影像的步驟(即上述步驟S33及S43)可包含如下步驟:將該溫度資料中溫度高於一第一溫度的資料,以一第一像素值表示;將該溫度資料中溫度低於一第二溫度的資料,以一第二像素值表示;以及將該溫度資料中溫度介於該第一溫度和該第二溫度之間的資料,以相異的像素值表示。也就是說,可以對紅外線攝像器23取得的溫度資料進行過濾。該影像可實現為例如RGB色階或用灰階。以RGB色階舉例來說,該溫度資料中溫度高於45℃的資料點,可以豔紅色表示,該溫度資料中溫度低於30℃度的資料點,可以黑色表示,溫度介於30℃至45℃的資料點則用不同的RGB像素值表示。進行溫度資料過濾的好處是不在這溫度範圍內的溫度都可能被判定為缺陷,將缺陷以相同的像素值表示,更能凸顯出缺陷的形態,同時也簡化了影像,簡化了後續的影像分析。 The step of converting the temperature data into an image (ie, the above steps S33 and S43) may include the following steps: the data in the temperature data whose temperature is higher than a first temperature is represented by a first pixel value; the temperature in the temperature data is Data below a second temperature are represented by a second pixel value; and data in the temperature data whose temperature is between the first temperature and the second temperature are represented by different pixel values. That is, the temperature data obtained by the infrared camera 23 can be filtered. The image can be implemented as, for example, RGB color scale or gray scale. Taking RGB color gradation as an example, data points with temperatures above 45 ° C in the temperature data can be represented in bright red, and data points with temperatures below 30 ° C in this temperature data can be represented in black, with temperatures between 30 ° C and The 45 ° C data points are represented by different RGB pixel values. The advantage of temperature data filtering is that temperatures outside this temperature range may be judged as defects. Representing the defects with the same pixel value can better highlight the shape of the defect, and it also simplifies the image and simplifies subsequent image analysis. .

請參閱第7圖,其顯示根據本揭示實施例的一個容器的影像中標示有感興趣區域的示意圖。假定容器11的端口12為圓形,其蓋體14也是圓形的情況,端口12周圍的區域可以作為感興趣區域,因此定義該感興趣區域的步驟(即上述步驟S34及S44)可包含如下步驟:在該容器11的影像中定義出一中心點O;以該中心點O為圓心、一第一半徑值R1為半徑,定義出一第一圓形;以該中心點O為圓心,一第二半徑值R2為半徑,定義出一第二圓心;以及將 該第一圓形和該第二圓形之間的區域,定義為該感興趣區域,如第6圖中的斜線區域。由於端口12周圍通常是密封缺陷出現的區域,因此可將該區域作為感興趣區域進行檢測,其中第一半徑R1可由容器11之端口12的內徑來定義,第二半徑R2可由蓋體14的外徑來定義,運用常用的圖像演算法可找出圓心,藉此就能定義出該感興趣區域。 Please refer to FIG. 7, which is a schematic diagram showing a region of interest marked in an image of a container according to an embodiment of the present disclosure. Assuming that the port 12 of the container 11 is circular and the cover 14 is also circular, the area around the port 12 can be used as the region of interest, so the steps of defining the region of interest (ie, the above steps S34 and S44) can include the following Steps: define a center point O in the image of the container 11; define a first circle with the center point O as the center of the circle and a first radius value R1 as the radius; with the center point O as the center of the circle, a The second radius value R2 is a radius, which defines a second circle center; and The area between the first circle and the second circle is defined as the area of interest, such as the slanted area in FIG. 6. Since the area around the port 12 is usually an area where a sealing defect occurs, this area can be detected as an area of interest. The first radius R1 can be defined by the inner diameter of the port 12 of the container 11 and the second radius R2 can be determined by the cover 14 The outer diameter is defined, and the center of the circle can be found by using common image algorithms, so that the region of interest can be defined.

計算該連續面積的步驟(即上述步驟S35及S45)可包含如下步驟:計算不在該合格溫度範圍內的一第一溫度區間,在該影像的感興趣區域中所佔的第一連續面積;計算不在該合格溫度範圍內的一第二溫度區間,在該影像的感興趣區域中所佔的第二連續面積;以及將該第一連續面積和該第二連續面積的和作為該連續面積。也就是說,如上舉例的,若合格溫度範圍為33至40℃,33℃至32℃可作為第一溫度區間,32℃至31℃可作為第二溫度區間,他們的連續面積相加作為步驟S35及S45中的連續面積。於另一實施例中,也可以單判斷某一溫度區間的連續面積是否大於面積閾值,來判斷是否存在密封缺陷。 The step of calculating the continuous area (that is, the above steps S35 and S45) may include the steps of: calculating a first temperature interval that is not within the qualified temperature range, and a first continuous area occupied in a region of interest of the image; calculation A second temperature interval outside the qualified temperature range, a second continuous area occupied in the region of interest of the image; and the sum of the first continuous area and the second continuous area as the continuous area. That is, as the above example, if the qualified temperature range is 33 to 40 ° C, 33 ° C to 32 ° C can be used as the first temperature interval, and 32 ° C to 31 ° C can be used as the second temperature interval. Their continuous area addition is used as a step. Continuous area in S35 and S45. In another embodiment, it may also be determined whether the continuous area of a certain temperature interval is greater than the area threshold to determine whether there is a sealing defect.

計算該連續面積的步驟(即上述步驟S35及S45)可包含如下步驟:將不在該合格溫度範圍內的溫度劃分為複數個溫度區間;計算每個溫度區間在該影像的感興趣區域中所佔的連續面積;判斷每個溫度區間所佔的連續面積是否大於一閾值;移除連續面積小於該閾值所對應的溫度區間;以及針對連續面積大於該閾值的溫度區間,對其所佔的連續面積進行加總。也就是說,如上舉 例的,當某一溫度區間對應的連續面積太小,可能為雜訊時,可以將其剔除。同樣地,也可以單判斷某些溫度區間剔除雜訊後相加的連續面積,判斷其是否大於面積閾值,從而判斷出是否存在密封缺陷。 The step of calculating the continuous area (that is, the above steps S35 and S45) may include the steps of: dividing the temperature not within the qualified temperature range into a plurality of temperature intervals; calculating each temperature interval occupying a region of interest in the image The continuous area occupied by each temperature interval; determine whether the continuous area occupied by each temperature interval is greater than a threshold value; remove the temperature interval corresponding to the continuous area less than the threshold value; and the continuous area occupied by the temperature interval where the continuous area is greater than the threshold value Sum up. That is, as mentioned above For example, when the continuous area corresponding to a certain temperature interval is too small and may be noise, it can be eliminated. Similarly, it is also possible to simply judge the continuous area added after removing noise in certain temperature intervals, and determine whether it is greater than the area threshold, thereby determining whether there is a sealing defect.

請參閱第8圖,其顯示根據本揭示實施例的一個容器的影像中標示有另一個感興趣區域的示意圖。在密封的過程中,金屬薄膜13可能與隔熱紙15放反,而導致不同的溫度分佈,也就是說,當金屬薄膜13放置於隔熱紙15上方時,金屬薄膜13因未被隔熱,而生成溫度較高的熱,本揭示也可對此一情況進行檢測。 Please refer to FIG. 8, which is a schematic diagram showing another region of interest marked in an image of a container according to an embodiment of the present disclosure. During the sealing process, the metal thin film 13 may be put against the heat-insulating paper 15 and cause different temperature distribution. That is, when the metal thin film 13 is placed on the heat-insulating paper 15, the metal thin film 13 is not insulated The heat generated at a relatively high temperature can also be detected in this disclosure.

首先,在定義感興趣區域的過程中,可以將端口12形成的圓形作為感興趣區域,其可包括如下步驟:在該容器11的影像中定義出一中心點O;以及以該中心點O為圓心、一預定半徑值R1為半徑,定義出一圓形。在此,預定半徑R1可由端口12的內徑所定義。 First, in the process of defining the region of interest, the circle formed by the port 12 may be used as the region of interest, which may include the following steps: defining a center point O in the image of the container 11; and using the center point O Is a circle center, and a predetermined radius value R1 is a radius, and a circle is defined. Here, the predetermined radius R1 may be defined by the inner diameter of the port 12.

在此例中,密封缺陷檢測方面可包括如下步驟:計算該圓形中像素點所對應的溫度資料的一平均溫度;判斷該平均溫度是否大於一閾值;以及指示出一密封缺陷,以回應該平均溫度大於該閾值的情況。在這一類的檢測上,可採用平均溫度進行計算即可,此一計算可透過將此感興趣區域內的全部像素點對應的溫度取平均來達成,也可從總面積的角度出發來計算。當然,亦可採用上文提及的針對不在合格溫度範圍內的溫度區間計算其連續面積的概念來計算。 In this example, the sealing defect detection may include the following steps: calculating an average temperature of the temperature data corresponding to the pixels in the circle; determining whether the average temperature is greater than a threshold value; and indicating a sealing defect in response Cases where the average temperature is greater than this threshold. In this type of detection, the average temperature can be used for calculation. This calculation can be achieved by averaging the temperatures corresponding to all pixels in the region of interest, or it can be calculated from the perspective of the total area. Of course, the above-mentioned concept of calculating the continuous area for a temperature range that is not within the acceptable temperature range can also be calculated.

請參閱第9圖,可將感興趣區域分割成複數個單元區域90,若其中一個單元區域存在密封缺陷,則判定該容器11存在密封缺陷。如第9圖所示,以一預定角度,將該感興趣區域分割成8個單元區域90。每個單元區域90單獨進行判斷,若有一個單元區域90存在密封缺陷,即可判定該容器11存在密封缺陷。針對每個單元區域90可採用第3圖及/或第4圖所示的判斷方式。 Referring to FIG. 9, the region of interest can be divided into a plurality of unit regions 90. If one of the unit regions has a sealing defect, it is determined that the container 11 has a sealing defect. As shown in FIG. 9, the region of interest is divided into eight unit regions 90 at a predetermined angle. Each unit region 90 is judged separately. If there is a sealing defect in one unit region 90, it can be determined that the container 11 has a sealing defect. For each unit area 90, the judgment method shown in FIG. 3 and / or FIG. 4 can be adopted.

參考上述的檢測熱密封缺陷的方法及系統,本揭示並提出一種檢測熱密封缺陷的設備,其具體實現可參上述的檢測熱密封缺陷的方法及系統而不再贅述。 With reference to the above method and system for detecting heat seal defects, the present disclosure also proposes a device for detecting heat seal defects. The specific implementation thereof can be referred to the above method and system for detecting heat seal defects without further description.

本揭示已用較佳實施例揭露如上,然其並非用以限定本揭示,本揭示所屬技術領域中具有通常知識者,在不脫離本揭示之精神和範圍內,當可作各種之更動與潤飾,因此本揭示之保護範圍當視後附之申請專利範圍所界定者為準。 The present disclosure has been disclosed as above with a preferred embodiment, but it is not intended to limit the present disclosure. Those with ordinary knowledge in the technical field to which this disclosure belongs can make various changes and modifications without departing from the spirit and scope of this disclosure. Therefore, the scope of protection of this disclosure shall be determined by the scope of the appended patent application.

Claims (17)

一種檢測熱密封缺陷的方法,其應用於檢測一容器之一端口的密封特性,該容器之端口以一金屬薄膜覆蓋,而在該金屬薄膜上疊置有一蓋體,所述方法包含:對應該容器之端口上覆蓋的金屬薄膜的位置,施加高周波;利用一紅外線攝像器在該容器上方感測紅外線輻射,以生成該容器各部分的溫度資料;將該容器各部分的溫度資料轉換成該容器的一影像;對該容器的影像進行定位,以定義出一感興趣區域(region of interest,ROI);計算不在一合格溫度範圍內的溫度,在該影像的感興趣區域中所佔的連續面積;計算該連續面積的標準差與該感興趣區域的標準差或該感興趣區域去除該連續面積後的區域的標準差的一差值;以及根據該差值的大小,判斷是否指示該密封缺陷。A method for detecting a heat-sealing defect, which is used to detect the sealing characteristic of a port of a container, the port of the container is covered with a metal film, and a cover is stacked on the metal film, the method includes: A high frequency is applied to the position of the metal film covered on the port of the container; an infrared camera is used to sense infrared radiation above the container to generate temperature data of each part of the container; the temperature data of each part of the container is converted into the container Positioning an image of the container to define a region of interest (ROI); calculating a temperature that is not within a qualified temperature range and a continuous area occupied by the region of interest of the image ; Calculate a difference between the standard deviation of the continuous area and the standard deviation of the region of interest or the standard deviation of the region after the continuous area is removed from the region of interest; and determine whether to indicate the seal defect based on the size of the difference . 如申請專利範圍第1項所述之檢測熱密封缺陷的方法,其中該金屬薄膜包含一鋁膜。The method for detecting a heat-sealing defect as described in item 1 of the patent application scope, wherein the metal thin film includes an aluminum film. 如申請專利範圍第1項所述之檢測熱密封缺陷的方法,其中將該容器各部分的溫度資料轉換成該容器的影像的步驟包含:將該溫度資料中溫度高於一第一溫度的資料,以一第一像素值表示;將該溫度資料中溫度低於一第二溫度的資料,以一第二像素值表示;以及將該溫度資料中溫度介於該第一溫度和該第二溫度之間的資料,以相異的像素值表示。The method for detecting a heat-sealing defect as described in item 1 of the scope of the patent application, wherein the step of converting temperature data of each part of the container into an image of the container includes: data of the temperature data having a temperature higher than a first temperature , Represented by a first pixel value; data in which the temperature data is lower than a second temperature is represented by a second pixel value; and the temperature in the temperature data is between the first temperature and the second temperature The data is represented by different pixel values. 如申請專利範圍第1項所述之檢測熱密封缺陷的方法,更包含:將該感興趣區域分割成複數個單元區域,其中計算不在該合格溫度範圍內的溫度,在該影像的感興趣區域中所佔的連續面積的步驟包含:計算不在該合格溫度範圍內的溫度,在每個單元區域所佔的連續面積,其中當該等單元區域中的其中一個單元區域被判定為存在密封缺陷,則判定該容器存在密封缺陷。The method for detecting a heat-sealing defect as described in item 1 of the scope of the patent application, further comprises: dividing the region of interest into a plurality of unit regions, wherein a temperature not within the qualified temperature range is calculated, and the region of interest of the image is calculated. The continuous area occupied by step includes: calculating the temperature outside the qualified temperature range, the continuous area occupied by each unit area, and when one of the unit areas is determined to have a sealing defect, It is determined that the container has a sealing defect. 如申請專利範圍第1項所述之檢測熱密封缺陷的方法,其中對該容器的影像進行定位,以定義出該感興趣區域的步驟包含:在該容器的影像中定義出一中心點;以該中心點為圓心、一第一半徑值為半徑,定義出一第一圓形;以該中心點為圓心,一第二半徑值為半徑,定義出一第二圓心;以及將該第一圓形和該第二圓形之間的區域,定義為該感興趣區域。The method for detecting a heat-sealing defect as described in item 1 of the scope of patent application, wherein the step of positioning the image of the container to define the region of interest includes: defining a center point in the image of the container; The center point is a circle center, a first radius value is a radius, and a first circle is defined; the center point is a circle center, and a second radius value is a radius, a second circle center is defined; and the first circle is defined; The area between the shape and the second circle is defined as the area of interest. 如申請專利範圍第1項所述之檢測熱密封缺陷的方法,其中計算不在該合格溫度範圍內的溫度,在該影像的感興趣區域中所佔的連續面積的步驟包含:計算不在該合格溫度範圍內的一第一溫度區間,在該影像的感興趣區域中所佔的第一連續面積;計算不在該合格溫度範圍內的一第二溫度區間,在該影像的感興趣區域中所佔的第二連續面積;以及將該第一連續面積和該第二連續面積的和作為該連續面積。The method for detecting a heat-sealing defect as described in item 1 of the scope of patent application, wherein the step of calculating a temperature outside the qualified temperature range and occupying a continuous area in the region of interest of the image includes: calculating the temperature not in the qualified temperature A first temperature interval within the range, the first continuous area occupied in the region of interest of the image; a second temperature interval not within the qualified temperature range, calculated in the region of interest of the image A second continuous area; and a sum of the first continuous area and the second continuous area as the continuous area. 如申請專利範圍第1項所述之檢測熱密封缺陷的方法,其中計算不在該合格溫度範圍內的溫度,在該影像的感興趣區域中所佔的連續面積的步驟包含:將不在該合格溫度範圍內的溫度劃分為複數個溫度區間;計算每個溫度區間在該影像的感興趣區域中所佔的連續面積;判斷每個溫度區間所佔的連續面積是否大於一閾值;移除連續面積小於該閾值所對應的溫度區間;以及針對連續面積大於該閾值的溫度區間,對其所佔的連續面積進行加總。The method for detecting a heat seal defect according to item 1 of the scope of the patent application, wherein the step of calculating a continuous area occupied by the temperature outside the qualified temperature range in the region of interest of the image includes: not at the qualified temperature The temperature in the range is divided into a plurality of temperature intervals; the continuous area occupied by each temperature interval in the region of interest of the image is calculated; the continuous area occupied by each temperature interval is greater than a threshold; the continuous area removed is less than A temperature interval corresponding to the threshold; and summing up the continuous area occupied by the temperature interval with a continuous area greater than the threshold. 如申請專利範圍第1項所述之檢測熱密封缺陷的方法,其中對該容器的影像進行定位,以定義出該感興趣區域的步驟包含:在該容器的影像中定義出一中心點;以及以該中心點為圓心、一預定半徑值為半徑,定義出一圓形;且其中所述方法更包含:計算該圓形中像素點所對應的溫度資料的一平均溫度;判斷該平均溫度是否大於一閾值;以及指示出一密封缺陷,以回應該平均溫度大於該閾值的情況。The method for detecting a heat-sealing defect as described in item 1 of the patent application scope, wherein the step of positioning the image of the container to define the region of interest includes: defining a center point in the image of the container; and A circle is defined by using the center point as a circle center and a predetermined radius value as a radius; and the method further includes: calculating an average temperature of temperature data corresponding to the pixels in the circle; and determining whether the average temperature is Greater than a threshold; and indicating a seal defect in response to a situation where the average temperature is greater than the threshold. 一種檢測熱密封缺陷的設備,其應用於檢測一容器之一端口的密封特性,該容器之端口以一金屬薄膜覆蓋,而在該金屬薄膜上疊置有一蓋體,所述設備包含:一高周波產生器,用以對應該容器之端口上覆蓋的金屬薄膜的位置,施加高周波;一紅外線攝像器,用以在該高周波產生器施加該高周波後,在該容器上方感測紅外線輻射,以生成該容器各部分的溫度資料;一處理裝置,與該紅外線攝像器耦接,用以接收該紅外線攝像器生成的該溫度資料;將該容器各部分的溫度資料轉換成該容器的一影像;對該容器的影像進行定位,以定義出一感興趣區域(region of interest,ROI);計算不在一合格溫度範圍內的溫度,在該影像的感興趣區域中所佔的連續面積;計算該連續面積的標準差與該感興趣區域的標準差或該感興趣區域去除該連續面積後的區域的標準差的一差值;以及根據該差值的大小,判斷是否指示該密封缺陷;以及一輸出裝置,與該處理裝置耦接,用以指示該密封缺陷。A device for detecting a heat seal defect, which is used to detect the sealing characteristics of a port of a container, the port of the container is covered with a metal film, and a cover is stacked on the metal film. The device includes: a high frequency A generator for applying high frequency to the position of the metal film covered on the port of the container; an infrared camera for sensing infrared radiation above the container after the high frequency is applied by the high frequency generator to generate the Temperature data of each part of the container; a processing device coupled to the infrared camera for receiving the temperature data generated by the infrared camera; converting the temperature data of each part of the container into an image of the container; The image of the container is positioned to define a region of interest (ROI); the temperature is not within a qualified temperature range, and the continuous area occupied by the image's region of interest; the continuous area is calculated The difference between the standard deviation of the region of interest or the standard deviation of the region of interest after the continuous area is removed ; And according to the size of the difference, indicating that the seal is determined whether the defect; and an output means, coupled to the processing means for indicating the sealing defect. 如申請專利範圍第9項所述之檢測熱密封缺陷的設備,其中該金屬薄膜包含一鋁膜。The apparatus for detecting a heat seal defect as described in item 9 of the scope of the patent application, wherein the metal thin film includes an aluminum film. 如申請專利範圍第9項所述之檢測熱密封缺陷的設備,其中在將該溫度資料轉換成該影像的過程中,該處理裝置還用以將該溫度資料中溫度高於一第一溫度的資料,以一第一像素值表示;將該溫度資料中溫度低於一第二溫度的資料,以一第二像素值表示;以及將該溫度資料中溫度介於該第一溫度和該第二溫度之間的資料,以相異的像素值表示。The apparatus for detecting a heat seal defect as described in item 9 of the scope of patent application, wherein in the process of converting the temperature data into the image, the processing device is further configured to: The data is represented by a first pixel value; the temperature of the temperature data is lower than a second temperature by a second pixel value; and the temperature in the temperature data is between the first temperature and the second Data between temperatures is expressed as distinct pixel values. 如申請專利範圍第9項所述之檢測熱密封缺陷的設備,其中該處理裝置進一步用以將該感興趣區域分割成複數個單元區域;以及計算不在該合格溫度範圍內的溫度,在每個單元區域所佔的連續面積,其中當該等單元區域中的其中一個單元區域被判定為存在密封缺陷,則該處理裝置判定該容器存在密封缺陷。The device for detecting a heat seal defect as described in item 9 of the scope of the patent application, wherein the processing device is further configured to divide the region of interest into a plurality of unit regions; and calculate a temperature not within the qualified temperature range at each The continuous area occupied by the unit areas. When one of the unit areas is determined to have a sealing defect, the processing device determines that the container has a sealing defect. 如申請專利範圍第9項所述之檢測熱密封缺陷的設備,其中在定義該感興趣區域的過程中,該處理裝置還用以在該容器的影像中定義出一中心點;以該中心點為圓心、一第一半徑值為半徑,定義出一第一圓形;以該中心點為圓心,一第二半徑值為半徑,定義出一第二圓心;以及將該第一圓形和該第二圓形之間的區域,定義為該感興趣區域。The device for detecting a heat seal defect as described in item 9 of the scope of patent application, wherein in the process of defining the region of interest, the processing device is further used to define a center point in the image of the container; use the center point Is a circle center, a first radius value is a radius, a first circle is defined; the center point is a circle center, and a second radius value is a radius, a second circle center is defined; and the first circle and the The area between the second circles is defined as the area of interest. 如申請專利範圍第9項所述之檢測熱密封缺陷的設備,其中在計算該連續面積的過程中,該處理裝置還用以計算不在該合格溫度範圍內的一第一溫度區間,在該影像的感興趣區域中所佔的第一連續面積;計算不在該合格溫度範圍內的一第二溫度區間,在該影像的感興趣區域中所佔的第二連續面積;以及將該第一連續面積和該第二連續面積的和作為該連續面積。The device for detecting a heat seal defect as described in item 9 of the scope of patent application, wherein in the process of calculating the continuous area, the processing device is further configured to calculate a first temperature interval that is not within the qualified temperature range. A first continuous area occupied in the region of interest of the; calculating a second temperature interval not in the qualified temperature range, a second continuous area occupied in the region of interest of the image; and the first continuous area The sum with the second continuous area is taken as the continuous area. 如申請專利範圍第9項所述之檢測熱密封缺陷的設備,其中在計算該連續面積的過程中,該處理裝置還用以將不在該合格溫度範圍內的溫度劃分為複數個溫度區間;計算每個溫度區間在該影像的感興趣區域中所佔的連續面積;判斷每個溫度區間所佔的連續面積是否大於一閾值;移除連續面積小於該閾值所對應的溫度區間;以及針對連續面積大於該閾值的溫度區間,對其所佔的連續面積進行加總。The device for detecting a heat seal defect as described in item 9 of the scope of patent application, wherein in the process of calculating the continuous area, the processing device is further configured to divide the temperature not within the qualified temperature range into a plurality of temperature intervals; calculation The continuous area occupied by each temperature interval in the region of interest of the image; determining whether the continuous area occupied by each temperature interval is greater than a threshold; removing the temperature interval where the continuous area is less than the threshold; and for continuous areas For temperature intervals greater than this threshold, the continuous area occupied by them is added up. 如申請專利範圍第9項所述之檢測熱密封缺陷的設備,其中在定義該感興趣區域的過程中,該處理裝置還用以在該容器的影像中定義出一中心點;以及以該中心點為圓心、一預定半徑值為半徑,定義出一圓形,該處理裝置並用以計算該圓形中像素點所對應的溫度資料的一平均溫度;以及判斷該平均溫度是否大於一閾值,且該輸出裝置用以指示出一密封缺陷,以回應該平均溫度大於該閾值的情況。The device for detecting a heat seal defect as described in item 9 of the scope of patent application, wherein in the process of defining the region of interest, the processing device is further used to define a center point in the image of the container; and the center A point is a circle center, a predetermined radius value is a radius, a circle is defined, and the processing device is configured to calculate an average temperature of temperature data corresponding to the pixels in the circle; and determine whether the average temperature is greater than a threshold value, and The output device is used to indicate a sealing defect in response to a situation where the average temperature is greater than the threshold. 一種檢測熱密封缺陷的系統,其應用於檢測一容器之一端口的密封特性,該容器之端口以一金屬薄膜覆蓋,而在該金屬薄膜上疊置有一蓋體,所述系統包含:一高周波產生器,設置於一生產線上,該生產線上具有一輸送帶,該輸送帶用以輸送複數個裝配有該金屬薄膜和該蓋體之容器,該高周波產生器用以對應每個容器之端口上覆蓋的金屬薄膜的位置,施加高周波;一紅外線攝像器,用以在該高周波產生器施加該高周波後,在每個容器上方感測紅外線輻射,以生成每個容器各部分的溫度資料;一處理裝置,與該紅外線攝像器耦接,用以接收該紅外線攝像器生成的該溫度資料;將該容器各部分的溫度資料轉換成該容器的一影像;對該容器的影像進行定位,以定義出一感興趣區域(region of interest,ROI);計算不在一合格溫度範圍內的溫度,在該影像的感興趣區域中所佔的連續面積;計算該連續面積的標準差與該感興趣區域的標準差或該感興趣區域去除該連續面積後的區域的標準差的一差值;以及根據該差值的大小,判斷是否指示該密封缺陷;以及一移除裝置,與該處理裝置耦接,用以回應該處理裝置判斷出該容器存在該密封缺陷,而從該輸送帶上將該容器移除。A system for detecting a heat seal defect, which is used to detect the sealing characteristics of a port of a container, the port of the container is covered with a metal film, and a cover is stacked on the metal film. The system includes: a high frequency The generator is arranged on a production line. The production line has a conveyor belt for conveying a plurality of containers equipped with the metal film and the cover. The high frequency generator is used to cover the ports corresponding to each container. High frequency is applied to the position of the metal thin film; an infrared camera is used to sense infrared radiation above each container after the high frequency is applied by the high frequency generator to generate temperature data of each part of each container; a processing device Is coupled to the infrared camera to receive the temperature data generated by the infrared camera; convert the temperature data of each part of the container into an image of the container; position the image of the container to define a Region of interest (ROI); calculates the temperature not within a qualified temperature range, the interest in the image The continuous area occupied in the domain; calculating a difference between the standard deviation of the continuous area and the standard deviation of the region of interest or the standard deviation of the region after the continuous area is removed from the region of interest; and according to the magnitude of the difference To determine whether to indicate the sealing defect; and a removing device coupled to the processing device, in response to the processing device determining that the container has the sealing defect, and removing the container from the conveyor belt.
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