TWI608117B - Film forming method - Google Patents

Description

Film formation method

Priority is claimed on the basis of Japanese Patent Application No. 2014-259976, filed on Dec.

Various aspects and embodiments of the present invention relate to a film forming method.

The ruthenium substrate forms a thin natural oxide film on the surface due to exposure to the atmosphere. When a natural oxide film is formed on the germanium substrate and an SiN film is formed on the germanium substrate, abnormal growth of the SiN film occurs. In order to prevent such a situation, it is known to form a base film made of a SiON-based film having a small surface correlation on a substrate, and to continuously form a SiN-based film, after the substrate is transferred to a reaction furnace. Please refer to Japanese Patent Laid-Open No. 7-245268

In one embodiment, the film forming method is disclosed in which a nitride film is formed on a substrate to be processed which is placed in a processing container of a film forming apparatus and has a carbon-containing film containing carbon atoms, and the film forming method includes 1 a nitride film forming step of forming a first nitridation on a carbon-containing film by a plasma containing a first reaction gas of a nitride gas having no hydrogen atoms and an inert gas; membrane.

The above summary is for illustrative purposes only and is not intended to be limiting in any way. In addition to the above-described aspects, embodiments, and features, additional aspects, embodiments, and features may be

In the following detailed description, reference is made to the accompanying drawings which form a part of the specification. The detailed description, the drawings and the description of the claims are not intended to be limiting. Other embodiments may be utilized, and other variations may be made, without departing from the spirit and scope of the inventions.

When a film containing a carbon atom is used as a base film and a nitride film is formed on the base film, ions in the plasma may react with carbon atoms contained in the base film to decompose the base film. Therefore, it is difficult to maintain the thickness of the base film containing carbon atoms, and a nitride film of a predetermined thickness is formed on the base film. In particular, when a nitride film is formed on a substrate by an Atomic Layer Deposition (ALD) method, molecular nitrogen adsorbed on the surface of the base film is caused by a slow film formation speed and a long time for the base film to contact the plasma. When it is formed, an unwanted reaction occurs between the molecule and the base film. Therefore, decomposition of the base film or deterioration of the nitride film occurs.

In one embodiment, the film forming method is disclosed in which a nitride film is formed on a substrate to be processed which is placed in a processing container of a film forming apparatus and has a carbon-containing film containing carbon atoms, and the film forming method includes 1 a nitride film forming step of forming a first nitridation on a carbon-containing film by a plasma containing a first reaction gas of a nitride gas having no hydrogen atoms and an inert gas; membrane.

Further, in an embodiment of the film forming method disclosed, in the first nitride film forming step, the first nitride film is preferably formed by an ALD method.

Further, in an embodiment of the film forming method disclosed, the first reaction gas is preferably a mixed gas of N ₂ gas and Ar gas.

Further, in an embodiment of the film forming method disclosed, the ratio of the flow rate of the N ₂ gas to the flow rate of the Ar gas is preferably 1/50 or less.

Further, in an embodiment of the film forming method disclosed, the first nitride film forming step preferably generates a plasma of the first reaction gas by microwaves supplied from the antenna into the processing container, and is supplied from the antenna to the processing container. The sum of the power of the microwaves is 2 kW or more.

Further, in the film forming method disclosed, in one embodiment, it is preferable to include a second nitride film forming step, and the second nitride film forming step is included in the first nitride film forming step, and is included in the first A plasma of the second reaction gas of a gas having a different reaction gas forms a second nitride film on the first nitride film.

Further, in an embodiment of the film forming method disclosed, it is preferable that the second reaction gas contains a nitride gas containing a hydrogen atom.

In addition, in an embodiment of the film forming method disclosed, the processing container preferably mounts the substrate to be processed, and the substrate to be processed is moved around the axis by rotating the mounting table that can be rotated about the axis. The circumferential direction in which the substrate moves relative to the axis is divided into a plurality of regions. Further, the first nitride film forming step preferably includes the steps of: supplying a precursor gas to one of a plurality of regions, adsorbing molecules of the precursor gas on the surface of the substrate to be processed; and supplying the first reaction gas to the plurality of regions Another region in the middle; and a plasma of the first reaction gas generated by microwaves supplied to another of the plurality of regions, and the surface of the substrate to be processed to which the precursor gas molecules are adsorbed is generated by the generated plasma Perform plasma treatment. Further, the second nitride film forming step preferably includes the steps of: supplying a precursor gas into the processing container in one of the plurality of regions, adsorbing molecules of the precursor gas on the surface of the substrate to be processed; and performing the second reaction The gas is supplied to another one of the plurality of regions; and the plasma of the second reactive gas is generated by the microwave supplied to the other of the plurality of regions, and the precursor gas molecules are adsorbed by the generated plasma The surface of the substrate to be processed is subjected to plasma treatment.

Further, in an embodiment of the film forming method disclosed, the first nitride film is preferably formed on the carbon-containing film with a thickness of 0.5 nm to 1.0 nm.

According to various aspects and embodiments of the present invention, it is possible to suppress a decrease in film thickness of a base film containing carbon atoms, and to form a nitride film having a predetermined thickness on the base film. (embodiment)

FIG. 1 is a cross-sectional view showing an example of the film forming apparatus 10. Fig. 2 is a schematic view showing an example of the film forming apparatus 10 when viewed from above. The A-A section in Fig. 2 is shown in Fig. 1. 3 and 4 are enlarged cross-sectional views showing an example of the left side portion of the axis X in Fig. 1. Fig. 5 is a view showing an example of the lower portion of the unit U. Fig. 6 is an enlarged cross-sectional view showing an example of a right portion of the axis X in Fig. 1. The film forming apparatus 10 shown in FIGS. 1 to 6 mainly includes a processing container 12, a mounting table 14, a first gas supply unit 16, an exhaust unit 18, a second gas supply unit 20, and a plasma generating unit 22.

As shown in Fig. 1, the processing container 12 has a lower member 12a and an upper member 12b. The lower member 12a has a substantially cylindrical shape with an upper opening and forms a recess, and the recess includes a side wall and a bottom wall forming the process chamber C. The upper member 12b has a substantially cylindrical lid body, and the processing chamber C is formed by closing the upper opening of the recess of the lower member 12a by the lid. An outer peripheral portion between the lower member 12a and the upper member 12b is provided with an elastic sealing member for sealing the processing chamber C, for example, an O-ring.

The film forming apparatus 10 has a mounting table 14 inside the processing chamber C formed by the processing container 12. The mounting table 14 is driven to rotate about the axis X by the drive mechanism 24. The drive mechanism 24 has a driving device 24a of a motor or the like and a rotating shaft 24b, and is attached to the lower member 12a of the processing container 12.

The rotating shaft 24b extends to the inside of the processing chamber C with the axis X as a central axis. The rotating shaft 24b is rotated about the axis X by the driving force transmitted from the driving device 24a. The central portion of the stage 14 is supported by the rotating shaft 24b. Thereby, the mounting table 14 rotates with the rotation of the rotating shaft 24b centering on the axis X. Further, between the lower member 12a of the processing container 12 and the drive mechanism 24, an elastic sealing member such as an O-ring or the like that seals the processing chamber C is provided.

The film forming apparatus 10 has a heater 26 for heating the substrate W under the mounting table 14 inside the processing chamber C, and the substrate W is a substrate to be processed placed on the mounting table 14. Specifically, the heater 26 heats the substrate W by heating the mounting table 14.

The processing container 12 is, for example, as shown in Fig. 2, a substantially cylindrical container having an axis X as a central axis, and a processing chamber C inside. The processing chamber C is provided with a unit U including an injection portion 16a. The processing container 12 is formed of, for example, a metal such as Al (aluminum) which is subjected to plasma treatment such as alumite treatment or thermal spraying treatment of Y ₂ O ₃ (yttria) on the inner surface. The film forming apparatus 10 has a plurality of plasma generating portions 22 in the processing container 12.

Each of the plasma generating portions 22 has a plurality of antennas 22a-1 to 22a-3 for outputting microwaves on the upper portion of the processing container 12. In the present embodiment, each of the antennas 22a has a substantially triangular shape with a circular shape at an angle. In FIG. 2, although three antennas 22a-1 to 22a-3 are provided in the upper portion of the processing container 12, the number of the antennas 22a is not limited, and may be two or less, or four or more.

The film forming apparatus 10 includes, for example, as shown in FIG. 2, a mounting table 14 having a plurality of substrate mounting regions 14a thereon. The mounting table 14 is a substantially disk-shaped member having a central axis X as a central axis. On the upper surface of the mounting table 14, a plurality of concentric circles (five in the example of FIG. 2) centered on the axis X are placed on the substrate mounting region 14a on which the substrate W is placed. The substrate W is disposed in the substrate mounting region 14a, and the substrate mounting region 14a supports the substrate W when the mounting table 14 rotates, so that the substrate W is not displaced. The substrate mounting region 14a is a substantially circular recess having substantially the same shape as the substantially circular substrate W. The diameter of the concave portion of the substrate mounting region 14a is substantially the same as the diameter W1 of the substrate W placed in the substrate mounting region 14a. In other words, the diameter of the concave portion of the substrate mounting region 14a allows the substrate W to be placed to be fitted into the concave portion, and even if the mounting table 14 rotates, the substrate W can be fixed, so that the substrate W is not moved by the fitting position due to the centrifugal force.

The film forming apparatus 10 has a gate valve G for transporting the substrate W into the processing chamber C through a transfer device such as a robot arm and carrying out the substrate W from the processing chamber C at the outer edge of the processing container 12. Further, the film forming apparatus 10 has an exhaust portion 22h along the periphery of the mounting table 14 below the outer edge of the mounting table 14. The exhaust unit 22h is connected to the exhaust unit 52. The film forming apparatus 10 can control the operation of the exhaust unit 52, and the gas in the processing chamber C is discharged from the exhaust port, thereby maintaining the pressure in the processing chamber C at the target pressure.

The processing chamber C includes, for example, as shown in FIG. 2, a first region R1 and a second region R2 arranged on a circumference centered on the axis X. The substrate W placed on the substrate mounting region 14a sequentially passes through the first region R1 and the second region R2 in accordance with the rotation of the mounting table 14. In the present embodiment, the mounting table 14 shown in Fig. 2 is rotated in, for example, a clockwise direction when viewed from above.

The first gas supply unit 16 includes an inner gas supply unit 161, an intermediate gas supply unit 162, and an outer air supply unit 163 as shown, for example, in FIGS. 3 and 4 . Further, above the first region R1, as shown, for example, in FIGS. 3 and 4, a unit U for supplying, flushing, and exhausting gas is provided so as to face the upper surface of the mounting table 14. The unit U has a structure in which the first member M1, the second member M2, the third member M3, and the fourth member M4 are superposed in this order. The unit U is mounted on the processing container 12 in a manner that abuts against the underlying member 12b of the processing vessel 12.

The unit U has a gas supply path 161p, a gas supply path 162p, and a gas supply path 163p that penetrate the second member M2 to the fourth member M4 as shown, for example, in FIGS. 3 and 4. The gas supply path 161p is connected to the gas supply path 121p provided at the upper end of the processing container 12 upper member 12b. The gas supply path 121p is connected to the gas supply source 16g of the precursor gas through the flow rate controller 161c such as the valve 161v and the mass flow controller. Further, the lower end of the gas supply path 161p is connected to a buffer space 161d formed between the first member M1 and the second member M2 and surrounded by an elastic member 161b such as an O-ring. The buffer space 161d is connected to the injection port 16h provided in the inner injection portion 161a of the first member M1.

Further, the gas supply path 162p is connected to the gas supply path 122p provided at the upper end of the processing container 12 upper member 12b. The gas supply path 122p is connected to the gas supply source 16g through the valve 162v and the flow rate controller 162c. Further, the lower end of the gas supply path 162p is connected to a buffer space 162d formed between the first member M1 and the second member M2 and surrounded by an elastic member 162b such as an O-ring. The buffer space 162d is connected to the injection port 16h provided in the intermediate injection portion 162a of the first member M1.

Further, the gas supply path 163p is connected to the gas supply path 123p provided at the upper end of the processing container 12 upper member 12b. The gas supply path 123p is connected to the gas supply source 16g through the valve 163v and the flow rate controller 163c. Further, the lower end of the gas supply path 163p is connected to a buffer space 163d formed between the first member M1 and the second member M2 and surrounded by an elastic member 163b such as an O-ring. The buffer space 163d is connected to the injection port 16h provided in the injection portion 163a on the outer side of the first member M1.

The buffer space 161d of the inner gas supply unit 161, the buffer space 162d of the intermediate gas supply unit 162, and the buffer space 163d of the outer air supply unit 163 form an independent space as shown, for example, in FIGS. 3 and 4 . Moreover, the precursor gas flow rate through each buffer space can be independently controlled by the flow rate controller 161c, the flow rate controller 162c, and the flow rate controller 163c.

In the unit U, as shown, for example, in FIGS. 3 and 4, a gas supply path 20r penetrating through the fourth member M4 is formed. The gas supply path 20r is connected to the gas supply path 12r provided at the upper end of the processing container 12 upper member 12b. The gas supply path 12r is connected to the gas supply source 20g of the flushing gas through the valve 20v and the flow rate controller 20c.

The lower end of the gas supply path 20r is connected to a space 20d provided between the lower surface of the fourth member M4 and the upper surface of the third member M3. Further, the fourth member M4 forms a recess in which the first member M1 to the third member M3 are housed. A gap 20p is provided between the inner surface of the fourth member M4 forming the recess and the outer surface of the third member M3. The gap 20p is connected to the space 20d. The lower end of the gap 20p has a function as the ejection port 20a.

In the unit U, as shown, for example, in FIGS. 3 and 4, an exhaust passage 18q penetrating the third member M3 and the fourth member M4 is formed. The exhaust passage 18q is connected to an exhaust passage 12q whose upper end is provided in the upper member 12b of the processing container 12. The exhaust passage 12q is connected to an exhaust device 34 such as a vacuum pump. Further, the lower end of the exhaust passage 18q is connected to a space 18d provided between the lower surface of the third member M3 and the upper surface of the second member M2.

The third member M3 has a concave portion that accommodates the first member M1 and the second member M2. A gap 18g is provided between the inner surface of the third member M3 constituting the recessed portion of the third member M3 and the outer surface of the first member M1 and the second member M2. The space 18d is connected to the gap 18g. The lower end of the gap 18g has a function as the exhaust port 18a.

Below the unit U, that is, on the surface facing the mounting table 14, as shown, for example, in Fig. 5, the injection portion 16a is provided in the Y-axis direction away from the axis X. The region opposite to the ejection portion 16a in the region included in the processing chamber C is the first region R1. The ejection portion 16a ejects the precursor gas toward the substrate W on the mounting table 14. As shown, for example, in FIG. 5, the injection portion 16a has an inner injection portion 161a, an intermediate injection portion 162a, and an outer injection portion 163a.

The inner spray portion 161a is formed in the inner annular region A1 of the region included in the lower surface of the unit U in an annular region having a distance from the axis X to r1 to r2 as shown, for example, in FIG. 5. Further, the intermediate injection portion 162a is formed in the annular region in the range of r2 to r3 with respect to the axis X, and the intermediate annular region A2 of the region included in the lower portion of the unit U. Further, the outer injection portion 163a is formed in an annular region within a range of r3 to r4 with respect to the axis X, and is located in the outer annular region A3 of the region included in the lower surface of the unit U.

The ejection portion 16a formed under the unit U has a length L of r1 to r4 in a range extending in the Y-axis direction, as shown, for example, in FIG. 5, the length of the substrate W passing through the Y-axis compared to the diameter W1, on the axis The direction of the X side is longer than the predetermined distance DL, and is longer than the predetermined distance DL in the direction opposite to the side of the axis X.

The inner injection portion 161a, the intermediate injection portion 162a, and the outer injection portion 163a have a plurality of injection ports 16h as shown, for example, in FIG. The precursor gas is ejected toward the first region R1 by the respective ejection ports 16h. The flow rate of the precursor gas injected into the first region R1 by the respective injection ports 16h of the inner injection portion 161a, the intermediate injection portion 162a, and the outer injection portion 163a is independently generated by the flow rate controller 161c, the flow rate controller 162c, and the flow rate controller 163c. control. By supplying the precursor gas to the first region R1, atoms or molecules of the precursor gas are adsorbed on the surface of the substrate W passing through the first region R1. The precursor gas uses a gas containing a nitrogen atom; and contains a gas such as DCS (dichlorodecane), monochlorodecane, trichlorodecane, and hexachlorodecane.

Above the first region R1, as shown, for example, in FIGS. 3 and 4, an exhaust port 18a of the exhaust portion 18 is provided so as to face the upper surface of the mounting table 14. The exhaust port 18a is formed below the unit U so as to surround the periphery of the injection portion 16a as shown, for example, in FIG. The exhaust port 18a exhausts the gas in the processing chamber C through the exhaust port 18a by the operation of the exhaust device 34 such as a vacuum pump.

Above the first region R1, as shown, for example, in FIGS. 3 and 4, the injection port 20a of the second gas supply unit 20 is provided so as to face the upper surface of the mounting table 14. The injection port 20a is formed below the unit U so as to surround the periphery of the exhaust port 18a as shown, for example, in FIG. The second gas supply unit 20 injects the flushing gas into the first region R1 through the injection port 20a. The flushing gas system jetted by the second gas supply unit 20 is an inert gas such as Ar (argon). By spraying the flushing gas onto the surface of the substrate W, atoms or molecules (residual gas components) of the precursor gas excessively adsorbed on the substrate W can be removed from the substrate W. Thereby, an atomic layer or a molecular layer in which atoms or molecules of the precursor gas are adsorbed can be formed on the surface of the substrate W.

The unit U injects the flushing gas from the injection port 20a, and exhausts the flushing gas from the surface of the mounting table 14 by the exhaust port 18a. Thereby, the unit U can suppress the leakage of the exchanging gas outside the first region R1 before being supplied to the first region R1. Further, since the unit U injects the flushing gas from the injection port 20a and exhausts the flushing gas from the surface of the mounting table 14 by the exhaust port 18a, it is possible to suppress the intrusion of radicals or reaction gases such as the reaction gas or the reaction gas supplied to the second region R2. In the first area R1. In other words, the unit U can separate the first region R1 from the second region R2 by injecting the flushing gas from the second gas supply unit 20 and exhausting it from the exhaust unit 18.

As shown in, for example, FIG. 6, the film forming apparatus 10 has a plasma generating portion 22 that is disposed to face the upper surface of the mounting table 14 in the opening AP of the upper member 12b above the second region R2. The plasma generating unit 22 includes an antenna 22a, a coaxial waveguide 22b that supplies microwaves to the antenna 22a, and a reaction gas supply unit 22c that supplies a reaction gas to the second region R2. In the present embodiment, for example, three openings AP are formed in the upper member 12b, and the film forming apparatus 10 has, for example, three antennas 22a-1 to 22a-3.

The plasma generating unit 22 supplies microwaves to the second region R2 by the antenna 22a and the coaxial waveguide 22b, and supplies the reaction gas to the second region R2 by the reaction gas supply unit 22c, thereby generating electricity of the reaction gas in the second region R2. Pulp. Further, a plasma treatment is performed on the atomic layer or the molecular layer adsorbed on the surface of the substrate W. In the present embodiment, when a nitrogen-containing gas is used as the reaction gas, the plasma generating unit 22 nitrides the atomic layer or the molecular layer adsorbed on the substrate W. As the reaction gas, for example, a mixed gas of a N ₂ (nitrogen) gas and a H ₂ (hydrogen) gas, or a nitrogen atom-containing gas such as a mixed gas of NH ₃ (ammonia) gas and H ₂ (hydrogen) gas can be used.

The plasma generating unit 22 hermetically arranges the antenna 22a so as to close the opening AP as shown, for example, in FIG. The antenna 22a has a top plate 40, a slotted plate 42, and a slow wave plate 44. The top plate 40 is a rounded substantially triangular member formed of a dielectric body, and is formed of, for example, alumina ceramics or the like. The top plate 40 is supported by the upper member 12b such that the lower portion thereof is exposed to the second region R2 by the opening AP formed in the upper member 12b of the processing container 12.

The slotted plate 42 is disposed above the top plate 40. The slotted plate 42 is formed of a plate-like metal member having a substantially equilateral triangle shape. A plurality of slot pairs are formed in the slotted plate 42. Each slot pair includes two slots that are orthogonal to each other.

The slow wave plate 44 is disposed above the grooved plate 42. The slow wave plate 44 is formed into a substantially regular triangle by a dielectric such as alumina ceramic. The slow wave plate 44 is provided with a substantially cylindrical opening for arranging the outer side conductor 62b of the coaxial waveguide 22b.

A metal cooling plate 46 is disposed above the slow wave plate 44. The cooling plate 46 can pass through the slow wave plate 44 to cool the antenna 22a by circulating a refrigerant flowing through the flow path formed therein. The cooling plate 46 presses the upper surface of the slow wave plate 44 by a spring or the like (not shown) so that the lower surface of the cooling plate 46 is in close contact with the upper surface of the slow wave plate 44.

The coaxial waveguide 22b has an inner conductor 62a and an outer conductor 62b. The inner conductor 62a penetrates the opening of the slow wave plate 44 and the opening of the grooved plate 42 from above the antenna 22a. The outer conductor 62b has a gap between the outer peripheral surface of the inner conductor 62a and the inner peripheral surface of the outer conductor 62b, and is provided to surround the inner conductor 62a. The lower end of the outer conductor 62b is connected to the opening of the cooling plate 46. Further, the antenna 22a may have a function as an electrode. Alternatively, an electrode provided in the processing container 12 may be used as the antenna 22a.

The film forming apparatus 10 has a waveguide 60 and a microwave generator 68. The microwave generated by the microwave generator 68, for example, about 2.45 GHz, is transmitted through the waveguide 60 to the coaxial waveguide 22b and through the gap between the inner conductor 62a and the outer conductor 62b. Further, the microwaves transmitted through the slow wave plate 44 are transferred from the slots of the slotted plate 42 to the top plate 40, and are emitted from the top plate 40 toward the second region R2.

The reaction gas is supplied from the reaction gas supply unit 22c to the second region R2. The reaction gas supply unit 22c has a plurality of inner injection portions 50b and a plurality of outer injection ports 51b as shown, for example, in Fig. 2 . Each of the inner injection ports 50b is connected to the gas supply source 50g of the reaction gas through the flow rate control unit 50c such as the permeation valve 50v and the mass flow controller, as shown, for example. Each of the inner injection ports 50b is provided on the lower surface of the upper member 12b of the processing container 12 as shown, for example, in FIG.

Each of the inside injection ports 50b supplies the reaction gas supplied from the gas supply source 50g through the valve 50v and the flow rate control unit 50c in a direction away from the axis X, for example, toward the substrate W placed on the substrate mounting region 14a of the mounting table 14. The plane parallel to the surface is ejected to the second region R2 below the antenna 22a.

Each of the outer injection ports 51b is connected to the gas supply source 50g of the reaction gas through the flow rate control unit 51c such as the valve 51v and the mass flow controller. Each of the outer injection ports 51b is provided on the lower surface of the upper member 12b of the processing container 12 as shown, for example, in FIG. Each of the inside injection ports 51b ejects the reaction gas supplied from the gas supply source 50g through the valve 51v and the flow rate control unit 51c in the direction of the axis X, for example, along the substrate placed on the substrate mounting region 14a of the mounting table 14. The reaction gas is sprayed in a direction parallel to the W plane.

Further, in the present embodiment, the flow rates of the reaction gases injected from the inner injection port 50b and the outer injection port 51b are independently controlled by the flow rate control unit 50c and the flow rate control unit 51c. Further, the flow rate control unit 50c and the flow rate control unit 51c may be provided on each of the antennas 22a, and the flow rate of the reaction gas injected from the inner injection port 50b and the outer injection port 51b may be independently controlled by each antenna 22a.

The plasma generating unit 22 supplies the reaction gas to the second region R2 via the plurality of inner injection ports 50b and the plurality of outer injection ports 51b, and emits microwaves to the second region R2 via the antenna 22a. Thereby, the plasma generating unit 22 can generate a plasma of the reaction gas in the second region R2.

On the periphery of the mounting table 14, as shown, for example, in Fig. 2, an exhaust portion 22h is provided. The exhaust portion 22h has a groove portion 222 having an upper opening and a lid portion 221 provided at an upper portion of the groove portion 222, as shown, for example, in FIG. The groove portion 222 is connected to the exhaust device 52. The cover portion 221 has a plurality of exhaust holes in, for example, the exhaust region 220h shown in FIG.

Further, below the outer injection port 51b, a partition 220 is provided on the lid portion 221. The separator 220 has a thickness substantially equal to the height of the upper surface of the lid portion 221 to the upper surface of the mounting table 14, as shown, for example, in FIG. The partition member 220 can suppress an increase in the flow velocity of the gas generated by the step of the mounting table 14 and the lid portion 221 below the outer injection port 51b.

In each of the exhaust regions 220h, the exhaust portion 22h exhausts the gas in the processing chamber C by the plurality of exhaust holes provided in the lid portion 221 through the groove portion 222 by the operation of the exhaust device 52. Further, the position, size, and number of the exhaust holes provided in each of the exhaust regions 220h can be adjusted, and the amount of exhaust gas from each of the exhaust regions 220h provided in the exhaust holes of the cover portion 221 is substantially the same.

The film forming apparatus 10 has a control unit 70 for controlling each constituent element of the film forming apparatus 10 as shown, for example, in FIG. The control unit 70 may be a computer having a control device such as a CPU (Central Processing Unit), a memory device such as a memory, and an output input device. The control unit 70 controls the constituent elements of the film forming apparatus 10 by operating the CPU in accordance with a control program stored in the memory.

The control unit 70 transmits a control signal for controlling the rotational speed of the mounting table 14 to the drive device 24a. Further, the control unit 70 transmits a control signal for controlling the temperature of the substrate W to a power source connected to the heater 26. Further, the control unit 70 transmits a control signal for controlling the flow rate of the precursor gas to the valves 161v to 163v and the flow rate controllers 161c to 163c. Further, the control unit 70 transmits a control signal for controlling the amount of exhaust of the exhaust unit 34 connected to the exhaust port 18a to the exhaust unit 34.

Further, the control unit 70 transmits a control signal for controlling the flow rate of the flushing gas to the valve 20v and the flow rate controller 20c. Further, the control unit 70 transmits a control signal for controlling the transmission power of the microwave to the microwave generator 68. Further, the control unit 70 transmits a control signal for controlling the flow rate of the reaction gas to the valve 50v, the valve 51v, the flow rate control unit 50c, and the flow rate control unit 51c. Further, the control unit 70 transmits a control signal for controlling the amount of exhaust gas from the exhaust unit 22h to the exhaust unit 52.

According to the film forming apparatus 10 configured as described above, the precursor gas is ejected from the first gas supply unit 16 to the substrate W that is moved by the rotation of the mounting table 14, and the exhaust portion 18 and the second gas are used. The supply unit 20 removes excessively adsorbed precursor gas from the substrate W. Then, the substrate W moved by the rotation of the mounting table 14 is exposed to the plasma of the reaction gas generated by the plasma generating portion 22. The above operation is repeated on the substrate W by the rotation of the mounting table 14, and the film forming apparatus 10 can form a film of a predetermined thickness on the substrate W. [Examples]

Hereinafter, using the film forming apparatus 10 described with reference to FIGS. 1 to 6, a SiN film having a thickness of, for example, about 20 nm is formed as a nitride film on a base film containing carbon atoms, and a platinum such as platinum is deposited on the SiN film. An experiment to form a conductor film. An example of a carbon film containing a basement membrane.

First, an experiment in which a DCN was used as a precursor gas and a mixed gas of NH ₃ gas and H ₂ gas was used as a reaction gas to form a SiN film on a base film was performed. An example of a nitride gas containing a hydrogen atom in the NH ₃ gas system. Fig. 7A is a schematic view showing an example of a cross section of a substrate W before performing a film formation process. Fig. 7B is a schematic view showing an example of a cross section of a substrate W when a film forming process is performed using a mixed gas of NH ₃ gas and H ₂ gas.

In the film formation process of the SiN film of the present experiment, as shown in FIG. 7A, a substrate W having a base film 101 containing carbon atoms having a thickness of about 60 nm formed on a base substrate 100 of ruthenium or the like is used. When a film formation process is performed using a mixed gas of NH ₃ gas and H ₂ gas as a reaction gas, as shown in FIG. 7B, an SiN film is not formed on the base film 101. Further, as shown in Fig. 7B, the thickness of the base film 101 after the film formation treatment is reduced to about 25 nm, and voids are also generated inside. This is because the hydrogen atoms contained in the plasma of the reaction gas react with the carbon atoms contained in the base film 101 to decompose the base film 101.

Next, an experiment of forming a SiN film on the base film using DCS as a precursor gas and using only NH ₃ gas as a reaction gas was performed. Fig. 8A is a schematic view showing an example of a cross section of a substrate W before performing a film formation process. Fig. 8B is a schematic view showing an example of a cross section of a substrate W when a film formation process is performed using NH ₃ gas.

In the film formation process of the SiN film of the present experiment, as shown in FIG. 8A, the substrate W on which the base film 101 having a thickness of about 62.4 nm was formed on the base substrate 100 was used. In addition, the precursor gas uses DCS. When the film formation process is performed using only NH ₃ gas as the reaction gas, as shown in FIG. 8B, the SiN film 102 having a thickness of about 17.8 nm can be formed on the base film 101. Since the SiN film 102 is formed, the conductor film 103 is formed on the SiN film 102.

However, as shown in FIG. 8B, the thickness of the base film 101 after the film formation treatment is greatly reduced from about 62.4 nm to about 23.6 nm, and voids are also generated inside the base film 101. Further, a void is also found between the base film 101 and the base substrate 100. Therefore, the adhesion between the base film 101 and the base substrate 100 is lowered, and the base film 101 is easily peeled off from the base substrate 100.

This is because the NH ₃ gas also contains hydrogen atoms, so that the hydrogen atoms contained in the plasma of the NH ₃ gas react with the carbon atoms contained in the base film 101 to decompose the base film 101. Therefore, when only the NH ₃ gas is used as the reaction gas, the SiN film 102 can be formed on the base film 101 containing carbon atoms, but the film thickness of the base film 101 or voids are reduced, and the base film 101 is severely damaged.

Next, an experiment was conducted in which a SiN film was formed on a base film by using DCS as a precursor gas and using a mixed gas of N ₂ gas and an inert gas as a reaction gas. An example of a nitride gas containing no hydrogen atoms in the N ₂ gas system. In this experiment, Ar gas was used as an inert gas. In addition, the precursor gas uses DCS. FIG. 9 is a schematic view showing an example of a cross section of a substrate W when a film formation process is performed using a mixed gas of N ₂ gas and Ar gas.

In the film formation process of the SiN film of the present experiment, a substrate W on which the base film 101 of about 62.4 nm was formed was used in the same manner as the substrate W shown in FIG. 8A. When a film formation process is performed using a mixed gas of N ₂ gas and Ar gas, as shown in FIG. 9, an SiN film 102 having a thickness of about 20.1 nm can be formed on the base film 101. Since the SiN film 102 is formed, the conductor film 103 is formed on the SiN film 102.

In the present experiment, as shown in FIG. 9, although the thickness of the base film 101 after the film formation treatment was reduced from about 62.4 nm to about 55.4 nm, it was formed in comparison with a mixed gas using NH ₃ gas and H ₂ gas. In the film treatment, or in the base film 101 in which the film formation treatment is performed using only NH ₃ gas, the amount of film thickness reduction is much smaller. Further, in the present experiment, no void was found inside the base film 101. Further, no void is found between the base film 101 and the base substrate 100, and it is conceivable to maintain the adhesion between the base film 101 and the base substrate 100.

It is understood that the SiN film 102 can be formed on the base film 101 by using a mixed gas of N ₂ gas and Ar gas as a reaction gas, and at the same time, it is possible to suppress the film thickness of the base film 101 or to generate voids and the like to the base film 101. damage. Then, an experiment of changing the flow ratio of the N ₂ gas and the Ar gas is performed, and the range of conditions for suppressing the reduction of the film thickness of the underlying film 101 or the occurrence of voids or the like is examined.

10A to 10D are schematic views showing an example of a cross section of a substrate W when a flow ratio of N ₂ gas and Ar gas is changed to perform a film formation process. Further, in the experiment shown in FIGS. 10A to 10D, similarly to the substrate W shown in FIG. 8A, the substrate W on which the base film 101 of about 62.4 nm was formed was used. In addition, DCS was used as the precursor gas. Further, in the experiments shown in Figs. 10A to 10D, the temperature of the substrate W in the plasma processing was 300 ° C, and the microwave power supplied from each antenna 22a was used using the antennas 22a-2 and 22a-3 for supplying microwaves. It is 4.0 kW, and the rotation speed of the mounting table 14 is 20 rpm.

Fig. 10A is a schematic view showing an example of a cross section of a substrate when a film formation process is performed using a reaction gas having a flow ratio of N ₂ gas / Ar gas = 20 / 5000 sccm. The experimental result shown in Fig. 10A is that a SiN film 102 having a thickness of about 18.6 nm can be formed on the base film 101. Further, in the experimental results shown in Fig. 10A, although the thickness of the base film 101 after the film formation treatment was reduced from about 62.4 nm to about 52.3 nm, the amount of reduction in film thickness was small. Further, in the present experiment, no void was observed inside the base film 101, and no void was observed between the base film 101 and the base substrate 100.

Fig. 10B is a schematic view showing an example of a cross section of a substrate when a film formation process is performed using a reaction gas having a flow ratio of N ₂ gas / Ar gas = 20 / 3000 sccm. The experimental result shown in Fig. 10B is that a SiN film 102 having a thickness of about 17.4 nm can be formed on the base film 101. Further, in the experimental results shown in Fig. 10B, although the thickness of the base film 101 after the film formation treatment was reduced from about 62.4 nm to about 54.3 nm, the amount of reduction in film thickness was small. Further, in the present experiment, no void was observed inside the base film 101, and no void was observed between the base film 101 and the base substrate 100.

Fig. 10C is a schematic view showing an example of a cross section of a substrate when a film formation process is performed using a reaction gas having a flow ratio of N ₂ gas / Ar gas = 20 / 1000 sccm. The experimental result shown in Fig. 10C is that a SiN film 102 having a thickness of about 20.1 nm can be formed on the base film 101. Further, in the experimental results shown in Fig. 10C, although the thickness of the base film 101 after the film formation treatment was reduced from about 62.4 nm to about 55.4 nm, the amount of reduction in film thickness was small. Further, in the present experiment, no void was observed inside the base film 101, and no void was observed between the base film 101 and the base substrate 100.

Fig. 10D is a schematic view showing an example of a cross section of a substrate when a film formation process is performed using a reaction gas having a flow ratio of N ₂ gas / Ar gas = 1000 / 0 sccm. Further, in the experiment shown in Fig. 10D, the reaction gas contained no Ar gas. The experimental result shown in Fig. 10D is such that an SiN film 102 having a thickness of about 22.5 nm can be formed on the base film 101. However, in the experimental results shown in Fig. 10D, the thickness of the base film 101 was reduced from about 62.4 nm to about 46.5 nm, and the reduction in film thickness was large. Further, as shown in FIG. 10D, a void is generated inside the base film 101, and a part of the base film 101 is peeled off from the base substrate 100.

Fig. 11 is a table summarizing the experimental results shown in Figs. 10A to 10D. As shown in FIG. 11, when the reaction gas is subjected to film formation treatment using only N ₂ gas, the amount of reduction in the film thickness of the base film 101 is large. Further, in this case, as shown in FIG. 10D, breakage of voids or the like is generated in the base film 101. On the other hand, when a mixed gas of N ₂ gas and Ar gas is used as the reaction gas, the amount of decrease in the thickness of the base film 101 is much smaller than when the reaction gas is formed by using only N ₂ gas. Further, in this case, as shown in FIGS. 10A to 10C, no breakage of voids or the like was observed in the base film 101.

This is because the density of the plasma is increased by the addition of an inert gas such as Ar gas to the reaction gas, and the film formation speed of the SiN film 102 is increased, and the film formation of the SiN film 102 is made before the destruction of the base film 101 becomes large. termination. Therefore, in order to reduce the amount of film thickness reduction of the base film 101 and to suppress the occurrence of voids or the like in the base film 101, a mixed gas of N ₂ gas and Ar gas is preferably used as the reaction gas. Further, from the experimental results shown in Figs. 10A to 10D, in order to reduce the film thickness reduction amount of the base film 101 and suppress the occurrence of voids or the like in the base film 101, the flow rate of the N ₂ gas and the flow rate of the Ar gas The ratio is preferably N ₂ gas/Ar gas 20/1000 sccm = 1/50 or less.

Furthermore, in an ideal ALD, the film formation rate is related to the substrate rotation speed regardless of the plasma density. However, in actuality, when the flow rate of the Ar gas is small, the probability of existence of the nitrogen radical is lowered, and when the position where the nitriding is performed is 100, only about 60 is nitrided. As a result, when the flow rate of the Ar gas is small, the film formation speed becomes slow. If the film formation speed is increased, the probability of forming a C-N bond between the base film and the nitrogen radical is also reduced, and the destruction of the base film can be reduced.

Next, an experiment of changing the number of antennas 22a for supplying microwaves and the microwave power supplied from the antenna 22a is performed, and a range in which the conditions for reducing the film thickness of the base film 101 or the occurrence of voids or the like is suppressed can be examined. 12A to 12E are schematic views showing an example of a cross section of the substrate W when the number and power of the antennas 22a are changed to perform a film formation process. Further, in the experiment shown in FIGS. 12A to 12D, a substrate W on which the base film 101 of about 62.4 nm was formed was used in the same manner as the substrate W shown in FIG. 8A. In addition, DCS was used as the precursor gas. Further, in the experiments shown in FIGS. 12A to 12D, the temperature of the substrate W in the plasma treatment was 300 ° C, and the antennas 22a-2 and 22a-3 for supplying microwaves were used, and the flow rate of the N ₂ gas and Ar were used. The ratio of the flow rate of the gas was N ₂ gas / Ar gas = 20 / 1000 sccm, and the rotation speed of the mounting table 14 was 20 rpm.

FIG. 12A is a schematic diagram showing an example of a cross section of a substrate W when a single film 22a (antenna 22a-3) is used and a microwave power supplied from an antenna is 0.5 kW to perform a film formation process. Further, in the experiment shown in Fig. 12A, the antennas 22a-1 and 22a-2 were not used. The experimental result shown in Fig. 12 is that a SiN film 102 having a thickness of about 16.6 nm can be formed on the base film 101.

However, the experimental results shown in Fig. 12A generate voids inside the base film 101 after the film formation treatment, and under the influence thereof, the thickness of the base film 101 is expanded from about 62.4 nm to about 67.0 nm. Further, a void is also found between the base film 101 and the base substrate 100, and the adhesion between the base film 101 and the base substrate 100 can be considered to be lowered.

FIG. 12B is a cross-sectional view showing an example of a cross section of the substrate W when the film formation process is performed using the two antennas 22a (the antennas 22a-2 and 22a-3) and the microwave power supplied from each antenna 22a is 1.0 kW. In this experiment, the sum of the microwave powers supplied from the antenna 22a was 2.0 kW. Further, in the experiment shown in Fig. 12B, the antenna 22a-1 was not used.

The experimental result shown in Fig. 12B is that a SiN film 102 having a thickness of about 17.4 nm can be formed on the base film 101. Further, in the experimental results shown in Fig. 12B, although the thickness of the base film 101 after the film formation treatment was reduced from about 62.4 nm to about 55.0 nm, the amount of reduction in film thickness was small. Further, in the present experiment, no void was observed inside the base film 101, and no void was observed between the base film 101 and the base substrate 100.

12C is a cross-sectional view showing an example of a cross section of the substrate W when a single film 22a (antenna 22a-3) is used and a microwave power supplied from the antenna is 2.0 kW to perform a film formation process. Further, in the experiment shown in Fig. 12C, the antennas 22a-1 and 22a-2 were not used.

The experimental result shown in Fig. 12C is that a SiN film 102 having a thickness of about 13.4 nm can be formed on the base film 101. Further, in the experimental results shown in Fig. 12C, although the thickness of the base film 101 after the film formation treatment was reduced from about 62.4 nm to about 52.5 nm, the amount of reduction in film thickness was small. Further, in the present experiment, no void was observed inside the base film 101, and no void was observed between the base film 101 and the base substrate 100.

FIG. 12D is a cross-sectional view showing an example of a cross section of the substrate W when the film formation process is performed using the two antennas 22a (the antennas 22a-2 and 22a-3) and the microwave power supplied from each antenna 22a is 2.0 kW. In this experiment, the sum of the microwave powers supplied from the antenna 22a was 4.0 kW. Further, in the experiment shown in Fig. 12D, the antenna 22a-1 was not used.

The experimental result shown in Fig. 12D is such that a SiN film 102 having a thickness of about 18.2 nm can be formed on the base film 101. Further, in the experimental results shown in Fig. 12D, although the thickness of the base film 101 after the film formation treatment was reduced from about 62.4 nm to about 60.1 nm, the amount of reduction in film thickness was small. Further, in the present experiment, no void was observed inside the base film 101, and no void was observed between the base film 101 and the base substrate 100.

FIG. 12E is a cross-sectional view showing an example of a cross section of the substrate W when the film formation process is performed using the two antennas 22a (the antennas 22a-2 and 22a-3) and the microwave power supplied from each antenna 22a is 4.0 kW. In this experiment, the sum of the microwave powers supplied from the antenna 22a was 8.0 kW. Further, in the experiment shown in Fig. 12E, the antenna 22a-1 was not used.

The experimental result shown in Fig. 12E is that a SiN film 102 having a thickness of about 20.1 nm can be formed on the base film 101. Further, the experimental results shown in Fig. 12E are such that although the thickness of the base film 101 after the film formation treatment is reduced from about 62.4 nm to about 55.4 nm, the reduction in film thickness is small. Further, in the present experiment, no void was observed inside the base film 101, and no void was observed between the base film 101 and the base substrate 100.

Fig. 13 is a table summarizing the experimental results shown in Figs. 12A to 12E. As shown in FIG. 13, when the sum of the microwave powers supplied from the antenna 22a is 0.5 kW, the base film 101 is deteriorated, and breakage or the like is generated in the base film 101. On the other hand, when the sum of the microwave powers supplied from the antenna 22a is 2.0 kW or more, the base film 101 is not deteriorated or the voids or the like are not damaged.

If the microwave power supplied is low, the N ₂ gas molecules are not sufficiently dissociated in the plasma, and the number of ions or radicals of the nitrogen atoms contained in the plasma is small. Therefore, the film formation speed is slow, and the substrate W including the base film 101 is exposed to a high temperature environment for a long period of time until the SiN film 102 having a predetermined thickness is formed. Therefore, the base film 101 is deteriorated by the influence of heat.

On the other hand, when the sum of the microwave powers supplied from the antenna 22a is, for example, 2.0 kW or more, the N ₂ gas molecules dissociated in the plasma increase, and the number of ions or radicals of the nitrogen atoms contained in the plasma increases. Therefore, the film formation speed is fast, and the time until the SiN film 102 of a predetermined thickness is formed is short. Therefore, the substrate W including the base film 101 is exposed to a high temperature environment for a short period of time, and the base film 101 is less affected by heat, and the deterioration of the base film 101 can be suppressed.

Therefore, in order to suppress the deterioration of the base film 101 and form the SiN film 102 of a predetermined thickness on the base film 101, the sum of the microwave powers supplied from the antenna 22a is preferably, for example, 2.0 kW or more.

Next, an experiment was conducted in which a SiN film (first nitride film) having a predetermined thickness was formed on the base film 101 by a plasma of a mixed gas of N ₂ gas and Ar gas, and this was used as a protective film. An SiN film (second nitride film) is formed by a plasma of a mixed gas of NH ₃ gas and H ₂ gas. Fig. 14 is a flow chart showing an example of a film forming process for forming a SiN film after forming a protective film.

First, the substrate W on which the base film 101 is formed on the base substrate 100 is carried into the processing container 12 of the film forming apparatus 10 (S100). Then, a protective film forming step (S101) is carried out. In the protective film forming step, the DCS as the precursor gas is ejected onto the substrate W that is moved by the rotation of the loading table 14 by the first gas supply unit 16. Then, the precursor gas that is excessively adsorbed on the surface of the substrate W is removed from the substrate W by the action of the exhaust portion 18 and the second gas supply portion 20. Then, the substrate W that has been moved by the rotation of the stage 14 is exposed to a plasma in which a mixed gas of N ₂ gas and Ar gas as a reaction gas is supplied from the reaction gas supply unit 22c. Thereby, a protective film is formed on the base film 101.

Further, in the protective film forming step, the ratio of the flow rate of the N ₂ gas to the flow rate of the Ar gas is N ₂ gas / Ar gas = 20 / 1000 sccm, and two antennas 22a (antennas 22a-2 and 22a-3) are used, and The microwave power supplied from each antenna 22a was 2.0 kW. Further, the temperature of the substrate W in the plasma treatment was 300 ° C, and the rotation speed of the mounting table 14 was 20 rpm.

Then, until a protective film having a predetermined thickness is formed on the base film 101 (S102: No), the protective film forming step shown in the step S101 is repeated a predetermined time. In the present experiment, the protective film forming step shown in step S101 was repeated until a protective film having a thickness of, for example, about 3 nm was formed. After the predetermined protective film forming step is repeated (S102: Yes), a nitride film forming step (S103) is performed.

In the nitride film forming step, the DCS as the precursor gas is ejected onto the substrate W that is moved by the rotation of the mounting table 14 by the first gas supply unit 16. Then, the precursor gas that is excessively adsorbed on the surface of the substrate W is removed from the substrate W by the action of the exhaust portion 18 and the second gas supply portion 20. Then, the substrate W that has been moved by the rotation of the stage 14 is exposed to a plasma in which a mixed gas of NH ₃ gas and H ₂ gas as a reaction gas is supplied from the reaction gas supply unit 22c. Thereby, a SiN film is formed on the protective film.

Further, in the nitride film forming step, the ratio of the flow rate of the NH ₃ gas to the flow rate of the H ₂ gas is NH ₃ gas / H ₂ gas = 750 / 4000 sccm, and two antennas 22a are used (antennas 22a-2 and 22a-3) The microwave power supplied from each antenna 22a is 4.0 kW. Further, the temperature of the substrate W in the plasma treatment was 300 ° C, and the rotation speed of the mounting table 14 was 20 rpm.

Then, until a SiN film having a predetermined thickness is formed on the protective film (S104: No), the predetermined step of forming a nitride film shown in step S103 is repeated. In the present experiment, the step of forming a nitride film shown in step S103 was repeated until a SiN film having a thickness of, for example, about 17 nm was formed. After the predetermined step of forming the nitride film is repeated (S104: Yes), the substrate W is carried out by the processing container 12 (S105), and the film forming process shown in this flowchart is completed.

Fig. 15 is a schematic view showing an example of a cross section of a substrate formed by film formation processing shown in Fig. 14. In the substrate W shown in FIG. 15, an SiN film 102 having a film thickness of about 22.5 nm is formed on the base film 101. The SiN film 102 shown in FIG. 15 includes a protective film formed of a plasma of a mixed gas of N ₂ gas and Ar gas, and an SiN film formed of a plasma of a mixed gas of NH ₃ gas and H ₂ gas.

In this experiment, a substrate W formed with a base film 101 having a film thickness of about 60 nm was used. As shown in Fig. 15, the thickness of the base film 101 after the film formation treatment was about 59.3 nm, and there was almost no change with respect to the base film 101 before film formation. Further, in the present experiment, no void was observed inside the base film 101, and no void was observed between the base film 101 and the base substrate 100. In addition, deterioration of the base film 101 was not observed.

Then, the experiment was repeated, and it was found that the thickness of the protective film formed of the plasma of the mixed gas of the N ₂ gas and the Ar gas was as small as 0.5 to 1.0 nm, and the function as the protective film of the base film 101 was suppressed, and the base film 101 was suppressed. Create a gap. The purpose of this experiment is to form a SiN film on a base film 101 containing carbon by a plasma of a mixed gas of NH ₃ gas and H ₂ gas. A protective film formed of a plasma of a mixed gas of N ₂ gas and Ar gas has a film having a property different from that of a SiN film formed of a plasma of a mixed gas of NH ₃ gas and H ₂ gas. Therefore, the protective film is preferably extremely thin. Therefore, the thickness of the protective film is preferably from 0.5 to 1.0 nm.

One embodiment has been described above. According to the film forming apparatus 10 of the present embodiment, it is possible to suppress a decrease in the thickness of the underlying film containing carbon atoms, and to form a nitride film having a predetermined thickness on the underlying film.

Further, the present invention is not limited to the above embodiments, and many modifications are possible within the scope of the gist of the invention.

For example, in the above embodiment, the SiN film formed on the protective film is formed of a plasma of a mixed gas of NH ₃ gas and H ₂ gas, but the disclosed technology is not limited thereto. For example, the SiN film formed on the protective film may be formed by a plasma of a mixed gas of N ₂ gas and H ₂ gas. If a SiN film is formed on a base film by a plasma of a mixed gas of N ₂ gas and H ₂ gas without a protective film, the thickness of the base film containing carbon atoms is greatly reduced, but it is formed on the base film. On the upper protective film, a SiN film is formed by a plasma of a mixed gas of N ₂ gas and H ₂ gas, whereby a decrease in film thickness of the base film can be suppressed, and a nitride film having a predetermined thickness can be formed on the base film.

Further, in the above-described embodiment, the half-batch film forming apparatus 10 using microwaves has been exemplified, but the film forming apparatus 10 is not limited thereto. For example, the film forming apparatus 10 may be a film forming apparatus using an ALD method using microwaves, and may be a monolithic or batch film forming apparatus, or may be a high frequency CVD (Chemical Vapor Deposition) method. Film forming device.

It is to be understood that the various embodiments of the present invention are described in the foregoing, Therefore, the various embodiments disclosed herein are not intended to limit the scope and spirit of the nature of the invention.

10‧‧‧ film forming device
12‧‧‧Processing container
12a‧‧‧lower components
12b‧‧‧ upper member
12q‧‧‧ exhaust road
12r‧‧‧ gas supply road
14‧‧‧ mounting table
14a‧‧‧Substrate placement area
16‧‧‧1st gas supply department
16a‧‧‧Injection Department
16g‧‧‧ gas supply source
16h‧‧‧jet
18‧‧‧Exhaust Department
18a‧‧‧Exhaust port
18d‧‧‧ space
18g‧‧‧ gap
18q‧‧‧Exhaust road
20‧‧‧2nd gas supply department
20a‧‧‧jet
20c‧‧‧Flow Controller
20d‧‧‧ space
20g‧‧‧ gas supply source
20p‧‧‧ gap
20r‧‧‧ gas supply road
20v‧‧‧ valve
22‧‧‧ Plasma Production Department
22a‧‧‧Antenna
22a-1‧‧‧Antenna
22a-2‧‧‧Antenna
22a-3‧‧‧Antenna
22b‧‧‧ coaxial waveguide
22c‧‧‧Reactive Gas Supply Department
22h‧‧‧Exhaust Department
24‧‧‧ drive mechanism
24a‧‧‧ drive
24b‧‧‧Rotary axis
26‧‧‧heater
34‧‧‧Exhaust device
40‧‧‧ top board
42‧‧‧ slotted board
44‧‧‧ Slow wave board
46‧‧‧Cooling plate
50b‧‧‧Inside injection port
50c‧‧‧Flow Control Department
50g‧‧‧ gas supply source
50v‧‧‧ valve
51b‧‧‧Outer jet
51c‧‧‧Flow Control Department
51v‧‧‧ valve
52‧‧‧Exhaust device
60‧‧‧waveguide
62a‧‧‧Inside conductor
62b‧‧‧Outer conductor
68‧‧‧Microwave generator
70‧‧‧Control Department
100‧‧‧Base substrate
101‧‧‧ basement membrane
102‧‧‧SiN film
103‧‧‧Conductor film
121p‧‧‧ gas supply road
122p‧‧‧ gas supply road
123p‧‧‧ gas supply road
161‧‧‧Internal Gas Supply Department
161a‧‧‧Inside Jetting Department
161b‧‧‧Flexible components
161c‧‧‧Flow Controller
161d‧‧‧ buffer space
161p‧‧‧ gas supply road
161v‧‧‧ valve
162‧‧‧Intermediate Gas Supply Department
162a‧‧‧Intermediate Jet Department
162b‧‧‧Flexible components
162c‧‧‧Flow Controller
162d‧‧‧ buffer space
162p‧‧‧ gas supply road
162v‧‧‧ valve
163‧‧‧Outside Gas Supply Department
163a‧‧‧Outer Jet Department
163b‧‧‧Flexible components
163c‧‧‧Flow Controller
163d‧‧‧ buffer space
163p‧‧‧ gas supply road
163v‧‧‧ valve
220‧‧‧Parts
220h‧‧‧Exhaust area
221‧‧‧ 盖部
222‧‧‧Ditch
A1‧‧‧inside annular zone
A2‧‧‧ intermediate ring zone
A3‧‧‧Outer annular area
AP‧‧‧ openings
C‧‧‧Processing room
G‧‧‧ gate valve
L‧‧‧ length
DL‧‧‧Predetermined distance
M1‧‧‧1st component
M2‧‧‧ second component
M3‧‧‧3rd component
M4‧‧‧4th building
R1‧‧‧1st area
R2‧‧‧2nd area
R1‧‧‧ distance
R2‧‧‧ distance
R3‧‧‧ distance
R4‧‧‧ distance
S100‧‧‧ steps
S101‧‧‧Steps
S102‧‧‧Steps
S103‧‧‧Steps
S104‧‧‧Steps
S105‧‧‧Steps
Unit U‧‧‧
W‧‧‧Substrate
W1‧‧‧ diameter
X‧‧‧ axis

Fig. 1 is a cross-sectional view showing an example of a film forming apparatus.

Fig. 2 is a schematic view showing an example of a film forming apparatus when viewed from above.

Fig. 3 is an enlarged cross-sectional view showing an example of a left portion of the axis X in Fig. 1.

Fig. 4 is an enlarged cross-sectional view showing an example of a left portion of the axis X in Fig. 1.

Fig. 5 is a view showing an example of the lower portion of the unit U.

Fig. 6 is an enlarged cross-sectional view showing an example of a right portion of the axis X in Fig. 1.

Fig. 7A is a schematic view showing an example of a cross section of a substrate before performing a film formation process.

Fig. 7B is a schematic view showing an example of a cross section of a substrate when a film forming process is performed using a mixed gas of NH ₃ gas and H ₂ gas.

Fig. 8A is a schematic view showing an example of a cross section of a substrate before performing a film formation process.

Fig. 8B is a schematic view showing an example of a cross section of a substrate when a film formation process is performed using NH ₃ gas.

FIG. 9 is a schematic view showing an example of a cross section of a substrate when a film formation process is performed using a mixed gas of N ₂ gas and Ar gas.

Fig. 10A is a schematic view showing an example of a cross section of a substrate when a film formation process is performed using a reaction gas having a flow ratio of N ₂ gas / Ar gas = 20 / 5000 sccm.

Fig. 10B is a schematic view showing an example of a cross section of a substrate when a film formation process is performed using a reaction gas having a flow ratio of N ₂ gas / Ar gas = 20 / 3000 sccm.

Fig. 10C is a schematic view showing an example of a cross section of a substrate when a film formation process is performed using a reaction gas having a flow ratio of N ₂ gas / Ar gas = 20 / 1000 sccm.

Fig. 10D is a schematic view showing an example of a cross section of a substrate when a film formation process is performed using a reaction gas having a flow ratio of N ₂ gas / Ar gas = 1000 / 0 sccm.

Fig. 11 is a table summarizing the experimental results shown in Figs. 10A to 10D.

Fig. 12A is a schematic view showing an example of a cross section of a substrate when a film forming process is performed using a single antenna and a microwave power supplied from an antenna of 0.5 kW.

12B is a cross-sectional view showing an example of a substrate when a film forming process is performed using two antennas and a microwave power supplied from each antenna is 1.0 kW.

Fig. 12C is a schematic view showing an example of a substrate cross-section when a film forming process is performed using a single antenna and a microwave power supplied from an antenna of 2.0 kW.

12D is a schematic view showing an example of a substrate cross-section when a film formation process is performed using two antennas and microwave power supplied from each antenna is 2.0 kW.

Fig. 12E is a schematic view showing an example of a substrate cross-section when a film formation process is performed using two antennas and microwave power supplied from each antenna is 4.0 kW.

Fig. 13 is a table summarizing the experimental results shown in Figs. 12A to 12E.

Fig. 14 is a flow chart showing an example of a film forming process for forming a SiN film after forming a protective film.

Fig. 15 is a schematic view showing an example of a cross section of a substrate when a SiN film is formed by forming a protective film of a mixed gas of N ₂ gas and Ar gas.

S100~S105‧‧‧Steps

Claims (7)

A film forming method for forming a nitride film on a substrate to be processed which is placed in a processing container of a film forming apparatus and having a carbon-containing film containing carbon atoms, the film forming method including a first nitride film forming step, and In the first nitride film forming step, a first nitride film is formed on the carbon-containing film by a plasma containing a first reaction gas containing a nitride gas of no hydrogen atom and an inert gas, wherein the first reaction A gas mixture of N ₂ gas and Ar gas, and wherein the ratio of the flow rate of the N ₂ gas to the flow rate of the Ar gas is 1/50 or less. The film forming method according to claim 1, wherein in the first nitride film forming step, the first nitride film is formed by an atomic layer deposition (ALD) method. The film forming method of claim 1, wherein the first nitride film forming step generates a plasma of the first reaction gas by microwaves supplied from the antenna into the processing container, and supplies the plasma to the first reaction gas. The sum of the power of the microwaves in the processing vessel is 2 kW or more. The film forming method of claim 1, further comprising a second nitride film forming step, wherein the second nitride film forming step is performed after the first nitride film forming step A plasma of the second reaction gas of a gas having a different reaction gas forms a second nitride film on the first nitride film. The film forming method of claim 4, wherein the second reaction gas contains a gas containing a nitride of a hydrogen atom. The film forming method of claim 4, wherein the substrate to be processed is placed and rotated about a single axis to rotate the substrate on which the substrate to be processed moves around the axis The processing container is divided into a plurality of regions in a circumferential direction in which the substrate to be processed is moved with respect to the axis; the first nitride film forming step includes the step of supplying a precursor gas to one of the plurality of regions, such that The molecules of the precursor gas are adsorbed on the surface of the substrate to be processed; the first reaction gas is supplied to another region of the plurality of regions; and the first reactant gas is generated by microwaves supplied to the other region a plasma, and a plasma treatment of the surface of the substrate to which the precursor gas molecules are adsorbed by the generated plasma, the second nitride film forming step comprising the steps of: The precursor gas is supplied into the processing container to adsorb molecules of the precursor gas on the surface of the substrate to be processed; the second reaction gas is supplied to the other region; and by supplying to the other The microwave plasma generating region of the second reaction gas, and by generating plasma, the surface adsorbed molecules of the precursor gas to be treated in the plasma processing of the substrate. The film forming method of claim 4, wherein the first nitride film is formed on the carbon-containing film with a thickness of 0.5 nm to 1.0 nm.