TWI597182B - Liquid ejection device, nanoimprinting apparatus, nanoimprinting liquid storage tank, method of manufacturing cured product pattern, method of manufacturing optical component, method of manufacturing circuit board, and method of manufacturing imprinting - Google Patents

Liquid ejection device, nanoimprinting apparatus, nanoimprinting liquid storage tank, method of manufacturing cured product pattern, method of manufacturing optical component, method of manufacturing circuit board, and method of manufacturing imprinting Download PDF

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TWI597182B
TWI597182B TW104134899A TW104134899A TWI597182B TW I597182 B TWI597182 B TW I597182B TW 104134899 A TW104134899 A TW 104134899A TW 104134899 A TW104134899 A TW 104134899A TW I597182 B TWI597182 B TW I597182B
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liquid
nanoimprinting
component
sorption medium
substrate
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TW201615434A (en
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伊藤俊樹
荒木義雅
坂本和美
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佳能股份有限公司
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05CAPPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C5/00Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05CAPPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C11/00Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
    • B05C11/10Storage, supply or control of liquid or other fluent material; Recovery of excess liquid or other fluent material

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Description

液體排出裝置、奈米壓印設備、奈米壓印液體儲存桶、製造硬化產品圖案的方法、製造光學組件的方法、製造電路板的方法、和製造壓印模具的方法 Liquid discharge device, nanoimprinting device, nanoimprinting liquid storage bucket, method of manufacturing hardened product pattern, method of manufacturing optical component, method of manufacturing circuit board, and method of manufacturing imprinting mold

本發明有關排出奈米壓印液體的液體排出裝置、奈米壓印設備、奈米壓印液體儲存桶、使用該液體排出裝置製造硬化產品圖案之方法、製造光學組件的方法、製造電路板之方法、及製造壓印模具的方法。 The invention relates to a liquid discharge device for discharging a nanoimprint liquid, a nanoimprinting device, a nanoimprint liquid storage bucket, a method for manufacturing a hardened product pattern using the liquid discharge device, a method for manufacturing an optical component, and a circuit board for manufacturing the same Method, and method of making an imprint mold.

於半導體裝置、微機電系統(MEMSs)與類似者等中,用於微加工之需求已正在增加。尤其是,光奈米壓印技術已正引起注意。 In semiconductor devices, microelectromechanical systems (MEMSs) and the like, the demand for micromachining has been increasing. In particular, photon imprinting technology is attracting attention.

於該光奈米壓印技術中,可光可硬化成份(抗蝕劑)係於具有一設有細微不規則圖案之表面的模具被壓抵靠著塗以該光可硬化成份之基板(晶圓)的狀態中硬化。這將 該模具之不規則圖案轉印至該光可硬化成份的硬化產品,藉此在該基板上形成該不規則圖案。該光奈米壓印技術係能夠形成在數奈米之等級的細微結構(硬化產品圖案)。 In the photon imprinting technique, a photohardenable component (resist) is attached to a substrate having a surface having a fine irregular pattern and pressed against a substrate coated with the photohardenable component (crystal Hardened in the state of the circle). this will The irregular pattern of the mold is transferred to the hardened product of the photohardenable component, whereby the irregular pattern is formed on the substrate. The photon nanoimprint technique is capable of forming a fine structure (hardened product pattern) on the order of several nanometers.

於該光奈米壓印技術中,光可硬化成份被施加至該基板之圖案形成區域中(放置步驟)。其次,該光可硬化成份係使用具有圖案的模具來模製(模具接觸步驟)。該光可硬化成份係藉由以光照射該光可硬化成份被硬化(光照射步驟),且接著被脫模(脫模步驟)。施行這些步驟允許具有預定形狀之樹脂圖案(光硬化薄膜)將被形成在該基板上(看PTL 1)。 In the photon imprint technique, a photohardenable component is applied to a pattern forming region of the substrate (placement step). Next, the photohardenable component is molded using a patterned mold (mold contact step). The photohardenable component is hardened by irradiating the photohardenable component with light (light irradiation step), and then being demolded (release step). Performing these steps allows a resin pattern (photohardenable film) having a predetermined shape to be formed on the substrate (see PTL 1).

於該光奈米壓印技術的放置步驟中,包含液體排出頭(其後僅只被稱為“頭部”)之液體排出裝置能被用作施加該光可硬化成份至該基板用的裝置。PTL2敘述用於排出諸如墨水之普通液體的液體排出裝置,亦即,液體排出裝置包含全封閉的外殼、被放置於該外殼中之儲存桶、及與該儲存桶相通的頭部。待排出之液體(墨水)被儲存於該儲存桶中的儲存空間中。該儲存桶中所儲存之液體(墨水)被供給至該頭部,且接著被由該頭部排出。 In the placing step of the photon nanoimprint technique, a liquid discharge device including a liquid discharge head (hereinafter simply referred to as a "head") can be used as a means for applying the photohardenable component to the substrate. PTL 2 describes a liquid discharge device for discharging a common liquid such as ink, that is, the liquid discharge device includes a fully enclosed outer casing, a storage tub placed in the outer casing, and a head communicating with the storage tub. The liquid (ink) to be discharged is stored in a storage space in the storage tub. The liquid (ink) stored in the tub is supplied to the head and then discharged from the head.

於該光奈米壓印技術中,模製係藉由將模具壓抵靠著奈米壓印液體、諸如於該配置步驟中所施加之光可硬化成份來施行。因此,當譬如具有數奈米至數微米的直徑之膠化或固體外來微粒(其後被稱為“微粒”)係存在於該配置步驟中所施加的奈米壓印液體中時,該模具被損壞或所形成之圖案具有缺陷。因此,該奈米壓印液體的微粒之濃 度較佳地係低的。 In the photon imprint technique, molding is performed by pressing a mold against a nanoimprinting liquid, such as a photohardenable component applied in the step of disposing. Therefore, when, for example, gelled or solid foreign particles having a diameter of several nanometers to several micrometers (hereinafter referred to as "fine particles") are present in the nanoimprint liquid applied in the configuration step, the mold The damaged or formed pattern has defects. Therefore, the concentration of the nano-imprinted liquid particles The degree is preferably low.

另一選擇係,當諸如金屬離子或細微金屬微粒之金屬雜質係存在於該奈米壓印液體中時,經處理的基板係以該金屬雜質污染,且因此半導體裝置之半導體性質受影響。如此,該奈米壓印液體中的金屬雜質之濃度較佳地係低的。 Alternatively, when metal impurities such as metal ions or fine metal particles are present in the nanoimprint liquid, the treated substrate is contaminated with the metal impurities, and thus the semiconductor properties of the semiconductor device are affected. As such, the concentration of metal impurities in the nanoimprinted liquid is preferably low.

當水係存在於該奈米壓印液體中時,諸如該奈米壓印液體之硬化性質的性質可被儘可能地減少。因此,該奈米壓印液體中之水的濃度較佳地係低的。 When a water system is present in the nanoimprinting liquid, properties such as hardening properties of the nanoimprinting liquid can be reduced as much as possible. Therefore, the concentration of water in the nanoimprinted liquid is preferably low.

於PTL2中所敘述之液體排出裝置被應用至奈米壓印設備及該奈米壓印液體被儲存於儲存區段中的案例中,由於液體排出裝置之各種零組件,微粒、金屬雜質、或水的濃度可為儘可能隨著時間而增加。因此,有一問題,其中將該奈米壓印液體儲存於該儲存區段中隨著時間增加該奈米壓印液體中之微粒、金屬雜質、或水的濃度。 The liquid discharge device described in PTL 2 is applied to a nanoimprinting device and the case where the nanoimprint liquid is stored in a storage section due to various components of the liquid discharge device, particles, metal impurities, or The concentration of water can be increased as much as possible over time. Therefore, there is a problem in which the nanoimprint liquid is stored in the storage section to increase the concentration of particles, metal impurities, or water in the nanoimprint liquid over time.

在本發明中,於儲存區段中所儲存之奈米壓印液體中的微粒、金屬雜質、或水之濃度隨著時間的增加被抑制。 In the present invention, the concentration of particles, metal impurities, or water in the nanoimprint liquid stored in the storage section is suppressed with time.

〔引用清單〕 [reference list] 〔專利文獻〕 [Patent Document]

〔PTL1〕 [PTL1]

PCT日本翻釋專利公告第2005-533393號 PCT Japan Interpretation Patent Notice No. 2005-533393

〔PTL2〕 [PTL2]

日本專利特許公開申請案第2006-192785號 Japanese Patent Laid-Open Application No. 2006-192785

當作本發明之一態樣,液體排出裝置包括儲存奈米壓印液體的儲存區段,且亦包括與該儲存區段相通及排出該奈米壓印液體之排出通口。該儲存區段含有吸著媒介,其吸附或吸收選自由微粒、金屬離子、及水所組成之群組的至少一者。當該奈米壓印液體被由該排出通口排出時,該吸著媒介不被由該排出通口排出。 As one aspect of the present invention, the liquid discharge device includes a storage section for storing the nanoimprint liquid, and also includes a discharge port communicating with the storage section and discharging the nanoimprint liquid. The storage section contains a sorption medium that adsorbs or absorbs at least one selected from the group consisting of microparticles, metal ions, and water. When the nanoimprint liquid is discharged from the discharge port, the absorbing medium is not discharged from the discharge port.

本發明之進一步特色將參考所附圖面由示範實施例的以下敘述變得明顯。 Further features of the present invention will become apparent from the following description of exemplary embodiments.

1‧‧‧液體排出裝置 1‧‧‧Liquid discharge device

2‧‧‧底板 2‧‧‧floor

3‧‧‧頭部 3‧‧‧ head

4‧‧‧液體儲存單元 4‧‧‧Liquid storage unit

5‧‧‧轉印構件 5‧‧‧Transfer member

6‧‧‧基板 6‧‧‧Substrate

7‧‧‧儲存區段 7‧‧‧Storage section

8‧‧‧儲存袋 8‧‧‧storage bag

9‧‧‧光奈米壓印液體 9‧‧‧Light nanoimprinting liquid

10‧‧‧排出通口 10‧‧‧Exhaust port

11‧‧‧液體填料 11‧‧‧Liquid packing

12‧‧‧壓力調整器 12‧‧‧ Pressure Regulator

13‧‧‧溝通件 13‧‧‧Communication

14‧‧‧閥門 14‧‧‧ Valve

15‧‧‧閥門 15‧‧‧ valve

16‧‧‧接頭 16‧‧‧Connectors

17‧‧‧緩衝部 17‧‧‧ buffer

18‧‧‧壓力感測器 18‧‧‧ Pressure Sensor

19‧‧‧泵浦 19‧‧‧ pump

20‧‧‧閥門 20‧‧‧ valve

21‧‧‧儲存桶 21‧‧‧ storage bucket

22‧‧‧控制器 22‧‧‧ Controller

23‧‧‧吸著媒介 23‧‧‧Sucking media

70‧‧‧儲存桶 70‧‧‧ storage bucket

80‧‧‧儲存區段 80‧‧‧Storage section

103‧‧‧定位記號 103‧‧‧ Positioning marks

104‧‧‧模具 104‧‧‧Mold

105‧‧‧定位記號 105‧‧‧ Positioning marks

106‧‧‧塗覆薄膜 106‧‧‧ coated film

107‧‧‧照射光 107‧‧‧ illuminating light

108‧‧‧硬化產品 108‧‧‧ hardened products

109‧‧‧硬化薄膜 109‧‧‧ hardened film

110‧‧‧硬化產品圖案 110‧‧‧ hardened product pattern

111‧‧‧區域 111‧‧‧Area

112‧‧‧電路結構 112‧‧‧Circuit structure

201‧‧‧容器 201‧‧‧ container

203‧‧‧溝通件 203‧‧‧Communication

204‧‧‧泵浦 204‧‧‧ pump

205‧‧‧微粒計數器 205‧‧‧Party counter

206‧‧‧微粒過濾器 206‧‧‧Particle filter

207‧‧‧金屬雜質移除過濾器 207‧‧‧Metal impurity removal filter

600‧‧‧奈米壓印設備 600‧‧‧ nano imprinting equipment

610‧‧‧模具頭部 610‧‧‧Mold head

611‧‧‧結構式本體 611‧‧‧Structural Ontology

612‧‧‧光源 612‧‧‧Light source

613‧‧‧照明光學系統 613‧‧‧Lighting optical system

616‧‧‧基板夾頭 616‧‧‧Substrate chuck

618‧‧‧控制區段 618‧‧‧Control section

701‧‧‧儲存桶 701‧‧‧ storage bucket

801‧‧‧儲存區段 801‧‧‧Storage section

圖1係根據本發明之實施例的液體排出裝置之概要視圖。 1 is a schematic view of a liquid discharge device in accordance with an embodiment of the present invention.

圖2係一說明,顯示洗滌液體儲存單元中所密封的吸著媒介之方法。 Figure 2 is a diagram showing a method of displaying a sorbent medium sealed in a wash liquid storage unit.

圖3A係一說明,舉例說明本發明的實施例中所之使用壓力調整器。 Figure 3A is an illustration of a pressure regulator used in an embodiment of the invention.

圖3B係一說明,顯示儲存袋由圖3A所示狀態收縮的狀態。 Fig. 3B is a view showing a state in which the storage bag is contracted by the state shown in Fig. 3A.

圖4係流程圖,顯示液體填料之壓力如何被控制。 Figure 4 is a flow chart showing how the pressure of the liquid fill is controlled.

圖5A係概要剖視圖,顯示製造根據本發明的實施例之硬化產品圖案的方法。 Figure 5A is a schematic cross-sectional view showing a method of making a hardened product pattern in accordance with an embodiment of the present invention.

圖5B係概要剖視圖,顯示製造該硬化產品圖案的方法。 Fig. 5B is a schematic cross-sectional view showing a method of manufacturing the hardened product pattern.

圖5C係概要剖視圖,顯示製造該硬化產品圖案的方法。 Fig. 5C is a schematic cross-sectional view showing a method of manufacturing the hardened product pattern.

圖5D係概要剖視圖,顯示製造該硬化產品圖案的方法。 Fig. 5D is a schematic cross-sectional view showing a method of manufacturing the hardened product pattern.

圖5E係概要剖視圖,顯示製造該硬化產品圖案的方法。 Fig. 5E is a schematic cross-sectional view showing a method of manufacturing the hardened product pattern.

圖5F係概要剖視圖,顯示製造該硬化產品圖案的方法。 Fig. 5F is a schematic cross-sectional view showing a method of manufacturing the hardened product pattern.

圖5G係概要剖視圖,顯示製造該硬化產品圖案的方法。 Fig. 5G is a schematic cross-sectional view showing a method of manufacturing the hardened product pattern.

圖6係根據本發明之實施例的奈米壓印設備之概要視圖。 Figure 6 is a schematic view of a nanoimprinting apparatus in accordance with an embodiment of the present invention.

圖7A係根據本發明之實施例的奈米壓印液體儲存桶之概要視圖。 Figure 7A is a schematic view of a nanoimprinted liquid storage tank in accordance with an embodiment of the present invention.

圖7B係奈米壓印液體儲存桶的概要視圖,該奈米壓印液體儲存桶係圖7A中所示奈米壓印液體儲存桶之修改。 Figure 7B is a schematic view of a nanoimprinted liquid storage tank modified by the nanoimprinted liquid storage tank shown in Figure 7A.

本發明之實施例參考所附圖面被詳細地敘述在下面。本發明不被限制於該等實施例。可基於那些熟習此技術領域者的知識對該等實施例作成各種修改及改良,而不會由本發明的精神脫離。此等修改及改善係在本發明之範圍內。 Embodiments of the invention are described in detail below with reference to the accompanying drawings. The invention is not limited to the embodiments. Various modifications and improvements can be made to the embodiments based on the knowledge of those skilled in the art without departing from the spirit of the invention. Such modifications and improvements are within the scope of the invention.

〔奈米壓印液體中之微粒、金屬雜質、或水〕 [Microparticles, metal impurities, or water in a liquid imprinted liquid]

在藉由光奈米壓印製程製造硬化產品圖案的案例中,光奈米壓印液體9(其後被稱為“液體9”)中之微粒的存在可儘可能造成模具之損壞或諸如所形成圖案中之缺陷的故障。當該模具被壓抵靠著譬如基板上之液體9時,在該模具的表面上所形成之圖案的凹入部份被展開,且因此該模具可儘可能被損壞。另一選擇係,該等微粒係在該模具表面的凹入部份中被捉住,且因此該模具可儘可能發生故障。 In the case of producing a hardened product pattern by a photon nanoimprinting process, the presence of particles in the photon imprinting liquid 9 (hereinafter referred to as "liquid 9") may cause damage to the mold or such as A failure to form a defect in the pattern. When the mold is pressed against the liquid 9 on the substrate, for example, the concave portion of the pattern formed on the surface of the mold is unfolded, and thus the mold can be damaged as much as possible. Alternatively, the particles are caught in the recessed portion of the mold surface, and thus the mold can be broken as much as possible.

如在此中所使用,該“微粒”一詞意指細微之外來微粒。該等微粒係具有數奈米至數微米的直徑之膠化或固體粒子物質。該等微粒包括藉由局部聚合奈米壓印液體所產生的膠化或固體有機微粒、及諸如在下面之細微金屬微粒的無機微粒。 As used herein, the term "microparticle" means finely foreign particles. The microparticles are gelled or solid particulate materials having a diameter of from several nanometers to several micrometers. The microparticles include gelled or solid organic microparticles produced by topical polymerization of a nanoimprinted liquid, and inorganic microparticles such as fine metal microparticles underneath.

該液體9中之微粒的數目較佳地係儘可能小。該液體9中之具有0.1微米或更多的直徑之微粒的濃度較佳地係每毫升1或更少、或較佳地係每毫升0.1或更少。 The number of particles in the liquid 9 is preferably as small as possible. The concentration of the particles having a diameter of 0.1 μm or more in the liquid 9 is preferably 1 or less per ml, or preferably 0.1 or less per ml.

在製備該液體9期間,為了使該液體9中之微粒的數目減至最小,包括過濾之純化被充分地施行係較佳的。縱使該液體9係藉由充分地施行純化以便具有減少之微粒濃度所製備,當時間隨著儲存桶等中所儲存之液體9消逝時,該液體9中的微粒之濃度可儘可能逐漸地增加。因此,其係需要抑制該液體9中之微粒的濃度隨著時間之增 加。 During the preparation of the liquid 9, in order to minimize the number of particles in the liquid 9, it is preferred that the purification including filtration be sufficiently performed. Even if the liquid 9 is prepared by sufficiently performing purification so as to have a reduced particle concentration, the concentration of the particles in the liquid 9 can be gradually increased as much as possible as time elapses with the liquid 9 stored in the tub or the like. . Therefore, it is necessary to suppress the concentration of the particles in the liquid 9 to increase with time. plus.

在藉由該光奈米壓印製程製造半導體裝置的案例中,當該等金屬雜質係存在於該液體9中時,藉由將該液體9施加至經處理之基板,該經處理之基板被以該金屬雜質所污染。其結果是,該半導體裝置的半導體性質可儘可能地被影響。如在此中所使用之“金屬雜質”一詞意指含金屬的細微微粒或金屬離子,且尤其意指含有鈉、鈣、鐵、鉀、鋅、鋁、鎂、鎳、鉻、銅、鉛、錳、鋰、錫、鈀、鋇、鈷、或鍶之細微微粒或離子。 In the case of fabricating a semiconductor device by the photon nanoimprint process, when the metal impurities are present in the liquid 9, by applying the liquid 9 to the processed substrate, the processed substrate is Contaminated by the metal impurities. As a result, the semiconductor properties of the semiconductor device can be affected as much as possible. The term "metal impurities" as used herein means metal-containing fine particles or metal ions, and especially means sodium, calcium, iron, potassium, zinc, aluminum, magnesium, nickel, chromium, copper, lead. Fine particles or ions of manganese, lithium, tin, palladium, rhodium, cobalt, or ruthenium.

該液體9中的金屬雜質之濃度較佳地係低的。該液體9中之每一金屬雜質元素的濃度較佳地係100ppb(100ng/g)或更少及更佳地係1ppb(1ng/g)或更少。如在此中所使用,該“金屬雜質元素”一詞意指鈉、鈣、鐵、鉀、鋅、鋁、鎂、鎳、鉻、銅、鉛、錳、鋰、錫、鈀、鋇、鈷、及鍶。在上面範圍內調整該液體9中之這些元素的濃度能夠使在該半導體裝置之半導體性質上液體9的影響被減少。 The concentration of the metal impurities in the liquid 9 is preferably low. The concentration of each of the metal impurity elements in the liquid 9 is preferably 100 ppb (100 ng/g) or less and more preferably 1 ppb (1 ng/g) or less. As used herein, the term "metal impurity element" means sodium, calcium, iron, potassium, zinc, aluminum, magnesium, nickel, chromium, copper, lead, manganese, lithium, tin, palladium, iridium, cobalt. And 锶. Adjusting the concentration of these elements in the liquid 9 within the above range enables the effect of the liquid 9 to be reduced in the semiconductor properties of the semiconductor device.

如此,在製備該液體9期間,為了使該液體9中的金屬雜質之濃度減至最小,包括過濾之純化被充分地施行係較佳的。縱使該液體9係藉由充分地施行純化以便具有減少之金屬雜質濃度所製備,當時間隨著該桶等中所儲存之液體9消逝時,該液體9中的金屬雜質之濃度可儘可能逐漸地增加。因此,其係需要抑制該桶中所儲存的液體9中之金屬雜質的濃度隨著時間之增加。 Thus, during the preparation of the liquid 9, in order to minimize the concentration of the metal impurities in the liquid 9, it is preferred that the purification including filtration be sufficiently performed. Even if the liquid 9 is prepared by sufficiently performing purification so as to have a reduced metal impurity concentration, the concentration of the metal impurities in the liquid 9 can be gradually increased as time elapses with the liquid 9 stored in the barrel or the like. Increase in land. Therefore, it is necessary to suppress an increase in the concentration of the metal impurities in the liquid 9 stored in the tub over time.

再者,當水係存在於該液體9中時,性質、諸如該液體9的硬化性質可儘可能被減少。當水係存在於譬如藉由包括紫外線之光所硬化的光可硬化成份中時,該光可硬化成份對光之敏感性可為儘可能減少。 Further, when a water system is present in the liquid 9, properties such as the hardening property of the liquid 9 can be reduced as much as possible. When the water system is present in a photohardenable component such as that hardened by ultraviolet light, the sensitivity of the photohardenable component to light can be minimized.

因此,該液體9中的水之濃度較佳地係在製備該液體9期間被減至最小。當時間隨著該桶等中所儲存之液體9消逝時,用於壓力調整的周遭空氣中之濕氣或液體填料中的水、含有水可儘可能貫穿隔間。於水由外側進入該液體9之案例中,性質、諸如硬化性質可為儘可能地減少,且該液體9可為儘可能地被來自外側的金屬離子所污染。因此,其係需要抑制該液體9中之水的濃度隨著時間之增加。 Therefore, the concentration of water in the liquid 9 is preferably minimized during the preparation of the liquid 9. When the time 9 elapses with the liquid 9 stored in the tub or the like, the moisture in the ambient air for pressure adjustment or the water contained in the liquid filler, containing water, may penetrate the compartment as much as possible. In the case where water enters the liquid 9 from the outside, properties such as hardening properties may be reduced as much as possible, and the liquid 9 may be contaminated as much as possible by metal ions from the outside. Therefore, it is necessary to suppress the concentration of water in the liquid 9 from increasing with time.

〔液體儲存單元〕 [Liquid storage unit]

根據本發明的實施例之液體儲存單元4(其後被稱為該“單元4”)包括儲存該液體9的儲存袋8及被放置於該儲存袋8中之吸著媒介23。亦即,該單元4儲存該吸著媒介23及該儲存袋8中的液體9。該儲存袋8被放置於儲存該液體9之儲存區段(外殼7)中。 The liquid storage unit 4 (hereinafter referred to as the "unit 4") according to an embodiment of the present invention includes a storage bag 8 storing the liquid 9 and a sorption medium 23 placed in the storage bag 8. That is, the unit 4 stores the sorption medium 23 and the liquid 9 in the storage bag 8. The storage bag 8 is placed in a storage section (outer casing 7) in which the liquid 9 is stored.

該吸著媒介23吸附或吸收選自由該等微粒、該等金屬離子、及水所組成之群組的至少一者。如在此中所使用,該“吸著”一詞意指吸附及/或吸收。 The sorption medium 23 adsorbs or absorbs at least one selected from the group consisting of the particles, the metal ions, and water. As used herein, the term "sorption" means adsorption and/or absorption.

〔吸著媒介〕 [sucking media]

該單元4包括該吸著媒介23,該吸著媒介吸附或吸收選自由該液體9中所含有之微粒、金屬離子、及水所組成之群組的至少一者,且被放置於儲存該液體9之儲存袋8中。該吸著媒介23被建構,使得當該液體9係由頭部3的排出通口10排出時,該吸著媒介23不被由該排出通口10排出。 The unit 4 includes the sorption medium 23 that adsorbs or absorbs at least one selected from the group consisting of particles, metal ions, and water contained in the liquid 9, and is placed in the storage of the liquid. 9 in the storage bag 8. The sorption medium 23 is constructed such that when the liquid 9 is discharged from the discharge port 10 of the head 3, the absorbing medium 23 is not discharged by the discharge port 10.

該吸著媒介23及該液體9係彼此接觸,且因此該液體9中所含有之微粒、金屬離子、及/或水可被吸附在該吸著媒介23上或吸收在該吸著媒介23中,並可被留住。如此,縱使諸如該等微粒、該等金屬離子、或水的雜質被產生於該儲存袋8中或進入該儲存袋8中之液體9,該液體9中的雜質之濃度隨著時間的增加能被抑制,因為該等雜質被以該吸著媒介23留住。 The absorbing medium 23 and the liquid 9 are in contact with each other, and thus the particles, metal ions, and/or water contained in the liquid 9 can be adsorbed on the absorbing medium 23 or absorbed in the absorbing medium 23. And can be retained. Thus, even if impurities such as the particles, the metal ions, or water are generated in the storage bag 8 or into the liquid 9 in the storage bag 8, the concentration of the impurities in the liquid 9 can be increased with time. It is suppressed because the impurities are retained by the sorption medium 23.

既然該吸著媒介23被建構,使得當該液體9被由該頭部3排出時,該吸著媒介23不被由該排出通口10排出,該等微粒、該等金屬雜質、或水能被防止由該排出通口10排出。因此,該光奈米壓印製程之產量能被增加,且各種裝置、諸如半導體裝置能被以高產量來製造。 Since the sorption medium 23 is constructed such that when the liquid 9 is discharged from the head 3, the absorbing medium 23 is not discharged by the discharge port 10, the particles, the metal impurities, or the water It is prevented from being discharged from the discharge port 10. Therefore, the yield of the photon nanoimprint process can be increased, and various devices such as semiconductor devices can be manufactured with high yield.

該吸著媒介23較佳地係多小孔媒介。當該吸著媒介23為多小孔時,該吸著媒介23吸附或吸收該等微粒的能力可被增加。於該吸著媒介23如下面所敘述地具有在其表面上之離子交換群組的案例中,當該吸著媒介23為多小孔時,該吸著媒介23之特定表面積可被製成大的,且因此該吸著媒介23吸附該金屬雜質之能力能被增加。於 該吸著媒介23如下面所敘述地含有乾燥劑的案例中,當該吸著媒介23為多小孔時,該吸著媒介23之特定表面積可被製成大的,且因此該吸著媒介23之吸附能力或吸收能力可被增加。 The sorbent medium 23 is preferably a multi-hole medium. When the sorption medium 23 is a plurality of small holes, the ability of the sorption medium 23 to adsorb or absorb the particles can be increased. In the case where the sorption medium 23 has an ion exchange group on its surface as described below, when the sorption medium 23 is a small aperture, the specific surface area of the sorption medium 23 can be made large. And thus the ability of the sorption medium 23 to adsorb the metal impurities can be increased. to In the case where the sorbent medium 23 contains a desiccant as described below, when the sorbent medium 23 is a small aperture, the specific surface area of the sorption medium 23 can be made large, and thus the sorption medium The adsorption capacity or absorption capacity of 23 can be increased.

該吸著媒介23具有孔隙。該等孔隙較佳地係具有0.001微米至0.5微米、更佳地係0.001微米至0.1微米、及尤其較佳地係0.005微米至0.1微米的平均直徑。具有在該上面範圍內之平均直徑的孔隙之吸著媒介23的使用允許該等微粒被有效率地吸附或吸收。當該吸著媒介23之孔隙的平均直徑係大於0.5微米或少於0.001微米時,該吸著媒介23吸附該等微粒及該等金屬離子之能力傾向於為低的。順便提及,該吸著媒介23之孔隙的平均直徑可為藉由譬如汞注入方法所決定。如在此中所使用,該“孔隙之平均直徑”一詞意指該孔隙於使得該吸著媒介23被洗滌及被乾燥的狀態中之平均直徑。 The sorption medium 23 has pores. The pores preferably have an average diameter of from 0.001 micron to 0.5 micron, more preferably from 0.001 micron to 0.1 micron, and particularly preferably from 0.005 micron to 0.1 micron. The use of sorbent media 23 having pores having an average diameter within the above range allows the particles to be efficiently adsorbed or absorbed. When the average diameter of the pores of the sorption medium 23 is more than 0.5 μm or less than 0.001 μm, the ability of the sorption medium 23 to adsorb the particles and the metal ions tends to be low. Incidentally, the average diameter of the pores of the sorption medium 23 can be determined by, for example, a mercury injection method. As used herein, the term "average diameter of pores" means the average diameter of the pores in a state in which the sorption medium 23 is washed and dried.

該吸著媒介23的範例包括諸如聚乙烯(PE)薄膜及聚丙烯(PP)薄膜之多小孔聚烯烴薄膜、諸如聚四氟乙烯薄膜的多小孔氟樹脂薄膜、多小孔聚醯亞胺薄膜、諸如尼龍6薄膜和尼龍6,6薄膜之多小孔聚醯胺薄膜、纖維素、珠光體、矽藻土、玻璃纖維、矽膠、活性碳、沸石、及分子篩。該吸著媒介23可為粒狀(球狀)或纖維狀。 Examples of the sorbent medium 23 include a multi-porous polyolefin film such as a polyethylene (PE) film and a polypropylene (PP) film, a multi-pore fluororesin film such as a polytetrafluoroethylene film, and a multi-pore polysiloxane. Amine film, multi-pore polyimide film such as nylon 6 film and nylon 6,6 film, cellulose, pearlite, diatomaceous earth, glass fiber, silicone, activated carbon, zeolite, and molecular sieve. The sorption medium 23 can be granular (spherical) or fibrous.

該吸著媒介23較佳地係由諸如纖維素、矽藻土、聚乙烯、尼龍、活性碳、或矽膠的材料所製成。這是因為此一材料未含有譬如儘可能負責用於該等金屬雜質之產生的 金屬元素、諸如鋁及鈉。尼龍、矽藻土、纖維素、與類似者等具有極性及能力,以吸附該等金屬離子,且因此係特別較佳的。 The sorbent medium 23 is preferably made of a material such as cellulose, diatomaceous earth, polyethylene, nylon, activated carbon, or silicone. This is because this material does not contain, for example, as much responsibility as possible for the production of such metal impurities. Metal elements such as aluminum and sodium. Nylon, diatomaceous earth, cellulose, and the like have polarity and ability to adsorb the metal ions, and are therefore particularly preferred.

在本發明中,該吸著媒介23較佳地係以該離子交換群組作表面改性。其尤其較佳的是該吸著媒介23為多小孔,且係以該離子交換群組作表面改性。這允許該液體9及該吸著媒介23間之接觸面積為大的,且因此允許該吸著媒介23吸附該等金屬離子之能力為高的。該儲存袋8之內表面可被以該等離子交換群組作表面改性。 In the present invention, the sorbent medium 23 is preferably surface modified with the ion exchange group. It is especially preferred that the sorbent medium 23 is a plurality of small pores and is surface modified with the ion exchange group. This allows the contact area between the liquid 9 and the sorption medium 23 to be large, and thus the ability of the sorption medium 23 to adsorb the metal ions is high. The inner surface of the storage bag 8 can be surface modified with the plasma exchange group.

該等離子交換群組的型式未特別受限制。該等離子交換群組較佳地係陽離子交換群組。該等陽離子交換群組之使用能夠使作為陽離子的金屬離子被有效率地吸附。該等離子交換群組較佳地係為陽離子交換群組之磺酸基及羧基。 The type of the plasma exchange group is not particularly limited. The plasma exchange group is preferably a cation exchange group. The use of such cation exchange groups enables efficient adsorption of metal ions as cations. The plasma exchange group is preferably a sulfonic acid group and a carboxyl group of a cation exchange group.

如上面所述,以該離子交換群組表面改性該吸著媒介23或該儲存袋8的內表面能夠使該金屬雜質基於離子交換之原理被移去,該等金屬雜質係以離子的形式存在於該液體9中。 As described above, surface modification of the sorption medium 23 or the inner surface of the storage bag 8 by the ion exchange group enables the metal impurities to be removed based on the principle of ion exchange in the form of ions It is present in the liquid 9.

以該離子交換群組作表面改性之吸著媒介23可為譬如Zeta Plus(註冊商標)EC系列濾片B47-40QSH或Zeta Plus(註冊商標)EC系列濾片B47-020GN(由3M日本有限公司)所製成,其係由纖維素、矽藻土、及離子交換樹脂所構成的吸著媒介。 The sorbent medium 23 which is surface-modified by the ion exchange group may be, for example, Zeta Plus (registered trademark) EC series filter B47-40QSH or Zeta Plus (registered trademark) EC series filter B47-020GN (by 3M Japan Limited) Made by the company, which is a sorption medium composed of cellulose, diatomaceous earth, and ion exchange resin.

以該離子交換群組作表面改性之吸著媒介23可為纖 維的離子交換樹脂。該纖維之離子交換樹脂的較佳範例包括IONEX(註冊商標)TIN-100及IONEX(註冊商標)TIN-600(皆藉由東麗泛應化學股份有限公司所生產)。IONEX(註冊商標)TIN-100係藉由以磺酸交換群組表面改性聚苯乙烯樹脂所獲得之聚苯乙烯/聚烯烴合成纖維。IONEX(註冊商標)TIN-600係藉由以亞氨二醋酸交換群組表面改性聚苯乙烯樹脂所獲得之聚苯乙烯/聚烯烴合成纖維。IONEX(註冊商標)TIN-100及IONEX(註冊商標)TIN-600兩者具有40微米的纖維直徑及0.5毫米之纖維長度。這些纖維的離子交換樹脂具有優異的吸附能力及大表面積,亦具有良好之化學穩定性,且當作該吸著媒介23係較佳的。 The sorption medium 23 modified by the ion exchange group can be a fiber Dimensional ion exchange resin. Preferred examples of the fiber ion exchange resin include IONEX (registered trademark) TIN-100 and IONEX (registered trademark) TIN-600 (both produced by Toray Pan Chemical Co., Ltd.). IONEX (registered trademark) TIN-100 is a polystyrene/polyolefin synthetic fiber obtained by exchanging a group surface-modified polystyrene resin with a sulfonic acid. IONEX (registered trademark) TIN-600 is a polystyrene/polyolefin synthetic fiber obtained by exchanging a group surface-modified polystyrene resin with iminodiacetic acid. Both IONEX (registered trademark) TIN-100 and IONEX (registered trademark) TIN-600 have a fiber diameter of 40 μm and a fiber length of 0.5 mm. The ion exchange resins of these fibers have excellent adsorption ability and large surface area, and also have good chemical stability, and are preferred as the sorption medium 23.

當該吸著媒介23為纖維時,該等孔隙之平均直徑對應於形成該吸著媒介23的交織纖維間之空間的平均直徑。其平均直徑能被以此一使得過濾器係使用該吸著媒介23所製備及具有習知直徑之黃金奈米微粒係通過該過濾器的方式來測量。 When the sorbent medium 23 is a fiber, the average diameter of the pores corresponds to the average diameter of the space between the interwoven fibers forming the sorption medium 23. The average diameter can be measured by means of the filter in which the filter is prepared using the sorption medium 23 and the gold nanoparticles having a conventional diameter pass through the filter.

當該吸著媒介23係纖維時,該等纖維較佳地係具有約1微米至500微米且更佳地係10微米至100微米之直徑。該等纖維較佳地係具有約0.1毫米至100毫米且更佳地係0.50毫米至50毫米的長度。當該等纖維之直徑及長度係在該上面之範圍內時,該吸著媒介23吸附該等微粒及該等金屬離子的能力可被增加。 When the sorbent medium 23 is a fiber, the fibers preferably have a diameter of from about 1 micron to 500 microns and more preferably from 10 microns to 100 microns. The fibers preferably have a length of from about 0.1 mm to 100 mm and more preferably from 0.50 mm to 50 mm. When the diameter and length of the fibers are within the upper range, the ability of the sorbent medium 23 to adsorb the particles and the metal ions can be increased.

於此實施例中,該吸著媒介23較佳地係含有該乾燥 劑。當該吸著媒介23含有該乾燥劑時,該液體9中所含有之水被吸附在該吸著媒介23上或吸收於該吸著媒介23中,且因此水能被防止由該排出通口10排出。 In this embodiment, the sorbent medium 23 preferably contains the drying Agent. When the absorbing medium 23 contains the desiccant, water contained in the liquid 9 is adsorbed on the absorbing medium 23 or absorbed in the absorbing medium 23, and thus water can be prevented from being discharged from the venting port. 10 discharge.

該乾燥劑係未特別受限制及可具有吸附或吸收濕氣的功能。該乾燥劑可為譬如化學或物理乾燥劑。 The desiccant is not particularly limited and may have a function of adsorbing or absorbing moisture. The desiccant can be, for example, a chemical or physical desiccant.

該化學乾燥劑係利用與水之化學反應性或溶解的其中一者,溶解係化學物質中所固有之性質。該化學乾燥劑的範例包括氧化鈣、氧化鋇、氧化鎂、氧化鍶、硫酸鋰、硫酸鈉、硫酸鎵、硫酸鈦、硫酸鎳、氯化鋰、氯化鈣、氯化鎂、氯化鋁、硫酸鈣、硫酸鎂、硫酸鋅、醋酸鉀、二甲胺鹽酸鹽、正磷酸、鹽酸胍、磷酸胍、氨基磺酸胍、磷酸甲基胍、碳酸胍、氫氧化鉀、氫氧化鈉、氫氧化鎂、五氧化二磷、過氯酸鎂、氧化鍺、氧化鉀、氧化銫、氧化鈉、聚乙烯醇、澱粉-丙烯酸接枝共聚物、澱粉-丙烯腈接枝共聚物、纖維素-丙烯腈接枝共聚物、交鏈聚乙烯醇、交鏈聚丙烯酸鈉、及丙烯酸甲酯-乙酸乙烯酯共聚物之皂化產品。 The chemical desiccant utilizes one of the chemical reactivity or dissolution with water to dissolve the properties inherent in the chemical. Examples of the chemical desiccant include calcium oxide, barium oxide, magnesium oxide, barium oxide, lithium sulfate, sodium sulfate, gallium sulfate, titanium sulfate, nickel sulfate, lithium chloride, calcium chloride, magnesium chloride, aluminum chloride, calcium sulfate. , magnesium sulfate, zinc sulfate, potassium acetate, dimethylamine hydrochloride, orthophosphoric acid, guanidine hydrochloride, strontium phosphate, bismuth sulfamate, methyl hydrazine phosphate, cesium carbonate, potassium hydroxide, sodium hydroxide, magnesium hydroxide , phosphorus pentoxide, magnesium perchlorate, cerium oxide, potassium oxide, cerium oxide, sodium oxide, polyvinyl alcohol, starch-acrylic acid graft copolymer, starch-acrylonitrile graft copolymer, cellulose-acrylonitrile A saponified product of a branched copolymer, a cross-linked polyvinyl alcohol, a sodium cross-linked polyacrylate, and a methyl acrylate-vinyl acetate copolymer.

該物理乾燥劑係利用水分子之吸附在多小孔媒介上的其中一者。該物理乾燥劑之範例包括活性碳、矽膠、聚乙烯醇、煆燒滑石、及合成沸石。 The physical desiccant utilizes one of the adsorption of water molecules on a multi-pore medium. Examples of such physical drying agents include activated carbon, silicone, polyvinyl alcohol, strontium talc, and synthetic zeolites.

該乾燥劑較佳地係未含有可儘可能影響半導體裝置的半導體性質之金屬元素。亦即,該乾燥劑較佳地係未含有鈉、鈣、鐵、鉀、鋅、鋁、鎂、鎳、鉻、銅、鉛、錳、鋰、錫、鈀、鋇、鈷、及鍶。該乾燥劑較佳地係選自由硫 酸鎵、硫酸鈦、二甲胺鹽酸鹽、正磷酸、鹽酸胍、磷酸胍、氨基磺酸胍、磷酸甲基胍、碳酸胍、五氧化二磷、聚乙烯醇、澱粉-丙烯酸接枝共聚物、澱粉-丙烯腈接枝共聚物、纖維素-丙烯腈接枝共聚物、交鏈聚乙烯醇、丙烯酸甲酯-乙酸乙烯酯共聚物之皂化產品、氧化鍺、氧化銫、活性碳、及矽膠所組成之群組的至少一者。 The desiccant preferably does not contain a metal element that can affect the semiconductor properties of the semiconductor device as much as possible. That is, the desiccant preferably does not contain sodium, calcium, iron, potassium, zinc, aluminum, magnesium, nickel, chromium, copper, lead, manganese, lithium, tin, palladium, iridium, cobalt, and lanthanum. The desiccant is preferably selected from the group consisting of sulfur Gallium hydride, titanium sulphate, dimethylamine hydrochloride, orthophosphoric acid, guanidine hydrochloride, strontium phosphate, bismuth sulfamate, methyl hydrazine phosphate, cesium carbonate, phosphorus pentoxide, polyvinyl alcohol, starch-acrylic acid graft copolymerization , starch-acrylonitrile graft copolymer, cellulose-acrylonitrile graft copolymer, crosslinked polyvinyl alcohol, saponified product of methyl acrylate-vinyl acetate copolymer, cerium oxide, cerium oxide, activated carbon, and At least one of the group consisting of silicones.

該乾燥劑可另具有吸附該等微粒或該等金屬離子之能力。與該吸著媒介23不同的另一吸著媒介可被使用。亦即,包括該吸著媒介23之複數吸著媒介可被使用。 The desiccant may additionally have the ability to adsorb the particles or the metal ions. Another sorption medium different from the sorption medium 23 can be used. That is, a plurality of sorbent media including the sorbent medium 23 can be used.

當該吸著媒介23不被固定至該儲存袋8的內表面時,該吸著媒介23較佳地係懸置於該儲存袋8中之液體9中。當該吸著媒介23被懸置於該儲存袋8中之液體9中時,該排出通口10在該液體9的排出期間不被阻斷,且因此該排出性能之減少可被抑制。如此,該吸著媒介23的密度較佳地係少於或等於該液體9之密度。尤其是,該吸著媒介23的密度較佳地係該液體9之密度的30%至100%、更佳地係50%至100%、及尤其較佳地係80%至100%。當該吸著媒介23之密度係在該上面的範圍內時,該吸著媒介23可被懸置在該液體9中。 When the sorption medium 23 is not fixed to the inner surface of the storage bag 8, the absorbing medium 23 is preferably suspended in the liquid 9 in the storage bag 8. When the sorption medium 23 is suspended in the liquid 9 in the storage bag 8, the discharge port 10 is not blocked during the discharge of the liquid 9, and thus the reduction in discharge performance can be suppressed. As such, the density of the sorbent medium 23 is preferably less than or equal to the density of the liquid 9. In particular, the density of the sorbent medium 23 is preferably from 30% to 100%, more preferably from 50% to 100%, and particularly preferably from 80% to 100%, of the density of the liquid 9. When the density of the sorption medium 23 is within the upper range, the sorption medium 23 can be suspended in the liquid 9.

該吸著媒介23較佳地係具有大於該排出通口10之直徑的尺寸,使得當該液體9係由該頭部3排出時,該吸著媒介23不被由該排出通口10排出。吸著媒介23之尺寸較佳地係該排出通口10的直徑之150%或更多、及更佳地係200%或更多。該吸著媒介23之尺寸可為藉由譬如沈降 方法、雷射散射方法、或過篩方法所決定的有效直徑或同等直徑。 The absorbing medium 23 preferably has a size larger than the diameter of the discharge port 10 such that the sorption medium 23 is not discharged from the discharge port 10 when the liquid 9 is discharged from the head 3. The size of the absorbing medium 23 is preferably 150% or more, and more preferably 200% or more, of the diameter of the discharge port 10. The size of the sorption medium 23 can be determined by, for example, sedimentation The effective diameter or equivalent diameter determined by the method, the laser scattering method, or the sieving method.

另一選擇係,該吸著媒介23可被固定至該儲存袋8之內表面。亦即,該吸著媒介23可被附接至該儲存袋8的內表面。於此案例中,以使得該吸著媒介23被附接至呈薄膜形式的儲存袋8之內表面、或該吸著媒介23被附接至或嵌入於呈球體或微粒形式的儲存袋8之內表面的方式,該吸著媒介23可被固定至該儲存袋8之內表面。另一選擇係,該吸著媒介23可被以纖維構件固定至該儲存袋8的內表面。 Alternatively, the sorbent medium 23 can be secured to the inner surface of the storage bag 8. That is, the sorption medium 23 can be attached to the inner surface of the storage bag 8. In this case, the sorption medium 23 is attached to the inner surface of the storage bag 8 in the form of a film, or the sorption medium 23 is attached or embedded in the storage bag 8 in the form of spheres or particles. The absorbing medium 23 can be fixed to the inner surface of the storage bag 8 in a manner of the inner surface. Alternatively, the sorbent medium 23 can be secured to the inner surface of the storage bag 8 with a fibrous member.

如上面所述,該吸著媒介23較佳地係被放置,以便不會阻斷該等排出通口10。如果該吸著媒介23被放置使得該等排出通口10被阻斷、亦即該液體9之通道被阻斷,則排出性能可被儘可能地減少。如果該液體9係藉由增加該儲存袋8於此狀態中之壓力而被排出,則其他雜質、諸如奈米氣泡或微粒可為儘可能在所排出的液體9中產生。於此實施例中,該吸著媒介23被懸置在該液體9中或固定至該儲存袋8之內表面;因此,藉由該吸著媒介23阻斷該排出通口10能被避免。這允許該前述排出性能的減少及由於排出之雜質的產生被抑制。 As mentioned above, the sorption medium 23 is preferably placed so as not to block the discharge ports 10. If the sorption medium 23 is placed such that the discharge ports 10 are blocked, that is, the passage of the liquid 9 is blocked, the discharge performance can be reduced as much as possible. If the liquid 9 is discharged by increasing the pressure of the storage bag 8 in this state, other impurities such as nanobubbles or particles may be generated as much as possible in the discharged liquid 9. In this embodiment, the sorption medium 23 is suspended in the liquid 9 or fixed to the inner surface of the storage bag 8; therefore, blocking the discharge port 10 by the absorbing medium 23 can be avoided. This allows the aforementioned reduction in discharge performance and suppression of generation of impurities due to discharge.

〔奈米壓印液體儲存桶〕 [nanoimprinted liquid storage tank]

根據本發明之實施例的奈米壓印液體儲存桶70(其後被稱為該“桶70”)係在下面參考圖7A被敘述。圖 7A係該桶70之概要視圖。 A nanoimprint liquid storage tank 70 (hereinafter referred to as the "bucket 70") according to an embodiment of the present invention is described below with reference to FIG. 7A. Figure 7A is a schematic view of the barrel 70.

該桶70包括儲存該液體9的儲存區段80。該桶70含有該吸著媒介23。該吸著媒介23被放置在該儲存區段80中,且吸附或吸收該液體9中所含有的微粒、金屬離子、及/或水。該吸著媒介23之材料及性質係如上述。 The tub 70 includes a storage section 80 that stores the liquid 9. The tub 70 contains the sorption medium 23. The sorption medium 23 is placed in the storage section 80 and adsorbs or absorbs particles, metal ions, and/or water contained in the liquid 9. The material and properties of the sorption medium 23 are as described above.

如在圖7A中所示,於該桶70中,該吸著媒介23被懸置在該液體9中。圖7B係奈米壓印液體儲存桶701的概要視圖,其係儲存桶70之修改。該奈米壓印液體儲存桶701包括儲存區段801,且該吸著媒介23被固定至該儲存區段801的內表面。 As shown in FIG. 7A, in the tub 70, the sorption medium 23 is suspended in the liquid 9. 7B is a schematic view of a nanoimprinted liquid storage tank 701, which is a modification of the storage tub 70. The nanoimprint liquid storage tank 701 includes a storage section 801, and the sorption medium 23 is fixed to an inner surface of the storage section 801.

如上述該桶70中之吸著媒介23的存在允許該液體9中之微粒、金屬雜質、或水的濃度隨著時間之增加將被抑制,而被使用於奈米壓印製程中的液體9被儲存於該桶70中。 The presence of the sorption medium 23 in the tank 70 as described above allows the concentration of particulates, metallic impurities, or water in the liquid 9 to be suppressed over time, and is used for the liquid in the nanoimprinting process. It is stored in the tub 70.

〔奈米壓印液體〕 [nanoimprint liquid]

該液體9之型式未特別受限制,並可為被使用於該奈米壓印製程中的液體材料。液體範例9包括、但不被限制於(1)可硬化成份、諸如用於抗蝕劑之可硬化成份及用於形成模具複製品的可硬化成份,用於形成細微圖案,及(2)硬化層-形成可硬化成份、諸如黏著劑層-形成可硬化成份、底層-形成可硬化成份、中介層-形成可硬化成份、頂部塗覆層-形成可硬化成份、及平滑層-形成可硬化成份。 The type of the liquid 9 is not particularly limited and may be a liquid material used in the nanoimprinting process. Liquid Example 9 includes, but is not limited to, (1) hardenable components, such as hardenable components for resists and hardenable components for forming mold replicas, for forming fine patterns, and (2) hardening Layer - forming a hardenable component, such as an adhesive layer - forming a hardenable component, a primer layer - forming a hardenable component, an interposer - forming a hardenable component, a top coating layer - forming a hardenable component, and a smoothing layer - forming a hardenable component .

該液體9較佳地係光可硬化成份P(下文被稱為該“成份P”)。為該液體9之成份P在下面被敘述。 The liquid 9 is preferably a photohardenable component P (hereinafter referred to as the "component P"). The component P which is the liquid 9 is described below.

〔光可硬化成份〕 [photohardenable component]

該成份P含有分量(A),其係可聚合化合物;及分量(B),其係光聚合引發劑。如在此中所使用,該“光可硬化成份”一詞意指藉由光照射所硬化的成份。該成份P較佳地係可被用作光奈米壓印之光可硬化成份。含有該分量(A)及該分量(B)的成份P未特別受限制及可為藉由光照射所硬化者。該成份P可含有譬如於該化合物之分子中含有該分量(A)及該分量(B)的化合物。 The component P contains a component (A) which is a polymerizable compound; and a component (B) which is a photopolymerization initiator. As used herein, the term "photohardenable component" means a component that is hardened by light irradiation. The component P is preferably used as a photohardenable component of a photon imprint. The component P containing the component (A) and the component (B) is not particularly limited and may be cured by light irradiation. The component P may contain, for example, a compound containing the component (A) and the component (B) in the molecule of the compound.

如在此中所使用,該“硬化產品”一詞意指藉由局部或完全地硬化一聚合物所獲得者,該聚合物藉由聚合光可硬化成份中所含有之可聚合化合物所獲得。順便提及,在硬化產品之中,如比較於其面積,具有非常小厚度的硬化產品於一些案例中被敘述為“硬化薄膜”。硬化產品及薄膜之形狀未特別受限制。該硬化產品及該硬化薄膜可具有一表面圖案形狀。 As used herein, the term "hardened product" means a person obtained by partially or completely hardening a polymer obtained by polymerizing a polymerizable compound contained in a photohardenable component. Incidentally, among the hardened products, such as a comparatively large area, a hardened product having a very small thickness is described as a "hardened film" in some cases. The shape of the hardened product and the film is not particularly limited. The hardened product and the cured film may have a surface pattern shape.

〔分量(A):可聚合化合物〕 [Component (A): polymerizable compound]

該分量(A)係該可聚合化合物。如在此中所使用,該“可聚合化合物”一詞意指化合物與由該分量(B)(光聚合引發劑)所產生的聚合因素(自由基等)反應,以藉由連鎖反應(聚合反應)形成聚合物薄膜。 This component (A) is the polymerizable compound. As used herein, the term "polymerizable compound" means that a compound reacts with a polymerization factor (free radical, etc.) produced by the component (B) (photopolymerization initiator) to carry out a chain reaction (polymerization). The reaction) forms a polymer film.

可聚合化合物之範例係自由基可聚合化合物。為該分量(A)的可聚合化合物可為由單一型式之可聚合化合物或數個型式的可聚合化合物所構成。 An example of a polymerizable compound is a radical polymerizable compound. The polymerizable compound which is the component (A) may be composed of a single type of polymerizable compound or a plurality of types of polymerizable compounds.

該自由基可聚合化合物較佳地係具有一或多個丙烯醯基或異丁烯酰基群組之化合物、亦即(甲基)丙烯酸化合物。 The radical polymerizable compound is preferably a compound having one or more groups of acryloyl or methacryl groups, that is, a (meth)acrylic compound.

據此,為該成份P的分量(A)之可聚合化合物較佳地係含有該(甲基)丙烯酸化合物。該分量(A)的主要分量更佳地係(甲基)丙烯酸化合物。該分量(A)最佳地係該(甲基)丙烯酸化合物。順便提及,該分量(A)之主要分量為該(甲基)丙烯酸化合物的事實意指該(甲基)丙烯酸化合物總計達該分量(A)之重量百分比的90%或更多。 Accordingly, the polymerizable compound which is the component (A) of the component P preferably contains the (meth)acrylic compound. The main component of the component (A) is more preferably a (meth)acrylic compound. This component (A) is optimally the (meth)acrylic compound. Incidentally, the fact that the main component of the component (A) is the (meth)acrylic compound means that the (meth)acrylic compound amounts to 90% or more by weight of the component (A).

當該自由基可聚合化合物係由具有一或更多丙烯醯基或異丁烯酰基群組之數個型式的化合物所構成時,該自由基可聚合化合物較佳地係含有單功能(甲基)丙烯酸單體及多功能(甲基)丙烯酸單體。這是因為具有高機械強度之硬化產品係結合地使用該單功能(甲基)丙烯酸單體及該多功能(甲基)丙烯酸單體所獲得。 When the radical polymerizable compound is composed of a plurality of types of compounds having one or more groups of acryloyl or methacryloyl groups, the radical polymerizable compound preferably contains a monofunctional (meth)acrylic acid. Monomer and multifunctional (meth)acrylic monomers. This is because a hardened product having high mechanical strength is obtained by using the monofunctional (meth)acrylic monomer and the multifunctional (meth)acrylic monomer in combination.

〔分量(B):光聚合引發劑〕 [Component (B): Photopolymerization initiator]

該分量(B)係該光聚合引發劑。 This component (B) is the photopolymerization initiator.

如在此中所使用,該“光聚合引發劑”一詞意指吸收具有某一波長的光之化合物,以產生該聚合因素(自由 基)。尤其是,該光聚合引發劑係聚合引發劑(自由基發生器),其藉由光線(紅外線、可見光、紫外線、遠紫外線、X射線、諸如電子束的帶電粒子束、或輻射)產生自由基。 As used herein, the term "photopolymerization initiator" means a compound that absorbs light having a certain wavelength to produce the polymerization factor (freedom) base). In particular, the photopolymerization initiator is a polymerization initiator (radical generator) which generates radicals by light rays (infrared rays, visible rays, ultraviolet rays, far ultraviolet rays, X rays, charged particle beams such as electron beams, or radiation). .

該分量(B)可為由單一型式之光聚合引發劑或數個型式的光聚合引發劑所構成。 This component (B) may be composed of a single type of photopolymerization initiator or a plurality of types of photopolymerization initiators.

被混合在該成份P中而為該光聚合引發劑之分量(B)的數量較佳地係該分量(A)之重量百分比的0.01%至10%,其係該可聚合化合物,且更佳地係0.1%至7%之重量百分比。 The amount of the component (B) which is mixed in the component P and is the photopolymerization initiator is preferably 0.01% to 10% by weight of the component (A), which is the polymerizable compound, and more preferably The ground system is from 0.1% to 7% by weight.

當該分量(B)之數量係該分量(A)的數量之0.01%重量百分比或更多時,該成份P的硬化速率係高的,且因此反應之效率能被增加。當該分量(B)的數量係該分量(A)之10%重量百分比或更少時,所獲得的硬化產品具有某一機械強度。 When the amount of the component (B) is 0.01% by weight or more based on the amount of the component (A), the hardening rate of the component P is high, and thus the efficiency of the reaction can be increased. When the amount of the component (B) is 10% by weight or less of the component (A), the obtained hardened product has a certain mechanical strength.

〔分量(C):另一添加劑分量〕 [Component (C): another additive component]

除了該分量(A)及該分量(B)以外,視各種目的而定,該成份P可另含有添加劑分量(C),除非本發明之效果被損害。該添加劑分量(C)的範例包括敏化劑、氫予體、內部脫模劑、表面活性劑、氧化抑制劑、溶劑、聚合物分量、及異於該分量(B)之聚合引發劑。 In addition to the component (A) and the component (B), the component P may further contain an additive component (C) depending on various purposes, unless the effects of the present invention are impaired. Examples of the additive component (C) include a sensitizer, a hydrogen donor, an internal mold release agent, a surfactant, an oxidation inhibitor, a solvent, a polymer component, and a polymerization initiator different from the component (B).

該敏化劑係被適當地加入用於增進聚合反應或增加反應轉化之目的之化合物。該敏化劑的範例係敏化染料。 The sensitizer is suitably added to a compound for the purpose of promoting polymerization or increasing reaction conversion. An example of such a sensitizer is a sensitizing dye.

該敏化染料係吸收具有特定波長之光的化合物,其藉此被激發,且其與為該分量(B)之光聚合引發劑互相作用。如在此中所使用,該“相互作用”一詞包括由該被激發的敏化染料至為該分量(B)之光聚合引發劑的能量之傳送及電子的傳送。 The sensitizing dye is a compound which absorbs light having a specific wavelength, whereby it is excited, and it interacts with a photopolymerization initiator which is the component (B). As used herein, the term "interaction" includes the transfer of energy from the excited sensitizing dye to the photopolymerization initiator of component (B) and the transport of electrons.

該敏化劑可被單獨地使用或與另一敏化劑結合地使用。 The sensitizer can be used alone or in combination with another sensitizer.

該氫予體係與由為該分量(B)之光聚合引發劑所產生的引發自由基、或在聚合作用中之成長端的自由基反應之化合物,以產生更多反應自由基。當為該分量(B)的光聚合引發劑係光自由基發生器時,該氫予體較佳地係被使用。 The hydrogen-providing system reacts with a radical which is generated by a photopolymerization initiator of the component (B) to initiate a radical or a radical which grows at the growth end to generate more reactive radicals. When the photopolymerization initiator of the component (B) is a photo radical generator, the hydrogen donor is preferably used.

該氫予體可被獨自地或與另一氫予體結合地使用。該氫予體可具有如敏化劑之功能。 The hydrogen donor can be used alone or in combination with another hydrogen donor. The hydrogen donor may have a function as a sensitizer.

當該成份P含有該敏化劑或該氫予體當作該添加劑分量(C)時,該成份P中所含有的敏化劑或氫予體之數量較佳地係為可聚合化合物的分量(A)之數量的0.01%至20%重量百分比、更佳地係0.1%至5.0%重量百分比、及進一步更佳地係0.2%至2.0%重量百分比。當在其中所含有之敏化劑的數量係該分量(A)之數量的0.1%重量百分比或更多時,增進聚合之效果可被有效地呈現。當在其中所含有之敏化劑或氫予體的數量係該分量(A)之數量的5.0%重量百分比或更少時,形成所製備之硬化產品的聚合化合物具有充分高之分子量,且該成份P中的溶解失效或 該成份P之儲存穩定性的惡化可被抑制。 When the component P contains the sensitizer or the hydrogen donor as the additive component (C), the amount of the sensitizer or hydrogen donor contained in the component P is preferably a component of the polymerizable compound. The amount of (A) is from 0.01% to 20% by weight, more preferably from 0.1% to 5.0% by weight, and still more preferably from 0.2% to 2.0% by weight. When the amount of the sensitizer contained therein is 0.1% by weight or more based on the amount of the component (A), the effect of enhancing the polymerization can be effectively exhibited. When the amount of the sensitizer or hydrogen donor contained therein is 5.0% by weight or less based on the amount of the component (A), the polymer compound forming the prepared hardened product has a sufficiently high molecular weight, and Dissolution in component P fails or The deterioration of the storage stability of the component P can be suppressed.

為著減少模具及抗蝕劑間之界面間的黏合強度、亦即在下面之脫模步驟中的脫模力之目的,該內部脫模劑可被加至該成份P。如在此中所使用,該“內部”一詞意指在下面的放置步驟之前將內部脫模劑加至該成份P。 The internal mold release agent may be added to the component P for the purpose of reducing the bonding strength between the interface between the mold and the resist, that is, the release force in the demolding step below. As used herein, the term "internal" means that an internal release agent is added to the component P prior to the placing step below.

該內部脫模劑的範例包括表面活性劑、諸如矽酮表面活性劑、氟化表面活性劑、及碳化氫表面活性劑。於此實施例中,該內部脫模劑係不可聚合的。該內部脫模劑可被獨自地使用或與另一內部脫模劑結合地使用。 Examples of the internal mold release agent include surfactants such as an anthrone surfactant, a fluorinated surfactant, and a hydrocarbon surfactant. In this embodiment, the internal release agent is non-polymerizable. The internal mold release agent can be used alone or in combination with another internal mold release agent.

當該成份P含有該內部脫模劑當作該添加劑分量(C)時,在其中所含有之內部脫模劑的數量較佳地係譬如為可聚合化合物之分量(A)的數量之0.001%至10%重量百分比、更佳地係0.01%至7%重量百分比、及進一步更佳地係0.05%至5%重量百分比。 When the component P contains the internal mold release agent as the additive component (C), the amount of the internal mold release agent contained therein is preferably 0.001% of the amount of the component (A) of the polymerizable compound. Up to 10% by weight, more preferably 0.01% to 7% by weight, and still more preferably 0.05% to 5% by weight.

該成份P可含有溶劑,且較佳地係大體上未含有溶劑。在此中,大體上未含有溶劑的事實意指異於無意中所含有之溶劑、諸如雜質的任何溶劑被含有。亦即,該成份P中的溶劑之含量較佳地係譬如3%重量百分比或更少及更佳地係1%重量百分比或更少。如在此中所使用,該“溶劑”一詞意指供共同使用於成份或光阻劑中的溶劑。該溶劑之型式係未特別受限制,且該溶劑可為溶解及均勻地分散此實施例中所使用的化合物及不會與該等化合物反應者。 The component P may contain a solvent, and is preferably substantially free of a solvent. Herein, the fact that substantially no solvent is contained means that any solvent which is inadvertently contained, such as an impurity, is contained. That is, the content of the solvent in the component P is preferably, for example, 3% by weight or less and more preferably 1% by weight or less. As used herein, the term "solvent" means a solvent that is used in combination with a component or photoresist. The type of the solvent is not particularly limited, and the solvent may be a compound which dissolves and uniformly disperses the compound used in the examples and does not react with the compounds.

該分量(A)與該分量(B)間之比率能以使得該成 份P及/或藉由硬化該成份P所獲得的硬化產品係藉由紅外線光譜學、紫外線光譜學、裂解氣色譜法-質譜法等所分析之方式被決定。該成份P中的分量(A)與分量(B)間之比率能由該硬化產品中的分量(A)與分量(B)間之比率被決定。當該成份P含有該添加劑分量(C)時,該成份P中的分量(A)、分量(B)、與添加劑分量(C)間之比率可被類似地決定。 The ratio between the component (A) and the component (B) can be such that the The P and/or the hardened product obtained by hardening the component P are determined by means of infrared spectroscopy, ultraviolet spectroscopy, pyrolysis gas chromatography-mass spectrometry or the like. The ratio between the component (A) and the component (B) in the component P can be determined by the ratio between the component (A) and the component (B) in the hardened product. When the component P contains the additive component (C), the ratio between the component (A), the component (B), and the additive component (C) in the component P can be similarly determined.

〔光可硬化成份於混合期間的溫度〕 [The temperature of the photohardenable component during mixing]

當該成份P被製備時,該分量(A)與分量(B)在預定的溫度條件之下被混合在一起及被溶解。尤其是,該分量(A)與分量(B)在0℃至100℃的範圍內被混合在一起。這適用至該成份P含有該添加劑分量(C)之案例。 When the component P is prepared, the component (A) and the component (B) are mixed together and dissolved under a predetermined temperature condition. In particular, the component (A) and the component (B) are mixed together in the range of 0 ° C to 100 ° C. This applies to the case where the component P contains the additive component (C).

〔光可硬化成份的黏性〕 [Adhesiveness of photohardenable components]

排除該溶劑之成份P的各分量之混合物較佳地係在25℃具有1mPas至100mPas、更佳地係1mPas至50mPas、及進一步更佳地係1mPas至6mPas之黏性。 The mixture of the components excluding the component P of the solvent preferably has a viscosity of from 1 mPas to 100 mPas, more preferably from 1 mPas to 50 mPas, and still more preferably from 1 mPas to 6 mPas at 25 °C.

當其黏性係100mPas或更少時,當該成份P被帶入與該模具接觸時,將該成份P充填進入模具上之細微圖案的凹入部份不會花費長時間。亦即,該光奈米壓印製程可被以高生產力施行。再者,由於填充不良之圖案缺陷係不太可能發生。 When the viscosity is 100 mPas or less, when the component P is brought into contact with the mold, it does not take a long time for the component P to be filled into the concave portion of the fine pattern on the mold. That is, the photon imprint process can be performed with high productivity. Furthermore, pattern defects due to poor filling are less likely to occur.

當其黏性係1mPas或更多時,於施加該成份P至基板的操作期間,不均勻之施加係不太可能發生。再者,當該成份P被帶入與該模具造成接觸時,該成份P係不太可能排出該模具的末端部份。 When the viscosity is 1 mPas or more, uneven application is less likely to occur during the operation of applying the component P to the substrate. Further, when the component P is brought into contact with the mold, the component P is less likely to be discharged from the end portion of the mold.

〔光硬化成份之表面張力〕 [surface tension of photohardening component]

排除該溶劑的成份P之各分量的混合物較佳地係在23℃具有5mN/m至70mN/m、更佳地係7mN/m至35mN/m、及進一步更佳地係10mN/m至32mN/m之表面張力。當其表面張力係5mN/m或更多時,當該成份P被帶入與該模具接觸時,將該成份P充填進入該模具上之細微圖案的凹入部份不會花費長時間。 The mixture excluding the components of the component P of the solvent is preferably from 5 mN/m to 70 mN/m, more preferably from 7 mN/m to 35 mN/m, and still more preferably from 10 mN/m to 32 mN at 23 °C. /m surface tension. When the surface tension is 5 mN/m or more, when the component P is brought into contact with the mold, it takes no time to fill the concave portion of the fine pattern on the mold when the component P is filled.

當其表面張力係70mN/m或更少時,藉由硬化該成份P所獲得之硬化產品具有表面平整度。 When the surface tension is 70 mN/m or less, the hardened product obtained by hardening the component P has surface flatness.

〔洗滌吸著媒介之方法及充填可光自由基聚合化合物進入液體儲存單元的方法〕 [Method of washing sorption medium and method of filling photo-radical polymerizable compound into liquid storage unit]

於此實施例中,在該成份P被充填進入該單元4中的儲存袋8之前,該吸著媒介23較佳地係被充分地預先洗滌,使得該吸著媒介23不會作用為該等微粒或該等金屬雜質的來源。該單元4之結構被敘述在下面。洗滌該吸著媒介23的方法之範例係參考圖2被敘述。 In this embodiment, the sorbent medium 23 is preferably sufficiently pre-washed before the component P is filled into the storage bag 8 in the unit 4, such that the sorption medium 23 does not act as such. Particles or sources of such metallic impurities. The structure of the unit 4 is described below. An example of a method of washing the sorbent medium 23 is described with reference to FIG.

容器201中所儲存的成份P被以泵浦204泵吸經過諸如管件之溝通件203。該成份P係由該泵浦204經過該溝 通件203、微粒計數器205、微粒過濾器206、及金屬雜質移除過濾器207餵入至該單元4中的儲存袋8。該吸著媒介23被預先放置在該儲存袋8中。在該儲存袋8被以該成份P充填之後,該溢流成份P經過該溝通件203被反饋至該容器201。 The component P stored in the container 201 is pumped by the pump 204 through a communication member 203 such as a tube. The component P is passed by the pump 204 through the trench The through piece 203, the particle counter 205, the particulate filter 206, and the metal impurity removing filter 207 are fed to the storage bag 8 in the unit 4. The sorption medium 23 is placed in the storage bag 8 in advance. After the storage bag 8 is filled with the component P, the overflow component P is fed back to the container 201 via the communication member 203.

雖然該泵浦204的操作係繼續的,該成份P通過該微粒過濾器206及該金屬雜質移除過濾器207數次。這允許該等微粒或該等金屬雜質被移除。如果該等微粒或該等金屬雜質係由該吸著媒介23產生,該等微粒或該等金屬雜質流入該成份P,且於該上面進程中被移去。 While the operation of the pump 204 continues, the component P passes through the particulate filter 206 and the metal impurity removal filter 207 several times. This allows the particles or the metal impurities to be removed. If the particles or the metal impurities are produced by the sorption medium 23, the particles or the metal impurities flow into the component P and are removed in the process.

如需要,該成份P中之微粒的濃度係以該微粒計數器205測量。在該成份P中之微粒的濃度抵達一預定值或更少之後,該泵浦204被停止,且該單元4係與該溝通件203分開及接著被全密封。 The concentration of the particles in the component P is measured by the particle counter 205, if necessary. After the concentration of the particles in the component P reaches a predetermined value or less, the pump 204 is stopped, and the unit 4 is separated from the communication member 203 and then fully sealed.

以使得該成份P的適當數量在該預定瞬間被由該容器201取得的方式,該成份P中的金屬雜質之含量可被檢查,且金屬元素被決定。在該成份P中的金屬雜質之含量抵達一預定值或更少之後,該泵浦204可被停止。 In such a manner that the appropriate amount of the component P is taken by the container 201 at the predetermined instant, the content of the metal impurities in the component P can be checked, and the metal element is determined. After the content of the metal impurities in the component P reaches a predetermined value or less, the pump 204 can be stopped.

該泵浦204的範例包括管件泵浦、隔膜泵浦、及齒輪泵浦。該微粒計數器205之範例包括液載微粒感測器KS系列(藉由RION股份有限公司所製造)、液體微粒計數器UltraChem系列(藉由微粒測量系統公司所製造)、液體微粒計數器SLS系列(藉由微粒測量系統公司所製造)、及液體微粒計數器HSLIS系列(藉由微粒測量系 統公司所製造)。 Examples of such pumps 204 include tube pumping, diaphragm pumping, and gear pumping. Examples of the particle counter 205 include a liquid particle sensor KS series (manufactured by RION Co., Ltd.), a liquid particle counter UltraChem series (manufactured by Particle Measurement Systems, Inc.), and a liquid particle counter SLS series (by Particle Measurement Systems, Inc., and Liquid Particle Counter HSLIS Series (by Particle Measurement System) Manufactured by the company).

該微粒過濾器206的範例包括“Ultipleat P-尼龍66”(藉由Nihon Pall有限公司所製造)、“Ultipor N66”(藉由Nihon Pall有限公司所製造)、“P Emflon”(藉由Nihon Pall有限公司所製造)、“LifeASSURE PSN系列”(藉由住友3M有限公司所製造)、“LifeASSURE EF系列”(藉由住友3M有限公司所製造)、“Photoshield”(藉由住友3M有限公司所製造)、“Electropor II EF”(藉由住友3M有限公司所製造)、“Microgard”(藉由Nihon Entegris K.K.公司所製造)、“Optimizer D”(藉由Nihon Entegris K.K.公司所製造)、“Impact Mini”(藉由Nihon Entegris K.K.公司所製造)、及“Impact 2”(藉由Nihon Entegris K.K.公司所製造)。這些過濾器可被獨自地或結合地使用。 Examples of the particulate filter 206 include "Ultipleat P-Nylon 66" (manufactured by Nihon Pall Co., Ltd.), "Ultipor N66" (manufactured by Nihon Pall Co., Ltd.), "P Emflon" (by Nihon Pall) Co., Ltd.), "LifeASSURE PSN Series" (manufactured by Sumitomo 3M Co., Ltd.), "LifeASSURE EF Series" (manufactured by Sumitomo 3M Co., Ltd.), "Photoshield" (manufactured by Sumitomo 3M Co., Ltd.) ), "Electropor II EF" (manufactured by Sumitomo 3M Co., Ltd.), "Microgard" (manufactured by Nihon Entegris KK), "Optimizer D" (manufactured by Nihon Entegris KK), "Impact Mini" (Manufactured by Nihon Entegris KK) and "Impact 2" (manufactured by Nihon Entegris KK). These filters can be used on their own or in combination.

該金屬雜質移除過濾器203之範例包括“Zeta Plus GN級”(藉由住友3M有限公司所製造)、“Electropor”(藉由住友3M有限公司所製造)、“Posidyne”(藉由Nihon Pall有限公司所製造)、“Ionkleen AN”(藉由Nihon Pall有限公司所製造)、“Ionkleen SL”(藉由Nihon Pall有限公司所製造)、及“Protego”(藉由Nihon Entegris K.K.公司所製造)。這些過濾器可被獨自地或結合地使用。 Examples of the metal impurity removal filter 203 include "Zeta Plus GN grade" (manufactured by Sumitomo 3M Co., Ltd.), "Electropor" (manufactured by Sumitomo 3M Co., Ltd.), "Posidyne" (by Nihon Pall) "Ionkleen AN" (manufactured by Nihon Pall Co., Ltd.), "Ionkleen SL" (manufactured by Nihon Pall Co., Ltd.), and "Protego" (manufactured by Nihon Entegris KK) . These filters can be used on their own or in combination.

該微粒過濾器206及該金屬雜質移除過濾器207較佳地係具有譬如0.001微米至5.0微米、及更佳地係0.003 微米至0.01微米的孔徑。當該微粒及金屬雜質移除過濾器206及207之孔徑係大於5.0微米時,該微粒及金屬雜質移除過濾器206及207吸附該等微粒及該等金屬離子的能力係低的。當該微粒及金屬雜質移除過濾器206及207之孔徑係少於0.001微米時,該微粒及金屬雜質移除過濾器206及207捕集該成份P的各分量,且因此可儘可能變化該成份P之成份或可儘可能被插入。 The particulate filter 206 and the metal impurity removal filter 207 preferably have a thickness of, for example, 0.001 micrometers to 5.0 micrometers, and more preferably 0.003. A pore size of micron to 0.01 micron. When the pore size of the particulate and metal impurity removal filters 206 and 207 is greater than 5.0 microns, the particulate and metal impurity removal filters 206 and 207 have low ability to adsorb the particles and the metal ions. When the particle size of the particulate and metal impurity removal filters 206 and 207 is less than 0.001 microns, the particulate and metal impurity removal filters 206 and 207 capture components of the component P, and thus may vary as much as possible The ingredients of ingredient P can be inserted as much as possible.

該吸著媒介23較佳地係在譬如0℃至80℃、更佳地係10℃至60℃、及尤其更佳地係20℃至50℃的溫度被洗滌。該泵浦204較佳地係具有譬如0.01毫升/分至100毫升/分及更佳地係1毫升/分至10毫升/分之流率。 The sorbent medium 23 is preferably washed at a temperature of, for example, 0 ° C to 80 ° C, more preferably 10 ° C to 60 ° C, and particularly preferably 20 ° C to 50 ° C. The pump 204 preferably has a flow rate of, for example, from 0.01 ml/min to 100 ml/min and more preferably from 1 ml/min to 10 ml/min.

〔液體排出裝置〕 [liquid discharge device]

本發明係可適用於任何液體排出裝置,包括儲存奈米壓印液體、諸如光可硬化成份之全密封閉的儲存區段。如在此中所使用,該“液體”一詞包括具有相當低之黏性的流體、諸如溶膠狀物質。根據本發明之實施例的液體排出裝置之範例係在下面參考圖1、4及5所敘述。本發明不被限制於該範例。 The present invention is applicable to any liquid discharge device, including a storage of a nanoimprinted liquid, a fully sealed storage section such as a photohardenable component. As used herein, the term "liquid" includes fluids having a relatively low viscosity, such as sol-like materials. Examples of liquid discharge devices according to embodiments of the present invention are described below with reference to Figures 1, 4 and 5. The invention is not limited to this example.

圖1係根據本發明之實施例的液體排出裝置1(下文被稱為該“裝置1”)之概要視圖。該裝置1係一排出該液體9的裝置。如圖1中所示,該裝置1包括該單元4及壓力調整器12。該裝置1與底板2相反地放置該頭部3,該頭部被包括在該裝置1中。該裝置1能將該液體9排出 至被放置在該底板2上之基板6(經處理的基板)上。該底板2係以轉印構件5覆疊。該基板6使用未示出之吸引單元被吸引至該轉印構件5上。 1 is a schematic view of a liquid discharge device 1 (hereinafter referred to as "device 1") according to an embodiment of the present invention. The device 1 is a device for discharging the liquid 9. As shown in FIG. 1, the device 1 includes the unit 4 and a pressure regulator 12. The device 1 places the head 3 opposite the bottom plate 2, which head is included in the device 1. The device 1 can discharge the liquid 9 To the substrate 6 (treated substrate) placed on the substrate 2. The bottom plate 2 is covered with a transfer member 5. The substrate 6 is attracted to the transfer member 5 using a suction unit not shown.

該單元4包括該頭部3、全封閉的外殼7(儲存區段)、及該儲存袋8。該儲存袋8被放置在該外殼7中及為撓性的。該外殼7(儲存區段)中之空間被分開成與該頭部3的排出通口10相通之第一儲存空間、及藉由為分隔器的儲存袋8而與該第一儲存空間隔絕之第二儲存空間。於此實施例中,在該外殼7中的空間中,該儲存袋8中之空間形成該第一儲存空間,且在該儲存袋8外側的空間形成該第二儲存空間。 The unit 4 comprises the head 3, a fully enclosed outer casing 7 (storage section), and the storage bag 8. The storage bag 8 is placed in the outer casing 7 and is flexible. The space in the outer casing 7 (storage section) is divided into a first storage space that communicates with the discharge port 10 of the head 3, and is isolated from the first storage space by the storage bag 8 that is a divider. Second storage space. In this embodiment, in the space in the outer casing 7, the space in the storage bag 8 forms the first storage space, and the space outside the storage bag 8 forms the second storage space.

本發明不被限制於一組構,其中該第一儲存空間及該第二儲存空間係使用該儲存袋8彼此分開。該第一儲存空間及該第二儲存空間可使用撓性分隔器彼此分開。該分隔器不須被成袋狀。該外殼7的內側可藉由譬如似薄膜之撓性分隔器被分開成至少二空間。該儲存袋8中的空間可為該第二儲存空間,且在該儲存袋8外側之空間可為該第一儲存空間。 The present invention is not limited to a set of configurations in which the first storage space and the second storage space are separated from each other using the storage bag 8. The first storage space and the second storage space may be separated from each other using a flexible separator. The separator does not have to be bagged. The inside of the outer casing 7 can be separated into at least two spaces by a flexible separator such as a film. The space in the storage bag 8 may be the second storage space, and the space outside the storage bag 8 may be the first storage space.

於儲存液體填料的案例中,在下面被敘述,於該第二儲存空間中含有水,由對水之浸透性不佳的材料所製成之分隔器較佳地係被使用。此一材料的範例包括四氟乙烯-全氟烴基乙烯基乙醇共聚物(PFA)、改性聚四氟乙烯(改性PTFE)、尼龍(Ny)、低密度聚乙烯(LDPE)、及聚丙烯(PP)。 In the case of storing a liquid filler, as described below, water is contained in the second storage space, and a separator made of a material having poor water permeability is preferably used. Examples of such materials include tetrafluoroethylene-perfluoroalkyl vinyl alcohol copolymer (PFA), modified polytetrafluoroethylene (modified PTFE), nylon (Ny), low density polyethylene (LDPE), and polypropylene. (PP).

該液體9被儲存於該第一儲存空間、亦即該儲存袋8中之空間中。被儲存於該儲存袋8中的空間中之液體9被供給至該頭部3,且係由該頭部3的排出通口10排出。該液體9較佳地係被預先除氣。 The liquid 9 is stored in the first storage space, that is, in the space in the storage bag 8. The liquid 9 stored in the space in the storage bag 8 is supplied to the head 3, and is discharged from the discharge port 10 of the head 3. The liquid 9 is preferably pre-degassed.

於該單元4中,該吸著媒介23被儲存於該第一儲存空間中、亦即該儲存袋8中之空間。該吸著媒介23可被懸置在該液體9中或可被固定至該儲存袋8的內表面。該吸著媒介23不會阻斷該排出通口10係較佳的。 In the unit 4, the sorption medium 23 is stored in the first storage space, that is, the space in the storage bag 8. The sorption medium 23 can be suspended in the liquid 9 or can be fixed to the inner surface of the storage bag 8. It is preferred that the sorption medium 23 does not block the discharge port 10.

該儲存袋8係直接地連接至該頭部3,而在其間沒有管件或閥門。於本實施例中,既然滑動構件、諸如閥門不被使用於該儲存袋8及該頭部3之間,該液體9中的微粒之產生及以細微灰塵汙染該液體9被抑制。 The storage bag 8 is directly connected to the head 3 without a tube or valve therebetween. In the present embodiment, since a sliding member such as a valve is not used between the storage bag 8 and the head portion 3, generation of particles in the liquid 9 and contamination of the liquid 9 with fine dust are suppressed.

該裝置1另包括為被充填於該第二儲存空間中的流體之液體填料11、及調整該第二儲存空間中所充填的液體填料11之壓力的壓力調整器12。該液體填料11係無可壓縮性之流體、亦即不可壓縮的流體,並可為譬如液體或膠狀物質。該液體填料11較佳地係含水液體或膠體。 The apparatus 1 further includes a liquid filler 11 that is a fluid that is filled in the second storage space, and a pressure regulator 12 that adjusts the pressure of the liquid filler 11 filled in the second storage space. The liquid filler 11 is a fluid which is not compressible, that is, an incompressible fluid, and may be, for example, a liquid or a gelatinous substance. The liquid filler 11 is preferably an aqueous liquid or a gel.

該第二儲存空間、亦即該液體填料11被充填之空間係經過諸如管件的溝通件13連接至該壓力調整器12。該溝通件13係設有閥門14、閥門15、及被放置於該閥門14與該閥門15間之接頭16。 The second storage space, that is, the space in which the liquid filling material 11 is filled, is connected to the pressure regulator 12 via a communication member 13 such as a pipe. The communication member 13 is provided with a valve 14, a valve 15, and a joint 16 placed between the valve 14 and the valve 15.

該接頭16係由二可分開的接頭部份(未示出)所構成。既然該溝通件13係設有該接頭16,該溝通件13可為在該壓力調整器12與該閥門14間之位置和該壓力調整 器12分開。其結果是,該單元4能被由該裝置1的本體分離。 The joint 16 is constructed of two separable joint portions (not shown). Since the communication member 13 is provided with the joint 16, the communication member 13 can be at a position between the pressure regulator 12 and the valve 14 and the pressure adjustment The separator 12 is separated. As a result, the unit 4 can be separated by the body of the device 1.

如上述,該單元4被建構來可由該裝置1之本體分離。於該單元4被損壞或該儲存袋8中所儲存的液體9用盡之案例中,這允許該裝置1僅只藉由替換該單元4而再次被造成可使用。 As mentioned above, the unit 4 is constructed to be detachable from the body of the device 1. In the case where the unit 4 is damaged or the liquid 9 stored in the storage bag 8 is used up, this allows the device 1 to be used again only by replacing the unit 4.

在該單元4係由該裝置1的本體分離之前,該閥門14及該閥門15被關閉。於此一使得該外殼7中的壓力以該壓力調整器12被維持負壓之狀態中,該閥門14被關閉,藉此該外殼7中的壓力被維持負壓。因此,該液體9能被防止由該排出通口10滲漏。藉由關閉該閥門15,該液體填料11由該壓力調整器12之餵入被停止,且因此該液體填料11的滲漏11可被防止。 The valve 14 and the valve 15 are closed before the unit 4 is separated by the body of the device 1. Here, in a state where the pressure in the outer casing 7 is maintained at a negative pressure by the pressure regulator 12, the valve 14 is closed, whereby the pressure in the outer casing 7 is maintained at a negative pressure. Therefore, the liquid 9 can be prevented from leaking from the discharge port 10. By closing the valve 15, the feeding of the liquid packing 11 by the pressure regulator 12 is stopped, and thus the leakage 11 of the liquid packing 11 can be prevented.

該液體填料11被充填於該第二儲存空間中。如比較於氣體之體積,液體及膠體的體積係更不可能被溫度及壓力中之變化所影響。如此,縱使該裝置1的周遭溫度或壓力變動,該液體填料11之體積幾乎恆定的,且該第一儲存空間中之液體9的壓力中之變化被抑制。 The liquid filler 11 is filled in the second storage space. If compared to the volume of a gas, the volume of liquid and colloid is less likely to be affected by changes in temperature and pressure. Thus, even if the ambient temperature or pressure of the apparatus 1 fluctuates, the volume of the liquid filler 11 is almost constant, and the change in the pressure of the liquid 9 in the first storage space is suppressed.

該外殼7的一部份可形成緩衝部17。尤其是,該外殼7之壁面的一部份係由撓性薄膜所製成,藉此該緩衝部17被形成。當該裝置1之操作被停止或電源供給於該裝置1的操作期間被切斷時,該緩衝部17起作用。 A portion of the outer casing 7 can form a buffer portion 17. In particular, a portion of the wall surface of the outer casing 7 is made of a flexible film, whereby the buffer portion 17 is formed. The buffer portion 17 functions when the operation of the device 1 is stopped or the power is supplied to the device 1 during the operation.

由於譬如壓力或溫度中之變化,該液體填料11及該液體9的體積稍微變動。由於液體填料11及該液體9之 體積中的變化,該緩衝部17吸收壓力波動;因此,該第一儲存空間中之液體9的壓力波動被控制為小的。 The volume of the liquid filler 11 and the liquid 9 slightly varies due to changes in pressure or temperature. Due to the liquid filler 11 and the liquid 9 The buffer portion 17 absorbs pressure fluctuations in the change in volume; therefore, the pressure fluctuation of the liquid 9 in the first storage space is controlled to be small.

如比較於氣體之體積,既然該液體填料11的體積係更不可能被溫度或壓力中之變化所影響,如比較於氣體被充填於該第二儲存空間中的案例,此實施例係更有利的,其中該緩衝部17能被減縮尺寸。該緩衝部17不被限制於該外殼7係設有該緩衝部17之組構。該溝通件13可為設有該緩衝部17。 If compared to the volume of the gas, since the volume of the liquid filler 11 is less likely to be affected by changes in temperature or pressure, as compared to the case where the gas is filled in the second storage space, this embodiment is more advantageous. The buffer portion 17 can be reduced in size. The buffer portion 17 is not limited to the configuration in which the outer casing 7 is provided with the buffer portion 17. The communication member 13 can be provided with the buffer portion 17.

依據此實施例,該液體9被儲存於該儲存袋8中,且該液體填料11被充填在該儲存袋8的外面及該外殼7間之空間中。因此,該儲存袋8係幾乎不與氣體接觸。如此,氣體幾乎不會進入該儲存袋8,且該儲存袋8中的液體9之壓力中的增加能被抑制。 According to this embodiment, the liquid 9 is stored in the storage bag 8, and the liquid filler 11 is filled in the space between the outside of the storage bag 8 and the outer casing 7. Therefore, the storage bag 8 is hardly in contact with the gas. Thus, the gas hardly enters the storage bag 8, and the increase in the pressure of the liquid 9 in the storage bag 8 can be suppressed.

組成該儲存袋8之撓性構件可為譬如具有低透氣性的構件、諸如多層鋁薄膜。縱使氣泡在該液體填料11中產生,此一具有低透氣性之構件的使用抑制該等氣泡之透過進入該儲存袋8,且因此該儲存袋8中的液體9之壓力中的增加能被抑制。 The flexible member constituting the storage bag 8 may be, for example, a member having low gas permeability, such as a multilayer aluminum film. Even if bubbles are generated in the liquid filler 11, the use of such a member having low gas permeability suppresses the permeation of the bubbles into the storage bag 8, and thus the increase in the pressure of the liquid 9 in the storage bag 8 can be suppressed. .

該液體9被儲存於該第一儲存空間中,且該液體填料11被充填在該第二儲存空間中。該液體9及該液體填料11間之密度中的差異係少於該液體9及氣體間之密度中的差異。當衝擊被施加至該外殼7時,減少該第一儲存空間中所儲存之物質的密度及該第二儲存空間中所充填之物質的密度間之差異能夠使該儲存袋8的搖擺被減少。 The liquid 9 is stored in the first storage space, and the liquid filler 11 is filled in the second storage space. The difference in density between the liquid 9 and the liquid filler 11 is less than the difference in density between the liquid 9 and the gas. When an impact is applied to the outer casing 7, reducing the difference between the density of the material stored in the first storage space and the density of the material filled in the second storage space enables the sway of the storage bag 8 to be reduced.

在譬如氣體被充填於該第二儲存空間中之案例中,如比較於該液體9,該氣體的密度係微不足道地小。於此案例中,該氣體按照儲存該液體9的儲存袋8之運動而運動。如此,當衝擊被施加至該外殼7時,該氣體幾乎不會抑制該儲存袋8的運動,且因此該儲存袋8相當顯著地搖擺。 In the case where, for example, a gas is filled in the second storage space, the density of the gas is negligibly small as compared to the liquid 9. In this case, the gas moves in accordance with the movement of the storage bag 8 storing the liquid 9. Thus, when an impact is applied to the outer casing 7, the gas hardly inhibits the movement of the storage bag 8, and thus the storage bag 8 swings considerably.

於密度中與該第一儲存空間中所儲存之液體9具有小差異的液體填料11被充填在該第二儲存空間中。因此,該液體填料11在該外殼7中運動,而與含有該液體9之儲存袋8的運動無關。亦即,當衝擊被施加至該外殼7時,該液體填料11之運動及含有該液體9的儲存袋8之運動彼此抑制;因此,該儲存袋8的搖擺被減少。 A liquid filler 11 having a small difference in density from the liquid 9 stored in the first storage space is filled in the second storage space. Therefore, the liquid filler 11 moves in the outer casing 7 regardless of the movement of the storage bag 8 containing the liquid 9. That is, when the impact is applied to the outer casing 7, the movement of the liquid filler 11 and the movement of the storage bag 8 containing the liquid 9 are suppressed from each other; therefore, the sway of the storage bag 8 is reduced.

該液體填料11較佳地係具有由該液體9之密度的80%分佈至120%之密度。當該液體填料11具有在此範圍內的密度時,該儲存袋8之搖擺可被有效地減少。 The liquid filler 11 preferably has a density from 80% to 120% of the density of the liquid 9. When the liquid filler 11 has a density within this range, the sway of the storage bag 8 can be effectively reduced.

當氣體被充填於該第二儲存空間中時,該第一儲存空間中所儲存之液體9與該第二儲存空間中所充填的氣體間之密度中的差異被視為100%。當該液體填料11具有由該液體9之密度的80%分佈至120%之密度時,該液體填料11與該液體9間之密度中的差異係20%或更少。因此,如比較於氣體被充填於該第二儲存空間中之案例,該儲存袋8的搖擺能被減少至五分之一或更少。因該液體填料11及該液體9間之密度中的差異係小的,該儲存袋8係不太可能搖擺。該儲存袋8中所儲存之液體9的壓力波動 係藉由減少該儲存袋8之搖擺而被抑制。 When the gas is filled in the second storage space, the difference in density between the liquid 9 stored in the first storage space and the gas filled in the second storage space is regarded as 100%. When the liquid filler 11 has a density from 80% to 120% of the density of the liquid 9, the difference in density between the liquid filler 11 and the liquid 9 is 20% or less. Therefore, the swing of the storage bag 8 can be reduced to one-fifth or less as compared with the case where the gas is filled in the second storage space. Since the difference in density between the liquid filler 11 and the liquid 9 is small, the storage bag 8 is less likely to sway. Pressure fluctuation of the liquid 9 stored in the storage bag 8 It is suppressed by reducing the sway of the storage bag 8.

依據此實施例,該儲存袋8中所儲存之液體9的壓力波動可如上述被抑制。如此,與該第一儲存空間相通的頭部3中之液體9的壓力波動被抑制,且該頭部3中之壓力被維持負的。其結果是,來自該頭部3之液體9的滲漏(液體滲漏)能被抑制。 According to this embodiment, the pressure fluctuation of the liquid 9 stored in the storage bag 8 can be suppressed as described above. Thus, the pressure fluctuation of the liquid 9 in the head 3 communicating with the first storage space is suppressed, and the pressure in the head 3 is maintained negative. As a result, leakage (liquid leakage) of the liquid 9 from the head 3 can be suppressed.

於此實施例中,譬如,該外殼7之體積可為400毫升,該液體9的最初體積可為約250毫升,該吸著媒介23之體積可為50毫升,且該液體填料11的最初體積可為約100毫升。本發明不被限制於此組構。該外殼7之體積、該液體9的最初體積、該吸著媒介23之體積、及該液體填料11的最初體積可被適當地決定。譬如,該外殼7之體積可為400毫升,該吸著媒介23的體積可為50毫升,該液體9的最初體積可為約350毫升,且沒有液體填料11可在最初狀態中被充填於該第二儲存空間中。 In this embodiment, for example, the outer casing 7 may have a volume of 400 ml, the liquid 9 may have an initial volume of about 250 ml, the sorption medium 23 may have a volume of 50 ml, and the initial volume of the liquid filler 11 Can be about 100 ml. The invention is not limited to this configuration. The volume of the outer casing 7, the initial volume of the liquid 9, the volume of the sorption medium 23, and the initial volume of the liquid filler 11 can be appropriately determined. For example, the outer casing 7 may have a volume of 400 ml, the sorption medium 23 may have a volume of 50 ml, and the liquid 9 may have an initial volume of about 350 ml, and no liquid filler 11 may be filled in the initial state. In the second storage space.

組成該儲存袋8之撓性構件具有約10微米至200微米的厚度,且儘可能具有最多約5毫升至6毫升之體積。如此,組成該儲存袋8的撓性構件之體積係該液體填料11的體積與該液體9之體積的總和之約1%,且係充分小。因此,組成該儲存袋8的撓性構件與該液體填料11間之密度中的差異、及組成該儲存袋8的撓性構件與該液體9間之密度中的差異係可忽略的。 The flexible member constituting the storage bag 8 has a thickness of about 10 micrometers to 200 micrometers and as much as possible a volume of up to about 5 milliliters to 6 milliliters. Thus, the volume of the flexible member constituting the storage bag 8 is about 1% of the sum of the volume of the liquid filler 11 and the volume of the liquid 9, and is sufficiently small. Therefore, the difference in density between the flexible member constituting the storage bag 8 and the liquid filler 11, and the difference in density between the flexible member constituting the storage bag 8 and the liquid 9 are negligible.

組成該儲存袋8的撓性構件之範例係由鋁所製成的層疊薄膜,具有相當高之氣密性。該層疊薄膜通常具有約 10微米的厚度。鋁之密度係2.7g/cm3,且係相當多地大於該液體填料11的密度及該液體9之密度。該儲存袋8對該液體填料11的體積與該液體9之體積的總和之體積比率係少於1%。因此,該儲存袋8的密度係可忽略的。 An example of a flexible member constituting the storage bag 8 is a laminated film made of aluminum, which has a relatively high airtightness. The laminated film typically has a thickness of about 10 microns. The density of aluminum is 2.7 g/cm 3 and is considerably larger than the density of the liquid filler 11 and the density of the liquid 9. The storage bag 8 has a volume ratio of the volume of the liquid filler 11 to the sum of the volumes of the liquid 9 of less than 1%. Therefore, the density of the storage bag 8 is negligible.

該外殼7之內側被充填以該液體9及該液體填料11;因此,該儲存袋8的搖擺能被減少。其結果是,來自該排出通口10之液體9的滲漏能被抑制。 The inside of the outer casing 7 is filled with the liquid 9 and the liquid filler 11; therefore, the rocking of the storage bag 8 can be reduced. As a result, the leakage of the liquid 9 from the discharge port 10 can be suppressed.

在一些案例中,於該單元4係在該單元4上之狀態中,外力被施加至該溝通件13,以造成該外殼7相當顯著地搖擺。再者,於一些案例中,該單元4在該裝置1中運動。甚至於這些案例中,該單元4中的儲存袋8之搖擺被減少,且因此來自該頭部3的液體9之滲漏能被抑制。 In some cases, in the state in which the unit 4 is attached to the unit 4, an external force is applied to the communication member 13 to cause the outer casing 7 to swing considerably. Again, in some cases, the unit 4 moves in the device 1. Even in these cases, the sway of the storage bag 8 in the unit 4 is reduced, and thus the leakage of the liquid 9 from the head 3 can be suppressed.

圖3A係一說明,舉例說明該壓力調整器12。如圖3A中所示,該壓力調整器12可包括壓力感測器18、泵浦19、閥門20、儲存桶21、及控制器22。 FIG. 3A is an illustration of the pressure regulator 12. As shown in FIG. 3A, the pressure regulator 12 can include a pressure sensor 18, a pump 19, a valve 20, a reservoir 21, and a controller 22.

該壓力感測器18係壓力測量單元,用於測量該溝通件13中的液體填料11之壓力。以該壓力感測器18所測量的壓力係該液體填料11相對於該裝置1中之壓力的相對壓力。為了避免擾動之影響,該壓力感測器18較佳地係被放置接近該閥門15。 The pressure sensor 18 is a pressure measuring unit for measuring the pressure of the liquid filler 11 in the communication member 13. The pressure measured by the pressure sensor 18 is the relative pressure of the liquid packing 11 relative to the pressure in the apparatus 1. To avoid the effects of disturbances, the pressure sensor 18 is preferably placed in proximity to the valve 15.

該液體填料11被儲存於該儲存桶21中。該泵浦19在該儲存桶21與該外殼7之間傳送該液體填料11。泵浦19的範例包括管泵、隔膜泵、及齒輪泵。該閥門20係位於該泵浦19與該儲存桶21之間,且通常被關上。 The liquid filler 11 is stored in the storage tub 21. The pump 19 transfers the liquid filling 11 between the storage tub 21 and the outer casing 7. Examples of pumps 19 include tube pumps, diaphragm pumps, and gear pumps. The valve 20 is located between the pump 19 and the reservoir 21 and is normally closed.

該壓力感測器18測量該液體填料11的壓力及傳輸對應於其壓力之信號至該控制器22。該控制器22基於該溝通件13中的液體填料11之壓力控制該閥門20及該泵浦19的操作。於此一使得該閥門20係打開之狀態中驅動該泵浦19在該儲存桶21之間運動該液體填料11,以將該外殼7中的壓力調整至預定值。 The pressure sensor 18 measures the pressure of the liquid fill 11 and transmits a signal corresponding to its pressure to the controller 22. The controller 22 controls the operation of the valve 20 and the pump 19 based on the pressure of the liquid packing 11 in the communication member 13. In this state, the pump 20 is driven to move the liquid filler 11 between the storage tubs 21 to adjust the pressure in the outer casing 7 to a predetermined value.

該裝置1之操作係在下面參考圖3B及4被敘述。圖3B係一說明,顯示該儲存袋8由圖3A所示狀態收縮的狀態,而與該液體9之消耗有關聯。圖4係流程圖,顯示該液體填料11之壓力如何使用該壓力感測器18及該控制器22被控制。 The operation of the apparatus 1 is described below with reference to Figures 3B and 4. Fig. 3B is an illustration showing the state in which the storage bag 8 is contracted by the state shown in Fig. 3A, and is associated with the consumption of the liquid 9. Figure 4 is a flow chart showing how the pressure of the liquid fill 11 is controlled using the pressure sensor 18 and the controller 22.

當該裝置1被開動時,該控制器22開始控制該外殼7中的壓力。 When the device 1 is actuated, the controller 22 begins to control the pressure in the housing 7.

由該頭部3之排出通口10排出該液體9減少該儲存袋8中所儲存的液體9之數量,以減少該儲存袋8的體積。於該閥門20被關閉之此一狀態中,該外殼7及該溝通件13被密封;因此,該外殼7及該溝通件13中之液體填料11的壓力被減少。 Discharging the liquid 9 from the discharge port 10 of the head 3 reduces the amount of liquid 9 stored in the storage bag 8 to reduce the volume of the storage bag 8. In the state in which the valve 20 is closed, the outer casing 7 and the communication member 13 are sealed; therefore, the pressure of the liquid filler 11 in the outer casing 7 and the communication member 13 is reduced.

該控制器22允許該壓力感測器18測量該溝通件13中之液體填料11的壓力(S40)。該壓力感測器18傳輸對應於該液體填料11之經測量壓的信號至該控制器22。該控制器22基於由該壓力感測器18所傳輸之信號來控制該泵浦19及該閥門20的操作。 The controller 22 allows the pressure sensor 18 to measure the pressure of the liquid filling 11 in the communication member 13 (S40). The pressure sensor 18 transmits a signal corresponding to the measured pressure of the liquid fill 11 to the controller 22. The controller 22 controls the operation of the pump 19 and the valve 20 based on signals transmitted by the pressure sensor 18.

尤其是,該控制器22判斷該溝通件13中之液體填料 11的壓力是否係在預定範圍內(S41)。於該控制器22判斷該溝通件13中之液體填料11的壓力係低於該預定範圍之案例中,該控制器22打開該閥門20及驅動該泵浦19(S42)。該泵浦19由該儲存桶21餵入該液體填料11至該外殼7,藉此該外殼7中的壓力被增加(充填步驟)。 In particular, the controller 22 determines the liquid filler in the communication member 13. Whether the pressure of 11 is within a predetermined range (S41). In the case where the controller 22 determines that the pressure of the liquid filler 11 in the communication member 13 is lower than the predetermined range, the controller 22 opens the valve 20 and drives the pump 19 (S42). The pump 19 feeds the liquid packing 11 from the storage tank 21 to the outer casing 7, whereby the pressure in the outer casing 7 is increased (filling step).

此後,該壓力感測器18再次測量該溝通件13中之液體填料11的壓力(S40),且該控制器22判斷該溝通件13中之液體填料11的壓力是否係在該預定範圍內(S41)。於此之案例中,該控制器22判斷該溝通件13中之液體填料11的壓力係在該預定範圍內,該控制器22關閉該閥門20且停止該泵浦19。其結果是,該液體填料11由該儲存桶21之餵入至該外殼被停止,且該外殼7中的壓力中之增加被停止。 Thereafter, the pressure sensor 18 measures the pressure of the liquid filler 11 in the communication member 13 again (S40), and the controller 22 determines whether the pressure of the liquid filler 11 in the communication member 13 is within the predetermined range ( S41). In this case, the controller 22 determines that the pressure of the liquid fill 11 in the communication member 13 is within the predetermined range, and the controller 22 closes the valve 20 and stops the pump 19. As a result, the liquid filler 11 is stopped by the feeding of the storage tub 21 to the outer casing, and the increase in the pressure in the outer casing 7 is stopped.

如上述,該控制器22基於使用該壓力感測器18所測量的結果來控制該閥門20及該泵浦19的操作,藉此該外殼7中之壓力係在該預定範圍內被調整(壓力調整步驟)。 As described above, the controller 22 controls the operation of the valve 20 and the pump 19 based on the results measured using the pressure sensor 18, whereby the pressure in the outer casing 7 is adjusted within the predetermined range (pressure Adjustment steps).

於該外殼7中之壓力係過度地增加的案例中,該液體填料11係使用該泵浦19由該外殼7傳送至該儲存桶21。這允許該外殼7中之壓力被減少。 In the case where the pressure in the outer casing 7 is excessively increased, the liquid filling 11 is transferred from the outer casing 7 to the storage tub 21 using the pump 19. This allows the pressure in the outer casing 7 to be reduced.

在該外殼7中的壓力被調整之後,該控制器22判斷該壓力控制是否被停止(S43)。於該控制器22判斷該壓力控制不被停止的案例中,該控制器22允許該壓力感測 器18測量該溝通件13中之液體填料11的壓力(S40)。 After the pressure in the casing 7 is adjusted, the controller 22 determines whether the pressure control is stopped (S43). In the case where the controller 22 determines that the pressure control is not stopped, the controller 22 allows the pressure sensing The device 18 measures the pressure of the liquid filler 11 in the communication member 13 (S40).

於此實施例中,該壓力調整器12如上述調整該頭部3中之液體9的壓力,藉此該排出通口10中之液體9的新月形被很好地維持。如此,該頭部3之排出穩定性被增強。 In this embodiment, the pressure regulator 12 adjusts the pressure of the liquid 9 in the head 3 as described above, whereby the crescent shape of the liquid 9 in the discharge port 10 is well maintained. As such, the discharge stability of the head 3 is enhanced.

既然該液體填料11與該液體9的消耗有關聯地被充填於該第二儲存空間中,該頭部3中之液體9的壓力被維持,而不管該液體9之消耗。當該外殼7具有較大體積時,這對於該裝置1係有利的。增加該外殼7之體積能夠使替換該單元4的頻率被減少。 Since the liquid filling 11 is filled in the second storage space in association with the consumption of the liquid 9, the pressure of the liquid 9 in the head 3 is maintained irrespective of the consumption of the liquid 9. This is advantageous for the device 1 when the outer casing 7 has a large volume. Increasing the volume of the outer casing 7 enables the frequency of replacing the unit 4 to be reduced.

諸如泵浦之可運動機構大致上有微粒係由於其操作而產生的問題。於此實施例中,該壓力調整器12未與該液體9直接接觸。因此,縱使該等微粒係由於該壓力調整器12之操作所產生,該等微粒僅只進入該液體填料11,且不會進入該液體9。如此,有由於該壓力調整器12而以該等微粒污染該液體9能被減少的優點。 A movable mechanism such as a pump has a problem that a particle system is caused by its operation. In this embodiment, the pressure regulator 12 is not in direct contact with the liquid 9. Therefore, even if the particles are generated by the operation of the pressure regulator 12, the particles enter only the liquid filler 11 and do not enter the liquid 9. Thus, there is an advantage that the liquid 9 can be reduced by the particulate regulator due to the pressure regulator 12.

依據此實施例,該外殼7被充填以該液體9及該液體填料11,且因此該液體9之壓力可僅只藉由測量該液體填料11的壓力而被決定。該液體填料11的壓力中之變化幾乎不會被該儲存袋8的變形所影響。如此,該液體9之壓力係藉由測量該液體填料11的壓力所精確地決定。 According to this embodiment, the outer casing 7 is filled with the liquid 9 and the liquid filler 11, and thus the pressure of the liquid 9 can be determined only by measuring the pressure of the liquid filler 11. The change in the pressure of the liquid filler 11 is hardly affected by the deformation of the storage bag 8. Thus, the pressure of the liquid 9 is precisely determined by measuring the pressure of the liquid filler 11.

既然該液體9之壓力被精確地決定,該頭部3中的液體9能被維持在想要之負壓,且該等排出通口10中的液體9之新月形被很好地維持。其結果是,該頭部3的排出 穩定性被增強。 Since the pressure of the liquid 9 is precisely determined, the liquid 9 in the head 3 can be maintained at a desired negative pressure, and the crescent of the liquid 9 in the discharge ports 10 is well maintained. As a result, the discharge of the head 3 Stability is enhanced.

既然該液體填料11及該液體9係液體,該液體填料11及該液體9的體積中之變化係少於氣體的體積中之變化,且該液體填料11及該液體9的壓力不會快速地變動。 Since the liquid filler 11 and the liquid 9-series liquid, the change in the volume of the liquid filler 11 and the liquid 9 is less than the change in the volume of the gas, and the pressure of the liquid filler 11 and the liquid 9 does not rapidly change.

當該儲存袋8與如圖3B中所示液體9之消耗有關聯地收縮時,該外殼7視該儲存袋8的收縮而定被再充填以該液體填料11。該液體填料21與液體9間之密度中的差異係相當小。因此,縱使該外殼7中的液體填料11及液體9間之體積比率變動,與該液體9的消耗有關聯之外殼7中的密度中之變化係相當小。因此,由於其間之體積比率中的變化,壓力波動不須被補償,且該裝置1之結構可被簡化。 When the storage bag 8 is contracted in association with the consumption of the liquid 9 as shown in Fig. 3B, the outer casing 7 is refilled with the liquid filling 11 depending on the contraction of the storage bag 8. The difference in density between the liquid filler 21 and the liquid 9 is quite small. Therefore, even if the volume ratio between the liquid filler 11 and the liquid 9 in the outer casing 7 fluctuates, the change in density in the outer casing 7 associated with the consumption of the liquid 9 is relatively small. Therefore, the pressure fluctuation does not have to be compensated due to the change in the volume ratio therebetween, and the structure of the apparatus 1 can be simplified.

〔製造硬化產品圖案的方法〕 [Method of Manufacturing Hardened Product Pattern]

製造根據本發明之實施例的硬化產品圖案之方法被敘述在下面。圖5A至5G係概要剖視圖,顯示製造該硬化產品圖案的方法。 A method of manufacturing a hardened product pattern according to an embodiment of the present invention is described below. 5A to 5G are schematic cross-sectional views showing a method of manufacturing the hardened product pattern.

製造該硬化產品圖案的方法包括使用該前述液體排出裝置將光可硬化成份放置在基板上之第一步驟(1)、將該光硬化成份帶入與模具接觸之第二步驟(2)、用光線照射該光硬化成份以將該光硬化成份硬化成一經硬化的產品之第三步驟(3)、及將該第三步驟中所獲得之經硬化的產品與該模具彼此分開之第四步驟(4)。 The method for producing the hardened product pattern comprises the first step (1) of placing the photohardenable component on the substrate using the liquid discharge device, and the second step (2) of bringing the photohardenable component into contact with the mold, a third step (3) of irradiating the photohardenable component with light to harden the photohardenable component into a hardened product, and a fourth step of separating the hardened product obtained in the third step from the mold (the fourth step) 4).

製造該硬化產品圖案的方法係使用該光奈米壓印製程之方法。 The method of manufacturing the hardened product pattern is a method using the photon imprint process.

該硬化產品圖案較佳地係具有圖案的硬化產品,該圖案具有1奈米至10毫米、且更佳地係10奈米至100微米之尺寸。大致上,用於使用光線製備具有奈米尺寸(1奈米至100奈米)的圖案(不規則結構)之硬化產品的圖案形成技術被稱為該光奈米壓印製程。製造該硬化產品圖案之方法使用該光奈米壓印製程。 The hardened product pattern is preferably a patterned hardened product having a size of from 1 nanometer to 10 millimeters, and more preferably from 10 nanometers to 100 micrometers. In general, a pattern forming technique for preparing a hardened product having a pattern (irregular structure) having a nanometer size (1 nm to 100 nm) using light is referred to as the photon nanoimprinting process. The method of manufacturing the hardened product pattern uses the photon nanoimprint process.

每一步驟被敘述在下面。 Each step is described below.

〔放置步驟(1)〕 [Placement step (1)]

於此步驟(放置步驟)中,如圖5A中所示,該液體9使用該裝置1被放置在(施加至)該基板6上,藉此濕薄膜被形成。 In this step (placement step), as shown in Fig. 5A, the liquid 9 is placed (applied) on the substrate 6 using the apparatus 1, whereby a wet film is formed.

作為該液體9被放置在其上之標靶的基板6係經處理之基板,且通常為矽晶圓。於藉由製造該硬化產品圖案的方法製造壓印模具之案例中,該基板6可為石英基板。於製造該壓印模具的案例中,該基板6可為在其上面具有金屬化合物層之石英基板。 The substrate 6 as the target on which the liquid 9 is placed is a processed substrate, and is usually a germanium wafer. In the case of manufacturing an imprint mold by a method of manufacturing the hardened product pattern, the substrate 6 may be a quartz substrate. In the case of manufacturing the imprint mold, the substrate 6 may be a quartz substrate having a metal compound layer thereon.

在本實施例中,該基板6不被限制於該矽水或該石英基板。該基板6可被任意地選自習知半導體裝置基板、諸如鋁基板、鈦鎢合金基板、鋁矽合金基板、鋁銅合金基板、氧化矽基板、及氮化矽基板。所使用的基板6(經處理之基板)可為遭受表面處理之基板,該表面處理包括矽 烷耦合處理、矽烷處理、及有機薄膜的形成,而對該液體9具有增加之親和力。 In the present embodiment, the substrate 6 is not limited to the hydrophobic water or the quartz substrate. The substrate 6 can be arbitrarily selected from conventional semiconductor device substrates such as an aluminum substrate, a titanium tungsten alloy substrate, an aluminum-niobium alloy substrate, an aluminum-copper alloy substrate, a tantalum oxide substrate, and a tantalum nitride substrate. The substrate 6 (treated substrate) used may be a substrate subjected to surface treatment including 矽 The alkane coupling treatment, the decane treatment, and the formation of an organic film have an increased affinity for the liquid 9.

形狀轉印層(濕薄膜)的厚度視其應用而定,且係譬如0.01微米至100.0微米。 The thickness of the shape transfer layer (wet film) depends on its application, and is, for example, from 0.01 micrometers to 100.0 micrometers.

〔模具接觸步驟(2)〕 [Mold contact step (2)]

其次,如圖5B中所示,具有用於轉印圖案形狀之細微圖案的模具104被帶入與該濕薄膜接觸,該濕薄膜係由該液體9所製成,且係在該先前步驟(放置步驟)(圖5B1)中被形成。這允許該濕薄膜之由該液體9所製成的部份被充填進入該模具104之細微圖案的凹入部份,藉此塗覆薄膜106被形成,以便被充填於該模具104之細微圖案中(圖5B2)。 Next, as shown in Fig. 5B, a mold 104 having a fine pattern for transferring a pattern shape is brought into contact with the wet film, which is made of the liquid 9, and is in the previous step ( The placement step) (Fig. 5B1) is formed. This allows the portion of the wet film made of the liquid 9 to be filled into the concave portion of the fine pattern of the mold 104, whereby the coating film 106 is formed so as to be filled in the fine pattern of the mold 104. Medium (Figure 5B2).

考慮該下一步驟(光照射步驟),該模具104較佳地係由透光材料所製成。尤其是,組成該模具104的材料較佳地係玻璃、石英、諸如聚甲基丙烯酸甲酯(PMMA)或聚碳酸酯之透明樹脂、透明的蒸氣沉積金屬薄膜、諸如聚二甲基矽氧烷薄膜之撓性薄膜、光硬化薄膜、金屬薄膜等。於使用該透明樹脂來組成該模具104的案例中,該透明樹脂需要被選擇,以便不被溶解該液體9中所含有之分量中。組成該模具104的材料尤其較佳地係石英,因為石英具有小熱膨脹係數,且圖案之應變係小的。 Considering this next step (light irradiation step), the mold 104 is preferably made of a light transmissive material. In particular, the material constituting the mold 104 is preferably glass, quartz, a transparent resin such as polymethyl methacrylate (PMMA) or polycarbonate, a transparent vapor deposited metal film such as polydimethyl methoxyoxane. Flexible film, photo-cured film, metal film, etc. of film. In the case of using the transparent resin to constitute the mold 104, the transparent resin needs to be selected so as not to be dissolved in the component contained in the liquid 9. The material constituting the mold 104 is particularly preferably quartz because quartz has a small coefficient of thermal expansion and the strain strain of the pattern is small.

該模具104之細微圖案較佳地係具有4奈米至200奈米的高度及1至10之縱橫比。 The fine pattern of the mold 104 preferably has a height of 4 nm to 200 nm and an aspect ratio of 1 to 10.

為了增強該模具104由該液體9的剝離性,該模具104可於此步驟之前被表面處理,其係將該液體9帶入與該模具104接觸的模具接觸步驟。 To enhance the peelability of the mold 104 from the liquid 9, the mold 104 can be surface treated prior to this step by bringing the liquid 9 into a mold contact step in contact with the mold 104.

於此步驟(模具接觸步驟)中,當該液體9如圖5B1中所示被帶入與該模具104造成接觸時,被施加至該液體9之壓力未特別受限制。於此步驟中,該液體9與該模具104的接觸時間未特別受限制。 In this step (mold contact step), when the liquid 9 is brought into contact with the mold 104 as shown in Fig. 5B1, the pressure applied to the liquid 9 is not particularly limited. In this step, the contact time of the liquid 9 with the mold 104 is not particularly limited.

此步驟可在空氣大氣、真空大氣、及惰性大氣的任一者之下被施行,且較佳地係在真空或惰性大氣之下被施行,因為氧或濕氣在硬化反應上的影響可被防止。 This step can be carried out under any of an air atmosphere, a vacuum atmosphere, and an inert atmosphere, and is preferably carried out under a vacuum or an inert atmosphere because the influence of oxygen or moisture on the hardening reaction can be prevent.

該模具接觸步驟可在含有可冷凝氣體的大氣(下文被稱為該“可冷凝氣體的大氣”)之下被施行。如在此中所使用,該“可冷凝氣體”一詞意指藉由該毛細管壓力被冷凝及液化之氣體,當大氣中的氣體隨同該塗覆薄膜106(之部分)被充填進入該模具104之細微圖案的凹入部份、及該模具104與該基板6間之間隙時,產生該毛細管壓力。在該液體9(形狀轉印層)被帶入與該模具104造成接觸之前(圖5B1),該可冷凝氣體係存在於大氣中。 The mold contacting step can be performed under an atmosphere containing a condensable gas (hereinafter referred to as "the atmosphere of the condensable gas"). As used herein, the term "condensable gas" means a gas that is condensed and liquefied by the capillary pressure, and a gas in the atmosphere is filled into the mold 104 along with (part of) the coated film 106. The capillary pressure is generated when the concave portion of the fine pattern and the gap between the mold 104 and the substrate 6 are formed. Before the liquid 9 (shape transfer layer) is brought into contact with the mold 104 (Fig. 5B1), the condensable gas system is present in the atmosphere.

被充填於該細微圖案的凹入部份中之氣體係藉由在該可冷凝氣體的大氣之下施行該模具接觸步驟所液化,且因此氣泡被消除;因此,充填性質係優異的。該可冷凝氣體可被溶解在該液體9中。 The gas system filled in the concave portion of the fine pattern is liquefied by performing the mold contacting step under the atmosphere of the condensable gas, and thus the bubbles are eliminated; therefore, the filling property is excellent. The condensable gas can be dissolved in the liquid 9.

〔對齊步驟(3)〕 [Alignment step (3)]

其次,該模具104之位置及/或該基板6的位置如所需要地被調整,使得該模具104之定位記號105與該基板6的定位記號103重合。對齊步驟係非不可缺的,並可視應用而定被省略。 Next, the position of the mold 104 and/or the position of the substrate 6 is adjusted as needed such that the positioning mark 105 of the mold 104 coincides with the positioning mark 103 of the substrate 6. The alignment step is indispensable and can be omitted depending on the application.

〔光照射步驟(4)〕 [Light irradiation step (4)]

其次,如圖5D中所示,於使得該模具104及該基板6在該對齊步驟中被互相對齊之狀態中,與該模具104接觸的液體9之一部份係以經過該模具104的光照射。尤其是,被充填於該模具104之細微圖案中的塗覆薄膜106係以經過該模具104之光照射。(圖5D1)。這允許該模具104的細微圖案中所充填之塗覆薄膜106被光所硬化,藉此形成一硬化產品108(圖5D2)。被施加至該液體9的光係視該液體9之敏感性波長而定被選擇,該液體9組成被充填於該模具104的細微圖案中之塗覆薄膜106。尤其是,具有150奈米至400奈米的波長之紫外線、X光、電子束等被適當地選擇及較佳地係被使用。 Next, as shown in FIG. 5D, in a state in which the mold 104 and the substrate 6 are aligned with each other in the alignment step, a portion of the liquid 9 in contact with the mold 104 is light passing through the mold 104. Irradiation. In particular, the coated film 106 that is filled in the fine pattern of the mold 104 is irradiated with light passing through the mold 104. (Fig. 5D1). This allows the coated film 106 filled in the fine pattern of the mold 104 to be hardened by light, thereby forming a hardened product 108 (Fig. 5D2). The light applied to the liquid 9 is selected depending on the sensitivity wavelength of the liquid 9, which constitutes the coated film 106 which is filled in the fine pattern of the mold 104. In particular, ultraviolet rays, X-rays, electron beams, and the like having a wavelength of from 150 nm to 400 nm are appropriately selected and preferably used.

被施加至該液體9的光(照射光107)尤其較佳地係紫外線。這是因為大部份市售硬化助劑(光聚合引發劑)係對紫外線敏感的 The light (irradiation light 107) applied to the liquid 9 is particularly preferably ultraviolet. This is because most commercially available hardening aids (photopolymerization initiators) are UV sensitive.

〔脫模步驟(5)〕 [Mold release step (5)]

其次,該硬化產品108及該模具104係彼此分開。於此操作中,該基板6係以具有預定圖案形狀(硬化產品圖 案)之硬化薄膜109覆疊。 Second, the hardened product 108 and the mold 104 are separated from each other. In this operation, the substrate 6 has a predetermined pattern shape (hardened product pattern) The hardened film 109 of the case is overlaid.

於此步驟(脫模步驟)中,如圖5E中所示,該硬化產品108及該模具104係彼此分開,且該硬化薄膜109被獲得。該硬化薄膜109具有圖案形狀、在該步驟(4)(光照射步驟)中被形成、而與該模具104的細微圖案顛倒。 In this step (release step), as shown in FIG. 5E, the hardened product 108 and the mold 104 are separated from each other, and the hardened film 109 is obtained. The cured film 109 has a pattern shape, is formed in the step (4) (light irradiation step), and is reversed from the fine pattern of the mold 104.

經過包括該等上面步驟(1)至(5)的一系列步驟(製造製程),該硬化薄膜109能被獲得,以便具有位在想要位置之想要的不規則圖案形狀(在該模具104的細微圖案之後的圖案形狀)。所獲得之硬化薄膜109能被用作譬如光學構件、諸如菲涅耳透鏡或繞射光柵(包括該硬化薄膜109被使用當作光學構件的零組件之案例)。於此案例中,以下構件能被獲得:包括該基板6及該硬化薄膜109的光學構件,其具有一圖案形狀,被放置在該基板6上。 The cured film 109 can be obtained by a series of steps (manufacturing processes) including the above steps (1) to (5) so as to have a desired irregular pattern shape at a desired position (in the mold 104) The pattern shape after the fine pattern). The obtained hardened film 109 can be used as, for example, an optical member such as a Fresnel lens or a diffraction grating (including a case where the hardened film 109 is used as a component of an optical member). In this case, the following members can be obtained: an optical member including the substrate 6 and the cured film 109, which has a pattern shape and is placed on the substrate 6.

於製造該硬化產品圖案之方法中,由該等步驟(1)至(5)所構成的重複單元(發射)可在該相同之經處理基板上被反覆地施行數次。重複由該等步驟(1)至(5)所構成的重複單元(發射)數次能夠使具有複數個位於該經處理基板上之想要位置的不規則圖案形狀(在該模具104的細微圖案之後的圖案形狀)之硬化薄膜被獲得。 In the method of producing the hardened product pattern, the repeating unit (emission) composed of the steps (1) to (5) can be repeatedly performed several times on the same treated substrate. Repeating the repeating unit (emission) composed of the steps (1) to (5) several times enables an irregular pattern shape (a fine pattern in the mold 104) having a plurality of desired positions on the processed substrate A cured film of the subsequent pattern shape is obtained.

〔移去部份硬化薄膜的殘留薄膜移去步驟(6)〕 [Removing the residual film of the partially cured film and removing the step (6)]

雖然在該脫模步驟、亦即該步驟(5)中所獲得之硬化薄膜109具有特定的圖案形狀,該硬化薄膜109之一部 份有時候留在異於具有此圖案形狀的區域之區域中(該硬化薄膜109的此一部份在下文被稱為該“殘留薄膜”)。於此案例中,如圖5F中所示,位在應被移去之區域中的殘留薄膜係由該硬化薄膜109移去,其具有所獲得之圖案形狀。這允許具有想要的不規則圖案之硬化產品圖案110(在該模具104的細微圖案之後的圖案形狀)被獲得。 Although the hardened film 109 obtained in the demolding step, that is, in the step (5) has a specific pattern shape, one portion of the cured film 109 The portion is sometimes left in a region different from the region having the shape of the pattern (this portion of the cured film 109 is hereinafter referred to as the "residual film"). In this case, as shown in Fig. 5F, the residual film in the region to be removed is removed from the cured film 109, which has the obtained pattern shape. This allows the hardened product pattern 110 (the pattern shape after the fine pattern of the mold 104) having the desired irregular pattern to be obtained.

移去該殘留薄膜之方法係如下:譬如,作為該硬化薄膜109的凹入部份之殘留薄膜係藉由諸如蝕刻的製程所移去,使得該基板6之表面係經過藉由該硬化薄膜109所擁有之圖案的凹入部份被暴露。 The method of removing the residual film is as follows: For example, the residual film as the concave portion of the cured film 109 is removed by a process such as etching, so that the surface of the substrate 6 passes through the cured film 109. The concave portion of the pattern that is owned is exposed.

在藉由蝕刻法移去作為該硬化薄膜109之凹入部份的殘留薄膜之案例中,所使用的特別製程未特別受限制,且譬如,諸如乾燥蝕刻法之習知製程可被使用。用於乾燥蝕刻法,習知的乾燥蝕刻系統能被使用。 In the case of removing the residual film as the concave portion of the cured film 109 by etching, the special process used is not particularly limited, and, for example, a conventional process such as a dry etching method can be used. For dry etching, conventional dry etching systems can be used.

該硬化產品圖案110可藉由包括該等上面步驟(1)至(6)的製造製程被獲得,以便具有位於想要位置之想要的不規則圖案形狀(在該模具104的細微圖案之後的圖案形狀)。具有該硬化產品圖案110之物件能被獲得。再者,於下面的基板處理步驟(步驟(7))係在使用該硬化產品圖案110處理該基板6之案例中被施行。 The hardened product pattern 110 can be obtained by a manufacturing process including the above steps (1) to (6) to have a desired irregular pattern shape at a desired position (after the fine pattern of the mold 104) Pattern shape). An article having the hardened product pattern 110 can be obtained. Furthermore, the following substrate processing step (step (7)) is performed in the case of processing the substrate 6 using the hardened product pattern 110.

光學零組件能使用該硬化產品圖案110當作光學構件、諸如繞射光柵或偏振器而被獲得(包括該硬化產品圖案110被使用當作光學構件的零組件之案例)。於此案例中,以下構件能被獲得:包括該基板6及被放置在該基板 6上的硬化產品圖案110之光學構件。 The optical component can be obtained using the hardened product pattern 110 as an optical member such as a diffraction grating or a polarizer (including the case where the hardened product pattern 110 is used as a component of an optical member). In this case, the following components can be obtained: including the substrate 6 and being placed on the substrate The optical member of the hardened product pattern 110 on 6.

〔基板處理步驟(7)〕 [Substrate processing step (7)]

在此實施例中被獲得的硬化產品圖案110能被用作層間隔離薄膜,供使用於藉由半導體裝置作為典型之電子零組件中、諸如大型積體電路(LSIs)、系統LSIs、動態隨機存取存儲器(DRAMs)、同步DRAM(SDRAMs)、Rambus DRAM(RDRAMs)、及Direct RDRAMs(D-RDRAMs)。再者,該硬化產品圖案110能被用作半導體裝置製造用之抗蝕劑薄膜。 The hardened product pattern 110 obtained in this embodiment can be used as an interlayer insulating film for use in a typical electronic component such as a large-scale integrated circuit (LSIs), system LSIs, dynamic random memory by a semiconductor device. Take memory (DRAMs), synchronous DRAMs (SDRAMs), Rambus DRAMs (RDRAMs), and Direct RDRAMs (D-RDRAMs). Further, the hardened product pattern 110 can be used as a resist film for semiconductor device fabrication.

於使用該硬化產品圖案110當作抗蝕劑薄膜的案例中,具有於該殘留薄膜移去步驟、亦即該步驟(6)中暴露之表面的基板6之一部份(藉由圖5F中之參考數字111所代表的區域)被蝕刻或被離子植入。於此操作中,該硬化產品圖案110用作蝕刻罩幕。此外,基於該硬化產品圖案110之圖案形狀的電路結構112(圖5G)能藉由形成電子零組件而被形成在該基板6上。這能夠讓譬如供使用於半導體裝置、諸如LSIs、系統LSIs、DRAMs、SDRAMs、RDRAMs、及D-RDRAMs之電路板被製成。再者,諸如顯示器、照相機、或醫療裝置的電子裝置可藉由將該電路板連接至用於該電路板之電路控制機件所形成。 In the case of using the hardened product pattern 110 as a resist film, there is a portion of the substrate 6 in the residual film removal step, that is, the surface exposed in the step (6) (by FIG. 5F The area represented by reference numeral 111 is etched or ion implanted. In this operation, the hardened product pattern 110 is used as an etching mask. Further, a circuit structure 112 (FIG. 5G) based on the pattern shape of the hardened product pattern 110 can be formed on the substrate 6 by forming an electronic component. This enables, for example, a circuit board for use in semiconductor devices such as LSIs, system LSIs, DRAMs, SDRAMs, RDRAMs, and D-RDRAMs. Furthermore, an electronic device such as a display, camera, or medical device can be formed by connecting the circuit board to a circuit control mechanism for the circuit board.

同樣地,電子零組件能以使得蝕刻法、離子植入等係使用該硬化產品圖案110當作罩幕(抗蝕劑罩幕)來施行的方式被獲得。 Likewise, the electronic component can be obtained in such a manner that an etching method, ion implantation, or the like is performed using the hardened product pattern 110 as a mask (resist mask).

另一選擇係,壓印模具能以使得對應於該基板6之石英基板係使用該硬化產品圖案110被蝕刻的方式被製成。於此案例中,對應於該基板6之石英基板可使用該硬化產品圖案110當作罩幕被蝕刻。另一選擇係,該石英基板能以使得第二硬化產品係使用第二可硬化材料被形成於該硬化產品圖案110的凹入部份中及被用作罩幕之方式被蝕刻。 Alternatively, the imprinting mold can be made in such a manner that the quartz substrate corresponding to the substrate 6 is etched using the hardened product pattern 110. In this case, the quartz substrate corresponding to the substrate 6 can be etched using the hardened product pattern 110 as a mask. Alternatively, the quartz substrate can be etched such that the second hardened product is formed in the recessed portion of the hardened product pattern 110 using the second hardenable material and used as a mask.

蝕刻法及離子植入被敘述為使用該硬化產品圖案110當作罩幕來處理該基板6的方法。處理該基板6之方法不被限制於蝕刻或離子植入。譬如,電鍍等可能以使得該硬化產品圖案110被放置在該基板6上的狀態被施行。 The etching method and ion implantation are described as a method of processing the substrate 6 using the hardened product pattern 110 as a mask. The method of processing the substrate 6 is not limited to etching or ion implantation. For example, plating or the like may be performed in a state where the hardened product pattern 110 is placed on the substrate 6.

於製備該電路板等之案例中,該硬化產品圖案110可最後被由該經處理的基板6移去、或能以組成一裝置的構件之形式保留。 In the case of preparing the circuit board or the like, the hardened product pattern 110 may be finally removed by the processed substrate 6, or may be retained in the form of a member constituting a device.

〔其它實施例〕 [Other Embodiments]

可適用於奈米壓印設備的裝置1係在該上面實施例中被敘述。本發明不被限制於該裝置1。亦即,可被安裝至該裝置1之單元4被包括於本發明中。以下設備亦被包括在本發明中:奈米壓印設備,該裝置1可被安裝至該奈米壓印設備,且在基板上藉由該上述光奈米壓印製程形成具有預定形狀的樹脂圖案。 An apparatus 1 applicable to a nanoimprinting apparatus is described in the above embodiment. The invention is not limited to the device 1. That is, the unit 4 that can be mounted to the device 1 is included in the present invention. The following apparatus is also included in the present invention: a nanoimprinting apparatus, the apparatus 1 can be mounted to the nanoimprinting apparatus, and a resin having a predetermined shape is formed on the substrate by the above-described photon imprinting process pattern.

圖6係根據本發明之實施例的奈米壓印設備600之概要視圖。該奈米壓印設備600係以使得被放置在該基板6 上的液體9為以該模具104模製及接著被硬化之方式施行該光奈米壓印製程的設備,該模具104係與該硬化液體9分開,且圖案藉此被轉印至該基板6。該光奈米壓印製程之細節係如上述。 Figure 6 is a schematic view of a nanoimprinting apparatus 600 in accordance with an embodiment of the present invention. The nanoimprinting apparatus 600 is such that it is placed on the substrate 6 The upper liquid 9 is a device for performing the photon imprint process by molding the mold 104 and then hardening, the mold 104 is separated from the hardened liquid 9, and the pattern is thereby transferred to the substrate 6 . The details of the photon imprint process are as described above.

該奈米壓印設備600包括模具頭部610、結構式本體611、光源612、照明光學系統613、底板2、傳送區段5、及控制區段618。該奈米壓印設備600另包括排出該液體9的裝置1。該裝置1係可分離地安裝至該奈米壓印設備600之本體。整個該裝置1能為可分離地安裝至該奈米壓印設備600之本體。另一選擇係,該裝置1的一部份、譬如該單元4能僅只可分離地安裝至該奈米壓印設備600之本體。 The nanoimprinting apparatus 600 includes a mold head 610, a structural body 611, a light source 612, an illumination optical system 613, a bottom plate 2, a transfer section 5, and a control section 618. The nanoimprinting apparatus 600 further includes means 1 for discharging the liquid 9. The device 1 is detachably mounted to the body of the nanoimprinting apparatus 600. The entire device 1 can be detachably mounted to the body of the nanoimprinting apparatus 600. Alternatively, a portion of the device 1, such as the unit 4, can be detachably mounted only to the body of the nanoimprinting device 600.

該模具頭部610被附接至該結構式本體611,且用作一固持及運動該模具104的夾具。該模具頭部610包括真空夾住或靜電地夾住該模具104之模具夾頭,且亦包括用於運動該模具104的運動機件。該模具頭部610具有將該模具104壓抵靠著該基板6上之硬化液體9(將該模具104帶入與該硬化液體9接觸)、及由該基板6上的硬化液體9分開(移去)該模具104之功能。 The mold head 610 is attached to the structural body 611 and serves as a clamp for holding and moving the mold 104. The mold head 610 includes a mold chuck that vacuum clamps or electrostatically clamps the mold 104, and also includes a moving mechanism for moving the mold 104. The mold head 610 has a hardened liquid 9 that presses the mold 104 against the substrate 6 (the mold 104 is brought into contact with the hardened liquid 9), and is separated (hardened) by the hardened liquid 9 on the substrate 6. Go) the function of the mold 104.

該光源612及該照明光學系統613形成放射光的照射系統,用於硬化該基板6上之液體9。由該光源612所放射的光可視該液體9之型式而定被適當地選擇。 The light source 612 and the illumination optical system 613 form an illumination system for emitting light for hardening the liquid 9 on the substrate 6. The light emitted by the light source 612 can be appropriately selected depending on the type of the liquid 9.

該底板2係以該傳送區段5覆疊。該傳送區段5固持及運動該基板6。該傳送區段5包括真空夾住該基板6的 基板夾頭616,且亦包括用於運動該基板6之運動機件。 The bottom plate 2 is overlapped by the transfer section 5. The transfer section 5 holds and moves the substrate 6. The conveying section 5 includes a vacuum sandwiching the substrate 6 The substrate chuck 616 also includes a moving mechanism for moving the substrate 6.

該裝置1將該液體9供給至該基板6。該液體9能以使得該傳送區段5被運動(掃描運動式或步進運動式)、而該液體9正由該裝置1所供給之方式被施加至該基板6的上方區域(發射區域)。 The device 1 supplies the liquid 9 to the substrate 6. The liquid 9 can be applied to the upper region (emission region) of the substrate 6 in such a manner that the transport section 5 is moved (scanning motion or step motion) while the liquid 9 is being supplied by the device 1. .

該控制區段618包括中央處理單元(CPU)、記憶體、與類似者等,且控制該奈米壓印設備600之操作(光奈米壓印製程)。換句話說,該控制區段618廣泛地控制該奈米壓印設備600的每一區段,以施行該光奈米壓印製程。尤其是,以使得該模具104被壓抵靠著該基板6上之液體9的狀態,該控制區段618運動該模具頭部610及以來自該光源612及該照明光學系統613之光照射該液體9,藉此硬化該液體9。該控制區段618運動該模具頭部610,以由該基板6上之硬化液體9分開該模具104,藉此該模具104的圖案104被轉印至該基板6。 The control section 618 includes a central processing unit (CPU), a memory, the like, and the like, and controls the operation of the nanoimprinting apparatus 600 (photon nanoimprinting process). In other words, the control section 618 broadly controls each section of the nanoimprinting apparatus 600 to perform the photon nanoimprinting process. In particular, in a state in which the mold 104 is pressed against the liquid 9 on the substrate 6, the control section 618 moves the mold head 610 and illuminates the light from the light source 612 and the illumination optical system 613. The liquid 9 thereby hardens the liquid 9. The control section 618 moves the mold head 610 to separate the mold 104 from the hardened liquid 9 on the substrate 6, whereby the pattern 104 of the mold 104 is transferred to the substrate 6.

〔範例〕 〔example〕

本發明在下面參考範例被進一步詳細地敘述。本發明之技術範圍不被限制於下面的範例。 The invention is described in further detail below with reference to examples. The technical scope of the present invention is not limited to the following examples.

〔範例1〕 [Example 1]

首先,分量(A)、分量(B)、及添加劑分量(C)在下面被混合在一起。該混合物係經過由超高分子量聚乙烯所製成之0.2微米篩網過濾器被過濾,藉此光可硬化成 份a被獲得。 First, the component (A), the component (B), and the additive component (C) are mixed together underneath. The mixture is filtered through a 0.2 micron mesh filter made of ultra high molecular weight polyethylene, whereby the light can be hardened into A is obtained.

(1-1)分量(A):總共94重量配合比 (1-1) Component (A): a total of 94 weight ratio

(A-1)異冰片基丙烯酸脂(IB-XATM,藉由Kyoeisha化學股份有限公司所產生):9.0重量配合比 (A-1) Isobornyl acrylate (IB-XA TM , produced by Kyoeisha Chemical Co., Ltd.): 9.0 by weight mix ratio

(A-2)丙烯酸芐酯(V#160TTM,藉由所生產):38.0重量配合比 (A-2) benzyl acrylate (V#160T TM , produced by): 38.0 by weight mix

(A-3)戊二醇雙丙烯酸酯(NP-ATM,藉由Kyoeisha化學股份有限公司所生產):47.0重量配合比 (A-3) pentanediol diacrylate (NP-A TM , produced by Kyoeisha Chemical Co., Ltd.): 47.0 by weight mix ratio

(1-2)分量(B):總共3.5重量配合比 (1-2) Component (B): a total of 3.5 weight ratio

(B-1)Lucirin TPO(藉由BASF所生產):3重量配合比 (B-1) Lucirin TPO (produced by BASF): 3 weight ratio

(B-2)4,4'雙(二乙基胺基)二苯甲酮(藉由東京化學工業股份有限公司所生產):0.5重量配合比 (B-2) 4,4' bis(diethylamino)benzophenone (produced by Tokyo Chemical Industry Co., Ltd.): 0.5 weight ratio

(1-3)添加劑分量(C):1.6重量配合比 (1-3) Additive component (C): 1.6 weight ratio

(C-1)聚氧乙烯硬脂酸醚SR-730(藉由青木油脂工業股份有限公司所生產):1.6重量配合比 (C-1) Polyoxyethylene stearate SR-730 (produced by Aoki Oil & Fat Industry Co., Ltd.): 1.6 weight ratio

隨後,100毫升的光可硬化成份a被測量,且接著被裝入由PFA所製成之瓶子,具有約100毫升的體積。此後,吸著媒介(p-1)被裝入含有該光可硬化成份a之瓶子。於此範例中,所使用的吸著媒介(p-1)係Zeta Plus(註冊商標)EC系列濾片、B47-40QSH(約47毫米的直徑及約3毫米之厚度,由3M日本有限公司所製成)。該吸著媒介(p-1)係由纖維素、矽藻土、及離子交換樹脂所製成。 Subsequently, 100 ml of the photohardenable component a was measured and then loaded into a bottle made of PFA having a volume of about 100 ml. Thereafter, the absorbing medium (p-1) is charged into the bottle containing the photohardenable component a. In this example, the sorbent medium (p-1) used is a Zeta Plus (registered trademark) EC series filter, B47-40QSH (a diameter of about 47 mm and a thickness of about 3 mm, by 3M Japan Co., Ltd. production). The sorption medium (p-1) is made of cellulose, diatomaceous earth, and ion exchange resin.

該吸著媒介(p-1)被裝入該瓶子,且接著被保持固定不動達一個月。此後,使用感應耦合電漿(ICP)發射光譜分析儀、CIROS CCD(藉由斯派克分析儀器公司所製造),該光可硬化成份a中的每一金屬元素(17元素:鈉、鈣、鐵、鉀、鋅、鋁、鎂、鎳、鉻、銅、鉛、錳、鋰、錫、鈀、鋇、鈷、及鍶)之含量被決定。順便提及,在該吸著媒介(p-1)被裝入該瓶子之前,該等金屬元素被類似地決定。 The sorption medium (p-1) was loaded into the bottle and then held stationary for up to one month. Thereafter, an inductively coupled plasma (ICP) emission spectrometer, CIROS CCD (manufactured by Spike Analytical Instruments), which hardens each metal element in the component a (17 elements: sodium, calcium, iron) The contents of potassium, zinc, aluminum, magnesium, nickel, chromium, copper, lead, manganese, lithium, tin, palladium, ruthenium, cobalt, and rhodium are determined. Incidentally, the metal elements are similarly determined before the absorbing medium (p-1) is loaded into the bottle.

在該吸著媒介(p-1)被裝入該瓶子之前,6.6ppm的K係存在於該瓶子中之光可硬化成份a中。然而,在該吸著媒介(p-1)被裝入該瓶子及被保持固定不動達一個月之後,該光可硬化成份a中的K之濃度係低於該ICP發射光譜分析儀的偵測限制(1.1ppm)。在該吸著媒介(p-1)被裝入該瓶子之前,4.5ppm的鎳係存在於該瓶子中之光可硬化成份a中。然而,在該吸著媒介(p-1)被裝入該瓶子及被保持固定不動達一個月之後,該光可硬化成份a中的鎳之濃度係3.6ppm。在該吸著媒介(p-1)被裝入該瓶子及被保持固定不動達一個月之後,該光可硬化成份a中的其他金屬元素之每一者的濃度係低於該ICP發射光譜分析儀的偵測限制。 Before the sorption medium (p-1) was loaded into the bottle, 6.6 ppm of K was present in the photohardenable component a in the bottle. However, after the sorption medium (p-1) is loaded into the bottle and held stationary for one month, the concentration of K in the photohardenable component a is lower than that of the ICP emission spectrum analyzer. Limit (1.1ppm). Before the sorption medium (p-1) was charged into the bottle, 4.5 ppm of nickel was present in the photohardenable component a in the bottle. However, the concentration of nickel in the photohardenable component a was 3.6 ppm after the sorbent medium (p-1) was charged into the bottle and held stationary for one month. After the sorption medium (p-1) is loaded into the bottle and held stationary for one month, the concentration of each of the other metal elements in the photohardenable component a is lower than the ICP emission spectrum analysis. The detection limit of the instrument.

在當該光可硬化成份a被製備及被裝入該瓶子時之任意時間點,該等金屬元素係存在於該光可硬化成份a中。於此範例中,該等金屬元素的數量可藉由將該金屬元素吸附至該吸著媒介(p-1)上而被減少。據此,當該光可硬 化成份a與譬如金屬構件、諸如包括排出通口的噴墨頭造成接觸時,縱使該光可硬化成份a被以金屬雜質污染,該等金屬雜質之數量隨著時間而增加可被儘可能地抑制。 The metal elements are present in the photohardenable component a at any point in time when the photohardenable component a is prepared and loaded into the bottle. In this example, the amount of the metal elements can be reduced by adsorbing the metal element onto the sorption medium (p-1). According to this, when the light can be hard When the component a is brought into contact with, for example, a metal member such as an ink jet head including a discharge port, even if the photohardenable component a is contaminated with metal impurities, the amount of the metal impurities increases as time can be inhibition.

〔範例2〕 [Example 2]

在光可硬化成份a被以與範例1中所敘述者相同的方式製備之後,該光可硬化成份a的100毫升被測量,且接著被裝入由所PFA製成之瓶子,具有約100毫升的體積。此後,吸著媒介(p-2)被裝入含有該光可硬化成份a之瓶子。於此範例中,所使用的吸著媒介(p-2)係Zeta Plus(註冊商標)EC系列濾片、B47-020GN(約47毫米的直徑及約3毫米之厚度,由3M日本有限公司所製成)。該吸著媒介(p-2)係由纖維素、矽藻土、及離子交換樹脂所製成。 After the photohardenable component a was prepared in the same manner as described in Example 1, 100 ml of the photohardenable component a was measured, and then loaded into a bottle made of PFA, having about 100 ml. volume of. Thereafter, the absorbing medium (p-2) is charged into the bottle containing the photohardenable component a. In this example, the sorbent medium (p-2) used is a Zeta Plus (registered trademark) EC series filter, B47-020GN (a diameter of about 47 mm and a thickness of about 3 mm, by 3M Japan Co., Ltd. production). The sorption medium (p-2) is made of cellulose, diatomaceous earth, and ion exchange resin.

該吸著媒介(p-2)被裝入該瓶子及接著被保持固定不動達一個月。此後,使用ICP發射光譜分析儀、CIROS CCD(藉由斯派克分析儀器公司所製造),該光可硬化成份a中的每一金屬元素(17元素:鈉、鈣、鐵、鉀、鋅、鋁、鎂、鎳、鉻、銅、鉛、錳、鋰、錫、鈀、鋇、鈷、及鍶)之含量被決定。順便提及,在該吸著媒介(p-2)被裝入該瓶子之前,該等金屬元素被類似地決定。 The sorption medium (p-2) was loaded into the bottle and then held stationary for up to one month. Thereafter, using an ICP emission spectrometer, CIROS CCD (manufactured by Spike Analytical Instruments, Inc.), each of the metal elements in the photohardenable component a (17 elements: sodium, calcium, iron, potassium, zinc, aluminum) The contents of magnesium, nickel, chromium, copper, lead, manganese, lithium, tin, palladium, ruthenium, cobalt, and rhodium are determined. Incidentally, the metal elements are similarly determined before the absorbing medium (p-2) is loaded into the bottle.

在該吸著媒介(p-2)被裝入該瓶子之前,6.6ppm的K係存在於該瓶子中之光可硬化成份a中。然而,在該吸著媒介(p-2)被裝入該瓶子及被保持固定不動達一個月 之後,該光可硬化成份a中的K之濃度係低於該ICP發射光譜分析儀的偵測限制(1.1ppm)。在該吸著媒介(p-2)被裝入該瓶子之前,4.5ppm的鎳係存在於該瓶子中之光可硬化成份a中。然而,在該吸著媒介(p-2)被裝入該瓶子及被保持固定不動達一個月之後,該光可硬化成份a中的鎳之濃度係3.3ppm。在該吸著媒介(p-2)被裝入該瓶子及被保持固定不動達一個月之後,該光可硬化成份a中的其他金屬元素之每一者的濃度係低於該ICP發射光譜分析儀的偵測限制。 Before the sorption medium (p-2) was loaded into the bottle, 6.6 ppm of K was present in the photohardenable component a in the bottle. However, the sorption medium (p-2) was loaded into the bottle and held stationary for up to one month. Thereafter, the concentration of K in the photohardenable component a is lower than the detection limit (1.1 ppm) of the ICP emission spectrum analyzer. Before the sorption medium (p-2) was charged into the bottle, 4.5 ppm of nickel was present in the photohardenable component a in the bottle. However, the concentration of nickel in the photohardenable component a was 3.3 ppm after the sorption medium (p-2) was loaded into the bottle and held stationary for one month. After the sorption medium (p-2) is loaded into the bottle and held stationary for one month, the concentration of each of the other metal elements in the photohardenable component a is lower than the ICP emission spectrum analysis. The detection limit of the instrument.

在當該光可硬化成份a被製備及被裝入該瓶子時之任意時間點,該等金屬元素係存在於該光可硬化成份a中。於此範例中,該等金屬元素的數量可藉由將該等金屬元素吸附至該吸著媒介(p-2)上而被減少。據此,當該光可硬化成份a與譬如金屬構件、諸如包括排出通口的噴墨頭造成接觸時,縱使該光可硬化成份a被以金屬雜質污染,該等金屬雜質之數量隨著時間而增加可被儘可能地抑制。 The metal elements are present in the photohardenable component a at any point in time when the photohardenable component a is prepared and loaded into the bottle. In this example, the amount of the metal elements can be reduced by adsorbing the metal elements onto the sorption medium (p-2). According to this, when the photohardenable component a comes into contact with, for example, a metal member such as an ink jet head including a discharge port, the light hardenable component a is contaminated with metal impurities, and the amount of such metal impurities is over time. The increase can be suppressed as much as possible.

雖然本發明已參考示範實施例被敘述,其將被了解本發明不被限制於所揭示的示範實施例。以下申請專利之範圍將被給與最寬廣的解釋,以便涵括所有此等修改及同等結構與功能。 While the invention has been described with reference to the exemplary embodiments thereof, it is understood that the invention is not limited to the disclosed exemplary embodiments. The scope of the following patent application is to be accorded the breadth of

1‧‧‧液體排出裝置 1‧‧‧Liquid discharge device

2‧‧‧底板 2‧‧‧floor

3‧‧‧頭部 3‧‧‧ head

4‧‧‧液體儲存單元 4‧‧‧Liquid storage unit

5‧‧‧轉印構件 5‧‧‧Transfer member

6‧‧‧基板 6‧‧‧Substrate

7‧‧‧儲存區段 7‧‧‧Storage section

8‧‧‧儲存袋 8‧‧‧storage bag

9‧‧‧光奈米壓印液體 9‧‧‧Light nanoimprinting liquid

10‧‧‧排出通口 10‧‧‧Exhaust port

11‧‧‧液體填料 11‧‧‧Liquid packing

12‧‧‧壓力調整器 12‧‧‧ Pressure Regulator

13‧‧‧溝通件 13‧‧‧Communication

14‧‧‧閥門 14‧‧‧ Valve

15‧‧‧閥門 15‧‧‧ valve

16‧‧‧接頭 16‧‧‧Connectors

17‧‧‧緩衝部 17‧‧‧ buffer

23‧‧‧吸著媒介 23‧‧‧Sucking media

Claims (24)

一種液體排出裝置,包含:儲存區段,儲存用於奈米壓印的液體;及排出通口,其與該儲存區段相通,且其排出用於奈米壓印的該液體,其中該液體排出裝置可拆卸地安裝至奈米壓印設備,和其中該儲存區段含有吸著媒介,該吸著媒介吸附或吸收選自由微粒、金屬離子、及水所組成之群組的至少一者。 A liquid discharge device comprising: a storage section for storing a liquid for nanoimprinting; and a discharge port communicating with the storage section, and discharging the liquid for nanoimprinting, wherein the liquid The discharge device is detachably mounted to the nanoimprinting apparatus, and wherein the storage section contains a sorption medium that adsorbs or absorbs at least one selected from the group consisting of particles, metal ions, and water. 如申請專利範圍第1項之液體排出裝置,其中當用於奈米壓印的該液體被從該排出通口排出時,該吸著媒介不被從該排出通口排出。 The liquid discharge device of claim 1, wherein the sorption medium is not discharged from the discharge port when the liquid for nanoimprinting is discharged from the discharge port. 如申請專利範圍第1或2項之液體排出裝置,其中該吸著媒介係具有0.001微米至0.5微米的平均孔隙直徑之多小孔媒介。 A liquid discharge device according to claim 1 or 2, wherein the sorbent medium has a small pore medium having an average pore diameter of from 0.001 μm to 0.5 μm. 如申請專利範圍第1或2項之液體排出裝置,其中該吸著媒介具有在其表面上的陽離子交換群組。 A liquid discharge device according to claim 1 or 2, wherein the sorption medium has a cation exchange group on a surface thereof. 如申請專利範圍第1或2項之液體排出裝置,其中該吸著媒介含有物理或化學乾燥劑。 A liquid discharge device according to claim 1 or 2, wherein the sorption medium contains a physical or chemical desiccant. 如申請專利範圍第1或2項之液體排出裝置,其中該吸著媒介具有大於該排出通口的直徑之尺寸,且於該儲存區段中被懸置在用於奈米壓印的該液體中。 The liquid discharge device of claim 1 or 2, wherein the sorption medium has a size larger than a diameter of the discharge port, and is suspended in the storage section for the liquid for nanoimprinting in. 如申請專利範圍第1或2項之液體排出裝置,其 中該吸著媒介被固定至該儲存區段的內側。 A liquid discharge device according to claim 1 or 2, wherein The sorption medium is fixed to the inside of the storage section. 如申請專利範圍第7項之液體排出裝置,其中該吸著媒介的密度係用於奈米壓印的該液體之密度的30%至100%。 The liquid discharge device of claim 7, wherein the density of the sorption medium is from 30% to 100% of the density of the liquid imprinted by the nanometer. 如申請專利範圍第1或2項之液體排出裝置,其中該吸著媒介係由選自由纖維素、矽藻土、聚乙烯、尼龍、矽膠、及活性碳所組成之群組的至少一者之材料所製成。 The liquid discharge device of claim 1 or 2, wherein the sorption medium is at least one selected from the group consisting of cellulose, diatomaceous earth, polyethylene, nylon, silicone, and activated carbon. Made of materials. 如申請專利範圍第1或2項之液體排出裝置,其中用於奈米壓印的該液體係光可硬化成份。 A liquid discharge apparatus according to claim 1 or 2, wherein the liquid system for nanoimprinting has a photohardenable component. 一種液體排出裝置,包含:排出通口,被建構用於排出用於奈米壓印的液體;和儲存區段,其中該儲存區段中的空間被分開成第一儲存空間與第二儲存空間,該第一儲存空間儲存用於奈米壓印的該液體並與該排出通口相通,該第二儲存空間藉由分離器而不與該排出通口相通,該第二儲存空間被以流體充填,其中該第一儲存空間含有吸著媒介,其吸附或吸收選自由微粒、金屬離子、及水所組成的群組中的至少一者。 A liquid discharge device comprising: a discharge port configured to discharge a liquid for nanoimprinting; and a storage section, wherein a space in the storage section is divided into a first storage space and a second storage space The first storage space stores the liquid for nanoimprinting and communicates with the discharge port, the second storage space is not connected to the discharge port by a separator, and the second storage space is fluidized Filling, wherein the first storage space contains a sorption medium that adsorbs or absorbs at least one selected from the group consisting of particles, metal ions, and water. 如申請專利範圍第11項之液體排出裝置,另包含:壓力調整器,其與該第二儲存空間相通,且其調整該第二儲存空間中所充填的流體之壓力; 溝通件,其被建構用於使該第二儲存空間和該壓力調整器彼此相通;和閥門,設置在溝通單元內,其中該溝通單元在該壓力調整器和該閥門之間可從該壓力調整器分離。 The liquid discharge device of claim 11, further comprising: a pressure regulator communicating with the second storage space and adjusting a pressure of the fluid filled in the second storage space; a communication member configured to communicate the second storage space and the pressure regulator with each other; and a valve disposed in the communication unit, wherein the communication unit is adjustable from the pressure between the pressure regulator and the valve Separation. 如申請專利範圍第11或12項之液體排出裝置,其中該流體係含有水的不可壓縮流體。 A liquid discharge apparatus according to claim 11 or 12, wherein the flow system contains an incompressible fluid of water. 如申請專利範圍第11或12項之液體排出裝置,其中該第一儲存空間的容積隨著用於奈米壓印的該液體的排出而減少。 A liquid discharge apparatus according to claim 11 or 12, wherein the volume of the first storage space is reduced as the liquid for nanoimprinting is discharged. 如申請專利範圍第11或12項之液體排出裝置,其中當用於奈米壓印的該液體被從該排出通口排出時,該吸著媒介不被從該排出通口排出。 A liquid discharge apparatus according to claim 11 or 12, wherein the sorption medium is not discharged from the discharge port when the liquid for nanoimprinting is discharged from the discharge port. 一種液體排出裝置,包含:儲存區段,儲存用於奈米壓印的液體;及排出通口,其與該儲存區段相通,且其排出用於奈米壓印的該液體,其中該儲存區段含有吸著媒介,該吸著媒介吸附或吸收選自由微粒、金屬離子、及水所組成之群組的至少一者,和其中該吸著媒介被設置成不會阻擋用於奈米壓印的該液體之通道。 A liquid discharge device comprising: a storage section for storing a liquid for nanoimprinting; and a discharge port communicating with the storage section, and discharging the liquid for nanoimprinting, wherein the storing The section contains a sorption medium that adsorbs or absorbs at least one selected from the group consisting of particles, metal ions, and water, and wherein the sorption medium is configured to not block for nanopressure The channel of the liquid printed. 一種奈米壓印設備,其以使得模具被壓抵靠著該基板上所放置之光可硬化成份及該光可硬化成份被硬化的 方式在基板上形成硬化產品圖案,該奈米壓印設備包含如申請專利範圍第10項之液體排出裝置,其中使用該液體排出裝置將該光可硬化成份放置在該基板上。 A nanoimprinting apparatus for causing a mold to be pressed against a light hardenable component placed on the substrate and the photohardenable component to be hardened The method of forming a hardened product pattern on a substrate, the nanoimprinting apparatus comprising the liquid discharge device of claim 10, wherein the liquid hardenable component is placed on the substrate using the liquid discharge device. 一種液體儲存桶,包含儲存用於奈米壓印的液體的儲存區段,其中該儲存區段含有吸著媒介,其吸附或吸收選自由微粒、金屬離子、及水所組成的群組中的至少一者,和其中該吸著媒介被懸置在用於奈米壓印的該液體中和/或緊緊地黏附致該儲存區段的內表面。 A liquid storage tank comprising a storage section for storing a liquid for nanoimprinting, wherein the storage section contains a sorption medium that adsorbs or absorbs a group selected from the group consisting of particles, metal ions, and water. At least one, and wherein the sorption medium is suspended in the liquid for nanoimprinting and/or adheres tightly to the inner surface of the storage section. 如申請專利範圍第18項之液體儲存桶,其中用於奈米壓印的該液體被儲存於該儲存區段中。 A liquid storage tank according to claim 18, wherein the liquid for nanoimprinting is stored in the storage section. 一種製造硬化產品圖案的方法,包含:使用如申請專利範圍第10項之液體排出裝置將該光可硬化成份放置在基板上的第一步驟;將該光可硬化成份帶入與模具接觸之第二步驟;用光線照射該光可硬化成份,以將該光可硬化成份硬化成一經硬化的產品之第三步驟;及將該經硬化的產品與該模具彼此分開之第四步驟。 A method of producing a pattern of a hardened product, comprising: a first step of placing the photohardenable component on a substrate using a liquid discharge device according to claim 10; and bringing the photohardenable component into contact with the mold a second step of irradiating the photohardenable component with light to harden the photohardenable component into a hardened product; and a fourth step of separating the hardened product from the mold. 一種製造光學組件的方法,包含藉由如申請專利範圍第20項之方法獲得經硬化的產品圖案之步驟。 A method of manufacturing an optical component comprising the step of obtaining a hardened product pattern by the method of claim 20 of the patent application. 一種製造電路板的方法,包含:藉由如申請專利範圍第20項之方法在基板上形成經硬化之產品圖案的步驟;及 使用該硬化產品圖案當作遮罩來蝕刻或離子植入該基板之步驟。 A method of manufacturing a circuit board, comprising: a step of forming a hardened product pattern on a substrate by the method of claim 20; and The step of etching or ion implanting the substrate using the hardened product pattern as a mask. 如申請專利範圍第22項之方法,其中該電路板係供使用於半導體裝置的電路板。 The method of claim 22, wherein the circuit board is for use in a circuit board of a semiconductor device. 一種製造壓印模具的方法,包括:藉由如申請專利範圍第20項之方法而在基板上形成硬化產品圖的步驟;及使用該經硬化的產品圖案蝕刻該基板之步驟。 A method of manufacturing an imprint mold, comprising: a step of forming a hardened product pattern on a substrate by a method as in claim 20; and a step of etching the substrate using the hardened product pattern.
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