TWI580944B - Metal composition analysis method - Google Patents
Metal composition analysis method Download PDFInfo
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- TWI580944B TWI580944B TW105100877A TW105100877A TWI580944B TW I580944 B TWI580944 B TW I580944B TW 105100877 A TW105100877 A TW 105100877A TW 105100877 A TW105100877 A TW 105100877A TW I580944 B TWI580944 B TW I580944B
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Description
本發明是有關於一種分析方法，特別是指一種金屬成分分析方法。The present invention relates to an analytical method, and more particularly to a method for analyzing a metal component.
利用分光儀(Optical Emission Spectrometer)分析金屬材料所含的成分，不僅準確而且快速。但是，現有分光儀僅能用以分析斷面直徑在10mm以上的樣品，對於斷面直徑小於10mm的樣品，則僅能依據JIS G1258所規範的濕式化學分析方法進行分析。The use of an Optical Emission Spectrometer to analyze the composition of a metal material is not only accurate but also fast. However, the existing spectrometer can only be used to analyze samples with a section diameter of 10 mm or more. For samples with a section diameter of less than 10 mm, it can only be analyzed according to the wet chemical analysis method specified in JIS G1258.
現有JIS G1258所規範的濕式化學分析方法大致包括下列步驟：先以鹽酸與硝酸的混合液體將樣品溶解；然後，再利用濾紙進行過濾；之後，再利用偏硼酸鋰溶解濾紙上的殘渣；接下來，再以鹽酸溶解並與過濾後的過濾液合併；進一步，加入釔標準液作為內標準；最後，在稀釋至定量後，以感應耦合電漿分析儀(Inductively Coupled Plasma, ICP)進行分析。The wet chemical analysis method specified in the prior JIS G1258 generally comprises the following steps: first, the sample is dissolved by a mixed liquid of hydrochloric acid and nitric acid; then, filtering is performed by using a filter paper; then, the residue on the filter paper is dissolved by using lithium metaborate; Then, it was dissolved in hydrochloric acid and combined with the filtered filtrate; further, the ruthenium standard solution was added as an internal standard; finally, after dilution to quantitative analysis, the analysis was carried out by Inductively Coupled Plasma (ICP).
濕式化學分析方法雖然可以分析金屬成分，但是，每一個步驟都需要相當長的反應時間，而且還要隨著待分析項目的不同準備不同的標準液，再稀釋成不同濃度範圍的液體才能進行分析，而且如果待分析物的部分項目超出標準液濃度時，還要重新調配標準液與稀釋才能分析準確成分。因此，濕式化學分析方法程序複雜、費時。Although the wet chemical analysis method can analyze the metal component, each step requires a relatively long reaction time, and different standard solutions are prepared depending on the item to be analyzed, and then diluted into liquids of different concentration ranges. Analysis, and if some of the analytes are outside the standard concentration, the standard and dilution should be re-formulated to analyze the exact composition. Therefore, the wet chemical analysis method is complicated and time consuming.
因此，本發明之目的，即在提供一種程序簡單且省時的金屬成分分析方法。Accordingly, it is an object of the present invention to provide a metal component analysis method which is simple in procedure and time-saving.
於是，本發明金屬成分分析方法包含下列步驟，步驟(A) 將一金屬樣本的斷面積擴大至314.159平方公釐以上成為一待測樣本，步驟(B) 將該待測樣本與一基座相結合成為一待測物，以及步驟(C) 利用一分光儀分析該待測物上的待測樣本的成分。Therefore, the metal component analysis method of the present invention comprises the following steps: step (A) expanding the cross-sectional area of a metal sample to 314.159 square mm or more to become a sample to be tested, and step (B) to phase the sample to be tested with a susceptor Combining into a sample to be tested, and step (C) analyzing the composition of the sample to be tested on the object to be tested using a spectrometer.
本發明之功效在於：將該金屬樣本的斷面積擴大至314.159平方公釐以上成為該待測樣本，再將該待測樣本與該基座相結合成為該待測物，即可直接利用該分光儀分析原本不能以該分光儀進行分析的該金屬樣本，整體操作程序簡單且能有效縮短分析所需時間。The effect of the invention is that the cross-sectional area of the metal sample is expanded to 314.159 square mm or more to become the sample to be tested, and the sample to be tested is combined with the susceptor to become the object to be tested, and the beam splitting can be directly utilized. The instrument analyzes the metal sample that could not be analyzed by the spectrometer, and the overall operation procedure is simple and can effectively shorten the time required for analysis.
參閱圖1與圖2，本發明金屬成分分析方法之實施例包含下列步驟：步驟21是利用一高週波加熱爐200加熱一斷面積小於314.159平方公釐的小尺寸金屬樣本31，再利用一壓平機201將加熱後的該金屬樣本31的斷面積擴大至314.159平方公釐以上，而成為一待測樣本32。其中，該高週波加熱爐200的加熱時間約1分鐘。在此要特別說明的是，該高週波加熱爐200與該壓平機201是現有設備，因此，僅以假想線示意繪出。Referring to FIG. 1 and FIG. 2, an embodiment of the metal component analysis method of the present invention comprises the following steps: Step 21 is to heat a small-sized metal sample 31 having a sectional area of less than 314.159 cm 2 by using a high-frequency heating furnace 200, and then using a pressure. The flat machine 201 expands the sectional area of the heated metal sample 31 to 314.159 square mm or more to become a sample 32 to be tested. The heating time of the high-frequency heating furnace 200 is about 1 minute. It is to be noted that the high-frequency heating furnace 200 and the flattening machine 201 are conventional equipment, and therefore, they are only schematically depicted by imaginary lines.
步驟22是以該高週波加熱爐200加熱一金屬基座33，再以該壓平機201將該待測樣本32與加熱後的該基座33壓合，使該金屬基座33形成一與該待測樣本32相配合的空間，並利用快乾膠202黏合將該待測樣本32黏合於該基座33的空間中成為一待測物34。於本實施例中，該基座33的斷面積大於該待測樣本32的斷面積。Step 22 is to heat a metal base 33 by the high-frequency heating furnace 200, and press the sample 32 to be tested with the heated base 33 by the flattening machine 201, so that the metal base 33 forms a The sample 32 to be tested is matched with the space, and the sample 32 to be tested is bonded to the space of the base 33 by the quick-drying adhesive 202 to form a sample to be tested 34. In this embodiment, the sectional area of the pedestal 33 is larger than the sectional area of the sample 32 to be tested.
步驟23是先利用一研磨機(圖未示)將該待測物34的待測樣本32研磨成光滑表面，再以一分光儀203分析該待測物34上的待測樣本32的成分。In step 23, the sample 32 to be tested of the object to be tested 34 is ground to a smooth surface by a grinder (not shown), and then the composition of the sample to be tested 32 on the object to be tested 34 is analyzed by a spectrometer 203.
綜上所述，本發明金屬成分分析方法是將斷面積小於314.159平方公釐的該金屬樣本31的斷面積擴大至314.159平方公釐以上成為該待測樣本32，再將該待測樣本32與該基座33相結合成為該待測物34，即可直接利用該分光儀203分析原本無法用該分光儀203進行分析的小尺寸金屬樣本31，整體操作程序簡單且能有效縮短分析所需時間，故確實能達成本發明之目的。In summary, the metal component analysis method of the present invention expands the cross-sectional area of the metal sample 31 having a sectional area of less than 314.159 cm 2 to 314.159 cm 2 or more to become the sample 32 to be tested, and then the sample 32 to be tested is The pedestal 33 is combined to form the object to be tested 34, and the small-sized metal sample 31 which can not be analyzed by the spectrometer 203 can be directly analyzed by the spectrometer 203, and the overall operation procedure is simple and the time required for analysis can be effectively shortened. Therefore, the object of the present invention can be achieved.
惟以上所述者，僅為本發明之實施例而已，當不能以此限定本發明實施之範圍，凡是依本發明申請專利範圍及專利說明書內容所作之簡單的等效變化與修飾，皆仍屬本發明專利涵蓋之範圍內。However, the above is only the embodiment of the present invention, and the scope of the invention is not limited thereto, and all the equivalent equivalent changes and modifications according to the scope of the patent application and the patent specification of the present invention are still The scope of the invention is covered.
21‧‧‧步驟21‧‧‧Steps
22‧‧‧步驟22‧‧‧Steps
23‧‧‧步驟23‧‧‧Steps
31‧‧‧金屬樣本31‧‧‧ metal samples
32‧‧‧待測樣本32‧‧‧samples to be tested
33‧‧‧基座33‧‧‧Base
34‧‧‧待測物34‧‧‧Test objects
200‧‧‧高週波加熱爐200‧‧‧High Frequency Heating Furnace
201‧‧‧壓平機201‧‧‧Leveling machine
202‧‧‧快乾膠202‧‧‧Quick dry glue
203‧‧‧分光儀203‧‧‧ Spectrometer
本發明之其他的特徵及功效，將於參照圖式的實施方式中清楚地呈現，其中： 圖1是一流程圖，說明本發明金屬成分分析方法的實施例；及 圖2是一示意圖，輔助說明該實施例中該金屬樣本的變化情形。Other features and advantages of the present invention will be apparent from the embodiments of the present invention, wherein: Figure 1 is a flow chart illustrating an embodiment of the metal component analysis method of the present invention; and Figure 2 is a schematic view of an auxiliary The variation of the metal sample in this embodiment is explained.
21‧‧‧步驟 21‧‧‧Steps
22‧‧‧步驟 22‧‧‧Steps
23‧‧‧步驟 23‧‧‧Steps
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| TW105100877A TWI580944B (en) | 2016-01-13 | 2016-01-13 | Metal composition analysis method |
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| TW105100877A TWI580944B (en) | 2016-01-13 | 2016-01-13 | Metal composition analysis method |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5949082A (en) * | 1998-03-23 | 1999-09-07 | Datex-Ohmeda, Inc. | Ceramic radiation source assembly with metalized seal for gas spectrometer |
| TW200424321A (en) * | 2003-03-14 | 2004-11-16 | Praxair Technology Inc | System for optically analyzing a molten metal bath |
| US20060061762A1 (en) * | 2004-09-22 | 2006-03-23 | Dwight David W | Surface enhanced raman spectroscopy (SERS) substrates exhibiting uniform high enhancement and stability |
| CN203235922U (en) * | 2013-01-17 | 2013-10-16 | 陈柏翰 | Die of metal spectrometer test block |
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- 2016-01-13 TW TW105100877A patent/TWI580944B/en not_active IP Right Cessation
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5949082A (en) * | 1998-03-23 | 1999-09-07 | Datex-Ohmeda, Inc. | Ceramic radiation source assembly with metalized seal for gas spectrometer |
| TW200424321A (en) * | 2003-03-14 | 2004-11-16 | Praxair Technology Inc | System for optically analyzing a molten metal bath |
| US20060061762A1 (en) * | 2004-09-22 | 2006-03-23 | Dwight David W | Surface enhanced raman spectroscopy (SERS) substrates exhibiting uniform high enhancement and stability |
| WO2006137885A2 (en) * | 2004-09-22 | 2006-12-28 | The Penn State Research Foundation | Surface enhanced raman spectroscopy (sers) substrates exhibiting uniform high enhancement and stability |
| CN203235922U (en) * | 2013-01-17 | 2013-10-16 | 陈柏翰 | Die of metal spectrometer test block |
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| TW201725373A (en) | 2017-07-16 |
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