TWI576242B - Gas barrier plastic molded body and manufacturing method thereof - Google Patents

Gas barrier plastic molded body and manufacturing method thereof Download PDF

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TWI576242B
TWI576242B TW101123442A TW101123442A TWI576242B TW I576242 B TWI576242 B TW I576242B TW 101123442 A TW101123442 A TW 101123442A TW 101123442 A TW101123442 A TW 101123442A TW I576242 B TWI576242 B TW I576242B
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film
gas barrier
gas
heating element
plastic molded
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TW101123442A
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TW201325896A (en
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Mari Shimizu
Eitaro Matsui
Aiko Sato
Masaki Nakaya
Hiroyasu Tabuchi
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Kirin Brewery
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阻氣性塑膠成形體及其製造方法 Gas barrier plastic molded body and method of manufacturing same

本發明係關於一種阻氣性塑膠成形體及其製造方法。 The present invention relates to a gas barrier plastic molded body and a method of manufacturing the same.

先前,作為形成具有阻氣性之薄膜(以下,亦存在稱為阻氣性薄膜之情形)之技術,存在電漿化學蒸鍍(CVD,Chemical Vapor Deposition)法(例如參照專利文獻1)。於專利文獻1中,揭示有將有機矽化合物作為原料,於塑膠製容器之內表面積層以無機氧化物為主體之阻氣性薄膜的方法。然而,於利用電漿CVD法形成薄膜之方法中,薄膜形成時電漿會對膜表面造成損傷,膜之緻密度容易受損,可成為提高阻氣性或確保薄膜密接性之障礙。又,電漿CVD法係利用電漿分解原料氣體而使其離子化,並於塑膠容器之表面使經電場加速之離子碰撞而形成薄膜,因此必需高頻電源及高頻電力匹配裝置,而存在不可避免之裝置成本昂貴之問題。 In the prior art, there is a chemical vapor deposition (CVD) method (for example, see Patent Document 1) as a technique for forming a gas barrier film (hereinafter, a gas barrier film is also known). Patent Document 1 discloses a method of using a ruthenium compound as a raw material and a gas barrier film mainly composed of an inorganic oxide in an inner surface layer of a plastic container. However, in the method of forming a thin film by the plasma CVD method, the plasma may damage the surface of the film during film formation, and the density of the film is easily damaged, which may become an obstacle to improve gas barrier properties or ensure film adhesion. Further, the plasma CVD method uses a plasma to decompose a raw material gas to ionize it, and collides ions accelerated by an electric field on a surface of a plastic container to form a thin film. Therefore, a high-frequency power source and a high-frequency power matching device are required. The inevitable problem of expensive equipment.

為解決該問題,本申請人揭示如下技術:使用使原料氣體接觸發熱之發熱體而分解並使生成之化學種直接或於氣相中經過反應過程後於基材上堆積為薄膜的方法,即,被稱為發熱體CVD法、Cat-CVD法(Catalytic Chemical Vapor Deposition,觸媒化學氣相沈積)或熱絲CVD法之CVD法(以下,本說明書中稱為發熱體CVD法),於塑膠容器之表面形成阻氣性薄膜(例如參照專利文獻2或3)。於專利文獻2中,揭示有藉由使用非自燃性原料與臭氧之混合氣體作為 原料氣體而形成AlOx薄膜或SiOx薄膜作為氧化物薄膜的技術。於專利文獻3中,提出有關於可藉由組合複數種氣體作為原料氣體而形成例如含氫SiNx薄膜、含氫DLC(類金剛石碳,Diamond-like Carbon)薄膜、含氫SiOx薄膜或含氫SiCxNy薄膜的發熱體CVD法之技術。 In order to solve this problem, the present applicant has disclosed a technique of decomposing a raw material gas in contact with a heat generating body which generates heat, and depositing the generated chemical species directly or in the gas phase through a reaction process, and then depositing the film on the substrate as a film, that is, a CVD method called a heating element CVD method, a Cat-CVD method (Catalytic Chemical Vapor Deposition) or a hot wire CVD method (hereinafter, referred to as a heating element CVD method in the present specification), in plastics A gas barrier film is formed on the surface of the container (for example, refer to Patent Document 2 or 3). Patent Document 2 discloses a technique in which an AlO x film or a SiO x film is formed as an oxide film by using a mixed gas of a non-self-igniting raw material and ozone as a material gas. Patent Document 3 proposes to form, for example, a hydrogen-containing SiN x film, a hydrogen-containing DLC (diamond-like carbon) film, a hydrogen-containing SiO x film or a film by combining a plurality of gases as a material gas. A technique of a heating body CVD method for a hydrogen SiC x N y film.

作為形成阻氣性薄膜之方法,另外揭示有如下技術:於包含熱塑性樹脂之基材之表面,利用發熱體CVD法,並使用含氮氣體與矽烷系氣體作為原料氣體,而形成SiN(氮化矽)或SiON(氮氧化矽)薄膜(例如參照專利文獻4)。又,雖並非阻氣性薄膜,但作為使用發熱體CVD法而形成薄膜之方法,例如揭示有如下技術:使原料氣體接觸加熱至800~2000℃之發熱體並產生化學種,將該化學種於加熱至150~400℃之基板上利用熱CVD法形成薄膜(例如參照專利文獻5)。專利文獻5中揭示有使用混合有複數種氣體之氣體而堆積薄膜之方法。又,揭示有使用矽氮烷系之原料氣體而提高SiCN膜之阻氣性之技術(例如參照專利文獻7)。 As a method of forming a gas barrier film, there is disclosed a technique of forming a SiN (nitriding) by using a heating element CVD method on a surface of a substrate containing a thermoplastic resin, and using a nitrogen-containing gas and a decane-based gas as a material gas.矽) or a SiON (yttrium oxynitride) film (for example, refer to Patent Document 4). Further, although it is not a gas barrier film, as a method of forming a film by using a heating element CVD method, for example, a technique is disclosed in which a material gas is brought into contact with a heating element heated to 800 to 2000 ° C to generate a chemical species, and the chemical species is produced. A film is formed by a thermal CVD method on a substrate heated to 150 to 400 ° C (see, for example, Patent Document 5). Patent Document 5 discloses a method of depositing a film using a gas in which a plurality of gases are mixed. Further, a technique of improving the gas barrier properties of the SiCN film by using a raw material gas of a decazane system has been disclosed (for example, see Patent Document 7).

[先前技術文獻] [Previous Technical Literature]

[專利文獻] [Patent Literature]

[專利文獻1]日本專利特開2005-200043號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2005-200043

[專利文獻2]日本專利特開2008-127053號公報 [Patent Document 2] Japanese Patent Laid-Open Publication No. 2008-127053

[專利文獻3]WO 2006/126677號公報 [Patent Document 3] WO 2006/126677

[專利文獻4]日本專利特開2008-208404號公報 [Patent Document 4] Japanese Patent Laid-Open Publication No. 2008-208404

[專利文獻5]日本專利特開昭63-40314號公報 [Patent Document 5] Japanese Patent Laid-Open Publication No. 63-40314

[專利文獻6]日本專利特開平08-53116號公報 [Patent Document 6] Japanese Patent Laid-Open Publication No. 08-53116

[專利文獻7]日本專利特開2010-235979號公報 [Patent Document 7] Japanese Patent Laid-Open Publication No. 2010-235979

然而,先前之發熱體CVD法係結合目標之薄膜之構成元素而使用組合有2種以上之氣體之混合氣體作為原料氣體的方法。於該方法中,各氣體之供給量之控制較為複雜,難以穩定地獲得具有較高之阻氣性之薄膜。又,存在生成與目標化學種不同之化學種之情形,阻氣性之提高存在極限。又,根據本發明者等人之研究,薄膜即便包含相同之構成元素亦未必顯示相同之阻氣性,薄膜之阻氣性受堆積之薄膜中之元素間之鍵結狀態或薄膜中之空隙之狀態的影響。至今為止,尚未揭示使用單種原料氣體而形成具有較高之阻氣性之薄膜的技術。進而,為了進一步提高阻氣性,可選擇性地堆積具有目標鍵結狀態之薄膜之發熱體之種類的研究幾乎並未進行。例如,本發明者等人銳意試驗,結果得知:專利文獻7中記載之技術中,為提高阻氣性而必需使基板高溫,由於PET(Polyethylene Terephthalate,聚對苯二甲酸乙二酯)基板之耐熱性不足,故而無法實現PET基板之阻氣性之提高。 However, the conventional heating element CVD method is a method in which a mixed gas of two or more kinds of gases is used as a material gas in combination with a constituent element of a target film. In this method, the control of the supply amount of each gas is complicated, and it is difficult to stably obtain a film having a high gas barrier property. Further, there is a case where a chemical species different from the target chemical species is generated, and there is a limit to improvement in gas barrier properties. Further, according to the study by the inventors of the present invention, the film does not necessarily exhibit the same gas barrier properties even if it contains the same constituent elements, and the gas barrier property of the film is affected by the bonding state between the elements in the deposited film or the voids in the film. The impact of the state. Heretofore, a technique of forming a film having a high gas barrier property using a single material gas has not been disclosed. Further, in order to further improve the gas barrier properties, research on the type of the heat generating body capable of selectively depositing the film having the target bonding state has hardly been carried out. For example, the inventors of the present invention have intensively tested and found that in the technique described in Patent Document 7, it is necessary to raise the temperature of the substrate in order to improve the gas barrier property, and the PET (Polyethylene Terephthalate) substrate is used. Since the heat resistance is insufficient, the gas barrier properties of the PET substrate cannot be improved.

因此,本發明之目的在於提供一種具有較高之阻氣性之阻氣性塑膠成形體。又,本發明之第二目的在於提供一種使用安全性較高之單種原料氣體、且可以無需昂貴機件之製造裝置進行的具有阻氣薄膜之塑膠成形體之製造方法。 Accordingly, it is an object of the present invention to provide a gas barrier plastic molded article having a high gas barrier property. Further, a second object of the present invention is to provide a method for producing a plastic molded body having a gas barrier film which can be carried out using a single raw material gas having high safety and which can be produced without requiring an expensive machine.

本發明之阻氣性塑膠成形體係包括塑膠成形體及設置於該塑膠成形體之表面之阻氣薄膜者;其特徵在於:上述阻氣薄膜包含矽(Si)、碳(C)、氧(O)及氫(H)作為構成元素,且包括(數1)所示之Si含有率為40.1%以上之Si含有層。 The gas barrier plastic molding system of the present invention comprises a plastic molded body and a gas barrier film disposed on the surface of the plastic molded body; wherein the gas barrier film comprises bismuth (Si), carbon (C), and oxygen (O) And hydrogen (H) as a constituent element, and includes the Si-containing layer having a Si content of 40.1% or more as indicated by (number 1).

(數1)Si含有率[%]={(Si含量[原子%])/(Si、O及C之合計含量[原子%])}×100於數1中,Si、O或C之含量係Si、O及C三元素之明細含量。 (Number 1) Si content rate [%] = {(Si content [Atomic%]) / (Total content of Si, O and C [Atomic%])} × 100 in the number 1, content of Si, O or C It is the content of the three elements of Si, O and C.

於本發明之阻氣性塑膠成形體中,上述Si含有層之(數2)所示之C含有率較佳為22.8~45.5%。 In the gas barrier plastic molded article of the present invention, the C content of the Si-containing layer (number 2) is preferably from 22.8 to 45.5%.

(數2)C含有率[%]={(C含量[原子%])/(Si、O及C之合計含量[原子%])}×100於數2中,Si、O或C之含量係Si、O及C三元素之明細含量。 (Number 2) C content rate [%] = {(C content [atomic %]) / (total content of Si, O and C [atomic %])} × 100 in the number 2, content of Si, O or C It is the content of the three elements of Si, O and C.

於本發明之阻氣性塑膠成形體中,上述Si含有層之(數3)所示之O含有率較佳為2.0~35.8%。 In the gas barrier plastic molded article of the present invention, the O content shown by the number (3) of the Si-containing layer is preferably 2.0 to 35.8%.

(數3)O含有率[%]={(O含量[原子%])/(Si、O及C之合計含量[原子%])}×100於數3中,Si、O或C之含量係Si、O及C三元素之明細含量。 (Number 3) O content rate [%] = {(O content [atomic %]) / (total content of Si, O and C [atomic %])} × 100 in the number 3, content of Si, O or C It is the content of the three elements of Si, O and C.

於本發明之阻氣性塑膠成形體中,上述Si含有層之含氫率較佳為21~46原子%。 In the gas barrier plastic molded article of the present invention, the Si-containing layer preferably has a hydrogen content of 21 to 46% by atom.

於本發明之阻氣性塑膠成形體中,上述阻氣薄膜之密度較佳為1.30~1.47 g/cm3In the gas barrier plastic molded article of the present invention, the density of the gas barrier film is preferably from 1.30 to 1.47 g/cm 3 .

本發明之阻氣性塑膠成形體中,較佳為包含以下區域:若以條件(1)對上述Si含有層進行X射線電子分光分析(以下,存在稱為XPS分析之情形),則於Si與Si之鍵結能之波峰出現位置觀察到主波峰。 In the gas barrier plastic molded article of the present invention, it is preferable to include a region in which the X-ray electron spectroscopic analysis (hereinafter, referred to as XPS analysis) is performed on the Si-containing layer under the condition (1). The main peak is observed at the position where the peak of the bond energy of Si is present.

條件(1)將測定範圍設為95~105 eV。 Condition (1) sets the measurement range to 95 to 105 eV.

可製成阻氣性更佳之阻氣薄膜。 It can be made into a gas barrier film with better gas barrier properties.

於本發明之阻氣性塑膠成形體中,較佳為,若以條件(2)對上述Si含有層進行X射線光電子分光分析,則於Si與Si之鍵結能之波峰出現位置未觀察到波峰。 In the gas barrier plastic molded article of the present invention, it is preferred that the X-ray photoelectron spectroscopy of the Si-containing layer is carried out under the condition (2), and the peak position of the bonding energy of Si and Si is not observed. crest.

條件(2)將測定範圍設為120~150 eV。 Condition (2) sets the measurement range to 120 to 150 eV.

可確認Si含有層中存在Si-H鍵。 It was confirmed that a Si-H bond was present in the Si-containing layer.

於本發明之阻氣性塑膠成形體中,上述阻氣薄膜較佳為利用發熱體CVD法而形成。 In the gas barrier plastic molded article of the present invention, the gas barrier film is preferably formed by a heating element CVD method.

於本發明之阻氣性塑膠成形體中,上述阻氣薄膜之膜厚較佳為5 nm以上。可製成阻氣性更佳之阻氣薄膜。 In the gas barrier plastic molded article of the present invention, the film thickness of the gas barrier film is preferably 5 nm or more. It can be made into a gas barrier film with better gas barrier properties.

於本發明之阻氣性塑膠成形體中,包括上述塑膠成形體為容器、膜或片材之形態。 In the gas barrier plastic molded article of the present invention, the plastic molded body is in the form of a container, a film or a sheet.

本發明之阻氣性塑膠成形體之製造方法係包括以下成膜步驟者:使原料氣體接觸發熱之發熱體,使該原料氣體分解而生成化學種,並使上述化學種到達塑膠成形體之表面,藉此而形成阻氣薄膜;其特徵在於:使用通式(化1)所示之有機矽烷系化合物作為上述原料氣體,並使用包含選自Mo、W、Zr、Ta、V、Nb、Hf之群中之一種或二種以上之金屬元素的材料作為上述發熱體,且將該發熱體之發熱 溫度設為1550~2400℃。 The method for producing a gas barrier plastic molded article of the present invention comprises the following steps of forming a film: contacting a material gas with a heat generating body that generates heat, decomposing the material gas to form a chemical species, and causing the chemical species to reach the surface of the plastic molded body Thereby, a gas barrier film is formed; characterized in that an organic decane compound represented by the formula (Chemical Formula 1) is used as the above-mentioned source gas, and a component selected from the group consisting of Mo, W, Zr, Ta, V, Nb, Hf is used. a material of one or more of the metal elements in the group as the heat generating body, and the heat of the heat generating body The temperature is set to 1550~2400 °C.

(化1)H3Si-Cn-X於化1中,n為2或3,X為SiH3、H或NH2(Chemical Formula 1) H 3 Si-C n -X In Chemical 1, 1 is 2 or 3, and X is SiH 3 , H or NH 2 .

於本發明之阻氣性塑膠成形體之製造方法中,上述通式(化1)所示之有機矽烷系化合物較佳為乙烯基矽烷、二矽丁烷或二矽烷基乙炔或2-胺基乙基矽烷。可有效地形成阻氣性更優異之薄膜。 In the method for producing a gas barrier plastic molded article of the present invention, the organodecane compound represented by the above formula (Chemical Formula 1) is preferably a vinyl decane, a dioxane or a dialkyl acetylene or a 2-amino group. Ethyl decane. A film having more excellent gas barrier properties can be effectively formed.

於本發明之阻氣性塑膠成形體之製造方法中,作為上述發熱體,較佳為使用金屬鉭、鉭基合金或碳化鉭,使用金屬鎢、鎢基合金或碳化鎢,使用金屬鉬、鉬基合金或碳化鉬,或使用金屬鉿、鉿基合金或碳化鉿。由於該等材料之觸媒活性較高,故而可使原料氣體更有效地分解。又,可有效地生成化學種,形成具有較高之阻氣性之薄膜。 In the method for producing a gas barrier plastic molded article of the present invention, as the heat generating body, metal ruthenium, ruthenium-based alloy or tantalum carbide is preferably used, metal tungsten, tungsten-based alloy or tungsten carbide is used, and metal molybdenum and molybdenum are used. Base alloy or molybdenum carbide, or use of metal ruthenium, ruthenium based alloy or tantalum carbide. Since the catalytic activity of the materials is high, the raw material gases can be more efficiently decomposed. Further, chemical species can be efficiently produced to form a film having a high gas barrier property.

本發明提供一種具有較高之阻氣性之阻氣性塑膠成形體。又,本發明之第二目的在於提供一種使用安全性較高之單種原料氣體、且可以無需昂貴機件之製造裝置進行的具有阻氣薄膜之塑膠成形體之製造方法。 The present invention provides a gas barrier plastic molded body having a high gas barrier property. Further, a second object of the present invention is to provide a method for producing a plastic molded body having a gas barrier film which can be carried out using a single raw material gas having high safety and which can be produced without requiring an expensive machine.

繼而,關於本發明例示實施形態而詳細進行說明,但本發明並不限定於該等記載而解釋。只要實現本發明之效果,則實施形態亦可進行種種變形。 Hereinafter, the exemplary embodiments of the present invention will be described in detail, but the present invention is not limited to the descriptions. The embodiment can be variously modified as long as the effects of the present invention are achieved.

圖1係表示本實施形態之阻氣性塑膠成形體之基本構成的剖面圖。本實施形態之阻氣性塑膠成形體90係包括塑膠 成形體91及設置於塑膠成形體91之表面之阻氣薄膜92者,且阻氣薄膜92包含矽(Si)、碳(C)、氧(O)及氫(H)作為構成元素,且包括(數1)所示之Si含有率為40.1%以上之Si含有層。 Fig. 1 is a cross-sectional view showing a basic configuration of a gas barrier plastic molded article of the present embodiment. The gas barrier plastic molded body 90 of the present embodiment includes plastic The molded body 91 and the gas barrier film 92 provided on the surface of the plastic molded body 91, and the gas barrier film 92 contains bismuth (Si), carbon (C), oxygen (O), and hydrogen (H) as constituent elements, and includes The Si-containing layer having a Si content of 40.1% or more is shown by the number (1).

(數1)Si含有率[%]={(Si含量[原子%])/(Si、O及C之合計含量[原子%])}×100於數1中,Si、O或C之含量係Si、O及C三元素之明細含量。 (Number 1) Si content rate [%] = {(Si content [Atomic%]) / (Total content of Si, O and C [Atomic%])} × 100 in the number 1, content of Si, O or C It is the content of the three elements of Si, O and C.

構成塑膠成形體91之樹脂係例如:聚對苯二甲酸乙二酯樹脂(PET,Polyethylene Terephthalate)、聚對苯二甲酸丁二酯樹脂、聚萘二甲酸乙二酯樹脂、聚乙烯樹脂、聚丙烯樹脂(PP,Polypropylene)、環烯烴共聚物樹脂(COC,Cycloolefin Copolymer,環狀烯烴共聚合)、離子聚合物樹脂、聚-4-甲基戊烯-1樹脂、聚甲基丙烯酸甲酯樹脂、聚苯乙烯樹脂、乙烯-乙烯醇共聚合樹脂、丙烯腈樹脂、聚氯乙烯樹脂、聚偏二氯乙烯樹脂、聚醯胺樹脂、聚醯胺醯亞胺樹脂、聚縮醛樹脂、聚碳酸酯樹脂、聚碸樹脂,或四氟乙烯樹脂、丙烯腈-苯乙烯樹脂、丙烯腈-丁二烯-苯乙烯樹脂。該等可將1種作為單層或積層2種以上而使用,但就生產性方面而言,較佳為單層。又,樹脂之種類更佳為PET。 The resin constituting the plastic molded body 91 is, for example, polyethylene terephthalate (PET), polybutylene terephthalate resin, polyethylene naphthalate resin, polyethylene resin, poly Acrylic resin (PP, Polypropylene), cycloolefin copolymer resin (COC, Cycloolefin Copolymer, cyclic olefin copolymerization), ionic polymer resin, poly-4-methylpentene-1 resin, polymethyl methacrylate resin , polystyrene resin, ethylene-vinyl alcohol copolymer resin, acrylonitrile resin, polyvinyl chloride resin, polyvinylidene chloride resin, polyamide resin, polyamidamine resin, polyacetal resin, polycarbonate Ester resin, polyfluorene resin, or tetrafluoroethylene resin, acrylonitrile-styrene resin, acrylonitrile-butadiene-styrene resin. One type of these may be used as a single layer or a laminate, but it is preferably a single layer in terms of productivity. Further, the type of the resin is more preferably PET.

於本實施形態之阻氣性塑膠成形體90中,包括塑膠成形體91為容器、膜或片材之形態。其形狀可根據目的及用途而適當設定,並無特別限定。容器包括蓋上、栓上或密封 而使用之容器,或不使用該等而於開口狀態下使用之容器。開口部之大小可根據內容物而適當設定。塑膠容器包括具有適度剛性之具有特定壁厚之塑膠容器,及不具有剛性之由片材形成之塑膠容器。本發明並不受容器之製造方法之限制。內容物例如係水、茶飲料、清涼飲料、碳酸飲料或果汁飲料等飲料,液體、黏體、粉末或固體狀之食品。又,容器可為可回收容器或一次性容器中之任一者。膜或片材包括長條之片狀物及切割片。膜或片材無論延伸或未延伸均可。本發明不受塑膠成形體91之製造方法之限制。 In the gas barrier plastic molded body 90 of the present embodiment, the plastic molded body 91 is in the form of a container, a film or a sheet. The shape can be appropriately set depending on the purpose and use, and is not particularly limited. The container includes a lid, a bolt or a seal The container used, or the container used in the open state without using the container. The size of the opening can be appropriately set depending on the content. The plastic container includes a plastic container having a moderate rigidity and a specific wall thickness, and a plastic container formed of a sheet material having no rigidity. The invention is not limited by the method of manufacture of the container. The contents are, for example, beverages such as water, tea drinks, refreshing drinks, carbonated drinks or fruit drinks, liquids, slims, powders or solid foods. Also, the container can be any of a recyclable container or a disposable container. The film or sheet comprises long strips and cut pieces. The film or sheet may be either extended or unstretched. The present invention is not limited by the method of manufacturing the plastic formed body 91.

塑膠成形體91之厚度可根據目的及用途而適當設定,並無特別限定。例如,於塑膠成形體91為飲料用瓶等容器之情形時,瓶之壁厚較佳為50~500 μm,更佳為100~350 μm。又,於為構成包裝袋之膜之情形時,膜之厚度較佳為3~300 μm,更佳為10~100 μm。於為電子紙或有機EL(Organic Electro-Luminescence,有機電致發光)等之平板顯示器的基板之情形時,膜之厚度較佳為25~200 μm,更佳為50~100 μm。於為用於形成容器之片材之情形時,片材之厚度較佳為50~500 μm,更佳為100~350 μm。並且,於塑膠成形體91為容器之情形時,阻氣薄膜92設置於其內壁面或外壁面之任一面或兩面上。又,於塑膠成形體91為膜之情形時,阻氣薄膜92設置於單面或兩面上。 The thickness of the plastic molded body 91 can be appropriately set depending on the purpose and use, and is not particularly limited. For example, when the plastic molded body 91 is a container such as a bottle for a drink, the wall thickness of the bottle is preferably 50 to 500 μm, more preferably 100 to 350 μm. Further, in the case of forming a film of a packaging bag, the thickness of the film is preferably from 3 to 300 μm, more preferably from 10 to 100 μm. In the case of a substrate of a flat panel display such as an electronic paper or an organic EL (Organic Electro-Luminescence), the thickness of the film is preferably 25 to 200 μm, more preferably 50 to 100 μm. In the case of a sheet for forming a container, the thickness of the sheet is preferably from 50 to 500 μm, more preferably from 100 to 350 μm. Further, when the plastic molded body 91 is a container, the gas barrier film 92 is provided on either or both of the inner wall surface and the outer wall surface. Further, when the plastic molded body 91 is a film, the gas barrier film 92 is provided on one side or both sides.

阻氣薄膜92包含矽(Si)、碳(C)、氧(O)及氫(H)作為構成元素,且包括(數1)所示之Si含有率為40.1%以上之Si含有 層。Si含有層之Si含有率更佳為40.7%以上。Si含有層之Si含有率之上限較佳設為57.7%。更佳為55.7%。若Si含有層之Si含有率未達40.1%,則存在阻氣性不足之情形。若阻氣薄膜92包括Si含有率為40.1%以上之Si含有層,則亦可於該Si含有層之上層或下層或上下兩層具有低Si含有層等其他層。又,阻氣薄膜92整體亦可為該Si含有層。 The gas barrier film 92 contains cerium (Si), carbon (C), oxygen (O), and hydrogen (H) as constituent elements, and includes Si containing a Si content of 40.1% or more as indicated by (number 1). Floor. The Si content of the Si-containing layer is more preferably 40.7% or more. The upper limit of the Si content of the Si-containing layer is preferably set to 57.7%. More preferably 55.7%. If the Si content of the Si-containing layer is less than 40.1%, the gas barrier property may be insufficient. When the gas barrier film 92 includes a Si-containing layer having a Si content of 40.1% or more, another layer such as a low Si-containing layer may be provided in the upper layer or the lower layer or the upper and lower layers of the Si-containing layer. Further, the gas barrier film 92 as a whole may be the Si-containing layer.

於本實施形態之阻氣性塑膠成形體中,Si含有層之(數2)所示之C含有率較佳為22.8~45.5%。更佳為24.8~45.4%。 In the gas barrier plastic molded article of the present embodiment, the C content of the Si-containing layer (number 2) is preferably from 22.8 to 45.5%. More preferably 24.8~45.4%.

(數2)C含有率[%]={(C含量[原子%])/(Si、O及C之合計含量[原子%])}×100於數2中,Si、O或C之含量係Si、O及C三元素之明細含量。 (Number 2) C content rate [%] = {(C content [atomic %]) / (total content of Si, O and C [atomic %])} × 100 in the number 2, content of Si, O or C It is the content of the three elements of Si, O and C.

於本實施形態之阻氣性塑膠成形體中,Si含有層之(數3)所示之O含有率較佳為2.0~35.8%。更佳為6.0~33.8%。 In the gas barrier plastic molded article of the present embodiment, the O content shown by the number (3) of the Si-containing layer is preferably 2.0 to 35.8%. More preferably 6.0 to 33.8%.

(數3)O含有率[%]={(O含量[原子%])/(Si、O及C之合計含量[原子%])}×100於數3中,Si、O或C之含量係Si、O及C三元素之明細含量。 (Number 3) O content rate [%] = {(O content [atomic %]) / (total content of Si, O and C [atomic %])} × 100 in the number 3, content of Si, O or C It is the content of the three elements of Si, O and C.

Si含有率、C含有率或O含有率例如可藉由將阻氣薄膜92進行XPS(X-ray Photoelectron Spectroscopy,X射線光電子分光)分析而測定。 The Si content, the C content, or the O content can be measured, for example, by performing XPS (X-ray Photoelectron Spectroscopy) analysis on the gas barrier film 92.

於本實施形態之阻氣性塑膠成形體中,Si含有層之含氫率較佳為21~46原子%(at.%)。更佳為25~42 at.%。含氫率可藉由拉塞福逆散射譜法(以下稱為RBS分析)進行測定。 藉由相對增大含氫量,而容易吻合塑膠基板之變形。反之,若將含氫量抑制較小則膜質硬質化,因此容易於塑膠基板變形時顯著地產生裂痕。又,RBS分析所得之阻氣薄膜之矽含有率較佳為20~38 at.%。更佳為22~36 at.%。RBS分析所得之阻氣薄膜之碳含有率較佳為15~25 at.%。更佳為18~22 at.%。RBS分析所得之阻氣薄膜之氧含有率較佳為12~26 at.%。更佳為15~21 at.%。再者,阻氣薄膜92除Si、C、O及H以外,亦可包含其他元素。其他元素係例如Mo(鉬)等來自發熱體之金屬元素、N(氮)。 In the gas barrier plastic molded article of the present embodiment, the hydrogen content of the Si-containing layer is preferably from 21 to 46 atom% (at.%). More preferably 25~42 at.%. The hydrogen content can be measured by a Laceford inverse scattering spectrum method (hereinafter referred to as RBS analysis). By relatively increasing the hydrogen content, it is easy to match the deformation of the plastic substrate. On the other hand, if the amount of hydrogen contained is suppressed to a small extent, the film quality is hardened, so that cracks are remarkably generated when the plastic substrate is deformed. Further, the ruthenium content of the gas barrier film obtained by RBS analysis is preferably from 20 to 38 at.%. More preferably 22~36 at.%. The carbon content of the gas barrier film obtained by RBS analysis is preferably 15 to 25 at.%. More preferably 18~22 at.%. The oxygen content of the gas barrier film obtained by RBS analysis is preferably from 12 to 26 at.%. More preferably 15~21 at.%. Further, the gas barrier film 92 may contain other elements in addition to Si, C, O, and H. Other elements are a metal element derived from a heating element such as Mo (molybdenum), and N (nitrogen).

於本實施形態之阻氣性塑膠成形體中,上述阻氣薄膜之密度較佳為1.30~1.47 g/cm3,更佳為1.33~1.46 g/cm3,特佳為1.35~1.40 g/m3In the gas barrier plastic molded article of the present embodiment, the density of the gas barrier film is preferably from 1.30 to 1.47 g/cm 3 , more preferably from 1.33 to 1.46 g/cm 3 , and particularly preferably from 1.35 to 1.40 g/m. 3 .

本實施形態之阻氣性塑膠成形體中,較佳為包含以下區域:若以條件(1)對Si含有層進行XPS分析,則於Si與Si之鍵結能之波峰出現位置觀察到主波峰(以下,亦存在將於Si與Si之鍵結能之波峰出現位置觀察到之波峰稱為Si波峰的情形)。 In the gas barrier plastic molded article of the present embodiment, it is preferable to include a region in which the main peak is observed at the peak position of the bonding energy of Si and Si when the Si-containing layer is subjected to XPS analysis under the condition (1). (Herein, there is also a case where a peak observed at a peak where the bonding energy of Si and Si is observed is called an Si peak).

條件(1)將測定範圍設為95~105 eV。 Condition (1) sets the measurement range to 95 to 105 eV.

若以條件(1)進行XPS分析,則於Si與Si之鍵結能之波峰出現位置觀察到主波峰。此處,於本說明書中,主波峰係指於條件(1)中,波峰分離而觀察到之波峰中強度最高之波峰。根據出現於Si與Si之鍵結能之波峰出現位置的波峰而設想之鍵結狀態係Si-Si鍵或Si-H鍵。於本實施形態中,較佳為Si波峰之主要鍵為Si-H鍵。阻氣薄膜92所包含之化合 物之鍵之態樣除Si-Si鍵或Si-H鍵以外,例如為Si-C鍵、Si-O鍵、C-H鍵、C-C鍵、C-O鍵、Si-O-C鍵、C-O-C鍵、O-C-O鍵。 When the XPS analysis is carried out under the condition (1), the main peak is observed at the position where the peak of the bonding energy of Si and Si appears. Here, in the present specification, the main peak refers to the peak having the highest intensity among the peaks observed in the peak separation in the condition (1). The bonding state assumed based on the peak appearing at the peak of the bonding energy of Si and Si is a Si-Si bond or a Si-H bond. In the present embodiment, it is preferred that the main bond of the Si peak is a Si-H bond. The combination of the gas barrier film 92 In addition to the Si-Si bond or the Si-H bond, the bond state of the object is, for example, a Si-C bond, a Si-O bond, a C-H bond, a C-C bond, a C-O bond, a Si-O-C bond, a C-O-C bond, or an O-C-O bond.

於本實施形態之阻氣性塑膠成形體中,較佳為若以條件(2)對Si含有層進行XPS分析,則於Si與Si之鍵結能之波峰出現位置未觀察到波峰。 In the gas barrier plastic molded article of the present embodiment, when the Si-containing layer is subjected to XPS analysis under the condition (2), no peak is observed at the peak of the bonding energy of Si and Si.

條件(2)將測定範圍設為120~150 eV。 Condition (2) sets the measurement range to 120 to 150 eV.

可藉由以條件(1)及條件(2)進行XPS分析而確認Si波峰主要為Si-Si鍵或Si-H鍵中之何者。即,條件(1)下於Si與Si之鍵結能之波峰出現位置有波峰,條件(2)下於Si與Si之鍵結能之波峰出現位置無波峰,藉此可確認Si波峰顯示Si-H鍵。藉此,可將以(數4)求出之阻隔性改良率(Barrier Improvement Factor,以下稱為BIF)設為6以上。 It can be confirmed by XPS analysis under the conditions (1) and (2) that the Si peak is mainly a Si-Si bond or a Si-H bond. That is, under the condition (1), there is a peak at the peak of the bonding energy of Si and Si, and under the condition (2), there is no peak at the peak of the bonding energy of Si and Si, thereby confirming that the Si peak shows Si. -H key. Thereby, the Barrier Improvement Factor (hereinafter referred to as BIF) obtained by (number 4) can be set to 6 or more.

(數4)BIF=[未形成薄膜之塑膠成形體之氧穿透度]/[阻氣性塑膠成形體之氧穿透度] (Number 4) BIF = [oxygen permeability of a plastic formed body without a film] / [oxygen permeability of a gas barrier plastic molded body]

根據本發明者等人之研究,為表現更高之阻氣性,較佳為阻氣薄膜92具有使Si與H之鍵(Si-H鍵)偏靠於薄膜之表面之傾斜組成。可於條件(1)下之XPS分析中進行氬離子蝕刻而確認阻氣薄膜92具有傾斜組成。根據該分析結果,阻氣薄膜92之表面Si波峰為主波峰,隨著朝向塑膠成形體而主波峰向高鍵結能側偏移。藉此,推測,表面Si-H鍵較多,但隨著朝向塑膠成形體之方向,而組成逐漸變化為SiC,繼而自碳比氧多之SiOC變化為氧比碳多之SiOC,於塑膠成形體之界面變為SiOx。具有此種傾斜組成之理由並不明 確,但推測,成膜過程中塑膠成形體之界面因來自塑膠成形體之氧之影響而堆積SiO2或SiOx等SiO系之化合物,但自距塑膠成形體之界面5 nm附近起,塑膠成形體之影響減小,O之含有率減少,堆積之化合物以由SiOC到SiC之方式變為SiC系之化合物,而薄膜之表面較多地包含Si-H鍵。 According to the study by the inventors of the present invention, in order to exhibit higher gas barrier properties, it is preferred that the gas barrier film 92 has a tilting composition in which the bond of Si and H (Si-H bond) is biased against the surface of the film. Argon ion etching can be performed in the XPS analysis under the condition (1) to confirm that the gas barrier film 92 has an inclined composition. According to the analysis result, the surface Si peak of the gas barrier film 92 is the main peak, and the main peak is shifted toward the high bonding energy side as it goes toward the plastic formed body. Therefore, it is estimated that there are many Si-H bonds on the surface, but the composition gradually changes to SiC as it goes toward the direction of the plastic molded body, and then the SiOC from carbon to oxygen is changed to the SiOC with more oxygen than carbon. The interface of the body becomes SiO x . The reason for having such a tilt composition is not clear. However, it is presumed that the interface of the plastic formed body is deposited with an SiO-based compound such as SiO 2 or SiO x due to the influence of oxygen from the plastic formed body during the film formation process, but the self-forming plastic is formed. From the vicinity of the interface of 5 nm, the influence of the plastic formed body is reduced, the content of O is reduced, and the compound deposited becomes a compound of SiC system from SiOC to SiC, and the surface of the film contains Si-H more. key.

於本實施形態之阻氣性塑膠成形體90中,阻氣薄膜92之膜厚較佳為5 nm以上。更佳為10 nm以上。若未達5 nm,則存在阻氣性不充分之情形。又,阻氣薄膜92之膜厚之上限值較佳為設為200 nm。更佳為100 nm。若阻氣薄膜92之膜厚超過200 nm,則容易由於內部應力而產生裂痕。 In the gas barrier plastic molded body 90 of the present embodiment, the film thickness of the gas barrier film 92 is preferably 5 nm or more. More preferably 10 nm or more. If it is less than 5 nm, there is a case where the gas barrier property is insufficient. Further, the upper limit of the film thickness of the gas barrier film 92 is preferably set to 200 nm. More preferably 100 nm. If the film thickness of the gas barrier film 92 exceeds 200 nm, cracks are likely to occur due to internal stress.

於本實施形態之阻氣性塑膠成形體90中,較佳為阻氣薄膜92係利用發熱體CVD法而形成。發熱體CVD法係以下方法:於真空腔室內使原料氣體接觸藉由通電加熱而發熱之發熱體而發生分解,並使生成之化學種直接或於氣相中經過反應過程後於基材上堆積為薄膜。發熱體因其軟化溫度而有所不同,通常使其發熱至200~2200℃,但藉由空出基材與發熱體之間隔,而可將基材之溫度保持於常溫以上200℃左右之低溫,可不對如塑膠般不耐熱之基材造成損傷而形成薄膜。又,與電漿CVD等其他化學蒸鍍法或真空蒸鍍法、濺鍍法、離子電鍍法等物理蒸鍍(PVD)法相比,裝置簡單且可抑制裝置本身之成本。於發熱體CVD法中,藉由化學種之堆積而形成阻氣薄膜,因此與濕式法相比,獲得體積密度較高之緻密之膜。 In the gas barrier plastic molded body 90 of the present embodiment, it is preferable that the gas barrier film 92 is formed by a heating element CVD method. The heating element CVD method is a method in which a raw material gas is brought into contact with a heating element that generates heat by electric heating in a vacuum chamber, and the generated chemical species is deposited on the substrate directly or in the gas phase after passing through the reaction process. It is a film. The heating element differs depending on its softening temperature, and usually causes it to heat up to 200 to 2200 ° C. However, by vacating the space between the substrate and the heating element, the temperature of the substrate can be kept at a low temperature of about 200 ° C above normal temperature. It can form a film without causing damage to a substrate that is not heat-resistant like plastic. Further, compared with other physical vapor deposition methods such as plasma CVD, vacuum vapor deposition, sputtering, and ion plating, the device is simple and can suppress the cost of the device itself. In the heating element CVD method, since a gas barrier film is formed by chemical species deposition, a dense film having a high bulk density is obtained as compared with the wet method.

繼而,對可於塑膠成形體之表面形成阻氣薄膜之成膜裝置進行說明。圖2係表示成膜裝置之一形態之概略圖。圖2係使用塑膠容器11作為塑膠成形體91並於塑膠容器11之內表面形成阻氣薄膜92的裝置。 Next, a film forming apparatus which can form a gas barrier film on the surface of a plastic molded body will be described. Fig. 2 is a schematic view showing one form of a film forming apparatus. 2 shows a device in which a plastic container 11 is used as the plastic molded body 91 and a gas barrier film 92 is formed on the inner surface of the plastic container 11.

圖2所示之阻氣性塑膠容器之製造裝置100包括:真空腔室6,其收容作為塑膠成形體91之塑膠容器11;排氣泵(未圖示),其將真空腔室6抽成真空;原料氣體供給管23,其可插拔地配置於塑膠容器11之內部並向塑膠容器11之內部提供原料氣體,且其由絕緣且耐熱之材料形成;發熱體18,其由原料氣體供給管23支撐;及加熱電源20,其對發熱體18通電而使其發熱。 The gas barrier plastic container manufacturing apparatus 100 shown in Fig. 2 includes a vacuum chamber 6 that houses a plastic container 11 as a plastic molded body 91, and an exhaust pump (not shown) that draws the vacuum chamber 6 into a vacuum; a raw material gas supply pipe 23 which is detachably disposed inside the plastic container 11 and supplies a material gas to the inside of the plastic container 11, and which is formed of an insulating and heat-resistant material; and a heat generating body 18 which is supplied by the raw material gas The tube 23 is supported; and a heating power source 20 that energizes the heating element 18 to generate heat.

真空腔室6於其內部形成有收容塑膠容器11之空間,該空間成為用於形成薄膜之反應室12。真空腔室6包括下腔室13及上腔室15,該上腔室15裝卸自由地安裝於該下腔室13之上部並以O型環14密封下腔室13之內部。上腔室15中存在未圖示之上下之驅動機構,隨著塑膠容器11之搬入、搬出而上下移動。下腔室13之內部空間係以稍大於收容於此之塑膠容器11之外形之方式而形成。 The vacuum chamber 6 is formed therein with a space for accommodating the plastic container 11, which becomes the reaction chamber 12 for forming a film. The vacuum chamber 6 includes a lower chamber 13 and an upper chamber 15, which is detachably mounted to the upper portion of the lower chamber 13 and seals the inside of the lower chamber 13 with an O-ring 14. The upper chamber 15 has a drive mechanism (not shown), and moves up and down as the plastic container 11 is moved in and out. The internal space of the lower chamber 13 is formed in a manner slightly larger than the outer shape of the plastic container 11 accommodated therein.

真空腔室6之內側,尤其是下腔室13之內側,為防止隨著發熱體18之發熱而放射之光之反射,較佳為內面28係黑色內壁,或內面具有表面粗糙度(Rmax)0.5 μm以上之凹凸。表面粗糙度(Rmax)係使用例如表面粗糙度測定器(Ulvac Techno公司製造,DEKTAX3)進行測定。為使內面28成為黑色內壁,存在鍍黑鎳、鍍黑鉻等電鍍處理, RAYDENT(冷電鍍)、染黑等化成皮膜處理,或塗佈黑色塗料而進行著色之方法。進而,較佳為將流動冷卻水之冷卻管等冷卻裝置29設置於真空腔室6之內部或外部,而防止下腔室13之溫度上升。真空腔室6之中,尤其是以下腔室13為對象,其原因在於發熱體18插入塑膠容器11時恰好成為收容於下腔室13之內部空間之狀態。藉由進行光之反射之防止及真空腔室6之冷卻,而可抑制塑膠容器11之溫度上升及伴隨於此之熱變形。進而,若將包括自已通電之發熱體18產生之放射光可通過之透明體之腔室30,例如玻璃製腔室配置於下腔室13之內側,則接觸塑膠容器11之玻璃製腔室之溫度難以上升,因此可進一步減輕對塑膠容器11造成之熱影響。 The inner side of the vacuum chamber 6, especially the inner side of the lower chamber 13, is for preventing the reflection of light emitted by the heating of the heating element 18, preferably the inner surface 28 is a black inner wall, or the inner surface has a surface roughness. (Rmax) Concavities and convexities of 0.5 μm or more. The surface roughness (Rmax) is measured using, for example, a surface roughness measuring instrument (manufactured by Ulvac Techno, DEKTAX3). In order to make the inner surface 28 a black inner wall, there is a plating treatment such as black nickel plating or black chrome plating. RAYDENT (cold plating), blackening, etc., into a film treatment, or a method of applying a black paint to color. Further, it is preferable to provide a cooling device 29 such as a cooling pipe for flowing cooling water inside or outside the vacuum chamber 6, thereby preventing the temperature of the lower chamber 13 from rising. Among the vacuum chambers 6, particularly the following chambers 13, is intended to be in a state in which the heat generating body 18 is inserted into the plastic container 11 just in the state of being accommodated in the internal space of the lower chamber 13. By preventing the reflection of light and the cooling of the vacuum chamber 6, the temperature rise of the plastic container 11 and the thermal deformation accompanying this can be suppressed. Further, when the chamber 30 including the transparent body through which the emitted light generated by the self-heating heating element 18 passes, for example, the glass chamber is disposed inside the lower chamber 13, the glass chamber of the plastic container 11 is contacted. The temperature is hard to rise, so that the thermal influence on the plastic container 11 can be further alleviated.

原料氣體供給管23係於上腔室15之內側頂板面之中央以向下方下垂之方式而被支撐。原料氣體33經由流量調整器24a、24b及閥門25a~25c而流入原料氣體供給管23。原料氣體33之供給於起始原料為液體之情形時,可利用起泡法而進行供給。即,一面利用流量調節器24a控制流量一面向收容於原料槽40a內之起始原料41a供給起泡氣體,使起始原料41a產生蒸氣並作為原料氣體33進行供給。 The material gas supply pipe 23 is supported so as to be suspended in the center of the inner top surface of the upper chamber 15 so as to hang downward. The material gas 33 flows into the material gas supply pipe 23 via the flow rate adjusters 24a and 24b and the valves 25a to 25c. When the raw material gas 33 is supplied to the starting material as a liquid, it can be supplied by a foaming method. In other words, the flow rate is controlled by the flow rate adjuster 24a, and the foaming gas is supplied to the starting material 41a accommodated in the raw material tank 40a, and the starting material 41a is vaporized and supplied as the material gas 33.

原料氣體供給管23較佳為包括冷卻管並一體地形成。此種原料氣體供給管23之結構例如存在雙管結構。於原料氣體供給管23中,雙管之內側管路成為原料氣體流路17,其一端連接於設置於上腔室15上之氣體供給口16,另一端成為氣體噴出孔17x。藉此,原料氣體自連接於氣體供給口 16之原料氣體流路17之前端的氣體噴出孔17x噴出。另一方面,雙管之外側管路係用於冷卻原料氣體供給管23之冷卻水流路27,作為冷卻管而發揮作用。而且,於發熱體18通電而發熱時,原料氣體流路17之溫度上升。為防止溫度上升,於冷卻水流路27中循環有冷卻水。即,於冷卻水流路27之一端,自連接於上腔室15之未圖示之冷卻水供給裝置供給冷卻水,並且使完成冷卻之冷卻水返回冷卻水供給裝置。另一方面,冷卻水流路27之另一端於氣體噴出孔17x附近密封,此處冷卻水折返而回。藉由冷卻水流路27,原料氣體供給管23整體經冷卻。藉由進行冷卻可降低對塑膠容器11造成之熱影響。因此,原料氣體供給管23之材質較佳為絕緣體且熱導率較大者。例如,較佳為由以氮化鋁、碳化矽、氮化矽或氧化鋁為主成分之材料形成之陶瓷管,或由以氮化鋁、碳化矽、氮化矽或氧化鋁為主成分之材料被覆表面之金屬管。可對發熱體穩定地通電,具有耐久性,且可藉由熱傳導而效率較佳地排出利用發熱體產生之熱。 The material gas supply pipe 23 preferably includes a cooling pipe and is integrally formed. The structure of the material gas supply pipe 23 is, for example, a double pipe structure. In the material gas supply pipe 23, the inner pipe of the double pipe serves as the material gas flow path 17, and one end thereof is connected to the gas supply port 16 provided in the upper chamber 15, and the other end serves as the gas discharge hole 17x. Thereby, the material gas is self-connected to the gas supply port The gas ejection hole 17x at the front end of the raw material gas flow path 17 of 16 is ejected. On the other hand, the pipe outside the double pipe is used to cool the cooling water flow path 27 of the material gas supply pipe 23, and functions as a cooling pipe. When the heating element 18 is energized and generates heat, the temperature of the material gas flow path 17 rises. In order to prevent the temperature from rising, cooling water is circulated in the cooling water flow path 27. In other words, at one end of the cooling water flow path 27, cooling water is supplied from a cooling water supply device (not shown) connected to the upper chamber 15, and the cooling water that has been cooled is returned to the cooling water supply device. On the other hand, the other end of the cooling water flow path 27 is sealed near the gas discharge hole 17x, and the cooling water is turned back and returned. The raw material gas supply pipe 23 is entirely cooled by the cooling water flow path 27. The thermal influence on the plastic container 11 can be reduced by performing cooling. Therefore, the material of the material gas supply pipe 23 is preferably an insulator and has a large thermal conductivity. For example, it is preferably a ceramic tube formed of a material mainly composed of aluminum nitride, tantalum carbide, tantalum nitride or aluminum oxide, or mainly composed of aluminum nitride, tantalum carbide, tantalum nitride or aluminum oxide. The material is coated with a metal tube on the surface. The heating element can be stably energized, has durability, and can efficiently discharge heat generated by the heating element by heat conduction.

關於原料氣體供給管23,作為未圖示之另一形態,亦可如下設置。即,將原料氣體供給管設置為雙管,以其外側管作為原料氣體流路並於外側管之側壁開孔,較佳為開複數個孔。另一方面,原料氣體供給管之雙管之內側管係由緻密之管而形成,作為冷卻水流路而流動冷卻水。發熱體係沿原料氣體供給管之側壁而佈線,通過設置於外側管之側壁上之孔的原料氣體接觸沿側壁之部分之發熱體,可效 率較佳地生成化學種。 The material gas supply pipe 23 may be provided as follows, as another form not shown. That is, the raw material gas supply pipe is provided as a double pipe, and the outer pipe is used as a material gas flow path to open a hole in the side wall of the outer pipe, and preferably a plurality of holes are opened. On the other hand, the inner tube of the double pipe of the material gas supply pipe is formed of a dense pipe, and the cooling water flows as a cooling water flow path. The heat generating system is routed along the side wall of the raw material gas supply pipe, and the raw material gas provided in the hole on the side wall of the outer pipe contacts the heat generating body along the side wall, which is effective The rate is preferably a chemical species.

氣體噴出孔17x若與塑膠容器11之底部過度分離,則難以於塑膠容器11之內部形成薄膜。於本實施形態中,原料氣體供給管23之長度較佳為以自氣體噴出孔17x起至塑膠容器11之底部為止之距離L1成為5~50 mm之方式而形成。膜厚之均勻性提高。可以5~50 mm之距離於塑膠容器11之內表面形成均勻之薄膜。若距離大於50 mm則存在難以於塑膠容器11之底部形成薄膜之情形。又,若距離小於5 mm則存在難以噴出原料氣體之情形,或膜厚分佈不均勻之情形。該事實亦可自理論上進行把握。於500 ml之容器之情形時,由於容器之主體直徑為6.4 cm,常溫之空氣之平均自由行程λ=0.68/Pa[cm],故而分子流為壓力<0.106 Pa,黏性流為壓力>10.6 Pa,中間流為0.106 Pa<壓力<10.6 Pa。於成膜時之氣壓為5~100 Pa時,氣流自中間流變為黏性流,氣體噴出孔17x與塑膠容器11之底部之距離存在最適條件。 When the gas ejection hole 17x is excessively separated from the bottom of the plastic container 11, it is difficult to form a film inside the plastic container 11. In the present embodiment, the length of the material gas supply pipe 23 is preferably such that the distance L1 from the gas discharge hole 17x to the bottom of the plastic container 11 is 5 to 50 mm. The uniformity of the film thickness is improved. A uniform film can be formed on the inner surface of the plastic container 11 at a distance of 5 to 50 mm. If the distance is larger than 50 mm, there is a case where it is difficult to form a film on the bottom of the plastic container 11. Further, when the distance is less than 5 mm, there is a case where it is difficult to discharge the material gas, or the film thickness distribution is not uniform. This fact can also be grasped theoretically. In the case of a 500 ml container, since the main body diameter of the container is 6.4 cm, the average free path of air at normal temperature is λ = 0.68/Pa [cm], so the molecular flow is pressure <0.106 Pa, and the viscous flow is pressure > 10.6. Pa, the intermediate flow is 0.106 Pa <pressure < 10.6 Pa. When the gas pressure at the time of film formation is 5 to 100 Pa, the gas flow changes from the intermediate flow to the viscous flow, and the distance between the gas ejection hole 17x and the bottom of the plastic container 11 is optimal.

發熱體18促進原料氣體之分解。發熱體18形成為佈線形狀,且發熱體18之一端連接於連接部26a,連接部26a設置於原料氣體供給管23之上腔室15之固定位置之下方,為佈線19與發熱體18之連接位置。而且,由前端部分即設置於氣體噴出孔17x上之絕緣陶瓷構件35進行支撐。進而,返回,發熱體18之另一端連接於連接部26b。如此,由於發熱體18沿原料氣體供給管23之側面而受到支撐,故而以位於下腔室13之內部空間之大致主軸上之方式進行配置。圖 2中例示有發熱體18以與原料氣體供給管23之軸平行之方式沿原料氣體供給管23之周圍進行配置之情形,但亦可將連接部26a為起點,螺旋狀地纏繞於原料氣體供給管23之側面,並由固定於氣體噴出孔17x附近之絕緣陶瓷35支撐後,向連接部26b折返而回。此處,發熱體18係藉由掛在絕緣陶瓷35上而固定於原料氣體供給管23上。圖2中已例示發熱體18於原料氣體供給管23之氣體噴出孔17x附近而配置於氣體噴出孔17x之出口側的情形。藉此,由於自氣體噴出孔17x噴出之原料氣體容易與發熱體18接觸,故而可效率較佳地使原料氣體活化。此處,發熱體18較佳為稍稍離開原料氣體供給管23之側面而配置。其目的在於防止原料氣體供給管23之急劇之溫度上升。又,可增加與自氣體噴出孔17x噴出之原料氣體及反應室12之原料氣體之接觸機會。包括該發熱體18之原料氣體供給管23之外徑必需小於塑膠容器之口部21之內徑。其目的在於將包括發熱體18之原料氣體供給管23自塑膠容器之口部21插入。因此,若必要程度以上地使發熱體18離開原料氣體供給管23之表面,則於將原料氣體供給管23自塑膠容器之口部21插入時容易接觸。若考慮到自塑膠容器之口部21插入時之位置偏差,則發熱體18之寬度較佳為10 mm以上且(口部21之內徑-6)mm以下。例如,口部21之內徑約為21.7~39.8 mm。 The heating element 18 promotes decomposition of the material gas. The heating element 18 is formed in a wiring shape, and one end of the heating element 18 is connected to the connecting portion 26a, and the connecting portion 26a is provided below the fixed position of the upper chamber 15 of the material gas supply pipe 23 to connect the wiring 19 to the heating element 18. position. Further, the front end portion is supported by the insulating ceramic member 35 provided on the gas ejection hole 17x. Further, returning, the other end of the heating element 18 is connected to the connecting portion 26b. In this manner, since the heating element 18 is supported along the side surface of the material gas supply pipe 23, it is disposed so as to be positioned on the substantially main axis of the internal space of the lower chamber 13. Figure In the case where the heating element 18 is disposed along the periphery of the material gas supply pipe 23 so as to be parallel to the axis of the material gas supply pipe 23, the connection portion 26a may be used as a starting point and spirally wound around the material gas supply. The side surface of the tube 23 is supported by the insulating ceramic 35 fixed in the vicinity of the gas ejection hole 17x, and then folded back to the connecting portion 26b. Here, the heating element 18 is fixed to the material gas supply pipe 23 by being hung on the insulating ceramic 35. In the case where the heat generating body 18 is disposed in the vicinity of the gas discharge hole 17x of the material gas supply pipe 23, the heat generating body 18 is disposed on the outlet side of the gas discharge hole 17x. Thereby, since the material gas discharged from the gas ejection hole 17x is easily brought into contact with the heat generating body 18, the material gas can be efficiently activated. Here, it is preferable that the heating element 18 is disposed slightly away from the side surface of the material gas supply pipe 23. The purpose is to prevent an abrupt temperature rise of the material gas supply pipe 23. Further, the chance of contact with the material gas ejected from the gas ejection hole 17x and the material gas of the reaction chamber 12 can be increased. The outer diameter of the material gas supply pipe 23 including the heat generating body 18 must be smaller than the inner diameter of the mouth portion 21 of the plastic container. The purpose is to insert the material gas supply pipe 23 including the heating element 18 from the mouth portion 21 of the plastic container. Therefore, when the heating element 18 is separated from the surface of the material gas supply pipe 23 to the extent necessary, the material gas supply pipe 23 is easily contacted when being inserted from the mouth portion 21 of the plastic container. The width of the heating element 18 is preferably 10 mm or more and (the inner diameter of the mouth portion -6) mm or less in consideration of the positional deviation when the mouth portion 21 of the plastic container is inserted. For example, the inner diameter of the mouth portion 21 is about 21.7 to 39.8 mm.

由於發熱體18具有導電性,故而例如可藉由通電而使其發熱。於圖2所示之裝置中,發熱體18上經由連接部26a、26b及佈線19而連接有加熱電源20。藉由利用加熱電源20 向發熱體18供電而發熱體18發熱。再者,本發明並不限定於發熱體18之發熱方法。 Since the heating element 18 has electrical conductivity, it can be heated by, for example, energization. In the apparatus shown in FIG. 2, the heating source 18 is connected to the heating element 18 via the connecting portions 26a and 26b and the wiring 19. By using a heating power source 20 The heating element 18 is supplied with power and the heating element 18 generates heat. Furthermore, the present invention is not limited to the heat generating method of the heat generating body 18.

又,由於自塑膠容器之口部21起至容器之肩部為止塑膠容器11於成形時之延伸倍率較小,故而若將高溫發熱之發熱體18配置於附近,則容易產生熱引起之變形。根據實驗,若不使佈線19與發熱體18之連接位置即連接部26a、26b之位置自塑膠容器之口部21之下端離開10 mm以上,則塑膠容器11之肩部部分產生熱變形,若超過50 mm,則難以於塑膠容器11之肩部部分形成薄膜。因此,發熱體18較佳為以其上端位於距塑膠容器之口部21之下端10~50 mm下方之方式進行配置。即,較佳以連接部26a、26b與口部21之下端之距離L2為10~50 mm之方式進行設置。可抑制容器之肩部之熱變形。 Further, since the stretching ratio of the plastic container 11 at the time of molding from the mouth portion 21 of the plastic container to the shoulder portion of the container is small, if the heat generating body 18 which generates heat at a high temperature is disposed in the vicinity, deformation due to heat is likely to occur. According to the experiment, if the position where the connection portion 26a, 26b, that is, the connection position of the wiring 19 and the heating element 18, is not separated from the lower end of the mouth portion 21 of the plastic container by 10 mm or more, the shoulder portion of the plastic container 11 is thermally deformed. When it exceeds 50 mm, it is difficult to form a film on the shoulder portion of the plastic container 11. Therefore, the heating element 18 is preferably disposed such that its upper end is located 10 to 50 mm below the lower end of the mouth portion 21 of the plastic container. That is, it is preferable to provide such that the distance L2 between the connecting portions 26a and 26b and the lower end of the mouth portion 21 is 10 to 50 mm. It can suppress the thermal deformation of the shoulder of the container.

又,排氣管22經由真空閥門8與上腔室15之內部空間連通,藉由未圖示之排氣泵而真空腔室6之內部之反應室12之空氣得以排出。 Further, the exhaust pipe 22 communicates with the internal space of the upper chamber 15 via the vacuum valve 8, and the air in the reaction chamber 12 inside the vacuum chamber 6 is discharged by an exhaust pump (not shown).

繼而,一面參照圖2,一面以於阻氣性塑膠容器11之內表面形成阻氣薄膜之情形為例,對本實施形態之阻氣性塑膠成形體之製造方法進行說明。本實施形態之阻氣性塑膠成形體之製造方法係包括以下成膜步驟者:使原料氣體33接觸發熱之發熱體18,而使原料氣體33分解並生成化學種34,使化學種34到達塑膠成形體之表面(圖2中為塑膠容器11之內表面),藉此而形成阻氣薄膜;使用通式(化1)所示之有機矽烷系化合物作為原料氣體33,且使用包含選自 Mo、W、Zr、Ta、V、Nb、Hf之群中之一種或二種以上之金屬元素的材料作為發熱體18,並將發熱體18之發熱溫度設為1550~2400℃。 Then, a method of manufacturing a gas barrier plastic molded article of the present embodiment will be described by taking a case where a gas barrier film is formed on the inner surface of the gas barrier plastic container 11 as an example. The method for producing a gas barrier plastic molded article according to the present embodiment includes a film forming step of bringing the material gas 33 into contact with the heat generating body 18 that generates heat, and decomposing the material gas 33 to form a chemical species 34, so that the chemical species 34 reaches the plastic. The surface of the molded body (the inner surface of the plastic container 11 in Fig. 2), thereby forming a gas barrier film; using the organic decane compound represented by the formula (Chemical Formula 1) as the raw material gas 33, and using the inclusion of the selected material A material of one or two or more metal elements of Mo, W, Zr, Ta, V, Nb, and Hf is used as the heating element 18, and the heating temperature of the heating element 18 is set to 1550 to 2400 °C.

(化1)H3Si-Cn-X於化1中,n為2或3,X為SiH3、H或NH2(Chemical Formula 1) H 3 Si-C n -X In Chemical 1, 1 is 2 or 3, and X is SiH 3 , H or NH 2 .

於使用上述通式(化1)所示之有機矽烷系化合物作為原料氣體而形成薄膜之情形時,若使用電漿CVD法,則只能將500 ml之PET瓶之氧穿透率抑制至2分之1左右,實用性能不充分。已知若利用電漿CVD法形成包含DLC或SiOx之薄膜,則可將500 ml之PET瓶之氧穿透率抑制至10分之1以下,但於填充有碳酸飲料之情形時,伴隨瓶之膨脹而阻氣性降低。具體而言,若於利用電漿CVD法形成DLC膜或SiOx膜之500 ml之PET瓶(樹脂量23 g)中填充4 GV(氣體容積)之碳酸水並於38℃之條件下保持5天,則通常PET瓶之容量膨脹18~21 cm3(未經成膜之PET瓶之情形為22~26 cm3),且膨脹後之氧穿透率增加至1.5~2.9倍。此為PET瓶之膨脹及膨脹引起之薄膜之損傷綜合性地表現之結果。另一方面,於使用上述通式(化1)所示之有機矽烷系化合物作為原料氣體而形成薄膜之情形時,若使用發熱體CVD法,則可將500 ml之PET瓶之氧穿透率降低至例如10分之1以下,可獲得充分之實用性能。又,於填充有碳酸飲料之情形時,可有效地抑制瓶之膨脹,且阻氣性實質上並未降低。具體而言,若向使用發熱體CVD法而成膜之500 ml之PET瓶(樹脂量23 g)中填充4 GV(氣體容積)之碳酸水並於 38℃之條件下保持5天,則通常瓶容量僅膨脹13~17 cm3(未經成膜之瓶之情形為22~26 cm3),且膨脹後之氧穿透率止於1.2~1.3倍之增加。 When a film is formed using the organodecane compound represented by the above formula (Chemical Formula 1) as a material gas, if the plasma CVD method is used, the oxygen permeability of a 500 ml PET bottle can only be suppressed to 2 About 1 point, the practical performance is not sufficient. It is known that if a film containing DLC or SiO x is formed by a plasma CVD method, the oxygen permeability of a 500 ml PET bottle can be suppressed to less than 1/10, but when filled with a carbonated beverage, the bottle is accompanied. The expansion expands and the gas barrier properties decrease. Specifically, if a 500 ml PET bottle (resin amount 23 g) which forms a DLC film or a SiO x film by a plasma CVD method is filled with 4 GV (gas volume) of carbonated water and maintained at 38 ° C, 5 In the day, the capacity of the PET bottle is usually expanded by 18 to 21 cm 3 (22 to 26 cm 3 in the case of a PET bottle without film formation), and the oxygen permeability after expansion is increased to 1.5 to 2.9 times. This is a result of a comprehensive manifestation of the damage of the film caused by the expansion and expansion of the PET bottle. On the other hand, when a film is formed using the organic decane compound represented by the above formula (Chemical Formula 1) as a material gas, the oxygen permeability of a 500 ml PET bottle can be obtained by using a heating element CVD method. When it is reduced to, for example, 1/10 or less, sufficient practical performance can be obtained. Further, when the carbonated beverage is filled, the expansion of the bottle can be effectively suppressed, and the gas barrier properties are not substantially lowered. Specifically, when a 500 ml PET bottle (resin amount 23 g) formed by using a heating element CVD method is filled with 4 GV (gas volume) of carbonated water and kept at 38 ° C for 5 days, usually The bottle capacity is only expanded by 13~17 cm 3 (22~26 cm 3 without the film forming bottle), and the oxygen permeability after expansion stops at 1.2~1.3 times.

(塑膠成形體對成膜裝置之安裝) (Installation of plastic molded body to film forming apparatus)

首先,打開通風口(未圖示)使真空腔室6內對大氣開放。於卸除上腔室15之狀態下,自下腔室13之上部開口部向反應室12中插入作為塑膠成形體91之塑膠容器11而將其收容。其後,降下位置確定之上腔室15,將安裝於上腔室15上之原料氣體供給管23及固定於其上之發熱體18自塑膠容器之口部21插入塑膠容器11內。然後,上腔室15經由O型環14抵接於下腔室13,藉此而反應室12成為密閉空間。此時,下腔室13之內壁面與塑膠容器11之外壁面之間隔保持大致均勻,且塑膠容器11之內壁面與發熱體18之間之間隔亦保持大致均勻。 First, a vent (not shown) is opened to open the inside of the vacuum chamber 6 to the atmosphere. In the state where the upper chamber 15 is removed, the plastic container 11 as the plastic molded body 91 is inserted into the reaction chamber 12 from the upper opening portion of the lower chamber 13 and housed therein. Thereafter, the upper chamber 15 is lowered, and the material gas supply pipe 23 attached to the upper chamber 15 and the heat generating body 18 fixed thereto are inserted into the plastic container 11 from the mouth portion 21 of the plastic container. Then, the upper chamber 15 abuts against the lower chamber 13 via the O-ring 14, whereby the reaction chamber 12 becomes a sealed space. At this time, the interval between the inner wall surface of the lower chamber 13 and the outer wall surface of the plastic container 11 is kept substantially uniform, and the interval between the inner wall surface of the plastic container 11 and the heat generating body 18 is also kept substantially uniform.

(壓力調整步驟) (pressure adjustment step)

繼而,於關閉通風口(未圖示)後,使排氣泵(未圖示)動作,並打開真空閥門8,藉此而排出反應室12內之空氣。此時,不僅塑膠容器11之內部空間,塑膠容器11之外壁面與下腔室13之內壁面之間之空間亦被進行排氣而成為真空。即,反應室12整體經排氣。而且,較佳為將反應室12內必需之壓力減壓至達到例如1.0~100 Pa,更佳為1.4~50 Pa。若未達1.0 Pa,則存在耗費排氣時間之情形。又,若超過100 Pa,則存在於塑膠容器11內雜質增多而無法獲得阻隔性較高之容器之情形。若自大氣壓減壓至達到1.4~50 Pa,則可獲得適度之真空壓及來自大氣、裝置及容器之適度之殘留水蒸氣壓,可簡便地形成具有阻隔性之薄膜。 Then, after the vent (not shown) is closed, an exhaust pump (not shown) is operated, and the vacuum valve 8 is opened to discharge the air in the reaction chamber 12. At this time, not only the internal space of the plastic container 11, but also the space between the outer wall surface of the plastic container 11 and the inner wall surface of the lower chamber 13 is exhausted to become a vacuum. That is, the entire reaction chamber 12 is exhausted. Further, it is preferred to reduce the pressure necessary in the reaction chamber 12 to, for example, 1.0 to 100 Pa, more preferably 1.4 to 50 Pa. If it is less than 1.0 Pa, there is a case where exhaust time is consumed. In addition, when it exceeds 100 Pa, the amount of impurities in the plastic container 11 increases, and a container having a high barrier property cannot be obtained. If the pressure is reduced from atmospheric pressure to 1.4~50 Pa, a moderate vacuum pressure and a moderate residual vapor pressure from the atmosphere, equipment and containers can be obtained, and a barrier film can be easily formed.

(成膜步驟-對發熱體之通電) (film formation step - energization of the heating element)

繼而,例如藉由通電而使發熱體18發熱。發熱體18之材料係包含選自Mo(鉬)、W(鎢)、Zr(鋯)、Ta(鉭)、V(釩)、Nb(鈮)、Hf(鉿)之群中之一種或二種以上之金屬元素者。更佳為包含選自Mo、W、Zr、Ta之群中之一種或二種以上之金屬元素者。發熱體18之發熱溫度設為1550~2400℃。更佳為1700~2100℃。若未達1550℃,則無法有效地分解原料氣體而於成膜時耗費時間作業效率較低。若超過2400℃,則發熱溫度過剩,不經濟。又,因發熱體18之材料不同而存在變形之情形。存在對塑膠成形體之熱損傷之擔憂。 Then, the heating element 18 generates heat, for example, by energization. The material of the heating element 18 includes one or two selected from the group consisting of Mo (molybdenum), W (tungsten), Zr (zirconium), Ta (钽), V (vanadium), Nb (铌), and Hf (铪). Those who have above the metal elements. More preferably, it is one or more metal elements selected from the group consisting of Mo, W, Zr, and Ta. The heating temperature of the heating element 18 is set to 1550 to 2400 °C. More preferably, it is 1700~2100 °C. If it is less than 1550 ° C, the raw material gas cannot be efficiently decomposed, and it takes time and effort to form a film. If it exceeds 2400 ° C, the heat generation temperature is excessive and it is uneconomical. Further, there is a case where the material of the heating element 18 is deformed due to the material. There is a concern about thermal damage to the plastic formed body.

用於發熱體18之包含金屬元素之材料較佳為純金屬、合金或金屬之碳化物。於使用以Mo、W、Zr、Ta、V、Nb或Hf為主成分之合金作為發熱體18之情形時,較佳為於該合金中,作為主成分之金屬以外之成分之含量為25質量%以下。更佳為10質量%以下,進而較佳為1質量%以下。又,於使用碳化鉭(TaCx)作為發熱體18之情形時,較佳為碳化鉭(TaCx)中之碳原子之比以質量比計超過0質量%且為6.2質量%以下。更佳為3.2質量%以上且6.2質量%以下。於使用碳化鉿(HfCx)作為發熱體18之情形時,較佳為碳化鉿(HfCx)中之碳原子之比以質量比計超過0質量%且為6.3質量%以下。更佳為3.2質量%以上且6.3質量%以下。於使用 碳化鎢(WCx)作為發熱體18之情形時,較佳為碳化鎢(WCx)中之碳原子之比以質量比計超過0質量%且為6.1質量%以下。更佳為3.0質量%以上且6.1質量%以下。於使用碳化鉬(MoCx)作為發熱體18之情形時,較佳為碳化鉬(MoCx)中之碳原子之比以質量比計超過0質量%且為5.9質量%以下。更佳為2.9質量%以上且5.9質量%以下。 The material containing the metal element for the heating element 18 is preferably a pure metal, an alloy or a carbide of a metal. When an alloy containing Mo, W, Zr, Ta, V, Nb or Hf as a main component is used as the heating element 18, it is preferable that the content of the component other than the metal as the main component is 25 mass. %the following. More preferably, it is 10 mass% or less, More preferably, it is 1 mass% or less. In the case where tantalum carbide (TaC x ) is used as the heat generating body 18, the ratio of carbon atoms in tantalum carbide (TaC x ) is preferably more than 0% by mass and not more than 6.2% by mass. More preferably, it is 3.2 mass% or more and 6.2 mass% or less. In the case where tantalum carbide (HfC x ) is used as the heating element 18, the ratio of carbon atoms in the niobium carbide (HfC x ) is preferably more than 0% by mass and not more than 6.3% by mass. More preferably, it is 3.2 mass % or more and 6. mass % or less. In the case where tungsten carbide (WC x ) is used as the heating element 18, the ratio of carbon atoms in the tungsten carbide (WC x ) is preferably more than 0% by mass and not more than 6.1% by mass in terms of a mass ratio. More preferably, it is 3.0 mass% or more and 6.1 mass% or less. Ratio of carbon atoms to the use of molybdenum carbide (MoC x) as the case where the heat generating element 18, preferably molybdenum carbide (MoC x) in a mass ratio of more than 0 mass% and 5.9 mass% or less. More preferably, it is 2.9 mass% or more and 5.9 mass% or less.

(成膜步驟-原料氣體之導入) (film formation step - introduction of raw material gas)

其後,供給通式(化1)所示之有機矽烷系化合物作為原料氣體33。於化1中,相當於Cn之碳化氫結構中之碳間之鍵可為單鍵、雙鍵或三鍵之任一者。更佳為直鏈狀之結構。又,較佳為包括含氫量較少之雙鍵或三鍵。例如,於n=2時,Cn之態樣例為C-C間為單鍵之態樣(C2H4)、C-C間為雙鍵之態樣(C2H2)、C-C間為三鍵之態樣(C2)。於n=3時,Cn之態樣例係C-C間為單鍵之態樣(C3H6)、C-C間為單鍵及雙鍵之態樣(C3H4)、C-C間為單鍵及三鍵之態樣(C3H2)。具體而言,通式(化1)所示之有機矽烷系化合物係例如乙烯基矽烷(H3SiC2H3)、二矽丁烷(H3SiC2H4SiH3)、二矽烷基乙炔(H3SiC2SiH3)、2-胺基乙基矽烷(H3SiC2H4NH2)。其中,較佳為乙烯基矽烷、二矽丁烷或二矽烷基乙炔。 Thereafter, an organic decane compound represented by the formula (Chemical Formula 1) is supplied as the material gas 33. In the first embodiment, the bond between the carbons in the hydrogen carbide structure corresponding to C n may be either a single bond, a double bond or a triple bond. More preferably, it is a linear structure. Further, it is preferred to include a double bond or a triple bond having a small amount of hydrogen. For example, when n=2, the example of the state of C n is a single bond (CC 2 H 4 ) between CCs, a double bond between CCs (C 2 H 2 ), and a triple bond between CCs. The aspect (C 2 ). When n=3, the sample of C n is a single bond (CC 3 H 6 ) between CC, a single bond and a double bond between CC (C 3 H 4 ), and a single CC The key and the three-button aspect (C 3 H 2 ). Specifically, the organodecane compound represented by the formula (Chemical Formula 1) is, for example, vinyl decane (H 3 SiC 2 H 3 ), dioxane (H 3 SiC 2 H 4 SiH 3 ), dialkyl acetylene. (H 3 SiC 2 SiH 3 ), 2-aminoethyl decane (H 3 SiC 2 H 4 NH 2 ). Among them, vinyl decane, dioxane or dialkyl acetylene is preferred.

原料氣體33係利用氣體流量調整器24a進行流量控制而供給。進而,一面根據需要將載氣利用氣體流量調整器24b進行流量控制,一面於閥門25c之近前將其混合於原料氣體33中。載氣係例如氬氣、氦氣、氮氣等惰性氣體。如此,原料氣體33係於經氣體流量調整器24a控制流量之狀 態下,或於經載氣控制流量之狀態下,於減壓至特定壓力之塑膠容器11內,自原料氣體供給管23之氣體噴出孔17x向發熱之發熱體18噴出。較佳為,於如此般使發熱體18升溫完畢後再開始噴出原料氣體33。自成膜初期即可利用發熱體18生成充分活化之化學種34,而可獲得阻氣性較高之膜。 The material gas 33 is supplied by the flow rate control by the gas flow rate adjuster 24a. Further, the carrier gas is flow-controlled by the gas flow rate adjuster 24b as needed, and is mixed in the source gas 33 near the valve 25c. The carrier gas is an inert gas such as argon gas, helium gas or nitrogen gas. Thus, the material gas 33 is controlled by the gas flow rate adjuster 24a. In the state where the flow rate is controlled by the carrier gas, the gas discharge hole 17x of the material gas supply pipe 23 is ejected from the gas generating hole 17 of the raw material gas supply pipe 23 in the plastic container 11 which is depressurized to a specific pressure. Preferably, after the heating element 18 is heated up in this manner, the raw material gas 33 is discharged. At the initial stage of film formation, the chemical element 34 which is sufficiently activated can be generated by the heating element 18, and a film having a high gas barrier property can be obtained.

於原料氣體33為液體之情形時,可利用起泡法進行供給。起泡法中使用之起泡氣體係例如氮氣、氬氣、氦氣等惰性氣體,更佳為氮氣。即,若使用起泡氣體一面利用氣體流量調整器24a控制流量一面使原料槽40a內之起始原料41a起泡,則起始原料41a氣化並混入氣泡中。如此,原料氣體33係於與起泡氣體混合之狀態下進行供給。進而,一面將載氣利用氣體流量調整器24b控制流量,一面於閥門25c之近前使其混合至原料氣體33中。如此,原料氣體33係於經載氣控制流量之狀態下,於減壓至特定壓力之塑膠容器11內,自原料氣體供給管23之氣體噴出孔17x向發熱之發熱體18噴出。此處,起泡氣體之流量較佳為3~50 sccm,更佳為5~15 sccm。載氣之流量並無特別限定,較佳為0~80 sccm。更佳為5~50 sccm。可藉由載氣之流量而將塑膠容器11內之壓力調整為20~80 Pa。 When the material gas 33 is a liquid, it can be supplied by a foaming method. The foaming gas system used in the foaming method is an inert gas such as nitrogen, argon or helium, and more preferably nitrogen. In other words, when the flow rate is controlled by the gas flow rate adjuster 24a while the flow rate is controlled by the gas flow rate adjuster 24a, the starting material 41a in the raw material tank 40a is foamed, and the starting material 41a is vaporized and mixed into the bubbles. In this manner, the material gas 33 is supplied in a state of being mixed with the foaming gas. Further, while the carrier gas is controlled to flow rate by the gas flow rate adjuster 24b, it is mixed into the source gas 33 near the valve 25c. In this manner, the material gas 33 is discharged from the gas ejection hole 17x of the material gas supply pipe 23 to the heat generating body 18 that generates heat in the plastic container 11 which is depressurized to a specific pressure in a state where the flow rate is controlled by the carrier gas. Here, the flow rate of the bubbling gas is preferably from 3 to 50 sccm, more preferably from 5 to 15 sccm. The flow rate of the carrier gas is not particularly limited, and is preferably 0 to 80 sccm. More preferably 5~50 sccm. The pressure in the plastic container 11 can be adjusted to 20 to 80 Pa by the flow rate of the carrier gas.

(成膜步驟-成膜) (film formation step - film formation)

一旦原料氣體33與發熱體18接觸即生成化學種34。藉由使該化學種34到達塑膠容器11之內壁而堆積阻氣薄膜。於成膜步驟中,使發熱體18發熱並將原料氣體噴附至發熱體 18之時間(以下,亦存在稱為成膜時間之情形)較佳為1.0~20秒,更佳為1.0~8.5秒。成膜時真空腔室內之壓力較佳為減壓至達到例如1.0~100 Pa。更佳為1.4~50 Pa。 Once the material gas 33 comes into contact with the heating element 18, the chemical species 34 is generated. The gas barrier film is deposited by causing the chemical species 34 to reach the inner wall of the plastic container 11. In the film forming step, the heating element 18 is heated and the material gas is sprayed onto the heating element. The time of 18 (hereinafter, also referred to as the film formation time) is preferably 1.0 to 20 seconds, more preferably 1.0 to 8.5 seconds. The pressure in the vacuum chamber during film formation is preferably reduced to, for example, 1.0 to 100 Pa. More preferably 1.4 to 50 Pa.

根據本發明者等人之實驗,關於使用通式(化1)所示之有機矽烷系化合物以外之有機矽烷系化合物(例如,單甲基矽烷、二甲基矽烷、三甲基矽烷、四甲基矽烷、二甲氧甲基乙烯基矽烷)作為原料氣體而形成之薄膜,若以條件(1)對表面進行XPS分析,則未觀察到Si波峰而觀察到基於SiO、SiC或SiOC之主波峰。並且,包括該薄膜之塑膠成形體之BIF未達3,確認以單種氣體無法獲得具有較高之阻氣性之薄膜。又,若使用Mo、W、Zr、Ta、V、Nb或Hf以外之金屬(例如,Ir(銥)、Re(鎓)、Pt(鉑)、Rh(銠)、Ti(鈦)、Cr(鉻))作為發熱體18,則即便使用通式(化1)所示之有機矽烷系化合物作為原料氣體33,亦存在成膜效率較低而生產性較差之問題。並且,若以條件(1)對獲得之極薄之薄膜之表面進行XPS分析,則未觀察到Si波峰且略微觀察到基於SiO2之主波峰。另一方面,本實施形態之阻氣性塑膠成形體使用通式(化1)所示之有機矽烷系化合物作為原料氣體33,進而,使用包含選自Mo、W、Zr、Ta、V、Nb、Hf之群中之一種或二種以上之金屬元素之材料作為發熱體18之材料,因此即便原料氣體33為單種氣體,亦可形成BIF為15以上之具有較高之阻氣性之薄膜。 According to experiments by the inventors of the present invention, an organodecane-based compound other than the organodecane-based compound represented by the formula (Chemical Formula 1) (for example, monomethylnonane, dimethyldecane, trimethylnonane, tetramethyl) is used. When a film formed as a material gas by decane or dimethoxymethyl vinyl decane is subjected to XPS analysis on the surface under the condition (1), no Si peak is observed and a main peak based on SiO, SiC or SiOC is observed. . Further, the BIF of the plastic formed body including the film was less than 3, and it was confirmed that a film having a high gas barrier property could not be obtained with a single gas. Further, if a metal other than Mo, W, Zr, Ta, V, Nb or Hf is used (for example, Ir (铱), Re (鎓), Pt (platinum), Rh (铑), Ti (titanium), Cr ( Chromium)) As the heating element 18, even if the organic decane compound represented by the formula (Chemical Formula 1) is used as the material gas 33, there is a problem that the film formation efficiency is low and the productivity is inferior. Further, when XPS analysis was performed on the surface of the extremely thin film obtained under the condition (1), no Si peak was observed and a main peak based on SiO 2 was slightly observed. On the other hand, in the gas barrier plastic molded article of the present embodiment, an organic decane compound represented by the formula (Chemical Formula 1) is used as the material gas 33, and further, a component selected from the group consisting of Mo, W, Zr, Ta, V, Nb is used. The material of one or more of the Hf groups is used as the material of the heating element 18. Therefore, even if the material gas 33 is a single gas, a film having a high gas barrier property of 15 or more BIF can be formed. .

進而,藉由使用金屬鉭、鉭基合金或碳化鉭(TaCx)作為包含鉭元素之材料,使用金屬鎢、鎢基合金或碳化鎢 (WCx)作為包含鎢元素之材料,使用金屬鉬、鉬基合金或碳化鉬(MoCx)作為包含鉬元素之材料,或使用金屬鉿、鉿基合金或碳化鉿(HfCx)作為包含鉿元素之材料,而由於該等材料之觸媒活性較高,故而可更有效地分解原料氣體。又,由於有效地生成化學種34而堆積緻密之膜,故而可形成具有較高之阻氣性之薄膜。 Further, by using a metal ruthenium, a ruthenium-based alloy or tantalum carbide (TaC x ) as a material containing a ruthenium element, a metal tungsten, a tungsten-based alloy or a tungsten carbide (WC x ) is used as a material containing a tungsten element, and a metal molybdenum is used. Molybdenum-based alloy or molybdenum carbide (MoC x ) as a material containing molybdenum or metal ruthenium, ruthenium-based alloy or niobium carbide (HfC x ) as a material containing niobium, and the catalytic activity of these materials is high Therefore, the raw material gas can be decomposed more efficiently. Further, since the dense film is deposited by efficiently generating the chemical species 34, a film having high gas barrier properties can be formed.

使用發熱體CVD法時,塑膠容器11與阻氣薄膜之密接性非常好。若自原料氣體流路17導入氫氣,則氫氣藉由與發熱體18之接觸分解反應而活化,可利用該活性種進行塑膠容器11之表面之清潔。更具體而言,可期待活化氫H*或氫自由基(原子狀氫)H之奪氫反應或蝕刻作用。 When the heating body CVD method is used, the adhesion between the plastic container 11 and the gas barrier film is very good. When hydrogen gas is introduced from the material gas channel 17, the hydrogen gas is activated by the contact decomposition reaction with the heating element 18, and the surface of the plastic container 11 can be cleaned by the active species. More specifically, a hydrogen abstraction reaction or an etching action of an activated hydrogen H* or a hydrogen radical (atomic hydrogen) H can be expected.

又,若自原料氣體流路17導入NH3氣體,則利用藉由與發熱體18之接觸分解反應而生成之活性種,可進行對塑膠容器11之表面進行改質而使其穩定化之表面處理。更具體而言,可期待對表面之含氮官能基之附加或塑膠之高分子鏈之交聯反應。 When the NH 3 gas is introduced from the material gas channel 17 , the surface of the plastic container 11 can be modified and stabilized by using the active species generated by the contact decomposition reaction with the heating element 18 . deal with. More specifically, a crosslinking reaction to the nitrogen-containing functional group of the surface or the polymer chain of the plastic can be expected.

關於阻氣薄膜之膜厚,其依賴於發熱體18之材料、塑膠容器11內之原料氣體之壓力、供給氣體流量、成膜時間等,但為同時實現阻氣性之提高效果、及與塑膠容器11之密接性、耐久性及透明性等,較佳為將其設為5~200 nm。更佳為10~100 nm。 The film thickness of the gas barrier film depends on the material of the heat generating body 18, the pressure of the material gas in the plastic container 11, the flow rate of the supplied gas, the film forming time, etc., but at the same time, the gas barrier property is improved, and the plastic is improved. The adhesion, durability, transparency, and the like of the container 11 are preferably set to 5 to 200 nm. More preferably 10 to 100 nm.

(成膜之結束) (the end of film formation)

薄膜達到特定厚度時即停止原料氣體33之供給,並於將反應室12內再度排氣後,導入未圖示之洩漏氣體,而使反 應室12中達到大氣壓。其後,打開上腔室15取出塑膠容器11。如此獲得之阻氣性塑膠成形體中可使BIF為6以上。作為具體例,可使500 ml之PET瓶(高度133 mm、主體外徑64 mm、口部外徑24.9 mm、口部內徑21.4 mm、壁厚300 μm及樹脂量29 g)之氧穿透度成為0.0058 cc/容器/天以下。可使720 ml之PET瓶(高度279 mm、主體外徑70 mm、口部外徑24.9 mm、口部內徑21.4 mm、壁厚509 μm及樹脂量38 g)之氧穿透度成為0.0082 cc/容器/天以下。 When the film reaches a certain thickness, the supply of the material gas 33 is stopped, and after the gas is again exhausted in the reaction chamber 12, a leak gas (not shown) is introduced to cause a reverse Atmospheric pressure should be reached in chamber 12. Thereafter, the upper chamber 15 is opened to take out the plastic container 11. The gas barrier plastic molded body thus obtained can have a BIF of 6 or more. As a specific example, an oxygen permeability of a 500 ml PET bottle (having a height of 133 mm, a main body outer diameter of 64 mm, a mouth outer diameter of 24.9 mm, a mouth inner diameter of 21.4 mm, a wall thickness of 300 μm, and a resin amount of 29 g) can be obtained. Become 0.0058 cc / container / day or less. The oxygen permeability of a 720 ml PET bottle (height 279 mm, body outer diameter 70 mm, mouth outer diameter 24.9 mm, mouth inner diameter 21.4 mm, wall thickness 509 μm, and resin amount 38 g) becomes 0.0082 cc/ Container / day below.

本實施形態中亦可經過熱退火步驟。熱退火步驟可於薄膜達到特定厚度而停止原料氣體33之供給並使反應室內排氣一定時間後進行。藉由經過熱退火步驟,而可進一步減小阻氣膜之氧穿透度。熱退火步驟中發熱體18之發熱溫度較佳為1450℃以上,更佳為1950℃以上。若未達1450℃,則存在無法獲得熱退火處理之效果之情形。又,發熱溫度之上限較佳為設為低於發熱體18之軟化溫度。上限溫度根據發熱體之材料而有所不同,例如,若為鉬則較佳為2400℃。於熱退火步驟中使發熱體18發熱之時間較佳為1.0~5.0秒,更佳為1.5~2.0秒。經過熱退火步驟之情形時,於熱退火步驟後結束對發熱體18之通電。 In this embodiment, a thermal annealing step may also be performed. The thermal annealing step can be performed after the film reaches a certain thickness to stop the supply of the material gas 33 and to exhaust the reaction chamber for a certain period of time. The oxygen permeability of the gas barrier film can be further reduced by the thermal annealing step. The heat generation temperature of the heating element 18 in the thermal annealing step is preferably 1450 ° C or higher, more preferably 1950 ° C or higher. If it is less than 1450 ° C, there is a case where the effect of the thermal annealing treatment cannot be obtained. Further, the upper limit of the heat generation temperature is preferably set to be lower than the softening temperature of the heat generating body 18. The upper limit temperature varies depending on the material of the heating element, and is, for example, 2400 ° C in the case of molybdenum. The heating time of the heating element 18 in the thermal annealing step is preferably 1.0 to 5.0 seconds, more preferably 1.5 to 2.0 seconds. When the thermal annealing step is performed, the energization of the heating element 18 is terminated after the thermal annealing step.

於本實施形態之阻氣性塑膠成形體之製造方法中,較佳為於成膜步驟後具有向環境中添加氧化氣體並加熱發熱體之發熱體18之再生步驟。若使用有機矽烷系化合物作為原料氣體並以相同條件重複進行成膜步驟,則存在進行30次左右時發熱體18之表面進行碳化而阻氣薄膜92之阻氣性降 低的情形。作為其對策,較佳為實施自發熱體18之表面去除碳成分之發熱體18之再生步驟。發熱體18之再生步驟藉由於調整為特定壓力之真空腔室6內使氧化氣體接觸發熱之發熱體18,而可自發熱體18之表面容易地去除碳成分,從而可抑制連續成膜後之阻氣薄膜92之阻氣性之降低。發熱體18之再生步驟較佳為於供給氧化氣體後使發熱體18發熱。氧化氣體較佳為二氧化碳。發熱體18之再生步驟可每進行1次成膜步驟而進行或於進行複數次成膜步驟後進行。又,發熱體18之再生步驟較佳為於成膜步驟後且自真空腔室6取出塑膠成形體後進行。 In the method for producing a gas barrier plastic molded article of the present embodiment, it is preferred to have a regeneration step of adding the oxidizing gas to the environment and heating the heat generating body 18 after the film forming step. When an organic decane-based compound is used as a material gas and the film formation step is repeated under the same conditions, the surface of the heating element 18 is carbonized when the temperature is about 30 times, and the gas barrier film 92 is depressurized. Low situation. As a countermeasure, it is preferable to carry out a regeneration step of the heating element 18 that removes the carbon component from the surface of the heating element 18. The regeneration step of the heating element 18 can easily remove the carbon component from the surface of the heating element 18 by the heat generating body 18 in which the oxidizing gas contacts the heat in the vacuum chamber 6 adjusted to a specific pressure, thereby suppressing the continuous film formation. The gas barrier properties of the gas barrier film 92 are lowered. The regeneration step of the heating element 18 is preferably such that the heating element 18 generates heat after the supply of the oxidizing gas. The oxidizing gas is preferably carbon dioxide. The regeneration step of the heating element 18 can be carried out every one film formation step or after a plurality of film formation steps. Further, the step of regenerating the heating element 18 is preferably performed after the film forming step and after the plastic molded body is taken out from the vacuum chamber 6.

於發熱體18之再生步驟中,發熱體18之加熱溫度較佳為1900℃以上且2500℃以下。更佳為2000℃以上且2400℃以下。加熱時間較佳為成膜時間之0.5倍以上且3.0倍以下。又,於添加之氧化氣體為二氧化碳之情形時,發熱體18之再生步驟中之真空腔室內之壓力(以下,有時亦稱為再生時之真空壓)較佳為1.3 Pa以上且未達14 Pa。更佳為1.4 Pa以上且13 Pa以下。再生時之真空壓較佳為相對於成膜時之真空腔室內之原料氣體33之分壓(以下,有時亦稱為成膜時之原料氣體之分壓)超過1倍且為9倍以下。再生時之真空壓為成膜時之原料氣體之分壓之1倍以下時,存在以下情形:碳化物之堆積速度超過去除速度,於在複數個成形體上連續成膜時,後半成膜者之阻氣性低於前半成膜者之阻氣性。又,若再生時之真空壓超過成膜時之原料氣體之分壓之9倍,則存在以下情形:碳化物去除並且發熱體 18之表面產生氧化,氧化成分混入阻氣薄膜中或由蒸發引起發熱體18之消耗等,因此於連續成膜時後半成膜者之阻氣性降低。再者,發熱體18之再生步驟中氧化氣體向真空腔室6內之供給路徑可設為與成膜步驟中原料氣體之供給路徑相同,或與原料氣體之供給路徑不同。 In the regeneration step of the heating element 18, the heating temperature of the heating element 18 is preferably 1900 ° C or higher and 2500 ° C or lower. More preferably, it is 2000 ° C or more and 2400 ° C or less. The heating time is preferably 0.5 times or more and 3.0 times or less of the film formation time. Further, when the oxidizing gas to be added is carbon dioxide, the pressure in the vacuum chamber in the regeneration step of the heating element 18 (hereinafter sometimes referred to as the vacuum pressure during regeneration) is preferably 1.3 Pa or more and less than 14 Pa. More preferably, it is 1.4 Pa or more and 13 Pa or less. The partial pressure of the raw material gas 33 in the vacuum chamber at the time of film formation (hereinafter, sometimes referred to as the partial pressure of the material gas at the time of film formation) is preferably more than 1 time and 9 times or less. . When the vacuum pressure at the time of regeneration is less than or equal to the partial pressure of the material gas at the time of film formation, there are cases where the deposition rate of carbide exceeds the removal rate, and when the film is formed continuously on a plurality of formed bodies, the latter half of the film is formed. The gas barrier property is lower than that of the first half film former. Further, if the vacuum pressure at the time of regeneration exceeds 9 times the partial pressure of the material gas at the time of film formation, there are the following cases: carbide removal and heating body The surface of 18 is oxidized, and the oxidized component is mixed into the gas barrier film or consumed by the heat generating body 18 by evaporation. Therefore, the gas barrier property of the latter half of the film formation is lowered at the time of continuous film formation. Further, in the regeneration step of the heating element 18, the supply path of the oxidizing gas into the vacuum chamber 6 may be the same as the supply path of the material gas in the film forming step or may be different from the supply path of the material gas.

繼而,關於重複成膜步驟時阻氣薄膜之阻氣性降低之原理、及發熱體18之再生步驟之效果,以發熱體為純度99.5質量%之金屬鉭且將其加熱至2000℃並連續100次重複進行成膜步驟的情形為例進行說明。此處,發熱體之表面之分析係使用掃描型電子顯微鏡(日立製作所公司製造,SU1510)觀察距發熱體之表面深度1 μm之元素組成,並使用該裝置配套之能量分散型X射線分析裝置(堀場製作所公司製造,EMAX ENERGY)進行。確認碳之元素濃度相對於成膜前未達1 at.%,於連續100次重複成膜步驟後最大增加至50 at.%。若將其進行質量換算,則成膜前未達0.13質量%,而連續100次重複成膜步驟後最大為6.2質量%。生成於發熱體表面之碳化物之電阻與形成發熱體中心部之金屬鉭之電阻相比,較大。因此,若發熱體之表面碳化,則該表面即便通電溫度亦難以上升。如此,存在無法確保對阻氣薄膜92之形成較為充分之溫度而無法獲得阻氣性較高之緻密之膜的情形。增加施加於發熱體18之電壓而使發熱體之表面亦充分升溫,藉此,若為PET瓶之情形,則可形成可將阻氣性提高至10倍以上之阻氣薄膜92。然而,於量產步驟中,對應發熱體表面之急劇之電阻變化而調整施加 電壓的控制較為複雜。此處,藉由進行發熱體18之再生步驟,而無需施加電壓之複雜之控制,即便連續進行成膜步驟,亦可不斷形成阻氣性較高之薄膜。 Then, regarding the principle of reducing the gas barrier properties of the gas barrier film at the time of repeating the film formation step and the effect of the regeneration step of the heating element 18, the heating element is a metal crucible having a purity of 99.5 mass% and heated to 2000 ° C for 100 consecutive times. The case where the film formation step is repeated is described as an example. Here, the surface of the heating element was analyzed by using a scanning electron microscope (SU1510, manufactured by Hitachi, Ltd.) to observe an elemental composition having a surface depth of 1 μm from the surface of the heating element, and using the energy dispersive X-ray analyzer of the apparatus ( Manufactured by Horiba Manufacturing Co., Ltd., EMAX ENERGY). It was confirmed that the elemental concentration of carbon was less than 1 at.% with respect to film formation, and the maximum increase was 50 at.% after 100 consecutive film formation steps. When this was converted into mass, it was not 0.13 mass% before film formation, and it was 6.2 mass% after repeating film formation process 100 times continuously. The electric resistance of the carbide formed on the surface of the heating element is larger than the electric resistance of the metal crucible forming the central portion of the heating element. Therefore, if the surface of the heating element is carbonized, the surface does not easily rise even when the temperature is applied. As described above, there is a case where it is impossible to ensure a sufficient temperature for the formation of the gas barrier film 92, and a dense film having a high gas barrier property cannot be obtained. When the voltage applied to the heating element 18 is increased and the surface of the heating element is sufficiently heated, the gas barrier film 92 which can improve the gas barrier properties by 10 times or more can be formed in the case of a PET bottle. However, in the mass production step, the application is adjusted in accordance with the sharp resistance change of the surface of the heating element. Voltage control is more complicated. Here, by performing the regeneration step of the heating element 18, it is not necessary to apply complicated control of the voltage, and even if the film forming step is continuously performed, a film having a high gas barrier property can be continuously formed.

已關於在塑膠容器之內表面形成阻氣薄膜之方法進行說明,但於塑膠容器之外表面形成阻氣薄膜時,例如可使用專利文獻4之圖3所示之成膜裝置而進行。又,成膜裝置並不限定於圖2所示之裝置,例如可如專利文獻2或3所示般進行種種變形。 A method of forming a gas barrier film on the inner surface of a plastic container has been described. However, when a gas barrier film is formed on the outer surface of the plastic container, for example, the film forming apparatus shown in Fig. 3 of Patent Document 4 can be used. Further, the film forming apparatus is not limited to the apparatus shown in Fig. 2, and various modifications can be made, for example, as shown in Patent Document 2 or 3.

已關於塑膠成形體為塑膠容器之態樣進行說明,但本發明並不限定於此,可將塑膠成形體設為膜或片材。 The plastic molded body is described as a plastic container. However, the present invention is not limited thereto, and the plastic molded body may be a film or a sheet.

[實施例] [Examples]

繼而,一面例示實施例一面關於本發明進而詳細地進行說明,但本發明並不限定於實施例而解釋。 Hereinafter, the present invention will be described in detail with reference to the embodiments, but the invention is not limited by the examples.

(實施例1) (Example 1)

作為塑膠成形體,於500 ml之PET瓶(高度133 mm、主體外徑64 mm、口部外徑24.9 mm、口部內徑21.4 mm、壁厚300 μm及樹脂量29 g)之內表面,使用圖2所示之成膜裝置形成阻氣薄膜。將PET瓶收容於真空腔室6內並減壓至達到1.0 Pa。繼而,作為發熱體18,使用2條Φ0.5 mm、長度44 cm之鉬線,向發熱體18施加直流電流24 V而使其發熱至2000℃。其後,自氣體流量調整器24a將乙烯基矽烷作為原料氣體一面調整閥門開度一面進行供給,使其於PET瓶之內表面堆積阻氣薄膜。此處,自氣體流量調整器24a至氣體供給口16之配管係由氧化鋁製之1/4英吋配管構成, 原料氣體之流量設為50 sccm。成膜時之壓力(全壓)設為1.4 Pa。成膜時間設為6秒。此時,乙烯基矽烷之分壓(成膜時之原料氣體之分壓)與成膜時之壓力(全壓)相等,為1.4 Pa。 As a plastic molded body, it is used on the inner surface of a 500 ml PET bottle (having a height of 133 mm, a main body outer diameter of 64 mm, a mouth outer diameter of 24.9 mm, a mouth inner diameter of 21.4 mm, a wall thickness of 300 μm, and a resin amount of 29 g). The film forming apparatus shown in Fig. 2 forms a gas barrier film. The PET bottle was housed in the vacuum chamber 6 and depressurized to 1.0 Pa. Then, as the heating element 18, two molybdenum wires of Φ 0.5 mm and 44 cm in length were used, and a direct current 24 V was applied to the heating element 18 to generate heat to 2000 ° C. Then, the gas flow rate adjuster 24a supplies the vinyl decane as a material gas while adjusting the valve opening degree, and deposits a gas barrier film on the inner surface of the PET bottle. Here, the piping from the gas flow rate adjuster 24a to the gas supply port 16 is composed of a 1/4 inch pipe made of alumina. The flow rate of the material gas was set to 50 sccm. The pressure at the time of film formation (full pressure) was set to 1.4 Pa. The film formation time was set to 6 seconds. At this time, the partial pressure of vinyl decane (the partial pressure of the material gas at the time of film formation) was equal to the pressure at the time of film formation (full pressure), and was 1.4 Pa.

(實施例2) (Example 2)

於實施例1中,除調整施加於發熱體18之直流電流並將發熱溫度設為1550℃以外,按照實施例1獲得阻氣性塑膠成形體。 In the first embodiment, a gas barrier plastic molded body was obtained in accordance with Example 1, except that the direct current applied to the heating element 18 was adjusted and the heat generation temperature was set to 1550 °C.

(實施例3) (Example 3)

於實施例1中,除調整施加於發熱體18之直流電流並將發熱溫度設為2200℃以外,按照實施例1獲得阻氣性塑膠成形體。 In the first embodiment, a gas barrier plastic molded body was obtained in accordance with Example 1, except that the direct current applied to the heating element 18 was adjusted and the heat generation temperature was set to 2,200 °C.

(實施例4) (Example 4)

於實施例1中,除以1,4-二矽丁烷代替乙烯基矽烷作為原料氣體以外,按照實施例1獲得阻氣性塑膠成形體。成膜時間設為6秒。 In the first embodiment, a gas barrier plastic molded article was obtained in the same manner as in Example 1 except that 1,4-dioxane was used instead of vinyl decane as a material gas. The film formation time was set to 6 seconds.

(實施例5) (Example 5)

於實施例1中,除以二矽烷基乙炔代替乙烯基矽烷作為原料氣體以外,按照實施例1獲得阻氣性塑膠成形體。成膜時間設為6秒。 In the first embodiment, a gas barrier plastic molded article was obtained in the same manner as in Example 1 except that dialkyl acetylene was used instead of vinyl decane as a material gas. The film formation time was set to 6 seconds.

(實施例6) (Example 6)

於實施例1中,除以鎢線代替鉬線作為發熱體18以外,按照實施例1獲得阻氣性塑膠成形體。成膜時間設為6秒。 In the first embodiment, a gas barrier plastic molded body was obtained in accordance with Example 1 except that a tungsten wire was used instead of the molybdenum wire as the heat generating body 18. The film formation time was set to 6 seconds.

(實施例7) (Example 7)

於實施例1中,除以鋯線代替鉬線作為發熱體18,調整施加於發熱體18之直流電流並將發熱溫度設為1700℃,成膜時間設為6秒以外,按照實施例1獲得阻氣性塑膠成形體。 In the first embodiment, the zirconium wire was used as the heating element 18 instead of the molybdenum wire, and the direct current applied to the heating element 18 was adjusted, and the heat generation temperature was set to 1,700 ° C, and the film formation time was set to 6 seconds. Gas barrier plastic molded body.

(實施例8) (Example 8)

於實施例1中,除以鉭線代替鉬線作為發熱體18以外,按照實施例1獲得阻氣性塑膠成形體。 In the first embodiment, a gas barrier plastic molded body was obtained in accordance with Example 1, except that a twisted wire was used instead of the molybdenum wire as the heat generating body 18.

(實施例9) (Example 9)

於實施例1中,除以鉭線代替鉬線作為發熱體18,並重複5次成膜時間8秒以外,按照實施例1獲得阻氣性塑膠成形體。 In the first embodiment, a gas barrier plastic molded body was obtained in accordance with Example 1, except that a twisted wire was used instead of the molybdenum wire as the heat generating body 18, and the film forming time was repeated 5 times for 5 seconds.

(實施例10) (Embodiment 10)

於實施例1中,除以碳化鉭(TaCx(X=1,TaCx中之碳原子之質量比為6.2質量%,TaCx中之碳原子之元素濃度為50 at.%))線代替鉬線作為發熱體18,調整施加於發熱體18之直流電流並將發熱溫度設為2400℃以外,按照實施例1於塑膠成形體之表面形成薄膜。 In the first embodiment, the wire is replaced by a tantalum carbide (TaC x (X = 1, the mass ratio of carbon atoms in TaC x is 6.2% by mass, and the elemental concentration of carbon atoms in TaC x is 50 at.%)). The molybdenum wire was used as the heating element 18, and the direct current applied to the heating element 18 was adjusted, and the heat generation temperature was set to 2400 ° C. A film was formed on the surface of the plastic molded body in accordance with Example 1.

(實施例11) (Example 11)

於實施例1中,除以碳化鎢(WCx(X=1,WCx中之碳原子之質量比為6.1質量%,WCx中之碳原子之元素濃度為50 at.%))線代替鉬線作為發熱體18,調整施加於發熱體18之直流電流並將發熱溫度設為2400℃以外,按照實施例1於塑膠成形體之表面形成薄膜。 In Example 1, the tungsten carbide (WC x (X = 1, the mass ratio of carbon atoms in WC x is 6.1% by mass, the elemental concentration of carbon atoms in WC x is 50 at.%) is substituted for the line) The molybdenum wire was used as the heating element 18, and the direct current applied to the heating element 18 was adjusted, and the heat generation temperature was set to 2400 ° C. A film was formed on the surface of the plastic molded body in accordance with Example 1.

(比較例1) (Comparative Example 1)

作為塑膠成形體,於500 ml之PET瓶(高度133 mm、主體外徑64 mm、口部外徑24.9 mm、口部內徑21.4 mm、壁厚300 μm及樹脂量29 g)之內表面,使用專利文獻6之圖1所示之製造裝置形成薄膜。將PET瓶收容於外部電極內,利用真空泵將外部電極內減壓至達到5 Pa。其後,於原料氣體供給管中將乙烯基矽烷作為原料氣體,一面調整為流量80 sccm一面向PET瓶之內部進行供給。於原料氣體之供給後,自高頻電源經由匹配器向外部電極輸入電力,於外部電極與內部電極之間施加13.5 MHz、800 W之高頻電壓而產生電漿。並且,於產生原料氣體之電漿之狀態下保持2秒,而於PET瓶之內表面形成薄膜。 As a plastic molded body, it is used on the inner surface of a 500 ml PET bottle (having a height of 133 mm, a main body outer diameter of 64 mm, a mouth outer diameter of 24.9 mm, a mouth inner diameter of 21.4 mm, a wall thickness of 300 μm, and a resin amount of 29 g). The manufacturing apparatus shown in Fig. 1 of Patent Document 6 forms a film. The PET bottle was housed in an external electrode, and the inside of the external electrode was decompressed to 5 Pa by a vacuum pump. Then, vinyl decane was used as a material gas in the material gas supply pipe, and the flow rate was adjusted to a flow rate of 80 sccm and supplied to the inside of the PET bottle. After the supply of the material gas, electric power is input from the high-frequency power source to the external electrode via the matching device, and a high-frequency voltage of 13.5 MHz and 800 W is applied between the external electrode and the internal electrode to generate plasma. Further, the film was held for 2 seconds in the state where the plasma of the material gas was generated, and a film was formed on the inner surface of the PET bottle.

(比較例2) (Comparative Example 2)

於實施例1中,除以單甲基矽烷代替乙烯基矽烷作為原料氣體以外,按照實施例1於塑膠成形體之表面形成薄膜。成膜時間設為6秒。 In Example 1, a film was formed on the surface of the plastic molded body according to Example 1, except that monomethyl decane was used instead of vinyl decane as a material gas. The film formation time was set to 6 seconds.

(比較例3) (Comparative Example 3)

於實施例1中,除以二甲基矽烷代替乙烯基矽烷作為原料氣體以外,按照實施例1於塑膠成形體之表面形成薄膜。成膜時間設為6秒。 In Example 1, a film was formed on the surface of the molded metal body according to Example 1, except that dimethyl decane was used instead of vinyl decane as a material gas. The film formation time was set to 6 seconds.

(比較例4) (Comparative Example 4)

於實施例1中,除以三甲基矽烷代替乙烯基矽烷作為原料氣體以外,按照實施例1於塑膠成形體之表面形成薄膜。成膜時間設為6秒。 In Example 1, a film was formed on the surface of the molded metal body according to Example 1, except that trimethyldecane was used instead of vinyl decane as a material gas. The film formation time was set to 6 seconds.

(比較例5) (Comparative Example 5)

於實施例1中,除以四甲基矽烷代替乙烯基矽烷作為原料氣體以外,按照實施例1於塑膠成形體之表面形成薄膜。成膜時間設為6秒。 In Example 1, a film was formed on the surface of the molded metal body according to Example 1, except that tetramethylnonane was used instead of vinyl decane as a material gas. The film formation time was set to 6 seconds.

(比較例6) (Comparative Example 6)

於實施例1中,除以二甲氧基甲基乙烯基矽烷代替乙烯基矽烷作為原料氣體以外,按照實施例1於塑膠成形體之表面形成薄膜。成膜時間設為6秒。 In Example 1, a film was formed on the surface of the molded metal body according to Example 1, except that dimethoxymethylvinyl decane was used instead of vinyl decane as a material gas. The film formation time was set to 6 seconds.

(比較例7) (Comparative Example 7)

於實施例1中,除以銥線代替鉬線作為發熱體18以外,按照實施例1於塑膠成形體之表面形成薄膜。成膜時間設為6秒。 In Example 1, a film was formed on the surface of the plastic molded body in accordance with Example 1, except that the twisted wire was used instead of the molybdenum wire as the heat generating body 18. The film formation time was set to 6 seconds.

(比較例8) (Comparative Example 8)

於實施例1中,除以錸線代替鉬線作為發熱體18以外,按照實施例1於塑膠成形體之表面形成薄膜。成膜時間設為6秒。 In Example 1, a film was formed on the surface of the plastic molded body in accordance with Example 1, except that the twisted wire was used instead of the molybdenum wire as the heat generating body 18. The film formation time was set to 6 seconds.

(比較例9) (Comparative Example 9)

於實施例1中,除以鉑線代替鉬線作為發熱體18,調整施加於發熱體18之直流電流並將發熱溫度設為1500℃以外,按照實施例1於塑膠成形體之表面形成薄膜。成膜時間設為6秒。 In the first embodiment, a film was formed on the surface of the plastic molded body in accordance with Example 1, except that a platinum wire was used as the heating element 18 instead of the molybdenum wire, and the direct current applied to the heating element 18 was adjusted and the heat generation temperature was set to 1500 °C. The film formation time was set to 6 seconds.

(比較例10) (Comparative Example 10)

於實施例1中,除以銠線代替鉬線作為發熱體18,調整施加於發熱體18之直流電流並將發熱溫度設為1500℃以外,按照實施例1於塑膠成形體之表面形成薄膜。成膜時 間設為6秒。 In the first embodiment, a film was formed on the surface of the plastic molded body according to Example 1, except that the twisted wire was used as the heat generating body 18 instead of the molybdenum wire, and the direct current applied to the heat generating body 18 was adjusted and the heat generation temperature was set to 1500 °C. Film formation Set to 6 seconds.

(比較例11) (Comparative Example 11)

於實施例1中,除以鈦線代替鉬線作為發熱體18,調整施加於發熱體18之直流電流並將發熱溫度設為1500℃以外,按照實施例1於塑膠成形體之表面形成薄膜。成膜時間設為6秒。 In the first embodiment, a film was formed on the surface of the plastic molded body in accordance with Example 1, except that a titanium wire was used as the heating element 18 instead of the molybdenum wire, and a direct current applied to the heating element 18 was adjusted and the heat generation temperature was set to 1500 °C. The film formation time was set to 6 seconds.

(比較例12) (Comparative Example 12)

於實施例1中,除調整施加於發熱體18之直流電流並將發熱溫度設為1500℃以外,按照實施例1於塑膠成形體之表面形成薄膜。使薄膜之膜厚成為30 nm所需之成膜時間為25秒。 In Example 1, a film was formed on the surface of the plastic molded body in accordance with Example 1, except that the direct current applied to the heating element 18 was adjusted and the heat generation temperature was set to 1500 °C. The film formation time required to make the film thickness of the film 30 nm was 25 seconds.

關於獲得之實施例及比較例之阻氣性塑膠成形體及包括薄膜之塑膠成形體,利用以下方法進行評價。將評價結果示於表1~4。 The gas barrier plastic molded article and the plastic molded article including the film of the obtained examples and comparative examples were evaluated by the following methods. The evaluation results are shown in Tables 1 to 4.

(XPS分析) (XPS analysis)

使用XPS裝置(型式:QUANTERASXM,PHI公司製造)分析於實施例1~8、10、11、比較例1~4及6中形成之薄膜之表面。將薄膜表面之構成元素之比示於表1。XPS分析之條件如下。 The surfaces of the films formed in Examples 1 to 8, 10, 11, and Comparative Examples 1 to 4 and 6 were analyzed using an XPS apparatus (type: QUANTERASXM, manufactured by PHI Corporation). The ratio of the constituent elements of the film surface is shown in Table 1. The conditions for XPS analysis are as follows.

X射線源:單色化Al(1486.6 ev) X-ray source: monochromatic Al (1486.6 ev)

檢測區域:100 μmΦ Detection area: 100 μmΦ

濺鍍條件:Ar+1.0 kv Sputtering conditions: Ar+1.0 kv

圖3係將於以條件(1)對實施例1之薄膜表面進行XPS分析之光譜中觀察到之波峰藉由波形解析而分離的圖。圖4係表示以條件(2)對實施例1之薄膜表面進行XPS分析之光譜的圖。圖5係將於以條件(1)對實施例4之薄膜表面進行XPS分析之光譜中觀察到之波峰藉由波形解析而分離的圖。圖6係將於以條件(1)對比較例2之薄膜表面進行XPS分析之光譜中觀察到之波峰藉由波形解析而分離的圖。再者,於圖3、圖5及圖6中,藉由波形解析而設想之鍵結狀態為:Si1:Si波峰(Si-Si鍵或Si-H鍵),Si2:SiC、SiO1C3、Si2O,Si3:SiO2C2、SiO,Si4:SiO3C1、Si2O3,Si5:SiO2Fig. 3 is a view in which the peak observed in the spectrum of XPS analysis of the film surface of Example 1 by the condition (1) is separated by waveform analysis. Fig. 4 is a graph showing the spectrum of XPS analysis of the surface of the film of Example 1 under the condition (2). Fig. 5 is a view in which the peak observed in the spectrum of XPS analysis of the film surface of Example 4 by the condition (1) is separated by waveform analysis. Fig. 6 is a view in which the peak observed in the spectrum of XPS analysis of the film surface of Comparative Example 2 by the condition (1) is separated by waveform analysis. Furthermore, in FIGS. 3, 5, and 6, the bonding state assumed by waveform analysis is: Si1: Si peak (Si-Si bond or Si-H bond), Si2: SiC, SiO 1 C 3 Si 2 O, Si 3 : SiO 2 C 2 , SiO, Si 4 : SiO 3 C 1 , Si 2 O 3 , Si 5 : SiO 2 .

於實施例1中,如圖3所示,於條件(1)下於Si與Si之鍵結能之波峰出現位置觀察到波峰,如圖4所示,於條件(2)下於Si與Si之鍵結能之波峰出現位置未觀察到波峰。由此可推定實施例1之薄膜具有Si-H鍵。再者,其他實施例亦獲得相同之波峰。進而,可由圖3確認於實施例1之波峰中Si1(Si波峰)為主波峰。如圖5所示,可確認於實施例4中亦 為Si1(Si波峰)為主波峰。 In the first embodiment, as shown in FIG. 3, a peak is observed at the peak position of the bonding energy of Si and Si under the condition (1), as shown in FIG. 4, under the condition (2) in Si and Si. No peaks were observed at the peak of the bond energy. From this, it can be presumed that the film of Example 1 has a Si-H bond. Furthermore, other embodiments also obtain the same peak. Further, it can be confirmed from Fig. 3 that Si1 (Si peak) is the main peak in the peak of Example 1. As shown in FIG. 5, it can be confirmed that in Embodiment 4 It is the main peak of Si1 (Si wave peak).

另一方面,於比較例2中,如圖6所示,於條件(1)下於Si與Si之鍵結能之波峰出現位置未觀察到波峰,而於SiC、SiOC、SiOx或SiO2之波峰出現位置觀察到波峰。進而,可由圖6確認比較例2之波峰中Si3為主波峰。再者,比較例1及3~8均不具有Si1,關於主波峰,比較例1中為Si2,比較例3~6中為Si3,比較例7~11中為Si5。 On the other hand, in Comparative Example 2, as shown in Fig. 6, under the condition (1), no peak was observed at the peak position of the bonding energy of Si and Si, but in SiC, SiOC, SiO x or SiO 2 . A peak is observed at the position where the peak appears. Further, it can be confirmed from Fig. 6 that Si3 is the main peak in the peak of Comparative Example 2. Further, Comparative Examples 1 and 3 to 8 did not have Si1, and in the comparative example 1, Si2 was used as the main peak, Si3 in Comparative Examples 3 to 6, and Si5 in Comparative Examples 7 to 11.

(RBS分析之薄膜之元素比) (Element ratio of film analyzed by RBS)

使用高解析RBS裝置(型式:HRBS500,神戶製鋼所公司製造)分析於實施例1~8中形成之薄膜。將薄膜之構成元素之比示於表2。 The films formed in Examples 1 to 8 were analyzed using a high-resolution RBS apparatus (type: HRBS500, manufactured by Kobe Steel Co., Ltd.). The ratio of the constituent elements of the film is shown in Table 2.

(膜厚) (film thickness)

膜厚係使用觸針式輪廓儀(型式:α-Step,KLA-Tencor公司製造)而測定之值。將評價結果示於表3。 The film thickness was measured using a stylus profiler (type: α-Step, manufactured by KLA-Tencor Co., Ltd.). The evaluation results are shown in Table 3.

(氧穿透度) (oxygen permeability)

氧穿透度係使用氧穿透度測定裝置(型式:Oxtran 2/20,Modern Control公司製造)於23℃、90% RH之條件下進行測定,並自測定開始調節24小時,取自測定開始經過72小時後之值。作為參考,測定薄膜形成前之PET瓶之氧穿透度,作為未成膜瓶而示於表中。將評價結果示於表3。 Oxygen permeability was measured using an oxygen permeability measuring apparatus (type: Oxtran 2/20, manufactured by Modern Control Co., Ltd.) under the conditions of 23 ° C and 90% RH, and was adjusted from the start of measurement for 24 hours from the start of the measurement. After 72 hours, the value. For reference, the oxygen permeability of the PET bottle before film formation was measured, and it is shown in the table as an unfilmed bottle. The evaluation results are shown in Table 3.

(BIF) (BIF)

BIF係於數4中將未成膜瓶之氧穿透度之值作為未形成薄膜之塑膠成形體之氧穿透度,將實施例或比較例中所獲得 之塑膠容器之氧穿透度之值作為阻氣性塑膠成形體之氧穿透度,而算出。將評價結果示於表3。 BIF is the value of the oxygen permeability of the unformed bottle in the number 4 as the oxygen permeability of the plastic formed body without the film, which is obtained in the examples or the comparative examples. The value of the oxygen permeability of the plastic container was calculated as the oxygen permeability of the gas barrier plastic molded body. The evaluation results are shown in Table 3.

(膜密度) (film density)

膜密度係於各種濃度之碳酸鉀水溶液100 ml中攪拌膜片,以目視觀察15分鐘後之沉浮。將市售之油性筆之墨水塗於PET瓶內,並於其上按照實施例1、4及5之條件以50 μm之膜厚進行成膜後,使用浸透有乙醇之棉棒自PET瓶取出膜片。漂浮於碳酸鉀水溶液之水面之膜片判定為密度小於該水溶液之密度(○),又,沉於碳酸鉀水溶液之底面之膜片判定為密度大於該水溶液之密度(×),懸浮於碳酸鉀水溶液之水面與底面之間之膜片判定為密度與該水溶液之密度相等(△),並以△判定之範圍作為密度之範圍。將各種濃度之密度及評價結果示於表4。 The film density was stirred in 100 ml of various concentrations of potassium carbonate aqueous solution to visually observe the ups and downs after 15 minutes. A commercially available oil-based pen ink was applied to a PET bottle, and a film of 50 μm was formed thereon according to the conditions of Examples 1, 4 and 5, and then taken out from the PET bottle using a cotton swab impregnated with ethanol. Diaphragm. The film floating on the surface of the aqueous solution of potassium carbonate was judged to have a density smaller than the density of the aqueous solution (○), and the film deposited on the bottom surface of the aqueous solution of potassium carbonate was judged to have a density greater than the density (×) of the aqueous solution, and suspended in potassium carbonate. The diaphragm between the water surface and the bottom surface of the aqueous solution was judged to have a density equal to the density of the aqueous solution (Δ), and the range determined by Δ was taken as the range of the density. The density and evaluation results of various concentrations are shown in Table 4.

如表1~表3所示,實施例1~實施例11之阻氣薄膜由於薄膜中具有Si-H鍵且包括Si含有率為40.1%以上之Si含有層,故而可確認可形成氧穿透度之值較小、BIF為6以上、使用單種原料氣體而具有較高之阻氣性的薄膜。 As shown in Tables 1 to 3, the gas barrier films of Examples 1 to 11 have a Si-H bond in the film and include a Si-containing layer having a Si content of 40.1% or more, so that oxygen permeation can be confirmed. A film having a small degree of value, a BIF of 6 or more, and a high gas barrier property using a single raw material gas.

另一方面,比較例1由於利用電漿CVD法形成薄膜,故而薄膜中之Si含有率較低且阻氣性較差。使用通式(化1)以外之氣體作為原料氣體之比較例中,薄膜中之Si含有率較低且阻氣性較差。比較例7~11中,由於使用Mo、W、Zr、Ta、V、Nb或Hf以外作為發熱體,故而成膜效率較差且阻氣性較差。比較例12中,由於發熱體之發熱溫度較低,故而成膜效率較差且阻氣性較差。 On the other hand, in Comparative Example 1, since the film was formed by the plasma CVD method, the Si content in the film was low and the gas barrier property was inferior. In the comparative example using a gas other than the formula (Chemical Formula 1) as a material gas, the Si content in the film was low and the gas barrier property was inferior. In Comparative Examples 7 to 11, since Mo, W, Zr, Ta, V, Nb, or Hf was used as the heating element, the film formation efficiency was poor and the gas barrier property was inferior. In Comparative Example 12, since the heat generation temperature of the heat generating body was low, the film forming efficiency was poor and the gas barrier property was inferior.

繼而,進行用於確認發熱體之再生步驟之效果的試驗。 Then, a test for confirming the effect of the regeneration step of the heating element was performed.

(實施例12) (Embodiment 12)

按照實施例8進行100次成膜,每結束1次成膜即進行發熱體之再生步驟。各再生步驟中,於真空腔室6內之壓力到達1.0 Pa之真空壓時,將CO2作為氧化氣體向真空腔室6進行供給而使真空壓成為12.5 Pa(成膜時之原料氣體之分壓1.4 Pa之9.0倍之真空壓),以2000℃對發熱體18加熱6秒。 The film formation was carried out 100 times in accordance with Example 8, and the regeneration step of the heating element was carried out every time the film formation was completed. In the regeneration step, when the pressure in the vacuum chamber 6 reaches a vacuum pressure of 1.0 Pa, CO 2 is supplied as an oxidizing gas to the vacuum chamber 6, and the vacuum pressure is made 12.5 Pa (the material gas at the time of film formation) The heating element 18 was heated at 2000 ° C for 6 seconds at a pressure of 9.0 times the pressure of 1.4 Pa.

(實施例13) (Example 13)

按照實施例8進行100次成膜,每結束10次成膜即進行發熱體之再生步驟。各再生步驟除將發熱體之加熱時間設為60秒以外,以與實施例12相同之條件進行。 Film formation was carried out 100 times in accordance with Example 8, and a heating element regeneration step was carried out every 10 times of film formation. Each of the regeneration steps was carried out under the same conditions as in Example 12 except that the heating time of the heating element was 60 seconds.

(實施例14) (Example 14)

按照實施例10進行100次成膜,每結束1次成膜即進行發熱體之再生步驟。各再生步驟以與實施例12相同之條件進行。 Film formation was carried out 100 times in accordance with Example 10, and the regeneration step of the heating element was carried out every time the film formation was completed. Each regeneration step was carried out under the same conditions as in Example 12.

(實施例15) (Example 15)

按照實施例10進行100次成膜,每結束10次成膜即進行發熱體之再生步驟。各再生步驟以與實施例13相同之條件進行。 Film formation was carried out 100 times in accordance with Example 10, and a heating element regeneration step was carried out every 10 times of film formation. Each regeneration step was carried out under the same conditions as in Example 13.

(實施例16) (Embodiment 16)

於實施例12中,除將CO2供給至真空腔室6而使真空壓成為1.4 Pa(成膜時之原料氣體之分壓1.4 Pa之1.0倍之真空壓)以外,以與實施例12相同之條件進行發熱體之再生步驟。 In the embodiment 12, the same as in the embodiment 12 except that the CO 2 is supplied to the vacuum chamber 6 so that the vacuum pressure becomes 1.4 Pa (the vacuum pressure of 1.0 Pa of the partial pressure of the material gas at the time of film formation). The conditions for the regeneration of the heating element are performed.

(實施例17) (Example 17)

於實施例12中,除將CO2供給至真空腔室6而使真空壓成為1.3 Pa(成膜時之原料氣體之分壓1.4 Pa之0.93倍之真空壓)以外,以與實施例12相同之條件進行發熱體之再生步驟。 In the embodiment 12, the same as in the embodiment 12 except that the CO 2 is supplied to the vacuum chamber 6 so that the vacuum pressure becomes 1.3 Pa (the vacuum pressure of 0.93 times the partial pressure of the material gas at the time of film formation is 0.93). The conditions for the regeneration of the heating element are performed.

(參考例1) (Reference example 1)

於實施例12中,除將CO2供給至真空腔室6而使真空壓成為14.0 Pa(成膜時之原料氣體之分壓1.4 Pa之10.0倍之真空壓)以外,以與實施例12相同之條件進行發熱體之再生步驟。 In Example 12, except that the CO 2 is supplied to the vacuum chamber the vacuum pressure became 6 than 14.0 Pa (when the film-forming raw material gas partial pressure of 10.0 times the vacuum pressure of 1.4 Pa), the same as in Example 12 The conditions for the regeneration of the heating element are performed.

(參考例2) (Reference example 2)

按照實施例8進行100次成膜,且不進行發熱體之再生步驟。 Film formation was carried out 100 times in accordance with Example 8, and the regeneration step of the heating element was not performed.

(參考例3) (Reference Example 3)

按照實施例10進行100次成膜,且不進行發熱體之再生步驟。 Film formation was carried out 100 times in accordance with Example 10, and the regeneration step of the heating element was not performed.

(BIF測定) (BIF measurement)

關於實施例20~實施例25及參考例1~參考例3,分別測定第1次及第100次成膜之BIF。BIF之測定方法為「阻氣性評價-BIF」所記載之方法。阻氣性評價之判定基準如下。將BIF之測定結果示於圖7。 With respect to Examples 20 to 25 and Reference Examples 1 to 3, the BIF of the first and 100th film formation was measured. The measurement method of BIF is the method described in "gas barrier evaluation - BIF". The criteria for determining the gas barrier properties are as follows. The measurement results of BIF are shown in Fig. 7.

阻氣性評價之判定基準:BIF為8以上:實用水平 Judging criteria for gas barrier evaluation: BIF is 8 or more: practical level

BIF為5以上且未達8:實用水平 BIF is above 5 and not up to 8: practical level

BIF為2以上且未達5:最低實用水平 BIF is 2 or more and less than 5: minimum practical level

BIF未達2:不實用水平。 BIF does not reach 2: not practical level.

由圖7可知,實施例12~實施例17中均為第1次及第100次之BIF為實用水平。尤其是於實施例12~實施例16中均為第1次及第100次之成膜中阻氣性並無顯著差異,且第100次之BIF為8以上。實施例17中,由於再生時之真空壓低於成膜時之真空腔室內之真空壓,故而第100次之BIF為3.6但維持實用水平。與此相對,參考例1~參考例3中,第1次成膜時阻氣性良好,但於第100次成膜時阻氣性大幅降低。參考例1中進行了再生步驟,但可認為由於再生時之真空壓過高,故而發熱體之表面氧化而使連續成膜後之阻氣性降低。由上可確認藉由進行再生步驟而連續成膜適應性提高。 As can be seen from Fig. 7, the BIFs of the first and the 100th times in the examples 12 to 17 are practical levels. In particular, in each of Examples 12 to 16, the gas barrier properties were not significantly different between the first and the 100th film formation, and the BIF of the 100th time was 8 or more. In Example 17, since the vacuum pressure at the time of regeneration was lower than the vacuum pressure in the vacuum chamber at the time of film formation, the BIF of the 100th time was 3.6, but the practical level was maintained. On the other hand, in Reference Example 1 to Reference Example 3, the gas barrier properties were good at the time of the first film formation, but the gas barrier properties were largely lowered at the time of the 100th film formation. Although the regeneration step was carried out in Reference Example 1, it is considered that the vacuum pressure at the time of regeneration is too high, so that the surface of the heating element is oxidized to lower the gas barrier properties after continuous film formation. From the above, it was confirmed that the film formation adaptability was improved by performing the regeneration step.

[產業上之可利用性] [Industrial availability]

本發明之阻氣性塑膠成形體適用於包裝材料。又,包括本發明之阻氣性塑膠成形體之阻氣性容器適用於水、茶飲料、清涼飲料、碳酸飲料、果汁飲料等之飲料用容器。 The gas barrier plastic molded article of the present invention is suitable for use in packaging materials. Moreover, the gas barrier container including the gas barrier plastic molded article of the present invention is suitable for use in a beverage container for water, tea beverage, refreshing beverage, carbonated beverage, fruit juice beverage, and the like.

6‧‧‧真空腔室 6‧‧‧vacuum chamber

8‧‧‧真空閥門 8‧‧‧Vacuum valve

11‧‧‧塑膠容器 11‧‧‧Plastic containers

12‧‧‧反應室 12‧‧‧Reaction room

13‧‧‧下腔室 13‧‧‧ lower chamber

14‧‧‧O型環 14‧‧‧O-ring

15‧‧‧上腔室 15‧‧‧Upper chamber

16‧‧‧氣體供給口 16‧‧‧ gas supply port

17‧‧‧原料氣體流路 17‧‧‧Material gas flow path

17x‧‧‧氣體噴出孔 17x‧‧‧ gas ejection hole

18‧‧‧發熱體 18‧‧‧heating body

19‧‧‧佈線 19‧‧‧Wiring

20‧‧‧加熱電源 20‧‧‧heating power supply

21‧‧‧塑膠容器之口部 21‧‧‧ mouth of plastic container

22‧‧‧排氣管 22‧‧‧Exhaust pipe

23‧‧‧原料氣體供給管 23‧‧‧Material gas supply pipe

24a、24b‧‧‧流量調整器 24a, 24b‧‧‧ flow regulator

25a、25b、25c‧‧‧閥門 25a, 25b, 25c‧‧‧ valves

26a、26b‧‧‧連接部 26a, 26b‧‧‧ Connections

27‧‧‧冷卻水流路 27‧‧‧Cooling water flow path

28‧‧‧真空腔室之內面 28‧‧‧ Inside the vacuum chamber

29‧‧‧冷卻裝置 29‧‧‧Cooling device

30‧‧‧包括透明體之腔室 30‧‧‧Case including transparent body

33‧‧‧原料氣體 33‧‧‧Material gases

34‧‧‧化學種 34‧‧‧Chemical species

35‧‧‧絕緣陶瓷構件 35‧‧‧Insulated ceramic components

40a、40b‧‧‧原料槽 40a, 40b‧‧‧ raw material tank

41a、41b‧‧‧起始原料 41a, 41b‧‧‧ starting materials

90‧‧‧阻氣性塑膠成形體 90‧‧‧ gas barrier plastic molded body

91‧‧‧塑膠成形體 91‧‧‧plastic molded body

92‧‧‧阻氣薄膜 92‧‧‧ gas barrier film

100‧‧‧成膜裝置 100‧‧‧ film forming device

圖1係表示本實施形態之阻氣性塑膠成形體之基本構成的剖面圖。 Fig. 1 is a cross-sectional view showing a basic configuration of a gas barrier plastic molded article of the present embodiment.

圖2係表示成膜裝置之一形態之概略圖。 Fig. 2 is a schematic view showing one form of a film forming apparatus.

圖3係將於以條件(1)對實施例1之薄膜表面進行XPS分析之光譜中觀察到之波峰藉由波形解析而分離的圖。 Fig. 3 is a view in which the peak observed in the spectrum of XPS analysis of the film surface of Example 1 by the condition (1) is separated by waveform analysis.

圖4係表示以條件(2)對實施例1之薄膜表面進行XPS分析 之光譜的圖。 Figure 4 is a graph showing the XPS analysis of the film surface of Example 1 under the condition (2). The map of the spectrum.

圖5係將於以條件(1)對實施例4之薄膜表面進行XPS分析之光譜中觀察到之波峰藉由波形解析而分離的圖。 Fig. 5 is a view in which the peak observed in the spectrum of XPS analysis of the film surface of Example 4 by the condition (1) is separated by waveform analysis.

圖6係將於以條件(1)對比較例2之薄膜表面進行XPS分析之光譜中觀察到之波峰藉由波形解析而分離的圖。 Fig. 6 is a view in which the peak observed in the spectrum of XPS analysis of the film surface of Comparative Example 2 by the condition (1) is separated by waveform analysis.

圖7係表示於發熱體之再生步驟之確認試驗中成膜第1次及第100次之BIF的圖。 Fig. 7 is a view showing the first and the 100th BIF of the film formation in the confirmation test of the heating step of the heating element.

90‧‧‧阻氣性塑膠成形體 90‧‧‧ gas barrier plastic molded body

91‧‧‧塑膠成形體 91‧‧‧plastic molded body

92‧‧‧阻氣薄膜 92‧‧‧ gas barrier film

Claims (2)

一種阻氣性塑膠成形體之製造方法,其包括以下成膜步驟:使原料氣體接觸發熱之發熱體,使該原料氣體分解而生成化學種,並使上述化學種到達塑膠成形體之表面,藉此而形成阻氣薄膜,其特徵在於:使用乙烯基矽烷(H3SiC2H3)、二矽烷基乙炔(H3SiC2SiH3)或2-胺基乙基矽烷(H3SiC2H4NH2)作為上述原料氣體,且使用包含選自Mo、W、Zr、Ta、V、Nb、Hf之群中之一種或二種以上之金屬元素的材料作為上述發熱體,並將該發熱體之發熱溫度設為1550~2400℃。 A method for producing a gas barrier plastic molded body, comprising the steps of forming a film by contacting a raw material gas with a heat generating body that generates heat, decomposing the material gas to form a chemical species, and causing the chemical species to reach the surface of the plastic molded body. Thus, a gas barrier film is formed, which is characterized in that vinyl hydride (H 3 SiC 2 H 3 ), dialkyl acetylene (H 3 SiC 2 SiH 3 ) or 2-aminoethyl decane (H 3 SiC 2 H) is used. 4 NH 2 ) as the material gas, and a material containing one or two or more metal elements selected from the group consisting of Mo, W, Zr, Ta, V, Nb, and Hf is used as the heat generating body, and the heat is generated. The heating temperature of the body is set to 1550~2400 °C. 如請求項1之阻氣性塑膠成形體之製造方法,其中作為上述發熱體,使用金屬鉭、鉭基合金或碳化鉭,使用金屬鎢、鎢基合金或碳化鎢,使用金屬鉬、鉬基合金或碳化鉬,或使用金屬鉿、鉿基合金或碳化鉿。 The method for producing a gas barrier plastic molded body according to claim 1, wherein the heating element is made of a metal ruthenium, a ruthenium-based alloy or tantalum carbide, a metal tungsten, a tungsten-based alloy or a tungsten carbide, and a metal molybdenum or a molybdenum-based alloy is used. Or molybdenum carbide, or use metal ruthenium, ruthenium based alloy or tantalum carbide.
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