TWI575220B - Thin-film curvature measurment apparatus and method thereof - Google Patents

Description

Film curvature measuring device and method thereof

The present disclosure relates to a film curvature measuring device and method thereof.

In the process of epitaxial deposition of a semiconductor material, if the lattice constant of the epitaxial substrate is too different from the deposited material, for example, gallium nitride (GaN) is grown on a sili con (Si) substrate. There is a built-in stress between the two materials, and the substrate is bent to form a curved surface. Such a phenomenon causes the epitaxial quality to be lowered to affect the process quality, and the manufacturing cost is increased. Therefore, if the curvature change of the substrate can be monitored in the epitaxial process, and the structure of the built-in stress is most obvious in the structure, and the corresponding parameters are adjusted to reduce the built-in stress, it is a manufacturer. All are in the subject of research.

According to an embodiment of the present disclosure, a film curvature measuring device includes a light emitting module, at least one first optical module, at least one second optical module, and an image analyzing module. The light emitting module is configured to emit at least one first light as incident light, and the incident light forms a first geometric figure. The at least one first optical module is configured to provide at least one first optical path to cause incident light to be incident on the film via the first optical path. The at least one second optical module is configured to provide a second optical path to propagate the reflected light reflected by the thin film along the second optical path. The image analysis module determines the curvature of the film according to the second geometric shape formed by the reflected light, and the second geometric pattern has at least one feature. Wherein at least one feature of the second geometric figure is different from the first geometric figure, the at least one feature being a length of the second geometric figure, a distance between the at least one pair of parallel lines, a circumference of the second geometric figure, and a second geometric figure At least one of the areas.

According to a film curvature measuring method according to an embodiment of the present disclosure, the film curvature measuring method is suitable for measuring the curvature of the film to be tested. The film curvature measurement method first emits a first light as an incident light, and the cross-sectional shape of the incident light is a first geometric shape, and the incident light is propagated through the first optical path. The incident light propagating along the first optical path is then directed to the film. The reflected light reflected by the film is guided into the second optical path, and the cross-sectional shape of the reflected light is a second geometric figure having at least one feature. Then, the reflected light is extracted, and the curvature of the film is determined according to the second geometric shape having at least one feature of the cross-sectional shape of the reflected light. Wherein, the second geometric figure comprises a rectangle, and the at least one feature comprises at least one of a ratio of a length, a width or a length and a width of the rectangle.

The above description of the disclosure and the following description of the embodiments are intended to illustrate and clarify the spirit and principles of the disclosure, and to provide a further explanation of the scope of the disclosure.

The detailed features of the disclosure are described in the following description, which are sufficient for any person skilled in the art to understand the technical content of the disclosure and implement it according to the disclosure, the scope of the patent application and the drawings. The objects and advantages associated with the present disclosure can be readily understood by those skilled in the art. The following examples are intended to further illustrate the aspects of the disclosure, but are not intended to limit the scope of the disclosure.

It is to be understood that the drawings are a simplified schematic and are merely illustrative of the basic structure and method of the invention. Therefore, the components shown are not drawn in the actual number, shape, size ratio, etc., and the actual size of the implementation is a selective design, and the component layout may be more complicated. Bright.

Please refer to FIG. 1. FIG. 1 is a functional block diagram of a film curvature measuring device according to an embodiment of the present disclosure. As shown in FIG. 1 , the film curvature measuring device of the present disclosure is suitable for measuring the curvature of the film 4 to be tested, and the film curvature measuring device comprises the light emitting module 1 , the first optical module 2 , and the second optical module. 3. The third optical module 5, the image capturing module 6, and the image analyzing module 7. The image capturing module 6 is electrically connected to the image analyzing module 7, and the remaining functional modules 1, 2, 3, 4, and 5 have no substantial connection relationship, but the incident light emitted by the light emitting module 1 passes through each The order of the functional modules 2, 3, 4, 5 defines the relative positional relationship of each functional module 1, 2, 3, 4, 5.

Briefly, the film curvature measuring device of the present disclosure first emits at least one line laser as the incident light by the light emitting module 1, and the cross-sectional shape of the incident light is the first geometric figure. The incident light is sequentially passed through the first optical path provided by the first optical module 2 and the second optical path provided by the second optical module 3, and is incident on the film to be tested according to the guiding of the second optical module 3. 4. Then, the film 4 to be tested reflects the received incident light to form reflected light, and the reflected light enters the third optical path provided by the third optical module 5 according to the guiding of the second optical module 3, and is The image capturing module 6 receives. In order to simplify the description of the subsequent text, the cross-section of the reflected light obtained by the image capturing module 6 is defined as the second geometric figure according to the propagation order of the reflected light in each optical path. The shape of the second geometric figure is also a geometric figure having at least one feature. The image analysis module 7 determines the curvature of the film 4 to be tested according to at least one feature included in the second geometric figure. The following will be explained in detail based on each functional module in the film curvature measuring device.

The light emitting module 1 is configured to emit at least one line laser as incident light, and the cross-sectional shape of the incident light is a first geometric shape formed by at least one straight line. The first geometric figure may be, for example, a single straight line, a plurality of staggered straight lines (for example, a cross shape, a mesh shape), a plurality of parallel lines or a polygon (for example, a rectangle or a triangle), and the disclosure is not limited herein. In practice, the at least one line of the laser emitted by the light-emitting module 1 may be a solid-state laser or a gaseous laser, and the wavelength range of each line of the laser is visible wavelength, but the disclosure is merely exemplary here. There are no restrictions.

The first optical module 2 can adjust the light intensity or cross-sectional shape of the incident light by configuring the different optical components to form the first optical path so that the incident light propagates through the first optical path. The optical component is, for example, a concave lens, a convex lens, or a neutral density filter (ND filter), which is merely exemplary but not limited thereto. The second optical module 3 is configured to provide a second optical path, the function of which is similar to that of the first optical path, but the second optical path is further configured to guide incident light propagating along the first optical path to the film to be tested 4, And guiding the reflected light formed by the reflection of the film to be tested 4 into the third optical path provided by the third optical module 5. The third optical module 5 is configured to provide a third optical path such that the reflected light passing through the second optical path can propagate along the third optical path, and the third optical path also has a similar function as the first optical path. In practice, the film 4 to be tested may be, for example, a wafer of a light emitting diode (LED), but is not limited thereto.

The image capturing module 6 is configured to capture the reflected light that is transmitted to the terminal of the third optical path to obtain the second geometric pattern. This second geometric figure, as previously described, is a geometric figure having at least one feature. In practice, the image capturing module 6 can be, for example, a camera having a photosensitive-coupled device (CCD) or a complementary metal oxide semiconductor (CMOS). The disclosure is here. No restrictions.

The image analysis module 7 is configured to determine the curvature of the film 4 to be tested according to at least one feature of the second geometric figure. In practice, the image analysis module 7 can be, for example, a central processing unit (CPU) or a microcontroller unit (MCU), but is not limited thereto. More specifically, since the film 4 to be tested is not necessarily an ideal plane, if the film 4 to be tested is concave or convex, the incident light is reflected by the film 4 to be tested to form a reflected light, and the reflection is performed. The cross-sectional shape of the light is formed by the cross-sectional shape of the incident light correspondingly enlarged, reduced, skewed, or twisted according to the curvature of the film 4 to be tested.

In other words, the cross-sectional shape of the incident light and the reflected light may differ depending on the reflection of the film 4 to be tested. And in the case where the film 4 to be tested has different curvatures, the reflected light will form a corresponding cross-sectional shape according to different curvatures. Therefore, at least one feature of the second geometric shape may also vary depending on the curvature. The image analysis module 7 derives the unknown curvature of the film 4 to be tested by the measured at least one feature according to the corresponding relationship between the at least one feature of the second geometric figure and the curvature. Each of the geometric shapes has a different geometric definition and correspondingly forms the at least one feature, so the second geometric shape of the at least one feature may be, for example, at least one line of laser corresponding to a length in different axial directions, at least one pair of parallel lines The distance between the lasers, the perimeter of the second geometric figure, and the area of the second geometric figure are at least one of.

In an embodiment, the image analysis module 7 can determine the curvature of the film 4 to be tested according to different sets of standard data and the cross-sectional shape of the reflected light captured by the image capturing module 6. The aforementioned standard data is pre-experimental data, and each set of standard data corresponds to a film of a specific curvature. In more detail, each set of standard data includes substrate data as well as feature data, and wherein the substrate data is related to the curvature of a standard substrate. For example, the substrate data may indicate that the standard data is a film formed by a germanium substrate having a certain curvature, or a thin film formed of a sapphire substrate having another curvature; and the feature data is related to at least one feature of the second geometric figure. For example, when the second geometric figure is a rectangle, the feature data can indicate the length, width, or any feature of the rectangle that is sufficient to represent the rectangle. Therefore, the standard data is used to indicate that when a substrate formed of a material has a certain curvature, it corresponds to the second geometric figure having a certain feature.

According to the foregoing embodiment, the image analysis module 7 can analyze the first feature data related to the film 4 to be tested from the second geometric figure. At this time, the image analysis module 7 can calculate the curvature of the film to be tested according to the substrate data and the feature data contained in the plurality of sets of known standard data together with the first feature data. The calculation may be an interpolation method, an extrapolation method or a corresponding algorithm designed according to the correspondence between the curvature and the second geometric figure, for example, establishing a regression operation model with each known information, which is in the technical field. Those with ordinary knowledge can design freely and are not limited to this. As can be understood by those of ordinary skill in the art, the spirit of the present disclosure is to generate reflected light by incident light having a "specific cross-sectional shape" incident on the film 4 to be tested, and the image capturing module 6 extracts the reflection. The light has a second geometric shape of at least one feature. The image analysis module 7 determines the curvature of the film 4 to be tested according to at least one feature of the second geometric figure and supplemented by standard data. The foregoing is a functional description of the disclosed film curvature measuring device. However, the film curvature measuring device disclosed herein may have the following embodiments.

Please refer to FIG. 2. FIG. 2 is a first embodiment of a film curvature measuring device according to an embodiment of the present disclosure. In the embodiment represented by Fig. 2, the functional blocks shown in Fig. 1 are actually made with actual optical components. As shown in FIG. 2, the first optical module 2 includes a first lens 21 and a first filter 23, thereby forming a first optical path for sequentially passing incident light through the first lens 21 and the first in the first optical path. Filter 23. The second optical module 3 includes a first total reflection mirror 31 and a beam splitter 33, thereby forming a second optical path, so that the incident light sequentially passes through the first total reflection mirror 31 and the beam splitter 33 in the second optical path, and The reflected light formed by the reflection of the film to be tested 4 is guided into the third optical path by the beam splitter 33 in the second optical path. The third optical module 5 includes a second filter 51 and a second lens 53 to form a third optical path for sequentially passing the incident light through the second filter 51 and the second lens 53 in the first optical path.

The first lens 21 and the second lens 53 are convex lenses for focusing incident light and reflected light, thereby finely adjusting incident light or reflected light having a desired characteristic. In practice, the first lens 21 and the second lens 53 may also be concave lenses for diverging incident light or reflected light to have desired characteristics. The first filter 23 and the second filter 51 may be neutral attenuators for controlling the light intensity of the incident light and the reflected light. Therefore, it can be understood that the first optical module 2 composed of the first lens 21 and the first filter 23 and the third optical module 5 composed of the second filter 51 and the second lens 53 are corresponding to FIG. In the embodiment, the aspect of the incident light and the reflected light is finely adjusted. The first total reflection mirror 31 is configured to reflect the incident light propagating in the first direction to propagate in the second direction; the first surface of the beam splitter 33 is used for the incident light in the second direction to penetrate, and the light splitting The second side of the mirror 33 reflects the reflected light propagating in the second direction, causing it to propagate in the first direction. Therefore, it can be understood that the second optical module 2 composed of the first total reflection mirror 31 and the beam splitter 33 is used to control the direction of the incident light and the reflected light to be biased to a desired angle and propagated to a desired path. .

Referring to FIG. 1 and FIG. 2 simultaneously, in the corresponding embodiment of FIG. 2, the light-emitting module 1 emits at least one line of laser light as an incident light, and the incident light passes through the first optical mode in sequence as described above. The first optical path provided by the group 2 and the second optical path provided by the second optical module 3, wherein the incident light and the reflected light are further guided by the second optical module 3 to switch the propagation direction. In more detail, the incident light propagates in the first direction (for example, the X-axis direction) in the first optical path, and is guided by the second optical module 3 to vertically enter the film to be tested in the second direction (for example, the Y-axis direction). 4 is reflected vertically to form reflected light. Then, the reflected light first propagates in the second optical path along the second direction, and then passes through the reflection of the second optical module 3 to enter the third optical path provided by the third optical module 5 in the first direction. Wherein, as shown in FIG. 2, the first direction is perpendicular to the second direction. The image capturing module 6 receives the reflected light of the third optical path terminal and obtains the second geometric figure as described above. The image analysis module 7 analyzes according to at least one feature of the second geometric figure and the plurality of standard data, and determines the curvature of the film 4 to be tested.

Please refer to FIG. 3. FIG. 3 is a second embodiment of the film curvature measuring device of FIG. As shown, the first optical module 2 forms a first optical path with the first lens 21 and the first filter 23. The second optical module 3 forms a second optical path with the first total reflection mirror 31 and the second total reflection mirror 35. The third optical module 5 forms a third optical path with the second filter 51 and the second lens 53. The incident light propagates in the first direction along the first optical path and then into the second optical path. The incident light is reflected by the first total reflection mirror 31 to the second direction in the second optical path, and is incident on the film 4 to be tested in the second direction. The film to be tested 4 reflects the incident light to form reflected light, and the reflected light propagates in the third direction. The reflected light is reflected by the second total reflection mirror 35 to the first direction and enters the third optical path in the first direction. Then, as described above, the image capture module 6 receives the reflected light at the terminal of the third optical path, and obtains the second geometric pattern as described above for analysis by the image analysis module 7.

2 and 3 respectively disclose the actual implementation of the film curvature measuring device of the present disclosure, but the optical path system formed by the optical module is generally known to those skilled in the art, and can be designed and configured according to the type of the film, the machine, and the configuration. The actual considerations such as location are free to arrange the design, which is not limited to this. As described above, the spirit of the present disclosure is to form incident light having a specific cross-sectional shape by a line laser, and the incident light is incident on the film to be tested 4 and reflected to form reflected light, and then the self-reflecting light picks up at least one feature. The second geometric figure is supplemented by standard data to determine the curvature of the film 4 to be tested. The details will be described in detail below with reference to specific embodiments.

4A, 4B, and 4C, FIG. 4A, FIG. 4B and FIG. 4C are diagrams showing different standard data generated by a line laser source and corresponding second geometric patterns in an embodiment of the present disclosure. It should be noted that FIGS. 4A, 4B, and 4C correspond to different standard data, that is, FIG. 4A, FIG. 4B, and FIG. 4C are used to emit the same shape of the line laser by the light-emitting module 1, and the optical path and the difference are different. The reflection of the convex film of curvature is known as a schematic diagram of the second geometry captured by the image capture module 6. Therefore, each of the second geometric figures illustrated in FIGS. 4A, 4B, and 4C corresponds to a film having a different and known levitation height. As shown in the figure, the corresponding sag heights of FIGS. 4A, 4B, and 4C are sequentially followed. It is 100 μm, 70 μm, and 65 μm. In addition to being derived from the theory, it can be further understood from FIGS. 4A, 4B, and 4C that the same shape of incident light is emitted to the film having different levitation heights in the same optical path, and the corresponding reflected light respectively has different shapes. The second geometry.

The aforementioned suspension height is the distance between the highest point of the film to be tested and a horizontal plane, and when the junction area of the film to be tested and the horizontal plane is fixed, the suspension height may correspond to the curvature of the film to be tested and the radius of curvature. More specifically, in a convex film to be tested, when the flying height is larger, the curvature of the corresponding convex film to be tested is larger and the radius of curvature is smaller; conversely, when the flying height is smaller, the corresponding convex surface is to be tested. The smaller the curvature of the film, the larger the radius of curvature. Based on practical considerations, the present disclosure analyzes at least one feature of the second geometric figure based on the levitation height. However, those skilled in the art should understand that the levitation height, curvature, and radius of curvature are substantially interchangeable through the operation.

4A, 4B, and 4C, in the corresponding embodiment of FIGS. 4A, 4B, and 4C, the light-emitting module 1 emits a line of laser light as incident light. The cross-sectional shape of the incident light is close to a rectangle under the appropriate unit pitch. When the incident light having a rectangular cross-sectional shape is reflected by the above-mentioned "convex film having a known levitation height", the length and width of the rectangular cross-sectional shape are reduced or enlarged corresponding to the respective levitation heights, so that the cross-sectional shape of the reflected light is still rectangular. However, the length and width thereof are different from the cross-sectional shape of the incident light, and the cross-sectional shape of each reflected light also differs depending on the curvature of the film 4 to be tested. Finally, the second geometric figures as shown in FIGS. 4A, 4B, and 4C are respectively formed.

4A, 4B, 4C, the larger the levitation height of the convex film, the larger the length and width of the corresponding second geometric figure. More specifically, in the rectangular second geometry corresponding to the film having a suspension height of 100 μm, the length and width are larger than those corresponding to the film having a suspension height of 70 μm or 65 μm. Although the same single-line laser is used as the incident light, it can be understood from the figure that there is a relative relationship between m1>m2>m3 between the lengths m1, m2 and m3 of the second geometric figure of each rectangle, and the second geometric figure of each rectangle There is a relative relationship between n1>n2>n3 between the widths n1, n2, and n3. Those skilled in the art should be able to deduce that when the film 4 to be tested is a concave film, the above characteristics will be different, and the details will not be repeated here.

When the film curvature measuring device of the present disclosure is used to measure a film having an unknown curvature, that is, the film 4 to be tested has an unknown curvature or an unknown levitation height, the image capturing module 6 撷 obtains a corresponding The second geometric shape of the rectangle of the film 4 to be tested having an unknown levitation height. The image analysis module 7 can use the second geometric figure corresponding to the rectangle of the unknown levitation height and the second geometric shape of the rectangle corresponding to the known levitation height, and use the interpolation according to the correspondence of the length or the width thereof. The method, the extrapolation method or the analysis algorithm is designed according to the corresponding relationship, and the levitation height of the film 4 to be tested, that is, the curvature of the film 4 to be tested is calculated and judged.

5A, 5B, and 5C, FIG. 5A, FIG. 5B, and FIG. 5C are schematic diagrams showing different standard data generated by a cross laser light source and corresponding second geometric patterns in an embodiment of the present disclosure. In this embodiment, the light-emitting module 1 emits two lines of laser light as incident light, and the two lines of laser light are staggered to form a cross. At this time, the cross-sectional shape of the incident light is the cross shape, and the image capturing is performed. The module 6 can be adapted to obtain a second geometric shape of a cross. The image analysis module 7 changes the length of the two lines of the reflected light in different axial directions according to the second geometry of the cross and a plurality of known standard data as shown in FIGS. 5A, 5B, and 5C. The suspension height and curvature of the film 4 to be tested are determined.

5A, 5B, and 5C correspond to the concepts of analyzing the second geometric figure in the corresponding embodiments of FIGS. 4A, 4B, and 4C, and both are in accordance with the shape and length of the second geometric figure in two axial directions. The suspension height of the film 4 to be tested is judged. It should be noted, however, that the embodiment corresponding to FIGS. 4A, 4B, and 4C is incident on the film 4 to be tested with a single line of laser light, and is judged according to the length or width of the corresponding second geometric figure. 5A, 5B, and 5C correspond to the embodiment in which the two line lasers are determined according to the change in the length of the curvature of the different films. Therefore, the corresponding embodiments of FIGS. 5A, 5B, and 5C are applied in accordance with FIGS. 4A, 4B, and 4C. For example, more information is judged, so that the levitation height and curvature of the film 4 to be tested can be measured more accurately.

6A, 6B, and 6C, FIG. 6A, 6B, and 6C are schematic diagrams showing different standard data and corresponding second geometric patterns generated by a pair of parallel laser light sources in an embodiment of the present disclosure. In this embodiment, the light-emitting module 1 also emits two lines of laser light as incident light. Unlike the embodiment corresponding to FIGS. 5A, 5B, and 5C, the two lines of lasers are arranged in parallel to form a pair of parallel lines. line. Therefore, the cross-sectional shape of the incident light is a pair of parallel lines, and the image analysis module 7 determines the levitation height and curvature of the film 4 to be tested according to the change of the distance between the parallel lines included in the second geometric figure. In more detail, the image analysis module 7 knows the parallel line distances d1, d2, d3 and the distance corresponding to each parallel line distance in each figure, and the image analysis module 7 corresponds to the film to be tested. The second geometry of 4 takes another parallel line distance corresponding to the unknown levitation height, and based on these information analysis, determines the levitation height and curvature of the film 4 to be tested.

7A, 7B, and 7C, FIG. 7A, FIG. 7B, and FIG. 7C are diagrams showing different standard data generated by a grid laser light source and corresponding second geometric patterns in an embodiment of the present disclosure. In this embodiment, the light-emitting module 1 emits a plurality of line lasers as incident light, and the plurality of line lasers are staggered to form a grid. Therefore, the cross-sectional shape of the incident light is the mesh shape described above, and the image capturing module 6 can correspondingly acquire the second geometric figure of the mesh. The image analysis module 7 is based on the second geometry of the grid and a plurality of known standard data as represented by FIGS. 7A, 7B, and 7C, by the area of a specific area in the grid or its perimeter. The corresponding relationship of the levitation height determines the levitation height and curvature of the film 4 to be tested. In more detail, the image analysis module 7 knows the area a1, a2, a3 or its circumference of a specific block in each figure and the levitation height corresponding to each specific block, and the image analysis module 7 From the second geometric figure corresponding to the film 4 to be tested, another specific block area corresponding to the unknown levitation height or its circumference is taken, and the levitation height and curvature of the film 4 to be tested are judged based on the analysis of the information.

Corresponding to the above, the present disclosure also provides a film curvature measuring method suitable for measuring the curvature of a film to be tested. Please refer to FIG. 8. FIG. 8 is a flow chart showing the steps of the method for measuring the curvature of a film according to an embodiment of the present disclosure. It should be noted that the first, second, and third optical paths in the film curvature measurement method according to the embodiment may correspond to the related embodiments of the first, second, and third figures, The first, second, and third optical modules 2, 3, and 5 respectively form the first, second, and third optical paths. The film curvature measuring method disclosed in the present invention is also applicable to the above-mentioned film curvature measuring device, so please refer to the first, second, and third figures at the same time. In step S801, the film curvature measurement method of the present disclosure first emits at least one line of laser light as incident light, wherein the cross-sectional shape of the incident light is a first geometric figure formed by at least one straight line. While corresponding to the related embodiments of FIGS. 4-8, the geometric shape may be, for example, a single straight line, a plurality of staggered straight lines, a plurality of parallel lines or a polygon.

Next, in step S803, incident light is propagated through the first optical path, and incident light propagating along the first optical path is guided to enter the film to be tested via the second optical path. Then, in step S805, the reflected light passing through the second optical path is guided into the third optical path, and the reflected light is propagated along the third optical path, wherein the reflected light is formed by the incident light reflected by the film to be tested, and the reflection is The cross-sectional shape of the light is a second geometric figure having at least one feature. In step S807, the reflected light propagating to the third optical path terminal is extracted. Finally, in step S809, the curvature of the film to be tested is determined based on the second geometric pattern of at least one characteristic of the reflected light obtained by the 撷.

In the step of the film curvature measuring method, the second geometric shape of the at least one feature corresponds to the previous 4A to 7C, and includes at least one line of laser corresponding to the length in different axial directions, at least one pair The distance between the parallel line lasers, at least one of the perimeter of the second geometric figure and the area of the second geometric figure. And the at least one feature obtained in addition to the 更 can be supplemented with a plurality of known standard data to determine the levitation height and curvature of the film to be tested.

In summary, the present disclosure provides a film curvature measuring device and a film curvature measuring method, wherein at least one line of laser light is emitted by the light emitting module to form incident light, and optical paths are formed through the optical modules. The incident light is incident on a film to be tested having an unknown curvature, and the reflected light formed by the reflection of the film to be tested is received by the image capturing device. The image capturing module reflects the light for analysis by the image analysis module to determine the curvature of the film to be tested. The image analysis module can determine the levitation height of the film to be tested by using the second geometric figure of the at least one feature of the reflected light, and the corresponding standard data, and then obtain the curvature by a simple operation. Therefore, the exposed film curvature measuring device and the film curvature measuring method can monitor the curvature change of each wafer in each epitaxial process in order to assist the manufacturer to clearly identify the main factor causing the substrate to bend. In a process, the parameters are adjusted to improve the yield of the process and reduce the cost, which is very practical.

Although the disclosure is disclosed above in the foregoing embodiments, it is not intended to limit the disclosure. All changes and refinements are beyond the scope of this disclosure. Please refer to the attached patent application for the scope of protection defined by this disclosure.

1‧‧‧Lighting module
2‧‧‧First optical module
21‧‧‧ first lens
23‧‧‧First filter
3‧‧‧Second optical module
31‧‧‧First total reflection mirror
33‧‧‧beam splitter
35‧‧‧Second total reflection mirror
4‧‧‧ film to be tested
5‧‧‧ Third optical module
51‧‧‧Second filter
53‧‧‧second lens
6‧‧‧Image capture module
7‧‧‧Image Analysis Module
The length of the second geometric figure of the m1~m3‧‧‧ rectangle
Width of the second geometry of the rectangle n1~n3‧‧‧
Distance between two parallel lines in the second geometry of the d1~d3‧‧‧ parallel lines
The area of a particular area of the second geometry of the a1~a3‧‧‧ grid
S801~S809‧‧‧Step procedure

1 is a functional block diagram of a film curvature measuring device according to an embodiment of the present invention. 2 is a first embodiment of the film curvature measuring device of FIG. 1. 3 is a second embodiment of the film curvature measuring device of FIG. 1. 4A, 4B, and 4C are schematic diagrams showing different standard data and corresponding second geometric patterns produced by a line laser source in an embodiment of the present disclosure. 5A, 5B, and 5C are schematic views showing the generation of different standard data and corresponding second geometric patterns by a cross laser light source in an embodiment. 6A, 6B, and 6C are schematic views showing the generation of different standard data and corresponding second geometric patterns by a pair of parallel line laser light sources in an embodiment. 7A, 7B, and 7C are schematic diagrams showing different standard data and corresponding second geometric patterns produced by a grid laser light source in an embodiment. FIG. 8 is a flow chart showing the steps of a method for measuring curvature of a film in an embodiment.

Claims (13)

A film curvature measuring device, comprising: a light emitting module, configured to emit at least one first light as an incident light, the incident light forming a first geometric figure; at least one first optical mode a set of at least one first optical path for causing the incident light to be incident on a film through the first optical path; at least one second optical module for providing a second optical path to pass the film Reflecting a reflected light along the second optical path; and an image analysis module determining a curvature of the film according to a second geometric shape formed by the reflected light, the second geometric figure having at least one feature Wherein the at least one feature of the second geometric figure is different from the first geometric figure, the at least one feature being a length of the second geometric figure, a distance between at least one pair of parallel lines, and a second geometric figure At least one of a perimeter and an area of the second geometric figure. The film curvature measuring device of claim 1, wherein the first optical module comprises a first lens and a first filter, the incident light passing through the first lens and the first in a first direction Filter. The film curvature measuring device according to claim 1, wherein the image analyzing module is the at least one feature of the cross-sectional shape of the reflected light according to a plurality of sets of different standard data. The second geometry is comparatively analyzed and the curvature of the film is calculated by interpolation or extrapolation. The film curvature measuring device according to claim 3, wherein each of the standard data includes a substrate data and a feature data, the substrate data being related to the curvature of a standard substrate, the feature data being related to the reflected light The second geometric shape of the at least one feature of the cross-sectional shape. The film curvature measuring device according to claim 1, wherein the first geometric figure and the second geometric figure are a single straight line, a plurality of staggered straight lines, a plurality of parallel lines, a polygon, a circle or an ellipse. The film curvature measuring device according to claim 1, wherein the first light is a laser light. A film curvature measuring method is suitable for measuring a curvature of a film, the film curvature measuring method comprising: emitting a first light as an incident light, the cross-sectional shape of the incident light being a first geometric figure; Passing the incident light through a first optical path; guiding the incident light propagating along the first optical path to enter the film; guiding a reflected light reflected by the film into a second optical path, and the cross section of the reflected light The shape is a second geometric figure having at least one feature; the reflected light is extracted; and the curvature of the film is determined according to the second geometric shape having the at least one feature of the cross-sectional shape of the reflected light; The second geometric figure includes a rectangle, and the at least one feature includes at least one of a ratio of length, width or length to width of the rectangle. The film curvature measurement method according to claim 7, wherein the second geometric pattern of the at least one feature of the cross-sectional shape of the reflected light is compared and analyzed according to a plurality of sets of different standard data, and is interpolated or The curvature of the film is calculated by extrapolation. The film curvature measurement method according to claim 8, wherein each of the standard data includes a substrate data and a feature data, the substrate data being related to the curvature of a standard substrate, the feature data being related to the reflected light The second geometric shape of the at least one feature of the cross-sectional shape. A method for measuring curvature of a film, which is suitable for measuring a curvature of a film, wherein the method for measuring curvature of the film comprises: using at least one pair of parallel line lasers as an incident light, the cross-sectional shape of the incident light being a first Geometry; propagating the incident light through a first optical path; guiding the incident light along the film; guiding a reflected light reflected by the film into a second optical path, and the cross-sectional shape of the reflected light is a second geometric figure of the at least one feature; capturing the reflected light; and determining the curvature of the film according to the at least one feature; wherein the second geometric figure comprises a first rectangle and a second rectangle, The first rectangle is substantially parallel to the second rectangle, and the at least one feature includes the first rectangle and the second a distance of a center line of the rectangle, a distance between the first rectangle and a parallel side of the second rectangle, or at least one of a distance between the first rectangle and an individual diagonal of the second rectangle. The film curvature measurement method of claim 10, wherein the second geometric figure has a plurality of features, the features are a distance between the first rectangle and a center line of the second rectangle, the first rectangle and the The distance of the parallel sides of the second rectangle or the distance between the first rectangle and the individual diagonals of the second rectangle. The film curvature measurement method according to claim 10, wherein the second geometric pattern of the at least one feature of the cross-sectional shape of the reflected light is compared and analyzed according to a plurality of sets of different standard data, and is interpolated or The curvature of the film is calculated by extrapolation. The film curvature measurement method according to claim 10, wherein each of the standard data includes a substrate data and a feature data, the substrate data being related to the curvature of a standard substrate, the feature data being related to the reflected light The second geometric shape of the at least one feature of the cross-sectional shape.