TWI573989B - Meterial level indicator - Google Patents
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Description
本發明是關於檢知裝置，且特別是有關於物位檢知裝置。 The present invention relates to a detection device, and more particularly to a level detection device.
倉儲管理為存放物料與保存物料時的一個相當重要的課題。各種類型的產業皆會用到倉庫來儲存各種物料，如石化工業、大宗食品業、飼料業、鋼鐵業、水泥業等。而存放於倉庫中的物料有固體、液體、固液混合體等不同的物質形態，舉例來說，有石油、煤礦、鐵砂、水泥、玉米、小麥、麵粉、牛油等不同的物料。各種物料在儲存於倉庫時，倉庫內的溫度、濕度與物料存量的多寡，都會影響到儲存於倉庫中各種物料的保存期限與保存品質的優劣。而在某些特定的產業，倉庫內溫度若沒有控管好，則可能導致物料的爆炸或其他公安意外的發生，例如乾燥的物料玉米、大豆、導電粉塵等，會因為溫度變異，導致悶燒或火花塵爆。 Warehouse management is a very important issue when storing materials and storing materials. Various types of industries use warehouses to store various materials, such as petrochemical industry, bulk food industry, feed industry, steel industry, and cement industry. The materials stored in the warehouse have different physical forms such as solid, liquid, solid-liquid mixture, for example, oil, coal, iron sand, cement, corn, wheat, flour, butter and other materials. When various materials are stored in the warehouse, the temperature, humidity and material inventory in the warehouse will affect the shelf life and quality of the various materials stored in the warehouse. In some specific industries, if the temperature in the warehouse is not well controlled, it may lead to the explosion of materials or other public security accidents, such as dry materials such as corn, soybeans, conductive dust, etc., which may cause smoldering due to temperature variation. Or sparks burst.
然而，一般的物料檢知裝置多僅應用於量測物位，並無法進行倉庫內環境條件及物料條件的檢測。 However, the general material detection device is mostly used only for measuring the level, and it is impossible to detect the environmental conditions and material conditions in the warehouse.
本發明提供一種物位檢知裝置，用以量測容器內的物料料位，物位檢知裝置包含探棒、複數第一信號補償單元、至少一第二信號補償 單元及控制模組。探棒包含第一端及與第一端相對的第二端；第一信號補償單元設於第一端，且相鄰二第一信號補償單元間具有第一間隔距離；第二信號補償單元設於第二端。控制模組位於第一端並包含信號處理單元、信號發射單元及信號接收單元，信號發射單元電連接於該信號處理單元並供產生電磁波信號；信號接收單元電連接於信號處理單元。信號發射單元產生之電磁波信號沿著第一端傳遞至第二端，第一信號補償單元反射電磁波信號，信號接收單元接收由該等第一信號補償單元反射後之電磁波信號並傳遞至信號處理單元以產生第一走時差值，信號處理單元依據第一走時差值進行環境係數校正，第二信號補償單元反射電磁波信號，信號接收單元接收由該等第二信號補償單元反射後之電磁波信號並傳遞至信號處理單元以產生第二走時差值，信號處理單元依據第二走時差值進行物料的介電係數的檢知。 The invention provides a level detecting device for measuring a material level in a container, the level detecting device comprises a probe, a plurality of first signal compensation units, and at least a second signal compensation Unit and control module. The probe includes a first end and a second end opposite to the first end; the first signal compensation unit is disposed at the first end, and the first two signal compensation units have a first separation distance; the second signal compensation unit is configured At the second end. The control module is located at the first end and includes a signal processing unit, a signal transmitting unit and a signal receiving unit. The signal transmitting unit is electrically connected to the signal processing unit for generating an electromagnetic wave signal; and the signal receiving unit is electrically connected to the signal processing unit. The electromagnetic wave signal generated by the signal transmitting unit is transmitted to the second end along the first end, the first signal compensating unit reflects the electromagnetic wave signal, and the signal receiving unit receives the electromagnetic wave signal reflected by the first signal compensating unit and transmits the electromagnetic wave signal to the signal processing unit To generate a first travel time difference, the signal processing unit performs environmental coefficient correction according to the first travel time difference, the second signal compensation unit reflects the electromagnetic wave signal, and the signal receiving unit receives the electromagnetic wave signal reflected by the second signal compensation unit. And transmitting to the signal processing unit to generate a second travel time difference, the signal processing unit performs the detection of the dielectric coefficient of the material according to the second travel time difference.
10‧‧‧電氣盒 10‧‧‧Electrical box
100‧‧‧容置空間 100‧‧‧ accommodating space
102‧‧‧底端 102‧‧‧ bottom
104‧‧‧穿孔 104‧‧‧Perforation
12‧‧‧探棒 12‧‧‧ Probe
120‧‧‧第一端 120‧‧‧ first end
122‧‧‧第二端 122‧‧‧ second end
14‧‧‧控制模組 14‧‧‧Control Module
140‧‧‧電路板 140‧‧‧ boards
142‧‧‧信號處理單元 142‧‧‧Signal Processing Unit
144‧‧‧信號發射單元 144‧‧‧Signal launch unit
146‧‧‧信號接收單元 146‧‧‧Signal receiving unit
16、16a、160b‧‧‧第一信號補償單元 16, 16a, 160b‧‧‧ first signal compensation unit
16b、18b‧‧‧扣件 16b, 18b‧‧‧ fasteners
162b、182b‧‧‧連接件 162b, 182b‧‧‧connecting parts
18、18a、180b‧‧‧第二信號補償單元 18, 18a, 180b‧‧‧ second signal compensation unit
19‧‧‧信號增強件 19‧‧‧Signal Enhancements
190‧‧‧本體 190‧‧‧ Ontology
192‧‧‧延伸部 192‧‧‧Extension
194‧‧‧柱體 194‧‧‧Cylinder
196‧‧‧凹槽 196‧‧‧ Groove
20‧‧‧重錘 20‧‧‧heavy hammer
200‧‧‧環形體 200‧‧‧ ring body
202‧‧‧連接部 202‧‧‧Connecting Department
204‧‧‧上端部 204‧‧‧Upper end
206‧‧‧下端部 206‧‧‧Bottom
30、40、50、60、70、80‧‧‧曲線 30, 40, 50, 60, 70, 80‧‧‧ curves
D‧‧‧預定方向 D‧‧‧Predetermined direction
d1‧‧‧第一間隔距離 D1‧‧‧first separation distance
d2‧‧‧第二間隔距離 D2‧‧‧Second separation distance
圖1繪示依照本發明第一實施方式之物位檢知裝置之架構圖；圖2繪示依照本發明第一實施方式之控制模組之電路方塊圖；圖3繪示對應第一走時差值及第一預設走時差值的曲線圖；圖4a至圖4d繪示依照本發明之信號增強件之示意圖；圖5繪示不具有信號增強件之物料檢知裝置及具有信號增強件之物料檢知裝置的第二走時信號的曲線圖；圖6a至圖6c繪示依照本發明之重錘之示意圖； 圖7繪示不具有重錘之物料檢知裝置及具有重錘之物料檢知裝置的雜訊的曲線圖；圖8繪示依照本發明第二實施方式之物位檢知裝置之架構圖；以及圖9繪示依照本發明第三實施方式之物位檢知裝置之架構圖。 1 is a block diagram of a level detecting device according to a first embodiment of the present invention; FIG. 2 is a block diagram of a control module according to a first embodiment of the present invention; FIG. 4a to FIG. 4d are schematic diagrams of a signal enhancement member according to the present invention; FIG. 5 is a diagram showing a material detection device without a signal enhancement member and having signal enhancement A graph of a second travel time signal of the material detecting device; FIG. 6a to FIG. 6c are schematic views of the weight according to the present invention; 7 is a graph showing the noise of the material detecting device without the weight and the material detecting device having the weight; FIG. 8 is a structural diagram of the level detecting device according to the second embodiment of the present invention; And FIG. 9 is a block diagram of a level detecting device according to a third embodiment of the present invention.
配合參閱圖1，其繪示依照本發明第一實施方式之物位檢知裝置之架構圖。物位檢知裝置供安裝於供安置物料的桶槽的頂面，用以檢知桶槽的環境係數、容置於物料的高度(或稱物位)及物料的介電係數。如圖1所示，物位檢知裝置包含電氣盒10、探棒12及控制模組14。電氣盒10具有容置空間100，以及位於電氣盒10的底端102並與容置空間100相連通的穿孔104。 Referring to FIG. 1, a block diagram of a level detecting device according to a first embodiment of the present invention is shown. The level detecting device is installed on the top surface of the tank for the placement material, and is used for detecting the environmental coefficient of the tank, the height of the material (or the level) and the dielectric constant of the material. As shown in FIG. 1, the level detecting device includes an electrical box 10, a probe 12, and a control module 14. The electrical box 10 has an accommodating space 100, and a through hole 104 located at the bottom end 102 of the electrical box 10 and communicating with the accommodating space 100.
探棒12設於電氣盒10的底端102，沿著預定方向D延伸，使包含第一端120及與第一端120相對的第二端122。探棒12可呈圓柱體或多角柱體，並可以為不具可撓性的鋼棒或具備可饒性的鋼索。 The probe 12 is disposed at the bottom end 102 of the electrical box 10 and extends along a predetermined direction D to include a first end 120 and a second end 122 opposite the first end 120. The probe 12 can be a cylindrical or polygonal cylinder and can be a non-flexible steel bar or a resilient cable.
探棒12的第一端120設有複數第一信號補償單元16，第一信號補償單元16等間隔排列，且相鄰二第一信號補償單元16間具有第一間隔距離d1。如圖1所示，第一信號補償單元16為開設在探棒12的第一端120的凹槽。 The first end 120 of the probe 12 is provided with a plurality of first signal compensation units 16, and the first signal compensation units 16 are equally arranged, and the first two first signal compensation units 16 have a first separation distance d1. As shown in FIG. 1 , the first signal compensation unit 16 is a recess that is opened at the first end 120 of the probe 12 .
探棒12的第二端122設有複數第二信號補償單元18，第二信號補償單元18等間隔排列，且相鄰二第二信號補償單元18間具有第二間隔距離d2，第二間隔距離d2可例如不等於第一間隔距離d1。在圖1中，第二信號補償單元18為開設在探棒12的第二端120的凹槽。 The second end 122 of the probe 12 is provided with a plurality of second signal compensation units 18, and the second signal compensation unit 18 is equally spaced, and the second spacing compensation unit 18 has a second separation distance d2, and the second separation distance D2 may, for example, not be equal to the first separation distance d1. In FIG. 1, the second signal compensation unit 18 is a recess that is opened at the second end 120 of the probe 12.
在此要特別說明的是，雖然圖1所繪示的第一信號補償單元16及第二信號補償單元18皆為凹槽，然實際實施時，第一信號補償單元16及/或第二信號補償單元18也可以為凸部或其他可供反射電磁波信號的結構。再者，第一信號補償單元16之凹槽的高度及孔徑並不一定要相同於代表第二信號補償單元18之凹槽的高度及孔徑，且第一信號補償單元16及第二信號補償單元18的連線可以是平行於探棒12延伸的預定方向D，或者第一信號補償單元16及第二信號補償單元18的連線也可以是不平行於探棒12延伸的預定方向D。又，第一信號補償單元16及第二信號補償單元18也可以是套設於探棒12上的環形扣件，此環形扣件上開設有前述的凹槽。 It should be particularly noted that although the first signal compensation unit 16 and the second signal compensation unit 18 are all grooves, the first signal compensation unit 16 and/or the second signal are actually implemented. The compensation unit 18 can also be a convex portion or other structure for reflecting electromagnetic wave signals. Moreover, the height and aperture of the groove of the first signal compensation unit 16 do not have to be the same as the height and aperture of the groove representing the second signal compensation unit 18, and the first signal compensation unit 16 and the second signal compensation unit The connection of 18 may be a predetermined direction D parallel to the extension of the probe 12, or the connection of the first signal compensation unit 16 and the second signal compensation unit 18 may also be a predetermined direction D that is not parallel to the extension of the probe 12. Moreover, the first signal compensating unit 16 and the second signal compensating unit 18 may also be an annular fastener that is sleeved on the probe 12, and the annular fastener is provided with the aforementioned groove.
控制模組14位於容置空間100內，並包含電路板140、信號處理單元142、信號發射單元144及信號接收單元146。請同時參照圖2，其繪示依照本發明之控制模組14的電路圖。電路板140可例如是雙面都佈設銅箔線路的印刷電路板，信號處理單元142、信號發射單元144及信號接收單元146分別設置於電路板140上，且信號處理單元142電連接於信號發射單元144及信號接收單元146。 The control module 14 is located in the accommodating space 100 and includes a circuit board 140, a signal processing unit 142, a signal transmitting unit 144, and a signal receiving unit 146. Please also refer to FIG. 2, which shows a circuit diagram of the control module 14 in accordance with the present invention. The circuit board 140 can be, for example, a printed circuit board on which both sides of the copper foil line are disposed. The signal processing unit 142, the signal transmitting unit 144 and the signal receiving unit 146 are respectively disposed on the circuit board 140, and the signal processing unit 142 is electrically connected to the signal transmission. Unit 144 and signal receiving unit 146.
在圖1中，信號處理單元142是設置在電路板140的其中之表面，信號發射單元144及信號接收單元146分別設置在電路板140相反設有信號處理單元142之表面，探棒12的一端部也可例如是連接於電路板140設有信號發射單元144及信號接收單元146之表面；然實際實施時，信號處理單元142、信號發射單元144及信號接收單元146可以是設置在電路板140的相同表面上。 In FIG. 1, the signal processing unit 142 is disposed on a surface of the circuit board 140, and the signal transmitting unit 144 and the signal receiving unit 146 are respectively disposed on a surface of the circuit board 140 oppositely provided with the signal processing unit 142, and one end of the probe 12 The portion may also be connected to the surface of the circuit board 140 and provided with the signal transmitting unit 144 and the signal receiving unit 146. However, in actual implementation, the signal processing unit 142, the signal transmitting unit 144 and the signal receiving unit 146 may be disposed on the circuit board 140. On the same surface.
在進行桶槽內環境係數校正及物料的介電係數檢知時，探棒12的第二端122必須埋入物料中，第一端120可例如是暴露於物料之外或深埋入物料中。 When the environmental coefficient correction in the tank and the dielectric coefficient of the material are detected, the second end 122 of the probe 12 must be buried in the material, and the first end 120 can be exposed to the material, for example, or buried deep into the material. .
信號發射單元144供產生電磁波信號，其可例如為石英震盪器。信號發射單元144產生的電磁波信號沿著探棒12的表面傳遞。當電磁波信號傳遞至第一信號補償單元16時，部分的電磁波信號由第一信號補償單元16反射後傳遞至信號處理單元142，並產生第一走時差值，如圖3曲線40所示。 The signal transmitting unit 144 is for generating an electromagnetic wave signal, which may be, for example, a quartz oscillator. The electromagnetic wave signal generated by the signal transmitting unit 144 is transmitted along the surface of the probe 12. When the electromagnetic wave signal is transmitted to the first signal compensating unit 16, a part of the electromagnetic wave signal is reflected by the first signal compensating unit 16 and then transmitted to the signal processing unit 142, and a first travel time difference is generated, as shown by a curve 40 in FIG.
在此要特別說明的是，信號處理單元142內建有計數器，以供計數信號發射單元144產生電磁波至信號接收單元146接收到由第一信號補償單元16反射的電磁波信號的計數值；之後，信號處理單元142利用時域反射(Time Domain Reflectometry,TDR)以將計數值轉換成為時間。再者，信號處理單元142更內建有第一預設走時差值，如圖3曲線30所示。此第一預設走時差值為桶槽內尚未擺放物料時，電磁波信號由第一信號補償單元16反射後傳遞至信號處理單元142而產生。 It is to be noted that the signal processing unit 142 has a counter built therein for the counter signal transmitting unit 144 to generate an electromagnetic wave to the signal receiving unit 146 to receive the count value of the electromagnetic wave signal reflected by the first signal compensating unit 16; Signal processing unit 142 utilizes Time Domain Reflectometry (TDR) to convert the count value to time. Furthermore, the signal processing unit 142 has a built-in first preset travel time difference, as shown by the curve 30 in FIG. When the first preset travel time difference is that the material is not placed in the tank, the electromagnetic wave signal is reflected by the first signal compensation unit 16 and then transmitted to the signal processing unit 142.
當桶槽內放置有物料時，第一走時差值會因物料附著於探棒12或者物料產生的蒸汽而較第一預設走時差值大，藉此，信號處理單元142可藉由比較第一走時差值及第一預設走時差值，以進行因環境條件改變所導致之誤差的校正(環境係數的校正)。 When the material is placed in the tank, the first travel time difference is greater than the first preset travel time difference due to the material attached to the probe 12 or the steam generated by the material, whereby the signal processing unit 142 can The first travel time difference and the first preset travel time difference are compared to perform correction of the error caused by the change in environmental conditions (correction of the environmental coefficient).
信號發射單元144產生的電磁波信號沿著探棒12的表面傳遞至第二信號補償單元18時，部分的電磁波信號由第二信號補償單元18反射 後傳遞至信號處理單元142，並產生第二走時差值。其中，在進行第二走時差值得檢知時，桶槽內已擺設有物料。 When the electromagnetic wave signal generated by the signal transmitting unit 144 is transmitted to the second signal compensating unit 18 along the surface of the probe 12, part of the electromagnetic wave signal is reflected by the second signal compensating unit 18. It is then passed to signal processing unit 142 and a second travel time difference is generated. Among them, when the second travel time difference is worth detecting, the material has been placed in the tank.
信號處理單元142更內建有第二預設走時差值，此第二預設走時差值為桶槽內尚未擺放物料時，電磁波信號由第二信號補償單元18反射後傳遞至信號處理單元而產生。 The signal processing unit 142 further has a second preset travel time difference. When the second preset travel time difference is that the material is not placed in the slot, the electromagnetic wave signal is reflected by the second signal compensation unit 18 and transmitted to the signal. Generated by the processing unit.
當桶槽內放置有物料時，第二走時差值會因物料附著於探棒12而較第二預設走時差值大，藉此，信號處理單元142可藉由比較第二走時差值及第二預設走時差值，以進行因物料介電係數的檢知。 When the material is placed in the tank, the second travel time difference is greater than the second preset travel time difference due to the material being attached to the probe 12, whereby the signal processing unit 142 can compare the second travel time. The difference and the second preset travel time difference are used to detect the dielectric constant of the material.
因第二信號補償單元18遠離控制模組14，因此，第二信號補償單元18反射電磁波信號產生的第二走時差值的信號明顯較第一走時差值微弱，如圖5曲線50所示。為了避免第二走時差值無法有效地傳遞至信號接收單元146，物料檢知裝置可以包含信號增強件19，如圖4a至圖4d所示。信號增強件19連接於探棒12的第二端122，具有增強第二走時差值的信號強度的效果；其中，由圖5曲線60可以看出，包含信號增強件19之物料檢知裝置的第二走時差值的信號強度明顯高於未包含信號增強件19之第二走時差值的信號強度。 Because the second signal compensation unit 18 is away from the control module 14, the signal of the second travel time difference generated by the second signal compensation unit 18 reflected by the electromagnetic wave signal is significantly weaker than the first travel time, as shown by curve 50 in FIG. Show. In order to prevent the second travel time difference from being effectively transmitted to the signal receiving unit 146, the material detecting means may include the signal enhancement member 19 as shown in Figs. 4a to 4d. The signal enhancement member 19 is coupled to the second end 122 of the probe 12 and has the effect of enhancing the signal strength of the second travel time difference; wherein, as can be seen from the curve 60 of FIG. 5, the material detection device including the signal enhancement member 19 The signal strength of the second travel time difference is significantly higher than the signal strength of the second travel time difference that does not include the signal enhancement 19.
在圖4a中，信號增強件19呈環狀，並連接於探棒12的第二端122。在圖4b中，信號增強件19包含本體190及延伸部192，本體190的一側連接於探棒12，且本體190的外徑大於探棒12的外徑。延伸部192連接在本體190相反與探棒12連接的一側，且延伸部192外徑沿著探棒12的延伸方向減少(即延伸部192的外徑隨著遠離電氣盒10而減少)。在圖4c中，信號增強件19呈漏斗狀，且其外徑隨著遠離電氣盒 10而漸少。在圖4d中，信號增強件19包含柱體194及凹槽196，且凹槽196形成於柱體194鄰近於電氣盒10之一端；柱體194的外徑大於探棒12的外徑，且柱體194可例如為圓柱體或角柱體。 In FIG. 4a, signal enhancement 19 is annular and is coupled to second end 122 of probe 12. In FIG. 4b, the signal reinforcement 19 includes a body 190 and an extension 192. One side of the body 190 is coupled to the probe 12, and the outer diameter of the body 190 is greater than the outer diameter of the probe 12. The extension 192 is coupled to the side of the body 190 that is oppositely coupled to the probe 12, and the outer diameter of the extension 192 decreases along the direction in which the probe 12 extends (ie, the outer diameter of the extension 192 decreases as it moves away from the electrical box 10). In Figure 4c, the signal reinforcement 19 is funnel shaped and has an outer diameter that is away from the electrical box. 10 and less. In FIG. 4d, the signal reinforcement 19 includes a post 194 and a recess 196, and a recess 196 is formed in the post 194 adjacent to one end of the electrical box 10; the outer diameter of the post 194 is greater than the outer diameter of the probe 12, and The cylinder 194 can be, for example, a cylinder or a corner cylinder.
又，物料檢知裝置的第二端122另可選擇性地包含重錘20而非信號增強件19，如圖6a至圖6c所示，藉以降低第二走時差值的雜訊。請參閱圖7，曲線70繪示不具有重錘之物料檢知裝置的檢知信號曲線圖，曲線80繪示具有重錘之物料檢知裝置的檢知信號的曲線圖；重錘20連接於探棒12的第二端122。在圖6a中，重錘20由複數個環形體200所組成，所述的環形體200呈等間隔排列；其中，環形體200的外徑大於探棒12的外徑。在圖6b中，重錘20包含具有連接部202，以及位於連接部202兩相反側並與連接部202連接之上端部204及下端部206。連接部202的外徑部於探棒12的外徑；上端部204連接於第二端122，且上端部204的外徑隨著遠離第二端102而增加；下端部206之外徑隨著遠離連接部202而減少。在圖6c中，重錘20呈錐狀，且其外徑隨著遠離第二端122而增加。 Moreover, the second end 122 of the material detecting device can optionally include the weight 20 instead of the signal enhancing member 19, as shown in FIGS. 6a to 6c, thereby reducing the noise of the second travel time difference. Referring to FIG. 7, a curve 70 shows a detection signal curve of the material detecting device without a weight, and a curve 80 shows a curve of a detection signal of the material detecting device with a weight; the weight 20 is connected to The second end 122 of the probe 12. In Fig. 6a, the weight 20 is composed of a plurality of annular bodies 200 arranged at equal intervals; wherein the outer diameter of the annular body 200 is larger than the outer diameter of the probe 12. In FIG. 6b, the weight 20 includes a connecting portion 202 and two opposite sides of the connecting portion 202 and is coupled to the upper portion 204 and the lower end portion 206 of the connecting portion 202. The outer diameter of the connecting portion 202 is at the outer diameter of the probe 12; the upper end portion 204 is connected to the second end 122, and the outer diameter of the upper end portion 204 increases as it moves away from the second end 102; the outer diameter of the lower end portion 206 follows It is reduced away from the connecting portion 202. In Figure 6c, the weight 20 is tapered and its outer diameter increases as it moves away from the second end 122.
請參閱圖8，其繪示依照本發明第二實施方式之物料檢知裝置的架構圖。圖8所繪示的物料檢知裝置類似於圖1所繪示的物料檢知裝置，其差異在於圖8所繪示的每個第一信號補償單元16a及第二信號補償單元18a皆為獨立地凸部。當探棒12為鋼棒時，探棒12、第一信號補償單元16a及第二信號補償單元18a可以是一體成型。當探棒12為鋼索時，第一信號補償單元16a及第二信號補償單元18a可以是套設在探棒12上的環形件。在圖8中，第一信號補償單元16a的外徑相 同於第二信號補償單元18a的外徑；然在實際實施時並不以此為限。本實施方式的物位檢知裝置的其他元件的功用及相關說明，實際上與第一實施方式的物位檢知裝置相同，在此不予贅述。本實施方式的物位檢知裝置至少可以達到與第一實施方式的物位檢知裝置相同的功能。 Please refer to FIG. 8 , which is a block diagram of a material detecting device according to a second embodiment of the present invention. The material detecting device shown in FIG. 8 is similar to the material detecting device shown in FIG. 1 , and the difference is that each of the first signal compensating unit 16a and the second signal compensating unit 18a shown in FIG. 8 are independent. Ground convex. When the probe 12 is a steel rod, the probe 12, the first signal compensation unit 16a, and the second signal compensation unit 18a may be integrally formed. When the probe 12 is a steel cable, the first signal compensation unit 16a and the second signal compensation unit 18a may be ring members that are sleeved on the probe 12. In FIG. 8, the outer diameter phase of the first signal compensating unit 16a The same as the outer diameter of the second signal compensating unit 18a; however, it is not limited thereto in actual implementation. The functions and related descriptions of other elements of the level detecting device of the present embodiment are substantially the same as those of the level detecting device of the first embodiment, and will not be described herein. The level detecting device of the present embodiment can at least achieve the same function as the level detecting device of the first embodiment.
請參閱圖9，其繪示依照本發明第三實施方式之物位檢知裝置之架構圖。圖9所繪示的物料檢知裝置類似於圖8所繪示的物料檢知裝置，其差異在於圖9所繪示的相鄰的二第一信號補償單元161b間更設有連接件162b，而形成外觀為I形的扣件16b，且相鄰的二第二信號補償單元181b間更設有連接件182b，使形成外觀為I形的扣件18b。本實施方式的物位檢知裝置的其他元件的功用及相關說明，實際上與第一實施方式的物位檢知裝置相同，在此不予贅述。本實施方式的物位檢知裝置至少可以達到與第一實施方式的物位檢知裝置相同的功能。 Please refer to FIG. 9, which is a structural diagram of a level detecting device according to a third embodiment of the present invention. The material detecting device shown in FIG. 9 is similar to the material detecting device shown in FIG. 8 , and the difference is that the connecting two first signal compensating units 161 b are further provided with a connecting member 162 b between FIG. 9 . The fasteners 16b having an I-shape are formed, and the connecting members 182b are further disposed between the adjacent two second signal compensating units 181b to form a fastener 18b having an I-shape. The functions and related descriptions of other elements of the level detecting device of the present embodiment are substantially the same as those of the level detecting device of the first embodiment, and will not be described herein. The level detecting device of the present embodiment can at least achieve the same function as the level detecting device of the first embodiment.
雖然本發明已以實施方式揭露如上，然其並非用以限定本發明，任何熟習此技藝者，在不脫離本發明的精神和範圍內，當可作各種的更動與潤飾，因此本發明的保護範圍當視後附的申請專利範圍所界定者為準。 While the present invention has been disclosed in the above embodiments, it is not intended to limit the invention, and the invention may be modified and modified in various ways without departing from the spirit and scope of the invention. The scope is subject to the definition of the scope of the patent application.
10‧‧‧電氣盒 10‧‧‧Electrical box
100‧‧‧容置空間 100‧‧‧ accommodating space
102‧‧‧底端 102‧‧‧ bottom
104‧‧‧穿孔 104‧‧‧Perforation
12‧‧‧探棒 12‧‧‧ Probe
120‧‧‧第一端 120‧‧‧ first end
122‧‧‧第二端 122‧‧‧ second end
140‧‧‧電路板 140‧‧‧ boards
142‧‧‧信號處理單元 142‧‧‧Signal Processing Unit
144‧‧‧信號發射單元 144‧‧‧Signal launch unit
146‧‧‧信號接收單元 146‧‧‧Signal receiving unit
16‧‧‧第一信號補償單元 16‧‧‧First signal compensation unit
18‧‧‧第二信號補償單元 18‧‧‧Second signal compensation unit
20‧‧‧重錘 20‧‧‧heavy hammer
D‧‧‧預定方向 D‧‧‧Predetermined direction
d1‧‧‧第一間隔距離 D1‧‧‧first separation distance
d2‧‧‧第二間隔距離 D2‧‧‧Second separation distance
Claims (14)
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| TW104137854A TWI573989B (en) | 2015-11-17 | 2015-11-17 | Meterial level indicator |
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| TW104137854A TWI573989B (en) | 2015-11-17 | 2015-11-17 | Meterial level indicator |
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| TWI573989B true TWI573989B (en) | 2017-03-11 |
| TW201719123A TW201719123A (en) | 2017-06-01 |
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|---|---|---|---|---|
| US5898308A (en) * | 1997-09-26 | 1999-04-27 | Teleflex Incorporated | Time-based method and device for determining the dielectric constant of a fluid |
| US6690320B2 (en) * | 2000-06-13 | 2004-02-10 | Magnetrol International Incorporated | Time domain reflectometry measurement instrument |
| US6867729B2 (en) * | 2003-07-30 | 2005-03-15 | Magnetrol International | Guided wave radar level transmitter with automatic velocity compensation |
| US7586435B1 (en) * | 2008-05-16 | 2009-09-08 | Rosemount Tank Radar Ab | Radar level gauge system using a waveguiding structure with periodically arranged reference impedance transitions |
| CN102661773A (en) * | 2012-05-15 | 2012-09-12 | 合肥工业大学 | System and method for processing echo signal of guided wave type radar level meter |
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| US5898308A (en) * | 1997-09-26 | 1999-04-27 | Teleflex Incorporated | Time-based method and device for determining the dielectric constant of a fluid |
| US6690320B2 (en) * | 2000-06-13 | 2004-02-10 | Magnetrol International Incorporated | Time domain reflectometry measurement instrument |
| US6867729B2 (en) * | 2003-07-30 | 2005-03-15 | Magnetrol International | Guided wave radar level transmitter with automatic velocity compensation |
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| TW201719123A (en) | 2017-06-01 |
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