TWI560636B - Chip ID code automatic checking system and its method - Google Patents

Chip ID code automatic checking system and its method

Info

Publication number
TWI560636B
TWI560636B TW104131613A TW104131613A TWI560636B TW I560636 B TWI560636 B TW I560636B TW 104131613 A TW104131613 A TW 104131613A TW 104131613 A TW104131613 A TW 104131613A TW I560636 B TWI560636 B TW I560636B
Authority
TW
Taiwan
Prior art keywords
chip
checking system
automatic checking
code automatic
code
Prior art date
Application number
TW104131613A
Other languages
Chinese (zh)
Other versions
TW201712617A (en
Inventor
Hao-Chih Chiu
Original Assignee
King Yuan Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by King Yuan Electronics Co Ltd filed Critical King Yuan Electronics Co Ltd
Priority to TW104131613A priority Critical patent/TWI560636B/en
Application granted granted Critical
Publication of TWI560636B publication Critical patent/TWI560636B/en
Publication of TW201712617A publication Critical patent/TW201712617A/en

Links

Classifications

    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30—Computing systems specially adapted for manufacturing
TW104131613A 2015-09-24 2015-09-24 Chip ID code automatic checking system and its method TWI560636B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW104131613A TWI560636B (en) 2015-09-24 2015-09-24 Chip ID code automatic checking system and its method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW104131613A TWI560636B (en) 2015-09-24 2015-09-24 Chip ID code automatic checking system and its method

Publications (2)

Publication Number Publication Date
TWI560636B true TWI560636B (en) 2016-12-01
TW201712617A TW201712617A (en) 2017-04-01

Family

ID=58227184

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104131613A TWI560636B (en) 2015-09-24 2015-09-24 Chip ID code automatic checking system and its method

Country Status (1)

Country Link
TW (1) TWI560636B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109816055A (en) * 2017-11-22 2019-05-28 欣竑科技有限公司 A kind of normotopia warehousing system of micro drill
CN112415365A (en) * 2020-11-18 2021-02-26 海光信息技术股份有限公司 Chip testing method and device, electronic equipment and storage medium

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6830941B1 (en) * 2002-12-17 2004-12-14 Advanced Micro Devices, Inc. Method and apparatus for identifying individual die during failure analysis
TWI272478B (en) * 2004-03-04 2007-02-01 Taiwan Semiconductor Mfg System and method for check-in control in wafer testing
CN101364529B (en) * 2007-09-30 2010-06-02 北京华大泰思特半导体检测技术有限公司 Method for automatically downloading sequence number of integrated circuit
CN103197640A (en) * 2013-03-26 2013-07-10 江苏润达光伏科技有限公司 Intelligent management and control system and method of manufacturing technique
TW201528189A (en) * 2014-01-15 2015-07-16 Signality System Engineering Co Ltd Method of using test data for performing quality control

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6830941B1 (en) * 2002-12-17 2004-12-14 Advanced Micro Devices, Inc. Method and apparatus for identifying individual die during failure analysis
TWI272478B (en) * 2004-03-04 2007-02-01 Taiwan Semiconductor Mfg System and method for check-in control in wafer testing
CN101364529B (en) * 2007-09-30 2010-06-02 北京华大泰思特半导体检测技术有限公司 Method for automatically downloading sequence number of integrated circuit
CN103197640A (en) * 2013-03-26 2013-07-10 江苏润达光伏科技有限公司 Intelligent management and control system and method of manufacturing technique
TW201528189A (en) * 2014-01-15 2015-07-16 Signality System Engineering Co Ltd Method of using test data for performing quality control

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109816055A (en) * 2017-11-22 2019-05-28 欣竑科技有限公司 A kind of normotopia warehousing system of micro drill
CN109816055B (en) * 2017-11-22 2022-03-04 欣竑科技有限公司 Just position warehouse system of micro-drill
CN112415365A (en) * 2020-11-18 2021-02-26 海光信息技术股份有限公司 Chip testing method and device, electronic equipment and storage medium

Also Published As

Publication number Publication date
TW201712617A (en) 2017-04-01

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