TWI554078B - Scanning device - Google Patents

Scanning device Download PDF

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TWI554078B
TWI554078B TW104127653A TW104127653A TWI554078B TW I554078 B TWI554078 B TW I554078B TW 104127653 A TW104127653 A TW 104127653A TW 104127653 A TW104127653 A TW 104127653A TW I554078 B TWI554078 B TW I554078B
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light
scanning device
beam splitting
angle
quarter wave
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TW104127653A
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TW201709714A (en
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王靜慧
林穎芳
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佳世達科技股份有限公司
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Description

掃描裝置Scanning device

本發明係有關於一種掃描裝置,特別是一種可在不同模式下,調整自物體之反射光的接收角度的掃描裝置。The present invention relates to a scanning device, and more particularly to a scanning device that can adjust the angle of reception of reflected light from an object in different modes.

掃描裝置可用來建立物體三維模型,並可被應用在許多不同的範疇當中。例如動畫師可利用掃描裝置建立物體的三維模型,以減少手動繪圖的時間,又例如齒模師可利用掃描裝置取得病患牙齒的三維模型,以製作適合病患的假牙。在先前技術當中,掃描裝置可透過發射具有固定圖案的光至待掃描的物體,並根據經物體反射後的光所呈現的圖案來建立物體的三維模型。詳言之,由於物體的表面可能具有花紋或凹凸等特徵,經過待掃描物體反射後的光所呈現之圖案會與原本的固定圖案有所差異,而掃描裝置即可根據兩者的差異取得待掃描物體的特徵以建立其三維模型。Scanning devices can be used to create three-dimensional models of objects and can be applied in many different categories. For example, an animator can use a scanning device to create a three-dimensional model of an object to reduce the time for manual drawing. For example, a dental modeler can use a scanning device to obtain a three-dimensional model of a patient's teeth to make a denture suitable for a patient. In the prior art, the scanning device can transmit a three-dimensional model of the object by emitting light having a fixed pattern to the object to be scanned and according to the pattern presented by the light reflected by the object. In detail, since the surface of the object may have a pattern or a concave-convex feature, the pattern reflected by the light reflected by the object to be scanned may be different from the original fixed pattern, and the scanning device may be obtained according to the difference between the two. The features of the object are scanned to create their three-dimensional model.

由於在先前技術中,掃描裝置發射圖案及接受物體反射光的角度是固定的,因此若物體的表面細節較多時,則可能因為掃描裝置的鑑別率不足,使得掃描裝置所建立的三維模型失真。第1圖為利用掃描裝置100掃描牙齒T的情境示意圖。在第1圖中,牙齒T在A部位及B部位之間有一蛀洞C,由於蛀洞C的開口較小,因此若掃描裝置100對待測物體的鑑別率不足時,則可能會使得蛀洞C無法被清楚地辨別,甚至導致掃描裝置100所建立的三維模型失真。由於物體的表面特性不同,而先前技術之掃描裝置100卻只能以固定的鑑別率來掃描物體,因此可能會造成使用者在操作掃描裝置100時的不便。Since in the prior art, the angle at which the scanning device emits the pattern and the reflected light from the object is fixed, if the surface details of the object are large, the three-dimensional model distortion created by the scanning device may be distorted because the discrimination rate of the scanning device is insufficient. . FIG. 1 is a schematic diagram of a situation in which the tooth T is scanned by the scanning device 100. In Fig. 1, the tooth T has a cavity C between the A portion and the B portion. Since the opening of the cavity C is small, if the discrimination rate of the object to be measured by the scanning device 100 is insufficient, the cavity may be caused. C cannot be clearly discerned, and even causes distortion of the three-dimensional model established by the scanning device 100. Since the surface characteristics of the object are different, the prior art scanning device 100 can only scan the object at a fixed discrimination rate, which may cause inconvenience to the user when operating the scanning device 100.

本發明之一實施例提供一種可用以建構物體之三維模型的掃描裝置。掃描裝置可包含投影模組、取像模組及接物模組。投影模組可包含成像元件及第一分光元件。成像元件可發出投影光以投射圖案,投影光具有第一偏振方向。第一分光元件可用以使投影光穿透以成為具有第一偏振方向之第一光。接物模組可用以傳遞第一光,並包含反射元件、四分之一波片及第二分光元件。反射元件可用以反射第一光為第二光。四分之一波片可置於反射元件與物體間,其中第二光穿透四分之一波片成為第三光並入射至物體,第三光經物體反射成為第四光,第四光穿透四分之一波片成為具有第二偏振方向之第五光。第二偏振方向與第一偏振方向垂直。第二分光元件可置於反射元件及四分之一波片間,用以使第一光及第二光穿透,並反射第五光成為第六光,而第一分光元件可另用以反射第六光成為第七光。取像模組可用以接收自第一分光元件反射之第七光。One embodiment of the present invention provides a scanning device that can be used to construct a three-dimensional model of an object. The scanning device can include a projection module, an imaging module, and a docking module. The projection module can include an imaging element and a first beam splitting element. The imaging element can emit projected light to project a pattern, the projected light having a first polarization direction. The first beam splitting element can be used to penetrate the projected light to become the first light having the first polarization direction. The mating module can be used to transmit the first light and includes a reflective element, a quarter wave plate, and a second beam splitting element. The reflective element can be used to reflect the first light as the second light. The quarter wave plate can be placed between the reflective element and the object, wherein the second light penetrates the quarter wave plate into the third light and is incident on the object, and the third light is reflected by the object into the fourth light, the fourth light The quarter wave plate is penetrated into a fifth light having a second polarization direction. The second polarization direction is perpendicular to the first polarization direction. The second beam splitting element may be disposed between the reflective element and the quarter wave plate for penetrating the first light and the second light, and reflecting the fifth light to be the sixth light, and the first light splitting element may be additionally used The sixth light is reflected to become the seventh light. The image capturing module can be configured to receive the seventh light reflected from the first beam splitting element.

當掃描裝置操作於第一模式時,第二分光元件與四分之一波片具有第一夾角。當掃描裝置操作於第二模式時,第二分光元件與四分之一波片具有第二夾角,且第一夾角與第二夾角相異。The second beam splitting element has a first angle with the quarter wave plate when the scanning device is operated in the first mode. When the scanning device operates in the second mode, the second beam splitting element and the quarter wave plate have a second angle, and the first angle is different from the second angle.

本發明之另一實施例提供一種可用以建構物體之三維模型的掃描裝置。掃描裝置可包含投影模組、取像模組及接物模組。投影模組可包含成像元件及第一分光元件。成像元件可發出投影光以投射圖案,投影光具有第一偏振方向。第一分光元件可用以使投影光穿透以成為具有第一偏振方向之第一光。接物模組可用以傳遞第一光,並包含反射元件、四分之一波片及第二分光元件。反射元件可用以反射第一光為第二光。四分之一波片可置於反射元件與物體間,其中第二光穿透四分之一波片成為第三光並入射至物體,第三光經物體反射成為第四光,第四光穿透四分之一波片成為具有第二偏振方向之第五光。第二偏振方向與第一偏振方向垂直。第二分光元件可置於反射元件及四分之一波片間,用以使第一光及第二光穿透,並反射第五光成為第六光,而第一分光元件可另用以反射第六光成為第七光。取像模組可用以接收自第一分光元件反射之第七光。Another embodiment of the present invention provides a scanning device that can be used to construct a three-dimensional model of an object. The scanning device can include a projection module, an imaging module, and a docking module. The projection module can include an imaging element and a first beam splitting element. The imaging element can emit projected light to project a pattern, the projected light having a first polarization direction. The first beam splitting element can be used to penetrate the projected light to become the first light having the first polarization direction. The mating module can be used to transmit the first light and includes a reflective element, a quarter wave plate, and a second beam splitting element. The reflective element can be used to reflect the first light as the second light. The quarter wave plate can be placed between the reflective element and the object, wherein the second light penetrates the quarter wave plate into the third light and is incident on the object, and the third light is reflected by the object into the fourth light, the fourth light The quarter wave plate is penetrated into a fifth light having a second polarization direction. The second polarization direction is perpendicular to the first polarization direction. The second beam splitting element may be disposed between the reflective element and the quarter wave plate for penetrating the first light and the second light, and reflecting the fifth light to be the sixth light, and the first light splitting element may be additionally used The sixth light is reflected to become the seventh light. The image capturing module can be configured to receive the seventh light reflected from the first beam splitting element.

當掃描裝置操作於第一模式時,第一光與第六光具有第三夾角。當掃描裝置操作於第二模式時,第一光與第六光具有第四夾角,且第三夾角與第四夾角相異。The first light and the sixth light have a third angle when the scanning device operates in the first mode. When the scanning device operates in the second mode, the first light and the sixth light have a fourth angle, and the third angle is different from the fourth angle.

第2圖為本發明一實施例之掃描裝置200的示意圖。掃描裝置200包含投影模組210、取像模組220及接物模組230。投影模組210包含光源元件212、成像元件214及第一分光元件216。光源元件212可發出入射光E1,而成像元件214則可接收入射光E1並根據入射光E1發射投影光E2以投射圖案至物體O。在本發明的部分實施例中,成像元件214可透過數位微鏡裝置(Digital MicromirrorDevice, DMD)、動態光柵產生裝置或固定光柵產生裝置以投射圖案,而圖案則例如但不限於方格圖案。FIG. 2 is a schematic diagram of a scanning device 200 according to an embodiment of the present invention. The scanning device 200 includes a projection module 210, an image capturing module 220, and a docking module 230. The projection module 210 includes a light source element 212, an imaging element 214, and a first beam splitting element 216. The light source element 212 can emit incident light E1, and the imaging element 214 can receive the incident light E1 and emit the projected light E2 according to the incident light E1 to project a pattern to the object O. In some embodiments of the present invention, the imaging element 214 can transmit a pattern through a Digital Micromirror Device (DMD), a dynamic grating generating device, or a fixed grating generating device, and the pattern is, for example, but not limited to, a checkered pattern.

接物模組230包含反射元件232、四分之一波片234及第二分光元件236。在本發明之一實施例中,投影光E2具有第一偏振方向,而第一分光元件216及第二分光元件236為分光偏振片,並皆可使具有第一偏振方向的光束穿透。第一分光元件216相對水平方向傾斜45度設置,可使具有第一偏振方向之投影光E2穿透以成為第一光L1。此外,第二分光元件236係設置於反射元件232及四分之一波片234之間,因此第一光L1會穿透第二分光元件236,並繼續入射反射元件232。在本發明之一實施例中,反射元件232為反射鏡,因此反射元件232可反射第一光L1成為第二光L2。由於第二光L2亦具有第一偏振方向,因此第二光L2可穿透第二分光元件236,並可入射四分之一波片234。The module 230 includes a reflective element 232, a quarter wave plate 234, and a second beam splitter 236. In one embodiment of the present invention, the projection light E2 has a first polarization direction, and the first beam splitting element 216 and the second beam splitting element 236 are splitting polarizers, and both of the light beams having the first polarization direction can be penetrated. The first beam splitting element 216 is disposed at an angle of 45 degrees with respect to the horizontal direction, so that the projection light E2 having the first polarization direction can be penetrated to become the first light L1. In addition, the second beam splitting element 236 is disposed between the reflective element 232 and the quarter wave plate 234, so that the first light L1 will penetrate the second beam splitting element 236 and continue to be incident on the reflective element 232. In an embodiment of the invention, the reflective element 232 is a mirror, and thus the reflective element 232 can reflect the first light L1 into the second light L2. Since the second light L2 also has the first polarization direction, the second light L2 can penetrate the second beam splitting element 236 and can enter the quarter wave plate 234.

四分之一波片234係置於反射元件232與物體O之間。四分之一波片234可使第二光L2穿透成為第三光L3。在本發明之一實施例中,第一光L1是以平行四分之一波片234的方向(亦即水平方向)入射反射元件232,因此當四分之一波片234與反射元件232夾45度角時,第三光L3即會以垂直四分之一波片234的方向(亦即垂直方向)入射物體O。A quarter wave plate 234 is placed between the reflective element 232 and the object O. The quarter wave plate 234 can penetrate the second light L2 into the third light L3. In one embodiment of the invention, the first light L1 is incident on the reflective element 232 in the direction of the parallel quarter wave plate 234 (i.e., horizontally), so that when the quarter wave plate 234 is sandwiched by the reflective element 232 At a 45 degree angle, the third light L3 will incident on the object O in the direction of the vertical quarter wave plate 234 (i.e., the vertical direction).

第三光L3經物體O反射後成為第四光L4,而第四光L4可穿透四分之一波片234成為第五光L5。由於四分之一波片234會將穿透四分之一波片234之光線的偏振方向偏轉45度,因此第五光L5具有與第一偏振方向垂直的第二偏振方向。由於第五光L5具有第二偏振方向,因此第二分光元件236會反射第五光L5成為第六光L6,並將第六光L6導向第一分光元件216,而第一分光元件216即可反射第六光L6成為第七光L7,並使第七光L7入射至取像模組220。The third light L3 is reflected by the object O to become the fourth light L4, and the fourth light L4 can penetrate the quarter wave plate 234 to become the fifth light L5. Since the quarter wave plate 234 deflects the polarization direction of the light penetrating the quarter wave plate 234 by 45 degrees, the fifth light L5 has a second polarization direction perpendicular to the first polarization direction. Since the fifth light L5 has the second polarization direction, the second light splitting element 236 reflects the fifth light L5 to become the sixth light L6, and guides the sixth light L6 to the first light splitting element 216, and the first light splitting element 216 can The sixth light L6 is reflected to become the seventh light L7, and the seventh light L7 is incident on the image capturing module 220.

取像模組220接收自第一分光元件216反射之第七光L7。由於投影光E2所投射的圖案在經過物體O的反射後,會因為物體O表面的特徵而產生變形(distortion),因此藉由判斷第七光L7所呈現圖案與原圖案的差異,即能夠建構物體O的三維模型。The image capturing module 220 receives the seventh light L7 reflected from the first beam splitting element 216. Since the pattern projected by the projection light E2 is reflected by the object O, distortion may occur due to the feature of the surface of the object O. Therefore, it can be constructed by judging the difference between the pattern represented by the seventh light L7 and the original pattern. A three-dimensional model of the object O.

第3圖及第4圖分別說明使用掃描裝置200掃描物體O1及O2的情境圖。在第3圖中,掃描裝置200在掃描物體O1的部位P1至P2時,會發出第三光L3 P1及L3 P2至部位P1及P2,並分別接收物體O1於部位P1及P2上的反射光,即第四光L4 P1及L4 P2。第四光L4 P1及L4 P2經過四分之一波片234之後成為第五光L5 P1及L5 P2。而第五光L5 P1及L5 P2在經過第二分光元件236反射後則成為第六光L6 P1及L6 P2,第六光L6 P1及L6 P2經第一分光元件216反射之後成為第七光L7 P1及L7 P2,第七光L7 P1及L7 P2即會入射取像模組220並形成成像點I P1及I P23 and 4 respectively illustrate a scenario in which the objects O1 and O2 are scanned using the scanning device 200. In FIG. 3, when scanning the portions P1 to P2 of the object O1, the scanning device 200 emits the third light L3 P1 and L3 P2 to the portions P1 and P2, and respectively receives the reflected light of the object O1 on the portions P1 and P2. , that is, the fourth light L4 P1 and L4 P2 . The fourth lights L4 P1 and L4 P2 pass through the quarter wave plate 234 and become the fifth lights L5 P1 and L5 P2 . On the other hand, the fifth lights L5 P1 and L5 P2 become the sixth lights L6 P1 and L6 P2 after being reflected by the second beam splitting element 236, and the sixth lights L6 P1 and L6 P2 are reflected by the first beam splitting element 216 to become the seventh light L7. P1 and L7 P2 , and the seventh light L7 P1 and L7 P2 are incident on the image capturing module 220 and form imaging points I P1 and I P2 .

在第3圖中,掃描裝置200是操作在第一模式,此時,反射元件232與第二分光元件236之間的夾角為θ A,而第二分光元件236與四分之一波片234之間的夾角為θ B。在此實施例中,反射元件232與四分之一波片234之間的角度為45度,根據幾何光學可以得知第六光L6 P1與第一光L1間的夾角θ C(亦即第六光L6 P1與水平方向的夾角)實質上會等於2θ A,而第7光L7 P1入射取像模組220的夾角θ D亦會等於2θ A。同樣的,第六光L6 P2與第一光L1之間的夾角實質上會等於2θ A,而第7光L7 P2入射取像模組220的夾角則亦會等於2θ AIn FIG. 3, the scanning device 200 is operated in the first mode, at which time the angle between the reflective element 232 and the second beam splitting element 236 is θ A , and the second beam splitting element 236 and the quarter wave plate 234 The angle between them is θ B . In this embodiment, the angle between the reflective element 232 and the quarter-wave plate 234 is 45 degrees, and the angle θ C between the sixth light L6 P1 and the first light L1 can be known according to geometrical optics (ie, The angle between the six light L6 P1 and the horizontal direction is substantially equal to 2θ A , and the angle θ D of the seventh light L7 P1 incident image capturing module 220 is also equal to 2θ A . Similarly, the angle between the sixth light L6 P2 and the first light L1 is substantially equal to 2θ A , and the angle of the seventh light L7 P2 incident to the image capturing module 220 is also equal to 2θ A .

在此實施例中,第三光L3 P1及L3 P2間的距離為d1,經第二分光元件236反射後的第六光L6 P1及L6 P2間的距離以及經第一分光元件216反射後的第七光L7 P1及L7 P2之間的距離亦皆為d1,而取像模組220上形成之成像點I P1及I P2之間的距離d2則可表示為(d1/cosθ D)或(d1/cos2θ A)。申言之,當第二分光元件236與反射元件232之間的夾角θ A越大時,亦即當第二分光元件236與四分之一波片234之間的夾角θ B越小時,取像模組220上所形成之成像點I P1及I P2之間的距離d2會隨著增加,進而提升掃描裝置200的鑑別率。 In this embodiment, the distance between the third light L3 P1 and L3 P2 is d1, the distance between the sixth light L6 P1 and L6 P2 reflected by the second beam splitting element 236, and the reflection by the first beam splitting element 216. The distance between the seventh light L7 P1 and L7 P2 is also d1, and the distance d2 between the imaging points I P1 and I P2 formed on the image capturing module 220 can be expressed as (d1/cos θ D ) or ( D1/cos2θ A ). In other words, when the angle θ A between the second beam splitting element 236 and the reflecting element 232 is larger, that is, when the angle θ B between the second beam splitting element 236 and the quarter wave plate 234 is smaller, The distance d2 between the imaging points I P1 and I P2 formed on the module 220 increases, which in turn increases the discrimination rate of the scanning device 200.

在第4圖中,掃描裝置200是以第二模式掃描物體O2的部位P1’至P2’。當掃描裝置200操作於第二模式時,反射元件232與第二分光元件236之間的夾角θ A’會大於掃描裝置200操作於第一模式時反射元件232與第二分光元件236之間的夾角θ A。由於在第3圖及第4圖中,反射元件232與四分之一波片234之間的夾角係維持不變,因此在第4圖中第二分光元件236與四分之一波片234之間的夾角θ B’會小於第3圖中第二分光元件236與四分之一波片234之間的夾角θ B,在第4圖中第六光L6 P1與第一光L1間的夾角θ C’會大於第3圖中第六光L6 P1與第一光L1間的夾角θ C,而在第4圖中第7光L7 P1入射取像模組220的夾角θ D’會大於第3圖中第7光L7 P1入射取像模組220的夾角θ D,如此一來,雖然在第3及第4圖中,第三光L3 P1及L3 P2間的距離皆為d1,然而在第4圖中取像模組220上所形成之成像點I P1’及I P2’之間的距離d2’會大於在第3圖中取像模組220上所形成之成像點I P1及I P2之間的距離d2。申言之,在第二模式下,掃描裝置200能夠呈現物體O2之部位P1至P2間的更多細節,因此使用者可根據物體的表面特徵,切換掃描裝置200的操作模式以選擇適當的鑑別率。 In Fig. 4, the scanning device 200 scans the portions P1' to P2' of the object O2 in the second mode. When the scanning device 200 is operated in the second mode, the angle θ A′ between the reflective element 232 and the second beam splitting element 236 may be greater than the angle between the reflective element 232 and the second beam splitting element 236 when the scanning device 200 operates in the first mode. Angle θ A . Since the angle between the reflective element 232 and the quarter-wave plate 234 remains unchanged in FIGS. 3 and 4, the second beam splitting element 236 and the quarter-wave plate 234 are shown in FIG. The angle θ B ' between the second light splitting element 236 and the quarter wave plate 234 in FIG. 3 is smaller than the angle θ B between the sixth light L6 P1 and the first light L1 in FIG. The angle θ C′ is greater than the angle θ C between the sixth light L6 P1 and the first light L1 in FIG. 3 , and the angle θ D′ of the seventh light L7 P1 incident image capturing module 220 in FIG. 4 is greater than In Fig. 3, the seventh light L7 P1 is incident on the image capturing module 220 by an angle θ D . Thus, in the third and fourth figures, the distance between the third light L3 P1 and L3 P2 is d1. The distance d2' between the imaging points I P1 ′ and I P2 ′ formed on the imaging module 220 in FIG. 4 is greater than the imaging point I P1 formed on the imaging module 220 in FIG. 3 and The distance d2 between I P2 . In other words, in the second mode, the scanning device 200 can present more details between the parts P1 to P2 of the object O2, so that the user can switch the operation mode of the scanning device 200 according to the surface features of the object to select an appropriate identification. rate.

在第2圖的實施例中,為使掃描裝置200在不同模式下,入射第二分光元件236之第一光L1與自第二分光元件236反射之第六光L6間的夾角具有不同的大小,接物模組230還會包含調整機構238。在反射元件232及四分之一波片234的位置不變的情況下,調整機構238可改變第二分光元件236之分光偏振片與反射元件232之反射鏡間的夾角θ A,同時也會改變第二分光元件236之分光偏振片與四分之一波片234之間的夾角θ B,藉此改變第一光L1與第六光L6間的夾角θ C以及第七光L7入射取像模組220的角度θ D。如此一來,掃描裝置200即可在不同的模式下,透過調整機構238來調整入射第二分光元件236之第一光L1與自第二分光元件236反射之第六光L6間的夾角,而使用者便可根據物體O的表面特性,調整掃描裝置200的鑑別率。 In the embodiment of FIG. 2, in order to make the scanning device 200 in different modes, the angle between the first light L1 incident on the second beam splitting element 236 and the sixth light L6 reflected from the second beam splitting element 236 has a different size. The docking module 230 also includes an adjustment mechanism 238. In the case where the positions of the reflective element 232 and the quarter wave plate 234 are unchanged, the adjustment mechanism 238 can change the angle θ A between the split polarizer of the second splitter element 236 and the mirror of the reflective element 232, and Changing the angle θ B between the spectral polarizing plate of the second beam splitting element 236 and the quarter wave plate 234, thereby changing the angle θ C between the first light L1 and the sixth light L6 and the incident image of the seventh light L7 The angle θ D of the module 220. In this way, the scanning device 200 can adjust the angle between the first light L1 incident on the second beam splitting element 236 and the sixth light L6 reflected from the second beam splitting element 236 through the adjusting mechanism 238 in different modes. The user can adjust the discrimination rate of the scanning device 200 according to the surface characteristics of the object O.

第5圖為利用本發明另一實施例之掃描裝置300掃描物體O1的示意圖,掃描裝置300可包含投影模組210、取像模組220及接物模組330。接物模組330包含反射元件232、四分之一波片234、第二分光元件236及調整機構338。掃描裝置300與掃描裝置200的操作原理相似,然而為了方便將投影光E2投射位於各種不同環境的物體,例如但不限於病患口腔中的牙齒,在一較佳實施例中,可將掃描裝置300的接物模組330設置在形狀狹長的延伸機構340之一端,而投影模組210及取像模組220則可設置在握把機構350中,延伸機構340與握把機構350可組合成完整的手持機構,以方便使用者手持操作。FIG. 5 is a schematic diagram of scanning an object O1 by using a scanning device 300 according to another embodiment of the present invention. The scanning device 300 can include a projection module 210, an image capturing module 220, and a docking module 330. The mating module 330 includes a reflective element 232, a quarter wave plate 234, a second beam splitter 236, and an adjustment mechanism 338. The scanning device 300 is similar in operation to the scanning device 200. However, in order to facilitate projecting the projection light E2 to objects in various environments, such as but not limited to teeth in the patient's mouth, in a preferred embodiment, the scanning device can be The extension module 330 of the 300 is disposed at one end of the elongated extension mechanism 340, and the projection module 210 and the imaging module 220 are disposed in the grip mechanism 350, and the extension mechanism 340 and the grip mechanism 350 can be combined into a complete The hand-held mechanism is convenient for the user to operate.

此外,為了避免第六光L6在通過延伸機構340時,入射到延伸機構340的內壁導致取像模組220無法接收到來自物體O1的反射光,掃描裝置300還可包含鏡頭360。鏡頭360可包含第一端360A、第二端360B及透鏡360C。鏡頭360的第一端360A可延伸自投影模組210且鄰近第一分光元件216,而鏡頭360的第二端360B則與第一端360A相對,且延伸機構340可套住鏡頭360使得接物模組330可與鏡頭360之第二端360B相鄰接。透鏡360C可設置於第二端360B,用以接收自第二分光元件236反射的第六光L6,並可用以調整第六光L6的行進方向,以確保第六光L6在鏡頭360的傳遞過程中不會入射到延伸機構340及鏡頭360的內壁。In addition, in order to prevent the sixth light L6 from entering the inner wall of the extension mechanism 340 when passing through the extension mechanism 340, the image capturing module 220 cannot receive the reflected light from the object O1, and the scanning device 300 may further include the lens 360. Lens 360 can include a first end 360A, a second end 360B, and a lens 360C. The first end 360A of the lens 360 can extend from the projection module 210 and adjacent to the first beam splitting element 216, while the second end 360B of the lens 360 is opposite to the first end 360A, and the extending mechanism 340 can cover the lens 360 so that the object is attached. The module 330 can be adjacent to the second end 360B of the lens 360. The lens 360C can be disposed at the second end 360B for receiving the sixth light L6 reflected from the second beam splitting element 236, and can be used to adjust the traveling direction of the sixth light L6 to ensure the transfer process of the sixth light L6 in the lens 360. It does not enter the extension mechanism 340 and the inner wall of the lens 360.

在第5圖中,調整機構338包含固定螺絲338A、滑槽338B及轉軸338C。第6圖為調整機構338的外觀示意圖。固定螺絲338A設置於第二分光元件236之一端,滑槽338B則設置於延伸機構340上,且固定螺絲338A突出於滑槽338B。轉軸338C設置於反射元件232與第二分光元件236的相連處。如此一來,使用者即可在延伸機構340的外側撥動固定螺絲338A,以使固定螺絲338A在滑槽338B內移動。由於反射元件232與第二分光元件236之間是透過轉軸338C相連,因此當固定螺絲338A在滑槽338B內移動時,反射元件232與第二分光元件236之間的夾角θ A也會隨著被改變。 In Fig. 5, the adjustment mechanism 338 includes a fixing screw 338A, a chute 338B, and a rotating shaft 338C. FIG. 6 is a schematic view showing the appearance of the adjustment mechanism 338. The fixing screw 338A is disposed at one end of the second beam splitting member 236, the sliding slot 338B is disposed on the extending mechanism 340, and the fixing screw 338A protrudes from the sliding slot 338B. The rotating shaft 338C is disposed at a junction of the reflective element 232 and the second beam splitting element 236. In this way, the user can move the fixing screw 338A on the outside of the extension mechanism 340 to move the fixing screw 338A in the sliding groove 338B. Since the reflective element 232 and the second beam splitter 236 are connected through the rotating shaft 338C, when the fixing screw 338A moves in the sliding groove 338B, the angle θ A between the reflective element 232 and the second beam splitting element 236 also follows. Was changed.

在第5圖中,掃描裝置300是操作在第一模式下來掃描物體O1。第7圖則是將掃描裝置300操作在第二模式下來掃描物體O2的示意圖。由於物體O2的表面具有較多的細節,如蛀洞,因此掃描裝置300需要以較高的鑑別率來建立其立體模型。在第7圖中,使用者可透過撥動調整機構338之固定螺絲338A來調整反射元件232與第二分光元件236間之角度,藉此切換掃描裝置300的操作模式。由於第7圖中的固定螺絲338A較第5圖中的固定螺絲338A來得更接近四分之一波片234,因此在第7圖中反射元件232與第二分光元件236間的角度θ A’會大於在第5圖中反射元件232與第二分光元件236間的角度θ A,而在第7圖中第二分光元件236與四分之一波片234之間的角度θ B’則會小於在第5圖中第二分光元件236與四分之一波片234之間的角度θ B,因此在第7圖中入射第二分光元件236之第一光L1與自第二分光元件反射236之第六光L6間的夾角θ C’會大於在第5圖中第一光L1及第六光L6之間的角度θ C,而在第7圖中第七光L7入射取像模組220的角度會也會大於在第5圖中第七光L7入射取像模組220的角度。如此一來,取像模組220即可取得物體O2表面上更多的細節,而掃描裝置300的鑑別率即可提升。 In Fig. 5, the scanning device 300 is operated to scan the object O1 in the first mode. Figure 7 is a schematic diagram of scanning the object O2 by operating the scanning device 300 in the second mode. Since the surface of the object O2 has more details, such as cavities, the scanning device 300 needs to establish its stereo model with a higher discrimination rate. In FIG. 7, the user can adjust the angle between the reflective element 232 and the second beam splitter 236 by the set screw 338A of the adjustment mechanism 338, thereby switching the operation mode of the scanning device 300. Since the fixing screw 338A in Fig. 7 is closer to the quarter wave plate 234 than the fixing screw 338A in Fig. 5, the angle θ A' between the reflecting member 232 and the second beam splitting member 236 in Fig. 7 It will be larger than the angle θ A between the reflective element 232 and the second splitting element 236 in Fig. 5, and the angle θ B' between the second splitting element 236 and the quarter wave plate 234 in Fig. 7 will It is smaller than the angle θ B between the second beam splitting element 236 and the quarter wave plate 234 in Fig. 5, and thus the first light L1 incident on the second beam splitting element 236 and reflected from the second beam splitting element in Fig. 7 the angle θ C 236 between the sixth light L6 'may be greater than the angle θ C between the first light L1 and the sixth light L6 in FIG. 5, while in FIG. 7 of the seventh L7 incident light camera module The angle of 220 will also be greater than the angle at which the seventh light L7 is incident on the image capturing module 220 in FIG. In this way, the image capturing module 220 can obtain more details on the surface of the object O2, and the discrimination rate of the scanning device 300 can be improved.

綜上所述,使用者可透過調整機構238或338來調整入射第二分光元件之第一光L1與自第二分光元件反射之第六光L6間的夾角,以切換掃描裝置200或300在不同模式,進而調整掃描裝置200或300的鑑別率。如此即可避免先前技術當中,使用者無法根據物體表面特性的不同調整掃描裝置之鑑別率,造成無法準確建立物體之三維模型的問題。In summary, the user can adjust the angle between the first light L1 incident on the second beam splitting element and the sixth light L6 reflected from the second beam splitting element through the adjusting mechanism 238 or 338 to switch the scanning device 200 or 300. Different modes further adjust the discrimination rate of the scanning device 200 or 300. In this way, in the prior art, the user cannot adjust the discrimination rate of the scanning device according to the surface characteristics of the object, thereby causing the problem that the three-dimensional model of the object cannot be accurately established.

第8圖為本發明另一實施例之掃描裝置400的示意圖。掃描裝置400與掃描裝置300的差別在於掃描裝置400之接物模組430中包含除了包含反射元件232、四分之一波片234、第二分光元件236及調整機構338之外,還包含調整機構438。第9圖為調整機構438的外觀示意圖。調整機構438的一端連接於反射元件232,而另一端則突出於延伸機構340。在一實施例中,調整機構438可為調整螺絲。使用者藉由改變調整螺絲拴入延伸機構340的深淺,即可改變反射元件232與第二分光元件236之間的距離,進而調整反射元件232與第二分光元件236之間的角度。FIG. 8 is a schematic diagram of a scanning device 400 according to another embodiment of the present invention. The scanning device 400 differs from the scanning device 300 in that the interface module 430 of the scanning device 400 includes an adjustment in addition to the reflective component 232, the quarter wave plate 234, the second beam splitting component 236, and the adjusting mechanism 338. Agency 438. FIG. 9 is a schematic view showing the appearance of the adjustment mechanism 438. One end of the adjustment mechanism 438 is coupled to the reflective element 232 while the other end projects from the extension mechanism 340. In an embodiment, the adjustment mechanism 438 can be an adjustment screw. The user can change the distance between the reflective element 232 and the second beam splitting element 236 by changing the depth of the extension screw 340 by changing the adjusting screw, thereby adjusting the angle between the reflective element 232 and the second beam splitting element 236.

第10圖為掃描裝置400的另一示意圖。在第10圖中,由於使用者將調整螺絲進一步拴入延伸機構340當中,因此在第10圖中反射元件232與第二分光元件236之間的距離會比在第8圖中反射元件232與第二分光元件236之間的距離來得小。亦即,在第8圖中,反射元件232與第二分光元件236之間的夾角θ A會比在第10圖中反射元件232與第二分光元件236之間的夾角θ A’還大。 FIG. 10 is another schematic diagram of the scanning device 400. In Fig. 10, since the user further inserts the adjusting screw into the extending mechanism 340, the distance between the reflecting member 232 and the second beam splitting member 236 in Fig. 10 is higher than that in the reflecting member 232 in Fig. 8. The distance between the second beam splitting elements 236 is small. That is, in Fig. 8, the angle θ A between the reflective element 232 and the second beam splitting element 236 is larger than the angle θ A ' between the reflective element 232 and the second beam splitting element 236 in Fig. 10.

如此一來,使用者即可透過調整機構338及438調整掃描裝置400之反射元件232與第二分光元件236之間的夾角。此外,當利用調整機構438來調整反射元件232與第二分光元件236之間的夾角時,也會同時改變反射元件232與四分之一波片236之間的夾角,進而改變光線入射四分之一波片236的角度。因此使用者亦可根據實際需求,選擇適當的方式操作調整機構338及438,以配合掃描物體的需求。In this way, the user can adjust the angle between the reflective element 232 of the scanning device 400 and the second beam splitting element 236 through the adjusting mechanisms 338 and 438. In addition, when the adjustment mechanism 438 is used to adjust the angle between the reflective element 232 and the second beam splitting element 236, the angle between the reflective element 232 and the quarter-wave plate 236 is also changed, thereby changing the incident angle of the light. The angle of one of the wave plates 236. Therefore, the user can select the adjustment mechanism 338 and 438 in an appropriate manner according to actual needs to meet the needs of scanning objects.

第11圖為本發明另一實施例之掃描裝置500掃描物體O1的情境示意圖。掃描裝置500可包含投影模組210、取像模組220、接物模組530、延伸機構540、握把機構550及鏡頭560。接物模組530包含反射元件232、四分之一波片234及第二分光元件236。鏡頭560包含第一端560A、第二端560B及透鏡560C。鏡頭560的第一端560A可延伸自投影模組210且鄰近第一分光元件216,而鏡頭560的第二端560B則與第一端560A相對,透鏡360C可設置於第二端360B。掃描裝置500與掃描裝置300的操作原理相似,差別在於掃描裝置500之接物模組530並未包含調整機構338,然而接物模組530係為可拆卸地連接至鏡頭560,例如延伸機構540可為與鏡頭560(或握把機構550)自由拆卸或組裝的機構。由於接物模組530可自鏡頭560上拆卸,使用者利用掃描裝置500掃描不同的物體時,可根據物體表面的特徵,選擇適合的接物模組並組裝在鏡頭560上。FIG. 11 is a schematic diagram showing a situation in which the scanning device 500 scans the object O1 according to another embodiment of the present invention. The scanning device 500 can include a projection module 210, an image capturing module 220, a docking module 530, an extension mechanism 540, a grip mechanism 550, and a lens 560. The module 530 includes a reflective element 232, a quarter wave plate 234, and a second beam splitter 236. Lens 560 includes a first end 560A, a second end 560B, and a lens 560C. The first end 560A of the lens 560 can extend from the projection module 210 and adjacent to the first beam splitting element 216, while the second end 560B of the lens 560 is opposite to the first end 560A, and the lens 360C can be disposed at the second end 360B. The operation principle of the scanning device 500 is similar to that of the scanning device 300. The difference is that the interface module 530 of the scanning device 500 does not include the adjustment mechanism 338. However, the interface module 530 is detachably coupled to the lens 560, such as the extension mechanism 540. It can be a mechanism that is free to be disassembled or assembled with the lens 560 (or the grip mechanism 550). Since the docking module 530 can be detached from the lens 560, when the user scans different objects by using the scanning device 500, a suitable docking module can be selected and assembled on the lens 560 according to the characteristics of the surface of the object.

第12圖為掃描裝置500掃描另一物體O2的情境圖。在第11圖中,由於物體O1的表面較為平滑,因此掃描裝置500無須以高鑑別率來建立其立體模型,此時掃描裝置500可操作於第一模式,亦即使用者將接物模組530連接至鏡頭560,使得掃描裝置500較低的鑑別率來掃描物體O1,而入射第二分光元件236之第一光L1與自第二分光元件236反射之第六光L6會具有角度較小的夾角θ C。然而在第12圖中,當利用掃描裝置500掃描物體O2時,由於物體O2的表面具有較多細節而較為粗糙,此時使用者可將延伸機構540自鏡頭560拆卸下來,並將延伸機構540’連接至鏡頭560,使得掃描裝置500操作於第二模式,此時入射第二分光元件236之第一光L1與自第二分光元件236反射之第六光L6會具有角度較大的夾角θ C’(亦即夾角θ C’大於夾角θ C),進而提升掃描裝置500的鑑別率。 Fig. 12 is a diagram showing the scanning device 500 scanning another object O2. In Fig. 11, since the surface of the object O1 is relatively smooth, the scanning device 500 does not need to establish its stereo model with a high discrimination rate. At this time, the scanning device 500 can operate in the first mode, that is, the user can connect the module. The 530 is coupled to the lens 560 such that the scanning device 500 has a lower discrimination rate to scan the object O1, and the first light L1 incident on the second beam splitting element 236 and the sixth light L6 reflected from the second beam splitting element 236 have a smaller angle. The angle θ C . However, in FIG. 12, when the object O2 is scanned by the scanning device 500, since the surface of the object O2 has more detail and is rough, the user can detach the extension mechanism 540 from the lens 560 and the extension mechanism 540. 'Connected to the lens 560, so that the scanning device 500 operates in the second mode, when the first light L1 incident on the second beam splitting element 236 and the sixth light L6 reflected from the second beam splitting element 236 have a larger angle θ C' (ie, the angle θ C' is greater than the angle θ C ), thereby increasing the discrimination rate of the scanning device 500.

如此一來,使用者即可根據物體表面的特徵,將適合的接物模組連接至鏡頭560以調整掃描裝置500的鑑別率。因此透過掃描裝置500即可避免先前技術當中,因為無法依物體表面特性的不同調整鑑別率,而無法準確建立物體之三維模型的問題。In this way, the user can connect a suitable docking module to the lens 560 according to the characteristics of the surface of the object to adjust the discrimination rate of the scanning device 500. Therefore, the prior art can be avoided by the scanning device 500, because the discrimination rate cannot be adjusted depending on the surface characteristics of the object, and the problem of the three-dimensional model of the object cannot be accurately established.

此外,雖然上述實施例中的反射元件232為反射鏡,而第二分光元件236為分光偏振片,然而在實作上,若欲使每個接物模組中,其反射鏡及分光偏振片之間都具有相同角度,則可能會增加製程的複雜度,並使得良率較低,因此在本發明的其他實施例中,亦透過稜鏡來實作反射元件及第二分光元件。In addition, although the reflective element 232 in the above embodiment is a mirror and the second splitting element 236 is a splitting polarizer, in practice, if each of the mating modules is to be used, the mirror and the spectroscopic polarizer are Having the same angle between them may increase the complexity of the process and result in a lower yield. Therefore, in other embodiments of the present invention, the reflective element and the second beam splitting element are also realized by the crucible.

第13圖為本發明另一實施例之掃描裝置600的示意圖。掃描裝置600包含投影模組210、取像模組220、接物模組630、延伸機構540、握把機構550及鏡頭560。接物模組630包含反射元件632、四分之一波片634及第二分光元件636。掃描裝置600與掃描裝置500的操作原理相似,差別在於接物模組630另包含第一稜鏡638A及第二稜鏡638B。第一稜鏡638A包含第一面M1及第二面M2,第二稜鏡638B包含第三面M3及第四面M4。第一稜鏡638A的第一面M1與四分之一波片634重疊,而第一稜鏡638A的第二面M2可塗覆分光偏振層以形成第二分光元件636。第二稜鏡638B連接於第一稜鏡628A,第二稜鏡638B的第三面M3可塗覆全反射鍍膜層以形成反射元件632,而第二稜鏡638B的第四面M4則重疊於第一稜鏡638A的第二面M2。Figure 13 is a schematic illustration of a scanning device 600 in accordance with another embodiment of the present invention. The scanning device 600 includes a projection module 210, an image capturing module 220, a docking module 630, an extending mechanism 540, a grip mechanism 550, and a lens 560. The module 630 includes a reflective element 632, a quarter wave plate 634, and a second beam splitting element 636. The scanning device 600 is similar in operation to the scanning device 500, except that the receiving module 630 further includes a first weir 638A and a second weir 638B. The first side 638A includes a first side M1 and a second side M2, and the second side 638B includes a third side M3 and a fourth side M4. The first face M1 of the first turn 638A overlaps the quarter wave plate 634, and the second face M2 of the first turn 638A may be coated with a split polarization layer to form the second splitter element 636. The second turn 638B is connected to the first turn 628A, the third face M3 of the second turn 638B may be coated with a total reflection coating layer to form the reflective element 632, and the fourth face M4 of the second turn 638B is overlapped The second side M2 of the first 稜鏡 638A.

此外,第一稜鏡638A更包含中繼面M5,中繼面M5連接第一面M1及第二面M2,而第一光L1即可依序穿透中繼面M5,再入射第二面M2、第四面M4及第三面M3,而第一光L1經第三面M3反射所產生之第二光L2即可垂直入射第一面M1。由於掃描裝置600的接物模組630可利用稜鏡來實作反射元件及第二分光元件,因此反射元件及第二分光元件間的夾角可直接由稜鏡的夾角直接決定,而無須再做調整,進而可提升製造掃描裝置600的良率。In addition, the first 稜鏡 638A further includes a relay surface M5, and the relay surface M5 is connected to the first surface M1 and the second surface M2, and the first light L1 can sequentially penetrate the relay surface M5 and then enter the second surface. M2, the fourth surface M4 and the third surface M3, and the second light L2 generated by the first light L1 being reflected by the third surface M3 can be perpendicularly incident on the first surface M1. Since the interface module 630 of the scanning device 600 can use the cymbal to implement the reflective element and the second beam splitting element, the angle between the reflective element and the second beam splitting element can be directly determined by the angle of the cymbal, and no need to be performed. Adjustments, in turn, can increase the yield of the manufacturing scanning device 600.

此外,根據折射定律,當第六光L6穿出第一稜鏡638A之中繼面M5(光密介質)至空氣(光疏介質)時,穿出中繼面M5後的第六光L6與第一光L1之間的角度還會被提升,亦即在第13圖中,入射中繼面M5之第六光L6與第一光L1之間的夾角θ C會小於穿出中繼面M5之第六光L6與第一光L1之間的夾角θ C’。如此一來,利用改變入射第二分光元件236之第一光L1與自第二分光元件236反射之第六光L6間的角度以調整掃描裝置600之鑑別率的效果將會更加顯著。 Further, according to the law of refraction, when the sixth light L6 passes through the relay surface M5 (light-tight medium) of the first crucible 638A to the air (light-diffusing medium), the sixth light L6 that passes through the relay surface M5 and The angle between the first light L1 is also raised, that is, in FIG. 13, the angle θ C between the sixth light L6 of the incident relay surface M5 and the first light L1 is smaller than the exiting relay surface M5. The angle θ C' between the sixth light L6 and the first light L1. As such, the effect of adjusting the discrimination between the first light L1 incident on the second beam splitting element 236 and the sixth light L6 reflected from the second beam splitting element 236 to adjust the discrimination rate of the scanning device 600 will be more remarkable.

綜上所述,透過本發明之實施例所提供的掃描裝置,使用者即可根據物體表面的特性,調整掃描裝置的鑑別率,因此可避免先前技術當中,因為物體表面特性的不同,而無法準確建立物體之三維模型的問題。In summary, according to the scanning device provided by the embodiment of the present invention, the user can adjust the discrimination rate of the scanning device according to the characteristics of the surface of the object, thereby avoiding the prior art, because the surface characteristics of the object are different, Accurately establish the problem of the 3D model of the object.

以上所述僅為本發明之較佳實施例,凡依本發明申請專利範圍所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。The above are only the preferred embodiments of the present invention, and all changes and modifications made to the scope of the present invention should be within the scope of the present invention.

100、200、300、400、500、600‧‧‧掃描裝置
T‧‧‧牙齒
A、B‧‧‧牙齒之部位
C‧‧‧蛀洞
210‧‧‧投影模組
220‧‧‧取像模組
230、330、430、530、530’、630‧‧‧接物模組
340、540、540’‧‧‧延伸機構
350、550‧‧‧握把機構
360、560‧‧‧鏡頭
212‧‧‧光源元件
214‧‧‧成像元件
216‧‧‧第一分光元件
232、232’、632‧‧‧反射元件
234、234’、634‧‧‧四分之一波片
236、236’、636‧‧‧第二分光元件
238、338、438‧‧‧調整機構
338A‧‧‧固定螺絲
338B‧‧‧滑槽
338C‧‧‧轉軸
638A、638B‧‧‧稜鏡
360A、560A‧‧‧鏡頭之第一端
360B、560B‧‧‧鏡頭之第二端
360C、560C‧‧‧透鏡
M1‧‧‧第一面
M2‧‧‧第二面
M3‧‧‧第三面
M4‧‧‧第四面
M5‧‧‧中繼面
O、O1、O2‧‧‧物體
P1、P2、P1’、P2’‧‧‧物體之部位
IP1、IP2、IP1’、IP2’‧‧‧成像點
d1、d2、d2’‧‧‧距離
E1‧‧‧入射光
E2‧‧‧投影光
L1‧‧‧第一光
L2‧‧‧第二光
L3、L3P1、L3P2‧‧‧第三光
L4、L4P1、L4P2‧‧‧第四光
L5、L5P1、L5P2‧‧‧第五光
L6、L6P1、L6P2‧‧‧第六光
L7、L7P1、L7P2‧‧‧第七光
θA、θB、θA’、θB’、θC、θC’、θD、θD’‧‧‧夾角
100, 200, 300, 400, 500, 600‧‧‧ scanning devices
T‧‧‧ teeth
A, B‧‧‧ parts of the teeth
C‧‧‧ hole
210‧‧‧Projection Module
220‧‧‧Image capture module
230, 330, 430, 530, 530', 630‧‧‧ Socket modules
340, 540, 540' ‧ ‧ extension agencies
350, 550‧‧ ‧ grip mechanism
360, 560‧ ‧ lens
212‧‧‧Light source components
214‧‧‧ imaging components
216‧‧‧First beam splitter
232, 232', 632‧‧‧ reflective elements
234, 234', 634‧‧‧ quarter wave plate
236, 236', 636‧‧‧ second beam splitter
238, 338, 438 ‧ ‧ adjustment agencies
338A‧‧‧ fixing screws
338B‧‧ ‧ chute
338C‧‧‧ shaft
638A, 638B‧‧‧稜鏡
360A, 560A‧‧‧ the first end of the lens
360B, 560B‧‧‧ second end of the lens
360C, 560C‧‧ lens
M1‧‧‧ first side
M2‧‧‧ second side
M3‧‧‧ third side
M4‧‧‧ fourth side
M5‧‧‧ Relay surface
O, O1, O2‧‧‧ objects
P1, P2, P1', P2'‧‧‧ parts of the object
I P1 , I P2 , I P1 ', I P2 '‧‧‧ imaging points
D1, d2, d2'‧‧‧ distance
E1‧‧‧ incident light
E2‧‧‧projection light
L1‧‧‧First light
L2‧‧‧second light
L3, L3 P1 , L3 P2 ‧‧‧ Third light
L4, L4 P1 , L4 P2 ‧‧‧fourth light
L5, L5 P1 , L5 P2 ‧‧‧ Fifth Light
L6, L6 P1 , L6 P2 ‧‧‧ sixth light
L7, L7 P1 , L7 P2 ‧‧‧ seventh light θ A , θ B , θ A′ , θ B′ , θ C , θ C′ , θ D , θ D′ ‧‧‧ angle

第1圖為利用先前技術之掃描裝置掃描牙齒的情境示意圖。 第2圖為本發明一實施例之掃描裝置的示意圖。 第3圖為利用第2圖的掃描裝置掃描一物體的情境示意圖。 第4圖為利用第2圖的掃描裝置掃描另一物體的情境示意圖。 第5圖為利用本發明另一實施例之掃描裝置掃描一物體的示意圖。 第6圖為第5圖的掃描裝置之調整機構的示意圖。 第7圖為利用第5圖的掃描裝置掃描另一物體的情境示意圖。 第8圖為利用本發明另一實施例之掃描裝置掃描一物體的示意圖。 第9圖為第8圖的掃描裝置之調整機構的示意圖。 第10圖為利用第8圖的掃描裝置掃描另一物體的情境示意圖。 第11圖為利用本發明另一實施例之掃描裝置掃描一物體的示意圖。 第12圖為利用第11圖之掃描裝置掃描另一物體的情境示意圖。 第13圖為本發明另一實施例之掃描裝置的示意圖。Figure 1 is a schematic illustration of the context of scanning a tooth using a prior art scanning device. Fig. 2 is a schematic view showing a scanning device according to an embodiment of the present invention. Figure 3 is a schematic diagram of a situation in which an object is scanned using the scanning device of Figure 2. Fig. 4 is a schematic diagram showing the situation in which another object is scanned by the scanning device of Fig. 2. Fig. 5 is a schematic view showing an object scanned by a scanning device according to another embodiment of the present invention. Fig. 6 is a schematic view showing an adjustment mechanism of the scanning device of Fig. 5. Fig. 7 is a schematic diagram showing the situation in which another object is scanned by the scanning device of Fig. 5. Figure 8 is a schematic view of an object scanned by a scanning device according to another embodiment of the present invention. Fig. 9 is a schematic view showing an adjustment mechanism of the scanning device of Fig. 8. Fig. 10 is a schematic diagram showing the situation in which another object is scanned by the scanning device of Fig. 8. Figure 11 is a schematic view of an object scanned by a scanning device according to another embodiment of the present invention. Fig. 12 is a schematic diagram showing the situation in which another object is scanned by the scanning device of Fig. 11. Figure 13 is a schematic view of a scanning device according to another embodiment of the present invention.

300‧‧‧掃描裝置 300‧‧‧ scanning device

210‧‧‧投影模組 210‧‧‧Projection Module

220‧‧‧取像模組 220‧‧‧Image capture module

330‧‧‧接物模組 330‧‧‧Access module

340‧‧‧延伸機構 340‧‧‧Extension agencies

350‧‧‧握把機構 350‧‧‧ grip mechanism

360‧‧‧鏡頭 360‧‧‧ lens

212‧‧‧光源元件 212‧‧‧Light source components

214‧‧‧成像元件 214‧‧‧ imaging components

216‧‧‧第一分光元件 216‧‧‧First beam splitter

232‧‧‧反射元件 232‧‧‧reflecting elements

234‧‧‧四分之一波片 234‧‧‧ Quarter wave plate

236‧‧‧第二分光元件 236‧‧‧Second beam splitter

338‧‧‧調整機構 338‧‧‧Adjustment agency

338A‧‧‧固定螺絲 338A‧‧‧ fixing screws

338B‧‧‧滑槽 338B‧‧ ‧ chute

338C‧‧‧轉軸 338C‧‧‧ shaft

360A‧‧‧鏡頭之第一端 360A‧‧‧ the first end of the lens

360B‧‧‧鏡頭之第二端 360B‧‧‧ the second end of the lens

360C‧‧‧透鏡 360C‧‧ lens

O1‧‧‧物體 O1‧‧‧ objects

E1‧‧‧入射光 E1‧‧‧ incident light

E2‧‧‧投影光 E2‧‧‧projection light

L1‧‧‧第一光 L1‧‧‧First light

L2‧‧‧第二光 L2‧‧‧second light

L3‧‧‧第三光 L3‧‧‧ Third Light

L4‧‧‧第四光 L4‧‧‧fourth light

L5‧‧‧第五光 L5‧‧‧ Fifth Light

L6‧‧‧第六光 L6‧‧‧6th light

L7‧‧‧第七光 L7‧‧‧ seventh light

θA、θB、θC‧‧‧夾角 θ A , θ B , θ C ‧‧‧ angle

Claims (12)

一種掃描裝置,用來建構一物體的三維模型,包含: 一投影模組,包含: 一成像元件,發出一投影光以投射一圖案,該投影光具有一第一偏振方向;及 一第一分光元件,用以使該投影光穿透以成為具有該第一偏振方向之一第一光; 一接物模組,用以傳遞該第一光,包含: 一反射元件,用以反射該第一光為一第二光; 一四分之一波片,置於該反射元件與該物體間,其中該第二光穿透該四分之一波片成為一第三光並入射至該物體,該第三光經該物體反射成為一第四光,該第四光穿透該四分之一波片成為具有一第二偏振方向之一第五光,該第二偏振方向與該第一偏振方向垂直;及 一第二分光元件,置於該反射元件及該四分之一波片間,用以使該第一光及該第二光穿透,並反射該第五光成為一第六光,而該第一分光元件另用以反射該第六光成為一第七光;及 一取像模組,用以接收自該第一分光元件反射之該第七光; 其中當該掃描裝置操作於一第一模式時,該第二分光元件與該四分之一波片具有一第一夾角,及當該掃描裝置操作於一第二模式時,該第二分光元件與該四分之一波片具有一第二夾角,且該第一夾角與該第二夾角相異。A scanning device for constructing a three-dimensional model of an object, comprising: a projection module, comprising: an imaging component, emitting a projection light to project a pattern, the projection light having a first polarization direction; and a first beam splitting An element for penetrating the projection light to become the first light having the first polarization direction; a substrate module for transmitting the first light, comprising: a reflective element for reflecting the first light The light is a second light; a quarter wave plate is disposed between the reflective element and the object, wherein the second light penetrates the quarter wave plate into a third light and is incident on the object, The third light is reflected by the object into a fourth light, and the fourth light penetrates the quarter wave plate into a fifth light having a second polarization direction, the second polarization direction and the first polarization The direction is vertical; and a second beam splitting element is disposed between the reflective element and the quarter wave plate for penetrating the first light and the second light, and reflecting the fifth light to become a sixth Light, and the first beam splitting element is further configured to reflect the sixth light to become a seventh And the image capturing module is configured to receive the seventh light reflected from the first beam splitting component; wherein the second beam splitting component and the quarter wave are when the scanning device operates in a first mode The sheet has a first angle, and when the scanning device is operated in a second mode, the second beam splitting element has a second angle with the quarter wave plate, and the first angle is opposite to the second angle different. 如請求項1所述之掃描裝置,其中該第一分光元件係為一分光偏振片。The scanning device of claim 1, wherein the first beam splitting element is a beam splitting polarizer. 如請求項1所述之掃描裝置,其中該成像元件係透過一數位微鏡裝置(Digital Micromirror Device, DMD)、一動態光柵產生裝置或一固定光柵產生裝置以投射該圖案。The scanning device according to claim 1, wherein the imaging element is transmitted through a digital micromirror device (DMD), a dynamic grating generating device or a fixed grating generating device to project the pattern. 如請求項1所述之掃描裝置,其中該第二分光元件係為一分光偏振片,該反射元件係為一反射鏡。The scanning device of claim 1, wherein the second beam splitting element is a beam splitting polarizer, and the reflecting element is a mirror. 如請求項4所述之掃描裝置,其中該接物模組包含一調整機構,用以調整該分光偏振片與該反射鏡間的一夾角。The scanning device of claim 4, wherein the receiving module comprises an adjusting mechanism for adjusting an angle between the spectral polarizing plate and the reflecting mirror. 如請求項1所述之掃描裝置,另包含: 一鏡頭,包含: 一第一端,係延伸自該投影模組且鄰近該第一分光元件;及 一第二端,係相對該第一端。The scanning device of claim 1, further comprising: a lens comprising: a first end extending from the projection module adjacent to the first beam splitting element; and a second end opposite to the first end . 如請求項6所述之掃描裝置,其中該接物模組係鄰接該第二端。The scanning device of claim 6, wherein the docking module is adjacent to the second end. 如請求項7所述之掃描裝置,其中該接物模組係可拆卸地連接該鏡頭。The scanning device of claim 7, wherein the receiving module is detachably coupled to the lens. 如請求項7所述之掃描裝置,其中該接物模組另包含: 一第一稜鏡,包含: 一第一面,係與該四分之一波片重疊;及 一第二面,係塗覆一分光偏振層以形成該第二分光元件;及 一第二稜鏡,連接該第一稜鏡,包含: 一第三面,係塗覆一全反射鍍膜層以形成該反射元件;及 一第四面,重疊該第二面。The scanning device of claim 7, wherein the object module further comprises: a first frame comprising: a first surface overlapping the quarter wave plate; and a second surface Coating a light-polarizing layer to form the second beam-splitting element; and a second layer connecting the first layer, comprising: a third surface coated with a total reflection coating layer to form the reflective element; a fourth side that overlaps the second side. 如請求項9所述之掃描裝置,其中該第一稜鏡更包含一中繼面,該中繼面連接該第一面及該第二面,該第一光穿透中繼面再入射該第三面,且該第二光垂直入射該第一面。The scanning device of claim 9, wherein the first device further comprises a relay surface, the relay surface is connected to the first surface and the second surface, and the first light penetrates the relay surface and is incident on the first surface a third side, and the second light is incident perpendicular to the first side. 如請求項1所述之掃描裝置,其中該四分之一波片與該反射元件夾45度角。The scanning device of claim 1, wherein the quarter wave plate is at a 45 degree angle to the reflective element. 一種掃描裝置,用來建構一物體的三維模型,包含: 一投影模組,包含: 一成像元件,發出一投影光以投射一圖案,該投影光具有一第一偏振方向;及 一第一分光元件,用以使該投影光穿透以成為具有該第一偏振方向之一第一光; 一接物模組,用以傳遞該第一光,包含: 一反射元件,用以反射該第一光為一第二光; 一四分之一波片,置於該反射元件與該物體間,其中該第二光穿透該四分之一波片成為一第三光並入射至該物體,該第三光經該物體反射成為一第四光,該第四光穿透該四分之一波片成為具有一第二偏振方向之一第五光,該第二偏振方向與該第一偏振方向垂直;及 一第二分光元件,置於該反射元件及該四分之一波片間,用以使該第一光及該第二光穿透,並反射該第五光成為一第六光,而該第一分光元件另用以反射該第六光成為一第七光;及 一取像模組,用以接收自該第一分光元件反射之該第七光; 其中當該掃描裝置操作於一第一模式時,該第一光與該第六光具有一第三夾角,及當該掃描裝置操作於一第二模式時,該第一光與該第六光具有一第四夾角,且該第三夾角與該第四夾角相異。A scanning device for constructing a three-dimensional model of an object, comprising: a projection module, comprising: an imaging component, emitting a projection light to project a pattern, the projection light having a first polarization direction; and a first beam splitting An element for penetrating the projection light to become the first light having the first polarization direction; a substrate module for transmitting the first light, comprising: a reflective element for reflecting the first light The light is a second light; a quarter wave plate is disposed between the reflective element and the object, wherein the second light penetrates the quarter wave plate into a third light and is incident on the object, The third light is reflected by the object into a fourth light, and the fourth light penetrates the quarter wave plate into a fifth light having a second polarization direction, the second polarization direction and the first polarization The direction is vertical; and a second beam splitting element is disposed between the reflective element and the quarter wave plate for penetrating the first light and the second light, and reflecting the fifth light to become a sixth Light, and the first beam splitting element is further configured to reflect the sixth light to become a seventh And the image capturing module is configured to receive the seventh light reflected from the first beam splitting component; wherein when the scanning device operates in a first mode, the first light and the sixth light have a first The third angle, and when the scanning device operates in a second mode, the first light and the sixth light have a fourth angle, and the third angle is different from the fourth angle.
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