TWI548936B - Photoresist composition, photoresist pattern formation method - Google Patents

Photoresist composition, photoresist pattern formation method Download PDF

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TWI548936B
TWI548936B TW101146393A TW101146393A TWI548936B TW I548936 B TWI548936 B TW I548936B TW 101146393 A TW101146393 A TW 101146393A TW 101146393 A TW101146393 A TW 101146393A TW I548936 B TWI548936 B TW I548936B
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TW201339746A (en
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Shinji Kumada
Toshikazu Takayama
Naoki Yamashita
Fumitake Hirayama
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Tokyo Ohka Kogyo Co Ltd
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光阻組成物,光阻圖型之形成方法 Photoresist composition, method for forming photoresist pattern

本發明為有關光阻組成物、使用該光阻組成物之光阻圖型之形成方法。 The present invention relates to a photoresist composition and a method for forming a photoresist pattern using the photoresist composition.

微影蝕刻技術,例如,於基板上形成由光阻材料所形成之光阻膜,對該光阻膜,介由形成特定圖型之遮罩,以光、電子線等輻射線進行選擇性曝光、顯影處理之方式,而於前述光阻膜上形成特定形狀之光阻圖型等步驟之方式進行。 a lithography technique, for example, forming a photoresist film formed of a photoresist material on a substrate, and selectively exposing the photoresist film to a mask of a specific pattern by using radiation such as light or electron lines And a method of developing treatment, and performing a step of forming a photoresist pattern of a specific shape on the photoresist film.

曝光部份變化為對顯影液具有溶解性之特性的光阻材料稱為正型、曝光部份變化為對顯影液不具有溶解性之特性的光阻材料稱為負型。 A photoresist material whose refractive portion is changed to have solubility characteristics to a developing solution is referred to as a positive type, and a photoresist material whose exposed portion is changed to have no solubility property to a developing solution is referred to as a negative type.

近年來,於半導體元件或液晶顯示元件之製造中,伴隨微影蝕刻技術之進步,而使圖型急速地邁向微細化。 In recent years, in the manufacture of semiconductor elements or liquid crystal display elements, with the advancement of the lithography technique, the pattern has been rapidly refining.

微細化之方法,一般為使曝光光源予以短波長化(高能量化)之方式進行。具體而言,以往為使用以g線、i線為代表之紫外線,但目前則開始使用KrF準分子雷射,或ArF準分子雷射等進行半導體元件之量產。又,對於較該些準分子雷射為更短波長(高能量)之電子線、EUV(極紫外線)或X線等亦已開始進行研究。 The method of miniaturization is generally performed in such a manner that the exposure light source is shortened (high energy). Specifically, ultraviolet rays typified by g-line and i-line have been used in the past, but currently, mass production of semiconductor elements has been started using KrF excimer lasers or ArF excimer lasers. Further, studies have been started on electron beams, EUV (extreme ultraviolet rays) or X-rays which are shorter wavelengths (high energy) than these excimer lasers.

光阻材料中,則尋求對於該些曝光光源之感度、可重現微細尺寸之圖型的解析性等微影蝕刻特性。 Among the photoresist materials, lithographic etching characteristics such as the sensitivity of the exposure light sources and the resolution of the pattern of the reproducible fine size are sought.

可滿足該些要求之光阻材料,一般為使用含有經由酸之作用而對顯影液之溶解性產生變化之基材成份,與經由曝光而產生酸之酸產生劑成份之化學增幅型光阻組成物。 A photoresist material which satisfies these requirements is generally composed of a chemically amplified photoresist which contains a substrate component which changes the solubility of the developer by the action of an acid, and an acid generator component which generates an acid by exposure. Things.

例如,上述顯影液為鹼顯影液(鹼顯影製程)之情形,正型之化學增幅型光阻組成物,一般為使用含有經由酸之作用而增大對鹼顯影液之溶解性的樹脂成份(基礎樹脂),與酸產生劑成份者。使用該光阻組成物所形成之光阻膜,於光阻圖型形成中進行選擇性曝光時,於曝光部中,酸產生劑成份會產生酸,經由該酸之作用,而使樹脂成份增大對鹼顯影液之溶解性,使曝光部形成對於鹼顯影液為可溶性。又,未曝光部則以圖型之方式殘留,而形成正型圖型。其中,前述基礎樹脂係採用經由酸之作用而可提高樹脂之極性者,故於增大對鹼顯影液之溶解性的同時,會降低對有機溶劑之溶解性。因此,不僅鹼顯影製程,於使用於含有有機溶劑之顯影液(有機系顯影液)之製程(以下,亦稱為溶劑顯影製程,或負型顯影製程)時,曝光部中,會相對地降低對有機系顯影液之溶解性,故於該溶劑顯影製程中,光阻膜之未曝光部被有機系顯影液溶解、去除,曝光部則以圖型方式殘留,形成負型之光阻圖型。例如,專利文獻1中,則有提出負型顯影之製程。 For example, in the case where the developing solution is an alkali developing solution (alkali developing process), a positive type chemically amplified resist composition generally uses a resin component containing an increase in solubility to an alkali developing solution by an action of an acid ( Base resin), with the acid generator component. When the photoresist film formed by the photoresist composition is selectively exposed in the formation of a photoresist pattern, an acid generator component generates an acid in the exposed portion, and the resin component is increased by the action of the acid. The solubility of the large alkali developer is such that the exposed portion is soluble in the alkali developer. Further, the unexposed portion remains as a pattern to form a positive pattern. Among them, since the base resin can increase the polarity of the resin by the action of an acid, the solubility in the alkali developer is increased, and the solubility in the organic solvent is lowered. Therefore, not only the alkali developing process, but also the process of using a developing solution (organic developing solution) containing an organic solvent (hereinafter, also referred to as a solvent developing process or a negative developing process), the exposure portion is relatively lowered. In the solvent development process, the unexposed portion of the photoresist film is dissolved and removed by the organic developer, and the exposed portion remains in a pattern to form a negative photoresist pattern. . For example, in Patent Document 1, there is a process of proposing negative development.

目前,ArF準分子雷射微影蝕刻等中,所使用之光阻組成物的基礎樹脂,就於193nm附近具有優良透明性等觀點,一般為使用主鏈具有(甲基)丙烯酸酯(meta) acrylic acid ester)所衍生之結構單位的樹脂(丙烯酸(Acryl)系樹脂)等(例如,參考專利文獻2)。 At present, in the ArF excimer laser lithography etching, the base resin of the photoresist composition used has excellent transparency in the vicinity of 193 nm, and generally has a (meth) acrylate (meta) in the main chain. Acrylic acid ester) A resin (Acryl resin) of a structural unit derived therefrom (for example, refer to Patent Document 2).

近年來,伴隨所要求之具有0.15微米以下之高解析性的光阻圖型,故除需改善上述微影蝕刻特性等以外,對於顯影後所產生之浮渣(殘渣)之改善也將具有更迫切性。 In recent years, with the required high-resolution photoresist pattern of 0.15 μm or less, it is necessary to improve the scum (residue) generated after development in addition to the above-mentioned lithography etching characteristics. Urgency.

近年來,於半導體元件或液晶顯示元件、MEMS(Micro Electro Mechanical Systems)等之製造中,常於支撐體表面形成雜質擴散層。雜質擴散層之形成,通常為分為雜質之導入與擴散等二階段進行,導入之方法之一,例如使磷或硼等雜質於真空中離子化,以高電界加速打入支撐體表面之離子植入(implantation)製程。 In recent years, in the production of semiconductor elements, liquid crystal display elements, MEMS (Micro Electro Mechanical Systems), etc., an impurity diffusion layer is often formed on the surface of a support. The formation of the impurity diffusion layer is usually carried out in two stages, such as introduction and diffusion of impurities, and one of the methods of introduction is, for example, ionization of impurities such as phosphorus or boron in a vacuum, and acceleration of ions entering the surface of the support at a high electric frequency. Implantation process.

使用化學增幅型光阻組成物於支撐體上所形成之光阻圖型,被廣泛地利用於對支撐體(基板)進行蝕刻時之遮罩使用,最近,光阻圖型於上述離子植入製程中,於將雜質離子選擇性地植入支撐體表面時,亦被作為打入時之遮罩使用。 A photoresist pattern formed on a support using a chemically amplified photoresist composition is widely used for masking when etching a support (substrate). Recently, a photoresist pattern is used for the above ion implantation. In the process, when the impurity ions are selectively implanted on the surface of the support, they are also used as a mask for the driving.

離子植入製程所使用之組成物,已揭示有含有經由酸解離性基之解離而形成鹼可溶性的酸解離性基的(甲基)丙烯酸酯樹脂,與酸產生劑,與含有作為酸擴散抑制劑的胺之離子植入用感輻射線性樹脂(酚醛清漆樹脂)組成物(專利文獻3)。 The composition used in the ion implantation process has revealed a (meth) acrylate resin containing an acid-dissociable group which is dissociated by an acid dissociable group, and an acid generator, and contains as an acid diffusion inhibiting agent. A composition of a radiation-sensitive linear resin (novolac resin) for ion ion implantation of an amine (Patent Document 3).

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]特開2009-025707號公報 [Patent Document 1] JP-A-2009-025707

[專利文獻2]特開2003-241385號公報 [Patent Document 2] JP-A-2003-241385

[專利文獻3]特開2010-276624號公報 [Patent Document 3] JP-A-2010-276624

今後,於微影蝕刻技術更為進步、光阻圖型更邁向微細化之過程中,光阻材料中,則期待各種微影蝕刻特性之提升,或浮渣之降低等。 In the future, as the lithography process progresses and the photoresist pattern becomes more refined, in the photoresist material, improvement of various lithography etching characteristics or reduction of scum is expected.

又,於上述離子植入用途中,為防止抗反射膜而遮蔽離子等理由,於形成光阻圖型之支撐體上並不能形成抗反射膜。又因沒有抗反射膜,故使用以往之化學增幅型光阻組成物進行離子植入製程之際,光阻組成物對於基板等支撐體之密著性將不充分,而會造成光阻組成物容易剝離等問題。特別是使用具有(甲基)丙烯酸酯所衍生之結構單位的基礎樹脂之情形,因該基礎樹脂與基板之密著性較低,故該基礎樹脂於主要使用ArF準分子雷射等作為曝光光源的微影蝕刻中,其問題將特別顯著。另一方面,專利文獻3所記載之組成物,就微影蝕刻特性之觀點,仍有改良之空間。 Further, in the ion implantation application described above, in order to prevent the antireflection film from being blocked, the antireflection film cannot be formed on the support of the photoresist pattern. Since there is no anti-reflection film, when the conventional chemical amplification type photoresist composition is used for the ion implantation process, the adhesion of the photoresist composition to the support such as the substrate is insufficient, and the photoresist composition is caused. Easy to peel off and other issues. In particular, in the case of using a base resin having a structural unit derived from (meth) acrylate, since the base resin has low adhesion to the substrate, the base resin mainly uses an ArF excimer laser or the like as an exposure light source. The problem of lithography etching will be particularly significant. On the other hand, in the composition described in Patent Document 3, there is still room for improvement in terms of the lithographic etching characteristics.

本發明即為鑑於上述情事所提出者,而以提供一種具有優良微影蝕刻特性及密著性、降低浮渣之光阻組成物,及使用該光阻組成物之光阻圖型之形成方法為目的。 The present invention has been made in view of the above circumstances, and provides a photoresist composition having excellent lithography etching properties and adhesion, reducing scum, and a method for forming a photoresist pattern using the photoresist composition. for purpose.

為解決上述之課題,本發明為採用以下之構成內容。 In order to solve the above problems, the present invention adopts the following constitution.

即,本發明之第一態樣為,一種光阻組成物,其特徵為,含有經由酸之作用而對顯影液之溶解性產生變化之基材成份(A)、經由曝光而產生酸之酸產生劑成份(B)、具有下述通式(c0)所表示之結構單位(c0)的高分子化合物(C),及含有由下述通式(d1)所表示之化合物(D1)、下述通式(d2)所表示之化合物(D2)及下述通式(d3)所表示之化合物(D3)所成之群所選出之1個以上之化合物的光反應型抑制劑(D), [式中,R表示氫原子、碳數1~5之烷基或碳數1~5之鹵化烷基、R1為具有1個以上之一級或二級之醇性羥基,或鏈狀之三級醇性經基有機基]。 That is, the first aspect of the present invention is a photoresist composition characterized by comprising a substrate component (A) which changes the solubility of a developing solution by an action of an acid, and an acid which generates an acid by exposure. a polymer component (B), a polymer compound (C) having a structural unit (c0) represented by the following formula (c0), and a compound (D1) represented by the following formula (d1), a photoreactive inhibitor (D) of one or more selected from the group consisting of the compound (D2) represented by the formula (d2) and the compound (D3) represented by the following formula (d3), Wherein R represents a hydrogen atom, an alkyl group having 1 to 5 carbon atoms or a halogenated alkyl group having 1 to 5 carbon atoms; and R 1 is an alcoholic hydroxyl group having one or more of the first or second order, or a chain of three Alkyl alcoholic organic group].

[式中,R3為可具有取代基之烴基,Z2c為可具有取代基之碳數1~30之烴基(但,S為鄰接之碳上未被氟原子所取代者),R4為有機基,Y3為直鏈狀、支鏈狀或環狀之伸烷基或伸芳基,Rf0為烴基,Z+為各自獨立之鋶或錪陽離子]。 Wherein R 3 is a hydrocarbon group which may have a substituent, and Z 2c is a hydrocarbon group having 1 to 30 carbon atoms which may have a substituent (however, S is a carbon atom which is not substituted by a fluorine atom), and R 4 is The organic group, Y 3 is a linear, branched or cyclic alkyl or aryl group, Rf 0 is a hydrocarbon group, and Z + is a separate ruthenium or osmium cation.

本發明之第二態樣為,一種光阻圖型之形成方法,其特徵為包含,使用前述第一態樣之光阻組成物於支撐體上形成光阻膜之步驟、使前述光阻膜曝光之步驟,及使前述光阻膜顯影,以形成光阻圖型之步驟。 A second aspect of the present invention is a method for forming a photoresist pattern, comprising the step of forming a photoresist film on a support using the photoresist composition of the first aspect, and forming the photoresist film a step of exposing, and a step of developing the photoresist film to form a photoresist pattern.

本說明書及本申請專利範圍中,「脂肪族」對於芳香族為相對之概念,定義為不具有芳香族性之基、化合物等之意義之物。 In the present specification and the scope of the present patent application, "aliphatic" is a relative concept of aromatics, and is defined as a substance having no aromatic group or a compound.

「烷基」,於無特別限定時,為包含直鏈狀、支鏈狀及環狀之1價飽和烴基者。烷氧基中之烷基亦為相同之內容。 The "alkyl group" is a linear monovalent, branched or cyclic monovalent saturated hydrocarbon group unless otherwise specified. The alkyl group in the alkoxy group is also the same.

「伸烷基」,於無特別限定時,為包含直鏈狀、支鏈狀及環狀之2價飽和烴基者。 The "alkylene group" is a linear, branched, and cyclic divalent saturated hydrocarbon group unless otherwise specified.

「鹵化烷基」為,烷基之氫原子的一部份或全部被鹵素原子所取代之基,該鹵素原子,例如,氟原子、氯原子、溴原子、碘原子等。 The "halogenated alkyl group" is a group in which a part or all of a hydrogen atom of an alkyl group is substituted by a halogen atom, for example, a fluorine atom, a chlorine atom, a bromine atom, an iodine atom or the like.

「氟化烷基」或「氟化伸烷基」,係指烷基或伸烷基之氫原子的一部份或全部被氟原子所取代之基。 "Fluorinated alkyl group" or "fluorinated alkyl group" means a group in which a part or all of a hydrogen atom of an alkyl group or an alkyl group is substituted by a fluorine atom.

「結構單位」為具有,構成高分子化合物(樹脂、聚合物、共聚物)之單體單位(monomerunit)之意義。 The "structural unit" has the meaning of a monomer unit constituting a polymer compound (resin, polymer, copolymer).

「丙烯酸酯」為,丙烯酸(CH2=CH-COOH)之羧基末端的氫原子被有機基所取代之化合物。 The "acrylate" is a compound in which a hydrogen atom at the carboxyl terminal of acrylic acid (CH 2 =CH-COOH) is substituted with an organic group.

「丙烯酸酯所衍生之結構單位」為具有,丙烯酸酯之乙烯性雙鍵經開裂所構成之結構單位之意。 The "structural unit derived from acrylate" is intended to have a structural unit composed of cleavage of an ethylenic double bond of acrylate.

本說明書中,α位之碳原子所鍵結之氫原子被取代基所取代之丙烯酸、丙烯酸酯,亦分別稱為α取代丙烯酸、α取代丙烯酸酯。又,包括丙烯酸與α取代丙烯酸,亦稱為「(α取代)丙烯酸」,包括丙烯酸與α取代丙烯酸酯亦稱為「(α取代)丙烯酸酯」。 In the present specification, acrylic acid or acrylate which is substituted by a substituent with a hydrogen atom bonded to a carbon atom at the α-position is also referred to as an α-substituted acrylic acid or an α-substituted acrylate, respectively. Further, it includes acrylic acid and α-substituted acrylic acid, which is also referred to as "(α-substituted) acrylic acid, and includes acrylic acid and α-substituted acrylate, also referred to as "(α-substituted) acrylate".

α取代丙烯酸或其酯之α位的碳原子所鍵結之取代基,例如,鹵素原子、碳數1~5之烷基、碳數1~5之鹵化烷基、羥烷基等。又,丙烯酸酯所衍生之結構單位之α位(α位之碳原子),於無特別限定時,係指羰基所鍵結之碳原子之意。 The substituent in which the carbon atom at the α-position of the α-substituted acrylic acid or its ester is bonded, for example, a halogen atom, an alkyl group having 1 to 5 carbon atoms, a halogenated alkyl group having 1 to 5 carbon atoms, or a hydroxyalkyl group. Further, the α-position (the carbon atom at the α-position) of the structural unit derived from the acrylate is not particularly limited, and means the carbon atom to which the carbonyl group is bonded.

作為前述α位之取代基的鹵素原子,例如,氟原子、氯原子、溴原子、碘原子等。 The halogen atom as a substituent of the above-mentioned α-position is, for example, a fluorine atom, a chlorine atom, a bromine atom, an iodine atom or the like.

作為前述α位之取代基的碳數1~5之烷基,具體而言,例如,甲基、乙基、丙基、異丙基、n-丁基、異丁基、tert-丁基、戊基、異戊基、新戊基等直鏈狀或支鏈狀之烷基等。 The alkyl group having 1 to 5 carbon atoms as the substituent of the above α position, specifically, for example, a methyl group, an ethyl group, a propyl group, an isopropyl group, an n-butyl group, an isobutyl group, a tert-butyl group, A linear or branched alkyl group such as a pentyl group, an isopentyl group or a neopentyl group.

作為前述α位之取代基的碳數1~5之鹵化烷基,具體而言,例如,上述之碳數1~5之烷基中之氫原子的一部份或全部被鹵素原子所取代之基等。該鹵素原子,例如,氟原子、氯原子、溴原子、碘原子等,特別是以氟原子為佳。 The halogenated alkyl group having 1 to 5 carbon atoms as the substituent of the α-position, specifically, for example, a part or all of the hydrogen atom in the above-mentioned alkyl group having 1 to 5 carbon atoms is substituted by a halogen atom. Base. The halogen atom is, for example, a fluorine atom, a chlorine atom, a bromine atom, an iodine atom or the like, and particularly preferably a fluorine atom.

作為前述α位之取代基的羥烷基,以碳數1~5之羥烷基為佳,具體而言,例如,上述之碳數1~5之烷基中之氫原子的一部份或全部被羥基所取代之基等。 The hydroxyalkyl group as the substituent of the above α position is preferably a hydroxyalkyl group having 1 to 5 carbon atoms, specifically, for example, a part of a hydrogen atom in the above alkyl group having 1 to 5 carbon atoms or All of the groups substituted by a hydroxyl group and the like.

本發明中,鍵結於(α取代)丙烯酸或其酯之α位的碳原子者,例如以氫原子、碳數1~5之烷基或碳數1~5之鹵化烷基為佳,以氫原子、碳數1~5之烷基或碳數1~5之氟化烷基為較佳,就工業上取得之容易性等觀點,以氫原子或甲基為最佳。 In the present invention, the carbon atom bonded to the α-position of (α-substituted) acrylic acid or an ester thereof is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms or a halogenated alkyl group having 1 to 5 carbon atoms. A hydrogen atom, an alkyl group having 1 to 5 carbon atoms or a fluorinated alkyl group having 1 to 5 carbon atoms is preferred, and a hydrogen atom or a methyl group is preferred from the viewpoint of industrial easiness.

「有機基」為包含碳原子之基,其亦可具有碳原子以外之原子(例如,氫原子、氧原子、氮原子、硫原子、鹵素原子(氟原子、氯原子等)等)。 The "organic group" is a group containing a carbon atom, and may have an atom other than a carbon atom (for example, a hydrogen atom, an oxygen atom, a nitrogen atom, a sulfur atom, a halogen atom (a fluorine atom, a chlorine atom, etc.)).

(α取代)丙烯酸酯所具有之有機基,並未有特別之限定,例如,芳香族基、極性變換基、後述之酸分解性基等特性基、結構中含有該些特性基之含有特性基之基等。 The organic group of the (α-substituted) acrylate is not particularly limited, and examples thereof include a functional group such as an aromatic group, a polar group, and an acid-decomposable group described later, and a characteristic group having a characteristic group in the structure. Base and so on.

「曝光」為包含輻射線之全面照射之概念。 "Exposure" is the concept of full illumination containing radiation.

依本發明之內容,為提供一種具有優良微影蝕刻特性及密著性、降低浮渣之光阻組成物,及使用該光阻組成物 之光阻圖型之形成方法。 According to the present invention, in order to provide a photoresist composition having excellent lithography etching characteristics and adhesion, reducing scum, and using the photoresist composition The formation method of the photoresist pattern.

[發明之實施形態] [Embodiment of the Invention] ≪光阻組成物≫ ≪ photoresist composition ≫

本發明之第一態樣的光阻組成物為含有,經由酸之作用而對顯影液之溶解性產生變化之基材成份(A)(以下,亦稱為「(A)成份」)、經由曝光而產生酸之酸產生劑成份(B)(以下,亦稱為「(B)成份」)、高分子化合物(C)(以下,亦稱為「(C)成份」),及光反應型抑制劑(D)(以下,亦稱為「(D)成份」)。 The photoresist composition of the first aspect of the present invention contains a substrate component (A) (hereinafter also referred to as "(A) component)) which changes the solubility of the developer by the action of an acid. An acid generator component (B) (hereinafter, also referred to as "(B) component)), a polymer compound (C) (hereinafter also referred to as "(C) component)), and a photoreactive type Inhibitor (D) (hereinafter also referred to as "(D) ingredient").

使用該光阻組成物所形成之光阻膜,於光阻圖型形成中進行選擇性曝光時,(B)成份會產生酸,該酸會使(A)成份對顯影液之溶解性產生變化。其結果,於該光阻膜之曝光部對顯影液之溶解性產生變化的同時,未曝光部仍為對顯影液之溶解性未有變化下,對該光阻膜顯影時,該光阻組成物為正型之情形為曝光部將被溶解去除,而形成正型之光阻圖型,該光阻組成物為負型之情形時,未曝光部將被溶解去除,而形成負型之光阻圖型。 When the photoresist film formed by the photoresist composition is used for selective exposure in the formation of a photoresist pattern, the component (B) generates an acid which changes the solubility of the component (A) to the developer. . As a result, the solubility of the developer in the exposed portion of the photoresist film is changed, and the unexposed portion is still not changed in the solubility of the developer. When the photoresist is developed, the photoresist is composed. When the object is positive, the exposed portion will be dissolved and removed to form a positive photoresist pattern. When the photoresist composition is negative, the unexposed portion will be dissolved and removed to form a negative light. Resistance pattern.

本說明書中,曝光部被溶解去除,而形成正型光阻圖型之光阻組成物稱為正型光阻組成物,未曝光部被溶解去除,而形成負型光阻圖型之光阻組成物稱為負型光阻組成物。本發明之光阻組成物,可為正型光阻組成物亦可、負型光阻組成物亦可。又,本發明之光阻組成物,於使用於光阻圖型之形成時,可作為使用鹼顯影液進行顯影處理之 鹼顯影製程用亦可、於該顯影處理時使用於含有有機溶劑之顯影液(有機系顯影液)之溶劑顯影製程用亦可。較佳者為,鹼顯影製程中,為形成正型光阻圖型所使用者,該情形中,(A)成份為使用經由酸之作用而增大對鹼顯影液之溶解性的成份。 In the present specification, the exposed portion is dissolved and removed, and the photoresist composition forming the positive resist pattern is referred to as a positive resist composition, and the unexposed portion is dissolved and removed to form a negative resist pattern resist. The composition is referred to as a negative photoresist composition. The photoresist composition of the present invention may be a positive photoresist composition or a negative photoresist composition. Moreover, the photoresist composition of the present invention can be used as a development process using an alkali developer when used in the formation of a photoresist pattern. The alkali developing process may be used in a solvent developing process for developing a developing solution (organic developing solution) containing an organic solvent in the developing process. Preferably, in the alkali developing process, a user who forms a positive resist pattern is used. In this case, the component (A) is a component which increases the solubility to the alkali developing solution by the action of an acid.

<(A)成份> <(A) ingredient>

(A)成份,通常可單獨使用1種作為化學增幅型光阻用之基材成份的有機化合物,或將2種以上混合使用皆可。 (A) As the component, an organic compound which is a substrate component for a chemically amplified photoresist may be used alone or in combination of two or more.

其中,「基材成份」係指,具有膜形成能之有機化合物,較佳為使用分子量為500以上之有機化合物。該有機化合物之分子量為500以上時,可提高膜形成能,又,容易形成奈米程度之光阻圖型。 Here, the "substrate component" means an organic compound having a film forming ability, and an organic compound having a molecular weight of 500 or more is preferably used. When the molecular weight of the organic compound is 500 or more, the film formation energy can be improved, and a photoresist pattern of a nanometer level can be easily formed.

作為前述基材成份使用之「分子量為500以上之有機化合物」,可大致區分為非聚合物與聚合物。 The "organic compound having a molecular weight of 500 or more" used as the substrate component can be roughly classified into a non-polymer and a polymer.

非聚合物,通常為使用分子量為500以上、未達4000者。以下,將分子量為500以上、未達4000之非聚合物稱為低分子化合物。 The non-polymer is usually one having a molecular weight of 500 or more and less than 4,000. Hereinafter, a non-polymer having a molecular weight of 500 or more and less than 4,000 is referred to as a low molecular compound.

聚合物通常為使用分子量為1000以上者。以下,將分子量為1000以上之聚合物稱為高分子化合物。高分子化合物之情形,「分子量」為使用GPC(凝膠滲透色層分析儀)測定之聚苯乙烯換算之質量平均分子量。以下,高分子化合物亦有僅稱為「樹脂」者。 The polymer is usually one having a molecular weight of 1,000 or more. Hereinafter, a polymer having a molecular weight of 1,000 or more is referred to as a polymer compound. In the case of a polymer compound, "molecular weight" is a mass average molecular weight in terms of polystyrene measured by GPC (gel permeation chromatography). Hereinafter, the polymer compound is also referred to simply as "resin."

(A)成份,可作為經由酸之作用而對顯影液之溶解性產生變化之樹脂成份使用亦可、作為經由酸之作用而對顯影液之溶解性產生變化之低分子化合物成份使用者亦可。 The component (A) may be used as a resin component which changes the solubility of the developer by the action of an acid, or may be used as a low molecular compound component which changes the solubility of the developer by the action of an acid. .

(A)成份,可為經由酸之作用而增大對顯影液之溶解性者亦可、經由酸之作用而降低對顯影液之溶解性者亦可。 The component (A) may be one in which the solubility in the developer is increased by the action of an acid, and the solubility in the developer may be lowered by the action of an acid.

本發明之光阻組成物於鹼顯影製程中,為形成負型圖型之(或溶劑顯影製程中,形成正型光阻圖型)光阻組成物之情形,(A)成份除作為對鹼顯影液具可溶性之基材成份(以下,亦稱為(A0’)成份)以外,再添加交聯劑成份。該光阻組成物經由曝光而由(B)成份產生酸時,經該酸之作用而使(A0’)成份與交聯劑成份之間引起交聯,結果,將會降低對鹼顯影液之溶解性(對有機系顯影液會增大其溶解性)。因此,於光阻圖型之形成中,對於支撐體上塗佈該光阻組成物所得之光阻膜進行選擇性曝光時,曝光部於對鹼顯影液轉變為難溶性(對有機系顯影液為可溶性)的同時,因未曝光部對鹼顯影液則仍為可溶性(對有機系顯影液為難溶性)而無變化下,經由鹼顯影液進行顯影時,則可形成負型光阻圖型。又,此時使用有機系顯影液作為顯影液時,則可形成正型之光阻圖型。 In the alkali developing process of the photoresist composition of the present invention, in order to form a photoresist pattern of a negative pattern (or a positive photoresist pattern in a solvent developing process), the component (A) is used as a base. The developer has a solvent component (hereinafter, also referred to as (A0') component), and a crosslinking agent component is added. When the photoresist composition generates an acid from the component (B) by exposure, crosslinking between the (A0') component and the crosslinking component is caused by the action of the acid, and as a result, the alkali developer is lowered. Solubility (the organic developer will increase its solubility). Therefore, in the formation of the photoresist pattern, when the photoresist film obtained by applying the photoresist composition on the support is selectively exposed, the exposed portion is converted to a poorly soluble alkali developer (for the organic developer) At the same time, since the unexposed portion is still soluble in the alkali developing solution (which is insoluble to the organic developing solution) and does not change, the negative resist pattern can be formed when developing through the alkali developing solution. Moreover, when an organic developing solution is used as the developing solution at this time, a positive resist pattern can be formed.

(A0’)成份,可使用已知對鹼顯影液為可溶性之樹脂(以下,亦稱「鹼可溶性樹脂」)的公知之樹脂。 As the component (A0'), a known resin which is known to be soluble in an alkali developer (hereinafter also referred to as "alkali-soluble resin") can be used.

鹼可溶性樹脂,例如特開2000-206694號公報所揭 示,具有由α-(羥烷基)丙烯酸,或α-(羥烷基)丙烯酸之烷酯(較佳為碳數1~5之烷酯)所選出之至少一者所衍生之單位的樹脂;美國專利6949325號公報所揭示般,具有磺醯胺基之α位之碳原子可鍵結氫原子以外之原子或取代基的丙烯酸樹脂或多環烯烴樹脂;美國專利6949325號公報、特開2005-336452號公報、特開2006-317803號公報所揭示般,含有氟化醇、α位之碳原子可鍵結氫原子以外之原子或取代基的丙烯酸樹脂;特開2006-259582號公報所揭示般,具有氟化醇之多環烯烴樹脂等,以其可形成具有較少膨潤之良好的光阻圖型,而為較佳。 An alkali-soluble resin, for example, disclosed in Japanese Laid-Open Patent Publication No. 2000-206694 a resin having a unit derived from at least one selected from the group consisting of α-(hydroxyalkyl)acrylic acid, or an alkyl ester of α-(hydroxyalkyl)acrylic acid (preferably an alkyl ester having 1 to 5 carbon atoms) An acrylic resin or a polycyclic olefin resin having a carbon atom at the alpha position of a sulfonamide group capable of bonding an atom or a substituent other than a hydrogen atom, as disclosed in U.S. Patent No. 6,943,325; U.S. Patent No. 6,499,325, JP-A-2005 An acrylic resin containing a fluorinated alcohol and a carbon atom at the alpha position to bond an atom or a substituent other than a hydrogen atom, as disclosed in Japanese Laid-Open Patent Publication No. Hei. No. 2006-317803. In general, a polycyclic olefin resin having a fluorinated alcohol or the like is preferable because it can form a good photoresist pattern having less swelling.

又,前述α-(羥烷基)丙烯酸為,α位之碳原子可鍵結氫原子以外之原子或取代基的丙烯酸之中,羧基所鍵結之α位的碳原子鍵結有氫原子之丙烯酸,與該α位之碳原子鍵結有羥烷基(較佳為碳數1~5之羥烷基)之α-羥烷基丙烯酸之一或兩者之意。 Further, the α-(hydroxyalkyl)acrylic acid is an acrylic acid in which an atom at the α-position is bonded to an atom or a substituent other than a hydrogen atom, and a carbon atom bonded to the α-position of the carboxyl group is bonded to a hydrogen atom. Acrylic acid, one or both of the α-hydroxyalkylacrylic acid having a hydroxyalkyl group (preferably a hydroxyalkyl group having 1 to 5 carbon atoms) bonded to the carbon atom at the α-position.

交聯劑成份,例如,通常為使用具有羥甲基或烷氧甲基之乙炔脲等胺系交聯劑、三聚氰胺系交聯劑等,以其可形成具有較少膨潤之良好的光阻圖型,而為較佳。交聯劑成份之添加量,相對於鹼可溶性樹脂100質量份,以1~50質量份為佳。 The crosslinking agent component is usually an amine crosslinking agent such as acetylene urea having a methylol group or an alkoxymethyl group, or a melamine crosslinking agent, etc., so that a good photoresist pattern with less swelling can be formed. Type, but preferred. The amount of the crosslinking agent component to be added is preferably from 1 to 50 parts by mass based on 100 parts by mass of the alkali-soluble resin.

本發明之光阻組成物為,於鹼顯影製程中形成正型圖型、溶劑顯影製程中形成負型圖型之光阻組成物之情形,(A)成份較佳為,經由酸之作用而增大極性之基材成份(A0)(以下,亦稱為「(A0)成份」)所使用者。 (A0)成份因於曝光前後之極性會產生變化,故不僅於鹼顯影製程,於溶劑顯影製程中,也可得到良好之顯影反差。 The photoresist composition of the present invention is a case where a positive pattern is formed in an alkali developing process and a photoresist pattern of a negative pattern is formed in a solvent developing process, and the component (A) is preferably via an acid. Increase the polarity of the substrate component (A0) (hereinafter also referred to as "(A0) component"). (A0) The composition changes due to the polarity before and after exposure, so that not only the alkali development process, but also a good development contrast can be obtained in the solvent development process.

即,使用於鹼顯影製程之情形,(A0)成份,於曝光前對於鹼顯影液為難溶性,經由曝光而由(B)成份產生酸時,經由該酸之作用而使極性增大,進而增大對鹼顯影液之溶解性。因此,於光阻圖型之形成中,對於支撐體上塗佈該光阻組成物所得之光阻膜進行選擇性曝光時,曝光部由對鹼顯影液為難溶性變化為可溶性的同時,未曝光部則仍為鹼難溶性之未變化下,經鹼顯影而可形成正型圖型。 That is, in the case of the alkali developing process, the component (A0) is insoluble to the alkali developing solution before the exposure, and when the acid is generated from the component (B) by exposure, the polarity is increased by the action of the acid, and the polarity is increased. Solubility of large alkali developer. Therefore, in the formation of the photoresist pattern, when the photoresist film obtained by coating the photoresist composition on the support is selectively exposed, the exposed portion is insoluble in the alkali developer, and is not exposed. The part is still under the condition that the alkali is poorly soluble, and the positive pattern can be formed by alkali development.

另一方面,使用於溶劑顯影製程之情形,(A0)成份,於曝光前對於有機系顯影液具有高度溶解性,經由曝光而由(B)成份產生酸時,經由該酸之作用而增高極性、降低對有機系顯影液之溶解性。因此,於光阻圖型之形成中,對於支撐體上塗佈該光阻組成物所得之光阻膜進行選擇性曝光時,曝光部於對有機系顯影液為可溶性變化為難溶性的同時,未曝光部仍為可溶性之未變化下,使用有機系顯影液進行顯影時,可於曝光部與未曝光部之間賦予反差,而可形成負型圖型。 On the other hand, in the case of a solvent developing process, the component (A0) is highly soluble in the organic developing solution before exposure, and when the acid is generated from the component (B) by exposure, the polarity is increased by the action of the acid. Reduce the solubility of organic developer. Therefore, in the formation of the photoresist pattern, when the photoresist film obtained by applying the photoresist composition on the support is selectively exposed, the exposed portion is soluble in the organic developer and is insoluble, and is not When the exposed portion is still soluble, when the organic developing solution is used for development, a contrast can be imparted between the exposed portion and the unexposed portion, and a negative pattern can be formed.

本發明之光阻組成物中,(A)成份以(A0)成份為佳。即,本發明之光阻組成物,以於鹼顯影製程中,可形成正型,於溶劑顯影製程中,可形成負型之化學增幅型光阻組成物為佳。 In the photoresist composition of the present invention, the component (A) is preferably (A0). That is, the photoresist composition of the present invention can form a positive type in the alkali developing process, and a negative-type chemically amplified resist composition can be formed in the solvent developing process.

該(A0)成份,可為經由酸之作用而增大極性之樹脂成份(A1)(以下,亦稱為「(A1)成份」)亦可、經由酸之作用而增大極性之低分子化合物成份(A2)(以下,亦稱為「(A2)成份」)亦可,或該些混合物亦可。 The (A0) component may be a resin component (A1) (hereinafter, also referred to as "(A1) component)) which is increased in polarity by an action of an acid, or a low molecular compound which increases polarity by an action of an acid. The component (A2) (hereinafter also referred to as "(A2) component") may also be used, or the mixture may be used.

[(A1)成份] [(A1) ingredients]

(A1)成份,通常可單獨使用1種作為化學增幅型光阻用之基材成份使用之樹脂成份(基礎樹脂),或將2種以上混合使用亦可。 In the component (A1), a resin component (base resin) used as a substrate component for a chemically amplified photoresist may be used alone or in combination of two or more.

本發明中,(A1)成份以具有含有經由酸之作用而增大極性之酸分解性基的結構單位(a1)者為佳。 In the present invention, the component (A1) is preferably a structural unit (a1) having an acid-decomposable group which increases polarity by an action of an acid.

(結構單位(a1)) (Structural unit (a1))

結構單位(a1)為,含有經由酸之作用而增大極性之酸分解性基的結構單位。 The structural unit (a1) is a structural unit containing an acid-decomposable group which increases polarity by the action of an acid.

「酸分解性基」係指,受到經由曝光而由(B)成份所產生之酸的作用時,該酸分解性基的結構中之至少一部份鍵結經開裂而得之具有酸分解性之基。 The "acid-decomposable group" means that when at least a part of the bond of the structure of the acid-decomposable group is cleaved by the action of an acid generated by the component (B) by exposure, the acid-decomposable property is obtained. The basis.

經由酸之作用而增大極性之酸分解性基,例如,經由酸之作用而分解產生極性基之基等。 The acid-decomposable group which increases the polarity by the action of an acid, for example, is decomposed by the action of an acid to generate a group of a polar group or the like.

構成酸分解性基之極性基,例如,羧基、羥基、胺基、磺基(-SO3H)等。該些之中,又以羧基或羥基為佳,以羧基為特佳。 The polar group constituting the acid-decomposable group is, for example, a carboxyl group, a hydroxyl group, an amine group, a sulfo group (-SO 3 H) or the like. Among these, a carboxyl group or a hydroxyl group is preferred, and a carboxyl group is particularly preferred.

酸分解性基,更具體而言,例如前述極性基被酸解離 性基所保護之基(例如,前述極性基之氫原子被酸解離性基所保護之基)等。 An acid-decomposable group, more specifically, for example, the aforementioned polar group is dissociated by an acid A group protected by a group (for example, a group in which a hydrogen atom of the aforementioned polar group is protected by an acid dissociable group) or the like.

「酸解離性基」係指,受到經由曝光而由(B)成份所產生之酸的作用時,至少使該酸解離性基與該酸解離性基鄰接之原子之間的鍵結產生開裂而得之具有酸解離性之基。構成酸分解性基之酸解離性基,必須為具有較該酸解離性基經由解離所生成之極性基為更低的極性之基,如此,經由酸之作用而使該酸解離性基解離之際,將會生成極性較該酸解離性基為更高之極性基,而增大(A)成份的極性。增大(A)成份的極性時,鹼顯影製程之情形會增大曝光部對鹼顯影液之溶解性,溶劑顯影製程之情形會降低曝光部對有機系顯影液之溶解性。 The "acid dissociable group" means that, when subjected to an acid generated by the component (B) by exposure, at least the bond between the acid dissociable group and the atom adjacent to the acid dissociable group is cracked. It has the basis of acid dissociation. The acid dissociable group constituting the acid-decomposable group must be a group having a polarity lower than that of the polar group formed by dissociation of the acid dissociable group, so that the acid dissociable group is dissociated by the action of an acid. Further, a polar group having a polarity higher than the acid dissociable group is generated, and the polarity of the (A) component is increased. When the polarity of the component (A) is increased, the alkali development process increases the solubility of the exposed portion to the alkali developer, and the solvent development process reduces the solubility of the exposed portion to the organic developer.

酸解離性基,並未有特別之限定,其可使用目前為止被提案作為化學增幅型光阻用之基礎樹脂的酸解離性基者。一般而言,廣為已知者例如,與(甲基)丙烯酸等中之羧基形成環狀或鏈狀之三級烷酯之基、烷氧烷基等縮醛型酸解離性基等。 The acid-dissociable group is not particularly limited, and an acid-dissociable group which has been proposed as a base resin for chemically amplified photoresist has been used. In general, for example, a carboxyl group in a (meth)acrylic acid or the like is formed into a cyclic or chain-like tertiary alkyl ester group, or an acetal acid dissociable group such as an alkoxyalkyl group.

其中,「三級烷酯」係指,羧基之氫原子,被鏈狀或環狀之烷基所取代而形成酯,其羰氧基(-C(=O)-O-)的末端之氧原子上,鍵結前述鏈狀或環狀之烷基中之三級碳原子所得之結構之意。此三級烷酯中,經由酸之作用時,使氧原子與三級碳原子之間的鍵結被切斷,而形成羧基。 Here, the "trialkyl ester" means a hydrogen atom of a carboxyl group which is substituted with a chain or a cyclic alkyl group to form an ester, and a terminal oxycarbonyl group of the carbonyloxy group (-C(=O)-O-) On the atom, the structure obtained by bonding the tertiary carbon atoms of the aforementioned chain or cyclic alkyl group means. In the tertiary alkyl ester, when an acid acts, the bond between the oxygen atom and the tertiary carbon atom is cleaved to form a carboxyl group.

前述鏈狀或環狀之烷基,其可具有取代基。 The aforementioned chain or cyclic alkyl group which may have a substituent.

以下,經由羧基與三級烷酯之構成,而形成酸解離性之基,於方便上,將其稱為「三級烷酯型酸解離性基」。 Hereinafter, the acid dissociable group is formed via the constitution of a carboxyl group and a tertiary alkyl ester, and it is referred to as a "tri-alkyl ester type acid dissociable group" for convenience.

三級烷酯型酸解離性基,例如,含有脂肪族支鏈狀酸解離性基、脂肪族環式基之酸解離性基等。 The tertiary alkyl ester type acid dissociable group, for example, contains an aliphatic branched acid dissociable group, an acid dissociable group of an aliphatic cyclic group, and the like.

其中,「脂肪族支鏈狀」係指,不具有芳香族性之具有支鏈狀結構者之意。「脂肪族支鏈狀酸解離性基」之結構,只要為由碳及氫所形成之基(烴基)時,並未有特別之限定,又以烴基為佳。又,「烴基」可為飽和或不飽和之任一者皆可,通常以飽和者為佳。 Here, the "aliphatic branched shape" means a group having a branched structure without aromaticity. The structure of the "aliphatic branched acid dissociable group" is not particularly limited as long as it is a group (hydrocarbon group) formed of carbon and hydrogen, and a hydrocarbon group is preferred. Further, the "hydrocarbon group" may be either saturated or unsaturated, and it is usually preferred to saturate.

脂肪族支鏈狀酸解離性基,例如,-C(R71)(R72)(R73)所表示之基等。式中,R71~R73為各自獨立之碳數1~5之直鏈狀烷基。-C(R71)(R72)(R73)所表示之基,以碳數4~8為佳,具體而言,例如,tert-丁基、2-甲基-2-丁基、2-甲基-2-戊基、3-甲基-3-戊基等。特別是以tert-丁基為佳。 An aliphatic branched acid dissociable group, for example, a group represented by -C(R 71 )(R 72 )(R 73 ). In the formula, R 71 to R 73 are each independently a linear alkyl group having 1 to 5 carbon atoms. a group represented by -C(R 71 )(R 72 )(R 73 ), preferably having a carbon number of 4 to 8, specifically, for example, tert-butyl, 2-methyl-2-butyl, 2 -Methyl-2-pentyl, 3-methyl-3-pentyl and the like. Especially tert-butyl is preferred.

脂肪族支鏈狀酸解離性基中,氫原子的一部份可被氟原子所取代。該情形中,以前述-C(R71)(R72)(R73)所表示之基之R71、R72及R73之中的1個為氟化烷基,2個為烷基為佳。該氟化烷基,以-(CH2)w20-CF3所表示之基為佳。w20為0~3之整數。 In the aliphatic branched acid dissociable group, a part of a hydrogen atom may be substituted by a fluorine atom. In this case, one of R 71 , R 72 and R 73 represented by the above-mentioned -C(R 71 )(R 72 )(R 73 ) is a fluorinated alkyl group, and two of them are an alkyl group. good. The fluorinated alkyl group is preferably a group represented by -(CH 2 ) w20 -CF 3 . W20 is an integer from 0 to 3.

「脂肪族環式基」係指,不具有芳香族性之單環式基或多環式基之意。 The "aliphatic cyclic group" means a monocyclic group or a polycyclic group which does not have an aromatic group.

「含有脂肪族環式基之酸解離性基」中之脂肪族環式基,可具有取代基,或不具有取代基皆可。取代基例如, 碳數1~5之烷基、碳數1~5之烷氧基、氟原子、碳數1~5之氟化烷基、氧原子(=O)等。 The aliphatic cyclic group in the "acid-dissociable group containing an aliphatic cyclic group" may have a substituent or may have no substituent. Substituents, for example, An alkyl group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a fluorine atom, a fluorinated alkyl group having 1 to 5 carbon atoms, and an oxygen atom (=O).

該脂肪族環式基之去除取代基的基本之環結構,只要為由碳及氫所形成之基(烴基)時,並未有特別之限定,又以烴基為佳。又,該烴基,可為飽和或不飽和之任一者皆可,通常以飽和者為佳。 The basic ring structure of the substituent of the aliphatic cyclic group is not particularly limited as long as it is a group (hydrocarbon group) formed of carbon and hydrogen, and a hydrocarbon group is preferred. Further, the hydrocarbon group may be either saturated or unsaturated, and it is usually preferred to saturate.

脂肪族環式基,可為單環式亦可、多環式亦可。 The aliphatic cyclic group may be a single ring type or a multi ring type.

脂肪族環式基,其碳數以3~30者為佳,以5~30者為較佳,以5~20為更佳,以6~15為特佳,以6~12為最佳。單環式之脂肪族環式基,以由單環鏈烷去除1個以上之氫原子所得之基為佳。該單環鏈烷以碳數3~6者為佳,具體而言,例如,環丁烷、環戊烷、環己烷等。多環式之脂肪族環式基,以由多環鏈烷去除1個以上之氫原子所得之基為佳,該多環鏈烷以碳數7~12者為佳,具體而言,例如,金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等。又,構成該些脂肪族環式基之環的碳原子中之一部份可被醚基(-O-)所取代者亦可。 The aliphatic cyclic group has a carbon number of 3 to 30, preferably 5 to 30, more preferably 5 to 20, and 6 to 15 is preferred, and 6 to 12 is the best. The monocyclic aliphatic cyclic group is preferably a group obtained by removing one or more hydrogen atoms from a monocyclic alkane. The monocyclic alkane is preferably a carbon number of 3 to 6, and specifically, for example, cyclobutane, cyclopentane, cyclohexane or the like. The polycyclic aliphatic cyclic group is preferably a group obtained by removing one or more hydrogen atoms from a polycyclic alkane, and the polycyclic alkane is preferably a carbon number of 7 to 12, specifically, for example, Adamantane, norbornane, isodecane, tricyclodecane, tetracyclododecane, and the like. Further, one of the carbon atoms constituting the ring of the aliphatic cyclic group may be substituted by an ether group (-O-).

含有脂肪族環式基之酸解離性基,例如,(i)1價之脂肪族環式基之環骨架上,該酸解離性基所鄰接之原子(例如,-C(=O)-O-中之-O-)所鍵結之碳原子鍵結取代基(氫原子以外之原子或基)而形成三級碳原子之基;(ii)具有1價之脂肪族環式基,與,與其鍵結之具有三級碳原子之支鏈狀伸烷基之基等。 An acid-dissociable group containing an aliphatic cyclic group, for example, an atom adjacent to the acid-dissociable group on the ring skeleton of the monovalent aliphatic ring group (for example, -C(=O)-O -中中-O-) a carbon atom-bonded substituent (atom or group other than a hydrogen atom) to form a group of a tertiary carbon atom; (ii) a monovalent aliphatic ring group; a group of a branched alkyl group having a tertiary carbon atom bonded thereto.

前述(i)之基中,於脂肪族環式基之環骨架上,鍵結與該酸解離性基相鄰接之原子之碳原子所鍵結的取代基,例如,烷基等。該烷基,例如與後述式(1-1)~(1-9)中之R14為相同之內容等。 In the group (i) above, a substituent bonded to a carbon atom of an atom adjacent to the acid dissociable group, for example, an alkyl group or the like, is bonded to the ring skeleton of the aliphatic ring group. The alkyl group is, for example, the same as R 14 in the following formulae (1-1) to (1-9).

前述(i)之基之具體例,例如,下述通式(1-1)~(1-9)所表示之基等。 Specific examples of the group of the above (i) are, for example, groups represented by the following general formulae (1-1) to (1-9).

前述(ii)之基之具體例,例如,下述通式(2-1)~(2-6)所表示之基等。 Specific examples of the group (ii) include, for example, a group represented by the following general formulae (2-1) to (2-6).

[式中,R14為烷基,g為0~8之整數]。 [wherein, R 14 is an alkyl group, and g is an integer of 0 to 8].

[式中,R15及R16各自獨立為烷基]。 [wherein, R 15 and R 16 are each independently an alkyl group].

式(1-1)~(1-9)中,R14之烷基,可為直鏈狀、支鏈狀、環狀之任一者皆可。 In the formulae (1-1) to (1-9), the alkyl group of R 14 may be any of a linear chain, a branched chain, and a cyclic chain.

該直鏈狀烷基,以碳數1~5為佳,以1~4為較佳,以1或2為更佳。具體而言,例如,甲基、乙基、n-丙基、n-丁基、n-戊基等。該些之中,又以甲基、乙基或n-丁基為佳,以甲基或乙基為更佳。 The linear alkyl group preferably has a carbon number of 1 to 5, preferably 1 to 4, more preferably 1 or 2. Specifically, for example, a methyl group, an ethyl group, an n-propyl group, an n-butyl group, an n-pentyl group or the like. Among them, a methyl group, an ethyl group or an n-butyl group is preferred, and a methyl group or an ethyl group is more preferred.

該支鏈狀之烷基,以碳數3~10為佳,以3~5為更佳。具體而言,例如,異丙基、異丁基、tert-丁基、異戊基、新戊基等,又以異丙基為最佳。 The branched alkyl group preferably has a carbon number of 3 to 10 and preferably 3 to 5. Specifically, for example, isopropyl, isobutyl, tert-butyl, isopentyl, neopentyl or the like is preferably isopropyl.

該環狀之烷基,其碳數以3~20為佳,以4~12為更佳。具體而言,例如,由環戊烷、環己烷等單環鏈烷,或金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等多環鏈烷去除1個以上之氫原子所得之基等。環狀之烷基之構成環之碳原子的一部份可被醚性氧原子(-O-)所取代。 The cyclic alkyl group preferably has a carbon number of 3 to 20, more preferably 4 to 12. Specifically, for example, one monocyclic alkane such as cyclopentane or cyclohexane or one polycyclic alkane such as adamantane, norbornane, isodecane, tricyclodecane or tetracyclododecane is removed. The base obtained by the above hydrogen atom and the like. A part of the carbon atom constituting the ring of the cyclic alkyl group may be substituted by an etheric oxygen atom (-O-).

g為0~3之整數為佳,以1~3之整數為較佳,以1或2為更佳。 It is preferable that g is an integer of 0 to 3, preferably an integer of 1 to 3, more preferably 1 or 2.

式(2-1)~(2-6)中,R15~R16之烷基,與前述R14之烷基為相同之內容等。 In the formulae (2-1) to (2-6), the alkyl group of R 15 to R 16 is the same as the alkyl group of the above R 14 .

上述式(1-1)~(1-9)、(2-1)~(2-6)中,構成環之碳原子的一部份可被醚性氧原子(-O-)所取代。 In the above formulae (1-1) to (1-9) and (2-1) to (2-6), a part of the carbon atoms constituting the ring may be substituted by an etheric oxygen atom (-O-).

又,式(1-1)~(1-9)、(2-1)~(2-6)中,鍵結於構成環之碳原子的氫原子可被取代基所取代。該取代基例如,碳數1~5之烷基、氟原子、氟化烷基等。 Further, in the formulae (1-1) to (1-9) and (2-1) to (2-6), a hydrogen atom bonded to a carbon atom constituting the ring may be substituted with a substituent. The substituent is, for example, an alkyl group having 1 to 5 carbon atoms, a fluorine atom, a fluorinated alkyl group or the like.

「縮醛型酸解離性基」,一般而言,為取代羧基、羥 基等含有OH之極性基末端的氫原子而與氧原子鍵結。隨後,經由曝光產生酸時,經由該酸之作用,使縮醛型酸解離性基,與,鍵結於該縮醛型酸解離性基之氧原子之間的鍵結被切斷,而形成羧基、羥基等含有OH之極性基。 "acetal type acid dissociable group", in general, is a substituted carboxyl group or a hydroxyl group. The base or the like contains a hydrogen atom at the terminal of the polar group of OH and is bonded to the oxygen atom. Subsequently, when an acid is generated by exposure, the acetal-type acid dissociable group and the bond between the oxygen atom bonded to the acetal-type acid dissociable group are cleaved by the action of the acid to form a bond. A carboxyl group, a hydroxyl group or the like contains a polar group of OH.

縮醛型酸解離性基,例如,下述通式(p1)所表示之基等。 The acetal type acid dissociable group is, for example, a group represented by the following formula (p1).

[式中,R1’,R2’各自獨立表示氫原子或碳數1~5之烷基,n表示0~3之整數,Y表示碳數1~5之烷基或脂肪族環式基]。 Wherein R 1 ' and R 2 ' each independently represent a hydrogen atom or an alkyl group having 1 to 5 carbon atoms, n represents an integer of 0 to 3, and Y represents an alkyl group having 1 to 5 carbon atoms or an aliphatic cyclic group. ].

式(p1)中,n,以0~2之整數為佳,以0或1為較佳,以0為最佳。 In the formula (p1), n is preferably an integer of 0 to 2, preferably 0 or 1, and most preferably 0.

R1’,R2’之烷基,例如與上述α取代丙烯酸酯之說明中,α位之取代基所列舉之烷基為相同之內容等,以甲基或乙基為佳,以甲基為最佳。 The alkyl group of R 1 ' and R 2 ' , for example, in the description of the above-mentioned α-substituted acrylate, the alkyl group exemplified as the substituent at the α-position is the same, and the methyl group or the ethyl group is preferably a methyl group. For the best.

本發明中,以R1’,R2’中之至少1個為氫原子為佳。即,酸解離性基(p1)以下述通式(p1-1)所表示之基為佳。 In the present invention, it is preferred that at least one of R 1 ' and R 2' is a hydrogen atom. That is, the acid-dissociable group (p1) is preferably a group represented by the following formula (p1-1).

[式中,R1’、n、Y與上述為相同之內容]。 [wherein, R 1 ' , n, and Y are the same as described above].

Y之烷基,例如,與前述作為α位之取代基的烷基為相同之內容等。 The alkyl group of Y is, for example, the same as the alkyl group as the substituent of the α-position described above.

Y之脂肪族環式基,可由以往ArF光阻等中,被多數提案之單環或多環式之脂肪族環式基之中適當地選擇使用,例如,與上述「含有脂肪族環式基之酸解離性基」所列舉之脂肪族環式基為相同之內容等。 The aliphatic ring group of Y may be appropriately selected from among the monocyclic or polycyclic aliphatic ring groups which have been proposed by conventional ArF photoresists, for example, and the above-mentioned "containing aliphatic ring group" The aliphatic cyclic group exemplified as the acid dissociable group is the same content and the like.

縮醛型酸解離性基,又例如下述通式(p2)所示之基。 The acetal type acid dissociable group is, for example, a group represented by the following formula (p2).

[式中,R17、R18為各自獨立之直鏈狀或支鏈狀之烷基或氫原子;R19為直鏈狀、支鏈狀或環狀之烷基。或,R17及R19為各自獨立之直鏈狀或支鏈狀之伸烷基,又R17與R19可鍵結形成環]。 [wherein, R 17 and R 18 are each independently a linear or branched alkyl group or a hydrogen atom; and R 19 is a linear, branched or cyclic alkyl group. Or, R 17 and R 19 are each independently a linear or branched alkyl group, and R 17 and R 19 may be bonded to form a ring].

R17、R18中,烷基的碳數,較佳為1~15,其可為直鏈狀、支鏈狀之任一者,又以乙基、甲基為佳,以甲基為最佳。 In R 17 and R 18 , the carbon number of the alkyl group is preferably from 1 to 15, which may be either a linear chain or a branched chain, and is preferably an ethyl group or a methyl group, and a methyl group is the most good.

特別是R17、R18之一者為氫原子,另一者為甲基為佳。 In particular, one of R 17 and R 18 is a hydrogen atom, and the other is preferably a methyl group.

R19為直鏈狀、支鏈狀或環狀之烷基,碳數較佳為1~15,可為直鏈狀、支鏈狀或環狀之任一者皆可。 R 19 is a linear, branched or cyclic alkyl group, and the carbon number is preferably from 1 to 15, and may be any of a linear chain, a branched chain or a cyclic chain.

R19為直鏈狀、支鏈狀之情形,以碳數1~5為佳,以 乙基、甲基為更佳,以乙基為最佳。 When R 19 is a linear or branched form, it is preferably a carbon number of 1 to 5, more preferably an ethyl group or a methyl group, and most preferably an ethyl group.

R19為環狀之情形,以碳數4~15為佳,以碳數4~12為更佳,以碳數5~10為最佳。具體而言,例如由可被氟原子或氟化烷基所取代,或未被取代之單環鏈烷、二環鏈烷、三環鏈烷、四環鏈烷等多環鏈烷去除1個以上之氫原子所得之基等,其例如與上述「脂肪族環式基」為相同之內容。其中又以由金剛烷去除1個以上之氫原子所得之基為佳。 When R 19 is a ring, it is preferably 4 to 15 carbon atoms, more preferably 4 to 12 carbon atoms, and most preferably 5 to 10 carbon atoms. Specifically, for example, one polycyclic alkane such as a monocyclic alkane, a bicycloalkane, a tricycloalkane or a tetracycloalkane which may be substituted by a fluorine atom or a fluorinated alkyl group or unsubstituted is removed. The base or the like obtained by the above hydrogen atom is, for example, the same as the above-mentioned "aliphatic cyclic group". Among them, a group obtained by removing one or more hydrogen atoms from adamantane is preferred.

又,上述式(p2)中,R17及R19為各自獨立之直鏈狀或支鏈狀之伸烷基(較佳為碳數1~5之伸烷基),又,R19與R17可形成鍵結。 Further, in the above formula (p2), R 17 and R 19 are each independently a linear or branched alkyl group (preferably an alkyl group having 1 to 5 carbon atoms), and further, R 19 and R. 17 can form a bond.

該情形中,R17,與R19,與R19鍵結之氧原子,與該氧原子及R17鍵結之碳原子可形成環式基。該環式基,以4~7員環為佳,以4~6員環為更佳。該環式基之具體例、四氫吡喃基、四氫呋喃基等。 In this case, R 17 , an oxygen atom bonded to R 19 and R 19 , and a carbon atom bonded to the oxygen atom and R 17 may form a ring group. The ring base is preferably a 4 to 7 ring, and a 4 to 6 ring is preferred. Specific examples of the cyclic group, tetrahydropyranyl group, tetrahydrofuranyl group and the like.

結構單位(a1),只要為具有酸分解性基之單位時,其他部位之結構並未有特別之限定,又以α位之碳原子所鍵結之氫原子可被取代基所取代之丙烯酸酯所衍生之結構單位,且含有酸分解性基之結構單位(a11)、α位之碳原子所鍵結之氫原子可被取代基所取代,苯環所鍵結之氫原子可被羥基以外取代基所取代之羥基苯乙烯所衍生之結構單位之羥基中之氫原子被含有酸解離性基或酸解離性基之取代基取代所得之結構單位(a12)、α位之碳原子所鍵結之氫原子可被取代基所取代、萘環所鍵結之氫原子可 被羥基以外之取代基所取代之乙烯基(羥基萘)所衍生之結構單位之羥基中之氫原子被酸解離性基或含有酸解離性基之取代基取代所得之結構單位(a13)等。就線路邊緣粗糙度之觀點,以結構單位(a11)為佳,就使用EUV或EB作為曝光光源之微影蝕刻中,容易吸收EUV波長或EB波長之觀點,以結構單位(a12)~(a13)為佳。 The structural unit (a1) is not particularly limited as long as it is a unit having an acid-decomposable group, and an acrylate in which a hydrogen atom bonded to a carbon atom of the α-position can be substituted with a substituent is used. The structural unit derived, and the structural unit containing the acid-decomposable group (a11), the hydrogen atom bonded to the carbon atom at the α-position may be substituted by a substituent, and the hydrogen atom bonded by the benzene ring may be substituted by a hydroxyl group. The structural unit (a12) in which the hydrogen atom in the hydroxyl group of the structural unit derived from the hydroxystyrene substituted by the group is substituted by the substituent containing the acid dissociable group or the acid dissociable group, and the carbon atom in the α position are bonded thereto. The hydrogen atom may be substituted by a substituent, and the hydrogen atom to which the naphthalene ring is bonded may be A structural unit (a13) obtained by substituting a hydrogen atom in a hydroxyl group of a structural unit derived from a vinyl group (hydroxynaphthalene) substituted with a substituent other than a hydroxyl group with an acid dissociable group or a substituent containing an acid dissociable group. From the viewpoint of line edge roughness, the structural unit (a11) is preferable, and EUV or EB is used as the exposure light source in the lithography etching, and the EUV wavelength or the EB wavelength is easily absorbed, in the structural unit (a12)~(a13) ) is better.

{結構單位(a11)} {Structural unit (a11)}

結構單位(a11)中,α位之碳原子所鍵結之氫原子可被取代基所取代之丙烯酸酯所衍生之結構單位,且含有酸分解性基之結構單位。 In the structural unit (a11), a hydrogen atom to which a carbon atom of the α-position is bonded may be a structural unit derived from an acrylate substituted with a substituent, and a structural unit containing an acid-decomposable group.

結構單位(a11),例如,下述通式(a1-0-1)所表示之結構單位、下述通式(a1-0-2)所表示之結構單位等。 The structural unit (a11) is, for example, a structural unit represented by the following general formula (a1-0-1), a structural unit represented by the following general formula (a1-0-2), and the like.

[式中,R為氫原子、碳數1~5之烷基或碳數1~5之鹵化烷基;X1為酸解離性基;Y2為2價之鍵結基;X2為酸解離性基]。 Wherein R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms or a halogenated alkyl group having 1 to 5 carbon atoms; X 1 is an acid dissociable group; Y 2 is a divalent bond group; and X 2 is an acid Dissociative base].

通式(a1-0-1)中,R之烷基、鹵化烷基,分別與上 述α取代丙烯酸酯之說明中,α位之取代基所列舉之烷基、鹵化烷基為相同之內容等。R,以氫原子、碳數1~5之烷基或碳數1~5之氟化烷基為佳,以氫原子或甲基為最佳。 In the formula (a1-0-1), the alkyl group of R, the alkyl group of the halogenated group, respectively In the description of the α-substituted acrylate, the alkyl group or the halogenated alkyl group exemplified as the substituent at the α-position is the same. R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms or a fluorinated alkyl group having 1 to 5 carbon atoms, and preferably a hydrogen atom or a methyl group.

X1,只要為酸解離性基時,並未有特別之限定,可例如,上述三級烷酯型酸解離性基、縮醛型酸解離性基等,又以三級烷酯型酸解離性基為佳。 X 1 is not particularly limited as long as it is an acid dissociable group, and for example, the above-mentioned tertiary alkyl ester type acid dissociable group, acetal type acid dissociable group, etc., and dissociated by a tertiary alkyl ester type acid The sex base is better.

通式(a1-0-2)中,R與上述為相同之內容。 In the formula (a1-0-2), R is the same as described above.

X2,與式(a1-0-1)中之X1為相同之內容。 X 2 is the same as X 1 in the formula (a1-0-1).

Y2之2價之鍵結基,並未有特別之限定,例如可具有取代基之2價烴基、含雜原子之2價之鍵結基等為較佳之例示。 The bonding group of the two-valent Y 2 is not particularly limited, and examples thereof include a divalent hydrocarbon group which may have a substituent, a divalent bond group containing a hetero atom, and the like.

(可具有取代基之2價烴基) (a divalent hydrocarbon group which may have a substituent)

作為2價鍵結基之烴基可為脂肪族烴基亦可、芳香族烴基亦可。 The hydrocarbon group which is a divalent bond group may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group.

脂肪族烴基為表示不具有芳香族性之烴基之意。該脂肪族烴基,可為飽和者亦可、不飽和者亦可,通常以飽和者為佳。 The aliphatic hydrocarbon group is intended to mean a hydrocarbon group which does not have aromaticity. The aliphatic hydrocarbon group may be either saturated or unsaturated, and is usually saturated.

該脂肪族烴基,更具體而言,例如,直鏈狀或支鏈狀之脂肪族烴基、結構中含有環之脂肪族烴基等。 More specifically, the aliphatic hydrocarbon group is, for example, a linear or branched aliphatic hydrocarbon group or a hydrocarbon group having a ring in the structure.

前述直鏈狀或支鏈狀之脂肪族烴基,以碳數1~10為佳,以1~8為較佳,以1~5為更佳。 The linear or branched aliphatic hydrocarbon group preferably has a carbon number of 1 to 10, preferably 1 to 8, more preferably 1 to 5.

直鏈狀之脂肪族烴基,以直鏈狀之伸烷基為佳,具體 而言,例如伸甲基[-CH2-]、伸乙基[-(CH2)2-]、伸三甲基[-(CH2)3-]、伸四甲基[-(CH2)4-]、伸五甲基[-(CH2)5-]等。 a linear aliphatic hydrocarbon group, preferably a linear alkyl group, specifically, for example, a methyl group [-CH 2 -], an extended ethyl group [-(CH 2 ) 2 -], a trimethyl group [-(CH 2 ) 3 -], tetramethyl [-(CH 2 ) 4 -], pentamethyl [-(CH 2 ) 5 -], and the like.

支鏈狀之脂肪族烴基,以支鏈狀之伸烷基為佳,具體而言,例如-CH(CH3)-、-CH(CH2CH3)-、-C(CH3)2-、-C(CH3)(CH2CH3)-、-C(CH3)(CH2CH2CH3)-、-C(CH2CH3)2-等烷基伸甲基;-CH(CH3)CH2-、-CH(CH3)CH(CH3)-、-C(CH3)2CH2-、-CH(CH2CH3)CH2-、-C(CH2CH3)2-CH2-等烷基伸乙基;-CH(CH3)CH2CH2-、-CH2CH(CH3)CH2-等烷基伸三甲基;-CH(CH3)CH2CH2CH2-、-CH2CH(CH3)CH2CH2-等烷基伸四甲基等烷基伸烷基等。烷基伸烷基中之烷基,以碳數1~5之直鏈狀烷基為佳。 a branched aliphatic hydrocarbon group, preferably a branched alkyl group, specifically, for example, -CH(CH 3 )-, -CH(CH 2 CH 3 )-, -C(CH 3 ) 2 - , -C(CH 3 )(CH 2 CH 3 )-, -C(CH 3 )(CH 2 CH 2 CH 3 )-, -C(CH 2 CH 3 ) 2 - and the like alkyl-methyl; -CH ( CH 3 )CH 2 -, -CH(CH 3 )CH(CH 3 )-, -C(CH 3 ) 2 CH 2 -, -CH(CH 2 CH 3 )CH 2 -, -C(CH 2 CH 3 2 -CH 2 -isoalkyl extended ethyl; -CH(CH 3 )CH 2 CH 2 -, -CH 2 CH(CH 3 )CH 2 -, etc. alkyl-extended trimethyl; -CH(CH 3 )CH 2 An alkyl group such as CH 2 CH 2 -, -CH 2 CH(CH 3 )CH 2 CH 2 - or the like extends to an alkyl group such as a tetramethyl group. The alkyl group in the alkylalkyl group is preferably a linear alkyl group having 1 to 5 carbon atoms.

前述直鏈狀或支鏈狀之脂肪族烴基,可具有取代氫原子之取代基(氫原子以外之基或原子)亦可、不具有亦可。該取代基例如,氟原子、被氟原子所取代之碳數1~5之氟化烷基、酮基(=O)等。 The linear or branched aliphatic hydrocarbon group may have a substituent (a group other than a hydrogen atom or an atom) which substitutes a hydrogen atom, and may or may not be. The substituent is, for example, a fluorine atom, a fluorinated alkyl group having 1 to 5 carbon atoms substituted by a fluorine atom, a ketone group (=O) or the like.

前述結構中含有環之脂肪族烴基,例如,環結構中可含有含雜原子之取代基的環狀脂肪族烴基(由脂肪族烴環去除2個氫原子所得之基)、前述環狀脂肪族烴基鍵結於直鏈狀或支鏈狀之脂肪族烴基的末端之基、前述環狀脂肪族烴基介於直鏈狀或支鏈狀之脂肪族烴基之中途之基等。前述直鏈狀或支鏈狀之脂肪族烴基,例如與前述為相同之內容等。 The aliphatic hydrocarbon group having a ring in the above structure, for example, a cyclic aliphatic hydrocarbon group which may have a substituent containing a hetero atom in the ring structure (a group obtained by removing two hydrogen atoms from an aliphatic hydrocarbon ring), the aforementioned cyclic aliphatic group The hydrocarbon group is bonded to the terminal group of the linear or branched aliphatic hydrocarbon group, and the cyclic aliphatic hydrocarbon group is in the middle of the linear or branched aliphatic hydrocarbon group. The linear or branched aliphatic hydrocarbon group is, for example, the same as described above.

環狀脂肪族烴基,以碳數3~20為佳,以3~12為更佳。 The cyclic aliphatic hydrocarbon group preferably has a carbon number of 3 to 20 and preferably 3 to 12.

環狀脂肪族烴基,可為多環式亦可、單環式亦可。單環式之脂肪族烴基,以由單環鏈烷去除2個氫原子所得之基為佳。該單環鏈烷以碳數3~6者為佳,具體而言,例如環戊烷、環己烷等。多環式之脂肪族烴基,例如由多環鏈烷去除2個氫原子所得之基為佳,該多環鏈烷以碳數7~12者為佳,具體而言,例如,金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等。 The cyclic aliphatic hydrocarbon group may be a polycyclic ring or a monocyclic ring. The monocyclic aliphatic hydrocarbon group is preferably a group obtained by removing two hydrogen atoms from a monocyclic alkane. The monocyclic alkane is preferably a carbon number of 3 to 6, and specifically, for example, cyclopentane or cyclohexane. The polycyclic aliphatic hydrocarbon group is preferably a group obtained by removing two hydrogen atoms from a polycyclic alkane, and the polycyclic alkane is preferably a carbon number of 7 to 12, specifically, for example, adamantane or a descending Decane, isodecane, tricyclodecane, tetracyclododecane, and the like.

環狀脂肪族烴基,可具有取代氫原子之取代基(氫原子以外之基或原子),或不具有亦可。該取代基例如,烷基、烷氧基、鹵素原子、鹵化烷基、羥基、酮基(=O)等。 The cyclic aliphatic hydrocarbon group may have a substituent (a group other than a hydrogen atom or an atom) which substitutes a hydrogen atom, or may have no. The substituent is, for example, an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a ketone group (=O) or the like.

前述作為取代基之烷基,以碳數1~5之烷基為佳,以甲基、乙基、丙基、n-丁基、tert-丁基為最佳。 The alkyl group as the substituent is preferably an alkyl group having 1 to 5 carbon atoms, and most preferably a methyl group, an ethyl group, a propyl group, an n-butyl group or a tert-butyl group.

前述作為取代基之烷氧基,以碳數1~5之烷氧基為佳,以甲氧基、乙氧基、n-丙氧基、iso-丙氧基、n-丁氧基、tert-丁氧基為佳,以甲氧基、乙氧基為最佳。 The alkoxy group as a substituent is preferably an alkoxy group having 1 to 5 carbon atoms, and a methoxy group, an ethoxy group, an n-propoxy group, an iso-propoxy group, an n-butoxy group, or a tert group. - Butoxy is preferred, and methoxy and ethoxy are preferred.

前述作為取代基之鹵素原子,例如,氟原子、氯原子、溴原子、碘原子等,又以氟原子為佳。 The halogen atom as the substituent, for example, a fluorine atom, a chlorine atom, a bromine atom, an iodine atom or the like, is preferably a fluorine atom.

前述作為取代基之鹵化烷基,例如,前述烷基之氫原子的一部份或全部被前述鹵素原子所取代之基等。 The halogenated alkyl group as the substituent is, for example, a group in which a part or all of the hydrogen atom of the alkyl group is substituted by the halogen atom.

環狀脂肪族烴基中,構成該環結構之碳原子的一部份可被含雜原子之取代基所取代。該含雜原子之取代基,以-O-、-C(=O)-O-、-S-、-S(=O)2-、-S(=O)2-O-為佳。 In the cyclic aliphatic hydrocarbon group, a part of the carbon atom constituting the ring structure may be substituted by a substituent containing a hetero atom. The hetero atom-containing substituent is preferably -O-, -C(=O)-O-, -S-, -S(=O) 2 -, -S(=O) 2 -O-.

作為2價烴基之芳香族烴基為,至少具有1個芳香環 之2價烴基,其可具有取代基。芳香環,只要為具有4n+2個π電子的環狀共軛系時,並未有特別之限定,其可為單環式或多環式皆可。芳香環之碳數以5~30為佳,以5~20為較佳,以6~15為更佳,以6~12為特佳。但,該碳數中,為不包含取代基中之碳數者。芳香環,具體而言,例如,苯、萘、蒽、菲等芳香族烴環;構成前述芳香族烴環之碳原子的一部份被雜原子所取代之芳香族雜環;等。芳香族雜環中之雜原子,例如,氧原子、硫原子、氮原子等。芳香族雜環,具體而言,例如,吡啶環、噻吩環等。 The aromatic hydrocarbon group as the divalent hydrocarbon group has at least one aromatic ring A divalent hydrocarbon group which may have a substituent. The aromatic ring is not particularly limited as long as it is a cyclic conjugated system having 4n+2 π electrons, and may be either a monocyclic ring or a polycyclic ring. The carbon number of the aromatic ring is preferably 5 to 30, preferably 5 to 20, more preferably 6 to 15, and particularly preferably 6 to 12. However, among the carbon numbers, those having no carbon number in the substituent are included. The aromatic ring is, for example, an aromatic hydrocarbon ring such as benzene, naphthalene, anthracene or phenanthrene; an aromatic heterocyclic ring which is a part of a carbon atom constituting the aromatic hydrocarbon ring and is substituted with a hetero atom; The hetero atom in the aromatic hetero ring is, for example, an oxygen atom, a sulfur atom, a nitrogen atom or the like. The aromatic heterocyclic ring is specifically, for example, a pyridine ring, a thiophene ring or the like.

作為2價烴基之芳香族烴基,具體而言,例如,由前述芳香族烴環或芳香族雜環去除2個氫原子所得之基(伸芳基或伸雜芳基);由含有2個以上芳香環之芳香族化合物(例如,聯苯基、茀等)去除2個氫原子所得之基;由前述芳香族烴環或芳香族雜環去除1個氫原子所得之(芳基或雜芳基)中之1個氫原子被伸烷基所取代之基(例如,苄基、苯基乙基、1-萘基甲基、2-萘基甲基、1-萘基乙基、2-萘基乙基等芳烷基中,由芳基再去除1個氫原子所得之基);等。前述芳基或雜芳基所鍵結之伸烷基的碳數,以1~4為佳,以1~2為較佳,以1為特佳。 Specific examples of the aromatic hydrocarbon group of the divalent hydrocarbon group include a group obtained by removing two hydrogen atoms from the aromatic hydrocarbon ring or the aromatic heterocyclic ring (such as an aryl group or a heteroaryl group); An aromatic compound (for example, biphenyl, anthracene, etc.) of an aromatic ring obtained by removing two hydrogen atoms; and an aryl or heteroaryl group obtained by removing one hydrogen atom from the above aromatic hydrocarbon ring or aromatic heterocyclic ring a group in which one hydrogen atom is substituted by an alkyl group (for example, benzyl, phenylethyl, 1-naphthylmethyl, 2-naphthylmethyl, 1-naphthylethyl, 2-naphthalene) A group obtained by removing one hydrogen atom from an aryl group in an aralkyl group such as a ethyl group; The carbon number of the alkyl group bonded to the aryl group or the heteroaryl group is preferably from 1 to 4, more preferably from 1 to 2, particularly preferably from 1 to 1.

前述芳香族烴基,可具有取代基,或不具有取代基皆可。例如,該芳香族基所具有之芳香環所鍵結之氫原子可被取代基所取代。該取代基,例如,烷基、烷氧基、鹵素原子、鹵化烷基、羥基、酮基(=O)等。 The aromatic hydrocarbon group may have a substituent or may have no substituent. For example, a hydrogen atom bonded to an aromatic ring of the aromatic group may be substituted with a substituent. The substituent is, for example, an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, a ketone group (=O) or the like.

前述作為取代基之烷基,以碳數1~5之烷基為佳,以甲基、乙基、丙基、n-丁基、tert-丁基為最佳。 The alkyl group as the substituent is preferably an alkyl group having 1 to 5 carbon atoms, and most preferably a methyl group, an ethyl group, a propyl group, an n-butyl group or a tert-butyl group.

前述作為取代基之烷氧基,以碳數1~5之烷氧基為佳,以甲氧基、乙氧基、n-丙氧基、iso-丙氧基、n-丁氧基、tert-丁氧基為佳,以甲氧基、乙氧基為最佳。 The alkoxy group as a substituent is preferably an alkoxy group having 1 to 5 carbon atoms, and a methoxy group, an ethoxy group, an n-propoxy group, an iso-propoxy group, an n-butoxy group, or a tert group. - Butoxy is preferred, and methoxy and ethoxy are preferred.

前述作為取代基之鹵素原子,例如,氟原子、氯原子、溴原子、碘原子等,又以氟原子為佳。 The halogen atom as the substituent, for example, a fluorine atom, a chlorine atom, a bromine atom, an iodine atom or the like, is preferably a fluorine atom.

前述作為取代基之鹵化烷基,例如,前述烷基之氫原子的一部份或全部被前述鹵素原子所取代之基等。 The halogenated alkyl group as the substituent is, for example, a group in which a part or all of the hydrogen atom of the alkyl group is substituted by the halogen atom.

(含雜原子之2價之鍵結基) (containing a divalent bond of a divalent atom)

含雜原子之2價之鍵結基中之雜原子,係指碳原子及氫原子以外之原子,例如,氧原子、氮原子、硫原子、鹵素原子等。 The hetero atom in the divalent bond group containing a hetero atom means an atom other than a carbon atom and a hydrogen atom, for example, an oxygen atom, a nitrogen atom, a sulfur atom, a halogen atom or the like.

含雜原子之2價之鍵結基,具體而言,例如-O-、-C(=O)-、-C(=O)-O-、-O-C(=O)-O-、-S-、-S(=O)2-、-S(=O)2-O-、-NH-、-NH-C(=O)-、-NH-C(=NH)-、=N-等非烴系鍵結基、該些非烴系鍵結基之至少1種與2價烴基之組合等。該2價烴基,例如與上述可具有取代基之2價烴基為相同之內容等,又以直鏈狀或支鏈狀之脂肪族烴基為佳。 a divalent bond group containing a hetero atom, specifically, for example, -O-, -C(=O)-, -C(=O)-O-, -OC(=O)-O-, -S -, -S(=O) 2 -, -S(=O) 2 -O-, -NH-, -NH-C(=O)-, -NH-C(=NH)-, =N-, etc. A non-hydrocarbon-based bonding group, a combination of at least one of these non-hydrocarbon-based bonding groups, and a divalent hydrocarbon group. The divalent hydrocarbon group is, for example, the same as the above-mentioned divalent hydrocarbon group which may have a substituent, and is preferably a linear or branched aliphatic hydrocarbon group.

上述之中,-C(=O)-NH-中之-NH-、-NH-、-NH-C(=NH)-中之H,可分別被烷基、醯基等取代基所取代。該取代基之碳數以1~10為佳,以碳數1~8為更佳,以碳數1~5 為特佳。 Among the above, H in -NH-, -NH-, -NH-C(=NH)- in -C(=O)-NH- may be substituted by a substituent such as an alkyl group or a fluorenyl group. The carbon number of the substituent is preferably from 1 to 10, more preferably from 1 to 8 carbon atoms, and from 1 to 5 carbon atoms. It is especially good.

Y2,特別是以直鏈狀或支鏈狀之伸烷基、2價之脂環式烴基,或含雜原子之2價之鍵結基為佳。 Y 2 is particularly preferably a linear or branched alkyl group, a divalent alicyclic hydrocarbon group, or a divalent bond group containing a hetero atom.

Y2為直鏈狀或支鏈狀伸烷基之情形,該伸烷基,以碳數1~10為佳,以碳數1~6為更佳,以碳數1~4為特佳,以碳數1~3為最佳。具體而言,例如與前述R1中之2價之鍵結基之說明中,直鏈狀或支鏈狀之脂肪族烴基所列舉之直鏈狀之伸烷基、支鏈狀之伸烷基為相同之內容等。 Y 2 is a linear or branched alkyl group. The alkyl group is preferably a carbon number of 1 to 10, preferably a carbon number of 1 to 6, and a carbon number of 1 to 4. The carbon number of 1 to 3 is the best. Specifically, for example, in the description of the two-valent bond group in the above R 1 , a linear alkyl group or a branched alkyl group as exemplified in the linear or branched aliphatic hydrocarbon group For the same content and so on.

Y2為2價之脂環式烴基之情形,該脂環式烴基,例如與前述R0-1中之2價之鍵結基之說明中,「結構中含有環之脂肪族烴基」所列舉之脂環族烴基為相同之內容等。 In the case where Y 2 is a divalent alicyclic hydrocarbon group, for example, in the description of the two-valent bond group in the above R 0-1 , "the aliphatic hydrocarbon group having a ring in the structure" is listed. The alicyclic hydrocarbon group is the same content and the like.

該脂環式烴基,又以由環戊烷、環己烷、降莰烷、異莰烷、金剛烷、三環癸烷、四環十二烷去除2個以上之氫原子所得之基為特佳。 The alicyclic hydrocarbon group is further obtained by removing two or more hydrogen atoms from cyclopentane, cyclohexane, norbornane, isodecane, adamantane, tricyclodecane or tetracyclododecane. good.

Y2為含雜原子之2價之鍵結基之情形,該鍵結基中之較佳者,例如,-O-、-C(=O)-O-、-C(=O)-、-O-C(=O)-O-、-C(=O)-NH-、-NH-(H可被烷基、醯基等取代基所取代)、-S-、-S(=O)2-、-S(=O)2-O-、通式-Y21-O-Y22-、-[Y21-C(=O)-O]m’-Y22-或-Y21-O-C(=O)-Y22-所表示之基[式中,Y21及Y22為各自獨立之可具有取代基之2價烴基,O為氧原子,m’為0~3之整數]等。 Y 2 is a case of a divalent bond group containing a hetero atom, and a preferred one of the bond groups, for example, -O-, -C(=O)-O-, -C(=O)-, -OC(=O)-O-, -C(=O)-NH-, -NH- (H can be substituted by a substituent such as an alkyl group or a fluorenyl group), -S-, -S(=O) 2 -, -S(=O) 2 -O-, general formula -Y 21 -OY 22 -, -[Y 21 -C(=O)-O] m' -Y 22 - or -Y 21 -OC(= O)-Y 22 - a group represented by the formula [wherein Y 21 and Y 22 are each independently a divalent hydrocarbon group which may have a substituent, O is an oxygen atom, and m' is an integer of 0 to 3].

Y2為-NH-之情形,該H可被烷基、芳香族基(例如,芳基)等取代基所取代。該取代基(烷基、芳香族基 等)中,碳數以1~10為佳,以1~8為更佳,以1~5為特佳。 In the case where Y 2 is -NH-, the H may be substituted with a substituent such as an alkyl group or an aromatic group (for example, an aryl group). In the substituent (alkyl group, aromatic group, etc.), the number of carbon atoms is preferably from 1 to 10, more preferably from 1 to 8, and particularly preferably from 1 to 5.

式-Y21-O-Y22-、-[Y21-C(=O)-O]m’-Y22-或-Y21-O-C(=O)-Y22-中,Y21及Y22為各自獨立之可具有取代基之2價烴基。該2價烴基,與前述Y2中之「可具有取代基之2價烴基」所列舉者為相同之內容等。 Formula -Y 21 -OY 22 -, -[Y 21 -C(=O)-O] m' -Y 22 - or -Y 21 -OC(=O)-Y 22 -, Y 21 and Y 22 are Each of them is independently a divalent hydrocarbon group which may have a substituent. The divalent hydrocarbon group is the same as those listed in the "divalent hydrocarbon group which may have a substituent" in the above Y 2 .

Y21,以直鏈狀之脂肪族烴基為佳,以直鏈狀之伸烷基為較佳,以碳數1~5之直鏈狀之伸烷基為更佳,以伸甲基或伸乙基為特佳。 Y 21 is preferably a linear aliphatic hydrocarbon group, preferably a linear alkyl group, and preferably a linear alkyl group having 1 to 5 carbon atoms. Ethyl is especially good.

Y22,以直鏈狀或支鏈狀之脂肪族烴基為佳,以伸甲基、伸乙基或烷基伸甲基為更佳。該烷基伸甲基中之烷基,以碳數1~5之直鏈狀烷基為佳,以碳數1~3之直鏈狀烷基為佳,以甲基為最佳。 Y 22 is preferably a linear or branched aliphatic hydrocarbon group, and more preferably a methyl group, an ethyl group or an alkyl group. The alkyl group in the methyl group is preferably a linear alkyl group having 1 to 5 carbon atoms, more preferably a linear alkyl group having 1 to 3 carbon atoms, and most preferably a methyl group.

式-[Y21-C(=O)-O]m’-Y22-所表示之基中,m’為0~3之整數,以0~2之整數為佳,以0或1為較佳,以1為特佳。即,式-[Y21-C(=O)-O]m’-Y22-所表示之基,以式-Y21-C(=O)-O-Y22-所表示之基為特佳。其中,又以式-(CH2)a’-C(=O)-O-(CH2)b’-所表示之基為佳。該式中,a’為1~10之整數,以1~8之整數為佳,以1~5之整數為較佳,以1或2為更佳,以1為最佳。b’為1~10之整數,以1~8之整數為佳,以1~5之整數為較佳,以1或2為更佳,以1為最佳。 In the base represented by the formula -[Y 21 -C(=O)-O] m' -Y 22 -, m' is an integer from 0 to 3, preferably an integer from 0 to 2, with 0 or 1 as the Good, with 1 is especially good. That is, the group represented by the formula -[Y 21 -C(=O)-O] m' -Y 22 - is particularly preferably a group represented by the formula -Y 21 -C(=O)-OY 22 -. Among them, the group represented by the formula -(CH 2 ) a' -C(=O)-O-(CH 2 ) b' - is preferred. In the formula, a' is an integer of 1 to 10, preferably an integer of 1 to 8, preferably an integer of 1 to 5, more preferably 1 or 2, and most preferably 1. b' is an integer from 1 to 10, preferably from 1 to 8 integers, preferably from 1 to 5, more preferably from 1 or 2, and most preferably from 1.

Y2中之含雜原子之2價之鍵結基,以至少1種之非烴基與2價烴基之組合所形成之有機基為佳。其中,又以具 有作為雜原子之氧原子的直鏈狀之基,例如以含有醚鍵結或酯鍵結之基為佳,以前述式-Y21-O-Y22-、-[Y21-C(=O)-O]m’-Y22-或-Y21-O-C(=O)-Y22-所表示之基為較佳,以前述式-[Y21-C(=O)-O]m’-Y22-或-Y21-O-C(=O)-Y22-所表示之基為佳。 The divalent bond group containing a hetero atom in Y 2 is preferably an organic group formed by combining at least one non-hydrocarbon group and a divalent hydrocarbon group. Further, it is preferably a linear group having an oxygen atom as a hetero atom, for example, a group having an ether bond or an ester bond, and the above formula -Y 21 -OY 22 -, -[Y 21 -C (=O)-O] m' -Y 22 - or -Y 21 -OC(=O)-Y 22 - is preferably a group represented by the above formula - [Y 21 -C(=O)-O The base represented by m' -Y 22 - or -Y 21 -OC(=O)-Y 22 - is preferred.

Y2,於上述之中,又以直鏈狀或支鏈狀之伸烷基,或含雜原子之2價之鍵結基為佳,以直鏈狀或支鏈狀之伸烷基、前述式-Y21-O-Y22-所表示之基、前述式-[Y21-C(=O)-O]m’-Y22-所表示之基,或前述式-Y21-O-C(=O)-Y22-所表示之基為更佳。 Y 2 , in the above, further a linear or branched alkyl group, or a divalent bond group containing a hetero atom, preferably a linear or branched alkyl group, the foregoing a group represented by the formula -Y 21 -OY 22 -, a group represented by the above formula -[Y 21 -C(=O)-O] m' -Y 22 - or the above formula -Y 21 -OC(=O )-Y 22 - The base represented is better.

結構單位(a11),更具體而言,例如下述通式(a1-1)~(a1-4)所表示之結構單位等。 The structural unit (a11) is more specifically, for example, a structural unit represented by the following general formulae (a1-1) to (a1-4).

[式中,R、R1’、R2’、n、Y及Y2分別與前述為相同之內容,X’表示三級烷酯型酸解離性基]。’ 式中,X’,與前述三級烷酯型酸解離性基為相同之內容等。 [wherein, R, R 1 ' , R 2 ' , n, Y and Y 2 are each the same as defined above, and X' represents a tertiary alkyl ester type acid dissociable group]. In the formula, X' is the same as the above-mentioned tertiary alkyl ester type acid dissociable group.

R1’、R2’、n、Y,分別與上述「縮醛型酸解離性基」之說明中所列舉之通式(p1)中之R1’、R2’、n、Y為相同之內容等。 R 1 ', R 2', n, Y, respectively, with the above-described "acetal-type acid dissociable group" as exemplified in the description of general formula (p1) in the R 1 ', R 2', n, Y is the same The content and so on.

Y2,與上述之通式(a1-0-2)中之Y2為相同之內容等。 Y 2 is the same as Y 2 in the above formula (a1-0-2).

以下為上述通式(a1-1)~(a1-4)所表示之結構單位之具體例示。 The following is a specific example of the structural unit represented by the above general formulae (a1-1) to (a1-4).

以下各式中,Rα表示氫原子、甲基或三氟甲基。 In the following formulae, R α represents a hydrogen atom, a methyl group or a trifluoromethyl group.

本發明中,結構單位(a11),以具有由下述通式(a1-0-11)所表示之結構單位、下述通式(a1-0-12)所表示之結構單位、下述通式(a1-0-13)所表示之結構單位及下述通式(a1-0-2)所表示之結構單位所成之群所選出之至少1種者為佳。其中,又以具有由式(a1-0-11)所表示之結構單位、下述通式(a1-0-12)所表示之結構單位及下述通式(a1-0-2)所表示之結構單位所成之群所選出之至少1種者為佳。 In the present invention, the structural unit (a11) has a structural unit represented by the following general formula (a1-0-11), a structural unit represented by the following general formula (a1-0-12), and the following It is preferred that at least one selected from the group consisting of the structural unit represented by the formula (a1-0-13) and the structural unit represented by the following formula (a1-0-2). In addition, it is represented by the structural unit represented by the formula (a1-0-11), the structural unit represented by the following general formula (a1-0-12), and the following general formula (a1-0-2). It is preferred that at least one of the selected groups of structural units is selected.

[式中,R為氫原子、碳數1~5之烷基或碳數1~5之鹵化烷基,R21為烷基,R22為,與該R22鍵結之碳原子共同形成脂肪族單環式基之基,R23為支鏈狀之烷基,R24為,與該R24鍵結之碳原子共同形成脂肪族多環式基之基,R25為碳數1~5之直鏈狀烷基。Y2為2價之鍵結基,X2為酸解離性基]。 Wherein R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms or a halogenated alkyl group having 1 to 5 carbon atoms; R 21 is an alkyl group; and R 22 is a carbon atom bonded to the R 22 to form a fat a group of a monocyclic group, R 23 is a branched alkyl group, and R 24 is a group having an aliphatic polycyclic group together with the carbon atom bonded to the R 24 , and R 25 is a carbon number of 1 to 5. a linear alkyl group. Y 2 is a divalent bond group, and X 2 is an acid dissociable group].

各式中,R、Y2、X2之說明與前述為相同之內容。 In the respective formulas, the descriptions of R, Y 2 and X 2 are the same as those described above.

式(a1-0-11)中,R21之烷基,與前述式(1-1)~(1-9)中之R14之烷基為相同之內容等,以甲基、乙基、異丙基,或,由可具有取代基之降莰烷去除1個以上之氫原子所得之基為佳。 In the formula (a1-0-11), the alkyl group of R 21 is the same as the alkyl group of R 14 in the above formulae (1-1) to (1-9), and is a methyl group or an ethyl group. The isopropyl group or a group obtained by removing one or more hydrogen atoms from a norbornane which may have a substituent is preferred.

R22,與該R22鍵結之碳原子共同形成之脂肪族單環式基,例如,與前述三級烷酯型酸解離性基中所列舉之脂肪族環式基中,作為單環式基之基為相同之內容等。具體而言,例如由單環鏈烷去除1個以上之氫原子所得之基等。該單環鏈烷,以3~11員環為佳,以3~8員環為較佳,以4~6員環為更佳,以5或6員環為特佳。 R 22 , an aliphatic monocyclic group formed by the carbon atom bonded to the R 22 , for example, in the aliphatic cyclic group exemplified in the above-mentioned tertiary alkyl ester type acid dissociable group, as a monocyclic ring The basis of the base is the same content and the like. Specifically, for example, a group obtained by removing one or more hydrogen atoms from a monocyclic alkane or the like. The monocyclic alkane is preferably a 3 to 11 member ring, preferably a 3 to 8 member ring, preferably a 4 to 6 member ring, and a 5 or 6 member ring.

該單環鏈烷中,構成環之碳原子的一部份可被醚基(-O-)所取代,或未被取代亦可。 In the monocyclic alkane, a part of the carbon atoms constituting the ring may be substituted by an ether group (-O-) or may be unsubstituted.

又,該單環鏈烷中,取代基可具有碳數1~5之烷基、氟原子或碳數1~5之氟化烷基。 Further, in the monocyclic alkane, the substituent may have an alkyl group having 1 to 5 carbon atoms, a fluorine atom or a fluorinated alkyl group having 1 to 5 carbon atoms.

構成脂肪族單環式基之R22,例如,碳原子間可介有醚基(-O-)之直鏈狀之伸烷基等。 R 22 constituting an aliphatic monocyclic group, for example, a linear alkyl group having an ether group (-O-) interposed between carbon atoms.

式(a1-0-11)所表示之結構單位之具體例,例如,前述式(a1-1-16)~(a1-1-23)、(a1-1-27)、(a1-1-31)、(a1-1-37)所表示之結構單位等。該些之中,又以包括式(a1-1-16)~(a1-1-17)、(a1-1-20)~(a1-1-23)、(a1-1-27)、(a1-1-31)、(a1-1-37)所表示之結構單位的下述(a1-1-02)所表示之結構單位為佳。又,下述(a1-1-02’)所表示之結構單位亦佳。 Specific examples of the structural unit represented by the formula (a1-0-11), for example, the above formulas (a1-1-16) to (a1-1-23), (a1-1-27), (a1-1-) 31), the structural unit represented by (a1-1-37), and the like. Among these, it includes equations (a1-1-16)~(a1-1-17), (a1-1-20)~(a1-1-23), (a1-1-27), ( The structural unit represented by the following (a1-1-02) of the structural unit represented by a1-1-31) and (a1-1-37) is preferable. Further, the structural unit represented by the following (a1-1-02') is also preferable.

各式中,h,以1或2為佳。 In each formula, h is preferably 1 or 2.

[式中,R、R21分別與前述為相同之內容,h為1~4之整數]。 [wherein R and R 21 are the same as described above, and h is an integer of 1 to 4].

式(a1-0-12)中,R23之支鏈狀之烷基,與前述式 (1-1)~(1-9)中之R14之烷基所列舉之支鏈狀之烷基為相同之內容等,又以異丙基為最佳。 In the formula (a1-0-12), a branched alkyl group of R 23 and a branched alkyl group exemplified by the alkyl group of R 14 in the above formula (1-1) to (1-9) For the same content, etc., isopropyl is the best.

R24,與該R24鍵結之碳原子共同形成之脂肪族多環式基,與前述三級烷酯型酸解離性基中所列舉之脂肪族環式基中,作為多環式基之基為相同之內容等。 R 24, an aliphatic polycyclic group formed jointly with the carbon atom which R 24 is bonded, the aforementioned three alkyl ester-type acid solution of the aliphatic cyclic group enumerated dissociable group, as the polycyclic group of The base is the same content and so on.

式(a1-0-12)所表示之結構單位之具體例,例如,前述式(a1-1-26)、(a1-1-28)~(a1-1-30)所表示之結構單位等。 Specific examples of the structural unit represented by the formula (a1-0-12) include, for example, structural units represented by the above formulas (a1-1-26), (a1-1-28) to (a1-1-30), and the like. .

式(a1-0-12)所表示之結構單位中,以R24,與該R24鍵結之碳原子共同形成之脂肪族多環式基為2-金剛烷基者為佳,特別是以前述式(a1-1-26)所表示之結構單位為佳。 In the structural unit represented by the formula (a1-0-12), it is preferred that R 24 and the aliphatic polycyclic group formed by the carbon atom bonded to the R 24 are 2-adamantyl groups, particularly The structural unit represented by the above formula (a1-1-26) is preferred.

式(a1-0-13)中,R及R24分別與前述為相同之內容。 In the formula (a1-0-13), R and R 24 are the same as those described above.

R25之直鏈狀烷基,與前述式(1-1)~(1-9)中之R14之烷基所列舉之直鏈狀烷基為相同之內容等,以甲基或乙基為最佳。 The linear alkyl group of R 25 is the same as the linear alkyl group exemplified for the alkyl group of R 14 in the above formulae (1-1) to (1-9), and is a methyl group or an ethyl group. For the best.

式(a1-0-13)所表示之結構單位,具體而言,例如,前述通式(a1-1)之具體例所例示之式(a1-1-1)~(a1-1-3)、(a1-1-7)~(a1-1-15)所表示之結構單位等。 The structural unit represented by the formula (a1-0-13), specifically, for example, the formula (a1-1-1) to (a1-1-3) exemplified in the specific example of the above formula (a1-1) , the structural unit represented by (a1-1-7)~(a1-1-15), and the like.

式(a1-0-13)所表示之結構單位中,以R24,與該R24鍵結之碳原子共同形成之脂肪族多環式基為2-金剛烷基者為佳,特別是以前述式(a1-1-1)或(a1-1-2)所表示之結構單位為佳。 In the structural unit represented by the formula (a1-0-13), it is preferred that R 24 and the aliphatic polycyclic group formed by the carbon atom bonded to the R 24 are 2-adamantyl groups, particularly The structural unit represented by the above formula (a1-1-1) or (a1-1-2) is preferred.

式(a1-0-2)所表示之結構單位,例如前述式(a1-3)或(a1-4)所表示之結構單位,特別是以式(a1-3)所表示之結構單位為佳。 The structural unit represented by the formula (a1-0-2), for example, the structural unit represented by the above formula (a1-3) or (a1-4), particularly preferably the structural unit represented by the formula (a1-3) .

式(a1-0-2)所表示之結構單位,特別是以式中之Y2為前述式-Y21-O-Y22-所表示之基、前述式-[Y21-C(=O)-O]m’-Y22-所表示之基,或前述式-Y21-O-C(=O)-Y22-所表示之基者為佳。 The structural unit represented by the formula (a1-0-2), in particular, Y 2 in the formula is a group represented by the above formula -Y 21 -OY 22 -, the above formula - [Y 21 -C(=O)- The base represented by O] m' - Y 22 - or the base represented by the above formula -Y 21 -OC(=O)-Y 22 - is preferred.

該結構單位中,較佳者例如下述通式(a1-3-01)所表示之結構單位;下述通式(a1-3-02)所表示之結構單位;下述通式(a1-3-03)所表示之結構單位等。 In the structural unit, for example, a structural unit represented by the following general formula (a1-3-01); a structural unit represented by the following general formula (a1-3-02); and the following general formula (a1- 3-03) The structural unit represented by etc.

[式中,R與前述為相同之內容,R13為氫原子或甲基,R14為烷基,y為1~10之整數,n’為0~3之整數]。 [wherein R is the same as the above, R 13 is a hydrogen atom or a methyl group, R 14 is an alkyl group, y is an integer of 1 to 10, and n' is an integer of 0 to 3].

[式中,R與前述為相同之內容,Y2’及Y2”為各自獨立之2價之鍵結基,X’為酸解離性基,w為0~3之整數]。 [wherein, R is the same as the above, and Y 2 ' and Y 2" are each a two-valent bond group independently, and X' is an acid dissociable group, and w is an integer of 0 to 3].

式(a1-3-01)~(a1-3-02)中,R13以氫原子為佳。 In the formulae (a1-3-01) to (a1-3-02), R 13 is preferably a hydrogen atom.

R14,與前述式(1-1)~(1-9)中之R14為相同之內容。 R 14 is the same as R 14 in the above formulae (1-1) to (1-9).

y,以1~8之整數為佳,以1~5之整數為較佳,以1或2為最佳。 Y is preferably an integer from 1 to 8, preferably from 1 to 5, and preferably 1 or 2.

n’,以1或2為佳,以2為最佳。 n' is preferably 1 or 2, and 2 is most preferred.

式(a1-3-01)所表示之結構單位之具體例,例如,前述式(a1-3-25)~(a1-3-26)所表示之結構單位等。 Specific examples of the structural unit represented by the formula (a1-3-01) are, for example, structural units represented by the above formulas (a1-3-25) to (a1-3-26).

式(a1-3-02)所表示之結構單位之具體例,例如,前述式(a1-3-27)~(a1-3-28)所表示之結構單位等。 Specific examples of the structural unit represented by the formula (a1-3-02) are, for example, structural units represented by the above formulas (a1-3-27) to (a1-3-28).

式(a1-3-03)中,Y2’、Y2”中之2價之鍵結基,例如與前述通式(a1-0-2)中之Y2為相同之內容等。 In the formula (a1-3-03), the divalent bond group in Y 2 ' and Y 2 ' is, for example, the same as Y 2 in the above formula (a1-0-2).

Y2’,以可具有取代基之2價烴基為佳,以直鏈狀之脂肪族烴基為較佳,以直鏈狀之伸烷基為更佳。其中又以碳數1~5之直鏈狀之伸烷基為佳,以伸甲基、伸乙基為最佳。 Y 2 ' is preferably a divalent hydrocarbon group which may have a substituent, and a linear aliphatic hydrocarbon group is preferred, and a linear alkyl group is more preferred. Among them, a linear alkyl group having a carbon number of 1 to 5 is preferred, and a methyl group and an ethyl group are preferred.

Y2”,以可具有取代基之2價烴基為佳,以直鏈狀之 脂肪族烴基為較佳,以直鏈狀之伸烷基為更佳。其中又以碳數1~5之直鏈狀之伸烷基為佳,以伸甲基、伸乙基為最佳。 Y 2" is preferably a divalent hydrocarbon group which may have a substituent, preferably a linear aliphatic hydrocarbon group, more preferably a linear alkyl group, and a carbon number of 1 to 5. The chain-like alkyl group is preferred, and the methyl group and the ethyl group are most preferred.

X’中之酸解離性基,與前述為相同之內容,又以三級烷酯型酸解離性基為佳,以上述(i)1價之脂肪族環式基之環骨架上,該酸解離性基所鄰接之原子所鍵結之碳原子鍵結取代基而形成之三級碳原子之基為較佳,其中又以前述通式(1-1)所表示之基為佳。 The acid dissociable group in X' is the same as the above, and is preferably a tertiary alkyl ester type acid dissociable group, and the acid is on the ring skeleton of the above (i) monovalent aliphatic ring group. A group of a tertiary carbon atom formed by a carbon atom-bonded substituent bonded to an atom adjacent to the dissociable group is preferred, and a group represented by the above formula (1-1) is preferred.

w為0~3之整數,w,以0~2之整數為佳,以0或1為較佳,以1為最佳。 w is an integer of 0~3, w, preferably an integer of 0~2, preferably 0 or 1, and 1 is the best.

式(a1-3-03)所表示之結構單位,以下述通式(a1-3-03-1)或(a1-3-03-2)所表示之結構單位為佳,其中又以式(a1-3-03-1)所表示之結構單位為佳。 The structural unit represented by the formula (a1-3-03) is preferably a structural unit represented by the following general formula (a1-3-03-1) or (a1-3-03-2), wherein The structural unit represented by a1-3-03-1) is preferred.

[式中,R及R14分別與前述為相同之內容,a’為1~10之 整數,b’為1~10之整數,t為0~3之整數]。 [wherein R and R 14 are respectively the same as described above, a' is an integer of 1 to 10, b' is an integer of 1 to 10, and t is an integer of 0 to 3].

式(a1-3-03-1)~(a1-3-03-2)中,a’,以1~8之整數為佳,以1~5之整數為較佳,以1或2為特佳。 In the formula (a1-3-03-1)~(a1-3-03-2), a' is preferably an integer from 1 to 8, preferably an integer from 1 to 5, preferably 1 or 2. good.

b’,以1~8之整數為佳,以1~5之整數為佳,以1或2為特佳。 b' is preferably an integer of 1 to 8, preferably an integer of 1 to 5, and particularly preferably 1 or 2.

t為1~3之整數為佳,以1或2為特佳。 It is preferable that t is an integer of 1 to 3, and 1 or 2 is particularly preferable.

式(a1-3-03-1)或(a1-3-03-2)所表示之結構單位之具體例,例如,前述式(a1-3-29)~(a1-3-32)所表示之結構單位等。 Specific examples of the structural unit represented by the formula (a1-3-03-1) or (a1-3-03-2), for example, represented by the above formulas (a1-3-29) to (a1-3-32) The structural unit and so on.

{結構單位(a12)} {Structural unit (a12)}

結構單位(a12)為,α位之碳原子所鍵結之氫原子可被取代基所取代,苯環所鍵結之氫原子可被羥基以外取代基所取代之羥基苯乙烯所衍生之結構單位之羥基中之氫原子被酸解離性基或含有酸解離性基之取代基取代所得之結構單位。 The structural unit (a12) is a structural unit in which a hydrogen atom bonded to a carbon atom in the alpha position can be substituted by a substituent, and a hydrogen atom bonded to the benzene ring can be replaced by a hydroxystyrene substituted with a substituent other than a hydroxyl group. A structural unit obtained by substituting a hydrogen atom in a hydroxyl group with an acid dissociable group or a substituent containing an acid dissociable group.

「羥基苯乙烯」為,苯環鍵結1個乙烯基,與至少1個羥基所得之化合物。苯環所鍵結之羥基之數,以1~3為佳,以1為特佳。苯環中之羥基的鍵結位置並未有特別限定。羥基之數為1個之情形,以乙烯基之鍵結位置之對4位為佳。羥基之數為2以上之整數之情形,其可為任意鍵結位置之組合。 "Hydroxystyrene" is a compound obtained by bonding a vinyl group to at least one hydroxyl group. The number of hydroxyl groups bonded to the benzene ring is preferably from 1 to 3, with 1 being particularly preferred. The bonding position of the hydroxyl group in the benzene ring is not particularly limited. In the case where the number of hydroxyl groups is one, it is preferable that the bonding position of the vinyl group is four. In the case where the number of hydroxyl groups is an integer of 2 or more, it may be a combination of any bonding positions.

羥基中之取代氫原子之酸解離性基,例如與前述為相同之內容等,三級烷酯型酸解離性基或縮醛型酸解離性基 為佳,以縮醛型酸解離性基為更佳。 An acid-dissociable group of a substituted hydrogen atom in a hydroxyl group, for example, the same as described above, a tertiary alkyl ester type acid dissociable group or an acetal type acid dissociable group Preferably, the acetal acid dissociable group is more preferred.

含有酸解離性基之取代基,例如,由酸解離性基與2價之鍵結基所構成之基等。2價之鍵結基,例如,與前述式(a1-0-2)中之Y2中之2價之鍵結基為相同之內容等,特別是以酸解離性基側的末端結構為羰氧基之基為佳。該情形中,以該羰氧基之氧原子(-O-)鍵結酸解離性基者為佳。 The substituent containing an acid dissociable group is, for example, a group composed of an acid dissociable group and a divalent bond group. The divalent bond group is, for example, the same as the two-valent bond group in Y 2 in the above formula (a1-0-2), and particularly the terminal structure of the acid dissociable base side is carbonyl. The base of the oxy group is preferred. In this case, it is preferred that the acid-dissociable group is bonded to the oxygen atom (-O-) of the carbonyloxy group.

含有酸解離性基之取代基,例如,R11’-O-C(=O)-所表示之基、R11’-O-C(=O)-R12’-所表示之基為佳。式中,R11’為酸解離性基,R12’為直鏈狀或支鏈狀之伸烷基。 The substituent having an acid-cleavable group is preferably a group represented by R 11 ' -OC(=O)- or a group represented by R 11 ' -OC(=O)-R 12' -. In the formula, R 11 ' is an acid-dissociable group, and R 12 ' is a linear or branched alkylene group.

R11’中之酸解離性基,以三級烷酯型酸解離性基或縮醛型酸解離性基為佳,以三級烷酯型酸解離性基為更佳。該三級烷酯型酸解離性基之較佳例示,如前述之-C(R71)(R72)(R73)所表示之脂肪族支鏈狀酸解離性基、式(1-1)~(1-9)所表示之基、式(2-1)~(2-6)所表示之基等。 The acid dissociable group in R 11 ' is preferably a tertiary alkyl ester type acid dissociable group or an acetal type acid dissociable group, and more preferably a tertiary alkyl ester type acid dissociable group. A preferred example of the tertiary alkyl ester type acid dissociable group is an aliphatic branched acid dissociable group represented by -C(R 71 )(R 72 )(R 73 ), and the formula (1-1) ) The base represented by ~(1-9), the base represented by the formula (2-1) to (2-6), and the like.

R12’中之伸烷基,例如,伸甲基、伸乙基、伸三甲基、伸四甲基、1,1-二甲基伸乙基等。R12’,以直鏈狀之伸烷基為佳。 The alkyl group in R 12 ' , for example, a methyl group, an ethyl group, a trimethyl group, a tetramethyl group, a 1,1-dimethylmethyl group, and the like. R 12 ' is preferably a linear alkyl group.

{結構單位(a13)} {Structural unit (a13)}

結構單位(a13)為,α位之碳原子所鍵結之氫原子可被取代基所取代、萘環所鍵結之氫原子可被羥基以外之取代基所取代之乙烯基(羥基萘)(以下,(α取代)乙 烯基(羥基萘))所衍生之結構單位之羥基中之氫原子被含有酸解離性基或酸解離性基之取代基取代所得之結構單位。 The structural unit (a13) is a vinyl group (hydroxynaphthalene) in which a hydrogen atom to which a carbon atom of the α-position is bonded may be substituted by a substituent, and a hydrogen atom to which a naphthalene ring is bonded may be substituted with a substituent other than a hydroxyl group ( Following, (α substituted) B The structural unit in which a hydrogen atom in a hydroxyl group of a structural unit derived from an alkenyl group (hydroxynaphthalene) is substituted with a substituent containing an acid dissociable group or an acid dissociable group.

「乙烯基(羥基萘)」為,萘環鍵結1個乙烯基,與至少1個羥基之化合物。乙烯基,可鍵結於萘環之1位,或鍵結於2位亦可。萘環所鍵結之羥基之數,以1~3為佳,以1為特佳。萘環中之羥基的鍵結位置並未有特別限定。乙烯基鍵結於萘環之1位或2位之情形,以鍵結於萘環之5~8位之任一者為佳。特別是羥基之數為1個之情形,以鍵結於萘環之5~7位之任一者為佳,以5或6位為佳。羥基之數為2以上之整數之情形,其可為任意鍵結位置之組合。 "Vinyl (hydroxynaphthalene)" is a compound in which a naphthalene ring is bonded to one vinyl group and at least one hydroxyl group. The vinyl group may be bonded to the 1 position of the naphthalene ring or may be bonded to the 2 position. The number of hydroxyl groups bonded to the naphthalene ring is preferably from 1 to 3, and particularly preferably from 1. The bonding position of the hydroxyl group in the naphthalene ring is not particularly limited. In the case where the vinyl group is bonded to the 1 or 2 position of the naphthalene ring, it is preferred to bond to any of the 5 to 8 positions of the naphthalene ring. In particular, in the case where the number of hydroxyl groups is one, it is preferred to bond to any of the 5 to 7 positions of the naphthalene ring, and it is preferably 5 or 6 positions. In the case where the number of hydroxyl groups is an integer of 2 or more, it may be a combination of any bonding positions.

結構單位(a13)中,羥基中之取代氫原子之酸解離性基、含有酸解離性基之取代基,例如,分別與前述結構單位(a12)之說明所列舉者為相同之內容等。 In the structural unit (a13), the acid-dissociable group of the substituted hydrogen atom in the hydroxyl group and the substituent containing the acid-dissociable group are, for example, the same as those described in the description of the structural unit (a12).

(A1)成份所含之結構單位(a1)可為1種,或2種以上皆可。 The structural unit (a1) contained in the component (A1) may be one type or two or more types.

(A1)成份中,結構單位(a1)之比例,相對於構成(A1)成份之全結構單位,以15~70莫耳%為佳,以15~60莫耳%為較佳,以20~55莫耳%為更佳。於下限值以上時,作為光阻組成物之際,可容易得到圖型,亦可提高感度、解析性、圖型形狀等微影蝕刻特性。又,上限值以下時,可取得與其他結構單位之平衡。 In the component (A1), the ratio of the structural unit (a1) is preferably 15 to 70 mol%, more preferably 15 to 60 mol%, and 20 to 20% of the total structural unit constituting the component (A1). 55% of the moles is better. When it is more than the lower limit value, when it is a photoresist composition, the pattern can be easily obtained, and the lithographic etching characteristics such as sensitivity, resolution, and pattern shape can be improved. Moreover, when it is less than the upper limit, the balance with other structural units can be acquired.

(結構單位(a2)) (Structural unit (a2))

(A1)成份,除結構單位(a1)以外,可再具有含有含-SO2-之環式基或含有含內酯之環式基的結構單位(a2)為佳。 The component (A1) may have, in addition to the structural unit (a1), a structural unit (a2) containing a ring group containing -SO 2 - or a ring group containing a lactone.

結構單位(a2)之含-SO2-之環式基或內酯環式基,於(A1)成份作為光阻膜之形成所使用之情形中,就提高光阻膜與基板之密著性之觀點為有效者。又,就提高與鹼顯影液等含有水之顯影液之親和性等觀點,於鹼顯影製程中為有效者。 The structural unit (a2) contains a ring group of a -SO 2 - or a lactone ring group, and in the case where the component (A1) is used as a photoresist film, the adhesion between the photoresist film and the substrate is improved. The view is valid. In addition, it is effective in an alkali development process from the viewpoint of improving the affinity with a developer containing water such as an alkali developer.

又,前述結構單位(a1)於其結構中含有含-SO2-之環式基或含內酯之環式基之情形,該結構單位雖相當於結構單位(a2),但此情形中,該些結構單位視為相當於結構單位(a1),而不相當於結構單位(a2)者。 Further, the structural unit (a1) has a ring-form group containing -SO 2 - or a ring-form group containing a lactone in the structure, and the structural unit corresponds to the structural unit (a2), but in this case, These structural units are considered to correspond to the structural unit (a1) and not to the structural unit (a2).

其中,「含-SO2-之環式基」係指,該環骨架中含有含-SO2-之環的環式基之意,具體而言,-SO2-中之硫原子(S)形成為環式基之環骨架中的一部份之環式基。以該環骨架中含有含-SO2-之環作為1個單位之環的方式計數,僅為該環之情形稱為單環式基,再具有其他環結構的情形,無論其結構為何,皆稱為多環式基。含-SO2-之環式基,可為單環式亦可、多環式亦可。 Here, the "cyclic group containing -SO 2 -" means that the ring skeleton contains a ring group containing a ring of -SO 2 -, specifically, a sulfur atom in -SO 2 - (S) A ring group formed as a part of a ring skeleton of a ring group. Counting the ring containing -SO 2 - in the ring skeleton as a ring of one unit, and only the case of the ring is called a monocyclic group, and other ring structures are used, regardless of the structure. It is called a polycyclic group. The ring group containing -SO 2 - may be a single ring type or a multiple ring type.

含-SO2-之環式基,特別是該環骨架中含有-O-SO2-之環式基,即,以含有-O-SO2-中之-O-S-為形成環骨架之一部份的磺內酯(sultone)環之環式基為佳。 Containing -SO 2 - of cyclic groups, especially the cyclic skeleton containing -O-SO 2 - group of cyclic, i.e., containing -O-SO 2 - in the -OS- to form a skeleton of the ring The ring group of the sultone ring is preferred.

含-SO2-之環式基,碳數以3~30為佳,以4~20為 較佳,以4~15為更佳,以4~12為特佳。但,該碳數為構成環骨架之碳原子的數目,為不包含取代基中之碳數者。 The ring group containing -SO 2 - has a carbon number of 3 to 30, preferably 4 to 20, more preferably 4 to 15, and 4 to 12 is particularly preferred. However, the carbon number is the number of carbon atoms constituting the ring skeleton, and is the number of carbon atoms in the substituent.

含-SO2-之環式基,可為含有-SO2-之脂肪族環式基亦可、含有-SO2-之芳香族環式基亦可。較佳為含有-SO2-之脂肪族環式基。 Containing -SO 2 - group of cyclic, may contain -SO 2 - of the aliphatic cyclic group may contain -SO 2 - group of the aromatic ring also. It is preferably an aliphatic cyclic group containing -SO 2 -.

含-SO2-之脂肪族環式基,例如由構成其環骨架之碳原子中之一部份被-SO2-或-O-SO2-所取代之脂肪族烴環去除至少1個氫原子所得之基等。更具體而言,例如由構成其環骨架之-CH2-被-SO2-所取代之脂肪族烴環去除至少1個氫原子所得之基、由構成其環之-CH2-CH2-被-O-SO2-所取代之脂肪族烴環去除至少1個氫原子所得之基等。 An aliphatic cyclic group containing -SO 2 -, for example, at least one hydrogen is removed from an aliphatic hydrocarbon ring in which one of the carbon atoms constituting the ring skeleton is substituted by -SO 2 - or -O-SO 2 - The basis of the atom, etc. More specifically, for example, a group obtained by removing at least one hydrogen atom from an aliphatic hydrocarbon ring in which -CH 2 - which is a ring skeleton is substituted by -SO 2 - is formed, and -CH 2 -CH 2 - which constitutes a ring thereof A group obtained by removing at least one hydrogen atom from an aliphatic hydrocarbon ring substituted by -O-SO 2 -.

該脂環式烴環,其碳數以3~20為佳,以3~12為更佳。 The alicyclic hydrocarbon ring preferably has a carbon number of 3 to 20, more preferably 3 to 12.

該脂環式烴環,可為多環式亦可、單環式亦可。單環式之脂環式烴基,以由碳數3~6之單環鏈烷去除2個之氫原子所得之基為佳,該單環鏈烷,例如環戊烷、環己烷等例示。多環式之脂環式烴環,以由碳數7~12之多環鏈烷去除2個之氫原子所得之基為佳,該多環鏈烷,具體而言,例如金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等。 The alicyclic hydrocarbon ring may be a multi-ring type or a single-ring type. The monocyclic alicyclic hydrocarbon group is preferably a group obtained by removing two hydrogen atoms from a monocyclic alkane having 3 to 6 carbon atoms, and examples of the monocyclic alkane such as cyclopentane and cyclohexane are exemplified. The polycyclic alicyclic hydrocarbon ring is preferably a group obtained by removing two hydrogen atoms from a cycloalkane having 7 to 12 carbon atoms, specifically, for example, adamantane or rhodium. Alkane, isodecane, tricyclodecane, tetracyclododecane, and the like.

含-SO2-之環式基,可具有取代基。該取代基,例如,烷基、烷氧基、鹵素原子、鹵化烷基、羥基、氧原子(=O)、-COOR”、-OC(=O)R”、羥烷基、氰基等。 The cyclic group containing -SO 2 - may have a substituent. The substituent is, for example, an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, an oxygen atom (=O), -COOR", -OC(=O)R", a hydroxyalkyl group, a cyano group or the like.

作為該取代基之烷基,以碳數1~6之烷基為佳。該烷基以直鏈狀或支鏈狀為佳。具體而言,例如,甲基、乙基、丙基、異丙基、n-丁基、異丁基、tert-丁基、戊基、異戊基、新戊基、己基等。該些之中,又以甲基或乙基為佳,以甲基為特佳。 The alkyl group as the substituent is preferably an alkyl group having 1 to 6 carbon atoms. The alkyl group is preferably linear or branched. Specifically, for example, a methyl group, an ethyl group, a propyl group, an isopropyl group, an n-butyl group, an isobutyl group, a tert-butyl group, a pentyl group, an isopentyl group, a neopentyl group, a hexyl group and the like. Among them, a methyl group or an ethyl group is preferred, and a methyl group is particularly preferred.

作為該取代基之烷氧基,以碳數1~6之烷氧基為佳。該烷氧基以直鏈狀或支鏈狀為佳。具體而言,例如前述作為取代基之烷基所列舉之烷基鍵結氧原子(-O-)所得之基等。 The alkoxy group as the substituent is preferably an alkoxy group having 1 to 6 carbon atoms. The alkoxy group is preferably linear or branched. Specifically, for example, the group obtained by the alkyl group-bonded oxygen atom (-O-) exemplified as the alkyl group as the substituent is used.

作為該取代基之鹵素原子,例如,氟原子、氯原子、溴原子、碘原子等,又以氟原子為佳。 As the halogen atom of the substituent, for example, a fluorine atom, a chlorine atom, a bromine atom, an iodine atom or the like is preferably a fluorine atom.

該取代基之鹵化烷基,例如,前述烷基之氫原子的一部份或全部被前述鹵素原子所取代之基等。 The halogenated alkyl group of the substituent is, for example, a group in which a part or all of a hydrogen atom of the alkyl group is substituted by the aforementioned halogen atom.

作為該取代基之鹵化烷基,例如前述作為取代基之烷基所列舉之烷基中的一部份或全部氫原子被前述鹵素原子所取代之基等。該鹵化烷基以氟化烷基為佳,特別是以全氟烷基為佳。 The halogenated alkyl group as the substituent is, for example, a group in which a part or all of hydrogen atoms in the alkyl group exemplified as the alkyl group as the substituent is substituted by the halogen atom. The halogenated alkyl group is preferably a fluorinated alkyl group, particularly preferably a perfluoroalkyl group.

前述-COOR”、-OC(=O)R”中之R”,無論任一者皆為氫原子或碳數1~15之直鏈狀、支鏈狀或環狀之烷基。 Any of R-" in the above -COOR" and -OC(=O)R" is a hydrogen atom or a linear, branched or cyclic alkyl group having 1 to 15 carbon atoms.

R”為直鏈狀或支鏈狀之烷基之情形,其碳數以1~10為佳,以碳數1~5為更佳,以甲基或乙基為特佳。 When R" is a linear or branched alkyl group, the carbon number is preferably from 1 to 10, more preferably from 1 to 5 carbon atoms, and particularly preferably methyl or ethyl.

R”為環狀之烷基之情形,其碳數以3~15為佳,以碳數4~12為更佳,以碳數5~10為最佳。具體而言,例如由可被氟原子或氟化烷基所取代,或未被取代之單環鏈 烷,或二環鏈烷、三環鏈烷、四環鏈烷等多環鏈烷去除1個以上之氫原子所得之基等例示。更具體而言,例如,由環戊烷、環己烷等單環鏈烷,或金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等多環鏈烷去除1個以上之氫原子所得之基等。 When R" is a cyclic alkyl group, the carbon number is preferably from 3 to 15, and the carbon number is preferably from 4 to 12, and the carbon number is preferably from 5 to 10. Specifically, for example, it may be fluorine. a single-ring chain substituted with an atom or a fluorinated alkyl group, or unsubstituted A group obtained by removing one or more hydrogen atoms from a polycyclic alkane such as a dicycloalkane, a tricycloalkane or a tetracycloalkane is exemplified. More specifically, for example, a monocyclic alkane such as cyclopentane or cyclohexane, or a polycyclic alkane such as adamantane, norbornane, isodecane, tricyclodecane or tetracyclododecane is removed. The base obtained by more than one hydrogen atom, and the like.

作為該取代基之羥烷基,以碳數為1~6者為佳,具體而言,例如由前述作為取代基之烷基所列舉之烷基中之至少1個氫原子被羥基所取代之基等。 The hydroxyalkyl group as the substituent is preferably a carbon number of 1 to 6. Specifically, for example, at least one hydrogen atom of the alkyl group exemplified by the alkyl group as the substituent is substituted by a hydroxyl group. Base.

含-SO2-之環式基,更具體而言,例如下述通式(3-1)~(3-4)所表示之基等。 The ring group containing -SO 2 -, more specifically, for example, a group represented by the following general formulae (3-1) to (3-4).

[式中,A’為可含有氧原子或硫原子之碳數1~5之伸烷基、氧原子或硫原子,z為0~2之整數,R27為烷基、烷氧基、鹵化烷基、羥基、-COOR”、-OC(=O)R”、羥烷基或氰基,R”為氫原子或烷基]。 [wherein A' is an alkylene group, an oxygen atom or a sulfur atom having 1 to 5 carbon atoms which may contain an oxygen atom or a sulfur atom, z is an integer of 0 to 2, and R 27 is an alkyl group, an alkoxy group, or a halogenated group. Alkyl, hydroxy, -COOR", -OC(=O)R", hydroxyalkyl or cyano, R" is a hydrogen atom or an alkyl group].

前述通式(3-1)~(3-4)中,A’為可含有氧原子(-O-)或硫原子(-S-)之碳數1~5之伸烷基、氧原子或硫原子。 In the above formula (3-1) to (3-4), A' is an alkylene group having 1 to 5 carbon atoms which may contain an oxygen atom (-O-) or a sulfur atom (-S-), or an oxygen atom or Sulfur atom.

A’中之碳數1~5之伸烷基,以直鏈狀或支鏈狀之伸烷基為佳,以伸甲基、伸乙基、n-伸丙基、異伸丙基等。 The alkyl group having 1 to 5 carbon atoms in A' is preferably a linear or branched alkyl group, and is a methyl group, an ethyl group, an n-propyl group, an iso-propyl group or the like.

該伸烷基含有氧原子或硫原子之情形,其具體例如,前述伸烷基的末端或碳原子間介有-O-或-S-所得之基等,例如,-O-CH2-、-CH2-O-CH2-、-S-CH2-、-CH2-S-CH2-等。 The alkylene group contains an oxygen atom or a sulfur atom, and specifically, for example, a terminal derived from the alkyl group or a group in which a carbon atom is interposed with -O- or -S-, for example, -O-CH 2 -, -CH 2 -O-CH 2 -, -S-CH 2 -, -CH 2 -S-CH 2 -, and the like.

A’,以碳數1~5之伸烷基或-O-為佳,以碳數1~5之伸烷基為較佳,以伸甲基為最佳。 A' is preferably an alkylene group having a carbon number of 1 to 5 or -O-, and preferably an alkylene group having 1 to 5 carbon atoms, and preferably a methyl group.

z可為0~2之任一者皆可,又以0為最佳。 z can be any of 0~2, and 0 is the best.

z為2之情形,複數之R27可分別為相同亦可、相異者亦可。 In the case where z is 2, the plural R 27 may be the same or different.

R27中之烷基、烷氧基、鹵化烷基、-COOR”、-OC(=O)R”、羥烷基,分別與前述-SO2-含有環式基所可具有之取代基中所列舉之烷基、烷氧基、鹵化烷基、-COOR”、-OC(=O)R”、羥烷基為相同之內容等。 In R 27 the alkyl, alkoxy, halogenated alkyl group, -COOR ", - OC (= O) R", a hydroxyl group, respectively, and the -SO 2 - group containing the cyclic group may have the substituent The alkyl group, alkoxy group, halogenated alkyl group, -COOR", -OC(=O)R", and hydroxyalkyl group are the same contents.

以下為前述通式(3-1)~(3-4)所表示之環式基之具體例示。又,式中之「Ac」表示乙醯基。 The following are specific examples of the ring group represented by the above formulas (3-1) to (3-4). Further, "Ac" in the formula represents an ethyl group.

含-SO2-之環式基,於上述之中,又以前述通式(3-1)所表示之基為佳,以使用由以前述化學式(3-1-1)、(3-1-18)、(3-3-1)及(3-4-1)之任一者所表示之基所成之群所選出之至少一種為較佳,以前述化學式(3-1-1)所表示之基為最佳。 The cyclic group containing -SO 2 -, in the above, is preferably a group represented by the above formula (3-1), and is used by the above chemical formula (3-1-1), (3-1) At least one selected from the group consisting of -18), (3-3-1) and (3-4-1) is preferably selected from the above chemical formula (3-1-1) The basis indicated is the best.

「含內酯之環式基」係指,於其環骨架中含有含-O-C(=O)-之環(內酯環)的環式基。以內酯環作為第一個環進行計數時,僅有內酯環之情形稱為單環式基,再具有其他環結構的情形,無論其結構為何,皆稱為多環式基。含內酯之環式基,可為單環式基亦可、多環式基亦可。 The "per lactone-containing cyclic group" means a cyclic group containing a ring containing -O-C(=O)- (lactone) in the ring skeleton. When the lactone ring is counted as the first ring, the case where only the lactone ring is called a monocyclic group, and the case of other ring structures, regardless of the structure, is called a polycyclic group. The cyclic group containing a lactone may be a monocyclic group or a polycyclic group.

結構單位(a2)中之內酯環式基,並未有特別之限定,而可使用任意之內容。具體而言,含內酯之單環式基,為由4~6員環內酯去除1個氫原子所得之基,例如,由β-丙內酯去除1個氫原子所得之基、由γ-丁內酯去除1個氫原子所得之基、由δ-戊內酯去除1個氫原子所得之基等。又,含內酯之多環式基,例如由具有內酯環之二環鏈烷、三環鏈烷、四環鏈烷去除1個氫原子所得之基等。 The lactone ring group in the structural unit (a2) is not particularly limited, and any content can be used. Specifically, the monocyclic group containing a lactone is a group obtained by removing one hydrogen atom from 4 to 6 membered ring lactones, for example, a group obtained by removing one hydrogen atom from β-propiolactone, and γ. a group obtained by removing one hydrogen atom from butyrolactone, a group obtained by removing one hydrogen atom from δ-valerolactone, and the like. Further, the polycyclic group having a lactone is, for example, a group obtained by removing one hydrogen atom from a bicycloalkane having a lactone ring, a tricycloalkane or a tetracycloalkane.

結構單位(a2),只要為具有含-SO2-之環式基或含內酯之環式基之基時,其他部份之結構並未有特別之限定,又以由α位之碳原子所鍵結之氫原子可被取代基所取 代之丙烯酸酯所衍生之結構單位,且含有含-SO2-之環式基的結構單位(a2S),及α位之碳原子所鍵結之氫原子可被取代基所取代之丙烯酸酯所衍生之結構單位,且含有含內酯之環式基的結構單位(a2L)所成之群所選出之至少1種的結構單位為佳。 The structural unit (a2), as long as it has a ring group containing -SO 2 - or a ring group containing a lactone, the structure of the other part is not particularly limited, and the carbon atom of the alpha position The bonded hydrogen atom may be a structural unit derived from an acrylate substituted with a substituent, and has a structural unit (a2 S ) containing a ring group of -SO 2 -, and a carbon atom bonded at the α position The hydrogen atom may be a structural unit derived from an acrylate substituted with a substituent, and at least one structural unit selected from the group consisting of a structural unit (a2 L ) containing a lactone-containing cyclic group is preferred.

‧結構單位(a2S): ‧Structural unit (a2 S ):

結構單位(a2S)之例示,更具體而言,例如下述通式(a2-0)所表示之結構單位等。 An example of the structural unit (a2 S ) is more specifically, for example, a structural unit represented by the following general formula (a2-0).

[式中,R為氫原子、碳數1~5之烷基或碳數1~5之鹵化烷基,R28為含-SO2-之環式基,R29為單鍵或2價之鍵結基]。 Wherein R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms or a halogenated alkyl group having 1 to 5 carbon atoms; R 28 is a cyclic group containing -SO 2 -, and R 29 is a single bond or a divalent group. Bond base].

式(a2-0)中,R與前述為相同之內容。 In the formula (a2-0), R is the same as the above.

R28,與前述所列舉之含-SO2-之環式基為相同之內容。 R 28 is the same as the above-mentioned ring-form group containing -SO 2 -.

R29可為單鍵、2價之鍵結基之任一者皆可。就使本發明之效果更優良之觀點,以2價之鍵結基為佳。 R 29 may be either a single bond or a divalent bond group. In view of making the effect of the present invention more excellent, a divalent bond group is preferred.

R29中之2價之鍵結基,並未有特別之限定,例如,與前述式(a1-0-2)中之Y2中之2價之鍵結基為相同之內 容等。該些之中,又以伸烷基,或含有酯鍵結(-C(=O)-O-)者為佳。 The divalent bond group in R 29 is not particularly limited, and for example, it is the same as the bond group of the two valences in Y 2 in the above formula (a1-0-2). Among them, those having an alkyl group or an ester bond (-C(=O)-O-) are preferred.

該伸烷基,以直鏈狀或支鏈狀之伸烷基為佳。具體而言,例如與前述Y2中之脂肪族烴基所列舉之直鏈狀之伸烷基、支鏈狀之伸烷基為相同之內容等。 The alkyl group is preferably a linear or branched alkyl group. Specifically, for example, the linear alkyl group and the branched alkyl group which are exemplified in the aliphatic hydrocarbon group in the above Y 2 are the same.

含有酯鍵結之2價之鍵結基,特別是以通式:-R30-C(=O)-O-[式中,R30為2價之鍵結基]所表示之基為佳。即,結構單位(a2S),以下述通式(a2-0-1)所表示之結構單位為佳。 a divalent bond group containing an ester bond, particularly preferably a group represented by the formula: -R 30 -C(=O)-O-[wherein R 30 is a divalent bond group] . That is, the structural unit (a2 S ) is preferably a structural unit represented by the following general formula (a2-0-1).

[式中,R及R28分別與前述為相同之內容,R30為2價之鍵結基]。 [wherein R and R 28 are each the same as described above, and R 30 is a divalent bond group].

R30,並未有特別之限定,例如,與前述式(a1-0-2)中之Y2中之2價之鍵結基為相同之內容等。 R 30 is not particularly limited, and for example, it is the same as the two-valent bond group in Y 2 in the above formula (a1-0-2).

R30之2價之鍵結基,以直鏈狀或支鏈狀之伸烷基、結構中含有環之脂肪族烴基,或含雜原子之2價之鍵結基為佳,以直鏈狀或支鏈狀之伸烷基,或含有作為雜原子的氧原子之2價之鍵結基為佳。 a two-valent bond group of R 30 , preferably a linear or branched alkyl group, an aliphatic hydrocarbon group having a ring in the structure, or a divalent bond group containing a hetero atom, preferably in a linear form It is preferably a branched alkyl group or a divalent bond group containing an oxygen atom as a hetero atom.

直鏈狀之伸烷基,以伸甲基或伸乙基為佳,以伸甲基 為特佳。 a linear alkyl group, preferably methyl or ethyl, to methyl It is especially good.

支鏈狀之伸烷基,以烷基伸甲基或烷基伸乙基為佳,以-CH(CH3)-、-C(CH3)2-或-C(CH3)2CH2-為特佳。 a branched alkyl group, preferably an alkyl methyl group or an alkyl group ethyl group, with -CH(CH 3 )-, -C(CH 3 ) 2 - or -C(CH 3 ) 2 CH 2 - Very good.

含有氧原子之2價之鍵結基,以含有醚鍵結或酯鍵結之2價之鍵結基為佳,以前述-Y21-O-Y22-、-[Y21-C(=O)-O]m’-Y22-或-Y21-O-C(=O)-Y22-為更佳。Y21、Y22、m’分別與前述為相同之內容。 The divalent bond group containing an oxygen atom is preferably a divalent bond group containing an ether bond or an ester bond, and the above -Y 21 -OY 22 -, -[Y 21 -C(=O) -O] m' -Y 22 - or -Y 21 -OC(=O)-Y 22 - is more preferred. Y 21 , Y 22 , and m' are the same as those described above.

結構單位(a2S),特別是以下述通式(a2-0-11)或(a2-0-12)所表示之結構單位為佳,以式(a2-0-12)所表示之結構單位為更佳。 The structural unit (a2 S ) is particularly preferably a structural unit represented by the following formula (a2-0-11) or (a2-0-12), and a structural unit represented by the formula (a2-0-12) For better.

[式中,R、A’、R27、z及R30分別與前述為相同之內容]。 [wherein, R, A', R 27 , z and R 30 are respectively the same as described above].

式(a2-0-11)中,A’以伸甲基、氧原子(-O-)或硫原子(-S-)為佳。 In the formula (a2-0-11), A' is preferably a methyl group, an oxygen atom (-O-) or a sulfur atom (-S-).

R30,以直鏈狀或支鏈狀之伸烷基,或含有氧原子之2價之鍵結基為佳。R30中之直鏈狀或支鏈狀之伸烷基、含有氧原子之2價之鍵結基,分別與前述所列舉之直鏈狀或支鏈狀之伸烷基、含有氧原子之2價之鍵結基為相同之內容等。 R 30 is preferably a linear or branched alkyl group or a divalent bond group containing an oxygen atom. a linear or branched alkyl group in R 30 and a divalent linking group containing an oxygen atom, respectively, and a linear or branched alkyl group as described above, containing an oxygen atom The bond base of the price is the same content and the like.

式(a2-0-12)所表示之結構單位,特別是以下述通式(a2-0-12a)或(a2-0-12b)所表示之結構單位為佳。 The structural unit represented by the formula (a2-0-12) is particularly preferably a structural unit represented by the following formula (a2-0-12a) or (a2-0-12b).

[式中,R及A’分別與前述為相同之內容,c~e為各自獨立之1~3之整數]。 [wherein, R and A' are the same as described above, and c~e are independent integers of 1 to 3 respectively].

‧結構單位(a2L): ‧Structural unit (a2 L ):

結構單位(a2L)之例,例如,前述通式(a2-0)中之R28被含內酯之環式基所取代者等例示,更具體而言,例如下述通式(a2-1)~(a2-5)所表示之結構單位等。 In the example of the structural unit (a2 L ), for example, R 28 in the above formula (a2-0) is exemplified by a lactone-containing cyclic group, and the like, more specifically, for example, the following formula (a2- 1) The structural unit represented by ~(a2-5).

[式中,R為氫原子、碳數1~5之烷基或碳數1~5之鹵化烷基;R’為各自獨立之氫原子、烷基、烷氧基、鹵化烷基、羥基、-COOR”、-OC(=O)R”、羥烷基或氰基,R”為氫原子或烷基;R29為單鍵或2價之鍵結基,s”為0~2之整數;A”為可含有氧原子或硫原子之碳數1~5之伸烷基、氧原子或硫原子;m為0或1]。 Wherein R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms or a halogenated alkyl group having 1 to 5 carbon atoms; and R' is a hydrogen atom independently selected from the group consisting of an alkyl group, an alkoxy group, an alkyl halide group, and a hydroxyl group. -COOR", -OC(=O)R", hydroxyalkyl or cyano, R" is a hydrogen atom or an alkyl group; R 29 is a single bond or a divalent bond group, and s" is an integer from 0 to 2 ; A" is an alkyl, oxygen or sulfur atom having 1 to 5 carbon atoms which may contain an oxygen atom or a sulfur atom; m is 0 or 1].

通式(a2-1)~(a2-5)中之R,與前述為相同之內容。 R in the general formulae (a2-1) to (a2-5) is the same as described above.

R’中之烷基、烷氧基、鹵化烷基、-COOR”、-OC(=O)R”、羥烷基,分別與前述含-SO2-之環式基所可具有之取代基 中所列舉之烷基、烷氧基、鹵化烷基、-COOR”、-OC(=O)R”、羥烷基為相同之內容等。R”亦與前述為相同之內容。 An alkyl group, an alkoxy group, an alkyl halide group, a -COOR", -OC(=O)R", a hydroxyalkyl group in R', and a substituent which may be present in the above-mentioned ring-form group containing -SO 2 - The alkyl group, the alkoxy group, the alkyl halide group, the -COOR", the -OC(=O)R", and the hydroxyalkyl group are the same contents. R" is also the same as the foregoing.

R’,於考慮工業上容易取得等狀況時,以氫原子為佳。 R' is preferably a hydrogen atom when it is considered to be industrially easy to obtain.

A”,例如與前述通式(3-1)中之A’為相同之內容等。A”,以碳數1~5之伸烷基、氧原子(-O-)或硫原子(-S-)為佳,以碳數1~5之伸烷基或-O-為更佳。碳數1~5之伸烷基,以伸甲基或二甲基伸甲基為較佳,以伸甲基為最佳。 A" is, for example, the same as A' in the above formula (3-1). A", an alkyl group having 1 to 5 carbon atoms, an oxygen atom (-O-) or a sulfur atom (-S) -) is preferable, and an alkyl group or -O- having a carbon number of 1 to 5 is more preferable. The alkyl group having 1 to 5 carbon atoms is preferably a methyl group or a dimethyl group, and the methyl group is most preferred.

R29,與前述通式(a2-0)中之R29為相同之內容。 R 29 is the same as R 29 in the above formula (a2-0).

式(a2-1)中,s”以1~2為佳。 In the formula (a2-1), s" is preferably 1 or 2.

以下為,前述通式(a2-1)~(a2-5)所表示之結構單位的具體例示。以下各式中,Rα表示氫原子、甲基或三氟甲基。 The following is a specific example of the structural unit represented by the above formulas (a2-1) to (a2-5). In the following formulae, R α represents a hydrogen atom, a methyl group or a trifluoromethyl group.

結構單位(a2L),以由前述通式(a2-1)~(a2-5)所表示之結構單位所成之群所選出之至少1種為佳,以由通式(a2-1)~(a2-3)所表示之結構單位所成之群所選出之至少1種為較佳,以由前述通式(a2-1)或(a2-3)所表示之結構單位所成之群所選出之至少1種為特佳。 The structural unit (a2 L ) is preferably at least one selected from the group consisting of the structural units represented by the above formulas (a2-1) to (a2-5), and is represented by the general formula (a2-1) At least one selected from the group consisting of structural units represented by ~(a2-3) is preferably a group formed by the structural unit represented by the above formula (a2-1) or (a2-3) At least one of the selected ones is particularly good.

其中,又以由前述式(a2-1-1)、(a2-1-2)、(a2-2-1)、(a2-2-7)、(a2-2-12)、(a2-2-14)、(a2-3-1)、(a2-3-5)所表示之結構單位所成之群所選出之至少1種為佳。 Among them, by the above formula (a2-1-1), (a2-1-2), (a2-2-1), (a2-2-7), (a2-2-12), (a2- It is preferable that at least one selected from the group consisting of structural units represented by 2-14) and (a2-3-1) and (a2-3-5) is preferable.

又,結構單位(a2L),以下述式(a2-6)~(a2-7)所表示之結構單位亦佳。 Further, the structural unit (a2 L ) is preferably a structural unit represented by the following formulas (a2-6) to (a2-7).

[式中,R、R29與前述為相同之內容]。 [wherein, R and R 29 are the same as those described above].

(A1)成份所具有之結構單位(a2),可為1種或2種以上皆可。例如,結構單位(a2),可僅使用結構單位(a2S)亦可、僅使用結構單位(a2L)亦可,或將該些合併使用亦可。又,結構單位(a2S)或結構單位(a2L),可單獨使用1種亦可,或將2種以上組合使用亦可。 (A1) The structural unit (a2) of the component may be one type or two or more types. For example, the structural unit (a2) may be used only in the structural unit (a2 S ), or only in the structural unit (a2 L ), or may be used in combination. Further, the structural unit (a2 S ) or the structural unit (a2 L ) may be used singly or in combination of two or more.

(A1)成份具有結構單位(a2)之情形,結構單位(a2)之比例,相對於構成(A1)成份之全結構單位之合計,以1~80莫耳%為佳,以10~70莫耳%為較佳,以10~65莫耳%為更佳,以10~60莫耳%為特佳。於下限值以上時,含有結構單位(a2)時,可得到充分之效果,於上 限值以下時,可取得與其他結構單位之平衡,也可得到DOF、CDU等種種良好之微影蝕刻特性及圖型形狀。 (A1) The composition has the structural unit (a2), and the ratio of the structural unit (a2) is preferably 1 to 80 mol%, and 10 to 70 mol, based on the total of the structural units constituting the (A1) component. The ear % is preferably, preferably from 10 to 65 mol %, and particularly preferably from 10 to 60 mol %. When it is more than the lower limit value, when the structural unit (a2) is contained, a sufficient effect can be obtained. When the value is less than the limit, a balance with other structural units can be obtained, and various fine lithographic etching characteristics and pattern shapes such as DOF and CDU can be obtained.

(結構單位(a3)) (Structural unit (a3))

(A1)成份,除結構單位(a1)以外,或結構單位(a1)及(a2)以外,亦可具有含有極性基之結構單位(a3)。(A1)成份具有結構單位(a3)時,可使曝光後之(A1)成份的極性更向上提升。極性之提升,特別是鹼顯影製程之情形中,可賦予提高解析性等能力。 The component (A1) may have a structural unit (a3) containing a polar group in addition to the structural unit (a1) or the structural units (a1) and (a2). When the component (A1) has a structural unit (a3), the polarity of the (A1) component after exposure can be increased upward. In the case of an increase in polarity, particularly in the case of an alkali developing process, the ability to improve the resolution can be imparted.

極性基例如,-OH、-COOH、-CN、-SO2NH2、-CONH2等。包含-COOH之基,其亦包含(α取代)丙烯酸之結構單位。 The polar group is, for example, -OH, -COOH, -CN, -SO 2 NH 2 , -CONH 2 or the like. A group comprising -COOH, which also comprises a structural unit of (alpha substituted) acrylic acid.

結構單位(a3),以含有氫原子的一部份被極性基所取代之烴基的結構單位為佳。該烴基,可為脂肪族烴基亦可、芳香族烴基亦可。其中,該烴基又以脂肪族烴基為更佳。 The structural unit (a3) preferably has a structural unit of a hydrocarbon group in which a part of a hydrogen atom is substituted by a polar group. The hydrocarbon group may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group. Among them, the hydrocarbon group is more preferably an aliphatic hydrocarbon group.

該烴基中之脂肪族烴基,例如碳數1~10之直鏈狀或支鏈狀之烴基(較佳為伸烷基),或脂肪族環式基(單環式基、多環式基)等。 An aliphatic hydrocarbon group in the hydrocarbon group, for example, a linear or branched hydrocarbon group having 1 to 10 carbon atoms (preferably an alkylene group), or an aliphatic cyclic group (monocyclic group or polycyclic group) Wait.

該脂肪族環式基(單環式基、多環式基),例如可由ArF準分子雷射用光阻組成物用之樹脂中,被多數提案之成份中適當地選擇使用。該脂肪族環式基之碳數以3~30為佳,以5~30為較佳,以5~20為更佳,以6~15為特佳,以6~12為最佳。具體而言,例如,由單環鏈烷去除 2個以上之氫原子所得之基;由二環鏈烷、三環鏈烷、四環鏈烷等多環鏈烷去除2個以上之氫原子所得之基等。更具體而言,例如,由環戊烷、環己烷等單環鏈烷去除2個以上之氫原子所得之基;由金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等多環鏈烷去除2個以上之氫原子所得之基等。該脂肪族環式基,可具有取代基,或不具有取代基皆可。取代基例如,碳數1~5之烷基、氟原子、碳數1~5之氟化烷基等。 The aliphatic cyclic group (monocyclic group or polycyclic group) can be suitably selected from most of the proposed components, for example, a resin which can be used for a resist composition for an ArF excimer laser. The carbon number of the aliphatic ring group is preferably from 3 to 30, preferably from 5 to 30, more preferably from 5 to 20, most preferably from 6 to 15, and most preferably from 6 to 12. Specifically, for example, removed by a monocyclic alkane A group obtained by two or more hydrogen atoms; a group obtained by removing two or more hydrogen atoms from a polycyclic alkane such as a bicycloalkane, a tricycloalkane or a tetracycloalkane. More specifically, for example, a group obtained by removing two or more hydrogen atoms from a monocyclic alkane such as cyclopentane or cyclohexane; from adamantane, norbornane, isodecane, tricyclodecane, tetracyclic A group obtained by removing two or more hydrogen atoms from a polycyclic alkane such as dodecane. The aliphatic cyclic group may have a substituent or may have no substituent. The substituent is, for example, an alkyl group having 1 to 5 carbon atoms, a fluorine atom or a fluorinated alkyl group having 1 to 5 carbon atoms.

該烴基中之芳香族烴基為,至少具有1個芳香環之烴基。芳香環,只要為具有4n+2個π電子的環狀共軛系時,並未有特別之限定,其可為單環式或多環式皆可。芳香環之碳數以5~30為佳,以5~20為較佳,以6~15為更佳,以6~12為特佳。但,該碳數中,為不包含取代基中之碳數者。芳香環,具體而言,例如,苯、萘、蒽、菲等芳香族烴環;構成前述芳香族烴環之碳原子的一部份被雜原子所取代之芳香族雜環;等。芳香族雜環中之雜原子,例如,氧原子、硫原子、氮原子等。芳香族雜環,具體而言,例如,吡啶環、噻吩環等。 The aromatic hydrocarbon group in the hydrocarbon group is a hydrocarbon group having at least one aromatic ring. The aromatic ring is not particularly limited as long as it is a cyclic conjugated system having 4n+2 π electrons, and may be either a monocyclic ring or a polycyclic ring. The carbon number of the aromatic ring is preferably 5 to 30, preferably 5 to 20, more preferably 6 to 15, and particularly preferably 6 to 12. However, among the carbon numbers, those having no carbon number in the substituent are included. The aromatic ring is, for example, an aromatic hydrocarbon ring such as benzene, naphthalene, anthracene or phenanthrene; an aromatic heterocyclic ring which is a part of a carbon atom constituting the aromatic hydrocarbon ring and is substituted with a hetero atom; The hetero atom in the aromatic hetero ring is, for example, an oxygen atom, a sulfur atom, a nitrogen atom or the like. The aromatic heterocyclic ring is specifically, for example, a pyridine ring, a thiophene ring or the like.

作為2價烴基之芳香族烴基,具體而言,例如由前述芳香族烴環或芳香族雜環去除2個氫原子所得之基(伸芳基或伸雜芳基);含有2個以上芳香環之芳香族化合物(例如,聯苯基、茀等)去除2個氫原子所得之基;前述芳香環中之1個氫原子被伸烷基所取代之基(例如,苄基、苯基乙基、1-萘基甲基、2-萘基甲基、1- 萘基乙基、2-萘基乙基等芳烷基或雜芳烷基)中之芳香環再去除1個氫原子所得之基;等。前述芳香族烴環或芳香族雜環的取代氫原子之伸烷基的碳數,以1~4為佳,以1~2為較佳,以1為特佳。 Specific examples of the aromatic hydrocarbon group of the divalent hydrocarbon group include a group obtained by removing two hydrogen atoms from the aromatic hydrocarbon ring or the aromatic heterocyclic ring (such as an aryl group or a heteroaryl group); and two or more aromatic rings. a group obtained by removing two hydrogen atoms from an aromatic compound (for example, biphenyl group, hydrazine, etc.); a group in which one hydrogen atom in the above aromatic ring is substituted by an alkyl group (for example, benzyl group, phenylethyl group) , 1-naphthylmethyl, 2-naphthylmethyl, 1- a group obtained by removing one hydrogen atom from an aromatic ring in an aralkyl group or a heteroarylalkyl group such as a naphthylethyl group or a 2-naphthylethyl group; The carbon number of the alkyl group of the substituted hydrogen atom of the aromatic hydrocarbon ring or the aromatic hetero ring is preferably from 1 to 4, more preferably from 1 to 2, particularly preferably from 1 to 1.

該芳香族烴基,其可具有取代基。例如,鍵結於該芳香族烴基所具有之芳香環的氫原子可被取代基所取代等。該取代基,例如,烷基、烷氧基、鹵素原子、鹵化烷基、羥基、氧原子(=O)等。 The aromatic hydrocarbon group may have a substituent. For example, a hydrogen atom bonded to an aromatic ring of the aromatic hydrocarbon group may be substituted by a substituent or the like. The substituent is, for example, an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, an oxygen atom (=O) or the like.

前述作為取代基之烷基,以碳數1~5之烷基為佳,以甲基、乙基、丙基、n-丁基、tert-丁基為最佳。 The alkyl group as the substituent is preferably an alkyl group having 1 to 5 carbon atoms, and most preferably a methyl group, an ethyl group, a propyl group, an n-butyl group or a tert-butyl group.

前述作為芳香族烴基之取代基的鹵素原子,例如,氟原子、氯原子、溴原子、碘原子等,又以氟原子為佳。 The halogen atom as the substituent of the aromatic hydrocarbon group, for example, a fluorine atom, a chlorine atom, a bromine atom, an iodine atom or the like, is preferably a fluorine atom.

作為前述取代基之鹵化烷基,例如,前述烷基之氫原子的一部份或全部被前述鹵素原子取代所得之基等。 The halogenated alkyl group as the substituent is, for example, a group obtained by substituting a part or all of a hydrogen atom of the alkyl group with the halogen atom.

結構單位(a3),以下述通式(a3-1)所表示之結構單位為佳。 The structural unit (a3) is preferably a structural unit represented by the following general formula (a3-1).

[式中,R為氫原子、碳數1~5之烷基,或碳數1~5之鹵化烷基。L0為-C(=O)-O-、-C(=O)-NRn-(Rn為氫原子或碳數1~5之烷基)或單鍵。R0為-COOH,或具有由作為取代基之-OH、-COOH、-CN、-SO2NH2、-C(Rr1)(Rr2)(OH) 及-CONH2所成之群所選出之至少一種之基的烴基,其任意之位置上可具有氧原子或硫原子。Rr1、Rr2為各自獨立之氫原子、碳數1~5之烷基,或碳數1~5之鹵化烷基]。 [In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms. L 0 is -C(=O)-O-, -C(=O)-NR n - (R n is a hydrogen atom or an alkyl group having 1 to 5 carbon atoms) or a single bond. R 0 is -COOH or has a group consisting of -OH, -COOH, -CN, -SO 2 NH 2 , -C(R r1 )(R r2 )(OH) and -CONH 2 as substituents. The hydrocarbon group of at least one selected may have an oxygen atom or a sulfur atom at any position. R r1 and R r2 are each independently a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms.

前述式(a3-1)中,R之烷基,以直鏈狀或支鏈狀之烷基為佳,具體而言,例如,甲基、乙基、丙基、異丙基、n-丁基、異丁基、tert-丁基、戊基、異戊基、新戊基等。 In the above formula (a3-1), the alkyl group of R is preferably a linear or branched alkyl group, specifically, for example, a methyl group, an ethyl group, a propyl group, an isopropyl group or an n-butyl group. Base, isobutyl, tert-butyl, pentyl, isopentyl, neopentyl, and the like.

R之鹵化烷基,例如前述中之R的烷基中之氫原子的一部份或全部被鹵素原子取代所得之基等。該鹵素原子,例如,氟原子、氯原子、溴原子、碘原子等,特別是以氟原子為佳。 The halogenated alkyl group of R, for example, a group obtained by substituting a part or all of a hydrogen atom in the alkyl group of R in the above with a halogen atom. The halogen atom is, for example, a fluorine atom, a chlorine atom, a bromine atom, an iodine atom or the like, and particularly preferably a fluorine atom.

R,以氫原子、碳數1~5之烷基或碳數1~5之氟化烷基為佳,以氫原子或甲基為特佳。 R is preferably a hydrogen atom, an alkyl group having 1 to 5 carbon atoms or a fluorinated alkyl group having 1 to 5 carbon atoms, particularly preferably a hydrogen atom or a methyl group.

前述式(a3-1)中,L0為,-C(=O)-O-、-C(=O)-NRn-(Rn為氫原子或碳數1~5之烷基)或單鍵。Rn之烷基,與R之烷基為相同之內容。 In the above formula (a3-1), L 0 is -C(=O)-O-, -C(=O)-NR n - (R n is a hydrogen atom or an alkyl group having 1 to 5 carbon atoms) or single bond. The alkyl group of R n is the same as the alkyl group of R.

前述式(a3-1)中,R0為,具有由作為取代基之-OH、-COOH、-CN、-SO2NH2、-C(Rr1)(Rr2)(OH)及-CONH2所成之群所選出之至少一種之基的烴基,其任意之位置上可具有氧原子或硫原子。 In the above formula (a3-1), R 0 is, having -OH, -COOH, -CN, -SO 2 NH 2 , -C(R r1 )(R r2 )(OH) and -CONH as substituents The hydrocarbon group of at least one selected from the group of 2 may have an oxygen atom or a sulfur atom at any position.

「具有取代基之烴基」係指,鍵結於烴基之氫原子中之至少一部份被取代基所取代之意。 The "hydrocarbon group having a substituent" means that at least a part of a hydrogen atom bonded to a hydrocarbon group is substituted with a substituent.

R0中之烴基,可為脂肪族烴基亦可、芳香族烴基亦可。 The hydrocarbon group in R 0 may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group.

R0中之脂肪族烴基,以碳數1~10之直鏈狀或支鏈狀之烴基(較佳為伸烷基),或脂肪族環式基(單環式基、多環式基)為較佳之例示,該些說明與上述為相同之內容。 The aliphatic hydrocarbon group in R 0 , a linear or branched hydrocarbon group having 1 to 10 carbon atoms (preferably an alkyl group), or an aliphatic cyclic group (monocyclic group or polycyclic group) For better illustration, the descriptions are the same as described above.

R0中之芳香族烴基為具有芳香環之烴基,該說明與上述為相同之內容。 The aromatic hydrocarbon group in R 0 is a hydrocarbon group having an aromatic ring, and the description is the same as described above.

R0中作為取代基之-C(Rr1)(Rr2)(OH)中,Rr1、Rr2為各自獨立之氫原子、碳數1~5之烷基,或碳數1~5之鹵化烷基。碳數1~5之烷基、碳數1~5之鹵化烷基,與上述作為α位之取代基的碳數1~5之烷基、碳數1~5之鹵化烷基為相同之內容。 In the case of -C(R r1 )(R r2 )(OH) as a substituent in R 0 , R r1 and R r2 are each independently a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a carbon number of 1 to 5. Halogenated alkyl. The alkyl group having 1 to 5 carbon atoms and the halogenated alkyl group having 1 to 5 carbon atoms are the same as the alkyl group having 1 to 5 carbon atoms and the halogenated alkyl group having 1 to 5 carbon atoms as the substituent at the α position. .

但,R0,其任意之位置上可具有氧原子或硫原子。該「其任意之位置上可具有氧原子或硫原子」係指,烴基,或分別構成具有取代基之烴基的碳原子(包含取代基部份之碳原子)中之一部份,可被氧原子或硫原子所取代之意,或烴基所鍵結之氫原子可被氧原子或硫原子所取代之意。 However, R 0 may have an oxygen atom or a sulfur atom at any position. The "having an oxygen atom or a sulfur atom at any position thereof" means a hydrocarbon group or a part of a carbon atom (a carbon atom containing a substituent moiety) constituting a hydrocarbon group having a substituent, respectively, which can be oxygenated. The meaning of the substitution of an atom or a sulfur atom, or the hydrogen atom to which a hydrocarbon group is bonded, may be replaced by an oxygen atom or a sulfur atom.

以下之例示說明為有關任意之位置尚具有氧原子(O)之R0的例示。 The following exemplification is an illustration of R 0 which still has an oxygen atom (O) at an arbitrary position.

[式中,W00為烴基,Rm為碳數1~5之伸烷基]。 [wherein, W 00 is a hydrocarbon group, and R m is an alkylene group having 1 to 5 carbon atoms].

前述式中,W00為烴基,例如與前述式(a3-1)中之R0為相同之內容等。W00,較佳為脂肪族烴基,更佳為脂肪族環式基(單環式基、多環式基)。 In the above formula, W 00 is a hydrocarbon group, and is, for example, the same as R 0 in the above formula (a3-1). W 00 is preferably an aliphatic hydrocarbon group, more preferably an aliphatic cyclic group (monocyclic group or polycyclic group).

Rm,以直鏈狀、支鏈狀為佳,以碳數1~3之伸烷基為佳,以伸甲基、伸乙基為更佳。 R m is preferably a linear chain or a branched chain, and preferably an alkylene group having 1 to 3 carbon atoms, more preferably a methyl group or an ethyl group.

結構單位(a3)中之較適合者,更具體而言,例如,(α取代)丙烯酸所衍生之結構單位、下述通式(a3-11)~(a3-13)之任一者所表示之結構單位等。 More suitable in the structural unit (a3), more specifically, for example, a structural unit derived from (α-substituted) acrylic acid, or any one of the following general formulae (a3-11) to (a3-13) The structural unit and so on.

(α取代)丙烯酸所衍生之結構單位,例如,前述式(a3-1)中之L0為單鍵,R0為-COOH之結構單位等。 The structural unit derived from (α-substituted) acrylic acid, for example, L 0 in the above formula (a3-1) is a single bond, and R 0 is a structural unit of -COOH.

[式中,R為氫原子、碳數1~5之烷基,或碳數1~5之鹵化烷基。W01為具有由作為取代基之-OH、-COOH、-CN、-SO2NH2、-C(Rr1)(Rr2)(OH)及-CONH2所成之群所選出之至少一種之基的芳香族烴基。P02及P03分別為-C(=O)-O-或-C(=O)-NRn-(Rn為氫原子或碳數1~5之烷基)。W02為具有由作為取代基之-OH、-COOH、-CN、-SO2NH2、-C(Rr1)(Rr2)(OH)及-CONH2所成之群所選出之至少一種之基的環狀之烴基,其任意之位置上可具有氧原子或硫原 子。W03為具有由作為取代基之-OH、-COOH、-CN、-SO2NH2、-C(Rr1)(Rr2)(OH)及-CONH2所成之群所選出之至少一種之基的直鏈狀之烴基。Rr1、Rr2與前述為相同之內容]。 [In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms. W 01 is at least one selected from the group consisting of -OH, -COOH, -CN, -SO 2 NH 2 , -C(R r1 )(R r2 )(OH), and -CONH 2 as substituents. An aromatic hydrocarbon group based on it. P 02 and P 03 are each -C(=O)-O- or -C(=O)-NR n - (R n is a hydrogen atom or an alkyl group having 1 to 5 carbon atoms). W 02 is at least one selected from the group consisting of -OH, -COOH, -CN, -SO 2 NH 2 , -C(R r1 )(R r2 )(OH) and -CONH 2 as substituents. The cyclic hydrocarbon group may have an oxygen atom or a sulfur atom at any position. W 03 is at least one selected from the group consisting of -OH, -COOH, -CN, -SO 2 NH 2 , -C(R r1 )(R r2 )(OH) and -CONH 2 as substituents. a linear hydrocarbon group based on a base. R r1 and R r2 are the same as described above].

[通式(a3-11)所表示之結構單位] [Structural unit represented by the general formula (a3-11)]

前述式(a3-11)中,R與前述式(a3-1)中之R之說明為相同之內容。 In the above formula (a3-11), R is the same as the description of R in the above formula (a3-1).

W01中之芳香族烴基,例如與前述式(a3-1)中之R0中之芳香族烴基之說明為相同之內容。 The aromatic hydrocarbon group in W 01 is, for example, the same as the description of the aromatic hydrocarbon group in R 0 in the above formula (a3-1).

以下為通式(a3-11)所表示之結構單位的較佳具體例示。以下各式中,Rα表示氫原子、甲基或三氟甲基。 The following is a preferred specific example of the structural unit represented by the general formula (a3-11). In the following formulae, R α represents a hydrogen atom, a methyl group or a trifluoromethyl group.

[通式(a3-12)所表示之結構單位] [Structural unit represented by the general formula (a3-12)]

前述式(a3-12)中,R與前述式(a3-1)中之R之說明為相同之內容。 In the above formula (a3-12), R is the same as the description of R in the above formula (a3-1).

P02,以-C(=O)-O-或-C(=O)-NRn-(Rn為氫原子或碳數1~5之烷基),-C(=O)-O-為佳。Rn之烷基,與R之烷基為相同之內容。 P 02 , -C(=O)-O- or -C(=O)-NR n - (R n is a hydrogen atom or an alkyl group having 1 to 5 carbon atoms), -C(=O)-O- It is better. The alkyl group of R n is the same as the alkyl group of R.

W02中之環狀之烴基,分別與前述式(a3-1)中之R0之說明中所例示之脂肪族環式基(單環式基、多環式基)、芳香族烴基為相同之內容。 The cyclic hydrocarbon group in W 02 is the same as the aliphatic cyclic group (monocyclic group, polycyclic group) or aromatic hydrocarbon group exemplified in the description of R 0 in the above formula (a3-1). The content.

W02,於任意之位置可具有氧原子或硫原子,該說明與前述式(a3-1)中之R0之說明為相同之內容。 W 02 may have an oxygen atom or a sulfur atom at any position, and the description is the same as the description of R 0 in the above formula (a3-1).

以下為通式(a3-12)所表示之結構單位的較佳具體例示。以下各式中,Rα表示氫原子、甲基或三氟甲基。 The following is a preferred specific example of the structural unit represented by the general formula (a3-12). In the following formulae, R α represents a hydrogen atom, a methyl group or a trifluoromethyl group.

[通式(a3-13)所表示之結構單位] [Structural unit represented by the general formula (a3-13)]

前述式(a3-13)中,R與前述式(a3-1)中之R之說明為相同之內容。 In the above formula (a3-13), R is the same as the description of R in the above formula (a3-1).

P03,以-C(=O)-O-或-C(=O)-NRn-(Rn為氫原子或碳數1~5之烷基),-C(=O)-O-為佳。Rn之烷基,與R之烷基為相同之內容。 P 03 , -C(=O)-O- or -C(=O)-NR n - (R n is a hydrogen atom or an alkyl group having 1 to 5 carbon atoms), -C(=O)-O- It is better. The alkyl group of R n is the same as the alkyl group of R.

W03中之直鏈狀之烴基,其碳數以1~10為佳,以碳數1~5為較佳,以碳數1~3為更佳。 The linear hydrocarbon group in W 03 preferably has a carbon number of from 1 to 10, preferably a carbon number of from 1 to 5, more preferably a carbon number of from 1 to 3.

W03中之直鏈狀之烴基,可再具有-OH、-COOH、-CN、-SO2NH2及-CONH2以外之取代基(a)。該取代基(a )例如,碳數1~5之烷基、脂肪族環式基(單環式基、多環式基)、氟原子、碳數1~5之氟化烷基等。取代基(a)中之脂肪族環式基(單環式基、多環式基)之碳數以3~30為佳,以5~30為較佳,以5~20為更佳,以6~15為特佳,以6~12為最佳。具體而言,例如,由單環鏈烷去除2個以上之氫原子所得之基;由二環鏈烷、三環鏈烷、四環鏈烷等多環鏈烷去除1個以上之氫原子所得之基等。更具體而言,例如,由環戊烷、環己烷等單環鏈烷去除2個以上之氫原子所得之基;由金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等多環鏈烷去除1個以上之氫原子所得之基等。 The linear hydrocarbon group in W 03 may further have a substituent (a) other than -OH, -COOH, -CN, -SO 2 NH 2 and -CONH 2 . The substituent (a) is, for example, an alkyl group having 1 to 5 carbon atoms, an aliphatic cyclic group (monocyclic group or polycyclic group), a fluorine atom or a fluorinated alkyl group having 1 to 5 carbon atoms. The aliphatic ring group (monocyclic group, polycyclic group) in the substituent (a) preferably has 3 to 30 carbon atoms, preferably 5 to 30, more preferably 5 to 20 carbon atoms. 6~15 is especially good, and 6~12 is the best. Specifically, for example, a group obtained by removing two or more hydrogen atoms from a monocyclic alkane; and removing one or more hydrogen atoms from a polycyclic alkane such as a bicycloalkane, a tricycloalkane or a tetracycloalkane; Base and so on. More specifically, for example, a group obtained by removing two or more hydrogen atoms from a monocyclic alkane such as cyclopentane or cyclohexane; from adamantane, norbornane, isodecane, tricyclodecane, tetracyclic A group obtained by removing one or more hydrogen atoms from a polycyclic alkane such as dodecane.

又,W03中之直鏈狀之烴基,可例示如下述通式(a3-13-a)所表示之結構單位般,可具有複數之取代基(a),或複數之取代基(a)亦可相互鍵結形成環。 Further, the linear hydrocarbon group in W 03 may, for example, be a structural unit represented by the following general formula (a3-13-a), and may have a plurality of substituents (a) or a plurality of substituents (a) They can also be bonded to each other to form a ring.

[式中,R為氫原子、碳數1~5之烷基,或碳數1~5之鹵化烷基。Ra1及Ra2為各自獨立之碳數1~5之烷基、脂肪族環式基(單環式基、多環式基)、氟原子,或碳數1~5之氟化烷基。但,Ra1與Ra2可相互鍵結形成環。q0為1~ 4之整數]。 [In the formula, R is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms. R a1 and R a2 are each independently an alkyl group having 1 to 5 carbon atoms, an aliphatic cyclic group (monocyclic group or polycyclic group), a fluorine atom, or a fluorinated alkyl group having 1 to 5 carbon atoms. However, R a1 and R a2 may be bonded to each other to form a ring. q 0 is an integer from 1 to 4].

前述式(a3-13-a)中,R與前述式(a3-1)中之R之說明為相同之內容。 In the above formula (a3-13-a), R is the same as the description of R in the above formula (a3-1).

Ra1及Ra2中之脂肪族環式基(單環式基、多環式基),與前述取代基(a)中之脂肪族環式基(單環式基、多環式基)為相同之內容。 The aliphatic cyclic group (monocyclic group or polycyclic group) in R a1 and R a2 and the aliphatic cyclic group (monocyclic group or polycyclic group) in the above substituent (a) are The same content.

又,Ra1與Ra2,可相互鍵結形成環。該情形中,Ra1,與Ra2,與Ra1與Ra2共同鍵結之碳原子形成環式基。該環式基,可為單環式基亦可、多環式基亦可,具體而言,例如由前述取代基(a)中之脂肪族環式基(單環式基、多環式基)之說明中所例示之單環鏈烷或多環鏈烷去除1個以上之氫原子所得之基等。 Further, R a1 and R a2 may be bonded to each other to form a ring. In this case, R a1 , and R a2 , and a carbon atom to which R a1 and R a2 are bonded together form a ring group. The cyclic group may be a monocyclic group or a polycyclic group, and specifically, for example, an aliphatic cyclic group (monocyclic group or polycyclic group) in the above substituent (a) The monocyclic alkane or polycyclic alkane exemplified in the description is a group obtained by removing one or more hydrogen atoms.

q0以1或2為佳,以1為更佳。 It is preferable that q 0 is 1 or 2, and 1 is more preferable.

以下為通式(a3-13)所表示之結構單位的較佳具體例示。以下各式中,Rα表示氫原子、甲基或三氟甲基。 The following is a preferred specific example of the structural unit represented by the general formula (a3-13). In the following formulae, R α represents a hydrogen atom, a methyl group or a trifluoromethyl group.

(A1)成份所具有之結構單位(a3)可為1種或2種以上皆可。 The structural unit (a3) of the component (A1) may be one type or two or more types.

(A1)成份具有結構單位(a3)之情形,結構單位(a3)之比例,該相對於構成(A1)成份之全結構單位,以0~85莫耳%為佳,以0~80莫耳%為更佳。結構單位(a3)之比例於下限值以上時,含有結構單位(a3)時,可得到充分之效果(解析性、微影蝕刻特性、圖型形狀之提升效果),於上限值以下時,可容易取得與其他結構單位之平衡。 (A1) The composition has the structural unit (a3), and the proportion of the structural unit (a3) is preferably 0 to 85 mol%, and 0 to 80 mol, relative to the total structural unit constituting the (A1) component. % is better. When the ratio of the structural unit (a3) is equal to or greater than the lower limit value, when the structural unit (a3) is contained, sufficient effects (analytical properties, lithographic etching characteristics, and pattern shape enhancement effects) can be obtained, and when the ratio is equal to or less than the upper limit value It is easy to obtain a balance with other structural units.

(其他結構單位) (other structural units)

(A1)成份,於無損本發明效果之範圍,可再含有上述結構單位(a1)~(a3)以外之其他結構單位(以下,亦稱為結構單位(a4))。 The component (A1) may further contain other structural units (hereinafter also referred to as structural units (a4)) other than the structural units (a1) to (a3) insofar as the effects of the present invention are not impaired.

結構單位(a4),只要為未分類於上述之結構單位(a1)~(a3)之其他結構單位時,並未有特別之限定內容,其可使用ArF準分子雷射用、KrF準分子雷射用(較佳為ArF準分子雷射用)等光阻用樹脂所使用之以往已知之多數結構單位。 The structural unit (a4) is not limited to any other structural unit that is not classified into the structural units (a1) to (a3) described above, and may be used in an ArF excimer laser or a KrF excimer. A plurality of conventionally known structural units used for resistive resins such as shots (preferably for ArF excimer lasers).

結構單位(a4),例如,以α位之碳原子所鍵結之氫原子可被取代基所取代之丙烯酸酯所衍生之結構單位,且含有非酸解離性之脂肪族多環式基的結構單位、苯乙烯單體所衍生之結構單位、乙烯基萘單體所衍生之結構單位等為佳。該多環式基,例如,與前述結構單位(a1)之情形中所例示者為相同之例示等,其可使用以往已知之ArF準分子雷射用、KrF準分子雷射用(較佳為ArF準分子雷射 用)等光阻組成物的樹脂成份所使用之多數成份。 The structural unit (a4), for example, a structural unit derived from an acrylate in which a hydrogen atom bonded to a carbon atom of the α-position can be substituted by a substituent, and a structure containing a non-acid dissociable aliphatic polycyclic group The unit, the structural unit derived from the styrene monomer, and the structural unit derived from the vinyl naphthalene monomer are preferred. The polycyclic group is, for example, the same as exemplified in the case of the structural unit (a1) described above, and can be used for a conventionally known ArF excimer laser or KrF excimer laser (preferably ArF excimer laser Most of the components used in the resin composition of the photoresist composition.

特別是由三環癸基、金剛烷基、四環十二烷基、異莰基、降莰基所選出之至少1種時,就工業上容易取得等觀點而言為較佳。該些多環式基,可具有碳數1~5之直鏈狀或支鏈狀之烷基作為取代基。 In particular, when at least one selected from the group consisting of a tricyclic fluorenyl group, an adamantyl group, a tetracyclododecyl group, an isodecyl group, and a fluorenyl group is preferable, it is preferable from the viewpoint of industrial availability. The polycyclic group may have a linear or branched alkyl group having 1 to 5 carbon atoms as a substituent.

結構單位(a4),具體而言,可例如下述通式(a4-1)~(a4-5)之結構單位。 The structural unit (a4) may specifically be, for example, a structural unit of the following general formulae (a4-1) to (a4-5).

[式中,R與前述為相同之內容]。 [wherein R is the same as the above].

結構單位(a4),可單獨使用1種亦可,將2種以上組合使用亦可。 The structural unit (a4) may be used singly or in combination of two or more.

(A1)成份含有結構單位(a4)之情形,結構單位(a4)之比例,相對於構成(A1)成份之全結構單位之合計,以1~20莫耳%為佳,以1~15莫耳%為較佳,以1~10莫耳%為更佳。 (A1) In the case where the component contains the structural unit (a4), the ratio of the structural unit (a4) is preferably 1 to 20 mol%, and 1 to 15 mol, based on the total of the total structural units constituting the component (A1). The ear % is preferably, preferably 1 to 10 mol%.

(A1)成份,以具有結構單位(a1)之共聚物為佳。 The component (A1) is preferably a copolymer having a structural unit (a1).

該共聚物,例如,由結構單位(a1)及結構單位(a3)所形成之共聚物;由結構單位(a1)及(a2)所形成之共聚物;由結構單位(a1)、(a2)及(a3)所形成之共聚物;由結構單位(a1)、(a2)、(a3)及(a4) 所形成之共聚物等例示。 The copolymer, for example, a copolymer formed of structural unit (a1) and structural unit (a3); a copolymer formed of structural units (a1) and (a2); and structural units (a1), (a2) And the copolymer formed by (a3); by structural units (a1), (a2), (a3) and (a4) The copolymer formed and the like are exemplified.

本發明中之(A1)成份,特別是以結構單位(a11)、(a2L)及(a3)之組合為佳,以前述式(a1-0-12)、(a2-1)及(a3-12)所表示之結構單位之組合;前述式(a1-0-13)、(a2-1)、(a2-3)及(a3-12)所表示之結構單位之組合為更佳。 The component (A1) in the present invention is particularly preferably a combination of structural units (a11), (a2 L ) and (a3), and the above formulae (a1-0-12), (a2-1) and (a3). -12) The combination of the structural units indicated; the combination of the structural units represented by the above formulas (a1-0-13), (a2-1), (a2-3) and (a3-12) is more preferable.

(A1)成份之質量平均分子量(Mw)(凝膠滲透色層分析儀之聚苯乙烯換算基準),並未有特別之限定範圍,一般以1000~50000為佳,以1500~30000為較佳,以2500~20000為更佳,以2500~15000為最佳。於此範圍之上限值以下時,作為光阻使用時,對光阻溶劑可得到充分之溶解性,於此範圍之下限值以上時,可得到良好之耐乾蝕刻性或光阻圖型之截面形狀。 (A1) The mass average molecular weight (Mw) of the component (the polystyrene conversion standard of the gel permeation chromatography analyzer) is not particularly limited, and is generally preferably from 1,000 to 50,000, preferably from 1,500 to 30,000. It is better to use 2500~20000, and 2500~15000 is the best. When the amount is less than or equal to the upper limit of the range, when used as a photoresist, sufficient solubility is obtained for the photoresist solvent. When the value is at least the lower limit of the range, good dry etching resistance or photoresist pattern can be obtained. Section shape.

又,(A1)成份之分散度(Mw/Mn),並未有特別之限定內容,以1.0~5.0為佳,以1.0~3.0為較佳,以1.2~2.5為最佳。 Further, the degree of dispersion (Mw/Mn) of the component (A1) is not particularly limited, and is preferably 1.0 to 5.0, more preferably 1.0 to 3.0, and most preferably 1.2 to 2.5.

又,Mn表示數平均分子量。 Further, Mn represents a number average molecular weight.

(A)成份中,(A1)成份,可單獨使用1種亦可,或將2種以上合併使用亦可。 In the component (A), the component (A1) may be used singly or in combination of two or more.

(A)成份中之(A1)成份之比例,相對於(A)成份之總質量,以25質量%以上為佳,以50質量%為較佳,以75質量%為更佳,亦可為100質量%。該比例為25質量%以上時,可提高微影蝕刻特性等效果。 The ratio of the component (A1) in the component (A) is preferably 25% by mass or more based on the total mass of the component (A), preferably 50% by mass, more preferably 75% by mass, or more preferably 100% by mass. When the ratio is 25% by mass or more, effects such as lithography characteristics can be improved.

[(A2)成份] [(A2) ingredients]

(A2)成份,例如,分子量為500以上、未達4000之具有上述(A1)成份之說明所例示之酸解離性基,與親水性基之低分子化合物為佳。具體而言,例如,具有複數之酚骨架的化合物之羥基中的氫原子之一部份被上述酸解離性基所取代者等。 The component (A2) is, for example, an acid dissociable group having a molecular weight of 500 or more and less than 4,000 and having the above-mentioned (A1) component, and a hydrophilic group-based low molecular compound. Specifically, for example, a part of a hydrogen atom in a hydroxyl group of a compound having a plural phenol skeleton is substituted by the above acid dissociable group.

(A2)成份,例如,以已知作為非化學增幅型之g線或i線光阻中之增感劑,或作為耐熱性提升劑之低分子量酚化合物之羥基中之氫原子的一部份被上述酸解離性基所取代者為佳,只要為該些成份時,則可任意地使用。 (A2) component, for example, a sensitizer in a g-line or i-line photoresist known as a non-chemically amplified type, or a part of a hydrogen atom in a hydroxyl group of a low molecular weight phenol compound as a heat-resistant enhancer It is preferred to be replaced by the above acid-dissociable group, and any of these components may be used arbitrarily.

該低分子量酚化合物,例如,雙(4-羥基苯基)甲烷、雙(2,3,4-三羥基苯基)甲烷、2-(4-羥基苯基)-2-(4’-羥基苯基)丙烷、2-(2,3,4-三羥基苯基)-2-(2’,3’,4’-三羥基苯基)丙烷、三(4-羥基苯基)甲烷、雙(4-羥-3,5-二甲基苯基)-2-羥基苯基甲烷、雙(4-羥-2,5-二甲基苯基)-2-羥基苯基甲烷、雙(4-羥-3,5-二甲基苯基)-3,4-二羥基苯基甲烷、雙(4-羥-2,5-二甲基苯基)-3,4-二羥基苯基甲烷、雙(4-羥-3-甲基苯基)-3,4-二羥基苯基甲烷、雙(3-環己基-4-羥-6-甲基苯基)-4-羥基苯基甲烷、雙(3-環己基-4-羥-6-甲基苯基)-3,4-二羥基苯基甲烷、1-[1-(4-羥基苯基)異丙基]-4-[1,1-雙(4-羥基苯基)乙基]苯、酚、m-甲酚、p-甲酚或二甲酚等酚類的福馬林縮合物之2~6核體等。當然並不僅限定於該些內容。特別是,具有2~6個三苯基甲烷骨架之酚化合 物,以其具有優良之解析性、LWR等,而為較佳。 The low molecular weight phenol compound, for example, bis(4-hydroxyphenyl)methane, bis(2,3,4-trihydroxyphenyl)methane, 2-(4-hydroxyphenyl)-2-(4'-hydroxyl Phenyl)propane, 2-(2,3,4-trihydroxyphenyl)-2-(2',3',4'-trihydroxyphenyl)propane, tris(4-hydroxyphenyl)methane, double (4-hydroxy-3,5-dimethylphenyl)-2-hydroxyphenylmethane, bis(4-hydroxy-2,5-dimethylphenyl)-2-hydroxyphenylmethane, bis (4 -hydroxy-3,5-dimethylphenyl)-3,4-dihydroxyphenylmethane, bis(4-hydroxy-2,5-dimethylphenyl)-3,4-dihydroxyphenylmethane , bis(4-hydroxy-3-methylphenyl)-3,4-dihydroxyphenylmethane, bis(3-cyclohexyl-4-hydroxy-6-methylphenyl)-4-hydroxyphenylmethane , bis(3-cyclohexyl-4-hydroxy-6-methylphenyl)-3,4-dihydroxyphenylmethane, 1-[1-(4-hydroxyphenyl)isopropyl]-4-[ 1,2-bis(4-hydroxyphenyl)ethyl]benzene, phenol, m-cresol, p-cresol or xylenol, phenolic valerine condensate 2-6 nucleus, and the like. Of course, it is not limited to this content. In particular, phenolic compounds having 2 to 6 triphenylmethane skeletons It is preferred that it has excellent resolution, LWR, and the like.

酸解離性基也未有特別之限定,可例如上述之內容。 The acid dissociable group is also not particularly limited, and can be, for example, the above.

(A2)成份,可單獨使用1種亦可,將2種以上組合使用亦可。 The component (A2) may be used singly or in combination of two or more.

本發明之光阻組成物中,(A)成份,可單獨使用1種亦可,或將2種以上合併使用亦可。 In the photoresist composition of the present invention, the component (A) may be used singly or in combination of two or more.

上述之中,(A)成份,又以含有(A1)成份為佳。 Among the above, the component (A) preferably contains the component (A1).

本發明之光阻組成物中,(A)成份之含量,可配合所欲形成之光阻膜厚度等作適當之調整即可。 In the photoresist composition of the present invention, the content of the component (A) may be appropriately adjusted in accordance with the thickness of the photoresist film to be formed.

<(B)成份> <(B) ingredients>

(B)成份,並未有特別之限定,其可使用目前為止被提案作為化學增幅型光阻用之酸產生劑者。該些酸產生劑,目前為止,已知有錪鹽或鋶鹽等鎓鹽系酸產生劑、肟磺酸酯系酸產生劑、雙烷基或雙芳基磺醯基重氮甲烷類、聚(雙磺醯基)重氮甲烷類等重氮甲烷系酸產生劑、硝基苄磺酸酯系酸產生劑、亞胺基磺酸酯系酸產生劑、二碸系酸產生劑等多種成份。 The component (B) is not particularly limited, and those which have been proposed so far as acid generators for chemically amplified photoresists can be used. These acid generators have heretofore been known as sulfonium-based acid generators such as sulfonium salts or phosphonium salts, sulfonate-based acid generators, dialkyl or bisarylsulfonyldiazomethanes, and poly (disulfonyl) diazomethane acid generator such as diazomethane, nitrobenzyl sulfonate acid generator, iminosulfonate acid generator, diterpenoid acid generator and the like .

鎓鹽系酸產生劑,例如可使用下述通式(b-1)或(b-2)所表示之化合物。 As the onium salt acid generator, for example, a compound represented by the following formula (b-1) or (b-2) can be used.

[式中,R1”~R3”,R5”~R6”表示各自獨立之可具有取代基 之芳基、烷基或烯基。式(b-1)中之R1”~R3”之中,任意之二個可相互鍵結,並與式中之硫原子共同形成環亦可。R4”表示可具有取代基之烷基、鹵化烷基、芳基,或烯基]。 [wherein, R 1" to R 3" and R 5" to R 6" represent an aryl group, an alkyl group or an alkenyl group which may independently have a substituent. Among the R 1" to R 3" in the formula (b-1), any two of them may be bonded to each other and may form a ring together with the sulfur atom in the formula. R 4" represents an alkyl group, a halogenated alkyl group, an aryl group, or an alkenyl group which may have a substituent.

式(b-1)中,R1”~R3”,表示各自獨立之可具有取代基之芳基、烷基或烯基。R1”~R3”之中,任意之二個可相互鍵結,並與式中之硫原子共同形成環亦可。 In the formula (b-1), R 1" to R 3" represent an aryl group, an alkyl group or an alkenyl group which may independently have a substituent. Any one of R 1" to R 3 " may be bonded to each other and may form a ring together with a sulfur atom in the formula.

又,就更提高微影蝕刻特性與光阻圖型形狀之觀點,R1”~R3”之中,以至少1個為芳基為佳,以R1”~R3”之中,以2個以上為芳基為較佳,以R1”~R3”之全部為芳基為特佳。 Further, even the viewpoint of improving the lithography characteristics of the resist pattern shape, among R 1 "~ R 3", at least one aryl group is preferable, and R 1 "~ R 3" in order to Two or more aryl groups are preferred, and all of R 1" to R 3" are particularly preferably aryl groups.

R1”~R3”之芳基可為,碳數6~20之無取代之芳基;該無取代之芳基之氫原子的一部份或全部被烷基、烷氧基、鹵素原子、羥基、酮基(=O)、芳基、烷氧烷基氧基、烷氧羰基烷基氧基、-C(=O)-O-R6’、-O-C(=O)-R7’、-O-R8’等所取代之取代芳基等。R6’、R7’、R8’,各自表示碳數1~25之直鏈狀、支鏈狀或碳數3~20之環狀之飽和烴基,或,碳數2~5之直鏈狀或支鏈狀之脂肪族不飽和烴基。 The aryl group of R 1" to R 3" may be an unsubstituted aryl group having 6 to 20 carbon atoms; a part or all of a hydrogen atom of the unsubstituted aryl group may be an alkyl group, an alkoxy group or a halogen atom. , hydroxy, keto (=O), aryl, alkoxyalkyloxy, alkoxycarbonylalkyloxy, -C(=O)-OR 6' , -OC(=O)-R 7' , a substituted aryl group or the like substituted by -OR 8' or the like. R 6 ' , R 7 ' , and R 8 ' each represent a linear, branched or cyclic hydrocarbon group having a carbon number of 1 to 25 or a linear chain having a carbon number of 2 to 5; A branched or branched aliphatic unsaturated hydrocarbon group.

R1”~R3”中,無取代之芳基,就可廉價合成等觀點,以碳數6~10之芳基為佳。具體而言,例如,苯基、萘基等。 In the case of R 1" to R 3" , an unsubstituted aryl group can be inexpensively synthesized, and an aryl group having 6 to 10 carbon atoms is preferred. Specifically, for example, a phenyl group, a naphthyl group or the like.

R1”~R3”之取代芳基中作為取代基之烷基,以碳數1~5之烷基為佳,以甲基、乙基、丙基、n-丁基、tert-丁基為最佳。 The alkyl group as a substituent in the substituted aryl group of R 1" to R 3" is preferably an alkyl group having 1 to 5 carbon atoms, and a methyl group, an ethyl group, a propyl group, an n-butyl group, and a tert-butyl group. For the best.

取代芳基中作為取代基之烷氧基,以碳數1~5之烷氧基為佳,以甲氧基、乙氧基、n-丙氧基、iso-丙氧基、n-丁氧基、tert-丁氧基為最佳。 The alkoxy group as a substituent in the substituted aryl group is preferably an alkoxy group having 1 to 5 carbon atoms, and a methoxy group, an ethoxy group, an n-propoxy group, an iso-propoxy group, and an n-butoxy group. The base and tert-butoxy group are the most preferred.

取代芳基中作為取代基之鹵素原子,以氟原子為佳。 The halogen atom as a substituent in the substituted aryl group is preferably a fluorine atom.

取代芳基中作為取代基之芳基,例如,與前述R1”~R3”之芳基為相同之內容等,以碳數6~20之芳基為佳,以碳數6~10之芳基為較佳,以苯基、萘基為更佳。 The aryl group as a substituent in the substituted aryl group is, for example, the same as the aryl group of the above R 1" to R 3" , and preferably an aryl group having 6 to 20 carbon atoms, and a carbon number of 6 to 10 The aryl group is preferred, and the phenyl group and the naphthyl group are more preferred.

取代芳基中之烷氧烷基氧基,例如,通式:-O-C(R47)(R48)-O-R49 Substituting an alkoxyalkyloxy group in the aryl group, for example, the formula: -OC(R 47 )(R 48 )-OR 49

[式中,R47、R48為各自獨立之氫原子或直鏈狀或支鏈狀之烷基,R49為烷基]所表示之基等。 In the formula, R 47 and R 48 are each a hydrogen atom or a linear or branched alkyl group, and R 49 is an alkyl group.

R47、R48中,烷基的碳數較佳為1~5,其可為直鏈狀、支鏈狀之任一者,又以乙基、甲基為佳,以甲基為最佳。 In R 47 and R 48 , the alkyl group preferably has 1 to 5 carbon atoms, and may be either linear or branched, preferably ethyl or methyl, and preferably methyl. .

R47、R48,以至少一者為氫原子為佳。特別是一者為氫原子,另一者為氫原子或甲基為更佳。 R 47 and R 48 are preferably at least one of hydrogen atoms. In particular, one is a hydrogen atom, and the other is preferably a hydrogen atom or a methyl group.

R49之烷基,較佳為碳數為1~15者,其可為直鏈狀、支鏈狀、環狀之任一者。 The alkyl group of R 49 is preferably one having a carbon number of from 1 to 15, and may be any of a linear chain, a branched chain, and a cyclic group.

R49中之直鏈狀、支鏈狀之烷基,以碳數為1~5者為佳,例如,甲基、乙基、丙基、n-丁基、tert-丁基等。 The linear or branched alkyl group in R 49 is preferably a carbon number of 1 to 5, and examples thereof include a methyl group, an ethyl group, a propyl group, an n-butyl group, and a tert-butyl group.

R49中之環狀之烷基,以碳數4~15為佳,以碳數4~12為更佳,以碳數5~10為最佳。具體而言,例如,由可被碳數1~5之烷基、氟原子或氟化烷基所取代,或由未被取代之單環鏈烷、二環鏈烷、三環鏈烷、四環鏈烷等 多環鏈烷去除1個以上之氫原子所得之基等。單環鏈烷例如,環戊烷、環己烷等。多環鏈烷例如,金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等。其中又以由金剛烷去除1個以上之氫原子所得之基為佳。 The cyclic alkyl group in R 49 is preferably a carbon number of 4 to 15, preferably a carbon number of 4 to 12, and a carbon number of 5 to 10. Specifically, for example, it is substituted by an alkyl group having 1 to 5 carbon atoms, a fluorine atom or a fluorinated alkyl group, or an unsubstituted monocyclic alkane, a bicycloalkane, a tricycloalkane, or a tetra A group obtained by removing one or more hydrogen atoms from a polycyclic alkane such as a cycloalkane. Monocyclic alkane is, for example, cyclopentane, cyclohexane or the like. Polycyclic alkanes are, for example, adamantane, norbornane, isodecane, tricyclodecane, tetracyclododecane, and the like. Among them, a group obtained by removing one or more hydrogen atoms from adamantane is preferred.

取代芳基中之烷氧羰基烷基氧基,例如,通式:-O-R50-C(=O)-O-R56 Substituting an alkoxycarbonylalkyloxy group in the aryl group, for example, the formula: -OR 50 -C(=O)-OR 56

[式中,R50為直鏈狀或支鏈狀之伸烷基,R56為三級烷基]所表示之基等。 [wherein, R 50 is a linear or branched alkyl group, and R 56 is a tertiary alkyl group].

R50中之直鏈狀、支鏈狀之伸烷基,其碳數以1~5為佳,例如,伸甲基、伸乙基、伸三甲基、伸四甲基、1,1-二甲基伸乙基等。 a linear or branched alkyl group in R 50 having a carbon number of 1 to 5, for example, a methyl group, an ethyl group, a trimethyl group, a tetramethyl group, a 1,1-di group. Methyl extended ethyl and the like.

R56中之三級烷基,例如,2-甲基-2-金剛烷基、2-乙基-2-金剛烷基、1-甲基-1-環戊基、1-乙基-1-環戊基、1-甲基-1-環己基、1-乙基-1-環己基、1-(1-金剛烷基)-1-甲基乙基、1-(1-金剛烷基)-1-甲基丙基、1-(1-金剛烷基)-1-甲基丁基、1-(1-金剛烷基)-1-甲基戊基;1-(1-環戊基)-1-甲基乙基、1-(1-環戊基)-1-甲基丙基、1-(1-環戊基)-1-甲基丁基、1-(1-環戊基)-1-甲基戊基;1-(1-環己基)-1-甲基乙基、1-(1-環己基)-1-甲基丙基、1-(1-環己基)-1-甲基丁基、1-(1-環己基)-1-甲基戊基、tert-丁基、tert-戊基、tert-己基等。 A tertiary alkyl group in R 56 , for example, 2-methyl-2-adamantyl, 2-ethyl-2-adamantyl, 1-methyl-1-cyclopentyl, 1-ethyl-1 -cyclopentyl, 1-methyl-1-cyclohexyl, 1-ethyl-1-cyclohexyl, 1-(1-adamantyl)-1-methylethyl, 1-(1-adamantyl) -1-methylpropyl, 1-(1-adamantyl)-1-methylbutyl, 1-(1-adamantyl)-1-methylpentyl; 1-(1-cyclopentyl) 1-methylethyl, 1-(1-cyclopentyl)-1-methylpropyl, 1-(1-cyclopentyl)-1-methylbutyl, 1-(1-cyclo Pentyl)-1-methylpentyl; 1-(1-cyclohexyl)-1-methylethyl, 1-(1-cyclohexyl)-1-methylpropyl, 1-(1-cyclohexyl -1-methylbutyl, 1-(1-cyclohexyl)-1-methylpentyl, tert-butyl, tert-pentyl, tert-hexyl, and the like.

此外,又例如前述通式:-O-R50-C(=O)-O-R56中之R56被R56’所取代之基等。R56’為,可含有氫原子、烷基、氟化烷基,或雜原子之脂肪族環式基。 Further, for example, the above formula: -OR 50 -C(=O)-OR 56 is a group in which R 56 is substituted by R 56' . R 56 'is, may contain a hydrogen atom, an alkyl group, fluorinated alkyl, hetero atoms or aliphatic cyclic group.

R56’中之烷基,例如與前述R49之烷基為相同之內容等。 The alkyl group in R 56 ' is, for example, the same as the alkyl group of the above R 49 and the like.

R56’中之氟化烷基為,前述R49之烷基中之氫原子的一部份或全部被氟原子所取代之基等。 The fluorinated alkyl group in R 56' is a group in which a part or the whole of a hydrogen atom in the alkyl group of R 49 is substituted by a fluorine atom.

R56’中,可含有雜原子之脂肪族環式基,例如,不含有雜原子之脂肪族環式基、環結構中含有雜原子之脂肪族環式基、脂肪族環式基中之氫原子被雜原子所取代者等。 In R 56 ' , an aliphatic cyclic group which may contain a hetero atom, for example, an aliphatic cyclic group which does not contain a hetero atom, an aliphatic cyclic group which contains a hetero atom in a ring structure, and hydrogen in an aliphatic cyclic group The atom is replaced by a hetero atom.

R56’中,不含有雜原子之脂肪族環式基,例如,由單環鏈烷、由二環鏈烷、三環鏈烷、四環鏈烷等多環鏈烷去除1個以上之氫原子所得之基等。單環鏈烷例如,環戊烷、環己烷等。多環鏈烷例如,金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等。其中又以由金剛烷去除1個以上之氫原子所得之基為佳。 In R 56 ' , an aliphatic cyclic group which does not contain a hetero atom, for example, one or more hydrogen atoms are removed from a monocyclic alkane, a polycyclic alkane such as a bicycloalkane, a tricycloalkane or a tetracycloalkane. The basis of the atom, etc. Monocyclic alkane is, for example, cyclopentane, cyclohexane or the like. Polycyclic alkanes are, for example, adamantane, norbornane, isodecane, tricyclodecane, tetracyclododecane, and the like. Among them, a group obtained by removing one or more hydrogen atoms from adamantane is preferred.

R56’中,環結構中含有雜原子之脂肪族環式基,具體而言,例如後述之式(L1)~(L6)、(S1)~(S4)所表示之基等。 In R 56 ' , the ring structure contains an aliphatic ring group of a hetero atom, and specifically, for example, a group represented by the formulas (L1) to (L6), (S1) to (S4) which will be described later.

R56’中,脂肪族環式基中之氫原子被雜原子所取代者,具體而言,例如,脂肪族環式基中之氫原子被氧原子(=O)所取代者等。 In R 56 ' , a hydrogen atom in the aliphatic cyclic group is substituted by a hetero atom, and specifically, for example, a hydrogen atom in the aliphatic cyclic group is replaced by an oxygen atom (=O).

-C(=O)-O-R6’、-O-C(=O)-R7’、-O-R8’中之R6’、R7’、R8’,各自表示碳數1~25之直鏈狀、支鏈狀或碳數3~20之環狀之飽和烴基,或,碳數2~5之直鏈狀或支鏈狀之脂肪族不飽和烴基。 -C (= O) -OR 6 ' , -OC (= O) -R 7', -OR 8 ' in the R 6', R 7 ', R 8', each represents a straight-chain carbon atoms of 1 to 25 a saturated hydrocarbon group having a cyclic or branched shape or a carbon number of 3 to 20, or a linear or branched aliphatic unsaturated hydrocarbon group having 2 to 5 carbon atoms.

直鏈狀或支鏈狀之飽和烴基之碳數為1~25,以碳數 1~15為佳,以4~10為更佳。 a linear or branched saturated hydrocarbon group having a carbon number of 1 to 25 in terms of carbon number 1~15 is better, 4~10 is better.

直鏈狀之飽和烴基,例如,甲基、乙基、丙基、丁基、戊基、己基、庚基、辛基、壬基、癸基等。 A linear saturated hydrocarbon group, for example, a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, a heptyl group, an octyl group, a decyl group, a decyl group or the like.

支鏈狀之飽和烴基,除三級烷基以外,例如,1-甲基乙基、1-甲基丙基、2-甲基丙基、1-甲基丁基、2-甲基丁基、3-甲基丁基、1-乙基丁基、2-乙基丁基、1-甲基戊基、2-甲基戊基、3-甲基戊基、4-甲基戊基等。 Branched saturated hydrocarbon group, in addition to tertiary alkyl group, for example, 1-methylethyl, 1-methylpropyl, 2-methylpropyl, 1-methylbutyl, 2-methylbutyl , 3-methylbutyl, 1-ethylbutyl, 2-ethylbutyl, 1-methylpentyl, 2-methylpentyl, 3-methylpentyl, 4-methylpentyl, etc. .

前述直鏈狀或支鏈狀之飽和烴基,其可具有取代基。該取代基,例如,烷氧基、鹵素原子、鹵化烷基、羥基、氧原子(=O)、氰基、羧基等。 The aforementioned linear or branched saturated hydrocarbon group may have a substituent. The substituent is, for example, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, an oxygen atom (=O), a cyano group, a carboxyl group or the like.

作為前述直鏈狀或支鏈狀之飽和烴基之取代基的烷氧基,以碳數1~5之烷氧基為佳,以甲氧基、乙氧基、n-丙氧基、iso-丙氧基、n-丁氧基、tert-丁氧基為佳,以甲氧基、乙氧基為最佳。 The alkoxy group as a substituent of the above-mentioned linear or branched saturated hydrocarbon group is preferably an alkoxy group having 1 to 5 carbon atoms, and a methoxy group, an ethoxy group, an n-propoxy group, or an iso- A propoxy group, an n-butoxy group, and a tert-butoxy group are preferred, and a methoxy group and an ethoxy group are preferred.

作為前述直鏈狀或支鏈狀之飽和烴基之取代基的鹵素原子,例如,氟原子、氯原子、溴原子、碘原子等,又以氟原子為佳。 The halogen atom as a substituent of the linear or branched saturated hydrocarbon group, for example, a fluorine atom, a chlorine atom, a bromine atom, an iodine atom or the like is preferably a fluorine atom.

作為前述直鏈狀或支鏈狀之飽和烴基之取代基的鹵化烷基,例如,前述直鏈狀或支鏈狀之飽和烴基之氫原子的一部份或全部被前述鹵素原子所取代之基等。 a halogenated alkyl group as a substituent of the above-mentioned linear or branched saturated hydrocarbon group, for example, a part or all of a hydrogen atom of the above-mentioned linear or branched saturated hydrocarbon group is substituted by the aforementioned halogen atom Wait.

R6’、R7’、R8’中之碳數3~20之環狀之飽和烴基,可為多環式基、單環式基之任一者皆可,例如,由單環鏈烷去除1個氫原子所得之基;由二環鏈烷、三環鏈烷、四環鏈烷等多環鏈烷去除1個氫原子所得之基等。更具體而 言,例如,由環戊烷、環己烷、環庚烷、環辛烷等單環鏈烷,或金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等多環鏈烷去除1個氫原子所得之基等。 The cyclic saturated hydrocarbon group having 3 to 20 carbon atoms in R 6 ' , R 7 ' and R 8 ' may be any of a polycyclic group or a monocyclic group, for example, a monocyclic alkane. A group obtained by removing one hydrogen atom; a group obtained by removing one hydrogen atom from a polycyclic alkane such as a bicycloalkane, a tricycloalkane or a tetracycloalkane. More specifically, for example, a monocyclic alkane such as cyclopentane, cyclohexane, cycloheptane or cyclooctane, or adamantane, norbornane, isodecane, tricyclodecane or tetracyclic A group obtained by removing one hydrogen atom such as a polycyclic alkane such as an alkane.

該環狀之飽和烴基,其可具有取代基。例如,構成該環狀之烷基所具有之環之碳原子的一部份可被雜原子所取代,鍵結於該環狀之烷基所具有之環的氫原子可被取代基所取代。 The cyclic saturated hydrocarbon group may have a substituent. For example, a part of a carbon atom constituting a ring of the cyclic alkyl group may be substituted by a hetero atom, and a hydrogen atom bonded to a ring of the cyclic alkyl group may be substituted with a substituent.

前者之例,例如,由構成前述單環鏈烷或多環鏈烷之環之碳原子的一部份被氧原子、硫原子、氮原子等雜原子所取代之雜環鏈烷去除1個以上之氫原子所得之基等。又,前述環之結構中,可具有酯鍵結(-C(=O)-O-)。具體而言,例如,由γ-丁內酯去除1個氫原子所得之基等含內酯之單環式基,或由具有內酯環之二環鏈烷、三環鏈烷、四環鏈烷去除1個氫原子所得之基等含內酯之多環式基等。 In the former example, for example, one or more of the carbon atoms constituting the ring of the monocyclic alkane or the polycyclic alkane are substituted with one or more heterocycloalkanes substituted with a hetero atom such as an oxygen atom, a sulfur atom or a nitrogen atom. The base obtained by the hydrogen atom or the like. Further, the structure of the ring may have an ester bond (-C(=O)-O-). Specifically, for example, a lactone-containing monocyclic group such as a group obtained by removing one hydrogen atom from γ-butyrolactone, or a bicycloalkane having a lactone ring, a tricycloalkane or a tetracyclic chain A polycyclic group containing a lactone such as a group obtained by removing one hydrogen atom from an alkane.

後者之例中之取代基,與上述直鏈狀或支鏈狀之烷基所可具有之取代基所列舉之取代基為相同者,可例如低級烷基等。 The substituent in the latter example may be the same as the substituent exemplified as the substituent which the linear or branched alkyl group may have, and may be, for example, a lower alkyl group.

又,R6’、R7’、R8’可為直鏈狀或支鏈狀之烷基,與環狀烷基之組合。 Further, R 6' , R 7' and R 8' may be a linear or branched alkyl group in combination with a cyclic alkyl group.

直鏈狀或支鏈狀之烷基與環狀烷基之組合,例如,直鏈狀或支鏈狀之烷基鍵結作為取代基之環狀之烷基所得之基、環狀之烷基鍵結作為取代基之直鏈狀或支鏈狀之烷基所得之基等。 a combination of a linear or branched alkyl group and a cyclic alkyl group, for example, a linear or branched alkyl group bonded to a cyclic alkyl group as a substituent, a cyclic alkyl group A group obtained by bonding a linear or branched alkyl group as a substituent.

R6’、R7’、R8’中之直鏈狀之脂肪族不飽和烴基,例如,乙烯基、丙烯基(烯丙基)、丁烯基等。 A linear aliphatic unsaturated hydrocarbon group in R 6 ' , R 7 ' or R 8 ' , for example, a vinyl group, a propenyl group, a butenyl group or the like.

R6’、R7’、R8’中之支鏈狀之脂肪族不飽和烴基,例如,1-甲基丙烯基、2-甲基丙烯基等。 A branched aliphatic unsaturated hydrocarbon group in R 6 ' , R 7 ' and R 8' , for example, a 1-methylpropenyl group, a 2-methylpropenyl group or the like.

該直鏈狀或支鏈狀之脂肪族不飽和烴基可具有取代基。該取代基與前述直鏈狀或支鏈狀之烷基所可具有之取代基所列舉者為相同之內容等。 The linear or branched aliphatic unsaturated hydrocarbon group may have a substituent. The substituent is the same as those exemplified for the substituent which the linear or branched alkyl group may have.

R7’、R8’中,於上述之中,就使微影蝕刻特性、光阻圖型形狀更為良好之觀點,以碳數1~15之直鏈狀或支鏈狀之飽和烴基,或碳數3~20之環狀之飽和烴基為佳。 Among the above, R 7 ' and R 8 ' are a linear or branched saturated hydrocarbon group having a carbon number of 1 to 15 from the viewpoint of further improving the lithographic etching property and the photoresist pattern shape. Or a cyclic saturated hydrocarbon group having a carbon number of 3 to 20 is preferred.

R1”~R3”之芳基,分別以苯基或萘基為佳。 The aryl group of R 1" to R 3" is preferably a phenyl group or a naphthyl group.

R1”~R3”之烷基,例如,碳數1~10之直鏈狀、支鏈狀或環狀之烷基等。其中,就具有優良解析性之觀點,以碳數1~5者為佳。具體而言,例如,甲基、乙基、n-丙基、異丙基、n-丁基、異丁基、n-戊基、環戊基、己基、環己基、壬基、癸基等,又就具有優良解析性,或可廉價合成等觀點之較佳取代基,可列舉如甲基。 The alkyl group of R 1" to R 3" is, for example, a linear, branched or cyclic alkyl group having 1 to 10 carbon atoms. Among them, the viewpoint of excellent resolution is preferably 1 to 5 carbon atoms. Specifically, for example, methyl, ethyl, n-propyl, isopropyl, n-butyl, isobutyl, n-pentyl, cyclopentyl, hexyl, cyclohexyl, decyl, decyl, etc. Further preferred substituents having excellent analytical properties or inexpensive synthesis can be exemplified by a methyl group.

R1”~R3”之烯基,例如,碳數2~10為佳,以2~5為較佳,以2~4為更佳。具體而言,例如,乙烯基、丙烯基(烯丙基)、丁烯基、1-甲基丙烯基、2-甲基丙烯基等。 The alkenyl group of R 1" to R 3" is preferably 2 to 10 carbon atoms, more preferably 2 to 5 carbon atoms, and still more preferably 2 to 4 carbon atoms. Specifically, for example, a vinyl group, a propenyl group (allyl group), a butenyl group, a 1-methylpropenyl group, a 2-methylpropenyl group, or the like.

R1”~R3”之烷基、烯基可為,可被烷基、烷氧基、鹵素原子、羥基、酮基(=O)、芳基、烷氧烷基氧基、烷氧羰基烷基氧基、-C(=O)-O-R6’、-O-C(=O)-R7’、-O-R8’等所 取代之取代烷基、取代烯基亦可。該些取代基例如,上述取代芳基所可具有之取代基為相同之內容。 The alkyl or alkenyl group of R 1" to R 3" may be an alkyl group, an alkoxy group, a halogen atom, a hydroxyl group, a keto group (=O), an aryl group, an alkoxyalkyloxy group or an alkoxycarbonyl group. A substituted alkyl group or a substituted alkenyl group substituted with an alkyloxy group, -C(=O)-OR 6' , -OC(=O)-R 7' or -OR 8' may be used. These substituents have, for example, the substituents which the above substituted aryl group may have the same content.

R1”~R3”之中,任意2個相互鍵結,並與式中之硫原子共同形成環之情形,包含硫原子,以形成3~10員環為佳,以形成5~7員環為特佳。 Among R 1" to R 3" , any two of them are bonded to each other and form a ring together with the sulfur atom in the formula, and include a sulfur atom to form a 3 to 10 member ring to form a 5 to 7 member. The ring is especially good.

R1”~R3”之中,任意2個相互鍵結,並與式中之硫原子共同形成環之情形,殘留之1個,以芳基為佳。前述芳基,與前述R1”~R3”之芳基為相同之內容等。 Among R 1" to R 3" , any two of them are bonded to each other and form a ring together with the sulfur atom in the formula, and one of them remains, and an aryl group is preferred. The aryl group is the same as the aryl group of the above R 1" to R 3" .

前述式(b-1)所表示之化合物中的陽離子部之具體例,例如,三苯基鋶、(3,5-二甲基苯基)二苯基鋶、(4-(2-金剛烷氧基甲基氧基)-3,5-二甲基苯基)二苯基鋶、(4-(2-金剛烷氧基甲基氧基)苯基)二苯基鋶、(4-(tert-丁氧基羰基甲基氧基)苯基)二苯基鋶、(4-(tert-丁氧基羰基甲基氧基)-3,5-二甲基苯基)二苯基鋶、(4-(2-甲基-2-金剛烷氧基羰基甲基氧基)苯基)二苯基鋶、(4-(2-甲基-2-金剛烷氧基羰基甲基氧基)-3,5-二甲基苯基)二苯基鋶、三(4-甲基苯基)鋶、二甲基(4-羥基萘基)鋶、單苯基二甲基鋶、二苯基單甲基鋶、(4-甲基苯基)二苯基鋶、(4-甲氧基苯基)二苯基鋶、三(4-tert-丁基)苯基鋶、二苯基(1-(4-甲氧基)萘基)鋶、二(1-萘基)苯基鋶、1-苯基四氫噻吩鎓、1-(4-甲基苯基)四氫噻吩鎓、1-(3,5-二甲基-4-羥基苯基)四氫噻吩鎓、1-(4-甲氧基萘-1-基)四氫噻吩鎓、1-(4-乙氧基萘-1-基)四氫噻吩鎓、1-(4-n-丁氧基萘-1- 基)四氫噻吩鎓、1-苯基四氫噻喃鎓、1-(4-羥基苯基)四氫噻喃鎓、1-(3,5-二甲基-4-羥基苯基)四氫噻喃鎓、1-(4-甲基苯基)四氫噻喃鎓等。 Specific examples of the cation moiety in the compound represented by the above formula (b-1), for example, triphenylsulfonium, (3,5-dimethylphenyl)diphenylphosphonium, (4-(2-adamantane) Oxymethylmethyl)-3,5-dimethylphenyl)diphenylanthracene, (4-(2-adamantyloxymethyloxy)phenyl)diphenylphosphonium, (4-( Tert-butoxycarbonylmethyloxy)phenyl)diphenylphosphonium, (4-(tert-butoxycarbonylmethyloxy)-3,5-dimethylphenyl)diphenylphosphonium, (4-(2-Methyl-2-adamantyloxycarbonylmethyloxy)phenyl)diphenylphosphonium, (4-(2-methyl-2-adamantyloxycarbonylmethyloxy)) -3,5-dimethylphenyl)diphenylanthracene, tris(4-methylphenyl)anthracene, dimethyl(4-hydroxynaphthyl)anthracene, monophenyldimethylhydrazine, diphenyl Monomethyl hydrazine, (4-methylphenyl) diphenyl fluorene, (4-methoxyphenyl) diphenyl fluorene, tris(4-tert-butyl)phenyl fluorene, diphenyl (1 -(4-methoxy)naphthyl)anthracene, bis(1-naphthyl)phenylanthracene, 1-phenyltetrahydrothiophene, 1-(4-methylphenyl)tetrahydrothiophene, 1- (3,5-Dimethyl-4-hydroxyphenyl)tetrahydrothiophene oxime, 1-(4-methoxynaphthalen-1-yl)tetrahydrothiophene oxime, 1-(4-ethoxynaphthalene-1 -yl)tetrahydrothiophene, 1-(4-n-butoxynaphthalene-1- Tetrahydrothiophene oxime, 1-phenyltetrahydrothiopyranium, 1-(4-hydroxyphenyl)tetrahydrothiopyran, 1-(3,5-dimethyl-4-hydroxyphenyl)tetra Hydrothiazolidine, 1-(4-methylphenyl)tetrahydrothiopyrene, and the like.

又,前述式(b-1)所表示之化合物中的陽離子部中之較適合者,具體而言,例如以下所示內容等。 In addition, as for the more suitable one of the cations in the compound represented by the formula (b-1), specifically, the contents shown below are as follows.

[式中,g1表示重複單位,1~5之整數]。 [wherein, g1 represents a repeating unit, an integer of 1 to 5].

[式中,g2、g3表示重複單位,g2為0~20之整數,g3為0~20之整數]。 [wherein, g2 and g3 represent repeating units, g2 is an integer of 0 to 20, and g3 is an integer of 0 to 20].

式(b-1)中,R4”表示可具有取代基之烷基、鹵化烷基、芳基,或烯基。 In the formula (b-1), R 4" represents an alkyl group, a halogenated alkyl group, an aryl group or an alkenyl group which may have a substituent.

R4”中之烷基,可為直鏈狀、支鏈狀或環狀之任一者皆可。 The alkyl group in R 4" may be any of a linear chain, a branched chain or a cyclic chain.

前述直鏈狀或支鏈狀之烷基,以碳數1~10為佳,以碳數1~8為較佳,以碳數1~4為最佳。 The linear or branched alkyl group is preferably a carbon number of 1 to 10, preferably a carbon number of 1 to 8, and preferably a carbon number of 1 to 4.

前述環狀之烷基,以碳數4~15為佳,以碳數4~10為更佳,以碳數6~10為最佳。 The cyclic alkyl group is preferably a carbon number of 4 to 15, preferably a carbon number of 4 to 10, and a carbon number of 6 to 10.

R4”中之鹵化烷基,例如,前述直鏈狀、支鏈狀或環狀之烷基之氫原子的一部份或全部被鹵素原子所取代之基等。該鹵素原子,例如,氟原子、氯原子、溴原子、碘原子等,又以氟原子為佳。 The halogen atom R 4 halogenated alkyl group "in the, for example, the linear, a part of hydrogen atoms of branched or cyclic alkyl group of or all group substituted with the halogen atom and the like, e.g., fluoro An atom, a chlorine atom, a bromine atom, an iodine atom, etc., preferably a fluorine atom.

鹵化烷基中,相對於該鹵化烷基所含之鹵素原子及氫原子之合計數,鹵素原子數之比例(鹵化率(%)),以10~100%為佳,以50~100%為佳,以100%為最佳。該鹵化率越高時,以酸之強度越強,而為更佳。 In the halogenated alkyl group, the ratio of the number of halogen atoms (halogenation ratio (%)) to the total number of halogen atoms and hydrogen atoms contained in the halogenated alkyl group is preferably from 10 to 100%, and from 50 to 100%. Good, 100% is the best. When the halogenation rate is higher, the stronger the strength of the acid, the more preferable.

前述R4”中之芳基,以碳數6~20之芳基為佳。 The aryl group in the above R 4" is preferably an aryl group having 6 to 20 carbon atoms.

前述R4”中之烯基,以碳數2~10之烯基為佳。 The alkenyl group in the above R 4" is preferably an alkenyl group having 2 to 10 carbon atoms.

前述R4”中,「可具有取代基」係指,前述直鏈狀、支鏈狀或環狀之烷基、鹵化烷基、芳基,或烯基中之氫原子的一部份或全部可被取代基(氫原子以外之其他原子或基)所取代亦可之意。 In the above R 4" , "may have a substituent" means a part or all of a hydrogen atom in the above linear, branched or cyclic alkyl group, halogenated alkyl group, aryl group or alkenyl group. It may also be substituted by a substituent (other than a hydrogen atom or a base).

R4”中之取代基之數,可為1個亦可、2個以上亦可。 The number of the substituents in R 4" may be one or two or more.

前述取代基,例如,鹵素原子、雜原子、烷基、羥基、式:X3-Q1-[式中,Q1為含有氧原子之2價之鍵結基,X3為可具有取代基之碳數3~30之烴基]所表示之基等。 The above substituent, for example, a halogen atom, a hetero atom, an alkyl group, a hydroxyl group, a formula: X 3 -Q 1 - [wherein, Q 1 is a divalent bond group containing an oxygen atom, and X 3 may have a substituent. The base represented by the hydrocarbon group of 3 to 30 carbon atoms.

前述鹵素原子、烷基,與R4”中,鹵化烷基中之鹵素原子、烷基所列舉者為相同之內容等。 The halogen atom or the alkyl group is the same as the halogen atom or the alkyl group in the halogenated alkyl group in R 4" .

前述雜原子,例如,氧原子、氮原子、硫原子等。 The aforementioned hetero atom is, for example, an oxygen atom, a nitrogen atom, a sulfur atom or the like.

X3-Q1-所表示之基中,Q1為含有氧原子之2價之鍵結基。 In the group represented by X 3 -Q 1 -, Q 1 is a divalent bond group containing an oxygen atom.

Q1,可含有氧原子以外之原子。氧原子以外之原子,例如,碳原子、氫原子、氧原子、硫原子、氮原子等。 Q 1 may contain atoms other than oxygen atoms. An atom other than an oxygen atom, for example, a carbon atom, a hydrogen atom, an oxygen atom, a sulfur atom, a nitrogen atom or the like.

含有氧原子之2價之鍵結基,例如,氧原子(醚鍵結;-O-)、酯鍵結(-C(=O)-O-)、醯胺鍵結(-C(=O)-NH-)、羰基(-C(=O)-)、碳酸酯鍵結(-O-C(=O)-O-)等非烴系的含氧原子之鍵結基;該非烴系的含氧原子之鍵結基與伸烷基之組合等。 a divalent bond group containing an oxygen atom, for example, an oxygen atom (ether bond; -O-), an ester bond (-C(=O)-O-), a guanamine bond (-C(=O) a non-hydrocarbon oxygen atom-containing bond group such as -NH-), a carbonyl group (-C(=O)-), a carbonate bond (-OC(=O)-O-); a combination of a bonding group of an oxygen atom and an alkyl group.

該組合,例如,-R91-O-、-R92-O-C(=O)-、-C(=O)-O-R93-O-C(=O)-(式中,R91~R93為各自獨立之伸烷基)等。 The combination, for example, -R 91 -O-, -R 92 -OC(=O)-, -C(=O)-OR 93 -OC(=O)- (wherein, R 91 to R 93 are each Independent alkyl group) and the like.

R91~R93中之伸烷基,以直鏈狀或支鏈狀之伸烷基為佳,該伸烷基的碳數以1~12為佳,以1~5為較佳,以1~3為特佳。 The alkylene group in R 91 to R 93 is preferably a linear or branched alkyl group. The carbon number of the alkyl group is preferably from 1 to 12, preferably from 1 to 5, and is 1 ~3 is especially good.

該伸烷基,具體而言,例如,伸甲基[-CH2-];-CH(CH3)-、-CH(CH2CH3)-、-C(CH3)2-、-C(CH3)(CH2CH3)-、-C(CH3)(CH2CH2CH3)-、-C(CH2CH3)2-等烷基伸甲基;伸乙基[-CH2CH2-];-CH(CH3)CH2-、-CH(CH3)CH(CH3)-、-C(CH3)2CH2-、-CH(CH2CH3)CH2-等烷基伸乙基;伸三甲基(n-伸丙基)[-CH2CH2CH2-];-CH(CH3)CH2CH2-、-CH2CH(CH3)CH2-等烷基伸三甲基;伸四甲基[-CH2CH2CH2CH2-];-CH(CH3)CH2CH2CH2-、-CH2CH(CH3)CH2CH2-等烷基伸四甲基;伸五甲基 [-CH2CH2CH2CH2CH2-]等。 The alkylene group, specifically, for example, methyl [-CH 2 -]; -CH(CH 3 )-, -CH(CH 2 CH 3 )-, -C(CH 3 ) 2 -, -C (CH 3 )(CH 2 CH 3 )-, -C(CH 3 )(CH 2 CH 2 CH 3 )-, -C(CH 2 CH 3 ) 2 - and the like alkyl-extension methyl; ex-ethyl [-CH 2 CH 2 -]; -CH(CH 3 )CH 2 -, -CH(CH 3 )CH(CH 3 )-, -C(CH 3 ) 2 CH 2 -, -CH(CH 2 CH 3 )CH 2 -isoalkyl extended ethyl; trimethyl (n-propyl)[-CH 2 CH 2 CH 2 -]; -CH(CH 3 )CH 2 CH 2 -, -CH 2 CH(CH 3 )CH 2 -isoalkyl extended trimethyl; tetramethyl [-CH 2 CH 2 CH 2 CH 2 -]; -CH(CH 3 )CH 2 CH 2 CH 2 -, -CH 2 CH(CH 3 )CH 2 CH 2 -Isoalkylalkyltetramethyl; pentamethyl [-CH 2 CH 2 CH 2 CH 2 CH 2 -] and the like.

Q1,以含有酯鍵結或醚鍵結之2價之鍵結基為佳,其中又以-R91-O-、-R92-O-C(=O)-或-C(=O)-O-R93-O-C(=O)-為佳。 Q 1 , preferably a divalent bond group containing an ester bond or an ether bond, wherein -R 91 -O-, -R 92 -OC(=O)- or -C(=O)- OR 93 -OC(=O)- is preferred.

X3-Q1-所表示之基中,X3之烴基,可為芳香族烴基亦可、脂肪族烴基亦可。 In the group represented by X 3 -Q 1 -, the hydrocarbon group of X 3 may be an aromatic hydrocarbon group or an aliphatic hydrocarbon group.

芳香族烴基為具有芳香環之烴基。該芳香族烴基之碳數以3~30為佳,以5~30為較佳,以5~20為更佳,以6~15為特佳,以6~12為最佳。但,該碳數中,為不包含取代基中之碳數者。 The aromatic hydrocarbon group is a hydrocarbon group having an aromatic ring. The carbon number of the aromatic hydrocarbon group is preferably from 3 to 30, preferably from 5 to 30, more preferably from 5 to 20, most preferably from 6 to 15, and most preferably from 6 to 12. However, among the carbon numbers, those having no carbon number in the substituent are included.

芳香族烴基,具體而言,例如,由苯基、聯苯(biphenyl)基、茀(fluorenyl)基、萘基、蒽(anthryl)基、菲基等芳香族烴環去除1個氫原子所得之芳基、苄基、苯基乙基、1-萘基甲基、2-萘基甲基、1-萘基乙基、2-萘基乙基等芳烷基等。前述芳烷基中之烷基鏈之碳數,以1~4為佳,以1~2為較佳,以1為特佳。 The aromatic hydrocarbon group is specifically obtained, for example, by removing one hydrogen atom from an aromatic hydrocarbon ring such as a phenyl group, a biphenyl group, a fluorenyl group, a naphthyl group, an anthryl group or a phenanthryl group. An aralkyl group such as an aryl group, a benzyl group, a phenylethyl group, a 1-naphthylmethyl group, a 2-naphthylmethyl group, a 1-naphthylethyl group or a 2-naphthylethyl group. The number of carbon atoms in the alkyl chain in the aralkyl group is preferably from 1 to 4, more preferably from 1 to 2, particularly preferably from 1 to 1.

該芳香族烴基,其可具有取代基。例如,構成該芳香族烴基所具有之芳香環的碳原子之一部份可被雜原子所取代、鍵結於該芳香族烴基所具有之芳香環的氫原子可被取代基所取代等。 The aromatic hydrocarbon group may have a substituent. For example, a part of a carbon atom constituting an aromatic ring of the aromatic hydrocarbon group may be substituted by a hetero atom, and a hydrogen atom bonded to an aromatic ring of the aromatic hydrocarbon group may be substituted by a substituent or the like.

前者之例如,構成前述芳基之環的碳原子之一部份被氧原子、硫原子、氮原子等雜原子所取代之雜芳基、構成前述芳烷基中之芳香族烴之環的碳原子之一部份被前述雜原子所取代之雜芳烷基等。 In the former, for example, a heteroaryl group in which a part of a carbon atom constituting the ring of the aryl group is substituted with a hetero atom such as an oxygen atom, a sulfur atom or a nitrogen atom, and a carbon constituting a ring of an aromatic hydrocarbon in the aralkyl group; A heteroarylalkyl group in which a part of an atom is substituted by the aforementioned hetero atom.

後者例示中之芳香族烴基之取代基,例如,烷基、烷氧基、鹵素原子、鹵化烷基、羥基、氧原子(=O)等。 The latter exemplifies a substituent of the aromatic hydrocarbon group in the latter, for example, an alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, an oxygen atom (=O), or the like.

作為前述芳香族烴基之取代基的烷基,以碳數1~5之烷基為佳,以甲基、乙基、丙基、n-丁基、tert-丁基為最佳。 The alkyl group as a substituent of the aromatic hydrocarbon group is preferably an alkyl group having 1 to 5 carbon atoms, and most preferably a methyl group, an ethyl group, a propyl group, an n-butyl group or a tert-butyl group.

作為前述芳香族烴基之取代基的烷氧基,以碳數1~5之烷氧基為佳,以甲氧基、乙氧基、n-丙氧基、iso-丙氧基、n-丁氧基、tert-丁氧基為佳,以甲氧基、乙氧基為最佳。 The alkoxy group as a substituent of the aromatic hydrocarbon group is preferably an alkoxy group having 1 to 5 carbon atoms, and a methoxy group, an ethoxy group, an n-propoxy group, an iso-propoxy group, and an n-butyl group. The oxy group and the tert-butoxy group are preferred, and the methoxy group and the ethoxy group are preferred.

前述作為芳香族烴基之取代基的鹵素原子,例如,氟原子、氯原子、溴原子、碘原子等,又以氟原子為佳。 The halogen atom as the substituent of the aromatic hydrocarbon group, for example, a fluorine atom, a chlorine atom, a bromine atom, an iodine atom or the like, is preferably a fluorine atom.

作為前述芳香族烴基之取代基的鹵化烷基,例如,前述烷基之氫原子的一部份或全部被前述鹵素原子所取代之基等。 The halogenated alkyl group as a substituent of the aromatic hydrocarbon group is, for example, a group in which a part or all of a hydrogen atom of the alkyl group is substituted by the halogen atom.

X3中之脂肪族烴基,可為飽和脂肪族烴基亦可、不飽和酯肪族烴基亦可。又,脂肪族烴基,可為直鏈狀、支鏈狀、環狀之任一者皆可。 The aliphatic hydrocarbon group in X 3 may be a saturated aliphatic hydrocarbon group or an unsaturated aliphatic hydrocarbon group. Further, the aliphatic hydrocarbon group may be any of a linear chain, a branched chain, and a cyclic chain.

X3中,脂肪族烴基中,構成該脂肪族烴基之碳原子的一部份可被含雜原子之取代基所取代、構成該脂肪族烴基之氫原子的一部份或全部被含雜原子之取代基所取代亦可。 In X 3 , in the aliphatic hydrocarbon group, a part of a carbon atom constituting the aliphatic hydrocarbon group may be substituted by a substituent containing a hetero atom, and a part or all of hydrogen atoms constituting the aliphatic hydrocarbon group may be contained in a hetero atom. Substituents can also be substituted.

X3中之「雜原子」,只要為碳原子及氫原子以外之原子時,並未有特別之限定,例如,鹵素原子、氧原子、硫原子、氮原子等。鹵素原子,例如,氟原子、氯原子、碘 原子、溴原子等。 The "hetero atom" in X 3 is not particularly limited as long as it is an atom other than a carbon atom or a hydrogen atom, and examples thereof include a halogen atom, an oxygen atom, a sulfur atom, and a nitrogen atom. A halogen atom, for example, a fluorine atom, a chlorine atom, an iodine atom, a bromine atom or the like.

含雜原子之取代基,可為僅由前述雜原子所構成者亦可、含有前述雜原子以外之基或原子之基亦可。 The substituent containing a hetero atom may be a group consisting of only the above-mentioned hetero atom, and may contain a group other than the above-mentioned hetero atom or an atom.

取代一部份碳原子之取代基,具體而言,例如,-O-、-C(=O)-O-、-C(=O)-、-O-C(=O)-O-、-C(=O)-NH-、-NH-(H可被烷基、醯基等取代基所取代)、-S-、-S(=O)2-、-S(=O)2-O-等。脂肪族烴基為環狀之情形,該些取代基可包含於環結構中亦可。 Substituting a substituent of a part of carbon atoms, specifically, for example, -O-, -C(=O)-O-, -C(=O)-, -OC(=O)-O-, -C (=O)-NH-, -NH- (H can be substituted by a substituent such as an alkyl group or a fluorenyl group), -S-, -S(=O) 2 -, -S(=O) 2 -O- Wait. In the case where the aliphatic hydrocarbon group is cyclic, the substituents may be included in the ring structure.

取代一部份或全部氫原子之取代基,具體而言,例如,烷氧基、鹵素原子、鹵化烷基、羥基、氧原子(=O)、氰基等。 A substituent which substitutes a part or all of a hydrogen atom, specifically, for example, an alkoxy group, a halogen atom, an alkyl halide group, a hydroxyl group, an oxygen atom (=O), a cyano group or the like.

前述烷氧基,以碳數1~5之烷氧基為佳,以甲氧基、乙氧基、n-丙氧基、iso-丙氧基、n-丁氧基、tert-丁氧基為佳,以甲氧基、乙氧基為最佳。 The alkoxy group is preferably an alkoxy group having 1 to 5 carbon atoms, and is a methoxy group, an ethoxy group, an n-propoxy group, an iso-propoxy group, an n-butoxy group or a tert-butoxy group. Preferably, methoxy and ethoxy groups are preferred.

前述鹵素原子,例如,氟原子、氯原子、溴原子、碘原子等,又以氟原子為佳。 The halogen atom, for example, a fluorine atom, a chlorine atom, a bromine atom, an iodine atom or the like, is preferably a fluorine atom.

前述鹵化烷基為,碳數1~5之烷基,例如,甲基、乙基、丙基、n-丁基、tert-丁基等烷基中之氫原子的一部份或全部被前述鹵素原子所取代之基等。 The halogenated alkyl group is an alkyl group having 1 to 5 carbon atoms, for example, a part or all of hydrogen atoms in an alkyl group such as a methyl group, an ethyl group, a propyl group, an n-butyl group or a tert-butyl group. A group substituted by a halogen atom or the like.

脂肪族烴基,以直鏈狀或支鏈狀之飽和烴基、直鏈狀或支鏈狀之1價之不飽和烴基,或環狀脂肪族烴基(脂肪族環式基)為佳。 The aliphatic hydrocarbon group is preferably a linear or branched saturated hydrocarbon group, a linear or branched monovalent unsaturated hydrocarbon group, or a cyclic aliphatic hydrocarbon group (aliphatic cyclic group).

直鏈狀之飽和烴基(烷基),以碳數1~20為佳,以1~15為較佳,以1~10為最佳。具體而言,例如,甲 基、乙基、丙基、丁基、戊基、己基、庚基、辛基、壬基、癸基、十一烷基、十二烷基、十三烷基、異十三烷基、十四烷基、十五烷基、十六烷基、異十六烷基、十七烷基、十八烷基、十九烷基、二十烷基、二十一烷基、二十二烷基等。 The linear saturated hydrocarbon group (alkyl group) preferably has a carbon number of 1 to 20, preferably 1 to 15, and preferably 1 to 10. Specifically, for example, A Base, ethyl, propyl, butyl, pentyl, hexyl, heptyl, octyl, decyl, decyl, undecyl, dodecyl, tridecyl, isotridecyl, ten Tetraalkyl, pentadecyl, hexadecyl, isohexadecyl, heptadecyl, octadecyl, nonadecyl, eicosyl, icosyl, docosane Base.

支鏈狀之飽和烴基(烷基),其碳數以3~20為佳,以3~15為較佳,以3~10為最佳。具體而言,例如,1-甲基乙基、1-甲基丙基、2-甲基丙基、1-甲基丁基、2-甲基丁基、3-甲基丁基、1-乙基丁基、2-乙基丁基、1-甲基戊基、2-甲基戊基、3-甲基戊基、4-甲基戊基等。 The branched saturated hydrocarbon group (alkyl group) preferably has a carbon number of 3 to 20, preferably 3 to 15 and most preferably 3 to 10. Specifically, for example, 1-methylethyl, 1-methylpropyl, 2-methylpropyl, 1-methylbutyl, 2-methylbutyl, 3-methylbutyl, 1- Ethyl butyl, 2-ethylbutyl, 1-methylpentyl, 2-methylpentyl, 3-methylpentyl, 4-methylpentyl, and the like.

不飽和烴基,其碳數以2~10為佳,以2~5為佳,以2~4為佳,以3為特佳。直鏈狀之1價之不飽和烴基,例如,乙烯基、丙烯基(烯丙基)、丁烯基等。支鏈狀之1價之不飽和烴基,例如,1-甲基丙烯基、2-甲基丙烯基等。 The unsaturated hydrocarbon group preferably has a carbon number of 2 to 10, preferably 2 to 5, preferably 2 to 4, and particularly preferably 3. A linear monovalent unsaturated hydrocarbon group, for example, a vinyl group, a propenyl group, a butenyl group or the like. A branched monovalent unsaturated hydrocarbon group, for example, a 1-methylpropenyl group, a 2-methylpropenyl group or the like.

不飽和烴基,於上述之中特別是以丙烯基為佳。 The unsaturated hydrocarbon group is particularly preferably an propylene group among the above.

脂肪族環式基,可為單環式基亦可、多環式基亦可。其碳數以3~30為佳,以5~30為較佳,以5~20為更佳,以6~15為特佳,以6~12為最佳。 The aliphatic cyclic group may be a monocyclic group or a polycyclic group. The carbon number is preferably 3 to 30, preferably 5 to 30, more preferably 5 to 20, and 6 to 15 is preferred, and 6 to 12 is the best.

具體而言,例如,由單環鏈烷去除1個以上之氫原子所得之基;由二環鏈烷、三環鏈烷、四環鏈烷等多環鏈烷去除1個以上之氫原子所得之基等。更具體而言,例如,由環戊烷、環己烷等單環鏈烷去除1個以上之氫原子所得之基;由金剛烷、降莰烷、異莰烷、三環癸烷、四環十二 烷等多環鏈烷去除1個以上之氫原子所得之基等。 Specifically, for example, a group obtained by removing one or more hydrogen atoms from a monocyclic alkane; and removing one or more hydrogen atoms from a polycyclic alkane such as a bicycloalkane, a tricycloalkane or a tetracycloalkane; Base and so on. More specifically, for example, a group obtained by removing one or more hydrogen atoms from a monocyclic alkane such as cyclopentane or cyclohexane; adamantane, norbornane, isodecane, tricyclodecane, tetracyclic twelve A group obtained by removing one or more hydrogen atoms from a polycyclic alkane such as an alkane.

脂肪族環式基,其環結構中不含有含雜原子之取代基之情形,該脂肪族環式基,以多環式基為佳,以由多環鏈烷去除1個以上之氫原子所得之基為佳,以由金剛烷去除1個以上之氫原子所得之基為最佳。 An aliphatic cyclic group having no ring-containing substituents in the ring structure, and the aliphatic ring group is preferably a polycyclic group, and one or more hydrogen atoms are removed from the polycyclic alkane. The base is preferably a group obtained by removing one or more hydrogen atoms from adamantane.

脂肪族環式基,其環結構中含有含雜原子之取代基之情形,該含雜原子之取代基,以-O-、-C(=O)-O-、-S-、-S(=O)2-、-S(=O)2-O-為佳。該脂肪族環式基之具體例,例如,下述式(L1)~(L6)、(S1)~(S4)等。 An aliphatic cyclic group having a substituent containing a hetero atom in the ring structure, the substituent containing a hetero atom, -O-, -C(=O)-O-, -S-, -S( =O) 2 -, -S(=O) 2 -O- is preferred. Specific examples of the aliphatic cyclic group include, for example, the following formulae (L1) to (L6), (S1) to (S4), and the like.

[式中,Q”為碳數1~5之伸烷基、-O-、-S-、-O-R94-或-S-R95-,R94及R95為各自獨立之碳數1~5之伸烷基,m為0或1之整數]。 [wherein Q" is an alkylene group having 1 to 5 carbon atoms, -O-, -S-, -OR 94 - or -SR 95 -, and R 94 and R 95 are each independently a carbon number of 1 to 5 An alkyl group, m is an integer of 0 or 1.

式中,Q”、R94及R95中之伸烷基,分別與前述R91~R93中之伸烷基為相同之內容等。 Wherein, Q ", R 94 and R 95 in the alkylene group, respectively, and the R 91 ~ R 93 in the alkylene group is of the same content.

該些脂肪族環式基中,構成該環結構之碳原子所鍵結之氫原子的一部份可被取代基所取代。該取代基,例如, 烷基、烷氧基、鹵素原子、鹵化烷基、羥基、氧原子(=O)等。 In the aliphatic cyclic group, a part of a hydrogen atom to which a carbon atom constituting the ring structure is bonded may be substituted with a substituent. The substituent, for example, An alkyl group, an alkoxy group, a halogen atom, a halogenated alkyl group, a hydroxyl group, an oxygen atom (=O), or the like.

前述烷基,以碳數1~5之烷基為佳,以甲基、乙基、丙基、n-丁基、tert-丁基為特佳。 The alkyl group is preferably an alkyl group having 1 to 5 carbon atoms, particularly preferably a methyl group, an ethyl group, a propyl group, an n-butyl group or a tert-butyl group.

前述烷氧基、鹵素原子分別與前述X3之脂肪族烴基中,可取代一部份或全部氫原子之取代基所列舉者為相同之內容等。 The alkoxy group and the halogen atom respectively have the same contents as those of the substituent of the aliphatic hydrocarbon group of the above X 3 which may be substituted for a part or all of the hydrogen atoms.

本發明中,X3,以可具有取代基之環式基為佳。該環式基為,可具有取代基之芳香族烴基亦可、可具有取代基之脂肪族環式基亦可,又以可具有取代基之脂肪族環式基為佳。 In the present invention, X 3 is preferably a cyclic group which may have a substituent. The cyclic group may be an aromatic hydrocarbon group which may have a substituent, an aliphatic cyclic group which may have a substituent, and an aliphatic cyclic group which may have a substituent.

前述芳香族烴基,以可具有取代基之萘基,或可具有取代基之苯基為佳。 The aromatic hydrocarbon group is preferably a naphthyl group which may have a substituent or a phenyl group which may have a substituent.

可具有取代基之脂肪族環式基,以可具有取代基之多環式之脂肪族環式基為佳。該多環式之脂肪族環式基,例如以由前述多環鏈烷去除1個以上之氫原子所得之基、前述(L2)~(L6)、(S3)~(S4)等為佳。 The aliphatic cyclic group which may have a substituent is preferably a polycyclic aliphatic ring group which may have a substituent. The polycyclic aliphatic cyclic group is preferably a group obtained by removing one or more hydrogen atoms from the polycyclic alkane, and the above (L2) to (L6), (S3) to (S4), and the like.

本發明中,R4”,以具有作為取代基之X3-Q1-者為佳。該情形中,R4”,以X3-Q1-Y10-[式中,Q1及X3與前述為相同之內容,Y10為可具有取代基之碳數1~4之伸烷基或可具有取代基之碳數1~4之氟化伸烷基]所表示之基為佳。 In the present invention, R 4" is preferably one having X 3 -Q 1 - as a substituent. In this case, R 4" is represented by X 3 -Q 1 -Y 10 -[wherein, Q 1 and X 3 is the same as the above, and Y 10 is preferably a group represented by a C 1-4 alkyl group which may have a substituent or a fluorinated alkyl group having 1 to 4 carbon atoms which may have a substituent.

X3-Q1-Y10-所表示之基中,Y10之伸烷基,例如與前述Q1所列舉之伸烷基中之碳數1~4者為相同之內容等。 In the group represented by X 3 -Q 1 -Y 10 -, the alkylene group of Y 10 is, for example, the same as the carbon number of 1 to 4 in the alkylene group of the above-mentioned Q 1 .

氟化伸烷基,例如該伸烷基之一部份或全部之氫原子被氟原子所取代之基等。 A fluorinated alkyl group, for example, a group in which a part or all of a hydrogen atom of the alkyl group is substituted by a fluorine atom.

Y10,具體而言,例如-CF2-、-CF2CF2-、-CF2CF2CF2-、-CF(CF3)CF2-、-CF(CF2CF3)-、-C(CF3)2-、-CF2CF2CF2CF2-、-CF(CF3)CF2CF2-、-CF2CF(CF3)CF2-、-CF(CF3)CF(CF3)-、-C(CF3)2CF2-、-CF(CF2CF3)CF2-、-CF(CF2CF2CF3)-、-C(CF3)(CF2CF3)-;-CHF-、-CH2CF2-、-CH2CH2CF2-、-CH2CF2CF2-、-CH(CF3)CH2-、-CH(CF2CF3)-、-C(CH3)(CF3)-、-CH2CH2CH2CF2-、-CH2CH2CF2CF2-、-CH(CF3)CH2CH2-、-CH2CH(CF3)CH2-、-CH(CF3)CH(CF3)-、-C(CF3)2CH2-;-CH2-、-CH2CH2-、-CH2CH2CH2-、-CH(CH3)CH2-、-CH(CH2CH3)-、-C(CH3)2-、-CH2CH2CH2CH2-、-CH(CH3)CH2CH2-、-CH2CH(CH3)CH2-、-CH(CH3)CH(CH3)-、-C(CH3)2CH2-、-CH(CH2CH3)CH2-、-CH(CH2CH2CH3)-、-C(CH3)(CH2CH3)-等。 Y 10 , specifically, for example, -CF 2 -, -CF 2 CF 2 -, -CF 2 CF 2 CF 2 -, -CF(CF 3 )CF 2 -, -CF(CF 2 CF 3 )-, - C(CF 3 ) 2 -, -CF 2 CF 2 CF 2 CF 2 -, -CF(CF 3 )CF 2 CF 2 -, -CF 2 CF(CF 3 )CF 2 -, -CF(CF 3 )CF (CF 3 )-, -C(CF 3 ) 2 CF 2 -, -CF(CF 2 CF 3 )CF 2 -, -CF(CF 2 CF 2 CF 3 )-, -C(CF 3 )(CF 2 CF 3 )-;-CHF-, -CH 2 CF 2 -, -CH 2 CH 2 CF 2 -, -CH 2 CF 2 CF 2 -, -CH(CF 3 )CH 2 -, -CH(CF 2 CF 3 )-, -C(CH 3 )(CF 3 )-, -CH 2 CH 2 CH 2 CF 2 -, -CH 2 CH 2 CF 2 CF 2 -, -CH(CF 3 )CH 2 CH 2 -, -CH 2 CH(CF 3 )CH 2 -, -CH(CF 3 )CH(CF 3 )-, -C(CF 3 ) 2 CH 2 -; -CH 2 -, -CH 2 CH 2 -, -CH 2 CH 2 CH 2 -, -CH(CH 3 )CH 2 -, -CH(CH 2 CH 3 )-, -C(CH 3 ) 2 -, -CH 2 CH 2 CH 2 CH 2 -, -CH ( CH 3 )CH 2 CH 2 -, -CH 2 CH(CH 3 )CH 2 -, -CH(CH 3 )CH(CH 3 )-, -C(CH 3 ) 2 CH 2 -, -CH(CH 2 CH 3 )CH 2 -, -CH(CH 2 CH 2 CH 3 )-, -C(CH 3 )(CH 2 CH 3 )-, and the like.

Y10,以氟化伸烷基為佳,特別是以鄰接之硫原子所鍵結之碳原子被氟化所得之氟化伸烷基為佳。該些氟化伸烷基,例如,-CF2-、-CF2CF2-、-CF2CF2CF2-、-CF(CF3)CF2-、-CF2CF2CF2CF2-、-CF(CF3)CF2CF2-、-CF2CF(CF3)CF2-、-CF(CF3)CF(CF3)-、-C(CF3)2CF2-、-CF(CF2CF3)CF2-;-CH2CF2-、-CH2CH2CF2-、-CH2CF2CF2-;-CH2CH2CH2CF2-、-CH2CH2CF2CF2-、-CH2CF2CF2CF2-等。 Y 10 is preferably a fluorinated alkyl group, and particularly preferably a fluorinated alkyl group obtained by fluorinating a carbon atom bonded to a sulfur atom adjacent thereto. The fluorinated alkyl groups, for example, -CF 2 -, -CF 2 CF 2 -, -CF 2 CF 2 CF 2 -, -CF(CF 3 )CF 2 -, -CF 2 CF 2 CF 2 CF 2 -, -CF(CF 3 )CF 2 CF 2 -, -CF 2 CF(CF 3 )CF 2 -, -CF(CF 3 )CF(CF 3 )-, -C(CF 3 ) 2 CF 2 -, -CF(CF 2 CF 3 )CF 2 -; -CH 2 CF 2 -, -CH 2 CH 2 CF 2 -, -CH 2 CF 2 CF 2 -; -CH 2 CH 2 CH 2 CF 2 -, -CH 2 CH 2 CF 2 CF 2 -, -CH 2 CF 2 CF 2 CF 2 -, and the like.

該些之中,又以-CF2-、-CF2CF2-、-CF2CF2CF2-,或CH2CF2CF2-為佳,以-CF2-、-CF2CF2-或-CF2CF2CF2-為較佳,以-CF2-為特佳。 Among the more so, on -CF 2 -, - CF 2 CF 2 -, - CF 2 CF 2 CF 2 -, or CH 2 CF 2 CF 2 - preferably to -CF 2 -, - CF 2 CF 2 - or -CF 2 CF 2 CF 2 - is preferred, and -CF 2 - is particularly preferred.

前述伸烷基或氟化伸烷基,其可具有取代基。伸烷基或氟化伸烷基為「具有取代基」係指,該伸烷基或氟化伸烷基中之氫原子或氟原子的一部份或全部被氫原子及氟原子以外之原子或基所取代之意。 The aforementioned alkylene or fluorinated alkyl group may have a substituent. The alkyl group or the fluorinated alkyl group has a "substituent group" means that a part or all of a hydrogen atom or a fluorine atom in the alkyl group or the fluorinated alkyl group is a hydrogen atom and an atom other than a fluorine atom. Or the meaning of the base.

伸烷基或氟化伸烷基所可具有之取代基,例如,碳數1~4之烷基、碳數1~4之烷氧基、羥基等。 The substituent which the alkyl group or the fluorinated alkyl group may have, for example, an alkyl group having 1 to 4 carbon atoms, an alkoxy group having 1 to 4 carbon atoms, a hydroxyl group or the like.

前述式(b-2)中,R5”~R6”,表示各自獨立之可具有取代基之芳基、烷基或烯基。 In the above formula (b-2), R 5" to R 6" represent an aryl group, an alkyl group or an alkenyl group which may independently have a substituent.

又,就更提高微影蝕刻特性與光阻圖型形狀之觀點,R5”~R6”之中,以至少1個為芳基為佳,以R5”~R6”之任一者皆為芳基者為更佳。 Further, even the viewpoint of improving the lithography characteristics of the resist pattern shape, in R 5 "~ R 6", at least one aryl group is preferable, and any one of R 5 "~ R 6" of a person Those who are all aryl are better.

R5”~R6”之芳基,與R1”~R3”之芳基為相同之內容等。 The aryl group of R 5" to R 6" is the same as the aryl group of R 1" to R 3" .

R5”~R6”之烷基,與R1”~R3”之烷基為相同之內容等。 The alkyl group of R 5" to R 6" is the same as the alkyl group of R 1" to R 3" .

R5”~R6”之烯基,與R1”~R3”之烯基為相同之內容等。 The alkenyl group of R 5" to R 6" is the same as the alkenyl group of R 1" to R 3" .

該些之中,又以R5”~R6”以全部為苯基為最佳。 Among these, R 5" to R 6" are all preferred as the phenyl group.

前述式(b-2)所表示之化合物中的陽離子部之具體例如,二苯基錪、雙(4-tert-丁基苯基)錪等。 Specific examples of the cation moiety in the compound represented by the above formula (b-2) include diphenylphosphonium, bis(4-tert-butylphenyl)fluorene and the like.

前述式(b-2)中之R4”,與上述式(b-1)中之R4”為 相同之內容等。 (B-2) in the above formula R 4 ", and (b-1) in the above formula R 4" of the same content.

式(b-1)、(b-2)所表示之鎓鹽系酸產生劑之具體例,例如二苯基錪之三氟甲烷磺酸酯或九氟丁烷磺酸酯、雙(4-tert-丁基苯基)錪之三氟甲烷磺酸酯或九氟丁烷磺酸酯、三苯基鋶之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯、三(4-甲基苯基)鋶之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯、二甲基(4-羥基萘基)鋶之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯、單苯基二甲基鋶之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯;二苯基單甲基鋶之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯、(4-甲基苯基)二苯基鋶之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯、(4-甲氧基苯基)二苯基鋶之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯、三(4-tert-丁基)苯基鋶之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯、二苯基(1-(4-甲氧基)萘基)鋶之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯、二(1-萘基)苯基鋶之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯;1-苯基四氫噻吩鎓之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯;1-(4-甲基苯基)四氫噻吩鎓之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯;1-(3,5-二甲基-4-羥基苯基)四氫噻吩鎓之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯;1-(4-甲氧基萘-1-基) 四氫噻吩鎓之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯;1-(4-乙氧基萘-1-基)四氫噻吩鎓之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯;1-(4-n-丁氧基萘-1-基)四氫噻吩鎓之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯;1-苯基四氫噻喃鎓之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯;1-(4-羥基苯基)四氫噻喃鎓之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯;1-(3,5-二甲基-4-羥基苯基)四氫噻喃鎓之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯;1-(4-甲基苯基)四氫噻喃鎓之三氟甲烷磺酸酯、其七氟丙烷磺酸酯或其九氟丁烷磺酸酯等。 Specific examples of the sulfonium-based acid generator represented by the formulae (b-1) and (b-2), for example, diphenyl sulfonium trifluoromethanesulfonate or nonafluorobutane sulfonate, bis (4- Tert-butylphenyl) guanidine trifluoromethane sulfonate or nonafluorobutane sulfonate, triphenylsulfonium trifluoromethane sulfonate, heptafluoropropane sulfonate or its nonafluorobutane sulfonate , tris(4-methylphenyl)phosphonium trifluoromethanesulfonate, its heptafluoropropane sulfonate or its nonafluorobutane sulfonate, dimethyl(4-hydroxynaphthyl)phosphonium trifluoromethanesulfonate An acid ester, a heptafluoropropane sulfonate or a nonafluorobutane sulfonate thereof, a triphenylmethanesulfonate of monophenyldimethylhydrazine, a heptafluoropropane sulfonate or a nonafluorobutane sulfonate thereof; Trifluoromethanesulfonate of monomethylhydrazine, its heptafluoropropane sulfonate or its nonafluorobutane sulfonate, trifluoromethanesulfonate of (4-methylphenyl)diphenylphosphonium, and heptafluoropropane a sulfonate or a nonafluorobutanesulfonate thereof, a (4-methoxyphenyl)diphenylphosphonium trifluoromethanesulfonate, a heptafluoropropanesulfonate or a nonafluorobutanesulfonate thereof, (4-tert-butyl)phenylhydrazine trifluoromethanesulfonate, Fluoropropane sulfonate or its nonafluorobutane sulfonate, diphenyl(1-(4-methoxy)naphthyl)phosphonium trifluoromethanesulfonate, heptafluoropropane sulfonate or its nonafluorobutane Alkanesulfonate, tris(1-naphthyl)phenylphosphonium trifluoromethanesulfonate, heptafluoropropanesulfonate or its nonafluorobutanesulfonate; 1-phenyltetrahydrothiophene trifluoromethane Sulfonate, its heptafluoropropane sulfonate or its nonafluorobutane sulfonate; trifluoromethanesulfonate of 1-(4-methylphenyl)tetrahydrothiophene, its heptafluoropropane sulfonate or its nonafluoro Butane sulfonate; trifluoromethanesulfonate of 1-(3,5-dimethyl-4-hydroxyphenyl)tetrahydrothiophene, its heptafluoropropane sulfonate or its nonafluorobutane sulfonate; 1-(4-methoxynaphthalen-1-yl) Trifluoromethanesulfonate of tetrahydrothiophene, its heptafluoropropane sulfonate or its nonafluorobutane sulfonate; trifluoromethanesulfonate of 1-(4-ethoxynaphthalen-1-yl)tetrahydrothiophene An acid ester, a heptafluoropropane sulfonate or a nonafluorobutane sulfonate thereof; a trifluoromethanesulfonate of 1-(4-n-butoxynaphthalen-1-yl)tetrahydrothiophene hydride, and a heptafluoropropane sulfonic acid Ester or its nonafluorobutane sulfonate; triphenylmethanesulfonate of 1-phenyltetrahydrothiopyrene, its heptafluoropropane sulfonate or its nonafluorobutane sulfonate; 1-(4-hydroxybenzene) Trifluorothiamethane trifluoromethanesulfonate, heptafluoropropane sulfonate or its nonafluorobutane sulfonate; 1-(3,5-dimethyl-4-hydroxyphenyl)tetrahydrothiophene A trifluoromethanesulfonate, a heptafluoropropane sulfonate or a nonafluorobutane sulfonate thereof; a trifluoromethanesulfonate of 1-(4-methylphenyl)tetrahydrothiopyranium, a heptafluoropropane thereof a sulfonate or a nonafluorobutane sulfonate thereof.

又,亦可使用該些鎓鹽之陰離子部被下述式(b1)~(b9)之任一者所表示之陰離子部所取代之鎓鹽。 Further, an anthracene salt in which the anion portion of the onium salt is replaced by an anion portion represented by any one of the following formulas (b1) to (b9) may be used.

[式中,q1~q2為各自獨立之1~5之整數,q3為1~12之整數,t3為1~3之整數,r1~r2為各自獨立之0~3之整數,g為1~20之整數,R7為取代基,n1~n6為各自獨立之0或1,v0~v6為各自獨立之0~3之整數,w1~w6為各自獨立之0~3之整數,Q”與前述為相同之內容]。 [wherein, q1~q2 are independent integers of 1~5, q3 is an integer from 1 to 12, t3 is an integer from 1 to 3, r1~r2 are independent integers of 0~3, g is 1~ An integer of 20, R 7 is a substituent, n1~n6 are independent 0 or 1, v0~v6 are independent integers of 0~3, and w1~w6 are independent integers of 0~3, Q" and The foregoing is the same content].

R7之取代基,例如與前述X3中,脂肪族烴基所可具有之取代基、芳香族烴基所可具有之取代基所列舉者為相同之內容等。 The substituent of R 7 is, for example, the same as the substituent which the aliphatic hydrocarbon group may have in the above X 3 and the substituent which the aromatic hydrocarbon group may have.

R7所附之符號(r1~r2、w1~w6)為2以上之整數的情形,該化合物中之複數之R7可分別為相同亦可、相異者亦可。 When the symbol (r1 to r2, w1 to w6) attached to R 7 is an integer of 2 or more, the plural R 7 of the compound may be the same or different.

又,鎓鹽系酸產生劑,亦可使用前述通式(b-1)或(b-2)中,陰離子部被下述通式(b-3)或(b-4)所表示 之陰離子部所取代之鎓鹽系酸產生劑(陽離子部與(b-1)或(b-2)為相同之內容)。 Further, in the above-described general formula (b-1) or (b-2), the anion moiety may be represented by the following formula (b-3) or (b-4). The sulfonium-based acid generator (the cation portion is the same as (b-1) or (b-2)) in which the anion portion is substituted.

[式中,X”表示,至少1個之氫原子被氟原子所取代之碳數2~6之伸烷基;Y”、Z”表示各自獨立之至少1個氫原子被氟原子所取代之碳數1~10之烷基]。 [wherein, X" represents a C 2~6 alkyl group in which at least one hydrogen atom is replaced by a fluorine atom; Y", Z" means that at least one hydrogen atom independently substituted by a fluorine atom Alkyl group having 1 to 10 carbon atoms].

X”為,至少1個氫原子被氟原子所取代之直鏈狀或支鏈狀之伸烷基,該伸烷基的碳數為2~6,較佳為碳數3~5,最佳為碳數3。 X" is a linear or branched alkyl group in which at least one hydrogen atom is replaced by a fluorine atom, and the alkyl group has a carbon number of 2 to 6, preferably a carbon number of 3 to 5, preferably It has a carbon number of 3.

Y”、Z”為,各自獨立之至少1個氫原子被氟原子所取代之直鏈狀或支鏈狀之烷基,該烷基的碳數為1~10,較佳為碳數1~7,更佳為碳數1~3。 Y", Z" are straight-chain or branched alkyl groups in which at least one hydrogen atom is independently substituted by a fluorine atom, and the alkyl group has a carbon number of 1 to 10, preferably a carbon number of 1~. 7, better for carbon number 1~3.

X”之伸烷基的碳數或Y”、Z”之烷基的碳數,於上述碳數之範圍內時,就對光阻溶劑之溶解性更為良好等理由,以越小越好。 When the carbon number of the alkyl group of X" or the carbon number of the alkyl group of Y" or Z" is in the range of the above carbon number, the solubility in the resist solvent is further improved, and the smaller the better .

又,X”之伸烷基或Y”、Z”之烷基中,被氟原子所取代之氫原子的數目越多時,酸之強度越強,且可提高對於200nm以下之高能量光或電子線之透明性等觀點,而為較佳。 Further, in the alkyl group of X" or the alkyl group of Y" or Z", the more the number of hydrogen atoms substituted by the fluorine atom, the stronger the strength of the acid, and the higher the energy of light of 200 nm or less or The viewpoint of transparency of an electronic wire is preferable.

該伸烷基或烷基中之氟原子之比例,即氟化率,較佳為70~100%,更佳為90~100%,最佳為全部氫原子被氟原子所取代之全氟伸烷基或全氟烷基。 The ratio of the fluorine atom in the alkyl group or the alkyl group, that is, the fluorination rate, is preferably from 70 to 100%, more preferably from 90 to 100%, and most preferably the total fluorine extension in which all hydrogen atoms are replaced by fluorine atoms. Alkyl or perfluoroalkyl.

又,鎓鹽系酸產生劑,亦可使用陽離子部具有下述通式(b-5)或(b-6)所表示之陽離子的鋶鹽。 Further, the onium salt-based acid generator may be a phosphonium salt having a cation represented by the following formula (b-5) or (b-6) in the cation portion.

[式中,R81~R86為各自獨立之烷基、乙醯基、烷氧基、羧基、羥基或羥烷基;n1~n5為各自獨立之0~3之整數,n6為0~2之整數]。 Wherein R 81 to R 86 are each independently an alkyl group, an ethyl group, an alkoxy group, a carboxyl group, a hydroxyl group or a hydroxyalkyl group; n 1 to n 5 are each an integer of 0 to 3 independently, and n 6 is An integer from 0 to 2.].

R81~R86中,烷基以碳數1~5之烷基為佳,其中又以直鏈或支鏈狀之烷基為較佳,以甲基、乙基、丙基、異丙基、n-丁基,或tert-丁基為特佳。 In R 81 to R 86 , the alkyl group is preferably an alkyl group having 1 to 5 carbon atoms, wherein a linear or branched alkyl group is preferred, and a methyl group, an ethyl group, a propyl group and an isopropyl group are preferred. , n-butyl, or tert-butyl is particularly preferred.

烷氧基以碳數1~5之烷氧基為佳,其中又以直鏈狀或支鏈狀之烷氧基為較佳,以甲氧基、乙氧基為特佳。 The alkoxy group is preferably an alkoxy group having 1 to 5 carbon atoms, and a linear or branched alkoxy group is preferred, and a methoxy group or an ethoxy group is particularly preferred.

羥烷基,以上述烷基中之一個或複數個氫原子被羥基取代所得之基為佳,例如羥甲基、羥乙基、羥丙基等。 The hydroxyalkyl group is preferably a group obtained by substituting one of the above alkyl groups or a plurality of hydrogen atoms with a hydroxyl group, for example, a methylol group, a hydroxyethyl group, a hydroxypropyl group or the like.

R81~R86所附之符號n1~n6為2以上之整數的情形,複數之R81~R86可分別為相同亦可、相異者亦可。 When the symbols n 1 to n 6 attached to R 81 to R 86 are integers of 2 or more, the plural numbers R 81 to R 86 may be the same or different.

n1,較佳為0~2,更佳為0或1,更佳為0。 n 1 is preferably 0 to 2, more preferably 0 or 1, more preferably 0.

n2及n3,較佳為各自獨立之0或1,更佳為0。 n 2 and n 3 are preferably each independently 0 or 1, more preferably 0.

n4,較佳為0~2,更佳為0或1。 n 4 is preferably 0 to 2, more preferably 0 or 1.

n5,較佳為0或1,更佳為0。 n 5 is preferably 0 or 1, more preferably 0.

n6,較佳為0或1,更佳為1。 n 6 is preferably 0 or 1, more preferably 1.

前述式(b-5)或式(b-6)所表示之陽離子中之較佳者,例如,以下所示之內容等。 The preferred one of the cations represented by the above formula (b-5) or formula (b-6), for example, the contents shown below.

此外,亦可使用陽離子部具有下述通式(I-2)~(I-5)所表示之陽離子的鋶鹽。 Further, an onium salt having a cation represented by the following general formulae (I-2) to (I-5) in the cationic portion can also be used.

式(I-2)~(I-5)中,u為1~3之整數,1或2為最佳。 In the formulae (I-2) to (I-5), u is an integer of 1 to 3, and 1 or 2 is optimal.

式(I-2)~(I-4)中,R6a~R8a為可具有取代基之伸烷基或可具有取代基之伸苯基,R6b~R8b為氫原子、可具有取代基之烷基、可具有取代基之苯基或萘基。 In the formulae (I-2) to (I-4), R 6a to R 8a are a stretching alkyl group which may have a substituent or a stretching phenyl group which may have a substituent, and R 6b to R 8b are a hydrogen atom and may have a substitution. An alkyl group, a phenyl group or a naphthyl group which may have a substituent.

式(I-5)中,R9為可具有取代基之烷基、可具有取代基之苯基或萘基。 In the formula (I-5), R 9 is an alkyl group which may have a substituent, a phenyl group or a naphthyl group which may have a substituent.

R6a~R8a中之伸烷基,以直鏈狀或支鏈狀之伸烷基為佳。該伸烷基的碳數,以1~12為佳,以1~5為較佳,以1~3為更佳,以1或2為特佳。 The alkyl group in R 6a to R 8a is preferably a linear or branched alkyl group. The carbon number of the alkylene group is preferably from 1 to 12, preferably from 1 to 5, more preferably from 1 to 3, and particularly preferably from 1 or 2.

該伸烷基所可具有之取代基例如,烷氧基、鹵素原子、羥基、酮基(=O)、氰基、芳基、烷氧烷基氧基、烷氧羰基烷基氧基、-C(=O)-O-R6’、-O-C(=O)-R7’、-O-R8’等。烷氧基、鹵素原子、芳基、烷氧烷基氧基、烷氧羰基烷基氧基、-C(=O)-O-R6’、-O-C(=O)-R7’、-O-R8’,與前述式(b-1)中之R1”~R3”之說明中,取代芳基所可具有之取代基所列舉者為相同之內容。 The substituent which the alkylene group may have is, for example, an alkoxy group, a halogen atom, a hydroxyl group, a keto group (=O), a cyano group, an aryl group, an alkoxyalkyloxy group, an alkoxycarbonylalkyloxy group, C(=O)-OR 6' , -OC(=O)-R 7' , -OR 8', and the like. Alkoxy, halogen atom, aryl, alkoxyalkyloxy, alkoxycarbonylalkyloxy, -C(=O)-OR 6' , -OC(=O)-R 7' , -OR 8 ' , and in the description of R 1" to R 3" in the above formula (b-1), the substituents which the substituted aryl group may have are the same.

式中,R6b~R8b、R9中之可具有取代基之烷基,例 如,與前述通式(b-1)中之R1”~R3”之說明所列舉之取代烷基為相同之內容等。 In the formula, an alkyl group which may have a substituent in R 6b to R 8b and R 9 is, for example, a substituted alkyl group as exemplified in the description of R 1" to R 3" in the above formula (b-1). The same content and so on.

R6b~R8b、R9中之苯基或萘基所可具有之取代基例如,與前述通式(b-1)中之R1”~R3”之說明所列舉之取代芳基所可具有之取代基所列舉者為相同之內容等。 The substituent which the phenyl group or the naphthyl group in R 6b to R 8b and R 9 may have, for example, the substituted aryl group as exemplified in the description of R 1" to R 3" in the above formula (b-1) The substituents which may be included are the same contents and the like.

前述式(I-2)~(I-5)所表示之陽離子中之較佳者,例如,以下所示之內容等。式中,RC為上述取代芳基之說明中所例示之取代基(烷氧基、烷氧烷基氧基、烷氧羰基烷基氧基、鹵素原子、羥基、酮基(=O)、芳基、-C(=O)-O-R6’、-O-C(=O)-R7’、-O-R8’)。 The preferred ones of the cations represented by the above formulae (I-2) to (I-5) are, for example, the contents shown below. In the formula, R C is a substituent exemplified in the description of the above substituted aryl group (alkoxy group, alkoxyalkyloxy group, alkoxycarbonylalkyloxy group, halogen atom, hydroxyl group, keto group (=O), Aryl, -C(=O)-OR 6' , -OC(=O)-R 7' , -OR 8' ).

以下為具體之例示。 The following is a specific illustration.

陽離子部具有式(I-2)~(I-5)所表示之陽離子的鋶鹽中之陰離子部,並未有特別之限定,其可使用與目前提案之鎓鹽系酸產生劑之陰離子為相同之內容。該陰離子部,例如,上述通式(b-1)或(b-2)所表示之鎓鹽系酸產生劑之陰離子部(R4”SO3 -)等氟化烷基磺酸離子;上述通式(b-3)或(b-4)所表示之陰離子、前述式(b1)~(b9)之任一者所表示之陰離子等。 The anion portion of the cation salt having a cation represented by the formula (I-2) to (I-5) in the cation portion is not particularly limited, and an anion of the currently proposed sulfonium acid generator can be used. The same content. The anion portion is, for example, a fluorinated alkylsulfonic acid ion such as an anion portion (R 4 " SO 3 - ) of the phosphonium salt generator represented by the above formula (b-1) or (b-2); An anion represented by the formula (b-3) or (b-4), an anion represented by any one of the above formulas (b1) to (b9), and the like.

本說明書中,肟磺酸酯系酸產生劑為,至少具有1個下述通式(B-1)所表示之基的化合物,且具有經由輻射線之照射(曝光)而產生酸之特性者。該些肟磺酸酯系酸產生劑,已廣泛地使用於化學增幅型光阻組成物中,而可由其中任意地選擇使用。 In the present specification, the oxime sulfonate-based acid generator is a compound having at least one group represented by the following formula (B-1), and has characteristics of generating acid by irradiation (exposure) by radiation. . These sulfonate-based acid generators have been widely used in chemically amplified photoresist compositions, and can be arbitrarily selected and used.

[式(B-1)中,R31、R32表示各自獨立之有機基]。 [In the formula (B-1), R 31 and R 32 each represent an independently-organic group].

R31、R32之有機基為含有碳原子之基,其亦可具有碳原子以外之原子(例如,氫原子、氧原子、氮原子、硫原子、鹵素原子(氟原子、氯原子等)等)。 The organic group of R 31 and R 32 is a group containing a carbon atom, and may have an atom other than a carbon atom (for example, a hydrogen atom, an oxygen atom, a nitrogen atom, a sulfur atom, a halogen atom (a fluorine atom, a chlorine atom, etc.), etc.) ).

R31之有機基,以直鏈狀、支鏈狀或環狀之烷基或芳基為佳。該些烷基、芳基可具有取代基。該取代基並未有特別限制,例如,氟原子、碳數1~6之直鏈狀、支鏈狀或環狀之烷基等。其中,「具有取代基」為表示烷基或芳基中之氫原子的一部份或全部被取代基所取代之意。 The organic group of R 31 is preferably a linear, branched or cyclic alkyl or aryl group. The alkyl group and the aryl group may have a substituent. The substituent is not particularly limited, and examples thereof include a fluorine atom, a linear chain having 1 to 6 carbon atoms, a branched or cyclic alkyl group, and the like. Here, the "having a substituent" means that a part or the whole of a hydrogen atom in an alkyl group or an aryl group is substituted with a substituent.

烷基,以碳數1~20為佳,以碳數1~10為較佳,以碳數1~8為更佳,以碳數1~6為特佳,以碳數1~4為最佳。烷基,特別是以部份或完全被鹵化之烷基(以下,亦稱為鹵化烷基)為佳。又,部份被鹵化之烷基表示,氫原子中之一部份被鹵素原子所取代之烷基之意,完全被鹵化之烷基表示,全部氫原子被鹵素原子所取代之烷基之意。鹵素原子,例如,氟原子、氯原子、溴原子、碘原子等,特別是以氟原子為佳。即,鹵化烷基以氟化烷基為佳。 The alkyl group has a carbon number of 1 to 20, preferably a carbon number of 1 to 10, a carbon number of 1 to 8, preferably a carbon number of 1 to 6, and a carbon number of 1 to 4. good. The alkyl group is particularly preferably an alkyl group which is partially or completely halogenated (hereinafter, also referred to as a halogenated alkyl group). Further, a partially halogenated alkyl group means that an alkyl group in which a part of a hydrogen atom is replaced by a halogen atom is completely represented by a halogenated alkyl group, and an alkyl group in which all hydrogen atoms are replaced by a halogen atom means . The halogen atom, for example, a fluorine atom, a chlorine atom, a bromine atom, an iodine atom or the like, is preferably a fluorine atom. That is, the halogenated alkyl group is preferably a fluorinated alkyl group.

芳基,以碳數4~20為佳,以碳數4~10為較佳,以碳數6~10為最佳。芳基,特別是以部份或完全被鹵化之芳基為佳。又,部份被鹵化之芳基表示,氫原子之一部份被鹵素原子所取代之芳基之意,完全被鹵化之芳基表示,全部氫原子被鹵素原子所取代之芳基之意。 The aryl group preferably has a carbon number of 4 to 20, a carbon number of 4 to 10, and a carbon number of 6 to 10. The aryl group is particularly preferably an aryl group which is partially or completely halogenated. Further, a partially halogenated aryl group means that an aryl group in which a part of a hydrogen atom is replaced by a halogen atom is completely represented by an aryl group which is halogenated, and an aryl group in which all hydrogen atoms are replaced by a halogen atom.

R31,特別是以不具有取代基之碳數1~4之烷基,或碳數1~4之氟化烷基為佳。 R 31 is particularly preferably an alkyl group having 1 to 4 carbon atoms or a fluorinated alkyl group having 1 to 4 carbon atoms which has no substituent.

R32之有機基,以直鏈狀、支鏈狀或環狀之烷基、芳基或氰基為佳。R32之烷基、芳基,例如,與前述R31所列舉之烷基、芳基為相同之內容等。 The organic group of R 32 is preferably a linear, branched or cyclic alkyl group, an aryl group or a cyano group. The alkyl group and the aryl group of R 32 are , for example, the same as those of the alkyl group and the aryl group exemplified in the above R 31 .

R32,特別是以氰基、不具有取代基之碳數1~8之烷基,或碳數1~8之氟化烷基為佳。 R 32 is particularly preferably a cyano group, an alkyl group having 1 to 8 carbon atoms which has no substituent, or a fluorinated alkyl group having 1 to 8 carbon atoms.

肟磺酸酯系酸產生劑,更佳者例如,下述通式(B-2)或(B-3)所表示之化合物等。 The oxime sulfonate-based acid generator is more preferably, for example, a compound represented by the following formula (B-2) or (B-3).

[式(B-2)中,R33為氰基、不具有取代基之烷基或鹵化烷基。R34為芳基。R35為不具有取代基之烷基或鹵化烷基]。 [In the formula (B-2), R 33 is a cyano group, an alkyl group having no substituent or a halogenated alkyl group. R 34 is an aryl group. R 35 is an alkyl group or a halogenated alkyl group having no substituent.

[式(B-3)中,R36為氰基、不具有取代基之烷基或鹵化烷基。R37為2或3價之芳香族烴基。R38為不具有取代基之烷基或鹵化烷基。p”為2或3]。 [In the formula (B-3), R 36 is a cyano group, an alkyl group having no substituent or a halogenated alkyl group. R 37 is a 2 or 3 valent aromatic hydrocarbon group. R 38 is an alkyl group or a halogenated alkyl group having no substituent. p" is 2 or 3].

前述通式(B-2)中,R33之不具有取代基之烷基或鹵化烷基,以碳數1~10為佳,以碳數1~8為較佳,以碳數1~6為最佳。 In the above formula (B-2), the alkyl group or the halogenated alkyl group having no substituent of R 33 is preferably a carbon number of 1 to 10, preferably a carbon number of 1 to 8, and a carbon number of 1 to 6. For the best.

R33,以鹵化烷基為佳,以氟化烷基為更佳。 R 33 is preferably a halogenated alkyl group or more preferably a fluorinated alkyl group.

R33中之氟化烷基,以烷基中之氫原子被50%以上氟化者為佳,以70%以上被氟化者為較佳,以90%以上被氟化者為特佳。 The fluorinated alkyl group in R 33 is preferably one in which the hydrogen atom in the alkyl group is fluorinated by 50% or more, the fluorinated one in 70% or more, and the fluorinated one in 90% or more.

R34之芳基,例如,由苯基、聯苯(biphenyl)基、茀(fluorenyl)基、萘基、蒽(anthryl)基、菲基等芳香族烴之環去除1個氫原子所得之基,及構成該些基之環的碳原子之一部份被氧原子、硫原子、氮原子等雜原子所取代之雜芳基等。該些之中,又以茀基為佳。 The aryl group of R 34 is, for example, a group obtained by removing one hydrogen atom from a ring of an aromatic hydrocarbon such as a phenyl group, a biphenyl group, a fluorenyl group, a naphthyl group, an anthryl group or a phenanthryl group. And a heteroaryl group in which a part of a carbon atom constituting the ring of the group is substituted with a hetero atom such as an oxygen atom, a sulfur atom or a nitrogen atom. Among them, the base is better.

R34之芳基,可具有碳數1~10之烷基、鹵化烷基、烷氧基等取代基。該取代基中之烷基或鹵化烷基,以碳數1~8為佳,以碳數1~4為更佳。又,該鹵化烷基以氟化烷基為佳。 The aryl group of R 34 may have a substituent such as an alkyl group having 1 to 10 carbon atoms, a halogenated alkyl group or an alkoxy group. The alkyl group or the halogenated alkyl group in the substituent is preferably a carbon number of 1 to 8, and more preferably a carbon number of 1 to 4. Further, the halogenated alkyl group is preferably a fluorinated alkyl group.

R35之不具有取代基之烷基或鹵化烷基,以碳數1~10為佳,以碳數1~8為較佳,以碳數1~6為最佳。 The alkyl group or the halogenated alkyl group having no substituent of R 35 is preferably a carbon number of 1 to 10, preferably a carbon number of 1 to 8, and preferably a carbon number of 1 to 6.

R35,以鹵化烷基為佳,以氟化烷基為更佳。 R 35 is preferably a halogenated alkyl group or more preferably a fluorinated alkyl group.

R35中之氟化烷基,以烷基中之氫原子被50%以上氟化者為佳,以70%以上被氟化者為較佳,以90%以上被氟化者,以可提高所產生之酸的強度,而為特佳。最佳者為,氫原子被100%氟取代之全氟化烷基。 The fluorinated alkyl group in R 35 is preferably one in which the hydrogen atom in the alkyl group is fluorinated by 50% or more, the fluorinated one in 70% or more, and the fluorinated one in 90% or more. The strength of the acid produced is particularly good. The most preferred is a perfluorinated alkyl group in which a hydrogen atom is replaced by 100% fluorine.

前述通式(B-3)中,R36之不具有取代基之烷基或鹵化烷基,例如與上述R33之不具有取代基之烷基或鹵化烷基為相同之內容等。 In the above formula (B-3), the alkyl group or the halogenated alkyl group having no substituent of R 36 is, for example, the same as the alkyl group or the halogenated alkyl group having no substituent of R 33 described above.

R37之2或3價之芳香族烴基,例如由上述R34之芳基再去除1或2個氫原子所得之基等。 The 2 or 3 valent aromatic hydrocarbon group of R 37 is, for example, a group obtained by further removing 1 or 2 hydrogen atoms from the aryl group of the above R 34 .

R38之不具有取代基之烷基或鹵化烷基,與上述R35之不具有取代基之烷基或鹵化烷基為相同之內容等。 The alkyl group or the halogenated alkyl group having no substituent of R 38 is the same as the alkyl group or the halogenated alkyl group having no substituent of R 35 described above.

p”,較佳為2。 p", preferably 2.

肟磺酸酯系酸產生劑之具體例,例如,α-(p-甲苯磺醯氧亞胺基)-苄氰化物(cyanide)、α-(p-氯基苯磺醯氧亞胺基)-苄氰化物、α-(4-硝基苯磺醯氧亞胺基)-苄氰化物、α-(4-硝基-2-三氟甲基苯磺醯氧亞胺基)-苄氰化物、α-(苯磺醯氧亞胺基)-4-氯基苄氰化物、α-(苯 磺醯氧亞胺基)-2,4-二氯基苄氰化物、α-(苯磺醯氧亞胺基)-2,6-二氯基苄氰化物、α-(苯磺醯氧亞胺基)-4-甲氧基苄氰化物、α-(2-氯基苯磺醯氧亞胺基)-4-甲氧基苄氰化物、α-(苯磺醯氧亞胺基)-噻嗯-2-基乙腈、α-(4-十二烷基苯磺醯氧亞胺基)-苄氰化物、α-[(p-甲苯磺醯氧亞胺基)-4-甲氧基苯基]乙腈、α-[(十二烷基苯磺醯氧亞胺基)-4-甲氧基苯基]乙腈、α-(甲苯磺醯氧基亞胺基)-4-噻嗯基氰化物、α-(甲基磺醯氧亞胺基)-1-環戊烯基乙腈、α-(甲基磺醯氧亞胺基)-1-環己烯基乙腈、α-(甲基磺醯氧亞胺基)-1-環庚烯基乙腈、α-(甲基磺醯氧亞胺基)-1-環辛烯基乙腈、α-(三氟甲基磺醯氧亞胺基)-1-環戊烯基乙腈、α-(三氟甲基磺醯氧亞胺基)-環己基乙腈、α-(乙基磺醯氧亞胺基)-乙基乙腈、α-(丙基磺醯氧亞胺基)-丙基乙腈、α-(環己基磺醯氧亞胺基)-環戊基乙腈、α-(環己基磺醯氧亞胺基)-環己基乙腈、α-(環己基磺醯氧亞胺基)-1-環戊烯基乙腈、α-(乙基磺醯氧亞胺基)-1-環戊烯基乙腈、α-(異丙基磺醯氧亞胺基)-1-環戊烯基乙腈、α-(n-丁基磺醯氧亞胺基)-1-環戊烯基乙腈、α-(乙基磺醯氧亞胺基)-1-環己烯基乙腈、α-(異丙基磺醯氧亞胺基)-1-環己烯基乙腈、α-(n-丁基磺醯氧亞胺基)-1-環己烯基乙腈、α-(甲基磺醯氧亞胺基)-苯基乙腈、α-(甲基磺醯氧亞胺基)-p-甲氧基苯基乙腈、α-(三氟甲基磺醯氧亞胺基)-苯基乙腈、α-(三氟甲基磺醯氧亞胺基)-p-甲氧 基苯基乙腈、α-(乙基磺醯氧亞胺基)-p-甲氧基苯基乙腈、α-(丙基磺醯氧亞胺基)-p-甲基苯基乙腈、α-(甲基磺醯氧亞胺基)-p-溴苯基乙腈等。 Specific examples of the sulfonate-based acid generator include, for example, α-(p-toluenesulfonyloxyimido)-cyanide (cyanide) and α-(p-chlorophenylsulfonyloxyimino). -benzyl cyanide, α-(4-nitrophenylsulfonyloxyimido)-benzyl cyanide, α-(4-nitro-2-trifluoromethylbenzenesulfonyloxyimido)-benzamide Compound, α-(phenylsulfonyloxyimido)-4-chlorobenzyl cyanide, α-(benzene Sulfonoxyimino)-2,4-dichlorobenzyl cyanide, α-(phenylsulfonyloxyimino)-2,6-dichlorobenzyl cyanide, α-(phenylsulfonate) Amino)-4-methoxybenzyl cyanide, α-(2-chlorophenylsulfonyloxyimido)-4-methoxybenzyl cyanide, α-(phenylsulfonyloxyimino)- Thien-2-ylacetonitrile, α-(4-dodecylbenzenesulfonyloxyimino)-benzyl cyanide, α-[(p-toluenesulfonyloxyimino)-4-methoxy Phenyl]acetonitrile, α-[(dodecylbenzenesulfonyloxyimino)-4-methoxyphenyl]acetonitrile, α-(toluenesulfonyloxyimino)-4-thiol Cyanide, α-(methylsulfonyloxyimido)-1-cyclopentenylacetonitrile, α-(methylsulfonyloxyimino)-1-cyclohexenylacetonitrile, α-(methyl Sulfonoxyimino)-1-cycloheptenylacetonitrile, α-(methylsulfonyloxyimino)-1-cyclooctenylacetonitrile, α-(trifluoromethylsulfonyloxyimino) )-1-cyclopentenylacetonitrile, α-(trifluoromethylsulfonyloxyimido)-cyclohexylacetonitrile, α-(ethylsulfonyloxyimino)-ethylacetonitrile, α-(propyl Alkylsulfonyloxyimido)-propylacetonitrile, α-(cyclohexylsulfonyloxyimino)-cyclopentylacetonitrile, α-(cyclohexylsulfonyloxyimine )-cyclohexylacetonitrile, α-(cyclohexylsulfonyloxyimino)-1-cyclopentenylacetonitrile, α-(ethylsulfonyloxyimino)-1-cyclopentenylacetonitrile, α- (isopropylsulfonyloxyimino)-1-cyclopentenylacetonitrile, α-(n-butylsulfonyloxyimino)-1-cyclopentenylacetonitrile, α-(ethylsulfonate Oxyimido)-1-cyclohexenylacetonitrile, α-(isopropylsulfonyloxyimino)-1-cyclohexenylacetonitrile, α-(n-butylsulfonyloxyimino) 1-cyclohexenylacetonitrile, α-(methylsulfonyloxyimino)-phenylacetonitrile, α-(methylsulfonyloxyimino)-p-methoxyphenylacetonitrile, α- (trifluoromethylsulfonyloxyimino)-phenylacetonitrile, α-(trifluoromethylsulfonyloxyimido)-p-methoxy Phenyl acetonitrile, α-(ethylsulfonyloxyimido)-p-methoxyphenylacetonitrile, α-(propylsulfonyloxyimino)-p-methylphenylacetonitrile, α- (Methylsulfonyloxyimido)-p-bromophenylacetonitrile or the like.

又,特開平9-208554號公報(段落[0012]~[0014]之[化18]~[化19])所揭示之肟磺酸酯系酸產生劑、國際公開第04/074242號公報(65~86頁次之實施例1~40)所揭示之肟磺酸酯系酸產生劑亦適合使用。 Further, the oxime sulfonate-based acid generator disclosed in JP-A-H09-208554 (paragraphs [0012] to [0014] [Chem. 18] to [Chem. 19], International Publication No. 04/074242 ( The sulfonate-based acid generators disclosed in Examples 1 to 40 of 65 to 86 pages are also suitable for use.

又,較佳者例如以下所例示之內容。 Further, preferred examples are as exemplified below.

重氮甲烷系酸產生劑之中,雙烷基或雙芳基磺醯基重氮甲烷類之具體例,例如,雙(異丙基磺醯基)重氮甲烷、雙(p-甲苯磺醯基)重氮甲烷、雙(1,1-二甲基乙基磺醯基)重氮甲烷、雙(環己基磺醯基)重氮甲烷、雙(2,4-二甲基苯基磺醯基)重氮甲烷等。 Among the diazomethane acid generators, specific examples of the dialkyl or bisarylsulfonyldiazomethanes, for example, bis(isopropylsulfonyl)diazomethane, bis(p-toluenesulfonate) Diazomethane, bis(1,1-dimethylethylsulfonyl)diazomethane, bis(cyclohexylsulfonyl)diazomethane, bis(2,4-dimethylphenylsulfonate) Base) diazomethane and the like.

又,特開平11-035551號公報、特開平11-035552號公報、特開平11-035573號公報所揭示之重氮甲烷系酸產生劑亦適合使用。 Further, the diazomethane-based acid generator disclosed in Japanese Laid-Open Patent Publication No. Hei 11-035551, No. Hei 11-035552, and No. Hei 11-035573 is also suitably used.

又,聚(雙磺醯基)重氮甲烷類,又例如,特開平11-322707號公報所揭示般,1,3-雙(苯基磺醯基重氮甲 基磺醯基)丙烷、1,4-雙(苯基磺醯基重氮甲基磺醯基)丁烷、1,6-雙(苯基磺醯基重氮甲基磺醯基)己烷、1,10-雙(苯基磺醯基重氮甲基磺醯基)癸烷、1,2-雙(環己基磺醯基重氮甲基磺醯基)乙烷、1,3-雙(環己基磺醯基重氮甲基磺醯基)丙烷、1,6-雙(環己基磺醯基重氮甲基磺醯基)己烷、1,10-雙(環己基磺醯基重氮甲基磺醯基)癸烷等。 Further, poly(disulfonyl)diazomethane, as disclosed in JP-A-H11-322707, 1,3-bis(phenylsulfonyldiazide) Sulfosyl)propane, 1,4-bis(phenylsulfonyldiazomethylsulfonyl)butane, 1,6-bis(phenylsulfonyldiazomethylsulfonyl)hexane 1,10-bis(phenylsulfonyldiazomethylsulfonyl)decane, 1,2-bis(cyclohexylsulfonyldiazomethylsulfonyl)ethane, 1,3-double (cyclohexylsulfonyldiazomethylsulfonyl)propane, 1,6-bis(cyclohexylsulfonyldiazomethylsulfonyl)hexane, 1,10-bis(cyclohexylsulfonyl) Nitromethylsulfonyl) decane and the like.

(B)成份,可單獨使用1種該些酸產生劑,或將2種以上組合使用亦可。 (B) The component may be used alone or in combination of two or more.

(B)成份以含有作為陰離子之氟化烷基磺酸離子的鎓鹽系酸產生劑為佳。 The component (B) is preferably a sulfonium acid generator containing a fluorinated alkylsulfonic acid ion as an anion.

本發明之光阻組成物中之(B)成份之含量,相對於(A)成份100質量份,以0.5~50質量份為佳,以1~40質量份為更佳。於上述範圍內時,可充分進行圖型之形成。又,就可得到均勻之溶液、良好之保存安定性等,而為較佳。 The content of the component (B) in the photoresist composition of the present invention is preferably 0.5 to 50 parts by mass, more preferably 1 to 40 parts by mass, per 100 parts by mass of the component (A). When it is in the above range, the formation of the pattern can be sufficiently performed. Further, it is preferred to obtain a homogeneous solution, good storage stability, and the like.

<(C)成份> <(C) ingredients>

本發明之光阻組成物,可含有具有下述通式(c0)所表示之結構單位(c0)的高分子化合物(C)((C)成份)。 The photoresist composition of the present invention may contain a polymer compound (C) (component (C)) having a structural unit (c0) represented by the following formula (c0).

[式中,R表示氫原子、碳數1~5之烷基或碳數1~5之鹵化烷基、R1為具有1個以上之一級或二級之醇性羥基,或鏈狀之三級醇性羥基有機基]。 Wherein R represents a hydrogen atom, an alkyl group having 1 to 5 carbon atoms or a halogenated alkyl group having 1 to 5 carbon atoms; and R 1 is an alcoholic hydroxyl group having one or more of the first or second order, or a chain of three Alcoholic hydroxyl organic group].

(結構單位(c0)) (Structural unit (c0))

式(c0)中,R與前述為相同之內容。 In the formula (c0), R is the same as the above.

式(c0)中,R1為具有1個以上之一級或二級之醇性羥基,或鏈狀之三級醇性羥基有機基。 In the formula (c0), R 1 is an alcoholic hydroxyl group having one or more of the first or second stages, or a chain-like tertiary alcoholic hydroxyl group.

本發明中,醇性羥基係指,鍵結於鏈狀或環狀之烴基的碳原子之羥基。 In the present invention, the alcoholic hydroxyl group means a hydroxyl group bonded to a carbon atom of a chain or cyclic hydrocarbon group.

「鏈狀之三級醇性羥基」係指,鍵結於構成鏈狀之烴基的三級碳原子之羥基。該鏈狀之烴基,例如,結構單位(a1)之R14所列舉之直鏈狀、支鏈狀之烷基等。 The "chain-like tertiary alcoholic hydroxyl group" means a hydroxyl group bonded to a tertiary carbon atom constituting a chain hydrocarbon group. The chain hydrocarbon group is, for example, a linear or branched alkyl group as exemplified as R 14 in the structural unit (a1).

又,結構單位(c0)具有一級或二級之醇性羥基之情形,該一級或二級之醇性羥基所鍵結之烴基,可為鏈狀亦可、環狀亦可。鏈狀、環狀之烴基,例如,結構單位(a1)之R14所列舉之直鏈狀、支鏈狀之烷基、結構單位(a1)所列舉之「脂肪族環式基」等。 Further, the structural unit (c0) may have a primary or secondary alcoholic hydroxyl group, and the hydrocarbon group to which the primary or secondary alcoholic hydroxyl group is bonded may be a chain or a ring. The chain-like or cyclic hydrocarbon group is, for example, a linear or branched alkyl group as recited in R 14 of the structural unit (a1), and an "aliphatic cyclic group" as exemplified in the structural unit (a1).

R1之有機基為,具有如上述般之醇性羥基之基,即, 只要為具有醇性羥基,與該醇性羥基所鍵結之烴基之基時,並未有特別之限定。 The organic group of R 1 is a group having an alcoholic hydroxyl group as described above, that is, it is not particularly limited as long as it has an alcoholic hydroxyl group and a hydrocarbon group bonded to the alcoholic hydroxyl group.

R1之有機基,具體而言,例如伸烷基、2價之脂肪族環式基或含雜原子之2價之鍵結基的末端鍵結醇性羥基之基等。伸烷基、2價之脂肪族環式基、含雜原子之2價之鍵結基,與上述Y2之2價之鍵結基之說明中之伸烷基、2價之脂肪族環式基、含雜原子之2價之鍵結基為相同之內容。 The organic group of R 1 is specifically, for example, an alkyl group, a divalent aliphatic ring group or a terminal group of a divalent bond group containing a hetero atom bonded to an alcoholic hydroxyl group. An alkyl group, a divalent aliphatic ring group, a divalent bond group containing a hetero atom, an alkylene group and a divalent aliphatic ring in the description of a two-valent bond group of the above Y 2 The base and the divalent bond group containing a hetero atom are the same.

結構單位(c0),以下述通式(c0-11)或(c0-12)所表示之結構單位、下述通式(c0-21)或(c0-22)所表示之結構單位,及下述通式(c0-3)所表示之結構單位為佳。 The structural unit (c0) is a structural unit represented by the following general formula (c0-11) or (c0-12), a structural unit represented by the following general formula (c0-21) or (c0-22), and The structural unit represented by the general formula (c0-3) is preferred.

具有一級之醇性羥基的結構單位(c0),以下述通式(c0-11)或(c0-12)所表示之結構單位為佳,具有二級之醇性羥基的結構單位(c0),以下述通式(c0-21)或(c0-22)所表示之結構單位,或一級之醇性不具有羥基之情形的下述通式(c0-12)所表示之結構單位為佳,具有鏈狀之三級醇性羥基的結構單位(c0),以下述通式(c0-3)所表示之結構單位為佳。 The structural unit (c0) having a first-order alcoholic hydroxyl group is preferably a structural unit represented by the following general formula (c0-11) or (c0-12), and has a structural unit (c0) of a secondary alcoholic hydroxyl group, The structural unit represented by the following general formula (c0-21) or (c0-22), or the structural unit represented by the following general formula (c0-12) in the case where the alcohol of the first stage does not have a hydroxyl group is preferable, and has The structural unit (c0) of the chain-like tertiary alcoholic hydroxyl group is preferably a structural unit represented by the following formula (c0-3).

[式中,R與前述為相同之內容,Q為各自獨立之單鍵,或,伸烷基、2價之脂肪族環式基或含雜原子之2價之鍵結基,A01為可具有取代基之2價烴基,R0為各自獨立之碳數1~5之烷基。式中之複數之R0可分別為相同或相異皆可。p0為0~3之整數,p1為1~3之整數,p2為0~3之整數]。 [wherein, R is the same as the above, and Q is an independent single bond, or an alkyl group, a divalent aliphatic ring group or a divalent bond group containing a hetero atom, and A 01 is A divalent hydrocarbon group having a substituent, and R 0 is an independently substituted alkyl group having 1 to 5 carbon atoms. The R 0 of the plural in the formula may be the same or different, respectively. P0 is an integer from 0 to 3, p1 is an integer from 1 to 3, and p2 is an integer from 0 to 3.

上述式中,Q為單鍵,或,伸烷基、2價之脂肪族環式基或含雜原子之2價之鍵結基。伸烷基、2價之脂肪族環式基、含雜原子之2價之鍵結基,與上述「有機基」之說明中之基為相同之內容。 In the above formula, Q is a single bond, or an alkyl group, a divalent aliphatic ring group or a divalent bond group containing a hetero atom. The alkyl group, the divalent aliphatic ring group, and the divalent bond group containing a hetero atom are the same as those in the above description of the "organic group".

上述式中,A01為可具有取代基之烴基。 In the above formula, A 01 is a hydrocarbon group which may have a substituent.

A01中之烴基,以脂肪族烴基為佳,例如,與(A)成份之說明中之式(a1-0-2)之Y2所說明之Y21之2價烴基中之2價之脂肪族烴基為相同之內容等。 A 01 in the hydrocarbon group, preferably an aliphatic hydrocarbon group, for example, the description (A) ingredient in the formula (a1-0-2) of the Y 2 Y 21 is described in the divalent hydrocarbon group of the divalent aliphatic The hydrocarbon group is the same content and the like.

其中,A01中之烴基,又以碳數1~10之伸烷基為更佳。又,A01所鍵結之醇性羥基,基於以一級或二級之醇性羥基,或鏈狀之三級醇性羥基為佳之觀點,故A01之伸 烷基以直鏈狀或支鏈狀為佳。 Among them, the hydrocarbon group in A 01 is more preferably an alkyl group having 1 to 10 carbon atoms. Further, the alcoholic hydroxyl group bonded to A 01 is based on a first- or second-order alcoholic hydroxyl group, or a chain-like tertiary alcoholic hydroxyl group, so that the alkyl group of A 01 is linear or branched. The shape is better.

A01中之脂肪族烴基中,構成該脂肪族烴基的氫原子的一部份可被取代基所取代。取代一部份氫原子的取代基例如,碳數1~5之烷基、烷氧基、氟原子、氟化烷基、羥基、氧原子(=O)、氰基等,又以羥基或烷基為佳。具有作為取代基之羥基的情形,該羥基以一級或二級之醇性羥基為佳。 In the aliphatic hydrocarbon group in A 01 , a part of a hydrogen atom constituting the aliphatic hydrocarbon group may be substituted with a substituent. a substituent replacing a part of a hydrogen atom, for example, an alkyl group having 1 to 5 carbon atoms, an alkoxy group, a fluorine atom, a fluorinated alkyl group, a hydroxyl group, an oxygen atom (=O), a cyano group, etc., and a hydroxyl group or an alkane The base is good. In the case of having a hydroxyl group as a substituent, the hydroxyl group is preferably a primary or secondary alcoholic hydroxyl group.

上述式中,R0為碳數1~5之烷基,其可為直鏈狀亦可、支鏈狀亦可,又以甲基或乙基為佳。 In the above formula, R 0 is an alkyl group having 1 to 5 carbon atoms, and may be linear or branched, and preferably methyl or ethyl.

上述式中,p0為0~3之整數,以0~2為佳,以1~2為更佳。p1為1~3之整數,以1或2為佳,以1為更佳。p2為0~3之整數,0~1之整數為佳。 In the above formula, p0 is an integer of 0 to 3, preferably 0 to 2, and more preferably 1 to 2. P1 is an integer from 1 to 3, preferably 1 or 2, and more preferably 1. P2 is an integer from 0 to 3, and an integer from 0 to 1 is preferred.

以下為結構單位(c0)之具體例示。以下各式中,R與前述為相同之內容。 The following is a specific illustration of the structural unit (c0). In the following formulas, R is the same as the above.

(C)成份中,結構單位(c0),可單獨使用1種亦可,將2種以上組合使用亦可。 In the component (C), the structural unit (c0) may be used singly or in combination of two or more.

(C)成份中,結構單位(c0)之比例,只要為相對於構成該(C)成份的全結構單位為1莫耳%以上時,並未有特別之限定內容,亦可為100莫耳%。其與結構單位(c0)以外之結構單位組合之情形,以3~95莫耳%為佳,以5~90莫耳%為較佳,以20~85莫耳%為更佳,以45~75莫耳%為更佳。於下限值以上時,可提高光阻組成物對基板等支撐體之密著性,於上限值以下時,可取得與其他結構單位之平衡。 In the component (C), the ratio of the structural unit (c0) is not more limited as long as it is 1 mol% or more with respect to the total structural unit constituting the component (C), and may be 100 mol. %. The combination with the structural unit other than the structural unit (c0) is preferably 3 to 95 mol%, preferably 5 to 90 mol%, and more preferably 20 to 85 mol%, and 45 to 45. 75% of the moles is better. When it is more than the lower limit value, the adhesion of the photoresist composition to a support such as a substrate can be improved, and when it is at most the upper limit value, the balance with other structural units can be obtained.

本發明中,(C)成份除上述結構單位(c0)以外, 以再含有含有經由酸之作用而增大極性之酸分解性基的結構單位(c1)為佳。(C)成份於含有結構單位(c1)時,可大幅降低浮渣之發生。 In the present invention, the component (C) is in addition to the above structural unit (c0). It is preferable to further contain a structural unit (c1) containing an acid-decomposable group which increases polarity by an action of an acid. (C) When the composition contains structural unit (c1), the occurrence of scum can be greatly reduced.

結構單位(c1),例如,與上述結構單位(a1)為相同之內容等。其中,結構單位(c1)又以與上述結構單位(a11)為相同之內容者為佳,以上述式(a1-1)所表示之結構單位為較佳,以上述式(a1-0-11)所表示之結構單位為更佳,以上述式(a1-1-23)所表示之結構單位為特佳。 The structural unit (c1) is, for example, the same content as the above-described structural unit (a1). Wherein, the structural unit (c1) is preferably the same as the above structural unit (a11), and the structural unit represented by the above formula (a1-1) is preferred, and the above formula (a1-0-11) The structural unit represented by the above is more preferable, and the structural unit represented by the above formula (a1-1-23) is particularly preferable.

(C)成份中,結構單位(c1),可單獨使用1種亦可,將2種以上組合使用亦可。 In the component (C), the structural unit (c1) may be used singly or in combination of two or more.

(C)成份中,結構單位(c1)之比例,以1~70莫耳%為佳,以3~60莫耳%為較佳,以5~55莫耳%為更佳。於下限值以上時,可大幅降低浮渣之發生,於上限值以下時,可取得與其他結構單位之平衡,而提高光阻組成物對基板等支撐體之密著性。 Among the components (C), the ratio of the structural unit (c1) is preferably from 1 to 70 mol%, preferably from 3 to 60 mol%, more preferably from 5 to 55 mol%. When it is more than the lower limit value, the occurrence of dross can be greatly reduced, and when it is at most the upper limit value, the balance with other structural units can be obtained, and the adhesion of the photoresist composition to the support such as the substrate can be improved.

(C)成份,於無損本發明效果之範圍,可含有上述結構單位(c0)、(c1)以外之結構單位(以下,亦稱為「結構單位(c2)」)。 The component (C) may contain structural units other than the structural units (c0) and (c1) (hereinafter also referred to as "structural unit (c2)") insofar as the effects of the present invention are not impaired.

結構單位(c2),只要為未分類於上述之結構單位(c1)、(c2)的其他結構單位時,並未有特別之限定內容,其可使用以往作為ArF準分子雷射用、KrF準分子雷射用、EUV用、EB用等光阻用樹脂用之已知多數成份。 The structural unit (c2) is not particularly limited as long as it is another structural unit that is not classified into the structural units (c1) and (c2) described above, and can be used as an ArF excimer laser or KrF A known majority of components for resistive resins such as molecular lasers, EUVs, and EBs.

結構單位(c2),例如,(甲基)丙烯酸甲基、(甲 基)丙烯酸乙基、(甲基)丙烯酸n-丙基、(甲基)丙烯酸n-丁基、(甲基)丙烯酸2-甲基丙基、(甲基)丙烯酸1-甲基丙基、(甲基)丙烯酸t-丁基、(甲基)丙烯酸環丙基、(甲基)丙烯酸環戊基、(甲基)丙烯酸環己基、(甲基)丙烯酸4-甲氧基環己基、(甲基)丙烯酸2-環戊氧羰基乙基、(甲基)丙烯酸2-環己氧基羰基乙基、(甲基)丙烯酸2-(4-甲氧基環己基)氧羰基乙基等鏈狀之烷基、烷氧基,或具有單環之環烷基的(甲基)丙烯酸酯類等,又較佳為下述式(c2-1)所表示之結構單位等。式(c2-1)中,R98為碳數1~5之烷基或烷氧基,例如,甲基、乙基、甲氧基、乙氧基等。 Structural unit (c2), for example, methyl (meth)acrylate, ethyl (meth)acrylate, n-propyl (meth)acrylate, n-butyl (meth)acrylate, (meth)acrylic acid 2 -methylpropyl, 1-methylpropyl (meth)acrylate, t-butyl (meth)acrylate, cyclopropyl (meth)acrylate, cyclopentyl (meth)acrylate, (methyl) Cyclohexyl acrylate, 4-methoxycyclohexyl (meth) acrylate, 2-cyclopentyloxycarbonylethyl (meth) acrylate, 2-cyclohexyloxycarbonylethyl (meth) acrylate, (methyl) a chain-like alkyl group such as 2-(4-methoxycyclohexyl)oxycarbonylethyl acrylate, an alkoxy group, or a (meth) acrylate having a monocyclic cycloalkyl group, etc., preferably further The structural unit represented by the formula (c2-1) and the like. In the formula (c2-1), R 98 is an alkyl group or alkoxy group having 1 to 5 carbon atoms, and examples thereof include a methyl group, an ethyl group, a methoxy group, and an ethoxy group.

[式中,R與前述為相同之內容,R98為碳數1~5之烷基或烷氧基]。 [wherein R is the same as described above, and R 98 is an alkyl group having 1 to 5 carbon atoms or an alkoxy group].

(C)成份中,結構單位(c2),可單獨使用1種亦可,將2種以上組合使用亦可。 In the component (C), the structural unit (c2) may be used singly or in combination of two or more.

(C)成份中之結構單位(c2)之比例,以0~95莫耳%為佳,以5~90莫耳%為較佳,以10~50莫耳%為更佳。於下限值以上時,可提高微影蝕刻特性,於上限值以 下時,可提高光阻組成物對基板等支撐體之密著性。 The proportion of the structural unit (c2) in the component (C) is preferably 0 to 95 mol%, preferably 5 to 90 mol%, more preferably 10 to 50 mol%. When it is above the lower limit value, the lithography etching characteristics can be improved, and the upper limit value is In the next case, the adhesion of the photoresist composition to a support such as a substrate can be improved.

本發明中,(C)成份,特別是以含有下述通式(C-1)所示結構單位之組合的高分子化合物為佳。下述通式中,R、Q、R21、h分別與前述為相同之內容,式中,複數之R可分別為相同或相異皆可。 In the present invention, the component (C) is preferably a polymer compound containing a combination of structural units represented by the following formula (C-1). In the following general formula, R, Q, R 21 and h are the same as described above, and in the formula, the plural R may be the same or different.

(C)成份之質量平均分子量(Mw)(凝膠滲透色層分析儀之聚苯乙烯換算基準),並未有特別之限定內容,以2萬~50萬為佳,以2.5萬~45萬為較佳,以3~40萬為更佳,以5萬~35萬為特佳。於此範圍之上限值以下時,特別是可降低浮渣之發生,於此範圍之下限值以上時,特別是可以提高光阻組成物對基板等支撐體之密著性。 (C) The mass average molecular weight (Mw) of the component (the polystyrene conversion standard of the gel permeation chromatography analyzer) is not particularly limited, and is preferably 20,000 to 500,000, and is 25,000 to 450,000. For better, it is better to use 30,000 to 400,000, and 50,000 to 350,000 is especially good. When the amount is less than or equal to the upper limit of the range, the occurrence of dross can be particularly reduced. When the value is equal to or greater than the lower limit of the range, the adhesion of the photoresist composition to a support such as a substrate can be particularly improved.

又,(C)成份之分散度(Mw/Mn),並未有特別之限定內容,以1.0~5.0為佳,以1.0~3.0為較佳,以1.2~2.5為最佳。又,Mn表示數平均分子量。 Further, the dispersion degree (Mw/Mn) of the component (C) is not particularly limited, and is preferably 1.0 to 5.0, preferably 1.0 to 3.0, and preferably 1.2 to 2.5. Further, Mn represents a number average molecular weight.

(C)成份,可將衍生各結構單位之單體,例如使用偶氮二異丁腈(AIBN)等自由基聚合起始劑,依公知之自由基聚合等予以聚合而製得。 The component (C) can be obtained by polymerizing a monomer derived from each structural unit, for example, a radical polymerization initiator such as azobisisobutyronitrile (AIBN) by a known radical polymerization or the like.

利用公知方法所合成之化合物之結構,可依1H-核磁共振(NMR)圖譜法、13C-NMR圖譜法、19F-NMR圖譜法、紅外線吸收(IR)圖譜法、質量分析(MS)法、元素分析法、X線結晶繞射法等一般性有機分析法予以確認。 The structure of the compound synthesized by a known method can be determined by 1 H-nuclear magnetic resonance (NMR) spectroscopy, 13 C-NMR spectroscopy, 19 F-NMR spectroscopy, infrared absorption (IR) spectroscopy, mass analysis (MS). General organic analysis methods such as method, elemental analysis, and X-ray crystal diffraction are confirmed.

本發明之光阻組成物中,(C)成份之含量,相對於(A)成份100質量份,為未達25質量份,又以0.05~20質量份為佳,以0.1~5質量份為較佳,以0.1~1質量份為更佳。上述範圍於上限值以下時,可降低浮渣之發生,且,可提高微影蝕刻特性,上述範圍於下限值以上時,可提高對基板等支撐體之密著性。 In the photoresist composition of the present invention, the content of the component (C) is less than 25 parts by mass, and preferably 0.05 to 20 parts by mass, and 0.1 to 5 parts by mass, based on 100 parts by mass of the component (A). Preferably, it is more preferably 0.1 to 1 part by mass. When the range is less than or equal to the upper limit, the occurrence of scum can be reduced, and the lithographic etching characteristics can be improved. When the range is at least the lower limit, the adhesion to a support such as a substrate can be improved.

<(D)成份> <(D) ingredient>

本發明之光阻組成物,除前述(A)成份、(B)成份及(C)成份以外,可含有作為(D)成份之光反應型抑制劑(Quencher)。 The photoresist composition of the present invention may contain, as the component (A), the component (B) and the component (C), a photoreactive inhibitor (Quencher) as the component (D).

「抑制劑」為作為酸擴散控制劑,即捕集(Trap)經由曝光而前述(B)成份所產生之酸者。 The "inhibitor" is an acid which is an acid diffusion controlling agent, that is, an acid produced by the above-mentioned (B) component by exposure.

「光反應型抑制劑」為,於曝光前(或未曝光部中)具有作為抑制劑之作用,於曝光(經EB、EUV等輻射線之照射)後則不具有抑制劑之作用者。 The "photoreactive inhibitor" has an action as an inhibitor before exposure (or in an unexposed portion), and does not have an inhibitor function after exposure (irradiation by radiation such as EB or EUV).

(D)成份,可使用已知作為光反應型抑制劑之成份,例如,由陽離子部,與陰離子部所形成之鹼性化合物等。該鹼性化合物,可以鹼交換方式捕集前述(B)成份 所產生之酸(強酸)。 As the component (D), a component known as a photoreactive inhibitor, for example, a basic compound formed of a cationic moiety and an anion moiety, or the like can be used. The basic compound can capture the aforementioned (B) component by alkali exchange The acid produced (strong acid).

又,本發明中之「鹼性化合物」,係指相對於前述(B)成份所產生之酸形成相對性鹼性的化合物。 Further, the "basic compound" in the present invention means a compound which is relatively basic with respect to the acid produced by the component (B).

(D)成份,更具體而言,例如下述通式(d1)所表示之化合物(D1)(以下,亦稱為(D1)成份)、下述通式(d2)所表示之化合物(D2)(以下,亦稱為(D2)成份)、下述通式(d3)所表示之化合物(D3)(以下,亦稱為(D3)成份)等。 (D) component, more specifically, for example, the compound (D1) represented by the following formula (d1) (hereinafter, also referred to as (D1) component), or the compound represented by the following formula (d2) (D2) (hereinafter, also referred to as (D2) component), the compound (D3) represented by the following formula (d3) (hereinafter, also referred to as (D3) component).

[式中,R3為可具有取代基之烴基,Z2c為可具有取代基之碳數1~30之烴基(但,S為鄰接之碳上未被氟原子所取代者),R4為有機基,Y3為直鏈狀、支鏈狀或環狀之伸烷基或伸芳基,Rf0為烴基,Z+為各自獨立之鋶或錪陽離子]。 Wherein R 3 is a hydrocarbon group which may have a substituent, and Z 2c is a hydrocarbon group having 1 to 30 carbon atoms which may have a substituent (however, S is a carbon atom which is not substituted by a fluorine atom), and R 4 is The organic group, Y 3 is a linear, branched or cyclic alkyl or aryl group, Rf 0 is a hydrocarbon group, and Z + is a separate ruthenium or osmium cation.

[(D1)成份] [(D1) ingredients] ‧陰離子部 ‧ anion

式(d1)中,R3為可具有取代基之烴基。 In the formula (d1), R 3 is a hydrocarbon group which may have a substituent.

R3之可具有取代基之烴基,可為脂肪族烴基亦可、芳香族烴基亦可,其與(B)成份中之X3之脂肪族烴基、芳香族烴基為相同之內容等。 The hydrocarbon group which may have a substituent of R 3 may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group, and may be the same as the aliphatic hydrocarbon group or the aromatic hydrocarbon group of X 3 in the component (B).

其中,R3之可具有取代基之烴基,又以可具有取代基之芳香族烴基,或,可具有取代基之脂肪族環式基為佳,以可具有取代基之苯基或萘基;由金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等多環鏈烷去除1個以上之氫原子所得之基為更佳。 Wherein R 3 may have a hydrocarbon group of a substituent, and may be an aromatic hydrocarbon group which may have a substituent, or an aliphatic ring group which may have a substituent, preferably a phenyl group or a naphthyl group which may have a substituent; More preferably, a group obtained by removing one or more hydrogen atoms from a polycyclic alkane such as adamantane, norbornane, isodecane, tricyclodecane or tetracyclododecane is more preferable.

又,R3之可具有取代基之烴基,可為直鏈狀、支鏈狀、或脂環式烷基,或,氟化烷基亦佳。 Further, a hydrocarbon group which may have a substituent of R 3 may be a linear, branched or alicyclic alkyl group, or a fluorinated alkyl group is also preferred.

R3之直鏈狀、支鏈狀或脂環式烷基的碳數,以1~10為佳,具體而言,例如,甲基、乙基、丙基、丁基、戊基、己基、庚基、辛基、壬基、癸基等直鏈狀烷基、1-甲基乙基、1-甲基丙基、2-甲基丙基、1-甲基丁基、2-甲基丁基、3-甲基丁基、1-乙基丁基、2-乙基丁基、1-甲基戊基、2-甲基戊基、3-甲基戊基、4-甲基戊基等支鏈狀之烷基、降莰基、金剛烷基等脂環式烷基等。 The carbon number of the linear, branched or alicyclic alkyl group of R 3 is preferably from 1 to 10, specifically, for example, a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group or a hexyl group. a linear alkyl group such as heptyl, octyl, decyl or decyl, 1-methylethyl, 1-methylpropyl, 2-methylpropyl, 1-methylbutyl, 2-methyl Butyl, 3-methylbutyl, 1-ethylbutyl, 2-ethylbutyl, 1-methylpentyl, 2-methylpentyl, 3-methylpentyl, 4-methylpentyl An alicyclic alkyl group such as a branched alkyl group, a thiol group or an adamantyl group.

R3之氟化烷基,可為鏈狀亦可、環狀亦可,又以直鏈狀或支鏈狀為佳。 The fluorinated alkyl group of R 3 may be in the form of a chain or a ring, and is preferably a linear or branched chain.

氟化烷基的碳數,以1~11為佳,以1~8為較佳,以1~4為更佳。具體而言,例如,構成甲基、乙基、丙基、丁基、戊基、己基、庚基、辛基、壬基、癸基等直鏈狀烷基的一部份或全部之氫原子被氟原子所取代之基,或構成1-甲基乙基、1-甲基丙基、2-甲基丙基、1-甲基丁基、2-甲基丁基、3-甲基丁基等支鏈狀烷基一部份或全部之氫原子被氟原子所取代之基等。 The carbon number of the fluorinated alkyl group is preferably from 1 to 11, more preferably from 1 to 8, and more preferably from 1 to 4. Specifically, for example, a hydrogen atom constituting a part or all of a linear alkyl group such as a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, a heptyl group, an octyl group, a decyl group or a fluorenyl group. a group substituted by a fluorine atom, or a composition of 1-methylethyl, 1-methylpropyl, 2-methylpropyl, 1-methylbutyl, 2-methylbutyl, 3-methylbutyl A group in which a part or all of a hydrogen atom of a branched alkyl group is substituted by a fluorine atom or the like.

又,R3之氟化烷基,可含有氟原子以外之原子。氟原 子以外之原子,例如,氧原子、碳原子、氫原子、氧原子、硫原子、氮原子等。 Further, the fluorinated alkyl group of R 3 may contain an atom other than a fluorine atom. An atom other than a fluorine atom, for example, an oxygen atom, a carbon atom, a hydrogen atom, an oxygen atom, a sulfur atom, a nitrogen atom or the like.

其中,R3之氟化烷基,又以構成直鏈狀烷基之一部份或全部之氫原子被氟原子所取代之基為佳,以構成直鏈狀烷基之全部氫原子被氟原子所取代之基(全氟烷基)為佳。 Wherein, the fluorinated alkyl group of R 3 is preferably a group in which a part or all of a hydrogen atom constituting one of the linear alkyl groups is substituted by a fluorine atom, so that all hydrogen atoms constituting the linear alkyl group are fluorine-containing. The group substituted by an atom (perfluoroalkyl group) is preferred.

以下為(D1)成份之陰離子部之較佳具體例示。 The following is a preferred specific example of the anion portion of the component (D1).

‧陽離子部 ‧Catalyst

式(d1)中,Z+為鋶或錪陽離子。 In the formula (d1), Z + is a ruthenium or osmium cation.

Z+之鋶或錪陽離子並未有特別之限定,例如,可與前述式(b-1)或(b-2)中之陽離子為相同之內容等。 The ruthenium or ruthenium cation of Z + is not particularly limited, and for example, it may be the same as the cation of the above formula (b-1) or (b-2).

(D1)成份,可單獨使用1種亦可,將2種以上組合使用亦可。 The component (D1) may be used singly or in combination of two or more.

[(D2)成份] [(D2) ingredients] ‧陰離子部 ‧ anion

式(d2)中,Z2c為可具有取代基之碳數1~30之烴基。 In the formula (d2), Z 2c is a hydrocarbon group having 1 to 30 carbon atoms which may have a substituent.

Z2c之可具有取代基之碳數1~30之烴基,可為脂肪族烴基亦可、芳香族烴基亦可,例如與(B)成份中之X3之脂肪族烴基、芳香族烴基為相同之內容等。 Z 2c may have a hydrocarbon group having 1 to 30 carbon atoms, may be an aliphatic hydrocarbon group or an aromatic hydrocarbon group, and may be, for example, the same as the aliphatic hydrocarbon group or aromatic hydrocarbon group of X 3 in the component (B). The content and so on.

其中,以Z2c之可具有取代基之烴基,以可具有取代基之脂肪族環式基為佳,以由金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷、樟腦烷等去除1個以上之氫原子所得之基(可具有取代基)為更佳。 Wherein, the hydrocarbon group which may have a substituent of Z 2c is preferably an aliphatic cyclic group which may have a substituent, and is adamantane, norbornane, isodecane, tricyclodecane, tetracyclododecane More preferably, the base (which may have a substituent) obtained by removing one or more hydrogen atoms from camphor alkane is preferable.

Z2c之烴基可具有取代基,取代基例如,與(B)成份中之X3為相同之內容等。但,Z2c中,SO3 -中之與S原子相鄰接之碳,為未被氟所取代者。SO3 -與氟原子未相鄰接時,該(d2)成份之陰離子可形成適當之弱酸陰離子,而可提高(D)成份之抑制能力。 The hydrocarbon group of Z 2c may have a substituent, and the substituent is, for example, the same as X 3 in the component (B). However, in Z 2c , the carbon adjacent to the S atom in SO 3 - is not replaced by fluorine. When the SO 3 - is not adjacent to the fluorine atom, the anion of the (d2) component forms a suitable weak acid anion, and the ability to suppress the (D) component can be improved.

以下為(d2)成份之陰離子部之較佳具體例示。 The following is a preferred specific example of the anion portion of the component (d2).

‧陽離子部 ‧Catalyst

式(d2)中,Z+與前述式(d1)中之Z+為相同之內容。 In the formula (d2), Z + is the same as Z + in the above formula (d1).

(D2)成份,可單獨使用1種亦可,將2種以上組合使用亦可。 The component (D2) may be used singly or in combination of two or more.

[(D3)成份] [(D3) ingredients] ‧陰離子部 ‧ anion

式(d3)中,R4為有機基。 In the formula (d3), R 4 is an organic group.

R4之有機基並未有特別之限定,例如,烷基、烷氧 基、-O-C(=O)-C(RC2)=CH2(RC2為氫原子、碳數1~5之烷基或碳數1~5之鹵化烷基),或-O-C(=O)-RC3(RC3為烴基)。 The organic group of R 4 is not particularly limited, and for example, an alkyl group, an alkoxy group, -OC(=O)-C(R C2 )=CH 2 (R C2 is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms a group or a halogenated alkyl group having 1 to 5 carbon atoms, or -OC(=O)-R C3 (R C3 is a hydrocarbon group).

R4之烷基,以碳數1~5之直鏈狀或支鏈狀之烷基為佳,具體而言,例如,甲基、乙基、丙基、異丙基、n-丁基、異丁基、tert-丁基、戊基、異戊基、新戊基等。R4之烷基中之氫原子的一部份可被羥基、氰基等所取代。 The alkyl group of R 4 is preferably a linear or branched alkyl group having 1 to 5 carbon atoms, specifically, for example, a methyl group, an ethyl group, a propyl group, an isopropyl group or an n-butyl group. Isobutyl, tert-butyl, pentyl, isopentyl, neopentyl, and the like. A part of the hydrogen atom in the alkyl group of R 4 may be substituted by a hydroxyl group, a cyano group or the like.

R4之烷氧基以碳數1~5之烷氧基為佳,碳數1~5之烷氧基,具體而言,例如,甲氧基、乙氧基、n-丙氧基、iso-丙氧基、n-丁氧基、tert-丁氧基等。其中,又以甲氧基、乙氧基為最佳。 The alkoxy group of R 4 is preferably an alkoxy group having 1 to 5 carbon atoms and an alkoxy group having 1 to 5 carbon atoms, specifically, for example, a methoxy group, an ethoxy group, an n-propoxy group, or the like. -propoxy, n-butoxy, tert-butoxy and the like. Among them, methoxy and ethoxy groups are preferred.

R4為-O-C(=O)-C(RC2)=CH2之情形,RC2為氫原子、碳數1~5之烷基或碳數1~5之鹵化烷基。 When R 4 is -OC(=O)-C(R C2 )=CH 2 , R C2 is a hydrogen atom, an alkyl group having 1 to 5 carbon atoms or a halogenated alkyl group having 1 to 5 carbon atoms.

RC2中之碳數1~5之烷基,以碳數1~5之直鏈狀或支鏈狀之烷基為佳,具體而言,例如,甲基、乙基、丙基、異丙基、n-丁基、異丁基、tert-丁基、戊基、異戊基、新戊基等。 The alkyl group having 1 to 5 carbon atoms in R C2 is preferably a linear or branched alkyl group having 1 to 5 carbon atoms, specifically, for example, methyl group, ethyl group, propyl group or isopropyl group. Base, n-butyl, isobutyl, tert-butyl, pentyl, isopentyl, neopentyl, and the like.

RC2中之鹵化烷基,例如前述碳數1~5之烷基中之氫原子的一部份或全部被鹵素原子所取代之基。該鹵素原子,例如,氟原子、氯原子、溴原子、碘原子等,特別是以氟原子為佳。 The halogenated alkyl group in R C2 is, for example, a group in which a part or all of a hydrogen atom in the alkyl group having 1 to 5 carbon atoms is substituted by a halogen atom. The halogen atom is, for example, a fluorine atom, a chlorine atom, a bromine atom, an iodine atom or the like, and particularly preferably a fluorine atom.

RC2,以氫原子、碳數1~3之烷基或碳數1~3之氟化烷基為佳,就工業上取得之容易性等觀點,以氫原子或甲基為最佳。 R C2, hydrogen atoms, or alkyl having 1 to 3 carbon atoms of the fluorinated alkyl group preferably having 1 to 3, it is easy to obtain and the like of the industrial viewpoints, the hydrogen atom or a methyl groups.

R4為-O-C(=O)-RC3之情形,RC3為烴基。 In the case where R 4 is -OC(=O)-R C3 , R C3 is a hydrocarbon group.

RC3之烴基,可為芳香族烴基亦可、脂肪族烴基亦可。RC3之烴基,具體而言,例如與(B)成份中之X3之烴基為相同之內容等。 The hydrocarbon group of R C3 may be an aromatic hydrocarbon group or an aliphatic hydrocarbon group. The hydrocarbon group of R C3 is, for example, the same as the hydrocarbon group of X 3 in the component (B).

其中,RC3之烴基,又以由環戊烷、環己烷、金剛烷、降莰烷、異莰烷、三環癸烷、四環十二烷等環鏈烷去除1個以上之氫原子所得之脂環式基,或,苯基、萘基等芳香族基為佳。RC3為脂環式基之情形,光阻組成物可良好地溶解於有機溶劑中,而具有良好微影蝕刻特性。又,RC3為芳香族基之情形,於使用EUV等作為曝光光源之微影蝕刻中,該光阻組成物具有優良光吸收效率,且具有良好之感度或微影蝕刻特性。 Wherein, the hydrocarbon group of R C3 further removes one or more hydrogen atoms by a cycloalkane such as cyclopentane, cyclohexane, adamantane, norbornane, isodecane, tricyclodecane or tetracyclododecane. The obtained alicyclic group or an aromatic group such as a phenyl group or a naphthyl group is preferred. In the case where R C3 is an alicyclic group, the photoresist composition can be well dissolved in an organic solvent with good lithographic etching characteristics. Further, in the case where R C3 is an aromatic group, in the lithography etching using EUV or the like as an exposure light source, the photoresist composition has excellent light absorption efficiency and has good sensitivity or lithographic etching characteristics.

其中,R4又以-O-C(=O)-C(RC2’)=CH2(RC2’為氫原子或甲基),或,-O-C(=O)-RC3’(RC3’為脂肪族環式基)為佳。 Wherein R 4 is again -OC(=O)-C(R C2' )=CH 2 (R C2' is a hydrogen atom or a methyl group), or, -OC(=O)-R C3' (R C3' It is preferably an aliphatic cyclic group).

式(d3)中,Y3為直鏈狀、支鏈狀或環狀之伸烷基或伸芳基。 In the formula (d3), Y 3 is a linear, branched or cyclic alkyl group or an extended aryl group.

Y3之直鏈狀、支鏈狀或環狀之伸烷基或伸芳基,與上述式(a1-0-2)中之Y2之2價之鍵結基之中,「直鏈狀或支鏈狀之脂肪族烴基」、「環狀脂肪族烴基」、「芳香族烴基」為相同之內容等。 a linear, branched or cyclic alkyl or aryl group of Y 3 and a linear chain of Y 2 of the above formula (a1-0-2), "linear" The branched aliphatic hydrocarbon group, the "cyclic aliphatic hydrocarbon group", and the "aromatic hydrocarbon group" are the same contents.

其中,Y3又以伸烷基為佳,以直鏈狀或支鏈狀之伸烷基為較佳,以伸甲基或伸乙基為更佳。 Among them, Y 3 is preferably an alkylene group, and a linear or branched alkyl group is preferred, and a methyl group or an ethyl group is more preferred.

式(d3)中,Rf0為含有氟原子之烴基。 In the formula (d3), Rf 0 is a hydrocarbon group containing a fluorine atom.

Rf0之含有氟原子之烴基,以氟化烷基為佳,以與上述R3之氟化烷基為相同者為更佳。 The hydrocarbon group containing a fluorine atom of Rf 0 is preferably a fluorinated alkyl group, and more preferably the same as the above-mentioned fluorinated alkyl group of R 3 .

以下為(D3)成份之陰離子部之較佳具體例示。 The following is a preferred specific example of the anion portion of the component (D3).

‧陽離子部 ‧Catalyst

式(d3)中,Z+與前述式(d1)中之Z+為相同之內容。 In the formula (d3), Z + is the same as Z + in the above formula (d1).

(D3)成份,可單獨使用1種亦可,將2種以上組合使用亦可。 The component (D3) may be used singly or in combination of two or more.

(D)成份,可僅含有上述(D1)~(D3)成份之任一種亦可、含有由2種以上組合者亦可。 The component (D) may be any one of the above (D1) to (D3) components, and may be contained in combination of two or more.

(D1)~(D3)成份之合計含量,相對於(A)成份100質量份,以0.5~10.0質量份為佳,以0.5~8.0質量 份為較佳,以1.0~5.0質量份為更佳。於上述範圍之下限值以上時,特別是可以得到良好之微影蝕刻特性及光阻圖型形狀。於前述範圍之上限值以下時,可維持良好之感度,亦具有優良之產率。 The total content of the components (D1) to (D3) is preferably 0.5 to 10.0 parts by mass, and 0.5 to 8.0 by mass based on 100 parts by mass of the component (A). The portion is preferably used, and more preferably 1.0 to 5.0 parts by mass. When the value is at least the lower limit of the above range, in particular, good lithographic etching characteristics and a resist pattern shape can be obtained. When it is below the upper limit of the above range, it can maintain good sensitivity and also has excellent yield.

{(D)成份之製造方法} {(D) ingredient manufacturing method}

本發明中之(D1)成份、(D2)成份之製造方法並未有特別之限定內容,其可使用公知之方法予以製造。 The method for producing the component (D1) and the component (D2) in the present invention is not particularly limited, and it can be produced by a known method.

又,(D3)成份之製造方法並未有特別之限定,例如,前述式(d3)中之R4為,Y3鍵結之末端具有氧原子之基之情形,可使用使下述通式(i-1)所表示之化合物(i-1),與下述通式(i-2)所表示之化合物(i-2)進行反應之方式,製得下述通式(i-3)所表示之化合物(i-3),再使化合物(i-3),與具有所期待之陽離子Z+的A- Z+(i-4)進行反應之方式,製得通式(d3)所表示之化合物(D3)。 Further, the method for producing the component (D3) is not particularly limited. For example, R 4 in the above formula (d3) is a case where the terminal of the Y 3 bond has a group of an oxygen atom, and the following formula can be used. The compound (i-1) represented by the formula (i-1) is reacted with the compound (i-2) represented by the following formula (i-2) to obtain the following formula (i-3). The compound (i-3) is represented by reacting the compound (i-3) with A - Z + (i-4) having the desired cation Z + to obtain the formula (d3). The compound (D3) is indicated.

[式中,R4、Y3、Rf0、Z+,分別與前述通式(d3)中之R4、Y3、Rf0、Z+為相同。R4a為由R4去除末端之氧原子所得之基,A-為對陰離子]。 [Wherein, R 4, Y 3, Rf 0, Z +, respectively, with the general formula (d3) of the R 4, Y 3, Rf 0 , Z + is the same. R 4a is a group obtained by removing an oxygen atom at the terminal from R 4 , and A - is a pair of anions].

首先,化合物(i-1)與化合物(i-2)進行反應,以製得化合物(i-3)。 First, the compound (i-1) is reacted with the compound (i-2) to obtain a compound (i-3).

式(i-1)中,R4與前述為相同之內容,R4a為由前述R4去除末端之氧原子所得之基。式(i-2)中,Y3、Rf0與前述為相同之內容。 In the formula (i-1), R 4 is the same as the above, and R 4a is a group obtained by removing the oxygen atom at the terminal end from the above R 4 . In the formula (i-2), Y 3 and Rf 0 are the same as those described above.

化合物(i-1)、化合物(i-2),分別可使用市售者亦可、合成者亦可。 The compound (i-1) and the compound (i-2) may be used commercially or in combination.

使化合物(i-1)與化合物(i-2)進行反應,以製得化合物(i-3)方法,並未有特別之限定,例如,於適當之 酸觸媒的存在下,使化合物(i-2)與化合物(i-1)於有機溶劑中進行反應之後,將反應混合物洗淨、回收之方式予以實施。 The compound (i-1) is reacted with the compound (i-2) to produce the compound (i-3), which is not particularly limited, for example, as appropriate In the presence of an acid catalyst, the compound (i-2) and the compound (i-1) are reacted in an organic solvent, and then the reaction mixture is washed and recovered.

上述反應中之酸觸媒,並未有特別之限定,例如甲苯磺酸等,其使用量相對於化合物(i-2)1莫耳,又以0.05~5莫耳左右為佳。 The acid catalyst in the above reaction is not particularly limited, and for example, toluenesulfonic acid or the like is used in an amount of about 0.05 to 5 moles per mole of the compound (i-2).

上述反應中之有機溶劑,只要為可溶解作為原料之化合物(i-1)及化合物(i-2)之有機溶劑即可,具體而言,例如甲苯等,其使用量,相對於化合物(i-1),又以0.5~100質量份為佳,以0.5~20質量份為更佳。溶劑,可單獨使用1種,或將2種以上合併使用亦可。 The organic solvent in the above reaction may be an organic solvent which can dissolve the compound (i-1) and the compound (i-2) as a raw material, specifically, for example, toluene or the like, which is used in an amount relative to the compound (i) -1), preferably 0.5 to 100 parts by mass, more preferably 0.5 to 20 parts by mass. The solvent may be used singly or in combination of two or more.

上述反應中之化合物(i-2)之使用量,通常,相對於化合物(i-1)1莫耳,以使用0.5~5莫耳左右為佳,以0.8~4莫耳左右為更佳。 The amount of the compound (i-2) to be used in the above reaction is usually preferably from 0.5 to 5 mols, more preferably from about 0.8 to 4 mols, per mol of the compound (i-1).

上述反應中之反應時間,依化合物(i-1)與化合物(i-2)之反應性,或反應溫度等而有所相異,通常,以1~80小時為佳,以3~60小時為更佳。 The reaction time in the above reaction varies depending on the reactivity of the compound (i-1) and the compound (i-2), or the reaction temperature, etc., and usually, it is preferably 1 to 80 hours, and 3 to 60 hours. For better.

上述反應中之反應溫度,以20℃~200℃為佳,以20℃~150℃左右為更佳。 The reaction temperature in the above reaction is preferably from 20 ° C to 200 ° C, more preferably from about 20 ° C to 150 ° C.

隨後,使所得之化合物(i-3),與化合物(i-4)進行反應,以製得化合物(d1-3)。 Subsequently, the obtained compound (i-3) is reacted with the compound (i-4) to give a compound (d1-3).

式(i-4)中,Z+與前述為相同之內容,A-為對陰離子。 In the formula (i-4), Z + is the same as the above, and A - is a counter anion.

使化合物(i-3)與化合物(i-4)進行反應,以製得 化合物(D3)之方法,並未有特別之限定,例如,於適當之鹼金屬氫氧化物之存在下,使化合物(i-3)溶解於適當之有機溶劑及水之中,再添加化合物(i-4)進行攪拌,使其進行反應之方式予以實施。 The compound (i-3) is reacted with the compound (i-4) to obtain The method of the compound (D3) is not particularly limited. For example, the compound (i-3) is dissolved in a suitable organic solvent and water in the presence of a suitable alkali metal hydroxide, and a compound is added ( I-4) It is carried out by stirring and reacting it.

上述反應中之鹼金屬氫氧化物,並未有特別之限定,例如氫氧化鈉、氫氧化鉀等,其使用量相對於化合物(i-3)1莫耳,又以0.3~3莫耳左右為佳。 The alkali metal hydroxide in the above reaction is not particularly limited, and is, for example, sodium hydroxide, potassium hydroxide or the like, and is used in an amount of about 0.3 to 3 mol per mol of the compound (i-3). It is better.

上述反應中之有機溶劑,例如二氯甲烷、氯仿、乙酸乙酯等溶劑,其使用量,相對於化合物(i-3),以0.5~100質量份為佳,以0.5~20質量份為更佳。溶劑,可單獨使用1種,或將2種以上合併使用亦可。 The organic solvent in the above reaction, for example, a solvent such as dichloromethane, chloroform or ethyl acetate, is preferably used in an amount of 0.5 to 100 parts by mass, more preferably 0.5 to 20 parts by mass, based on the compound (i-3). good. The solvent may be used singly or in combination of two or more.

上述反應中之化合物(i-4)之使用量,通常,相對於化合物(i-3)1莫耳,以0.5~5莫耳左右為佳,以0.8~4莫耳左右為更佳。 The amount of the compound (i-4) to be used in the above reaction is usually preferably from 0.5 to 5 mols, more preferably from about 0.8 to 4 mols, per mol of the compound (i-3).

上述反應中之反應時間,化合物(i-3)與化合物(i-4)之反應性,或反應溫度等而有所相異,通常,以1~80小時為佳,以3~60小時為更佳。 The reaction time in the above reaction is different depending on the reactivity of the compound (i-3) and the compound (i-4), or the reaction temperature, etc., and usually, it is preferably 1 to 80 hours, and 3 to 60 hours is used. Better.

上述反應中之反應溫度,以20℃~200℃為佳,以20℃~150℃左右為更佳。 The reaction temperature in the above reaction is preferably from 20 ° C to 200 ° C, more preferably from about 20 ° C to 150 ° C.

反應結束後,可將反應液中之化合物(D3)單離、精製亦可。單離、精製之方法,可利用以往公知之方法,例如,可單獨使用濃縮、溶劑萃取、蒸餾、結晶化、再結晶、層析法等任一種,或將該些以2種以上組合使用亦可。 After completion of the reaction, the compound (D3) in the reaction mixture may be isolated and purified. For the method of separation and purification, a conventionally known method can be used. For example, any one of concentration, solvent extraction, distillation, crystallization, recrystallization, and chromatography can be used alone, or two or more of them can be used in combination. can.

依上述之方法所得之化合物(D3)之結構,可依1H-核磁共振(NMR)圖譜法、13C-NMR圖譜法、19F-NMR圖譜法、紅外線吸收(IR)圖譜法、質量分析(MS)法、元素分析法、X線結晶繞射法等一般性有機分析法予以確認。 The structure of the compound (D3) obtained by the above method can be determined by 1 H-nuclear magnetic resonance (NMR) spectroscopy, 13 C-NMR spectroscopy, 19 F-NMR spectroscopy, infrared absorption (IR) spectroscopy, mass analysis. General organic analysis methods such as (MS) method, elemental analysis method, and X-ray crystal diffraction method are confirmed.

<任意成份> <arbitrary ingredients> [(D’)成份] [(D’) ingredients]

本發明之光阻組成物,於不損害本發明之效果的範圍,可含有不相當於上述(D)成份之鹼性化合物成份(D’)(以下,亦稱為「(D’)成份」)作為任意成份。(D’)成份,與上述(D)成份相同般,具有捕集經由曝光而前述(B)成份所產生之酸的抑制劑(Quencher)之作用。 The photoresist composition of the present invention may contain a basic compound component (D') which is not equivalent to the above component (D) (hereinafter, also referred to as "(D') component" as long as the effect of the present invention is not impaired. ) as an optional ingredient. The component (D') has the same function as the above-mentioned component (D), and has an action of trapping an acid (Quencher) which is exposed to the acid produced by the component (B).

(D’)成份為,對於(B)成份形成相對性鹼性,且具有作為酸擴散控制劑作用者,其只要為不相當於上述(D)成份時,並未有特別之限定,故可由公知成份中任意選擇使用即可。例如,脂肪族胺、芳香族胺等胺,其中又以脂肪族胺,特別是二級脂肪族胺或三級脂肪族胺為佳。 The component (D') is a member which is relatively basic to the component (B) and has an action as an acid diffusion controlling agent, and is not particularly limited as long as it does not correspond to the component (D). Any of the known ingredients can be used arbitrarily. For example, an amine such as an aliphatic amine or an aromatic amine is preferably an aliphatic amine, particularly a secondary aliphatic amine or a tertiary aliphatic amine.

脂肪族胺係指,具有1個以上之脂肪族基之胺,該脂肪族基之碳數以1~12為佳。 The aliphatic amine means an amine having one or more aliphatic groups, and the aliphatic group preferably has 1 to 12 carbon atoms.

脂肪族胺係指,氨NH3之氫原子中之至少1個,被碳數12以下之烷基或羥烷基所取代之胺(烷胺或烷醇胺) 或環式胺等。 The aliphatic amine refers to an amine (alkylamine or alkanolamine) or a cyclic amine which is substituted with at least one of hydrogen atoms of ammonia NH 3 and substituted with an alkyl group having 12 or less carbon atoms or a hydroxyalkyl group.

烷胺及烷醇胺之具體例,如n-己胺、n-庚胺、n-辛胺、n-壬胺、n-癸胺等單烷胺;二乙胺、二-n-丙胺、二-n-庚胺、二-n-辛胺、二環己胺等二烷胺;三甲胺、三乙胺、三-n-丙胺、三-n-丁胺、三-n-戊胺、三-n-己胺、三-n-庚胺、三-n-辛胺、三-n-壬胺、三-n-癸胺、三-n-十二烷胺等三烷胺;二乙醇胺、三乙醇胺、二異丙醇胺、三異丙醇胺、二-n-辛醇胺、三-n-辛醇胺等烷醇胺等。該些之中,又以碳數5~10之三烷胺為更佳,以三-n-戊胺或三-n-辛胺為特佳。 Specific examples of the alkylamine and the alkanolamine, such as n-hexylamine, n-heptylamine, n-octylamine, n-decylamine, n-decylamine and the like, monoalkylamine; diethylamine, di-n-propylamine, a dialkylamine such as di-n-heptylamine, di-n-octylamine or dicyclohexylamine; trimethylamine, triethylamine, tri-n-propylamine, tri-n-butylamine, tri-n-pentylamine, a trialkylamine such as tri-n-hexylamine, tri-n-heptylamine, tri-n-octylamine, tri-n-decylamine, tri-n-decylamine or tri-n-dodecylamine; diethanolamine An alkanolamine such as triethanolamine, diisopropanolamine, triisopropanolamine, di-n-octanolamine or tri-n-octanolamine. Among them, a trialkylamine having 5 to 10 carbon atoms is more preferable, and tri-n-pentylamine or tri-n-octylamine is particularly preferable.

環式胺,例如,含有作為雜原子之氮原子之雜環化合物等。該雜環化合物,可為單環式之環(脂肪族單環式胺)亦可、多環式之環(脂肪族多環式胺)亦可。 The cyclic amine is, for example, a heterocyclic compound containing a nitrogen atom as a hetero atom. The heterocyclic compound may be a monocyclic ring (aliphatic monocyclic amine) or a polycyclic ring (aliphatic polycyclic amine).

脂肪族單環式胺,具體而言,例如,哌啶、六氫吡嗪等。 The aliphatic monocyclic amine is specifically, for example, piperidine, hexahydropyrazine or the like.

脂肪族多環式胺,以碳數為6~10者為佳,具體而言,1,5-二氮雜二環[4.3.0]-5-壬烯、1,8-二氮雜二環[5.4.0]-7-十一烯、六亞甲四胺、1,4-二氮雜二環[2.2.2]辛烷等。 Aliphatic polycyclic amines preferably having a carbon number of 6 to 10, specifically 1,5-diazabicyclo[4.3.0]-5-decene, 1,8-diaza Ring [5.4.0]-7-undecene, hexamethylenetetramine, 1,4-diazabicyclo[2.2.2]octane, and the like.

其他脂肪族胺,例如,三(2-甲氧基甲氧基乙基)胺、三{2-(2-甲氧基乙氧基)乙基}胺、三{2-(2-甲氧基乙氧基甲氧基)乙基}胺、三{2-(1-甲氧基乙氧基)乙基}胺、三{2-(1-乙氧基乙氧基)乙基}胺、三{2-(1-乙氧基丙氧基)乙基}胺、三[2-{2-(2-羥乙氧基)乙氧基}乙基] 胺、三乙醇胺三乙酸酯等,又以三乙醇胺三乙酸酯為佳。 Other aliphatic amines, for example, tris(2-methoxymethoxyethyl)amine, tris{2-(2-methoxyethoxy)ethyl}amine, tris{2-(2-methoxy Ethylethoxymethoxy)ethyl}amine, tris{2-(1-methoxyethoxy)ethyl}amine, tris{2-(1-ethoxyethoxy)ethyl}amine , three {2-(1-ethoxypropoxy)ethyl}amine, tris[2-{2-(2-hydroxyethoxy)ethoxy}ethyl] Amine, triethanolamine triacetate, etc., and triethanolamine triacetate are preferred.

芳香族胺,例如,苯胺、吡啶、4-二甲胺基吡啶、吡咯、吲哚、吡唑、咪唑或該些衍生物、二苯胺、三苯胺、三苄胺、2,6-二異丙基苯胺、N-tert-丁氧基羰基吡咯啶等。 Aromatic amines, for example, aniline, pyridine, 4-dimethylaminopyridine, pyrrole, hydrazine, pyrazole, imidazole or such derivatives, diphenylamine, triphenylamine, tribenzylamine, 2,6-diisopropyl Aniline, N-tert-butoxycarbonylpyrrolidine, and the like.

(D’)成份,可單獨使用亦可、將2種以上組合使用亦可。 The (D') component may be used singly or in combination of two or more.

(D’)成份,相對於(A)成份100質量份,通常為使用0.01~5.0質量份之範圍。於上述範圍內時,可提高光阻圖型形狀、存放之經時安定性等。 The component (D') is usually in the range of 0.01 to 5.0 parts by mass based on 100 parts by mass of the component (A). When it is in the above range, the shape of the resist pattern, the stability over time of storage, and the like can be improved.

[(E)成份] [(E) ingredients]

光阻組成物中,為防止感度劣化,或提高光阻圖型形狀、存放之經時安定性等目的,可含有由有機羧酸,及磷之含氧酸及其衍生物所成之群所選出之至少1種的化合物(E)(以下,亦稱為「(E)成份」)。 The photoresist composition may contain a group of organic carboxylic acids and phosphorus oxyacids and derivatives thereof for the purpose of preventing sensitivity deterioration, improving the shape of the photoresist pattern, and the stability over time of storage. At least one compound (E) (hereinafter also referred to as "(E) component)) is selected.

有機羧酸,例如,以乙酸、丙二酸、檸檬酸、蘋果酸、琥珀酸、苯甲酸、水楊酸等為佳。 The organic carboxylic acid is preferably, for example, acetic acid, malonic acid, citric acid, malic acid, succinic acid, benzoic acid, salicylic acid or the like.

磷之含氧酸,例如,磷酸、膦酸、次膦酸等,又,該些之中又以膦酸為特佳。 Phosphorus oxyacids, for example, phosphoric acid, phosphonic acid, phosphinic acid, etc., and among these, phosphonic acid is particularly preferred.

磷之含氧酸的衍生物,例如,上述含氧酸之氫原子被烴基所取代之酯等,前述烴基例如,碳數1~5之烷基、碳數6~15之芳基等。 The derivative of the oxyacid of phosphorus, for example, an ester in which the hydrogen atom of the oxyacid is substituted with a hydrocarbon group, and the hydrocarbon group is, for example, an alkyl group having 1 to 5 carbon atoms or an aryl group having 6 to 15 carbon atoms.

磷酸之衍生物,例如,磷酸二-n-丁酯、磷酸二苯酯等 磷酸酯等。 Derivatives of phosphoric acid, for example, di-n-butyl phosphate, diphenyl phosphate, etc. Phosphate esters, etc.

膦酸之衍生物,例如,膦酸二甲酯、膦酸-二-n-丁酯、苯基膦酸、膦酸二苯酯、膦酸二苄酯等膦酸酯等。 A derivative of a phosphonic acid, for example, a phosphonate such as dimethyl phosphonate, di-n-butyl phosphonate, phenylphosphonic acid, diphenyl phosphonate or dibenzyl phosphonate.

次膦酸之衍生物,例如,苯基次膦酸等次膦酸酯等。 A derivative of phosphinic acid, for example, a phosphinate such as phenylphosphinic acid.

(E)成份,可單獨使用1種亦可,或將2種以上合併使用亦可。 The component (E) may be used singly or in combination of two or more.

(E)成份,以有機羧酸為佳,以水楊酸為特佳。 (E) Ingredients, organic carboxylic acids are preferred, and salicylic acid is preferred.

(E)成份,相對於(A)成份100質量份,為使用0.01~5.0質量份之比例。 The component (E) is used in an amount of 0.01 to 5.0 parts by mass based on 100 parts by mass of the component (A).

本發明之光阻組成物中,可再配合期待之目的,適當地添加含有具有混合性之添加劑,例如改善光阻膜之性能所添加之樹脂、提高塗佈性之目的所添加之界面活性劑、溶解抑制劑、可塑劑、安定劑、著色劑、抗暈劑、染料等。 In the photoresist composition of the present invention, a surfactant containing a mixture of additives such as a resin added to improve the performance of the photoresist film and a coating property for improving the coating property may be appropriately added in combination with the intended purpose. , dissolution inhibitors, plasticizers, stabilizers, colorants, antihalation agents, dyes, and the like.

[(S)成份] [(S) ingredients]

光阻組成物,可將添加於光阻組成物之成份溶解於有機溶劑(以下,亦稱為「(S)成份」)之方予以製造。 The photoresist composition can be produced by dissolving a component added to the photoresist composition in an organic solvent (hereinafter also referred to as "(S) component").

(S)成份,只要可溶解所使用之各成份,形成均勻之溶液者即可,其可由以往作為化學增幅型光阻之溶劑的公知成份中,適當地選擇使用1種或2種以上任意之成份。 The (S) component is not particularly limited as long as it can dissolve the components to be used, and a suitable solution can be used as the solvent of the conventional chemically amplified resist, and one or two or more of them can be appropriately selected. Ingredients.

(S)成份,例如,γ-丁內酯等內酯類;丙酮、甲基乙基酮、環己酮、甲基-n-己酮、甲基異己酮、2-庚酮等酮 類;乙二醇、二乙二醇、丙二醇、二丙二醇等多元醇類;乙二醇單乙酸酯、二乙二醇單乙酸酯、丙二醇單乙酸酯,或二丙二醇單乙酸酯等具有酯鍵結之化合物,前述多元醇類或前述具有酯鍵結之化合物之單甲醚、單乙基醚、單丙基醚、單丁基醚等單烷基醚或單苯醚等具有醚鍵結之化合物等多元醇類之衍生物[該些之中,又以丙二醇單甲醚乙酸酯(PGMEA)、丙二醇單甲醚(PGME)為佳];二噁烷等環式醚類,或乳酸甲酯、乳酸乙酯(EL)、乙酸甲酯、乙酸乙酯、乙酸丁酯、丙酮酸甲酯、丙酮酸乙酯、甲氧基丙酸甲酯、乙氧基丙酸乙酯等酯類;茴香醚、乙基苄醚、甲苯酚基甲醚、二苯醚、二苄醚、苯乙醚、丁基苯醚、乙基苯、二乙基苯、戊基苯、異丙基苯、甲苯、二甲苯、異丙苯、三甲苯等芳香族系有機溶劑等。 (S) components, for example, lactones such as γ-butyrolactone; ketones such as acetone, methyl ethyl ketone, cyclohexanone, methyl-n-hexanone, methyl isohexanone, and 2-heptanone Polyols such as ethylene glycol, diethylene glycol, propylene glycol, dipropylene glycol; ethylene glycol monoacetate, diethylene glycol monoacetate, propylene glycol monoacetate, or dipropylene glycol monoacetate a compound having an ester bond, a polyalkylene or a monoalkyl ether such as monoethyl ether, monoethyl ether, monopropyl ether or monobutyl ether or a monophenyl ether having the above ester-bonded compound a derivative of a polyol such as an ether-bonded compound [in which propylene glycol monomethyl ether acetate (PGMEA) or propylene glycol monomethyl ether (PGME) is preferred]; a cyclic ether such as dioxane , or methyl lactate, ethyl lactate (EL), methyl acetate, ethyl acetate, butyl acetate, methyl pyruvate, ethyl pyruvate, methyl methoxypropionate, ethyl ethoxy propionate Ester, anisole, ethyl benzyl ether, cresyl methyl ether, diphenyl ether, dibenzyl ether, phenethyl ether, butyl phenyl ether, ethyl benzene, diethyl benzene, pentyl benzene, isopropyl An aromatic organic solvent such as benzene, toluene, xylene, cumene or trimethylbenzene.

(S)成份,可單獨使用,或以2種以上之混合溶劑之方式使用亦可。 The (S) component may be used singly or in combination of two or more.

其中,又以γ-丁內酯、丙二醇單甲醚乙酸酯(PGMEA)、丙二醇單甲醚(PGME)、乳酸乙酯(EL)為佳。 Among them, γ-butyrolactone, propylene glycol monomethyl ether acetate (PGMEA), propylene glycol monomethyl ether (PGME), and ethyl lactate (EL) are preferred.

又,PGMEA與極性溶劑混合所得之混合溶劑亦佳。其添加比(質量比),可於考量PGMEA與極性溶劑之相溶性等之後作適當之決定即可,以1:9~9:1之範圍內為佳,以2:8~8:2之範圍內為更佳。 Further, a mixed solvent obtained by mixing PGMEA with a polar solvent is also preferable. The addition ratio (mass ratio) can be appropriately determined after considering the compatibility of PGMEA with a polar solvent, and preferably in the range of 1:9 to 9:1, and 2:8 to 8:2. The range is better.

更具體而言,添加作為極性溶劑之EL的情形,PGMEA:EL之質量比,較佳為1:9~9:1,更佳為2:8 ~8:2。又,添加作為極性溶劑之PGME的情形,PGMEA:PGME之質量比,較佳為1:9~9:1,更佳為2:8~8:2,更佳為3:7~7:3。 More specifically, in the case of adding EL as a polar solvent, the mass ratio of PGMEA:EL is preferably 1:9 to 9:1, more preferably 2:8. ~8:2. Further, in the case of adding PGME as a polar solvent, the mass ratio of PGMEA:PGME is preferably 1:9 to 9:1, more preferably 2:8 to 8:2, still more preferably 3:7 to 7:3. .

又,(S)成份,其他例如,可使用由PGMEA與EL之中所選出之至少1種與γ-丁內酯所得之混合溶劑亦佳。該情形中,混合比例,依前者與後者之質量比,較佳為70:30~95:5。 Further, as the (S) component, for example, a mixed solvent obtained by at least one selected from PGMEA and EL and γ-butyrolactone may be preferably used. In this case, the mixing ratio is preferably 70:30 to 95:5 in terms of the mass ratio of the former to the latter.

又,(S)成份,其他例如,PGMEA與環己酮之混合溶劑,或PGMEA與PGME與環己酮之混合溶劑亦佳。該情形中,前者之混合比例之較佳者為,以質量比為PGMEA:環己酮=95~5:10~90,後者之混合比例之較佳者,依質量比為PGMEA:PGME:環己酮=35~55:25~45:10~30。 Further, the (S) component may be, for example, a mixed solvent of PGMEA and cyclohexanone, or a mixed solvent of PGMEA and PGME and cyclohexanone. In this case, the mixing ratio of the former is preferably, the mass ratio is PGMEA: cyclohexanone = 95 to 5: 10 to 90, and the mixing ratio of the latter is preferred, and the mass ratio is PGMEA: PGME: ring. Hexanone = 35~55:25~45:10~30.

依本發明之內容,可得到一種可提高對基板等支撐體之密著性及微影蝕刻特性,且,降低浮渣之發生的光阻組成物。 According to the present invention, it is possible to obtain a photoresist composition which can improve the adhesion to the support such as a substrate and the lithographic etching property, and reduce the occurrence of scum.

可得到上述效果之理由仍未明瞭,但推測因具有具一級或二級之醇性羥基,或鏈狀之三級醇性羥基的結構單位(c0),故可使作為極性基之該醇性羥基強固地鍵結於基板等支撐體,而使光阻組成物不易由顯影液等剝離(提升密著性)。又,提升密著性時,則可降低因剝離之光阻組成物所產生之浮渣的發生,而提高微影蝕刻特性。 The reason why the above effects can be obtained is still unclear, but it is presumed that the structural unit (c0) having a primary or secondary alcoholic hydroxyl group or a chain-like tertiary alcoholic hydroxyl group can be used as a polar group. The hydroxyl group is strongly bonded to a support such as a substrate, and the photoresist composition is less likely to be peeled off by the developer or the like (lifting adhesion). Further, when the adhesion is improved, the occurrence of scum due to the peeled photoresist composition can be reduced, and the lithographic etching characteristics can be improved.

此外,本發明之光阻組成物,因含有(D)成份,故可使酸擴散至未曝光部之情形受到抑制,且於曝光部中, 因該(D)成份失去抑制能力,故可提高曝光部與未曝光部間酸濃度的反差,而使微影蝕刻特性或圖型形狀更為優良。又,推測反差之提高亦期待可降低浮渣之發生。 Further, since the photoresist composition of the present invention contains the component (D), the acid can be diffused to the unexposed portion, and in the exposed portion, Since the component (D) loses its ability to suppress, the contrast of the acid concentration between the exposed portion and the unexposed portion can be increased, and the lithographic etching property or the pattern shape can be further improved. Moreover, it is expected that the increase in contrast is also expected to reduce the occurrence of scum.

≪光阻圖型之形成方法≫ How to form a photoresist pattern?

使用上述光阻組成物,例如,依以下之光阻圖型之形成方法,即可形成光阻圖型。 The photoresist pattern can be formed by using the above-described photoresist composition, for example, according to the formation method of the photoresist pattern below.

首先將前述光阻組成物使用旋轉塗佈器等塗佈於支撐體上,於80~150℃之溫度條件下,施以40~120秒鐘,較佳為60~90秒鐘之預燒焙(Post Apply Bake(PAB)),再將其例如使用電子線描繪機等,將電子線(EB)介由所期待之遮罩圖型進行選擇性曝光後,於80~150℃之溫度條件下施以40~120秒鐘,較佳為60~90秒鐘之PEB(曝光後加熱)。隨後,將其進行顯影處理。 First, the photoresist composition is applied onto a support using a spin coater or the like, and subjected to pre-baking at a temperature of 80 to 150 ° C for 40 to 120 seconds, preferably 60 to 90 seconds. (Post Apply Bake (PAB)), for example, using an electron beam drawing machine, etc., selectively exposing the electron beam (EB) to the desired mask pattern, and then operating at 80 to 150 ° C. Apply PEB (heating after exposure) for 40 to 120 seconds, preferably 60 to 90 seconds. Subsequently, it is subjected to development processing.

鹼顯影製程之情形為,使用鹼顯影液,例如0.1~10質量%氫氧化四甲基銨(TMAH)水溶液進行鹼顯影處理。 In the case of the alkali developing process, an alkali developing solution, for example, an aqueous solution of 0.1 to 10% by mass of tetramethylammonium hydroxide (TMAH) is used for alkali development treatment.

又,溶劑顯影製程之情形,為使用有機溶劑進行顯影處理。該有機溶劑,只要為可溶解(A)成份(曝光前之(A)成份)者即可,其可由公知之有機溶劑中,適當地選擇使用。具體而言,例如,酮系溶劑、酯系溶劑、醇系溶劑、醯胺系溶劑、醚系溶劑等極性溶劑、烴系溶劑等,其中,又以酯系溶劑為佳。酯系溶劑,以乙酸丁酯為佳。如上所述般,本發明之光阻組成物,於接觸孔穴圖型形成 中,作為重複使用之溶劑顯影製程用負型光阻組成物之際,可有效地防止該接觸孔穴圖型形成逆錐體狀,故以使用於溶劑顯影製程中為佳。 Further, in the case of the solvent developing process, development treatment is carried out using an organic solvent. The organic solvent is not particularly limited as long as it can dissolve the component (A) (component (A) before exposure), and can be appropriately selected from known organic solvents. Specifically, for example, a ketone solvent, an ester solvent, an alcohol solvent, a guanamine solvent, a polar solvent such as an ether solvent, a hydrocarbon solvent, or the like, and an ester solvent is preferable. The ester solvent is preferably butyl acetate. As described above, the photoresist composition of the present invention is formed in a contact hole pattern In the case of a negative resist composition for a solvent developing process which is repeatedly used, the contact hole pattern can be effectively prevented from forming an inverse pyramid shape, and therefore it is preferably used in a solvent developing process.

顯影處理後,較佳為進行洗滌處理。鹼顯影製程後之情形,以使用純水進行水洗滌為佳。溶劑顯影製程後之情形,以使用含有上述所列舉之有機溶劑作為洗滌液為佳。 After the development treatment, it is preferred to carry out a washing treatment. In the case of the alkali development process, it is preferred to use pure water for water washing. In the case of the solvent developing process, it is preferred to use the organic solvent described above as the washing liquid.

其後進行乾燥。又,依情況之不同,可於上述顯影處理後再進行燒焙處理(後燒焙;PostBake)。依此方式,即可製得忠實於遮罩圖型之光阻圖型。 It is then dried. Further, depending on the case, the baking treatment may be performed after the above development treatment (post-baking; PostBake). In this way, a photoresist pattern that is faithful to the mask pattern can be produced.

支撐體,並未有特別之限定,其可使用以往公知之物質,例如,電子零件用之基板,或於其上形成特定配線圖型者等例示。更具體而言,例如,矽晶圓、銅、鉻、鐵、鋁等金屬製之基板,或玻璃基板等。配線圖型之材料,例如可使用銅、鋁、鎳、金等。又,使用本發明之光阻組成物時,即使於具有數十~數百nm左右的高段差的段差基板上,也可形成具有優良微影蝕刻特性、密著性,且不具有浮渣之圖型,故亦可使用於作為基板之段差基板上。 The support is not particularly limited, and a conventionally known one can be used, for example, a substrate for an electronic component, or a person who forms a specific wiring pattern thereon. More specifically, for example, a substrate made of a metal such as germanium wafer, copper, chromium, iron, or aluminum, or a glass substrate. As the material of the wiring pattern, for example, copper, aluminum, nickel, gold, or the like can be used. Moreover, when the photoresist composition of the present invention is used, even on a stepped substrate having a high step of about several tens to several hundreds of nm, excellent lithographic etching characteristics and adhesion can be formed without scumming. The pattern can also be used on a stepped substrate as a substrate.

又,支撐體亦可為於上述之基板上,設有無機系及/或有機系之膜者。無機系之膜,例如,無機抗反射膜(無機BARC)等。有機系之膜,例如,有機抗反射膜(有機BARC)等。 Further, the support may be provided with an inorganic or/or organic film on the substrate. An inorganic film, for example, an inorganic antireflection film (inorganic BARC) or the like. Organic film, for example, organic anti-reflective film (organic BARC).

曝光所使用之波長,並未有特別之限定,其可使用ArF準分子雷射、KrF準分子雷射、F2準分子雷射、EUV(極紫外線)、VUV(真空紫外線)、EB(電子線)、X 線、軟X線等輻射線進行。 The wavelength used for the exposure is not particularly limited, and an ArF excimer laser, a KrF excimer laser, an F2 excimer laser, an EUV (very ultraviolet ray), a VUV (vacuum ultraviolet ray), an EB (electron line) can be used. ), X Radiation lines such as lines and soft X lines are used.

本發明之光阻組成物,對於KrF準分子雷射、ArF準分子雷射、EB或EUV為更有效,對ArF準分子雷射特別有效。 The photoresist composition of the present invention is more effective for KrF excimer lasers, ArF excimer lasers, EB or EUV, and is particularly effective for ArF excimer lasers.

光阻膜之曝光,可為於空氣或氮氣等惰性氣體中進行之通常曝光(乾式曝光)亦可、浸潤式曝光亦可。 The exposure of the photoresist film may be a normal exposure (dry exposure) or an immersion exposure in an inert gas such as air or nitrogen.

浸潤式曝光係指於曝光時,在以往充滿空氣或氮氣等惰性氣體之透鏡與晶圓上之光阻膜之間的部份,充滿具有折射率較空氣之折射率為大之溶劑(浸潤介質)的狀態下進行曝光。 Infiltrating exposure refers to a portion of a lens that is filled with an inert gas such as air or nitrogen and a photoresist film on a wafer during exposure, and is filled with a solvent having a refractive index higher than that of air (infiltration medium). Exposure is performed in the state of ).

更具體而言,浸潤式曝光為,於依上述方式所得之光阻膜與曝光裝置之最下位置的透鏡間,充滿折射率較空氣之折射率為更大之溶劑(浸潤介質),並於該狀態下,介由所期待之遮罩圖型進行曝光(浸潤式曝光)之方式予以實施。 More specifically, the immersion exposure is such that, between the photoresist film obtained in the above manner and the lens at the lowest position of the exposure device, a solvent (infiltration medium) having a refractive index greater than that of air is filled. In this state, exposure (immersion exposure) is performed by the desired mask pattern.

浸潤介質,以具有較空氣之折射率為大,且較依該浸潤式曝光進行曝光之光阻膜所具有之折射率為小之折射率的溶劑為佳。該溶劑之折射率,只要為前述範圍內時,並未有特別之限制。 The immersion medium is preferably a solvent having a refractive index larger than that of air and having a refractive index smaller than that of the resist film exposed by the immersion exposure. The refractive index of the solvent is not particularly limited as long as it is within the above range.

具有較空氣之折射率為大,且較光阻膜之折射率為小之折射率的溶劑,例如,水、氟系惰性液體、矽系溶劑、烴系溶劑等。 A solvent having a refractive index larger than that of air and having a refractive index smaller than that of the photoresist film, for example, water, a fluorine-based inert liquid, an oxime-based solvent, a hydrocarbon-based solvent, or the like.

氟系惰性液體之具體例,例如,以C3HCl2F5、C4F9OCH3、C4F9OC2H5、C5H3F7等氟系化合物為主成份之 液體等,又以沸點為70~180℃者為佳,以80~160℃者為佳。氟系惰性液體為具有上述範圍之沸點之液體時,於曝光結束後,可以簡便之方法去除浸潤時所使用之介質,而為更佳。 Specific examples of the fluorine-based inert liquid include, for example, a liquid containing a fluorine-based compound such as C 3 HCl 2 F 5 , C 4 F 9 OCH 3 , C 4 F 9 OC 2 H 5 or C 5 H 3 F 7 as a main component. It is better to have a boiling point of 70 to 180 ° C, and preferably 80 to 160 ° C. When the fluorine-based inert liquid is a liquid having a boiling point within the above range, it is more preferable to remove the medium used for the wetting in a simple manner after the completion of the exposure.

氟系惰性液體,特別是以烷基之全部氫原子被氟原子所取代之全氟烷基化合物為佳。全氟烷基,具體而言,例如,可列舉全氟烷基醚化合物或全氟烷胺化合物等。 The fluorine-based inert liquid is particularly preferably a perfluoroalkyl compound in which all hydrogen atoms of the alkyl group are replaced by fluorine atoms. Specific examples of the perfluoroalkyl group include a perfluoroalkyl ether compound or a perfluoroalkylamine compound.

更具體而言,前述全氟烷基醚化合物,可例如全氟(2-丁基-四氫呋喃)(沸點102℃),前述全氟烷胺化合物,可例如全氟三丁胺(沸點174℃)。 More specifically, the perfluoroalkyl ether compound may, for example, be perfluoro(2-butyl-tetrahydrofuran) (boiling point: 102 ° C), and the perfluoroalkylamine compound may be, for example, perfluorotributylamine (boiling point: 174 ° C). .

浸潤介質,就費用、安全性、環境問題、廣用性等觀點,以使用水為佳。 Infiltration of the medium, in terms of cost, safety, environmental issues, and versatility, it is preferred to use water.

[實施例] [Examples]

其次,將以實施例對本發明作更詳細之說明,但本發明並非受該些例示所限定者。 In the following, the invention will be described in more detail by way of examples, but the invention is not limited by the examples.

[實施例1~3、比較例1~2] [Examples 1 to 3, Comparative Examples 1 to 2]

將表1所示各成份混合、溶解,以製作正型之光阻組成物。 The components shown in Table 1 were mixed and dissolved to prepare a positive photoresist composition.

表1中之各簡稱具有以下之意義。又,[ ]內之數值為添加量(質量份)。 Each of the abbreviations in Table 1 has the following meanings. Further, the value in [ ] is the added amount (parts by mass).

(A)-1:下述高分子化合物(A)-1[l/m/n=40/40/20(莫耳比)、Mw=8000、Mw/Mn=1.67]。 (A)-1: The following polymer compound (A)-1 [l/m/n = 40/40/20 (mole ratio), Mw = 8000, Mw/Mn = 1.67].

(B)-1:下述化合物(B)-1。 (B)-1: The following compound (B)-1.

(B)-2:下述化合物(B)-2。 (B)-2: The following compound (B)-2.

(C)-1:下述高分子化合物(C)-0[l/m=60/40(莫耳比)、Mw=100,000、Mw/Mn=242]。 (C)-1: The following polymer compound (C)-0 [l/m = 60/40 (mole ratio), Mw = 100,000, Mw/Mn = 242].

(D)-1:下述化合物(D)-1。 (D)-1: The following compound (D)-1.

(D)-2:下述化合物(D)-2。 (D)-2: The following compound (D)-2.

(D)-3:下述化合物(D)-3。 (D)-3: The following compound (D)-3.

(D’)-4:三-n-戊胺。 (D')-4: Tri-n-pentylamine.

(E)-1:水楊酸。 (E)-1: Salicylic acid.

(S)-1:PGMEA/PGME=60/40(質量比)之混合溶劑。 (S)-1: a mixed solvent of PGMEA/PGME=60/40 (mass ratio).

[光阻圖型之形成1] [Formation of photoresist pattern 1]

將上述光阻組成物分別使用旋轉塗佈器塗佈於8英吋矽基板上,於熱板上以130℃、60秒鐘之條件進行預燒焙(PAB)處理、乾燥結果,形成膜厚240nm之光阻膜。 The photoresist composition was applied onto a 8-inch substrate using a spin coater, and subjected to pre-baking (PAB) treatment on a hot plate at 130 ° C for 60 seconds to form a film thickness. 240 nm photoresist film.

其次,對前述光阻膜,使用ArF曝光裝置NSR-S308F(Nikon公司製;NA(開口數)=0.80,σ=0.85),將ArF準分子雷射(193nm)介由遮罩圖型進行選擇性照 射。隨後,以110℃、60秒鐘之條件進行曝光後加熱(PEB)處理,再於23℃下,使用2.38質量%氫氧化四甲基銨(TMAH)水溶液NMD-3(東京應化工業股份有限公司製)以30秒鐘之條件下進行顯影,其後以30秒鐘使用純水進行水洗滌,進行振動乾燥後,進行100℃、45秒鐘之後燒焙。 Next, an ArF exposure apparatus NSR-S308F (manufactured by Nikon Corporation; NA (number of openings) = 0.80, σ = 0.85) was used for the above-mentioned photoresist film, and an ArF excimer laser (193 nm) was selected through a mask pattern. Sexual photo Shoot. Subsequently, post-exposure heating (PEB) treatment was carried out at 110 ° C for 60 seconds, and at 23 ° C, 2.38 mass% aqueous solution of tetramethylammonium hydroxide (TMAH) was used. NMD-3 (Tokyo Yinghua Industrial Co., Ltd.) The company was developed under the conditions of 30 seconds, and then washed with pure water for 30 seconds, vibrated and dried, and then baked at 100 ° C for 45 seconds.

其結果得知,實施例1~3及比較例1中,於前述光阻膜上,形成線路寬度160nm、間距320nm之1:1線路與空間(LS)圖型(具有良好密著性)。另一方面,比較例2中,因顯影時光阻膜由基板剝離,而未能形成圖型(密著性惡化)。結果以「密著性」記載於表2之中。 As a result, in Examples 1 to 3 and Comparative Example 1, a 1:1 line and a space (LS) pattern having a line width of 160 nm and a pitch of 320 nm (having good adhesion) were formed on the photoresist film. On the other hand, in Comparative Example 2, the photoresist film was peeled off from the substrate during development, and the pattern was not formed (adhesion deteriorated). The results are shown in Table 2 as "adhesiveness".

又,於施以110℃、25秒鐘之六甲基二矽胺烷(HMDS)處理後,依圖型形成1相同之操作進行LS圖型之形成,於形成上述線路寬度160nm之1:1 LS圖型之際的最佳曝光量中,進行線路寬度140nm、間距280nm之1:1 LS圖型之形成。其結果得知,實施例1~3中,有形成線路寬度140nm之1:1 LS圖型,另一方面,比較例1則未能形成圖型。其結果以「解析性」記載於表2之中。 Further, after the treatment with hexamethyldioxane (HMDS) at 110 ° C for 25 seconds, the formation of the LS pattern was carried out according to the same operation as the pattern formation, and the formation of the above-mentioned line width of 161 nm was 1:1. In the optimum exposure amount at the time of the LS pattern, a 1:1 LS pattern having a line width of 140 nm and a pitch of 280 nm was formed. As a result, in Examples 1 to 3, a 1:1 LS pattern having a line width of 140 nm was formed, and on the other hand, Comparative Example 1 failed to form a pattern. The results are shown in Table 2 as "analytical".

由表2之結果得知,實施例1~3之光阻組成物,與比較例2之光阻組成物相比較時,因具有良好之密著性, 故可形成光阻圖型。又,實施例1~3之光阻組成物,與比較例1之光阻組成物相比較時,確認具有優良解析性等微影蝕刻特性。 From the results of Table 2, it was found that the photoresist compositions of Examples 1 to 3 had good adhesion when compared with the photoresist composition of Comparative Example 2. Therefore, a photoresist pattern can be formed. Further, when the photoresist compositions of Examples 1 to 3 were compared with the photoresist composition of Comparative Example 1, it was confirmed that the photoresist etching characteristics such as excellent resolution were obtained.

[實施例4、比較例3] [Example 4, Comparative Example 3]

將表3所示各成份混合、溶解,以製作正型之光阻組成物。 The components shown in Table 3 were mixed and dissolved to prepare a positive photoresist composition.

表3中之各簡稱中,(B)-2、(C)-1、(D)-1、(D’)-4、(E)-1、(S)-1分別與前述為相同之內容。又,[ ]內之數值為添加量(質量份)。 In each of the abbreviations in Table 3, (B)-2, (C)-1, (D)-1, (D')-4, (E)-1, (S)-1 are the same as the above. content. Further, the value in [ ] is the added amount (parts by mass).

(A)-2:l/m/n/o=5/40/40/15(莫耳比)、Mw=5000、Mw/Mn=1.69之下述高分子化合物(A)-0。 (A)-2: l/m/n/o=5/40/40/15 (mole ratio), Mw=5000, Mw/Mn=1.69, the following polymer compound (A)-0.

(B)-3:下述化合物(B)-3。 (B)-3: The following compound (B)-3.

[光阻圖型之形成2] [Formation of photoresist pattern 2]

將上述光阻組成物分別使用旋轉塗佈器塗佈於施以90℃、36秒鐘之六甲基二矽胺烷(HMDS)處理的8英吋矽段差基板上,於熱板上,比較例3以130℃、實施例4以140℃、60秒鐘之條件下進行預燒焙(PAB)處理,經乾燥結果,形成膜厚333nm之光阻膜。段差基板為使用基板表面形成線路寬度160nm、間距320nm之線路狀的段差圖型(段差高:300nm)之基板。 The photoresist compositions were applied to a 8-inch step substrate treated with hexamethyldioxane (HMDS) at 90 ° C for 36 seconds using a spin coater, and compared on a hot plate. In Example 3, prebaking (PAB) treatment was carried out at 130 ° C in Example 4 at 140 ° C for 60 seconds, and as a result of drying, a photoresist film having a film thickness of 333 nm was formed. The step substrate is a substrate having a line-shaped step pattern (high step: 300 nm) having a line width of 160 nm and a pitch of 320 nm on the surface of the substrate.

其次,使用ArF曝光裝置NSR-S308F(Nikon公司製;NA(開口數)=0.75,σ=0.60),以ArF準分子雷射(193nm)介由具有段差的線路圖型與遮罩圖型為垂直交叉配置之遮罩圖型,對前述光阻膜進行選擇性照射。隨後,以115℃、60秒鐘之條件進行曝光後加熱(PEB)處理, 再於23℃下,使用2.38質量%氫氧化四甲基銨(TMAH)水溶液NMD-3(東京應化工業股份有限公司製)以30秒鐘之條件進行顯影,其後再以30秒鐘、使用純水進行水洗滌,進行振動乾燥後,進行100℃、45秒鐘之後燒焙。 Next, an ArF exposure apparatus NSR-S308F (manufactured by Nikon Corporation; NA (number of openings) = 0.75, σ = 0.60) was used, and an ArF excimer laser (193 nm) was used to have a line pattern and a mask pattern having a step difference. The mask pattern of the vertical cross configuration selectively irradiates the photoresist film. Subsequently, post-exposure heating (PEB) treatment was performed at 115 ° C for 60 seconds. Further, at 23 ° C, development was carried out for 30 seconds using a 2.38 mass% aqueous solution of tetramethylammonium hydroxide (TMAH) in NMD-3 (manufactured by Tokyo Ohka Kogyo Co., Ltd.), followed by 30 seconds. The mixture was washed with water using pure water, vibrated and dried, and then baked at 100 ° C for 45 seconds.

其結果得知,無論任一例示中,前述光阻膜皆形成有線路寬度200nm、間距400nm之1:1線路與空間(LS)圖型(具有良好密著性)。 As a result, in any of the examples, the photoresist film was formed with a 1:1 line and space (LS) pattern having a line width of 200 nm and a pitch of 400 nm (having good adhesion).

[顯影缺陷之評估] [Evaluation of development defects]

使用測長SEM(日立製作所公司製,製品名:S-9220)對依上述方法所得之350nm之1:1 LS圖型,以目視方式觀察其照片之表面顯影缺陷。並依以下之基準進行評估,結果係如表2所示。 The surface development defect of the photograph was visually observed by using a length measuring SEM (manufactured by Hitachi, Ltd., product name: S-9220) on a 1:1 LS pattern of 350 nm obtained by the above method. The evaluation was carried out on the basis of the following criteria, and the results are shown in Table 2.

◎:目視觀察未發現顯影缺陷。 ◎: No development defects were observed by visual observation.

×:目視觀察發現顯影缺陷。 ×: Development defects were observed by visual observation.

由表4之結果得知,實施例4之光阻組成物,與比較例3之光阻組成物相比較時,確認具有較少之顯影缺陷。 As is apparent from the results of Table 4, when the photoresist composition of Example 4 was compared with the photoresist composition of Comparative Example 3, it was confirmed that there were few development defects.

[實施例5、比較例4] [Example 5, Comparative Example 4]

將表5所示各成份混合、溶解,以製作正型之光阻組成物。 The components shown in Table 5 were mixed and dissolved to prepare a positive photoresist composition.

表5中之各簡稱中,(C)-1、(D)-1、(E)-1、(S)-1分別與前述為相同之內容,其他者分別具有以下之意義。又,[ ]內之數值為添加量(質量份)。 In each of the abbreviations in Table 5, (C)-1, (D)-1, (E)-1, and (S)-1 are the same as the above, and the others have the following meanings. Further, the value in [ ] is the added amount (parts by mass).

(B)-4:下述化合物(B)-4。 (B)-4: The following compound (B)-4.

(A)-3:l/m/n/o=5/40/40/15(莫耳比)、Mw=14000、Mw/Mn=170之上述高分子化合物(A)-0。 (A)-3: The above polymer compound (A)-0 having l/m/n/o=5/40/40/15 (mole ratio), Mw=14000, and Mw/Mn=170.

(D’)-5:2,6-二異丙基苯胺。 (D')-5: 2,6-diisopropylaniline.

[光阻圖型之形成3] [Formation of photoresist pattern 3]

將上述光阻組成物分別使用旋轉塗佈器塗佈於施以90℃、36秒鐘之六甲基二矽胺烷(HMDS)處理的8英吋矽基板上,於熱板上以140℃、60秒鐘之條件進行預燒焙(PAB)處理,經乾燥結果,形成膜厚900nm之厚膜光阻膜。 The photoresist compositions were applied to an 8-inch substrate treated with hexamethyldioxane (HMDS) at 90 ° C for 36 seconds using a spin coater, and placed on a hot plate at 140 ° C. The pre-baking (PAB) treatment was carried out for 60 seconds, and as a result of drying, a thick film photoresist film having a film thickness of 900 nm was formed.

其次,使用ArF曝光裝置NSR-S308F(Nikon公司製;NA(開口數)=0.75,σ=0.95),以ArF準分子雷射,介由遮罩圖型對前述光阻膜進行選擇性照射。隨後,實施例5為以125℃、比較例4為以120℃、60秒鐘之條件進行曝光後加熱(PEB)處理,再於23℃下,使用2.38質量%氫氧化四甲基銨(TMAH)水溶液NMD-3(東京應化工 業股份有限公司製)以30秒鐘之條件進行顯影,其後以30秒鐘,使用純水進行水洗滌,進行振動乾燥後,進行100℃、45秒鐘之後燒焙。 Next, using the ArF exposure apparatus NSR-S308F (manufactured by Nikon Corporation; NA (number of openings) = 0.75, σ = 0.95), the resist film was selectively irradiated with a mask pattern by an ArF excimer laser. Subsequently, Example 5 was subjected to post-exposure heating (PEB) treatment at 125 ° C, Comparative Example 4 at 120 ° C for 60 seconds, and at 23 ° C, using 2.38 mass % tetramethylammonium hydroxide (TMAH). )Aqueous solution NMD-3 (Tokyo Chemical The product was developed under the conditions of 30 seconds, and then washed with water using pure water for 30 seconds, vibrated and dried, and then baked at 100 ° C for 45 seconds.

其結果得知,無論任一例示中之前述光阻膜上,皆形成有線路寬度300nm、間距600nm之1:1線路與空間(LS)圖型(具有良好之密著性)。密著性之結果係如表6所示。 As a result, it was found that the 1:1 line and space (LS) pattern (having good adhesion) having a line width of 300 nm and a pitch of 600 nm was formed on any of the photoresist films in any of the examples. The results of the adhesion are shown in Table 6.

[微影蝕刻特性評估] [Micro-etching characteristics evaluation]

使用測長SEM(日立製作所公司製,製品名:S-9220)對依上述方法所得之300nm之1:1 LS光阻圖型之照面進行觀察,確認圖型產生部份性剝離或線路形狀等。依以下基準之評估結果係如表6所示。 The 300 nm 1:1 LS photoresist pattern obtained by the above method was observed using a length measuring SEM (manufactured by Hitachi, Ltd., product name: S-9220), and it was confirmed that the pattern was partially peeled off or the shape of the line was generated. . The evaluation results based on the following benchmarks are shown in Table 6.

◎:高度矩形性、優良圖型形狀。 ◎: Highly rectangular shape and excellent pattern shape.

×:頭狀形狀,圖型形狀低劣。 ×: Head shape, the shape of the figure is inferior.

由表6之結果得知,實施例5之光阻組成物,與比較例4之光阻組成物相比較時,確認具有優良微影蝕刻特性。 As is apparent from the results of Table 6, when the photoresist composition of Example 5 was compared with the photoresist composition of Comparative Example 4, it was confirmed that it had excellent lithographic etching characteristics.

Claims (5)

一種光阻組成物,其特徵為,含有經由酸之作用而對顯影液之溶解性產生變化之基材成份(A)、經由曝光而產生酸之酸產生劑成份(B)、具有下述通式(c0)所表示之結構單位(c0)的高分子化合物(C),及含有由下述通式(d1)所表示之化合物(D1)、下述通式(d2)所表示之化合物(D2)及下述通式(d3)所表示之化合物(D3)所成之群所選出之1個以上之化合物的光反應型抑制劑(D), [式中,R表示氫原子、碳數1~5之烷基或碳數1~5之鹵化烷基,R1為具有1個以上之一級或二級之醇性羥基,或鏈狀之三級醇性羥基有機基] [式中,R3為可具有取代基之烴基,Z2c為可具有取代基之 碳數1~30之烴基,但,S為鄰接之碳上未被氟原子所取代者,R4為有機基,Y3為直鏈狀、支鏈狀或環狀之伸烷基或伸芳基,Rf0為烴基,Z+為各自獨立之鋶或錪陽離子]。 A photoresist composition comprising a substrate component (A) which changes solubility in a developing solution by an action of an acid, an acid generator component (B) which generates an acid by exposure, and has the following The polymer compound (C) of the structural unit (c0) represented by the formula (c0), and the compound (D1) represented by the following formula (d1) and the compound represented by the following formula (d2) ( a photoreactive inhibitor (D) of one or more selected from the group consisting of the compound (D3) represented by the following formula (d3), [wherein, R represents a hydrogen atom, an alkyl group having 1 to 5 carbon atoms or a halogenated alkyl group having 1 to 5 carbon atoms, and R 1 is an alcoholic hydroxyl group having one or more of the first or second order, or a chain of three Alcoholic hydroxyl organic group] Wherein R 3 is a hydrocarbon group which may have a substituent, and Z 2c is a hydrocarbon group having 1 to 30 carbon atoms which may have a substituent, but S is an adjacent carbon which is not substituted by a fluorine atom, and R 4 is an organic group. Further, Y 3 is a linear, branched or cyclic alkyl or aryl group, Rf 0 is a hydrocarbon group, and Z + is a separate ruthenium or osmium cation. 如請求項1之光阻組成物,其中,前述高分子化合物(C)尚具有含有經由酸之作用而增大極性之酸分解性基的結構單位(c1)。 The photo-resist composition of claim 1, wherein the polymer compound (C) further has a structural unit (c1) containing an acid-decomposable group which increases polarity by an action of an acid. 如請求項1或2之光阻組成物,其中,前述高分子化合物(C)之質量平均分子量為2萬~50萬。 The photoresist composition according to claim 1 or 2, wherein the polymer compound (C) has a mass average molecular weight of 20,000 to 500,000. 如請求項1之光阻組成物,其中,前述基材成份(A)為經由酸之作用而增大極性之樹脂成份(A1)。 The photoresist composition of claim 1, wherein the substrate component (A) is a resin component (A1) which increases polarity by an action of an acid. 一種光阻圖型之形成方法,其特徵為,包含於支撐體上,使用請求項1~4項中任一項之光阻組成物形成光阻膜之步驟、使前述光阻膜曝光之步驟,及使前述光阻膜顯影,以形成光阻圖型之步驟。 A method for forming a photoresist pattern, comprising the steps of forming a photoresist film using a photoresist composition according to any one of claims 1 to 4, and exposing the photoresist film to a support. And a step of developing the photoresist film to form a photoresist pattern.
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