TWI545320B - Percussion test fixture - Google Patents
Percussion test fixture Download PDFInfo
- Publication number
- TWI545320B TWI545320B TW101121620A TW101121620A TWI545320B TW I545320 B TWI545320 B TW I545320B TW 101121620 A TW101121620 A TW 101121620A TW 101121620 A TW101121620 A TW 101121620A TW I545320 B TWI545320 B TW I545320B
- Authority
- TW
- Taiwan
- Prior art keywords
- test
- circuit board
- tested
- controller
- tap
- Prior art date
Links
Landscapes
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
- Tests Of Electronic Circuits (AREA)
Description
本發明係關於一種測試治具,特別是一種自動控制進行敲擊測試之敲擊測試治具。 The present invention relates to a test fixture, and more particularly to a tap test fixture for automatically controlling a tap test.
印刷電路板(PRINTING CIRCUIT BOARD,PCB)為時下常見之電子零組件,其特色在於不透過外接之實體電線,插設於電路板之電子元件即可透過電路板上設計好之電路(layout)電性連接於其他電子元件,除了減少實體電路的設置以節省空間外,印刷電路板並可於製作前依照電子裝置內各電子元件之種類及電子裝置所欲實施之功能,進行電路邏輯設計及電路布局,再依據設計結果製作印刷電路板,因此可將印刷電路板之表面積在滿足客戶需求的功能要求下縮減到最小,以符合目前電子產品體積日趨微型化之趨勢。 PRINTING CIRCUIT BOARD (PCB) is a common electronic component nowadays. It is characterized in that it does not pass through external physical wires. The electronic components inserted in the circuit board can be laid through the circuit board. Electrically connected to other electronic components, in addition to reducing the physical circuit settings to save space, the printed circuit board can be designed according to the type of electronic components in the electronic device and the functions to be implemented by the electronic device before fabrication. The circuit layout, and then the printed circuit board according to the design results, can reduce the surface area of the printed circuit board to the minimum required to meet the customer's requirements, in order to meet the trend of the current miniaturization of electronic products.
此外,經由印刷製程可使印刷電路板可以大量的生產,藉以降低製作成本,更符合電子產業的經濟效益。由於具備上述之優點,印刷電路板於目前電子相關產業中,已經成為不可或缺之必要電子零組件,並且產業需求量極大。 In addition, the printed circuit board can be mass-produced through the printing process, thereby reducing the manufacturing cost and more in line with the economic benefits of the electronics industry. Due to the above advantages, printed circuit boards have become an indispensable electronic component in the current electronic related industry, and the industrial demand is extremely large.
印刷電路板的製作過程,如前所述在完成電路設計後,必須經過印刷、蝕刻、沖裁等加工手段產生電路圖形,並透過錫焊或銀焊等焊接技術將電子元件焊接於印刷電路板上,焊接的步驟可以經過表面貼焊(Surface Mount Technology SMT)或波峰焊(Wave soldering)來達成。然而,部分印刷電路板由於在製作過程中電路 定位不良或電路板變形,造成電子元件在焊接過程中吃錫度不夠一般稱為「空焊」,意即電子元件無法透過焊接與電路板緊密連接,因此電路板上之電子元件可能因為震盪、外力撞擊或其他因素而造成電子元件與電路板之間的接觸不良、短路,甚至是電子元件自電路板上脫落等問題。 The manufacturing process of the printed circuit board, as described above, after the circuit design is completed, the circuit pattern must be generated by printing, etching, punching, etc., and the electronic components are soldered to the printed circuit board through soldering techniques such as soldering or silver soldering. The soldering step can be achieved by Surface Mount Technology (SMT) or Wave soldering. However, some printed circuit boards are due to the circuit during the manufacturing process Poor positioning or deformation of the board, resulting in insufficient soldering of electronic components during soldering is generally referred to as "empty soldering", meaning that electronic components cannot be tightly connected to the board through soldering, so the electronic components on the board may be oscillating, External force impact or other factors cause poor contact between the electronic components and the circuit board, short circuit, and even the electronic components falling off the circuit board.
為避免此類空焊之瑕疵電路板銷售給客戶,電路板廠商在產品出廠前都必須進行敲擊檢測,以確保產品之品質。目前業界採用之敲擊檢測方法是透過測試人員以特製的膠棒直接敲打在印刷電路板背面的特定位置並持續一定次數後,再將此印刷電路板放入電子測試儀器進行電路檢測,以測試敲擊後之電路板是否有接觸不良或短路等現象,整個敲擊檢測程序完全仰賴人工作業,因此無法精確控制敲擊的力道、時間及位置的準確性。 In order to avoid the sale of such an empty soldering board to the customer, the board manufacturer must perform a tap test before the product leaves the factory to ensure the quality of the product. At present, the tapping detection method adopted by the industry is to directly test the specific position of the back surface of the printed circuit board by a special glue stick for a certain number of times, and then put the printed circuit board into an electronic test instrument for circuit detection to test Whether the circuit board after tapping has poor contact or short circuit, the entire tap detection program relies entirely on manual work, so the accuracy of the force, time and position of the tap cannot be accurately controlled.
此外,敲擊面積也因為人為的不可預測及不可控制的因素,而無法精準地控制在同一個點或是同一個面上,且極有可能因檢測人員的敲擊用力過度反而造成電路板損壞。同時,由於電路板的正面已電性配置裝設有多個電子元件,因此當進行敲擊測試時無法水平放置,導致在敲擊測試過程中,受測的電路板背面之受力點不均,亦可能影響敲擊測試的正確性。 In addition, the tapping area is also unpredictable and uncontrollable due to human factors, and cannot be precisely controlled at the same point or on the same surface, and it is highly probable that the board is damaged due to excessive force of the tester. . At the same time, since the front surface of the circuit board is electrically disposed with a plurality of electronic components, it cannot be horizontally placed when the tapping test is performed, resulting in uneven stress on the back side of the tested circuit board during the tapping test. It may also affect the correctness of the tap test.
鑒於以上的問題,本發明提供一種不用透過人力敲擊之敲擊測試治具,藉以解決習用以人工方式進行敲擊測試無法掌握敲擊力道及準確性,可能造成測試結果存在有過於顯著之誤差問題。 In view of the above problems, the present invention provides a tapping test fixture that does not need to be struck by human beings, so as to solve the problem that the tapping test can not be mastered by manual tapping test, and the test result may have an excessively significant error. problem.
本發明揭露一種敲擊測試治具,適用於一待測電路板,敲擊 測試治具包含有一基座及一敲擊組件,其中基座用以放置待測電路板於其上,敲擊組件包括一控制器及一動力組,動力組具有一動力源及一致動件,動力源電性連接於控制器,致動件則與動力源相連接,且敲擊器活動連接於致動件。在進行敲擊測試時,控制器發出一電性訊號令動力源啟動,動力源驅動致動件作動,以帶動敲擊器往復位移,並且敲擊器間歇敲擊待測電路板。 The invention discloses a tap test fixture suitable for a circuit board to be tested and tapped The test fixture comprises a base and a tapping component, wherein the base is used for placing the circuit board to be tested thereon, the tapping component comprises a controller and a power group, and the power pack has a power source and an actuating component. The power source is electrically connected to the controller, the actuating member is connected to the power source, and the striker is movably connected to the actuating member. During the tapping test, the controller sends an electrical signal to activate the power source, the power source drives the actuator to actuate to drive the striker to reciprocate, and the striker intermittently strikes the circuit board to be tested.
本發明之功效在於,敲擊測試治具的動力源依據控制器的啟動,驅動致動件作動,致動件則進一步帶動敲擊器往復位移,並間歇敲擊待測電路板,透過本發明之治具藉由機械控制的精準運作,可使敲擊測試的敲擊力度及敲擊次數標準化,以減少人為操作上的誤差,並可因應不同種類之電路板的敲擊測試標準,有效提高測試的精確性,並可降低檢測所需之工時。 The utility model has the advantages that the power source of the tap test fixture is driven by the actuation of the controller according to the activation of the controller, and the actuating member further drives the striker to reciprocate and intermittently taps the circuit board to be tested, through the invention. The precision control of the mechanical control allows the tapping force and the number of strokes of the tapping test to be standardized to reduce the error in human operation, and can effectively improve the tapping test standards of different types of circuit boards. The accuracy of the test and the time required for testing can be reduced.
有關本發明的特徵、實作與功效,茲配合圖式作最佳實施例詳細說明如下。 The features, implementations, and utilities of the present invention are described in detail below with reference to the drawings.
本發明所揭露各實施例之敲擊測試治具10適用於一待測電路板50,待測電路板50上有貫通的多個定位孔501,定位孔501的位置依據待測電路板50之種類及電性配置於待測電路板50上之電子元件的不同而變更位置,並不以本發明所揭露之各型態為限。 The tapping test fixture 10 of each embodiment of the present invention is applicable to a circuit board 50 to be tested. The circuit board 50 to be tested has a plurality of positioning holes 501 extending therethrough. The position of the positioning hole 501 depends on the circuit board 50 to be tested. The type and electrical position of the electronic component disposed on the circuit board 50 to be tested are different, and are not limited to the various types disclosed in the present invention.
在第一實施例中,請參考第1圖所示之立體示意圖,並請同時參考第2圖之測試示意圖、第3圖之側視圖以及第4圖之電路方塊示意圖。 In the first embodiment, please refer to the schematic diagram shown in FIG. 1, and please refer to the test diagram of FIG. 2, the side view of FIG. 3, and the circuit block diagram of FIG.
本發明第一實施例之敲擊測試治具10包含有一基座100及一敲擊組件200,基座100用以放置待測電路板50於其上,敲擊組件200進一步包含有一控制器201、一動力組202、一敲擊器2023以及一力計器203。動力組202具有一動力源2021及一致動件2022,動力源2021電性連接於控制器201,致動件2022則與動力源2021相連接,並且敲擊器2023活動連接於致動件2022。 The tapping test fixture 10 of the first embodiment of the present invention includes a base 100 and a tapping assembly 200. The base 100 is used to place the circuit board 50 to be tested thereon. The tapping component 200 further includes a controller 201. A power pack 202, a striker 2023, and a force meter 203. The power pack 202 has a power source 2021 and an actuator 2022. The power source 2021 is electrically connected to the controller 201, the actuator 2022 is connected to the power source 2021, and the striker 2023 is movably connected to the actuator 2022.
值得注意的是,本實施例所述之動力源2021包含但不限於氣泵、馬達或電動機等之動力裝置,凡能產生動能並帶動與其相連之致動件2022作動之動力裝置皆可為動力源2021,本領域具有通常技藝之人士可依據測試需求採用不同之裝置。 It should be noted that the power source 2021 of the embodiment includes, but is not limited to, a power device such as a gas pump, a motor or a motor, and any power device capable of generating kinetic energy and driving the actuating member 2022 connected thereto can be a power source. 2021, a person of ordinary skill in the art can use different devices depending on the test requirements.
同時,本實施例之敲擊器2023更具有一敲擊部2024,且敲擊部2024設計為圓角結構,而且敲擊器2023及其敲擊部2024之材質皆為塑膠材料或其他具彈力特性之材質,以避免在進行敲擊測試的過程中,因施力不當或是敲擊位置不當而造成待測電路板50上的電子元件損壞。 At the same time, the tapper 2023 of the embodiment further has a tapping portion 2024, and the tapping portion 2024 is designed as a rounded structure, and the material of the tapper 2023 and the tapping portion 2024 are all plastic materials or other elastic materials. The material of the characteristic is to avoid damage to the electronic components on the circuit board 50 to be tested due to improper application or improper tapping position during the tapping test.
除了前所述敲擊測試治具10之機械結構外,本實施例之控制器201透過與動力源2021的電性連接關係,而得以控制致動件2022之作動,並且進一步地帶動敲擊器2023往復位移。控制器201另具有一計數器(counter)2011,用以設定敲擊器2023之敲擊次數。 In addition to the mechanical structure of the test fixture 10, the controller 201 of the present embodiment controls the actuation of the actuator 2022 through the electrical connection with the power source 2021, and further drives the striker. 2023 reciprocating displacement. The controller 201 further has a counter 2011 for setting the number of taps of the tapper 2023.
除此之外,力計器203係連接於致動件2022與敲擊器2023之間,可控制敲擊器2023之敲擊測試力量。一般來說,在進行敲擊測試時,敲擊力設定於0.1公斤至5公斤之間,但並不以此為 限。此外,本實施例所述之計數器2011及力計器203亦可整合於控制器201中,檢測人員僅須在整合計數器2011及力計器203功能之控制器201上設定敲擊力量及敲擊次數即可,減少設定上之繁瑣程序,有效提高檢測效率。 In addition, the force gauge 203 is coupled between the actuating member 2022 and the taper 2023 to control the tapping test force of the tapper 2023. Generally, when performing a tap test, the tapping force is set between 0.1 kg and 5 kg, but this is not limit. In addition, the counter 2011 and the force meter 203 described in this embodiment may also be integrated into the controller 201, and the detecting personnel only need to set the tapping force and the number of tapping times on the controller 201 that integrates the counter 2011 and the function of the force meter 203. Yes, the cumbersome procedure of setting is reduced, and the detection efficiency is effectively improved.
本實施例之敲擊測試治具10更包含有一測試開關300,以及一緊急停止開關400。測試開關300電性連接於控制器201,當測試開關300被測試人員致動後,測試開關300電性傳輸一測試訊號至控制器201,以開啟動力源2021執行作動。 The tap test fixture 10 of the present embodiment further includes a test switch 300 and an emergency stop switch 400. The test switch 300 is electrically connected to the controller 201. When the test switch 300 is actuated by the tester, the test switch 300 electrically transmits a test signal to the controller 201 to turn on the power source 2021 to perform the operation.
本實施例之測試開關300具有兩個啟動按鈕,且兩個啟動按鈕必須同時被按壓或開啟,才能夠啟動本發明之敲擊測試治具10,此一設計是為了避免測試人員在放置符測電路板50而手還未離開基座100的情況下錯誤啟動測試開關300而發生意外傷害,因此必須以雙手啟動試開關300,加強操作人員於測試時的安全性。 The test switch 300 of the embodiment has two start buttons, and the two start buttons must be pressed or turned on at the same time to enable the tap test fixture 10 of the present invention. This design is to prevent the tester from placing the test. When the circuit board 50 and the hand have not left the susceptor 100, the test switch 300 is erroneously activated to cause accidental injury. Therefore, the test switch 300 must be started with both hands to enhance the safety of the operator during the test.
同理,緊急停止開關400亦為在相同安全考量下之設計,本實施例之緊急停止開關400電性連接於控制器201,當在敲擊檢測過程中有機械故障或意外發生時,測試人員可致動緊急停止開關400,緊急停止開關400電性傳輸一停止訊號至控制器201,以緊急停止動力源2021之作動,待機械故障或意外排除後,再行重新啟動本發明的敲擊測試治具10,強化操作人員於測試時的安全性。 Similarly, the emergency stop switch 400 is also designed under the same safety considerations. The emergency stop switch 400 of the embodiment is electrically connected to the controller 201, and when there is a mechanical failure or accident in the tap detection process, the tester The emergency stop switch 400 can be actuated, and the emergency stop switch 400 electrically transmits a stop signal to the controller 201 to emergency stop the power source 2021 to operate, and after the mechanical failure or accidental elimination, restart the tap test of the present invention. Fixture 10 enhances the safety of the operator during testing.
當測試人員以第一實施例之敲擊測試治具10進行電路板敲擊測試時,首先將待測電路板50放置於基座100上,並令待測電 路板50欲進行敲擊測試之特定位置對準於敲擊器2023之敲擊部2024位置,測試人員透過控制器201上之計數器2011以及力計器203設定敲擊次數及敲擊力道。 When the tester performs the circuit board tap test with the tap test fixture 10 of the first embodiment, the circuit board 50 to be tested is first placed on the susceptor 100, and the power to be tested is made. The specific position of the road board 50 to be subjected to the tap test is aligned with the tapping portion 2024 of the tapper 2023, and the tester sets the number of taps and the striking force path through the counter 2011 on the controller 201 and the force gauge 203.
待設定完後,測試人員以雙手同時按壓測試開關300,此時測試開關300被致動並電性傳輸測試訊號至控制器201。控制器201接收到測試訊號後,再發出一電性訊號令動力源2021啟動,動力源2021驅動致動件2022作動,致動件2022並帶動與其活動連接之敲擊器2023往復位移,使敲擊部2024依據設定之敲擊次數及敲擊力道間歇敲擊待測電路板50之特定位置。若敲擊測試過程中有任何意外或故障發生,測試人員可隨時致動緊急停止開關400以緊急停止敲擊測試治具10,以保障測試過程之安全,亦可避免待測電路板50因為不當測試而損壞。 After the setting is completed, the tester simultaneously presses the test switch 300 with both hands, at which time the test switch 300 is actuated and electrically transmits the test signal to the controller 201. After receiving the test signal, the controller 201 sends an electrical signal to activate the power source 2021, and the power source 2021 drives the actuating member 2022 to actuate. The actuating member 2022 drives the striker 2023 connected to the movable device to reciprocate and knock. The hitting portion 2024 intermittently taps a specific position of the circuit board 50 to be tested according to the set number of taps and the striking force. If there is any accident or malfunction during the tapping test, the tester can activate the emergency stop switch 400 at any time to stop the test fixture 10 in an emergency stop to ensure the safety of the test process, and also avoid the improper use of the circuit board 50 to be tested. Tested and damaged.
在本發明所揭露之第二實施例中,請參考第5圖所示之立體示意圖,並請同時參考第6圖之測試示意圖、第7圖之側視圖以及第8圖之局部放大圖。 In the second embodiment of the present invention, please refer to the perspective view shown in FIG. 5, and refer to the test schematic diagram of FIG. 6, the side view of FIG. 7, and the partial enlarged view of FIG.
第二實施例之敲擊測試具的結構大致與第一實施相類似,其不同之處在於,本實施例除第一實施例所揭露之元件外,基座100更包括有一平台110,且平台110相對於基座100為可上下左右(二維方向)移動的。當待測電路板50放置於平台110上後,測試人員可任意移動平台110,使敲擊器2023得以對待測電路板50的各個測試位置進行敲擊測試。 The structure of the tapping tester of the second embodiment is substantially similar to that of the first embodiment, except that in this embodiment, in addition to the components disclosed in the first embodiment, the base 100 further includes a platform 110, and the platform The 110 is movable up and down (two-dimensional direction) with respect to the susceptor 100. After the circuit board 50 to be tested is placed on the platform 110, the tester can move the platform 110 arbitrarily, so that the striker 2023 can perform a tap test on each test position of the circuit board 50 to be tested.
本實施例之平台110並具有多個定位柱1101及固定件1102,定位柱1101係對應於待測電路板50上之定位孔501設置,並可 依據不同種類之待測電路板50而相對調整定位柱1101之位置。當待測電路板50設置於平台110上時,定位柱1101分別穿設過待測電路板50之定位孔501,以固定待測電路板50,避免待測電路板50於進行敲擊測試時產生偏位情形。同時,定位柱1101亦可緩衝敲擊部2024之撞擊,有效避免撞擊力道過當所造成待測電路板50損壞或故障問題。 The platform 110 of the embodiment has a plurality of positioning posts 1101 and fixing members 1102, and the positioning posts 1101 are corresponding to the positioning holes 501 on the circuit board 50 to be tested, and The position of the positioning post 1101 is relatively adjusted according to different types of circuit boards 50 to be tested. When the circuit board to be tested 50 is disposed on the platform 110, the positioning posts 1101 are respectively disposed through the positioning holes 501 of the circuit board 50 to be tested to fix the circuit board 50 to be tested, so as to prevent the circuit board 50 to be tested from being subjected to the tap test. A bias situation occurs. At the same time, the positioning post 1101 can also buffer the impact of the tapping portion 2024, effectively avoiding the damage or failure of the circuit board 50 to be tested caused by the impact force.
此外,平台110之固定件1102分別連接於基座100與平台110,以固定平台110於基座100上,其固定件1102固定基座100的方式包括但不限於螺絲鎖付、卡固或尼龍搭扣(Velcro)等方式,僅須達到暫時固定平台110的功能,以避免平台110在敲擊測試過程中因為撞擊而被位移,進而影響敲擊測試的正確性,並且方便在測試完畢後將平台110與基座100分開。 In addition, the fixing member 1102 of the platform 110 is respectively connected to the base 100 and the platform 110 to fix the platform 110 on the base 100. The fixing member 1102 fixes the base 100 by means of, but not limited to, screw locking, clamping or nylon. In the manner of Velcro, it is only necessary to achieve the function of temporarily fixing the platform 110, so as to prevent the platform 110 from being displaced due to the impact during the tapping test, thereby affecting the correctness of the tapping test and facilitating the test after the test is completed. The platform 110 is separate from the base 100.
當測試人員以第二實施例之敲擊測試治具10進行電路板敲擊測試時,首先將待測電路板50透過定位柱1101穿過定位孔501的方式固定於平台110上,接著移動平台110,直到待測電路板50欲進行敲擊測試之特定位置對準於敲擊器2023之敲擊部2024。而後,透過固定件1102將平台110固定於基座100上,並執行如上述第一實施例中所載之測試程序。 When the tester performs the circuit board tap test with the tap test fixture 10 of the second embodiment, the test board 50 is first fixed to the platform 110 through the positioning post 501 through the positioning hole 501, and then the mobile platform is moved. 110, until the specific position of the circuit board 50 to be tested for the tap test is aligned with the tap portion 2024 of the tapper 2023. Then, the platform 110 is fixed to the base 100 through the fixing member 1102, and the test procedure as recited in the first embodiment described above is performed.
當完成第一個敲擊點的測試後,測試人員可鬆開固定件1102,使平台110得以沿著二維方向自由的移動,以使待測電路板50欲進行敲擊測試之下一個特定位置對準於敲擊器2023之敲擊部2024,以進行第二次的敲擊測試。 After completing the test of the first tap point, the tester can loosen the fixture 1102 to allow the platform 110 to move freely in a two-dimensional direction so that the circuit board 50 to be tested is to perform a specific test under the tap test. The position is aligned with the tap portion 2024 of the tapper 2023 for a second tap test.
在第三實施例中,請參考第9圖所示之立體示意圖,並請同 時參考第10圖之測試示意圖以及第11圖之側視圖,本實施例之敲擊測試治具10大致與第二實施相類似,其不同的地方在於,本實施例除第二實施例之元件外控制器201更具有一第一調節件204及一第二調節件205。 In the third embodiment, please refer to the three-dimensional diagram shown in Figure 9, and please Referring to the test diagram of FIG. 10 and the side view of FIG. 11, the tap test fixture 10 of the present embodiment is substantially similar to the second embodiment, except that the components of the second embodiment are different from the second embodiment. The outer controller 201 further has a first adjusting member 204 and a second adjusting member 205.
第三實施例之第一調節件204係控制敲擊器2023朝遠離待測電路板50方向的位移速度,藉以控制敲擊器2023之敲擊頻率。敲擊器2023朝遠離待測電路板50方向的位移速度越快,則敲擊器2023兩次敲擊間之時間間隔則較短,亦即敲擊頻率相對較高;相反的,則敲擊器2023的敲擊頻率則相對較低。 The first adjusting member 204 of the third embodiment controls the striking speed of the striking device 2023 toward the circuit board 50 to be tested, thereby controlling the tapping frequency of the tapper 2023. The faster the striker 2023 is moving away from the circuit board 50 to be tested, the shorter the interval between the taps of the tap 2023 is, that is, the tapping frequency is relatively high; on the contrary, the tapping The tap frequency of the device 2023 is relatively low.
第三實施例之第二調節件205係控制敲擊器2023朝向待測電路板50方向的位移速度,透過第二調節件205亦可控制敲擊器2023敲擊之頻率,其原理如前所述,故申請人不在此多加贅述。同時,第二調節件205亦可藉由調整敲擊器2023朝向待測電路板50方向的位移速度,配合力計器203調整敲擊器2023之敲擊力道,以達到最精確之測試,提升測試的品質。 The second adjusting member 205 of the third embodiment controls the displacement speed of the tapper 2023 toward the circuit board 50 to be tested, and the second adjusting member 205 can also control the frequency of tapping by the tapper 2023. The principle is as before. As mentioned, the applicant does not repeat this. At the same time, the second adjusting member 205 can also adjust the displacement speed of the tapper 2023 toward the circuit board 50 to be tested, and the force meter 203 adjusts the tapping force of the tapper 2023 to achieve the most accurate test and upgrade test. Quality.
值得注意的是,本實施例所述之第一調節件204及一第二調節件205,亦可如第一實施例所述之力計器203及計數器2011整合於控制器201中,檢測人員僅須在整合有第一調節件204及一第二調節件205之控制器201上調整敲擊器2023遠離和朝向待測電路板50之位移速度即可,減少設定上之繁瑣程序,有效提高檢測效率。 It is to be noted that the first adjusting member 204 and the second adjusting member 205 of the embodiment may be integrated into the controller 201 as described in the first embodiment, and the detecting personnel only The speed of the striking device 2023 away from and toward the circuit board 50 to be tested can be adjusted on the controller 201 integrated with the first adjusting member 204 and the second adjusting member 205, thereby reducing the cumbersome procedure of setting and effectively improving the detecting. effectiveness.
經由上述本發明所揭露各實施例之敲擊測試治具10,測試人員毋須以人力親自敲擊待測電路板50進行測試,僅須操作敲擊測 試治具10,即可針對待測電路板50特定之測試位置進行敲擊測試,並藉由平台110於二維方向的位移,而可依序對待測電路板50上之不同測試位置進行敲擊測試,以進行最完整之測試,並且不會受到過多人為操作因素的影響,獲得最精確的檢測結果。 Through the tapping test fixture 10 of the embodiments disclosed in the present invention, the tester does not need to manually tap the circuit board 50 to be tested for testing, and only needs to operate the tapping test. The test fixture 10 can perform a tap test on a specific test position of the circuit board 50 to be tested, and can be knocked on the different test positions on the circuit board 50 by the displacement of the platform 110 in a two-dimensional direction. Tests are performed for the most complete test and are not subject to excessive human error factors to obtain the most accurate test results.
同時,本發明所揭露之第一調節件204、一第二調節件205、力計器203及計數器2011,亦可針對不同的待測電路板50進行調整設定,藉以簡單且快速地控制敲擊器2023之敲擊力道、敲擊頻率以及敲擊次數,以符合測試需求,大幅提高檢測效率,同時亦可避免待測電路板50於測試過程中造成損壞。 At the same time, the first adjusting member 204, the second adjusting member 205, the force meter 203 and the counter 2011 disclosed in the present invention can also be adjusted and set for different circuit boards 50 to be tested, thereby controlling the tapper simply and quickly. 2023's tapping force, tapping frequency and number of taps to meet the test requirements, greatly improve the detection efficiency, and also avoid damage to the board under test 50 during the test.
在經過前述的敲擊測試流程後,測試人員再將待測電路板50連接於其他電路測試儀器,以檢測在經過敲擊測試後,待測電路板50是否仍可正常運作,抑或是有短路、接觸不良等問題,以篩選掉可能有空焊之不良品,達到提升產品品質的目的。 After the above-mentioned tapping test process, the tester connects the circuit board 50 to be tested to other circuit testing instruments to detect whether the circuit board 50 to be tested can still operate normally after being subjected to the tapping test, or is short-circuited. Problems such as poor contact, in order to screen out defective products that may be freely welded, to achieve the purpose of improving product quality.
雖然本發明之實施例揭露如上所述,然並非用以限定本發明,任何熟習相關技藝者,在不脫離本發明之精神和範圍內,舉凡依本發明申請範圍所述之形狀、構造、特徵及數量當可做些許之變更,因此本發明之專利保護範圍須視本說明書所附之申請專利範圍所界定者為準。 Although the embodiments of the present invention are disclosed above, it is not intended to limit the present invention, and those skilled in the art, regardless of the spirit and scope of the present invention, the shapes, structures, and features described in the scope of the present application. And the number of modifications may be made, and the scope of patent protection of the present invention shall be determined by the scope of the patent application attached to the specification.
10‧‧‧敲擊測試治具 10‧‧‧Knock test fixture
100‧‧‧基座 100‧‧‧Base
110‧‧‧平台 110‧‧‧ platform
1101‧‧‧定位柱 1101‧‧‧Positioning column
1102‧‧‧固定件 1102‧‧‧Fixed parts
200‧‧‧敲擊組件 200‧‧‧Knocking components
201‧‧‧控制器 201‧‧‧ Controller
2011‧‧‧計數器 2011‧‧‧Counter
202‧‧‧動力組 202‧‧‧Power Group
2021‧‧‧動力源 2021‧‧‧Power source
2022‧‧‧致動件 2022‧‧‧Acoustic
2023‧‧‧敲擊器 2023‧‧‧Patter
2024‧‧‧敲擊部 2024‧‧‧Knocking Department
203‧‧‧力計器 203‧‧‧ force meter
204‧‧‧第一調節件 204‧‧‧First adjustment piece
205‧‧‧第二調節件 205‧‧‧Second adjustment piece
300‧‧‧測試開關 300‧‧‧Test switch
400‧‧‧緊急停止開關 400‧‧‧Emergency stop switch
50‧‧‧待測電路板 50‧‧‧Device board to be tested
501‧‧‧定位孔 501‧‧‧Positioning holes
第1圖所示為本發明第一實施例之敲擊測試治具之立體示意圖。 Fig. 1 is a perspective view showing a tapping test jig according to a first embodiment of the present invention.
第2圖所示為本發明第一實施例之敲擊測試治具之測試示意圖。 Fig. 2 is a schematic view showing the test of the tap test fixture of the first embodiment of the present invention.
第3圖所示為本發明第一實施例之敲擊測試治具之側視圖。 Fig. 3 is a side view showing the tapping test jig of the first embodiment of the present invention.
第4圖所示為本發明第一實施例之敲擊測試治具之電路方塊示意 圖。 Figure 4 is a block diagram showing the circuit block of the tap test fixture of the first embodiment of the present invention. Figure.
第5圖所示為本發明第二實施例之敲擊測試治具之立體示意圖。 Fig. 5 is a perspective view showing a tapping test jig according to a second embodiment of the present invention.
第6圖所示為本發明第二實施例之敲擊測試治具之測試示意圖。 Figure 6 is a schematic view showing the test of the tap test fixture of the second embodiment of the present invention.
第7圖所示為本發明第二實施例之敲擊測試治具之側視圖。 Fig. 7 is a side view showing a tapping test jig according to a second embodiment of the present invention.
第8圖所示為本發明第二實施例之敲擊測試治具之局部放大圖。 Fig. 8 is a partially enlarged view showing a tapping test jig according to a second embodiment of the present invention.
第9圖所示為本發明第三實施例之敲擊測試治具之立體示意圖。 Fig. 9 is a perspective view showing a tapping test jig according to a third embodiment of the present invention.
第10圖所示為本發明第三實施例之敲擊測試治具之測試示意圖。 Figure 10 is a schematic view showing the test of the tap test fixture of the third embodiment of the present invention.
第11圖所示為本發明第三實施例之敲擊測試治具之側視圖。 Figure 11 is a side view showing a tapping test jig according to a third embodiment of the present invention.
10‧‧‧敲擊測試治具 10‧‧‧Knock test fixture
100‧‧‧基座 100‧‧‧Base
200‧‧‧敲擊組件 200‧‧‧Knocking components
201‧‧‧控制器 201‧‧‧ Controller
2011‧‧‧計數器 2011‧‧‧Counter
202‧‧‧動力組 202‧‧‧Power Group
2022‧‧‧致動件 2022‧‧‧Acoustic
2023‧‧‧敲擊器 2023‧‧‧Patter
2024‧‧‧敲擊部 2024‧‧‧Knocking Department
203‧‧‧力計器 203‧‧‧ force meter
300‧‧‧測試開關 300‧‧‧Test switch
400‧‧‧緊急停止開關 400‧‧‧Emergency stop switch
Claims (8)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201110396073.3A CN103135027B (en) | 2011-12-02 | 2011-12-02 | Tap measurement jig |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201323871A TW201323871A (en) | 2013-06-16 |
TWI545320B true TWI545320B (en) | 2016-08-11 |
Family
ID=48495118
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW101121620A TWI545320B (en) | 2011-12-02 | 2012-06-15 | Percussion test fixture |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN103135027B (en) |
TW (1) | TWI545320B (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103901644B (en) * | 2014-03-27 | 2016-06-29 | 深圳市华星光电技术有限公司 | A kind of lighting jig and lighting test method |
TWI658270B (en) * | 2018-06-22 | 2019-05-01 | 楊宗智 | Tapping detection device |
CN111176002B (en) * | 2020-01-20 | 2023-06-23 | 京东方现代(北京)显示技术有限公司 | Knocking jig |
CN111596197A (en) * | 2020-05-18 | 2020-08-28 | 内蒙古创维智能科技有限公司 | Display mainboard testing device |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1196955C (en) * | 2001-08-24 | 2005-04-13 | 瀚宇彩晶股份有限公司 | Pressurizing device for liquid crystal display and laser correction method with pressurizing process |
TW585253U (en) * | 2002-11-29 | 2004-04-21 | Giga Byte Tech Co Ltd | Switch device test tool |
CN1935398A (en) * | 2005-09-19 | 2007-03-28 | 海尔集团公司 | Circuit board component thermal disassembling equipment and method |
CN201563304U (en) * | 2009-11-11 | 2010-08-25 | 伍坚垣 | Circuit board engraver |
CN201788130U (en) * | 2010-09-06 | 2011-04-06 | 广东长虹数码科技有限公司 | Device for detecting service life of cell phone keys |
-
2011
- 2011-12-02 CN CN201110396073.3A patent/CN103135027B/en active Active
-
2012
- 2012-06-15 TW TW101121620A patent/TWI545320B/en active
Also Published As
Publication number | Publication date |
---|---|
TW201323871A (en) | 2013-06-16 |
CN103135027A (en) | 2013-06-05 |
CN103135027B (en) | 2017-06-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI545320B (en) | Percussion test fixture | |
CN203356800U (en) | Dimension-adjustable circuit board element welding clamp | |
CN103018608B (en) | A kind of connector product tester | |
US20100076589A1 (en) | Numerical control device | |
JP2011106844A (en) | Drop testing equipment | |
JP2009538750A (en) | Hitting detection marker device and associated method | |
CN100411093C (en) | Positioning apparatus and method of controlling positioning apparatus | |
TWI486554B (en) | Testing tool and testing method thereof | |
JPH1164426A (en) | Inspection device of printed circuit board and assembly kit of inspection device of printed circuit board | |
JP5403697B2 (en) | Circuit board impact test apparatus and circuit board impact test method | |
KR20140080166A (en) | Pcb substrate inspection device | |
JP2011058908A (en) | Method and device for probing of contact probe | |
CN101144829A (en) | PC board checking device | |
CN108598025B (en) | Independent automatic correction mechanism and chip mounter | |
WO1997043652A1 (en) | Probe needle | |
CN207380194U (en) | Flying probe tester | |
CN103019416B (en) | Time writer frequency adaptation device and method | |
CN202083364U (en) | Laser scanning detection apparatus | |
KR101966895B1 (en) | Touch sensor inspecting apparatus and method | |
JP3265790B2 (en) | Chip IC positioning device | |
CN219038673U (en) | Touch screen testing device | |
JP3562990B2 (en) | Device for testing punching device mounted device and its test method | |
CN221326700U (en) | SOC chip microcircuit testing device | |
TWI835636B (en) | Maintenance methods and equipment for electronic components | |
JP5595902B2 (en) | Board receiving pin, pin board unit and board inspection device |