TWI541645B - Testing system and testing method thereof - Google Patents

Description

Test system and test method thereof

The invention relates to a test system, in particular to a test system with simple structure and low cost and a test method thereof.

An existing test system, such as a signal generator of the type Chroma 2233B produced by the Uniform Electronics Co., Ltd., has a plurality of image output connectors, such as DVI, HDMI, Displayport, HDCP, TV, etc. The image signal generates software, and can be tested on various types of display panels or display panels of the display panel.

However, when testing the same fixed type of display panel or display panel driver board, only one of the above functions is available, so when using the test system, it is costly to construct the test system. Shortcomings.

Accordingly, it is an object of the present invention to provide a test system and a test method thereof that are simple in construction and low in cost.

Therefore, the test system of the present invention is used for testing a board to be tested. The test system includes a computer host and a power control unit. The computer host includes a processor, a storage module, and a display card. Connected to the processor, the display card is electrically connected to the processor, the storage module stores a plurality of sets of test parameters, the display card has a display connection socket, the power control unit is electrically connected to the test board and the computer host respectively, and the computer host outputs a control signal to the power supply a control unit, thereby controlling the power control unit to supply a main voltage signal to the test board, the processor receiving a selection signal, selecting a set of test parameters according to the selection signal, and outputting a test signal including the test parameter to the display connection socket The test board, so that the test board converts the test signal into a set of drive signals.

Therefore, the test method of the present invention is used for testing a board to be tested, and a display card having a display connection socket is installed in a computer host, and then the computer host controls the connection of the test parameters through the display of the display card. It is displayed on the board to be tested, and on the other hand, the program controls the relay module to control the opening or closing of the backlight power of the board and the display unit.

The utility model has the advantages that the board to be tested can be tested in a simple test manner by using the display card having the display connection socket and the setting of the power control unit, thereby achieving the effect of reducing the cost.

The foregoing and other objects, features, and advantages of the invention are set forth in the <RTIgt;

Before the present invention is described in detail, it is noted that in the following description, similar elements are denoted by the same reference numerals.

Referring to FIG. 1 and FIG. 2, the preferred embodiment of the test system of the present invention is used to test a board to be tested 5, which is used to generate a driving signal set 501 for display. The test system includes A computer host 2, a power control unit 3, and a display unit 4. In this embodiment, the driving signal set 501 has an image signal and a backlight driving signal, and the image signal is, for example, an RSSD (Reduced-Swing Differential Signaling) signal.

The computer host 2 includes a processor 21, a storage module 22, a display card 23, and a printer port. The processor 21 is configured to receive the selection signal 601. The storage module 22 is electrically connected to the processor 21 for display. The card 23 is electrically connected to the processor 21, and the parallel port 24 is electrically connected to the processor 21 for outputting a control signal 602. In this embodiment, the selection signal 601 is an instruction from an input interface (not shown) of the host computer 2, for example, using a mouse or a keyboard to execute a corresponding function instruction in the screen.

The storage module 22 stores a plurality of sets of test parameters. The display card 23 has a display connection socket 231. The display connection socket 231 conforms to specifications developed by the Video Electronics Standards Association (VESA) and outputs a test signal 603. In the embodiment, the test parameters represent image information to be tested, and the display connection socket 231 is a DisplayPort socket.

The power control unit 3 is electrically connected to the device to be tested 5 and the computer host 2, and includes a relay module 31, a power supply module 32, and a backlight power module 33. The relay module 31 is electrically connected to the computer host 2 and The control signal 602, the power supply module 32, and the power supply module 32, which are connected to the parallel output 24 of the host computer 2, are electrically connected to the relay module 31, and a power signal set 701 is input to the relay module 31. The backlight power module 33 is electrically connected to the relay module. Group 31 and the board to be tested 5 The board to be tested 5 is a driving board of the display panel.

The power signal set 701 has a main voltage signal 702 and a backlight control signal 703. In this embodiment, the main voltage signal 702 is a voltage signal of DC 3.3V, and the backlight control signal 703 is a voltage signal of DC 5V.

The relay module 31 determines whether to output the main voltage signal 702 to the device under test 5 according to the received control signal 602, and determines whether to output the backlight control signal 703 to the backlight power module 33. The backlight power module 33 is After receiving the backlight control signal 703, a backlight power signal 704 is input to the test board 5.

The display unit 4 is electrically connected to the board to be tested 5 to receive the driving signal set 501. In this embodiment, the display unit 4 is a display panel.

The present invention further provides a test method for testing the test board 5. Referring to FIG. 3, FIG. 3 is a flow chart of a test method of the present invention. The test method is to test the test board 5 by a test flow. In the embodiment, the display card 23 is installed in the computer host 2 in advance, and the testing process includes the following steps 81-88.

In step 81, when the device under test 5 is tested, the processor 21 outputs the control signal 602 through the parallel port 24 to control the relay module 31 to send the main voltage signal 702 to the device under test 5.

Further, in step 81, after the device to be tested 5 to be tested is first mounted to the positioning, the processor 21 receives the selection signal 601, and selects a set of test parameters according to the selection signal 601, and then passes through the computer host 2 The parallel output 24 outputs a control signal 602 to the relay module 31 of the power control unit 3.

Then, the relay module 31 of the power control unit 3 supplies the main voltage signal 702 generated by the power supply module 32 to the board to be tested 5 according to the control of the control signal 602.

In step 82, the processor 21 outputs a test signal 603 including the set of test parameters to the board to be tested 5 through the display connection socket 231.

In step 83, after the test signal 603 is received, the test signal 603 converts the test signal 603 into an image signal in the driving signal set 501, and outputs the image signal to the display unit 7.

In step 84, after receiving the control signal 602, the relay module 31 controls to turn on the backlight power of the display unit 7, and displays the screen.

Further, in step 84, the relay module 31 supplies the backlight control signal 703 generated by the power supply module 32 to the backlight power module 33 according to the control of the control signal 602, and causes the backlight generated by the backlight power module 33. The power signal 704 is supplied to the board to be tested 5, so that the test board 5 receives the test signal 603 and the backlight power signal 704, converts the test signal 603 and the backlight power signal 704 into a driving signal set 501, and outputs the signal to the display unit 7. The display, in turn, causes the display unit 7 to display the screen represented by the corresponding test parameters. In this embodiment, the test signal 603 and the backlight power signal 704 are respectively converted into a driving signal set 501 composed of an image signal and a backlight driving signal through the processing of the board under test 5 .

In step 85, the user visually checks whether the display unit 7 normally displays the screen represented by the corresponding test parameter, and thereby determines whether the board to be tested 5 is functioning normally. It should be noted that the user can switch between different test parameters for detection, and is not limited to a single test parameter.

In step 86, after the detection of the board to be tested 5 is completed, the processor 21 turns off the backlight power of the display unit 7.

Further, in step 86, after the detection of the device under test 5 is completed, the processor 21 receives the selection signal 601 for stopping the test, and then outputs the corresponding control signal 602 by the parallel port 24 according to the selection signal 601. In order to drive the relay module 31 to stop supplying the backlight control signal 703, the backlight power module 33 stops supplying the backlight power signal 704.

In step 87, the processor 21 turns off the test signal 603, that is, the processor 21 requests the display connection socket 231 to stop outputting the test signal 603.

In step 88, the processor 21 turns off the power of the board 5 to be tested to complete the test.

Further, in step 88, the processor 21 drives the relay module 31 to stop supplying the main voltage signal 702 through the control signal 602. At this time, the panel 5 is no longer receiving any electrical signals, and the board to be tested 5 can be used. Take it out safely to end the test process.

It is worth mentioning that the present invention can also cancel the display unit 4. At this time, the board to be tested 5 is a driving board including a display panel and a display panel, and the same effect can be achieved.

Referring to FIG. 4, it is a flow chart of another test method according to the present invention. The difference is that the step 82 and the step 83 in the test flow are performed simultaneously, and the step 87 and the step 88 are performed simultaneously. In this way, the same purpose and efficacy can be achieved.

It should be noted that the test procedure described above is only a single use case, and other test procedures that can be changed by those skilled in the art after knowing the present invention still do not deviate from the patent of the present invention. Coverage.

In summary, the display card 23 having the display connection socket 231 and the power control unit 3 can be tested in a simple test manner, compared to the existing test system. The invention not only has a simple structure and low cost, but also achieves the effect of reducing costs, so that the object of the present invention can be achieved.

The above is only the preferred embodiment of the present invention, and the scope of the invention is not limited thereto, that is, the simple equivalent changes and modifications made by the scope of the invention and the description of the invention are All remain within the scope of the invention patent.

2. . . Computer host

twenty one. . . processor

twenty two. . . Storage module

twenty three. . . graphics card

231. . . Display connection socket

twenty four. . . Parallel

3. . . Power control unit

31. . . Relay module

32. . . Power supply module

33. . . Backlight power module

4. . . Display unit

5. . . Test board

501. . . Drive signal set

601. . . Select signal

602. . . Control signal

603. . . Test signal

701. . . Power signal collection

702. . . Main voltage signal

703. . . Backlight control signal

704. . . Backlight power signal

Figure 1 is a schematic block diagram of a preferred embodiment of the present invention;

Figure 2 is a block diagram of a system in accordance with a preferred embodiment of the present invention;

3 is a flow chart of a test method of the present invention; and

4 is a flow chart of another test method of the present invention.

2. . . Computer host

twenty one. . . processor

twenty two. . . Storage module

twenty three. . . graphics card

231. . . Display connection socket

twenty four. . . Parallel

3. . . Power control unit

5. . . Test board

Claims (8)

A test system for testing a board to be tested, the test system comprising: a computer host, comprising a processor, a storage module, and a display card, the storage module is electrically connected to the processor, the display The card is electrically connected to the processor, the storage module stores a plurality of sets of test parameters, the display card has a display connection socket, and a power control unit electrically connects the test board and the computer host respectively; Controlling the signal to the power control unit, thereby controlling the power control unit to supply a main voltage signal to the board to be tested, the processor receiving a selection signal, and selecting a set of test parameters according to the selection signal, and connecting through the display The socket outputs a test signal including the set of test parameters to the board to be tested, so that the board under test converts the test signal into a set of driving signals. According to the test system of claim 1, wherein the power control unit comprises a relay module and a power supply module, the relay module is electrically connected between the computer host and the board to be tested, the power source The supply module is electrically connected and inputs a power signal set to the relay module. The power signal set has the main voltage signal, and the relay module determines whether to output the main voltage signal to the standby signal according to the received control signal. Measuring board. The test system of claim 2, further comprising a display unit electrically connected to the board to be tested to receive the set of driving signals, the power signal set further having a backlight control signal, the power control unit The backlight power module is electrically connected between the relay module and the board to be tested, and the relay module determines whether to output the backlight control signal to the backlight according to the received control signal. a power module, the backlight power module inputs a backlight power signal to the board after receiving the backlight control signal, and the test board receives the test signal and the backlight power signal, and the test signal and the backlight The power signal is converted into the set of driving signals and output to the display unit. The test system of claim 3, wherein the computer host further comprises a parallel port, the parallel port electrically connecting the processor, and the processor outputs the control signal through the parallel port. The test system according to claim 4, further comprising testing the test board with a test flow, the test process comprising the following steps: (A) driving the relay module to output the main through the parallel port The voltage signal is sent to the board to be tested; (B) the test signal is outputted to the board to be tested through the display connection socket; (C) the board to be tested is processed and converted into an image signal and output to the display unit. (D) the relay module controls the backlight power module to input the backlight power signal to the board to be tested, thereby causing the display unit to display a screen; (E) the user visually checks whether the display unit normally displays the screen represented by the corresponding test parameter, and determines whether the board to be tested is functioning normally; (F) driving the backlight power module to stop supplying the backlight power signal; (G) Driving the display connection socket to stop outputting the test signal; and (H) driving the relay module to stop supplying the main voltage signal. The test system according to claim 5, wherein the step (B) and the step (C) are performed simultaneously. The test system according to claim 5, wherein the step (G) and the step (H) are performed simultaneously. A test method for testing a board to be tested, the test method comprising the following steps: (A) installing a display card having a display connection socket in a computer host; (B) the computer host is connected through the display The socket outputs a test signal including a test parameter to the board to be tested; and (C) the host computer controls a relay module through a parallel connection to determine whether to output a main voltage signal and a backlight power signal to the standby Measuring board.