TWI537210B - Method of preparing graphene - Google Patents

Method of preparing graphene Download PDF

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TWI537210B
TWI537210B TW103100293A TW103100293A TWI537210B TW I537210 B TWI537210 B TW I537210B TW 103100293 A TW103100293 A TW 103100293A TW 103100293 A TW103100293 A TW 103100293A TW I537210 B TWI537210 B TW I537210B
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graphene
heating zone
sccm
heating
temperature
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TW201527210A (en
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陳密
陳栢峰
顧鴻壽
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明新科技大學
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製備石墨烯之方法 Method for preparing graphene

本發明是有關於一種製備石墨烯之方法,特別是有關於一種以多段式加熱區製備石墨烯之方法。 This invention relates to a process for the preparation of graphene, and more particularly to a process for the preparation of graphene in a multi-stage heating zone.

石墨烯(graphene)是一種單原子層的石墨,每個碳原子之間以sp2混成與相鄰的三個原子形成鍵結,並延伸成蜂窩狀的二維結構。石墨烯一直被認為是假想的結構,無法在自然界中穩定存在,直到2004年才成功的從石墨中分離出來。目前研究顯示石墨烯的載子遷移率(carrier mobility)高達200,000cm2/Vs,石墨烯在室溫下電阻率大約1.0μΩ-cm,是室溫下已知電阻率最低的物質,也具有良好的導熱及高穿透率等性質,同時,石墨烯亦是目前已知世界上最薄且最硬的奈米材料。因此目前已被廣為應用於奈米電子元件、觸控面板、電容器、鋰電池、半導體、太陽能電池複合材料和儲氫材料等領域。 Graphene is a monoatomic layer of graphite, each of which is sp 2 mixed with adjacent three atoms to form a bond and extends into a honeycomb two-dimensional structure. Graphene has always been considered a hypothetical structure and cannot be stably existed in nature until it was successfully separated from graphite in 2004. Current studies have shown that graphene has a carrier mobility of up to 200,000 cm 2 /Vs, and graphene has a resistivity of about 1.0 μΩ-cm at room temperature. It is the lowest known resistivity at room temperature and also has good properties. The properties of heat conduction and high transmittance are also the thinnest and hardest nanomaterials known in the world. Therefore, it has been widely used in fields such as nanoelectronic components, touch panels, capacitors, lithium batteries, semiconductors, solar cell composite materials, and hydrogen storage materials.

製備石墨烯的習知技術主要有機械剝離法(mechanical exfoliation)、碳化矽磊晶成長法(SiC epitaxial growth)、氧化石墨烯化學還原法(reduction from graphene oxides)及化學氣相沉積法(chemical vapor deposition,CVD)等方法。其中化學氣相沉積法是目前最常用的方式,因為最適合大量生產,並且容易操作及設備構造簡單,但是因其裂解原料氣體所需的製程溫度很 高(900~1000℃),因此不適用於沉積在熔點較低的基板上,常常需要再行轉印至其它基板如ITO玻璃基板上,轉印係指使原本成長於金屬基板上的石墨烯層轉移至所需要的基板上。舉例來說,一種慣用的技術是將以高分子支撐層(例如PMMA)抓取成長於銅基板上的石墨烯層,接著進行銅基板的蝕刻,再轉移到所需要的基板上並且溶解掉高分子支撐層,而使石墨烯層轉印至所需要的基板上。此種轉印容易導致石墨烯層發生破裂或不規則的皺折,並且會在石墨烯層表面殘留高分子殘餘物,使石墨烯層本質優異的材料特性受到嚴重影響。再者,這種轉印無法與目前的半導體製程(例如矽製程)技術相容,限制了晶圓級規模化生產積體電路元件的前景,所以有增加製程成本、費時與有化學品殘留等問題。 因此,如何直接成長高品質、大面積之單層石墨烯於常用的絕緣介電質(例如:二氧化矽基板),為發展石墨烯電子元件之重要課題。 Conventional techniques for preparing graphene mainly include mechanical exfoliation, SiC epitaxial growth, reduction from graphene oxides, and chemical vapor deposition. Deposition, CVD) and other methods. Among them, chemical vapor deposition is the most common method at present, because it is most suitable for mass production, and it is easy to operate and the equipment is simple in construction, but the process temperature required for cracking the raw material gas is very high. High (900~1000°C), so it is not suitable for deposition on substrates with lower melting points. It is often necessary to transfer to other substrates such as ITO glass substrates. Transfer refers to the graphene layer originally grown on metal substrates. Transfer to the desired substrate. For example, a conventional technique is to grab a graphene layer grown on a copper substrate with a polymer support layer (for example, PMMA), then etch the copper substrate, transfer it to a desired substrate, and dissolve it high. The molecular support layer transfers the graphene layer to the desired substrate. Such transfer easily causes cracking or irregular wrinkles of the graphene layer, and polymer residue remains on the surface of the graphene layer, so that the material properties excellent in the graphene layer are seriously affected. Moreover, such transfer cannot be compatible with current semiconductor processes (eg, tantalum process) technology, limiting the prospect of wafer-scale large-scale production of integrated circuit components, thereby increasing process cost, time consuming, and chemical residues. problem. Therefore, how to directly grow high-quality, large-area single-layer graphene on a common insulating dielectric (for example, a ceria substrate) is an important issue for the development of graphene electronic components.

有鑑於上述習知技術之問題,本發明之目的就是在提供一種以多段式加熱區製備石墨烯之方法,以解決習知技術中適用之基板種類不多以及無法直接沉積於玻璃基板上的問題。 In view of the above problems of the prior art, the object of the present invention is to provide a method for preparing graphene in a multi-stage heating zone, so as to solve the problem that the types of substrates suitable for the prior art are not many and cannot be directly deposited on a glass substrate. .

根據本發明之一目的,提出一種製備石墨烯之方法,可使用反應爐,反應爐分為第一加熱區及第二加熱區,其中第一加熱區位於反應爐前段且第二加熱區位於反應爐末段,此方法可包含下述步驟:將催化劑置於第一加熱區,且將基板置於第二加熱區;加熱第一加熱區至約900℃至約1000℃,以及加熱第二加熱區至約500℃至約600℃;及通入流量為約10sccm至約50sccm之甲烷 至反應爐中,使甲烷經上述溫度及催化劑催化而裂解,並沉積於基板上,以生成石墨烯。 According to an object of the present invention, a method for preparing graphene is provided. A reaction furnace can be used. The reaction furnace is divided into a first heating zone and a second heating zone, wherein the first heating zone is located in the front section of the reactor and the second heating zone is in the reaction. In the furnace section, the method may comprise the steps of: placing the catalyst in the first heating zone and placing the substrate in the second heating zone; heating the first heating zone to between about 900 ° C and about 1000 ° C, and heating the second heating From about 500 ° C to about 600 ° C; and a methane having a flow rate of from about 10 sccm to about 50 sccm Into the reaction furnace, methane is cracked by the above temperature and catalyst catalysis, and deposited on a substrate to form graphene.

較佳者,反應爐之爐內壓力為約5x10-3torr。 Preferably, the pressure in the furnace of the reactor is about 5 x 10 -3 torr.

較佳者,催化劑包含銅箔。 Preferably, the catalyst comprises a copper foil.

較佳者,基板包含銅基板或二氧化矽基板。 Preferably, the substrate comprises a copper substrate or a ceria substrate.

較佳者,在通入甲烷時係同時通入流量為約20sccm至約100sccm之氫氣。 Preferably, a hydrogen gas having a flow rate of from about 20 sccm to about 100 sccm is simultaneously introduced into the methane.

根據本發明之另一目的,提出一種使用三段式反應爐製備石墨烯之方法,三段式反應爐可分為第一加熱區、第二加熱區及第三加熱區,其中第一加熱區位於反應爐前段,第二加熱區位於反應爐中段,而第三加熱區位於反應爐末段。此方法可包含下述步驟:將催化劑置於第二加熱區,且將基板置於第三加熱區;加熱第一加熱區及第二加熱區至約900℃至約1000℃,及加熱第三加熱區至約500℃至約600℃;以及通入流量為約10sccm至約50sccm之甲烷至反應爐中,使甲烷經上述溫度及催化劑催化而裂解,並沉積於基板上,以生成石墨烯。 According to another object of the present invention, a method for preparing graphene using a three-stage reactor is provided. The three-stage reactor can be divided into a first heating zone, a second heating zone and a third heating zone, wherein the first heating zone Located in the front section of the reactor, the second heating zone is located in the middle section of the reactor, and the third heating zone is located in the end section of the reactor. The method can include the steps of: placing a catalyst in a second heating zone and placing the substrate in a third heating zone; heating the first heating zone and the second heating zone to between about 900 ° C and about 1000 ° C, and heating the third The heating zone is heated to a temperature of from about 500 ° C to about 600 ° C; and methane having a flow rate of from about 10 sccm to about 50 sccm is introduced into the reaction furnace, methane is cracked by the above temperature and catalyst catalysis, and deposited on the substrate to form graphene.

較佳者,反應爐之爐內壓力為約5x10-3torr。 Preferably, the pressure in the furnace of the reactor is about 5 x 10 -3 torr.

較佳者,催化劑包含銅箔。 Preferably, the catalyst comprises a copper foil.

較佳者,基板包含銅基板或二氧化矽基板。 Preferably, the substrate comprises a copper substrate or a ceria substrate.

較佳者,在通入甲烷時係同時通入流量為約20sccm至約100sccm之氫氣。 Preferably, a hydrogen gas having a flow rate of from about 20 sccm to about 100 sccm is simultaneously introduced into the methane.

承上所述,依本發明所揭露之製備石墨烯之方法,可具有一或多個下述優點: As described above, the method for preparing graphene disclosed in the present invention may have one or more of the following advantages:

(1)此製備石墨烯之方法可藉由使用多段式加熱區之反應爐,藉此可使石墨烯在低於600℃的環境下沉積於基板上,因此可適用於熔點較低之基板,可選擇之基板種類增多。 (1) The method for preparing graphene can be carried out on a substrate by using a multi-stage heating zone reaction furnace, whereby graphene can be deposited on a substrate at a temperature lower than 600 ° C, and thus can be applied to a substrate having a lower melting point. The number of substrates that can be selected is increased.

(2)此製備石墨烯之方法可藉由使用多段式加熱區之反應爐,藉此可直接沉積於玻璃基板上,無須再轉印至其它基板上,可降低成本與製程時間。 (2) The method for preparing graphene can be directly deposited on a glass substrate by using a multi-stage heating zone reaction furnace, without being transferred to other substrates, thereby reducing cost and process time.

(3)此製備石墨烯之方法可藉由使用多段式加熱區之反應爐,藉此可使在低於600℃的環境下沉積於基板上之石墨烯相較於在高於900℃的環境下沉積於基板上之石墨烯,具有較少的層數以及較少的缺陷。 (3) The method for preparing graphene can be carried out by using a multi-stage heating zone reactor, whereby graphene deposited on a substrate in an environment lower than 600 ° C can be compared with an environment higher than 900 ° C. The graphene deposited on the substrate has fewer layers and fewer defects.

S11~S13‧‧‧步驟 S11~S13‧‧‧Steps

1‧‧‧三段式反應爐 1‧‧‧Three-stage reactor

10‧‧‧第一加熱區 10‧‧‧First heating zone

20‧‧‧第二加熱區 20‧‧‧second heating zone

30‧‧‧第三加熱區 30‧‧‧ third heating zone

40‧‧‧催化劑 40‧‧‧ Catalyst

50‧‧‧基板 50‧‧‧Substrate

60‧‧‧石英舟 60‧‧‧Quartz boat

70‧‧‧加熱線圈 70‧‧‧heating coil

80‧‧‧氣體入口端 80‧‧‧ gas inlet end

90‧‧‧氣體出口端 90‧‧‧ gas outlet

第1圖係為本發明之第一實施例之製備石墨烯之方法之流程圖。 Fig. 1 is a flow chart showing a method of producing graphene according to a first embodiment of the present invention.

第2圖係為本發明之製備石墨烯之方法所使用之三段式反應爐之構造圖。 Fig. 2 is a structural view of a three-stage reactor used in the method for producing graphene of the present invention.

第3圖係為本發明之製備石墨烯之方法之升溫對時間之關係圖。 Fig. 3 is a graph showing the relationship between the temperature rise and the time of the method for producing graphene of the present invention.

第4a圖係為本發明之固定甲烷流量為20sccm但分別變化氫氣流量為20、40、60、80、100sccm之第二至第六實施例於950℃之加熱溫度所製得石墨烯之拉曼光譜圖。 Figure 4a is a graphene Raman produced by the second to sixth embodiments of the present invention having a fixed methane flow rate of 20 sccm but varying hydrogen flow rates of 20, 40, 60, 80, 100 sccm, respectively, at a heating temperature of 950 °C. Spectrum.

第4b圖係為本發明之固定甲烷流量為20sccm但分別變化氫氣流量為20、40、60、80、100sccm之第二至第六實施例於550℃之加熱溫度所製得石墨烯之拉曼光譜圖。 Figure 4b is a graphene Raman produced by the second to sixth embodiments of the present invention having a fixed methane flow rate of 20 sccm but varying hydrogen flow rates of 20, 40, 60, 80, 100 sccm, respectively, at a heating temperature of 550 °C. Spectrum.

第5a圖係為本發明之固定氫氣流量為100sccm但分別變化甲烷流量為20、10、30、40、50sccm之第六至第十實施例於950℃之加熱溫度所製得石墨烯之拉曼光譜圖。 Figure 5a is a graphene Raman produced by the sixth to tenth embodiments of the present invention having a fixed hydrogen flow rate of 100 sccm but varying methane flows of 20, 10, 30, 40, 50 sccm, respectively, at a heating temperature of 950 °C. Spectrum.

第5b圖係為本發明之固定氫氣流量為100sccm但分別變化甲烷流量為20、10、30、40、50sccm之第六至第十實施例於550℃之加熱溫度所製得石墨烯之拉曼光譜圖。 Figure 5b is a graphene Raman produced by the sixth to tenth embodiments of the present invention having a fixed hydrogen flow rate of 100 sccm but varying methane flows of 20, 10, 30, 40, 50 sccm, respectively, at a heating temperature of 550 °C. Spectrum.

第6a圖係為本發明之固定甲烷流量為20sccm及固定反應階段氫氣流量為100sccm但分別變化升溫與退火階段氫氣流量為100、50sccm之第十一至第十二實施例於550℃之加熱溫度所製得石墨烯之拉曼光譜圖。 Figure 6a is a heating temperature of the eleventh to twelfth embodiments of the eleventh to twelfth embodiments in which the fixed methane flow rate of the present invention is 20 sccm and the hydrogen flow rate of the fixed reaction stage is 100 sccm, respectively, and the temperature of the annealing and the annealing stage is 100, 50 sccm. A Raman spectrum of the graphene produced.

第6b圖係為本發明之固定甲烷流量為10sccm及固定反應階段氫氣流量為100sccm但分別變化升溫與退火階段氫氣流量為100、50sccm之第十三至第十四實施例於550℃之加熱溫度所製得石墨烯之拉曼光譜圖。 Figure 6b is the heating temperature of the thirteenth to fourteenth embodiments of the thirteenth to fourteenth embodiments in which the fixed methane flow rate of the present invention is 10 sccm and the hydrogen flow rate of the fixed reaction stage is 100 sccm, respectively, and the temperature of the annealing and the annealing stage is 100, 50 sccm. A Raman spectrum of the graphene produced.

第7a圖係為本發明之固定甲烷流量為20sccm但變化第一次、第二次及第三次反應之氫氣流量為100、0~100、0~100sccm以分別成長雙層及三層石墨烯之第十五及第十六實施例於950℃之加熱溫度所製得石墨烯之拉曼光譜圖。 Figure 7a shows the fixed methane flow rate of the present invention is 20 sccm, but the hydrogen flow rate of the first, second and third reactions is changed to 100, 0~100, 0~100 sccm to grow double-layer and three-layer graphene, respectively. The fifteenth and sixteenth embodiments of the present invention produce a Raman spectrum of graphene at a heating temperature of 950 °C.

第7b圖係為本發明之固定甲烷流量為20sccm但變化第一次、第二次及第三次反應之氫氣流量為100、0~100、0~100sccm以分別成長單層、雙層及三層石墨烯之第十七至第十九實施例於550℃之加熱溫度所製得石墨烯之拉曼光譜圖。 Figure 7b is the fixed methane flow rate of the present invention is 20sccm, but the hydrogen flow rate of the first, second and third reactions is changed to 100, 0~100, 0~100sccm to grow single layer, double layer and three respectively. The seventeenth to nineteenth embodiments of the layer graphene were prepared at a heating temperature of 550 ° C to obtain a Raman spectrum of graphene.

第8a圖係為本發明之第十五實施例於950℃之加熱溫度所製得石墨烯之HRTEM圖。 Fig. 8a is a HRTEM image of graphene prepared by heating at a temperature of 950 °C in the fifteenth embodiment of the invention.

第8b圖係為本發明之第十六實施例於950℃之加熱溫度所製得石墨烯之HRTEM圖。 Fig. 8b is a HRTEM image of graphene prepared by heating at a temperature of 950 °C in the sixteenth embodiment of the invention.

第9a圖係為本發明之第十七實施例於550℃之加熱溫度所製得石墨烯之HRTEM圖。 Fig. 9a is a HRTEM image of graphene obtained by heating at a heating temperature of 550 °C in the seventeenth embodiment of the invention.

第9b圖係為本發明之第十八實施例於550℃之加熱溫度所製得石墨烯之HRTEM圖。 Fig. 9b is a HRTEM image of graphene obtained by heating at a heating temperature of 550 °C in the eighteenth embodiment of the invention.

第9c圖係為本發明之第十九實施例於550℃之加熱溫度所製得石墨烯之HRTEM圖。 Fig. 9c is a HRTEM chart of graphene obtained by heating at a heating temperature of 550 °C in the nineteenth embodiment of the invention.

第10圖係為本發明之第二十實施例於950℃之加熱溫度所製得石墨烯之拉曼光譜圖。 Fig. 10 is a Raman spectrum diagram of graphene obtained by heating at 950 ° C in the twentieth embodiment of the present invention.

第11圖係為本發明之第二十一實施例分別於950℃及550℃之加熱溫度所製得石墨烯之拉曼光譜圖。 Fig. 11 is a Raman spectrum diagram of graphene obtained by heating at 950 ° C and 550 ° C for the twenty-first embodiment of the present invention.

第12a圖係為本發明之第六實施例於550℃之加熱溫度加熱前之銅基板表面之SEM圖。 Fig. 12a is an SEM image of the surface of the copper substrate before heating at a heating temperature of 550 ° C in the sixth embodiment of the invention.

第12b圖係為本發明之第六實施例於550℃之加熱溫度加熱後製得石墨烯之銅基板表面之SEM圖。 Fig. 12b is an SEM image of the surface of a copper substrate obtained by heating a heating temperature of 550 ° C in the sixth embodiment of the present invention.

第12c圖係為本發明之第六實施例於550℃之加熱溫度加熱後製得石墨烯之銅基板表面之高倍率SEM圖。 Fig. 12c is a high-magnification SEM image of the surface of the copper substrate on which graphene is obtained after heating at a heating temperature of 550 °C in the sixth embodiment of the present invention.

第13a圖係為石墨烯未成長於其上之銅基板尺寸之光學顯微影像圖。 Figure 13a is an optical micrograph of the size of a copper substrate on which graphene has not grown.

第13b圖係為石墨烯未成長於其上之銅基板表面之光學顯微影像圖。 Figure 13b is an optical micrograph of the surface of a copper substrate on which graphene has not grown.

第13c圖係為石墨烯已成長於其上之銅基板表面之光學顯微影像圖。 Figure 13c is an optical micrograph of the surface of a copper substrate on which graphene has grown.

第14a圖係為石墨烯未轉印於其上之二氧化矽基板尺寸之光學顯微影像圖。 Figure 14a is an optical micrograph of the size of the ceria substrate to which graphene has not been transferred.

第14b圖係為石墨烯未轉印於其上之二氧化矽基板表面之光學顯微影像圖。 Figure 14b is an optical micrograph of the surface of a ceria substrate on which graphene has not been transferred.

第14c圖係為石墨烯轉印於其上之二氧化矽表面之光學顯微影像圖。 Figure 14c is an optical micrograph of the surface of the ceria on which graphene is transferred.

第15a圖係為石墨烯未轉印於其上之鈉玻璃基板尺寸之光學顯微影像圖。 Figure 15a is an optical micrograph of the size of the soda glass substrate to which the graphene has not been transferred.

第15b圖係為石墨烯未轉印於其上之鈉玻璃基板表面之光學顯微影像圖。 Figure 15b is an optical micrograph of the surface of a soda glass substrate on which graphene has not been transferred.

第15c圖係為石墨烯轉印於其上之鈉玻璃表面之光學顯微影像圖。 Figure 15c is an optical micrograph of the surface of the soda glass onto which graphene is transferred.

第16圖係為本發明之第六實施例於550℃之加熱溫度所製得石墨烯之電阻率與層數關係圖。 Fig. 16 is a graph showing the relationship between the resistivity and the number of layers of graphene obtained by heating at 550 ° C in the sixth embodiment of the present invention.

第17圖係為本發明之第六實施例於550℃之加熱溫度所製得石墨烯轉於其上之玻璃基板之紫外光/可見光光譜圖。 Fig. 17 is a view showing the ultraviolet/visible spectrum of the glass substrate on which the graphene is transferred at the heating temperature of 550 ° C in the sixth embodiment of the present invention.

本發明將藉由下列較佳實施例及其配合之圖式,作進一步之詳細說明。需注意的是,以下各實施例所揭示之實驗數據,係為便於解釋本案技術特徵,並非用以限制其可實施之態樣。 The invention will be further described in detail by the following preferred embodiments and the accompanying drawings. It should be noted that the experimental data disclosed in the following embodiments are for explaining the technical features of the present invention, and are not intended to limit the manner in which they can be implemented.

請參閱第1圖,其係為本發明之第一實施例之製備石墨烯之方法之流程圖。此方法所使用的反應爐,可分為第一加熱區及第二加熱區,其中第一加熱區係位於反應爐前段且第二加熱區係位於反應爐末段。此方法可包含下述步驟:將催化劑置於第一加熱區,且將基板置於第二加熱區(步驟S11),加熱第一加熱區至約900℃至約1000℃,以及加熱第二加熱區至約500℃至約600℃(步驟S12),並通入流量為約10標準立方公分/分鐘(standard cubic centimeter per minute,sccm)至約50sccm之甲烷至反應爐中,使甲烷經催化劑催化而裂解,並沉積於基板上,以生成石墨烯(步驟S13)。 Please refer to FIG. 1, which is a flow chart of a method for preparing graphene according to a first embodiment of the present invention. The reaction furnace used in the method can be divided into a first heating zone and a second heating zone, wherein the first heating zone is located in the front section of the reactor and the second heating zone is located in the end section of the reaction furnace. The method may comprise the steps of: placing a catalyst in a first heating zone, placing the substrate in a second heating zone (step S11), heating the first heating zone to between about 900 ° C and about 1000 ° C, and heating the second heating The zone is from about 500 ° C to about 600 ° C (step S12), and the flow rate is about 10 standard cubic centimeters per minute (standard cubic centimeter per Minute, sccm) to about 50 sccm of methane to the reaction furnace, methane is cleaved by catalyst catalysis, and deposited on a substrate to form graphene (step S13).

請參閱第2圖,係為本發明之製備石墨烯之方法所使用之三段式反應爐之構造圖。在第二實施例中,其所使用三段式反應爐1結構係與第一實施例使用之二段式反應爐結構類似,差別僅在於三段式反應爐1多了第三加熱區30。在本實施例中,製造步驟為先將銅箔當做催化劑40放在石英舟60上,並置於第二加熱區20;再將銅箔(99.8%、25μm)裁切為1cm x 1cm之尺寸當作基板50,置於第三加熱區30;啟動機械泵浦將三段式反應爐1抽真空至壓力約為5x10-3torr;設定第一加熱區10以及第二加熱區20溫度皆為約950℃以及第三加熱區30溫度為約550℃,由氣體入口端80通入流量為約20sccm之氫氣(H2)與流量為約20sccm之氬氣(Ar),並由氣體出口端90排出,其中氫氣係作為蝕刻氣體,可打斷氧與銅鍵結,避免形成氧化銅,以維持銅之催化性以及降低生成之石墨烯之缺陷,而氬氣僅作為載流氣體。接著啟動加熱線圈70,將第一加熱區10、第二加熱區20及第三加熱區30加熱約100分鐘至上述各自的設定溫度,再保持相同的溫度下,退火25分鐘,關閉氬氣。接著通入流量為約20sccm之甲烷(CH4)至三段式反應爐1約10分鐘,使甲烷經上述溫度及催化劑催化而裂解,並沉積於基板50上,以生成石墨烯。最後停止通入甲烷並通入氬氣,溫度降至室溫後再將沉積於基板上的石墨烯取出。其升溫對時間之關係圖如第3圖所示。 Please refer to Fig. 2, which is a structural view of a three-stage reactor used in the method for producing graphene of the present invention. In the second embodiment, the structure of the three-stage reactor 1 used is similar to that of the two-stage reactor used in the first embodiment, except that the third-stage reactor 1 has a third heating zone 30. In this embodiment, the manufacturing step is to first place the copper foil as the catalyst 40 on the quartz boat 60 and place it in the second heating zone 20; then cut the copper foil (99.8%, 25 μm ) into 1 cm x 1 cm. The size is taken as the substrate 50, and is placed in the third heating zone 30; the mechanical pump is started to evacuate the three-stage reactor 1 to a pressure of about 5×10 −3 torr; the temperature of the first heating zone 10 and the second heating zone 20 are set. At about 950 ° C and the temperature of the third heating zone 30 is about 550 ° C, hydrogen gas (H 2 ) having a flow rate of about 20 sccm and argon gas (Ar) having a flow rate of about 20 sccm are introduced from the gas inlet end 80, and the gas outlet end is used. 90 is discharged, wherein hydrogen acts as an etching gas, which can interrupt the bonding of oxygen and copper to avoid the formation of copper oxide, to maintain the catalytic properties of copper and to reduce the defects of the formed graphene, and argon gas only acts as a carrier gas. Then, the heating coil 70 is activated, and the first heating zone 10, the second heating zone 20, and the third heating zone 30 are heated for about 100 minutes to the respective set temperatures, and then annealed for 25 minutes at the same temperature to close the argon gas. Then, methane (CH 4 ) having a flow rate of about 20 sccm was introduced into the three-stage reactor 1 for about 10 minutes, and methane was cracked by the above temperature and catalyst catalysis, and deposited on the substrate 50 to form graphene. Finally, the methane was introduced and argon gas was introduced, and the graphene deposited on the substrate was taken out after the temperature was lowered to room temperature. The relationship between temperature rise and time is shown in Figure 3.

本發明之第三、四、五及六實施例係與第二實施例之製備方式相似,差別僅在於通入之氫氣流量分別為約40sccm、60sccm、80sccm以及100sccm。 The third, fourth, fifth and sixth embodiments of the present invention are similar to the second embodiment in that the hydrogen flow rates are about 40 sccm, 60 sccm, 80 sccm, and 100 sccm, respectively.

本發明之第七、八、九及十實施例係與第六實施例之製備方式相似,差別僅在於通入之甲烷流量分別為約10sccm、30sccm、40sccm以及50sccm。 The seventh, eighth, ninth and tenth embodiments of the present invention are similar to the preparation of the sixth embodiment except that the methane flow rates are approximately 10 sccm, 30 sccm, 40 sccm and 50 sccm, respectively.

為使便於理解,本發明之第二至第十實施例之參數條件詳如表1。 For the sake of easy understanding, the parameter conditions of the second to tenth embodiments of the present invention are as detailed in Table 1.

請參閱第4a圖至第5b圖,其係為本發明之第二至第十實施例於第二加熱區及第三加熱區製得之石墨烯之拉曼光譜圖。其中第4a圖、第4b圖、第5a圖及第5b圖係分別為本發明之固定甲烷流量為20sccm但分別變化氫氣流量為20、40、60、80、100sccm之第二至第六實施例於950℃之加熱溫度所製得石墨烯之拉曼光譜圖、本發明之固定甲烷流量為20sccm但分別變化氫氣流量為20、40、60、80、100sccm之第二至第六實施例於550℃之加熱溫度所製得石墨烯之拉曼光譜圖、本發明之固定氫氣流量為100sccm但分別變化甲烷流量為20、10、30、40、50sccm之第六至第十實施例於950℃之加熱溫度所製得石墨烯之拉曼光譜圖及本發明之固定氫氣流量為100sccm但分別變化甲烷流量為20、10、30、40、50sccm之第六至第十實施例於550℃之加熱溫度所製得石墨烯之拉曼光譜圖。如上述四圖所示,以拉曼光譜進行石墨烯品質(亦即缺陷狀況)與生成層數的鑑定,可由D特徵峰(1350cm-1)、G特徵峰(1580cm-1)、2D特徵峰(2680~2700cm-1)來判 別。其中D特徵峰的強度與G特徵峰的強度比值ID/IG可判定品質,而2D特徵峰的強度與G特徵峰的強度比值I2D/IG可判定層數。當ID/IG愈小則缺陷愈少,當I2D/IG小於1為多層,I2D/IG大於等於1且小於2為二至三層之寡層,I2D/IG大於2為單層。 其比較結果如表2所示。 Please refer to FIGS. 4a to 5b, which are Raman spectra of graphene prepared in the second heating zone and the third heating zone according to the second to tenth embodiments of the present invention. 4A, 4b, 5a, and 5b are second to sixth embodiments of the present invention, wherein the fixed methane flow rate is 20 sccm, but the hydrogen flow rate is changed to 20, 40, 60, 80, 100 sccm, respectively. A Raman spectrum of graphene prepared at a heating temperature of 950 ° C, and a second to sixth embodiment of the present invention in which the fixed methane flow rate is 20 sccm but the hydrogen flow rate is changed to 20, 40, 60, 80, 100 sccm, respectively. The Raman spectrum of graphene obtained by heating at °C, the sixth to tenth embodiment of the present invention having a fixed hydrogen flow rate of 100 sccm but varying methane flow rates of 20, 10, 30, 40, 50 sccm respectively at 950 ° C Raman spectrum of graphene obtained by heating temperature and heating temperature of 550 ° C of the sixth to tenth embodiments of the present invention in which the fixed hydrogen flow rate is 100 sccm but the methane flow rate is changed to 20, 10, 30, 40, 50 sccm, respectively. A Raman spectrum of the graphene produced. As shown in the above four figures, the graphene quality (that is, the defect condition) and the number of generated layers are identified by Raman spectroscopy, and the D characteristic peak (1350 cm -1 ), the G characteristic peak (1580 cm -1 ), and the 2D characteristic peak can be obtained. (2680~2700cm -1 ) to judge. The intensity ratio of the D characteristic peak to the G characteristic peak I D /I G can determine the quality, and the intensity ratio of the intensity of the 2D characteristic peak to the G characteristic peak I 2D /I G can determine the number of layers. When the I D /I G is smaller, the defect is less. When I 2D /I G is less than 1 is a multilayer, I 2D /I G is greater than or equal to 1 and less than 2 is an oligo layer of two to three layers, and I 2D /I G is larger than 2 is a single layer. The comparison results are shown in Table 2.

由表2可知,第二實施例至第六實施例中,通入固定之甲烷流量,隨著通入之氫氣流量逐漸變大,無論在較高溫(950℃)之第二加熱區及較低溫(550℃)之第三加熱區,I2D/IG趨勢乃逐漸變大,代表石墨烯層數變少,皆為寡層石墨烯。同時第三加熱區之石墨烯層數大部分比第二加熱區略少,代表較低溫區比較容易得到欲求之單層石墨烯。在第二實施例至第六實施例六中,通入固定之甲烷流量,隨著通入之氫氣流量逐漸變大,ID/IG在較高溫(950℃)之第二加熱區趨勢為變大,代表缺陷變多,而ID/IG在較低溫(550℃)之第三加熱區趨勢為變小,代表缺陷變少。第六實施例在較高溫區與較低溫區產出之石墨烯缺陷均較少,且層數為單層,係最佳實施例。 It can be seen from Table 2 that in the second embodiment to the sixth embodiment, the fixed methane flow rate is gradually increased as the hydrogen flow rate is increased, regardless of the second heating zone and the lower temperature at a higher temperature (950 ° C). In the third heating zone (550 ° C), the I 2D /I G tendency gradually becomes larger, which means that the number of graphene layers is less, and all are oligo-layer graphene. At the same time, the number of graphene layers in the third heating zone is mostly less than that in the second heating zone, which means that the lower temperature zone is relatively easy to obtain the desired single layer graphene. In the second embodiment to the sixth embodiment, the fixed methane flow rate is gradually increased as the hydrogen flow rate is increased, and the second heating zone of I D /I G at a higher temperature (950 ° C) tends to be When it becomes larger, it means that the defect becomes more, and the trend of the third heating zone of I D /I G at a lower temperature (550 ° C) becomes smaller, indicating that the defect is less. The sixth embodiment produces fewer graphene defects in the higher temperature zone and the lower temperature zone, and the number of layers is a single layer, which is a preferred embodiment.

第六實施例至第十實施例中,通入固定之氫氣流量,隨著通入之甲烷流量逐漸變大,無論在較高溫(950℃)之第二加熱區及較低溫(550℃)之第三加熱區,I2D/IG趨勢均逐漸變小,代表石墨烯層數變多,但仍為寡層石墨烯。而第二加熱區與第三加熱區之石墨烯層數無顯著差異。在第二實施例至第六實施例六中,通入固定之氫氣流量,隨著通入之甲烷流量逐漸變大,ID/IG在較高溫(950℃)之第二加熱區之趨勢乃逐漸變大,代表缺陷變多。而ID/IG在較低溫(550℃)第三加熱區趨勢不規律,代表缺陷狀況與通入之甲烷流量多寡無一定之規律。 In the sixth embodiment to the tenth embodiment, the fixed hydrogen flow rate is gradually increased as the methane flow rate is increased, regardless of the second heating zone at a higher temperature (950 ° C) and the lower temperature (550 ° C). In the third heating zone, the I 2D /I G trend gradually becomes smaller, which means that the number of graphene layers is increased, but it is still oligo-layer graphene. There is no significant difference in the number of graphene layers between the second heating zone and the third heating zone. In the second embodiment to the sixth embodiment Sixth embodiment, the hydrogen flow rate into fixed, as the flow rate through the methane is gradually increased, I D / I G at relatively high temperature (950 deg.] C) of the second heating zone trends It is getting bigger and bigger, representing more defects. However, the trend of I D /I G in the third heating zone at lower temperature (550 °C) is irregular, indicating that there is no regularity in the defect status and the amount of methane flow.

本發明之第十一至十四實施例與第六實施例相似,差別在於通入氫氣的流量在反應階段固定,而在升溫退火階段有所不同,同時通入甲烷流量亦不同,以確定氫氣流量在升溫退火階段的差異是否會影響石墨烯之成長品質,其相關參數如表3所示。 The eleventh to fourteenth embodiments of the present invention are similar to the sixth embodiment except that the flow rate of the hydrogen gas is fixed in the reaction stage, and is different in the temperature rising annealing stage, and the methane flow rate is also different to determine the hydrogen gas. Whether the difference in flow rate during the annealing process affects the growth quality of graphene, the relevant parameters are shown in Table 3.

請參閱第6a圖,其係為本發明之固定甲烷流量為20sccm及固定反應階段氫氣流量為100sccm但分別變化升溫與退火階段氫氣流量為100、50sccm之第十一至第十二實施例於550℃之加熱溫度所製得石墨烯之拉曼光譜圖。如圖所示,固定甲烷流量為20sccm時,氫氣在反應階段皆為100sccm,而氫氣在升溫與退火階段為50sccm的D峰明顯比100sccm的D峰高,導致ID/IG值較高,顯示升 溫與退火階段氫氣流量由100sccm降低至50sccm,石墨烯缺陷增加,因此在升溫與退火階段通入足夠氫氣流量可有效降低石墨烯缺陷。接著請參閱第6b圖,其係為本發明之固定甲烷流量為10sccm及固定反應階段氫氣流量為100sccm但分別變化升溫與退火階段氫氣流量為100、50sccm之第十三至第十四實施例於550℃之加熱溫度所製得石墨烯之拉曼光譜圖,如圖所示,固定甲烷流量為10sccm時,氫氣在反應階段皆為100sccm,而氫氣在升溫與退火階段為50sccm的D峰與100sccm的D峰相比並無顯著差異。 Please refer to FIG. 6a, which is an eleventh to twelfth embodiment in which the fixed methane flow rate of the present invention is 20 sccm and the hydrogen flow rate in the fixed reaction stage is 100 sccm, respectively, and the hydrogen flow rate in the annealing stage is changed to 100, 50 sccm. A Raman spectrum of graphene was prepared at a heating temperature of °C. As shown in the figure, when the fixed methane flow rate is 20 sccm, the hydrogen gas is 100 sccm in the reaction stage, and the hydrogen peak in the heating and annealing phase is 50 sccm, and the D peak is higher than the 100 sccm D peak, resulting in a higher I D /I G value. It is shown that the hydrogen flow rate in the heating and annealing stages is reduced from 100 sccm to 50 sccm, and the graphene defects are increased, so that a sufficient hydrogen flow rate in the temperature rising and annealing stages can effectively reduce the graphene defects. Next, please refer to FIG. 6b, which is a thirteenth to fourteenth embodiment in which the fixed methane flow rate is 10 sccm and the fixed reaction phase hydrogen flow rate is 100 sccm, but the temperature rise and the annealing stage hydrogen flow rate are 100, 50 sccm, respectively. The Raman spectrum of graphene was obtained at a heating temperature of 550 ° C. As shown in the figure, when the fixed methane flow rate was 10 sccm, the hydrogen gas was 100 sccm in the reaction stage, and the hydrogen gas was 50 sccm D peak and 100 sccm in the heating and annealing stages. There was no significant difference in the D peak.

因此綜合上述第二至十四實施例比較,得到以氫氣流量無論在升溫退火階段或反應階段皆為100sccm以及甲烷流量為20sccm較低溫成長之石墨烯品質最佳。亦即第六實施例之較低溫成長條件為最佳化的參數。 Therefore, in comparison with the above-described second to fourteenth embodiments, the graphene having the lowest temperature growth in the hydrogen gas flow rate of 100 sccm in the temperature rising annealing stage or the reaction stage and the methane flow rate of 20 sccm is obtained. That is, the lower temperature growth condition of the sixth embodiment is an optimized parameter.

本發明之第十五至第十九實施例與第六實施例相似,差別在於成長石墨稀之步驟為連續重複做三次,其中甲烷流量在三次皆固定為20sccm,而氫氣流量在第一次、第二次及第三次反應分別為100、0~100、0~100sccm。透過第一次反應生成單層石墨稀,第二次反應更堆疊一層石墨稀於單層石墨稀上以形成雙層石墨稀,第三次反應再堆疊一層石墨稀於雙層石墨稀上以形成三層石墨稀,如此加以控制以得到寡層石墨烯。其相關實驗操縱參數以及製得之石墨烯層數與缺陷如表4所示。 The fifteenth to nineteenth embodiments of the present invention are similar to the sixth embodiment, except that the step of growing the graphite thinning is performed three times in succession, wherein the methane flow rate is fixed to 20 sccm three times, and the hydrogen flow rate is the first time, The second and third reactions were 100, 0 to 100, and 0 to 100 sccm, respectively. A single layer of graphite is formed by the first reaction, and a second layer of graphite is thinned on the single layer of graphite to form a double layer of graphite. The third reaction is further stacked with a layer of graphite diluted on the double layer of graphite to form a thin layer. The three layers of graphite are diluted and thus controlled to obtain oligo-layer graphene. The relevant experimental manipulation parameters and the number and defects of the graphene layers produced are shown in Table 4.

請參閱第7a及第7b圖,其係分別為本發明之固定甲烷流量為20sccm但變化第一次、第二次及第三次反應之氫氣流量為100、0~100、0~100sccm以分別成長雙層及三層石墨烯之第十五及第十六實施例於950℃之加熱溫度所製得石墨烯之拉曼光譜圖,以及本發明之固定甲烷流量為20sccm但變化第一次、第二次及第三次反應之氫氣流量為100、0~100、0~100sccm以分別成長單層、雙層及三層石墨烯之第十七至第十九實施例於550℃之加熱溫度所製得石墨烯之拉曼光譜圖。而由此兩圖得到之I2D/IG及ID/IG值如上表所示,可得知在較高溫區寡層的三層比起雙層有明顯較低的缺陷,推測再堆疊一層石墨烯時,促使之前未結晶完全者再結晶成長。由第7a及第7b圖得知層數皆在寡層範圍內,究為雙層抑或三層,實際上須由高解析穿透式電子顯微鏡(High-resolution transmission electron microscope,HRTEM)分析鑑定。 Please refer to Figures 7a and 7b, respectively. The fixed methane flow rate of the present invention is 20 sccm, but the hydrogen flow rates of the first, second and third reactions are changed to 100, 0 to 100, 0 to 100 sccm, respectively. The fifteenth and sixteenth embodiments of the two-layer and three-layer graphene are grown at a heating temperature of 950 ° C to obtain a Raman spectrum of graphene, and the fixed methane flow rate of the present invention is 20 sccm but the change is the first time, The hydrogen flow rate of the second and third reactions is 100, 0-100, 0-100 sccm to grow the heating temperature of the seventeenth to nineteenth embodiments of the single-layer, double-layer and three-layer graphene at 550 ° C, respectively. A Raman spectrum of the graphene produced. The I 2D /I G and I D /I G values obtained from the two figures are as shown in the above table. It can be seen that the three layers of the oligo layer in the higher temperature region have significantly lower defects than the double layer, and it is presumed to be stacked again. When a layer of graphene is used, it causes recrystallization to grow before it is completely crystallized. From the 7th and 7th diagrams, it is known that the number of layers is in the range of the oligo layer. The double layer or the third layer is actually identified by high-resolution transmission electron microscope (HRTEM) analysis.

接著請參閱第8a及第8b圖,其係分別為本發明之第十五實施例於950℃之加熱溫度所製得石墨烯之HRTEM圖以及本發明之第十六實施例於950℃之加熱溫度所製得石墨烯之HRTEM圖。其中第8a圖中石墨烯厚度為1nm,為雙層結構,而第8b圖中石墨烯厚度為1nm,為三層結構。因此由HRTEM及拉曼圖顯示,在較高溫區石墨烯成長層數難以控制。 Next, please refer to FIGS. 8a and 8b, which are HRTEM images of graphene prepared at a heating temperature of 950 ° C in the fifteenth embodiment of the present invention, and heating at 950 ° C in the sixteenth embodiment of the present invention. HRTEM image of graphene prepared by temperature. The graphene in Fig. 8a has a thickness of 1 nm and is a two-layer structure, and the graphene in Fig. 8b has a thickness of 1 nm and has a three-layer structure. Therefore, the HRTEM and Raman diagrams show that the number of graphene growth layers in the higher temperature region is difficult to control.

接著請參閱第9a、第9b及第9c圖,其係分別為本發明之第十七實施例於550℃之加熱溫度所製得石墨烯之HRTEM圖、本發明之第十八實施例於550℃之加熱溫度所製得石墨烯之HRTEM圖以及本發明之第十九實施例於550℃之加熱溫度所製得石墨烯之HRTEM圖。第9a圖石墨烯厚度0.335nm,為單層。 右上方為選區繞射圖(Selected Area Diffraction,SAD),顯示圖中的晶相呈不規則排列。第9b圖石墨烯厚度0.67nm,明顯為雙層。第9c圖石墨烯厚度1nm,為三層。 因此由HRTEM圖及拉曼光譜顯示,以本發明之分段加溫區製備石墨烯之方法,可在較低溫區550℃順利成長單層石墨烯,或是寡層之雙層及三層石墨烯,且缺陷低品質佳。 Next, please refer to Figures 9a, 9b and 9c, which are HRTEM images of graphene obtained at a heating temperature of 550 ° C for the seventeenth embodiment of the present invention, and an eighteenth embodiment of the present invention at 550 The HRTEM image of graphene obtained by heating at °C and the HRTEM image of graphene prepared at a heating temperature of 550 ° C in the nineteenth embodiment of the present invention. The graphene of Fig. 9a has a thickness of 0.335 nm and is a single layer. The upper right is the Selected Area Diffraction (SAD), which shows that the crystal phases in the figure are irregularly arranged. The thickness of graphene in Fig. 9b is 0.67 nm, which is obviously double layer. The graphene of Fig. 9c has a thickness of 1 nm and is three layers. Therefore, by the HRTEM image and the Raman spectrum, the method for preparing graphene by the segmented heating zone of the present invention can smoothly grow single-layer graphene in the lower temperature region at 550 ° C, or double-layer and three-layer graphite in the oligo layer. Aene, and the defects are low in quality.

本發明之第二十及二十一實施例與第二實施例相似,差別在於基板係為二氧化矽基板(玻璃基板),而第二十實施例通入之氫氣流量為約100sccm及通入之甲烷流量為約5sccm,第二十一實施例通入之氫氣流量為約24sccm及通入之甲烷流量為約35sccm,兩個實施例之反應時間均較第二實施例長,為約30分鐘。請參閱第10圖及第11圖,其係分別為本發明之第二十實施例於950℃之加熱溫度所製得石墨烯之拉曼光譜圖以及本發明之第二十一實施例分別於950℃及550℃之加熱溫度所製得石墨烯之拉曼光譜圖。由圖測定之I2D/IG及ID/IG其比較結果如表5所示。 The twentieth and twenty-first embodiments of the present invention are similar to the second embodiment, except that the substrate is a ceria substrate (glass substrate), and the hydrogen flow rate of the twentieth embodiment is about 100 sccm and is introduced. The methane flow rate is about 5 sccm, the hydrogen flow rate of the twenty-first embodiment is about 24 sccm, and the methane flow rate is about 35 sccm, and the reaction time of both examples is longer than the second embodiment, about 30 minutes. . Please refer to FIG. 10 and FIG. 11 , which are respectively a Raman spectrum of graphene prepared at a heating temperature of 950 ° C according to a twentieth embodiment of the present invention, and a twenty-first embodiment of the present invention respectively A Raman spectrum of graphene was prepared at a heating temperature of 950 ° C and 550 ° C. The comparison results of I 2D /I G and I D /I G measured by the graph are shown in Table 5.

由第10圖及表5可知,第二十實施例中,連較高溫之第二加熱區都無法產生石墨烯,遑論較低溫區。而由第11圖可知,第二十一實施例之條件在950℃及550℃可生成石墨烯,然無論較高溫之第二加熱區或較低溫之第三加熱區,其I2D/IG均小於1且ID/IG均為1.93,顯示無論較高溫區或較低溫區雖有石墨 烯生成,但層數皆為多層且缺陷多。由第二十一實施例可知石墨烯可於上述之氫氣及甲烷流量條件下,在約550℃的溫度直接於玻璃基板上形成石墨烯,如此便不須轉印至其它基板之過程,相較於使用銅基板之第二實施例至第十九實施例可降低轉印成本與製程時間。 It can be seen from Fig. 10 and Table 5 that in the twentieth embodiment, graphene cannot be produced in the second heating zone of higher temperature, which is lower in the lower temperature zone. As can be seen from Fig. 11, the conditions of the twenty-first embodiment can produce graphene at 950 ° C and 550 ° C, regardless of the second heating zone of higher temperature or the third heating zone of lower temperature, I 2D /I G Both are less than 1 and I D /I G are 1.93, indicating that although graphene is formed in the higher temperature zone or the lower temperature zone, the number of layers is multi-layer and many defects. It can be seen from the twenty-first embodiment that graphene can form graphene directly on the glass substrate at a temperature of about 550 ° C under the above-mentioned hydrogen and methane flow conditions, so that the process of transferring to other substrates is not required. The second to nineteenth embodiments using the copper substrate can reduce the transfer cost and the process time.

接下來以本發明之第六實施例之條件,進行石墨烯生長在基板上之形貌分析。參閱第12a至12c圖,其係分別為本發明之第六實施例於550℃之加熱溫度加熱前之銅基板表面之SEM圖、本發明之第六實施例於550℃之加熱溫度加熱後製得石墨烯之銅基板表面之SEM圖、本發明之第六實施例於550℃之加熱溫度加熱後製得石墨烯之銅基板表面之高倍率SEM圖。由第12a圖可知,未加熱前,可清楚看見銅基板表面有條狀形貌。由第12b圖,可見成長石墨烯後之銅基板,表面呈現些微皺褶,因銅基板為熱脹冷縮,石墨烯為冷脹熱縮所致,皺褶導致石墨烯能穩定存在。由第12c圖,在高倍率SEM下可清楚看見石墨烯呈現多個六角形組合而成之蜂巢狀。 Next, the morphology analysis of graphene growth on the substrate was carried out under the conditions of the sixth embodiment of the present invention. Referring to Figures 12a to 12c, which are respectively an SEM image of the surface of the copper substrate before heating at a heating temperature of 550 ° C according to the sixth embodiment of the present invention, and the sixth embodiment of the present invention is heated at a heating temperature of 550 ° C. The SEM image of the surface of the copper substrate obtained by graphene, and the sixth embodiment of the present invention were heated at a heating temperature of 550 ° C to obtain a high-magnification SEM image of the surface of the copper substrate of graphene. It can be seen from Fig. 12a that before the heating, it can be clearly seen that the surface of the copper substrate has a strip shape. From Fig. 12b, it can be seen that the copper substrate after the growth of graphene has some slight wrinkles on the surface. Because the copper substrate is in thermal expansion and contraction, graphene is caused by cold expansion and contraction, and the wrinkles cause the graphene to stably exist. From Fig. 12c, it can be clearly seen under high-magnification SEM that graphene has a honeycomb shape in which a plurality of hexagons are combined.

接下來觀察在銅基板上生成之石墨烯再轉印至其他基板的表面形貌比較,在此以光學顯微鏡(Optical Microscope)觀察。請參閱第13a至13c圖,其係分別為石墨烯未成長於其上之銅基板尺寸之光學顯微影像圖、石墨烯未成長於其上之銅基板表面之光學顯微影像圖、石墨烯已成長於其上之銅基板表面之光學顯微影像圖。由第13b圖,可清楚看到銅基板表面有條狀紋路,而由第13c圖可看見銅基板表面出現白色區塊之石墨烯成長痕跡。 Next, a comparison of the surface topography of the graphene formed on the copper substrate to another substrate was observed, and it was observed by an optical microscope (Optical Microscope). Please refer to Figures 13a to 13c, which are optical micrograph images of the size of the copper substrate on which graphene has not grown, optical micrographs of the surface of the copper substrate on which graphene has not grown, graphene An optical micrograph of the surface of a copper substrate that has grown thereon. From Fig. 13b, it can be clearly seen that the surface of the copper substrate has a stripe pattern, and from Fig. 13c, the graphene growth trace of the white block on the surface of the copper substrate can be seen.

接著請參閱第14a至14c圖,其係分別為石墨烯未轉印於其上之二氧化矽基板尺寸之光學顯微影像圖、石墨烯未轉印於其上之二氧化矽基板表面之光學顯微影像圖、石墨烯轉印於其上之二氧化矽表面之光學顯微影像圖。由 第14c圖所示,因為二氧化矽折射率極低,且石墨烯在可見光區透光率高,僅能看見未清洗乾淨之PMMA。 Next, please refer to the figures 14a to 14c, which are optical micrograph images of the size of the ceria substrate on which the graphene is not transferred, and the optics of the surface of the ceria substrate on which the graphene is not transferred. A microscopic image, an optical micrograph of the surface of the ceria on which graphene is transferred. by As shown in Fig. 14c, since the refractive index of cerium oxide is extremely low and the transmittance of graphene in the visible light region is high, only the uncleaned PMMA can be seen.

接著請參閱第15a至15c圖,其係分別為石墨烯轉印於其上之鈉玻璃基板尺寸之光學顯微影像圖、石墨烯未轉印於其上之鈉玻璃基板表面之光學顯微影像圖、石墨烯轉印於其上之鈉玻璃表面之光學顯微影像圖。由第15b圖及第15c圖比較得知,覆蓋上石墨烯後,鈉玻璃表面明顯顏色變深。 Next, please refer to Figures 15a to 15c, which are optical micrograph images of the size of the soda glass substrate on which graphene is transferred, and optical microscopy images of the surface of the soda glass substrate on which graphene is not transferred. Figure. Optical micrograph of the surface of the soda glass onto which graphene is transferred. From the comparison of Fig. 15b and Fig. 15c, it is known that after the graphene is covered, the surface of the soda glass becomes darker in color.

接下來測試本發明在較低溫區製得之石墨烯之電性分析,其數值如下表6所示。 Next, the electrical analysis of the graphene produced in the lower temperature region of the present invention was tested, and the values thereof are shown in Table 6 below.

由表6可知,在較低溫生成之單層石墨烯比較高溫生成之石墨烯有更小的電阻率及較好之載子遷移率,且電阻率比較低溫區生成之雙層及三層更小。因此在較低溫區生成之單層石墨烯具有更高的電性及更佳的品質。接著請參閱第16圖,其係為本發明之第六實施例於550℃之加熱溫度所製得石墨烯之電阻率與層數關係圖。如圖所示,當層數變多時,電阻率亦隨之增加,亦將導致導電率下降。 It can be seen from Table 6 that the graphene produced at a lower temperature has a lower resistivity and better carrier mobility than the graphene produced at a higher temperature, and the resistivity is smaller than that of the double layer and the third layer formed in the low temperature region. . Therefore, the single-layer graphene produced in the lower temperature region has higher electrical properties and better quality. Next, please refer to Fig. 16, which is a graph showing the relationship between the resistivity and the number of layers of graphene prepared at a heating temperature of 550 ° C in the sixth embodiment of the present invention. As shown in the figure, as the number of layers increases, the resistivity also increases, which also causes the conductivity to decrease.

接下來測試本發明在較低溫區製得之石墨烯之穿透率分析。請參閱第17圖,其係為本發明之第六實施例於550℃之加熱溫度所製得石墨烯轉於其上之玻璃基板之紫外光/可見光光譜圖。如圖所示,玻璃基板穿透率為91.11%,而石墨烯/玻璃之穿透率為87.22%,假設石墨烯穿透率為100%,石墨烯/玻璃應為91.11%,因此推算石墨烯穿透率為95.73%,略低於文獻中以機械剝離法得到的石墨烯穿透率97.7%。推測可能在轉印過程中,PMMA未清除乾淨而殘留於石墨烯表面,造成穿透率下降。 Next, the transmittance analysis of the graphene prepared in the lower temperature region of the present invention was tested. Referring to Fig. 17, which is a UV/Vis spectrum of a glass substrate on which graphene is transferred at a heating temperature of 550 ° C according to a sixth embodiment of the present invention. As shown in the figure, the glass substrate transmittance is 91.11%, and the graphene/glass transmittance is 87.22%. Assuming graphene transmittance is 100%, graphene/glass should be 91.11%, so graphene is estimated. The penetration rate was 95.73%, which was slightly lower than the graphene penetration rate of 97.7% obtained by mechanical peeling in the literature. It is speculated that during the transfer process, the PMMA is not cleaned and remains on the surface of the graphene, resulting in a decrease in the transmittance.

總結來說,本發明之製備石墨烯之方法由於採用多段式加熱區之反應爐,可使石墨烯在低於600℃的環境下沉積於基板上,因此可適用於熔點較低之基板,可選擇之基板種類增多。尤其是可適用於常用之玻璃基板,不須額外轉印之製程,可降低成本與製程時間。同時在約500℃至約600℃的較低溫加熱區生成之石墨烯比在約900℃至約1000℃的較高溫加熱區生成之石墨烯其層數較低,缺陷較少、導電性高且穿透率佳。 In summary, the method for preparing graphene of the present invention can deposit graphene on a substrate at a temperature lower than 600 ° C due to a multi-stage heating zone reaction furnace, so that it can be applied to a substrate having a lower melting point. The number of substrates selected has increased. In particular, it can be applied to commonly used glass substrates without additional transfer processes, which can reduce cost and process time. At the same time, the graphene formed in the lower temperature heating zone of about 500 ° C to about 600 ° C has a lower number of layers than the graphene produced in the higher temperature heating zone of about 900 ° C to about 1000 ° C, with fewer defects and high conductivity. Good penetration rate.

以上所述僅為舉例性,而非為限制性者。任何未脫離本發明之精神與範疇,而對其進行之等效修改或變更,均應包含於後附之申請專利範圍中。 The above is intended to be illustrative only and not limiting. Any equivalent modifications or alterations to the spirit and scope of the invention are intended to be included in the scope of the appended claims.

S11~S13‧‧‧步驟 S11~S13‧‧‧Steps

Claims (8)

一種製備石墨烯之方法,係使用一反應爐,該反應爐分為一第一加熱區及一第二加熱區,其中該第一加熱區係位於該反應爐前段且該第二加熱區係位於該反應爐末段,該方法包含下述步驟:將一催化劑置於該第一加熱區,且將一二氧化矽基板置於該第二加熱區;加熱該第一加熱區至約900℃至約1000℃,及加熱該第二加熱區至約500℃至約600℃;以及通入流量為約10sccm至約50sccm之甲烷至該反應爐中,使甲烷經該第一加熱區約900℃至約1000℃之溫度及該催化劑催化而裂解,並於該第二加熱區約500℃至約600℃的溫度沉積於該二氧化矽基板上,以生成石墨烯。 A method for preparing graphene is to use a reaction furnace which is divided into a first heating zone and a second heating zone, wherein the first heating zone is located in front of the reactor and the second heating zone is located At the end of the reactor, the method comprises the steps of: placing a catalyst in the first heating zone, and placing a cerium oxide substrate in the second heating zone; heating the first heating zone to about 900 ° C to About 1000 ° C, and heating the second heating zone to about 500 ° C to about 600 ° C; and introducing a flow of methane from about 10 sccm to about 50 sccm into the reactor, passing methane through the first heating zone to about 900 ° C to The catalyst is catalytically cracked at a temperature of about 1000 ° C and deposited on the ceria substrate at a temperature of from about 500 ° C to about 600 ° C in the second heating zone to form graphene. 如申請專利範圍第1項所述之方法,其中該反應爐之爐內壓力為約5x10-3torr。 The method of claim 1, wherein the furnace pressure in the furnace is about 5 x 10 -3 torr. 如申請專利範圍第1項所述之方法,其中該催化劑包含銅箔。 The method of claim 1, wherein the catalyst comprises a copper foil. 如申請專利範圍第3項所述之方法,其中在通入甲烷時係同時通入流量為約20sccm至約100sccm之氫氣。 The method of claim 3, wherein the introduction of methane simultaneously introduces a hydrogen gas having a flow rate of from about 20 sccm to about 100 sccm. 一種使用三段式反應爐製備石墨烯之方法,該三段式反應爐分為一第一加熱區、一第二加熱區及一第三加熱區,其中該第一加熱區係位於該反應爐前段,該第二加熱區係位於該反應爐中段,該第三加熱區係位於該反應爐末段,該方法包含下述步驟:將一催化劑置於該第二加熱區,且將一二氧化矽基板置於該第 三加熱區;加熱該第一加熱區及該第二加熱區至約900℃至約1000℃,及加熱該第三加熱區至約500℃至約600℃;以及通入流量為約10sccm至約50sccm之甲烷至該反應爐中,使甲烷經該第二加熱區約900℃至約1000℃之溫度及該催化劑催化而裂解,並於該第三加熱區約500℃至約600℃之溫度沉積於該二氧化矽基板上,以生成石墨烯。 A method for preparing graphene by using a three-stage reactor, the three-stage reactor is divided into a first heating zone, a second heating zone and a third heating zone, wherein the first heating zone is located in the reactor In the preceding stage, the second heating zone is located in the middle of the reaction furnace, and the third heating zone is located at the end of the reaction furnace. The method comprises the steps of: placing a catalyst in the second heating zone and a second oxidation zone矽 substrate placed in the first a third heating zone; heating the first heating zone and the second heating zone to about 900 ° C to about 1000 ° C, and heating the third heating zone to about 500 ° C to about 600 ° C; and the flow rate of about 10 sccm to about 50 sccm of methane is introduced into the reaction furnace, methane is cleaved by the catalyst at a temperature of about 900 ° C to about 1000 ° C in the second heating zone, and is deposited at a temperature of about 500 ° C to about 600 ° C in the third heating zone. On the ceria substrate, graphene is formed. 如申請專利範圍第5項所述之方法,其中該反應爐之爐內壓力為約5x10-3torr。 The method of claim 5, wherein the furnace pressure in the furnace is about 5 x 10 -3 torr. 如申請專利範圍第5項所述之方法,其中該催化劑包含銅箔。 The method of claim 5, wherein the catalyst comprises a copper foil. 如申請專利範圍第7項所述之方法,其中在通入甲烷時係同時通入流量為約20sccm至約100sccm之氫氣。 The method of claim 7, wherein the introduction of methane simultaneously introduces a hydrogen gas having a flow rate of from about 20 sccm to about 100 sccm.
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