TWI536698B - Supplying-end module in induction-type power supply system and signal analysis circuit therein - Google Patents
Supplying-end module in induction-type power supply system and signal analysis circuit therein Download PDFInfo
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本發明係指一種用於感應式電源供應器中供電模組之訊號解析電路,尤指一種可對感應式電源供應器中供電模組上的線圈訊號進行解析,以取出觸發訊號之訊號解析電路。The present invention relates to a signal analysis circuit for a power supply module in an inductive power supply, and more particularly to a signal analysis circuit capable of analyzing a coil signal on a power supply module of an inductive power supply to extract a trigger signal. .
在感應式電源供應器中,為了安全運作,需要在供電端確認其供電線圈上感應區域為正確之受電裝置,且在可以接收電力的狀況下才進行電力發送,為了使供電端能夠辨識受電端是否為正確的受電裝置,需要透過傳送資料碼來進行識別。資料碼的傳送係藉由供電端驅動供電線圈產生諧振,發送電磁能量到受電端,以進行電力傳送,而在受電端接收電力時,可透過訊號調制技術改變接收線圈上的阻抗狀態,再透過反饋影響供電線圈上的諧振載波訊號變化。接著,透過電路處理,可將供電線圈上的訊號變化轉換成數位資訊傳送到供電端的處理器進行判讀。In the inductive power supply, in order to operate safely, it is necessary to confirm that the sensing area on the power supply coil is the correct power receiving device at the power supply end, and the power transmission is performed only when the power can be received, so that the power supply end can recognize the power receiving end. Whether it is a correct power receiving device needs to be identified by transmitting a data code. The transmission of the data code is generated by the power supply terminal driving the power supply coil to generate resonance, transmitting electromagnetic energy to the power receiving end for power transmission, and when receiving power at the power receiving end, the impedance state of the receiving coil can be changed by the signal modulation technology, and then transmitted. The feedback affects the resonant carrier signal variation on the power supply coil. Then, through the circuit processing, the signal change on the power supply coil can be converted into digital information and transmitted to the processor of the power supply end for interpretation.
上述透過調制技術反饋至供電線圈上的訊號變化係透過供電模組中的訊號解析電路來進行解調。由於線圈訊號為大電壓(如數十或數百伏特)的交流訊號,而調制訊號為交流訊號上的振幅變化量,其往往遠小於線圈訊號的大小。上述交流訊號無法直接由處理器進行處理,而必須先經由訊號解析電路將線圈訊號轉換至處理器可處理的電壓範圍。在美國專利公開號2013/0342027 A1中,訊號解析電路前端包含一鉗位電路,其可將訊號鉗至較高電位,再進行整流及低通濾波,以產生處理器可判讀的訊號波形。The signal change feedback to the power supply coil through the modulation technique is demodulated by a signal analysis circuit in the power supply module. Since the coil signal is an alternating current signal of a large voltage (such as tens or hundreds of volts), and the modulation signal is an amplitude variation on the alternating current signal, it is often much smaller than the size of the coil signal. The above-mentioned AC signal cannot be directly processed by the processor, but must be converted to a voltage range that can be processed by the processor through the signal parsing circuit. In US Patent Publication No. 2013/0342027 A1, the front end of the signal analysis circuit includes a clamp circuit that clamps the signal to a higher potential, and then performs rectification and low-pass filtering to generate a signal waveform that the processor can interpret.
然而,先前技術尚有不足之處。首先,請參考第1圖,第1圖為感應式電源供應器之供電線圈之波形示意圖。如第1圖所示,波形W1_1及W1_2分別為供電線圈兩端所接收來自於驅動電路之驅動訊號,其為方波且互為反相。波形W1_3為線圈上的電壓訊號。理想上,線圈訊號應為持續振盪的正弦波。然而,如波形W1_3所示,線圈訊號在正半週期與負半週期皆呈現理想的正弦波,但在驅動訊號之波形W1_1及W1_2切換之處(即正半週期與負半週期交界處)存在瞬間的跨壓,此跨壓的大小大致等於線圈驅動訊號的振幅大小。由於線圈需要靠振盪方式發送能量,上述跨壓部分無法產生振盪的能量,造成線圈之能量發送能力的下降,也就是說,線圈訊號上包含由線圈本身諧振所產生的弦波訊號,而另一部分是驅動訊號之跨壓所構成,然而,處理器無法判讀線圈訊號中實際的弦波訊號成分,其可能在調節功率時誤判線圈上的振盪電壓過高,而進行錯誤的調節。此外,當驅動電壓加大時,相對應弦波訊號的比例會縮小,造成調制訊號判讀的難度增加。However, the prior art still has deficiencies. First, please refer to Figure 1, which is a waveform diagram of the power supply coil of the inductive power supply. As shown in FIG. 1, the waveforms W1_1 and W1_2 are drive signals received from the drive circuit at both ends of the power supply coil, which are square waves and are mutually inverted. Waveform W1_3 is the voltage signal on the coil. Ideally, the coil signal should be a sinusoidal wave that oscillates continuously. However, as shown by waveform W1_3, the coil signal exhibits an ideal sine wave in both the positive half cycle and the negative half cycle, but exists where the waveforms of the drive signals W1_1 and W1_2 are switched (ie, at the junction of the positive half cycle and the negative half cycle). The instantaneous cross-over pressure is approximately equal to the amplitude of the coil drive signal. Since the coil needs to transmit energy in an oscillating manner, the above-mentioned voltage-crossing portion cannot generate oscillating energy, resulting in a decrease in the energy transmission capability of the coil, that is, the coil signal includes a sine wave signal generated by the resonance of the coil itself, and the other portion It is composed of the cross-voltage of the driving signal. However, the processor cannot interpret the actual sine wave signal component in the coil signal, which may misjudge the oscillating voltage on the coil when adjusting the power, and make an error adjustment. In addition, when the driving voltage is increased, the proportion of the corresponding sine wave signal is reduced, which makes the difficulty of modulating the signal interpretation increased.
在美國專利公開號2013/0342027 A1中,來自於線圈的高壓訊號會先進入鉗位電路進行處理,此訊號未經衰減而直接輸入鉗位電路的二極體,可能造成該二極體承受過高電壓而燒毀。在其訊號解析電路中,前段為高壓運作而後段逐漸降低,當內部元件損毀時,可能造成預期外的高電壓進入供電端之處理器而使其燒毀。供電微處理器的燒毀可能造成供電系統失去安全控制。另一方面,先前技術之訊號解析電路不存在訊號放大的能力,若欲取得較大的訊號變化量,必須盡可能降低線圈訊號的衰減量。在此情形下,電路元件需要承受較高的電壓,容易造成元件壽命降低或燒毀。此外,由於該訊號解析電路只有訊號衰減的能力而無法對訊號進行放大,細微的訊號變化較難以被判讀。In U.S. Patent Publication No. 2013/0342027 A1, the high voltage signal from the coil is first processed into a clamp circuit, and the signal is directly input into the diode of the clamp circuit without being attenuated, which may cause the diode to withstand Burned down with high voltage. In the signal analysis circuit, the front section is operated at a high voltage and the rear section is gradually lowered. When the internal components are damaged, the expected high voltage may enter the processor of the power supply terminal to burn it. The burning of the power supply microprocessor may cause the power supply system to lose safety control. On the other hand, the signal analysis circuit of the prior art does not have the capability of signal amplification. To obtain a large signal variation, the attenuation of the coil signal must be reduced as much as possible. In this case, the circuit components need to withstand higher voltages, which tends to cause the component life to be reduced or burned. In addition, since the signal analysis circuit has only the ability to attenuate the signal and cannot amplify the signal, the subtle signal change is more difficult to be interpreted.
有鑑於此,實有必要提出一種新的訊號解析電路,以獲得更佳的訊號解析效能,同時避免上述問題的發生。In view of this, it is necessary to propose a new signal parsing circuit to obtain better signal parsing performance while avoiding the above problems.
因此,本發明之主要目的即在於提供一種可在感應式電源供應器中供電模組內用於解析觸發訊號之訊號解析電路。Therefore, the main object of the present invention is to provide a signal analysis circuit for analyzing a trigger signal in a power supply module in an inductive power supply.
本發明揭露一種用於一感應式電源供應器中一供電模組之一訊號解析電路,用來對該供電模組之一供電線圈上的一線圈訊號進行解析,以取出一觸發訊號,該訊號解析電路包含有一第一分壓電路、一第一放大電路、一第一檢波電路、一第二分壓電路、一第二放大電路、一第二檢波電路、一交連電容及一第三分壓電路。該第一分壓電路耦接於該供電線圈,可用來對該線圈訊號進行衰減,以產生一分壓線圈訊號。該第一放大電路耦接於該第一分壓電路,可用來取出該分壓線圈訊號高於一參考電壓的部分,以輸出一半波訊號。該第一檢波電路耦接於該第一放大電路,可用來對該半波訊號進行檢波,以產生一直流訊號,並加以輸出。該第二分壓電路耦接於該第一放大電路,可用來對該半波訊號進行衰減,以產生一分壓半波訊號。該第二放大電路耦接於該第一檢波電路及該第二分壓電路,可用來取出該分壓半波訊號高於該直流訊號的部分,以輸出一放大半波訊號。該第二檢波電路耦接於該第二放大電路,可用來對該放大半波訊號進行檢波,以產生一包絡訊號(envelope signal),並加以輸出。該交連電容耦接於該第二檢波電路,可用來對該包絡訊號進行濾波,以濾除該包絡訊號之一直流成分,並輸出該包絡訊號之一交流成分。該第三分壓電路耦接於該交連電容,可用來產生一直流電壓,該直流電壓並結合該包絡訊號之該交流成分,以輸出該觸發訊號。The invention discloses a signal analysis circuit for a power supply module in an inductive power supply, which is used for parsing a coil signal on a power supply coil of the power supply module to extract a trigger signal, the signal The parsing circuit comprises a first voltage dividing circuit, a first amplifying circuit, a first detecting circuit, a second voltage dividing circuit, a second amplifying circuit, a second detecting circuit, a cross-connecting capacitor and a third Voltage divider circuit. The first voltage dividing circuit is coupled to the power supply coil, and can be used to attenuate the coil signal to generate a voltage dividing coil signal. The first amplifying circuit is coupled to the first voltage dividing circuit, and can be used to extract a portion of the voltage dividing coil signal higher than a reference voltage to output a half wave signal. The first detecting circuit is coupled to the first amplifying circuit, and can be used for detecting the half wave signal to generate a DC signal and output the signal. The second voltage dividing circuit is coupled to the first amplifying circuit and configured to attenuate the half wave signal to generate a divided voltage half wave signal. The second amplifying circuit is coupled to the first detecting circuit and the second voltage dividing circuit, and can be used to extract a portion of the divided half-wave signal higher than the DC signal to output an amplified half-wave signal. The second detection circuit is coupled to the second amplifying circuit and configured to detect the amplified half-wave signal to generate an envelope signal and output the signal. The cross-connecting capacitor is coupled to the second detecting circuit and configured to filter the envelope signal to filter a DC component of the envelope signal and output an AC component of the envelope signal. The third voltage dividing circuit is coupled to the cross capacitance, and can be used to generate a DC voltage, which is combined with the AC component of the envelope signal to output the trigger signal.
本發明另揭露一種供電模組,用於一感應式電源供應器,該供電模組包含有一供電線圈;一諧振電容,耦接於該供電線圈,用來搭配該供電線圈進行諧振;至少一供電驅動單元,耦接於該供電線圈,用來驅動該供電線圈產生能量;一外部電壓源,用來輸出一第一電源;一供電單元,耦接於該外部電壓源,用來接收該第一電源,以產生一第二電源;一訊號解析電路,耦接於該供電線圈,用來對該供電線圈之一線圈訊號進行解析,以取出一觸發訊號;以及一處理單元,用來接收該觸發訊號,並對該觸發訊號進行解碼,以取得一調制資料。該訊號解析電路包含有一第一分壓電路、一第一放大電路、一第一檢波電路、一第二分壓電路、一第二放大電路、一第二檢波電路、一交連電容及一第三分壓電路。該第一分壓電路耦接於該供電線圈,可用來對該供電線圈之一線圈訊號進行衰減,以產生一分壓線圈訊號。該第一放大電路耦接於該第一分壓電路,可用來取出該分壓線圈訊號高於一參考電壓的部分,以輸出一半波訊號。該第一檢波電路耦接於該第一放大電路,可用來對該半波訊號進行檢波,以產生一直流訊號,並加以輸出。該第二分壓電路耦接於該第一放大電路,可用來對該半波訊號進行衰減,以產生一分壓半波訊號。該第二放大電路耦接於該第一檢波電路及該第二分壓電路,可用來取出該分壓半波訊號高於該直流訊號的部分,以輸出一放大半波訊號。該第二檢波電路耦接於該第二放大電路,可用來對該放大半波訊號進行檢波,以產生一包絡訊號,並加以輸出。該交連電容耦接於該第二檢波電路,可用來對該包絡訊號進行濾波,以濾除該包絡訊號之一直流成分,並輸出該包絡訊號之一交流成分。該第三分壓電路耦接於該交連電容,可用來產生一直流電壓,該直流電壓並結合該包絡訊號之該交流成分,以輸出該觸發訊號。The present invention further discloses a power supply module for an inductive power supply, the power supply module includes a power supply coil, and a resonant capacitor coupled to the power supply coil for resonating with the power supply coil; at least one power supply a driving unit coupled to the power supply coil for driving the power supply coil to generate energy; an external voltage source for outputting a first power source; and a power supply unit coupled to the external voltage source for receiving the first And a processing unit configured to receive the trigger signal The signal is decoded and the modulated signal is obtained to obtain a modulated data. The signal analysis circuit includes a first voltage dividing circuit, a first amplifying circuit, a first detecting circuit, a second voltage dividing circuit, a second amplifying circuit, a second detecting circuit, a cross-connecting capacitor and a The third voltage dividing circuit. The first voltage dividing circuit is coupled to the power supply coil, and can be used to attenuate a coil signal of the power supply coil to generate a voltage dividing coil signal. The first amplifying circuit is coupled to the first voltage dividing circuit, and can be used to extract a portion of the voltage dividing coil signal higher than a reference voltage to output a half wave signal. The first detecting circuit is coupled to the first amplifying circuit, and can be used for detecting the half wave signal to generate a DC signal and output the signal. The second voltage dividing circuit is coupled to the first amplifying circuit and configured to attenuate the half wave signal to generate a divided voltage half wave signal. The second amplifying circuit is coupled to the first detecting circuit and the second voltage dividing circuit, and can be used to extract a portion of the divided half-wave signal higher than the DC signal to output an amplified half-wave signal. The second detection circuit is coupled to the second amplification circuit, and can be used to detect the amplified half-wave signal to generate an envelope signal and output the signal. The cross-connecting capacitor is coupled to the second detecting circuit and configured to filter the envelope signal to filter a DC component of the envelope signal and output an AC component of the envelope signal. The third voltage dividing circuit is coupled to the cross capacitance, and can be used to generate a DC voltage, which is combined with the AC component of the envelope signal to output the trigger signal.
請參考第2圖,第2圖為本發明實施例一供電模組20之示意圖。供電模組20可用於一感應式電源供應器,其包含有一供電線圈171、一諧振電容17、供電驅動單元12A及12B、一外部電壓源161、一供電單元16、一訊號解析電路200、一處理單元11及一顯示單元15。供電線圈171可用來發送能量至受電端,並接收來自受電端之反饋訊號,再將反饋訊號傳輸至訊號解析電路200進行解析處理。諧振電容17耦接於供電線圈171,可搭配供電線圈171進行諧振。供電驅動單元12A及12B耦接於供電線圈171及諧振電容17,可接收處理單元11的控制,用以驅動供電線圈171產生能量發送。供電驅動單元12A及12B同時運作時,可進行全橋驅動。在部分實施例中,亦可僅開啟供電驅動單元12A及12B其中一者,抑或僅配置一個供電驅動單元12A或12B,以進行半橋驅動。外部電壓源161可輸出一電源P1。供電單元16耦接於外部電壓源161,可接收電源P1以產生一電源P2。訊號解析電路200可對供電線圈171上的一線圈訊號V_coil進行解析,以取出一觸發訊號V_trig。處理單元11耦接於訊號解析電路200,可用來接收觸發訊號V_trig,並對觸發訊號V_trig進行解碼,以取得一調制資料。處理單元11可以是一微處理器(Microprocessor)、一微控制器(Micro Controller Unit,MCU)或任何類型的處理裝置。顯示單元15耦接於處理單元11,可用來顯示供電模組20之運作狀態。Please refer to FIG. 2 , which is a schematic diagram of a power supply module 20 according to an embodiment of the present invention. The power supply module 20 can be used in an inductive power supply, comprising a power supply coil 171, a resonant capacitor 17, power supply driving units 12A and 12B, an external voltage source 161, a power supply unit 16, a signal analysis circuit 200, and a power supply unit The processing unit 11 and a display unit 15. The power supply coil 171 can be used to transmit energy to the power receiving end, receive the feedback signal from the power receiving end, and then transmit the feedback signal to the signal analyzing circuit 200 for analysis. The resonant capacitor 17 is coupled to the power supply coil 171 and can be resonated with the power supply coil 171. The power supply driving units 12A and 12B are coupled to the power supply coil 171 and the resonant capacitor 17, and can receive control of the processing unit 11 for driving the power supply coil 171 to generate energy transmission. When the power supply driving units 12A and 12B operate simultaneously, full bridge driving can be performed. In some embodiments, only one of the power supply driving units 12A and 12B may be turned on, or only one power supply driving unit 12A or 12B may be configured to perform half bridge driving. The external voltage source 161 can output a power source P1. The power supply unit 16 is coupled to the external voltage source 161 and can receive the power source P1 to generate a power source P2. The signal analysis circuit 200 can analyze a coil signal V_coil on the power supply coil 171 to take out a trigger signal V_trig. The processing unit 11 is coupled to the signal analysis circuit 200 and configured to receive the trigger signal V_trig and decode the trigger signal V_trig to obtain a modulated data. The processing unit 11 can be a microprocessor, a Micro Controller Unit (MCU) or any type of processing device. The display unit 15 is coupled to the processing unit 11 and can be used to display the operating status of the power supply module 20.
相較於習知技術中的感應式電源供應器之供電模組,本發明主要改良的部分在於訊號解析電路之結構。在本發明中,訊號解析電路之前端係採用分壓電路對線圈電壓進行衰減,使得訊號解析電路可運作在低電壓下,可減少高壓電路元件的使用,以降低元件體積同時避免高壓造成電路燒毀。此外,本發明之訊號解析電路包含放大電路來放大欲解析的觸發訊號,可提升訊號判讀能力。Compared with the power supply module of the inductive power supply in the prior art, the main improvement of the present invention lies in the structure of the signal analysis circuit. In the present invention, the signal analysis circuit uses a voltage dividing circuit to attenuate the coil voltage at the front end, so that the signal analysis circuit can operate at a low voltage, which can reduce the use of high voltage circuit components, thereby reducing the component volume while avoiding high voltage. burn. In addition, the signal analysis circuit of the present invention includes an amplifying circuit for amplifying the trigger signal to be analyzed, thereby improving the signal interpretation capability.
在一實施例中,第2圖中的訊號解析電路200可包含二個放大電路,以透過二層放大來提升觸發訊號V_trig的強度,使其更容易被判讀。請參考第3圖,第3圖為訊號解析電路200之一種實施方式之示意圖。如第3圖所示,訊號解析電路200包含有分壓電路D1~D4、放大電路A1~A2、檢波電路E1~E2、一交連電容2208及一穩壓電容2102。其中,分壓電路D1耦接於供電線圈171,可用來對線圈訊號V_coil進行衰減,以產生一分壓線圈訊號V_coil’。放大電路A1耦接於分壓電路D1,可用來取出分壓線圈訊號V_coil’高於一參考電壓V_ref的部分,以輸出一半波訊號V_hw至檢波電路E1及分壓電路D2。檢波電路E1耦接於放大電路A1,可用來對半波訊號V_hw進行檢波,以產生一直流訊號V_dc,並加以輸出。分壓電路D2耦接於放大電路A1,可用來對半波訊號V_hw進行衰減,以產生一分壓半波訊號V_hw’。放大電路A2耦接於檢波電路E1及分壓電路D2,可用來取出分壓半波訊號V_hw’高於直流訊號V_dc的部分,以輸出一放大半波訊號V_hwa至檢波電路E2。檢波電路E2耦接於放大電路A2,可用來對放大半波訊號V_hwa進行檢波,以產生一包絡訊號(envelope signal)V_env,並加以輸出。交連電容2208耦接於檢波電路E2,可用來對包絡訊號V_env進行濾波,以濾除包絡訊號V_env之一直流成分,並輸出包絡訊號V_env之一交流成分。分壓電路D3耦接於交連電容2208,可用來產生一直流電壓,並結合該直流電壓與包絡訊號V_env之交流成分,以輸出觸發訊號V_trig。分壓電路D4耦接於放大電路A1,可用來產生參考電壓V_ref,並將參考電壓V_ref輸出至放大電路A1。穩壓電容2102則耦接於分壓電路D4,可用來穩定參考電壓V_ref。In an embodiment, the signal analysis circuit 200 in FIG. 2 may include two amplification circuits to enhance the intensity of the trigger signal V_trig through the two-layer amplification to make it easier to be interpreted. Please refer to FIG. 3, which is a schematic diagram of an embodiment of the signal analysis circuit 200. As shown in FIG. 3, the signal analysis circuit 200 includes voltage dividing circuits D1 to D4, amplification circuits A1 to A2, detection circuits E1 to E2, a cross capacitance 2208, and a voltage stabilization capacitor 2102. The voltage dividing circuit D1 is coupled to the power feeding coil 171 and can be used to attenuate the coil signal V_coil to generate a voltage dividing coil signal V_coil'. The amplifying circuit A1 is coupled to the voltage dividing circuit D1, and can be used to extract a portion of the voltage dividing coil signal V_coil' higher than a reference voltage V_ref to output a half wave signal V_hw to the detecting circuit E1 and the voltage dividing circuit D2. The detection circuit E1 is coupled to the amplifying circuit A1 and can be used for detecting the half-wave signal V_hw to generate a DC signal V_dc and output it. The voltage dividing circuit D2 is coupled to the amplifying circuit A1 and can be used to attenuate the half wave signal V_hw to generate a divided half wave signal V_hw'. The amplifying circuit A2 is coupled to the detecting circuit E1 and the voltage dividing circuit D2, and can be used to extract a portion of the divided half-wave signal V_hw' higher than the direct current signal V_dc to output an amplified half-wave signal V_hwa to the detecting circuit E2. The detection circuit E2 is coupled to the amplifying circuit A2 and can be used for detecting the amplified half-wave signal V_hwa to generate an envelope signal V_env and output the signal. The cross-connect capacitor 2208 is coupled to the detection circuit E2 and can be used to filter the envelope signal V_env to filter out a DC component of the envelope signal V_env and output an AC component of the envelope signal V_env. The voltage dividing circuit D3 is coupled to the cross-connecting capacitor 2208, and can be used to generate a DC voltage, and combine the DC voltage with the AC component of the envelope signal V_env to output the trigger signal V_trig. The voltage dividing circuit D4 is coupled to the amplifying circuit A1 and can be used to generate the reference voltage V_ref and output the reference voltage V_ref to the amplifying circuit A1. The voltage stabilizing capacitor 2102 is coupled to the voltage dividing circuit D4 and can be used to stabilize the reference voltage V_ref.
詳細來說,當線圈訊號V_coil進入訊號解析電路200時,會先進入分壓電路D1。分壓電路D1會對線圈訊號V_coil進行衰減,產生分壓線圈訊號V_coil’。一般來說,衰減倍率可為50倍或100倍不等,其目的在於使線圈訊號V_coil進入訊號解析電路200後端元件及處理單元11之前先衰減至較低的電壓,使得線圈訊號V_coil可在後端元件及處理單元11容許的工作電壓範圍內進行處理。另一方面,分壓電路D4可從外部電壓源161接收電源P1,並對電源P1進行衰減而產生參考電壓V_ref。放大電路A1可同時接收分壓線圈訊號V_coil’及參考電壓V_ref,並輸出分壓線圈訊號V_coil’高於參考電壓V_ref的部分,作為半波訊號V_hw。較佳地,分壓電路D1及D4可採用適合的衰減倍率,使得放大電路A1所輸出的半波訊號V_hw包含供電線圈171振盪而產生的弦波,並排除驅動訊號之方波切換所產生的跨壓,以避免習知技術中跨壓造成功率調節誤判的缺點。舉例來說,在一實施例中,可設定分壓電路D4對電源P1進行衰減而產生參考電壓V_ref之衰減倍率等於分壓電路D1對線圈訊號V_coil進行衰減的倍率,使其輸出的分壓線圈訊號V_coil’及參考電壓V_ref位於相對應的準位。In detail, when the coil signal V_coil enters the signal analysis circuit 200, it first enters the voltage dividing circuit D1. The voltage dividing circuit D1 attenuates the coil signal V_coil to generate a voltage dividing coil signal V_coil'. In general, the attenuation ratio may be 50 times or 100 times, and the purpose is to attenuate the coil signal V_coil to a lower voltage before entering the back component of the signal analysis circuit 200 and the processing unit 11, so that the coil signal V_coil can be The back end component and the processing unit 11 are processed within a range of operating voltages that are tolerated. On the other hand, the voltage dividing circuit D4 can receive the power source P1 from the external voltage source 161 and attenuate the power source P1 to generate the reference voltage V_ref. The amplifying circuit A1 can simultaneously receive the voltage dividing coil signal V_coil' and the reference voltage V_ref, and output a portion of the voltage dividing coil signal V_coil' higher than the reference voltage V_ref as the half wave signal V_hw. Preferably, the voltage dividing circuits D1 and D4 can adopt a suitable attenuation ratio, so that the half-wave signal V_hw outputted by the amplifying circuit A1 includes the sine wave generated by the oscillation of the power supply coil 171, and the square wave switching of the driving signal is excluded. The cross-pressure is to avoid the shortcomings of power regulation misjudgment caused by cross-pressure in the prior art. For example, in an embodiment, the voltage dividing circuit D4 can be set to attenuate the power source P1 to generate a reference voltage V_ref, and the attenuation ratio is equal to the frequency at which the voltage dividing circuit D1 attenuates the coil signal V_coil, so that the output is divided. The pressure coil signal V_coil' and the reference voltage V_ref are at corresponding levels.
請參考第4圖,第4圖為放大電路A1運作之訊號波形示意圖,其繪示了分壓線圈訊號V_coil’、參考電壓V_ref及半波訊號V_hw之波形。由第4圖可知,參考電壓V_ref的準位大致等於分壓線圈訊號V_coil’之正半週期的最低電壓,在此情況下,放大電路A1取出分壓線圈訊號V_coil’高於參考電壓V_ref的部分而產生的半波訊號V_hw可包含正半週期的弦波,並排除驅動訊號之方波切換所產生的跨壓。如此一來,可避免跨壓造成處理單元11進行功率調節的誤判或影響調制訊號的判讀。Please refer to FIG. 4, which is a schematic diagram of the signal waveform of the operation of the amplifying circuit A1, which shows the waveforms of the voltage dividing coil signal V_coil', the reference voltage V_ref and the half wave signal V_hw. As can be seen from FIG. 4, the reference voltage V_ref is substantially equal to the lowest voltage of the positive half cycle of the voltage dividing coil signal V_coil'. In this case, the amplifying circuit A1 takes out the portion of the voltage dividing coil signal V_coil' higher than the reference voltage V_ref. The generated half-wave signal V_hw may include a sine wave of a positive half cycle, and excludes the cross-voltage generated by the square wave switching of the driving signal. In this way, it is possible to avoid the misjudgment of the power adjustment by the processing unit 11 or the interpretation of the modulation signal caused by the voltage across the voltage.
接著,半波訊號V_hw可分別輸入至檢波電路E1及分壓電路D2進行處理。為取出調制訊號的細微變化,檢波電路E1可根據半波訊號V_hw的波形,產生直流訊號V_dc作為參考準位。分壓電路D2則對半波訊號V_hw進行衰減而產生分壓半波訊號V_hw’。放大電路A2再接收分壓半波訊號V_hw’及直流訊號V_dc,並輸出分壓半波訊號V_hw’高於直流訊號V_dc的部分(即分壓半波訊號V_hw’的波峰部分),作為放大半波訊號V_hwa。Then, the half wave signal V_hw can be input to the detection circuit E1 and the voltage dividing circuit D2 for processing. In order to take out the subtle change of the modulation signal, the detection circuit E1 can generate the DC signal V_dc as the reference level according to the waveform of the half-wave signal V_hw. The voltage dividing circuit D2 attenuates the half-wave signal V_hw to generate a divided-wave half-wave signal V_hw'. The amplifying circuit A2 receives the divided voltage half wave signal V_hw' and the direct current signal V_dc, and outputs a portion of the divided voltage half wave signal V_hw' higher than the direct current signal V_dc (ie, the peak portion of the divided voltage half wave signal V_hw') as an amplification half. Wave number V_hwa.
請參考第5圖,第5圖為放大電路A2運作之訊號波形示意圖,其繪示了分壓半波訊號V_hw’、直流訊號V_dc及放大半波訊號V_hwa之波形。由第5圖可知,直流訊號V_dc的準位大致接近但不超過分壓半波訊號V_hw’的峰值電壓,在此情況下,放大電路A2取出分壓半波訊號V_hw’高於直流訊號V_dc的部分所產生的放大半波訊號V_hwa可包含分壓半波訊號V_hw’峰值的變化量,放大電路A2再將峰值變化量放大。如此一來,由放大半波訊號V_hwa可明顯看出其波形已包含訊號調制產生的峰值變化,如第5圖所示。Please refer to FIG. 5, which is a schematic diagram of the signal waveform of the operation of the amplifying circuit A2, which shows the waveforms of the divided half-wave signal V_hw', the direct current signal V_dc and the amplified half-wave signal V_hwa. It can be seen from Fig. 5 that the level of the direct current signal V_dc is substantially close to but not exceeding the peak voltage of the divided half-wave signal V_hw'. In this case, the amplifying circuit A2 takes out the divided half-wave signal V_hw' higher than the direct current signal V_dc. The amplified half-wave signal V_hwa generated by the part may include the amount of change of the peak value of the divided half-wave signal V_hw', and the amplifying circuit A2 further amplifies the peak change amount. In this way, it can be clearly seen from the amplified half-wave signal V_hwa that the waveform already contains the peak change caused by the signal modulation, as shown in FIG.
接著,放大半波訊號V_hwa可輸入至檢波電路E2進行檢波。檢波電路E2可濾除放大半波訊號V_hwa中的高頻成分,以根據放大半波訊號V_hwa之峰值變化來產生包絡訊號V_env,並將包絡訊號V_env輸出至交連電容2208。交連電容2208可濾除包絡訊號V_env中的直流成分,並輸出包絡訊號V_env中的交流成分,此交流成分再結合分壓電路D3產生的直流電壓之後,輸出至處理單元11,以供處理單元11進行觸發訊號V_trig的判讀。需注意的是,處理單元11需在穩定的直流準位之下進行觸發訊號V_trig的判讀,因此其接收的觸發訊號V_trig需位於固定的準位。然而,供電線圈171上的線圈訊號V_coil可能因受電端負載的影響而產生大幅變化,經由訊號解析電路200的解析處理之後,產生的包絡訊號V_env的準位可能因負載變化而有所變動。在此例中,交連電容2208可濾除包絡訊號V_env中的直流成分,再將包絡訊號V_env中的交流成分搭載在分壓電路D3所產生的固定直流準位上,以輸出至處理單元11,使得處理單元11能夠準確地進行觸發訊號V_trig的判讀。Then, the amplified half-wave signal V_hwa can be input to the detection circuit E2 for detection. The detection circuit E2 can filter out the high frequency component in the amplified half wave signal V_hwa to generate the envelope signal V_env according to the peak value of the amplified half wave signal V_hwa, and output the envelope signal V_env to the cross capacitance 2208. The cross-connecting capacitor 2208 can filter the DC component in the envelope signal V_env and output the AC component in the envelope signal V_env. The AC component is combined with the DC voltage generated by the voltage dividing circuit D3, and then output to the processing unit 11 for processing. 11 Perform the interpretation of the trigger signal V_trig. It should be noted that the processing unit 11 needs to perform the interpretation of the trigger signal V_trig under the stable DC level, so the received trigger signal V_trig needs to be at a fixed level. However, the coil signal V_coil on the power supply coil 171 may be greatly changed due to the influence of the load on the power receiving end. After the analysis processing by the signal analysis circuit 200, the level of the generated envelope signal V_env may vary due to load changes. In this example, the cross-connect capacitor 2208 can filter the DC component in the envelope signal V_env, and then mount the AC component in the envelope signal V_env on the fixed DC level generated by the voltage divider circuit D3 for output to the processing unit 11 So that the processing unit 11 can accurately perform the interpretation of the trigger signal V_trig.
請參考第6圖,第6圖為檢波電路E2、交連電容2208及分壓電路D3運作之訊號波形示意圖,其繪示了放大半波訊號V_hwa、包絡訊號V_env、觸發訊號V_trig及線圈訊號V_coil之波形。由第6圖可知,包絡訊號V_env大致隨著放大半波訊號V_hwa的峰值而變化。交連電容2208濾除了包絡訊號V_env之直流成分以後,再經由分壓電路D3提供固定的直流準位,以輸出觸發訊號V_trig至處理單元11。進一步參考線圈訊號V_coil之波形可知,訊號調制在線圈訊號V_coil之波形上產生的細微變化,透過訊號解析電路200的處理,可產生具有明顯變化量的觸發訊號V_trig,使得處理單元11可有效地進行訊號判讀。Please refer to FIG. 6 , FIG. 6 is a schematic diagram of signal waveforms of the detection circuit E2 , the cross-connecting capacitor 2208 and the voltage dividing circuit D3 , which shows the amplified half-wave signal V_hwa, the envelope signal V_env, the trigger signal V_trig and the coil signal V_coil. Waveform. As can be seen from Fig. 6, the envelope signal V_env substantially changes with the peak value of the amplified half-wave signal V_hwa. After the DC component of the envelope signal V_env is filtered, the cross-connect capacitor 2208 provides a fixed DC level via the voltage dividing circuit D3 to output the trigger signal V_trig to the processing unit 11. Further, referring to the waveform of the coil signal V_coil, the signal modulation is slightly changed on the waveform of the coil signal V_coil. Through the processing of the signal analysis circuit 200, the trigger signal V_trig having a significant amount of change can be generated, so that the processing unit 11 can effectively perform Signal interpretation.
請參考第7圖,第7圖為供電模組20之一種實施方式之示意圖,其進一步繪示了供電模組20中的訊號解析電路200之詳細電路結構。詳細來說,在訊號解析電路200中,分壓電阻2101及2103構成分壓電路D4,其可對電源P1進行衰減而產生參考電壓V_ref,並加以輸出。分壓電阻2104及2105構成分壓電路D1,其可對線圈訊號V_coil進行衰減而產生分壓線圈訊號V_coil’,並加以輸出。放大電路A1包含有一運算放大器21、一輸入電阻2106及一回授電阻2107。其中,運算放大器21可對分壓線圈訊號V_coil’高於參考電壓V_ref的部分進行放大,其正輸入端可用來接收分壓線圈訊號V_coil’,負輸入端可用來接收參考電壓V_ref,而輸出端則用來輸出半波訊號V_hw。輸入電阻2106耦接於運算放大器21之負輸入端與分壓電路D4之間,回授電阻2107耦接於運算放大器21之負輸入端與輸出端之間,輸入電阻2106及回授電阻2107的阻值則用來決定放大分壓線圈訊號V_coil’高於參考電壓V_ref的部分之放大倍率。檢波電路E1包含有一檢波二極體2108、一匹配電阻2109、一濾波電容2110及一負載電阻2111。其中,檢波二極體2108可用來接收半波訊號V_hw;濾波電容2110可用來濾除半波訊號V_hw中的高頻成分;負載電阻2111耦接於濾波電容2110,可用來提供濾波電容2110之放電匹配使用;匹配電阻2109則耦接於檢波二極體2108、濾波電容2110及負載電阻2111之間,可用來進行阻抗匹配。詳細來說,為避免檢波電路E1中的濾波電容2110充放電速度過快,造成直流訊號V_dc無法穩定輸出,需在檢波二極體2108、濾波電容2110及負載電阻2111之間設置匹配電阻2109。匹配電阻2109亦可降低檢波電路E1所輸出的直流訊號V_dc的準位,以控制其略低於分壓半波訊號V_hw’的峰值電壓。除此之外,檢波電路E1另耦接於處理單元11,並輸出直流訊號V_dc至處理單元11,使得處理單元11可根據直流訊號V_dc的大小來計算並量測供電線圈171之交流訊號電壓,以進行功率調節。Please refer to FIG. 7 . FIG. 7 is a schematic diagram of an embodiment of a power supply module 20 , which further illustrates a detailed circuit structure of the signal analysis circuit 200 in the power supply module 20 . In detail, in the signal analysis circuit 200, the voltage dividing resistors 2101 and 2103 constitute a voltage dividing circuit D4 which attenuates the power source P1 to generate a reference voltage V_ref and outputs it. The voltage dividing resistors 2104 and 2105 constitute a voltage dividing circuit D1 which attenuates the coil signal V_coil to generate a voltage dividing coil signal V_coil' and outputs it. The amplifying circuit A1 includes an operational amplifier 21, an input resistor 2106 and a feedback resistor 2107. The operational amplifier 21 can amplify a portion of the voltage dividing coil signal V_coil' higher than the reference voltage V_ref, and the positive input terminal can be used to receive the voltage dividing coil signal V_coil', the negative input terminal can be used to receive the reference voltage V_ref, and the output terminal is used. It is used to output the half-wave signal V_hw. The input resistor 2106 is coupled between the negative input terminal of the operational amplifier 21 and the voltage dividing circuit D4. The feedback resistor 2107 is coupled between the negative input terminal and the output terminal of the operational amplifier 21, and the input resistor 2106 and the feedback resistor 2107. The resistance value is used to determine the magnification of the portion of the amplified voltage dividing coil signal V_coil' higher than the reference voltage V_ref. The detection circuit E1 includes a detection diode 2108, a matching resistor 2109, a filter capacitor 2110 and a load resistor 2111. The detection diode 2108 can be used to receive the half-wave signal V_hw; the filter capacitor 2110 can be used to filter out the high-frequency component of the half-wave signal V_hw; the load resistor 2111 is coupled to the filter capacitor 2110, which can be used to provide the discharge of the filter capacitor 2110. The matching resistor 2109 is coupled between the detecting diode 2108, the filter capacitor 2110 and the load resistor 2111, and can be used for impedance matching. In detail, in order to avoid the charging and discharging speed of the filter capacitor 2110 in the detecting circuit E1 being too fast, the DC signal V_dc cannot be stably outputted, and the matching resistor 2109 is required to be disposed between the detecting diode 2108, the filter capacitor 2110 and the load resistor 2111. The matching resistor 2109 can also lower the level of the DC signal V_dc outputted by the detector circuit E1 to control the peak voltage which is slightly lower than the divided half-wave signal V_hw'. In addition, the detection circuit E1 is coupled to the processing unit 11 and outputs the DC signal V_dc to the processing unit 11, so that the processing unit 11 can calculate and measure the AC signal voltage of the power supply coil 171 according to the magnitude of the DC signal V_dc. For power adjustment.
此外,分壓電阻2202及2203構成分壓電路D2,其可對半波訊號V_hw進行衰減而產生分壓半波訊號V_hw’,並加以輸出。此外,由於直流訊號V_dc係半波訊號V_hw通過檢波二極體2108的順向導通壓差所降壓,再藉由匹配電阻2109及負載電阻2111的分壓而產生,因此,半波訊號V_hw亦可先通過一匹配二極體2118進行順向導通壓差的降壓之後,再藉由分壓電阻2202及2203的分壓而產生分壓半波訊號V_hw’,使得直流訊號V_dc與分壓半波訊號V_hw’可具有相對應的電壓準位(即直流訊號V_dc位於略低於分壓半波訊號V_hw’之峰值電壓的準位)。放大電路A2包含有一運算放大器22、一輸入電阻2201及一回授電阻2204。其中,運算放大器22可對分壓半波訊號V_hw’高於直流訊號V_dc的部分進行放大,其正輸入端可用來接收分壓半波訊號V_hw’,負輸入端可用來接收直流訊號V_dc,而輸出端則用來輸出放大半波訊號V_hwa。輸入電阻2201耦接於運算放大器22之負輸入端與檢波電路E1之間,回授電阻2204耦接於運算放大器22之負輸入端與輸出端之間,輸入電阻2201及回授電阻2204的阻值則用來決定放大分壓半波訊號V_hw’高於直流訊號V_dc的部分之放大倍率。檢波電路E2包含有一檢波二極體2205、一濾波電容2206及一負載電阻2207。其中,檢波二極體2205可用來接收放大半波訊號V_hwa;濾波電容2206耦接於檢波二極體2205,可用來濾除放大半波訊號V_hwa中的高頻成分;負載電阻2111耦接於濾波電容2206及檢波二極體2205,可用來提供濾波電容2206之放電匹配使用。接著,檢波電路E2所輸出的包絡訊號V_env在交連電容2208濾除直流成分之後進入分壓電路D3。分壓電路D3則透過分壓電阻2209及2210產生處理單元11可處理之直流電壓,並將該直流電壓結合包絡訊號V_env之交流成分,進而輸出觸發訊號V_trig至處理單元11。Further, the voltage dividing resistors 2202 and 2203 constitute a voltage dividing circuit D2 which attenuates the half wave signal V_hw to generate a divided voltage half wave signal V_hw' and outputs it. In addition, since the DC signal V_dc half-wave signal V_hw is stepped down by the forward voltage difference of the detection diode 2108, and is generated by the voltage division of the matching resistor 2109 and the load resistor 2111, the half-wave signal V_hw is also After the step-down voltage difference is stepped down by a matching diode 2118, the divided voltage wave signal V_hw' is generated by the voltage division of the voltage dividing resistors 2202 and 2203, so that the DC signal V_dc and the voltage dividing half are generated. The wave signal V_hw' may have a corresponding voltage level (ie, the DC signal V_dc is at a level slightly lower than the peak voltage of the divided half-wave signal V_hw'). The amplifying circuit A2 includes an operational amplifier 22, an input resistor 2201 and a feedback resistor 2204. The operational amplifier 22 can amplify a portion of the divided half-wave signal V_hw' higher than the DC signal V_dc, and the positive input terminal can be used to receive the divided voltage half-wave signal V_hw', and the negative input terminal can be used to receive the DC signal V_dc. The output is used to output an amplified half-wave signal V_hwa. The input resistor 2201 is coupled between the negative input terminal of the operational amplifier 22 and the detection circuit E1. The feedback resistor 2204 is coupled between the negative input terminal and the output terminal of the operational amplifier 22, and the resistance of the input resistor 2201 and the feedback resistor 2204. The value is used to determine the magnification of the portion of the amplified partial voltage half-wave signal V_hw' that is higher than the DC signal V_dc. The detection circuit E2 includes a detection diode 2205, a filter capacitor 2206 and a load resistor 2207. The detection diode 2205 can be used to receive the amplified half-wave signal V_hwa; the filter capacitor 2206 is coupled to the detection diode 2205, which can be used to filter out the high-frequency component of the amplified half-wave signal V_hwa; the load resistor 2111 is coupled to the filter Capacitor 2206 and detector diode 2205 can be used to provide discharge matching of filter capacitor 2206. Next, the envelope signal V_env outputted by the detection circuit E2 enters the voltage dividing circuit D3 after the DC component is filtered by the cross capacitance 2208. The voltage dividing circuit D3 generates a DC voltage that can be processed by the processing unit 11 through the voltage dividing resistors 2209 and 2210, and combines the DC voltage with the AC component of the envelope signal V_env to output the trigger signal V_trig to the processing unit 11.
除此之外,供電模組20中的供電單元16包含有一降壓式穩壓器164及一電壓偵測電路160。降壓式穩壓器164可從外部電壓源接收電源P1,並對電源P1進行降壓以產生電源P2,再加以輸出。詳細來說,電源P1需用來驅動供電線圈171進行運作,其往往具有極高的電壓準位;而電源P2主要用來供應處理單元11的工作電壓,因此遠低於線圈上的電壓以及電源P1之電壓。在供電模組20中,供電驅動單元12A、12B及分壓電路D4係由電源P1進行供電。詳細來說,供電驅動單元12A及12B係透過電源P1產生的驅動電壓來驅動供電線圈171進行振盪,分壓電路D4則對電源P1進行衰減而產生參考電壓V_ref,使參考電壓V_ref之準位可對應於衰減後的線圈電壓V_coil。另一方面,處理單元11、放大電路A1、A2及分壓電路D3係由準位較低的電源P2進行供電,使得經由放大電路A1、A2及分壓電路D3處理後的訊號可在處理單元11容許的準位之下輸入處理單元11,以進行後續解碼及處理。換句話說,處理單元11的工作電壓與訊號解析電路200中的放大電路A1、A2及分壓電路D3等元件之工作電壓皆等於電源P2之電壓準位,在此情形下,經由放大電路A1及A2放大後的訊號之最大電壓必然限制在電源P2電壓之下,因此,傳送至處理單元11的觸發訊號V_trig及直流訊號V_dc皆不會超過處理單元11的最大容許電壓,使得處理單元11可正常運作而不致燒毀。In addition, the power supply unit 16 in the power supply module 20 includes a buck regulator 164 and a voltage detecting circuit 160. The buck regulator 164 can receive the power supply P1 from an external voltage source, and step down the power supply P1 to generate the power supply P2, and then output it. In detail, the power supply P1 is required to drive the power supply coil 171 to operate, which tends to have a very high voltage level; and the power supply P2 is mainly used to supply the operating voltage of the processing unit 11, and thus is much lower than the voltage on the coil and the power supply. The voltage of P1. In the power supply module 20, the power supply driving units 12A, 12B and the voltage dividing circuit D4 are powered by the power source P1. In detail, the power supply driving units 12A and 12B drive the power supply coil 171 to oscillate through the driving voltage generated by the power source P1, and the voltage dividing circuit D4 attenuates the power source P1 to generate the reference voltage V_ref, so that the reference voltage V_ref is leveled. It can correspond to the attenuated coil voltage V_coil. On the other hand, the processing unit 11, the amplifying circuits A1, A2, and the voltage dividing circuit D3 are powered by the power source P2 having a lower level, so that the signals processed by the amplifying circuits A1, A2 and the voltage dividing circuit D3 can be The processing unit 11 inputs the processing unit 11 under the level allowed by the processing unit 11 for subsequent decoding and processing. In other words, the operating voltage of the processing unit 11 and the operating voltages of the amplifying circuits A1, A2 and the voltage dividing circuit D3 in the signal analyzing circuit 200 are equal to the voltage level of the power source P2, in this case, via the amplifying circuit. The maximum voltage of the amplified signals of A1 and A2 is necessarily limited to the voltage of the power supply P2. Therefore, the trigger signal V_trig and the direct current signal V_dc transmitted to the processing unit 11 do not exceed the maximum allowable voltage of the processing unit 11, so that the processing unit 11 It works normally without burning.
此外,電壓偵測電路160耦接於處理單元11,可用來輸出對應於電源P1之一電源訊號予處理單元11,以供處理單元11偵測電源P1之電壓。在供電模組20中,電壓偵測電路160係透過分壓電阻162及163來實現,但不應以此為限。In addition, the voltage detecting circuit 160 is coupled to the processing unit 11 and can be used to output a power signal corresponding to the power source P1 to the processing unit 11 for the processing unit 11 to detect the voltage of the power source P1. In the power supply module 20, the voltage detecting circuit 160 is implemented by the voltage dividing resistors 162 and 163, but should not be limited thereto.
透過上述訊號解析電路200之電路結構及其運作方式,本發明可取出供電線圈171上細微的振幅變化,以產生觸發訊號V_trig。處理單元11再對觸發訊號V_trig進行解碼而取得資料碼。如第6圖所示,訊號解析電路200可將線圈訊號V_coil上的細微變化轉換為觸發訊號V_trig,以供處理單元11進行判讀。第8圖進一步繪示連續多筆觸發的情況,由第8圖可看出,每一次線圈訊號V_coil的峰值細微變化皆可在觸發訊號V_trig上產生明顯的變化。Through the circuit structure of the signal analysis circuit 200 and the operation mode thereof, the present invention can take out a slight amplitude variation on the power supply coil 171 to generate the trigger signal V_trig. The processing unit 11 further decodes the trigger signal V_trig to obtain a data code. As shown in FIG. 6, the signal analysis circuit 200 can convert the subtle changes on the coil signal V_coil into the trigger signal V_trig for the processing unit 11 to perform the interpretation. Fig. 8 further illustrates the case of continuous multi-stroke. As can be seen from Fig. 8, the slight change of the peak value of each coil signal V_coil can produce a significant change on the trigger signal V_trig.
在本發明之訊號解析電路中,由於其輸入端的分壓電路直接對來自於線圈的訊號進行大幅度的衰減,因此後端電路皆可採用耐壓要求較低的電路元件,可大幅降低電路成本及元件體積。此外,本發明之訊號解析電路係直接針對交流訊號進行分析及處理,不同於習知訊號解析電路先將線圈訊號進行低通濾波再進行處理的方式。換句話說,本發明之訊號解析電路未包含低通濾波電路,可針對原始訊號進行處理,不會因低通濾波而誤將變化量較小的訊號濾除。In the signal analysis circuit of the present invention, since the voltage dividing circuit at the input end directly attenuates the signal from the coil, the back-end circuit can adopt circuit components with lower withstand voltage requirements, which can greatly reduce the circuit. Cost and component volume. In addition, the signal analysis circuit of the present invention directly analyzes and processes the AC signal, and is different from the conventional signal analysis circuit in which the coil signal is low-pass filtered and processed. In other words, the signal analysis circuit of the present invention does not include a low-pass filter circuit, and can process the original signal without erroneously filtering out the signal with less variation due to low-pass filtering.
進一步來說,本發明之訊號解析電路採用二個放大器來實現訊號的放大。其中,第一階段的放大可去除驅動訊號之方波切換所產生的跨壓,第二階段的放大則用來取出線圈訊號上的細微變化。相較於習知低通濾波電路往往需透過大量電路元件來實現(例如一主動低通濾波電路需要超過十個放大器),本發明使用較少的電路元件即可取出觸發訊號。此外,本發明之電路元件參數皆可依固定比例來進行設計,使得訊號解析電路在不同驅動電壓下皆可正常運作,而第二階段放大訊號變化量之運作可透過電阻阻值的調整來改變放大電路的放大倍率,可藉此輕易地調整訊號解析的靈敏度,以符合產品規格的要求。Further, the signal analysis circuit of the present invention uses two amplifiers to achieve signal amplification. Among them, the amplification of the first stage can remove the cross-voltage generated by the square wave switching of the driving signal, and the amplification of the second stage is used to take out the subtle changes on the coil signal. Compared with the conventional low-pass filter circuit, it is often required to implement a large number of circuit components (for example, an active low-pass filter circuit requires more than ten amplifiers), and the present invention can take out the trigger signal by using fewer circuit components. In addition, the circuit component parameters of the present invention can be designed according to a fixed ratio, so that the signal analysis circuit can operate normally under different driving voltages, and the operation of the second stage amplification signal variation can be changed through the adjustment of the resistance value. The magnification of the amplifier circuit allows the sensitivity of the signal analysis to be easily adjusted to meet product specifications.
綜上所述,本發明之訊號解析電路可用於感應式電源供應器之供電模組,其可透過二個放大器來實現二階段的訊號放大,同時去除線圈訊號上驅動訊號之方波切換所產生的跨壓,以避免該跨壓造成功率調節的誤判或影響調制訊號的判讀。透過本發明之訊號解析電路,可取出線圈訊號上細微的振幅變化而取得觸發訊號,訊號解析電路之電路結構使其可在低電壓下進行運作,可達到低成本及低體積等優點,同時實現良好的訊號解析效能。 以上所述僅為本發明之較佳實施例,凡依本發明申請專利範圍所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。In summary, the signal analysis circuit of the present invention can be used in a power supply module of an inductive power supply, which can realize two-stage signal amplification through two amplifiers, and remove the square wave switching of the driving signal on the coil signal. The cross-pressure is to avoid the misjudgment of the power regulation caused by the cross-voltage or the interpretation of the modulation signal. Through the signal analysis circuit of the present invention, a slight amplitude change on the coil signal can be taken to obtain a trigger signal, and the circuit structure of the signal analysis circuit can operate at a low voltage, thereby achieving the advantages of low cost and low volume, and at the same time realizing Good signal resolution performance. The above are only the preferred embodiments of the present invention, and all changes and modifications made to the scope of the present invention should be within the scope of the present invention.
W1_1、W1_2、W1_3‧‧‧波形
20‧‧‧供電模組
11‧‧‧處理單元
12A、12B‧‧‧供電驅動單元
15‧‧‧顯示單元
16‧‧‧供電單元
161‧‧‧外部電壓源
17‧‧‧諧振電容
171‧‧‧供電線圈
200‧‧‧訊號解析電路
P1、P2‧‧‧電源
V_coil‧‧‧線圈訊號
V_trig‧‧‧觸發訊號
D1~D4‧‧‧分壓電路
A1~A2‧‧‧放大電路
E1~E2‧‧‧檢波電路
2102‧‧‧穩壓電容
2208‧‧‧交連電容
V_coil’‧‧‧分壓線圈訊號
V_ref‧‧‧參考電壓
V_hw‧‧‧半波訊號
V_dc‧‧‧直流訊號
V_hw’‧‧‧分壓半波訊號
V_hwa‧‧‧放大半波訊號
V_env‧‧‧包絡訊號
2101、2103、2104、2105、2202、2203、2209、2210‧‧‧分壓電阻
21、22‧‧‧運算放大器
2106、2201‧‧‧輸入電阻
2107、2204‧‧‧回授電阻
2108、2205‧‧‧檢波二極體
2109‧‧‧匹配電阻
2110、2206‧‧‧濾波電容
2111、2207‧‧‧負載電阻
2118‧‧‧匹配二極體
160‧‧‧電壓偵測電路
162、163‧‧‧分壓電阻
W1_1, W1_2, W1_3‧‧‧ waveform
20‧‧‧Power supply module
11‧‧‧Processing unit
12A, 12B‧‧‧Power supply unit
15‧‧‧Display unit
16‧‧‧Power supply unit
161‧‧‧External voltage source
17‧‧‧Resonance capacitor
171‧‧‧Power supply coil
200‧‧‧Signal analysis circuit
P1, P2‧‧‧ power supply
V_coil‧‧‧ coil signal
V_trig‧‧‧ trigger signal
D1~D4‧‧‧voltage circuit
A1~A2‧‧‧Amplification circuit
E1~E2‧‧‧Detection circuit
2102‧‧‧Steady capacitor
2208‧‧‧Cross-connection capacitor
V_coil'‧‧‧ partial pressure coil signal
V_ref‧‧‧reference voltage
V_hw‧‧‧ half wave signal
V_dc‧‧‧DC signal
V_hw'‧‧‧ partial pressure half-wave signal
V_hwa‧‧‧Amplify half-wave signal
V_env‧‧‧ envelope signal
2101, 2103, 2104, 2105, 2202, 2203, 2209, 2210‧ ‧ div.
21, 22‧‧‧Operational Amplifier
2106, 2201‧‧‧ input resistance
2107, 2204‧‧‧Responsible resistance
2108, 2205‧‧‧Detector diode
2109‧‧‧Matching resistor
2110, 2206‧‧‧ Filter capacitor
2111, 2207‧‧‧ load resistor
2118‧‧‧Matching diodes
160‧‧‧Voltage detection circuit
162, 163‧‧ ‧ voltage divider resistor
164‧‧‧降壓式穩壓器 164‧‧‧Buck regulator
第1圖為感應式電源供應器之供電線圈之波形示意圖。 第2圖為本發明實施例一供電模組之示意圖。 第3圖為訊號解析電路之一種實施方式之示意圖。 第4圖為放大電路運作之訊號波形示意圖。 第5圖為另一放大電路運作之訊號波形示意圖。 第6圖為檢波電路、交連電容及分壓電路運作之訊號波形示意圖。 第7圖為供電模組之一種實施方式之示意圖。 第8圖為本發明實施例連續多筆觸發之訊號波形示意圖。Figure 1 is a waveform diagram of the power supply coil of the inductive power supply. FIG. 2 is a schematic diagram of a power supply module according to an embodiment of the present invention. Figure 3 is a schematic diagram of an embodiment of a signal analysis circuit. Figure 4 is a schematic diagram of the signal waveform of the operation of the amplifier circuit. Figure 5 is a schematic diagram of the signal waveform of another amplifier circuit operation. Figure 6 is a schematic diagram of the signal waveforms of the operation of the detector circuit, the cross-connect capacitor and the voltage divider circuit. Figure 7 is a schematic diagram of an embodiment of a power supply module. FIG. 8 is a schematic diagram of signal waveforms triggered by continuous multiple strokes according to an embodiment of the present invention.
200‧‧‧訊號解析電路 200‧‧‧Signal analysis circuit
P1、P2‧‧‧電源 P1, P2‧‧‧ power supply
D1~D4‧‧‧分壓電路 D1~D4‧‧‧voltage circuit
A1~A2‧‧‧放大電路 A1~A2‧‧‧Amplifier circuit
E1~E2‧‧‧檢波電路 E1~E2‧‧‧Detection circuit
2102‧‧‧穩壓電容 2102‧‧‧Steady capacitor
2208‧‧‧交連電容 2208‧‧‧Cross-connection capacitor
V_coil‧‧‧線圈訊號 V_coil‧‧‧ coil signal
V_coil’‧‧‧分壓線圈訊號 V_coil’‧‧‧ partial pressure coil signal
V_ref‧‧‧參考電壓 V_ref‧‧‧reference voltage
V_hw‧‧‧半波訊號 V_hw‧‧‧ half wave signal
V_dc‧‧‧直流訊號 V_dc‧‧‧DC signal
V_hw’‧‧‧分壓半波訊號 V_hw’‧‧‧ partial pressure half-wave signal
V_hwa‧‧‧放大半波訊號 V_hwa‧‧‧Amplify half-wave signal
V_env‧‧‧包絡訊號 V_env‧‧‧ envelope signal
V_trig‧‧‧觸發訊號 V_trig‧‧‧ trigger signal
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TW104121025A TWI536698B (en) | 2015-06-30 | 2015-06-30 | Supplying-end module in induction-type power supply system and signal analysis circuit therein |
CN201510429764.7A CN105045330B (en) | 2015-06-30 | 2015-07-21 | Power supply module in induction type power supply and signal analysis circuit thereof |
US14/876,788 US9831687B2 (en) | 2011-02-01 | 2015-10-06 | Supplying-end module for induction-type power supply system and signal analysis circuit therein |
US15/197,796 US10312748B2 (en) | 2011-02-01 | 2016-06-30 | Signal analysis method and circuit |
US15/231,795 US10289142B2 (en) | 2011-02-01 | 2016-08-09 | Induction type power supply system and intruding metal detection method thereof |
US15/836,904 US11128180B2 (en) | 2011-02-01 | 2017-12-10 | Method and supplying-end module for detecting receiving-end module |
US16/120,302 US10587153B2 (en) | 2011-02-01 | 2018-09-02 | Intruding metal detection method for induction type power supply system and related supplying-end module |
US16/124,211 US10615645B2 (en) | 2011-02-01 | 2018-09-07 | Power supply device of induction type power supply system and NFC device identification method of the same |
US16/128,526 US10630116B2 (en) | 2011-02-01 | 2018-09-12 | Intruding metal detection method for induction type power supply system and related supplying-end module |
US16/132,464 US10630113B2 (en) | 2011-02-01 | 2018-09-16 | Power supply device of induction type power supply system and RF magnetic card identification method of the same |
US16/241,940 US10574095B2 (en) | 2011-02-01 | 2019-01-07 | Decoding method for signal processing circuit and signal processing circuit using the same |
US16/248,815 US10673287B2 (en) | 2011-02-01 | 2019-01-16 | Method and supplying-end module for detecting receiving-end module |
US16/547,588 US10594168B2 (en) | 2011-02-01 | 2019-08-22 | Intruding metal detection method for induction type power supply system and related supplying-end module |
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