TWI535216B - Phase and/or frequency detector, phase-locked loop and operation method for the phase-locked loop - Google Patents
Phase and/or frequency detector, phase-locked loop and operation method for the phase-locked loop Download PDFInfo
- Publication number
- TWI535216B TWI535216B TW100125698A TW100125698A TWI535216B TW I535216 B TWI535216 B TW I535216B TW 100125698 A TW100125698 A TW 100125698A TW 100125698 A TW100125698 A TW 100125698A TW I535216 B TWI535216 B TW I535216B
- Authority
- TW
- Taiwan
- Prior art keywords
- frequency
- signal
- phase
- oscillation
- control signal
- Prior art date
Links
Landscapes
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
Description
本發明是有關於鎖相迴路之技術,且特別是有關於一種可解決鎖相迴路之輸出訊號抖動問題的相位及/或頻率檢測器、一種採用前述相位及/或頻率檢測器之鎖相迴路與前述鎖相迴路的操作方法。The present invention relates to a phase-locked loop technology, and more particularly to a phase and/or frequency detector that can solve the problem of output signal jitter of a phase-locked loop, and a phase-locked loop using the aforementioned phase and/or frequency detector The method of operation with the aforementioned phase-locked loop.
鎖相迴路(phase-locked loop,PLL)是一種能夠追蹤輸入訊號之頻率與相位的自動控制電路系統,其主要是將輸出訊號與輸入訊號之相位與頻率做追蹤與鎖定,使輸出訊號之相位與頻率能夠固定在一預設值或一預設範圍內。而就目前而言,鎖相迴路已被廣泛地運用在電腦與消費性產品中。A phase-locked loop (PLL) is an automatic control circuit that can track the frequency and phase of an input signal. It mainly tracks and locks the phase and frequency of the output signal and the input signal to make the phase of the output signal. The frequency can be fixed to a preset value or a predetermined range. For now, phase-locked loops have been widely used in computers and consumer products.
然而,鎖相迴路很容易受到雜訊干擾,使得其輸出訊號產生時間偏移的問題,也就是產生所謂的抖動(Jitter)問題,因而造成時脈誤差。However, the phase-locked loop is susceptible to noise interference, causing the output signal to have a time offset problem, that is, a so-called jitter problem, which causes a clock error.
本發明的目的就是在提供一種相位及/或頻率檢測器,其可解決鎖相迴路之輸出訊號抖動問題。It is an object of the present invention to provide a phase and/or frequency detector that addresses the output signal jitter of a phase locked loop.
本發明的另一目的是提供一種採用前述相位及/或頻率檢測器之鎖相迴路。Another object of the present invention is to provide a phase locked loop employing the aforementioned phase and/or frequency detectors.
本發明的再一目的是提供一種鎖相迴路的操作方法。It is still another object of the present invention to provide a method of operating a phase locked loop.
本發明提出一種相位及/或頻率檢測器,其包括有第一正反器、第二正反器、邏輯閘、控制電路與延遲電路。所述之第一正反器具有第一資料輸入端、第一資料輸出端、第一時脈輸入端與第一重置端。第一資料輸入端用以電性耦接電源電壓,而第一時脈輸入端用以接收具有參考頻率之參考訊號。所述之第二正反器具有第二資料輸入端、第二資料輸出端、第二時脈輸入端與第二重置端。第二資料輸入端用以電性耦接電源電壓,而第二時脈輸入端用以接收除頻訊號。所述之除頻訊號係對具有振盪頻率之振盪訊號除頻而得。所述之邏輯閘用以接收第一資料輸出端與第二資料輸出端所輸出的訊號。所述之控制電路用以依據振盪訊號之振盪頻率而對應產生延遲控制訊號。至於所述之延遲電路,其用以依據延遲控制訊號而改變所延長的時間,以便形成重置訊號而輸出至第一重置端與第二重置端。The invention provides a phase and/or frequency detector comprising a first flip-flop, a second flip-flop, a logic gate, a control circuit and a delay circuit. The first flip-flop has a first data input end, a first data output end, a first clock input end and a first reset end. The first data input terminal is electrically coupled to the power supply voltage, and the first clock input terminal is configured to receive the reference signal having the reference frequency. The second flip-flop has a second data input end, a second data output end, a second clock input end and a second reset end. The second data input terminal is electrically coupled to the power supply voltage, and the second clock input terminal is configured to receive the frequency division signal. The de-frequency signal is obtained by dividing an oscillating signal having an oscillating frequency. The logic gate is configured to receive signals output by the first data output end and the second data output end. The control circuit is configured to generate a delay control signal according to the oscillation frequency of the oscillation signal. The delay circuit is configured to change the extended time according to the delay control signal to form a reset signal and output to the first reset end and the second reset end.
本發明另提出一種鎖相迴路,其包括有相位及/或頻率檢測器、電荷幫浦、迴路濾波器、壓控振盪器與除頻器。其中相位及/或頻率檢測器又包括有第一正反器、第二正反器、邏輯閘、控制電路與延遲電路。所述之第一正反器具有第一資料輸入端、第一資料輸出端、第一時脈輸入端與第一重置端。第一資料輸入端用以電性耦接電源電壓,而第一時脈輸入端用以接收具有參考頻率之參考訊號。所述之第二正反器具有第二資料輸入端、第二資料輸出端、第二時脈輸入端與第二重置端。第二資料輸入端用以電性耦接電源電壓,而第二時脈輸入端用以接收除頻訊號。所述之除頻訊號係對具有振盪頻率之振盪訊號除頻而得。所述之邏輯閘用以接收第一資料輸出端與第二資料輸出端所輸出的訊號。所述之控制電路用以依據振盪訊號之振盪頻率而對應產生延遲控制訊號。所述之延遲電路用以依據延遲控制訊號而改變所延長的時間,以便形成重置訊號而輸出至第一重置端與第二重置端。所述之電荷幫浦用以依據第一資料輸出端與第二資料輸出端所輸出的訊號而決定其輸出電流的大小。所述之迴路濾波器用以依據輸出電流而產生頻率控制電壓。所述之壓控振盪器用以產生振盪訊號,並依據頻率控制電壓而決定振盪頻率的大小。至於所述之除頻器,其用以依據除頻控制訊號所對應之除頻倍數而對振盪訊號進行除頻,據以產生除頻訊號。The invention further provides a phase locked loop comprising a phase and / or frequency detector, a charge pump, a loop filter, a voltage controlled oscillator and a frequency divider. The phase and/or frequency detector further includes a first flip-flop, a second flip-flop, a logic gate, a control circuit and a delay circuit. The first flip-flop has a first data input end, a first data output end, a first clock input end and a first reset end. The first data input terminal is electrically coupled to the power supply voltage, and the first clock input terminal is configured to receive the reference signal having the reference frequency. The second flip-flop has a second data input end, a second data output end, a second clock input end and a second reset end. The second data input terminal is electrically coupled to the power supply voltage, and the second clock input terminal is configured to receive the frequency division signal. The de-frequency signal is obtained by dividing an oscillating signal having an oscillating frequency. The logic gate is configured to receive signals output by the first data output end and the second data output end. The control circuit is configured to generate a delay control signal according to the oscillation frequency of the oscillation signal. The delay circuit is configured to change the extended time according to the delay control signal to form a reset signal and output to the first reset end and the second reset end. The charge pump is configured to determine the magnitude of the output current according to the signal output by the first data output end and the second data output end. The loop filter is configured to generate a frequency control voltage according to an output current. The voltage controlled oscillator is used to generate an oscillation signal, and determines the magnitude of the oscillation frequency according to the frequency control voltage. The frequency divider is configured to perform frequency division on the oscillating signal according to the frequency division multiple corresponding to the frequency division control signal, thereby generating a frequency division signal.
本發明再提出一種鎖相迴路的操作方法。所述之鎖相迴路具有相位及/或頻率檢測器,而此相位及/或頻率檢測器包括有第一正反器、第二正反器、邏輯閘與延遲電路。所述之第一正反器具有第一資料輸入端、第一資料輸出端、第一時脈輸入端與第一重置端。第一資料輸入端用以電性耦接電源電壓,而第一時脈輸入端用以接收具有參考頻率之參考訊號。所述之第二正反器具有第二資料輸入端、第二資料輸出端、第二時脈輸入端與第二重置端。第二資料輸入端用以電性耦接電源電壓,而第二時脈輸入端用以接收除頻訊號,此除頻訊號為對鎖相迴路所輸出之振盪訊號除頻而得,且此振盪訊號具有振盪頻率。所述之邏輯閘用以接收第一資料輸出端與第二資料輸出端所輸出的訊號,而所述之延遲電路用以延長邏輯閘所輸出之訊號的上升時間,以便形成重置訊號而輸出至第一重置端與第二重置端。所述之操作方法包括下列步驟:判斷振盪頻率是否大於等於預設頻率;以及當判斷為是時,便控制延遲電路縮短所延長的時間。The invention further proposes a method of operating a phase locked loop. The phase locked loop has a phase and/or frequency detector, and the phase and/or frequency detector includes a first flip flop, a second flip flop, a logic gate and a delay circuit. The first flip-flop has a first data input end, a first data output end, a first clock input end and a first reset end. The first data input terminal is electrically coupled to the power supply voltage, and the first clock input terminal is configured to receive the reference signal having the reference frequency. The second flip-flop has a second data input end, a second data output end, a second clock input end and a second reset end. The second data input end is electrically coupled to the power supply voltage, and the second clock input end is configured to receive the frequency-divided signal, wherein the frequency-divided signal is obtained by dividing the oscillation signal outputted by the phase-locked loop, and the oscillation is performed. The signal has an oscillating frequency. The logic gate is configured to receive signals output by the first data output end and the second data output end, and the delay circuit is configured to extend the rise time of the signal output by the logic gate to form a reset signal and output Up to the first reset end and the second reset end. The operation method includes the following steps: determining whether the oscillation frequency is greater than or equal to the preset frequency; and when the determination is YES, controlling the delay circuit to shorten the extended time.
在本發明之相位及/或頻率檢測器的一實施例與鎖相迴路的一實施例中,當振盪頻率小於預設頻率時,延遲控制訊號便控制延遲電路增加所延長的時間,而當振盪頻率大於等於預設頻率時,延遲控制訊號便控制延遲電路縮短所延長的時間。In an embodiment of the phase and/or frequency detector of the present invention and an embodiment of the phase locked loop, when the oscillating frequency is less than the preset frequency, the delay control signal controls the delay circuit to increase the extended time while oscillating When the frequency is greater than or equal to the preset frequency, the delay control signal controls the delay circuit to shorten the extended time.
在本發明之相位及/或頻率檢測器的一實施例與鎖相迴路的一實施例中,上述之控制電路包括有頻率偵測器與控制單元。所述之頻率偵測器用以接收振盪訊號以偵測振盪頻率,並據以產生偵測結果。而所述之控制單元用以依據偵測結果而對應產生延遲控制訊號。In an embodiment of the phase and/or frequency detector of the present invention and the phase locked loop, the control circuit includes a frequency detector and a control unit. The frequency detector is configured to receive an oscillation signal to detect an oscillation frequency, and generate a detection result accordingly. The control unit is configured to generate a delay control signal according to the detection result.
在本發明之相位及/或頻率檢測器的一實施例與鎖相迴路的一實施例中,上述之頻率偵測器包括有計數器。所述之計數器用以計數振盪訊號之脈衝的致能時間長度,以將計數值做為偵測結果。In an embodiment of the phase and/or frequency detector of the present invention and the phase locked loop, the frequency detector includes a counter. The counter is used to count the length of the activation time of the pulse of the oscillation signal to use the count value as the detection result.
在本發明之相位及/或頻率檢測器的一實施例與鎖相迴路的一實施例中,上述之控制電路包括有電壓偵測器與控制單元。所述之電壓偵測器用以偵測頻率控制電壓的大小,並據以產生偵測結果。而所述之控制單元用以依據偵測結果而對應產生延遲控制訊號。In an embodiment of the phase and/or frequency detector of the present invention and the phase locked loop, the control circuit includes a voltage detector and a control unit. The voltage detector is configured to detect the magnitude of the frequency control voltage and generate a detection result accordingly. The control unit is configured to generate a delay control signal according to the detection result.
在本發明之相位及/或頻率檢測器的一實施例與鎖相迴路的一實施例中,上述之延遲控制訊號為具有多個位元之數位控制訊號,而上述之延遲電路包括有多個緩衝器與多個MOS電晶體。所述之多個緩衝器係相互串接。而所述之每一MOS電晶體係跨接於其中一緩衝器的輸入端與輸出端之間,並依據數位控制訊號之其中一位元的狀態而決定是否導通。In an embodiment of the phase and/or frequency detector of the present invention and the phase-locked loop, the delay control signal is a digital control signal having a plurality of bits, and the delay circuit includes a plurality of Buffer with multiple MOS transistors. The plurality of buffers are connected in series with each other. The MOS transistor system is connected between the input end and the output end of one of the buffers, and determines whether to be turned on according to the state of one of the digital control signals.
在本發明所述之操作方法的一實施例中,當振盪頻率小於預設頻率時,便控制延遲電路增加所延長的時間。In an embodiment of the operating method of the present invention, when the oscillation frequency is less than the preset frequency, the delay circuit is controlled to increase the extended time.
本發明係在相位及/或頻率檢測器中增設延遲電路與控制電路。如此,便可利用延遲電路來延長邏輯閘所輸出之訊號的上升時間,以進一步延長相位及/或頻率檢測器所輸出之增頻控制訊號(即第一正反器之輸出)與減頻控制訊號(即第二正反器之輸出)二者之脈衝的上升時間,藉以解決鎖相迴路的死區問題,並進而解決鎖相迴路的輸出訊號抖動問題。此外,還可利用控制電路去判斷鎖相迴路所輸出的振盪頻率是否大於等於預設頻率,並據以動態控制鎖相迴路的功率消耗。當判斷為是時,控制電路便控制延遲電路縮短所延長的時間,以減少鎖相迴路運作於高頻下的功率消耗;而當判斷為否時,控制電路便控制延遲電路增加所延長的時間。The present invention adds a delay circuit and a control circuit to the phase and/or frequency detector. In this way, the delay circuit can be used to extend the rise time of the signal output by the logic gate to further extend the up-conversion control signal (ie, the output of the first flip-flop) and the frequency-reduction control output by the phase and/or frequency detector. The rise time of the pulse of the signal (ie, the output of the second flip-flop) is used to solve the dead zone problem of the phase-locked loop, and further solve the output signal jitter problem of the phase-locked loop. In addition, the control circuit can be used to determine whether the oscillation frequency output by the phase locked loop is greater than or equal to the preset frequency, and accordingly, the power consumption of the phase locked loop is dynamically controlled. When the determination is yes, the control circuit controls the delay circuit to shorten the extended time to reduce the power consumption of the phase-locked loop operating at a high frequency; and when the determination is no, the control circuit controls the delay circuit to increase the extended time. .
為讓本發明之上述和其他目的、特徵和優點能更明顯易懂,下文特舉較佳實施例,並配合所附圖式,作詳細說明如下。The above and other objects, features and advantages of the present invention will become more <RTIgt;
圖1為一種鎖相迴路的方塊圖。如圖1所示,鎖相迴路100包括有相位及/或頻率檢測器110、電荷幫浦120、迴路濾波器130、壓控振盪器140與除頻器150。相位及/或頻率檢測器110用以接收除頻訊號FDIV與具有參考頻率之參考訊號FREF,並依據二者之相位差而決定是否輸出增頻控制訊號UP與減頻控制訊號DN。電荷幫浦120用以依據前述之增頻控制訊號UP與減頻控制訊號DN而決定其輸出電流CC的大小。迴路濾波器130用以依據上述之輸出電流CC而產生頻率控制電壓CV。壓控振盪器140用以產生振盪訊號FOUT,並依據上述之頻率控制電壓CV而決定振盪訊號FOUT之振盪頻率。至於除頻器150,其用以依據數位的除頻控制訊號(具有位元Mo~Mn)所對應之除頻倍數而對振盪訊號FOUT進行除頻,並據以產生上述之除頻訊號FDIV。Figure 1 is a block diagram of a phase locked loop. As shown in FIG. 1, the phase locked loop 100 includes a phase and/or frequency detector 110, a charge pump 120, a loop filter 130, a voltage controlled oscillator 140, and a frequency divider 150. The phase and/or frequency detector 110 is configured to receive the frequency division signal FDIV and the reference signal FREF having the reference frequency, and determine whether to output the up-conversion control signal UP and the frequency-down control signal DN according to the phase difference between the two. The charge pump 120 is configured to determine the magnitude of the output current CC according to the above-mentioned up-conversion control signal UP and the down-conversion control signal DN. The loop filter 130 is configured to generate the frequency control voltage CV according to the output current CC described above. The voltage controlled oscillator 140 is configured to generate the oscillation signal FOUT, and determine the oscillation frequency of the oscillation signal FOUT according to the frequency control voltage CV described above. As for the frequency divider 150, the frequency division signal FOUT is divided according to the frequency division multiple corresponding to the digital frequency division control signal (having the bit Mo~Mn), and the above-mentioned frequency division signal FDIV is generated accordingly.
圖2係繪示相位及/或頻率檢測器的其中一種實現方式。如圖2所示,相位及/或頻率檢測器200包括有正反器210、正反器220與邏輯閘230。在此實現方式中,每一正反器皆是採用正緣(rising edge)觸發的D型正反器來實現,且每一正反器皆具有資料輸入端D、資料輸出端Q、時脈輸入端CLK與重置端R。這二個正反器的資料輸入端D皆電性耦接電源電壓VDD。此外,正反器210的時脈輸入端CLK用以接收前述之參考訊號FREF,而其資料輸出端Q用以輸出增頻控制訊號UP。至於正反器220,其時脈輸入端CLK用以接收前述之除頻訊號FDIV,而其資料輸出端Q用以輸出減頻控制訊號DN。此外,此例中之邏輯閘230係以及閘(AND gate)來實現。Figure 2 illustrates one implementation of a phase and/or frequency detector. As shown in FIG. 2, the phase and/or frequency detector 200 includes a flip-flop 210, a flip-flop 220, and a logic gate 230. In this implementation, each flip-flop is implemented by a D-type flip-flop triggered by a rising edge, and each flip-flop has a data input terminal D, a data output terminal Q, and a clock. Input terminal CLK and reset terminal R. The data input terminals D of the two flip-flops are electrically coupled to the power supply voltage VDD. In addition, the clock input terminal CLK of the flip-flop 210 is used to receive the aforementioned reference signal FREF, and the data output terminal Q is used to output the up-conversion control signal UP. As for the flip-flop 220, the clock input terminal CLK is used to receive the aforementioned frequency-divided signal FDIV, and the data output terminal Q is used to output the frequency-down control signal DN. In addition, the logic gate 230 in this example is implemented by an AND gate.
圖3係用以說明相位及/或頻率檢測器的操作方式。在圖3中,標示與圖2中之標示相同者表示為相同的訊號,而標示t表示為時間。請同時參照圖2與圖3,當除頻訊號FDIV的相位落後參考訊號FREF的相位時,相位及/或頻率檢測器200便會輸出增頻控制訊號UP,以便進一步控制後端的壓控振盪器提高振盪訊號的振盪頻率。反之,當除頻訊號FDIV的相位超前參考訊號FREF的相位時,相位及/或頻率檢測器200便會輸出減頻控制訊號DN,以便進一步控制後端的壓控振盪器降低振盪訊號的振盪頻率。而相位及/或頻率檢測器200會不斷地控制壓控振盪器去調整振盪訊號的振盪頻率,直到參考訊號FREF與除頻訊號FDIV二者的相位達到鎖定為止。如此,便可使振盪訊號的振盪頻率穩定在目標頻率。此外,由圖3可知,增頻控制訊號UP與減頻控制訊號DN這二者之脈衝的致能時間長度係表示參考訊號FREF與除頻訊號FDIV二者的相差。Figure 3 is a diagram for explaining the operation of the phase and / or frequency detector. In FIG. 3, the same reference numerals as those in FIG. 2 are denoted as the same signal, and the designation t is expressed as time. Referring to FIG. 2 and FIG. 3 simultaneously, when the phase of the frequency division signal FDIV is behind the phase of the reference signal FREF, the phase and/or frequency detector 200 outputs the up-conversion control signal UP to further control the voltage-controlled oscillator at the rear end. Increase the oscillation frequency of the oscillation signal. On the contrary, when the phase of the frequency division signal FDIV leads the phase of the reference signal FREF, the phase and/or frequency detector 200 outputs the frequency reduction control signal DN to further control the voltage controlled oscillator of the back end to reduce the oscillation frequency of the oscillation signal. The phase and/or frequency detector 200 continuously controls the voltage controlled oscillator to adjust the oscillation frequency of the oscillation signal until the phase of both the reference signal FREF and the frequency division signal FDIV is locked. In this way, the oscillation frequency of the oscillation signal can be stabilized at the target frequency. In addition, as shown in FIG. 3, the length of the enable time of the pulse of both the up-regulation control signal UP and the down-conversion control signal DN represents the phase difference between the reference signal FREF and the frequency-divided signal FDIV.
然而,當參考訊號FREF與除頻訊號FDIV二者的相位非常地接近時,相位及/或頻率檢測器200便會同時輸出增頻控制訊號UP與減頻控制訊號DN,且增頻控制訊號UP與減頻控制訊號DN二者之脈衝的致能時間長度都會非常短,一如圖4所示。圖4係繪示此時之增頻控制訊號與減頻控制訊號的時序。在圖4中,標示與圖2中之標示相同者表示為相同的訊號,而標示t表示為時間。由於此時增頻控制訊號UP與減頻控制訊號DN二者之脈衝的致能時間長度都非常短,因此將造成後端的電荷幫浦無法依據這二個訊號而對應地運作,以圖5來解釋之。However, when the phases of the reference signal FREF and the frequency division signal FDIV are very close, the phase and/or frequency detector 200 simultaneously outputs the up-conversion control signal UP and the down-conversion control signal DN, and the up-conversion control signal UP The length of the enable time of the pulse with both the frequency reduction control signal DN will be very short, as shown in FIG. FIG. 4 illustrates the timing of the up-converted control signal and the down-converted control signal at this time. In FIG. 4, the same reference numerals as those in FIG. 2 are denoted as the same signal, and the designation t is expressed as time. Since the activation time of the pulse of both the up-regulation control signal UP and the down-conversion control signal DN is very short, the charge pump of the back end cannot be operated correspondingly according to the two signals, as shown in FIG. Explain it.
圖5係繪示電荷幫浦的其中一種實現方式與迴路濾波器的其中一種實現方式。如圖5所示,電荷幫浦510係由電流源512、開關514、開關516與電流源518所組成,且電流源512與514分別電性耦接電源電壓VDD與接地電位GND,而開關514與516則分別受增頻控制訊號UP與減頻控制訊號DN的控制而決定是否導通。至於迴路濾波器520,其係以一電容來實現。由於開關514與516皆以MOS電晶體(即metal oxide semiconductor field effect transistor,MOSFET)來實現,因此當增頻控制訊號UP與減頻控制訊號DN二者之脈衝的致能時間長度都非常短時,開關514與516就會來不及反應而處於關閉狀態(off state)。也就是說,在這個時候,電荷幫浦510並不會動作,因而產生運作上的死區(dead zone),以圖6來說明之。Figure 5 illustrates one of the implementations of a charge pump and one of the loop filters. As shown in FIG. 5, the charge pump 510 is composed of a current source 512, a switch 514, a switch 516, and a current source 518, and the current sources 512 and 514 are electrically coupled to the power supply voltage VDD and the ground potential GND, respectively, and the switch 514. And 516 are respectively controlled by the up-conversion control signal UP and the down-conversion control signal DN to determine whether to conduct. As for the loop filter 520, it is implemented with a capacitor. Since the switches 514 and 516 are implemented by MOS transistors (metal oxide semiconductor field effect transistors, MOSFETs), when the pulse-lengths of the up-conversion control signal UP and the down-conversion control signal DN are very short. The switches 514 and 516 are too late to react and are in an off state. That is to say, at this time, the charge pump 510 does not operate, thus creating a dead zone in operation, which is illustrated in FIG.
圖6係繪示圖5之參考訊號與除頻訊號二者的相差與電荷幫浦之輸出電流的對應關係。在圖6中,標示CC表示為電荷幫浦510之輸出電流,標示θ表示為參考訊號FREF與除頻訊號FDIV的相差,而標示DZ則表示為上述之死區。在縱軸右側係繪示除頻訊號FDIV落後參考訊號FREF的情況,而在縱軸左側係繪示除頻訊號FDIV超前參考訊號FREF的情況。至於死區DZ,其係表示當參考訊號FREF與除頻訊號FDIV二者的相差非常小,以致於增頻控制訊號UP與減頻控制訊號DN二者之脈衝的致能時間長度都非常短的情況。由圖6可知,當增頻控制訊號UP與減頻控制訊號DN二者之脈衝的致能時間長度都非常短時,電荷幫浦510不會動作,因而使得其輸出電流CC為零。6 is a diagram showing the relationship between the phase difference between the reference signal and the frequency-divided signal of FIG. 5 and the output current of the charge pump. In FIG. 6, the CC is indicated as the output current of the charge pump 510, the indication θ is the difference between the reference signal FREF and the frequency-divided signal FDIV, and the label DZ is represented as the dead zone described above. On the right side of the vertical axis, the case where the frequency division signal FDIV is behind the reference signal FREF is shown, and on the left side of the vertical axis, the de-frequency signal FDIV advanced reference signal FREF is shown. As for the dead zone DZ, it means that the difference between the reference signal FREF and the frequency-divided signal FDIV is very small, so that the length of the pulse of the up-conversion control signal UP and the down-conversion control signal DN is very short. Happening. As can be seen from FIG. 6, when the length of the enablement time of the pulse of both the up-converting control signal UP and the down-conversion control signal DN is very short, the charge pump 510 does not operate, thereby making its output current CC zero.
圖7係繪示圖5之參考訊號與除頻訊號二者的相差與頻率控制電壓的對應關係。在圖7中,標示CV表示為迴路濾波器520所產生的頻率控制電壓,標示θ表示為參考訊號FREF與除頻訊號FDIV的相差,而標示DZ則表示為死區。在縱軸右側係繪示除頻訊號FDIV落後參考訊號FREF的情況,而在縱軸左側係繪示除頻訊號FDIV超前參考訊號FREF的情況。至於死區DZ,其係表示當參考訊號FREF與除頻訊號FDIV二者的相差非常小,以致於增頻控制訊號UP與減頻控制訊號DN二者之脈衝的致能時間長度都非常短的情況。由圖7可知,當增頻控制訊號UP與減頻控制訊號DN二者之脈衝的致能時間長度都非常短時,電荷幫浦510不會動作而使得其輸出電流CC為零,進而使得迴路濾波器520所產生的頻率控制電壓CV也為零。FIG. 7 is a diagram showing the correspondence between the phase difference between the reference signal and the frequency-divided signal of FIG. 5 and the frequency control voltage. In FIG. 7, the symbol CV is represented as the frequency control voltage generated by the loop filter 520, the indication θ is represented as the phase difference between the reference signal FREF and the demultiplexed signal FDIV, and the label DZ is represented as the dead zone. On the right side of the vertical axis, the case where the frequency division signal FDIV is behind the reference signal FREF is shown, and on the left side of the vertical axis, the de-frequency signal FDIV advanced reference signal FREF is shown. As for the dead zone DZ, it means that the difference between the reference signal FREF and the frequency-divided signal FDIV is very small, so that the length of the pulse of the up-conversion control signal UP and the down-conversion control signal DN is very short. Happening. It can be seen from FIG. 7 that when the length of the energization time of the pulse of both the up-converting control signal UP and the down-conversion control signal DN is very short, the charge pump 510 does not operate and the output current CC is zero, thereby making the loop The frequency control voltage CV generated by the filter 520 is also zero.
由於在增頻控制訊號UP與減頻控制訊號DN二者之脈衝的致能時間長度都非常短時,電荷幫浦510便無法對迴路濾波器520進行充電或放電的動作,因此會進一步使得後端的壓控振盪器振盪出一個與參考訊號FREF有些許誤差的振盪訊號,一如圖8所示。圖8係用以解說振盪訊號有些許誤差的情況。在圖8中,標示FREF係表示為參考訊號,標示FOUT係表示為壓控振盪器所產生的振盪訊號,而標示t係表示為時間。由圖8可知,在此情況下,振盪訊號FOUT會發生時間偏移的問題,也就是發生抖動(Jitter)的問題。Since the length of the enable time of the pulse of both the up-regulated control signal UP and the down-converted control signal DN is very short, the charge pump 510 cannot charge or discharge the loop filter 520, so The voltage controlled oscillator of the terminal oscillates an oscillation signal with a slight error from the reference signal FREF, as shown in FIG. Figure 8 is a diagram for explaining a slight error in the oscillation signal. In Fig. 8, the FREF is indicated as a reference signal, the FOUT is indicated as the oscillation signal generated by the voltage controlled oscillator, and the t is indicated as time. As can be seen from FIG. 8, in this case, the problem of time shifting of the oscillation signal FOUT, that is, the occurrence of jitter (Jitter).
為了解決鎖相迴路的死區問題,可以採用如圖9所示的相位及/或頻率檢測器。在圖9中,標示與圖2中之標示相同者表示為相同物件或訊號。圖9所示之相位及/或頻率檢測器900與圖2所示之相位及/或頻率檢測器200的不同之處,在於相位及/或頻率檢測器900新增了一個延遲電路910。此延遲電路910用以延長邏輯閘230所輸出之訊號的上升時間,以便形成一重置訊號而輸出至正反器210與220(亦皆以D型正反器來實現)的重置端R。如此一來,當參考訊號FREF與除頻訊號FDIV二者的相差非常小時,相位及/或頻率檢測器900所輸出之增頻控制訊號UP與減頻控制訊號DN二者的脈衝的上升時間就會被延長,一如圖10所示。圖10係繪示脈衝上升時間已被延長的增頻控制訊號與減頻控制訊號。在圖10中,標示與圖9中之標示相同者表示為相同的訊號,而標示t表示為時間。In order to solve the dead zone problem of the phase locked loop, a phase and/or frequency detector as shown in FIG. 9 can be used. In FIG. 9, the same reference numerals as those in FIG. 2 are denoted as the same object or signal. The phase and/or frequency detector 900 shown in FIG. 9 differs from the phase and/or frequency detector 200 shown in FIG. 2 in that a delay circuit 910 is added to the phase and/or frequency detector 900. The delay circuit 910 is configured to extend the rise time of the signal output by the logic gate 230 to form a reset signal and output to the reset terminal R of the flip-flops 210 and 220 (also implemented by the D-type flip-flop). . In this way, when the phase difference between the reference signal FREF and the frequency-divided signal FDIV is very small, the rise time of the pulse of the up-converting control signal UP and the down-conversion control signal DN output by the phase and/or frequency detector 900 is Will be extended, as shown in Figure 10. FIG. 10 is a diagram showing an up-converted control signal and a down-conversion control signal in which the pulse rise time has been extended. In Fig. 10, the same reference numerals as those in Fig. 9 are denoted as the same signal, and the designation t is expressed as time.
由於增頻控制訊號UP與減頻控制訊號DN二者的脈衝的上升時間已被延長,使得電荷幫浦內部的開關可以來得及反應而處於導通狀態(on state),因此此時的電荷幫浦就可以依據增頻控制訊號UP與減頻控制訊號DN來對迴路濾波器進行充電與放電的動作,解決了運作上的死區問題。Since the rise time of the pulse of both the up-regulation control signal UP and the down-conversion control signal DN has been extended, the switch inside the charge pump can be reacted to be in the on state, so the charge pump at this time The loop filter can be charged and discharged according to the up-conversion control signal UP and the down-conversion control signal DN, thereby solving the dead zone problem in operation.
然而,也由於增頻控制訊號UP與減頻控制訊號DN二者之脈衝的上升時間被延長,使得電荷幫浦會同時對迴路濾波器進行充電與放電的動作,因此若是鎖相迴路係運作於高頻下時,鎖相迴路的功率消耗就會很可觀。此外,請再參照圖5,由於電荷幫浦510內部的二個開關一般係分別由一N型MOS電晶體與一P型MOS電晶體來實現,而N型MOS電晶體與P型MOS電晶體二者的導通電流並非相等,因此當增頻控制訊號UP與減頻控制訊號DN二者之脈衝的上升時間被延長時,便會發生充電電流與放電電流不匹配(current mismatch)的情況,進而使得迴路濾波器520所產生的頻率控制電壓CV發生擾動。在此情況下,又會造成鎖相迴路所輸出之振盪訊號發生抖動的問題。為了解決前述問題,可以採用如圖11所示的相位及/或頻率檢測器。However, since the rise time of the pulse of both the up-regulation control signal UP and the down-conversion control signal DN is extended, the charge pump simultaneously charges and discharges the loop filter, so if the phase-locked loop system operates At high frequencies, the power consumption of the phase-locked loop can be significant. In addition, please refer to FIG. 5 again, since the two switches inside the charge pump 510 are generally realized by an N-type MOS transistor and a P-type MOS transistor, respectively, and the N-type MOS transistor and the P-type MOS transistor. The conduction currents of the two are not equal. Therefore, when the rise time of the pulse of both the up-conversion control signal UP and the down-conversion control signal DN is prolonged, a current mismatch between the charging current and the discharge current occurs. The frequency control voltage CV generated by the loop filter 520 is disturbed. In this case, the oscillation signal outputted by the phase-locked loop is caused to be shaken. In order to solve the aforementioned problem, a phase and/or frequency detector as shown in FIG. 11 can be employed.
圖11為依照本發明一實施例之一相位及/或頻率檢測器的電路方塊圖。如圖11所示,此相位/頻率檢測器1100包括有正反器1110、正反器1120、延遲電路1130、邏輯閘1140與控制電路1150。在此實現方式中,每一正反器皆是採用正緣觸發的D型正反器,且每一正反器皆具有資料輸入端D、資料輸出端Q、時脈輸入端CLK與重置端R。這二個正反器的資料輸入端D皆電性耦接電源電壓VDD。此外,正反器1110的時脈輸入端CLK用以接收來自鎖相迴路外部之參考訊號FREF,而其資料輸出端Q用以輸出增頻控制訊號UP。至於正反器1120,其時脈輸入端CLK用以接收除頻訊號FDIV,而其資料輸出端Q用以輸出減頻控制訊號DN。上述之除頻訊號FDIV係對鎖相迴路所輸出之振盪訊號進行除頻而得,而此振盪訊號具有振盪頻率。11 is a circuit block diagram of a phase and/or frequency detector in accordance with an embodiment of the present invention. As shown in FIG. 11, the phase/frequency detector 1100 includes a flip-flop 1110, a flip-flop 1120, a delay circuit 1130, a logic gate 1140, and a control circuit 1150. In this implementation, each flip-flop is a D-type flip-flop that uses a positive-edge trigger, and each flip-flop has a data input terminal D, a data output terminal Q, a clock input terminal CLK, and a reset. End R. The data input terminals D of the two flip-flops are electrically coupled to the power supply voltage VDD. In addition, the clock input terminal CLK of the flip-flop 1110 is for receiving the reference signal FREF from the outside of the phase locked loop, and the data output terminal Q is for outputting the up-conversion control signal UP. As for the flip-flop 1120, the clock input terminal CLK is used to receive the frequency-divided signal FDIV, and the data output terminal Q is used to output the frequency-down control signal DN. The above-mentioned frequency-divided signal FDIV is obtained by dividing the oscillation signal outputted by the phase-locked loop, and the oscillation signal has an oscillation frequency.
此外,邏輯閘1140用以接收正反器1110與1120二者之資料輸出端Q所輸出的訊號,也就是增頻控制訊號UP與減頻控制訊號DN。在此例中,邏輯閘1140是採用及閘來實現。而控制電路1150用以依據前述振盪訊號之振盪頻率而對應產生延遲控制訊號。在此例中,延遲控制訊號係以具有位元Co~Cn的數位控制訊號來實現。然而,本發明之延遲控制訊號並非限定是數位控制訊號,其也可以是類比控制訊號。至於延遲電路1130,其用以延長邏輯閘1140所輸出之訊號的上升時間,並依據延遲控制訊號Co~Cn而改變所延長的時間(詳後述),以便形成重置訊號而輸出至正反器1110與1120二者的重置端。In addition, the logic gate 1140 is configured to receive the signals output by the data output terminal Q of both the flip-flops 1110 and 1120, that is, the up-conversion control signal UP and the down-conversion control signal DN. In this example, the logic gate 1140 is implemented using a gate. The control circuit 1150 is configured to generate a delay control signal according to the oscillation frequency of the oscillation signal. In this example, the delay control signal is implemented as a digital control signal having bits Co~Cn. However, the delay control signal of the present invention is not limited to a digital control signal, and may also be an analog control signal. The delay circuit 1130 is configured to extend the rise time of the signal output by the logic gate 1140, and change the extended time according to the delay control signal Co~Cn (described later) to form a reset signal and output to the flip-flop. The reset end of both 1110 and 1120.
因此,當前述之振盪頻率小於預設頻率時,便可利用延遲控制訊號Co~Cn來控制延遲電路1130增加所延長的時間;而當振盪頻率大於等於預設頻率時,便可利用延遲控制訊號Co~Cn來控制延遲電路1130縮短所延長的時間。如此一來,便可動態地降低鎖相迴路的功率損耗。當鎖相迴路運作於高頻下時,便可藉由縮短延遲電路所延長的時間來降低鎖相迴路的功率損耗,並降低振盪訊號發生抖動的機會。Therefore, when the oscillating frequency is less than the preset frequency, the delay control signal Co~Cn can be used to control the delay circuit 1130 to increase the extended time; and when the oscillating frequency is greater than or equal to the preset frequency, the delay control signal can be utilized. Co~Cn controls the delay circuit 1130 to shorten the extended time. In this way, the power loss of the phase-locked loop can be dynamically reduced. When the phase-locked loop operates at a high frequency, the power loss of the phase-locked loop can be reduced by shortening the delay time of the delay circuit, and the chance of jitter of the oscillation signal is reduced.
僅管在圖11的相關說明中,正反器1110與1120二者皆以一般的D型正反器來實現,然此並非用以限制本發明,本領域具有通常知識者皆知一般的D型正反器係可採用T型正反器、J-K正反器或R-S正反器來加以實現。此外,僅管在以上說明中,邏輯閘1140係以一般的及閘來實現,然此亦非用以限制本發明,本領域具有通常知識者皆知一般的及閘係可採用不同的邏輯閘來加以實現。另外,相位及/或頻率檢測器可以是採用僅檢測相位的相位檢測器、僅檢測頻率的頻率檢測器、或者是相位與頻率都檢測的相位及頻率檢測器。In the related description of FIG. 11, both the flip-flops 1110 and 1120 are implemented by a general D-type flip-flop, which is not intended to limit the present invention, and is generally known in the art as a general D. The type of flip-flop can be implemented by a T-type flip-flop, a JK flip-flop or an RS flip-flop. In addition, in the above description, the logic gate 1140 is implemented by a general gate and is not intended to limit the present invention. It is known to those skilled in the art that the gate system can adopt different logic gates. To achieve it. Alternatively, the phase and/or frequency detector may be a phase detector that detects only the phase, a frequency detector that only detects the frequency, or a phase and frequency detector that detects both the phase and the frequency.
以下將說明圖11中之控制電路1150的一些實現方式。請參照圖12,其為控制電路之其中一種實現方式的示意圖。如圖12所示,控制電路1200包括有控制單元1210與頻率偵測器1220。頻率偵測器1220係電性耦接鎖相迴路之壓控振盪器的輸出,以接收壓控振盪器所輸出的振盪訊號FOUT來偵測其振盪頻率,並據以產生偵測結果DR。在此例中,頻率偵測器1120可以是採用計數器(counter)來實現。如此,便可利用計數器來計數振盪訊號FOUT之脈衝的致能時間長度,以將計數值做為偵測結果DR。至於控制單元1210,其用以依據偵測結果DR而對應產生延遲控制訊號Co~Cn。舉例來說,控制單元1210可以內建頻率之偵測結果與延遲控制訊號的對照表(look-up table),以便從此對照表中找出對應於偵測結果DR的延遲控制訊號Co~Cn。Some implementations of the control circuit 1150 of Figure 11 will be described below. Please refer to FIG. 12, which is a schematic diagram of one implementation of the control circuit. As shown in FIG. 12, the control circuit 1200 includes a control unit 1210 and a frequency detector 1220. The frequency detector 1220 is electrically coupled to the output of the voltage controlled oscillator of the phase locked loop to receive the oscillation signal FOUT outputted by the voltage controlled oscillator to detect the oscillation frequency thereof, and accordingly generate the detection result DR. In this example, the frequency detector 1120 can be implemented using a counter. In this way, the counter can be used to count the length of the enable time of the pulse of the oscillation signal FOUT to use the count value as the detection result DR. The control unit 1210 is configured to generate the delay control signals Co~Cn according to the detection result DR. For example, the control unit 1210 may internally build a look-up table of the frequency detection result and the delay control signal to find the delay control signal Co~Cn corresponding to the detection result DR from the comparison table.
請參照圖13,其為控制電路之另一種實現方式的示意圖。如圖13所示,控制電路1300包括有控制單元1310與電壓偵測器1320。電壓偵測器1320係電性耦接鎖相迴路之壓控振盪器的輸入,以偵測此壓控振盪器所接收到之頻率控制電壓CV的大小,並據以產生偵測結果DR。至於控制單元1310,其用以依據偵測結果DR而對應產生延遲控制訊號Co~Cn。之所以可以這樣設計,是因為壓控振盪器所接收到之頻率控制電壓CV的大小與其所輸出之振盪訊號的振盪頻率係成正比,因此只要能得知頻率控制電壓CV的大小,就能依據頻率控制電壓CV與振盪訊號之振盪頻率的關係來對應得知振盪訊號的振盪頻率。控制單元1310可以內建電壓之偵測結果與延遲控制訊號的對照表,以便從此對照表中找出對應於偵測結果DR的延遲控制訊號Co~Cn。Please refer to FIG. 13, which is a schematic diagram of another implementation of the control circuit. As shown in FIG. 13, the control circuit 1300 includes a control unit 1310 and a voltage detector 1320. The voltage detector 1320 is electrically coupled to the input of the voltage controlled oscillator of the phase locked loop to detect the magnitude of the frequency control voltage CV received by the voltage controlled oscillator, and accordingly generates the detection result DR. The control unit 1310 is configured to generate the delay control signals Co~Cn according to the detection result DR. The reason why this can be designed is because the magnitude of the frequency control voltage CV received by the voltage controlled oscillator is proportional to the oscillation frequency of the oscillation signal it outputs. Therefore, as long as the frequency control voltage CV can be known, it can be based on The relationship between the frequency control voltage CV and the oscillation frequency of the oscillation signal corresponds to the oscillation frequency of the oscillation signal. The control unit 1310 can establish a comparison table between the detection result of the voltage and the delay control signal, so as to find the delay control signal Co~Cn corresponding to the detection result DR from the comparison table.
以下將說明圖11中之延遲電路1130的其中一實現方式。請參照圖14,其為延遲電路之其中一種實現方式的示意圖。如圖14所示,延遲電路1400包括有多個MOS電晶體(如標示1410所示)與多個緩衝器(如標示1420所示)。這些緩衝器1420係相互串接,且每一級緩衝器1420的輸入端係電性耦接上一級緩衝器1420的輸出端。此外,第一級的緩衝器1420用以接收邏輯閘的輸出訊號IN,而最後一級的緩衝器1420用以輸出重置訊號RS。一般將這樣的緩衝器串接架構稱為延遲鍊(delay chain)。而其中的每一緩衝器1420可由偶數個串接的反相器(inverter)來組成。此外,每一MOS電晶體1410係跨接於其中一緩衝器1420的輸入端與輸出端之間,並依據數位控制訊號Co~Cn之其中一位元的狀態而決定是否導通。值得一提的是,儘管在此例中,所有的MOS電晶體1410皆以N型MOS電晶體來實現,然此並非用以限制本發明,本領域具有通常知識者當知道這些MOS電晶體1410亦可皆改以P型MOS電晶體來實現,只要數位控制訊號Co~Cn也對應改變即可。One of the implementations of the delay circuit 1130 in FIG. 11 will be described below. Please refer to FIG. 14, which is a schematic diagram of one of the implementations of the delay circuit. As shown in FIG. 14, delay circuit 1400 includes a plurality of MOS transistors (as indicated by reference 1410) and a plurality of buffers (as indicated by reference 1420). The buffers 1420 are connected in series with each other, and the input of each stage buffer 1420 is electrically coupled to the output of the upper stage buffer 1420. In addition, the buffer 1420 of the first stage is used to receive the output signal IN of the logic gate, and the buffer 1420 of the last stage is used to output the reset signal RS. Such a buffer concatenation architecture is generally referred to as a delay chain. Each of the buffers 1420 can be composed of an even number of serially connected inverters. In addition, each MOS transistor 1410 is connected between the input end and the output end of one of the buffers 1420, and determines whether to be turned on according to the state of one of the digital control signals Co~Cn. It is worth mentioning that although in this example, all of the MOS transistors 1410 are implemented as N-type MOS transistors, this is not intended to limit the invention, and those skilled in the art will be aware of these MOS transistors 1410. It can also be implemented by using a P-type MOS transistor, as long as the digital control signal Co~Cn is also changed.
圖15為依照本發明一實施例之鎖相迴路的示意圖。如圖15所示,此鎖相迴路1500包括有相位及/或頻率檢測器1510、電荷幫浦1520、迴路濾波器1530、壓控振盪器1540與除頻器1550。此外,在此圖中,標示FREF係表示為外部輸入之參考訊號,標示FDIV係表示為除頻訊號,標示UP係表示為增頻控制訊號,標示DN係表示為減頻控制訊號,標示CC係表示為電荷幫浦1520之輸出電流,標示CV係表示為頻率控制電壓,標示FOUT係表示為振盪訊號,而標示Mo~Mn係表示為數位的除頻控制訊號。在此例中,相位及/或頻率檢測器1510內的控制電路係採用圖12所示的設計方式來實現。Figure 15 is a schematic illustration of a phase locked loop in accordance with an embodiment of the present invention. As shown in FIG. 15, the phase locked loop 1500 includes a phase and/or frequency detector 1510, a charge pump 1520, a loop filter 1530, a voltage controlled oscillator 1540, and a frequency divider 1550. In addition, in this figure, the FREF is indicated as an externally input reference signal, the FDIV is indicated as a de-frequency signal, the UP is indicated as an up-converted control signal, and the DN is represented as a de-frequency control signal, indicating the CC system. It is expressed as the output current of the charge pump 1520, the CV is indicated as the frequency control voltage, the FOUT is indicated as the oscillation signal, and the Mo~Mn is indicated as the digital frequency division control signal. In this example, the control circuitry within phase and/or frequency detector 1510 is implemented using the design shown in FIG.
圖16為依照本發明另一實施例之鎖相迴路的示意圖。如圖16所示,此鎖相迴路1600包括有相位及/或頻率檢測器1610、電荷幫浦1620、迴路濾波器1630、壓控振盪器1640與除頻器1650。此外,在此圖中,標示與圖15中之標示相同者表示為相同的訊號。在此例中,相位及/或頻率檢測器1610內的控制電路係採用圖13所示的設計方式來實現。16 is a schematic diagram of a phase locked loop in accordance with another embodiment of the present invention. As shown in FIG. 16, the phase locked loop 1600 includes a phase and/or frequency detector 1610, a charge pump 1620, a loop filter 1630, a voltage controlled oscillator 1640, and a frequency divider 1650. Further, in this figure, the same reference numerals as those in Fig. 15 are indicated as the same signals. In this example, the control circuitry within phase and/or frequency detector 1610 is implemented using the design shown in FIG.
圖17為依照本發明再一實施例之鎖相迴路的示意圖。如圖17所示,此鎖相迴路1700包括有相位及/或頻率檢測器1710、電荷幫浦1720、迴路濾波器1730、壓控振盪器1740與除頻器1750。此外,在此圖中,標示與圖15中之標示相同者表示為相同的訊號。在此例中,除頻器1750係可將接收到的除頻控制訊號Mo~Mn傳遞給相位及/或頻率檢測器1710,而相位及/或頻率檢測器1710則可依據除頻控制訊號Mo~Mn所對應之除頻倍數來得知振盪訊號FOUT之振盪頻率,然後再依據振盪訊號FOUT之振盪頻率而對應產生延遲控制訊號Co~Cn。之所以可以這麼做,是因為除頻控制訊號Mo~Mn所對應之除頻倍數亦是與振盪訊號FOUT之振盪頻率成正比。Figure 17 is a schematic illustration of a phase locked loop in accordance with yet another embodiment of the present invention. As shown in FIG. 17, the phase locked loop 1700 includes a phase and/or frequency detector 1710, a charge pump 1720, a loop filter 1730, a voltage controlled oscillator 1740, and a frequency divider 1750. Further, in this figure, the same reference numerals as those in Fig. 15 are indicated as the same signals. In this example, the frequency divider 1750 can transmit the received frequency division control signal Mo~Mn to the phase and/or frequency detector 1710, and the phase and/or frequency detector 1710 can be based on the frequency division control signal Mo. The frequency division multiple corresponding to ~Mn is used to know the oscillation frequency of the oscillation signal FOUT, and then the delay control signal Co~Cn is generated correspondingly according to the oscillation frequency of the oscillation signal FOUT. The reason why this can be done is because the frequency division multiple corresponding to the frequency control signal Mo~Mn is also proportional to the oscillation frequency of the oscillation signal FOUT.
藉由上述各實施例之教示,本領域具有通常知識者當可歸納出本發明之鎖相迴路的一些基本操作,一如圖18所示。圖18為依照本發明一實施例之鎖相迴路的操作方法的流程圖。所述之鎖相迴路具有相位及/或頻率檢測器,而此相位及/或頻率檢測器包括有第一正反器、第二正反器、邏輯閘與延遲電路。所述之第一正反器具有第一資料輸入端、第一資料輸出端、第一時脈輸入端與第一重置端。第一資料輸入端用以電性耦接電源電壓,而第一時脈輸入端用以接收具有參考頻率之參考訊號。所述之第二正反器具有第二資料輸入端、第二資料輸出端、第二時脈輸入端與第二重置端。第二資料輸入端用以電性耦接電源電壓,而第二時脈輸入端用以接收除頻訊號,此除頻訊號為對鎖相迴路所輸出之振盪訊號除頻而得,且此振盪訊號具有振盪頻率。所述之邏輯閘用以接收第一資料輸出端與第二資料輸出端所輸出的訊號,而所述之延遲電路用以延長邏輯閘所輸出之訊號的上升時間,以便形成重置訊號而輸出至第一重置端與第二重置端。請參照圖18,所述之操作方法包括下列步驟:判斷振盪頻率是否大於等於預設頻率(如步驟S1810所示);以及當判斷為是時,便控制延遲電路縮短所延長的時間(如步驟S1820所示)。With the teachings of the various embodiments described above, those skilled in the art will be able to generalize some of the basic operations of the phase-locked loop of the present invention, as shown in FIG. 18 is a flow chart of a method of operating a phase locked loop in accordance with an embodiment of the present invention. The phase locked loop has a phase and/or frequency detector, and the phase and/or frequency detector includes a first flip flop, a second flip flop, a logic gate and a delay circuit. The first flip-flop has a first data input end, a first data output end, a first clock input end and a first reset end. The first data input terminal is electrically coupled to the power supply voltage, and the first clock input terminal is configured to receive the reference signal having the reference frequency. The second flip-flop has a second data input end, a second data output end, a second clock input end and a second reset end. The second data input end is electrically coupled to the power supply voltage, and the second clock input end is configured to receive the frequency-divided signal, wherein the frequency-divided signal is obtained by dividing the oscillation signal outputted by the phase-locked loop, and the oscillation is performed. The signal has an oscillating frequency. The logic gate is configured to receive signals output by the first data output end and the second data output end, and the delay circuit is configured to extend the rise time of the signal output by the logic gate to form a reset signal and output Up to the first reset end and the second reset end. Referring to FIG. 18, the operation method includes the following steps: determining whether the oscillation frequency is greater than or equal to the preset frequency (as shown in step S1810); and when the determination is yes, controlling the delay circuit to shorten the extended time (such as the step) S1820 shows).
此外,當振盪頻率小於預設頻率時,便控制延遲電路增加所延長的時間。In addition, when the oscillation frequency is less than the preset frequency, the delay circuit is controlled to increase the extended time.
綜上所述,本發明係在相位及/或頻率檢測器中增設延遲電路與控制電路。如此,便可利用延遲電路來延長邏輯閘所輸出之訊號的上升時間,以進一步延長相位及/或頻率檢測器所輸出之增頻控制訊號(即第一正反器之輸出)與減頻控制訊號(即第二正反器之輸出)二者之脈衝的上升時間,藉以解決鎖相迴路的死區問題,並進而解決鎖相迴路的輸出訊號抖動問題。此外,還可利用控制電路去判斷鎖相迴路所輸出的振盪頻率是否大於等於預設頻率,並據以動態控制鎖相迴路的功率消耗。當判斷為是時,控制電路便控制延遲電路縮短所延長的時間,以減少鎖相迴路運作於高頻下的功率消耗;而當判斷為否時,控制電路便控制延遲電路增加所延長的時間。In summary, the present invention adds a delay circuit and a control circuit to the phase and/or frequency detector. In this way, the delay circuit can be used to extend the rise time of the signal output by the logic gate to further extend the up-conversion control signal (ie, the output of the first flip-flop) and the frequency-reduction control output by the phase and/or frequency detector. The rise time of the pulse of the signal (ie, the output of the second flip-flop) is used to solve the dead zone problem of the phase-locked loop, and further solve the output signal jitter problem of the phase-locked loop. In addition, the control circuit can be used to determine whether the oscillation frequency output by the phase locked loop is greater than or equal to the preset frequency, and accordingly, the power consumption of the phase locked loop is dynamically controlled. When the determination is yes, the control circuit controls the delay circuit to shorten the extended time to reduce the power consumption of the phase-locked loop operating at a high frequency; and when the determination is no, the control circuit controls the delay circuit to increase the extended time. .
雖然本發明已以較佳實施例揭露如上,然其並非用以限定本發明,任何熟習此技藝者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。While the present invention has been described in its preferred embodiments, the present invention is not intended to limit the invention, and the present invention may be modified and modified without departing from the spirit and scope of the invention. The scope of protection is subject to the definition of the scope of the patent application.
100、1500、1600、1700...鎖相迴路100, 1500, 1600, 1700. . . Phase-locked loop
110、200、900、1100、1510、1610、1710...相位及/或頻率檢測器110, 200, 900, 1100, 1510, 1610, 1710. . . Phase and / or frequency detector
120、510、1520、1620、1720...電荷幫浦120, 510, 1520, 1620, 1720. . . Charge pump
130、520、1530、1630、1730...迴路濾波器130, 520, 1530, 1630, 1730. . . Loop filter
140、1540、1640、1740...壓控振盪器140, 1540, 1640, 1740. . . Voltage controlled oscillator
150、1550、1650、1750...除頻器150, 1550, 1650, 1750. . . Frequency divider
210、220、1110、1120...正反器210, 220, 1110, 1120. . . Positive and negative
230、1140...邏輯閘230, 1140. . . Logic gate
512、518...電流源512, 518. . . Battery
514、516...開關514, 516. . . switch
910...延遲電路910. . . Delay circuit
1130...延遲電路1130. . . Delay circuit
1150...控制電路1150. . . Control circuit
1200、1300...控制電路1200, 1300. . . Control circuit
1210、1310...控制單元1210, 1310. . . control unit
1220...頻率偵測器1220. . . Frequency detector
1320...電壓偵測器1320. . . Voltage detector
1400...延遲電路1400. . . Delay circuit
1410...MOS電晶體1410. . . MOS transistor
1420...緩衝器1420. . . buffer
Co~Cn...數位控制訊號Co~Cn. . . Digital control signal
CC...輸出電流CC. . . Output current
CLK...時脈輸入端CLK. . . Clock input
CV...頻率控制電壓CV. . . Frequency control voltage
D...資料輸入端D. . . Data input
DN...減頻控制訊號DN. . . Frequency reduction control signal
DR...偵測結果DR. . . Detection result
DZ...死區DZ. . . dead zone
FDIV...除頻訊號FDIV. . . Frequency signal
FOUT...振盪訊號FOUT. . . Oscillating signal
FREF...參考訊號FREF. . . Reference signal
GND...接地電位GND. . . Ground potential
IN...邏輯閘的輸出訊號IN. . . Logic gate output signal
Mo~Mn...除頻控制訊號Mo~Mn. . . Frequency division control signal
Q...資料輸出端Q. . . Data output
R...重置端R. . . Reset end
RS...重置訊號RS. . . Reset signal
S1810、S1820...步驟S1810, S1820. . . step
t...時間t. . . time
UP...增頻控制訊號UP. . . Up-converting control signal
VDD...電源電壓VDD. . . voltage
θ...相差θ. . . difference
圖1為一種鎖相迴路的方塊圖。Figure 1 is a block diagram of a phase locked loop.
圖2係繪示相位及/或頻率檢測器的其中一種實現方式。Figure 2 illustrates one implementation of a phase and/or frequency detector.
圖3係用以說明相位及/或頻率檢測器的操作方式。Figure 3 is a diagram for explaining the operation of the phase and / or frequency detector.
圖4係繪示增頻控制訊號與減頻控制訊號的一時序。FIG. 4 illustrates a timing of the up-convert control signal and the down-conversion control signal.
圖5係繪示電荷幫浦的其中一種實現方式與迴路濾波器的其中一種實現方式。Figure 5 illustrates one of the implementations of a charge pump and one of the loop filters.
圖6係繪示圖5之參考訊號與除頻訊號二者的相差與電荷幫浦之輸出電流的對應關係。6 is a diagram showing the relationship between the phase difference between the reference signal and the frequency-divided signal of FIG. 5 and the output current of the charge pump.
圖7係繪示圖5之參考訊號與除頻訊號二者的相差與頻率控制電壓的對應關係。FIG. 7 is a diagram showing the correspondence between the phase difference between the reference signal and the frequency-divided signal of FIG. 5 and the frequency control voltage.
圖8係用以解說振盪訊號有些許誤差的情況。Figure 8 is a diagram for explaining a slight error in the oscillation signal.
圖9係繪示一種相位及/或頻率檢測器的電路方塊圖。9 is a circuit block diagram of a phase and/or frequency detector.
圖10係繪示脈衝上升時間已被延長的增頻控制訊號與減頻控制訊號。FIG. 10 is a diagram showing an up-converted control signal and a down-conversion control signal in which the pulse rise time has been extended.
圖11為依照本發明一實施例之一相位及/或頻率檢測器的電路方塊圖。11 is a circuit block diagram of a phase and/or frequency detector in accordance with an embodiment of the present invention.
圖12為控制電路之其中一種實現方式的示意圖。Figure 12 is a schematic illustration of one implementation of a control circuit.
圖13為控制電路之另一種實現方式的示意圖。Figure 13 is a schematic illustration of another implementation of a control circuit.
圖14為延遲電路之其中一種實現方式的示意圖。Figure 14 is a schematic illustration of one implementation of a delay circuit.
圖15為依照本發明一實施例之鎖相迴路的示意圖。Figure 15 is a schematic illustration of a phase locked loop in accordance with an embodiment of the present invention.
圖16為依照本發明另一實施例之鎖相迴路的示意圖。16 is a schematic diagram of a phase locked loop in accordance with another embodiment of the present invention.
圖17為依照本發明再一實施例之鎖相迴路的示意圖。Figure 17 is a schematic illustration of a phase locked loop in accordance with yet another embodiment of the present invention.
圖18為依照本發明一實施例之鎖相迴路的操作方法的流程圖。18 is a flow chart of a method of operating a phase locked loop in accordance with an embodiment of the present invention.
1100...相位及/或頻率檢測器1100. . . Phase and / or frequency detector
1110、1120...正反器1110, 1120. . . Positive and negative
1130...延遲電路1130. . . Delay circuit
1140...邏輯閘1140. . . Logic gate
1150...控制電路1150. . . Control circuit
Co~Cn...數位控制訊號Co~Cn. . . Digital control signal
CLK...時脈輸入端CLK. . . Clock input
D...資料輸入端D. . . Data input
DN...減頻控制訊號DN. . . Frequency reduction control signal
FDIV...除頻訊號FDIV. . . Frequency signal
FREF...參考訊號FREF. . . Reference signal
Q...資料輸出端Q. . . Data output
R...重置端R. . . Reset end
UP...增頻控制訊號UP. . . Up-converting control signal
VDD...電源電壓VDD. . . voltage
Claims (14)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW100125698A TWI535216B (en) | 2011-07-20 | 2011-07-20 | Phase and/or frequency detector, phase-locked loop and operation method for the phase-locked loop |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW100125698A TWI535216B (en) | 2011-07-20 | 2011-07-20 | Phase and/or frequency detector, phase-locked loop and operation method for the phase-locked loop |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201306487A TW201306487A (en) | 2013-02-01 |
TWI535216B true TWI535216B (en) | 2016-05-21 |
Family
ID=48169370
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW100125698A TWI535216B (en) | 2011-07-20 | 2011-07-20 | Phase and/or frequency detector, phase-locked loop and operation method for the phase-locked loop |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI535216B (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111770597A (en) * | 2019-04-01 | 2020-10-13 | 无锡物华电子科技有限公司 | Frequency tracking method in frequency modulation and power regulation |
-
2011
- 2011-07-20 TW TW100125698A patent/TWI535216B/en active
Also Published As
Publication number | Publication date |
---|---|
TW201306487A (en) | 2013-02-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7541848B1 (en) | PLL circuit | |
US7053666B2 (en) | Phase frequency detector | |
US7598775B2 (en) | Phase and frequency detector with zero static phase error | |
CN108306638B (en) | Configurable locking detection circuit suitable for charge pump phase-locked loop | |
US8786315B2 (en) | Phase frequency detector | |
JP2009302692A (en) | Clock and data recovery circuit | |
US7332945B2 (en) | Divider having dual modulus pre-scaler and an associated method | |
US8461890B1 (en) | Phase and/or frequency detector, phase-locked loop and operation method for the phase-locked loop | |
US9374038B2 (en) | Phase frequency detector circuit | |
JPWO2002099971A1 (en) | Semiconductor integrated circuit | |
US20070035338A1 (en) | Symmetric D flip-flop and phase frequency detector including the same | |
US20080013664A1 (en) | Phase error measurement circuit and method thereof | |
US8466720B2 (en) | Frequency division of an input clock signal | |
TWI535216B (en) | Phase and/or frequency detector, phase-locked loop and operation method for the phase-locked loop | |
US8138800B2 (en) | Phase detecting circuit and PLL circuit | |
US7756236B2 (en) | Phase detector | |
JP2005252447A (en) | Lock detection circuit and method | |
US11764792B2 (en) | Phase locked loop circuitry | |
US8319525B2 (en) | Flip-flop circuit and leakage current suppression circuit utilized in a flip-flop circuit | |
US20090154637A1 (en) | High speed hybrid structure counter having synchronous timing and asynchronous counter cells | |
CN113676177A (en) | Phase frequency detector, charge pump and phase-locked loop circuit | |
US9735786B2 (en) | Apparatus and methods for single phase spot circuits | |
TWI517581B (en) | Flip-flop circuit | |
CN111786668B (en) | Dual-mode prescaler | |
KR101091488B1 (en) | Prescaler and phase locked loop frequency synthesizer having the same |